TWI748300B - Testing system and method - Google Patents

Abstract

A testing method is provided in the invention. The testing method comprises the steps of when a testing machine performs a test program to perform a test process for a tested object, reading tested object information stored in a first memory of a control chip to determine whether the tested object matches the tested object information, wherein the control chip is configured in a testing jig and the testing jig is mounted on the testing machine; when the tested object matches the tested object information, initiating the test process; and writing the test information corresponding to the test process into a second memory of the control chip.

Description

Test system and test method

The embodiment of the present invention mainly relates to a test technology, and particularly relates to a test technology that records test information of each test process by a control chip of a jig.

After the tested product (such as a chip) is shipped to the client, if the client finds the product is abnormal, the product manufacturer often takes a long time to clarify. Furthermore, if there is a problem in a certain test process of the product during the test, the product manufacturer must often seek information or assistance from the test manufacturer. In addition to increasing the time cost of communication, it is also impossible to confirm whether the test plant is hidden. The act of avoiding responsibility based on the facts has resulted in the inability to effectively track which testing procedures the abnormal product has undergone. Therefore, how to enable product manufacturers to obtain the test information of the product in each test process more quickly, and to track and query each test process of the product more efficiently will be a topic worthy of discussion.

In view of the above-mentioned problems of the prior art, the embodiments of the present invention provide a testing method and system.

According to an embodiment of the present invention, a test method is provided. The steps of the above-mentioned test method include, when a test program is executed on a test machine to perform a test process on an object under test, reading the object under test information stored in a first memory of a control chip to Determine whether the object under test meets the information of the object under test, wherein the control chip is configured in a test fixture, and the test fixture is installed on the test machine; when the object under test meets the information of the object under test , Start the above-mentioned test process; and write the test information corresponding to the above-mentioned test process into a second memory of the control chip.

According to some embodiments of the present invention, the above-mentioned DUT information includes a company name, a product name, and a fixture number. According to some embodiments of the present invention, the above-mentioned test information includes a test time, a test process name, and a test number.

According to some embodiments of the present invention, the above-mentioned object to be tested has an exclusive code. The above-mentioned exclusive code is generated based on the goods number corresponding to the above-mentioned DUT, package manufacturer information, test manufacturer information and production sequence. According to some embodiments of the present invention, according to the above-mentioned exclusive code, the above-mentioned test information corresponding to the above-mentioned object to be tested can be inquired and tracked, and the possible cause of the product abnormality can be further confirmed.

According to an embodiment of the present invention, a test system is provided. The above-mentioned test system includes a test object, a test machine and a test fixture. The test fixture is installed on the above-mentioned test machine and has a control chip. When the test machine executes a test program to perform a test process on the object under test, the test machine reads the information about the object under test stored in the first memory of the control chip to determine the object under test. Whether the measured object meets the above-mentioned information of the measured object. When the object under test meets the information of the object under test, the testing machine starts the test process, and writes the test information corresponding to the test process into a second memory of the control chip.

Regarding other additional features and advantages of the present invention, those skilled in the art, without departing from the spirit and scope of the present invention, can make some changes and modifications according to the test system and method disclosed in the implementation method of this case. get.

The descriptions in this chapter are the preferred ways to implement the present invention. The purpose is to explain the spirit of the present invention and not to limit the scope of protection of the present invention. .

Fig. 1 shows a block diagram of a test system 100 according to an embodiment of the invention. As shown in FIG. 1, the testing system 100 may include a testing machine 110, a testing jig 120 and an object to be tested 130. Note that the block diagram shown in Figure 1 is only for the convenience of describing the embodiments of the present invention, but the present invention is not limited to Figure 1.

In the embodiment of the present invention, the test fixture 120 is installed on the test machine 110. When the testing machine 110 is to test the object 130 to be tested, the object 130 to be tested is placed on the test fixture 120 for testing. According to an embodiment of the present invention, when the test object 130 is undergoing chip probing (or circuit probing, CP), the test fixture 120 may be a probe card. According to another embodiment of the present invention, when the test object 130 is undergoing a wafer test, the test fixture 120 can be a load board. Wafer testing may include correlation testing (correlation testing), final testing (FT), and quality control (QC) testing. According to an embodiment of the present invention, the test object 130 can be a chip (IC) or a batch of chips.

As shown in FIG. 1, according to an embodiment of the present invention, a control chip 200 is disposed in the test fixture 120. According to an embodiment of the present invention, the control chip 200 may include a first memory 210 and a second memory 220. Note that the control chip 200 shown in FIG. 1 is only for the convenience of describing the embodiment of the present invention, but the present invention is not limited to FIG. 1. The control chip 200 may also include other components. According to an embodiment of the present invention, the first memory 210 and the second memory 220 may be flash memory.

According to an embodiment of the present invention, the first memory 210 can be used to store the test object information of the test object 130. The information of the test object can be written into the first memory 210 in advance. According to an embodiment of the present invention, the test object information may include a company name, a product name, and a fixture number corresponding to the test object 130, but the present invention is not limited to this. The company name may indicate the name of the manufacturer of the test object 130. The product name can indicate the model of the test object 130. The jig number can indicate the number of the test jig 120 corresponding to the test object 130. According to an embodiment of the present invention, when the test machine 110 executes a test program to perform a test process on the test object 130, the test machine 110 first reads the test object information stored in the first memory 210 to It is determined whether the test fixture 120 and the object under test 130 currently on the testing machine 110 meet the information of the object under test. When the information of the object under test is met, the testing machine 110 can test the object under test 130. According to an embodiment of the present invention, the testing machine 110 can only perform a reading operation on the first memory 210.

According to an embodiment of the present invention, the second memory 220 can be used to record the test information corresponding to the test process when the test object 130 is subjected to a test process. According to an embodiment of the present invention, the test information may include a test time corresponding to the test process, a test process name, and a test number, but the present invention is not limited to this. The test time can be the time that the test starts, such as year, month, day, hour, minute, second, etc. The name of the test process can refer to the test process performed this time. For example, if the test process of the first wafer test is performed, the test process name can be recorded as CP1, if the test process of the second wafer test is performed, the test process The name can be recorded as CP2, if the test process of the final test is performed, the test process name can be recorded as FT, and if the test process of the quality control test is performed, the test process name can be recorded as CP, but the present invention is not limited to this. The test number may be the lot number of the test object 130 to be tested. Whenever the test machine 110 needs to perform a test process for the test object 130, the test machine 110 will start a test program and write a piece of test information into the second memory 220. Therefore, corresponding to different test procedures, the DUT 130 will have different test information. After the test object 130 has been tested by the testing machine of the testing factory, the manufacturer of the test object 130 can obtain the test information corresponding to the test object 130 from the retrieved test fixture 120. According to an embodiment of the present invention, the test information corresponding to the DUT 130 can be stored in a management system (not shown in the figure) of one of the manufacturers for follow-up tracking, so that if the product is abnormal, the DUT and the The corresponding test information confirms the possible cause of the abnormality. In other words, through the management system, the test information can be used to know which test procedures the abnormal product has undergone.

According to an embodiment of the present invention, the test object 130 may have an exclusive code, and the exclusive code may be printed on the test object 130. According to an embodiment of the present invention, the exclusive code may be a two-dimensional bar code, such as a QR code, but the present invention is not limited to this. According to an embodiment of the present invention, the exclusive code can be generated by a code generator based on the lot number, package manufacturer information, test manufacturer information, and data number corresponding to the DUT 130. When the client thinks that there is a problem with the product (for example: DUT 130), the manufacturer can read the product’s exclusive code and query the corresponding test information from the management system to quickly identify the product with the problem. Which batch of goods is it, and what testing process the abnormal product has undergone. On the manufacturer's side, product exception notifications can also be issued in the management system for client inquiries. Specifically, the client can read the exclusive code of the DUT 130 and connect to the manufacturer's management system to confirm whether there is a product abnormality notification corresponding to the DUT 130. If there is a product abnormality notification, the client can know that the DUT 130 or the product belonging to the same batch as the DUT 130 is an abnormal product.

Figure 2 is a flowchart of the testing method according to an embodiment of the present invention. This test method is applicable to the test system 100. As shown in Figure 2, in step S210, when a test program is executed on a test machine of the test system 100 to perform a test process on an object under test, a first memory stored in a control chip is read The test object information of the body is used to determine whether the test object meets the test object information. The control chip is configured in a test fixture of the test system 100, and the test fixture is installed on the test machine. When the object to be measured matches the information of the object to be measured, step S220 is performed. In step S220, the testing machine starts the testing process. When the DUT does not match the DUT information, the test process is not performed. In step S230, the test machine writes the test information corresponding to the test process into a second memory of the control chip.

According to some embodiments of the present invention, the DUT information in the test method includes a company name, a product name, and a fixture number. According to some embodiments of the present invention, the test information in the test method includes a test time, a test process name, and a test number.

According to some embodiments of the present invention, the test object in the test method has an exclusive code. According to some embodiments of the present invention, the exclusive code is generated based on the goods number corresponding to the object under test, package manufacturer information, test manufacturer information, and production sequence. According to some embodiments of the present invention, the test method further includes, according to the unique code of the test object, querying the corresponding test information corresponding to the test object. According to some embodiments of the present invention, the test method further includes, according to the exclusive code of the test object, confirming whether a product abnormality notification corresponding to the test object is issued.

In the test system and method proposed according to the embodiment of the present invention, the information of the test object is stored in the first memory of the control chip configured in the test fixture to confirm whether the test object matches the information of the test object. Therefore, illegal use of the test program can be avoided. In addition, in the test system and method according to the embodiments of the present invention, the second memory of the control chip configured in the test fixture can record test information corresponding to the test process. Therefore, if the product is abnormal, the test information of the test process that the abnormal product has gone through can be quickly obtained. In addition, in the test system and method according to the embodiment of the present invention, both the manufacturer and the client can obtain the relevant information corresponding to the test object in real time according to the exclusive code of the test object.

The serial numbers in this specification and in the scope of the patent application, such as "first", "second", etc., are only for convenience of explanation, and there is no sequential relationship between them.

The steps of the method and algorithm disclosed in the specification of the present invention can be directly applied to hardware and software modules or a combination of the two directly by executing a processor. A software module (including execution commands and related data) and other data can be stored in data memory, such as random access memory (RAM), flash memory (flash memory), and read-only memory (ROM) , Erasable Programmable Read-Only Memory (EPROM), Electronically Erasable Programmable Read-Only Memory (EEPROM), Register, Hard Disk, Portable Disk, CD-ROM Read-Only Memory ( CD-ROM), DVD or any other computer-readable storage media format known in this field. A storage medium can be coupled to a machine device, such as a computer/processor (for the convenience of description, it is represented by a processor in this manual), and the processor can read information (such as a program) Code), and write information to the storage medium. A storage medium can integrate a processor. An application-specific integrated circuit (ASIC) includes a processor and a storage medium. A user equipment includes a special application integrated circuit. In other words, the processor and the storage medium are included in the user equipment in a way that they are not directly connected to the user equipment. In addition, in some embodiments, any product suitable for computer programs includes a readable storage medium, where the readable storage medium includes code related to one or more of the disclosed embodiments. In some embodiments, the product of the computer program may include packaging materials.

The above paragraphs use multiple levels of description. Obviously, the teachings of this document can be implemented in a variety of ways, and any specific structure or function disclosed in the example is only a representative situation. According to the teachings in this article, anyone who is familiar with this technique should understand that each level disclosed in this article can be implemented independently or two or more levels can be implemented in combination.

Although this disclosure has been disclosed in the above embodiments, it is not intended to limit the disclosure. Anyone who is familiar with this technique can make some changes and modifications without departing from the spirit and scope of this disclosure. Therefore, the scope of protection of the invention When the scope of the attached patent application is defined, it shall prevail.

100: test system 110: Test machine 120: test fixture 130: DUT 200: control chip 210: first memory 220: second memory S210~S230: steps

Fig. 1 shows a block diagram of a test system 100 according to an embodiment of the invention. Figure 2 is a flowchart of the testing method according to an embodiment of the present invention.

100: test system

110: Test machine

120: test fixture

130: DUT

200: control chip

210: first memory

220: second memory

Claims (6)

A test method includes: when a test program is executed on a test machine to perform a test process on a test object, reading the test object information stored in a first memory of a control chip to determine Whether the object under test meets the information of the object under test, wherein the control chip is arranged in a test fixture, and the test fixture is installed on the test machine, and the object under test is a chip; When the test object meets the information of the test object, the test process is started; and the test information corresponding to the test process is written into a second memory of the control chip; wherein the information of the test object includes a company name and a second memory of the control chip. Product name and a fixture number, wherein the second memory stores different test information corresponding to different test information of the test object, wherein each test information includes a test time, a test process name, and a test number . The test method described in item 1 of the scope of patent application, wherein the above-mentioned object to be tested has an exclusive code. As for the test method described in item 2 of the scope of patent application, the above-mentioned exclusive code is generated based on the goods number corresponding to the above-mentioned object under test, package manufacturer information, test manufacturer information and production sequence. A testing system includes: an object to be tested, wherein the object to be tested is a chip; a testing machine; and A test fixture is installed on the test machine and has a control chip; wherein when the test machine executes a test program to perform a test process on the object under test, the test machine reads and stores it in The test object information of the first memory of the control chip is used to determine whether the test object meets the test object information; and when the test object meets the test object information, the test machine starts to perform The above-mentioned test process, and the test information corresponding to the above-mentioned test process is written into a second memory of the control chip; wherein the information of the object to be tested includes a company name, a product name, and a fixture number, and the second Different test information corresponding to different test information of the above-mentioned object to be tested is stored in the memory, wherein each of the above-mentioned test information includes a test time, a test process name, and a test number. For the test system described in item 4 of the scope of patent application, the above-mentioned object to be tested has an exclusive code. For the test system described in item 5 of the scope of patent application, the above-mentioned exclusive code is generated based on the goods number corresponding to the above-mentioned object under test, package manufacturer information, test manufacturer information and production sequence.

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