TWI744066B - Vibration testing fixture assembly for peripheral component interconnect express card - Google Patents

Abstract

A vibration testing fixture assembly for peripheral component interconnect express card is disclosed in the present invention. The vibration testing fixture assembly includes a first fixture, a second fixture, a peripheral component interconnect express connector, and a bracket screw. The first fixture is utilized to fix to a vibration testing apparatus and receive a bracket of a peripheral component interconnect express card. The second fixture is utilized to fix to the vibration testing apparatus. The peripheral component interconnect express connector connects to the second fixture and is utilized to receive a gold finger of the peripheral component interconnect express card. The bracket screw is utilized to fix the bracket to the first fixture. Thus, the vibration testing apparatus is utilized to do a vibration test on the peripheral component interconnect express card fixed by the vibration testing fixture assembly.

Description

Rapid Peripheral Component Interconnect Card Vibration Test Fixture Set

The invention relates to a jig, in particular to a jig set for vibration testing of a fast peripheral component interconnection card.

With the advent of the Peripheral Component Interconnect Express (PCI-E or PCIe) bus specification, its transmission speed and transmission stability are better than the previous Peripheral Component Interconnect (PCI) bus Specifications, there is the possibility of completely replacing the peripheral component interconnect (Peripheral Component Interconnect; PCI) bus specifications. Therefore, the demand for R&D of rapid peripheral component interconnection cards has also increased.

However, there is no vibration test equipment that can simulate the assembly state of the rapid peripheral component interconnection card in the prior art, so it is impossible to evaluate the vibration (which may be caused by the external environment, host, server or other factors) for the assembly state. The impact caused by the rapid peripheral component interconnection card is even the degree of damage, and the structure of the rapid peripheral component interconnection card cannot be improved, reinforced and optimized, and it may further cause the rapid peripheral component interconnection card to function during use. Sexual issues. Therefore, there is room for improvement in the prior art.

In view of the fact that in the prior art, there is no vibration test equipment that can simulate the assembly state of the fast peripheral component interconnection card and the various problems derived therefrom. One of the main objects of the present invention is to provide a rapid peripheral component interconnection card vibration test fixture set to solve at least one problem in the prior art.

In order to solve the problems of the prior art, the necessary technical means adopted by the present invention are to provide a rapid peripheral component interconnection card vibration test fixture set, which is detachably assembled on a test board of a vibration test equipment to integrate a rapid The peripheral component interconnection card is fixed to the vibration test equipment for the vibration test equipment to perform a vibration test operation on the rapid peripheral component interconnection card, and includes a first fixture, a second fixture, and a rapid peripheral component interconnection connector Fix screws with a bracket.

The first jig is provided with a bracket accommodating hole and a first fixing hole, and is locked to the test board by a first locking means, and the bracket accommodating hole is used for accommodating the fast peripheral component interconnection card A bracket. The second jig has a connector accommodating groove and is locked to the test board by a second locking means. The fast peripheral component interconnection connector is fixed in the connector accommodating slot, and is used for inserting and connecting a golden finger of the fast peripheral component interconnection card. The bracket fixing screw correspondingly penetrates the bracket and the first fixing hole, so as to fix the rapid peripheral component interconnection card to the first jig.

On the basis of the above-mentioned necessary technical means, an auxiliary technical means derived from the present invention is a rapid peripheral component interconnection card vibration test fixture set, which further includes at least one first locking screw, and the first locking means is used The at least one first locking screw correspondingly penetrates the at least one first locking hole of the first jig, so as to fix the first jig to the test board.

On the basis of the above-mentioned necessary technical means, one of the subsidiary technical means derived from the present invention is to make the number of the first locking screw in the vibration test fixture set of the rapid peripheral component interconnection card is four.

On the basis of the above-mentioned necessary technical means, an auxiliary technical means derived from the present invention is to make the second jig in the rapid peripheral component interconnection card vibration test jig set, which includes a second body and a second cover. With a second pedestal. The second cover body is connected and fixed to the second body, and forms a connector accommodating groove with the second body. The second base is connected to the second body and is provided with at least one second locking hole.

On the basis of the above-mentioned necessary technical means, an auxiliary technical means derived from the present invention is a rapid peripheral component interconnection card vibration test fixture set, which further includes at least one second locking screw, and the second locking means is used The second locking screw correspondingly penetrates the second locking hole of the second base, so as to lock the second jig to the test board.

On the basis of the above-mentioned necessary technical means, one of the subsidiary technical means derived from the present invention is to make the number of the second locking screw in the vibration test fixture set of the rapid peripheral component interconnection card is three.

On the basis of the above-mentioned necessary technical means, an auxiliary technical means derived from the present invention is to make the second jig in the rapid peripheral component interconnection card vibration test jig set further include at least one cover fixing screw and cover The body fixing screw is used to correspondingly pass through at least one cover body through hole of the second cover body, so as to fix the second cover body to the second body.

On the basis of the above-mentioned necessary technical means, an auxiliary technical means derived from the present invention is to make the through hole of the cover in the vibration test fixture set of the rapid peripheral component interconnection card corresponding to the connector accommodating groove.

On the basis of the above-mentioned necessary technical means, one of the subsidiary technical means derived from the present invention is to make the cover fixing screws in the vibration test fixture set of the rapid peripheral component interconnection card, the number of which is three.

As mentioned above, the rapid peripheral component interconnection card vibration test fixture set provided by the present invention uses the first fixture, the second fixture, the rapid peripheral component interconnection connector and the bracket fixing screws to accommodate and fix The fast peripheral component interconnection card and the fast peripheral component interconnection card are fixed to the vibration test equipment so that the vibration test equipment can perform vibration test operations on the fast peripheral component interconnection card. Compared with the prior art, the present invention can simulate the rapid peripheral component interconnection card. The assembly status of the component interconnect card. Therefore, after the vibration test equipment performs the vibration test operation on the rapid peripheral component interconnection card that simulates the assembled state, it can evaluate the vibration (which may be generated by the external environment, host, server or other factors) for the rapid peripheral in the assembled state The impact caused by the component interconnection card is even the degree of damage, and the structure of the rapid peripheral component interconnection card is improved, reinforced and optimized, which can further avoid the functional problem of the rapid peripheral component interconnection card during use.

The specific embodiments of the present invention will be described in more detail below in conjunction with the schematic diagrams. According to the following description and the scope of patent application, the advantages and features of the present invention will be more clear. It should be noted that the drawings all adopt a very simplified form and all use imprecise proportions, which are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention.

Please refer to the first and second figures, in which, the first figure is a perspective view of the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention; and the second figure is a comparison of the present invention An exploded view of the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment. As shown in the figure, a Peripheral Component Interconnect Express (PCI-E or PCIe) card vibration test fixture set 1 includes a first fixture 11, a second fixture 12, and a rapid peripheral component interconnection. Connect the connector 13 and a bracket fixing screw 14. In this embodiment, the rapid peripheral component interconnection card vibration test fixture set 1 further includes at least one first locking screw 15 (four are drawn in the drawing and one is indicated) and at least one second locking screw 16 ( Draw three diagrams and mark one for illustration).

The first jig 11 defines a bracket accommodating hole H1, a first fixing hole H2, and at least one first locking hole H3 corresponding to the first locking screw 15.

The second jig 12 has a connector accommodating slot T, and includes a second body 121, a second cover 122, a second base 123 and at least one cover fixing screw 124 (three parallels are drawn in the drawing Mark one to indicate).

The second cover 122 is connected to and fixed to the second body 121 and forms a connector accommodating groove T with the second body 121. The second base 123 is connected to the second body 121 and defines at least one second locking hole H4 corresponding to the second locking screw 16.

The cover fixing screw 124 correspondingly penetrates at least one second fixing hole H5 opened in the second cover 122 and at least one body locking hole H6 opened in the second body 121, so as to fix the second cover 122 to the first Two body 121.

A PCIe Connector (PCIe Connector; also referred to as a PCI Express Slot) 13 is fixed in the connector accommodating slot T in the second jig 12. The bracket fixing screw 14 corresponds to the first fixing hole H2 of the first jig 11.

Next, please refer to Figures 1 to 7 together. Figure 3 shows the breakdown of the rapid peripheral component interconnection card vibration test fixture set and the test board of the vibration test equipment provided by the preferred embodiment of the present invention. Figure; The fourth figure is a perspective view showing the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention is assembled on the test board of the vibration test equipment; the fifth figure is a perspective view showing the preferred embodiment of the present invention The exploded view of the rapid peripheral component interconnection card vibration test fixture set and the rapid peripheral component interconnection card provided; the sixth figure shows the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention A three-dimensional view of the rapid peripheral component interconnection card fixed to the test board of the vibration test equipment; and, the seventh figure shows the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention to interconnect the rapid peripheral components The three-dimensional view of the card fixed to the vibration test equipment.

As shown in the figure, the rapid peripheral component interconnection card vibration test fixture set 1 is detachably assembled on a test board 21 of a vibration test equipment 2 and is used to fix a rapid peripheral component interconnection card 3 in the vibration test Equipment 2, for vibration testing equipment 2 to perform a vibration test operation on the fast peripheral component interconnection card 3.

The first jig 11 is locked to the test board 21 by a first locking means. In this embodiment, the first locking means is to use the first locking screw 15 to sequentially pass through the first locking hole H3 of the first jig 11 and the test board through hole H7 of the test board 21, thereby A jig 11 is locked on the test board 21, but it is not limited to this. In other embodiments of the present invention, the first locking means can also be other means that can lock the first jig 11 to the test board 21 by using a locking structure, a clamping groove, a clamping groove, a key groove, and the like.

The second jig 12 is locked to the test board 21 by a second locking means. In this embodiment, the second locking means is to use the second locking screw 16 to sequentially pass through the second locking hole H4 of the second base 123 and the test board through hole H8 of the test board 21, so that the second The jig 12 is locked on the test board 21, but it is not limited to this. The second locking means can also be other means that can lock the second jig 12 on the test board 21. In addition, the second locking means can also be different from the first locking means.

After the first jig 11 and the second jig 12 are locked on the test board 21, as shown in the fourth figure, they will be accommodated and used for the rapid peripheral component interconnection card 3 to be inserted. In more detail, a golden finger 32 of the rapid peripheral component interconnection card 3 is correspondingly inserted into the rapid peripheral component interconnection connector 13. A bracket 31 of the rapid peripheral component interconnection card 3 is correspondingly accommodated in the bracket accommodating hole H1 of the first jig 11, as shown in the fifth figure.

Then, the bracket fixing screw 14 will correspondingly penetrate the bracket 31 and the first fixing hole H2 in order to fix the rapid peripheral component interconnection card 3 to the first jig 11, as shown in the sixth figure. At this time, the rapid peripheral component interconnection card vibration test fixture set 1 can fix the rapid peripheral component interconnection card 3 to the vibration test equipment 2 and allow the vibration test equipment 2 to perform a vibration test on the rapid peripheral component interconnection card 3 Job, as shown in the seventh figure.

In this embodiment, the vibration test equipment 2 includes a test board 21, a test platform 22, a fixed board 23 and a plurality of fixed posts 24. The vibration test equipment 2 usually performs vibration test operations after power-on, and analyzes the test object, which is roughly the same as the general vibration test equipment, so it will not be repeated. The vibration test equipment 2 performs a vibration test operation on the rapid peripheral component interconnection card 3. The drawing is a schematic diagram of repetitive vibration along a first vibration direction D1 and a second vibration direction D2, but it is not limited thereto. The vibration direction of the vibration test operation usually depends on the vibration test equipment 2. At present, the existing vibration test equipment 2 can perform vibration test operations in the X-axis direction, the Y-axis direction and the Z-axis direction.

When the bracket 31 of the rapid peripheral component interconnection card 3 is accommodated in the bracket accommodating hole H1 of the first jig 11, the golden finger 32 of the rapid peripheral component interconnection card 3 is inserted into the rapid peripheral component interconnection connector 13 At this time, the rapid peripheral component interconnection card 3 in the assembled state can be simulated. In addition, the rapid peripheral component interconnection card vibration test fixture set 1 is detachably assembled on the test board 21 of the vibration test equipment 2. Therefore, when the vibration test equipment 2 is performing a vibration test operation, it can be regarded as performing a vibration test operation on the rapid peripheral component interconnection card 3 in an assembled state.

In addition, in order for the vibration test operation to proceed smoothly, the material and structure of the first jig 11 and the second jig 12 need to be such that no resonance occurs at the vibration frequency of the vibration test operation. Generally, the upper limit of the vibration frequency is about 500Hz. After the material and structure of the first jig 11 and the second jig 12 are analyzed, it is true that resonance does not occur when the vibration frequency is below 500 Hz.

In summary, the rapid peripheral component interconnection card vibration test fixture set provided by the present invention uses the first fixture, the second fixture, the rapid peripheral component interconnection connector and the bracket fixing screws to accommodate and fix The rapid peripheral component interconnection card is used to simulate the assembly state of the rapid peripheral component interconnection card, and the rapid peripheral component interconnection card in the assembled state is fixed to the vibration test equipment for the vibration test equipment to vibrate the rapid peripheral component interconnection card Test assignments. Therefore, compared with the prior art, the vibration test equipment can perform vibration test operations on the fast peripheral component interconnection card that simulates the assembled state, and evaluate the vibration (which may be caused by the external environment, host, server or other factors). The impact or even damage caused by the rapid peripheral component interconnection card in the assembled state, and the structure of the rapid peripheral component interconnection card is improved, reinforced and optimized, which can further avoid the rapid peripheral component interconnection card during use. There is a functional problem.

Through the detailed description of the above preferred embodiments, it is hoped that the characteristics and spirit of the present invention can be described more clearly, and the scope of the present invention is not limited by the preferred embodiments disclosed above. On the contrary, the purpose is to cover various changes and equivalent arrangements within the scope of the patent for which the present invention is intended.

1: Rapid peripheral component interconnection card vibration test fixture set 11: The first fixture 12: The second fixture 121: The second body 122: second cover 123: second base 124: cover fixing screw 13: Fast peripheral component interconnection connector 14: Bracket fixing screws 15: The first locking screw 16: The second locking screw 2: Vibration test equipment 21: Test board 22: test platform 23: fixed plate 24: fixed column 3: Fast peripheral component interconnection card 31: Bracket 32: gold finger D1: The first vibration direction D2: Second vibration direction H1: Bracket receiving hole H2: The first fixing hole H3: The first locking hole H4: The second locking hole H5: Second fixing hole H6: Body lock hole H7, H8: Test board through hole T: Connector accommodating slot

The first figure is a three-dimensional view of the vibration test fixture set for the rapid peripheral component interconnection card provided by the preferred embodiment of the present invention; The second figure is an exploded view of the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention; The third figure is an exploded view showing the rapid peripheral component interconnection card vibration test fixture set and the test board of the vibration test equipment provided by the preferred embodiment of the present invention; The fourth figure is a perspective view showing the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention assembled on the test board of the vibration test equipment; The fifth figure is an exploded view showing the rapid peripheral component interconnection card vibration test fixture set and the rapid peripheral component interconnection card provided by the preferred embodiment of the present invention; The sixth figure is a perspective view showing the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention to fix the rapid peripheral component interconnection card to the test board of the vibration test equipment; and The seventh figure is a perspective view showing the rapid peripheral component interconnection card vibration test fixture set provided by the preferred embodiment of the present invention to fix the rapid peripheral component interconnection card to the vibration test equipment.

1: Rapid peripheral component interconnection card vibration test fixture set

11: The first fixture

121: The second body

122: second cover

123: second base

124: cover fixing screw

13: Fast peripheral component interconnection connector

14: Bracket fixing screws

15: The first locking screw

16: The second locking screw

H1: Bracket receiving hole

H2: The first fixing hole

H3: The first locking hole

H4: The second locking hole

H5: Second fixing hole

H6: Body lock hole

T: Connector accommodating slot

Claims (9)

A rapid peripheral component interconnection card vibration test fixture set is detachably assembled on a test board of a vibration test equipment for fixing a rapid peripheral component interconnection card to the vibration testing equipment for the vibration testing equipment Perform a vibration test operation on the fast peripheral component interconnection card, and include: A first jig is provided with a bracket accommodating hole and a first fixing hole, and is locked to the test board by a first locking means, and the bracket accommodating hole is used for accommodating the One of the brackets of the rapid peripheral component interconnection card; A second jig has a connector accommodating groove and is locked to the test board by a second locking means; A fast peripheral component interconnection connector, fastened to the connector accommodating slot, for a golden finger of the fast peripheral component interconnection card to be inserted and connected; and A bracket fixing screw is correspondingly penetrated through the bracket and the first fixing hole, so that the rapid peripheral component interconnection card is fixed to the first fixture. The rapid peripheral component interconnection card vibration test fixture set according to claim 1, further comprising at least one first locking screw, and the first locking means is correspondingly penetrated by the at least one first locking screw At least one first locking hole of the first jig is used to fix the first jig to the test board. The rapid peripheral component interconnection card vibration test fixture set according to claim 2, wherein the number of the at least one first locking screw is four. The rapid peripheral component interconnection card vibration test fixture set according to claim 1, wherein the second fixture includes: A second body; A second cover body is connected and fixed to the second body, and forms the connector accommodating groove with the second body; and A second base is connected to the second body and has at least one second locking hole. The rapid peripheral component interconnection card vibration test fixture set according to claim 4, which further includes at least one second locking screw, and the second locking means utilizes the at least one second locking screw correspondingly The at least one second locking hole of the second base is penetrated so as to lock the second jig to the test board. The rapid peripheral component interconnection card vibration test fixture set according to claim 5, wherein the number of the at least one second locking screw is three. The rapid peripheral component interconnection card vibration test fixture set according to claim 4, wherein the second fixture further includes at least one cover fixing screw, and the at least one cover fixing screw is used for corresponding penetration At least one cover through hole of the second cover is used to fix the second cover to the second body. The rapid peripheral component interconnection card vibration test fixture set according to claim 7, wherein the at least one cover through hole is opened corresponding to the connector accommodating groove. The rapid peripheral component interconnection card vibration test fixture set according to claim 8, wherein the number of the at least one cover fixing screw is three.

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