TWI632384B - Measuring apparatus for ic pins and its measuring method thereof - Google Patents

Abstract

The invention provides a measuring device comprising: N comparators and M channels, each pass The channel is connected to one of a plurality of consecutive feet of a test object, and each channel is respectively connected to one of the comparators, wherein each channel has a switch; wherein the channels At least one channel subgroup is formed by dividing into N groups in sequence, and the channels in each channel subgroup are sequentially connected to the first to N comparators.

Description

IC pin measuring device and measuring method thereof

The invention relates to a measuring device and a measuring method thereof, in particular to a measuring device suitable for measuring a foot of an integrated circuit and a measuring method thereof.

The existing integrated circuit (IC) measuring device is designed to allow the user to arbitrarily arrange the position of the IC to be tested, and therefore each channel on the measuring device for connecting the IC pin (Channel) ) Connect a comparator to facilitate the writing of the test program. However, in actual use, only a part of the comparators are used, and the unused comparators remain idle. Therefore, this design often causes the cost of the measuring equipment to increase, the size becomes larger, and the waste of resources is a concern.

In view of this, the present invention provides a measuring device and a measuring method to solve the above problems.

An object of the present invention is to provide a measuring apparatus comprising: N comparators, N is a positive integer of 1 or more; and M channels, M is a positive integer greater than N, and each channel is used for a test object One of a plurality of consecutive feet is connected, and each channel is respectively associated with one of the comparators a connection, wherein each channel has a switch; wherein the channels are sequentially grouped into N groups to form at least one channel subgroup, and the channels in each channel subgroup are sequentially and the first Connect to N comparators.

In an embodiment, the channels are sequentially grouped by N, and have the remaining a channels, and the a channels are sequentially connected to the first to a comparators, wherein a is smaller than A positive integer of N.

In an embodiment, when the object to be tested has i consecutive feet and is respectively connected to one of the channels of the channels, the switches on the i channels are respectively turned on, so that the i channels are connected. The comparator performs the measurement of the pins during the period in which the corresponding switch is turned on, where i is a positive integer not greater than M.

In one embodiment, the open relationships on the i channels are sequentially turned on.

Another object of the present invention is to provide a measuring method, which is implemented in a measuring device, which includes N comparators and M channels, each channel being used for a plurality of consecutive legs with an object to be tested. One of the bits is connected, each channel is connected to one of the comparators, and each channel has a switch, and the channels are sequentially grouped by N to form at least one channel subgroup Groups, and the channels in each channel subgroup are sequentially connected to the first to N comparators, wherein N is a positive integer of 1 or more, and M is a positive integer greater than N, and the measurement method includes the following steps : connecting a plurality of consecutive pins of the object to be tested to one of the channels; and by controlling switches on the channels, causing the comparator to perform a plurality of consecutive pins of the object to be tested Measurement.

In an embodiment, the channels are sequentially divided into N groups and have the remaining a channels, and the a channels are sequentially connected to the first to a comparators, wherein a is less than N. Positive integer.

In an embodiment, the measuring method further comprises the steps of: when the object to be tested has i consecutive feet and is respectively connected to one of the channels of the channels, respectively, the switches on the i channels are respectively turned on, The comparators connected to the i channels are measured during the period in which their corresponding switches are turned on, where i is a positive integer not greater than M.

In an embodiment, the measuring method further comprises the steps of: when the first pin of the object to be tested corresponds to the bth comparator, respectively turning on the switches corresponding to the bth to Nth comparators, wherein b Is a positive integer not greater than N.

In an embodiment, the measuring method further comprises the steps of: respectively, when the switches corresponding to the b-th to N-th comparators are turned on, respectively, the switches corresponding to the continuous feet that have not been measured by the object to be tested are respectively turned on.

In an embodiment, the measuring method further comprises the steps of: the open relationship on the bth to the Nth channels is sequentially turned on, and the open relationship corresponding to the continuous pin positions that have not been measured by the object to be tested is sequentially turned on.

10‧‧‧Measurement equipment

20‧‧‧Channel unit

30‧‧‧Switch unit

40‧‧‧Comparative unit

50‧‧‧Test IC

DP ₁ -DP _M ‧‧‧ channel

SW ₁ -SW _M ‧‧‧Switch

CP ₁ -CP _N ‧‧‧ comparator

SDP ₁ -SDP ₂ ‧‧‧Channel Subgroup

PIN ₁ -PIN _i ‧‧‧ feet

S41-S45‧‧‧Steps

S51-S54‧‧‧Steps

S61-S64‧‧‧Steps

S61'-S64'‧‧‧ steps

1 is a schematic diagram showing the basic structure of a measuring device according to an embodiment of the present invention.

FIG. 2(A) is a schematic diagram showing the circuit structure of a measuring device according to an embodiment of the present invention.

2(B) is a schematic view showing the detailed circuit structure of the measuring device according to an embodiment of the present invention.

FIG. 3(A) is a schematic diagram showing the connection manner of the measuring device and the object to be tested according to an embodiment of the present invention.

FIG. 3(B) is a schematic diagram showing another connection manner of the measuring device and the object to be tested according to an embodiment of the present invention.

4 is a flow chart showing the basic operation method of the measuring device according to an embodiment of the present invention.

FIG. 5(A) is a schematic diagram showing an operation of the measuring device according to an embodiment of the present invention.

Fig. 5(B) is a flow chart corresponding to the detailed operation method of Fig. 5(A).

FIG. 6(A) is a schematic diagram showing an operation of a measuring device according to another embodiment of the present invention.

Fig. 6(B) is a flow chart corresponding to the detailed operation method of Fig. 6(A).

FIG. 6(C) is a schematic diagram showing an operation of the measuring device according to still another embodiment of the present invention.

Fig. 6(D) is a flow chart corresponding to the detailed operation method of Fig. 6(C).

The implementation and operation of the measuring device of the present invention will be described below through various embodiments. The features and functions of the present invention are understood by the above-described embodiments, and may be combined, modified, substituted or transferred based on the spirit of the present invention.

The term "connected" as used herein, is intended to include a direct connection or an indirect connection, and is not limiting. The word "when", "..." in this document means "present, before or after" and is not limiting.

FIG. 1 is a schematic diagram showing the basic structure of a measuring device 10 according to an embodiment of the present invention. The measuring device 10 includes a channel unit 20, a switching unit 30 and a comparing unit 40. The channel unit 20 is configured to be connected to an object to be tested 50 (for example, an IC to be tested), and is measured by the comparing unit 40 to measure the object 50. The switch unit 30 is disposed on the channel unit 20 to control whether the comparison unit 40 performs measurement.

FIG. 2(A) is a schematic diagram showing the circuit structure of the measuring device 10 according to an embodiment of the present invention, and please refer to FIG. 1 at the same time. The channel unit 20 includes M channels (DP ₁ -DP _M ), where M is a positive integer of 2 or more. The switch unit 30 includes M switches (SW ₁ -SW _M ), and each switch (SW ₁ -SW _M ) is correspondingly disposed on one channel (DP ₁ -DP _M ). The comparison unit 40 includes N comparators (CP ₁ -CP _N ), where N is a positive integer of 1 or more, and N is less than M.

In one embodiment, each of the channels includes a switch, that is, the channel DP _{1 is} provided with the switch SW ₁ , the channel DP _{2 is} provided with the switch SW ₂ , and so on, but is not limited thereto. Furthermore, the channels (DP ₁ -DP _M ) are connected to the comparators (CP ₁ -CP _N ). Since M is greater than N, a comparator may be connected to more than 2 channels.

When a pin of the object to be tested 50 is connected to one of the channels (DP ₁ -DP _M ), as long as the switch on the channel is turned on, the comparator connected to the channel measures the pin. In one embodiment, the comparator compares the voltage of the pin with a predetermined range to determine whether the pin is normal, but is not limited thereto. The present invention may also use other methods to determine whether the pin is normal.

In addition, the switches (SW ₁ -SW _M ) can be controlled in various ways, such as an external controller, etc., due to how the control switches (SW ₁ -SW _M ) conduct the conventional techniques of those skilled in the art, It is not the focus of the present invention and will not be described in detail. In addition, the switches (SW ₁ -SW _M ) may be transistors or other electronic components that can be used as switches, or mechanical switches, since the types of switches (SW ₁ -SW _M ) belong to those skilled in the art. The prior art is not the focus of the present invention and will not be described in detail.

The position on the channel can be replaced, for example, at the channel connection pin or between the channel and the comparator, and the present invention is not particularly limited.

In an embodiment, the on periods of each of the switches on the channels (DP ₁ -DP _M ) do not overlap each other. However, in other embodiments, the on periods of the N switches on the channels (DP ₁ -DP _M ) may overlap, but the comparators to which the N switches are connected must be different.

In one embodiment, the channel (DP ₁ -DP _M ) is sequentially grouped into N groups to form at least one channel subgroup, and the channels in each channel subgroup are sequentially connected to the first to N comparators are connected. In addition, when the channel (DP ₁ -DP( _M )) is sequentially grouped by N and has the remaining a channels, the a channels are sequentially connected to the first to a comparators. Where a is a positive integer less than N.

The detailed circuit structure of the present invention will be described below.

FIG. 2(B) is a schematic diagram showing the circuit details of the measuring device 10 according to an embodiment of the present invention. Please refer to FIGS. 1 to 2(B) at the same time. This embodiment will be described with N being 128 and M being 259. Since the circuit structure of this embodiment is similar to that of Fig. 2(A), some of the repeated elements are not described here and are not shown in Fig. 2(B).

In this embodiment, the channels (DP ₁ -DP ₂₃₀ ) are sequentially grouped into 128 groups to form 2 channel subgroups (SDP ₁ -SDP ₂ ), and each channel subgroup (SDP ₁ - The channels in SDP ₂ ) are sequentially connected to the first to 128 comparators. For example, the channels (DP _{1 -} DP ₁₂₈ ) in the first channel subgroup (SDP ₁ ) are respectively transmitted through the switch and the first Up to 128 comparators (CP ₁ -CP ₁₂₈ ) are connected, and the channels (DP ₁₂₉ -DP ₂₅₆ ) in the second channel subgroup (SDP ₂ ) are respectively connected to the first to 128 comparators (CP) ₁ -CP ₁₂₈ ) Connection.

In addition, since the channels (DP ₁ -DP ₂₅₆ ) are sequentially grouped into 128 groups, the remaining 3 channels (DP ₂₅₇ -DP ₂₅₉ ) are not enough to form a channel subgroup, so the channels ( The DP _{257 -} DP ₂₅₉ ) is sequentially connected to the first to third comparators (CP ₁ -CP ₃ ).

The manner in which the above channels (DP _{1 -} DP ₂₅₉ ) and the comparators (CP _{1 -} CP ₁₂₈ ) are connected is merely an example and is not a limitation of the present invention.

The various connection modes of the object to be tested 50 will be described below.

FIG. 3(A) is a schematic diagram showing the connection manner of the measuring device 10 and the object to be tested 50 according to an embodiment of the present invention, and please refer to FIG. 1 to FIG. 2(B) at the same time. In this embodiment, the object to be tested 50 has i consecutive feet (PIN _{1 -} PIN _i ), where i is a positive integer greater than 1, and i is less than or equal to M. When the pin (PIN ₁ -PIN _i ) of the object to be tested 50 is to be connected to the channel (DP ₁ -DP _M ), the first pin (PIN ₁ ) of the object to be tested 50 can be connected to the first channel ( DP ₁ ), and so on, in other words, the i-th pin (PIN _i ) is connected to the i-th channel (DP _i ).

FIG. 3(B) is a schematic diagram showing another connection manner of the measuring device 10 and the object to be tested 50 according to an embodiment of the present invention, and please refer to FIG. 1 to FIG. 3(A) at the same time. In this embodiment, when the pin position (PIN ₁ -PIN _i ) of the object to be tested 50 is to be connected to the channel (DP ₁ -DP _M ), the pin position (PIN ₁ -PIN _i ) of the object to be tested 50 is arbitrary. Connect to i consecutive channels on the channels (DP ₁ -DP _M ), connecting the first pin to the bth channel, and b is a positive integer greater than 1 and no greater than N. As shown in FIG. 3(B), in this embodiment, b is 3, that is, the first pin (PIN ₁ ) of the object to be tested 50 can be connected to the third channel (DP ₃ ), and so on. Therefore, the i-th pin (PIN _i ) is connected to the (3+i)th channel (DP _(3+i) ).

The manner in which the pins (PIN _{1 -} PIN _i ) of the object 50 to be tested are connected to the channels (DP _{1 -} DP _M ) is merely an example and is not a limitation of the present invention.

4 is a flow chart of a basic operation method of the measuring device 10 according to an embodiment of the present invention. Please refer to FIG. 1 to FIG. 3(B) at the same time. First, step S41 is performed, and i consecutive pin positions (PIN _{1 -} PIN _i ) of the object to be tested 50 are respectively connected to one of the continuous channels of the channels (DP _{1 -} DP _M ). Thereafter, step S42 is performed to respectively turn on the switches on the i channels, and the comparators connected by the i channels are in the conducting period of the switches on the i channels, and the measuring switches correspond to The pin position, wherein "respectively turned on" may be turned on sequentially or out of order. Thereafter, step S43 is performed, and when the measurement of all the feet is completed, the measuring device 10 outputs the measurement result of each of the feet, since the output of the data belongs to a conventional technique of a person having ordinary knowledge in the field, and It is not the focus of the present invention and will not be described in detail.

When the number of pins (PIN _{1 -} PIN _i ) of the object to be tested 50 is different and/or the connection mode is different, the detailed process of the method of FIG. 4 may also be different. The detailed operation flow of the device 10 to be measured will be described below.

FIG. 5(A) is a schematic diagram of an operation of the measuring device 10 according to an embodiment of the present invention, and FIG. 5(B) is a flowchart corresponding to the detailed operation method of FIG. 5(A). Figures 5(A) and 5(B) illustrate the operation when the number of feet to be tested is less than or equal to the number of comparators (i.e., i N). In this embodiment, the number of comparators is 6 (N=6), the number of channels is 15 (M=15), and the number of pins of the object 50 is 4 (i=4). The number of channel subgroups is exemplified by 2 (ie, SDP ₁ , SDP ₂ ).

In this embodiment, the first pin (PIN ₁ ) of the object to be tested 50 is connected to the second channel (DP ₂ ), that is, b=2, so the pin of the object to be tested 50 (PIN ₁ -PIN) ₄ ) Corresponding to the comparators (CP ₂ -CP ₅ ) respectively.

Fig. 5(B) is a flow chart corresponding to the detailed operation method of Fig. 5(A), and please refer to Fig. 4 at the same time. First, step S51 is executed, and the i consecutive pins of the special test IC 50 are respectively connected to the i channels in the channels (DP _{1 -} DP ₁₅ ), that is, the pin positions (PIN _{1 -} PIN ₄ ) of the object to be tested 50 are respectively connected. To the 2nd to 5th channels (DP ₂ -DP ₅ ).

Thereafter, step S52 is performed to turn on the switches on the i channels, respectively. In this embodiment, the switch (SW ₂ -SW ₅₎ on the (DP ₂ -DP ₅₎ of the channels 2-5 lines are turned on, and the first 2-5 comparator (CP ₂ -CP _5), respectively The pin position (PIN ₁ -PIN ₄ ) is measured during the on period of the switch (SW ₂ -SW ₅ ), that is, when the second switch SW _{2 is} turned on, the second comparator (CP ₂ ) is paired with the first The foot position (PIN ₁ ) is measured, and so on. Among them, the switches (SW ₂ -SW ₅ ) can be turned on sequentially or out of order.

Thereafter, step S53 is performed, and when the measurement of the foot position (PIN _{1 -} PIN ₄ ) is completed, the measuring device 10 outputs the measurement result.

According to the above operation mode, since the number of pins of the object to be tested 50 is not larger than the number of comparators (ie, i N), regardless of how the pin of the object to be tested 50 is connected to the channel (for example, whether or not the first pin (PIN ₁ ) is connected to the first channel (DP ₁ )), each comparator only needs to be measured once. The measurement can complete the measurement of all the feet of the object to be tested 50.

FIG. 6(A) is a schematic diagram of an operation of the measuring device 10 according to another embodiment of the present invention, and FIG. 6(B) is a flowchart corresponding to the detailed operation method of FIG. 6(A). 6(A) and 6(B) illustrate an operation in which the number of pins of the object to be tested 50 is larger than the number of comparators (i>N).

In the embodiment of FIGS. 6(A) to 6(D), the number of comparators is exemplified by 6 (N=6), and the number of channels is exemplified by 15 (M=15), and the position of the object to be tested 50 is The number is given as 8 (i=8), and the number of channel subgroups is 2 (SDP1, SDP2).

In the embodiment of FIG. 6(A), the first pin (PIN ₁ ) of the object to be tested 50 is connected to the first channel (DP ₁ ), and is further connected to the first comparator (CP ₁ ). And so on, that is, the pin position (PIN _{1 -} PIN ₆ ) of the object to be tested 50 is connected to the first to sixth channels (DP _{1 -} DP ₆ ). In addition, the remaining pins (PIN ₇ , PIN ₈ ) of the object to be tested 50 are sequentially reconnected to the first to second channels (DP _{1 -} DP ₂ ), and further connected to the first to second comparators (CP). ₁ -CP ₂ ).

Fig. 6(B) is a flow chart corresponding to the detailed operation method of Fig. 6(A), and please refer to Fig. 4 at the same time. First, step S61 is executed, and the i consecutive pins of the special test IC 50 are respectively connected to the i channels in the channels (DP _{1 -} DP ₁₅ ), and the first pin (PIN ₁₎ corresponds to the first channel. (DP ₁ ), that is, the pin position (PIN _{1 -} PIN ₆ ) of the object to be tested 50 is connected to the 1st to 6th channels (DP _{1 -} DP ₆ ), respectively, and the remaining feet of the object to be tested 50 (PIN ₇ - PIN ₈ ) is connected to the 1st to 2nd channels (DP _{1 -} DP ₂ ), respectively.

Thereafter, step S62 is executed, and the switches (SW ₁ -SW _N ) on the channels (DP ₁ -DP _N ) to which the first to Nth pins (PIN ₁ -PIN _N ) are connected are respectively turned on, so that the first The N comparators (CP ₁ -CP _N ) measure the corresponding pin positions (PIN ₁ -PIN _N ) during the conduction of the corresponding switches (SW ₁ -SW _N ), ie the channel (DP ₁ - switch (SW ₁ -SW ₆₎ on ₆₎ DP system are turned on, and the comparator (CP ₁ -CP _6), respectively, the switch (SW ₁ -SW ₆₎ of the conduction period pin (pIN ₁ -PIN ₆ ) Perform measurements. Among them, the switches (SW ₁ -SW ₆ ) can be turned on sequentially or out of order.

Thereafter, step S63 is performed, the switch _{(SW (N + 1) -SW)} on the channel _{(DP (N + 1) -DP} i) the remaining pins _{(PIN (N + 1) -PIN} i) connected They are turned on respectively, so that the comparator corresponding to the remaining pin (PIN _{(N+1) -} PIN _i ) is turned on during the conduction of the corresponding switch (SW _{(N+1) -} SW _i ) (PIN ( _{N +1) -PIN i)} measurement was carried out, i.e., the channel (DP ₇ -DP ₈₎ switch (SW ₇ -SW ₈₎ are based on turned on and the comparator (CP ₁ -CP _2), respectively, a switch (SW of the pin (pIN ₇ -PIN ₈₎ measurement was carried out during the _on-7 -SW ₈₎ a. Among them, the switches (SW ₇ -SW ₈ ) can be turned on sequentially or out of order.

It should be noted that in this embodiment, the number of remaining feet is only two, but in other embodiments, the number of remaining feet may be more. If there are more than N remaining pins, before step S63, step S621 is performed first, and the switches corresponding to the first to Nth pins in the remaining pins are turned on, thereby making the remaining pins The first to Nth positions are measured and repeatedly executed until the number of remaining feet is less than N, after which step S63 is performed. In other words, after the execution of step S62, if there are less than N remaining feet, step S63 is directly performed.

Thereafter, step S64 is executed, and when the measurement of all the feet is completed, the measuring device 10 outputs the measurement result.

Next, an embodiment of Fig. 6(C) will be described.

FIG. 6(C) is a schematic diagram of an operation of the measuring device 10 according to still another embodiment of the present invention, and FIG. 6(D) is a flowchart corresponding to the detailed operation method of FIG. 6(C). 6(C) and 6(D) illustrate another operation when the number of pins of the object to be tested 50 is larger than the number of comparators (i>N).

In the embodiment of FIG. 6(C), the first pin (PIN ₁ ) of the object to be tested 50 is connected to the fourth channel (DP ₄ ), and is further connected to the fourth comparator (CP ₄ ). And so on, that is, the first to third feet (PIN _{1 -} PIN ₃ ) of the object to be tested 50 are connected to the 4th to 6th channels (DP _{4 -} DP ₆ ), respectively. In addition, the 4th to 8th pins (PIN ₄ -PIN ₈ ) of the object to be tested 50 are sequentially connected to the 7th to 12th channels (DP _{7 -} DP ₁₂ ), and further connected to the 1st to 5th comparators. (CP ₁ -CP ₅ ).

Fig. 6(D) is a flow chart corresponding to the detailed operation method of Fig. 6(C), and please refer to Fig. 4 at the same time. First, step S61' is executed, and i consecutive pins of the object 50 are respectively connected to i channels in the channels (DP _{1 -} DP ₁₅ ), wherein the first pin (PIN1 ₎ corresponds to the bth The channel (DP _b ), that is, the pin (PIN _{1 -} PIN ₃ ) of the object to be tested 50 is connected to the channel (DP _{4 -} DP ₆ ), respectively, and the remaining pin (PIN _{4 -} PIN ₈ ) of the object to be tested 50 is The sequence is connected to the channel (DP ₇ -DP ₁₂ ) and to the comparator (CP ₁ -CP ₅ ).

Thereafter, step S62' is executed, and the switch (SW on the channel (DP _b -DP _N ) to which the first to (N-b+1)th pin (PIN ₁ -PIN _(N-b+1) ) is connected is connected. _b -SW _N ) are respectively turned on, so that the b-th comparator (CP _b -CP _N ) is paired with the corresponding pin (PIN ₁ -PIN ₍ during the conduction of the corresponding switch (SW _b -SW _N )) _N-b+1) ) is measured, that is, the switches (SW ₄ -SW ₆ ) on the channel (DP ₄ -DP ₆ ) are respectively turned on, and the comparators (CP ₄ -CP ₆ ) are respectively switched (SW) _The pin position (PIN _{1 -} PIN ₃ ) is measured during the on-time of ₄ -SW ₆ ). Among them, the switches (SW ₄ -SW ₆ ) can be turned on sequentially or out of order.

Thereafter, step S63' is executed to turn on the switch (SW _(N+1) ) on the channel (DP _{(N+1) -} DP _i ) to which the remaining pin (PIN( _{N-b+2) -} PIN _i ) is connected. -SW _i ), so that the comparator corresponding to the remaining pin (PIN _{(N-b+2) -} PIN _i ) is turned on during the conduction of the corresponding switch (SW _{(N+1) -} SW _i ) _(N-b+2) -PIN _i ) is measured, ie the switches (SW ₇ -SW ₁₂ ) on the channel (DP ₇ -DP ₁₂ ) are respectively turned on, and the comparators (CP ₁ -CP ₅ ) are respectively The foot position (PIN _{5 -} PIN ₈ ) is measured during the conduction of the switch (SW _{7 -} SW ₁₂ ). Among them, the switches (SW ₇ -SW ₁₂ ) can be turned on sequentially or out of order.

It should be noted that in this embodiment, the number of remaining pins is only five, but in other embodiments, the number of remaining pins may be more. If there are more than N remaining legs, then steps are performed. Before S63', step S621' is performed first, respectively, the switches corresponding to the first to N pin positions in the remaining pin positions are turned on, so that the first to N pin positions in the remaining pin positions are measured and repeated. Execution until the number of remaining feet is less than N, and then step S63' is performed. In other words, after the execution of step S62', if there are less than N remaining feet, step S63' is directly performed.

Thereafter, step S64' is performed, and when the measurement of all the feet is completed, the measuring device 10 outputs the measurement result.

The number of pins of the object to be tested, the number of channels, the number of switches, and the number of comparators in the above embodiments are merely examples, and actually more may be used. In addition, the order of measurement of each pin can also be changed by controlling the conduction of the switch, and is not limited to the above embodiment.

Thereby, the present invention can connect the continuous foot of the object to be tested to any channel of the measuring device, and can reduce the number of comparators, so that the overall cost is reduced, and at the same time, too much idle components can be avoided and waste. In addition, the invention can also reduce the overall volume of the measuring device, can reduce the use space of the clean room, and improve the utilization rate of the production capacity.

The above-mentioned embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

Claims (10)

An IC pin measurement device, comprising: N comparators, N is a positive integer of 2 or more; and M channels, M is a positive integer greater than N, and each channel is used for a plurality of consecutive objects with a test object One of the pins is connected, and each channel is respectively connected to one of the comparators, wherein each channel has a switch; wherein the channels are sequentially formed by N in groups A channel subgroup, and the channels in each channel subgroup are sequentially connected to the first to N comparators, and the channel channels in each channel subgroup are respectively connected to different comparators. The IC foot measuring device according to claim 1, wherein the channels are sequentially divided into N groups and have remaining a channels, and the a channels are sequentially connected to the first channel. To a comparator connection, where a is a positive integer less than N. The IC foot measuring device according to claim 2, wherein when the object to be tested has i consecutive feet and is respectively connected to one of the channels of the channels, the switches on the i channels are respectively Is turned on, such that the comparators connected to the i channels perform the measurement of the pins during the period in which the corresponding switches are turned on, where i is a positive integer not greater than M. The IC pin measurement device according to claim 3, wherein the open relationships on the i channels are sequentially turned on. An IC pin measurement method is implemented in an IC pin measurement device, the measurement device includes N comparators and M channels, each channel being used for a plurality of consecutive pins of a test object. One of the connections is connected to each of the comparators, and each of the channels has a switch, and the channels are sequentially grouped by N to form at least one channel subgroup. And each channel The channels in the group are sequentially connected to the first to N comparators, and the channels in each channel subgroup are respectively connected with different comparators, wherein N is a positive integer of 2 or more, and the M system is greater than N. a positive integer, the measuring method comprising the steps of: connecting a plurality of consecutive feet of the object to be tested to one of the channels; and by controlling a switch on the channels, causing the comparator to A plurality of consecutive feet of the object to be tested are measured. The IC pin measurement method according to claim 5, wherein the channels are sequentially grouped into N groups and have remaining a channels, and the a channels are sequentially connected to the first channel. Connect to a comparator, where a is a positive integer less than N. The method for measuring an IC foot position according to claim 6, wherein the method further comprises the step of: when the object to be tested has i consecutive feet and is respectively connected to one of the continuous channels of the channels, The switches on the i channels are respectively turned on, so that the comparators connected to the i channels perform the measurement of the pins during the period in which the switches corresponding to the i channels are turned on, where i is not greater than M. Positive integer. The method for measuring an IC pin position according to claim 7 , further comprising the step of: when the first pin of the object to be tested corresponds to the bth comparator, the first to (N-b+) 1) The switches corresponding to the pins are respectively turned on, so that the bth to Nth comparators measure the 1st to (N-b+1)th pins, where b is a positive integer greater than 0 and not greater than N . The method for measuring an IC pin position according to Item 8 of the patent application, further comprising the step of: when the switches corresponding to the b-th N comparator are respectively turned on, the continuous leg of the object to be tested has not been measured. The switches corresponding to the bits are turned on respectively. The IC pin measurement method according to claim 9, wherein the open relationship on the bth to Nth channels is sequentially turned on, and the open relationship corresponding to the continuous pin that has not been measured by the object to be tested is determined according to The sequence is turned on.