[go: up one dir, main page]

TWI630715B - System for optimizing fabrication parameters of oled - Google Patents

System for optimizing fabrication parameters of oled Download PDF

Info

Publication number
TWI630715B
TWI630715B TW103136343A TW103136343A TWI630715B TW I630715 B TWI630715 B TW I630715B TW 103136343 A TW103136343 A TW 103136343A TW 103136343 A TW103136343 A TW 103136343A TW I630715 B TWI630715 B TW I630715B
Authority
TW
Taiwan
Prior art keywords
parameter
oled
characteristic
optimized
emitting diode
Prior art date
Application number
TW103136343A
Other languages
Chinese (zh)
Other versions
TW201616647A (en
Inventor
韋安琪
李俊宏
杜修銘
Original Assignee
國立中央大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 國立中央大學 filed Critical 國立中央大學
Priority to TW103136343A priority Critical patent/TWI630715B/en
Publication of TW201616647A publication Critical patent/TW201616647A/en
Application granted granted Critical
Publication of TWI630715B publication Critical patent/TWI630715B/en

Links

Landscapes

  • Electroluminescent Light Sources (AREA)

Abstract

本發明為有機發光二極體(OLED)製程參數優化系統,其包括:一運算模組;一輸入模組;一輸出模組;以及一儲存單元。運算模組又具有:一電特性參數運算分析單元;一熱特性參數運算分析單元;一光特性參數運算分析單元;及一參數優化單元。藉由對電特性參數、光特性參數及熱特性參數之運算與分析,不但可以分析OLED暫態效能及穩定態效能、可使系統產生之OLED目標物之特性更為接近實際OLED實體之特性、更可以進行OLED製程參數之優化、降低產品製造成本、並提升產品開發效率。 The invention relates to an organic light emitting diode (OLED) process parameter optimization system, which comprises: a computing module; an input module; an output module; and a storage unit. The operation module further has: an electrical characteristic parameter operation analysis unit; a thermal characteristic parameter operation analysis unit; an optical characteristic parameter operation analysis unit; and a parameter optimization unit. By calculating and analyzing the electrical characteristic parameters, the optical characteristic parameters and the thermal characteristic parameters, the OLED transient performance and the steady state performance can be analyzed, and the characteristics of the OLED target generated by the system can be made closer to the characteristics of the actual OLED entity. It is also possible to optimize the OLED process parameters, reduce product manufacturing costs, and improve product development efficiency.

Description

有機發光二極體(OLED)製程參數優化系統 Organic Light Emitting Diode (OLED) Process Parameter Optimization System

本發明係關於一種製程參數優化系統,特別是關於一種同時具有電特性參數運算分析單元、光特性參數運算分析單元、及熱特性參數運算分析單元的有機發光二極體(OLED)製程參數優化系統。 The invention relates to a process parameter optimization system, in particular to an organic light emitting diode (OLED) process parameter optimization system with an electrical characteristic parameter operation analysis unit, an optical characteristic parameter operation analysis unit and a thermal characteristic parameter operation analysis unit. .

隨著社會的現代化與環保節能觀念的普及,人們對於LED及OLED照明的需求度日益攀升。然而像LED及OLED這樣生活上的較新應用產品,其是否能夠受到大量使用而產生較大的節能效益,則端視LED及OLED的終端使用成本及其產品實際使用效率而定。 With the modernization of society and the popularization of environmental protection and energy conservation concepts, the demand for LED and OLED lighting is increasing. However, newer applications such as LEDs and OLEDs, whether they can be used in large quantities and generate large energy-saving benefits, depend on the terminal use cost of LEDs and OLEDs and the actual use efficiency of their products.

因此,於LED及OLED進行量產前,皆會先進行相關材料參數及製造參數之模擬、分析、訂定,以確保在量產時可以使用最正確又最有效率的製造參數,達到順利量產、製造最佳化的LED及OLED、與降低成本之目的。 Therefore, before the mass production of LEDs and OLEDs, the simulation, analysis and setting of relevant material parameters and manufacturing parameters will be carried out first to ensure that the most accurate and efficient manufacturing parameters can be used in mass production to achieve a smooth amount. Production and manufacturing of optimized LEDs and OLEDs, and the purpose of reducing costs.

然而,現今所開發的系統結構或模擬軟體,對材料 參數及製造參數之模擬、分析、訂定,卻僅止於材料及製造參數之光學或電學特性,其雖亦能用來作為製程參考,但所得的結果卻無法全面涵蓋所有相關之特徵,與實務較有差距,而難以獲得較佳的優化結果。 However, today's developed system structures or simulation software, for materials The simulation, analysis and setting of parameters and manufacturing parameters are only based on the optical or electrical properties of the materials and manufacturing parameters. Although they can be used as a process reference, the results obtained cannot fully cover all relevant features. There are gaps in practice, and it is difficult to obtain better optimization results.

有鑑於此,一種可以針對材料參數所有技術參數進行模擬,並可產生出最佳化的製造參數之有機發光二極體(OLED)製程參數優化系統,變成為現今OLED製造產業及應用領域的一個關鍵性重大創新。 In view of this, an organic light-emitting diode (OLED) process parameter optimization system that can simulate all the technical parameters of material parameters and can produce optimized manufacturing parameters becomes one of the current OLED manufacturing industries and application fields. Key and major innovations.

本發明為有機發光二極體(OLED)製程參數優化系統,其包括:一運算模組;一輸入模組;一輸出模組;以及一儲存單元。運算模組又具有:一電特性參數運算分析單元;一熱特性參數運算分析單元;一光特性參數運算分析單元;及一參數優化單元。藉由本發明之實施,不但可以分析OLED暫態效能及穩定態效能、可使系統產生之OLED目標物之特性更為接近實際OLED實體之特性、更可以進行OLED製程參數之優化、降低產品製造成本、並提升產品開發效率。 The invention relates to an organic light emitting diode (OLED) process parameter optimization system, which comprises: a computing module; an input module; an output module; and a storage unit. The operation module further has: an electrical characteristic parameter operation analysis unit; a thermal characteristic parameter operation analysis unit; an optical characteristic parameter operation analysis unit; and a parameter optimization unit. Through the implementation of the invention, not only the OLED transient performance and the steady state performance can be analyzed, the characteristics of the OLED target generated by the system can be made closer to the characteristics of the actual OLED entity, the OLED process parameters can be optimized, and the manufacturing cost can be reduced. And improve product development efficiency.

本發明係提供一種有機發光二極體(OLED)製程參數優化系統,其包括有:一運算模組,其具有:一電特性參數運算分析單元,其係輸入OLED製造材料之至少一材料參數、OLED之至少一OLED操作條件參數及OLED之至少一電特性目標參數,加以分析及運算,產生並輸出至少一優化電特性製程參數,OLED操作條件參數可以包含來自熱特性參數運算分析單元及光 特性參數運算分析單元之輸出參數,以回饋分析熱、光效應對電的影響;一熱特性參數運算分析單元,係輸入OLED製造材料之材料參數、OLED操作條件參數及OLED之至少一熱特性目標參數,加以分析及運算,產生並輸出至少一優化熱特性製程參數,OLED操作條件參數可以包含來自電特性參數運算分析單元及光特性參數運算分析單元之輸出參數,以回饋分析電、光效應對熱的影響;一光特性參數運算分析單元,其係輸入材料參數、OLED操作條件參數及OLED之至少一光特性目標參數,加以分析及運算,產生並輸出至少一優化光特性製程參數,OLED操作條件參數可以包含來自電特性參數運算分析單元及熱特性參數運算分析單元之輸出參數,以回饋分析電、熱效應對光的影響;及一參數優化單元,分別與電特性參數運算分析單元、熱特性參數運算分析單元及光特性參數運算分析單元相連接,讀取優化電特性製程參數、優化熱特性製程參數及優化光特性製程參數,進行運算並產生及輸出至少一OLED優化製程參數;一輸入模組,與運算模組相連接,其具有至少一使用者介面,並自使用者介面讀入材料參數、OLED操作條件參數、電特性目標參數、熱特性目標參數或光特性目標參數,並將之傳送至運算模組;一輸出模組,與運算模組相連接,並讀取及輸出OLED優化製程參數及優化電特性製程參數、優化熱特性製程參數或優化光特性製程參數;以及一儲存單元,與運算模組相連接,並受運算模組控制自輸出模組輸入並儲存OLED優化製程參數及優化電特性製程參數、優化熱特性製程參數或優化光特性製程參數。 The invention provides an organic light emitting diode (OLED) process parameter optimization system, comprising: an operation module, comprising: an electrical characteristic parameter operation analysis unit, which inputs at least one material parameter of the OLED manufacturing material, At least one OLED operating condition parameter of the OLED and at least one electrical characteristic target parameter of the OLED are analyzed and operated to generate and output at least one optimized electrical characteristic process parameter, and the OLED operating condition parameter may include an operation analyzing unit and a light from the thermal characteristic parameter The output parameter of the characteristic parameter operation analysis unit is used to feedback the influence of the heat and the light effect on the electricity; the thermal characteristic parameter operation analysis unit is the material parameter of the input OLED manufacturing material, the OLED operating condition parameter and the at least one thermal characteristic target of the OLED. The parameter is analyzed and operated to generate and output at least one optimized thermal characteristic process parameter, and the OLED operating condition parameter may include an output parameter from the electrical characteristic parameter operation analysis unit and the optical characteristic parameter operation analysis unit to feedback the analysis of the electrical and optical effect pairs. The influence of heat; an optical characteristic parameter operation analysis unit, which is an input material parameter, an OLED operation condition parameter, and at least one optical characteristic target parameter of the OLED, is analyzed and operated, and generates and outputs at least one optimized optical characteristic process parameter, and the OLED operation The condition parameter may include an output parameter from the electrical characteristic parameter operation analysis unit and the thermal characteristic parameter operation analysis unit to feedback the influence of the electrical and thermal effects on the light; and a parameter optimization unit, respectively, and the electrical characteristic parameter operation analysis unit, thermal characteristics Parameter operation analysis unit and optical characteristic parameter The number operation analysis unit is connected, reads the optimized electrical characteristic process parameters, optimizes the thermal characteristic process parameters, and optimizes the optical characteristic process parameters, performs operations, and generates and outputs at least one OLED optimized process parameter; an input module is associated with the operation module Connecting, having at least one user interface, and reading material parameters, OLED operating condition parameters, electrical characteristic target parameters, thermal characteristic target parameters or optical characteristic target parameters from the user interface, and transmitting the same to the computing module; The output module is connected to the operation module, and reads and outputs the OLED optimized process parameters and the optimized electrical characteristic process parameters, optimizes the thermal characteristic process parameters or optimizes the optical characteristic process parameters; and a storage unit is connected to the operation module And controlled by the operation module to input and store OLED optimization process parameters and optimize electrical characteristic process parameters, optimize thermal characteristic process parameters or optimize optical characteristic process parameters.

藉由本發明之實施,至少可以達到下列進步功效: With the implementation of the present invention, at least the following advancements can be achieved:

一、可分析OLED暫態效能及穩定態效能。 First, the OLED transient performance and steady state performance can be analyzed.

二、可使系統產生之OLED目標物之特性更為接近實際OLED實體之特性。 Second, the characteristics of the OLED target produced by the system can be closer to the characteristics of the actual OLED entity.

三、可進行OLED製程參數之優化、降低產品製造成本、並提升產品開發效率。 Third, it can optimize the OLED process parameters, reduce product manufacturing costs, and improve product development efficiency.

為使任何熟習相關技藝者了解本發明之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本發明相關之目的及優點,因此將在實施方式中詳細敘述本發明之詳細特徵以及優點。 In order to make the technical content of the present invention known to those skilled in the art and to implement the present invention, and in accordance with the disclosure, the scope of the application, and the drawings, the related objects and advantages of the present invention can be easily understood by those skilled in the art. The detailed features and advantages of the present invention will be described in detail in the embodiments.

100‧‧‧有機發光二極體(OLED)製程參數優化系統 100‧‧‧Organic Luminescence Diode (OLED) Process Parameter Optimization System

10‧‧‧運算模組 10‧‧‧ Computing Module

11‧‧‧電特性參數運算分析單元 11‧‧‧Electrical characteristic parameter calculation analysis unit

12‧‧‧熱特性參數運算分析單元 12‧‧‧ Thermal characteristic parameter calculation analysis unit

13‧‧‧光特性參數運算分析單元 13‧‧‧Light characteristic parameter operation analysis unit

14‧‧‧參數優化單元 14‧‧‧Parameter Optimization Unit

20‧‧‧輸入模組 20‧‧‧Input module

30‧‧‧輸出模組 30‧‧‧Output module

40‧‧‧儲存單元 40‧‧‧ storage unit

第1圖係為本發明實施例之一種有機發光二極體(OLED)製程參數優化系統之組成方塊圖。 FIG. 1 is a block diagram showing the composition of an organic light emitting diode (OLED) process parameter optimization system according to an embodiment of the present invention.

請參考如第1圖所示,為實施例之一種有機發光二極體(OLED)製程參數優化系統100,其包括有:一運算模組10;一輸入模組20;一輸出模組30以及一儲存單元40。且有機發光二極體製程參數優化系統100係可以執行於一電腦系統中,讀入材料參數、OLED操作條件參數、電特性目標參數、熱特性目標參數或光特性目標參數後,進行處理,並輸出製造OLED時使用之OLED優化製程參數以及優化電特性製程參數、優化熱特性製程參數、優化光特性製程參數中之至少一參數。 Please refer to FIG. 1 , which is an organic light emitting diode (OLED) process parameter optimization system 100 of the embodiment, which includes: a computing module 10; an input module 20; an output module 30; A storage unit 40. The organic light-emitting diode process parameter optimization system 100 can be executed in a computer system, and after reading material parameters, OLED operating condition parameters, electrical characteristic target parameters, thermal characteristic target parameters or optical characteristic target parameters, processing is performed, and Outputting at least one of the OLED optimization process parameters used in the manufacture of the OLED, the optimization of the electrical characteristic process parameters, the optimization of the thermal characteristic process parameters, and the optimization of the optical characteristic process parameters.

如第1圖所示,有機發光二極體(OLED)製程參數優化系統100之運算模組10具有:一電特性參數運算分析單元11、一熱特性參數運算分析單元12、一光特性參數運算分析單元13及一參數優化單元14。 As shown in FIG. 1 , the operation module 10 of the organic light emitting diode (OLED) process parameter optimization system 100 has an electrical characteristic parameter operation analyzing unit 11 , a thermal characteristic parameter operation analyzing unit 12 , and an optical characteristic parameter operation. The analysis unit 13 and a parameter optimization unit 14.

如第1圖所示,電特性參數運算分析單元11,其係輸入OLED製造材料之至少一材料參數、OLED之至少一OLED操作條件參數及OLED之至少一電特性目標參數,加以分析及運算,產生並輸出至少一優化電特性製程參數,該OLED操作條件參數可以包含來自熱特性參數運算分析單元12及光特性參數運算分析單元13之輸出參數,以回饋分析熱、光效應對電的影響。 As shown in FIG. 1 , the electrical characteristic parameter calculation and analysis unit 11 inputs and analyzes at least one material parameter of the OLED manufacturing material, at least one OLED operating condition parameter of the OLED, and at least one electrical characteristic target parameter of the OLED. The at least one optimized electrical characteristic process parameter is generated and outputted, and the OLED operating condition parameter may include output parameters from the thermal characteristic parameter operation analyzing unit 12 and the optical characteristic parameter operation analyzing unit 13 to feedback the influence of the thermal and optical effects on the electricity.

熱特性參數運算分析單元12,係輸入OLED製造材料之材料參數、至少一OLED操作條件參數及OLED之至少一熱特性目標參數,加以分析及運算,產生並輸出至少一優化熱特性製程參數,該OLED操作條件參數可以包含來自電特性參數運算分析單元11及光特性參數運算分析單元13之輸出參數,以回饋分析電、光效應對熱的影響。 The thermal characteristic parameter operation analyzing unit 12 is configured to input a material parameter of the OLED manufacturing material, at least one OLED operating condition parameter, and at least one thermal characteristic target parameter of the OLED, analyze and calculate, and generate and output at least one optimized thermal characteristic process parameter. The OLED operating condition parameter may include output parameters from the electrical characteristic parameter operation analyzing unit 11 and the optical characteristic parameter operation analyzing unit 13 to feedback the influence of the electrical and optical effects on the heat.

光特性參數運算分析單元13,其係輸入OLED製造材料之材料參數、至少一OLED操作條件參數及OLED之至少一光特性目標參數,加以分析及運算,產生並輸出至少一優化光特性製程參數,該OLED操作條件參數可以包含來自電特性參數運算分析單元11及熱特性參數運算分析單元12之輸出參數,以回饋分析電、熱效應對光的影響。 The optical characteristic parameter operation analyzing unit 13 is configured to input a material parameter of the OLED manufacturing material, at least one OLED operating condition parameter, and at least one optical characteristic target parameter of the OLED, analyze and calculate, and generate and output at least one optimized optical characteristic process parameter. The OLED operating condition parameter may include output parameters from the electrical characteristic parameter operation analyzing unit 11 and the thermal characteristic parameter operation analyzing unit 12 to feedback the influence of the electrical and thermal effects on the light.

參數優化單元14,係分別與電特性參數運算分析單元11、熱特性參數運算分析單元12及光特性參數運算分析單元 13相連接,讀取優化電特性製程參數、優化熱特性製程參數及優化光特性製程參數,進行運算並產生及輸出至少一OLED優化製程參數。 The parameter optimization unit 14 is respectively an electrical characteristic parameter operation analysis unit 11, a thermal characteristic parameter operation analysis unit 12, and an optical characteristic parameter operation analysis unit. The 13-phase connection reads the optimized electrical characteristic process parameters, optimizes the thermal characteristic process parameters, and optimizes the optical characteristic process parameters, performs operations, and generates and outputs at least one OLED optimized process parameter.

如此,運算模組10輸入OLED製造材料之至少一材料參數、至少一OLED操作條件參數及OLED之至少一電特性目標參數、OLED之至少一熱特性目標參數、OLED之至少一光特性目標參數,加以運算分析,可使產生之OLED目標物之特性更為接近實際OLED實體之特性,並輸出至少一OLED優化製程參數,做為正式生產OLED之製程使用之製程參數,可降低產品製造成本、並提升產品開發效率。 As such, the computing module 10 inputs at least one material parameter of the OLED manufacturing material, at least one OLED operating condition parameter, and at least one electrical characteristic target parameter of the OLED, at least one thermal characteristic target parameter of the OLED, and at least one optical characteristic target parameter of the OLED. The operation analysis can make the characteristics of the generated OLED target closer to the characteristics of the actual OLED entity, and output at least one OLED optimization process parameter, as a process parameter for the process of officially producing the OLED, which can reduce the manufacturing cost of the product, and Improve product development efficiency.

其中電特性參數運算分析單元11係可以分析在包括有熱特性參數運算分析單元12之輸出參數及光特性參數運算分析單元13之輸出參數的操作條件下,OLED之電子電洞傳輸特性、激子(excitation)特性等電特性參數,並加以回饋分析及運算並輸出至少一優化電特性製程參數。 The electrical characteristic parameter operation analyzing unit 11 can analyze the electron hole transmission characteristics and excitons of the OLED under the operating conditions including the output parameter of the thermal characteristic parameter operation analyzing unit 12 and the output parameter of the optical characteristic parameter operation analyzing unit 13. (excitation) characteristic isoelectric characteristic parameters, and feedback analysis and calculation and output at least one optimized electrical characteristic process parameter.

熱特性參數運算分析單元12係可以分析在包括有電特性參數運算分析單元11之輸出參數及光特性參數運算分析單元13之輸出參數的操作條件下,OLED之功率參數、熱場分佈等熱特性參數,並加以回饋分析及運算及輸出至少一優化熱特性製程參數。 The thermal characteristic parameter operation analyzing unit 12 can analyze thermal characteristics such as power parameters and thermal field distribution of the OLED under operating conditions including the output parameter of the electric characteristic parameter operation analyzing unit 11 and the output parameter of the optical characteristic parameter operation analyzing unit 13. Parameters, and feedback analysis and calculations and output at least one optimized thermal characteristic process parameter.

光特性參數運算分析單元13係可以分析在包括有電特性參數運算分析單元11之輸出參數及熱特性參數運算分析單元12之輸出參數的操作條件下,OLED之發光頻譜、光場分佈、光通量特性等光特性參數,並加以回饋分析及運算及輸出至少一 優化光特性製程參數。 The optical characteristic parameter operation analyzing unit 13 can analyze the illuminating spectrum, the optical field distribution, and the luminous flux characteristic of the OLED under the operating conditions including the output parameter of the electric characteristic parameter operation analyzing unit 11 and the output parameter of the thermal characteristic parameter operation analyzing unit 12. Equivalent light characteristic parameters, and feedback analysis and calculation and output at least one Optimize optical characteristics process parameters.

同樣如第1圖所示,輸入模組20,係與運算模組10相連接,輸入模組20具有至少一使用者介面,並自使用者介面讀入OLED的製造材料之至少一材料參數、OLED之至少一操作條件參數、OLED之至少一電特性目標參數、OLED之至少一熱特性目標參數或OLED之至少一光特性目標參數,並將之傳送至運算模組10。 As shown in FIG. 1 , the input module 20 is connected to the computing module 10 . The input module 20 has at least one user interface, and reads at least one material parameter of the manufacturing material of the OLED from the user interface. At least one operating condition parameter of the OLED, at least one electrical characteristic target parameter of the OLED, at least one thermal characteristic target parameter of the OLED, or at least one optical characteristic target parameter of the OLED, and transmitted to the computing module 10.

也就是說,輸入模組20係為有機發光二極體(OLED)製程參數優化系統100與使用者間之介面,並可以讀入所有前述之參數資料,並將之傳送至運算模組10進行分析及運算。 That is to say, the input module 20 is an interface between the organic light emitting diode (OLED) process parameter optimization system 100 and the user, and can read all the aforementioned parameter data and transmit it to the computing module 10 for processing. Analysis and calculation.

再如第1圖所示,輸出模組30,係與運算模組10相連接,並讀取及輸出運算模組10所產生之OLED優化製程參數及優化電特性製程參數、優化熱特性製程參數或優化光特性製程參數。 As shown in FIG. 1 , the output module 30 is connected to the computing module 10 , and reads and outputs the OLED optimized process parameters and the optimized electrical characteristic process parameters generated by the computing module 10 , and optimizes the thermal characteristic process parameters. Or optimize the optical characteristics of the process parameters.

請再參考如第1圖所示,儲存單元40,係與運算模組10相連接,並受運算模組10控制自輸出模組30輸入並儲存OLED優化製程參數及優化電特性製程參數、優化熱特性製程參數或優化光特性製程參數。 Referring to FIG. 1 again, the storage unit 40 is connected to the computing module 10, and is controlled by the computing module 10 to input and store OLED optimized process parameters and optimize electrical characteristic process parameters from the output module 30, and optimize. Thermal characteristic process parameters or optimized optical characteristics process parameters.

正式量產之時,量產製程系統可以自儲存單元40讀取,或自輸出模組30直接讀取:OLED優化製程參數及優化電特性製程參數、優化熱特性製程參數或優化光特性製程參數以進行OLED之量產製作,而可以達到降低產品製造成本並提升產品開發效率之目的。 At the time of formal mass production, the mass production process system can be read from the storage unit 40 or directly read from the output module 30: OLED optimizes process parameters and optimizes electrical characteristic process parameters, optimizes thermal characteristic process parameters, or optimizes optical characteristic process parameters. In order to mass production of OLEDs, it is possible to reduce the manufacturing cost of products and improve the efficiency of product development.

惟上述各實施例係用以說明本發明之特點,其目的 在使熟習該技術者能瞭解本發明之內容並據以實施,而非限定本發明之專利範圍,故凡其他未脫離本發明所揭示之精神而完成之等效修飾或修改,仍應包含在以下所述之申請專利範圍中。 However, the above embodiments are for explaining the features of the present invention, and the purpose thereof Equivalent modifications or modifications that may be made without departing from the spirit of the invention are intended to be included within the scope of the invention. The scope of the patent application described below.

Claims (6)

一種有機發光二極體(OLED)製程參數優化系統,其包括:一運算模組,其具有:一電特性參數運算分析單元,其係輸入該有機發光二極體的製造材料之至少一材料參數、該有機發光二極體之至少一OLED操作條件參數及該有機發光二極體之至少一電特性目標參數,加以回饋分析及運算,產生並輸出至少一優化電特性製程參數;一熱特性參數運算分析單元,其係輸入該材料參數、該OLED操作條件參數及該有機發光二極體之至少一熱特性目標參數,加以回饋分析及運算,產生並輸出至少一優化熱特性製程參數;一光特性參數運算分析單元,其係輸入該材料參數、該OLED操作條件參數及該有機發光二極體之至少一光特性目標參數,加以回饋分析及運算,產生並輸出至少一優化光特性製程參數;及一參數優化單元,分別與該電特性參數運算分析單元、該熱特性參數運算分析單元及該光特性參數運算分析單元相連接,讀取該優化電特性製程參數、該優化熱特性製程參數及該優化光特性製程參數,進行運算並產生及輸出至少一OLED優化製程參數;一輸入模組,與該運算模組相連接,其具有至少一使用者介面,並自該使用者介面讀入該材料參數、該OLED操作條件參數、該電特性目標參數、該熱特性目標參數或該光特性目標 參數,並將之傳送至該運算模組;一輸出模組,與該運算模組相連接,並讀取及輸出該OLED優化製程參數及該優化電特性製程參數、該優化熱特性製程參數或該優化光特性製程參數;以及一儲存單元,與該運算模組相連接,並受該運算模組控制自該輸出模組輸入並儲存該OLED優化製程參數及該優化電特性製程參數、該優化熱特性製程參數或該優化光特性製程參數。 An organic light emitting diode (OLED) process parameter optimization system, comprising: an operation module, comprising: an electrical characteristic parameter operation analysis unit, which inputs at least one material parameter of a manufacturing material of the organic light emitting diode And at least one OLED operating condition parameter of the organic light emitting diode and at least one electrical characteristic target parameter of the organic light emitting diode are subjected to feedback analysis and calculation to generate and output at least one optimized electrical characteristic process parameter; a thermal characteristic parameter An operation analyzing unit, which inputs the material parameter, the OLED operating condition parameter, and at least one thermal characteristic target parameter of the organic light emitting diode, and performs feedback analysis and calculation to generate and output at least one optimized thermal characteristic process parameter; The characteristic parameter operation analyzing unit inputs the material parameter, the OLED operating condition parameter and the at least one optical characteristic target parameter of the organic light emitting diode, and performs feedback analysis and operation to generate and output at least one optimized optical characteristic process parameter; And a parameter optimization unit, respectively, and the electrical characteristic parameter operation analysis unit, the thermal characteristic parameter The calculation unit and the optical characteristic parameter operation analysis unit are connected, and the optimized electric characteristic process parameter, the optimized thermal characteristic process parameter and the optimized optical characteristic process parameter are read, and the operation is performed to generate and output at least one OLED optimization process parameter; An input module coupled to the computing module, having at least one user interface, and reading the material parameter, the OLED operating condition parameter, the electrical characteristic target parameter, and the thermal characteristic target parameter from the user interface Or the light characteristic target And transmitting the parameter to the computing module; an output module connected to the computing module, and reading and outputting the OLED optimized process parameter and the optimized electrical characteristic process parameter, the optimized thermal characteristic process parameter or The optimized optical characteristic process parameter; and a storage unit connected to the computing module, and controlled by the computing module to input and store the OLED optimized process parameter and the optimized electrical characteristic process parameter from the output module, the optimization Thermal characteristic process parameters or the optimized optical characteristic process parameters. 如申請專利範圍第1項所述之有機發光二極體(OLED)製程參數優化系統,其中該OLED操作條件參數係包含該電特性參數運算分析單元、該熱特性參數運算分析單元及該光特性參數運算分析單元中之至少一者所輸出之參數。 The organic light emitting diode (OLED) process parameter optimization system according to claim 1, wherein the OLED operating condition parameter comprises the electrical characteristic parameter operation analyzing unit, the thermal characteristic parameter operation analyzing unit, and the optical characteristic. A parameter output by at least one of the parameter operation analysis units. 如申請專利範圍第1項所述之有機發光二極體(OLED)製程參數優化系統,其係執行於一電腦系統中。 For example, the organic light emitting diode (OLED) process parameter optimization system described in claim 1 is implemented in a computer system. 如申請專利範圍第1項所述之有機發光二極體(OLED)製程參數優化系統,其中該電特性參數運算分析單元係分析該有機發光二極體之電子電洞傳輸特性、激子(excitation)特性之電特性參數,並加以回饋分析與運算及輸出該優化電特性製程參數。 The method for optimizing an organic light emitting diode (OLED) process parameter according to claim 1, wherein the electrical characteristic parameter calculation unit analyzes an electron hole transmission characteristic and an exciton of the organic light emitting diode (excitation) The electrical characteristic parameters of the characteristic are fed back to the analysis and operation and output the optimized electrical characteristic process parameters. 如申請專利範圍第1項所述之有機發光二極體(OLED)製程參數優化系統,其中該光特性參數運算分析單元係分析該有機發光二極體之發光頻譜、光場分佈、光通量特性之光特性參數,並加以回饋分析及運算及輸出該優化光特性製程參數。 The method for optimizing an organic light emitting diode (OLED) process parameter according to claim 1, wherein the optical characteristic parameter calculation unit analyzes an emission spectrum, a light field distribution, and a luminous flux characteristic of the organic light emitting diode. Optical characteristic parameters, and feedback analysis and calculation and output of the optimized optical characteristic process parameters. 如申請專利範圍第1項所述之有機發光二極體(OLED)製程參數優化系統,其中該熱特性參數運算分析單元係分析該有機發光二極體之功率參數、晶片溫度、熱場分佈之熱特性參數,並加 以回饋分析及運算及輸出該優化熱特性製程參數。 The organic light emitting diode (OLED) process parameter optimization system according to claim 1, wherein the thermal characteristic parameter operation analyzing unit analyzes the power parameter, the wafer temperature, and the thermal field distribution of the organic light emitting diode. Thermal characteristic parameter The feedback analysis and operation and output of the optimized thermal characteristic process parameters are performed.
TW103136343A 2014-10-21 2014-10-21 System for optimizing fabrication parameters of oled TWI630715B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103136343A TWI630715B (en) 2014-10-21 2014-10-21 System for optimizing fabrication parameters of oled

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103136343A TWI630715B (en) 2014-10-21 2014-10-21 System for optimizing fabrication parameters of oled

Publications (2)

Publication Number Publication Date
TW201616647A TW201616647A (en) 2016-05-01
TWI630715B true TWI630715B (en) 2018-07-21

Family

ID=56508661

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103136343A TWI630715B (en) 2014-10-21 2014-10-21 System for optimizing fabrication parameters of oled

Country Status (1)

Country Link
TW (1) TWI630715B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080021571A1 (en) * 2002-11-15 2008-01-24 Yuri Kokotov Method, system and medium for controlling manufacture process having multivariate input parameters
TW201229702A (en) * 2010-11-19 2012-07-16 Applied Materials Inc Factory level process and final product performance control system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080021571A1 (en) * 2002-11-15 2008-01-24 Yuri Kokotov Method, system and medium for controlling manufacture process having multivariate input parameters
TW201229702A (en) * 2010-11-19 2012-07-16 Applied Materials Inc Factory level process and final product performance control system

Also Published As

Publication number Publication date
TW201616647A (en) 2016-05-01

Similar Documents

Publication Publication Date Title
Yuan et al. Deep machine learning of the spectral power distribution of the LED system with multiple degradation mechanisms
CN112380768A (en) BP neural network-based LED chip life prediction method
Ryu et al. Analysis of the temperature dependence of phosphor conversion efficiency in white light-emitting diodes
Sun et al. Overview of high-power LED life prediction algorithms
TWI630715B (en) System for optimizing fabrication parameters of oled
Hantos et al. Measurement issues in LED characterization for Delphi4LED style combined electrical-optical-thermal LED modeling
CN103792003B (en) Illumination efficiency based on LED information display system and the Forecasting Methodology of luminous flux
CN106529054B (en) A Modeling Method for LED Lamps Considering Inter-module Correlations
He et al. Spectral optimization of warm-white light-emitting diode lamp with both color rendering index (CRI) and special CRI of R9 above 90
CN103942414A (en) Method for calculating heat dissipation coefficient, junction temperature and luminous power of LED integrated module
Nguyen et al. An efficient method for simulating the temperature distribution in regions containing YAG: Ce3+ luminescence composites of white LED
Liu et al. Two-dimensional photothermal modeling of multichip LEDs device with thermal coupling matrix by microscopic hyperspectral imaging
Tang et al. Multi-physics simulation and reliability analysis for LED luminaires under step stress accelerated degradation test
CN110057551B (en) A method for predicting light and color properties of LED multi-chip modules
Sun et al. A SPICE-based transient thermal-electronic model for LEDs
CN105045955B (en) A kind of LED light source junction temperature value based on genetic algorithm reduces method
Kıyak et al. Lifetime Prediction for a Cell‐on‐Board (COB) Light Source Based on the Adaptive Neuro‐Fuzzy Inference System (ANFIS)
Herzog et al. Modeling spectral LED degradation using an unsupervised machine learning approach
CN101782624B (en) Method and system for estimating specifications of solid-state light-emitting element modules
Long et al. Thermal uniformity of packaging multiple light-emitting diodes embedded in aluminum-core printed circuit boards
Zurfi et al. A Novel Differential Method for Power Loss Measurement of White Light Emitting Diodes
Ding et al. High‐power single‐chip GaN‐based white LED with 3058 lm
Kang et al. Optimization and fabrication of color temperature tunable white LED luminaires
CN104504267A (en) Prediction method for luminous power of LED device
Choi et al. Temperature effect on the optical properties of YAG and silicate phosphor-based white light emitting diodes

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees