TWI620634B - Expander, breaking device and breaking method - Google Patents
Expander, breaking device and breaking method Download PDFInfo
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- TWI620634B TWI620634B TW103121611A TW103121611A TWI620634B TW I620634 B TWI620634 B TW I620634B TW 103121611 A TW103121611 A TW 103121611A TW 103121611 A TW103121611 A TW 103121611A TW I620634 B TWI620634 B TW I620634B
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- H10P54/00—
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
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- H10P72/0428—
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- H10P72/7402—
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- H10W10/00—
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- H10W10/01—
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- Mechanical Engineering (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Dicing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
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Abstract
本發明之課題在於將在一面具有功能區域、在基板上塗佈有樹脂層而成之複合基板針對每一功能區域而分斷。 The object of the present invention is to divide a composite substrate having a functional area on one side and a resin layer coated on the substrate for each functional area.
擴展器30包含多個擴展棒32a~32n,上述多個擴展棒32a~32n於平板狀之基底31以固定之間隔且以脊線成為平面之方式形成為條帶狀,並且其剖面成為圓弧狀。於將複合基板10之樹脂層12斷裂時,藉由使該擴展棒32a~32n沿著裂斷線按壓,而使龜裂進展。如此,可分斷成包含功能區域之多個晶片。 The expander 30 includes a plurality of expansion rods 32a to 32n, and the plurality of expansion rods 32a to 32n are formed into a strip shape on a flat substrate 31 at a fixed interval and a ridge line becomes a flat surface, and a cross-section thereof becomes an arc. shape. When the resin layer 12 of the composite substrate 10 is fractured, the expansion rods 32a to 32n are pressed along the fracture line to cause cracks to progress. In this way, it can be divided into a plurality of chips including functional regions.
Description
本發明係關於一種用於在半導體基板、陶瓷基板等脆性材料基板上塗佈樹脂層等而成之複合基板之斷裂之擴展器、斷裂裝置及分斷方法。 The present invention relates to a spreader, a breaking device, and a breaking method for breaking a composite substrate formed by coating a resin layer or the like on a substrate of a brittle material such as a semiconductor substrate and a ceramic substrate.
半導體晶片係藉由將形成於半導體晶圓上之元件區域於該元件區域之邊界位置分斷而製造。先前,於將晶圓分斷成晶片之情形時,藉由切割裝置使切割刀片旋轉,從而藉由切削將半導體晶圓切斷得較小。 A semiconductor wafer is manufactured by dividing an element region formed on a semiconductor wafer at a boundary position of the element region. Previously, when the wafer was divided into wafers, the dicing blade was rotated by a dicing device, so that the semiconductor wafer was cut smaller by cutting.
然而,於使用切割裝置之情形時,必需有水以排出因切削產生之排出碎屑,為了不使該水或排出碎屑對半導體晶片之性能產生不良影響,必需用以對半導體晶片實施保護且清洗掉水或排出碎屑之前後步驟。因此,有步驟變得複雜,無法削減成本或縮短加工時間之缺點。又,因使用切割刀片進行切削,故而會產生膜剝離或缺損等問題。又,於具有微小機械構造之MEMS(Micro-Electro-Mechanical Systems,微機電系統)基板中,會因水之表面張力導致構造破壞,故而不能使用水,從而產生無法藉由切割進行分斷之問題。 However, in the case of using a dicing device, water must be used to discharge the discharged debris generated by cutting. In order to prevent the water or the discharged debris from adversely affecting the performance of the semiconductor wafer, it is necessary to protect the semiconductor wafer and Before and after washing out water or draining debris. Therefore, there are disadvantages in that the steps become complicated, which cannot reduce costs or shorten processing time. In addition, since cutting is performed using a dicing blade, problems such as film peeling or chipping may occur. In addition, in a MEMS (Micro-Electro-Mechanical Systems) substrate having a micro-mechanical structure, the structure is damaged due to the surface tension of water, so water cannot be used, which causes a problem that it cannot be cut by cutting. .
又,在專利文獻1、2中提出有一種基板裂斷裝置,其係藉由對形成有劃線之半導體晶圓,自形成有劃線之面之背面,沿著劃線垂直於該面按壓而將其裂斷。以下,示出利用此種裂斷裝置之裂斷之概要。於成為裂斷對象之半導體晶圓上整齊排列地形成有多個功能區 域。於進行分斷之情形時,首先,於半導體晶圓上,在功能區域之間隔開等間隔沿縱向及橫向形成劃線。繼而,沿著該劃線利用裂斷裝置進行分斷。圖1(a)表示分斷前載置於裂斷裝置之半導體晶圓之剖面圖。如本圖所示,於複合基板101上形成有功能區域101a、101b,於功能區域101a、101b之間形成有劃線S1、S2、S3…。於進行分斷之情形時,在複合基板101之背面貼附膠帶102,在其正面貼附保護膜103。繼而,於裂斷時,如圖1(b)所示,於支承刀105、106之正中間配置應裂斷之劃線,於該情形時為劃線S2,使刀片104自其上部對準劃線下降,從而按壓複合基板101。以此方式,利用一對支承刀105、106與刀片104之三點彎曲進行裂斷。 In addition, Patent Documents 1 and 2 propose a substrate breaking device that presses a semiconductor wafer on which a scribe line is formed from the back surface of the scribe line surface and presses the scribe line perpendicularly to the surface. And break it. The outline of cracking using such a cracking device is shown below. A plurality of functional regions are formed in a neat array on a semiconductor wafer to be broken. area. In the case of breaking, first, on the semiconductor wafer, scribe lines are formed in the vertical and horizontal directions at equal intervals between the functional regions. Then, it is divided | segmented by the breaking device along this scribe line. FIG. 1 (a) is a cross-sectional view of a semiconductor wafer placed in a breaking device before singulation. As shown in this figure, functional regions 101a, 101b are formed on the composite substrate 101, and scribe lines S1, S2, S3, ... are formed between the functional regions 101a, 101b. In the case of cutting, an adhesive tape 102 is attached to the back surface of the composite substrate 101, and a protective film 103 is attached to the front surface thereof. Then, as shown in FIG. 1 (b), when the crack is broken, a scribe line that should be broken is arranged in the middle of the supporting blades 105 and 106. In this case, the scribe line S2 is used to align the blade 104 from the upper part The scribe line is lowered, thereby pressing the composite substrate 101. In this manner, the three-point bending of the pair of support blades 105, 106 and the blade 104 is used for cracking.
[專利文獻1]日本專利特開2004-39931號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2004-39931
[專利文獻2]日本專利特開2010-149495號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2010-149495
於具有此種構成之裂斷裝置中,於在裂斷時將刀片104往下壓而進行按壓之情形時,複合基板101會稍微折曲,因此,應力會集中於複合基板101與支承刀105、106之前緣接觸之部分。因此,若裂斷裝置之支承刀105、106之部分如圖1(a)所示般接觸於功能區域101a、101b,則於裂斷時對功能區域施加力。因此,存在有可能損傷半導體晶圓上之功能區域之問題。 In the cracking device having such a configuration, when the blade 104 is pressed down and pressed during the cracking, the composite substrate 101 is slightly bent, so stress is concentrated on the composite substrate 101 and the support blade 105. , 106 The part where the leading edge touches. Therefore, if the parts of the supporting blades 105 and 106 of the breaking device contact the functional areas 101a and 101b as shown in FIG. 1 (a), a force is applied to the functional area during the breaking. Therefore, there is a problem that functional regions on the semiconductor wafer may be damaged.
又,作為使用裂斷裝置進行分斷之基板,有於陶瓷基板上塗佈矽樹脂而成之複合基板。於此種複合基板中,在將陶瓷基板裂斷後,直接利用裂斷棒按壓樹脂層,於此情形時,存在樹脂層變形而易於受到損傷之問題。又,若為了解決上述問題而想要使用雷射進行分斷, 則存在因雷射之熱影響而受到損傷,或在照射雷射之後,飛濺物附著於周邊之問題。 In addition, as a substrate that is cut using a cracking device, there is a composite substrate formed by applying a silicone resin to a ceramic substrate. In such a composite substrate, after the ceramic substrate is fractured, the resin layer is directly pressed by the fracture bar. In this case, there is a problem that the resin layer is deformed and easily damaged. In addition, in order to solve the above problems, if you want to use laser to cut off, However, there is a problem that the laser beam is damaged due to the thermal influence of the laser, or after the laser is irradiated, splashes adhere to the surroundings.
本發明著眼於此種問題而完成,其目的在於能夠將脆性材料基板已經被裂斷之複合基板無損傷地斷裂。 The present invention has been made focusing on such a problem, and an object thereof is to be able to break a composite substrate in which a brittle material substrate has been fractured without damage.
為了解決該問題,本發明之擴展器於分斷複合基板時使用,該複合基板係於一面具有在縱向及橫向上整齊排列之複數個功能區域之脆性材料基板上塗佈樹脂,並且於上述脆性材料基板形成有裂斷線以分斷上述各功能區域;且該擴展器包括:平板狀之基底;及條帶狀之複數個擴展棒,其等於上述平板狀之基底上一體地形成;上述各擴展棒之各個脊線形成同一平面,並且具有上述複合基板之功能區域之間距之2以上之整數倍之間隔。 In order to solve this problem, the expander of the present invention is used when breaking a composite substrate. The composite substrate is coated with a resin on a brittle material substrate having a plurality of functional areas arranged in a vertical and horizontal direction, and the brittleness is described above. The material substrate is formed with a broken line to cut off each of the above-mentioned functional areas; and the expander includes: a flat-shaped base; and a plurality of strip-shaped expansion rods, which are integrally formed on the flat-shaped base; Each ridge line of the expansion rod forms the same plane, and has an interval of an integer multiple of 2 or more between the functional areas of the composite substrate.
為了解決該問題,本發明之斷裂裝置係將複合基板之樹脂層斷裂之斷裂裝置,該複合基板係於一面具有功能區域之脆性材料基板上塗佈樹脂,並且於上述脆性材料基板形成有裂斷線以分斷上述功能區域;上述斷裂裝置包括:工作台;彈性支撐板,其配置於上述工作台上,將形成有裂斷線之面作為上表面而保持上述複合基板;擴展器,其包含平板狀之基底及於上述基底上一體形成之條帶狀之複數個擴展棒,上述各擴展棒之各個脊線形成同一平面,並且具有上述複合基板之功能區域之間距之2以上之整數倍之間隔;移動機構,其使上述工作台沿著其面移動;及升降機構,其一面平行地保持上述複合基板與擴展棒,一面使上述擴展器朝上述彈性支撐板上之複合基板之面升降。 In order to solve this problem, the breaking device of the present invention is a breaking device that breaks a resin layer of a composite substrate. The composite substrate is coated with resin on a brittle material substrate having a functional area on one side, and a crack is formed on the brittle material substrate. The breaking device includes: a work table; an elastic support plate disposed on the work table, and holding the composite substrate with a surface on which the broken line is formed as an upper surface; and an expander including A flat substrate and a plurality of strip-shaped expansion rods integrally formed on the above substrate. Each ridge line of each of the expansion rods forms the same plane and has an integer multiple of 2 or more between the functional regions of the composite substrate. Interval; a moving mechanism that moves the table along its surface; and a lifting mechanism that holds the composite substrate and the expansion rod in parallel while lifting the expander toward the surface of the composite substrate on the elastic support plate.
為了解決該問題,本發明之分斷方法係將複合基板分斷之分斷方法,該複合基板係於一面具有在縱向及橫向上整齊排列之複數個功能區域之脆性材料基板上塗佈樹脂,並且形成有裂斷線以分斷上述各 功能區域;並且於彈性支撐板上以脆性材料基板成為上表面之方式配置上述複合基板,藉由沿著已經裂斷之線使上述擴展器之擴展棒對應於下端而往下壓上述擴展器,而將樹脂層斷裂。 In order to solve the problem, the breaking method of the present invention is a breaking method of breaking a composite substrate. The composite substrate is coated with a resin on a brittle material substrate having a plurality of functional regions arranged in a vertical and horizontal direction in a uniform manner. And a break line is formed to break each of the above Functional area; and the composite substrate is arranged on the elastic support plate so that the brittle material substrate becomes the upper surface, and the expansion rod of the expander corresponds to the lower end along the line that has been broken, and the expander is pushed down, The resin layer is broken.
為了解決該問題,本發明之分斷方法係將複合基板分斷之分斷方法,該複合基板係於一面具有在縱向及橫向上整齊排列之複數個功能區域之脆性材料基板上塗佈樹脂,並且形成有裂斷線以分斷上述各功能區域;並且於彈性支撐板上以脆性材料基板成為上表面之方式配置上述複合基板,藉由沿著已經裂斷之線使上述擴展器之上述擴展棒對應於下端而往下壓上述擴展器,使斷裂進展至樹脂層進行斷裂,藉由使上述複合基板之位置偏移相當於上述功能區域之間距之量,並再次往下壓上述擴展器,而將樹脂層斷裂。 In order to solve the problem, the breaking method of the present invention is a breaking method of breaking a composite substrate. The composite substrate is coated with a resin on a brittle material substrate having a plurality of functional regions arranged in a vertical and horizontal direction in a uniform manner. And a break line is formed to cut off each of the above-mentioned functional areas; and the composite substrate is arranged on the elastic support plate so that the brittle material substrate becomes the upper surface, and the above-mentioned expansion of the expander is extended along the line that has been broken. The rod corresponds to the lower end and presses down the expander, so that the fracture progresses to the resin layer for fracture. By shifting the position of the composite substrate by an amount equivalent to the distance between the functional regions, and then pressing the expander down again, The resin layer is broken.
此處,上述擴展器之擴展棒之下端剖面可形成為圓弧狀。 Here, the lower end section of the expansion rod of the expander may be formed in an arc shape.
根據具有此種特徵之本發明,將複合基板配置於彈性支撐板上,以條帶狀之擴展棒之最下端線對應於裂斷線之方式進行位置對準,從而進行斷裂。因此,能獲得可不損傷功能區域而沿著裂斷線將樹脂層斷裂之效果。 According to the present invention having such a feature, the composite substrate is arranged on the elastic support plate, and the bottom end line of the strip-shaped expansion rod corresponds to the break line to perform position alignment, thereby breaking. Therefore, it is possible to obtain an effect that the resin layer can be broken along the break line without damaging the functional area.
10‧‧‧複合基板 10‧‧‧ composite substrate
11‧‧‧陶瓷基板 11‧‧‧ceramic substrate
12‧‧‧矽樹脂 12‧‧‧ Silicone
13‧‧‧功能區域 13‧‧‧ Functional Area
20‧‧‧斷裂裝置 20‧‧‧ Breaking device
21‧‧‧工作台 21‧‧‧Workbench
22、25‧‧‧水平固定構件 22, 25‧‧‧Horizontal fixed members
23‧‧‧伺服馬達 23‧‧‧Servo Motor
24‧‧‧滾珠螺桿 24‧‧‧ Ball Screw
26、29‧‧‧移動構件 26, 29‧‧‧ Mobile components
27‧‧‧母螺紋 27‧‧‧female thread
28a‧‧‧支撐軸 28a‧‧‧ support shaft
28b‧‧‧支撐軸 28b‧‧‧ support shaft
30‧‧‧擴展器 30‧‧‧ Expander
31‧‧‧基底 31‧‧‧ substrate
32a~32n‧‧‧擴展棒 32a ~ 32n‧‧‧Expansion Stick
40‧‧‧彈性支撐板 40‧‧‧ Elastic support plate
50‧‧‧劃線輪 50‧‧‧ scribing wheel
51‧‧‧裂斷棒 51‧‧‧ Splitting Rod
101‧‧‧複合基板 101‧‧‧ composite substrate
101a‧‧‧功能區域 101a‧‧‧functional area
101b‧‧‧功能區域 101b‧‧‧functional area
102‧‧‧膠帶 102‧‧‧Tape
103‧‧‧保護膜 103‧‧‧ protective film
104‧‧‧刀片 104‧‧‧Blade
105‧‧‧支承刀 105‧‧‧Support knife
106‧‧‧支承刀 106‧‧‧Support knife
Bxi+1、Bxi+3、Bxi+5‧‧‧裂斷線 B xi + 1 , B xi + 3 , B xi + 5 ‧‧‧
S1‧‧‧劃線 S1‧‧‧ crossed
S2‧‧‧劃線 S2‧‧‧ crossed
S3‧‧‧劃線 S3‧‧‧ crossed
Sx1~Sxm‧‧‧刻劃預定線 S x1 ~ S xm ‧‧‧ scribe line
Sy1~Syn‧‧‧刻劃預定線 S y1 ~ S yn
圖1(a)、(b)係表示先前之半導體晶圓之裂斷時之狀態之剖面圖。 1 (a) and 1 (b) are cross-sectional views showing a state when a conventional semiconductor wafer is broken.
圖2(a)、(b)係本發明之實施形態之成為分斷對象之基板之前視圖及側視圖。 2 (a) and 2 (b) are a front view and a side view of a substrate to be cut off according to an embodiment of the present invention.
圖3係表示本實施形態之樹脂層之斷裂裝置之一例之立體圖。 Fig. 3 is a perspective view showing an example of a device for breaking a resin layer according to this embodiment.
圖4係表示本實施形態之擴展器之一例之立體圖。 FIG. 4 is a perspective view showing an example of an expander according to this embodiment.
圖5係表示本發明之實施形態之用於斷裂時之彈性支撐板之立體圖。 Fig. 5 is a perspective view showing an elastic support plate for breaking according to an embodiment of the present invention.
圖6(a)~(d)係表示該實施形態之複合基板之分斷過程之概略圖。 Figs. 6 (a) to (d) are schematic diagrams showing the breaking process of the composite substrate in this embodiment.
圖7(a)~(c)係表示該實施形態之樹脂層之分斷過程之概略圖。 Figs. 7 (a) to 7 (c) are schematic diagrams showing the breaking process of the resin layer in this embodiment.
圖8(a)~(c)係表示該實施形態之樹脂層之分斷過程之概略圖。 8 (a) to 8 (c) are schematic diagrams showing the breaking process of the resin layer in this embodiment.
繼而,對本發明之實施形態進行說明。圖2示出了作為此種基板之一例之長方形狀之形成有半導體元件之複合基板10之前視圖及側視圖。於該實施形態中,將成為分斷對象之複合基板10設為於陶瓷基板11上塗佈樹脂層、例如矽樹脂12而成之複合基板10。此處,複合基板10之僅陶瓷基板11之分斷係使刻劃垂直地延伸至基板而一次性分斷,因此將這種分斷表述為「裂斷」,而矽樹脂層12之分斷係藉由施加力使樹脂層之龜裂逐漸擴張而裂開,因此將此種分斷表述為「斷裂」。又,將複合基板10整體之分斷表述為「分斷」。於複合基板10之製造步驟中,沿著平行於x軸、y軸之線縱橫地整齊排列地以相同間距呈格子狀形成多個功能區域13。該功能區域13例如設為組入有LED(Light-Emitting Diode,發光二極體)或機械構成零件、感測器、致動器等之MEMS功能區域。而且,為了針對各功能區域進行分斷而製成半導體晶片,如一點鏈線所示,將縱向上等間隔之線設為刻劃預定線Sy1~Syn,將橫向上等間隔之線設為刻劃預定線Sx1~Sxm,功能區域之零件位於由該等刻劃預定線包圍之正方形之中央。再者,複合基板10可為正方形亦可為長方形,於圖2中設為長方形,但格子狀之功能區域為正方形,關於刻劃預定線之數量,使y方向之刻劃預定線Sy1~Syn較x方向之刻劃預定線Sx1~Sxm多。 Next, an embodiment of the present invention will be described. FIG. 2 shows a front view and a side view of a rectangular composite substrate 10 formed with a semiconductor element as an example of such a substrate. In this embodiment, the composite substrate 10 to be cut is a composite substrate 10 formed by applying a resin layer, for example, a silicone resin 12 on the ceramic substrate 11. Here, the breaking of only the ceramic substrate 11 of the composite substrate 10 is performed by extending the scribe vertically to the substrate and breaking it at one time. Therefore, this breaking is described as “cracking”, and the breaking of the silicone resin layer 12 The cracks in the resin layer are gradually expanded and cracked by the application of a force. Therefore, this division is described as "fracture". The division of the entire composite substrate 10 is referred to as "disconnection". In the manufacturing steps of the composite substrate 10, a plurality of functional regions 13 are formed in a grid pattern at the same pitch in a horizontal and vertical arrangement along lines parallel to the x-axis and y-axis. This functional area 13 is, for example, a MEMS functional area in which an LED (Light-Emitting Diode) or a mechanical component, a sensor, an actuator, or the like is incorporated. In addition, in order to divide each functional area into semiconductor wafers, as shown by a chain of dots, the lines at equal intervals in the vertical direction are set as the scribe lines S y1 to S yn , and the lines at equal intervals in the horizontal direction are set. In order to scribe the predetermined lines S x1 to S xm , the parts of the functional area are located in the center of the square surrounded by the predetermined scribe lines. In addition, the composite substrate 10 may be square or rectangular. In FIG. 2, the composite substrate 10 is rectangular. However, the grid-shaped functional area is a square. Regarding the number of the predetermined scribe lines, the y-direction scribe line S y1 ~ S yn is more than the predetermined scribe lines S x1 to S xm in the x direction.
繼而,對該實施形態之用於斷裂樹脂層之斷裂裝置20進行說明。如圖3所示,斷裂裝置20包含能夠朝y方向移動及旋轉之工作台21。於斷裂裝置20中,在工作台21之下方設置有移動機構,上述移動機構使工作台21沿著其面於y軸方向上移動,進而使工作台21沿著其面旋轉。而且,於工作台21上隔著下述彈性支撐板40載置成為分斷對 象之複合基板10。於工作台21之上部,設置有字狀之水平固定構件22,於水平固定構件22之上部保持有伺服馬達23。於伺服馬達23之旋轉軸直接連接有滾珠螺桿24,滾珠螺桿24之下端由另一水平固定構件25支撐,且使滾珠螺桿24可旋轉。上移動構件26於中央部具備與滾珠螺桿24螺合之母螺紋27,自上述上移動構件26之兩端部朝下方具備支撐軸28a、28b。支撐軸28a、28b貫通水平固定構件25之一對貫通孔而連結於下移動構件29。於下移動構件29之下表面,與工作台21之面平行地安裝有下述擴展器30。藉此,於藉由伺服馬達23使滾珠螺桿24旋轉之情形時,上移動構件26與下移動構件29成為一體而上下移動,擴展器30亦同時上下移動。此處,伺服馬達23與水平固定構件22、25、及上下之移動構件26、29構成使擴展器30升降之升降機構。 Next, a breaking device 20 for breaking a resin layer in this embodiment will be described. As shown in FIG. 3, the breaking device 20 includes a table 21 capable of moving and rotating in the y-direction. In the breaking device 20, a moving mechanism is provided below the table 21, and the moving mechanism moves the table 21 along its surface in the y-axis direction, and further rotates the table 21 along its surface. Then, the composite substrate 10 to be cut off is placed on the table 21 via the elastic support plate 40 described below. Provided above the work table 21 The horizontal fixing member 22 in the shape of a letter holds a servo motor 23 above the horizontal fixing member 22. A ball screw 24 is directly connected to the rotation shaft of the servo motor 23, and the lower end of the ball screw 24 is supported by another horizontal fixing member 25, so that the ball screw 24 can rotate. The upper moving member 26 includes a female screw 27 that is screwed with the ball screw 24 at a central portion, and includes support shafts 28 a and 28 b from both ends of the upper moving member 26 downward. The support shafts 28 a and 28 b pass through one pair of through holes of the horizontal fixing member 25 and are connected to the lower moving member 29. An expander 30 described below is mounted on the lower surface of the lower moving member 29 in parallel with the surface of the table 21. Accordingly, when the ball screw 24 is rotated by the servo motor 23, the upper moving member 26 and the lower moving member 29 are integrated and moved up and down, and the expander 30 is also moved up and down at the same time. Here, the servo motor 23, the horizontal fixed members 22, 25, and the upper and lower moving members 26, 29 constitute a lifting mechanism that raises and lowers the expander 30.
繼而,對用於斷裂時之擴展器30進行說明。例如圖4之立體圖所示,擴展器30於平面狀之基底31並排形成有多個平行之條帶狀之擴展棒32a~32n。該各擴展棒之所有脊線構成一個平面。又,擴展棒之間隔只要為固定並且為刻劃預定線之間隔之2以上之整數倍即可,於本實施形態中設為2倍。而且,各擴展棒之剖面只要為具有能夠沿著裂斷線按壓之突出部之形狀,則並無特別限定,但較佳為設為如下所述般彎曲之圓弧狀。又,擴展棒之數量較複合基板上較多之劃線之數量少一個。再者,於圖4中,為了明確表示擴展棒32a~32n,使擴展棒32a~32n成為上表面而表示,但於使用時係以擴展棒32a~32n成為下方之方式安裝於下移動構件29。 Next, the expander 30 used at the time of a break is demonstrated. For example, as shown in the perspective view of FIG. 4, the expander 30 forms a plurality of parallel strip-shaped expansion rods 32 a to 32 n side by side on a flat base 31. All the ridges of the expansion rods form a plane. In addition, the interval between the extension rods may be a fixed number and an integer multiple of two or more between the intervals for scoring a predetermined line, and in this embodiment, it is doubled. The cross-section of each expansion rod is not particularly limited as long as it has a shape capable of being pressed along a break line, but it is preferably a curved arc shape as described below. In addition, the number of expansion rods is one less than the number of more scribe lines on the composite substrate. In addition, in FIG. 4, in order to clearly show the expansion rods 32 a to 32 n and the expansion rods 32 a to 32 n are shown on the upper surface, they are mounted on the lower moving member 29 such that the expansion rods 32 a to 32 n are lowered in use. .
於本實施形態中,在斷裂複合基板10之樹脂層時使用彈性支撐板40。如圖5之立體圖所示,彈性支撐板40係長方形之平板之橡膠製治具,其大小與複合基板10相同,例如厚度設為數mm左右。 In this embodiment, the elastic support plate 40 is used when the resin layer of the composite substrate 10 is broken. As shown in the perspective view of FIG. 5, the elastic supporting plate 40 is a rectangular flat plate made of rubber jig, and its size is the same as that of the composite substrate 10, and for example, the thickness is set to about several mm.
繼而,對分斷複合基板10之方法進行說明。圖6係表示分斷過程之圖,圖6(a)表示複合基板10之一部分。首先,如圖6(b)所示,將陶 瓷基板11之面作為上表面,藉由未圖示之劃線裝置使劃線輪50移動,沿著刻劃預定線進行刻劃。從而如圖2(a)所示,形成x方向之劃線Sx1~Sxm、y方向之劃線Sy1~Syn。 Next, a method of dividing the composite substrate 10 will be described. FIG. 6 is a diagram showing a breaking process, and FIG. 6 (a) shows a part of the composite substrate 10. First, as shown in FIG. 6 (b), the surface of the ceramic substrate 11 is used as an upper surface, and a scribing wheel 50 is moved by a scribing device (not shown) to perform scribing along a predetermined scribing line. Thus, as shown in FIG. 2 (a), scribe lines S x1 to S xm in the x direction and scribe lines S y1 to S yn in the y direction are formed.
繼而,於陶瓷基板11之裂斷步驟中,如圖6(c)所示,首先使複合基板10反轉。繼而,使用未圖示之裂斷裝置,使裂斷棒51位於已經形成之劃線之正上方,藉由將裂斷棒51往下壓而僅使陶瓷基板11裂斷。 Next, in the cracking step of the ceramic substrate 11, as shown in FIG. 6 (c), the composite substrate 10 is first reversed. Then, using a cracking device (not shown), the cracking rod 51 is positioned directly above the formed scribe line, and the ceramic substrate 11 is cracked only by pressing the cracking rod 51 downward.
藉此,成為僅陶瓷基板11沿著劃線Sx1~Sxm、Sy1~Syn裂斷之狀態。圖6(d)表示沿著x方向及y方向之各劃線裂斷後之複合基板10之一部分。再者,劃線Sx1~Sxm、Sy1~Syn均被裂斷,因此以下稱為裂斷線Bx1~Bxm、By1~Byn。 As a result, only the ceramic substrate 11 is broken along the scribe lines S x1 to S xm and S y1 to Syn . FIG. 6 (d) shows a part of the composite substrate 10 after the scribe lines are broken along the x-direction and the y-direction. Further, scribing S x1 ~ S xm, S y1 ~ S yn are breaking, cracking breakage therefore hereinafter referred to as B x1 ~ B xm, B y1 ~ B yn.
繼而,如圖7所示,對使形成於陶瓷基板11之裂斷線亦延伸至矽樹脂層而結束複合基板10之分斷之方法進行說明。圖7係表示樹脂層12之斷裂過程之圖,圖7(a)表示複合基板10與彈性支撐板40及擴展棒30之一部分。首先,於上述斷裂裝置20之工作台21上配置彈性支撐板40,進而於彈性支撐板40之上表面配置複合基板10。此時,如圖7(a)所示,以抵接於彈性支撐板40之方式配置矽樹脂層12,使陶瓷基板11之面為上表面。繼而,以該擴展器30之擴展棒例如32b、32c、32d之最下部之脊線對準裂斷線方式進行定位。如此,其他擴展棒亦成為每隔一條裂斷線即在裂斷線之正上方。 Next, as shown in FIG. 7, a method of ending the breaking of the composite substrate 10 by extending the break lines formed on the ceramic substrate 11 to the silicone resin layer will be described. FIG. 7 is a diagram showing the fracture process of the resin layer 12, and FIG. 7 (a) shows a part of the composite substrate 10, the elastic support plate 40, and the extension rod 30. First, an elastic supporting plate 40 is disposed on the table 21 of the breaking device 20, and a composite substrate 10 is further disposed on the upper surface of the elastic supporting plate 40. At this time, as shown in FIG. 7 (a), the silicone resin layer 12 is disposed so as to be in contact with the elastic support plate 40 so that the surface of the ceramic substrate 11 is the upper surface. Then, positioning is performed in such a manner that the lowermost ridge lines of the expansion rods of the expander 30, such as 32b, 32c, and 32d, are aligned with the broken lines. In this way, the other expansion rods also become every other split line, just above the split line.
繼而,驅動伺服馬達23,使上移動構件26與下移動構件29同時下降,而使擴展器30之擴展棒一面相對於工作台21保持平行一面逐漸下降。繼而,如圖7(b)所示,將擴展棒32b、32c、32d、…自裂斷線Bxi+1、Bxi+3、Bxi+5、…之正上方按壓陶瓷基板11。如此,如圖7(c)所示,陶瓷基板11被各擴展棒按壓而變形,並且下沉而使彈性支撐板40同樣地變形為V字狀。此時,陶瓷基板之左右隨著各擴展棒之壓入而均勻地變形,因此能夠使龜裂沿著裂斷線延伸至下方。此處,擴展棒 之下方之剖面形狀並無特別限定,但於例如三角形狀之情形時,高精度地進行使頂點對齊裂斷線之定位之必要性相對變高。因此,為了使陶瓷基板11、矽樹脂12以此方式平衡地變形,而將各擴展棒之下方之剖面設為圓弧狀。藉此,使擴展棒之脊線對齊裂斷線之定位之精度之容許範圍相對變寬。而且,藉由使擴展棒充分下降,樹脂內之龜裂進展而對左右施加推開之力,從而結束斷裂。若斷裂結束,則使伺服馬達23反轉而使擴展器30上升。 Then, the servo motor 23 is driven to lower the upper moving member 26 and the lower moving member 29 at the same time, and the extension rod 30 of the expander 30 is gradually lowered while being kept parallel to the table 21. Then, as shown in FIG. 7 (b), the expansion rods 32 b, 32 c, 32 d,... Are broken directly above the ceramic substrate 11 by the self-split lines B xi + 1 , B xi + 3 , B xi + 5 ,... In this way, as shown in FIG. 7 (c), the ceramic substrate 11 is deformed by being pressed by the expansion rods, and is lowered to deform the elastic support plate 40 into a V shape in the same manner. At this time, since the left and right sides of the ceramic substrate are uniformly deformed as the expansion rods are pushed in, cracks can be extended downward along the crack line. Here, the cross-sectional shape below the expansion rod is not particularly limited, but in the case of a triangular shape, for example, the necessity of accurately positioning the apex-aligned break line is relatively high. Therefore, in order to deform the ceramic substrate 11 and the silicone resin 12 in this manner in a balanced manner, the cross section below each expansion rod is made into an arc shape. Thereby, the tolerance range of the positioning accuracy of the ridge line of the expansion rod to the split line is relatively widened. Further, by sufficiently lowering the extension rod, cracks in the resin progress, and a force is pushed to the left and right, thereby ending the fracture. When the break is completed, the servo motor 23 is reversed and the expander 30 is raised.
此時,在擴展器30並排形成有多個擴展棒,且其間隔為劃線之2倍,因此可使擴展棒每隔一條裂斷線之方式沿著複數條裂斷線同時裂斷矽樹脂12。 At this time, a plurality of expansion rods are formed side by side in the expander 30, and the interval is twice as long as the scribe line. Therefore, the expansion rod can be used to split the silicone resin along a plurality of crack lines at the same time every other crack line. 12.
繼而,如圖8所示,使工作台21於y軸方向上移動相當於裂斷線之間距之量。繼而如圖8(b)、(c)所示使擴展器30下降,藉此亦能針對其他鄰接之裂斷線Bxi、Bxi+2、Bxi+4、…結束樹脂層之斷裂。此處,由於擴展棒之間隔為劃線之間距之兩倍,因此藉由使工作台21偏移一次而進行斷裂便可結束複合基板10之所有x軸方向之斷裂。又,於擴展棒之間隔為劃線之間距之3倍之情形時,藉由使工作台21移動2次而進行斷裂便可結束所有x軸方向之斷裂。 Then, as shown in FIG. 8, moving the table 21 in the y-axis direction is equivalent to the distance between the broken lines. Then, as shown in FIGS. 8 (b) and 8 (c), the expander 30 is lowered, so that the break of the resin layer can also be ended for other adjacent break lines B xi , B xi + 2 , B xi + 4 ,... Here, since the interval between the extension rods is twice the distance between the scribe lines, all the x-axis fractures of the composite substrate 10 can be ended by offsetting the table 21 once and performing the fracture. In addition, in a case where the interval between the extension rods is three times the distance between the scribe lines, all the fractures in the x-axis direction can be ended by moving the table 21 twice to perform the fracture.
繼而,使工作台21旋轉90°,針對y軸之裂斷線亦同樣地使擴展器30下降,從而將樹脂層斷裂。繼而,使工作台21於y軸方向上移動相當於裂斷線之間距之量,同樣地使擴展器30下降。如此,結束整個面之斷裂,沿著各裂斷線撕開樹脂而分斷正方形狀之功能區域,從而可形成多個MEMS晶片。 Then, the table 21 is rotated by 90 °, and the expander 30 is lowered in the same manner with respect to the y-axis crack and break, thereby breaking the resin layer. Then, moving the table 21 in the y-axis direction is equivalent to the distance between the break lines, and similarly, the expander 30 is lowered. In this way, the fracture of the entire surface is ended, and the resin is torn apart along each fracture line to divide the square functional area, so that a plurality of MEMS wafers can be formed.
再者,於該實施形態中,作為成為基底之基板,對陶瓷基板進行了說明,但本發明亦可適用於半導體基板或玻璃基板等各種脆性材料基板。 Furthermore, in this embodiment, a ceramic substrate is described as a substrate serving as a base. However, the present invention is also applicable to various brittle material substrates such as a semiconductor substrate and a glass substrate.
又,於該實施形態中,作為塗佈於陶瓷基板之樹脂,對矽樹脂 進行了說明,但亦可為其他各種材質之層、例如對玻璃基板積層之偏光板等層。 In this embodiment, as the resin applied to the ceramic substrate, silicon resin Although the description has been given, it may be a layer made of other various materials, such as a polarizing plate laminated on a glass substrate.
本發明於對具有應保護之區域之脆性材料基板進行刻劃而分斷時,可不損傷應保護之區域而進行斷裂,因此,可有效地適用於形成有功能區域之基板之斷裂裝置。 The invention can be used for breaking a substrate of a brittle material having a region to be protected without damaging the region to be protected when scoring and slicing. Therefore, the invention can be effectively applied to a breaking device for a substrate having a functional region.
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| JP2017001180A (en) * | 2016-09-29 | 2017-01-05 | 三星ダイヤモンド工業株式会社 | Surface layer fracturing apparatus of brittle material substrate |
| JP6862045B2 (en) * | 2017-01-13 | 2021-04-21 | 株式会社ディスコ | Processing method |
| EP3703106A4 (en) * | 2017-10-27 | 2021-08-25 | Mitsuboshi Diamond Industrial Co., Ltd. | SUBSTRATE SEGMENTATION PROCESS CONTAINING A METAL FILM |
| JP7157301B2 (en) * | 2017-11-06 | 2022-10-20 | 株式会社東京精密 | Wafer processing method |
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- 2013-10-16 JP JP2013215395A patent/JP6119550B2/en active Active
-
2014
- 2014-06-17 KR KR20140073641A patent/KR20150044368A/en not_active Ceased
- 2014-06-23 TW TW103121611A patent/TWI620634B/en not_active IP Right Cessation
- 2014-07-01 CN CN201410309070.5A patent/CN104552628B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11162887A (en) * | 1997-12-02 | 1999-06-18 | Tokyo Seimitsu Co Ltd | Work cutting method in dicing equipment |
| JP2002151443A (en) * | 2000-11-08 | 2002-05-24 | Victor Co Of Japan Ltd | Device for cleaving semiconductor element |
| JP2004119901A (en) * | 2002-09-27 | 2004-04-15 | Sumitomo Electric Ind Ltd | Cleaving device and cleaving method |
| JP2011060822A (en) * | 2009-09-07 | 2011-03-24 | Mitsubishi Electric Corp | Method and device for separating semiconductor element |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104552628B (en) | 2017-11-10 |
| JP2015079825A (en) | 2015-04-23 |
| KR20150044368A (en) | 2015-04-24 |
| JP6119550B2 (en) | 2017-04-26 |
| CN104552628A (en) | 2015-04-29 |
| TW201515800A (en) | 2015-05-01 |
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| MM4A | Annulment or lapse of patent due to non-payment of fees |