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TWI618229B - Flexible pixel array substrate and display panel - Google Patents

Flexible pixel array substrate and display panel Download PDF

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Publication number
TWI618229B
TWI618229B TW105107869A TW105107869A TWI618229B TW I618229 B TWI618229 B TW I618229B TW 105107869 A TW105107869 A TW 105107869A TW 105107869 A TW105107869 A TW 105107869A TW I618229 B TWI618229 B TW I618229B
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peripheral
flexible
pixel array
array substrate
trace
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TW105107869A
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TW201733092A (en
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王培筠
徐明樟
陳怡倩
江丞偉
陳佳楷
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友達光電股份有限公司
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Abstract

一種可撓式畫素陣列基板,包括可撓基板、多條訊號線、至少二個薄膜電晶體以及多個畫素電極。可撓基板具有主動區以及主動區外的周邊區。多條訊號線配置於可撓基板上。至少二個薄膜電晶體陣列排列於可撓基板的主動區且與訊號線電性連接。每一薄膜電晶體包括半導體圖案、閘極、位於閘極與半導體圖案之間的第一無機絕緣圖案、與半導體圖案電性連接的源極及汲極。多個畫素電極與至少二個薄膜電晶體電性連接。特別是,至少二個薄膜電晶體的多個第一無機絕緣圖案彼此分離。此外,包括上述可撓式畫素陣列基板的顯示面板也被提出。A flexible pixel array substrate includes a flexible substrate, a plurality of signal lines, at least two thin film transistors, and a plurality of pixel electrodes. The flexible substrate has an active area and a peripheral area outside the active area. A plurality of signal lines are disposed on the flexible substrate. At least two thin film transistor arrays are arranged in the active area of the flexible substrate and electrically connected to the signal lines. Each of the thin film transistors includes a semiconductor pattern, a gate, a first inorganic insulating pattern between the gate and the semiconductor pattern, and a source and a drain electrically connected to the semiconductor pattern. The plurality of pixel electrodes are electrically connected to the at least two thin film transistors. In particular, the plurality of first inorganic insulating patterns of at least two thin film transistors are separated from each other. Further, a display panel including the above-described flexible pixel array substrate has also been proposed.

Description

可撓式畫素陣列基板以及顯示面板Flexible pixel array substrate and display panel

本發明是有關於一種畫素陣列基板及顯示面板,且特別是有關於一種可撓式畫素陣列基板及可撓式顯示面板。The present invention relates to a pixel array substrate and a display panel, and more particularly to a flexible pixel array substrate and a flexible display panel.

隨著顯示科技的發展,顯示面板應用範圍日益廣泛。舉例而言,在早期,顯示面板多用做電子裝置(例如:電視、電腦、手機等)的螢幕,而應用在電子裝置上的顯示面板多為硬質顯示面板;在近期,則有人將顯示面板應用在穿戴裝置(例如:手錶、衣服等),而應用在穿戴裝置上的顯示面板多為可撓式顯示面板。With the development of display technology, display panels are increasingly used. For example, in the early days, display panels were mostly used as screens for electronic devices (eg, televisions, computers, mobile phones, etc.), while display panels applied to electronic devices were mostly hard display panels; in the near future, some people used display panels. In a wearable device (for example, a watch, a clothes, etc.), the display panel applied to the wearable device is mostly a flexible display panel.

可撓式顯示面板需具備相當的可彎曲程度。換言之,當可撓式顯示面板彎曲時,可撓基板上的構件(例如:薄膜電晶體、資料線、掃描線、周邊走線等)需隨之彎曲並維持正常功能。然而,在習知的可撓式顯示面板中,可撓式畫素陣列基板包括至少一層整面性的無機絕緣層。當可撓式顯示面板彎曲時,較脆弱的無機絕緣層往往易斷裂,並牽連其周邊的膜層(例如:第一導電層、第二導電層等)出現裂痕,進而導致可撓式顯示面板失效。Flexible display panels require considerable flexibility. In other words, when the flexible display panel is bent, components on the flexible substrate (eg, thin film transistors, data lines, scan lines, peripheral traces, etc.) need to be bent and maintain normal functions. However, in a conventional flexible display panel, the flexible pixel array substrate includes at least one layer of a substantially planar inorganic insulating layer. When the flexible display panel is bent, the relatively fragile inorganic insulating layer tends to be broken, and the surrounding film layer (for example, the first conductive layer, the second conductive layer, etc.) is cracked, thereby causing the flexible display panel. Invalid.

本發明提供一種可撓式畫素陣列基板及顯示面板,其可彎曲程度高。The invention provides a flexible pixel array substrate and a display panel, which are highly bendable.

本發明的一種可撓式畫素陣列基板包括可撓基板、多條訊號線、至少二個薄膜電晶體以及多個畫素電極。可撓基板具有主動區以及主動區外的周邊區。多條訊號線配置於可撓基板上。至少二個薄膜電晶體陣列排列於可撓基板的主動區且與訊號線電性連接。每一薄膜電晶體包括半導體圖案、閘極、位於閘極與半導體圖案之間的第一無機絕緣圖案、與半導體圖案電性連接的源極及汲極。多個畫素電極與至少二個薄膜電晶體電性連接。特別是,至少二個薄膜電晶體的多個第一無機絕緣圖案彼此分離。A flexible pixel array substrate of the present invention comprises a flexible substrate, a plurality of signal lines, at least two thin film transistors, and a plurality of pixel electrodes. The flexible substrate has an active area and a peripheral area outside the active area. A plurality of signal lines are disposed on the flexible substrate. At least two thin film transistor arrays are arranged in the active area of the flexible substrate and electrically connected to the signal lines. Each of the thin film transistors includes a semiconductor pattern, a gate, a first inorganic insulating pattern between the gate and the semiconductor pattern, and a source and a drain electrically connected to the semiconductor pattern. The plurality of pixel electrodes are electrically connected to the at least two thin film transistors. In particular, the plurality of first inorganic insulating patterns of at least two thin film transistors are separated from each other.

本發明的另一種可撓式畫素陣列基板包括可撓基板、多條訊號線、多個薄膜電晶體、多個畫素電極以及多條周邊走線。可撓基板具有主動區以及主動區外的周邊區。多條訊號線配置於可撓基板上。薄膜電晶體陣列排列於可撓基板的主動區上且與訊號線電性連接。畫素電極與薄膜電晶體電性連接。周邊走線配置於可撓基板的周邊區上且與薄膜電晶體電性連接。可撓基板具有兩相對的第一側邊與一第二側邊。周邊走線包含在第一側邊指向第二側邊的方向上依序排列的n 條周邊走線。最靠近第一側邊的第一條周邊走線以及最靠近第二側邊的第n條周邊走線皆具有非直線部。位於第一條周邊走線和第n條周邊走線之間的周邊走線呈直線狀。Another flexible pixel array substrate of the present invention comprises a flexible substrate, a plurality of signal lines, a plurality of thin film transistors, a plurality of pixel electrodes, and a plurality of peripheral traces. The flexible substrate has an active area and a peripheral area outside the active area. A plurality of signal lines are disposed on the flexible substrate. The thin film transistor array is arranged on the active area of the flexible substrate and electrically connected to the signal line. The pixel electrode is electrically connected to the thin film transistor. The peripheral traces are disposed on the peripheral region of the flexible substrate and are electrically connected to the thin film transistor. The flexible substrate has two opposite first sides and a second side. The peripheral traces include n peripheral traces sequentially arranged in a direction in which the first side faces the second side. The first perimeter trace closest to the first side and the nth perimeter trace closest to the second side have non-linear portions. The peripheral trace between the first perimeter trace and the nth perimeter trace is linear.

基於上述,在本發明一實施例的可撓式畫素陣列基板及顯示面板中,多個薄膜電晶體的多個第一無機絕緣圖案彼此分離。換言之,材質較脆而易斷裂的第一無機絕緣層已斷成多個小塊(即多個第一無機絕緣圖案)。因此,當可撓式畫素陣列基板彎曲時,尺寸小的每一個第一無機絕緣圖案不易因可撓式畫素陣列基板的彎曲而產生裂痕。即便,某一個第一無機絕緣圖案因可撓式畫素陣列基板彎曲而產生裂痕,所述某一個第一無機絕緣圖案的裂痕也不易延伸到其他第一無機絕緣圖案上,而導致其周邊的構件(例如:汲極、源極、部份周邊走線等)受損。藉此,可撓式畫素陣列基板之主動區的可彎曲程度可提升。In the above, in the flexible pixel array substrate and the display panel of the embodiment of the invention, the plurality of first inorganic insulating patterns of the plurality of thin film transistors are separated from each other. In other words, the first inorganic insulating layer which is relatively brittle and easily broken is broken into a plurality of small pieces (ie, a plurality of first inorganic insulating patterns). Therefore, when the flexible pixel array substrate is bent, each of the first inorganic insulating patterns having a small size is less likely to be cracked by the bending of the flexible pixel array substrate. Even if a certain first inorganic insulating pattern is cracked due to the bending of the flexible pixel array substrate, the crack of the one first inorganic insulating pattern does not easily extend to the other first inorganic insulating patterns, resulting in the periphery thereof. Components (eg bungee, source, partial perimeter traces, etc.) are damaged. Thereby, the flexible region of the active region of the flexible pixel array substrate can be improved.

另一方面,在本發明一實施例的可撓式畫素陣列基板及顯示面板中,透過將最靠近可撓基板的相對二側邊的第一、n條周邊走線設計為非直線狀,且將第一、n條周邊走線中間的多條周邊走線設計為直線狀,可節省所有周邊走線的佈局(layout)空間並兼顧可撓式畫素陣列基板的可彎曲程度。On the other hand, in the flexible pixel array substrate and the display panel according to the embodiment of the present invention, the first and n peripheral traces closest to the opposite sides of the flexible substrate are designed to be non-linear. Moreover, the plurality of peripheral traces in the middle of the first and n peripheral traces are designed to be linear, which can save the layout space of all the peripheral traces and take into account the flexibility of the flexible pixel array substrate.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.

圖1為本發明一實施例之可撓式畫素陣列基板的上視示意圖。圖2A至圖2G為本發明一實施例之可撓式畫素陣列基板的製造流程上視示意圖。特別是,圖2A至圖2G的區域Ⅰ是對應圖1之可撓式畫素陣列基板100的部份主動區110a,圖2A至圖2G的區域Ⅱ是對應圖1之可撓式畫素陣列基板100的部份周邊區110b。圖3A至圖3G為本發明一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。特別是,圖3A至圖3G是對應圖2A至圖2G之剖線A-A’及B-B’。以下利用圖1、圖2A至圖2G以及圖3A至圖3G說明本發明一實施例之可撓式畫素陣列基板100的製造流程及其結構。1 is a top plan view of a flexible pixel array substrate according to an embodiment of the invention. 2A to 2G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to an embodiment of the present invention. In particular, the region I of FIGS. 2A to 2G is a partial active region 110a corresponding to the flexible pixel array substrate 100 of FIG. 1, and the region II of FIGS. 2A to 2G is a flexible pixel array corresponding to FIG. A portion of the peripheral region 110b of the substrate 100. 3A to 3G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to an embodiment of the present invention. In particular, Figs. 3A to 3G are sectional lines A-A' and B-B' corresponding to Figs. 2A to 2G. Hereinafter, a manufacturing flow and a structure of the flexible pixel array substrate 100 according to an embodiment of the present invention will be described with reference to FIGS. 1, 2A to 2G, and 3A to 3G.

請參照圖1、圖2A及圖3A,首先,提供可撓基板110。可撓基板110具有主動區110a以及主動區110a外的周邊區110b。如圖1所示,在本實施例中,可撓基板110可選擇性地具有圓形主動區110a以及連接於所述圓形主動區110a下方的頸狀周邊區110b。然而,本發明不限於此,在其他實施例中,可撓基板110的外型可依實際需求做不同設計。在本實施例中,可撓基板110的材質可選自有機聚合物,例如:聚醯亞胺(polyimide;PI)、聚萘二甲酸乙醇酯(polyethylene naphthalate;PEN)、聚對苯二甲酸乙二酯(polyethylene terephthalate;PET)、聚碳酸酯(polycarbonates;PC)、聚醚碸(polyether sulfone;PES)、聚芳基酸酯(polyarylate)、或其它合適的材料,但本發明不以此為限。Referring to FIG. 1 , FIG. 2A and FIG. 3A , first, a flexible substrate 110 is provided. The flexible substrate 110 has an active area 110a and a peripheral area 110b outside the active area 110a. As shown in FIG. 1, in the embodiment, the flexible substrate 110 can selectively have a circular active area 110a and a neck-shaped peripheral area 110b connected below the circular active area 110a. However, the present invention is not limited thereto. In other embodiments, the appearance of the flexible substrate 110 can be differently designed according to actual needs. In this embodiment, the material of the flexible substrate 110 may be selected from organic polymers, such as: polyimide (PI), polyethylene naphthalate (PEN), polyethylene terephthalate. Polyethylene terephthalate (PET), polycarbonate (PC), polyether sulfone (PES), polyarylate, or other suitable materials, but the present invention does not limit.

請參照圖2A及圖3A,接著,在可撓基板110上形成多個無機緩衝圖案120和多個半導體圖案130。多個無機緩衝圖案120配置於可撓基板110上且彼此分離。彼此分離的多個半導體圖案130分別配置於多個無機緩衝圖案120上。詳言之,在本實施例中,可在可撓基板110上依序形成無機緩衝層(未繪示)以及覆蓋所述無機緩衝層的半導體層(未繪示);之後,再利用同一罩幕圖案化出相堆疊的多個無機緩衝圖案120與多個半導體圖案130。每一無機緩衝圖案120與對應的一個半導體圖案130可選擇性地切齊,但本發明不限於此,在其他實施例中,每一無機緩衝圖案120也可選擇性地超出對應的一個半導體圖案130。無機緩衝圖案120的材質可為氧化矽、氮化矽、氮氧化矽、其它合適的材料、或上述至少二種材料的堆疊層,但本發明不以此為限。半導體圖案130可為單層或多層結構,其包含非晶矽、多晶矽、微晶矽、單晶矽、有機半導體材料、氧化物半導體材料(例如:銦鋅氧化物、銦鍺鋅氧化物、或是其它合適的材料、或上述之組合)、或其它合適的材料、或含有摻雜物(dopant)於上述材料中、或上述之組合,但本發明不以此為限。Referring to FIGS. 2A and 3A , a plurality of inorganic buffer patterns 120 and a plurality of semiconductor patterns 130 are formed on the flexible substrate 110 . The plurality of inorganic buffer patterns 120 are disposed on the flexible substrate 110 and separated from each other. The plurality of semiconductor patterns 130 separated from each other are disposed on the plurality of inorganic buffer patterns 120, respectively. In detail, in the embodiment, an inorganic buffer layer (not shown) and a semiconductor layer (not shown) covering the inorganic buffer layer may be sequentially formed on the flexible substrate 110; The curtain patterning the plurality of inorganic buffer patterns 120 and the plurality of semiconductor patterns 130 stacked in phase. Each of the inorganic buffer patterns 120 and the corresponding one of the semiconductor patterns 130 are selectively spliced, but the present invention is not limited thereto. In other embodiments, each of the inorganic buffer patterns 120 may also selectively exceed a corresponding one of the semiconductor patterns. 130. The material of the inorganic buffer pattern 120 may be tantalum oxide, tantalum nitride, niobium oxynitride, other suitable materials, or a stacked layer of at least two materials, but the invention is not limited thereto. The semiconductor pattern 130 may be a single layer or a multilayer structure including an amorphous germanium, a polycrystalline germanium, a microcrystalline germanium, a single crystal germanium, an organic semiconductor material, an oxide semiconductor material (eg, indium zinc oxide, indium antimony zinc oxide, or Other suitable materials, or a combination thereof, or other suitable materials, or a dopant in the above materials, or a combination thereof, but the invention is not limited thereto.

請參照圖2B及圖3B,接著,形成第一無機絕緣層140’,以覆蓋無機緩衝圖案120、半導體圖案130以及部份可撓基板110。然後,在第一無機絕緣層140’上形成第一導電層150(標示於圖2B)。第一導電層150可包括多個閘極G以及多條掃描線SL。掃描線SL也可稱訊號線。每一閘極G位於對應的一個半導體圖案130上方,且與對應的一條掃描線SL電性連接。在本實施例中,閘極G及掃描線SL是使用金屬材料製作,但本發明不限於此,根據其他實施例,閘極G及掃描線SL也可以使用其他導電材料。例如:合金、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、或是金屬材料與其它導電材料的堆疊層。Referring to FIG. 2B and FIG. 3B, next, a first inorganic insulating layer 140' is formed to cover the inorganic buffer pattern 120, the semiconductor pattern 130, and the partially flexible substrate 110. Then, a first conductive layer 150 is formed on the first inorganic insulating layer 140' (shown in Fig. 2B). The first conductive layer 150 may include a plurality of gates G and a plurality of scan lines SL. The scan line SL can also be called a signal line. Each gate G is located above a corresponding one of the semiconductor patterns 130 and is electrically connected to a corresponding one of the scan lines SL. In the present embodiment, the gate G and the scan line SL are made of a metal material, but the present invention is not limited thereto. According to other embodiments, other conductive materials may be used for the gate G and the scan line SL. For example: alloys, nitrides of metallic materials, oxides of metallic materials, oxynitrides of metallic materials, or stacked layers of metallic materials and other electrically conductive materials.

請參照圖2C及圖3C,接著,形成第二無機絕緣層160’,以覆蓋閘極G、掃描線SL以及部份第一無機絕緣層140’。請參照圖2C、圖2D、圖3C以及圖3D,接著,圖案化第一無機絕緣層140’以及第二無機絕緣層160’,以形成多個第一無機絕緣圖案140以及多個第二無機絕緣圖案160。如圖3D所示,每一第一無機絕緣圖案140位於對應的一個的閘極G與對應的一個半導體圖案130之間。換言之,每一第一無機絕緣圖案140覆蓋對應的一個半導體圖案130。每一閘極G配置於對應的一個第一無機絕緣圖案140上。每一第二無機絕緣圖案160覆蓋對應的一個閘極G以及對應的一個第一無機絕緣圖案140。每一第二無機絕緣圖案160與對應的一個第一無機絕緣圖案140分別具有接觸開口160a、140a。相連通的接觸開口140a、160a暴露出對應之一個半導體圖案130的兩側。特別是,多個半導體圖案130上的多個第一無機絕緣圖案140彼此分離。多個第一無機絕緣圖案140上的多個第二無機絕緣圖案160彼此分離。換言之,材質較脆而易斷裂的第一無機絕緣層140’已被圖案化成彼此斷開且呈小塊的多個無機絕緣圖案(即多個第一無機絕緣圖案140),材質較脆而易斷裂的第二無機絕緣層160’已被圖案化成彼此斷開且呈小塊的無機絕緣圖案(即多個第二無機絕緣圖案160)。多個第一無機絕緣圖案140之間存在間隙140b(標示於圖3D)。多個第二無機絕緣圖案160之間存在間隙160b(標示於圖3D)。在本實施例中,第一無機絕緣圖案140以及第二無機絕緣圖案160的材質例如為氧化矽、氮化矽、氮氧化矽、其它合適的材料、或上述至少二種材料的堆疊層,但本發明不以此為限。Referring to Fig. 2C and Fig. 3C, next, a second inorganic insulating layer 160' is formed to cover the gate G, the scanning line SL, and a portion of the first inorganic insulating layer 140'. Referring to FIG. 2C, FIG. 2D, FIG. 3C and FIG. 3D, the first inorganic insulating layer 140' and the second inorganic insulating layer 160' are patterned to form a plurality of first inorganic insulating patterns 140 and a plurality of second inorganic layers. Insulation pattern 160. As shown in FIG. 3D, each of the first inorganic insulating patterns 140 is located between the corresponding one of the gates G and the corresponding one of the semiconductor patterns 130. In other words, each of the first inorganic insulating patterns 140 covers a corresponding one of the semiconductor patterns 130. Each of the gates G is disposed on a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 covers a corresponding one of the gates G and a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 and the corresponding one of the first inorganic insulating patterns 140 has contact openings 160a, 140a, respectively. The interconnecting contact openings 140a, 160a expose both sides of a corresponding one of the semiconductor patterns 130. In particular, the plurality of first inorganic insulating patterns 140 on the plurality of semiconductor patterns 130 are separated from each other. The plurality of second inorganic insulating patterns 160 on the plurality of first inorganic insulating patterns 140 are separated from each other. In other words, the first inorganic insulating layer 140' whose material is brittle and easily broken has been patterned into a plurality of inorganic insulating patterns (ie, a plurality of first inorganic insulating patterns 140) which are disconnected from each other and are small in size, and the material is relatively brittle and easy. The broken second inorganic insulating layer 160' has been patterned into an inorganic insulating pattern (ie, a plurality of second inorganic insulating patterns 160) that are disconnected from each other and are in small pieces. There is a gap 140b between the plurality of first inorganic insulating patterns 140 (shown in FIG. 3D). There is a gap 160b between the plurality of second inorganic insulating patterns 160 (shown in FIG. 3D). In this embodiment, the material of the first inorganic insulating pattern 140 and the second inorganic insulating pattern 160 is, for example, tantalum oxide, tantalum nitride, hafnium oxynitride, other suitable materials, or a stacked layer of at least two materials described above, but The invention is not limited thereto.

請參照圖2E及圖3E,接著,形成第二導電層170(標示於圖2E)。第二導電層170包括資料線DL、多個源極S、多個汲極D以及多個下層導線部172。資料線DL也可稱訊號線。每一源極S與對應的一條資料線DL電性連接。每一源極S和每一汲極D與對應的一個半導體圖案130電性連接。詳言之,在本實施例中,源極S與汲極D配置於第二無機絕緣圖案160上並填入接觸開口160a 、140a,以穿過第二無機絕緣圖案160與第一無機絕緣圖案140,而與對應的半導體圖案130電性連接。在本實施例中,每一個無機緩衝圖案120、對應的一個半導體圖案130、對應的一個第一無機絕緣圖案140、對應的一個第二無機絕緣圖案160、對應的一個源極S以及對應的一個汲極D可視為一個薄膜電晶體T。薄膜電晶體T配置於可撓基板110的主動區110a。多個下層導線部172配置於可撓基板110的周邊區110a。在本實施例中,下層導線部172可直接與可撓基板110接觸。然而,本發明不限於此,在其他實施例中,下層導線部172也可設置於其他適當構件上,以下將於後續段落中配合其他圖示舉例說明之。第二導電層170(即資料線DL、源極S、汲極D以及下層導線部172)一般是使用金屬材料,但本發明不限於此,根據其他實施例,第二導電層170也可以使用其他導電材料,例如:合金、金屬材料的氮化物、金屬材料的氧化物、金屬材料的氮氧化物、或是金屬材料與其它導電材料的堆疊層。Referring to FIG. 2E and FIG. 3E, a second conductive layer 170 (shown in FIG. 2E) is formed. The second conductive layer 170 includes a data line DL, a plurality of source electrodes S, a plurality of drain electrodes D, and a plurality of lower layer lead portions 172. The data line DL can also be called a signal line. Each source S is electrically connected to a corresponding one of the data lines DL. Each source S and each of the drains D are electrically connected to a corresponding one of the semiconductor patterns 130. In detail, in the embodiment, the source S and the drain D are disposed on the second inorganic insulating pattern 160 and filled in the contact openings 160a and 140a to pass through the second inorganic insulating pattern 160 and the first inorganic insulating pattern. 140, and electrically connected to the corresponding semiconductor pattern 130. In this embodiment, each of the inorganic buffer patterns 120, the corresponding one of the semiconductor patterns 130, the corresponding one of the first inorganic insulating patterns 140, the corresponding one of the second inorganic insulating patterns 160, the corresponding one of the source electrodes S, and the corresponding one The bungee D can be regarded as a thin film transistor T. The thin film transistor T is disposed on the active region 110a of the flexible substrate 110. The plurality of lower lead portions 172 are disposed in the peripheral region 110a of the flexible substrate 110. In the present embodiment, the lower wire portion 172 can be in direct contact with the flexible substrate 110. However, the present invention is not limited thereto, and in other embodiments, the lower wire portion 172 may be disposed on other suitable members, which will be exemplified in the following paragraphs in conjunction with other figures. The second conductive layer 170 (ie, the data line DL, the source S, the drain D, and the lower lead portion 172) is generally made of a metal material, but the present invention is not limited thereto. According to other embodiments, the second conductive layer 170 may also be used. Other conductive materials, such as alloys, nitrides of metal materials, oxides of metal materials, oxynitrides of metal materials, or stacked layers of metal materials and other conductive materials.

請參照圖2F及圖3F,接著,形成第一有機絕緣層180以及第三導電層190(標示於圖2F)。如圖3F所示,第一有機絕緣層180覆蓋薄膜電晶體T的源極S與汲極D。第一有機絕緣層180填入多個薄膜電晶體T的多個第一無機絕緣圖案140之間的空隙140b以及多個薄膜電晶體T的多個第二無機絕緣圖案160之間的空隙160b,以和可撓基板110接觸。第一有機絕緣層180覆蓋位於周邊區110b的下層導線部172以及可撓基板110的部份周邊區110b。位於周邊區110b的部份第一有機絕緣層180具有多個接觸開口180a。每一下層導線部172的兩端被對應的接觸開口180a暴露。Referring to FIG. 2F and FIG. 3F, next, a first organic insulating layer 180 and a third conductive layer 190 (shown in FIG. 2F) are formed. As shown in FIG. 3F, the first organic insulating layer 180 covers the source S and the drain D of the thin film transistor T. The first organic insulating layer 180 fills the gap 140b between the plurality of first inorganic insulating patterns 140 of the plurality of thin film transistors T and the gap 160b between the plurality of second inorganic insulating patterns 160 of the plurality of thin film transistors T, It is in contact with the flexible substrate 110. The first organic insulating layer 180 covers the lower wiring portion 172 located in the peripheral region 110b and a portion of the peripheral region 110b of the flexible substrate 110. A portion of the first organic insulating layer 180 located in the peripheral region 110b has a plurality of contact openings 180a. Both ends of each lower layer wire portion 172 are exposed by the corresponding contact opening 180a.

請參照圖2F及圖3F,第三導電層190配置於第一有機絕緣層180上。第三導電層190包括上層導線部192。在本實施例中,第三導電層190可選擇性地包括與汲極D電性連接的電極194,但本發明不限於此,在其他實施例中,也可不設置電極194,是否虛設置電極194端視實際的需求而定。上層導線部192位於周邊區110b。上層導線部192配置於第一有機絕緣層180上且填入第一有機絕緣層180的接觸開口180a,以和對應的下層導線部172電性連接成周邊走線L。周邊走線L與訊號線電性連接。所述訊號線可指資料線DL、掃描線SL或其他用以傳遞訊號的適當導線。Referring to FIG. 2F and FIG. 3F , the third conductive layer 190 is disposed on the first organic insulating layer 180 . The third conductive layer 190 includes an upper wire portion 192. In this embodiment, the third conductive layer 190 may selectively include the electrode 194 electrically connected to the drain D. However, the present invention is not limited thereto. In other embodiments, the electrode 194 may not be disposed, and the electrode may be disposed. 194 depends on actual needs. The upper wire portion 192 is located in the peripheral region 110b. The upper lead portion 192 is disposed on the first organic insulating layer 180 and filled in the contact opening 180a of the first organic insulating layer 180 to be electrically connected to the corresponding lower lead portion 172 to form the peripheral trace L. The peripheral trace L is electrically connected to the signal line. The signal line may refer to the data line DL, the scan line SL or other suitable wires for transmitting signals.

請參照圖2F及圖3F,在本實施例中,多個下層導線部172彼此分離,多個上層導線部192彼此分離。下層導線部172與上層導線部192交替排列並串接成周邊走線L。每一條周邊走線L與對應的薄膜電晶體T電性連接。舉例而言,每一條周邊走線L可透過對應的一條資料線DL與多個薄膜電晶體T的源極S電性連接;或者,每一條周邊走線L可透過對應的一條掃描線 SL與多個薄膜電晶體T的閘極G電性連接,但本發明不以此為限,周邊走線L也可指與薄膜電晶體T電性連接的其他訊號線。如圖2F所示,下層導線部172具有非直線部172a。上層導線部192具有非直線部192a。在本實施例中,上層導線部192的非直線部192a與下層導線部172的非直線部192a重疊,而上層導線部192的非直線部192a填入第一有機絕緣層180的接觸開口180a,以和下層導線部172的非直線部172a電性連接,但本發明不以此為限。Referring to FIG. 2F and FIG. 3F, in the present embodiment, the plurality of lower lead portions 172 are separated from each other, and the plurality of upper lead portions 192 are separated from each other. The lower lead portion 172 and the upper lead portion 192 are alternately arranged and connected in series to the peripheral trace L. Each of the peripheral traces L is electrically connected to the corresponding thin film transistor T. For example, each of the peripheral traces L can be electrically connected to the source S of the plurality of thin film transistors T through a corresponding one of the data lines DL; or each of the peripheral traces L can pass through a corresponding one of the scan lines SL and The gates G of the plurality of thin film transistors T are electrically connected, but the invention is not limited thereto. The peripheral traces L may also refer to other signal lines electrically connected to the thin film transistor T. As shown in FIG. 2F, the lower lead portion 172 has a non-linear portion 172a. The upper lead portion 192 has a non-linear portion 192a. In the present embodiment, the non-linear portion 192a of the upper lead portion 192 overlaps with the non-linear portion 192a of the lower lead portion 172, and the non-linear portion 192a of the upper lead portion 192 fills the contact opening 180a of the first organic insulating layer 180, It is electrically connected to the non-linear portion 172a of the lower lead portion 172, but the invention is not limited thereto.

請參照圖2 F,在本實施例中,下層導線部172與上層導線部192可選擇性地近似於半圓形圖案。然而,本發明不限於此,在其他實施例中,下層導線部172與上層導線部192可選擇性地呈其他適當圖案,例如:三角形、梯形、菱形、圓形、橢圓形等。在本實施例中,每一個下層導線部172可選擇性地為單一個圖案(例如:近似於半圓形的一個圖案),每一上層導線部192可選擇性地為單一個圖案(例如:近似於半圓形的一個圖案)。然而,本發明不限於此,在其他實施例中,每一下層導線部172 及/或每一上層導線部192也可由二個以上的重複圖案組合而成,例如:彼此連接的二個近似於半圓形的圖案、彼此連接的二個梯形、彼此連接的二個菱形、彼此連接的二個圓形、彼此連接的二個橢圓形。Referring to FIG. 2F, in the embodiment, the lower layer lead portion 172 and the upper layer lead portion 192 are selectively approximated to a semicircular pattern. However, the present invention is not limited thereto. In other embodiments, the lower wire portion 172 and the upper wire portion 192 may be selectively in other suitable patterns, such as a triangle, a trapezoid, a diamond, a circle, an ellipse, or the like. In this embodiment, each of the lower wire portions 172 may alternatively be a single pattern (eg, a pattern that approximates a semicircle), and each of the upper wire portions 192 may alternatively be a single pattern (eg, A pattern similar to a semicircle). However, the present invention is not limited thereto. In other embodiments, each of the lower wire portions 172 and/or each of the upper wire portions 192 may be combined by two or more repeating patterns, for example, two connected to each other are similar to A semicircular pattern, two trapezoids connected to each other, two diamonds connected to each other, two circles connected to each other, and two elliptical shapes connected to each other.

請參照圖2G及圖3G,接著,形成第二有機絕緣層200以及畫素電極210。第二有機絕緣層200覆蓋周邊走線L的上層導線部192、電極194以及部份第一有機絕緣層180。第二有機絕緣層200具有接觸開口200a。接觸開口200a暴露出薄膜電晶體T的汲極D。畫素電極210與薄膜電晶體T電性連接。詳言之,畫素電極210配置於第二有機絕緣層200上,以填入第二有機絕緣層200的接觸開口200a而與薄膜電晶體T的汲極D電性連接。於此便完成了本實施例的可撓式畫素陣列基板100。Referring to FIG. 2G and FIG. 3G, next, the second organic insulating layer 200 and the pixel electrode 210 are formed. The second organic insulating layer 200 covers the upper lead portion 192 of the peripheral trace L, the electrode 194, and a portion of the first organic insulating layer 180. The second organic insulating layer 200 has a contact opening 200a. The contact opening 200a exposes the drain D of the thin film transistor T. The pixel electrode 210 is electrically connected to the thin film transistor T. In detail, the pixel electrode 210 is disposed on the second organic insulating layer 200 to be electrically connected to the drain D of the thin film transistor T by filling the contact opening 200a of the second organic insulating layer 200. Thus, the flexible pixel array substrate 100 of the present embodiment is completed.

值得一提的是,如圖3G所示,多個薄膜電晶體T的多個第一無機絕緣圖案140彼此分離。換言之,材質較脆而易斷裂的第一無機絕緣層已斷成多個小塊(即多個第一無機絕緣圖案140)。因此,當可撓式畫素陣列基板100彎曲時,尺寸小的每一個第一無機絕緣圖案140不易因可撓式畫素陣列基板100的彎曲而產生裂痕。即便,某一個第一無機絕緣圖案140因可撓式畫素陣列基板100彎曲而產生裂痕,所述某一個第一無機絕緣圖案140的裂痕也不易延伸到其他第一無機絕緣圖案140上,而導致其周邊的構件(例如:汲極D、源極S、部份周邊走線L等)受損。藉此,可撓式畫素陣列基板100主動區110a的可彎曲程度可提升。另一方面,如圖3G所示,位於周邊區110b的每一條周邊走線L其上層導線部192與下層導線部172間夾有材質較軟的有機材料(即第一有機絕緣層180),而未夾有較脆易斷裂的無機材質,因此,當可撓式畫素陣列基板100彎曲時,周邊走線L的上層導線部192不易受到較脆弱的膜層牽連而產生斷裂的情形。藉此,可撓式畫素陣列基板100周邊區110b的可彎曲程度可提升。It is worth mentioning that, as shown in FIG. 3G, the plurality of first inorganic insulating patterns 140 of the plurality of thin film transistors T are separated from each other. In other words, the first inorganic insulating layer, which is relatively brittle and easily broken, has been broken into a plurality of small pieces (ie, a plurality of first inorganic insulating patterns 140). Therefore, when the flexible pixel array substrate 100 is bent, each of the first inorganic insulating patterns 140 having a small size is less likely to be cracked by the bending of the flexible pixel array substrate 100. Even if a certain first inorganic insulating pattern 140 is cracked due to the bending of the flexible pixel array substrate 100, the crack of the one first inorganic insulating pattern 140 does not easily extend to the other first inorganic insulating patterns 140, and The components surrounding it (for example: bungee D, source S, partial peripheral trace L, etc.) are damaged. Thereby, the degree of bendability of the active region 110a of the flexible pixel array substrate 100 can be improved. On the other hand, as shown in FIG. 3G, each of the peripheral traces L of the peripheral region 110b has a softer organic material (ie, the first organic insulating layer 180) interposed between the upper lead portion 192 and the lower lead portion 172. The inorganic material which is brittle and easily broken is not interposed. Therefore, when the flexible pixel array substrate 100 is bent, the upper lead portion 192 of the peripheral trace L is less likely to be broken by the weaker film layer. Thereby, the degree of bendability of the peripheral region 110b of the flexible pixel array substrate 100 can be improved.

圖4示出本發明一實施例之可撓基板的周邊區以及其上的多條周邊走線。圖5為根據圖4之剖線A-A’、B-B’所繪的周邊走線的剖面示意圖。請參照圖4及圖5,可撓基板110的周邊區110b(例如:圖1之頸狀周邊區110b)具有兩相對的第一側邊S1與第二側邊S2。周邊走線L、L’與前述薄膜電晶體T電性連接。周邊走線L、L’包含在第一側邊S1指向第二側邊S2的方向d上依序排列的n 條周邊走線L、L’。n可為大於或等於3的正整數。最靠近第一側邊S1的第一條周邊走線L以及最靠近第二側邊S2的第n條周邊走線L皆具有非直線部172a、192a。位於第一條周邊走線L和第n條周邊走線L之間的周邊走線L’呈直線狀。4 illustrates a peripheral region of a flexible substrate and a plurality of peripheral traces thereon, in accordance with an embodiment of the present invention. Fig. 5 is a schematic cross-sectional view showing the peripheral traces taken along the line A-A', B-B' of Fig. 4. Referring to FIGS. 4 and 5, the peripheral region 110b of the flexible substrate 110 (eg, the neck-shaped peripheral region 110b of FIG. 1) has two opposite first side S1 and second side S2. The peripheral traces L, L' are electrically connected to the thin film transistor T. The peripheral traces L, L' include n peripheral traces L, L' sequentially arranged in the direction d in which the first side S1 points to the second side S2. n may be a positive integer greater than or equal to 3. The first peripheral trace L closest to the first side S1 and the nth peripheral trace L closest to the second side S2 each have non-linear portions 172a, 192a. The peripheral trace L' located between the first peripheral trace L and the nth peripheral trace L is linear.

請參照圖4及圖5,在本實施例中,每一周邊走線L、L’包括下層導線部172以及上層導線部192。下層導線部172配置於可撓基板110上。第一有機絕緣層180覆蓋下層導線部172且具有暴露出下層導線部172的多個接觸開口180a。上層導線部192配置於第一有機絕緣層180上且填入第一有機絕緣層180的接觸開口180a,以和上層導線部192電性連接。最靠近第一側邊S1的第一條周邊走線L的下層導線部172以及最靠近第二側邊S2的第n條周邊走線L的下層導線部172皆具有非直線部172a、192a。位於第一條周邊走線L和第n條周邊走線l之間的中間部份之周邊走線L’的上層導線部192及下層導線部172可皆呈直線狀。換言之,中間的周邊走線L’可由上層導線部192與下層導線部172串接而成。然而,本發明不限於此,在它實施例中,中間的周邊走線L’也可為由單一膜層(例如:前述第二導電層170)構成的直線形導線。Referring to Figures 4 and 5, in the present embodiment, each of the peripheral traces L, L' includes a lower lead portion 172 and an upper lead portion 192. The lower lead portion 172 is disposed on the flexible substrate 110. The first organic insulating layer 180 covers the lower wiring portion 172 and has a plurality of contact openings 180a exposing the lower wiring portion 172. The upper lead portion 192 is disposed on the first organic insulating layer 180 and filled in the contact opening 180a of the first organic insulating layer 180 to be electrically connected to the upper lead portion 192. The lower lead portion 172 of the first peripheral trace L closest to the first side S1 and the lower lead portion 172 of the nth peripheral trace L closest to the second side S2 have non-linear portions 172a, 192a. The upper lead portion 192 and the lower lead portion 172 of the peripheral trace L' located at the intermediate portion between the first peripheral trace L and the nth peripheral trace 1 may be linear. In other words, the intermediate peripheral trace L' can be formed by connecting the upper lead portion 192 and the lower lead portion 172 in series. However, the present invention is not limited thereto, and in the embodiment, the intermediate peripheral trace L' may also be a linear conductor composed of a single film layer (e.g., the aforementioned second conductive layer 170).

請參照圖4,在本實施例中,最靠近第一側邊S1的第一條周邊走線L的下層導線部172具有與第一條周邊走線L的上層導線部192接觸的二個第一接觸點P1。二個第一接觸點P1在可撓基板110上的二個垂直投影連成連線l1。第一條周邊走線L的下層導線部172的非直線部172a在可撓基板110上的垂直投影位於連線l1與第一側邊S1之間。簡言之,第一條周邊走線L的左邊的非直線邊緣(例如:波浪形邊緣)是較其右邊的直線邊緣靠近可撓基板110的第一側邊S1。類似地,最靠近第二側邊S2之第n條周邊走線L的下層導線部172具有與第n條周邊走線L的上層導線部192接觸的二第二接觸點P2。二個第二接觸點P2在可撓基板110上的二個垂直投影連成連線l2。第n條周邊走線之下層導線部172的非直線部172 a在可撓基板110上的垂直投影位於連線l2與第二側邊S2之間。簡言之,第n條周邊走線L右邊的非直線邊緣(例如:波浪形邊緣)是較其左邊的直線邊緣靠近可撓基板110的第二側邊S2。透過將最靠近可撓基板110之第一、二側邊S1、S2的第一、n條周邊走線L設計為非直線狀,且將第一、n條周邊走線L中間的多條周邊走線L’設計為直線,可節省所有周邊走線L的佈局(layout)空間並兼顧可撓式畫素陣列基板100的可彎曲程度。然而,本發明不限於此,在其他實施例中,也可將所有周邊走線L、 L’ 均設計為非直線狀。Referring to FIG. 4, in the present embodiment, the lower lead portion 172 of the first peripheral trace L closest to the first side S1 has two first contacts with the upper lead portion 192 of the first peripheral trace L. A contact point P1. Two vertical projections of the two first contact points P1 on the flexible substrate 110 are connected into a line l1. The vertical projection of the non-linear portion 172a of the lower lead portion 172 of the first peripheral trace L on the flexible substrate 110 is located between the line l1 and the first side S1. In short, the non-linear edge (eg, wavy edge) on the left side of the first perimeter trace L is closer to the first side S1 of the flexible substrate 110 than the straight edge on the right side. Similarly, the lower lead portion 172 of the nth peripheral trace L closest to the second side S2 has two second contact points P2 that are in contact with the upper lead portion 192 of the nth peripheral trace L. Two vertical projections of the two second contact points P2 on the flexible substrate 110 are connected into a line l2. The vertical projection of the non-linear portion 172a of the layer conductor portion 172 under the nth peripheral trace on the flexible substrate 110 is located between the line l2 and the second side S2. In short, the non-linear edge (for example, the wavy edge) on the right side of the nth peripheral trace L is closer to the second side S2 of the flexible substrate 110 than the straight edge on the left side thereof. The first and n peripheral traces L closest to the first and second sides S1 and S2 of the flexible substrate 110 are designed to be non-linear, and a plurality of peripheral portions of the first and n peripheral traces L are arranged. The trace L' is designed as a straight line, which saves the layout space of all the peripheral traces L and the degree of flexibility of the flexible pixel array substrate 100. However, the present invention is not limited thereto, and in other embodiments, all of the peripheral traces L, L' may be designed to be non-linear.

請參照圖4,在本實施例中,最靠近可撓基板110之第一側邊S1的第一條周邊走線L與最靠近可撓基板110之第二側邊S2的第n條周邊走線L具有非直線部172a、192a。換言之,第一條周邊走線L以及第n條周邊走線L可較其他周邊走線L’長。第一條周邊走線L之非直線部172a、192a的最大線寬w1以及第n條周邊走線之非直線部172a、192a的最大線寬w2大於位於第一、n條周邊走線中間的周邊走線L’的最大線寬w3。換言之,雖然,第一條周邊走線L及第n條周邊走線L因具有非直線部172a、192a而長度較長,但第一、n條周邊走線的截面積較大,而使位於外圍的第一、n條周邊走線L的電阻值與位於中間的周邊走線L’ 的電阻值接近,而有助於可撓式畫素陣列基板100的電性。Referring to FIG. 4, in the present embodiment, the first peripheral trace L closest to the first side S1 of the flexible substrate 110 and the n-th periphery closest to the second side S2 of the flexible substrate 110 are taken. The line L has non-linear portions 172a, 192a. In other words, the first peripheral trace L and the nth peripheral trace L may be longer than the other peripheral traces L'. The maximum line width w1 of the non-linear portions 172a, 192a of the first peripheral trace L and the maximum line width w2 of the non-linear portions 172a, 192a of the n-th peripheral trace are larger than the middle of the first and n peripheral traces The maximum line width w3 of the surrounding trace L'. In other words, although the first peripheral trace L and the nth peripheral trace L have long lengths due to the non-linear portions 172a and 192a, the cross-sectional areas of the first and n peripheral traces are large, and the The resistance values of the first and n peripheral traces L of the periphery are close to the resistance values of the peripheral traces L' located in the middle, which contribute to the electrical properties of the flexible pixel array substrate 100.

在前述的實施例中,周邊走線L是由交替排列的下層導線部172與上層導線部192串接而成。上層導線部192、下層導線部172皆具有非直線部192a 、172a。然而,本發明不限於此,在其它實施例中,周邊走線L也可呈其他適當樣態。以下利用圖6~圖9舉例說明之。In the foregoing embodiment, the peripheral trace L is formed by connecting the lower-layer lead portions 172 and the upper-layer lead portions 192 which are alternately arranged in series. Both the upper lead portion 192 and the lower lead portion 172 have non-linear portions 192a and 172a. However, the present invention is not limited thereto, and in other embodiments, the peripheral trace L may also be in other suitable states. The following description will be exemplified using Figs. 6 to 9 .

圖6為本發明一實施例之周邊走線的上視示意圖。圖7為根據圖6的剖線A-A’所繪的周邊走線的剖面示意圖。請參照圖6及圖7,與前述周邊走線L類似地,周邊走線LA也是由下層導線部172A與上層導線部192A串接而成。下層導線部172A具有非直線部172a。與周邊走線L不同的是,周邊走線LA的上層導線部192A可呈直線。在圖6、圖7的實施例中,下層導線部172A近似於半圓形,但本發明不限於此,在它實施例中,下層導線部172A也可呈其他適當形狀,例如:梯形、菱形、圓形、橢圓形等。FIG. 6 is a top plan view of a peripheral trace according to an embodiment of the invention. Fig. 7 is a schematic cross-sectional view showing a peripheral trace taken along a line A-A' of Fig. 6. Referring to FIGS. 6 and 7, similarly to the peripheral trace L, the peripheral trace LA is also formed by connecting the lower lead portion 172A and the upper lead portion 192A in series. The lower lead portion 172A has a non-linear portion 172a. Different from the peripheral trace L, the upper lead portion 192A of the peripheral trace LA may be in a straight line. In the embodiment of FIG. 6 and FIG. 7, the lower lead portion 172A is approximately semicircular, but the present invention is not limited thereto. In the embodiment, the lower lead portion 172A may also have other suitable shapes, such as trapezoidal or rhombic. , round, oval, etc.

圖8為本發明另一實施例之周邊走線的上視示意圖。圖9為根據圖8的剖線A-A’所繪的周邊走線的剖面示意圖。請參照圖8及圖9,與前述周邊走線L類似地,周邊走線LB也是由下層導線部172B與上層導線部192B串接而成。詳言之,上層導線部192B的非直線部192a填入第一有機絕緣層180的接觸開口180a,以和下層導線部172B的非直線部172a電性連接。與周邊走線L不同的是,上層導線部172B的非直線部172a與下層導線部192B的非直線部192a重疊且可呈相同圖案。較佳的是,下層導線部172B與上層導線部192B之間存在三個以上的接觸點P3。藉此,若下層導線部172B與上層導線部192B的任一處受損時,訊號仍可經由它處傳遞,而維持周邊走線LB的功能正常。在圖8、圖9的實施例中,下層導線部172B與上層導線部192B可呈彼此連接的多個圓形,但本發明不限於此,在它實施例中,下層導線部172B與上層導線部192B也可呈其他適當形狀,例如:彼此連接的多個梯形、彼此連接的多個菱形、彼此連接的多個半圓形、彼此連接的多個橢圓形等。上述的周邊走線LA、LB可用以取代前述之可撓式畫素陣列基板100的周邊走線L。以周邊走線LA、LB取代周邊走線L所構成的多種可撓式畫素陣列基板也在本發明所欲保護的範疇內。FIG. 8 is a top plan view of a peripheral trace according to another embodiment of the present invention. Fig. 9 is a schematic cross-sectional view showing a peripheral trace drawn along a line A-A' of Fig. 8. Referring to FIGS. 8 and 9, similarly to the peripheral trace L, the peripheral trace LB is also formed by connecting the lower lead portion 172B and the upper lead portion 192B in series. In detail, the non-linear portion 192a of the upper lead portion 192B is filled in the contact opening 180a of the first organic insulating layer 180 to be electrically connected to the non-linear portion 172a of the lower lead portion 172B. Unlike the peripheral trace L, the non-linear portion 172a of the upper lead portion 172B overlaps with the non-linear portion 192a of the lower lead portion 192B and may have the same pattern. Preferably, there are three or more contact points P3 between the lower lead portion 172B and the upper lead portion 192B. Thereby, if any of the lower wire portion 172B and the upper wire portion 192B is damaged, the signal can still be transmitted therethrough, and the function of the peripheral wire LB is maintained normal. In the embodiment of FIG. 8 and FIG. 9, the lower lead portion 172B and the upper lead portion 192B may have a plurality of circular shapes connected to each other, but the present invention is not limited thereto. In the embodiment, the lower lead portion 172B and the upper layer lead are used. The portion 192B may have other suitable shapes, for example, a plurality of trapezoids connected to each other, a plurality of rhombic shapes connected to each other, a plurality of semicircles connected to each other, a plurality of elliptical shapes connected to each other, and the like. The peripheral traces LA and LB described above may be used in place of the peripheral trace L of the flexible pixel array substrate 100 described above. A plurality of flexible pixel array substrates formed by replacing the peripheral traces L with the peripheral traces LA and LB are also within the scope of the present invention.

圖10為本發明另一實施例之可撓式畫素陣列基板的上視示意圖。圖11A至圖11G為本發明另一實施例之可撓式畫素陣列基板的製造流程上視示意圖。特別是,圖11A至圖11G的區域Ⅰ是對應圖10之可撓式畫素陣列基板100C的部份主動區110a,圖11A至圖11G的區域Ⅱ是對應圖10之可撓式畫素陣列基板100C的部份周邊區110b。圖12A至圖12G為本發明另一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。特別是,圖12A至圖12G對應圖11A至圖11G的剖線A-A’及B-B’。以下利用圖10、圖11A至圖11G以及圖12A至圖12G說明本發明一實施例之可撓式畫素陣列基板100C的製造流程及其結構。本實施例的可撓式畫素陣列基板100C與前述可撓式畫素陣列基板100類似,因此相同或相對應的元件以相同或相對應的標號表示。本實施例的可撓式畫素陣列基板100C與前述可撓式畫素陣列基板100的差異在於:可撓式畫素陣列基板100C的周邊走線LC下方多設置了第三無機絕緣圖案142與第四無機絕緣圖案162。以下主要就此差異處做說明,兩者相同之處請依照圖10、圖11A至圖11G以及圖12A至圖12G中的標號參照前述說明,便不再重述之。FIG. 10 is a top plan view of a flexible pixel array substrate according to another embodiment of the present invention. 11A to 11G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to another embodiment of the present invention. In particular, the region I of FIGS. 11A to 11G is a partial active region 110a corresponding to the flexible pixel array substrate 100C of FIG. 10, and the region II of FIGS. 11A to 11G is a flexible pixel array corresponding to FIG. A portion of the peripheral region 110b of the substrate 100C. 12A to 12G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to another embodiment of the present invention. In particular, Figs. 12A to 12G correspond to the cross-sectional lines A-A' and B-B' of Figs. 11A to 11G. Hereinafter, a manufacturing flow and a structure of the flexible pixel array substrate 100C according to an embodiment of the present invention will be described with reference to FIGS. 10, 11A to 11G, and FIGS. 12A to 12G. The flexible pixel array substrate 100C of the present embodiment is similar to the aforementioned flexible pixel array substrate 100, and therefore the same or corresponding elements are denoted by the same or corresponding reference numerals. The difference between the flexible pixel array substrate 100C of the present embodiment and the flexible pixel array substrate 100 is that the third inorganic insulating pattern 142 is disposed under the peripheral trace LC of the flexible pixel array substrate 100C. The fourth inorganic insulating pattern 162. The following mainly explains the difference, and the same points are referred to the above description in accordance with the reference numerals in FIG. 10, FIG. 11A to FIG. 11G, and FIG. 12A to FIG. 12G, and the description thereof will not be repeated.

請參照圖10、圖11A及圖12A,首先,提供可撓基板110。可撓基板110具有主動區110a以及主動區110a外的周邊區110b。請參照圖11A及圖12A,接著,在可撓基板110上形成多個無機緩衝圖案120和多個半導體圖案130。請參照圖11B及圖12B,接著,形成第一無機絕緣層140’,以覆蓋無機緩衝圖案120、半導體圖案130以及部份可撓基板110。然後,在第一無機絕緣層140’上形成第一導電層150。第一導電層150可包括多個閘極G以及多條掃描線SL。掃描線SL也可稱訊號線。每一閘極G位於對應的一個半導體圖案130上方,且與對應的一條掃描線SL電性連接。Referring to FIG. 10, FIG. 11A and FIG. 12A, first, a flexible substrate 110 is provided. The flexible substrate 110 has an active area 110a and a peripheral area 110b outside the active area 110a. Referring to FIGS. 11A and 12A , a plurality of inorganic buffer patterns 120 and a plurality of semiconductor patterns 130 are formed on the flexible substrate 110 . Referring to FIG. 11B and FIG. 12B, next, a first inorganic insulating layer 140' is formed to cover the inorganic buffer pattern 120, the semiconductor pattern 130, and the partially flexible substrate 110. Then, a first conductive layer 150 is formed on the first inorganic insulating layer 140'. The first conductive layer 150 may include a plurality of gates G and a plurality of scan lines SL. The scan line SL can also be called a signal line. Each gate G is located above a corresponding one of the semiconductor patterns 130 and is electrically connected to a corresponding one of the scan lines SL.

請參照圖11C及圖12C,接著,形成第二無機絕緣層160’,以覆蓋閘極G、掃描線SL以及部份第一無機絕緣層140’。請參照圖11C、圖11D、圖12C以及圖12D,接著,圖案化第一無機絕緣層140’以及第二無機絕緣層160’,以形成多個第一無機絕緣圖案140以及多個第二無機絕緣圖案160。如圖12D所示,每一第一無機絕緣圖案140位於對應的一個的閘極G與對應的一個半導體圖案130之間。每一第一無機絕緣圖案140覆蓋對應的一個半導體圖案130。每一閘極G配置於對應的一個第一無機絕緣圖案140上。每一第二無機絕緣圖案160覆蓋對應的一個閘極G以及對應的一個第一無機絕緣圖案140。每一第二無機絕緣圖案160與對應的一個第一無機絕緣圖案140分別具有接觸開口160a、140a。相連通的接觸開口140a、160a暴露出對應的一個半導體圖案130的兩側。特別是,多個半導體圖案130上的多個第一無機絕緣圖案140彼此分離。多個第一無機絕緣圖案140上的多個第二無機絕緣圖案160彼此分離。Referring to Fig. 11C and Fig. 12C, next, a second inorganic insulating layer 160' is formed to cover the gate G, the scanning line SL, and a portion of the first inorganic insulating layer 140'. Referring to FIG. 11C, FIG. 11D, FIG. 12C, and FIG. 12D, the first inorganic insulating layer 140' and the second inorganic insulating layer 160' are patterned to form a plurality of first inorganic insulating patterns 140 and a plurality of second inorganic layers. Insulation pattern 160. As shown in FIG. 12D, each of the first inorganic insulating patterns 140 is located between the corresponding one of the gates G and the corresponding one of the semiconductor patterns 130. Each of the first inorganic insulating patterns 140 covers a corresponding one of the semiconductor patterns 130. Each of the gates G is disposed on a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 covers a corresponding one of the gates G and a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 and the corresponding one of the first inorganic insulating patterns 140 has contact openings 160a, 140a, respectively. The communicating contact openings 140a, 160a expose opposite sides of a corresponding one of the semiconductor patterns 130. In particular, the plurality of first inorganic insulating patterns 140 on the plurality of semiconductor patterns 130 are separated from each other. The plurality of second inorganic insulating patterns 160 on the plurality of first inorganic insulating patterns 140 are separated from each other.

請參照圖11C、圖11D、圖12C及圖12D,與可撓式畫素陣列基板100不同的是,在本實施例中,在圖案化出位於主動區110a之第一無機絕緣圖案140與第二無機絕緣圖案160時,更同時圖案化出位於周邊區110b之第三無機絕緣圖案142與第四無機絕緣圖案162。第一無機絕緣圖案140與第三無機絕緣圖案142屬於同一無機絕緣層。第二無機絕緣圖案160與第四無機絕緣圖案162屬於同一無機絕緣層。多個第三無機絕緣圖案142彼此分離且配置於可撓基板110的周邊區110b上。多個第四無機絕緣圖案162彼此分離且配置於可撓基板110的周邊區110b上。每一第四無機絕緣圖案162堆疊於對應的一個第三無機絕緣圖案142上。Referring to FIG. 11C, FIG. 11D, FIG. 12C and FIG. 12D, different from the flexible pixel array substrate 100, in the embodiment, the first inorganic insulating pattern 140 located in the active region 110a is patterned. When the inorganic insulating pattern 160 is used, the third inorganic insulating pattern 142 and the fourth inorganic insulating pattern 162 located in the peripheral region 110b are patterned at the same time. The first inorganic insulating pattern 140 and the third inorganic insulating pattern 142 belong to the same inorganic insulating layer. The second inorganic insulating pattern 160 and the fourth inorganic insulating pattern 162 belong to the same inorganic insulating layer. The plurality of third inorganic insulating patterns 142 are separated from each other and disposed on the peripheral region 110b of the flexible substrate 110. The plurality of fourth inorganic insulating patterns 162 are separated from each other and disposed on the peripheral region 110b of the flexible substrate 110. Each of the fourth inorganic insulating patterns 162 is stacked on a corresponding one of the third inorganic insulating patterns 142.

請參照圖11E及圖12E,接著,形成第二導電層170。第二導電層170包括資料線(也可稱訊號線)DL、多個源極S、多個汲極D以及多個下層導線部172C。每一源極S與對應的一條資料線DL電性連接。每一源極S和每一汲極D與對應的一個半導體圖案130電性連接。每一無機緩衝圖案120、對應的一個半導體圖案130、對應的一個第一無機絕緣圖案140、對應的一個第二無機絕緣圖案160、對應的一個源極S以及對應的一個汲極D可視為一個薄膜電晶體T。薄膜電晶體T配置於可撓基板110的主動區110a。多個下層導線部172C配置於可撓基板110的周邊區110a。與可撓式畫素陣列基板100不同的是,在本實施例中,多個下層導線部172C是分別配置在彼此分離的多個第四無機絕緣圖案162上,而沒有和可撓基板110直接接觸。Referring to FIG. 11E and FIG. 12E, next, the second conductive layer 170 is formed. The second conductive layer 170 includes a data line (also referred to as a signal line) DL, a plurality of source electrodes S, a plurality of drain electrodes D, and a plurality of lower layer lead portions 172C. Each source S is electrically connected to a corresponding one of the data lines DL. Each source S and each of the drains D are electrically connected to a corresponding one of the semiconductor patterns 130. Each of the inorganic buffer patterns 120, the corresponding one of the semiconductor patterns 130, the corresponding one of the first inorganic insulating patterns 140, the corresponding one of the second inorganic insulating patterns 160, the corresponding one of the source electrodes S, and the corresponding one of the drain electrodes D can be regarded as one Thin film transistor T. The thin film transistor T is disposed on the active region 110a of the flexible substrate 110. The plurality of lower lead portions 172C are disposed in the peripheral region 110a of the flexible substrate 110. Different from the flexible pixel array substrate 100, in the present embodiment, the plurality of lower wiring portions 172C are respectively disposed on the plurality of fourth inorganic insulating patterns 162 separated from each other without being directly connected to the flexible substrate 110. contact.

請參照圖11F及圖12F,接著,形成第一有機絕緣層180以及第三導電層190。第一有機絕緣層180覆蓋可撓基板110的周邊區110b以及位於周邊區110b的下層導線部172C。第一有機絕緣層180具有多個接觸開口180a。每一下層導線部172C被對應的接觸開口180a暴露。請參照圖12F,第三導電層190配置於第一有機絕緣層180上。第三導電層190包括上層導線部192。在本實施例中,第三導電層190可選擇性地包括與汲極D電性連接的電極194,但本發明不限於此。上層導線部192配置於第一有機絕緣層180上且填入第一有機絕緣層180的接觸開口180a,以和對應的下層導線部172C電性連接成周邊走線LC。周邊走線LC與訊號線電性連接。所述訊號線可指資料線DL、掃描線SL或其他用以傳遞訊號的適當導線。Referring to FIG. 11F and FIG. 12F, next, the first organic insulating layer 180 and the third conductive layer 190 are formed. The first organic insulating layer 180 covers the peripheral region 110b of the flexible substrate 110 and the lower wiring portion 172C of the peripheral region 110b. The first organic insulating layer 180 has a plurality of contact openings 180a. Each lower layer wire portion 172C is exposed by a corresponding contact opening 180a. Referring to FIG. 12F , the third conductive layer 190 is disposed on the first organic insulating layer 180 . The third conductive layer 190 includes an upper wire portion 192. In the present embodiment, the third conductive layer 190 may selectively include the electrode 194 electrically connected to the drain D, but the invention is not limited thereto. The upper lead portion 192 is disposed on the first organic insulating layer 180 and filled in the contact opening 180a of the first organic insulating layer 180 to be electrically connected to the corresponding lower lead portion 172C to form the peripheral trace LC. The peripheral trace LC is electrically connected to the signal line. The signal line may refer to the data line DL, the scan line SL or other suitable wires for transmitting signals.

請參照圖11G及圖12G,接著,形成第二有機絕緣層200以及畫素電極210。第二有機絕緣層200覆蓋上層導線部192、電極194以及部份第一有機絕緣層180。第二有機絕緣層200具有接觸開口200a。接觸開口200a暴露出薄膜電晶體T的汲極D。畫素電極210與薄膜電晶體T電性連接。於此便完成了本實施例的可撓式畫素陣列基板100C。可撓式畫素陣列基板100C具有與可撓式畫素陣列基板100類似的功效與優點,於此便不再重述。Referring to FIGS. 11G and 12G, next, the second organic insulating layer 200 and the pixel electrode 210 are formed. The second organic insulating layer 200 covers the upper wiring portion 192, the electrode 194, and a portion of the first organic insulating layer 180. The second organic insulating layer 200 has a contact opening 200a. The contact opening 200a exposes the drain D of the thin film transistor T. The pixel electrode 210 is electrically connected to the thin film transistor T. Thus, the flexible pixel array substrate 100C of the present embodiment is completed. The flexible pixel array substrate 100C has similar functions and advantages as the flexible pixel array substrate 100, and will not be repeated here.

圖13為本發明又一實施例之可撓式畫素陣列基板的上視示意圖。圖14A至圖14G為本發明又一實施例之可撓式畫素陣列基板的製造流程上視示意圖。特別是,圖14A至圖14G的區域Ⅰ是對應圖13之可撓式畫素陣列基板100D的部份主動區110a,圖14A至圖14G的區域Ⅱ是對應圖13之可撓式畫素陣列基板100D的部份周邊區110b。圖15A至圖15G為本發明又一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。特別是,圖15A至圖15G對應圖14A至圖14G之剖線A-A’及B-B’。以下利用圖13、圖14A至圖14G以及圖15A至圖15G說明本發明又一實施例之可撓式畫素陣列基板100D的製造流程及其結構。本實施例的可撓式畫素陣列基板100D與前述可撓式畫素陣列基板100類似,因此相同或相對應的元件以相同或相對應的標號表示。本實施例的可撓式畫素陣列基板100D與前述可撓式畫素陣列基板100的差異在於:可撓式畫素陣列基板100D的周邊走線LD下方多設置了無機緩衝圖案122。以下主要就此差異處做說明,兩者相同之處請依照圖13、圖14A至圖14G以及圖15A至圖15G中的標號參照前述說明,便不再重述之。FIG. 13 is a top plan view of a flexible pixel array substrate according to still another embodiment of the present invention. 14A to 14G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to still another embodiment of the present invention. In particular, the region I of FIGS. 14A to 14G is a partial active region 110a corresponding to the flexible pixel array substrate 100D of FIG. 13, and the region II of FIGS. 14A to 14G is a flexible pixel array corresponding to FIG. A portion of the peripheral region 110b of the substrate 100D. 15A to 15G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to still another embodiment of the present invention. In particular, Figs. 15A to 15G correspond to the cross-sectional lines A-A' and B-B' of Figs. 14A to 14G. Hereinafter, a manufacturing flow and a structure of the flexible pixel array substrate 100D according to still another embodiment of the present invention will be described with reference to FIGS. 13, 14A to 14G, and FIGS. 15A to 15G. The flexible pixel array substrate 100D of the present embodiment is similar to the aforementioned flexible pixel array substrate 100, and thus the same or corresponding elements are denoted by the same or corresponding reference numerals. The difference between the flexible pixel array substrate 100D of the present embodiment and the flexible pixel array substrate 100 is that an inorganic buffer pattern 122 is disposed under the peripheral trace LD of the flexible pixel array substrate 100D. The following mainly explains the difference, and the same points are referred to the above description in accordance with the reference numerals in FIG. 13, FIG. 14A to FIG. 14G, and FIGS. 15A to 15G, and the description thereof will not be repeated.

請參照圖13、圖14A及圖15A,首先,提供可撓基板110。可撓基板110具有主動區110a以及主動區110a外的周邊區110b。接著,在可撓基板110上形成無機緩衝層BL。無機緩衝層BL具有多個緩衝凸部120’以及緩衝減薄部122。緩衝凸部120’的厚度大於緩衝減薄部122的厚度。接著,在多個緩衝凸部120’上分別形成多個半導體圖案130。請參照圖14B及圖15B,接著,形成第一無機絕緣層140’,以覆蓋無機緩衝層BL與半導體圖案130。然後,在第一無機絕緣層140’上形成第一導電層150。第一導電層150可包括多個閘極G以及多條掃描線(也可稱訊號線)SL。每一閘極G位於對應的一個半導體圖案130上方,且與對應的一條掃描線SL電性連接。Referring to FIG. 13 , FIG. 14A and FIG. 15A , first, a flexible substrate 110 is provided. The flexible substrate 110 has an active area 110a and a peripheral area 110b outside the active area 110a. Next, an inorganic buffer layer BL is formed on the flexible substrate 110. The inorganic buffer layer BL has a plurality of buffer convex portions 120' and a buffer thinned portion 122. The thickness of the buffer convex portion 120' is larger than the thickness of the buffer thinned portion 122. Next, a plurality of semiconductor patterns 130 are formed on the plurality of buffer convex portions 120', respectively. Referring to Fig. 14B and Fig. 15B, next, a first inorganic insulating layer 140' is formed to cover the inorganic buffer layer BL and the semiconductor pattern 130. Then, a first conductive layer 150 is formed on the first inorganic insulating layer 140'. The first conductive layer 150 may include a plurality of gates G and a plurality of scan lines (also referred to as signal lines) SL. Each gate G is located above a corresponding one of the semiconductor patterns 130 and is electrically connected to a corresponding one of the scan lines SL.

請參照圖14C及圖15C,接著,形成第二無機絕緣層160’,以覆蓋閘極G、掃描線SL以及部份第一無機絕緣層140’。 請參照圖14C、圖14D、圖15C以及圖15D,接著,圖案化第一無機絕緣層140’、第二無機絕緣層160’以及無機緩衝層BL,以形成多個第一無機絕緣圖案140、多個第二無機絕緣圖案160以及多個無機緩衝圖案120、122。如圖15D所示,多個半導體圖案130分別位於多個無機緩衝圖案120上。多個無機緩衝圖案122配置於可撓基板110的周邊區110b且彼此分離。每一第一無機絕緣圖案140位於對應的一個的閘極G與對應的一個半導體圖案130之間。每一第一無機絕緣圖案140覆蓋對應的一個半導體圖案130。每一閘極G配置於對應的一個第一無機絕緣圖案140上。每一第二無機絕緣圖案160覆蓋對應的一個閘極G以及對應的一個第一無機絕緣圖案140。每一第二無機絕緣圖案160與對應的一個第一無機絕緣圖案140分別具有接觸開口160a、140a。相連通的接觸開口140a、160a暴露出對應之一個半導體圖案130的兩側。特別是,多個半導體圖案130上的多個第一無機絕緣圖案140彼此分離。多個第一無機絕緣圖案140上的多個第二無機絕緣圖案160彼此分離。Referring to Fig. 14C and Fig. 15C, next, a second inorganic insulating layer 160' is formed to cover the gate G, the scanning line SL, and a portion of the first inorganic insulating layer 140'. Referring to FIG. 14C, FIG. 14D, FIG. 15C, and FIG. 15D, the first inorganic insulating layer 140', the second inorganic insulating layer 160', and the inorganic buffer layer BL are patterned to form a plurality of first inorganic insulating patterns 140, A plurality of second inorganic insulating patterns 160 and a plurality of inorganic buffer patterns 120, 122. As shown in FIG. 15D, a plurality of semiconductor patterns 130 are respectively located on the plurality of inorganic buffer patterns 120. The plurality of inorganic buffer patterns 122 are disposed on the peripheral region 110b of the flexible substrate 110 and separated from each other. Each of the first inorganic insulating patterns 140 is located between the corresponding one of the gates G and the corresponding one of the semiconductor patterns 130. Each of the first inorganic insulating patterns 140 covers a corresponding one of the semiconductor patterns 130. Each of the gates G is disposed on a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 covers a corresponding one of the gates G and a corresponding one of the first inorganic insulating patterns 140. Each of the second inorganic insulating patterns 160 and the corresponding one of the first inorganic insulating patterns 140 has contact openings 160a, 140a, respectively. The interconnecting contact openings 140a, 160a expose both sides of a corresponding one of the semiconductor patterns 130. In particular, the plurality of first inorganic insulating patterns 140 on the plurality of semiconductor patterns 130 are separated from each other. The plurality of second inorganic insulating patterns 160 on the plurality of first inorganic insulating patterns 140 are separated from each other.

請參照圖14E及圖15E,接著,形成第二導電層170。第二導電層170包括資料線(也可稱訊號線)DL、多個源極S、多個汲極D以及多個下層導線部172D。每一源極S與對應的一條資料線DL電性連接。每一源極S和每一汲極D與對應的一個半導體圖案130電性連接。每一無機緩衝圖案120、對應的一個半導體圖案130、對應的一個第一無機絕緣圖案140、對應的一個第二無機絕緣圖案160、對應的一個源極S以及對應的一個汲極D可視為一個薄膜電晶體T。薄膜電晶體T配置於可撓基板110的主動區110a。多個下層導線部172D配置於可撓基板110的周邊區110a。與可撓式畫素陣列基板100不同的是,在本實施例中,多個下層導線部172D是分別配置在彼此分離的多個無機緩衝圖案122上,而沒有和可撓基板110直接接觸。Referring to FIG. 14E and FIG. 15E, next, the second conductive layer 170 is formed. The second conductive layer 170 includes a data line (also referred to as a signal line) DL, a plurality of source S, a plurality of drain electrodes D, and a plurality of lower layer lead portions 172D. Each source S is electrically connected to a corresponding one of the data lines DL. Each source S and each of the drains D are electrically connected to a corresponding one of the semiconductor patterns 130. Each of the inorganic buffer patterns 120, the corresponding one of the semiconductor patterns 130, the corresponding one of the first inorganic insulating patterns 140, the corresponding one of the second inorganic insulating patterns 160, the corresponding one of the source electrodes S, and the corresponding one of the drain electrodes D can be regarded as one Thin film transistor T. The thin film transistor T is disposed on the active region 110a of the flexible substrate 110. The plurality of lower lead portions 172D are disposed in the peripheral region 110a of the flexible substrate 110. Unlike the flexible pixel array substrate 100, in the present embodiment, the plurality of lower wiring portions 172D are respectively disposed on the plurality of inorganic buffer patterns 122 separated from each other without being in direct contact with the flexible substrate 110.

請參照圖14F及圖15F,接著,形成第一有機絕緣層180以及第三導電層190。第一有機絕緣層180覆蓋薄膜電晶體T、可撓基板110的周邊區110b以及位於周邊區110b的下層導線部172D。第一有機絕緣層180具有多個接觸開口180a。每一下層導線部172D被對應的接觸開口180a暴露。請參照圖15F,第三導電層190配置於第一有機絕緣層180上。第三導電層190包括上層導線部192。在本實施例中,第三導電層190可選擇性地包括與汲極D電性連接的電極194。上層導線部192配置於第一有機絕緣層180上且填入第一有機絕緣層180的接觸開口180a,以和對應的下層導線部172D電性連接成周邊走線LD。周邊走線LD與訊號線電性連接。所述訊號線可指資料線DL、掃描線SL或其他用以傳遞訊號的適當導線。Referring to FIG. 14F and FIG. 15F, next, the first organic insulating layer 180 and the third conductive layer 190 are formed. The first organic insulating layer 180 covers the thin film transistor T, the peripheral region 110b of the flexible substrate 110, and the lower wiring portion 172D located in the peripheral region 110b. The first organic insulating layer 180 has a plurality of contact openings 180a. Each lower layer wire portion 172D is exposed by a corresponding contact opening 180a. Referring to FIG. 15F , the third conductive layer 190 is disposed on the first organic insulating layer 180 . The third conductive layer 190 includes an upper wire portion 192. In this embodiment, the third conductive layer 190 can selectively include an electrode 194 electrically connected to the drain D. The upper lead portion 192 is disposed on the first organic insulating layer 180 and filled in the contact opening 180a of the first organic insulating layer 180 to be electrically connected to the corresponding lower lead portion 172D to form the peripheral trace LD. The peripheral trace LD is electrically connected to the signal line. The signal line may refer to the data line DL, the scan line SL or other suitable wires for transmitting signals.

請參照圖14G及圖15G,接著,形成第二有機絕緣層200以及畫素電極210。第二有機絕緣層200覆蓋上層導線部192、電極194以及部份第一有機絕緣層180。第二有機絕緣層200具有接觸開口200a。接觸開口200a暴露出薄膜電晶體T的汲極D。畫素電極210與薄膜電晶體T電性連接。於此便完成了本實施例的可撓式畫素陣列基板100D。可撓式畫素陣列基板100D具有與可撓式畫素陣列基板100類似的功效與優點,於此便不再重述。Referring to FIGS. 14G and 15G, next, the second organic insulating layer 200 and the pixel electrode 210 are formed. The second organic insulating layer 200 covers the upper wiring portion 192, the electrode 194, and a portion of the first organic insulating layer 180. The second organic insulating layer 200 has a contact opening 200a. The contact opening 200a exposes the drain D of the thin film transistor T. The pixel electrode 210 is electrically connected to the thin film transistor T. Thus, the flexible pixel array substrate 100D of the present embodiment is completed. The flexible pixel array substrate 100D has similar functions and advantages as the flexible pixel array substrate 100, and will not be repeated here.

圖16為本發明一實施例之顯示面板的剖面示意圖。請參照圖16,顯示面板1000包括前述可撓式畫素陣列基板100、100C、100D之任一者、配置於可撓式畫素陣列基板100、100C、100D之任一者對向的對向基板300以及配置於可撓式畫素陣列基板100、100C、100D之任一者與與對向基板300之間的顯示介質400。在本實施例中,顯示介質400例如為有機電致發光層。然而,本發明限於此,在其他實施例中,顯示介質400也可以是液晶或其他適當材料。由於顯示面板1000採用述可撓式畫素陣列基板100、100C、100D之任一者,因此顯示面板1000也具有可彎曲的優點。Figure 16 is a cross-sectional view showing a display panel in accordance with an embodiment of the present invention. Referring to FIG. 16, the display panel 1000 includes any one of the flexible pixel array substrates 100, 100C, and 100D, and is disposed opposite to any of the flexible pixel array substrates 100, 100C, and 100D. The substrate 300 and the display medium 400 disposed between the flexible pixel array substrates 100, 100C, and 100D and the counter substrate 300. In the present embodiment, the display medium 400 is, for example, an organic electroluminescent layer. However, the invention is limited thereto, and in other embodiments, display medium 400 can also be liquid crystal or other suitable material. Since the display panel 1000 employs any of the flexible pixel array substrates 100, 100C, and 100D, the display panel 1000 also has the advantage of being bendable.

綜上所述,在本發明一實施例的可撓式畫素陣列基板及顯示面板中,多個薄膜電晶體的多個第一無機絕緣圖案彼此分離。換言之,材質較脆而易斷裂的第一無機絕緣層已斷成多個小塊(即多個第一無機絕緣圖案)。因此,當可撓式畫素陣列基板彎曲時,尺寸小的每一個第一無機絕緣圖案不易因可撓式畫素陣列基板的彎曲而產生裂痕。即便,某一個第一無機絕緣圖案因可撓式畫素陣列基板彎曲而產生裂痕,所述某一個第一無機絕緣圖案的裂痕也不易延伸到其他第一無機絕緣圖案上,而導致周邊的構件(例如:汲極、源極、部份周邊走線等)受損。藉此,可撓式畫素陣列基板之主動區的可彎曲程度可提升。As described above, in the flexible pixel array substrate and the display panel of one embodiment of the present invention, the plurality of first inorganic insulating patterns of the plurality of thin film transistors are separated from each other. In other words, the first inorganic insulating layer which is relatively brittle and easily broken is broken into a plurality of small pieces (ie, a plurality of first inorganic insulating patterns). Therefore, when the flexible pixel array substrate is bent, each of the first inorganic insulating patterns having a small size is less likely to be cracked by the bending of the flexible pixel array substrate. Even if a certain first inorganic insulating pattern is cracked due to bending of the flexible pixel array substrate, cracks of the one first inorganic insulating pattern are not easily extended to other first inorganic insulating patterns, resulting in peripheral members. (eg bungee, source, partial perimeter, etc.) damaged. Thereby, the flexible region of the active region of the flexible pixel array substrate can be improved.

另一方面,在本發明一實施例的可撓式畫素陣列基板及顯示面板中,透過將最靠近可撓基板的相對二側邊的第一、n條周邊走線設計為非直線狀,且將第一、n條周邊走線中間的多條周邊走線設計為直線狀,可節省所有周邊走線的佈局(layout)空間並兼顧可撓式畫素陣列基板之可彎曲程度。On the other hand, in the flexible pixel array substrate and the display panel according to the embodiment of the present invention, the first and n peripheral traces closest to the opposite sides of the flexible substrate are designed to be non-linear. Moreover, the plurality of peripheral traces in the middle of the first and n peripheral traces are designed to be linear, which can save the layout space of all the peripheral traces and take into account the flexibility of the flexible pixel array substrate.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

100、100C、100D‧‧‧可撓式畫素陣列基板
110‧‧‧可撓基板
110a‧‧‧主動區
110b‧‧‧周邊區
120‧‧‧無機緩衝圖案
120’‧‧‧緩衝凸部
122‧‧‧緩衝減薄部
130‧‧‧半導體圖案
140‧‧‧第一無機絕緣圖案
140’‧‧‧第一無機絕緣層
140a、160a、180a、200a‧‧‧接觸開口
140b、160b‧‧‧間隙
142‧‧‧第三無機絕緣圖案
150‧‧‧第一導電層
160‧‧‧第二無機絕緣圖案
160’‧‧‧第二無機絕緣層
162‧‧‧第四無機絕緣圖案
170‧‧‧第二導電層
172、172A、172B、172C、172D‧‧‧下層導線部
172a、192a‧‧‧非直線部
180‧‧‧第一有機絕緣層
190‧‧‧第三導電層
192、192A、192B‧‧‧上層導線部
194‧‧‧電極
200‧‧‧第二有機絕緣層
210‧‧‧畫素電極
300‧‧‧對向基板
400‧‧‧顯示介質
A-A’、B-B’‧‧‧剖線
BL‧‧‧無機緩衝層
DL‧‧‧資料線
D‧‧‧汲極
d‧‧‧方向
G‧‧‧閘極
L、L’、LA、LB、LC、LD‧‧‧周邊走線
11、l2‧‧‧連線
P1‧‧‧第一接觸點
P2‧‧‧第二接觸點
P3‧‧‧接觸點
S‧‧‧源極
SL‧‧‧掃描線
S1‧‧‧第一側邊
S2‧‧‧第二側邊
T‧‧‧薄膜電晶體
w1、w2、w3‧‧‧線寬
Ⅰ、Ⅱ‧‧‧區域
100, 100C, 100D‧‧‧ flexible pixel array substrate
110‧‧‧Flexible substrate
110a‧‧‧active area
110b‧‧‧ surrounding area
120‧‧‧Inorganic buffer pattern
120'‧‧‧buffer convex
122‧‧‧Buffering and thinning department
130‧‧‧Semiconductor pattern
140‧‧‧First inorganic insulation pattern
140'‧‧‧First inorganic insulation
140a, 160a, 180a, 200a‧‧‧ contact openings
140b, 160b‧‧‧ gap
142‧‧‧ Third inorganic insulation pattern
150‧‧‧First conductive layer
160‧‧‧Second inorganic insulation pattern
160'‧‧‧Second inorganic insulation
162‧‧‧fourth inorganic insulation pattern
170‧‧‧Second conductive layer
172, 172A, 172B, 172C, 172D‧‧‧ lower wire section
172a, 192a‧‧‧ non-linear
180‧‧‧First organic insulation
190‧‧‧ third conductive layer
192, 192A, 192B‧‧‧ upper wire section
194‧‧‧electrode
200‧‧‧Second organic insulation
210‧‧‧ pixel electrodes
300‧‧‧ opposite substrate
400‧‧‧Display media
A-A', B-B'‧‧‧ cut line
BL‧‧‧Inorganic buffer layer
DL‧‧‧ data line
D‧‧‧汲
D‧‧‧ Direction
G‧‧‧ gate
L, L', LA, LB, LC, LD‧‧‧ peripheral wiring
11, l2‧‧‧ connection
P1‧‧‧ first touch point
P2‧‧‧ second touch point
P3‧‧‧ touch points
S‧‧‧ source
SL‧‧‧ scan line
S1‧‧‧ first side
S2‧‧‧ second side
T‧‧‧film transistor
W1, w2, w3‧‧‧ line width I, II‧‧‧ area

圖1為本發明一實施例之可撓式畫素陣列基板的上視示意圖。 圖2A至圖2G為本發明一實施例之可撓式畫素陣列基板的製造流程上視示意圖。 圖3A至圖3G為本發明一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。 圖4示出本發明一實施例之可撓基板的周邊區以及其上的多條周邊走線。 圖5為根據圖4之剖線A-A’、B-B’所繪的周邊走線的剖面示意圖。 圖6為本發明一實施例之周邊走線的上視示意圖。 圖7為根據圖6的剖線A-A’所繪的周邊走線的剖面示意圖。 圖8為本發明另一實施例之周邊走線的上視示意圖。 圖9為根據圖8的剖線A-A’所繪的周邊走線的剖面示意圖。 圖10為本發明另一實施例之可撓式畫素陣列基板的上視示意圖。 圖11A至圖11G為本發明另一實施例之可撓式畫素陣列基板的製造流程上視示意圖。 圖12A至圖12G為本發明另一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。 圖13為本發明又一實施例之可撓式畫素陣列基板的上視示意圖。 圖14A至圖14G為本發明又一實施例之可撓式畫素陣列基板的製造流程上視示意圖。 圖15A至圖15G為本發明又一實施例之可撓式畫素陣列基板的製造流程剖面示意圖。 圖16為本發明一實施例之顯示面板的剖面示意圖。1 is a top plan view of a flexible pixel array substrate according to an embodiment of the invention. 2A to 2G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to an embodiment of the present invention. 3A to 3G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to an embodiment of the present invention. 4 illustrates a peripheral region of a flexible substrate and a plurality of peripheral traces thereon, in accordance with an embodiment of the present invention. Fig. 5 is a schematic cross-sectional view showing the peripheral traces taken along the line A-A', B-B' of Fig. 4. FIG. 6 is a top plan view of a peripheral trace according to an embodiment of the invention. Fig. 7 is a schematic cross-sectional view showing a peripheral trace taken along a line A-A' of Fig. 6. FIG. 8 is a top plan view of a peripheral trace according to another embodiment of the present invention. Fig. 9 is a schematic cross-sectional view showing a peripheral trace drawn along a line A-A' of Fig. 8. FIG. 10 is a top plan view of a flexible pixel array substrate according to another embodiment of the present invention. 11A to 11G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to another embodiment of the present invention. 12A to 12G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to another embodiment of the present invention. FIG. 13 is a top plan view of a flexible pixel array substrate according to still another embodiment of the present invention. 14A to 14G are schematic top views showing a manufacturing process of a flexible pixel array substrate according to still another embodiment of the present invention. 15A to 15G are schematic cross-sectional views showing a manufacturing process of a flexible pixel array substrate according to still another embodiment of the present invention. Figure 16 is a cross-sectional view showing a display panel in accordance with an embodiment of the present invention.

Claims (21)

一種可撓式畫素陣列基板,包括:一可撓基板,具有一主動區以及該主動區外的一周邊區;多條訊號線,配置於該可撓基板上;至少二個薄膜電晶體,陣列排列於該可撓基板的該主動區且與該些訊號線電性連接,每一薄膜電晶體包括:一半導體圖案;一閘極;一第一無機絕緣圖案,位於該閘極與該半導體圖案之間;一源極以及一汲極,與該半導體圖案電性連接,其中,該些薄膜電晶體的多個第一無機絕緣圖案彼此分離;多個畫素電極,與該些薄膜電晶體電性連接;以及一第一有機絕緣層,覆蓋該些薄膜電晶體的多個源極與多個汲極,該些畫素電極配置於該第一有機絕緣層上,其中,該第一有機絕緣層填入該些薄膜電晶體之該些第一無機絕緣圖案之間的間隙,以和該可撓基板接觸。 A flexible pixel array substrate comprising: a flexible substrate having an active region and a peripheral region outside the active region; a plurality of signal lines disposed on the flexible substrate; at least two thin film transistors, an array Arranging in the active region of the flexible substrate and electrically connecting to the signal lines, each of the thin film transistors includes: a semiconductor pattern; a gate; a first inorganic insulating pattern, the gate and the semiconductor pattern a source and a drain electrically connected to the semiconductor pattern, wherein the plurality of first inorganic insulating patterns of the thin film transistors are separated from each other; a plurality of pixel electrodes, and the thin film transistors And a first organic insulating layer covering the plurality of sources and the plurality of drains of the thin film transistors, wherein the pixel electrodes are disposed on the first organic insulating layer, wherein the first organic insulating layer A layer fills a gap between the first inorganic insulating patterns of the thin film transistors to contact the flexible substrate. 如申請專利範圍第1項所述的可撓式畫素陣列基板,其中該半導體圖案配置於該可撓基板上,該第一無機絕緣圖案覆蓋該半導體圖案,該閘極配置於該第一無機絕緣圖案上,每一該薄膜電晶體更包括:一第二無機絕緣圖案,覆蓋該閘極以及該第一無機絕緣圖案,該源極與該汲極配置於該第二無機絕緣圖案上並穿過該第二 無機絕緣圖案與該第一無機絕緣圖案,以和該半導體圖案電性連接,其中該些薄膜電晶體的多個第二無機絕緣圖案彼此分離。 The flexible pixel array substrate of claim 1, wherein the semiconductor pattern is disposed on the flexible substrate, the first inorganic insulating pattern covers the semiconductor pattern, and the gate is disposed on the first inorganic Each of the thin film transistors further includes: a second inorganic insulating pattern covering the gate and the first inorganic insulating pattern, wherein the source and the drain are disposed on the second inorganic insulating pattern and are worn Pass the second The inorganic insulating pattern and the first inorganic insulating pattern are electrically connected to the semiconductor pattern, wherein the plurality of second inorganic insulating patterns of the thin film transistors are separated from each other. 如申請專利範圍第2項所述的可撓式畫素陣列基板,其中每一該薄膜電晶體更包括一無機緩衝圖案,配置於該可撓基板上,該半導體圖案配置於該無機緩衝圖案上,其中,該些薄膜電晶體的多個無機緩衝圖案彼此分離。 The flexible pixel array substrate of claim 2, wherein each of the thin film transistors further comprises an inorganic buffer pattern disposed on the flexible substrate, the semiconductor pattern being disposed on the inorganic buffer pattern Wherein the plurality of inorganic buffer patterns of the thin film transistors are separated from each other. 如申請專利範圍第1項所述的可撓式畫素陣列基板,其中該第一有機絕緣層更覆蓋該可撓基板的該周邊區,且所述的可撓式畫素陣列基板更包括:多條周邊走線,配置於該可撓基板的該周邊區上且與該些薄膜電晶體電性連接,每一該周邊走線包括:至少一下層導線部,配置於該可撓基板上,該第一有機絕緣層覆蓋該下層導線部且具有暴露出該下層導線部的多個接觸開口;以及至少一上層導線部,配置於該第一有機絕緣層上且填入該第一有機絕緣層的該些接觸開口,以和該下層導線部電性連接。 The flexible pixel array substrate of claim 1, wherein the first organic insulating layer further covers the peripheral region of the flexible substrate, and the flexible pixel array substrate further comprises: a plurality of peripheral traces disposed on the peripheral region of the flexible substrate and electrically connected to the thin film transistors, each of the peripheral traces comprising: at least a lower layer of lead portions disposed on the flexible substrate The first organic insulating layer covers the lower conductive portion and has a plurality of contact openings exposing the lower conductive portion; and at least one upper conductive portion disposed on the first organic insulating layer and filled with the first organic insulating layer The contact openings are electrically connected to the lower wire portion. 如申請專利範圍第4項所述的可撓式畫素陣列基板,其中該至少一下層導線部為彼此分離的多個下層導線部,該至少一上層導線部為彼此分離的多個上層導線部,該些下層導線部與該些上層導線部交替排列並串接成該周邊走線。 The flexible pixel array substrate of claim 4, wherein the at least one lower wire portion is a plurality of lower wire portions separated from each other, and the at least one upper wire portion is a plurality of upper wire portions separated from each other The lower wire portions are alternately arranged with the upper wire portions and connected in series to the peripheral wires. 如申請專利範圍第4項所述的可撓式畫素陣列基板,其中該下層導線部具有一非直線部。 The flexible pixel array substrate of claim 4, wherein the lower wire portion has a non-linear portion. 如申請專利範圍第6項所述的可撓式畫素陣列基板,其中該上層導線部具有一非直線部。 The flexible pixel array substrate of claim 6, wherein the upper wire portion has a non-linear portion. 如申請專利範圍第7項所述的可撓式畫素陣列基板,其中該上層導線部的該非直線部與該下層導線部的該非直線部重疊,而該上層導線部的該非直線部填入該第一有機絕緣層的該些接觸開口,以和該下層導線部的該非直線部電性連接。 The flexible pixel array substrate according to claim 7, wherein the non-linear portion of the upper lead portion overlaps with the non-linear portion of the lower lead portion, and the non-linear portion of the upper lead portion is filled with the non-linear portion The contact openings of the first organic insulating layer are electrically connected to the non-linear portion of the lower lead portion. 如申請專利範圍第4項所述的可撓式畫素陣列基板,其中該可撓基板具有相對的一第一側邊與一第二側邊,該些周邊走線包含在該第一側邊指向該第二側邊的方向上依序排列的n條周邊走線,其中最靠近該第一側邊的該第一條周邊走線以及最靠近該第二側邊的該第n條周邊走線皆具有非直線部,而位於該第一條周邊走線和該第n條周邊走線之間的該些周邊走線呈直線狀。 The flexible pixel array substrate of claim 4, wherein the flexible substrate has a first side and a second side, and the peripheral traces are included on the first side n peripheral traces sequentially arranged in the direction of the second side, wherein the first perimeter trace closest to the first side and the n-th perimeter closest to the second side Each of the lines has a non-linear portion, and the peripheral traces between the first peripheral trace and the n-th peripheral trace are linear. 如申請專利範圍第9項所述的可撓式畫素陣列基板,其中該第一條周邊走線之該非直線部的最大線寬以及該第n條周邊走線之該非直線部的最大線寬大於位於該第一條周邊走線與該第n條周邊走線中間之部份該些周邊走線的最大線寬。 The flexible pixel array substrate of claim 9, wherein a maximum line width of the non-linear portion of the first peripheral trace and a maximum line width of the non-linear portion of the n-th peripheral trace are large And a maximum line width of the peripheral traces in a portion between the first peripheral trace and the n-th peripheral trace. 如申請專利範圍第9項所述的可撓式畫素陣列基板,其中該第一條周邊走線的該下層導線部具有與該第一條周邊走線的該上層導線部接觸的二第一接觸點,該第一條周邊走線之該下層導線部的該非直線部在該可撓基板上的垂直投影位於該些第一 接觸點在該可撓基板上之二垂直投影的連線與該第一側邊之間;該第n條周邊走線的該下層導線部具有與該第n條周邊走線的該上層導線部接觸的二第二接觸點,該第n條周邊走線之該下層導線部的該非直線部在該可撓基板上的垂直投影位於該些第二接觸點在該可撓基板上的二垂直投影的連線與該第二側邊之間。 The flexible pixel array substrate of claim 9, wherein the lower lead portion of the first peripheral trace has two first contacts with the upper lead portion of the first peripheral trace a contact point, a vertical projection of the non-linear portion of the lower lead portion of the first peripheral trace on the flexible substrate is located at the first a contact point between the two vertical projection lines on the flexible substrate and the first side; the lower lead portion of the nth peripheral trace has the upper lead portion of the n-th circumference And a second vertical contact point of the contact, the vertical projection of the non-linear portion of the lower-layer lead portion of the n-th peripheral trace on the flexible substrate is located at two vertical projections of the second contact points on the flexible substrate Between the line and the second side. 如申請專利範圍第4項所述的可撓式畫素陣列基板,其中該下層走線與該可撓基板接觸。 The flexible pixel array substrate of claim 4, wherein the lower layer trace is in contact with the flexible substrate. 如申請專利範圍第4項所述的可撓式畫素陣列基板,更包括:多個第三無機絕緣圖案,彼此分離且配置於該可撓基板的該周邊區上;以及多個第四無機絕緣圖案,彼此分離且分別配置於該些第三無機絕緣圖案上,其中每一該周邊走線的該些下層導線部分別配置於該些第四無機絕緣圖案上。 The flexible pixel array substrate of claim 4, further comprising: a plurality of third inorganic insulating patterns separated from each other and disposed on the peripheral region of the flexible substrate; and a plurality of fourth inorganic The insulating patterns are separated from each other and disposed on the third inorganic insulating patterns, wherein the lower conductive portions of each of the peripheral traces are respectively disposed on the fourth inorganic insulating patterns. 一種可撓式畫素陣列基板,包括:一可撓基板,具有一主動區以及該主動區外的一周邊區;多條訊號線,配置於該可撓基板上;多個薄膜電晶體,陣列排列於該可撓基板的該主動區上且與該些訊號線電性連接;多個畫素電極,與該些薄膜電晶體電性連接;以及多條周邊走線,配置於該可撓基板的該周邊區上且與該些薄膜電晶體電性連接,其中, 該可撓基板具有兩相對的一第一側邊與一第二側邊,該些周邊走線包含在該第一側邊指向該第二側邊的方向上依序排列的n條周邊走線,其中最靠近該第一側邊的該第一條周邊走線以及最靠近該第二側邊的該第n條周邊走線皆具有非直線部,而位於該第一條周邊走線和該第n條周邊走線之間的該些周邊走線呈直線狀。 A flexible pixel array substrate comprising: a flexible substrate having an active region and a peripheral region outside the active region; a plurality of signal lines disposed on the flexible substrate; a plurality of thin film transistors arranged in an array The plurality of pixel electrodes are electrically connected to the thin film transistors; and a plurality of peripheral traces are disposed on the flexible substrate. The peripheral region is electrically connected to the thin film transistors, wherein The flexible substrate has two opposite first sides and a second side, and the peripheral traces include n peripheral traces sequentially arranged in a direction in which the first side faces the second side The first perimeter trace closest to the first side and the nth perimeter trace closest to the second side have non-linear portions, and the first perimeter trace and the The peripheral traces between the n-th perimeter traces are linear. 如申請專利範圍第14項所述的可撓式畫素陣列基板,更包括:一第一有機絕緣層,覆蓋該些薄膜電晶體以及該可撓基板的該周邊區,其中每一該周邊走線包括:至少一下層導線部,配置於該可撓基板上,該第一有機絕緣層覆蓋該下層導線部且具有暴露出該下層導線部的多個接觸開口;以及至少一上層導線部,配置於該第一有機絕緣層上且填入該第一有機絕緣層的該些接觸開口,以和該上層導線部電性連接。 The flexible pixel array substrate of claim 14, further comprising: a first organic insulating layer covering the thin film transistors and the peripheral region of the flexible substrate, wherein each of the peripheral regions The wire includes: at least one lower wire portion disposed on the flexible substrate, the first organic insulating layer covering the lower wire portion and having a plurality of contact openings exposing the lower wire portion; and at least one upper wire portion configured The contact openings of the first organic insulating layer are filled in the first organic insulating layer to be electrically connected to the upper conductive portions. 如申請專利範圍第15項所述的可撓式畫素陣列基板,其中最靠近該第一側邊的該第一條周邊走線的下層導線部以及最靠近該第二側邊的該第n條周邊走線的下層導線部皆具有非直線部,而位於該第一條周邊走線和該第n條周邊走線之間的中間部份之該些周邊走線的下層導線部呈直線狀。 The flexible pixel array substrate of claim 15, wherein the lower lead portion of the first peripheral trace closest to the first side and the nth closest to the second side The lower lead portions of the peripheral traces of the strips each have a non-linear portion, and the lower lead portions of the peripheral traces located at an intermediate portion between the first peripheral trace and the n-th peripheral trace are linear . 如申請專利範圍第15項所述的可撓式畫素陣列基板,其中該第一條周邊走線和該第n條周邊走線的該非直線部的最大線寬大於位於中間部份之該些周邊走線的最大線寬。 The flexible pixel array substrate of claim 15, wherein a maximum line width of the first peripheral trace and the non-linear portion of the n-th peripheral trace is larger than the intermediate portion The maximum line width of the surrounding traces. 如申請專利範圍第15項所述的可撓式畫素陣列基板,其中該第一條周邊走線的該下層導線部具有與該第一條周邊走線的該上層導線部接觸的二第一接觸點,該第一條周邊走線之該下層導線部的該非直線部在該可撓基板上的垂直投影位於該些第一接觸點在該可撓基板上之二垂直投影的連線與該第一側邊之間;該第n條周邊走線的該下層導線部具有與該第n條周邊走線的該上層導線部接觸的二第二接觸點,該第n條周邊走線之該下層導線部的該非直線部在該可撓基板上的垂直投影位於該些第二接觸點在該可撓基板上的二垂直投影的連線與該第二側邊之間。 The flexible pixel array substrate of claim 15, wherein the lower lead portion of the first peripheral trace has two first contacts with the upper lead portion of the first peripheral trace a contact point, a vertical projection of the non-linear portion of the lower wire portion of the first peripheral trace on the flexible substrate is located at a line connecting the two vertical projections of the first contact points on the flexible substrate and the Between the first side; the lower lead portion of the nth peripheral trace has two second contact points in contact with the upper lead portion of the nth peripheral trace, and the nth peripheral trace A vertical projection of the non-linear portion of the lower wire portion on the flexible substrate is between a line connecting the two vertical projections of the second contact points on the flexible substrate and the second side. 如申請專利範圍第15項所述的可撓式畫素陣列基板,其中該至少一下層導線部為彼此分離的多條下層導線部,該至少一上層導線部為彼此分離的多條上層導線部,該些下層導線部與該些上層導線部交替排列並串接成該周邊走線。 The flexible pixel array substrate of claim 15, wherein the at least one lower wire portion is a plurality of lower wire portions separated from each other, and the at least one upper wire portion is a plurality of upper wire portions separated from each other The lower wire portions are alternately arranged with the upper wire portions and connected in series to the peripheral wires. 如申請專利範圍第15項所述的可撓式畫素陣列基板,其中該下層導線部與該上層導線部皆具有非直線部,該上層導線部的該非直線部與該下層導線部的該非直線部重疊,而該上層導線部的該非直線部填入該第一有機絕緣層的該些接觸開口,以和該下層導線部的該非直線部電性連接。 The flexible pixel array substrate of claim 15, wherein the lower wire portion and the upper wire portion each have a non-linear portion, the non-linear portion of the upper wire portion and the non-linear portion of the lower wire portion The portions overlap, and the non-linear portion of the upper lead portion is filled in the contact openings of the first organic insulating layer to be electrically connected to the non-linear portion of the lower lead portion. 一種可撓式顯示面板,包括: 如申請專利範圍第1~20項之任一項的可撓式畫素陣列基板;一對向基板,配置於該可撓式畫素陣列基板的對向;以及一顯示介質,配置於該可撓式畫素陣列基板與該對向基板之間。 A flexible display panel comprising: The flexible pixel array substrate according to any one of claims 1 to 20, wherein the pair of substrates are disposed opposite to the flexible pixel array substrate; and a display medium disposed on the substrate Between the flexible pixel array substrate and the opposite substrate.
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