TWI698083B - Surface dirt measurement method and measurement apparatus - Google Patents

Abstract

A surface dirt measurement method includes the following operations: moving a baffle of a measurement apparatus to expose a first optoelectronic element of the measurement apparatus, wherein the measurement apparatus further includes a second optoelectronic element and a control circuit; utilizing the control circuit to measure a first short-circuit current of the first optoelectronic element and a second short-circuit current of the second optoelectronic element; moving the baffle to cover the first optoelectronic element; utilizing the control circuit to calculate a difference between the first short-circuit current and the second short-circuit current, and to divide the difference by the first short-circuit current to obtain a percentage loss of an electricity production of the second optoelectronic element.

Description

Surface dirt measuring method and measuring device

This disclosure relates to a measurement method and related measurement devices, especially a method for measuring surface contamination of solar panels.

In order to achieve sustainable development of the environment, the proportion of solar photovoltaic power generation in the total power generation of advanced countries has gradually increased. Many factors can cause the power generation efficiency of a solar power station to decrease, such as components damaged over time, temperature changes, power loss in the power transmission path, and dirt accumulated on the surface of the solar panel. Among the above-mentioned various factors, the loss of power generation caused by surface pollution can reach about 8% of the maximum power generation, which is the most significant factor that causes the reduction of power generation efficiency of solar power stations. The traditional method is to regularly send staff to clean the solar panels, but the cleaning time period cannot be adjusted according to the accumulation of surface dirt. Therefore, the traditional method not only fails to effectively maintain the power generation efficiency of the solar power station, but may also waste labor costs for cleaning. Therefore, how to accurately measure the degree of dirt on the surface of the solar module to determine the timing of cleaning is actually a problem to be solved in the industry.

The present disclosure provides a method for measuring surface contamination, which includes the following steps: moving a baffle of a measuring device to expose a first photoelectric unit of the measuring device, wherein the measuring device further includes a second photoelectric unit and a control circuit; Use the control circuit to measure the first short circuit current of the first photoelectric unit and the second short circuit current of the second photoelectric unit; move the baffle to shield the first photoelectric unit; use the control circuit to calculate the difference between the first short circuit current and the second short circuit current And divide the difference by the first short-circuit current to obtain the percentage of power generation loss of the second photovoltaic unit.

The present disclosure provides a measurement device, which includes a first photoelectric unit, a second photoelectric unit, a baffle, and a control circuit. The baffle is used to shield the first photoelectric unit. The control circuit is used to measure the first short-circuit current of the first photoelectric unit and the second short-circuit current of the second photoelectric unit. When the measuring device moves the baffle to expose the first photoelectric unit, the control circuit calculates the difference between the first short-circuit current and the second short-circuit current, and divides the difference by the first short-circuit current to obtain the second photoelectric unit The percentage of power generation loss.

The above-mentioned surface contamination measurement method and measurement device can accurately estimate the contamination level of the surrounding solar panels.

100, 100A, 100B, 100C, 100D‧‧‧Measuring device

110a‧‧‧First photoelectric unit

110b‧‧‧Second photoelectric unit

120, 120A, 120B‧‧‧stop plate

130、130B‧‧‧Drive device

140‧‧‧First T-slide

150‧‧‧The first T-shaped fixing

160‧‧‧Clamping unit

SF‧‧‧surface

172‧‧‧Upper clip body

174‧‧‧Lower clip body

176‧‧‧Bolt

Rw1‧‧‧First Right Wing

Rw2‧‧‧Second Right Wing

Lw1‧‧‧First Left Wing

Lw2‧‧‧Second Left Wing

CP1‧‧‧First top plate

CP2‧‧‧Second top plate

Th1‧‧‧First screw hole

Th2‧‧‧Second screw hole

210a~210n‧‧‧Solar Panel

220a、220b‧‧‧Support frame

310, 310A‧‧‧Control circuit

312a‧‧‧First current detection unit

312b‧‧‧Second current detection unit

314‧‧‧Processing Unit

316‧‧‧Communication Unit

320‧‧‧Host

400, 600‧‧‧Surface dirt measurement method

S402~S412, S610~S616‧‧‧Process

710‧‧‧shaft

720‧‧‧ groove

132‧‧‧Opening

122a~122d‧‧‧Curtain

910, 1010‧‧‧L type connector

920‧‧‧Second T-shaped fixing piece

930‧‧‧bracket

940‧‧‧Second T-slide

Vha‧‧‧First through hole

Vhb‧‧‧Second through hole

912、1012‧‧‧Part One

914、1014‧‧‧Part Two

FIG. 1A is a simplified perspective view of the measuring device according to an embodiment of the present disclosure.

Figure 1B is a simplified exploded view of the measuring device of Figure 1A.

Figure 2 is an application scenario of the measurement device of Figure 1A in an embodiment Schematic.

FIG. 3 is a simplified functional block diagram of the control circuit according to an embodiment of the present disclosure.

FIG. 4 is a simplified flowchart of a surface contamination measurement method according to an embodiment of the present disclosure.

FIG. 5 is a simplified functional block diagram of the control circuit according to another embodiment of the present disclosure.

FIG. 6 is a simplified flow chart of the surface contamination measurement method according to another embodiment of the present disclosure.

FIG. 7A is a simplified perspective view of the measurement device according to an embodiment of the present disclosure.

Figure 7B is a schematic diagram of the operating state of the measuring device.

FIG. 8A is a simplified perspective view of the measurement device according to an embodiment of the present disclosure.

Figure 8B is a schematic diagram of the operating state of the measuring device.

FIG. 9A is a simplified perspective view of the measuring device according to an embodiment of the present disclosure.

Figure 9B is a simplified exploded view of the measuring device.

FIG. 10A is a simplified perspective view of the measurement device according to an embodiment of the present disclosure.

Figure 10B is a simplified exploded view of the measuring device.

The following will explain the implementation of this disclosure document with the relevant drawings example. In the drawings, the same reference numerals indicate the same or similar elements or method flows.

FIG. 1A is a simplified perspective view of the measurement device 100 according to an embodiment of the present disclosure. The measuring device 100 includes a first photoelectric unit 110a, a second photoelectric unit 110b, a baffle 120, a driving device 130, and a control circuit (not shown in FIG. 1A) inside the measuring device 100. The first photoelectric unit 110a and the second photoelectric unit 110b are located on a surface SF of the measuring device. The driving device 130 is coupled to the baffle 120 and is used to move the baffle 120 in a horizontal direction (ie, a direction parallel to the surface SF) to switch the first photoelectric unit 110a between the exposed state or the shielded state. The aforementioned exposure state may be a state in which the first photoelectric unit 110a is not shielded by the baffle 120, and thus can receive light. Conversely, the shielding state may be a state in which the first photoelectric unit 110a is covered by the baffle 120 and therefore cannot receive light. The control circuit is used to control the operation of the driving device 130, and is used to compare the short-circuit current generated by the first photoelectric unit 110a and the second photoelectric unit 110b through photovoltaic power generation.

The measuring device 100 further includes a first T-shaped sliding rail 140, a plurality of first T-shaped fixing members 150 and a plurality of clamping units 160. The plurality of first T-shaped fixing members 150 are embedded in the first T-shaped sliding rail 140, and each clamping unit 160 is correspondingly coupled to one of the plurality of first T-shaped fixing members 150. The clamping unit 160 is used to fix the measuring device 100 on one side of a solar panel. In detail, when the measuring device 100 is clamped to the solar panel through the plurality of clamping units 160, the plurality of T-shaped fixing members 150 and the solar panel are located on opposite sides of the plurality of clamping units 160, respectively.

Figure 1B is a simplified analysis of the measuring device 100 in Figure 1A Solution diagram. The clamping unit 160 includes an upper clamping body 172, a lower clamping body 174 and a bolt 176. The upper clip body 172 includes a first top plate CP1, a first left wing portion Lw1, and a first right wing portion Rw1. The first left wing portion Lw1 and the first right wing portion Rw1 are located on the same surface of the first top board CP1, and both extend from the surface of the first top board CP1 in a direction away from the first top board CP1. The first top plate CP1 includes a first screw hole Th1, and the first screw hole Th1 is located between the first left wing portion Lw1 and the first right wing portion Rw1.

The lower clip body 174 includes a second top plate CP2, a second left wing portion Lw2, and a second right wing portion Rw2. The second left wing portion Lw2 and the second right wing portion Rw2 are located on the same surface of the second top board CP2, and both extend from the surface of the second top board CP2 in a direction away from the second top board CP2. The first T-shaped fixing member 150 passes through the second right wing portion Rw2 through the through hole Vh of the second right wing portion Rw2, so that the clamping unit 160 is coupled to the first T-shaped fixing member 150. In detail, the first T-shaped fixing member 150 has threads. When the first T-shaped fixing member 150 passes through the through hole Vh of the second right wing portion Rw2, the second right wing portion Rw2 can be fixed to the first T-shaped fixing member 150 through a nut, wherein the nut is screwed to the first T Type fixing piece 150. The second top plate CP2 includes a second screw hole Th2, and the second screw hole Th2 is located between the second left wing portion Lw2 and the second right wing portion Rw2.

When the bolt 176 is threadedly connected to the upper clip body 172 and the lower clip body 174 through the first screw hole Th1 and the second screw hole Th2, the first left wing portion Lw1 and the second left wing portion Lw2 extend in opposite directions, and the first right wing The portion Rw1 and the second right wing portion Rw2 extend in opposite directions. Therefore, the distance between the upper clip body 172 and the lower clip body 174 can be adjusted by rotating the bolt 176, so that the measuring device 100 can be coupled to solar panels of different thicknesses.

FIG. 2 is a schematic diagram of an application scenario of the measurement device 100 of FIG. 1A in an embodiment. The measuring device 100 is installed in a photovoltaic array (photovoltaic array) including a plurality of solar panels 210a-210n. The measurement device 100 is coupled to one of the solar panels 210a to 210n or to the support frames 220a and 220b of the solar panels 210a to 210n through the aforementioned clamping unit 160. Please refer to Figure 1A and Figure 2 at the same time. The driving device 130 will remove the baffle 120 in a short period of time (for example, 1 to 3 seconds), so that the first photoelectric unit 110a and the second photoelectric unit 110b can receive together Light causes short-circuit current. In addition, the driving device 130 uses the baffle 120 to shield the first photoelectric unit 110a during the rest of the time to prevent dirt from accumulating on the surface of the first photoelectric unit 110a. In this way, during the period when the baffle 120 is removed, the control circuit can compare the short-circuit currents of the first photoelectric unit 110a and the second photoelectric unit 110b to determine the degree of contamination on the surface of the second photoelectric unit 110b, thereby determining the solar panel The degree of dirt on the surface of the solar panel adjacent to the measuring device 100 among 210a to 210n.

In practice, the driving device 130 can be realized by a frame electromagnet. In one embodiment, the first photoelectric unit 110a and the second photoelectric unit 110b of the measuring device 100 and the adjacent solar panels have similar or the same sunlight incidence angles, so as to accurately estimate the accumulation degree of surface contamination of the adjacent solar panels .

FIG. 3 shows a simplified functional block diagram of a control circuit 310 that can be used to implement the control circuit of the measurement device 100. The control circuit 310 is located inside the measurement device 100 and includes a first current detection unit 312a, a second current detection unit 312b, a processing unit 314, and a communication unit 316. The first current detection unit 312a and the second current detection unit 312b are used for receiving the first short-circuit current Isa and the second short-circuit current Isb, respectively. The first short-circuit current Isa and the second short-circuit current Isb are respectively generated by the first photoelectric unit 110a and the second photoelectric unit 110b of FIG. 1A. The processing unit 314 is configured to receive digital or analog data representing the magnitude of the first short-circuit current Isa and the second short-circuit current Isb from the first current detection unit 312a and the second current detection unit 312b, respectively. In addition, the processing unit 314 is also used to compare the magnitude of the first short-circuit current Isa and the second short-circuit current Isb, and to control the operation of the driving device 130. The communication unit 316 is coupled to the processing unit 314 and is used to communicate with the host 320 through the network. The host 320 is used to provide a user interface, and the user interface can display information from the measuring device 100.

In practice, the first current detection unit 312a and the second current detection unit 312b can be implemented by a feedback circuit including an amplifier, a resistor and a capacitor, and an analog-to-digital converter. The aforementioned network may be an Internet or an internal network that uses various communication protocols for data exchange. The communication unit 316 can be implemented by various wired network interfaces, wireless network interfaces, or circuits that integrate the foregoing two functions at the same time. The different functional blocks in the aforementioned control circuit 310 can be implemented by different circuits, or can be integrated into a single circuit chip. For example, at least one of the first current detection unit 312a, the second current detection unit 312b, and the communication unit 316 of the control circuit 310 and the processing unit 314 can be integrated into a single chip.

FIG. 4 is a simplified flowchart of a surface contamination measurement method 400 according to an embodiment of the present disclosure. The surface contamination measurement method 400 includes steps S402 to S418, and is applicable to the aforementioned measurement device 100 and control Circuit 310. In the process S402, the processing unit 314 controls the driving device 130 to remove the baffle 120 to expose the first photoelectric unit 110a. After the baffle 120 is removed, the first photovoltaic unit 110a and the second photovoltaic unit 110b can perform solar photovoltaic power generation together, and generate a first short-circuit current Isa and a second short-circuit current Isb, respectively.

For example, in an embodiment where the driving device 130 is implemented by a frame type electromagnet, the baffle 120 is an iron core coupled to the frame type electromagnet. The processing unit 314 can apply a voltage to the coil of the frame electromagnet to attract the iron core of the frame electromagnet to move, and then move the baffle 120 away from the first photoelectric unit 110a in a drag manner.

In the process S404, the first current detection unit 312a and the second current detection unit 312b respectively measure the magnitude of the first short-circuit current Isa and the second short-circuit current Isb. The first current detection unit 312a and the second current detection unit 312b also transmit the measurement result to the processing unit 314. Next, the measurement device 100 performs the process S406 to use the driving device 130 to push the baffle 120 to cover the first photoelectric unit 110a. For example, when the driving device 130 is implemented by a frame electromagnet, the processing unit 314 can switch the coil of the frame electromagnet from the energized state to the off state, so as to reset the core of the frame electromagnet, and then push The baffle 120 is above the first photoelectric unit 110a.

In the process S408, the processing unit 314 calculates the power generation loss percentage of the second photovoltaic unit 110b according to the following "Equation 1" according to the received measurement result.

其中，Ploss表示第二光電單元110b的發電量損失百分比。

Wherein, Ploss represents the percentage of power generation loss of the second photovoltaic unit 110b.

Next, in the process S410, the processing unit 314 compares the power generation loss percentage of the second photoelectric unit 110b with a preset percentage. The processing unit 314 also determines whether to notify the host 320 to clean the solar panel near the measurement device 100 according to the comparison result. For example, when the power generation loss percentage of the solar module 110b is greater than or equal to a preset percentage (for example, 10%), the processing unit 314 will determine that the host 320 needs to be notified. If the processing unit 314 determines that the host 320 needs to be notified, the measurement device 100 will then execute the process S412. In the process S412, the processing unit 314 generates a cleaning notification, and uses the communication unit 316 to transmit the cleaning notification to the host 320 via the network. When the host end 320 receives the cleaning notification, the host end 320 may prompt the user to send a staff to perform cleaning through a related user interface.

In one embodiment, a plurality of measurement devices 100 are installed in different positions of a solar power plant. The cleaning notification generated by each measuring device 100 includes the location information of the measuring device 100. Therefore, when the host 320 receives the cleaning notification, the host 320 will notify the user to clean the location of the corresponding measurement device 100 according to the location information contained in the cleaning notification.

After the process S412 ends, the measuring device 100 will end the surface contamination measuring method 400. On the other hand, if the processing unit 314 determines in the process S410 that there is no need to notify the host 320, the measurement device 100 will directly end the surface contamination measurement method 400.

It can be seen from the above that the measuring device 100 has the advantages of simple structure and small size. In addition, the surface contamination measurement method 400 can accurately estimate the degree of contamination of the surrounding solar panels, thereby saving the time and labor costs of cleaning solar panels in the solar power plant.

FIG. 5 shows a simplified functional block diagram of another control circuit 310A that can be used to implement the control circuit of the measurement device 100. The control circuit 310A is similar to the control circuit 310. The difference is that the communication unit 316 of the control circuit 310A is not only used to communicate with the host 320 through the network, but also used to communicate with the cloud server 510 through the network. The cloud server 510 is used to store various data required for the operation of the processing unit 314, such as weather statistics and weather forecast data.

In the embodiment in which the measurement device 100 includes the control circuit 310A, the measurement device 100 can execute the surface contamination measurement method 600 shown in FIG. 6. The processes S402 to S408 of the surface contamination measurement method 600 are similar to the corresponding processes in the surface contamination measurement method 400, and are not repeated here for brevity. In the process S610 of the surface contamination measurement method 600, the processing unit 314 compares the power generation loss percentage of the second photoelectric unit 110b with a preset percentage (for example, 50%). If the power generation loss percentage of the second photoelectric unit 110b is greater than or equal to the preset percentage, the processing unit 314 will further execute the process S612.

In the process S612, the processing unit 314 receives the weather forecast data of the area where the measurement device 100 is located from the cloud server 510 through the communication unit 316. In addition, the processing unit 314 compares a preset probability with a rainfall probability corresponding to a preset period in the future in the weather forecast data. If the rain machine If the rate is less than the preset probability, the measuring device 100 will then execute the process S614. In the process S614, the processing unit 314 generates the aforementioned cleaning notification, and transmits the cleaning notification to the host through the communication unit 316 to notify the user to clean the solar panel near the measurement device 100. In practice, the aforementioned preset period can be 12 hours, 24 hours, or one week. In addition, the preset probability can be 10%.

On the other hand, if the rain probability is greater than or equal to the preset probability, the measuring device 100 will then perform the process S616. In the process S616, the processing unit 314 will receive the meteorological statistical data of the area where the measurement device 100 is located from the cloud server 510 through the communication unit 316 at the end of the predetermined period. Then, the processing unit 314 determines whether a rainfall event has occurred during the preset period according to the weather statistics. If the processing unit 314 determines that no rainfall event has occurred within the preset period, the measurement device 100 will then execute the aforementioned process S614. If the processing unit 314 determines that a rain event has occurred within the preset period, the measuring device 100 will end the surface contamination measuring method 600.

In addition, when the aforementioned process S614 ends, the measuring device 100 will end the surface contamination measuring method 600. In addition, in the aforementioned process S610, if the power generation loss percentage of the second photoelectric unit 110b is less than the preset percentage, the measuring device 100 will directly end the surface contamination measuring method 600.

It can be seen from the above that by executing the surface contamination measurement method 600, the measurement device 100 can prevent the surrounding solar panels from accumulating dirt due to rain in a short time after cleaning. In practice, the measuring device 100 can be executed one or more times at any point in time (for example, when the sun is sufficient and the weather is clear) Surface contamination measurement methods 400 and 600.

FIG. 7A is a simplified perspective view of the measurement device 100A according to an embodiment of the present disclosure. The measurement device 100A is similar to the measurement device 100 and can be used to perform surface contamination measurement methods 400 and 600. The difference between the measuring device 100A and the measuring device 100 is that the baffle 120A of the measuring device 100A has a recess 720, and the driving device (not shown in Figure 7A) of the measuring device 100A is located in the measuring device The interior of 100A. The driving device of the measuring device 100A includes a rotating shaft 710, and the rotating shaft 710 is pivotally connected to the baffle 120A. When the driving device rotates the rotating shaft 710, the rotating shaft 710 drives the baffle plate 120A to rotate to change the relative position of the concave portion 720 and the first photoelectric unit 110a. In practice, the driving device can be realized by a stepping motor.

In this embodiment, the concave portion 720 of the baffle 120A has a fan shape of equal sides or unequal sides. However, the present disclosure is not limited to this embodiment, and the shape of the recess 720 can be designed according to actual requirements. Referring to FIG. 7B, when the measuring device 100A executes step S402 of the surface contamination measuring method 400 or 600, the driving device will rotate the baffle 120A so that the first photoelectric unit 110a is located in the vertical projection of the concave portion 720 on the surface SF , To expose the first photoelectric unit 110a.

On the contrary, please refer to FIG. 7A again. When the measuring device 100A performs step S406 of the surface contamination measuring method 400 or 600, the driving device will rotate the baffle 120A so that the first photoelectric unit 110a is not located on the concave portion 720 on the surface SF Within the vertical projection. In other words, the first photoelectric unit 110a will be covered by the baffle 120A. The remaining connection methods, components, implementations and advantages of the aforementioned measuring device 100 are all applicable to the measuring device 100A, which is simple For the sake of this, I will not repeat them here.

FIG. 8A is a simplified functional block diagram of the measurement device 100B according to an embodiment of the present disclosure. The measurement device 100B is similar to the measurement device 100 and can be used to perform surface contamination measurement methods 400 and 600. The difference between the measuring device 100B and the measuring device 100 is that the driving device 130B of the measuring device 100B includes a rectangular opening 132, and the baffle 120B of the measuring device 100B is disposed in the opening 132 and includes a plurality of curtains 122a~ 122d. The driving device 130B is used to drive the curtains 122 a to 122 d so that the curtains 122 a to 122 d are in an unfolded state or an overlapping state. The number of curtains 122a to 122d in FIG. 8A is only an exemplary illustration, and the number of curtains can be designed according to actual requirements. In practice, the driving device 130B and the baffle 120B can be realized by an electronic shutter.

Referring to FIG. 8B, when the measuring device 100B executes step S402 of the surface contamination measuring method 400 or 600, the driving device 130B will drive the curtains 122a-122d so that the curtains 122a-122d form an overlapping state. The area of the opening 132 is larger than the area of the first photoelectric unit 110a, and the first photoelectric unit 110a is located in the vertical projection of the opening 132 on the surface SF. Therefore, when the curtains 122a-122d form an overlapping state, the curtains 122a-122d will not overlap the first photoelectric unit 110a to expose the first photoelectric unit 110a.

On the contrary, please refer to FIG. 8A again. When the measuring device 100B executes step S406 of the surface contamination measuring method 400 or 600, the driving device 130B will drive the curtains 122a-122d to make the curtains 122a-122d unfolded. In this way, the curtains 122a to 122d completely fill the opening 132 to shield the first photoelectric unit 110a. The remaining connection parties of the aforementioned measuring device 100 The formulas, components, implementations, and advantages are all applicable to the measuring device 100B. For the sake of brevity, the details are not repeated here.

FIG. 9A is a simplified perspective view of a measurement device 100C according to an embodiment of the present disclosure. The measuring device 100C is similar to the measuring device 100. The difference is that the measuring device 100C uses a plurality of L-shaped connectors 910 instead of the plurality of clamping units 160. The measuring device 100C further includes a first T-shaped sliding rail 140, a plurality of first T-shaped fixing members 150 and a plurality of second T-shaped fixing members 920. The plurality of first T-shaped fixing members 150 are embedded in the first T-shaped sliding rail 140, and each first T-shaped fixing member 150 is correspondingly coupled to one of the plurality of L-shaped connecting members 910. Each second T-shaped fixing member 920 is also correspondingly coupled to one of the plurality of L-shaped connecting members, and can be used to be embedded in the second T-shaped sliding rail 940 of a bracket 930. In practice, the bracket 930 may be a bracket for supporting a solar panel.

Figure 9B is a simplified exploded schematic diagram of the measuring device 100C. The L-shaped connector 910 includes a first part 912 and a second part 914. There is an included angle between the first part 912 and the second part 914, and the included angle is greater than or equal to 70° and less than or equal to 120°. However, the present disclosure is not limited to this embodiment, and the angle between the first part 912 and the second part 914 can be designed according to actual requirements. The first part 912 includes a first through hole Vha, and the first T-shaped fixing member 150 passes through the first part 912 through the first through hole Vha. The second part 914 includes a second through hole Vhb, and the second T-shaped fixing member 920 passes through the second part 914 through the second through hole Vhb.

When the first T-shaped fixing member 150 passes through the first through hole Vha, the first part 912 can be fixed to each other with the first T-shaped fixing member 150 through the nut. The middle nut is threadedly connected to the first T-shaped fixing member 150. Similarly, when the second T-shaped fixing member 920 passes through the second through hole Vhb, the second part 914 can be fixed to the second T-shaped fixing member 920 through another nut, wherein the other nut is screwed to The second T-shaped fixing member 920. The remaining connection modes, components, implementations, and advantages of the aforementioned measuring device 100 are all applicable to the measuring device 100C, and for the sake of brevity, the details are not repeated here.

FIG. 10A is a simplified perspective view of a measuring device 100D according to an embodiment of the present disclosure. The measuring device 100D is similar to the measuring device 100C. The difference is that the measuring device 100D uses a plurality of U-shaped fixing members 1020 instead of a plurality of second T-shaped fixing members 920. As shown in FIG. 10A, each L-shaped connecting member 1010 of the measuring device 100D is coupled to two U-shaped fixing members 1020. All the U-shaped fixing members 1020 are arranged in parallel to each other, so that the bracket 1030 passes through the accommodating space between the U-shaped fixing member 1020 and the L-shaped connecting member 1010.

Figure 10B is a simplified exploded view of the measuring device 100D. The second part 1014 of the L-shaped connector 1010 has a plurality of second through holes Vhb. Each U-shaped fixing member 1020 includes a first end and a second end. The first end of the U-shaped fixing member 1020 passes through one of the plurality of second through holes Vhb, and the second end of the U-shaped fixing member 1020 passes through the plurality of The other of the second through holes Vhb. When the first end and the second end of the U-shaped fixing member 1020 pass through the second part 1014, the first end and the second end of the U-shaped fixing member 1020 can be fixed to the second part 1014 through two nuts. , Wherein the two nut caps are respectively screwed to the first end and the second end of the U-shaped fixing member 1020. The remaining connection methods, components, implementations and advantages of the aforementioned measuring device 100C are all applicable For the measurement device 100D, for the sake of brevity, details are not repeated here.

In summary, when the measuring devices 100A, 100B, 100C, and 100D are installed on the solar panel or the solar panel bracket, there is no need to destroy the structure of the original power generation system. In addition, the measuring devices 100A, 100B, 100C and 100D also have the advantages of fewer components and easy installation.

The execution sequence of the processes in the foregoing flowcharts is only an exemplary embodiment, and does not limit the actual implementation of the present invention. For example, in the foregoing flowcharts, the process S406 can be performed simultaneously with the process S408.

Certain words are used in the specification and the scope of the patent application to refer to specific elements. However, those with ordinary knowledge in the technical field should understand that the same element may be called by different terms. The specification and the scope of the patent application do not use the difference in names as a way of distinguishing elements, but the difference in function of the elements as the basis for distinguishing. The "including" mentioned in the specification and the scope of the patent application is an open term, so it should be interpreted as "including but not limited to". In addition, "coupling" here includes any direct and indirect connection means. Therefore, if it is described in the text that the first element is coupled to the second element, it means that the first element can be directly connected to the second element through electrical connection, wireless transmission, optical transmission, or other signal connection methods, or through other elements or connections. The means is indirectly connected to the second element electrically or signally.

In addition, unless otherwise specified in the specification, any term in the singular case also includes the meaning of the plural case.

The above are only the preferred embodiments of the present disclosure. All equal changes and modifications made in accordance with the requirements of the present disclosure shall belong to the present disclosure. The scope of coverage.

100‧‧‧Measuring device

110a‧‧‧First photoelectric unit

110b‧‧‧Second photoelectric unit

120‧‧‧stop plate

130‧‧‧Drive

140‧‧‧First T-slide

150‧‧‧The first T-shaped fixing

160‧‧‧Clamping unit

SF‧‧‧surface

Claims (16)

A method for measuring surface contamination, comprising: moving a baffle of a measuring device to expose a surface of a first photoelectric unit of the measuring device, wherein the measuring device further comprises a second photoelectric unit and A control circuit; using the control circuit to measure a first short-circuit current of the first photoelectric unit and a second short-circuit current of the second photoelectric unit; using the baffle plate to cover the surface of the first photoelectric unit; and using The control circuit calculates a difference between the first short circuit current and the second short circuit current, and divides the difference by the first short circuit current to obtain a power generation loss percentage of the second photoelectric unit. The surface contamination measurement method according to claim 1, further comprising: comparing the power generation loss percentage with a preset percentage by using the control circuit; and if the power generation loss percentage is greater than the preset percentage, using the measurement The device transmits a cleaning command to a host. The surface contamination measurement method according to claim 1, further comprising: using the control circuit to compare the percentage of power generation loss with a preset percentage; if the percentage of power generation loss is greater than the preset percentage, using the control circuit The control circuit compares a rainfall probability of a weather forecast data with a preset probability; and if the rainfall probability is less than the preset probability, the measuring device is used to send a cleaning command to a host. The method for measuring surface contamination according to any one of claims 1 to 3, wherein the measuring device further includes a driving device for moving the baffle in a horizontal direction. The method for measuring surface contamination according to any one of claims 1 to 3, wherein the measuring device further comprises a driving device, a rotating shaft of the driving device is pivotally connected to the baffle plate, wherein, when the rotating shaft When rotating, the shaft will drive the baffle to rotate. The method for measuring surface contamination according to any one of claims 1 to 3, wherein the measuring device further includes a driving device, the baffle includes a plurality of curtains, and the driving device is used to drive the plurality of curtains The curtain is such that the multiple curtains are formed in an unfolded state to cover the surface of the first photoelectric unit, or the multiple curtains are formed in an overlapping state to expose the surface of the first photoelectric unit. A measuring device comprising: a first photoelectric unit; a second photoelectric unit; A baffle covering a surface of the first photoelectric unit; and a control circuit for measuring a first short-circuit current of the first photoelectric unit and a second short-circuit current of the second photoelectric unit ; Wherein when the measuring device moves the baffle to expose the surface of the first photoelectric unit, the control circuit calculates a difference between the first short-circuit current and the second short-circuit current, and divides the difference by The first short-circuit current is used to obtain a power generation loss percentage of the second photovoltaic unit. The measurement device according to claim 7, wherein the control circuit is further used to compare the power generation loss percentage with a preset percentage, and the control circuit further includes: a communication circuit; wherein, if the power generation loss percentage More than the preset percentage, the communication circuit sends a cleaning command to a host. The measurement device according to claim 7, wherein the control circuit is further used to compare the power generation loss percentage with a preset percentage, and the control circuit further includes: a communication circuit for receiving from a server A weather forecast data; wherein, if the power generation loss percentage is greater than the preset percentage, the control circuit compares a rainfall probability of the weather forecast data with a preset probability; wherein, if the rainfall probability is less than the preset probability, the control circuit Communication circuit Send a cleaning command to a host side. The measuring device according to any one of claims 7 to 9, further comprising: a driving device for moving the baffle in a horizontal direction. The measurement device according to any one of claims 7 to 9, further comprising: a driving device including a rotating shaft, wherein the rotating shaft is pivotally connected to the baffle plate, and when the rotating shaft rotates, the rotating shaft will drive the The baffle plate rotates. The measurement device according to any one of claims 7 to 9, further comprising: a driving device including an opening; wherein the baffle is disposed in the opening and includes a plurality of curtains, and the driving device is used for The multiple curtains are driven to form an unfolded state to cover the surface of the first photoelectric unit, or the multiple curtains are formed into an overlapping state to expose the surface of the first photoelectric unit. The measuring device according to any one of claims 7 to 9, further comprising: a first T-shaped sliding rail; a first T-shaped fixing member embedded in the first T-shaped sliding rail; and a The clamping unit, coupled to the first T-shaped fixing part, when the measuring device When a solar panel is clamped by the clamping unit, the T-shaped fixing member and the solar panel are respectively located on opposite sides of the clamping unit. The measurement device according to claim 13, wherein the clamping unit includes: an upper clamping body including: a first top plate including a first screw hole; a first left wing; and a first right wing Part, wherein the first left wing part and the first right wing part are disposed on the first top plate and extend in a direction away from the first top plate, and the first screw hole is located between the first left wing part and the first right wing part; A lower clamp body, which includes: a second top plate including a second screw hole; a second left wing portion; and a second right wing portion, wherein the first T-shaped fixing member penetrates through a through hole of the second right wing portion Passing the second right wing portion to couple the clamping unit to the first T-shaped fixing member, the second left wing portion and the second right wing portion are disposed on the second top plate and extend in a direction away from the second top plate, The second screw hole is located between the second left wing portion and the second right wing portion; and a bolt, wherein when the bolt penetrates the first screw hole and the second screw hole, the upper clamp body and the lower When the body is clamped, the first left wing portion and the second left wing portion extend in opposite directions, and the first right wing portion and the second right wing portion extend in opposite directions. The measuring device according to any one of claims 7 to 9, further comprising: a first T-shaped sliding rail; an L-shaped connecting piece, wherein the L-shaped connecting piece includes a first part and a second part, The first part includes a first through hole, the second part includes a second through hole, and there is an included angle between the first part and the second part; a first T-shaped fixing member is embedded in the first In the T-shaped slide rail, the first T-shaped fixing part passes through the first through hole of the L-shaped connecting part; and a second T-shaped fixing part, wherein the second T-shaped fixing part passes through the L-shaped The second through hole of the connecting piece is used to be embedded in a second T-shaped sliding rail of a bracket. The measuring device according to any one of claims 7 to 9, further comprising: a first T-shaped sliding rail; an L-shaped connecting piece, wherein the L-shaped connecting piece includes a first part and a second part, The first part includes a first through hole, the second part includes a plurality of second through holes, and there is an included angle between the first part and the second part; a first T-shaped fixing member is embedded in the second part In a T-shaped sliding rail, wherein the first T-shaped fixing member passes through the first through hole of the L-shaped connecting member; and a plurality of U-shaped fixing members, wherein each U-shaped fixing member includes a first end and A second end, the first end passing through one of the plurality of second through holes, The second end passes through another one of the second through holes.

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