TWI679423B - Electronic component test device and test classification equipment for application thereof - Google Patents

Abstract

An electronic component testing device is assembled on a carrier plate of a testing machine with a bearing mechanism having a driving source. The driving source of the bearing mechanism drives at least one carrier for displacement in a first direction, and the carrier is used for assembling a test unit. The test unit is provided with an electrically connected circuit board and a test stand. The circuit board is electrically connected to the test machine by a transmission line, and the test stand tests electronic components; thereby, using a separate test machine and the test unit, The test unit is assembled on the machine with the test unit as the first direction displacement, which can not only reduce the device used to clamp the displacement of the test machine, but also facilitate the space configuration of the site, and achieve practical benefits of substantial cost savings and improved convenience.

Description

Electronic component test device and test classification equipment for application thereof

The invention provides a test machine and a test unit which are separated and assembled by a load bearing mechanism to carry out the first direction displacement assembly on the machine, which can not only reduce the device for clamping the test machine displacement, but also facilitate the space configuration of the place. This greatly reduces the cost and improves the convenience of the test device.

At present, electronic components undergo multiple processing procedures during the production process. In order to ensure product quality, after the production of electronic components is completed, operators will perform test operations to eliminate defective electronic components; see Figures 1 and 2 for details. It is a schematic diagram of the electronic component testing device 10, which is provided with a testing machine 11 having a testing program, and a test unit is fixedly mounted on the substrate 111 on the top surface of the testing machine 11, and the testing unit is provided with an electrically connected circuit Board 12 and a test base 13, the circuit board 12 is an electrical connection tester 11, the test base 13 is used for receiving and testing electronic components, and the test device 10 is further provided with a clamping mechanism 14, the clamping mechanism 14 is A lifting structure 141 is provided, and an angle adjusting structure 142 is driven to move in the first direction (such as the Z direction) by the lifting structure 141, and the angle adjusting structure 142 holds the testing machine 11 by a clamping arm 143, so that The mechanism 14 can drive the testing machine 11 for Z-direction displacement and angular rotation. When a worker wants to assemble the testing machine 11 of the testing device 10 on the testing machine table 20, the testing machine 11 must be moved together with the clamping mechanism 14 to The side of the table 20, and the test machine 11 and the test stand 13 thereon are moved below the table 20, and the lifting structure 141 of the clamping mechanism 14 drives the angle adjustment structure 142 and the test machine 11 to move upward in the Z direction. In order to lock the substrate 111 of the test machine 11 to the machine table 20, the test base 13 is located at the through hole 21 of the machine table 20, and the electronic device is used to perform the test operation; however, the test device 10 has The problems to be solved are as follows:

1. Since the circuit board 12 and the test stand 13 of the test unit are fixed to the test machine 11, in order to allow the test stand 13 to be located at the through hole 21 of the machine table 20, the lifting mechanism 141 of the clamping mechanism 14 must be used to drive the test machine 11 The displacement of the test seat 13 upward in the Z direction not only complicates the assembly of each mechanism of the clamping mechanism 14, but also increases the cost of the device.

2. Because the testing machine 11 is mounted on the clamping arm 143 of the clamping mechanism 14, the clamping mechanism 14 is further provided with a lifting structure 141 and an angle adjustment structure 142, so that the staff must carry the volume together when carrying the testing machine 11 The large and heavy clamping mechanism 14 causes a problem of inconvenient and time-consuming transportation.

3． Because the lifting structure 141 of the clamping mechanism 14 is large and high in height, it cannot be moved below the machine table 20. Only the clamping arm 143 can be used to hold the test machine 11 under the machine table 20, which causes the lifting structure 141 to be necessary. Protruding to the outside of the machine 20 is not only detrimental to the space configuration of the workplace. Workers must avoid the lifting structure 141 when walking around the machine 20 of the equipment, and it is also prone to injury to workers due to accidental collision with the lifting structure 141 Problem.

An object of the present invention is to provide an electronic component testing device, which is assembled on a supporting plate of a testing machine with a bearing mechanism having a driving source, and the driving source of the bearing mechanism drives at least one carrier for first-direction displacement, The carrier is used for assembling a test unit. The test unit is provided with an electrically connected circuit board and a test stand. The circuit board is electrically connected to the test machine by a transmission line, and the test stand tests electronic components. Type test machine and test unit, and the test unit is assembled in the machine with the loading mechanism to carry the test unit in the first direction, which can not only reduce the device used to clamp the test machine, but also facilitate the configuration of the space in the place, achieving significant cost savings and improved use. Practical benefits of convenience.

The second object of the present invention is to provide an electronic component test device, wherein the test unit is mounted on a carrier of a carrier mechanism, and the drive of the carrier mechanism is used. The moving source drives the carrier and the test unit to make a first-direction displacement, so that the test unit is located at the through hole of the machine for testing electronic components. There is no need to configure a large and heavy clamping mechanism to hold the test machine for displacement. Significantly reduce the load of the staff to transport the test machine, and achieve practical benefits of easy transport.

A third object of the present invention is to provide an electronic component testing device, wherein the supporting mechanism is assembled on a testing machine, and the driving source and the testing unit are driven by a driving source for first-direction displacement, so that the testing machine and the supporting mechanism It can be moved under the machine, and it will not protrude beyond the machine. It is not only conducive to the space allocation of the workplace, but also avoids accidental collision and injury of workers, and achieves practical benefits of improving convenience and safety.

The fourth object of the present invention is to provide an electronic component testing device, wherein the carrier mechanism is provided with an anti-noise structure, and the anti-noise structure is provided with at least one isolator between the carrier and the tester, the isolator The components are around the outside of the transmission line of the test unit to prevent external noise from interfering with the test and achieve practical benefits of improving test quality.

A fifth object of the present invention is to provide a test classification device using a test device, which includes a machine, a feeding device, a receiving device, a test device, a conveying device, and a central control device. The feeding device is arranged on the machine. And is provided with at least one feeding holder for containing the electronic components to be tested, the receiving device is arranged on the machine, and at least one receiving holder for containing the tested electronic components is provided, and the test of the present invention The device is provided with a testing machine, a testing unit, and a bearing mechanism. The bearing mechanism is used for displacing and mounting the testing unit to the machine to allow the testing unit to receive and test electronic components. The conveying device is arranged on the machine and is provided with at least A transfer device for transferring electronic components. The central control device is used to control and integrate the actions of various devices to perform automatic operations to achieve practical benefits of improving operation efficiency.

[Learning]

10‧‧‧Test device

11‧‧‧testing machine

111‧‧‧ substrate

12‧‧‧Circuit Board

13‧‧‧Test Block

14‧‧‧ clamping mechanism

141‧‧‧lifting structure

142‧‧‧Angle adjustment structure

143‧‧‧Clamping arm

20‧‧‧machine

21‧‧‧through hole

〔this invention〕

30‧‧‧Test device

31‧‧‧Testing machine

311‧‧‧bearing plate

312‧‧‧perforation

313‧‧‧ pulley

32‧‧‧test unit

321‧‧‧circuit board

322‧‧‧Test Block

323‧‧‧Transmission Line

33‧‧‧Loading mechanism

331‧‧‧Press Cylinder

332‧‧‧First cover

333‧‧‧link

334‧‧‧Second cover

335‧‧‧Isolation cloth

40‧‧‧machine

41‧‧‧through hole

50‧‧‧feeding device

51‧‧‧feeder

60‧‧‧Receiving device

61‧‧‧Receiving container

70‧‧‧ conveyor

71‧‧‧The first feeder

72‧‧‧First loading stage

73‧‧‧Second loading stage

74‧‧‧second feeder

75‧‧‧ third feeder

76‧‧‧First discharge stage

77‧‧‧Second discharge stage

78‧‧‧ fourth feeder

Figure 1: Schematic diagram of a conventional test device and machine.

Figure 2: Schematic diagram of the assembly of a conventional test device on a machine.

Fig. 3: Schematic diagram of the testing device of the present invention.

Figure 4: Schematic diagram of the use of the test device of the present invention (1).

Figure 5: Schematic diagram of the use of the test device of the present invention (2).

Figure 6: Schematic diagram of the use of the test device of the present invention (3).

FIG. 7 is a schematic diagram of the test device of the present invention applied to test classification equipment.

In order for your reviewers to further understand the present invention, a preferred embodiment will be given in conjunction with the drawings, detailed as follows: Please refer to FIG. 3. The test device 30 of the present invention includes a test machine 31, a test unit 32 and Carrying mechanism 33. The testing machine 31 outputs test signals for testing electronic components. In this embodiment, the top surface of the testing machine 31 is provided with a bearing plate 311, and a hole 312 is opened in the bearing plate 311. The bottom surface of the machine 31 is equipped with a pulley 313 to facilitate the sliding displacement of the test machine 31. The test unit 32 is provided with an electrically connected circuit board 321 and a test base 322. The circuit board 321 is electrically connected to the test machine 31. The test The base 322 is used for receiving and testing electronic components. In this embodiment, the circuit board 321 is electrically connected to the testing machine 31 through a through-hole 312 of the supporting plate 311 through a transmission line 323; the supporting mechanism 33 is assembled to the testing machine 31 Furthermore, the supporting mechanism 33 can be assembled on the supporting plate 311 on the top surface of the testing machine 31, or a supporting frame can be provided on the side of the testing machine 31 to assemble the supporting mechanism 33. In this embodiment, the supporting mechanism 33 It is the mounting plate 311 assembled on the testing machine 31. The load bearing mechanism 33 is provided with at least one driving source on the testing machine 31. The driving source may be a pressure cylinder, or it may include a motor and a transmission group. The transmission group may be a pulley group or a screw seat group. The position and position are different according to the operation requirements, and are not limited to the types disclosed in the present invention. In this embodiment, the driving source is a pressure cylinder 331 arranged in a first direction (such as the Z direction). The pressure cylinder 331 is assembled on the supporting plate 311 of the testing machine 31, and the driving source drives at least one carrier for displacement in the first direction. The carrier is for carrying the test unit 32. Furthermore, the carrier may be an independent plate Or the cover or the circuit board 321 of the test unit 32, the type and position of the carrier are based on the needs of the operation The requirements are different, and are not limited to the type disclosed in the present invention. It only needs to carry the test seat 322. In this embodiment, the carrier is a hollow first cover 332. The top surface of a cover 332 is used for assembling the circuit board 321 with the test base 322 of the test unit 32, and the transmission line 323 at the bottom of the circuit board 321 passes through the first cover 332 and the through hole 312 of the support plate 311, and the electrical connection test Machine 31, the first cover 332 is connected to the pressure cylinder 331 with a connecting member 333 on the side, and the pressure cylinder 331 drives the first cover 332 and the circuit board 321 and the test base 322 on the Z through the connecting member 333. Directional displacement. In addition, the bearing mechanism 33 is provided with an anti-noise structure. The anti-noise structure is provided with at least one spacer between the carrier and the testing machine 31 to prevent external noise from interfering with the test. Further, the The spacer may be a cover or a flexible element (such as a foldable and retractable element or cloth body). In this embodiment, the anti-noise structure uses a hollow first cover 332 as the first spacer, and On the supporting plate 311 of the testing machine 31, another second partition member which is a hollow second cover 334 is provided, and The cover body 332 and the second cover body 334 are connected with at least one third foldable member which is flexible and is the insulation cloth 335, so that the first cover body 332, the second cover body 334, and the insulation cloth 335 cover the test. The transmission line 323 of the unit 32 is external to prevent external noise from interfering with the test.

Please refer to FIG. 4. Because the testing machine 31 of the testing device 30 is not equipped with a clamping mechanism, when the testing machine 31 is moved, the staff can remove the load of the clamping mechanism and use the pulley 313 at the bottom of the testing machine 31 to The ground of the work place is slipped to greatly improve the convenience of the moving operation. Therefore, the staff can move the test machine 31 to slide under the machine 40 of a test equipment with little effort. Since the bearing mechanism 33 is assembled on the top of the test machine 31 Surface, so that the testing machine 31 and the bearing mechanism 33 can be located under the machine 40 synchronously to avoid the bearing mechanism 33 protruding from the outside of the machine 40, which is not only conducive to the space configuration of the workplace, but also prevents staff from accidentally colliding and being injured. , Thereby improving the safety of use.

Please refer to FIG. 5. After the testing machine 31 and the bearing mechanism 33 are located below the machine 40, the bearing mechanism 33 uses the pressure cylinder 331 and the connecting member 333 to drive the first cover 332 to move upward in the Z direction. One cover 3 The circuit board 321 and the test base 322 carrying the test unit 32 are simultaneously moved upward in the Z direction. The circuit board 321 is locked on the bottom surface of the machine 40 and is electrically connected to the test machine 31 by a transmission line 323. It is located at the through hole 41 of the machine 40 for receiving and testing electronic components. Since the second cover 334 is fixed on the support plate 311 of the testing machine 31, the two ends of the isolation cloth 335 are connected to the first cover respectively. The body 332 and the second cover body 334, when the first cover body 332 is displaced upward in the Z direction, can pull one end of the isolation cloth 335 to move synchronously, so that the insulation cloth 335 keeps the enclosure outside the transmission line 323, and then uses the first The cover body 332, the second cover body 334, and the isolation cloth 335 are enclosed outside the transmission line 323 of the test unit 32 to prevent external noise from interfering with the test and achieve practical benefits of improving test quality.

Please refer to FIG. 6. When the test unit 32 of the test device 30 is to be replaced, the circuit board 321 and the machine 40 need only be separated. The load bearing mechanism 33 uses the pressure cylinder 331 to drive the first cover 332 through the connecting member 333. The downward displacement in the Z direction causes the circuit board 321 and the test base 322 of the first cover body 332 to carry the test unit 32 to move downward in the Z direction simultaneously, and drives one end of the isolation cloth 335 to synchronously shift, so that the isolation cloth 335 is folded and folded. The worker can use the pulley 313 at the bottom of the testing machine 31 to conveniently move the testing machine 31 away from the bottom of the machine 40 for replacement of the testing unit 32, thereby achieving the practical benefit of improving the convenience of use.

Please refer to FIGS. 3 and 7, which are schematic diagrams of the application of the testing device 30 of the present invention to an electronic component test classification device. The test classification device is provided with a feeding device 50, a receiving device 60, a testing device 30, Conveying device 70 and central control device (not shown); the feeding device 50 is assembled on the machine 40 and is provided with at least one feeding holder 51 which is a feeding tray to accommodate at least one to be measured The electronic device; the receiving device 60 is assembled on the machine 40, and is provided with at least one receiving holder 61 which is a receiving tray for receiving at least one measured electronic component; the testing device 30 is provided There are a testing machine 31, a testing unit 32, and a bearing mechanism 33, and the testing operation is performed on the electronic components by the testing unit 32; The feeding device 70 is assembled on the machine 40 and is provided with at least one feeder to transfer electronic components. In this embodiment, the feeding device 70 is provided with a first feeder 71 for feeding. The feeding holder 51 of the device 50 takes out the electronic components to be tested and transfers them to the first feeding stage 72 and the second feeding stage 73, the first feeding stage 72 and the second feeding stage 73 Carries the electronic components to be tested to the side of the testing device 30. The conveying device 70 uses the second feeder 74 and the third feeder 75 on the first loading platform 72 and the second loading platform. The stage 73 takes out the electronic components to be tested and transfers them to the test base 322 of the test unit 32 of the test device 30 to perform the test operation, and transfers the measured electronic components of the test base 322 to the first discharge stage 76 and The second discharge stage 77, the first discharge stage 76 and the second discharge stage 77 carry the measured electronic components. The conveying device 70 uses a fourth transfer device 78 on the first discharge stage. Take out the measured electronic components from 76 and the second discharge stage 77, and according to the test results, transport the measured electronic components to the receiving device 61 of the receiving device 60 for classification. Set; the system central control means for controlling the actuation and integration of each apparatus to perform automated operations, to enhance the utility efficiency job performance.

Claims (10)

An electronic component testing device includes: a testing machine: capable of generating and outputting a test signal to test an electronic component; a testing unit: the testing machine is separated from the testing unit, and the testing unit is provided with an electrically connected circuit board and A test stand, the circuit board is electrically connected to the test machine, the test stand is a test electronic component; a bearing mechanism: it is provided with at least one drive source on the test machine, and the drive source drives at least one carrier for the first direction Displacement, the carrier is carrying the test unit. The electronic component testing device according to item 1 of the scope of patent application, wherein a top surface of the testing machine is provided with a supporting plate, and a perforation is provided in the supporting plate. The electronic component testing device according to item 1 of the scope of patent application, wherein a bottom surface of the testing machine is equipped with a pulley. The electronic component testing device according to item 1 of the scope of patent application, wherein the circuit board of the testing unit is electrically connected to the testing machine by a transmission line. The electronic component testing device according to item 1 of the scope of the patent application, wherein the driving source of the bearing mechanism is a pressure cylinder or a motor and a transmission group are provided. The electronic component testing device according to item 1 of the scope of the patent application, wherein the carrier is an independent board or cover or a circuit board of the test unit. The electronic component testing device according to item 1 of the scope of the patent application, wherein the bearing mechanism is provided with an anti-noise structure, and the anti-noise structure is provided with at least one isolator to prevent external noise from interfering with the test. The electronic component testing device according to item 7 of the scope of the patent application, wherein the isolator of the anti-noise structure is a cover or a flexible component. The electronic component testing device according to item 7 of the scope of patent application, wherein the anti-noise structure uses the carrier as a first spacer, and a second spacer is provided on the tester, and the first spacer is provided on the tester. At least one third spacer is disposed between the member and the second spacer. A test classification device using an electronic component testing device, comprising: a machine; a feeding device: arranged on the machine and provided with at least one feeding holder for containing at least one electronic component to be tested; Receiving device: It is arranged on the machine and is provided with at least one receiving device for accommodating at least one tested electronic component. Testing device: It is provided with at least one institute according to the first patent application scope. The electronic component test device described above is used to perform test operations on electronic components; the conveying device: is arranged on the machine and is provided with at least one transfer device for transferring electronic components; the central control device: is used for control and integration Each device operates to perform an automated operation.