TWI672871B - Electrical connector and electrical test device - Google Patents

Abstract

An electrical connector and an electrical test device, the electrical connector comprising a substrate, and a plurality of contact bodies arranged along the substrate, each contact body having a base portion and at least one from the base portion facing away from the auxiliary line The direction extends to the arm outside the corresponding side. The plurality of electrical connectors can form an appropriate type of conductance unit in such a manner that the substrates overlap each other. The electrical test device uses the electrical connector and includes a base, a base unit located on the base and defining a space for the conductance units, a plurality of the conductance units, and a cover unit And a capping unit on the conductivity units. Through the electrical test device, the conductance units are surely fixed, and the electrical test is performed to exert the performance of the electrical connectors.

Description

Electrical connector and electrical test device

The invention relates to a connector for testing an electrical test and a test device, in particular to an electrical connector and an electrical test device.

Referring to FIG. 1, a conventional electrical test device 9 is suitable for testing a component 900 to be tested, such as an integrated circuit, a wafer, etc., and includes a body 91 made of metal, and a plurality of A spring probe 92 in the seat 91. The spring probe 92 is electrically connected to the device under test 900 to perform various tests. However, the electrical test device 9 must be designed in conjunction with the device under test 900. Regardless of the configuration of the seat 91 or the spring probes 92, special specifications must be designed in accordance with the component to be tested 900.

When the electrical test is performed by the existing technology, the physical contact of the physical component directly contacts the contacts of the electronic component to be tested, and the state of the electrical signal is turned on to confirm whether the electronic component is a good product. When the electrical connector used (for example, the spring probe 92 of FIG. 1) contacts the electronic component to be tested, in addition to the simple contact and observation of the electrical signal conduction, in order to meet the actual situation of the operation of the electronic component, it may be necessary to make The electrical connector contacts the electronic component in a moving wipe or in a specific force crimping manner. Therefore, the electrical connector needs to have a certain elasticity to facilitate the needs of various contact forms, and to buffer the external force received by the contact by appropriate deformation, while at the same time having considerable rigidity to maintain the overall Structural strength and the effect of support.

In addition, since the shape and contact distribution of electronic components are quite diverse, it is often necessary to design a dedicated test device for a specific electronic component when testing various electronic components, and it is difficult to design a test device for a specific electronic component. Applicable to other electronic components, not only costly manufacturing costs, but also a waste of material resources.

Accordingly, it is an object of the present invention to provide an electrical connector that can accommodate a variety of test actions and that can be flexibly stacked to test a variety of electronic components.

Therefore, the electrical connector of the present invention comprises a substrate extending along an auxiliary line and made of an insulating material, and a plurality of contact bodies positioned on the substrate and spaced along the auxiliary line and made of a conductive material. . The substrate has two sides parallel to the auxiliary line and spaced apart from each other, each contact body having a base portion and at least one arm portion extending from the base portion away from the auxiliary line to the corresponding side edge.

Another object of the present invention is to provide a use of the electrical connector Electrical test device.

Therefore, the electrical test device of the present invention comprises a base, a base unit necessarily located on the base, a plurality of conductance units, and a cover unit that is disposed on the base unit and the conductance units.

The base unit includes a bottom plate having a plurality of through-holes, a frame surrounding the bottom plate and defining a recessed space together with the bottom plate, and a frame plate stacked on the frame, the frame plate having Two end strips parallel to each other, and two side strips respectively connected to opposite ends of the end strips, each end strip having a plurality of projections spaced apart from each other and protruding toward the other end strip, each Each of the two adjacent protrusions of the one end strip and the two protrusions corresponding to the other end strip jointly define a receiving groove that communicates with the recessed space.

The conducting units are respectively positioned in the accommodating slots, and each of the conducting units includes a plurality of electrical connectors of the present invention that are superposed on each other, and the arms of the electrical connecting members facing the same side are respectively extended In the holes of the bottom plate of the base unit.

The cover unit is disposed on the frame plate of the base unit and the conductive units, and includes a cover plate having a plurality of arms extending in a manner that respectively pass the electrical connectors to the other side Perforation worn by the department.

The effect of the invention is that a plurality of the connecting members are superposed on each other to form a conducting unit of a desired type, and the arms passing through the connecting members correspond to specific joints to match various types of electronic components. . And using the electrical properties of the connectors The test device can reliably support the conductance units to prevent the connectors from being damaged during various test actions, and to perform the diversified test actions by utilizing the characteristics of the connectors.

1‧‧‧Base

100‧‧‧plug slot

2‧‧‧Base unit

21‧‧‧floor

210‧‧‧ holes

22‧‧‧Border

220‧‧‧ recessed space

23‧‧‧Box board

230‧‧‧ accommodating slots

231‧‧‧End strips

232‧‧‧ side strips

239‧‧‧Protruding

24‧‧‧ Ribs

3‧‧‧Electrical connectors

30‧‧‧ Conductance unit

31‧‧‧Substrate

311‧‧‧ side

32‧‧‧ reference junction

33‧‧‧Contact body

331‧‧‧ base

332‧‧‧arms

34‧‧‧Intermediary

35‧‧‧Terminal body

4‧‧‧Cover unit

41‧‧‧ Cover

410‧‧‧Perforation

42‧‧‧ ring frame

420‧‧‧ accommodation space

43‧‧‧ ribs

7‧‧‧ dielectric film

81‧‧‧Device under test

82‧‧‧ socket

L‧‧‧Auxiliary line

Other features and effects of the present invention will be apparent from the following description of the drawings, wherein: FIG. 1 is a cross-sectional view illustrating a conventional electrical testing device; FIG. 2 is a front view illustrating the present invention. An embodiment of the connector; FIG. 3 is an incomplete enlarged front view illustrating a plurality of contacts of the electrical connector; FIG. 4 is a side view illustrating an intermediate body of the electrical connector; FIG. 3 is a perspective view showing a plurality of embodiments of the electrical connector of the present invention combined to form a conducting unit; FIG. 6 is an exploded perspective view showing a first embodiment of the electrical testing device of the present invention; FIG. 8 is an incomplete cross-sectional view showing the assembly of the first embodiment of the electrical testing device of the present invention. FIG. 8 is an incomplete cross-sectional view illustrating the assembly of the first embodiment of the present invention. The situation of completion; 9 is a schematic view showing a case where a device to be tested is tested by using the first embodiment of the electrical test device of the present invention; and FIG. 10 is an incomplete cross-sectional view showing a second portion of the electrical test device of the present invention. Example.

Before the present invention is described in detail, it should be noted that in the following description, similar elements are denoted by the same reference numerals.

Referring to FIG. 2 to FIG. 4, an embodiment of the electrical connector 3 of the present invention includes a substrate 31 extending along an auxiliary line L and made of an insulating material, and a reference contact 32 fixed to the center of the substrate 31. a plurality of contact bodies 33 positioned on the substrate 31 and spaced apart along the auxiliary line L and made of a conductive material, a plurality of interposers 34 respectively interposed between the contact bodies 33 and the substrate 31, and two Terminals 35 are formed on opposite ends of the substrate 31 and made of a conductive material. The substrate 31 has two sides 311 which are parallel to the auxiliary line L and are spaced apart from each other. Each of the contacts 33 has a base 331 fixed to the substrate 31, and two from the base 331 are respectively away from the auxiliary line L. The direction extends to the arms 332 outside of the side edges 311. The arm portions 332 of each of the contact bodies 33 extend obliquely in a direction toward the reference contact 32 and are deformable in a direction toward the substrate 31. Through the intermediate bodies 34, the contact bodies 33 are spaced from the substrate 31, and the arm portions 332 are thus not directly in contact with the substrates Since the arm portions 332 can be deformed smoothly when subjected to a force without being affected by the frictional force, the sensitivity of the deformation can be improved. That is to say, by utilizing the elasticity of each of the arm portions 332, it is possible to transmit a telecommunication signal while contacting a specific contact, and it is also capable of generating a good cushioning effect when subjected to an external force.

Referring to FIG. 5, in order to cooperate with a plurality of different electronic components to be tested, a connection structure corresponding to each contact of the electronic component to be tested must be constructed. The electrical connectors 3 of the present invention are mainly connected to the corresponding contacts through the arms 332 of the contact bodies 33, and the plurality of electrical connectors 3 can be matched with the electronic components to be tested in such a manner that the substrates 31 overlap each other. The desired conductance unit 30 is formed. As shown in FIG. 5, a plurality of the electrical connecting members 3 are stacked on each other to form a conducting unit 30 to cooperate with the subsequent description. However, in actual implementation, the number of overlapping can be changed according to requirements, and the mutual amount can be transmitted through each other. The overlapping manner of misalignment does not completely coincide, forming a connection structure of more elements.

Referring to FIG. 6 , a first embodiment of an electrical test apparatus according to the present invention includes a base 1 , a base unit 2 that is necessarily located on the base 1 , and a plurality of bases as shown in FIG. 5 . The electrical conductivity unit 30 is formed by superposing the electrical connectors 3 on each other, and a cover unit 4 covering the base unit 2 and the conductivity units 30.

Referring to FIG. 6 and FIG. 7 , the base unit 2 includes a bottom plate 21 having a plurality of through holes 210 , and a frame 22 surrounding the bottom plate 21 and defining a recessed space 220 together with the bottom plate 21 . a frame plate 23 stacked on the frame 22, and a plurality of protrusions on the bottom plate 21 and spaced apart from each other to be connected to opposite sides of the frame 22 Between the ribs 24. The frame plate 23 has two end strips 231 spaced apart from each other, and two side strips 232 respectively connected to opposite ends of the end strips 231. Each end strip 231 has a plurality of spaced apart sides and faces the other side. Each of the two adjacent protrusions 239 of the end strip 231 and the two protrusions 239 corresponding to the other end strip 231 jointly define a recessed space 239 220 connected accommodating slots 230. Each of the ribs 24 is corresponding to each of the accommodating slots 230. When the conductive modulating units 30 are respectively positioned in the accommodating slots 230, the corresponding ribs 24 extend in the same direction as the electrical connecting members 3, and as shown in FIG. The ground is interposed between two adjacent electrical connectors 3. 7 and FIG. 8, since each of the electrical connectors 3 is in the form of an elongated strip, it is easy to generate a torsional moment at a longer position of the arm when subjected to an external force toward the substrate 31, and the rib 24 is provided for each A conductance unit 30 produces a supporting effect toward the substrate 31 to prevent the electrical connectors 3 from being damaged by the torsional moment when testing.

Referring to FIG. 6 to FIG. 8 , the conductance units 30 are respectively positioned in the accommodating slots 230 , and the arm portions 332 of the electrical connectors 3 facing the same side are respectively respectively disposed on the base unit 2 . The holes 210 of the bottom plate 21 are formed to form a specific type of circuit. The terminal bodies 35 of the electrical connectors 3 are supported on the frame 22 of the base unit 2 and abut against the frame plate 23 of the base unit 2, thereby causing the electrical connectors 3 and The base unit 2 is electrically connected.

The cover unit 4 includes a cover plate 41 that is disposed on the frame plate 23, and a ring frame that surrounds the cover plate 41 and defines a receiving space 420 together with the cover plate 41. 42 and a plurality of ribs 43 protruding from the cover plate 41 and spaced apart from each other and engaging between opposite sides of the ring frame 42, each rib 43 corresponding to each of the accommodating grooves 230, and Between two adjacent electrical connectors 3, the same effect of supporting the electrical connectors 3 can be produced. The cover plate 41 has a plurality of through holes 410 extending through the arm portions 332 of the other electrical connectors 3 toward the other side. The arm portions 332 of the electrical connectors 3 extend through the holes 332. After the vias 410 are formed, a particular type of circuit can be formed to match the desired test. The bottom surface 21 of the base unit 2 and the surface of the cover 41 of the cover unit 4 are coated with a dielectric film 7 to prevent the arm portions 332 of the electrical connectors 3 from contacting the bottom plate 21 or When the cover 41 is used, an unexpected electrical conduction is generated to ensure the accuracy of the detection.

Referring to FIG. 9 and FIG. 8 , when the device to be tested 81 is tested by using the electrical testing device of the first embodiment, a socket 82 for the component to be tested 81 is also provided. The base 1 is coupled to the socket 82 and surrounds a socket 100 that is recessed from a side opposite to the base unit 2 and that fits the component to be tested 81. The sockets 82 are connected to the base 1 and the components to be tested 81 are inserted into the insertion slots 100 of the base 1 to be electrically conductive through the arms 332 of the electrical connector 3. The electrical signal transmitted by the socket 82 and the base 1 cooperates to confirm whether the function of the device under test 81 is normal or not.

It should be particularly noted that the detection method as shown in FIG. 9 belongs to the detection of Package On Package (POP), but only the electrical test of the present invention. One of the preferred methods of use of the device, in practice, can also be used to directly test the test circuit of the device under test 81 by utilizing the characteristics that the electrical connectors 3 are freely assembled, or to utilize the elasticity of the arms 332. The scratch test is not limited to the detection shown in FIGS. 8 and 9.

Referring to FIG. 10, a second embodiment of the electrical testing device of the present invention is different from the first embodiment in that the bottom plate 21 of the base unit 2 and the cover of the cover unit 4 41 is made of a dielectric material, so that the bottom plate 21 and the cover 41 itself have an electrical insulating effect. The second embodiment of the electrical testing device of the present invention differs only in the manner in which the dielectric material is formed, and otherwise achieves the same effect as the first embodiment, and the user can even rely on existing equipment or process technology, and even It is an appropriate embodiment to select a particular requirement for detection.

In summary, the electrical connector 3 of the present invention can be assembled and assembled with each other, and can be easily configured to meet the detection requirements to form an appropriate type. With the elasticity of the arm portion 332 of the electrical connector 3, a plurality of different types can be utilized. And the electrical testing device of the present invention can also generate an appropriate supporting effect according to the shape of the electrical connectors 3, and constitute a systemized device for connecting the components to be tested 81 to play the electrical connectors 3 The test performance, indeed, can achieve the object of the present invention.

However, the above is only the embodiment of the present invention, and the scope of the invention is not limited thereto, and all the equivalent equivalent changes and modifications according to the scope of the patent application and the patent specification of the present invention are still The patent covers the scope of the patent Inside.

Claims (10)

An electrical connector comprising: a substrate extending along an auxiliary line and made of an insulating material; and having two sides parallel to the auxiliary line and spaced apart from each other; and a plurality of contacts positioned on the substrate and along The auxiliary lines are arranged at intervals and are made of a conductive material, each contact body having a base fixed to the substrate, and at least one arm extending from the base portion away from the auxiliary line to the corresponding side edge unit. The electrical connector of claim 1 further comprising a reference contact fixed to the center of the substrate, wherein the arms of each contact body extend obliquely toward the reference contact and can The deformation is caused in a direction toward the substrate. The electrical connector of claim 1 or 2, further comprising two terminal bodies formed at opposite ends of the substrate and made of a conductive material. The electrical connector of claim 1 further comprising a plurality of interposers interposed between the contact bodies and the substrate and made of a conductive material, such that each contact body is spaced apart from the substrate by a distance . An electrical test device comprising: a base; a base unit positioned on the base and including a bottom plate having a plurality of through holes, surrounding the bottom plate and defining a recessed space together with the bottom plate a frame, and a stack of frame plates disposed on the frame, the frame plate having two end strips spaced parallel to each other, and two side strips respectively connected to opposite ends of the end strips, each end strip Have multiple a protrusion extending from each other and protruding toward the other end strip, each two adjacent protrusions of each end strip and the two protrusions corresponding to the other end strip jointly define a space communicating with the recess a plurality of conductance units respectively positioned in the accommodating slots, each of the conductance units comprising a plurality of electrical connectors as described in claim 3 and overlapping each other, the electrical connectors being oriented the same The arm portions of the side are respectively inserted into the holes of the bottom plate of the base unit; and a cover unit is disposed on the frame plate of the base unit and the conductance units, and includes a cover plate The cover plate has a plurality of perforations that are penetrating and are respectively provided for the electrical connectors to face the arms of the other side. The electrical testing device of claim 5, wherein the base unit further comprises a plurality of ribs protruding from the bottom plate and spaced apart from each other and engaging on opposite sides of the frame, each rib corresponding to each other The accommodating slots are respectively located in the accommodating slots, and the corresponding ribs extend in the same direction as the electrical connectors and are interposed between the two adjacent electrical connectors. The electrical testing device of claim 5, wherein the capping unit further comprises a ring frame surrounding the cover plate and defining a receiving space together with the cover plate, and a plurality of protruding frames are disposed on the cover The ribs are parallel to each other and are connected to the opposite sides of the ring frame. Each rib is corresponding to each of the accommodating grooves and is interposed between two adjacent electrical connectors. The electrical testing device of claim 5, wherein the terminals of the electrical connectors are supported on the frame of the base unit and abut against the frame of the base unit. The electrical test device of claim 5, wherein the bottom of the base unit The plate, and the surface of the cover of the capping unit, are coated with a dielectric material. The electrical test device of claim 5, wherein the bottom plate of the base unit and the cover of the cover unit are made of a dielectric material.