TWI671520B - Method for inspecting defects of optical film, defect inspection device for optical film, method for producing optical film, and device for manufacturing optical film - Google Patents
Method for inspecting defects of optical film, defect inspection device for optical film, method for producing optical film, and device for manufacturing optical film Download PDFInfo
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- 238000007689 inspection Methods 0.000 title claims abstract description 206
- 239000012788 optical film Substances 0.000 title claims abstract description 167
- 238000000034 method Methods 0.000 title claims abstract description 126
- 230000007547 defect Effects 0.000 title claims abstract description 125
- 238000004519 manufacturing process Methods 0.000 title claims description 71
- 239000010408 film Substances 0.000 claims abstract description 106
- 230000005540 biological transmission Effects 0.000 claims abstract description 104
- 238000000926 separation method Methods 0.000 claims abstract description 102
- 230000010287 polarization Effects 0.000 claims abstract description 80
- 230000008569 process Effects 0.000 claims abstract description 65
- 238000005259 measurement Methods 0.000 claims abstract description 21
- 239000000853 adhesive Substances 0.000 claims description 59
- 230000001070 adhesive effect Effects 0.000 claims description 59
- 239000000463 material Substances 0.000 claims description 36
- 238000011144 upstream manufacturing Methods 0.000 claims description 9
- 239000002313 adhesive film Substances 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 13
- 239000012528 membrane Substances 0.000 description 7
- 238000005388 cross polarization Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 6
- 239000002699 waste material Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
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- NNLVGZFZQQXQNW-ADJNRHBOSA-N [(2r,3r,4s,5r,6s)-4,5-diacetyloxy-3-[(2s,3r,4s,5r,6r)-3,4,5-triacetyloxy-6-(acetyloxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6s)-4,5,6-triacetyloxy-2-(acetyloxymethyl)oxan-3-yl]oxyoxan-2-yl]methyl acetate Chemical compound O([C@@H]1O[C@@H]([C@H]([C@H](OC(C)=O)[C@H]1OC(C)=O)O[C@H]1[C@@H]([C@@H](OC(C)=O)[C@H](OC(C)=O)[C@@H](COC(C)=O)O1)OC(C)=O)COC(=O)C)[C@@H]1[C@@H](COC(C)=O)O[C@@H](OC(C)=O)[C@H](OC(C)=O)[C@H]1OC(C)=O NNLVGZFZQQXQNW-ADJNRHBOSA-N 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229920000089 Cyclic olefin copolymer Polymers 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
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- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 238000009751 slip forming Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
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Abstract
有關本發明之一實施形態的缺陷檢查方法包含：使用具備光源(22)、透過檢查器(23)、透過檢查用的偏光偏光濾光片(24)的缺陷檢查裝置(20)，進行貼附分離膜貼附黏著材的光學薄膜之缺陷檢查，缺陷檢查裝置(20)更具備配向角測定器(21)；缺陷檢查方法包含：藉由配向角測定器(21)測定分離膜(121)的配向角的配向角測定工程、及基於所測定的配向角調整偏光濾光片(24)的偏光軸之調整工程、及藉由光源(22)照射光學薄膜的光照射工程、及藉由透過檢查器(23)通過偏光濾光片(24)接收透過光學薄膜的光，基於所接收的透過光進行光學薄膜的缺陷檢查的缺陷檢查工程。 A defect inspection method according to an embodiment of the present invention includes attaching using a defect inspection device (20) including a light source (22), a transmission inspector (23), and a polarization inspection filter (24) for transmission inspection. Defect inspection of the optical film to which the separation film is adhered, and the defect inspection device (20) further includes an orientation angle measuring device (21); the defect inspection method includes: measuring the separation film (121) by the orientation angle measuring device (21) Alignment angle measurement process of alignment angle, adjustment process of adjusting polarization axis of polarizing filter (24) based on measured alignment angle, light irradiation process of irradiating optical film with light source (22), and transmission inspection The detector (23) receives the light transmitted through the optical film through the polarizing filter (24), and performs a defect inspection process for defect inspection of the optical film based on the received transmitted light.
Description
本發明係有關於光學薄膜的缺陷檢查方法、光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置。 The present invention relates to a defect inspection method for an optical film, a defect inspection device for an optical film, a method for producing an optical film, and an apparatus for producing an optical film.
一般所知的光學薄膜，包含：具有偏光特性的偏光板及具有雙折射性的相位差板等的光學薄膜本體部，於該些光學薄膜本體部之一方之主面上貼附有分離膜貼附黏著材。這種光學薄膜通常將帶狀的光學薄膜本體部延著長邊方向連續地搬送，同時將帶狀的分離膜貼付黏著材連續地貼附生產，並連續地搬送所得到的光學薄膜。專利文獻1~3，揭示這種光學薄膜的缺陷檢查方法。 A commonly known optical film includes an optical film body portion such as a polarizing plate having polarizing characteristics and a retardation plate having birefringence, and a separation film sticker is attached to the main surface of one of the optical film body portions. With adhesive material. Such an optical film generally continuously conveys a belt-shaped optical film main body along the long side direction, and continuously attaches a belt-shaped separation film to an adhesive material for production, and continuously conveys the obtained optical film. Patent Documents 1 to 3 disclose a defect inspection method of such an optical film.
當光學薄膜本體部為偏光板的時侯，缺陷檢查方法包含：於光學薄膜之一方之主面(分離膜貼附黏著材側之面)的相反側的另一方的主面側設置的光源，藉由該光源照射光學薄膜的光照射工程，藉由設置於光學薄膜的一方之主面側的透過檢查器，通過設置於光學薄膜與透 過檢查器之間的透過檢查用偏光濾光片，接收透過光學薄膜的光的受光工程，藉由光學薄膜(偏光板)與透過檢查用偏光濾光片的正交偏光法透過檢查，進行光學薄膜的缺陷檢查。 When the main body of the optical film is a polarizing plate, the defect inspection method includes a light source provided on the other main surface side of the main surface of the optical film (the surface on which the separation film is attached to the adhesive material side), The light irradiation process of irradiating the optical film with the light source is performed by a transmission inspection device provided on one main surface side of the optical film, Pass the inspection polarizing filter between the inspectors to receive the light through the optical film. The light receiving process receives the light through the optical film (polarizing plate) and the orthogonal inspection method of the polarizing filter for inspection. Inspection of film defects.
光學薄膜本體部為相位差板的時侯，缺陷檢查方法包含：於光學薄膜之一方之主面(分離膜貼附黏著材側之面)的相反側的另一方的主面側設置的光源，通過設置於光學薄膜與光源之間的透過檢查用補助偏光濾光片，藉由該光源照射光學薄膜的光照射工程，及藉由設置於光學薄膜的一方之主面側的透過檢查器，通過設置於光學薄膜與透過檢查器之間的透過檢查用偏光濾光片，接收透過光學薄膜的光的受光工程，藉由透過檢查用補助偏光濾光片與透過檢查用偏光濾光片的正交偏光法透過檢查，進行光學薄膜的缺陷檢查。 When the main body of the optical film is a retardation plate, the defect inspection method includes a light source provided on the other main surface side of the main surface of the optical film (the surface on which the separation film is attached to the adhesive material side), A light transmission process for irradiating the optical film with the light source through a supplementary polarizing filter for transmission inspection provided between the optical film and the light source, and a transmission inspection device provided on one main surface side of the optical film, The polarizing filter for transmission inspection provided between the optical film and the transmission inspector receives light transmitted through the optical film, and the orthogonal polarizing filter for transmission inspection and the polarizing filter for transmission inspection are orthogonal to each other. The polarized light method is used for inspection of defects in optical films.
但是，分離膜貼附黏著材中的分離膜，經由延伸工程所生產，使用有較大雙折射性的延伸薄膜。因此，分離膜有基於雙折射性的配向角。所以，這種正交偏光法透過檢查考慮分離膜貼附黏著材中分離膜的配向角，藉由調整透過檢查用偏光濾光片的偏光軸(例如：透過檢查用偏光濾光片的回轉角度)實現正交偏光狀態。 However, the separation film is attached to the separation film in the adhesive material, and is produced through the extension process, and an extension film having a large birefringence is used. Therefore, the separation film has an alignment angle based on birefringence. Therefore, in this orthogonal polarization method, the alignment angle of the separation film in the separation film-attached adhesive is taken into consideration through inspection, and the polarization axis of the polarization filter for transmission inspection is adjusted (for example, the rotation angle of the polarization filter for transmission inspection). ) To achieve the state of orthogonal polarization.
〔專利文獻1〕特開2007-213016號公報 [Patent Document 1] JP 2007-213016
〔專利文獻2〕國際公開第2011/148790號 [Patent Document 2] International Publication No. 2011/148790
〔專利文獻3〕特開2001-349839號公報 [Patent Document 3] JP 2001-349839
但是，這種做為光學薄膜生產所使用的分離膜貼附黏著材，例如常有數千公尺長，另一方面，偏光板或相位差板等的光學薄膜本體部，例如常有數萬公尺長，分離膜貼附黏著材對於一個光學薄膜本體部，在繫合在一起的同時連續地貼附。 However, such separation film adhesives used for the production of optical films are often thousands of meters long. On the other hand, optical film bodies such as polarizing plates or retardation plates often have tens of thousands. The meter is long, and the separation film is adhered to the optical film body, and is continuously attached while being tied together.
做為這種於分離膜貼附黏著材中的分離膜，例如是用從原料薄膜延伸而得到的寬幅延伸薄膜，使該寬幅延伸薄膜與欲貼附的光學薄膜本體部等寬，從寬度方向複數地裁切。將原料薄膜延伸成延伸薄膜時，薄膜的寬度方向的配向角有些微的變化，也就是說會引起所謂的曲躬(bowing)現象，在寬度方向的配向角會有錯位發生，因此對各個所應貼附的分離膜貼附黏著材，會有相異的配向角。 As the separation film in the adhesive material for attaching the separation film, for example, a wide-stretched film obtained by extending from a raw material film is used to make the wide-stretched film the same width as the main body of the optical film to be attached. Multiple cuts in the width direction. When the raw material film is extended into an extended film, the alignment angle in the width direction of the film changes slightly, that is, a so-called bowing phenomenon is caused, and the alignment angle in the width direction may be misaligned. The separation membrane to be attached is attached to the adhesive material, and has different alignment angles.
因此，如同上述所說，在偏光板或相位差板上貼附分離膜貼附黏著材後，進行正交偏光法透過檢查時，需要對各個所使用的分離膜貼附黏著材調整透過檢查用偏光濾光片的偏光軸。 Therefore, as described above, after the separation film is attached to the polarizing plate or the retardation plate, and the cross-polarization method is used for transmission inspection, it is necessary to adjust the transmission inspection for each of the separation films attached to the adhesion material. The polarization axis of the polarizing filter.
但是，對於連續生產的光學薄膜本體部連續地(也可說是在線地)進行正交偏光法透過檢查時，為了 切換分離膜貼附黏著材的輥，即便在調整透過檢查用偏光濾光片的偏光軸時，也連續地生成光學薄膜本體部。因此，在這段調整期間裡所得到的光學薄膜的區域，成為未檢查區域。例如：調整透過檢查用偏光濾光片的偏光軸所花的時間約1分鐘，線速度約10~30m/分的話，切換分離膜貼附黏著材1次將造成約10~30分的光學薄膜區域未被檢查到。 However, in order to continuously (or in-line) transmittance inspection of the body of the optical film produced continuously, The optical film main body portion is continuously generated even when the roll of the separation film to which the adhesive is attached is switched, even when the polarization axis of the polarization filter for transmission inspection is adjusted. Therefore, the area of the optical film obtained during this adjustment period becomes an uninspected area. For example: It takes about 1 minute to adjust the polarization axis of the polarizing filter for inspection. If the linear velocity is about 10 to 30 m / min, switching the separation film to the adhesive material once will cause an optical film of about 10 to 30 minutes. The area was not detected.
於是，本發明的目的為提供一種光學薄膜的缺陷檢查方法，能夠縮短因分離膜的配向角之錯位所必需調整正交偏光法透過檢查用偏光濾光片的偏光軸的時間。此外，本發明的目的為提供：光學薄膜的缺陷檢查裝置、光學薄膜的製造方法、及光學薄膜的製造裝置。 Therefore, an object of the present invention is to provide a defect inspection method for an optical film, which can shorten the time required to adjust the polarization axis of the orthogonal polarization method through the polarization filter for inspection due to the misalignment of the alignment angle of the separation film. Another object of the present invention is to provide a defect inspection device for an optical film, a method for producing an optical film, and an apparatus for producing an optical film.
本發明的光學薄膜的缺陷檢查方法，用於缺陷檢查裝置，具備：光學薄膜，於光學薄膜本體部之一方之主面貼附有分離膜貼附黏著材；於貼附有分離膜貼附黏著材之一方之主面側或另一方的主面側，設置有光源；相對於光學薄膜，於光源之相反側設置有透過檢查器；於光學薄膜的一方之主面與光源或透過檢查器之間，設置有透過檢查用偏光濾光片，其中該缺陷檢查裝置更具備：設置於光學薄膜之一方之主面側的配向角測器定器；缺陷檢查方法包含：藉由配向角測定器，測定分離膜的配向角之配向角測定工程；於配向角測定工程中，基於所測定出的配 向角，調整偏光濾光片的偏光軸之調整工程；藉由光源，以光照射光學薄膜之光照射工程；藉由透過檢查器，通過偏光濾光片接收透過光學薄膜的光，基於所接受的透過光，進行光學薄膜的缺陷檢查之缺陷檢查工程。 The defect inspection method of an optical film of the present invention is used in a defect inspection device, and includes: an optical film, a main body of one side of the main body of the optical film is attached with a separation film attaching adhesive material; and a separation film is attached and adhered A light source is provided on one side of the main surface of the material or on the other side of the main surface; with respect to the optical film, a transmission inspector is provided on the opposite side of the light source; and one side of the optical film is connected with the light source or the inspector. A polarizing filter for transmission inspection is provided, and the defect inspection device further includes: an orientation angle detector set on a main surface side of one of the optical films; the defect inspection method includes: using an orientation angle measurement device, Alignment angle measurement process for measuring the alignment angle of the separation membrane; in the alignment angle measurement process, based on the measured alignment Angle adjustment process of adjusting the polarization axis of the polarizing filter; light irradiation process of illuminating the optical film with light by a light source; receiving light transmitted through the optical film through the polarizing filter by a transmission inspector, based on the acceptance Defect inspection process for inspecting defects of optical films through transmitted light.
本發明的光學薄膜的缺陷檢查裝置，包含：光學薄膜，於光學薄膜本體部之一方之主面貼附有分離膜貼附黏著材，其中該光學薄膜的缺陷檢查裝置，具備：於光學薄膜中分離膜貼附黏著材側之一方之主面側或另一方的主面側，設置照射光學薄膜的光源；相對於光學薄膜，於光源之相反側，設置有接收透過光學薄膜之光的透過檢查器；於光學薄膜的一方之主面與光源或透過檢查器之間，設置有透過檢查用偏光濾光片，於光學薄膜之前述一方之主面側，設置有測定分離膜的配向角之配向角測器定器；基於藉由配向角測定器所測定的配向角，調整偏光濾光片的偏光軸之後，基於藉由透過檢查器所接收的透過光，進行光學薄膜的缺陷檢查。 The defect inspection device for an optical film of the present invention includes an optical film, and a separation film attaching adhesive material is attached to one of the main surfaces of the optical film body. The defect inspection device for the optical film is provided with: A light source for irradiating an optical film is provided on one of the main surface side or the other main surface side of the separation film to which the adhesive material is attached; and the optical film is provided on the opposite side of the light source with a transmission inspection for receiving light transmitted through the optical film. Between the main surface of one side of the optical film and the light source or the transmission inspector, a polarizing filter for transmission inspection is provided, and on the main surface side of the one side of the optical film, an alignment for measuring the alignment angle of the separation film is provided Angle measuring device; After adjusting the polarization axis of the polarizing filter based on the alignment angle measured by the alignment angle measuring device, defect inspection of the optical film is performed based on the transmitted light received by the transmission inspector.
根據這種光學薄膜的缺陷檢查方法及缺陷檢查裝置，藉由配向角測定器測定分離膜的配向角，基於測定得到的配向角調整偏光濾光片的偏光軸，因此，可以縮短造成分離膜的配向角之錯位所必要的正交偏光法透過檢查用偏光濾光片之偏光軸的調整時間。因此，在線進行正交偏光法透過檢查時，為了切換分離膜貼附黏著材的輥，在調整透過檢查用偏光濾光片的偏光軸時，可以削減連續生成的光學薄膜本體部的未檢查區域，減低無謂的浪費。 According to the defect inspection method and defect inspection device for such an optical film, the alignment angle of the separation film is measured by an alignment angle measuring device, and the polarization axis of the polarizing filter is adjusted based on the measured alignment angle. Therefore, the length of the separation film can be shortened. The orthogonal polarization method necessary for the misalignment of the alignment angle passes through the adjustment time of the polarizing axis of the polarizing filter for inspection. Therefore, in order to switch the rollers to which the adhesive is attached to the separation film when performing the cross-polarization transmission inspection online, when adjusting the polarization axis of the polarization filter for transmission inspection, it is possible to reduce the uninspected area of the optical film body portion that is continuously generated. , Reduce unnecessary waste.
這種光學薄膜的缺陷檢查方法及缺陷檢查裝置為：在偏光板本體部的一方之主面貼附分離膜貼附黏著材之偏光板的缺陷檢查，使用該偏光板及透過檢查用偏光濾光片可以適用於正交偏光法透過檢查。 The defect inspection method and defect inspection device for such an optical film are defect inspections of a polarizing plate with a separation film and an adhesive adhered to one main surface of a polarizing plate main body, and the polarizing plate and a polarizing filter for transmission inspection are used. The sheet can be used for transmission inspection by orthogonal polarization method.
上述光學薄膜的缺陷檢查裝置，在光學薄膜的另一方的主面與光源或透過檢查器之間，更可設置有透過檢查用的補助偏光濾光片。於上述光學薄膜的缺陷檢查方法中的缺陷檢查工程，通過偏光濾光片及補助偏光濾光片接收透過光學薄膜的光，基於所接受的透過光，也可進行光學薄膜的缺陷檢查。 The defect inspection device for an optical film may further include a supplementary polarizing filter for transmission inspection between the other main surface of the optical film and the light source or the transmission inspector. In the defect inspection process in the above-mentioned defect inspection method of an optical film, light transmitted through the optical film is received through a polarizing filter and a supplementary polarizing filter, and defect inspection of the optical film can also be performed based on the received transmitted light.
這種光學薄膜的缺陷檢查方法及缺陷檢查裝置為：在相位差板本體部的一方之主面貼附分離膜貼附黏著材的相位差板之缺陷檢查，使用該透過檢查用偏光濾光片及透過檢查用補助偏光濾光片可以適用於正交偏光法透過檢查。 The defect inspection method and defect inspection device of such an optical film are defect inspections of a retardation plate in which a separation film is attached to one main surface of a retardation plate main body, and an adhesive material is adhered thereto, and this transmission inspection polarizing filter is used. And the supplementary polarizing filter for transmission inspection can be applied to the transmission inspection by the orthogonal polarization method.
上述光學薄膜的缺陷檢查方法中，更包含將於配向角測定工程所測定的配向角之資訊記錄於光學薄膜上的記錄工程，調整工程基於記錄工程中光學薄膜上所記錄的配向角資訊，也可調整偏光濾光片的偏光軸。上述光學薄膜的缺陷檢查裝置中，更具備藉由配向角測定器所測定的配向角之資訊，將其記錄於光學薄膜上的記錄部，藉由記錄部在光學薄膜上所記錄的配向角的資訊，基於該資訊調整偏光濾光片的偏光軸之後，藉由透過檢查器基於所接收的透過光，也可進行光學薄膜的缺陷檢查。 The above-mentioned defect inspection method of the optical film further includes a recording process in which the information of the alignment angle measured in the alignment angle measurement process is recorded on the optical film. The adjustment process is based on the alignment angle information recorded in the optical film in the recording process. The polarization axis of the polarizing filter can be adjusted. The defect inspection device for an optical film further includes a recording section for recording the information of the alignment angle measured by the alignment angle measuring device on the optical film, and the recording angle of the alignment angle recorded on the optical film by the recording section. After the polarization axis of the polarizing filter is adjusted based on the information, the defect inspection of the optical film can also be performed by the transmission inspector based on the received transmitted light.
根據該光學薄膜的缺陷檢查方法及缺陷檢查裝置，從配向角測定工程開始記錄工程為止，都在同一線上進行；調整工程、光照射工程、及缺陷檢查可在別的線上進行。 According to the defect inspection method and defect inspection device of the optical film, all processes are performed on the same line from the start of recording of the alignment angle measurement process; the adjustment process, light irradiation process, and defect inspection can be performed on other lines.
本發明的光學薄膜之製造方法，包含上述光學薄膜的缺陷檢查方法，在配向角測定工程及缺陷檢查工程前，也可包含於光學薄膜本體部的一方的主面貼附分離膜貼附黏著材的貼附工程的形態；在配向角測定工程後，缺陷檢查工程前，也可包含於光學薄膜本體部的一方之主面貼附分離膜貼附黏著材的貼附工程的形態。 The manufacturing method of the optical film of the present invention includes the defect inspection method of the optical film described above. Before the alignment angle measurement process and the defect inspection process, the separation film can be attached to one of the main surfaces of the optical film main body. After the alignment angle measurement process and before the defect inspection process, it can also be included in the form of the attachment process of attaching a separation film to an adhesive material on one of the main surfaces of the main body of the optical film.
本發明的光學薄膜之製造裝置，包含上述光學薄膜的缺陷檢查裝置，在配向角測定器及透過檢查器的上游側，也可包含於光學薄膜本體部的一方的主面貼附分離膜貼附黏著材的形態；在配向角測定器的下游側，透過檢查器的上游側，也可包含於光學薄膜本體部的一方之主面貼附分離膜貼附黏著材的形態。 The optical film manufacturing apparatus of the present invention includes the above-mentioned defect inspection device for an optical film, and an upstream side of the alignment angle measuring device and the transmission inspector may be included on one of the main surfaces of the optical film main body. The form of the adhesive material; the form in which the release film is attached to the main surface of one side of the optical film body portion on the downstream side of the alignment angle measuring device and the upstream side of the inspection device.
根據本發明，可以縮短造成分離膜的配向角之錯位所必要的正交偏光法透過檢查用偏光濾光片之偏光軸的調整時間。因此，在線進行正交偏光法透過檢查時，為了切換分離膜貼附黏著材的輥，在調整透過檢查用偏光濾光片的偏光軸時，可以削減連續生成的光學薄膜本體部的未檢查區域，減低無謂的浪費。 According to the present invention, it is possible to shorten the adjustment time of the polarization axis of the orthogonal polarization method transmission inspection polarization filter necessary for causing the misalignment of the alignment angle of the separation film. Therefore, in order to switch the rollers to which the adhesive is attached to the separation film when performing the cross-polarization transmission inspection online, when adjusting the polarization axis of the polarization filter for transmission inspection, it is possible to reduce the uninspected area of the optical film body portion that is continuously generated. , Reduce unnecessary waste.
10、10A‧‧‧偏光板(光學薄膜)的製造裝置 10, 10A‧‧‧ manufacturing equipment for polarizing plate (optical film)
10B、10C‧‧‧相位差板(光學薄膜)的製造裝置 10B, 10C‧‧‧ retardation plate (optical film) manufacturing device
11、12‧‧‧原反捲取裝置 11, 12‧‧‧ original anti-winding device
20‧‧‧偏光板(光學薄膜)的缺陷檢查裝置 20‧‧‧ Defect inspection device for polarizing plate (optical film)
20B‧‧‧相位差板(光學薄膜)的缺陷檢查裝置 20B‧‧‧ Defect inspection device for retardation plate (optical film)
21‧‧‧配向角測定器 21‧‧‧Alignment angle measuring device
22‧‧‧光源 22‧‧‧light source
23‧‧‧透過檢查器 23‧‧‧ through the inspector
24‧‧‧透過檢查用偏光濾光片 24‧‧‧ Transmissive inspection polarizing filter
25‧‧‧透過檢查用補助偏光濾光片 25‧‧‧ Transmit inspection supplementary polarizing filter
26‧‧‧相位差補償濾光片 26‧‧‧Phase Difference Compensation Filter
27‧‧‧記錄部 27‧‧‧Recording Department
100‧‧‧偏光板(光學薄膜) 100‧‧‧ polarizing plate (optical film)
100B‧‧‧相位差板(光學薄膜) 100B‧‧‧ retardation plate (optical film)
101‧‧‧一方之主面 101‧‧‧ One of the main faces
102‧‧‧另一方的主面 102‧‧‧ the other side's main face
110‧‧‧偏光板本體部(光學薄膜本體部) 110‧‧‧ polarizing plate body (optical film body)
110B‧‧‧相位差板本體部(光學薄膜本體部) 110B‧‧‧ retardation plate body (optical film body)
120‧‧‧分離膜貼附黏著材 120‧‧‧ Separation membrane with adhesive
121‧‧‧分離膜 121‧‧‧ separation membrane
122‧‧‧黏著材 122‧‧‧Adhesive
123‧‧‧連結縫 123‧‧‧Joint seam
〔圖1〕有關本發明第1實施形態的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光板(光學薄膜)的製造裝置及製造方法的示意圖。 [Fig. 1] A schematic diagram of a defect inspection device and a defect inspection method for a polarizing plate (optical film) according to a first embodiment of the present invention, and a manufacturing device and a manufacturing method of a polarizing plate (optical film).
〔圖2〕藉由圖1的製造裝置及製造方法所製造的偏光板的示意圖。 [FIG. 2] A schematic view of a polarizing plate manufactured by the manufacturing apparatus and manufacturing method of FIG. 1. [FIG.
〔圖3〕圖1所揭示的分離膜的配向角錯位的示意圖。 [Fig. 3] Schematic diagram of misalignment of the alignment angle of the separation membrane disclosed in Fig. 1. [Fig.
〔圖4〕有關本發明第2實施形態的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光板(光學薄膜)的製造裝置及製造方法的示意圖。 [Fig. 4] A schematic diagram of a defect inspection device and a defect inspection method for a polarizing plate (optical film) according to a second embodiment of the present invention, and a manufacturing device and a manufacturing method of a polarizing plate (optical film).
〔圖5〕有關本發明第3實施形態的相位差板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及相位差板(光學薄膜)的製造裝置及製造方法的示意圖。 [Fig. 5] A schematic diagram of a defect inspection device and a defect inspection method for a retardation plate (optical film) according to a third embodiment of the present invention, and a manufacturing apparatus and a production method of a retardation plate (optical film).
〔圖6〕藉由圖5所示的製造裝置及製造方法所製造的相位差板的示意圖。 [Fig. 6] A schematic view of a retardation plate manufactured by the manufacturing apparatus and manufacturing method shown in Fig. 5. [Fig.
〔圖7〕有關本發明第4實施形態的相位差板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及相位差板(光學薄膜)的製造裝置及製造方法的示意圖。 [FIG. 7] A schematic diagram of a defect inspection device and a defect inspection method of a retardation plate (optical film) according to a fourth embodiment of the present invention, and a manufacturing apparatus and a manufacturing method of a retardation plate (optical film).
〔圖8〕有關本發明變形例的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光板(光學薄膜)的製造裝置及製造方法的示意圖。 [Fig. 8] A schematic diagram of a defect inspection device and a defect inspection method for a polarizing plate (optical film) according to a modification of the present invention, and a manufacturing device and a manufacturing method of a polarizing plate (optical film).
〔圖9〕有關本發明變形例的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光板(光學薄膜)的製造裝置及製造方法的示意圖。 [Fig. 9] A schematic diagram of a defect inspection device and a defect inspection method for a polarizing plate (optical film) according to a modification of the present invention, and a manufacturing device and a manufacturing method of a polarizing plate (optical film).
以下，參照圖式詳細說明本發明最佳的實施形態。於各圖式中對於同一或是相同的部分標示同一符號。 Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. The same symbols are used for the same or the same parts in each drawing.
圖1為有關本發明第1實施形態的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光板(光學薄膜)的製造裝置及製造方法的示意圖，圖2為藉由圖1所示的製造裝置及製造方法所製造的偏光板的示意圖。 FIG. 1 is a schematic diagram of a defect inspection device and a defect inspection method for a polarizing plate (optical film) according to a first embodiment of the present invention, and a manufacturing device and a manufacturing method of a polarizing plate (optical film). FIG. 2 is a view taken from FIG. The schematic diagram of the polarizing plate manufactured by the manufacturing apparatus and manufacturing method shown below.
圖1所示的製造裝置10為製造圖2所揭示的偏光板100的製造裝置。首先，製造裝置10在偏光子111的主面兩側貼附有保護薄膜112，生成偏光板本體部(光學薄膜本體部)110。接著，製造裝置10將由黏著材122與分離膜(離型薄膜)121貼合而成的分離膜貼附黏著材120貼合於偏光板本體部110，生成偏光板100。接著，製造裝置10藉由捲取輥這種原反捲取裝置11捲取所生成的偏光板100。 The manufacturing apparatus 10 shown in FIG. 1 is a manufacturing apparatus for manufacturing the polarizing plate 100 disclosed in FIG. 2. First, the manufacturing apparatus 10 attaches protective films 112 on both sides of the main surface of the polarizer 111 to generate a polarizing plate body portion (optical film body portion) 110. Next, the manufacturing apparatus 10 adheres a separation film attachment adhesive 120 formed by bonding the adhesion member 122 and the separation film (release film) 121 to the polarizing plate main body 110 to generate a polarizing plate 100. Next, the manufacturing apparatus 10 winds up the generated polarizing plate 100 by a rewinding apparatus 11 such as a winding roller.
做為偏光子111材料，例如：聚乙烯醇(Polyvinyl Alcohol：PVA)，做為保護薄膜112的材料，例如：三醋酸纖維素(Triacetylcellulose：TAC)。做為分離膜121的材料，例如：聚對苯二甲酸(Polyethylene Terephthalate：PET)。藉由剝除分離膜121，偏光板100可藉由黏著材122貼合於液晶面板或其他的光學薄膜等。 As the material of the polarizer 111, for example: Polyvinyl Alcohol (PVA), and as the material of the protective film 112, for example: Triacetylcellulose (TAC). As a material of the separation membrane 121, for example, Polyethylene Terephthalate (PET). By removing the separation film 121, the polarizing plate 100 can be bonded to a liquid crystal panel or other optical films by an adhesive material 122.
製造裝置10包含缺陷檢查裝置20。缺陷檢查裝置20具有：配向角測定器21、光源22、透過檢查器23、透過檢查用偏光濾光片24、在線進行偏光板100的缺陷檢查。 The manufacturing apparatus 10 includes a defect inspection apparatus 20. The defect inspection device 20 includes an alignment angle measuring device 21, a light source 22, a transmission inspection device 23, a transmission inspection polarizing filter 24, and an on-line defect inspection of the polarizing plate 100.
配向角測定器21設置於比透過檢查器23更上游側，設置於偏光板100的分離膜貼附黏著材120側的一方之主面101側，並測定分離膜121的配向角。配向角測定器21向透過檢查用偏光濾光片24提供所測定的配向角資訊。做為配向角測定器21，可使用在線軸測定器(例如：大塚電子製RE-200)等。在配向角測定器21的製造線更下游側，設置有光源22及透過檢查器23。 The alignment angle measuring device 21 is provided on the upstream side than the transmission checker 23, and is provided on the main surface 101 side of the separation film-attachment adhesive 120 on the polarizing plate 100, and measures the alignment angle of the separation film 121. The alignment angle measuring device 21 supplies the measured alignment angle information to the transmission inspection polarizing filter 24. As the alignment angle measuring device 21, a bobbin measuring device (for example, RE-200 manufactured by Otsuka Electronics) can be used. A light source 22 and a transmission inspector 23 are provided further downstream on the manufacturing line of the alignment angle measuring device 21.
光源22，設置於偏光板100另一方的主面102側，向偏光板100另一方的主面102側照射光。另一方面，透過檢查器23設置於偏光板100的一方之主面101側，通過透過檢查用偏光濾光片24，接收透過偏光板100的光。 The light source 22 is provided on the other main surface 102 side of the polarizing plate 100 and irradiates light to the other main surface 102 side of the polarizing plate 100. On the other hand, the transmission checker 23 is provided on one main surface 101 side of the polarizing plate 100 and receives the light transmitted through the polarizing plate 100 through the transmission inspection polarizing filter 24.
透過檢查用偏光濾光片24設置於偏光板100 的一方之主面101與透過檢查器23之間。透過檢查用偏光濾光片24具有偏光軸調整機構，基於從配向角測定器21所測定的分離膜121的配向角資訊，調整相對偏光板本體部110的偏光軸之偏光濾光片24的偏光軸(例如：偏光濾光片24的回轉角度)，形成正交偏光狀態。例如：偏光軸調整機構預先將分離膜121的配向角相關連的偏光濾光片24的偏光軸之調整量，做為查詢表記憶；基於該查詢表，自動決定對應所測定的分離膜121的配向角之偏光濾光片24的偏光軸。 The transmission inspection polarizing filter 24 is provided on the polarizing plate 100 Between the main surface 101 and the transmission inspector 23. The transmission inspection polarizing filter 24 has a polarization axis adjustment mechanism that adjusts the polarization of the polarization filter 24 with respect to the polarization axis of the polarizing plate body 110 based on the alignment angle information of the separation film 121 measured from the alignment angle measuring device 21. The axis (for example, the rotation angle of the polarizing filter 24) is in a state of orthogonal polarization. For example, the polarization axis adjustment mechanism preliminarily adjusts the adjustment amount of the polarization axis of the polarization filter 24 related to the alignment angle of the separation film 121 as a look-up table memory; based on the look-up table, automatically determines the value corresponding to the measured separation film 121. The polarization axis of the polarization filter 24 of the alignment angle.
調整偏光濾光片24的偏光軸之後，基於藉由透過檢查器23所接收的透過光，利用正交偏光法透過檢查，進行所謂的偏光板100缺陷檢查。正交偏光法透過檢查為：使2個偏光子(在本實施形態中為偏光板100及偏光濾光片24)的吸收軸略呈正交狀態(正交偏光)，利用攝影機(例如光感測器)觀察其透過光像，並檢測出漏光時的缺陷(輝點)。 After the polarization axis of the polarizing filter 24 is adjusted, based on the transmitted light received by the transmission inspector 23, the so-called inspection of the defect of the polarizing plate 100 is performed based on the transmission inspection by the orthogonal polarization method. The orthogonal polarization method transmission inspection is to make the absorption axes of the two polarizers (the polarizing plate 100 and the polarizing filter 24 in this embodiment) be slightly orthogonal (orthogonal polarized light), and use a camera (such as a light sensor) (Detector) to observe the transmitted light image and detect defects (bright spots) in the light leakage.
本實施形態在配向角測定器21及透過檢查器23的上游測，於偏光板本體部110的一方之主面貼合有分離膜貼附黏著材120。 In the present embodiment, a separation film attachment adhesive 120 is attached to one main surface of the polarizing plate main body 110 as measured upstream of the alignment angle measuring device 21 and the transmission inspector 23.
接著，說明有關本發明第1實施形態的偏光板的缺陷檢查方法，以及製造方法。首先，於偏光板本體部110的一方之主面貼附有分離膜貼附黏著材120(貼附工程)。 Next, a defect inspection method and a manufacturing method of the polarizing plate according to the first embodiment of the present invention will be described. First, a separation film attachment adhesive 120 is attached to one main surface of the polarizing plate main body portion 110 (attachment process).
接著，藉由配向角測定器21，測定分離膜 121的配向角(配向角測定工程)。再來，藉由於透過檢查用偏光濾光片24的偏光軸調整機構，基於從配向角測定器21所測定的分離膜121的配向角資訊，調整相對於偏光板本體部110的偏光軸之偏光濾光片24的偏光軸(調整工程)。 Next, the separation angle is measured by the alignment angle measuring device 21 Alignment angle of 121 (alignment angle measurement process). Furthermore, the polarization axis adjustment mechanism that passes through the inspection polarizing filter 24 adjusts the polarization with respect to the polarization axis of the polarizing plate body 110 based on the alignment angle information of the separation film 121 measured from the alignment angle measuring device 21. Polarization axis of the filter 24 (adjustment process).
接著，藉由光源22，以光照射偏光板100(光照射工程)。再來，藉由透過檢查器23，通過偏光濾光片24接收透過偏光板100的光，基於所接受的透過光，進行偏光板100的缺陷檢查(缺陷檢查工程)。 Next, the polarizing plate 100 is irradiated with light by the light source 22 (light irradiation process). Then, the transmission inspector 23 receives the light transmitted through the polarizing plate 100 through the polarizing filter 24, and performs a defect inspection (defect inspection process) of the polarizing plate 100 based on the received transmitted light.
但是，若分離膜貼附黏著材120，例如藉由輥形態提供，長度為1000m以上，並且，偏光板100，例如以超過分離膜貼附黏著材120的長度連續地生成的話，分離膜貼附黏著材120與一個偏光板100，於同種輥之間的連結縫123中一邊繫合在一起並連續地貼附。 However, if the separation film-attachment adhesive material 120 is, for example, provided in the form of a roller and has a length of 1000 m or more, and if the polarizing plate 100 is continuously formed over a length longer than the separation film-attachment adhesive material 120, for example, the separation film attachment The adhesive material 120 and a polarizing plate 100 are fastened together on one side in the connecting seam 123 between the same rollers and continuously attached.
做為分離膜貼附黏著材120中的分離膜121，如圖3所示，例如是使用：從原料薄膜延伸而得到的寬幅延伸薄膜，使該寬幅延伸薄膜與應貼附的偏光板100等寬，從寬度方向裁切成複數個A、B、C段。將原料薄膜延伸成延伸薄膜時，因為曲躬(bowing)D現象，寬度方向的配向角E會產生錯位，所以對各自所欲貼附的分離膜貼附黏著材120的輥A、B、C，會有相異的配向角。 As shown in FIG. 3, the separation film 121 in the adhesive film 120 is used as a separation film. For example, a wide extension film obtained by extending from a raw material film is used, and the wide extension film and the polarizing plate to be attached are used. 100 equal widths, cut into multiple A, B, C segments from the width direction. When the raw material film is stretched into a stretched film, due to the bowing D phenomenon, the alignment angle E in the width direction may be misaligned. Therefore, the rolls A, B, and C of the adhesive material 120 are attached to the separation films to be attached. , There will be different alignment angles.
因此，如同上述所說，在偏光板本體部110上貼附分離膜貼附黏著材120後，進行正交偏光法透過檢查時，需要對各個分離膜貼附黏著材120的輥調整透過檢 查用偏光濾光片24的偏光軸。 Therefore, as described above, after the separation film and the adhesive 120 are attached to the polarizing plate body 110, when the orthogonal polarization method is used for the transmission inspection, it is necessary to adjust the transmission inspection of the rollers to which the adhesive 120 is attached to each of the separation films. Check the polarization axis of the polarizing filter 24.
從前，在線進行正交偏光法透過檢查時，為了切換分離膜貼附黏著材的輥，在調整透過檢查用偏光濾光片的偏光軸時，也連續地生成偏光板。因此，在這段調整的期間裡所得到的偏光板的區域成為未檢查區域，無法做為製品使用，成為無謂的浪費。例如：調整透過檢查用偏光濾光片的偏光軸所花的時間約1分鐘，線速度約10~30m/分的話，切換1次分離膜貼附黏著材的輥將造成約10~30m的偏光板區域未檢查到，造成無謂的浪費。 In the past, in the case of performing the cross-polarization transmission inspection online, in order to switch the rollers to which the adhesive film is attached to the separation film, a polarizing plate is continuously generated when the polarization axis of the polarization filter for transmission inspection is adjusted. Therefore, the area of the polarizing plate obtained during this adjustment period becomes an uninspected area, which cannot be used as a product, and becomes wasteful. For example: It takes about 1 minute to adjust the polarization axis of the polarizing filter for inspection. If the linear velocity is about 10 to 30 m / min, switching the roller that attaches the adhesive to the separation film once will cause polarized light of about 10 to 30 m. The board area is not inspected, causing unnecessary waste.
不過，根據這種第1實施形態的偏光板的缺陷檢查方法及缺陷檢查裝置、以及偏光板的製造方法及製造裝置，藉由配向角測定器21事先測定分離膜121的配向角，基於測定得到的配向角自動調整偏光濾光片24的偏光軸。因此，可以縮短造成分離膜121的配向角之錯位所必要的正交偏光法透過檢查用偏光濾光片24之偏光軸的調整時間。 However, according to the defect inspection method and defect inspection device for a polarizing plate of the first embodiment, and the method and apparatus for producing a polarizing plate, the alignment angle of the separation film 121 is measured in advance by the alignment angle measuring device 21, and is obtained based on the measurement. The alignment angle of the polarizing filter 24 is automatically adjusted. Therefore, it is possible to shorten the adjustment time of the polarization axis of the orthogonal polarization method transmission inspection light filter 24 necessary for causing the misalignment of the alignment angle of the separation film 121.
於是，在線進行正交偏光法透過檢查時，為了切換分離膜貼附黏著材120的輥，在調整透過檢查用偏光濾光片24的偏光軸時，可以削減所連續生成的偏光板100的未檢查區域，減低無謂的浪費。 Therefore, in order to switch the rollers to which the separation film is attached to the adhesive 120 when the cross-polarization transmission inspection is performed online, the polarization axis of the polarization filter 24 for transmission inspection can be adjusted to reduce the number of successively generated polarizing plates 100. Examine the area and reduce unnecessary waste.
圖4為有關本發明第2實施形態的偏光板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及偏光 板(光學薄膜)的製造裝置及製造方法的示意圖。 4 is a defect inspection device and defect inspection method for a polarizing plate (optical film) according to a second embodiment of the present invention, and polarized light Schematic diagram of a board (optical film) manufacturing apparatus and manufacturing method.
如圖4所示的第2實施形態的製造裝置10A，在配向角測定器21的下游側及透過檢查器23的上游測，於偏光板本體部110的一方之主面貼合有分離膜貼附黏著材120，此點與第1實施形態相異。第2實施形態的製造裝置10A的其他構成，與第1實施形態的製造裝置10相同。 As shown in FIG. 4, the manufacturing apparatus 10A according to the second embodiment measures a downstream side of the alignment angle measuring device 21 and an upstream side of the transmission checker 23, and a separation film is attached to one of the main surfaces of the polarizing plate body 110. The point where the adhesive 120 is attached is different from the first embodiment. The other structures of the manufacturing apparatus 10A of the second embodiment are the same as those of the manufacturing apparatus 10 of the first embodiment.
換言之，第2實施形態的製造方法包含：在配向角測定工程後，缺陷檢查工程前，於偏光板本體部110的一方之主面貼合有分離膜貼附黏著材120的貼附工程，此點與第1實施形態相異。 In other words, the manufacturing method of the second embodiment includes an attaching process in which a separation film attaching adhesive 120 is attached to one of the main surfaces of the polarizing plate main body 110 after the alignment angle measurement process and before the defect inspection process. The points are different from the first embodiment.
該第2實施形態的偏光板的缺陷檢查方法及缺陷檢查裝置，以及偏光板的製造方法及製造裝置，可以得到與第1實施形態的偏光板的缺陷檢查方法及缺陷檢查裝置、及偏光板製造方法及製造裝置相同的優點。 The defect inspection method and defect inspection device for a polarizing plate of the second embodiment, and the method and apparatus for producing a polarizing plate, can obtain the defect inspection method and defect inspection device for a polarizing plate of the first embodiment, and manufacture of a polarizing plate. Method and manufacturing device have the same advantages.
圖5為有關本發明第3實施形態的相位差板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及相位差板(光學薄膜)的製造裝置及製造方法的示意圖，圖6為藉由圖5所示的製造裝置及製造方法所製造的相位差板示意圖。 5 is a schematic diagram of a defect inspection device and a defect inspection method for a retardation plate (optical film) according to a third embodiment of the present invention, and a manufacturing apparatus and a manufacturing method of the retardation plate (optical film); The retardation plate manufactured by the manufacturing apparatus and manufacturing method shown in FIG. 5 is a schematic diagram.
圖5所示的製造裝置10B為用來製造圖6所示的相位差板100B的製造裝置。製造裝置10B將由黏著 材122與分離膜(離型薄膜)121貼合而成的分離膜貼附黏著材120貼合於相位差板本體部110B，生成相位差板100B。接著，製造裝置10藉由原反捲取裝置11捲取所生成的相位差板100B。做為相位差板的材料，可以是TAC、聚碳酸酯、PET、COP(環烯烴聚合物)等。 The manufacturing apparatus 10B shown in FIG. 5 is a manufacturing apparatus for manufacturing the retardation plate 100B shown in FIG. 6. Manufacturing device 10B will consist of A separation film sticking adhesive 120 in which the material 122 and the separation film (release film) 121 are bonded together is attached to the retardation plate main body portion 110B to generate a retardation plate 100B. Next, the manufacturing apparatus 10 winds up the generated retardation plate 100B by the original unwinding apparatus 11. As the material of the retardation plate, TAC, polycarbonate, PET, COP (cycloolefin polymer) and the like can be used.
製造裝置10B包含缺陷檢查裝置20B。缺陷檢查裝置20B，於缺陷檢查裝置20B中更具備透過檢查用補助偏光濾光片25及相位差補償濾光片26，此點與第1實施形態相異。 The manufacturing apparatus 10B includes a defect inspection apparatus 20B. The defect inspection device 20B is different from the first embodiment in that the defect inspection device 20B further includes a supplementary polarizing filter 25 and a phase difference compensation filter 26 for transmission inspection.
透過檢查用補助偏光濾光片25設置於相位差板100B的另一方的主面102與光源22之間，相位差補償濾光片26設置於相位差板100B的另一方的主面102與透過檢查用補助偏光濾光片25之間。 The auxiliary inspection polarizing filter 25 for transmission is provided between the other main surface 102 of the phase difference plate 100B and the light source 22, and the phase difference compensation filter 26 is provided between the other main surface 102 of the phase difference plate 100B and the transmission. Between the auxiliary polarizing filters 25 for inspection.
藉此，透過檢查器23通過透過檢查用補助偏光濾光片25、相位差補償濾光片26、及透過檢查用偏光濾光片24，接收透過相位差板100B的光。 Thereby, the transmission inspector 23 receives the light transmitted through the retardation plate 100B through the transmission inspection auxiliary polarizing filter 25, the phase difference compensation filter 26, and the transmission inspection polarizing filter 24.
於透過檢查用偏光濾光片24的偏光軸調整機構，基於從配向角測定器21所測定的分離膜121的配向角資訊，調整相對於透過檢查用補助偏光濾光片25的偏光軸之偏光濾光片24的偏光軸(例如：偏光濾光片24的回轉角度)，形成正交偏光狀態。也就是說，本實施形態藉由兩個偏光子(透過檢查用補助偏光濾光片25及偏光濾光片24)形成正交偏光狀態。 The polarization axis adjustment mechanism of the transmission inspection polarizing filter 24 adjusts the polarization with respect to the polarization axis of the transmission inspection auxiliary polarization filter 25 based on the alignment angle information of the separation film 121 measured from the alignment angle measuring device 21. The polarization axis of the filter 24 (for example, the rotation angle of the polarization filter 24) is in the orthogonal polarization state. In other words, in this embodiment, two polarizers (the auxiliary polarizing filter 25 and the polarizing filter 24 for inspection) are used to form an orthogonal polarization state.
本實施形態在配向角測定器21及透過檢查器 23的上游測，於相位差板本體部110B的一方之主面貼合有分離膜貼附黏著材120。 In this embodiment, the alignment angle measuring device 21 and the transmission inspector In the upstream measurement of 23, a separation film attachment adhesive 120 is attached to one main surface of the retardation plate main body portion 110B.
接著，說明有關本發明第3實施形態的相位差板的缺陷檢查方法，以及製造方法。首先進行上述的貼附工程及配向角測定工程。 Next, a defect inspection method and a manufacturing method of the retardation plate according to the third embodiment of the present invention will be described. First, the above-mentioned attaching process and alignment angle measuring process are performed.
再來，藉由於透過檢查用偏光濾光片24的偏光軸調整機構，基於從配向角測定器21測定而來的分離膜121之配向角資訊，調整相對於透過檢查用補助偏光濾光片25的偏光軸之偏光濾光片24的偏光軸(調整工程)。 In addition, the polarization axis adjustment mechanism of the transmission inspection polarizing filter 24 adjusts the auxiliary polarization filter 25 for transmission inspection based on the alignment angle information of the separation film 121 measured from the alignment angle measuring device 21. The polarization axis of the polarizing filter 24 (adjustment process).
接著，藉由光源22，以光照射相位差板100B(光照射工程)。再來，藉由透過檢查器23，通過補助偏光濾光片25、相位差補償濾光片26、及偏光濾光片24接收透過相位差板100B的光，基於所接受的透過光，進行相位差板100B的缺陷檢查(缺陷檢查工程)。 Next, the phase difference plate 100B is irradiated with light by the light source 22 (light irradiation process). In addition, the transmission checker 23 receives the light transmitted through the phase difference plate 100B through the auxiliary polarizing filter 25, the phase difference compensation filter 26, and the polarizing filter 24, and performs phase based on the received transmitted light. Defect inspection (defect inspection process) of the differential plate 100B.
這種第3實施形態的相位差板的缺陷檢查方法及缺陷檢查裝置、以及相位差板的製造方法及製造裝置，藉由配向角測定器21事先測定分離膜121的配向角，基於測定所得到的配向角自動調整偏光濾光片24的偏光軸，因此，可以縮短造成分離膜121的配向角之錯位所必要的正交偏光法透過檢查用偏光濾光片24之偏光軸的調整時間。 In the defect inspection method and defect inspection device for a retardation plate of the third embodiment, and the method and apparatus for producing a retardation plate, the alignment angle of the separation film 121 is measured in advance by the alignment angle measuring device 21, and is obtained based on the measurement. The polarizing axis of the polarizing filter 24 is automatically adjusted by the alignment angle of the polarizing filter 24. Therefore, the adjustment time of the polarizing axis of the polarizing filter 24 for inspection by the orthogonal polarization method necessary to cause misalignment of the alignment angle of the separation film 121 can be shortened.
因此，在線進行正交偏光法透過檢查時，為了切換分離膜貼附黏著材120的輥，在調整透過檢查用偏 光濾光片24的偏光軸時，可以削減連續生成的相位差板100B的未檢查區域，減低無謂的浪費。 Therefore, in order to perform the cross-polarization transmission inspection online, in order to switch the roll of the adhesive film 120 to which the separation film is attached, the transmission inspection polarization is adjusted. When the polarization axis of the optical filter 24 is used, the unchecked area of the phase difference plate 100B generated continuously can be reduced, and unnecessary waste can be reduced.
圖7為有關本發明第4實施形態的相位差板(光學薄膜)的缺陷檢查裝置及缺陷檢查方法，以及相位差板(光學薄膜)的製造裝置及製造方法的示意圖。 FIG. 7 is a schematic diagram of a defect inspection device and a defect inspection method for a retardation plate (optical film) according to a fourth embodiment of the present invention, and a manufacturing apparatus and method for a retardation plate (optical film).
如圖7所示的第4實施形態的製造裝置10C，在配向角測定器21的下游側及透過檢查器23的上游測，於相位差板本體部110B的一方之主面貼合有分離膜貼附黏著材120，此點與第3實施形態相異。第4實施形態的製造裝置10C的其他構成，與第3實施形態的製造裝置10B相同。 As shown in FIG. 7, the manufacturing apparatus 10C of the fourth embodiment measures the downstream side of the alignment angle measuring device 21 and the upstream side of the transmission checker 23, and a separation film is bonded to one of the main surfaces of the retardation plate body 110B. The point that the adhesive material 120 is attached is different from the third embodiment. The other structures of the manufacturing apparatus 10C of the fourth embodiment are the same as those of the manufacturing apparatus 10B of the third embodiment.
換言之，第4實施形態的製造方法包含：在配向角測定工程後，缺陷檢查工程前，於相位差板本體部110B的一方之主面上貼附有分離膜貼附黏著材120的貼附工程，此點與第3實施形態相異。 In other words, the manufacturing method according to the fourth embodiment includes an attaching process in which a separation film attaching adhesive 120 is attached to one main surface of the retardation plate main body 110B after the alignment angle measurement process and before the defect inspection process. This point is different from the third embodiment.
該第4實施形態的相位差板的缺陷檢查方法及缺陷檢查裝置，以及相位差板的製造裝置及製造裝置，可以得到與第3實施形態的相位差板的缺陷檢查方法及缺陷檢查裝置、及相位差板的製造方法及製造裝置相同的優點。 The defect inspection method and defect inspection device of the retardation plate of the fourth embodiment, and the manufacturing apparatus and manufacturing apparatus of the retardation plate, can obtain the defect inspection method and defect inspection device of the retardation plate of the third embodiment, and The manufacturing method and manufacturing device of the retardation plate have the same advantages.
本發明不限於上述第1實施形態~第4實施形態(以下合稱為本實施形態。)可以有多種的可能的變形 態。例如：於本實施形態例示了，光源22設置於偏光板100或相位差板100B的另一方的主面102側，透過檢查器23設置於偏光板100或相位差板100B的一方的主面101側之形態。不過，光源22也可設置於偏光板100或相位差板100B的一方的主面101側，透過檢查器23也可設置於偏光板100或相位差板100B的另一方的主面102側(例如，參照圖8：第1實施形態的變形例)。此種情形，在第1及第2的實施形態中，透過檢查用偏光濾光片24也可設置於偏光板100的一方之主面101與光源22之間。另一方面，第3及第4的實施形態中，透過檢查用偏光濾光片24也可設置於相位差板100B的一方的主面101與光源22之間，透過檢查用補助偏光濾光片25及相位差補償濾光片26也可設置於相位差板100B的另一方的主面102與透過檢查器23之間。 The present invention is not limited to the above-mentioned first to fourth embodiments (hereinafter collectively referred to as this embodiment). There are various possible modifications. state. For example, in this embodiment, it is illustrated that the light source 22 is provided on the other main surface 102 side of the polarizing plate 100 or the retardation plate 100B, and the transmission inspector 23 is provided on one main surface 101 of the polarizing plate 100 or the retardation plate 100B. The shape of the side. However, the light source 22 may be provided on one side of the main surface 101 of the polarizing plate 100 or the retardation plate 100B, and the transmission inspector 23 may be provided on the other side of the main surface 102 of the polarizing plate 100 or the retardation plate 100B (for example, Refer to Fig. 8: a modification of the first embodiment). In this case, in the first and second embodiments, the transmission inspection polarizing filter 24 may be provided between one main surface 101 of the polarizing plate 100 and the light source 22. On the other hand, in the third and fourth embodiments, the transmission inspection polarizing filter 24 may be provided between one of the main surfaces 101 and the light source 22 of the retardation plate 100B, and the transmission inspection auxiliary polarizing filter may be provided. 25 and the phase difference compensation filter 26 may be provided between the other main surface 102 of the phase difference plate 100B and the transmission checker 23.
本實施形態中，雖然直接提供藉由配向角測定器21所測定的配向角之資訊給偏光濾光片24，但藉由配向角測定器21測定的分離膜121的配向角的資訊，則藉由記錄部27記錄在偏光板100或相位差板100B上，一旦藉由捲取輥這種所謂的原反捲取裝置12來做捲取，之後由再度捲出時位於偏光濾光片24中的偏光軸調整機構來讀取偏光板100或相位差板100B上所記錄的資訊，可以基於此資訊調整光濾光片的偏光軸。換句話說，包含將於配向角測定工程所測定的分離膜121的配向角資訊記錄於偏光板100或相位差板100B上的記錄工程之調整工 程，會基於記錄工程中偏光板100或相位差板100B上所記錄的分離膜121之配向角的資訊，調整偏光濾光片24的偏光軸(例如，圖9：參照第1實施形態的變形例)。 In this embodiment, although the information of the alignment angle measured by the alignment angle measuring device 21 is directly provided to the polarization filter 24, the information of the alignment angle of the separation film 121 measured by the alignment angle measuring device 21 is borrowed. It is recorded on the polarizing plate 100 or the retardation plate 100B by the recording unit 27. Once it is wound by the so-called original reverse winding device 12 which is a winding roller, it is located in the polarizing filter 24 when it is rolled out again. The polarizing axis adjustment mechanism can read information recorded on the polarizing plate 100 or the retardation plate 100B, and the polarizing axis of the optical filter can be adjusted based on this information. In other words, an adjustment process including a recording process in which the alignment angle information of the separation film 121 measured in the alignment angle measurement process is recorded on the polarizing plate 100 or the retardation plate 100B. In the recording process, the polarization axis of the polarizing filter 24 is adjusted based on the information of the alignment angle of the separation film 121 recorded on the polarizing plate 100 or the retardation plate 100B in the recording process (for example, FIG. 9: refer to the deformation of the first embodiment). example).
偏光板100或相位差板100B上所記錄的資訊，可以是驗證碼(一維條碼、二維條碼、OR code(註冊商標)等)等，也可以記錄於偏光板100或相位差板100B上的寬度方向的端部。 The information recorded on the polarizing plate 100 or the retardation plate 100B may be a verification code (one-dimensional barcode, two-dimensional barcode, OR code (registered trademark), etc.), etc., or may be recorded on the polarizing plate 100 or the retardation plate 100B. End in the width direction.
藉此，從配向角測定工程開始到記錄工程為止，都在同一線上進行；調整工程、光照射工程、及缺陷檢查工程可在別的線上進行。 With this, the alignment angle measurement process to the recording process are all performed on the same line; the adjustment process, light irradiation process, and defect inspection process can be performed on other lines.
做為配向角測定器21，組合與上述相同的透過檢查器、透過檢查用偏光濾光片、相位差補償濾光片、及光源，在第2實施形態(圖4)、第3實施形態(圖5)、及第4實施形態(圖7)的情況下，也可以組合與上述相同的透過檢查用補助偏光濾光片。在此情況下，例如配置透過檢查器於配置配向角測定器(21)的位置；配置透過檢查用偏光濾光片於透過檢查器與分離膜貼附黏著材(120)之間；配置光源於分離膜貼附黏著材(120)的透過檢查器側的相反對側；於分離膜貼附黏著材(120)與光源之間的分離膜貼附黏著材(120)側開始依序配置相位差補償濾光片及透過檢查用補助偏光濾光片。例如：為了不使從光源發出的光傳導至透過檢查器，改變透過檢查用偏光濾光片的偏光軸、相位差補償濾光片遲相軸、及光學檢查用補助偏光濾光片的偏光軸之方向，從該些軸的 方向可以得到分離膜的配向角。 As the alignment angle measuring device 21, the same transmission inspector, transmission inspection polarizing filter, phase difference compensation filter, and light source as the above are combined, and the second embodiment (FIG. 4) and the third embodiment (FIG. 4) In the case of FIG. 5) and the fourth embodiment (FIG. 7), a supplementary polarizing filter for transmission inspection similar to the above may be combined. In this case, for example, a transmission inspection device is disposed at a position where the alignment angle measuring device (21) is disposed; a transmission inspection polarizing filter is disposed between the transmission inspection device and the separation film attachment adhesive material (120); a light source is disposed at The separation film sticking adhesive (120) is on the opposite side of the inspection device side; the phase difference is sequentially arranged on the separation film sticking adhesive (120) side between the separation film sticking adhesive (120) and the light source. Compensation filters and auxiliary polarizing filters for transmission inspection. For example, in order not to transmit the light emitted from the light source to the transmission inspector, change the polarization axis of the polarization filter for transmission inspection, the retardation axis of the phase difference compensation filter, and the polarization axis of the auxiliary polarization filter for optical inspection. Direction from those axes The orientation can obtain the alignment angle of the separation membrane.
不過，一般偏光板100或相位差板100B(光學薄膜)的長度為分離膜貼附黏著材120的10倍以下。換言之，一般連續生成的偏光板本體部110或相位差板本體部110B(光學薄膜本體部)的長度為分離膜貼附黏著材120的長度之10倍以下。具體而言，偏光板100或相位差板100B的長度(換言之，偏光板本體部110或相位差板本體部110B的長度)為1000m以上20000m以下，分離膜貼附黏著材120的長度多為500m以上5000m以下。因此，偏光板100或相位差板100B的長度(換言之，偏光板本體部110或相位差板本體部110B的長度)為分離膜貼附黏著材120的長度之3倍以上，或甚至是5位以上的話，相對於1偏光板100或相位差板100B(換言之，偏光板本體部110或相位差板本體部110B)，繫合分離膜貼附黏著材120的頻度會增加。因此，偏光板100或相位差板100B的長度(換言之，偏光板本體部110或相位差板本體部110B的長度)與分離膜貼附黏著材120的長度差異將變大，連接分離膜貼附黏著材120的頻度增加時，使用本發明的方法及裝置會更適合，並更顯著地發揮上述的效果。 However, in general, the length of the polarizing plate 100 or the retardation plate 100B (optical film) is 10 times or less the separation film sticking adhesive 120. In other words, the length of the polarizing plate body portion 110 or the retardation plate body portion 110B (optical film body portion) that is generally continuously generated is 10 times or less the length of the separation film sticking adhesive 120. Specifically, the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate body portion 110 or the retardation plate body portion 110B) is 1000 m or more and 20,000 m or less, and the length of the separation film-attachment adhesive 120 is usually 500 m. Above 5000m. Therefore, the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate body portion 110 or the retardation plate body portion 110B) is more than three times the length of the separation film attachment adhesive material 120, or even 5 positions. As described above, the frequency of bonding the separation film to the adhesive material 120 is increased with respect to the 1 polarizing plate 100 or the retardation plate 100B (in other words, the polarizing plate body portion 110 or the retardation plate body portion 110B). Therefore, the difference between the length of the polarizing plate 100 or the retardation plate 100B (in other words, the length of the polarizing plate body portion 110 or the retardation plate body portion 110B) and the length of the separation film attachment adhesive 120 becomes large, and the separation film attachment is connected. When the frequency of the adhesive material 120 is increased, the method and device of the present invention are more suitable, and the above-mentioned effects are exhibited more significantly.
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| JP2015019450A JP6437329B2 (en) | 2015-02-03 | 2015-02-03 | Optical film defect inspection method |
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| NL2020361B1 (en) | 2018-01-31 | 2019-08-07 | Airborne Int B V | Tape sectioning system and method of sectioning tape |
| KR102112916B1 (en) * | 2018-05-15 | 2020-05-19 | 서울대학교산학협력단 | Method of analysing membrane defect |
| JP7451227B2 (en) * | 2020-02-28 | 2024-03-18 | 日東電工株式会社 | Inspection method for optically transparent laminates |
| JP2022074037A (en) * | 2020-10-29 | 2022-05-17 | 住友化学株式会社 | Inspection method |
| CN116465826B (en) * | 2023-03-15 | 2023-10-24 | 东阳市诰源闪光材料有限公司 | Device and method for testing polarization rate of optical film |
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| JP2005009919A (en) * | 2003-06-17 | 2005-01-13 | Taiyo Denki Kk | Inspection apparatus and inspection method for polarizing plate with protective film |
| JP2007213016A (en) * | 2006-01-11 | 2007-08-23 | Nitto Denko Corp | LAMINATED FILM MANUFACTURING METHOD, LAMINATED FILM DEFECT DETECTING METHOD, LAMINATED FILM DEFECT DETECTOR, LAMINATED FILM, AND IMAGE DISPLAY DEVICE |
| TWI340835B (en) * | 2008-04-15 | 2011-04-21 | Nitto Denko Corp | |
| WO2011148790A1 (en) * | 2010-05-25 | 2011-12-01 | 東レ株式会社 | Film defect inspection device, defect inspection method, and release film |
| TWI471220B (en) * | 2010-09-03 | 2015-02-01 | Nitto Denko Corp | Method of producing roll of optical film laminate with polarizing film |
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| JP2005062165A (en) * | 2003-07-28 | 2005-03-10 | Nitto Denko Corp | Sheet product inspection method, inspection system, sheet product, and image display apparatus |
| JP4869053B2 (en) * | 2006-01-11 | 2012-02-01 | 日東電工株式会社 | LAMINATED FILM MANUFACTURING METHOD, LAMINATED FILM DEFECT DETECTING METHOD, LAMINATED FILM DEFECT DETECTOR, LAMINATED FILM, AND IMAGE DISPLAY DEVICE |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005009919A (en) * | 2003-06-17 | 2005-01-13 | Taiyo Denki Kk | Inspection apparatus and inspection method for polarizing plate with protective film |
| JP2007213016A (en) * | 2006-01-11 | 2007-08-23 | Nitto Denko Corp | LAMINATED FILM MANUFACTURING METHOD, LAMINATED FILM DEFECT DETECTING METHOD, LAMINATED FILM DEFECT DETECTOR, LAMINATED FILM, AND IMAGE DISPLAY DEVICE |
| TWI340835B (en) * | 2008-04-15 | 2011-04-21 | Nitto Denko Corp | |
| WO2011148790A1 (en) * | 2010-05-25 | 2011-12-01 | 東レ株式会社 | Film defect inspection device, defect inspection method, and release film |
| TWI471220B (en) * | 2010-09-03 | 2015-02-01 | Nitto Denko Corp | Method of producing roll of optical film laminate with polarizing film |
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| JP6437329B2 (en) | 2018-12-12 |
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