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TWI666701B - Processing liquid supply device, substrate processing device, and processing liquid supply method - Google Patents

Processing liquid supply device, substrate processing device, and processing liquid supply method Download PDF

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TWI666701B
TWI666701B TW106141623A TW106141623A TWI666701B TW I666701 B TWI666701 B TW I666701B TW 106141623 A TW106141623 A TW 106141623A TW 106141623 A TW106141623 A TW 106141623A TW I666701 B TWI666701 B TW I666701B
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flow path
processing liquid
processing
circulation
liquid
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TW201830510A (en
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Takashi Ota
太田喬
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SCREEN Holdings Co., Ltd.
日商斯庫林集團股份有限公司
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    • H10P72/0411
    • H10P14/6508
    • H10P14/6534
    • H10P50/00
    • H10P52/00
    • H10P70/15
    • H10P72/0431
    • H10P72/0448
    • H10P72/0602

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Abstract

處理液供給裝置對處理基板之處理單元供給處理液。處理液供給裝置包含:貯存槽,貯存處理液;循環流路,使前述貯存槽內之處理液循環;供給流路,自前述循環流路對前述處理單元供給處理液;返回流路,使已供給至前述處理單元之處理液返回至前述循環流路;以及溫度調節單元,對在前述循環流路循環之處理液之溫度進行調節。 The processing liquid supply device supplies a processing liquid to a processing unit that processes a substrate. The processing liquid supply device includes: a storage tank for storing the processing liquid; a circulation flow path for circulating the processing liquid in the storage tank; a supply flow path for supplying the processing liquid from the circulation flow path to the processing unit; The processing liquid supplied to the processing unit is returned to the circulation flow path; and the temperature adjustment unit adjusts the temperature of the processing liquid circulating in the circulation flow path.

Description

處理液供給裝置、基板處理裝置以及處理液供給方法    Processing liquid supply device, substrate processing device, and processing liquid supply method   

本發明係關於一種對處理基板之處理單元供給處理液之處理液供給裝置、具備該處理液供給裝置之基板處理裝置、以及使用該處理液供給裝置及該基板處理裝置之處理液供給方法。成為處理對象之基板,例如包含半導體晶圓、液晶顯示裝置用基板、有機EL(Electroluminescence;電致發光)顯示裝置等之FPD(Flat Panel Display;平板顯示器)用基板、光碟用基板、磁碟用基板、光磁碟用基板、光罩用基板、陶瓷基板、太陽電池用基板等基板。 The present invention relates to a processing liquid supply device that supplies a processing liquid to a processing unit that processes a substrate, a substrate processing device including the processing liquid supply device, and a processing liquid supply method using the processing liquid supply device and the substrate processing device. Substrates to be processed include, for example, FPD (Flat Panel Display) substrates including semiconductor wafers, substrates for liquid crystal display devices, organic EL (Electroluminescence) display devices, substrates for optical disks, and disks Substrates such as substrates, substrates for magneto-optical disks, substrates for photomasks, ceramic substrates, and substrates for solar cells.

於利用逐片地處理基板之單晶圓處理式基板處理裝置所為之基板處理中,是例如將貯存於槽之藥液等處理液供給至處理基板之處理單元。為了減少每個基板之處理之不均,需要對供給至處理單元之處理液之溫度進行調節。因此,下述專利文獻1中提出如下之基板處理裝置,即,具備將自藥液槽送出之藥液供給至處理單元之藥液供給路及介設於藥液供給路之加熱器。於利用該基板處理裝置進行之基板處理中,可將經加熱器調節了溫度後之處理液供給至基板。而且,該基板處理裝置構成為自藥液供給路 供給至處理單元之藥液經由藥液回收路而回收至藥液槽。 In the substrate processing using a single wafer processing type substrate processing apparatus that processes substrates piece by piece, for example, a processing unit that supplies a processing liquid such as a chemical solution stored in a tank to a processing substrate. In order to reduce the uneven processing of each substrate, the temperature of the processing liquid supplied to the processing unit needs to be adjusted. Therefore, the following patent document 1 proposes a substrate processing apparatus including a chemical solution supply path for supplying the chemical solution sent from the chemical solution tank to the processing unit, and a heater interposed in the chemical solution supply path. In the substrate processing performed by the substrate processing apparatus, a processing liquid whose temperature has been adjusted by a heater can be supplied to the substrate. The substrate processing apparatus is configured such that the chemical solution supplied from the chemical solution supply path to the processing unit is recovered to the chemical solution tank via the chemical solution recovery path.

[先前技術文獻] [Prior technical literature]

(專利文獻) (Patent Literature)

專利文獻1:日本專利特開2006-269668號公報 Patent Document 1: Japanese Patent Laid-Open No. 2006-269668

要另外說明的是,基板處理在經過長時間的情況下,有時要將已對處理單元供給了處理液之處理液槽更換為其他處理液槽。此時,處理液對處理單元之供給被中斷。 It is to be noted that, in a case where the substrate processing has passed for a long time, the processing liquid tank that has been supplied with the processing liquid to the processing unit may be replaced with another processing liquid tank. At this time, the supply of the processing liquid to the processing unit is interrupted.

專利文獻1之基板處理裝置中設置有藥液循環路,該藥液循環路連接於藥液供給路且供藥液槽內之藥液循環。因此,可於藥液槽之更換後且藥液對基板之供給之停止中的情況下,使藥液供給路、藥液循環路及藥液槽內之藥液循環。藉由利用加熱器對循環之藥液進行加熱,而可調節藥液供給路、藥液循環路及藥液槽內之藥液之溫度。 The substrate processing apparatus of Patent Document 1 is provided with a chemical solution circulation path, which is connected to the chemical solution supply path and circulates the chemical solution in the chemical solution tank. Therefore, when the chemical liquid tank is replaced and the supply of the chemical liquid to the substrate is stopped, the chemical liquid supply path, the chemical liquid circulation path, and the chemical liquid in the chemical liquid tank can be circulated. By heating the circulating chemical liquid with a heater, the temperature of the chemical liquid supply path, the chemical liquid circulation path, and the chemical liquid in the chemical liquid tank can be adjusted.

另一方面,於處理液對處理單元之供給被中斷之期間,不對藥液回收路供給藥液。因此,藥液回收路內之藥液不會回到藥液槽而是積存於藥液回收路內。已積存於藥液回收路內之處理液在藥液回收路內冷卻。 On the other hand, while the supply of the processing liquid to the processing unit is interrupted, the chemical liquid is not supplied to the chemical liquid recovery path. Therefore, the medicinal solution in the medicinal solution recovery path does not return to the medicinal solution tank but is accumulated in the medicinal solution recovery path. The processing liquid that has been accumulated in the chemical liquid recovery path is cooled in the chemical liquid recovery path.

當藥液對處理單元之供給重新開始時,已於藥液回收路內冷卻之藥液被新進入至藥液回收路之藥液擠出而回到藥液槽。由於藥液回收路內溫度已降低之藥液回到藥液槽,故藥液槽內之藥液會被冷卻。因此,供給至處理單元之藥液之溫度降低。接著,已冷卻之藥液通過藥液供給路被供給至基板。此時,可能發生藥液被加熱器充分加熱前便被供給至基板之情況。 When the supply of the medicinal solution to the processing unit is restarted, the medicinal solution that has been cooled in the medicinal solution recovery path is squeezed out by the medicinal solution newly entering the medicinal solution recovery path and returned to the medicinal solution tank. Since the medicinal solution whose temperature in the medicinal solution recovery path has decreased has returned to the medicinal solution tank, the medicinal solution in the medicinal solution tank is cooled. Therefore, the temperature of the chemical solution supplied to the processing unit is reduced. Then, the cooled chemical solution is supplied to the substrate through the chemical solution supply path. At this time, the chemical solution may be supplied to the substrate before being sufficiently heated by the heater.

因此,本發明之一個目的在於提供一種即便於處理液對處理單元之供給已中斷情形時,亦可抑制處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化的處理液供給裝置、基板處理裝置以及處理液供給方法。 Therefore, it is an object of the present invention to provide a process capable of suppressing a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted even when the supply of the processing liquid to the processing unit is interrupted. A liquid supply device, a substrate processing device, and a processing liquid supply method.

本發明之一實施形態提供一種處理液供給裝置,對處理基板之處理單元供給處理液。且該處理液供給裝置包含:貯存槽,貯存處理液;循環流路,使前述貯存槽內之處理液循環;供給流路,自前述循環流路對前述處理單元供給處理液;返回流路,使已供給至前述處理單元之處理液返回至前述循環流路;以及溫度調節單元,對在前述循環流路循環之處理液之溫度進行調節。 An embodiment of the present invention provides a processing liquid supply device that supplies a processing liquid to a processing unit that processes a substrate. And the processing liquid supply device includes: a storage tank for storing the processing liquid; a circulation flow path for circulating the processing liquid in the storage tank; a supply flow path for supplying the processing liquid from the circulation flow path to the processing unit; a return flow path, Returning the processing liquid that has been supplied to the processing unit to the circulation flow path; and a temperature adjustment unit that adjusts the temperature of the processing liquid circulating in the circulation flow path.

根據該構成,貯存槽內之處理液藉由循環流路而循 環。於循環流路循環之處理液之溫度藉由溫度調節單元而調節。因此,供給流路可將溫度已得到適當調節之處理液供給至處理單元。 According to this configuration, the processing liquid in the storage tank is circulated through the circulation flow path. The temperature of the treatment liquid circulating in the circulation flow path is adjusted by a temperature adjustment unit. Therefore, the supply channel can supply the processing liquid whose temperature has been appropriately adjusted to the processing unit.

已供給至處理單元之處理液經由返回流路而返回至循環流路。循環流路例如包含連接有返回流路之分支部、自循環流路之上游側連接至分支部之上游流路、及自循環流路之下游側連接至分支部之下游流路。循環流路之上游側係指處理液流經循環流路之方向之上游側。循環流路之下游側係指處理液流經循環流路之方向之下游側。 The processing liquid supplied to the processing unit is returned to the circulation flow path through the return flow path. The circulation flow path includes, for example, a branch portion connected to the return flow path, an upstream flow path connected to the branch portion from the upstream side of the circulation flow path, and a downstream flow path connected to the branch portion from the downstream side of the circulation flow path. The upstream side of the circulation flow path means the upstream side of the direction in which the treatment liquid flows through the circulation flow path. The downstream side of the circulation flow path means the downstream side in the direction in which the treatment liquid flows through the circulation flow path.

已供給至處理單元之處理液通過返回流路、分支部及下游流路而返回至貯存槽。因此,與返回流路內之處理液直接返回至貯存槽之構成相比,可將處理液流經返回流路內之距離設定得較短。 The processing liquid that has been supplied to the processing unit is returned to the storage tank through the return flow path, the branch portion, and the downstream flow path. Therefore, compared with the configuration in which the processing liquid in the return flow path is directly returned to the storage tank, the distance that the processing liquid flows through the return flow path can be set shorter.

因此,於已中斷處理液對處理單元之供給之情形時,可減少殘存於返回流路內之處理液之量。藉此,可抑制因返回流路內已被冷卻之處理液在處理液對處理單元之供給重新開始時回到貯存槽而將貯存槽內之處理液冷卻。其結果,即便於已中斷處理液對處理單元之供給之情形時,亦可抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the return flow path can be reduced. Thereby, it is possible to prevent the processing liquid in the return flow path from being cooled when the processing liquid that has been cooled in the return flow path is returned to the storage tank when the supply of the processing liquid to the processing unit is resumed. As a result, even when the supply of the processing liquid to the processing unit is interrupted, a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted can be suppressed.

本發明之一實施形態中,處理液流經前述返回流路內之距離較處理液流經前述下游流路內之距離短。因此,於已中斷處理液對處理單元之供給之情形時,可進一步減少殘存於返回流路內之處理液之量。藉此,可進一步抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 In one embodiment of the present invention, the distance that the processing liquid flows through the aforementioned return flow path is shorter than the distance that the processing liquid flows through the aforementioned downstream flow path. Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the return flow path can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted.

本發明之一實施形態中,前述循環流路包含設置於前述分支部之循環槽,前述循環槽包含連接有前述上游流路及前述返回流路之頂部、及連接有前述下游流路之底部。 In one embodiment of the present invention, the circulation flow path includes a circulation groove provided in the branch portion, and the circulation groove includes a top portion connected to the upstream flow path and the return flow path, and a bottom portion connected to the downstream flow path.

根據該構成,於設置於分支部之循環槽之頂部連接有上游流路及返回流路。因此,自上游流路及返回流路供給至循環槽之處理液容易於循環槽內之底部移動。因此,自上游流路及返回流路供給至循環槽之處理液容易於連接於底部之下游流路流動。藉此,循環流路可使處理液順暢地循環。 According to this configuration, the upstream flow path and the return flow path are connected to the top of the circulation groove provided in the branch portion. Therefore, the processing liquid supplied to the circulation tank from the upstream flow path and the return flow path easily moves to the bottom in the circulation tank. Therefore, the processing liquid supplied to the circulation tank from the upstream flow path and the return flow path can easily flow in the downstream flow path connected to the bottom. Thereby, the circulation flow path can smoothly circulate the processing liquid.

於對循環槽內供給處理液時,循環槽內之處理液積存於底部。因此,循環槽內之處理液之液面與頂部之間容易設置有間隔。因此,可防止因循環槽內之處理液到達頂部而循環槽內之處理液向返回流路逆流之情況。 When the processing liquid is supplied into the circulation tank, the processing liquid in the circulation tank is accumulated at the bottom. Therefore, a space is easily provided between the liquid level and the top of the processing liquid in the circulation tank. Therefore, it is possible to prevent the processing liquid in the circulation tank from flowing backward to the return flow path because the processing liquid in the circulation tank reaches the top.

本發明之一實施形態中,前述處理液供給裝置進而包含:下游閥,用以開閉前述下游流路;以及閥開閉單元,維持關閉前述下游閥之狀態直至前述循環槽內之處理液之量達到基準量為止,於前述循環槽內之處理液之量達到基準量時便打開前述下游閥。 In an embodiment of the present invention, the processing liquid supply device further includes a downstream valve for opening and closing the downstream flow path; and a valve opening and closing unit that maintains the state of closing the downstream valve until the amount of the processing liquid in the circulation tank reaches Up to the reference amount, the downstream valve is opened when the amount of the processing liquid in the circulation tank reaches the reference amount.

根據該構成,下游閥維持關閉狀態直至循環槽內之處理液之量達到基準量為止。下游閥於循環槽內之處理液之量達到基準量時便被打開。因此,可防止循環槽內之處理液到達循環槽之頂部。因此,可有效果地防止循環槽內之處理液向返回流路逆流。 According to this configuration, the downstream valve is kept closed until the amount of the processing liquid in the circulation tank reaches the reference amount. The downstream valve is opened when the amount of processing liquid in the circulation tank reaches the reference amount. Therefore, the treatment liquid in the circulation tank can be prevented from reaching the top of the circulation tank. Therefore, it is possible to effectively prevent the processing liquid in the circulation tank from flowing backward to the return flow path.

本發明之一實施形態中,設置有複數個前述處理單元,已自前述供給流路供給至複數個前述處理單元中之各個處理單元的處理液係經由前述返回流路而共通地供給至前述循環槽。 In one embodiment of the present invention, a plurality of the processing units are provided, and the processing liquid that has been supplied from the supply flow path to each of the plurality of processing units is supplied to the circulation in common through the return flow path. groove.

根據該構成,已自供給流路供給至複數個處理單元中之各個處理單元的處理液經由返回流路而共通地供給至循環槽。詳細而言,供給流路對處理單元中之各處理單元供給處理液,返回流路將處理液自各個處理單元向循環槽導引。因此,無須針對每個處理單元設置循環槽。 According to this configuration, the processing liquid that has been supplied from the supply flow path to each of the plurality of processing units is supplied to the circulation tank in common through the return flow path. Specifically, the supply flow path supplies processing liquid to each processing unit in the processing unit, and the return flow path guides the processing liquid from each processing unit to the circulation tank. Therefore, it is not necessary to provide a circulation tank for each processing unit.

本發明之一實施形態中,前述分支部配置於較前述處 理單元所具有且用以收容前述基板之處理腔室更靠下方處。因此,返回流路內之處理液容易朝向循環流路流動。因此,於已中斷處理液對處理單元之供給之情形時,可進一步減少殘存於返回流路內之處理液之量。藉此,可進一步抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 In one embodiment of the present invention, the branch portion is disposed below a processing chamber provided in the processing unit and configured to receive the substrate. Therefore, the processing liquid in the return flow path easily flows toward the circulation flow path. Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the return flow path can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted.

本發明之一實施形態中,前述分支部與前述返回流路一起收容於與前述處理腔室鄰接而配置之流路盒。因此,可減小處理腔室與循環槽之距離。進而,可將返回流路設定得更短。 In one embodiment of the present invention, the branch portion is accommodated in the flow path box disposed adjacent to the processing chamber together with the return flow path. Therefore, the distance between the processing chamber and the circulation tank can be reduced. Furthermore, the return flow path can be set shorter.

本發明之一實施形態中,設置有複數個前述貯存槽;上述處理液供給裝置進而包含:上游切換單元,將對前述分支部或前述處理單元供給處理液之供給源之前述貯存槽在前述複數個貯存槽中進行切換;以及下游切換單元,將供給目標之貯存槽在前述複數個貯存槽中進行切換,以使前述供給目標之前述貯存槽與前述供給源之前述貯存槽為相同槽,且前述供給目標的前述貯存槽係自前述分支部被供給處理液。 In one embodiment of the present invention, a plurality of the storage tanks are provided; the processing liquid supply device further includes: an upstream switching unit that stores the storage tanks that supply a processing liquid supply source to the branch or the processing unit in the plurality of storage tanks; And the downstream switching unit switches the storage tank of the supply target among the plurality of storage tanks so that the storage tank of the supply target and the storage tank of the supply source are the same tank, and The storage tank of the supply target is supplied with a processing liquid from the branch portion.

根據該構成,供給目標之貯存槽被在複數個貯存槽中進行切換,以使供給源之貯存槽與供給目標之貯存槽為相同槽。因此,可藉由循環流路使各貯存槽內之處理液循環 而不會使各貯存槽內之處理液之量發生變化。因此,可於開始利用循環流路進行處理液之循環之前,針對每個貯存槽設定供給至處理單元之處理液的必要量。藉此,容易對貯存槽內之處理液之量進行管理。 According to this configuration, the storage tank of the supply target is switched among a plurality of storage tanks so that the storage tank of the supply source and the storage tank of the supply target are the same tank. Therefore, the processing liquid in each storage tank can be circulated through the circulation flow path without changing the amount of the processing liquid in each storage tank. Therefore, before starting the circulation of the processing liquid using the circulation flow path, the necessary amount of the processing liquid supplied to the processing unit can be set for each storage tank. This makes it easy to manage the amount of the processing liquid in the storage tank.

本發明之另一實施形態中,提供包含前述處理液供給裝置及前述處理單元之基板處理裝置。根據該構成,可實現與前述相同之效果。 According to another embodiment of the present invention, a substrate processing apparatus including the processing liquid supply device and the processing unit is provided. With this configuration, the same effects as described above can be achieved.

本發明之又一實施形態提供一種處理液供給方法,對利用處理液處理基板之處理單元供給處理液,且包含:循環步驟,使貯存處理液之貯存槽內之處理液於循環流路中循環;供給步驟,自前述循環流路對前述處理單元供給處理液;以及返回步驟,使已於前述供給步驟中供給至前述處理單元之處理液返回至前述循環流路。 Another embodiment of the present invention provides a processing liquid supply method, which supplies a processing liquid to a processing unit for processing a substrate using the processing liquid, and includes a circulation step of circulating the processing liquid in a storage tank storing the processing liquid in a circulation flow path. A supply step of supplying a processing liquid to the processing unit from the circulation flow path, and a return step of returning the processing liquid that has been supplied to the processing unit in the supply step to the circulation flow path.

根據該方法,循環步驟中,貯存槽內之處理液藉由循環流路而循環。溫度調節步驟中,對在循環流路中循環之處理液之溫度進行調節。因此,供給步驟中,可將溫度已得到適當調節之處理液自循環流路供給至處理單元。 According to this method, in the circulation step, the treatment liquid in the storage tank is circulated through the circulation flow path. In the temperature adjustment step, the temperature of the processing liquid circulating in the circulation flow path is adjusted. Therefore, in the supplying step, the processing liquid whose temperature has been appropriately adjusted can be supplied from the circulation flow path to the processing unit.

返回步驟中,已供給至處理單元之處理液返回至循環流路,然後,返回至貯存槽。因此,與已供給至處理單元之處理液直接返回至貯存槽之構成相比,可將處理液流動 直至返回至循環流路的距離設定得較短。 In the returning step, the processing liquid that has been supplied to the processing unit is returned to the circulation flow path, and then returned to the storage tank. Therefore, compared with the configuration in which the processing liquid that has been supplied to the processing unit is directly returned to the storage tank, the distance that the processing liquid flows until it returns to the circulation flow path can be set shorter.

因此,於已中斷處理液對處理單元之供給之情形時,可減少處理單元與循環流路之間之部分所殘存的處理液之量。藉此,可抑制因在該部分被冷卻之處理液在處理液對處理單元之供給重新開始時回到貯存槽而將貯存槽內之處理液冷卻。其結果,即便在已中斷處理液對處理單元之供給之情形時,亦可抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the portion between the processing unit and the circulation flow path can be reduced. Thereby, it is possible to suppress cooling of the processing liquid in the storage tank due to the processing liquid cooled in this part being returned to the storage tank when the supply of the processing liquid to the processing unit is resumed. As a result, even when the supply of the processing liquid to the processing unit is interrupted, a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted can be suppressed.

根據本發明之另一實施形態,前述循環步驟中,處理液依序於:可供已供給至前述處理單元之處理液經由返回流路返回之分支部、自前述循環流路之上游側連接至前述分支部之上游流路、及自前述循環流路之下游側連接至前述分支部之下游流路中流動。因此,返回步驟中,已供給至處理單元之處理液通過返回流路、分支部及下游流路而返回至貯存槽。因此,與返回流路內之處理液直接返回至貯存槽之構成相比,可將處理液流經返回流路內之距離設定得較短。 According to another embodiment of the present invention, in the circulation step, the processing liquid is sequentially connected to a branch portion through which the processing liquid that has been supplied to the processing unit is returned through the return flow path, and is connected to the upstream side of the circulation flow path The upstream flow path of the branch part and the downstream flow path connected to the branch part from the downstream side of the circulation flow path flow. Therefore, in the return step, the processing liquid that has been supplied to the processing unit is returned to the storage tank through the return flow path, the branch portion, and the downstream flow path. Therefore, compared with the configuration in which the processing liquid in the return flow path is directly returned to the storage tank, the distance that the processing liquid flows through the return flow path can be set shorter.

根據本發明之另一實施形態,前述返回步驟中處理液流經前述返回流路內之距離較前述循環步驟中處理液流經前述下游流路內之距離短。因此,於已中斷處理液對處理單元之供給之情形時,可進一步減少殘存於返回流路內 之處理液之量。藉此,可進一步抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 According to another embodiment of the present invention, the distance that the processing liquid flows through the return flow path in the return step is shorter than the distance that the processing liquid flows through the downstream flow path in the circulation step. Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the return flow path can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted.

根據本發明之另一實施形態,前述循環流路包含設置於前述分支部之循環槽;前述循環槽包含連接有前述上游流路及前述返回流路之頂部、及連接有前述下游流路之底部。 According to another embodiment of the present invention, the circulation flow path includes a circulation groove provided in the branch portion; the circulation groove includes a top connected to the upstream flow path and the return flow path, and a bottom connected to the downstream flow path. .

根據該方法,在設置於分支部之循環槽之頂部連接有上游流路及返回流路。因此,自上游流路及返回流路供給至循環槽之處理液容易於循環槽內之底部移動。因此,自上游流路及返回流路供給至循環槽之處理液容易於連接於底部之下游流路流動。藉此,循環流路可使處理液順暢地循環。 According to this method, an upstream flow path and a return flow path are connected to the top of a circulation groove provided in the branch portion. Therefore, the processing liquid supplied to the circulation tank from the upstream flow path and the return flow path easily moves to the bottom in the circulation tank. Therefore, the processing liquid supplied to the circulation tank from the upstream flow path and the return flow path can easily flow in the downstream flow path connected to the bottom. Thereby, the circulation flow path can smoothly circulate the processing liquid.

根據本發明之另一實施形態,前述基板處理方法進而包括閥開閉步驟,上述閥開閉步驟維持使開閉前述下游流路之下游閥關閉之狀態直至前述循環槽內之處理液之量達到基準量為止,於前述循環槽內之處理液之量達到基準量時便打開前述下游閥。 According to another embodiment of the present invention, the substrate processing method further includes a valve opening and closing step, and the valve opening and closing step maintains a state in which a downstream valve that opens and closes the downstream flow path is closed until the amount of the processing liquid in the circulation tank reaches a reference amount. When the amount of the processing liquid in the circulation tank reaches a reference amount, the downstream valve is opened.

根據該方法,下游閥維持關閉狀態直至循環槽內之處理液之量達到基準量為止。下游閥於循環槽內之處理液之 量達到基準量時便被打開。因此,可防止循環槽內之處理液到達循環槽之頂部。因此,可有效果地防止循環槽內之處理液向返回流路逆流。 According to this method, the downstream valve is kept closed until the amount of the processing liquid in the circulation tank reaches the reference amount. The downstream valve is opened when the amount of processing liquid in the circulation tank reaches the reference amount. Therefore, the treatment liquid in the circulation tank can be prevented from reaching the top of the circulation tank. Therefore, it is possible to effectively prevent the processing liquid in the circulation tank from flowing backward to the return flow path.

根據本發明之另一實施形態,前述供給步驟包含自前述循環流路對複數個處理單元中之各個處理單元供給處理液之步驟;前述返回步驟包含將已供給至複數個處理單元中之各個處理單元的處理液經由前述返回流路而共通地供給至前述循環槽之步驟。 According to another embodiment of the present invention, the supplying step includes a step of supplying a processing liquid to each of the plurality of processing units from the circulation flow path, and the returning step includes supplying each of the processes to the plurality of processing units. The processing liquid of the unit is supplied to the circulation tank in common through the return flow path.

根據該方法,已自循環流路供給至複數個處理單元中之各個處理單元的處理液係經由返回流路共通地供給至循環槽。詳細而言,自循環流路對各個處理單元供給處理液,返回流路則自各個處理單元將處理液導引至循環槽。因此,無須針對每個處理單元設置循環槽。 According to this method, the processing liquid that has been supplied from the circulation flow path to each of the plurality of processing units is supplied to the circulation tank in common through the return flow path. Specifically, the processing liquid is supplied to each processing unit from the circulation flow path, and the processing liquid is guided to the circulation tank from each processing unit from the return flow path. Therefore, it is not necessary to provide a circulation tank for each processing unit.

根據本發明之另一實施形態,前述分支部配置於較前述處理單元所具備且收容前述基板之處理腔室靠下方處。因此,返回流路內之處理液容易朝向循環流路流動。因此,於已中斷處理液對處理單元之供給之情形時,可進一步減少殘存於返回流路內之處理液之量。藉此,可進一步抑制於處理液對處理單元之供給重新開始時供給至處理單元之處理液的溫度之變化。 According to another embodiment of the present invention, the branch portion is disposed below a processing chamber provided in the processing unit and containing the substrate. Therefore, the processing liquid in the return flow path easily flows toward the circulation flow path. Therefore, when the supply of the processing liquid to the processing unit is interrupted, the amount of the processing liquid remaining in the return flow path can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit when the supply of the processing liquid to the processing unit is restarted.

根據本發明之另一實施形態,前述分支部與前述返回流路一起收容於與前述處理腔室鄰接配置之流路盒。因此,可減小處理腔室與循環槽之距離。進而,可將返回流路設定得更短。 According to another embodiment of the present invention, the branch portion is stored in a flow path box disposed adjacent to the processing chamber together with the return flow path. Therefore, the distance between the processing chamber and the circulation tank can be reduced. Furthermore, the return flow path can be set shorter.

根據本發明之另一實施形態,前述基板處理方法進而包括切換步驟,上述切換步驟係將供給源之貯存槽與供給目標之貯存槽在複數個貯存槽中進行切換,以使前述供給源之前述貯存槽與前述供給目標之前述貯存槽為相同槽,且該前述供給源之前述貯存槽係對前述分支部或前述處理單元供給處理液,而前述供給目標之前述貯存槽係自前述分支部被供給處理液。 According to another embodiment of the present invention, the substrate processing method further includes a switching step. The switching step is to switch the storage tank of the supply source and the storage tank of the supply target in a plurality of storage tanks, so that the aforementioned The storage tank is the same tank as the storage tank of the supply target, and the storage tank of the supply source supplies the processing liquid to the branch portion or the processing unit, and the storage tank of the supply target is covered by the branch portion. Supply the processing liquid.

根據該方法,將供給目標之貯存槽在複數個貯存槽中進行切換,以使供給源之貯存槽與供給目標之貯存槽為相同槽。因此,可藉由循環流路使各貯存槽內之處理液循環而不會使各貯存槽內之處理液之量發生變化。因此,可於開始利用循環流路進行處理液之循環之前,針對每個貯存槽設定供給至處理單元之處理液的必要量。藉此,容易對貯存槽內之處理液之量進行管理。 According to this method, the storage tank of the supply target is switched among a plurality of storage tanks so that the storage tank of the supply source and the storage tank of the supply target are the same tank. Therefore, the processing liquid in each storage tank can be circulated through the circulation flow path without changing the amount of the processing liquid in each storage tank. Therefore, before starting the circulation of the processing liquid using the circulation flow path, the necessary amount of the processing liquid supplied to the processing unit can be set for each storage tank. This makes it easy to manage the amount of the processing liquid in the storage tank.

本發明中之上述或進而其他之目的、特徵及效果將參照隨附圖式並根據如下敘述之實施形態之說明而可知。 The above-mentioned or further other objects, features, and effects in the present invention will be known with reference to the accompanying drawings and the description of the embodiments described below.

1、1P、1Q‧‧‧基板處理裝置 1, 1P, 1Q‧‧‧‧ substrate processing equipment

2、2A‧‧‧處理單元 2, 2A‧‧‧ processing unit

3、3P、3Q‧‧‧處理液供給裝置 3, 3P, 3Q‧‧‧‧ treatment liquid supply device

4‧‧‧旋轉夾盤 4‧‧‧ rotating chuck

5‧‧‧處理液噴嘴 5‧‧‧ treatment liquid nozzle

6‧‧‧杯部 6‧‧‧ Cup

7‧‧‧處理腔室 7‧‧‧ treatment chamber

8‧‧‧流路盒 8‧‧‧flow box

10‧‧‧夾盤銷 10‧‧‧ chuck pin

11‧‧‧旋轉基底 11‧‧‧ rotating base

12‧‧‧基板旋轉單元 12‧‧‧ substrate rotation unit

13‧‧‧電動馬達 13‧‧‧ Electric motor

14‧‧‧控制器 14‧‧‧Controller

14A‧‧‧處理器 14A‧‧‧Processor

14B‧‧‧記憶體 14B‧‧‧Memory

20‧‧‧貯存槽 20‧‧‧Storage tank

20A‧‧‧第一貯存槽 20A‧‧‧First storage tank

20B‧‧‧第二貯存槽 20B‧‧‧Second Storage Tank

20C‧‧‧第三貯存槽 20C‧‧‧Third Storage Tank

21‧‧‧循環流路 21‧‧‧Circular flow path

22、22A‧‧‧供給流路 22, 22A‧‧‧ Supply flow path

23、23A‧‧‧返回流路 23, 23A‧‧‧ Return flow path

24‧‧‧供給閥 24‧‧‧Supply valve

25‧‧‧新液槽 25‧‧‧ new liquid tank

26‧‧‧新液流路 26‧‧‧New liquid flow path

26A‧‧‧第一新液流路 26A‧‧‧First new liquid flow path

26B‧‧‧第二新液流路 26B‧‧‧Second new liquid flow path

26C‧‧‧第三新液流路 26C‧‧‧The third new liquid flow path

27‧‧‧新液泵 27‧‧‧new liquid pump

28‧‧‧新液閥 28‧‧‧ new fluid valve

29A‧‧‧第一新液切換閥 29A‧‧‧The first new liquid switching valve

29B‧‧‧第二新液切換閥 29B‧‧‧Second new fluid switching valve

29C‧‧‧第三新液切換閥 29C‧‧‧Third new liquid switching valve

30‧‧‧分支部 30‧‧‧ Branch

31‧‧‧循環槽 31‧‧‧Circulation tank

31a‧‧‧頂部 31a‧‧‧Top

31b‧‧‧底部 31b‧‧‧ bottom

32‧‧‧液面感測器 32‧‧‧ level sensor

40‧‧‧上游流路 40‧‧‧ upstream flow path

40A‧‧‧第一上游流路 40A‧‧‧First upstream flow path

40B‧‧‧第二上游流路 40B‧‧‧Second upstream flow path

40C‧‧‧第三上游流路 40C‧‧‧The third upstream flow path

41‧‧‧上游泵 41‧‧‧upstream pump

41A‧‧‧第一上游泵 41A‧‧‧First upstream pump

41B‧‧‧第二上游泵 41B‧‧‧Second upstream pump

41C‧‧‧第三上游泵 41C‧‧‧The third upstream pump

42‧‧‧循環加熱器 42‧‧‧Circulation heater

42A‧‧‧第一循環加熱器 42A‧‧‧First cycle heater

42B‧‧‧第二循環加熱器 42B‧‧‧Second circulation heater

42C‧‧‧第三循環加熱器 42C‧‧‧Third circulation heater

43‧‧‧過濾器 43‧‧‧ Filter

43A‧‧‧第一過濾器 43A‧‧‧first filter

43B‧‧‧第二過濾器 43B‧‧‧Second filter

43C‧‧‧第三過濾器 43C‧‧‧Third filter

44‧‧‧上游閥 44‧‧‧upstream valve

45A‧‧‧第一上游切換閥 45A‧‧‧The first upstream switching valve

45B‧‧‧第二上游切換閥 45B‧‧‧Second upstream switching valve

45C‧‧‧第三上游切換閥 45C‧‧‧The third upstream switching valve

50‧‧‧下游流路 50‧‧‧ downstream flow path

50A‧‧‧第一下游流路 50A‧‧‧First downstream flow path

50B‧‧‧第二下游流路 50B‧‧‧Second downstream flow path

50C‧‧‧第三下游流路 50C‧‧‧The third downstream flow path

50a、50b‧‧‧連接部分 50a, 50b ‧‧‧ connecting part

51‧‧‧下游泵 51‧‧‧downstream pump

52‧‧‧下游閥 52‧‧‧downstream valve

53‧‧‧下游切換閥 53‧‧‧downstream switching valve

53A‧‧‧第一下游切換閥 53A‧‧‧First downstream switching valve

53B‧‧‧第二下游切換閥 53B‧‧‧Second downstream switching valve

53C‧‧‧第三下游切換閥 53C‧‧‧Third downstream switching valve

60‧‧‧補給流路 60‧‧‧Supply flow path

60A‧‧‧第一補給流路 60A‧‧‧The first supply flow path

60B‧‧‧第二補給流路 60B‧‧‧Second Supply Channel

61A‧‧‧第一補給泵 61A‧‧‧The first supply pump

61B‧‧‧第二補給泵 61B‧‧‧Second Supply Pump

62A‧‧‧第一補給加熱器 62A‧‧‧The first supply heater

62B‧‧‧第二補給加熱器 62B‧‧‧Second Supply Heater

63A‧‧‧第一補給過濾器 63A‧‧‧First Supply Filter

63B‧‧‧第二補給過濾器 63B‧‧‧Second Supply Filter

64A‧‧‧第一補給閥 64A‧‧‧The first supply valve

64B‧‧‧第二補給閥 64B‧‧‧Second Supply Valve

70‧‧‧回收流路 70‧‧‧ Recovery flow path

70A‧‧‧第一回收流路 70A‧‧‧The first recovery flow path

70B‧‧‧第二回收流路 70B‧‧‧Second recovery flow path

71A‧‧‧第一回收閥 71A‧‧‧The first recovery valve

71B‧‧‧第二回收閥 71B‧‧‧Second Recovery Valve

A‧‧‧循環方向 A‧‧‧Circulation direction

A1‧‧‧旋轉軸線 A1‧‧‧axis of rotation

D1、D2、D21、D22、D23‧‧‧距離 D1, D2, D21, D22, D23‧‧‧ distance

H1、L1‧‧‧第一基準高度 H1, L1‧‧‧ first reference height

H2、L2‧‧‧第二基準高度 H2, L2‧‧‧ second base height

t1至t8‧‧‧時刻 From t1 to t8‧‧‧

W‧‧‧基板 W‧‧‧ substrate

圖1係表示本發明之第一實施形態之基板處理裝置之構成之示意圖。 FIG. 1 is a schematic diagram showing a configuration of a substrate processing apparatus according to a first embodiment of the present invention.

圖2係用以說明前述基板處理裝置之主要部分之電性構成之方塊圖。 FIG. 2 is a block diagram for explaining the electrical configuration of the main part of the aforementioned substrate processing apparatus.

圖3A係用以說明藉由前述基板處理裝置進行之基板處理之一例之示意圖。 FIG. 3A is a schematic diagram illustrating an example of substrate processing performed by the aforementioned substrate processing apparatus.

圖3B係用以說明藉由前述基板處理裝置進行之基板處理之一例之示意圖。 FIG. 3B is a schematic diagram illustrating an example of substrate processing performed by the aforementioned substrate processing apparatus.

圖4A係表示基板處理中之循環槽之情況之示意圖。 FIG. 4A is a schematic view showing a state of a circulation tank in substrate processing.

圖4B係表示基板處理中之循環槽之情況之示意圖。 FIG. 4B is a schematic view showing a state of a circulating tank in substrate processing.

圖4C係表示基板處理中之循環槽之情況之示意圖。 FIG. 4C is a schematic view showing the condition of a circulating tank in substrate processing.

圖5係表示本發明之第二實施形態之基板處理裝置之構成之示意圖。 FIG. 5 is a schematic diagram showing a configuration of a substrate processing apparatus according to a second embodiment of the present invention.

圖6係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之時序圖。 FIG. 6 is a timing chart for explaining an example of substrate processing performed by the substrate processing apparatus of the second embodiment.

圖7A係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 FIG. 7A is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖7B係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 FIG. 7B is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖7C係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 7C is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖7D係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 7D is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖7E係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 7E is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖7F係用以說明藉由第二實施形態之基板處理裝置進行之基板處理之一例之示意圖。 7F is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the second embodiment.

圖8係表示本發明之第三實施形態之基板處理裝置之構成之示意圖。 FIG. 8 is a schematic diagram showing a configuration of a substrate processing apparatus according to a third embodiment of the present invention.

圖9係用以說明對第三實施形態之基板處理裝置中具備之處理單元之處理液供給之一例之時序圖。 FIG. 9 is a timing chart for explaining an example of supplying a processing liquid to a processing unit provided in the substrate processing apparatus of the third embodiment.

圖10A係用以說明藉由第三實施形態之基板處理裝置進行之基板處理之一例之示意圖。 FIG. 10A is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the third embodiment.

圖10B係用以說明藉由第三實施形態之基板處理裝置進行之基板處理之一例之示意圖。 FIG. 10B is a schematic diagram illustrating an example of substrate processing performed by the substrate processing apparatus according to the third embodiment.

圖10C係用以說明藉由第三實施形態之基板處理裝置進行之基板處理之一例之示意圖。 10C is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the third embodiment.

圖10D係用以說明藉由第三實施形態之基板處理裝置進行之基板處理之一例之示意圖。 10D is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the third embodiment.

圖10E係用以說明藉由第三實施形態之基板處理裝置進行之基板處理之一例之示意圖。 FIG. 10E is a schematic diagram for explaining an example of substrate processing performed by the substrate processing apparatus according to the third embodiment.

(第一實施形態) (First Embodiment)

圖1係表示本發明之第一實施形態之基板處理裝置1之構成之示意圖。基板處理裝置1包括利用處理液處理基板W之處理單元2、及對處理單元2供給處理液之處理 液供給裝置3。作為處理液,可列舉磷酸水溶液等藥液或純水(DIW:Deionized Water;去離子水)等清洗液。 FIG. 1 is a schematic diagram showing the configuration of a substrate processing apparatus 1 according to a first embodiment of the present invention. The substrate processing apparatus 1 includes a processing unit 2 that processes a substrate W with a processing liquid, and a processing liquid supply apparatus 3 that supplies a processing liquid to the processing unit 2. Examples of the treatment liquid include a chemical liquid such as a phosphoric acid aqueous solution or a cleaning liquid such as pure water (DIW: Deionized Water).

作為磷酸水溶液以外之藥液,例如可使用緩衝氟酸(BHF)、稀氟酸(DHF)、氟酸(氟化氫水:HF)、鹽酸、硫酸、硝酸、醋酸、草酸或氨水等水溶液或者該等之混合溶液。作為混合溶液,例如可使用硫酸與過氧化氫水之混合液(SPM)、氨與過氧化氫水之混合溶液(SC1)或鹽酸與過氧化氫水之混合液(SC2)。 As the chemical solution other than the phosphoric acid aqueous solution, for example, buffered hydrofluoric acid (BHF), difluoric acid (DHF), hydrofluoric acid (hydrogen fluoride water: HF), hydrochloric acid, sulfuric acid, nitric acid, acetic acid, oxalic acid, or ammonia water or the like Of mixed solution. As the mixed solution, for example, a mixed solution of sulfuric acid and hydrogen peroxide (SPM), a mixed solution of ammonia and hydrogen peroxide (SC1), or a mixed solution of hydrochloric acid and hydrogen peroxide (SC2) can be used.

作為DIW以外之清洗液,可使用碳酸水、電解離子水、臭氧水、稀釋濃度(例如10ppm至100ppm左右)之鹽酸水、還原水(氫水)等。 As the cleaning liquid other than DIW, carbonated water, electrolytic ion water, ozone water, hydrochloric acid water with a diluted concentration (for example, about 10 ppm to 100 ppm), reduced water (hydrogen water), and the like can be used.

處理單元2包括使基板W繞通過基板W之中央部之鉛直之旋轉軸線A1旋轉之旋轉夾盤4、對基板W之上表面(上方之主面)供給處理液之處理液噴嘴5、及包圍旋轉夾盤4之杯部(cup)6。杯部6具有向上打開之環狀之槽。 The processing unit 2 includes a rotary chuck 4 that rotates the substrate W about a vertical rotation axis A1 passing through a central portion of the substrate W, a processing liquid nozzle 5 that supplies a processing liquid to the upper surface (the main surface above) of the substrate W, and surrounds The cup 6 of the chuck 4 is rotated. The cup portion 6 has an annular groove opened upward.

處理單元2進而包括收容旋轉夾盤4、處理液噴嘴5及杯部6之處理腔室7。處理腔室7中形成有出入口(未圖示),該出入口用於將基板W向處理腔室7內搬入或自處理腔室7內搬出。處理腔室7中具備將該出入口開閉之擋門單元(未圖示)。基板W經由該出入口收容於處理腔 室7內。而且,已收容於處理腔室7內之基板W保持於旋轉夾盤4。 The processing unit 2 further includes a processing chamber 7 accommodating the rotary chuck 4, the processing liquid nozzle 5, and the cup portion 6. An entrance (not shown) is formed in the processing chamber 7 and is used to carry the substrate W into or out of the processing chamber 7. The processing chamber 7 includes a door blocking unit (not shown) that opens and closes the doorway. The substrate W is housed in the processing chamber 7 through the entrance / exit. The substrate W that has been accommodated in the processing chamber 7 is held on the spin chuck 4.

旋轉夾盤4包含複數個夾盤銷10、旋轉基底11、及基板旋轉單元12。旋轉基底11具有沿著水平方向之圓盤形狀。於旋轉基底11之上表面之周緣部,於周方向上隔開間隔配置有複數個夾盤銷10。基板W由複數個夾盤銷10保持為大致水平。基板旋轉單元12包含結合於旋轉基底11之下表面中央之旋轉軸、及對該旋轉軸施加旋轉力之電動馬達。該旋轉軸沿著旋轉軸線A1而於鉛直方向上延伸。基板旋轉單元12藉由使旋轉基底11旋轉而使基板W繞旋轉軸線A1旋轉。 The rotating chuck 4 includes a plurality of chuck pins 10, a rotating base 11, and a substrate rotating unit 12. The rotating base 11 has a disc shape along a horizontal direction. A plurality of chuck pins 10 are arranged on the peripheral edge portion of the upper surface of the rotating base 11 at intervals in the circumferential direction. The substrate W is held substantially horizontally by a plurality of chuck pins 10. The substrate rotating unit 12 includes a rotating shaft coupled to the center of the lower surface of the rotating base 11 and an electric motor that applies a rotating force to the rotating shaft. This rotation axis extends in the vertical direction along the rotation axis A1. The substrate rotation unit 12 rotates the rotation base 11 to rotate the substrate W about the rotation axis A1.

處理液供給裝置3包含貯存處理液之貯存槽20、使貯存槽20內之處理液循環之循環流路21、自循環流路21對處理單元2供給處理液之供給流路22、及使已供給至處理單元2之處理液返回至循環流路21之返回流路23。 The processing liquid supply device 3 includes a storage tank 20 that stores the processing liquid, a circulation flow path 21 that circulates the processing liquid in the storage tank 20, a supply flow path 22 that supplies the processing liquid from the circulation flow path 21 to the processing unit 2, and a The processing liquid supplied to the processing unit 2 is returned to the return flow path 23 of the circulation flow path 21.

循環流路21包含連接有返回流路23之分支部30、自循環流路21之上游側連接至分支部30之上游流路40、自循環流路21之下游側連接至分支部30之下游流路50。循環流路21之上游側係指處理液流經循環流路21之方向(循環方向A)之上游側。循環流路21之下游側係指循環方向A之下游側。上游流路40及下游流路50分 別例如由配管形成。 The circulation flow path 21 includes a branch part 30 connected to the return flow path 23, an upstream flow path 40 connected to the branch part 30 from the upstream side of the circulation flow path 21, and a downstream connection to the branch part 30 from the downstream side of the circulation flow path 21. Flow path 50. The upstream side of the circulation flow path 21 means the upstream side in the direction (circulation direction A) in which the processing liquid flows through the circulation flow path 21. The downstream side of the circulation flow path 21 means the downstream side of the circulation direction A. The upstream flow path 40 and the downstream flow path 50 are each formed of a pipe, for example.

循環流路21進而包含設置於分支部30之循環槽31。循環槽31包含形成循環槽31之上端部之頂部31a、及形成循環槽31之下端部之底部31b。循環槽31可自下方將處理液積存於其內部。循環槽31中設置有對循環槽31內之處理液之液面之高度進行偵測之液面感測器32。 The circulation flow path 21 further includes a circulation groove 31 provided in the branch portion 30. The circulation groove 31 includes a top portion 31 a forming an upper end portion of the circulation groove 31 and a bottom portion 31 b forming a lower end portion of the circulation groove 31. The circulation tank 31 can accumulate the processing liquid in the inside from below. The circulation tank 31 is provided with a liquid level sensor 32 that detects the height of the liquid surface of the processing liquid in the circulation tank 31.

上游流路40之上游端部連接於貯存槽20。上游流路40之下游端部連接於循環槽31之頂部31a。下游流路50之上游端部連接於循環槽31之底部31b。下游流路50之下游端部連接於貯存槽20。 An upstream end portion of the upstream flow path 40 is connected to the storage tank 20. A downstream end portion of the upstream flow path 40 is connected to a top portion 31 a of the circulation tank 31. An upstream end portion of the downstream flow path 50 is connected to a bottom portion 31 b of the circulation tank 31. The downstream end of the downstream flow path 50 is connected to the storage tank 20.

處理液供給裝置3包含:將上游流路40內之處理液向下游側送出之上游泵41,對上游流路40內之處理液進行加熱之循環加熱器42,對上游流路40內之處理液進行過濾之過濾器43,及將上游流路40開閉之上游閥44。上游泵41、循環加熱器42、過濾器43及上游閥44自上游側起依序介設於上游流路40。 The processing liquid supply device 3 includes an upstream pump 41 that sends the processing liquid in the upstream flow path 40 to the downstream side, a circulation heater 42 for heating the processing liquid in the upstream flow path 40, and a processing in the upstream flow path 40 A filter 43 for filtering the liquid, and an upstream valve 44 that opens and closes the upstream flow path 40. The upstream pump 41, the circulation heater 42, the filter 43, and the upstream valve 44 are sequentially provided in the upstream flow path 40 from the upstream side.

處理液供給裝置3包含將下游流路50內之處理液向下游側送出之下游泵51、及將下游流路50開閉之下游閥52。下游泵51及下游閥52自上游側起依序介設於下游流路50。 The processing liquid supply device 3 includes a downstream pump 51 that sends the processing liquid in the downstream flow path 50 to the downstream side, and a downstream valve 52 that opens and closes the downstream flow path 50. The downstream pump 51 and the downstream valve 52 are sequentially disposed in the downstream flow path 50 from the upstream side.

供給流路22例如由配管形成。供給流路22之上游端部於過濾器43與上游閥44之間連接於上游流路40。供給流路22之下游端部連接於處理液噴嘴5。處理液供給裝置3進而包含介設於供給流路22而用以開閉供給流路22之供給閥24。 The supply flow path 22 is formed by a pipe, for example. The upstream end of the supply flow path 22 is connected to the upstream flow path 40 between the filter 43 and the upstream valve 44. A downstream end portion of the supply flow path 22 is connected to the processing liquid nozzle 5. The processing liquid supply device 3 further includes a supply valve 24 interposed in the supply flow path 22 to open and close the supply flow path 22.

返回流路23例如由配管形成。返回流路23之上游端部連接於杯部6之底部。返回流路23之下游端部連接於循環槽31之頂部31a。返回流路23之長度較下游流路50之長度短。 The return flow path 23 is formed by a pipe, for example. An upstream end portion of the return flow path 23 is connected to the bottom of the cup portion 6. A downstream end portion of the return flow path 23 is connected to the top portion 31 a of the circulation tank 31. The length of the return flow path 23 is shorter than the length of the downstream flow path 50.

處理單元2包含至少收容返回流路23及分支部30(循環槽31)之流路盒8。本實施形態中,流路盒8中,除返回流路23及分支部30(循環槽31)之外,亦收容有供給閥24及下游泵51。而且,流路盒8中收容供給流路22、上游流路40及下游流路50之一部分。流路盒8與處理腔室7鄰接配置。分支部30(循環槽31)係於流路盒8內位於較處理腔室7靠下方處。 The processing unit 2 includes a flow path box 8 accommodating at least the return flow path 23 and the branch portion 30 (circulation tank 31). In the present embodiment, in addition to the return flow path 23 and the branch portion 30 (circulation tank 31), the flow path box 8 also contains a supply valve 24 and a downstream pump 51. The flow path box 8 houses a part of the supply flow path 22, the upstream flow path 40, and the downstream flow path 50. The flow path box 8 is disposed adjacent to the processing chamber 7. The branch portion 30 (the circulation tank 31) is located in the flow path box 8 and is located below the processing chamber 7.

處理液供給裝置3包含貯存基板處理中未被使用之(尚未使用)處理液之新液槽25、連接於新液槽25與貯存槽20之新液流路26、及介置於新液流路26之新液泵27及新液閥28。 The processing liquid supply device 3 includes a new liquid tank 25 that stores unused (unused) processing liquid during substrate processing, a new liquid flow path 26 connected to the new liquid tank 25 and the storage tank 20, and a new liquid flow interposed therebetween The new liquid pump 27 and the new liquid valve 28 of the road 26.

圖2係用以說明基板處理裝置1之主要部分之電性構成之方塊圖。基板處理裝置1包含控制基板處理裝置1之控制器14。控制器14具備微電腦,依據預定之程式對基板處理裝置1中具備之控制對象進行控制。更具體而言,控制器14包含處理器(CPU(Central Processing Unit;中央處理單元))14A、及儲存程式之記憶體14B。控制器14構成為藉由處理器14A執行程式,而執行用於基板處理之各種控制。控制器14特別是對電動馬達13、循環加熱器42、泵類27、41、51、閥類24、28、44、52及液面感測器32等之動作進行控制。 FIG. 2 is a block diagram for explaining the electrical configuration of the main part of the substrate processing apparatus 1. The substrate processing apparatus 1 includes a controller 14 that controls the substrate processing apparatus 1. The controller 14 includes a microcomputer, and controls a control target provided in the substrate processing apparatus 1 according to a predetermined program. More specifically, the controller 14 includes a processor (CPU (Central Processing Unit)) 14A and a memory 14B that stores programs. The controller 14 is configured to execute various controls for substrate processing by the processor 14A executing a program. The controller 14 controls operations of the electric motor 13, the circulation heater 42, the pumps 27, 41, 51, the valves 24, 28, 44, 52, and the liquid level sensor 32.

圖3A及圖3B係用以說明由基板處理裝置1進行之基板處理之一例之示意圖。由基板處理裝置1進行之基板處理主要藉由控制器14執行程式而實現。於開始進行基板處理之前,閥24、28、44、52全部被關閉。 3A and 3B are schematic diagrams for explaining an example of substrate processing performed by the substrate processing apparatus 1. The substrate processing performed by the substrate processing apparatus 1 is mainly realized by the controller 14 executing a program. Before the substrate processing is started, the valves 24, 28, 44, 52 are all closed.

參照圖3A,基板處理中,首先,未處理之基板W保持於旋轉夾盤4。然後,執行使貯存槽20內之處理液於循環流路21循環之循環步驟。詳細而言,打開上游閥44。另一方面,供給閥24維持關閉狀態。然後,上游泵41抽吸貯存槽20內之處理液。藉此,自貯存槽20向上游流路40供給處理液。然後,循環加熱器42對上游流路40內之處理液進行加熱。流經上游流路40內之處理液被過 濾器43過濾。藉此,自流經上游流路40之處理液中除去析出物等。流經上游流路40之處理液被供給至較上游流路40靠下游側之循環槽31。 Referring to FIG. 3A, in the substrate processing, first, the unprocessed substrate W is held on the spin chuck 4. Then, a circulation step of circulating the treatment liquid in the storage tank 20 through the circulation flow path 21 is performed. Specifically, the upstream valve 44 is opened. On the other hand, the supply valve 24 is maintained in a closed state. Then, the upstream pump 41 sucks the processing liquid in the storage tank 20. Thereby, the processing liquid is supplied from the storage tank 20 to the upstream flow path 40. Then, the circulation heater 42 heats the processing liquid in the upstream flow path 40. The treatment liquid flowing through the upstream flow path 40 is filtered by a filter 43. Thereby, precipitates and the like are removed from the processing liquid flowing through the upstream flow path 40. The processing liquid flowing through the upstream flow path 40 is supplied to the circulation tank 31 on the downstream side from the upstream flow path 40.

然後,於下游閥52被打開之狀態下,下游泵51抽吸循環槽31內之處理液。藉此,自循環槽31對下游流路50供給處理液。流經下游流路50之處理液被輸送至貯存槽20。如此,已自貯存槽20送出至上游流路40之處理液經由下游流路50回到貯存槽20。即,貯存槽20內之處理液藉由循環流路21而循環。將藉由循環流路21使貯存槽20內之處理液循環稱作液循環。液循環時,利用循環加熱器42對上游流路40內之處理液進行加熱,藉此調整循環流路21內之處理液之溫度(溫度調節步驟)。循環加熱器42作為對循環流路21內之處理液之溫度進行調整之溫度調節單元發揮功能。 Then, in a state where the downstream valve 52 is opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31. Thereby, the processing liquid is supplied to the downstream flow path 50 from the circulation tank 31. The treatment liquid flowing through the downstream flow path 50 is sent to the storage tank 20. In this way, the processing liquid that has been sent from the storage tank 20 to the upstream flow path 40 returns to the storage tank 20 through the downstream flow path 50. That is, the processing liquid in the storage tank 20 is circulated through the circulation flow path 21. The circulation of the processing liquid in the storage tank 20 through the circulation flow path 21 is referred to as a liquid circulation. When the liquid is circulated, the circulation heater 42 is used to heat the treatment liquid in the upstream flow path 40 to adjust the temperature of the treatment liquid in the circulation flow path 21 (temperature adjustment step). The circulation heater 42 functions as a temperature adjustment unit that adjusts the temperature of the processing liquid in the circulation flow path 21.

參照圖3B,於溫度調節步驟開始後,執行自循環流路21對處理單元2供給處理液之供給步驟。詳細而言,打開供給閥24。另一方面,關閉上游閥44。藉此,流經上游流路40之處理液經由供給流路22供給至處理液噴嘴5。已供給至處理液噴嘴5之處理液朝向保持於旋轉夾盤4之基板W之上表面吐出。 Referring to FIG. 3B, after the temperature adjustment step is started, a supply step of supplying the processing liquid from the circulation flow path 21 to the processing unit 2 is performed. Specifically, the supply valve 24 is opened. On the other hand, the upstream valve 44 is closed. Thereby, the processing liquid flowing through the upstream flow path 40 is supplied to the processing liquid nozzle 5 through the supply flow path 22. The processing liquid supplied to the processing liquid nozzle 5 is discharged toward the upper surface of the substrate W held on the spin chuck 4.

於開始向基板W之上表面供給處理液之前,利用旋 轉夾盤4開始基板W繞旋轉軸線A1之旋轉。已接觸於基板W之上表面之處理液因離心力而遍佈於基板W之整個上表面。藉此,基板W之上表面利用處理液而受到處理。如此,將自貯存槽20對處理單元2供給處理液稱作液供給。 Before the supply of the processing liquid to the upper surface of the substrate W is started, the rotation of the substrate W about the rotation axis A1 is started by the spin chuck 4. The processing liquid that has contacted the upper surface of the substrate W is spread over the entire upper surface of the substrate W due to the centrifugal force. Thereby, the upper surface of the substrate W is processed with the processing liquid. In this manner, the supply of the processing liquid from the storage tank 20 to the processing unit 2 is referred to as a liquid supply.

基板W之上表面之處理液因離心力而向基板W外飛散。已向基板W外飛散之處理液被杯部6接住。已由杯部6接住之處理液流經返回流路23內,並自返回流路23返回至循環槽31。如此,已於供給步驟中供給至處理單元2之處理液返回至循環流路21(返回步驟)。 The processing liquid on the upper surface of the substrate W is scattered outside the substrate W due to the centrifugal force. The processing liquid which has scattered outside the substrate W is caught by the cup portion 6. The processing liquid that has been caught by the cup portion 6 flows through the return flow path 23 and returns from the return flow path 23 to the circulation tank 31. In this way, the processing liquid that has been supplied to the processing unit 2 in the supply step is returned to the circulation flow path 21 (return step).

於下游閥52被打開之狀態下,下游泵51抽吸循環槽31內之處理液。藉此,循環槽31內之處理液經由下游流路50輸送至貯存槽20。如此,已供給至處理單元2之處理液回到貯存槽20。將自處理單元2對貯存槽20輸送處理液稱作液回收。 In a state where the downstream valve 52 is opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31. Thereby, the processing liquid in the circulation tank 31 is transported to the storage tank 20 through the downstream flow path 50. In this way, the processing liquid that has been supplied to the processing unit 2 is returned to the storage tank 20. The transfer of the processing liquid from the processing unit 2 to the storage tank 20 is referred to as liquid recovery.

如前述般,返回流路23之長度較下游流路50之長度短。因此,處理液流經返回流路23內之距離D1較處理液流經下游流路50內之距離D2小。 As described above, the length of the return flow path 23 is shorter than the length of the downstream flow path 50. Therefore, the distance D1 in which the processing liquid flows through the return flow path 23 is smaller than the distance D2 in which the processing liquid flows through the downstream flow path 50.

亦可與本實施形態不同,在供給步驟及返回步驟中,上游閥44可被打開。該情形時,循環步驟係與供給步驟 及返回步驟並行地執行。 Unlike the present embodiment, the upstream valve 44 may be opened in the supplying step and the returning step. In this case, the loop step is performed in parallel with the supply step and the return step.

在此,單片式基板處理裝置1中,無法將基板W之處理中使用之處理液全部回收。因此,貯存槽20內之液面高度逐漸降低。若貯存槽20內之處理液之液面低於預定之高度,則新液閥28被打開且新液泵27作動,藉此,可經由新液流路26自新液槽25對貯存槽20供給處理液。藉此,可將處理液供給裝置3內之處理液之量保持為預定量以上。亦可藉由利用新液槽25進行之新的處理液之供給,而調整貯存槽20內之處理液之濃度。 Here, in the monolithic substrate processing apparatus 1, it is impossible to recover all the processing liquids used in the processing of the substrate W. Therefore, the height of the liquid surface in the storage tank 20 gradually decreases. If the liquid level of the processing liquid in the storage tank 20 is lower than a predetermined height, the new liquid valve 28 is opened and the new liquid pump 27 is operated, whereby the storage tank 20 can be accessed from the new liquid tank 25 through the new liquid flow path 26. Supply the processing liquid. Thereby, the amount of the processing liquid in the processing liquid supply device 3 can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the storage tank 20 by supplying a new processing liquid using the new liquid tank 25.

圖4A至圖4C係表示基板處理中之循環槽31之情況之示意圖。 4A to 4C are schematic views showing a state of the circulation tank 31 in the substrate processing.

基板處理中,下游閥52根據循環槽31內之處理液之量而開閉。本實施形態中,循環槽31內之處理液之量係根據循環槽31內之處理液之液面之高度而判斷。 In the substrate processing, the downstream valve 52 is opened and closed according to the amount of the processing liquid in the circulation tank 31. In this embodiment, the amount of the processing liquid in the circulation tank 31 is determined based on the height of the liquid level of the processing liquid in the circulation tank 31.

具體而言,參照圖4A,若液面感測器32(參照圖1)偵測到循環槽31內之處理液之液面之高度低於預定之第一基準高度L1,則控制器14關閉下游閥52。該狀態下,自上游流路40或返回流路23對循環槽31供給處理液,藉此,循環槽31內之處理液之液面上升。圖4A至圖4C中表示自上游流路40對循環槽31供給處理液之示例。 Specifically, referring to FIG. 4A, if the liquid level sensor 32 (refer to FIG. 1) detects that the height of the liquid level of the processing liquid in the circulation tank 31 is lower than the predetermined first reference height L1, the controller 14 is turned off. Descending valve 52. In this state, the processing liquid is supplied to the circulation tank 31 from the upstream flow path 40 or the return flow path 23, whereby the liquid level of the processing liquid in the circulation tank 31 rises. 4A to 4C show examples in which the processing liquid is supplied to the circulation tank 31 from the upstream flow path 40.

如圖4B所示,若液面感測器32(參照圖1)偵測到循環槽31內之處理液之液面之高度達到第一基準高度L1,則控制器14打開下游閥52。藉此,循環槽31內之處理液被輸送至下游流路50,循環槽31內之處理液之液面之高度低於第一基準高度L1。 As shown in FIG. 4B, if the liquid level sensor 32 (refer to FIG. 1) detects that the height of the liquid level of the processing liquid in the circulation tank 31 reaches the first reference height L1, the controller 14 opens the downstream valve 52. Thereby, the processing liquid in the circulation tank 31 is transported to the downstream flow path 50, and the liquid level of the processing liquid in the circulation tank 31 is lower than the first reference height L1.

然後,如圖4C所示,若液面感測器32偵測到循環槽31內之處理液之液面之高度低於第二基準高度L2,則控制器14再次關閉下游閥52。第二基準高度L2設定於較第一基準高度L1低之位置。藉此,因處理液積存於循環槽31,而循環槽31內之處理液之液面再次上升。 Then, as shown in FIG. 4C, if the liquid level sensor 32 detects that the height of the liquid level of the processing liquid in the circulation tank 31 is lower than the second reference height L2, the controller 14 closes the downstream valve 52 again. The second reference height L2 is set at a position lower than the first reference height L1. Thereby, since the processing liquid is accumulated in the circulation tank 31, the liquid level of the processing liquid in the circulation tank 31 rises again.

如此,控制器14作為閥開閉單元發揮功能,該閥開閉單元維持著關閉下游閥52之狀態直至循環槽31內之處理液之量達到基準量(第一基準高度L1)為止,於循環槽31內之處理液之量達到基準量(第一基準高度L1)時便打開下游閥52。 In this way, the controller 14 functions as a valve opening and closing unit, which maintains the state of closing the downstream valve 52 until the amount of the processing liquid in the circulation tank 31 reaches the reference amount (the first reference height L1), in the circulation tank 31 The downstream valve 52 is opened when the amount of the processing liquid therein reaches the reference amount (the first reference height L1).

根據第一實施形態,循環步驟中,貯存槽20內之處理液藉由循環流路21而循環。溫度調節步驟中,於循環流路21循環之處理液之溫度藉由循環加熱器42而調節。因此,供給步驟中,供給流路22可將溫度已得到適當調節之處理液自循環流路21供給至處理單元2。 According to the first embodiment, in the circulation step, the processing liquid in the storage tank 20 is circulated through the circulation flow path 21. In the temperature adjustment step, the temperature of the processing liquid circulating in the circulation flow path 21 is adjusted by the circulation heater 42. Therefore, in the supply step, the supply flow path 22 can supply the processing liquid whose temperature has been appropriately adjusted from the circulation flow path 21 to the processing unit 2.

返回步驟中,已供給至處理單元2之處理液經由返回流路23返回至循環流路21。循環流路21例如包含連接有返回流路23之分支部30、自循環流路21之上游側連接至分支部之上游流路40、及自循環流路21之下游側連接至分支部30之下游流路50。 In the returning step, the processing liquid that has been supplied to the processing unit 2 is returned to the circulation flow path 21 through the return flow path 23. The circulation flow path 21 includes, for example, a branch part 30 connected to the return flow path 23, an upstream flow path 40 connected to the branch part from the upstream side of the circulation flow path 21, and a branch part 30 connected to the downstream side from the circulation flow path 21 Downstream flow path 50.

已供給至處理單元2之處理液通過返回流路23、分支部30及下游流路50而返回至貯存槽20。因此,與返回流路23內之處理液直接返回至貯存槽20之構成相比,可將處理液流經返回流路23內之距離D1設定得較短。 The processing liquid supplied to the processing unit 2 is returned to the storage tank 20 through the return flow path 23, the branch portion 30, and the downstream flow path 50. Therefore, compared with the configuration in which the processing liquid in the return flow path 23 is directly returned to the storage tank 20, the distance D1 through which the processing liquid flows in the return flow path 23 can be set shorter.

因此,於因貯存槽20之更換等而中斷處理液對處理單元2之供給之情形時,可減少殘存於返回流路23內之處理液之量。藉此,可抑制因處理液對處理單元2之供給重新開始時已於返回流路23內冷卻之處理液回到貯存槽20而貯存槽20內之處理液被冷卻。其結果,即便於已中斷處理液對處理單元2之供給之情形時,亦可抑制於處理液對處理單元2之供給之重新開始時供給至處理單元2之處理液的溫度之變化。 Therefore, when the supply of the processing liquid to the processing unit 2 is interrupted due to the replacement of the storage tank 20 or the like, the amount of the processing liquid remaining in the return flow path 23 can be reduced. This can prevent the processing liquid in the storage tank 20 from being cooled when the processing liquid that has been cooled in the return flow path 23 when the supply of the processing liquid to the processing unit 2 is restarted, is cooled. As a result, even when the supply of the processing liquid to the processing unit 2 is interrupted, a change in the temperature of the processing liquid supplied to the processing unit 2 when the supply of the processing liquid to the processing unit 2 is resumed can be suppressed.

根據第一實施形態,處理液流經返回流路23內之距離D1較處理液流經下游流路50內之距離D2短。因此,於已中斷處理液對處理單元2之供給之情形時,可進一步 減少殘存於返回流路23內之處理液之量。藉此,可進一步抑制於處理液對處理單元2之供給之重新開始時供給至處理單元2之處理液的溫度之變化。 According to the first embodiment, the distance D1 through which the processing liquid flows through the return flow path 23 is shorter than the distance D2 through which the processing liquid flows through the downstream flow path 50. Therefore, when the supply of the processing liquid to the processing unit 2 has been interrupted, the amount of the processing liquid remaining in the return flow path 23 can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit 2 when the supply of the processing liquid to the processing unit 2 is resumed.

根據第一實施形態,於設置於分支部30之循環槽31之頂部31a連接有上游流路40及返回流路23。因此,已自上游流路40及返回流路23供給至循環槽31之處理液容易於循環槽31內之底部31b移動。因此,自上游流路40及返回流路23供給至循環槽31之處理液容易於連接於底部31b之下游流路50流動。藉此,循環流路21可使處理液順暢地循環。 According to the first embodiment, the upstream flow path 40 and the return flow path 23 are connected to the top portion 31 a of the circulation groove 31 provided in the branch portion 30. Therefore, the processing liquid that has been supplied to the circulation tank 31 from the upstream flow path 40 and the return flow path 23 easily moves at the bottom portion 31 b in the circulation tank 31. Therefore, the processing liquid supplied to the circulation tank 31 from the upstream flow path 40 and the return flow path 23 flows easily in the downstream flow path 50 connected to the bottom 31b. Thereby, the circulation flow path 21 can smoothly circulate the processing liquid.

於對循環槽31內供給處理液時,循環槽31內之處理液之液面自底部31b側朝向頂部31a側上升。因此,容易於返回流路23與處理液之液面之間設置間隔。因此,防止因循環槽31內之處理液到達頂部31a而循環槽31內之處理液向返回流路23逆流。 When the processing liquid is supplied into the circulation tank 31, the liquid level of the processing liquid in the circulation tank 31 rises from the bottom 31b side toward the top 31a side. Therefore, it is easy to provide a space between the return flow path 23 and the liquid surface of the processing liquid. Therefore, the processing liquid in the circulation tank 31 is prevented from flowing back to the return flow path 23 because the processing liquid in the circulation tank 31 reaches the top portion 31 a.

根據第一實施形態,下游閥52維持關閉之狀態直至循環槽31內之處理液之量達到基準量(第一基準高度L1)。下游閥52於循環槽31內之處理液之量達到基準量(第一基準高度L1)時被打開(閥開閉步驟)。因此,可防止循環槽31內之處理液到達循環槽31之頂部31a。因此,可有效果地防止循環槽31內之處理液向返回流路23逆 流。 According to the first embodiment, the downstream valve 52 is kept closed until the amount of the processing liquid in the circulation tank 31 reaches a reference amount (first reference height L1). The downstream valve 52 is opened when the amount of the processing liquid in the circulation tank 31 reaches the reference amount (the first reference height L1) (the valve opening and closing step). Therefore, the processing liquid in the circulation tank 31 can be prevented from reaching the top portion 31 a of the circulation tank 31. Therefore, it is possible to effectively prevent the processing liquid in the circulation tank 31 from flowing back to the return flow path 23.

根據第一實施形態,循環槽31配置於較收容基板W之處理腔室7靠下方處。因此,與配置於處理腔室7內之杯部6及循環流路21所包含之循環槽31連接的返回流路23內之處理液容易朝向循環流路21流動。因此,於已中斷處理液對處理單元2之供給之情形時,可進一步減少殘存於返回流路23內之處理液之量。藉此,可進一步抑制於處理液對處理單元2之供給之重新開始時供給至處理單元2之處理液的溫度之變化。 According to the first embodiment, the circulation tank 31 is disposed below the processing chamber 7 that houses the substrate W. Therefore, the processing liquid in the return flow path 23 connected to the cup portion 6 disposed in the processing chamber 7 and the circulation groove 31 included in the circulation flow path 21 easily flows toward the circulation flow path 21. Therefore, when the supply of the processing liquid to the processing unit 2 has been interrupted, the amount of the processing liquid remaining in the return flow path 23 can be further reduced. This can further suppress a change in the temperature of the processing liquid supplied to the processing unit 2 when the supply of the processing liquid to the processing unit 2 is resumed.

根據第一實施形態,返回流路23及循環槽31收容於與處理腔室7鄰接配置之流路盒8。因此,可減少處理腔室7與循環槽31之距離。進而,可將返回流路23(處理液流經返回流路23內之距離D1)設定得更短。 According to the first embodiment, the return flow path 23 and the circulation tank 31 are accommodated in a flow path box 8 disposed adjacent to the processing chamber 7. Therefore, the distance between the processing chamber 7 and the circulation tank 31 can be reduced. Furthermore, the return flow path 23 (the distance D1 through which the processing liquid flows through the return flow path 23) can be set shorter.

圖5係表示本發明之第二實施形態之基板處理裝置1P之構成之示意圖。圖5中,對於至此所說明之構件相同之構件附上相同之參照符號,並省略其說明(後述圖6及圖7A至圖7F亦同樣)。 FIG. 5 is a schematic diagram showing a configuration of a substrate processing apparatus 1P according to a second embodiment of the present invention. In FIG. 5, the same reference numerals are attached to the same components as explained so far, and the description is omitted (the same applies to FIGS. 6 and 7A to 7F described later).

基板處理裝置1P與第一實施形態之基板處理裝置1主要不同點在於處理液供給裝置3P包含複數個貯存槽20。複數個貯存槽20中包含第一貯存槽20A、第二貯存 槽20B及第三貯存槽20C。基板處理裝置1P中具備之各構件之構成於以下說明之方面與第一實施形態之基板處理裝置1中具備之各構件之構成不同。 The main difference between the substrate processing apparatus 1P and the substrate processing apparatus 1 of the first embodiment is that the processing liquid supply apparatus 3P includes a plurality of storage tanks 20. The plurality of storage tanks 20 include a first storage tank 20A, a second storage tank 20B, and a third storage tank 20C. The configuration of each member provided in the substrate processing apparatus 1P is different from the configuration of each member provided in the substrate processing apparatus 1 of the first embodiment in the points described below.

第二實施形態之循環流路21可使各貯存槽20A至貯存槽20C內之處理液循環。 The circulation flow path 21 of the second embodiment can circulate the processing liquid in each of the storage tanks 20A to 20C.

第二實施形態之上游流路40包含第一上游流路40A、第二上游流路40B及第三上游流路40C。 The upstream flow path 40 of the second embodiment includes a first upstream flow path 40A, a second upstream flow path 40B, and a third upstream flow path 40C.

第一上游流路40A之上游端部連接於第一貯存槽20A。第一上游流路40A之下游端部連接於循環槽31之頂部31a。 An upstream end portion of the first upstream flow path 40A is connected to the first storage tank 20A. A downstream end portion of the first upstream flow path 40A is connected to a top portion 31 a of the circulation tank 31.

處理液供給裝置3P包含:將第一上游流路40A內之處理液向下游側送出之第一上游泵41A,對第一上游流路40A內之處理液進行加熱之第一循環加熱器42A,及對第一上游流路40A內之處理液進行過濾之第一過濾器43A。處理液供給裝置3P包含:對是否自第一貯存槽20A向循環槽31及處理單元2供給處理液進行切換的第一上游切換閥45A、以及可開閉上游流路40之上游閥44。第一上游泵41A、第一循環加熱器42A、第一過濾器43A、第一上游切換閥45A及上游閥44自上游側起依序排列而介設於第一上游流路40A。 The processing liquid supply device 3P includes a first upstream pump 41A that sends the processing liquid in the first upstream flow path 40A to the downstream side, and a first circulation heater 42A that heats the processing liquid in the first upstream flow path 40A. And a first filter 43A that filters the processing liquid in the first upstream flow path 40A. The processing liquid supply device 3P includes a first upstream switching valve 45A that switches whether or not the processing liquid is supplied from the first storage tank 20A to the circulation tank 31 and the processing unit 2, and an upstream valve 44 that can open and close the upstream flow path 40. The first upstream pump 41A, the first circulation heater 42A, the first filter 43A, the first upstream switching valve 45A, and the upstream valve 44 are sequentially arranged from the upstream side and are interposed in the first upstream flow path 40A.

第二上游流路40B之上游端部連接於第二貯存槽20B。第二上游流路40B之下游端部於第一上游切換閥45A與上游閥44之間連接於第一上游流路40A。 An upstream end portion of the second upstream flow path 40B is connected to the second storage tank 20B. The downstream end of the second upstream flow path 40B is connected to the first upstream flow path 40A between the first upstream switching valve 45A and the upstream valve 44.

處理液供給裝置3P進而包含:將第二上游流路40B內之處理液向下游側送出之第二上游泵41B,對第二上游流路40B內之處理液進行加熱之第二循環加熱器42B,及對第二上游流路40B內之處理液進行過濾之第二過濾器43B。處理液供給裝置3P進而包含對是否自第二貯存槽20B向循環槽31及處理單元2供給處理液進行切換的第二上游切換閥45B。第二上游泵41B、第二循環加熱器42B、第二過濾器43B及第二上游切換閥45B自上游側起依序排列而介設於第二上游流路40B。 The processing liquid supply device 3P further includes a second upstream pump 41B that sends the processing liquid in the second upstream flow path 40B to the downstream side, and a second circulation heater 42B that heats the processing liquid in the second upstream flow path 40B. And a second filter 43B that filters the processing liquid in the second upstream flow path 40B. The processing liquid supply device 3P further includes a second upstream switching valve 45B that switches whether or not the processing liquid is supplied from the second storage tank 20B to the circulation tank 31 and the processing unit 2. The second upstream pump 41B, the second circulation heater 42B, the second filter 43B, and the second upstream switching valve 45B are sequentially arranged from the upstream side and are interposed in the second upstream flow path 40B.

第三上游流路40C之上游端部連接於第三貯存槽20C。第三上游流路40C之下游端部於較第二上游切換閥45B靠下游側處連接於第二上游流路40B。 An upstream end portion of the third upstream flow path 40C is connected to the third storage tank 20C. The downstream end portion of the third upstream flow path 40C is connected to the second upstream flow path 40B at a downstream side from the second upstream switching valve 45B.

處理液供給裝置3P包含:將第三上游流路40C內之處理液向下游側送出之第三上游泵41C,對第三上游流路40C內之處理液進行加熱之第三循環加熱器42C,及對第三上游流路40C內之處理液進行過濾之第三過濾器43C。處理液供給裝置3P包含對是否自第三貯存槽20C 向循環槽31及處理單元2供給處理液進行切換的第三上游切換閥45C。第三上游泵41C、第三循環加熱器42C、第三過濾器43C及第三上游切換閥45C自上游側起依序排列而介設於第三上游流路40C。 The processing liquid supply device 3P includes a third upstream pump 41C that sends the processing liquid in the third upstream flow path 40C to the downstream side, and a third circulation heater 42C that heats the processing liquid in the third upstream flow path 40C. And a third filter 43C that filters the processing liquid in the third upstream flow path 40C. The processing liquid supply device 3P includes a third upstream switching valve 45C that switches whether or not the processing liquid is supplied from the third storage tank 20C to the circulation tank 31 and the processing unit 2. The third upstream pump 41C, the third circulation heater 42C, the third filter 43C, and the third upstream switching valve 45C are sequentially arranged from the upstream side and interposed in the third upstream flow path 40C.

下游流路50包含第一下游流路50A、第二下游流路50B及第三下游流路50C。 The downstream flow path 50 includes a first downstream flow path 50A, a second downstream flow path 50B, and a third downstream flow path 50C.

第一下游流路50A之上游端部連接於循環槽31之底部31b。第一下游流路50A之下游端部連接於第一貯存槽20A。處理液供給裝置3P包含下游泵51、下游閥52、及對是否向第一貯存槽20A供給處理液進行切換的第一下游切換閥53A。下游泵51及第一下游切換閥53A自上游側起依序排列而介設於第一下游流路50A。 An upstream end portion of the first downstream flow path 50A is connected to a bottom portion 31 b of the circulation tank 31. The downstream end of the first downstream flow path 50A is connected to the first storage tank 20A. The processing liquid supply device 3P includes a downstream pump 51, a downstream valve 52, and a first downstream switching valve 53A that switches whether or not the processing liquid is supplied to the first storage tank 20A. The downstream pump 51 and the first downstream switching valve 53A are arranged in order from the upstream side and are interposed in the first downstream flow path 50A.

第二下游流路50B之上游端部於下游閥52與第一下游切換閥53A之間連接於第一下游流路50A。第二下游流路50B之下游端部連接於第二貯存槽20B。處理液供給裝置3P包含第二下游切換閥53B,該第二下游切換閥53B係介設於第二下游流路50B且對是否向第二貯存槽20B供給處理液進行切換。 An upstream end portion of the second downstream flow path 50B is connected to the first downstream flow path 50A between the downstream valve 52 and the first downstream switching valve 53A. A downstream end portion of the second downstream flow path 50B is connected to the second storage tank 20B. The processing liquid supply device 3P includes a second downstream switching valve 53B that is interposed in the second downstream flow path 50B and switches whether or not the processing liquid is supplied to the second storage tank 20B.

第三下游流路50C之上游端部於較第二下游切換閥53B靠上游側處連接於第二下游流路50B。第三下游流路 50C之下游端部連接於第三貯存槽20C。處理液供給裝置3P包含第三下游切換閥53C,該第三下游切換閥53C係介設於第三下游流路50C且對是否向第三貯存槽20C供給處理液進行切換。 An upstream end portion of the third downstream flow path 50C is connected to the second downstream flow path 50B at an upstream side from the second downstream switching valve 53B. The downstream end of the third downstream flow path 50C is connected to the third storage tank 20C. The processing liquid supply device 3P includes a third downstream switching valve 53C which is interposed in the third downstream flow path 50C and switches whether or not the processing liquid is supplied to the third storage tank 20C.

返回流路23之長度較第一下游流路50A之長度短。返回流路23之長度比下述兩者的和短:自第一下游流路50A之上游端部至第一下游流路50A及第二下游流路50B之連接部分50a為止之長度;以及第二下游流路50B之長度。返回流路23之長度比下述三者的和短:自第一下游流路50A之上游端部至連接部分50a為止之長度;自第二下游流路50B之上游端部至第二下游流路50B及第三下游流路50C之連接部分50b為止之長度;以及第三下游流路50C。 The length of the return flow path 23 is shorter than the length of the first downstream flow path 50A. The length of the return flow path 23 is shorter than the sum of the length from the upstream end of the first downstream flow path 50A to the connection portion 50a of the first downstream flow path 50A and the second downstream flow path 50B; and The length of the second downstream flow path 50B. The length of the return flow path 23 is shorter than the sum of the following three: the length from the upstream end of the first downstream flow path 50A to the connecting portion 50a; from the upstream end of the second downstream flow path 50B to the second downstream flow The length of the connecting portion 50b of the path 50B and the third downstream flow path 50C; and the third downstream flow path 50C.

處理液供給裝置3P之供給流路22之上游端部係於上游閥44與第一上游流路40A及第二上游流路40B之連接部分之間連接於第一上游流路40A。 The upstream end of the supply flow path 22 of the processing liquid supply device 3P is connected to the first upstream flow path 40A between the upstream valve 44 and the connection portions of the first upstream flow path 40A and the second upstream flow path 40B.

處理液供給裝置3P之新液流路26包含第一新液流路26A、第二新液流路26B及第三新液流路26C。 The new liquid flow path 26 of the processing liquid supply device 3P includes a first new liquid flow path 26A, a second new liquid flow path 26B, and a third new liquid flow path 26C.

第一新液流路26A連接於新液槽25與第一貯存槽20A。第一新液流路26A中介設有對是否自新液槽25向 第一貯存槽20A供給處理液進行切換的第一新液切換閥29A、及新液泵27。新液泵27配置於較第一新液切換閥29A靠上游側處。 The first new liquid flow path 26A is connected to the new liquid tank 25 and the first storage tank 20A. The first new liquid flow path 26A is provided with a first new liquid switching valve 29A and a new liquid pump 27 for switching whether or not the processing liquid is supplied from the new liquid tank 25 to the first storage tank 20A. The fresh liquid pump 27 is disposed upstream of the first fresh liquid switching valve 29A.

第二新液流路26B於第一新液切換閥29A與新液泵27之間自第一新液流路26A分支,並連接於第二貯存槽20B。於第二新液流路26B介設有對是否自新液槽25向第二貯存槽20B供給處理液進行切換的第二新液切換閥29B。 The second new liquid flow path 26B branches from the first new liquid flow path 26A between the first new liquid switching valve 29A and the new liquid pump 27 and is connected to the second storage tank 20B. A second new liquid switching valve 29B is provided in the second new liquid flow path 26B to switch whether or not the processing liquid is supplied from the new liquid tank 25 to the second storage tank 20B.

第三新液流路26C於第一新液切換閥29A與新液泵27之間自第一新液流路26A分支,並連接於第三貯存槽20C。於第三新液流路26C介設有對是否自新液槽25向第三貯存槽20C供給處理液進行切換的第三新液切換閥29C。 The third new liquid flow path 26C branches from the first new liquid flow path 26A between the first new liquid switching valve 29A and the new liquid pump 27 and is connected to the third storage tank 20C. A third new liquid switching valve 29C is provided in the third new liquid flow path 26C to switch whether or not the processing liquid is supplied from the new liquid tank 25 to the third storage tank 20C.

圖6係用以說明藉由基板處理裝置1P進行之基板處理之一例之時序圖。圖7A至圖7F係用以說明藉由基板處理裝置1P進行之基板處理之一例之示意圖。圖7A至圖7F表示圖6之時刻t1至時刻t8中之基板處理裝置1P之動作。 FIG. 6 is a timing chart for explaining an example of substrate processing performed by the substrate processing apparatus 1P. 7A to 7F are schematic diagrams for explaining an example of substrate processing performed by the substrate processing apparatus 1P. 7A to 7F show operations of the substrate processing apparatus 1P from time t1 to time t8 in FIG. 6.

藉由基板處理裝置1P進行之基板處理中,將對循環槽31供給處理液之貯存槽20A至貯存槽20C稱作供給源 貯存槽。藉由基板處理裝置1P進行之基板處理中,將被自循環槽31供給處理液之貯存槽20A至貯存槽20C稱作供給目標貯存槽。 In the substrate processing performed by the substrate processing apparatus 1P, the storage tank 20A to 20C that supplies the processing liquid to the circulation tank 31 is referred to as a supply source storage tank. In the substrate processing performed by the substrate processing apparatus 1P, the storage tank 20A to the storage tank 20C to which the processing liquid is supplied from the circulation tank 31 is referred to as a supply target storage tank.

於開始進行基板處理之前,於各貯存槽20A至貯存槽20C設定第一基準高度H1及第二基準高度H2。第一基準高度H1設定於貯存槽20A至貯存槽20C之頂部附近,第二基準高度H2設定得較第一基準高度H1低且設定於貯存槽20A至貯存槽20C之底部附近。各貯存槽20A至貯存槽20C內之處理液之液面之高度例如由液面感測器(未圖示)偵測。 Before the substrate processing is started, the first reference height H1 and the second reference height H2 are set in each of the storage tanks 20A to 20C. The first reference height H1 is set near the top of the storage tank 20A to 20C, and the second reference height H2 is set lower than the first reference height H1 and set near the bottom of the storage tank 20A to 20C. The height of the liquid level of the processing liquid in each of the storage tanks 20A to 20C is detected by, for example, a liquid level sensor (not shown).

於開始進行基板處理之前,第一貯存槽20A及第三貯存槽20C之各自之處理液之液面高度維持為第一基準高度H1。第二貯存槽20B之處理液之液面高度維持為第二基準高度H2。於開始進行基板處理之前,圖5所示之全部閥24、29A至29C、44、45A至45C、52、53A至53C被關閉著。 Before the substrate processing is started, the liquid level of each of the first storage tank 20A and the third storage tank 20C is maintained at the first reference height H1. The liquid level of the processing liquid in the second storage tank 20B is maintained at the second reference height H2. Before starting the substrate processing, all the valves 24, 29A to 29C, 44, 45A to 45C, 52, 53A to 53C shown in FIG. 5 are closed.

參照圖7A,首先,未處理之基板W保持於旋轉夾盤4。然後,執行使第一貯存槽20A內之處理液於循環流路21循環之第一循環步驟。 Referring to FIG. 7A, first, an unprocessed substrate W is held on the spin chuck 4. Then, the first circulation step of circulating the treatment liquid in the first storage tank 20A through the circulation flow path 21 is performed.

詳細而言,於圖6之時刻t1,上游閥44、第一上游 切換閥45A及第一下游切換閥53A被打開。然後,第一上游泵41A開始第一貯存槽20A內之處理液之抽吸。藉此,自第一貯存槽20A向第一上游流路40A供給處理液。然後,第一循環加熱器42A開始第一上游流路40A內之處理液之加熱。流經第一上游流路40A內之處理液藉由第一過濾器43A過濾。藉此,自流經第一上游流路40A之處理液中除去析出物等。流經第一上游流路40A之處理液被供給至較第一上游流路40A靠循環方向A之下游側之循環槽31中。 Specifically, at time t1 in Fig. 6, the upstream valve 44, the first upstream switching valve 45A, and the first downstream switching valve 53A are opened. Then, the first upstream pump 41A starts suction of the processing liquid in the first storage tank 20A. Thereby, the processing liquid is supplied from the first storage tank 20A to the first upstream flow path 40A. Then, the first circulation heater 42A starts heating of the processing liquid in the first upstream flow path 40A. The treatment liquid flowing through the first upstream flow path 40A is filtered by the first filter 43A. Thereby, precipitates and the like are removed from the processing liquid flowing through the first upstream flow path 40A. The processing liquid flowing through the first upstream flow path 40A is supplied to the circulation tank 31 on the downstream side in the circulation direction A from the first upstream flow path 40A.

然後,於圖6之時刻t1,與第一實施形態中之基板處理同樣地,開始與循環槽31內之處理液之量相應的下游閥52之開閉控制(參照圖4A至圖4C)。圖7A中表示下游閥52被打開之狀態。藉由控制器14進行之下游閥52之開閉控制係於時刻t1至時刻t8之間持續進行。 Then, at time t1 in FIG. 6, similarly to the substrate processing in the first embodiment, opening and closing control of the downstream valve 52 corresponding to the amount of the processing liquid in the circulation tank 31 is started (see FIGS. 4A to 4C). FIG. 7A shows a state where the downstream valve 52 is opened. The opening and closing control of the downstream valve 52 by the controller 14 is continuously performed from time t1 to time t8.

於下游閥52已被打開之狀態下,下游泵51抽吸循環槽31內之處理液,藉此自循環槽31向第一下游流路50A供給處理液。流經第一下游流路50A之處理液被供給至較第一下游流路50A靠下游側之第一貯存槽20A。於第一循環步驟中第一下游切換閥53A被打開時處理液流經下游流路50內之距離D21較處理液流經返回流路23內之距離D1大。 In a state where the downstream valve 52 has been opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31, thereby supplying the processing liquid from the circulation tank 31 to the first downstream flow path 50A. The processing liquid flowing through the first downstream flow path 50A is supplied to the first storage tank 20A on the downstream side from the first downstream flow path 50A. In the first circulation step, when the first downstream switching valve 53A is opened, the distance D21 through which the processing liquid flows through the downstream flow path 50 is greater than the distance D1 through which the processing liquid flows through the return flow path 23.

如此,已自第一貯存槽20A送出至第一上游流路40A之處理液自第一下游流路50A而回到第一貯存槽20A。亦即,第一貯存槽20A中,藉由循環流路21進行液循環。第一循環步驟中,第一貯存槽20A是供給源貯存槽,亦是供給目標貯存槽。 In this way, the processing liquid that has been sent from the first storage tank 20A to the first upstream flow path 40A returns to the first storage tank 20A from the first downstream flow path 50A. That is, in the first storage tank 20A, liquid is circulated through the circulation flow path 21. In the first cycle step, the first storage tank 20A is a supply source storage tank and also a supply target storage tank.

然後,參照圖7B,執行使第二貯存槽20B內之處理液於循環流路21循環之第二循環步驟。詳細而言,於圖6之時刻t2,第二上游切換閥45B及第二下游切換閥53B被打開。另一方面,第一上游切換閥45A及第一下游切換閥53A被關閉。 Then, referring to FIG. 7B, a second circulation step of circulating the processing liquid in the second storage tank 20B through the circulation flow path 21 is performed. Specifically, at time t2 in FIG. 6, the second upstream switching valve 45B and the second downstream switching valve 53B are opened. On the other hand, the first upstream switching valve 45A and the first downstream switching valve 53A are closed.

然後,第二上游泵41B開始第二貯存槽20B內之處理液之抽吸。藉此,自第二貯存槽20B向第二上游流路40B供給處理液。然後,第二循環加熱器42B開始第二上游流路40B內之處理液之加熱。流經第二上游流路40B內之處理液藉由第二過濾器43B過濾。藉此,自流經第二上游流路40B之處理液中除去析出物等。流經第二上游流路40B之處理液被供給至較第二上游流路40B靠循環方向A之下游側之循環槽31。 Then, the second upstream pump 41B starts to suck the processing liquid in the second storage tank 20B. Thereby, the processing liquid is supplied from the second storage tank 20B to the second upstream flow path 40B. Then, the second circulation heater 42B starts heating of the processing liquid in the second upstream flow path 40B. The treatment liquid flowing through the second upstream flow path 40B is filtered by the second filter 43B. Thereby, precipitates and the like are removed from the processing liquid flowing through the second upstream flow path 40B. The processing liquid flowing through the second upstream flow path 40B is supplied to the circulation tank 31 on the downstream side in the circulation direction A from the second upstream flow path 40B.

而且,於下游閥52已被打開之狀態下,下游泵51抽吸循環槽31內之處理液,藉此自循環槽31向下游流路50供給處理液。 When the downstream valve 52 has been opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31, thereby supplying the processing liquid from the circulation tank 31 to the downstream flow path 50.

詳細而言,已自循環槽31供給至下游流路50之處理液,於自循環槽31至連接部分50a之間係流經第一下游流路50A內,然後,流經第二下游流路50B內。流經第二下游流路50B內之處理液被供給至第二貯存槽20B。於第二循環步驟中第二下游切換閥53B被打開時處理液流經下游流路50內之距離D22較處理液流經返回流路23之距離D1大。 In detail, the processing liquid that has been supplied from the circulation tank 31 to the downstream flow path 50 flows through the first downstream flow path 50A from the circulation tank 31 to the connection portion 50a, and then flows through the second downstream flow path Within 50B. The processing liquid flowing through the second downstream flow path 50B is supplied to the second storage tank 20B. In the second circulation step, when the second downstream switching valve 53B is opened, the distance D22 through which the processing liquid flows through the downstream flow path 50 is greater than the distance D1 through which the processing liquid flows through the return flow path 23.

如此,已自第二貯存槽20B送出至第二上游流路40B之處理液自第二下游流路50B回到第二貯存槽20B。第二貯存槽20B中,藉由循環流路21進行液循環。第二循環步驟中,第二貯存槽20B是供給源貯存槽,亦是供給目標貯存槽。 In this way, the processing liquid that has been sent from the second storage tank 20B to the second upstream flow path 40B returns to the second storage tank 20B from the second downstream flow path 50B. In the second storage tank 20B, liquid is circulated through the circulation flow path 21. In the second cycle step, the second storage tank 20B is a supply source storage tank and also a supply target storage tank.

然後,參照圖7C,執行使第三貯存槽20C內之處理液於循環流路21循環之第三循環步驟。詳細而言,於圖6之時刻t3,第三上游切換閥45C及第三下游切換閥53C被打開。另一方面,第二上游切換閥45B及第二下游切換閥53B被關閉。 Then, referring to FIG. 7C, a third cycle step of circulating the processing liquid in the third storage tank 20C through the circulation flow path 21 is performed. Specifically, at time t3 in FIG. 6, the third upstream switching valve 45C and the third downstream switching valve 53C are opened. On the other hand, the second upstream switching valve 45B and the second downstream switching valve 53B are closed.

然後,第三上游泵41C開始第三貯存槽20C內之處理液之抽吸。藉此,自第三貯存槽20C向第三上游流路40C供給處理液。然後,第三循環加熱器42C開始第三上 游流路40C內之處理液之加熱。流經第三上游流路40C內之處理液藉由第三過濾器43C過濾。藉此,自流經第三上游流路40C之處理液中除去析出物等。流經第三上游流路40C之處理液被供給至較第三上游流路40C靠循環方向A之下游側之循環槽31。 Then, the third upstream pump 41C starts suction of the processing liquid in the third storage tank 20C. Thereby, the processing liquid is supplied from the third storage tank 20C to the third upstream flow path 40C. Then, the third circulation heater 42C starts heating the processing liquid in the third upstream flow path 40C. The treatment liquid flowing through the third upstream flow path 40C is filtered by a third filter 43C. Thereby, precipitates and the like are removed from the processing liquid flowing through the third upstream flow path 40C. The processing liquid flowing through the third upstream flow path 40C is supplied to the circulation tank 31 on the downstream side in the circulation direction A from the third upstream flow path 40C.

而且,於下游閥52已被打開之狀態下,下游泵51抽吸循環槽31內之處理液,藉此自循環槽31向下游流路50供給處理液。 When the downstream valve 52 has been opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31, thereby supplying the processing liquid from the circulation tank 31 to the downstream flow path 50.

詳細而言,已自循環槽31供給至下游流路50之處理液於自循環槽31至連接部分50a之間係流經第一下游流路50A內,然後,於自連接部分50a至連接部分50b之間係流經第二下游流路50B內。流經第二下游流路50B內之處理液經由第三下游流路50C而供給至較第三下游流路靠下游側之第三貯存槽20C。第三循環步驟中第三下游切換閥53C被打開時處理液流經下游流路50內之距離D23較處理液流經返回流路23之距離D1大。 In detail, the processing liquid that has been supplied from the circulation tank 31 to the downstream flow path 50 flows through the first downstream flow path 50A from the circulation tank 31 to the connection portion 50a, and then, from the connection portion 50a to the connection portion. 50b flows through the second downstream flow path 50B. The processing liquid flowing through the second downstream flow path 50B is supplied to the third storage tank 20C on the downstream side from the third downstream flow path through the third downstream flow path 50C. In the third circulation step, when the third downstream switching valve 53C is opened, the distance D23 through which the processing liquid flows through the downstream flow path 50 is greater than the distance D1 through which the processing liquid flows through the return flow path 23.

如此,已自第三貯存槽20C送出至第三上游流路40C之處理液自第三下游流路50C回到第三貯存槽20C。即,第三貯存槽20C中,藉由循環流路21進行液循環。第三循環步驟中,第三貯存槽20C是供給源貯存槽,亦是供給目標貯存槽。 In this way, the processing liquid that has been sent from the third storage tank 20C to the third upstream flow path 40C returns to the third storage tank 20C from the third downstream flow path 50C. That is, in the third storage tank 20C, liquid is circulated through the circulation flow path 21. In the third cycle step, the third storage tank 20C is a supply source storage tank and a supply target storage tank.

如此,第一循環步驟、第二循環步驟及第三循環步驟中,控制器14對上游切換閥45A至上游切換閥45C進行控制,將供給源貯存槽在複數個貯存槽20A至貯存槽20C中進行切換。而且,控制器14對下游切換閥53A至下游切換閥53C進行控制,將供給目標貯存槽在複數個貯存槽20A至貯存槽20C中進行切換,以使供給目標貯存槽與供給源貯存槽為相同之貯存槽20A至貯存槽20C(切換步驟)。上游切換閥45A至上游切換閥45C作為上游切換單元發揮功能,下游切換閥53A至下游切換閥53C作為下游切換單元發揮功能。 In this way, in the first cycle step, the second cycle step, and the third cycle step, the controller 14 controls the upstream switching valve 45A to the upstream switching valve 45C to place the supply source storage tank in the plurality of storage tanks 20A to 20C Make the switch. Further, the controller 14 controls the downstream switching valve 53A to the downstream switching valve 53C, and switches the supply target storage tank between the plurality of storage tanks 20A to 20C so that the supply target storage tank is the same as the supply source storage tank. Storage tank 20A to storage tank 20C (switching step). The upstream switching valve 45A to the upstream switching valve 45C function as an upstream switching unit, and the downstream switching valve 53A to the downstream switching valve 53C function as a downstream switching unit.

藉由執行第一循環步驟、第二循環步驟及第三循環步驟,處理液於貯存槽20、上游流路40及下游流路50之整體中循環。此時,利用循環加熱器42A至循環加熱器42C加熱上游流路40內之處理液,藉此調節循環流路21內之處理液之溫度(溫度調節步驟)。循環加熱器42A至循環加熱器42C作為調節循環流路21內之處理液之溫度之溫度調節單元發揮功能。 By performing the first circulation step, the second circulation step, and the third circulation step, the treatment liquid is circulated in the entirety of the storage tank 20, the upstream flow path 40, and the downstream flow path 50. At this time, the circulation heater 42A to the circulation heater 42C are used to heat the treatment liquid in the upstream flow path 40, thereby adjusting the temperature of the treatment liquid in the circulation flow path 21 (temperature adjustment step). The circulation heater 42A to 42C function as a temperature adjustment unit that adjusts the temperature of the processing liquid in the circulation flow path 21.

第三循環步驟結束後,進行自貯存槽20向處理單元2之液供給、以及自處理單元2向貯存槽20之液回收。第三循環步驟結束後,複數個貯存槽20A至貯存槽20C分別發揮液供給、液回收及待機中之任一者之作用。待機 是指在第三循環步驟結束後貯存槽20A至貯存槽20C不再發揮液供給及液回收中之任一者之作用。 After the third cycle step is completed, liquid supply from the storage tank 20 to the processing unit 2 and liquid recovery from the processing unit 2 to the storage tank 20 are performed. After the third cycle step is completed, the plurality of storage tanks 20A to 20C play a role of any one of liquid supply, liquid recovery, and standby. Standby means that the storage tank 20A to the storage tank 20C no longer perform any of the functions of liquid supply and liquid recovery after the third cycle step.

詳細而言,於圖6之時刻t4,第一上游切換閥45A及第二下游切換閥53B被打開,第三上游切換閥45C及第三下游切換閥53C被關閉。第一下游切換閥53A及第二上游切換閥45B維持著關閉之狀態。而且,上游閥44被關閉,供給閥24被打開。 Specifically, at time t4 in FIG. 6, the first upstream switching valve 45A and the second downstream switching valve 53B are opened, and the third upstream switching valve 45C and the third downstream switching valve 53C are closed. The first downstream switching valve 53A and the second upstream switching valve 45B are maintained in a closed state. The upstream valve 44 is closed, and the supply valve 24 is opened.

因此,於時刻t4至時刻t5,參照圖7D,第一貯存槽20A內之處理液經由上游流路40被供給至供給流路22。已供給至供給流路22之處理液被供給至處理單元2之處理液噴嘴5(供給步驟)。已供給至處理液噴嘴5之處理液朝向保持於旋轉夾盤4之基板W之上表面吐出。於開始對基板W之上表面供給處理液之前,藉由旋轉夾盤4開始進行基板W繞旋轉軸線A1之旋轉。已接觸於基板W之上表面之處理液因離心力而遍佈於基板W之整個上表面。藉此,基板W之上表面利用處理液而受到處理。如此,進行自第一貯存槽20A向處理單元2之液供給。因液供給,第一貯存槽20A內之處理液之量減少,處理液之液面之高度變為第二基準高度H2。 Therefore, from time t4 to time t5, referring to FIG. 7D, the processing liquid in the first storage tank 20A is supplied to the supply flow path 22 through the upstream flow path 40. The processing liquid supplied to the supply channel 22 is supplied to the processing liquid nozzle 5 of the processing unit 2 (supplying step). The processing liquid supplied to the processing liquid nozzle 5 is discharged toward the upper surface of the substrate W held on the spin chuck 4. Before the supply of the processing liquid to the upper surface of the substrate W is started, the rotation of the substrate W about the rotation axis A1 is started by the rotary chuck 4. The processing liquid that has contacted the upper surface of the substrate W is spread over the entire upper surface of the substrate W due to the centrifugal force. Thereby, the upper surface of the substrate W is processed with the processing liquid. In this way, the liquid supply from the first storage tank 20A to the processing unit 2 is performed. Due to the liquid supply, the amount of the processing liquid in the first storage tank 20A is reduced, and the height of the liquid level of the processing liquid becomes the second reference height H2.

而且,於時刻t4至時刻t5期間,已供給至處理單元2之處理液經由返回流路23而返回至循環槽31(返回步 驟)。已返回至循環槽31之處理液經由下游流路50回到第二貯存槽20B。如此,進行自處理單元2向第二貯存槽20B之液回收。因液回收,第二貯存槽20B內之處理液之量增大,液面之高度變得較第二基準高度H2高(例如為第一基準高度H1)。 During the period from time t4 to time t5, the processing liquid supplied to the processing unit 2 is returned to the circulation tank 31 via the return flow path 23 (return step). The processing liquid that has been returned to the circulation tank 31 is returned to the second storage tank 20B through the downstream flow path 50. In this way, liquid recovery from the processing unit 2 to the second storage tank 20B is performed. Due to the liquid recovery, the amount of the processing liquid in the second storage tank 20B increases, and the height of the liquid surface becomes higher than the second reference height H2 (for example, the first reference height H1).

於藉由第一貯存槽20A進行液供給及藉由第二貯存槽20B進行液回收之期間,第三貯存槽20C待機。第三貯存槽20C之待機中,可自新液槽25向第三貯存槽20C供給處理液。藉此,可將處理液供給裝置3P內之處理液之量保持為預定量以上。亦可利用藉由新液槽25進行之新的處理液之供給,調整第三貯存槽20C內之處理液之濃度。 The third storage tank 20C stands by while liquid is supplied by the first storage tank 20A and liquid is recovered by the second storage tank 20B. While the third storage tank 20C is on standby, the processing liquid can be supplied from the new liquid tank 25 to the third storage tank 20C. Thereby, the amount of the processing liquid in the processing liquid supply device 3P can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the third storage tank 20C by using the supply of the new processing liquid through the new liquid tank 25.

而且,於圖6之時刻t5,第三上游切換閥45C及第一下游切換閥53A被打開,第一上游切換閥45A及第二下游切換閥53B被關閉。第二上游切換閥45B及第三下游切換閥53C維持著關閉之狀態。 At time t5 in FIG. 6, the third upstream switching valve 45C and the first downstream switching valve 53A are opened, and the first upstream switching valve 45A and the second downstream switching valve 53B are closed. The second upstream switching valve 45B and the third downstream switching valve 53C are maintained in a closed state.

因此,於時刻t5至時刻t6,參照圖7E,第三貯存槽20C內之處理液經由上游流路40向供給流路22供給。已供給至供給流路22之處理液被供給至處理單元2之處理液噴嘴5(供給步驟)。進行自第三貯存槽20C向處理單元2之液供給。因液供給,第三貯存槽20C內之處理液之量 減少,處理液之液面之高度變為第二基準高度H2。 Therefore, from time t5 to time t6, referring to FIG. 7E, the processing liquid in the third storage tank 20C is supplied to the supply flow path 22 through the upstream flow path 40. The processing liquid supplied to the supply channel 22 is supplied to the processing liquid nozzle 5 of the processing unit 2 (supplying step). Liquid supply from the third storage tank 20C to the processing unit 2 is performed. Due to the liquid supply, the amount of the processing liquid in the third storage tank 20C is reduced, and the height of the liquid surface of the processing liquid becomes the second reference height H2.

而且,於時刻t5至時刻t6,已供給至處理單元2之處理液經由返回流路23而返回至循環槽31(返回步驟)。已返回至循環槽31之處理液經由下游流路50而回到第一貯存槽20A。如此,進行自處理單元2向第一貯存槽20A之液回收。因液回收,第一貯存槽20A內之處理液之量增大,液面之高度變得較第二基準高度H2高(例如為第一基準高度H1)。 Then, from time t5 to time t6, the processing liquid that has been supplied to the processing unit 2 is returned to the circulation tank 31 via the return flow path 23 (return step). The processing liquid that has been returned to the circulation tank 31 is returned to the first storage tank 20A through the downstream flow path 50. In this way, liquid recovery from the processing unit 2 to the first storage tank 20A is performed. Due to the liquid recovery, the amount of the processing liquid in the first storage tank 20A increases, and the height of the liquid surface becomes higher than the second reference height H2 (for example, the first reference height H1).

於藉由第三貯存槽20C進行液供給及藉由第一貯存槽20A進行液回收之期間,第二貯存槽20B待機。第二貯存槽20B之待機中,可自新液槽25向第二貯存槽20B供給處理液。藉此,可將處理液供給裝置3P內之處理液之量保持為預定量以上。亦可利用藉由新液槽25進行之新的處理液之供給,調整第二貯存槽20B內之處理液之濃度。 The second storage tank 20B stands by while liquid is supplied by the third storage tank 20C and liquid is recovered by the first storage tank 20A. While the second storage tank 20B is in standby, the processing liquid can be supplied from the new liquid tank 25 to the second storage tank 20B. Thereby, the amount of the processing liquid in the processing liquid supply device 3P can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the second storage tank 20B by supplying a new processing liquid through the new liquid tank 25.

然後,於圖6之時刻t6,第二上游切換閥45B及第三下游切換閥53C被打開,第一下游切換閥53A及第三上游切換閥45C被關閉。第一上游切換閥45A及第二下游切換閥53B維持著關閉之狀態。 Then, at time t6 in FIG. 6, the second upstream switching valve 45B and the third downstream switching valve 53C are opened, and the first downstream switching valve 53A and the third upstream switching valve 45C are closed. The first upstream switching valve 45A and the second downstream switching valve 53B are maintained in a closed state.

因此,於時刻t6至時刻t7,參照圖7F,第二貯存槽 20B內之處理液經由上游流路40而被供給至供給流路22。已供給至供給流路22之處理液被供給至處理液噴嘴5(供給步驟)。進行自第二貯存槽20B向處理單元2之液供給。因液供給,第二貯存槽20B內之處理液之量減少,液面之高度變為第一基準高度H1。 Therefore, from time t6 to time t7, referring to Fig. 7F, the processing liquid in the second storage tank 20B is supplied to the supply flow path 22 through the upstream flow path 40. The processing liquid supplied to the supply channel 22 is supplied to the processing liquid nozzle 5 (supplying step). Liquid supply from the second storage tank 20B to the processing unit 2 is performed. Due to the liquid supply, the amount of the processing liquid in the second storage tank 20B is reduced, and the height of the liquid surface becomes the first reference height H1.

然後,已供給至處理單元2之處理液經由返回流路23而返回至循環槽31(返回步驟)。已返回至循環槽31之處理液經由下游流路50而回到第三貯存槽20C。進行自處理單元2向第三貯存槽20C之液回收。因液回收,第三貯存槽20C內之處理液之量增大,處理液之液面之高度變得較第二基準高度H2高(例如為第一基準高度H1)。 Then, the processing liquid supplied to the processing unit 2 is returned to the circulation tank 31 via the return flow path 23 (return step). The processing liquid that has been returned to the circulation tank 31 is returned to the third storage tank 20C through the downstream flow path 50. Liquid recovery from the processing unit 2 to the third storage tank 20C is performed. Due to the liquid recovery, the amount of the processing liquid in the third storage tank 20C increases, and the height of the liquid level of the processing liquid becomes higher than the second reference height H2 (for example, the first reference height H1).

於藉由第二貯存槽20B進行液供給及藉由第三貯存槽20C進行液回收之期間,第一貯存槽20A待機。第一貯存槽20A之待機中,可自新液槽25向第一貯存槽20A供給處理液。藉此,可將處理液供給裝置3P內之處理液之量保持為預定量以上。亦可利用藉由新液槽25進行之新的處理液之供給,調整第一貯存槽20A內之處理液之濃度。 While the liquid is supplied by the second storage tank 20B and the liquid is recovered by the third storage tank 20C, the first storage tank 20A is on standby. While the first storage tank 20A is on standby, the processing liquid can be supplied from the new liquid tank 25 to the first storage tank 20A. Thereby, the amount of the processing liquid in the processing liquid supply device 3P can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the first storage tank 20A by supplying a new processing liquid through the new liquid tank 25.

然後,於時刻t7,與時刻t4同樣地控制上游切換閥45A至上游切換閥45C及下游切換閥53A至下游切換閥53C。藉此,各貯存槽20A至貯存槽20C之作用被切換, 時刻t7至時刻t8執行與時刻t4至時刻t5相同之基板處理。時刻t7以後,重複進行以時刻t4至時刻t7之基板處理為一單位之基板處理。 Then, at time t7, the upstream switching valve 45A to the upstream switching valve 45C and the downstream switching valve 53A to the downstream switching valve 53C are controlled in the same manner as the time t4. Thereby, the roles of each of the storage tanks 20A to 20C are switched, and the same substrate processing is performed from time t7 to time t8 as from time t4 to time t5. Subsequent to time t7, the substrate processing with the substrate processing from time t4 to time t7 as a unit is repeated.

根據第二實施形態,實現與第一實施形態相同之效果。 According to the second embodiment, the same effects as the first embodiment are achieved.

根據第二實施形態,貯存槽20設置有複數個(貯存槽20A至貯存槽20C)。於進行液循環之時刻t1至時刻t4期間,將供給目標貯存槽在複數個貯存槽20A至貯存槽20C中進行切換,以使供給源貯存槽與供給目標貯存槽為相同貯存槽。因此,可藉由循環流路21使各貯存槽20A至貯存槽20C內之處理液循環而不會使各貯存槽20A至貯存槽20C內之處理液之量發生變化。因此,可於開始利用循環流路21進行處理液之循環之前針對每個貯存槽20A至貯存槽20C設定供給至處理單元之處理液的必要量。藉此,容易對貯存槽20A至貯存槽20C內之處理液之量進行管理。 According to the second embodiment, a plurality of storage tanks 20 (storage tanks 20A to 20C) are provided. Between the time t1 and the time t4 when the liquid circulation is performed, the supply target storage tank is switched among the plurality of storage tanks 20A to 20C so that the supply source storage tank and the supply target storage tank are the same storage tank. Therefore, the processing liquid in each of the storage tanks 20A to 20C can be circulated through the circulation flow path 21 without changing the amount of the processing liquid in each of the storage tanks 20A to 20C. Therefore, the necessary amount of the processing liquid to be supplied to the processing unit can be set for each of the storage tanks 20A to 20C before the circulation of the processing liquid using the circulation flow path 21 is started. This makes it easy to manage the amount of the processing liquid in the storage tank 20A to the storage tank 20C.

圖8係表示本發明之第三實施形態之基板處理裝置1Q之構成之示意圖。圖8中,對至此說明之構件相同之構件附上相同之參照符號,並省略其說明(後述圖9及圖10A至圖10E亦相同)。 FIG. 8 is a schematic diagram showing a configuration of a substrate processing apparatus 1Q according to a third embodiment of the present invention. In FIG. 8, the same reference numerals are given to the same components as those explained so far, and the description thereof is omitted (the same applies to FIGS. 9 and 10A to 10E described later).

基板處理裝置1Q之構成於以下說明之方面與第一實施形態之基板處理裝置1之各構件之構成不同。 The configuration of the substrate processing apparatus 1Q is different from that of the components of the substrate processing apparatus 1 of the first embodiment in the following points.

基板處理裝置1Q之處理液供給裝置3Q與第二實施形態之基板處理裝置1P之處理液供給裝置3P同樣地包含複數個貯存槽20(第一貯存槽20A、第二貯存槽20B及第三貯存槽20C)。 The processing liquid supply device 3Q of the substrate processing apparatus 1Q includes a plurality of storage tanks 20 (a first storage tank 20A, a second storage tank 20B, and a third storage) similarly to the processing liquid supply apparatus 3P of the substrate processing apparatus 1P of the second embodiment. Slot 20C).

處理液供給裝置3Q之上游流路40之上游端部連接於第一貯存槽20A。處理液供給裝置3Q之上游流路40之下游端部連接於循環槽31之頂部31a。處理液供給裝置3Q之下游流路50之上游端部連接於循環槽31之底部31b。處理液供給裝置3Q之下游流路50之下游端部連接於第一貯存槽20A。 The upstream end of the upstream flow path 40 of the processing liquid supply device 3Q is connected to the first storage tank 20A. The downstream end of the upstream flow path 40 of the processing liquid supply device 3Q is connected to the top portion 31 a of the circulation tank 31. The upstream end of the downstream flow path 50 of the processing liquid supply device 3Q is connected to the bottom portion 31 b of the circulation tank 31. The downstream end of the downstream flow path 50 of the processing liquid supply device 3Q is connected to the first storage tank 20A.

處理液供給裝置3Q包含對是否向第一貯存槽20供給處理液進行切換之下游切換閥53。下游切換閥53於較下游閥52靠下游側處介置於下游流路50。 The processing liquid supply device 3Q includes a downstream switching valve 53 that switches whether or not the processing liquid is supplied to the first storage tank 20. The downstream switching valve 53 is interposed in the downstream flow path 50 on the downstream side from the downstream valve 52.

處理液供給裝置3Q包含:自第二貯存槽20B及第三貯存槽20C對第一貯存槽20A補給處理液之補給流路60,及使已供給至處理單元2之處理液回收至第二貯存槽20B及第三貯存槽20C之回收流路70。 The processing liquid supply device 3Q includes a replenishing flow path 60 for supplying the processing liquid to the first storage tank 20A from the second storage tank 20B and the third storage tank 20C, and recovering the processing liquid that has been supplied to the processing unit 2 to the second storage. The recovery flow path 70 of the tank 20B and the third storage tank 20C.

補給流路60包含將第二貯存槽20B內之處理液補給至第一貯存槽20A之第一補給流路60A、及將第三貯存槽20C內之處理液補給至第一貯存槽20A之第二補給流路60B。 The replenishment flow path 60 includes a first replenishment flow path 60A for replenishing the processing liquid in the second storage tank 20B to the first storage tank 20A, and a first replenishment flow path for replenishing the processing liquid in the third storage tank 20C to the first storage tank 20A. Second supply flow path 60B.

第一補給流路60A之上游端部連接於第二貯存槽20B。第一補給流路60A之下游端部連接於第一貯存槽20A。 An upstream end portion of the first supply flow path 60A is connected to the second storage tank 20B. The downstream end of the first replenishing flow path 60A is connected to the first storage tank 20A.

處理液供給裝置3Q包含將第一補給流路60A內之處理液向下游側送出之第一補給泵61A、對第一補給流路60A內之處理液進行加熱之第一補給加熱器62A、對第一補給流路60A內之處理液進行過濾之第一補給過濾器63A、及將第一補給流路60A開閉之第一補給閥64A。第一補給泵61A、第一補給加熱器62A、第一補給過濾器63A及第一補給閥64A自上游側起依序排列而介設於第一補給流路60A。 The processing liquid supply device 3Q includes a first supply pump 61A that sends the processing liquid in the first supply flow path 60A to the downstream side, a first supply heater 62A that heats the processing liquid in the first supply flow path 60A, A first supply filter 63A that filters the processing liquid in the first supply flow path 60A, and a first supply valve 64A that opens and closes the first supply flow path 60A. The first replenishment pump 61A, the first replenishment heater 62A, the first replenishment filter 63A, and the first replenishment valve 64A are sequentially arranged from the upstream side and are interposed in the first replenishment flow path 60A.

第二補給流路60B之上游端部連接於第三貯存槽20C。第二補給流路60B之下游端部於較第一補給閥64A靠下游側處連接於第一補給流路60A。 An upstream end portion of the second supply flow path 60B is connected to the third storage tank 20C. The downstream end portion of the second replenishing flow path 60B is connected to the first replenishing flow path 60A at a downstream side from the first replenishment valve 64A.

處理液供給裝置3Q包含將第二補給流路60B內之處理液向下游側送出之第二補給泵61B、對第二補給流路 60B內之處理液進行加熱之第二補給加熱器62B、對第二補給流路60B內之處理液進行過濾之第二補給過濾器63B、及用以開閉第二補給流路60B之第二補給閥64B。第二補給泵61B、第二補給加熱器62B、第二補給過濾器63B及第二補給閥64B自上游側起依序排列而介設於第二補給流路60B。 The processing liquid supply device 3Q includes a second supply pump 61B that sends the processing liquid in the second supply flow path 60B to the downstream side, a second supply heater 62B that heats the processing liquid in the second supply flow path 60B, A second supply filter 63B for filtering the processing liquid in the second supply flow path 60B, and a second supply valve 64B for opening and closing the second supply flow path 60B. The second replenishment pump 61B, the second replenishment heater 62B, the second replenishment filter 63B, and the second replenishment valve 64B are sequentially arranged from the upstream side and are interposed in the second replenishment flow path 60B.

回收流路70包含使已供給至處理單元2之處理液回收至第二貯存槽20B之第一回收流路70A、及使已供給至處理單元2之處理液回收至第三貯存槽20C之第二回收流路70B。 The recovery flow path 70 includes a first recovery flow path 70A for recovering the processing liquid supplied to the processing unit 2 to the second storage tank 20B, and a recovery flow path 70A for recovering the processing liquid supplied to the processing unit 2 to the third storage tank 20C. Second recovery flow path 70B.

第一回收流路70A之上游端部於下游閥52與下游切換閥53之間連接於下游流路50。第一回收流路70A之下游端部連接於第二貯存槽20B。處理液供給裝置3Q包含介設於第一回收流路70A而將第一回收流路70A開閉之第一回收閥71A。 The upstream end of the first recovery flow path 70A is connected to the downstream flow path 50 between the downstream valve 52 and the downstream switching valve 53. The downstream end portion of the first recovery flow path 70A is connected to the second storage tank 20B. The processing liquid supply device 3Q includes a first recovery valve 71A interposed in the first recovery flow path 70A to open and close the first recovery flow path 70A.

第二回收流路70B之上游端部於較第一回收閥71A靠上游側處連接於第一回收流路70A。第二回收流路70B之下游端部連接於第三貯存槽20C。處理液供給裝置3Q包含介設於第二回收流路70B而將第一回收流路70A開閉之第二回收閥71B。 An upstream end portion of the second recovery flow path 70B is connected to the first recovery flow path 70A at an upstream side from the first recovery valve 71A. A downstream end portion of the second recovery flow path 70B is connected to the third storage tank 20C. The processing liquid supply device 3Q includes a second recovery valve 71B interposed in the second recovery flow path 70B to open and close the first recovery flow path 70A.

處理液供給裝置3Q之新液流路26包含前述第二新液流路26B及第三新液流路26C。第三實施形態之第二新液流路26B與第二實施形態之第二新液流路26B不同,連接於新液槽25與第二貯存槽20B。第三實施形態之第三新液流路26C與第二實施形態之第三新液流路26C不同,自第二新液流路26B分支並連接於第三貯存槽20C。 The new liquid flow path 26 of the processing liquid supply device 3Q includes the aforementioned second new liquid flow path 26B and the third new liquid flow path 26C. The second new liquid flow path 26B of the third embodiment is different from the second new liquid flow path 26B of the second embodiment, and is connected to the new liquid tank 25 and the second storage tank 20B. The third new liquid flow path 26C of the third embodiment is different from the third new liquid flow path 26C of the second embodiment, and branches from the second new liquid flow path 26B and is connected to the third storage tank 20C.

圖9係用以說明藉由基板處理裝置1Q進行之基板處理之一例之時序圖。圖10A至圖10E係用以說明藉由基板處理裝置1Q進行之基板處理之一例之示意圖。圖10A至圖10E表示圖6之時刻t1至時刻t8中之基板處理裝置1Q之動作。 FIG. 9 is a timing chart for explaining an example of substrate processing performed by the substrate processing apparatus 1Q. 10A to 10E are schematic diagrams for explaining an example of substrate processing performed by the substrate processing apparatus 1Q. 10A to 10E show operations of the substrate processing apparatus 1Q from time t1 to time t8 in FIG. 6.

於藉由第三實施形態之基板處理裝置1Q開始進行基板處理之前,於各貯存槽20A至貯存槽20C設定第一基準高度H1及第二基準高度H2。第一基準高度H1設定於貯存槽20A至貯存槽20C之頂部附近,第二基準高度H2設定得較第一基準高度H1低且設定於貯存槽20A至貯存槽20C之底部附近。 Before the substrate processing is started by the substrate processing apparatus 1Q of the third embodiment, the first reference height H1 and the second reference height H2 are set in each of the storage tanks 20A to 20C. The first reference height H1 is set near the top of the storage tank 20A to 20C, and the second reference height H2 is set lower than the first reference height H1 and set near the bottom of the storage tank 20A to 20C.

於藉由第三實施形態之基板處理裝置1Q開始進行基板處理之前,第一貯存槽20A及第三貯存槽20C之處理液之液面高度維持為第一基準高度H1。而且,第二貯存槽20B之處理液之液面高度維持為第二基準高度H2。於 開始進行基板處理之前,圖8所示之全部之閥24、29B、29C、44、52、53、64A、64B、71A、71B被關閉著。 Before the substrate processing is started by the substrate processing apparatus 1Q of the third embodiment, the liquid level of the processing liquid in the first storage tank 20A and the third storage tank 20C is maintained at the first reference height H1. In addition, the liquid level of the processing liquid in the second storage tank 20B is maintained at the second reference height H2. Before starting the substrate processing, all the valves 24, 29B, 29C, 44, 52, 53, 64A, 64B, 71A, 71B shown in Fig. 8 are closed.

然後,參照圖10A,未處理之基板W保持於旋轉夾盤4。執行使第一貯存槽20A內之處理液於循環流路21循環之循環步驟。詳細而言,於圖9之時刻t1,上游閥44被打開。然後,上游泵41開始第一貯存槽20A內之處理液之抽吸。藉此,經由上游流路40而自第一貯存槽20A供給至循環槽31。 Then, referring to FIG. 10A, the unprocessed substrate W is held on the spin chuck 4. The circulation step of circulating the treatment liquid in the first storage tank 20A through the circulation flow path 21 is performed. Specifically, at time t1 in FIG. 9, the upstream valve 44 is opened. Then, the upstream pump 41 starts suction of the processing liquid in the first storage tank 20A. Thereby, it is supplied from the first storage tank 20A to the circulation tank 31 via the upstream flow path 40.

而且,於圖9之時刻t1,與第一實施形態之下游閥52同樣地,開始進行與循環槽31內之處理液之量相應的下游閥52之開閉控制。圖10A中表示下游閥52已被打開之狀態。藉由控制器14進行之下游閥52之開閉控制係於時刻t1至時刻t8期間持續進行。 At time t1 in FIG. 9, similarly to the downstream valve 52 of the first embodiment, the opening and closing control of the downstream valve 52 corresponding to the amount of the processing liquid in the circulation tank 31 is started. FIG. 10A shows a state where the downstream valve 52 has been opened. The opening and closing control of the downstream valve 52 by the controller 14 is continuously performed from time t1 to time t8.

於下游閥52已被打開之狀態下,下游泵51抽吸循環槽31內之處理液,藉此經由下游流路50而自循環槽31供給至第一貯存槽20A。如此,已自第一貯存槽20A送出至上游流路40之處理液自下游流路50回到第一貯存槽20A。即,第一貯存槽20A中,藉由循環流路21進行液循環。 In a state where the downstream valve 52 has been opened, the downstream pump 51 sucks the processing liquid in the circulation tank 31, thereby supplying the processing liquid from the circulation tank 31 to the first storage tank 20A through the downstream flow path 50. In this way, the processing liquid that has been sent from the first storage tank 20A to the upstream flow path 40 returns from the downstream flow path 50 to the first storage tank 20A. That is, in the first storage tank 20A, liquid is circulated through the circulation flow path 21.

循環步驟結束後,進行自第一貯存槽20A向處理單 元2之液供給、以及自處理單元2向第二貯存槽20B或第三貯存槽20C之液回收。循環步驟結束後,第一貯存槽20A發揮液供給之作用。循環步驟結束後,第二貯存槽20B及第三貯存槽20C發揮液回收、待機或液補給中之任一者之作用。 After the circulation step is completed, liquid supply from the first storage tank 20A to the processing unit 2 and liquid recovery from the processing unit 2 to the second storage tank 20B or the third storage tank 20C are performed. After the circulation step is completed, the first storage tank 20A functions as a liquid supply. After the circulation step is completed, the second storage tank 20B and the third storage tank 20C perform any of the functions of liquid recovery, standby, and liquid replenishment.

液補給係指自第二貯存槽20B或第三貯存槽20C向第一貯存槽20A補給處理液。待機係指循環步驟結束時,貯存槽20A至貯存槽20C不再發揮液供給、液回收及液補給中之任一者之作用。 The liquid replenishment refers to replenishing the processing liquid from the second storage tank 20B or the third storage tank 20C to the first storage tank 20A. Standby means that at the end of the circulation step, the storage tanks 20A to 20C no longer perform any of the functions of liquid supply, liquid recovery, and liquid replenishment.

詳細而言,於圖9之時刻t2,第一回收閥71A被打開,下游切換閥53被關閉。而且,上游閥44被關閉,供給閥24被打開。 Specifically, at time t2 in FIG. 9, the first recovery valve 71A is opened and the downstream switching valve 53 is closed. The upstream valve 44 is closed, and the supply valve 24 is opened.

因此,於時刻t2至時刻t3,參照圖10B,第一貯存槽20A內之處理液經由上游流路40而被供給至供給流路22。已供給至供給流路22之處理液被供給至處理單元2之處理液噴嘴5(供給步驟)。已供給至處理液噴嘴5之處理液朝向保持於旋轉夾盤4之基板W之上表面吐出。於開始對基板W之上表面供給處理液之前,藉由旋轉夾盤4開始進行基板W繞旋轉軸線A1之旋轉。已接觸於基板W之上表面之處理液因離心力而遍佈於基板W之整個上表面。藉此,基板W之上表面利用處理液而受到處理。 如此,進行自第一貯存槽20A向處理單元2之液供給。因液供給,第一貯存槽20A內之處理液之量減少,處理液之液面之高度變得較第一基準高度H1低。 Therefore, from time t2 to time t3, referring to FIG. 10B, the processing liquid in the first storage tank 20A is supplied to the supply flow path 22 through the upstream flow path 40. The processing liquid supplied to the supply channel 22 is supplied to the processing liquid nozzle 5 of the processing unit 2 (supplying step). The processing liquid supplied to the processing liquid nozzle 5 is discharged toward the upper surface of the substrate W held on the spin chuck 4. Before the supply of the processing liquid to the upper surface of the substrate W is started, the rotation of the substrate W about the rotation axis A1 is started by the rotary chuck 4. The processing liquid that has contacted the upper surface of the substrate W is spread over the entire upper surface of the substrate W due to the centrifugal force. Thereby, the upper surface of the substrate W is processed with the processing liquid. In this way, the liquid supply from the first storage tank 20A to the processing unit 2 is performed. Due to the liquid supply, the amount of the processing liquid in the first storage tank 20A is reduced, and the height of the liquid level of the processing liquid becomes lower than the first reference height H1.

而且,於時刻t2至時刻t3,已供給至處理單元2之處理液經由返回流路23而返回至循環槽31(返回步驟)。已返回至循環槽31之處理液藉由下游泵51抽吸,並向下游流路50供給。已供給至下游流路50之處理液經由回收流路70回收至第二貯存槽20B。 Then, from time t2 to time t3, the processing liquid that has been supplied to the processing unit 2 is returned to the circulation tank 31 via the return flow path 23 (return step). The processing liquid returned to the circulation tank 31 is sucked by the downstream pump 51 and is supplied to the downstream flow path 50. The processing liquid supplied to the downstream flow path 50 is recovered to the second storage tank 20B via the recovery flow path 70.

如此,進行自處理單元2向第二貯存槽20B之液回收。因液回收,第二貯存槽20B內之處理液之量增大,處理液之液面之高度變得較第二基準高度H2高。 In this way, liquid recovery from the processing unit 2 to the second storage tank 20B is performed. Due to the liquid recovery, the amount of the processing liquid in the second storage tank 20B increases, and the height of the liquid level of the processing liquid becomes higher than the second reference height H2.

於時刻t2至時刻t3藉由第一貯存槽20A進行液供給及藉由第二貯存槽20B進行液回收之期間,第三貯存槽20C待機。於第三貯存槽20C之待機中,可自新液槽25向第三貯存槽20C供給處理液。藉此,可將處理液供給裝置3P內之處理液之量保持為預定量以上。亦可利用藉由新液槽25進行之新的處理液之供給,調整第三貯存槽20C內之處理液之濃度。 Between time t2 and time t3, liquid is supplied from the first storage tank 20A and liquid is recovered from the second storage tank 20B, and the third storage tank 20C is on standby. During the standby of the third storage tank 20C, the processing liquid can be supplied from the new liquid tank 25 to the third storage tank 20C. Thereby, the amount of the processing liquid in the processing liquid supply device 3P can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the third storage tank 20C by using the supply of the new processing liquid through the new liquid tank 25.

於圖9之時刻t3,第二補給閥64B被打開。因此,於時刻t3至時刻t4,如圖10C所示,第三貯存槽20C內 之處理液經由補給流路60向第一貯存槽20A補給(補給步驟)。如此,進行自第三貯存槽20C向第一貯存槽20A之液補給。另一方面,藉由第一貯存槽20A進行之液供給及藉由第二貯存槽20B進行之液回收持續進行。因此,第一貯存槽20A內之處理液之量及第二貯存槽20B內之處理液之量增大,第三貯存槽20C內之處理液之量減少。藉此,第三貯存槽20C內之處理液之液面之高度變得較第一基準高度H1低。另一方面,第一貯存槽20A內之處理液之液面之高度為第一基準高度H1。 At time t3 in FIG. 9, the second supply valve 64B is opened. Therefore, from time t3 to time t4, as shown in FIG. 10C, the processing liquid in the third storage tank 20C is replenished to the first storage tank 20A via the replenishing flow path 60 (refilling step). In this manner, the liquid is replenished from the third storage tank 20C to the first storage tank 20A. On the other hand, the liquid supply by the first storage tank 20A and the liquid recovery by the second storage tank 20B continue. Therefore, the amount of the processing liquid in the first storage tank 20A and the amount of the processing liquid in the second storage tank 20B increase, and the amount of the processing liquid in the third storage tank 20C decreases. Thereby, the height of the liquid level of the processing liquid in the third storage tank 20C becomes lower than the first reference height H1. On the other hand, the height of the liquid surface of the processing liquid in the first storage tank 20A is the first reference height H1.

於圖9之時刻t4,第二回收閥71B被打開,第一回收閥71A及第二補給閥64B被關閉。 At time t4 in FIG. 9, the second recovery valve 71B is opened, and the first recovery valve 71A and the second supply valve 64B are closed.

因此,於時刻t4至時刻t5,參照圖10D,第一貯存槽20A內之處理液經由上游流路40而被供給至供給流路22。已供給至供給流路22之處理液被供給至處理單元2之處理液噴嘴5(供給步驟)。進行自第一貯存槽20A向處理單元2之液供給。因液供給,第一貯存槽20A內之處理液之量減少,處理液之液面之高度變得較第一基準高度H1低。 Therefore, from time t4 to time t5, referring to FIG. 10D, the processing liquid in the first storage tank 20A is supplied to the supply flow path 22 through the upstream flow path 40. The processing liquid supplied to the supply channel 22 is supplied to the processing liquid nozzle 5 of the processing unit 2 (supplying step). Liquid supply from the first storage tank 20A to the processing unit 2 is performed. Due to the liquid supply, the amount of the processing liquid in the first storage tank 20A is reduced, and the height of the liquid level of the processing liquid becomes lower than the first reference height H1.

而且,於時刻t4至時刻t5,已供給至處理單元2之處理液經由返回流路23而返回至循環槽31(返回步驟)。已返回至循環槽31之處理液藉由下游泵51抽吸而向下游 流路50供給。已供給至下游流路50之處理液經由回收流路70而回收至第三貯存槽20C。如此,進行自處理單元2向第三貯存槽20C之液回收。因液回收,第三貯存槽20C內之處理液之量增大。 Then, from time t4 to time t5, the processing liquid that has been supplied to the processing unit 2 is returned to the circulation tank 31 via the return flow path 23 (return step). The processing liquid returned to the circulation tank 31 is sucked by the downstream pump 51 and supplied to the downstream flow path 50. The processing liquid supplied to the downstream flow path 50 is recovered to the third storage tank 20C through the recovery flow path 70. In this way, liquid recovery from the processing unit 2 to the third storage tank 20C is performed. Due to the liquid recovery, the amount of the processing liquid in the third storage tank 20C increases.

於時刻t4至時刻t5藉由第一貯存槽20A進行液供給及藉由第三貯存槽20C進行液回收之期間,第二貯存槽20B待機。第二貯存槽20B之待機中,可自新液槽25向第二貯存槽20B供給處理液。藉此,可將處理液供給裝置3Q內之處理液之量保持為預定量以上。亦可利用藉由新液槽25進行之新的處理液之供給,調整第二貯存槽20B內之處理液之濃度。 Between time t4 and time t5, liquid is supplied by the first storage tank 20A and liquid is recovered by the third storage tank 20C, and the second storage tank 20B is on standby. While the second storage tank 20B is in standby, the processing liquid can be supplied from the new liquid tank 25 to the second storage tank 20B. Thereby, the amount of the processing liquid in the processing liquid supply device 3Q can be maintained at a predetermined amount or more. It is also possible to adjust the concentration of the processing liquid in the second storage tank 20B by supplying a new processing liquid through the new liquid tank 25.

於圖9之時刻t5,第一補給閥64A被打開。因此,於時刻t5至時刻t6,如圖10E所示,第二貯存槽20B內之處理液經由補給流路60而向第一貯存槽20A補給(補給步驟)。如此,進行自第二貯存槽20B向第一貯存槽20A之液補給。另一方面,藉由第一貯存槽20A進行之液供給及藉由第三貯存槽20C進行之液回收持續進行。因此,第一貯存槽20A內之處理液之量及第三貯存槽20C內之處理液之量增大,第二貯存槽20B內之處理液之量減少。藉此,第二貯存槽20B內之處理液之液面之高度變得較第一基準高度H1低(例如為第二基準高度H2)。另一方面,第一貯存槽20A內之處理液之液面之高度成為第一 基準高度H1。 At time t5 in FIG. 9, the first supply valve 64A is opened. Therefore, from time t5 to time t6, as shown in FIG. 10E, the processing liquid in the second storage tank 20B is replenished to the first storage tank 20A via the replenishment flow path 60 (replenishment step). In this way, the liquid is replenished from the second storage tank 20B to the first storage tank 20A. On the other hand, the liquid supply by the first storage tank 20A and the liquid recovery by the third storage tank 20C continue. Therefore, the amount of the processing liquid in the first storage tank 20A and the amount of the processing liquid in the third storage tank 20C increase, and the amount of the processing liquid in the second storage tank 20B decreases. Thereby, the height of the liquid level of the processing liquid in the second storage tank 20B becomes lower than the first reference height H1 (for example, the second reference height H2). On the other hand, the height of the liquid level of the processing liquid in the first storage tank 20A becomes the first reference height H1.

然後,於時刻t6,與時刻t2同樣地切換第二貯存槽20B與第三貯存槽20C之作用。然後,於時刻t6至時刻t8,執行與時刻t2至時刻t4相同之基板處理。於時刻t6以後,重複進行以時刻t2至時刻t6之基板處理為一單位之基板處理。 Then, at time t6, the effects of the second storage tank 20B and the third storage tank 20C are switched in the same manner as at time t2. Then, from time t6 to time t8, the same substrate processing as that from time t2 to time t4 is performed. Subsequent to time t6, the substrate processing with the substrate processing from time t2 to time t6 as a unit is repeated.

根據第三實施形態,實現與第一實施形態相同之效果。 According to the third embodiment, the same effect as that of the first embodiment is achieved.

本發明不限定於以上說明之實施形態,可進而以其他形態實施。 The present invention is not limited to the embodiments described above, and may be implemented in other forms.

例如,如圖1、圖5及圖8中兩點鏈線所示,亦可於基板處理裝置1、1P、1Q設置複數個處理單元2。例如,設置與上述實施形態中說明之處理單元2相同之構成的處理單元2A。處理單元2A連接有較供給閥24靠上游側且自供給流路22分支之供給流路22A。於供給流路22A介設有供給閥24。於處理單元2A連接有與返回流路23分開之返回流路23A之上游端部。返回流路23A之下游端部連接於與返回流路23共通之循環槽31之頂部31a。供給步驟中,供給流路22、22A向處理單元2、2A之各者供給處理液。返回步驟中,返回流路23、23A自處理 單元2、2A中之各個處理單元將處理液導引至循環槽31。 For example, as shown by two-dot chain lines in FIG. 1, FIG. 5, and FIG. 8, a plurality of processing units 2 may be provided in the substrate processing apparatuses 1, 1P, and 1Q. For example, a processing unit 2A having the same configuration as the processing unit 2 described in the above embodiment is provided. The processing unit 2A is connected to a supply flow path 22A upstream of the supply valve 24 and branching from the supply flow path 22. A supply valve 24 is provided in the supply flow path 22A. An upstream end portion of the return flow path 23A separated from the return flow path 23 is connected to the processing unit 2A. The downstream end of the return flow path 23A is connected to the top portion 31 a of the circulation groove 31 in common with the return flow path 23. In the supplying step, the supply channels 22 and 22A supply the processing liquid to each of the processing units 2 and 2A. In the returning step, each of the returning channels 23, 23A and each of the processing units 2 and 2A guides the processing liquid to the circulation tank 31.

如此,於已自供給流路22供給至複數個處理單元2中之各個處理單元之處理液經由返回流路23而共通供給至循環槽31之情形時,無須針對每個處理單元2設置循環槽31。 In this way, when the processing liquid that has been supplied from the supply flow path 22 to each of the plurality of processing units 2 is commonly supplied to the circulation tank 31 via the return flow path 23, there is no need to provide a circulation tank for each processing unit 2. 31.

而且,與上述實施形態不同,亦可設置對貯存槽20內之處理液進行加熱之加熱器。利用該加熱器對貯存槽20內之處理液進行加熱,藉此循環步驟中循環流路21內之處理液得以加熱。即,亦可為對貯存槽20內之處理液進行加熱之加熱器作為溫度調節單元發揮功能之構成。 Moreover, unlike the above-mentioned embodiment, a heater for heating the processing liquid in the storage tank 20 may be provided. The heater is used to heat the treatment liquid in the storage tank 20, thereby heating the treatment liquid in the circulation flow path 21 in the circulation step. That is, the heater which heats the processing liquid in the storage tank 20 may function as a temperature adjustment means.

而且,與上述實施形態不同,處理液供給裝置3、3P、3Q亦可包含將沿循環流路21循環之處理液冷卻之冷卻器。亦可構成為:利用該冷卻器將沿循環流路21循環之處理液冷卻,或利用循環加熱器42、42A、42B、42C將沿循環流路21循環之處理液加熱,藉此對沿循環流路21循環之處理液之溫度進行調節。該情形係由循環加熱器42、42A、42B、42C及冷卻器構成溫度調節單元。而且,作為溫度調節單元,亦可設置具有加熱器及冷卻器之雙方之功能之單元。 In addition, unlike the above embodiment, the processing liquid supply devices 3, 3P, and 3Q may include a cooler that cools the processing liquid circulating along the circulation flow path 21. It can also be configured to: use the cooler to cool the processing liquid circulating along the circulation flow path 21, or use the circulation heaters 42, 42A, 42B, and 42C to heat the processing liquid circulating along the circulation flow path 21, and thereby The temperature of the processing liquid circulating in the flow path 21 is adjusted. In this case, the temperature adjustment unit is constituted by the circulation heaters 42, 42A, 42B, and 42C and a cooler. Further, as the temperature adjustment unit, a unit having functions of both a heater and a cooler may be provided.

而且,與上述實施形態不同,處理液供給裝置3、3P、 3Q亦可以是不包含下游泵51之構成。 Moreover, unlike the above-mentioned embodiment, the processing liquid supply devices 3, 3P, and 3Q may have a configuration that does not include the downstream pump 51.

已對本發明之實施形態進行了詳細說明,該等不過是用於使本發明之技術內容明確之具體例,本發明不應限定於該等具體例而作出解釋,本發明之範圍僅由隨附之申請專利範圍所限定。 The embodiments of the present invention have been described in detail. These are merely specific examples for clarifying the technical content of the present invention. The present invention should not be limited to these specific examples for explanation. The scope of the present invention is only provided by the accompanying Limited by the scope of patent applications.

該申請案係對應於2017年1月31日向日本專利廳提出之特願2017-016103號,該申請案之全部揭示藉由引用而併入本文中。 This application corresponds to Japanese Patent Application No. 2017-016103 filed with the Japan Patent Office on January 31, 2017, the entire disclosure of which is incorporated herein by reference.

Claims (15)

一種處理液供給裝置,對處理基板之處理單元供給處理液,且包含:貯存槽,貯存處理液;循環流路,使前述貯存槽內之處理液循環;供給流路,自前述循環流路對前述處理單元供給處理液;返回流路,使已供給至前述處理單元之處理液返回至前述循環流路;以及溫度調節單元,對在前述循環流路循環之處理液之溫度進行調節;前述循環流路包含連接有前述返回流路之循環槽、自前述循環流路之上游側連接至前述循環槽之上游流路、及自前述循環流路之下游側連接至前述循環槽之下游流路;處理液流經前述返回流路內之距離較處理液流經前述下游流路內之距離短。A processing liquid supply device supplies a processing liquid to a processing unit for processing a substrate, and includes: a storage tank to store the processing liquid; a circulation flow path to circulate the processing liquid in the storage tank; and a supply flow path to the circulation flow path. The processing unit supplies a processing liquid; a return flow path to return the processing liquid that has been supplied to the processing unit to the foregoing circulation flow path; and a temperature adjustment unit that adjusts the temperature of the processing liquid circulating in the circulation flow path; the foregoing cycle The flow path includes a circulation tank connected to the return flow path, an upstream flow path connected to the circulation tank from an upstream side of the circulation flow path, and a downstream flow path connected to the circulation tank from a downstream side of the circulation flow path; The distance that the processing liquid flows through the aforementioned return flow path is shorter than the distance that the processing liquid flows through the aforementioned downstream flow path. 如請求項1所記載之處理液供給裝置,其中前述循環槽包含連接有前述上游流路及前述返回流路之頂部、及連接有前述下游流路之底部。The processing liquid supply device according to claim 1, wherein the circulation tank includes a top connected to the upstream flow path and the return flow path, and a bottom connected to the downstream flow path. 如請求項2所記載之處理液供給裝置,其中進而包含:下游閥,用以開閉前述下游流路;以及閥開閉單元,用以維持關閉前述下游閥之狀態直至前述循環槽內之處理液之量達到基準量為止,於前述循環槽內之處理液之量達到前述基準量時便打開前述下游閥。The processing liquid supply device according to claim 2, further comprising: a downstream valve for opening and closing the downstream flow path; and a valve opening and closing unit for maintaining the state of closing the downstream valve until the processing liquid in the circulation tank is maintained. Until the amount reaches the reference amount, the downstream valve is opened when the amount of the processing liquid in the circulation tank reaches the reference amount. 如請求項1或2所記載之處理液供給裝置,其中設置有複數個前述處理單元;已自前述供給流路供給至複數個前述處理單元中之各個處理單元的處理液經由前述返回流路而共通地供給至前述循環槽。The processing liquid supply device according to claim 1 or 2, wherein a plurality of the aforementioned processing units are provided; and the processing liquid which has been supplied from the aforementioned supply flow path to each of the plurality of the processing units is passed through the aforementioned return flow path. It is supplied to the circulation tank in common. 如請求項1或2所記載之處理液供給裝置,其中前述循環槽配置於較前述處理單元所具有而用以收容前述基板之處理腔室的靠下方處。The processing liquid supply device according to claim 1 or 2, wherein the circulation tank is disposed lower than a processing chamber provided in the processing unit and configured to receive the substrate. 如請求項5所記載之處理液供給裝置,其中前述循環槽與前述返回流路一起收容於與前述處理腔室鄰接而配置之流路盒。The processing liquid supply device according to claim 5, wherein the circulation tank and the return flow path are housed in a flow path box disposed adjacent to the processing chamber. 如請求項1或2所記載之處理液供給裝置,其中設置有複數個前述貯存槽;前述處理液供給裝置進而包含:上游切換單元,將對前述循環槽或前述處理單元供給處理液之供給源之前述貯存槽在前述複數個貯存槽中進行切換;以及下游切換單元,以使自前述循環槽被供給處理液之供給目標之前述貯存槽與前述供給源之前述貯存槽為相同槽的方式,將前述供給目標之前述貯存槽在前述複數個貯存槽中進行切換。The processing liquid supply device according to claim 1 or 2, wherein the plurality of storage tanks are provided; the processing liquid supply device further includes an upstream switching unit that supplies a processing liquid to the circulation tank or the processing unit. The aforementioned storage tank is switched among the aforementioned plurality of storage tanks; and the downstream switching unit is configured such that the aforementioned storage tank of the supply target to which the processing liquid is supplied from the aforementioned circulation tank is the same tank as the aforementioned storage tank of the aforementioned supply source, The storage tank of the supply target is switched among the plurality of storage tanks. 一種基板處理裝置,包含:如請求項1或2所記載之處理液供給裝置;以及前述處理單元。A substrate processing apparatus includes the processing liquid supply apparatus according to claim 1 or 2 and the aforementioned processing unit. 一種處理液供給方法,對利用處理液處理基板之處理單元供給處理液,且包含:循環步驟,使貯存處理液之貯存槽內之處理液於循環流路中循環;溫度調節步驟,對前述循環流路內之處理液之溫度進行調節;供給步驟,於前述溫度調節步驟開始後,自前述循環流路對前述處理單元供給處理液;以及返回步驟,使已於前述供給步驟中供給至前述處理單元之處理液返回至前述循環流路;在前述循環步驟中,處理液依序於自前述循環流路之上游側連接至循環槽之上游流路、前述循環槽、及自前述循環流路之下游側連接至前述循環槽之下游流路中流動,前述循環槽係供已供給至前述處理單元之處理液經由返回流路返回;前述返回步驟中處理液流經前述返回流路內之距離較前述循環步驟中處理液流經前述下游流路內之距離短。A processing liquid supply method includes supplying a processing liquid to a processing unit for processing a substrate by using the processing liquid, and comprising: a circulation step of circulating a processing liquid in a storage tank storing the processing liquid in a circulation flow path; and a temperature adjustment step for the aforementioned circulation. The temperature of the processing liquid in the flow path is adjusted; the supply step is to supply the processing liquid from the circulation flow path to the processing unit after the temperature adjustment step is started; and the return step is to supply the processing liquid in the supply step to the processing The processing liquid of the unit is returned to the aforementioned circulation flow path; in the aforementioned circulation step, the treatment liquid is sequentially connected to the upstream flow path connected to the circulation tank from the upstream side of the circulation flow path, the circulation tank, and from the circulation flow path. The downstream side is connected to the downstream flow path connected to the circulation tank. The circulation tank is used for returning the processing liquid that has been supplied to the processing unit through the return flow path. In the circulation step, the distance that the treatment liquid flows through the downstream flow path is short. 如請求項9所記載之處理液供給方法,其中前述循環槽包含連接有前述上游流路及前述返回流路之頂部、及連接有前述下游流路之底部。The processing liquid supply method according to claim 9, wherein the circulation tank includes a top connected to the upstream flow path and the return flow path, and a bottom connected to the downstream flow path. 如請求項10所記載之處理液供給方法,其中進而包括閥開閉步驟,前述閥開閉步驟維持使開閉前述下游流路之下游閥關閉之狀態直至前述循環槽內之處理液之量達到基準量為止,於前述循環槽內之處理液之量達到前述基準量時便打開前述下游閥。The method for supplying a processing liquid according to claim 10, further comprising a valve opening and closing step. The valve opening and closing step maintains a state in which the downstream valve that opens and closes the downstream flow path is closed until the amount of the processing liquid in the circulation tank reaches a reference amount. When the amount of the processing liquid in the circulation tank reaches the aforementioned reference amount, the aforementioned downstream valve is opened. 如請求項9或10所記載之處理液供給方法,其中前述供給步驟包含自前述循環流路對複數個處理單元中之各個處理單元供給處理液之步驟;前述返回步驟包含將已供給至複數個處理單元中之各個處理單元的處理液經由前述返回流路而共通地供給至前述循環槽之步驟。The processing liquid supply method according to claim 9 or 10, wherein the supplying step includes a step of supplying the processing liquid from each of the plurality of processing units from the circulation flow path, and the returning step includes supplying the processed liquid to the plurality of processing units. The processing liquid of each processing unit in a processing unit is supplied to the said circulation tank in common through the said return flow path. 如請求項9或10所記載之處理液供給方法,其中前述循環槽配置於較前述處理單元所具備且收容前述基板之處理腔室靠下方處。The processing liquid supply method according to claim 9 or 10, wherein the circulation tank is disposed below a processing chamber provided in the processing unit and containing the substrate. 如請求項13所記載之處理液供給方法,其中前述循環槽與前述返回流路一起收容於與前述處理腔室鄰接配置之流路盒。The method for supplying a processing liquid according to claim 13, wherein the circulation tank and the return flow path are housed in a flow path box disposed adjacent to the processing chamber. 如請求項9或10所記載之處理液供給方法,其中進而包括切換步驟,前述切換步驟係將供給源之前述貯存槽與供給目標之前述貯存槽在複數個前述貯存槽中進行切換,以使前述供給源之前述貯存槽與前述供給目標之前述貯存槽為相同槽,其中前述供給源之前述貯存槽係對前述循環槽或前述處理單元供給處理液,而前述供給目標之前述貯存槽係自前述循環槽被供給處理液。The method for supplying a processing liquid according to claim 9 or 10, further comprising a switching step of switching the storage tank of the supply source and the storage tank of the supply target in a plurality of the storage tanks so that The storage tank of the supply source is the same tank as the storage tank of the supply target, wherein the storage tank of the supply source supplies processing liquid to the circulation tank or the processing unit, and the storage tank of the supply target is from The circulation tank is supplied with a processing liquid.
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