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TWI661200B - Probe structure - Google Patents

Probe structure Download PDF

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Publication number
TWI661200B
TWI661200B TW107125296A TW107125296A TWI661200B TW I661200 B TWI661200 B TW I661200B TW 107125296 A TW107125296 A TW 107125296A TW 107125296 A TW107125296 A TW 107125296A TW I661200 B TWI661200 B TW I661200B
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TW
Taiwan
Prior art keywords
needle
conductive
probe structure
block
needle shaft
Prior art date
Application number
TW107125296A
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Chinese (zh)
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TW202007973A (en
Inventor
馮一鳴
Original Assignee
馮一鳴
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Publication date
Application filed by 馮一鳴 filed Critical 馮一鳴
Priority to TW107125296A priority Critical patent/TWI661200B/en
Priority to CN201910344733.XA priority patent/CN110749759A/en
Application granted granted Critical
Publication of TWI661200B publication Critical patent/TWI661200B/en
Publication of TW202007973A publication Critical patent/TW202007973A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

本發明提供一種探針結構,包括:一針頭,針頭的一端為平面,針頭的另一端為球形面;一針軸,針軸的上部為圓柱體,針頭的另一端容設於針軸的上部之頂端內,針軸的下部為至少三面體,並且下部的底端具有一斜面;一導電斜塊,導電斜塊的一端具有一斜面和導電斜塊的外部為至少三面體,下部的底端之斜面與導電斜塊的一端之斜面貼合接觸,導電斜塊的另一端具有凹槽;一絕緣片,容設於導電斜塊的另一端之凹槽內;一彈性件,彈性件之一端連接至絕緣片;以及一針管,具有中空空間,其中,針管之內部周壁具有至少三平面,針軸的下部、導電斜塊、絕緣片及彈性件容設於針管之中空空間內。 The invention provides a probe structure, comprising: a needle, one end of the needle is flat, and the other end of the needle is spherical; a needle shaft, the upper part of the needle shaft is a cylinder, and the other end of the needle is accommodated in the upper part of the needle shaft Within the top end, the lower part of the needle shaft is at least a trihedron, and the bottom end of the lower part has an inclined surface; a conductive inclined block, one end of the conductive inclined block has an inclined surface, and the outside of the conductive inclined block is at least a trihedron, and the lower end of the lower part is The inclined surface is in close contact with the inclined surface of one end of the conductive inclined block, and the other end of the conductive inclined block has a groove; an insulating sheet is accommodated in the groove of the other end of the conductive inclined block; an elastic member, one end of the elastic member Connected to the insulating sheet; and a needle tube having a hollow space, wherein the inner peripheral wall of the needle tube has at least three planes, and the lower part of the needle shaft, the conductive oblique block, the insulating sheet and the elastic member are accommodated in the hollow space of the needle tube.

Description

探針結構 Probe structure

本發明係關於一種探針,尤其是關於一種探針結構。 The present invention relates to a probe, and more particularly to a probe structure.

現今於產業中常用的探針結構,如圖1及圖2所示。圖1顯示習知探針結構之立體示意圖,圖2顯示習知探針之內部組合示意圖。 Probe structures commonly used in the industry today are shown in Figures 1 and 2. FIG. 1 shows a schematic perspective view of a conventional probe structure, and FIG. 2 shows an internal assembly schematic view of a conventional probe.

如圖2所示,當使用習知探針時,習知的探針之針軸1底部為斜面2設置,彈簧3會推抵球體4,而球體4再推抵針軸1,由於針軸1的底部為斜面2設置,所以球體4會將針軸1推向針管5內的一側,使得針軸1與針管5側壁形成接觸,藉以形成一導電通路。然而,因為針管5及針軸1皆為圓柱狀,所以針軸1與針管5側壁的接觸面積小,即呈現線接觸6。 As shown in FIG. 2, when the conventional probe is used, the bottom of the needle shaft 1 of the conventional probe is provided with an inclined surface 2, and the spring 3 pushes against the sphere 4, and the sphere 4 pushes against the needle shaft 1. The bottom of 1 is provided with a bevel 2, so the sphere 4 pushes the needle shaft 1 to a side inside the needle tube 5, so that the needle shaft 1 is in contact with the side wall of the needle tube 5 to form a conductive path. However, because the needle tube 5 and the needle shaft 1 are both cylindrical, the contact area between the needle shaft 1 and the side wall of the needle tube 5 is small, that is, it shows a linear contact 6.

再者,圖3顯示圖2之A-A剖面圖。如圖3所示,導電通路都是以圓形面積的相切線接觸6,也就是說,電流的流通只有接觸在一條線的面積上,因此,有限的接觸面積會造成最大電流導通量受限,當探針頭接觸到大電流時,非常容易造成探針發熱,所以會有安全顧慮。 Furthermore, FIG. 3 shows a cross-sectional view taken along the line A-A of FIG. 2. As shown in Figure 3, the conductive paths are all contacted by tangent lines with a circular area. That is to say, the current flow only contacts the area of a line. Therefore, the limited contact area will limit the maximum current flux. When the probe head is exposed to a large current, it is very easy to cause the probe to heat up, so there will be safety concerns.

有鑑於此,如何提供一種能有效地提升針軸與針管之間的接觸面積之探針結構,進而有效地提升最大電流導通量,使探針的使用更加安全,實為當前重要課題之一。 In view of this, how to provide a probe structure that can effectively increase the contact area between the needle shaft and the needle tube, thereby effectively increasing the maximum current flux and making the use of the probe safer is one of the important issues at present.

鑒於上述習知技術的缺點,本發明之一目的在於提供一種探針結構,可使探針頭完全貼合被導通的接觸面,並且增加電流導電的接觸面積,達到防止探針燒毀的效果。 In view of the shortcomings of the above-mentioned conventional technologies, an object of the present invention is to provide a probe structure that can fully fit the probe head to the contact surface to be conducted, and increase the contact area of current conduction, so as to prevent the burnout of the probe.

為達到上述的目的,依據本發明所提供之一種探針結構,包括:一針頭,該針頭的一端為一平面,該針頭的另一端為一球形面;一針軸,該針軸的上部為一圓柱體,該針頭的另一端容設於該針軸的上部之頂端內,該針軸的下部為一至少三面體,並且該下部的底端具有一斜面;一導電斜塊,該導電斜塊的一端具有一斜面和該導電斜塊的外部為一至少三面體,該下部的底端之斜面與該導電斜塊的一端之斜面貼合接觸,該導電斜塊的另一端具有一凹槽;一絕緣片,容設於該導電斜塊的另一端之該凹槽內;一彈性件,該彈性件之一端連接至該絕緣片;以及一針管,具有一中空空間,其中,該針管之內部周壁具有至少三平面,該針軸的下部、該導電斜塊、該絕緣片及該彈性件容設於該針管之該中空空間內。 In order to achieve the above object, a probe structure provided according to the present invention includes: a needle, one end of the needle is a plane, the other end of the needle is a spherical surface; a needle shaft, an upper part of the needle shaft is A cylinder, the other end of the needle is accommodated in the top of the upper part of the needle shaft, the lower part of the needle shaft is at least a trihedron, and the bottom end of the lower part has an inclined surface; a conductive inclined block, the conductive inclined One end of the block has an inclined surface and the outside of the conductive inclined block is at least a trihedron. The inclined surface at the bottom end of the lower part is in close contact with the inclined surface of one end of the conductive inclined block. The other end of the conductive inclined block has a groove. An insulating piece accommodated in the groove at the other end of the conductive oblique block; an elastic member having one end connected to the insulating piece; and a needle tube having a hollow space, wherein the needle tube The inner peripheral wall has at least three planes. The lower part of the needle shaft, the conductive oblique block, the insulating sheet and the elastic member are accommodated in the hollow space of the needle tube.

較佳地,該針管復包括一延伸柱形體,該延伸柱形體與該針管一體成形。 Preferably, the needle tube complex includes an extended cylindrical body, and the extended cylindrical body is integrally formed with the needle tube.

較佳地,該導電斜塊為一至少三面體。 Preferably, the conductive oblique block is at least a trihedron.

較佳地,該彈性件為一彈簧。 Preferably, the elastic member is a spring.

較佳地,該針頭的一端之該平面與外部電性接觸。 Preferably, the plane at one end of the needle is in electrical contact with the outside.

1‧‧‧針軸 1‧‧‧ Needle shaft

2‧‧‧斜面 2‧‧‧ bevel

3‧‧‧彈簧 3‧‧‧spring

4‧‧‧球體 4‧‧‧ sphere

5‧‧‧針管 5‧‧‧ Needle tube

6‧‧‧線接觸 6‧‧‧ line contact

10‧‧‧針頭 10‧‧‧ Needle

15‧‧‧角度 15‧‧‧ angle

20‧‧‧針軸 20‧‧‧ Needle shaft

25‧‧‧斜面 25‧‧‧ bevel

30‧‧‧導電斜塊 30‧‧‧Conductive inclined block

301‧‧‧凹槽 301‧‧‧groove

35‧‧‧斜面 35‧‧‧ bevel

40‧‧‧絕緣片 40‧‧‧Insulation sheet

50‧‧‧彈性件 50‧‧‧elastic

60‧‧‧針管 60‧‧‧ Needle tube

601‧‧‧中空空間 601‧‧‧Hollow Space

602‧‧‧延伸柱形體 602‧‧‧Extended cylindrical body

70‧‧‧面接觸 70‧‧‧ face contact

圖1顯示習知探針之立體示意圖;圖2顯示習知探針之內部組合示意圖; 圖3顯示圖2之A-A剖面圖;圖4為依據本發明之較佳實施例,顯示一種探針結構之立體示意圖;圖5為依據本發明之較佳實施例,顯示該探針結構之立體分解示意圖;圖6為依據本發明之較佳實施例,顯示該探針結構之組合示意圖;以及圖7為依據本發明之較佳實施例,顯示圖6所示的探針結構之B-B剖面圖。 Figure 1 shows a schematic perspective view of a conventional probe; Figure 2 shows a schematic internal assembly of the conventional probe; 3 is a cross-sectional view taken along the line AA of FIG. 2; FIG. 4 is a schematic perspective view showing a probe structure according to a preferred embodiment of the present invention; and FIG. 5 is a perspective view showing a probe structure according to a preferred embodiment of the present invention Exploded schematic diagram; FIG. 6 is a schematic diagram showing a combination of the probe structure according to a preferred embodiment of the present invention; and FIG. 7 is a BB sectional view showing the probe structure shown in FIG. 6 according to a preferred embodiment of the present invention .

以下係藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。本發明亦可藉由其他不同的具體實例加以施行或應用,本發明說明書中的各項細節亦可基於不同觀點與應用在不悖離本發明之精神下進行各種修飾與變更。 The following is a description of specific embodiments of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various details in the description of the present invention can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention.

依據本發明之較佳實施例,圖4顯示一種探針結構之立體示意圖,圖5顯示該探針結構之立體分解示意圖。如圖5所示,本發明之探針結構包括一針頭10、一針軸20、一導電斜塊30、一絕緣片40、一彈性件50及一針管60。 According to a preferred embodiment of the present invention, FIG. 4 shows a three-dimensional schematic diagram of a probe structure, and FIG. 5 shows a three-dimensional exploded schematic diagram of the probe structure. As shown in FIG. 5, the probe structure of the present invention includes a needle 10, a needle shaft 20, a conductive oblique block 30, an insulating sheet 40, an elastic member 50, and a needle tube 60.

其中,針頭10的一端為一平面,也可為其他形狀,但非限制本發明,而針頭10的另一端為一球形面。因此,針頭10之球形面的一端可調整針頭的角度15,使針頭10之平面的一端可以與導通接觸面完全貼合。 Wherein, one end of the needle 10 is a flat surface, and may have other shapes, but the invention is not limited thereto, and the other end of the needle 10 is a spherical surface. Therefore, one end of the spherical surface of the needle 10 can adjust the angle 15 of the needle, so that one end of the flat surface of the needle 10 can completely fit the conducting contact surface.

依據本發明之較佳實施例,如圖5所示,針軸20的上部為一圓柱體,針頭10的另一端可容設於針軸20的上部之頂端內,而針軸20的下部為一至少三面體(最佳為一四面體),並且該下部的底端具有一斜面25。 According to a preferred embodiment of the present invention, as shown in FIG. 5, the upper part of the needle shaft 20 is a cylinder, the other end of the needle 10 can be accommodated in the top of the upper part of the needle shaft 20, and the lower part of the needle shaft 20 is An at least trihedron (preferably a tetrahedron), and the lower end of the lower part has an inclined surface 25.

依據本發明之較佳實施例,導電斜塊30的一端亦具有一斜面和導電斜塊30的外部為至少三面體。,針軸20之下部的底端之斜面25與導電斜塊30的一端之斜面35貼合接觸,可以增加電流流至針管60的相對面,使導電面積有效地增加,另外,導電斜塊30的另一端具有一凹槽301 According to a preferred embodiment of the present invention, one end of the conductive inclined block 30 also has an inclined surface, and the outside of the conductive inclined block 30 is at least a trihedron. The inclined surface 25 at the bottom end of the lower part of the needle shaft 20 is in close contact with the inclined surface 35 at one end of the conductive inclined block 30, which can increase the current flow to the opposite surface of the needle tube 60 and effectively increase the conductive area. In addition, the conductive inclined block 30 The other end has a groove 301

依據本發明之較佳實施例,絕緣片40可容設於導電斜塊30的另一端之該凹槽301內。此外,彈性件50之一端可連接至絕緣片40。 According to a preferred embodiment of the present invention, the insulating sheet 40 can be accommodated in the groove 301 at the other end of the conductive slanting block 30. In addition, one end of the elastic member 50 may be connected to the insulating sheet 40.

依據本發明之較佳實施例,針管60具有一中空空間601,其中,針管60之中空空間601的周壁具有至少三平面(最佳為四平面中空空間),針軸20的下部、30導電斜塊、絕緣片40及彈性件50均容設於針管60之該中空空間601內。 According to a preferred embodiment of the present invention, the needle tube 60 has a hollow space 601. The peripheral wall of the hollow space 601 of the needle tube 60 has at least three planes (preferably a four-plane hollow space). The block, the insulating sheet 40 and the elastic member 50 are all accommodated in the hollow space 601 of the needle tube 60.

值得一提的是,如圖5所示,本發明之針管60復可包括一延伸柱形體602,該延伸柱形體602與針管60為一體成形。 It is worth mentioning that, as shown in FIG. 5, the needle tube 60 of the present invention may include an extended cylindrical body 602 which is integrally formed with the needle tube 60.

依據本發明之較佳實施例,如圖5所示,針管60之延伸柱形體602及針頭10之平面的一端可直接與外部電性接觸。 According to a preferred embodiment of the present invention, as shown in FIG. 5, the extended cylindrical body 602 of the needle tube 60 and one end of the flat surface of the needle 10 can be directly in electrical contact with the outside.

順便一提,如圖5所示,導電斜塊30亦為一至少三面體(最佳為一四面體),並且彈性件50可為一彈簧。 Incidentally, as shown in FIG. 5, the conductive inclined block 30 is also an at least trihedron (preferably a tetrahedron), and the elastic member 50 may be a spring.

圖6顯示本發明的探針結構之組合示意圖;以及圖7顯示圖6所示的探針結構之B-B剖面圖。如圖7所示,由於針軸20的下部為一至少三面體(最佳為一四面體)以及導電斜塊30亦為一至少三面體(最佳為一四面體),針軸20的下部及導電斜塊30可與針管60之中空空間601的周壁面積接觸(亦即呈面接觸70;也就是與導電斜塊30的外部之至少三面體呈面接觸),進而有效地增加接觸面積,可達到最大電流導通量,並且可有效地防止因探 針過熱所造成的損壞。 FIG. 6 shows a combined schematic view of the probe structure of the present invention; and FIG. 7 shows a B-B cross-sectional view of the probe structure shown in FIG. 6. As shown in FIG. 7, since the lower part of the needle shaft 20 is an at least trihedron (preferably a tetrahedron) and the conductive oblique block 30 is also an at least trihedron (preferably a tetrahedron), the needle shaft 20 The lower part and the conductive slant block 30 can be in contact with the peripheral wall area of the hollow space 601 of the needle tube 60 (that is, face contact 70; that is, face contact with at least the trihedron outside the conductive slant block 30), thereby effectively increasing contact. Area, can reach the maximum current flux, and can effectively prevent Damage caused by needle overheating.

綜上所述,本發明所提供的一種探針結構,具有以下優點,由於本發明之探針結構是由針頭(分別具有平面端及球形端)、針軸、導電斜塊(可為四面體)、絕緣片、彈性件及針管(具有四平面中空空間)所組成,所以本發明之探針結構可讓使用者使用探針進行大電流接觸的情況下,可達到最大電流導通量的效果,並且可有效地防止因探針過熱所造成的損壞。 In summary, the probe structure provided by the present invention has the following advantages, because the probe structure of the present invention is composed of a needle (which has a flat end and a spherical end respectively), a needle shaft, and a conductive oblique block (which can be a tetrahedron) ), An insulating sheet, an elastic piece, and a needle tube (having a four-plane hollow space), so the probe structure of the present invention allows the user to achieve the effect of maximum current flux under the condition of large current contact using the probe. And can effectively prevent damage caused by probe overheating.

然而,上述實施例僅例示性說明本發明之功效,而非用於限制本發明,任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與改變。此外,在上述該些實施例中之元件的數量僅為例示性說明,亦非用於限制本發明。因此本發明之權利保護範圍,應如以下之申請專利範圍所列。 However, the above-mentioned embodiments merely illustrate the effectiveness of the present invention, but are not intended to limit the present invention. Any person skilled in the art can modify and change the above-mentioned embodiments without departing from the spirit and scope of the present invention. . In addition, the number of components in the above-mentioned embodiments is merely illustrative, and is not intended to limit the present invention. Therefore, the scope of protection of the rights of the present invention should be listed in the following patent application scope.

Claims (6)

一種探針結構,包括:一針頭,該針頭的一端為一平面,該針頭的另一端為一球形面;一針軸,該針軸的上部為一圓柱體,該針頭的另一端容設於該針軸的上部之頂端內,該針軸的下部為一至少三面體,並且該下部的底端具有一斜面;一導電斜塊,該導電斜塊的一端具有一斜面,該下部的底端之斜面與該導電斜塊的一端之斜面貼合接觸,該導電斜塊的另一端具有一凹槽;一絕緣片,容設於該導電斜塊的另一端之該凹槽內;一彈性件,該彈性件之一端連接至該絕緣片;以及一針管,具有一中空空間,其中,該針管之該中空空間的周壁具有至少三平面,該針軸的下部、該導電斜塊、該絕緣片及該彈性件容設於該針管之該中空空間內。A probe structure includes: a needle, one end of the needle is a plane, the other end of the needle is a spherical surface, a needle shaft, an upper part of the needle shaft is a cylinder, and the other end of the needle is accommodated in Within the top of the upper part of the needle shaft, the lower part of the needle shaft is at least a trihedron, and the bottom end of the lower part has an inclined surface; a conductive inclined block, one end of the conductive inclined block has an inclined surface, and the lower end of the lower part The inclined surface is in close contact with the inclined surface of one end of the conductive inclined block, and the other end of the conductive inclined block has a groove; an insulating sheet is accommodated in the groove of the other end of the conductive inclined block; an elastic member One end of the elastic member is connected to the insulating sheet; and a needle tube having a hollow space, wherein a peripheral wall of the hollow space of the needle tube has at least three planes, a lower part of the needle shaft, the conductive oblique block, the insulating sheet And the elastic member is accommodated in the hollow space of the needle tube. 如申請專利範圍第1項所述之探針結構,其中,該針管復包括一延伸柱形體,該延伸柱形體與該針管一體成形。The probe structure according to item 1 of the scope of patent application, wherein the needle tube comprises an extended cylindrical body, and the extended cylindrical body is integrally formed with the needle tube. 如申請專利範圍第2項所述之探針結構,其中,該延伸柱形體與外部電性接觸。The probe structure according to item 2 of the patent application scope, wherein the extended cylindrical body is in electrical contact with the outside. 如申請專利範圍第1項所述之探針結構,其中,該導電斜塊為一至少三面體。The probe structure according to item 1 of the patent application scope, wherein the conductive oblique block is at least a trihedron. 如申請專利範圍第1項所述之探針結構,其中,該彈性件為一彈簧。The probe structure according to item 1 of the patent application scope, wherein the elastic member is a spring. 如申請專利範圍第1項所述之探針結構,其中,該針頭的一端之該平面與外部電性接觸。The probe structure according to item 1 of the scope of patent application, wherein the plane at one end of the needle is in electrical contact with the outside.
TW107125296A 2018-07-23 2018-07-23 Probe structure TWI661200B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM309101U (en) * 2006-09-20 2007-04-01 Chin-Chuan Lu Improvement of probe structure
WO2013035399A1 (en) * 2011-09-05 2013-03-14 株式会社島野製作所 Contact terminal
WO2014156531A1 (en) * 2013-03-27 2014-10-02 株式会社エンプラス Electric contact and electric component socket

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CN202042667U (en) * 2011-03-29 2011-11-16 富士康(昆山)电脑接插件有限公司 Probe connector
CN107534236A (en) * 2016-02-29 2018-01-02 华为技术有限公司 A kind of probe adapter single needle and probe adapter
TWI592666B (en) * 2016-09-12 2017-07-21 中華精測科技股份有限公司 Slide probe
CN206432435U (en) * 2017-01-16 2017-08-22 深圳市爱默斯科技有限公司 A kind of syringe needle adds insulated plastic formula probe adapter
CN107732514A (en) * 2017-11-21 2018-02-23 东莞市星全工业有限公司 Spring probe

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM309101U (en) * 2006-09-20 2007-04-01 Chin-Chuan Lu Improvement of probe structure
WO2013035399A1 (en) * 2011-09-05 2013-03-14 株式会社島野製作所 Contact terminal
WO2014156531A1 (en) * 2013-03-27 2014-10-02 株式会社エンプラス Electric contact and electric component socket

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