TWI539170B - Test fixture and its method of operation - Google Patents

Description

Test fixture and its operation method

The present invention relates to a test fixture and an operation method thereof, and more particularly to a test fixture for antenna testing and a method of operating the same.

The production line has the advantage of reducing costs and improving efficiency. It is a necessary system for all manufacturers. However, rapid and large-scale manufacturing is usually accompanied by the risk of quality degradation. Therefore, at the same time of mass production, the testing of terminal products is a critical one. Process.

For example, for antenna products such as GPS, WIFI, etc., it is necessary to pay attention to the standard size specifications and the accuracy of the positioning signals. Such product testing must take into account the testing standards of software and hardware. If it has been tested by humans in the past, it must be equivalent. Time-consuming and incapable of taking into account the quality of the test, in order to allow the operator to quickly complete the test work, the appropriate test fixture is needed to achieve the goal.

Therefore, how to balance quality and efficiency in the product testing phase is an urgent problem to be solved in the industry.

In order to solve the problems of the prior art, the present invention provides a test fixture for wireless signal antenna testing, comprising at least a first substrate having a first line card slot; and a second substrate parallel to the first substrate, a card slot and a second line card slot communicating with the card slot; The support member is fixed to one end of the first substrate; the second support member is fixed on the other end of the first substrate opposite to the first support member, and is oppositely connected to the opposite surface of the surface of the first substrate, And connecting to one end of the second substrate; two positioning blocks are fixed on the same surface of the second substrate; and the test board is respectively pivotally connected to the corresponding positioning block The test board includes: a first groove having a third line card slot connected; a second groove having a fourth line card slot connected; and a through hole extending through the first groove The second groove, wherein the first groove and the second groove are respectively formed on the upper and lower corresponding faces of the test board, and wherein the second, third and fourth line card slots respectively The first line card slots are connected.

In one form of the invention, the test board is in parallel with the second substrate The position of the first groove and the second groove of the test board overlaps with the position of the card slot of the second substrate.

In one form of the invention, the third support member is further included, and the third support member The first side portion is fixed to one side of the second substrate, and the second side portion is vertically fixed to one end of the first side portion and is parallel to the second substrate.

In one form of the invention, the third support member includes a built-in wireless signal. a wireless signal module of the connector, the wireless signal module being located at the second side and aligned downwardly with the first groove.

In one form of the invention, the test board and the two positioning blocks are coupled in a shaft connection, and the test board is inverted by the axial line formed by the two positioning blocks.

In one form of the invention, the first substrate includes at least one line snap.

In one form of the invention, the third support member includes a fixing hook disposed on a side of the first side portion.

In one form of the invention, the test board includes: a third groove, the setting a side of the test board; and a tenon disposed at one end of the test board opposite to the second support member, wherein the tenon is turned over to the side of the third support member Used to hook up with the fixed hook.

The present invention provides a method for operating the test fixture, including the following steps Step: the test board is turned upward toward the first side of the third support member by the axial line formed by the two positioning blocks, and the fixing hook is used when approaching the first side of the third supporting member The test board is fixed and fixed; the standard workpiece and the wiring thereof are respectively placed in the card slot of the second substrate, the second line card slot and the first line card slot; the fixed hook on the first side portion The test plate is flipped downwards away from the protrusion of the test board, so that the second groove and the fourth line card slot respectively cover the standard workpiece and the wiring thereof; and the test workpiece and the wiring thereof are respectively placed The first groove, the third line card slot and the first line card slot, such that the test workpiece and its wiring are overlapped with the standard workpiece and its wiring, and the test workpiece is aligned upwardly at the first The wireless signal module; and the signal test and size specification check of the test workpiece.

In one form of the invention, the step (d) is performed on the test workpiece and When the wiring is overlapped with the standard workpiece and its wiring, at least one of the wires is buckled to the first line card slot.

Compared with the prior art, the test fixture provided by the invention and the operation method thereof can It is enough to improve the testing speed and accuracy of the wireless signal antenna, and the quantitative production equipment can improve the overall production efficiency, and at the same time take into consideration the test quality. In addition, the test fixture provided by the invention is convenient to process and low in cost, and the operation mode is simple and simple. Can guarantee the stability of the test.

100‧‧‧Test fixture

1‧‧‧Substrate

11‧‧‧First substrate

111‧‧‧ line buckle

12‧‧‧second substrate

121‧‧‧ card slot

122‧‧‧Line card slot

2‧‧‧Support

21‧‧‧First support

22‧‧‧second support

23‧‧‧ Third support

231‧‧‧ first side

232‧‧‧ second side

233‧‧‧Wireless Signal Module

2331‧‧‧Wireless signal connector

234‧‧‧Fixed hook

3‧‧‧ Positioning block

4‧‧‧ test board

41‧‧‧Longside

42‧‧‧ Short side

43‧‧‧First groove

431‧‧‧Tongkong

432‧‧‧Line card slot

44‧‧‧second groove

441‧‧‧Line card slot

45‧‧‧ third groove

46‧‧‧榫

5‧‧‧Line card slot

Figure 1 is a schematic view showing the structure of a first embodiment of the test fixture of the present invention.

Figure 2 is a schematic view showing the structure of a second embodiment of the test fixture of the present invention.

Figure 3 is a schematic diagram of a wireless signal module of the test fixture of the present invention.

The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.

It is to be understood that the structure, the proportions, the size and the like of the drawings are only used in conjunction with the disclosure of the specification for the understanding and reading of those skilled in the art, and are not intended to limit the implementation of the present invention. The conditions are limited, so it is not technically meaningful. Any modification of the structure, change of the proportional relationship or adjustment of the size should fall within the present invention without affecting the effects and the achievable objectives of the present invention. The technical content disclosed can be covered. In the meantime, the terms "upper", "inside", "outside", "bottom" and "one" are used in this specification for convenience of description and are not intended to limit the invention. The scope, the change or adjustment of its relative relationship, is also considered to be the scope of implementation of the present invention in the absence of substantial changes in the technical content.

Please refer to FIG. 1 and FIG. 2 together, which are schematic diagrams showing the structure of the first embodiment of the test fixture of the present invention and the structure of the second embodiment. The test fixture 100 of the present invention mainly comprises a substrate 1, a support member 2, two positioning blocks 3, a test board 4 and a line card slot 5. The substrate 1 includes a first substrate 11 and a second substrate 12 which are parallel to each other. The second substrate 12 has a card slot 121; the support member 2 includes a first support member 21 fixed to one end of the first substrate 11, and is fixed to the first base The plate 11 is opposite to the second support 22 at the other end of the first support member 21, and the second support member 22 is connected to one end of the second substrate 12 to the opposite side of the face opposite to the first substrate 11, in other words, The first substrate 11 and the second substrate 12 are respectively connected to opposite faces of the second support member 22.

As shown in FIG. 2, the two positioning blocks 3 are fixed on the same surface of the second substrate 12. The two sides of the test board 4 are pivotally connected to the corresponding positioning blocks 3, respectively. Preferably, the test board 4 can be a convex plate having opposite lengths and two sides, and the two sides of the short side 42 are respectively pivotally connected to the corresponding positioning blocks 3, so that the test board 4 is parallel to the second substrate 12, parallel. The first substrate 11 is coplanar with the second substrate 12, and further, the test board 4 further includes a first recess 43 and a second recess 44 on the upper and lower corresponding surfaces, and the first recess 43 and the second recess 44 A through hole 431 is formed between the first groove 43 and the second groove 44.

The test board 4 is formed with one of the first recesses 43 and is formed to be connected with the first recess 43 The line card slot 432 is formed, and one of the second recesses 44 of the test board 4 is formed with a line card slot 441 communicating with the second recess 44. A line card slot 122 that communicates with the card slot 121 is formed on one side of the second substrate 12 on which the card slot 121 is formed.

The line card slot 5 is connected to the first substrate 11, the first support 21, and the second Support member 22. The line card slots 432, 441, and 122 communicate with the line card slot 5, respectively, such that the first substrate 11, the second support 22, and the second substrate 12 communicate with the test board 4.

The first groove 43 is used for placing the test workpiece, and the card slot 121 is used for placing the standard. The workpiece, and the second recess 44 is used to cover the standard workpiece that has been placed in the card slot 121. When the test board 4 is in parallel with the second substrate 12 and is coplanar with the first substrate 11, the test board 4 The positions of the first recess 43 and the second recess 44 may be superposed on the upper and lower sides of the slot 121 of the second substrate 12 for the test workpiece and the placement card placed in the first recess 43. The standard workpiece of the slot 121 is overlapped to Compare size specifications.

Preferably, the test fixture 100 of the present invention may further include a third support member 23, The third support member 23 includes a first side portion 231 disposed on one side of the second substrate 12, and a second side portion 232 vertically fixed to one end of the first side portion 231 and parallel to the second substrate 12. In other words, the first side portions 231 are perpendicular to the second substrate 12 and the second side portions 232, respectively, and the second side portions 232 are parallel to the second substrate 12. The third support member 23 may include a wireless signal module 233 located at the second side portion 232 and having a built-in wireless signal connector 2331.

Please refer to FIG. 3, which is a schematic diagram of the wireless signal module of the test fixture of the present invention. The wireless signal module 233 can be aligned downwardly to the first recess 43 of the test board 4, and the wireless signal connector 2331 is a signal transmitting end. When the test workpiece is placed in the first recess 43, the upward facing The quasi-wireless signal module 233 performs signal testing. In this embodiment, the wireless signal module 233 can be a GPS signal module, and the wireless signal connector 2331 can be a corresponding GPS signal connector, but is not limited thereto.

The manner in which the test board 4 and the two positioning blocks 3 are engaged can be connected by means of a shaft The bonding is performed, and after the shaft connecting structure is formed, the test board 4 can be turned counterclockwise or clockwise around the axis line formed by the two positioning blocks 3.

In an embodiment of the invention, the first substrate 11 can selectively include two lines. The buckle 111 is used to clamp the wiring of the test workpiece placed in the line card slot 5, and in the implementation structure of the test fixture 100 shown in FIGS. 1 and 2, the two lines are buckled. 111 is a preferred embodiment, but the number can be adjusted according to actual needs.

In another embodiment of the present invention, the third support member 23 can optionally include a solid The fixing hook 234 is disposed on a side of the first side portion 231, and the fixing hook 234 can be a rotary structure.

In addition, the test board 4 optionally includes a relative to the test board 4 a third recess 45 on one side of the second substrate 12, and a tenon 46 disposed on a side of the test board 4 opposite to one of the second support members 22, the third recess 45 being available for the user to flip the test board 4 When the test piece 4 is turned up to the first side portion 231 of the third support member 23, the user can use the fixing hook 234 to hook the tenon 46 to fix it. Test board 4.

Please continue to refer to Figures 1 and 2, as shown in the figure, the above test of the present invention The operation method of the device 100 includes the following steps: first, the test board 4 is turned up toward the first side portion 231 of the third support member 23 by the axial line formed by the two positioning blocks 3, when approaching the third support member 23 When the one side portion 231 is used, the fixing hook 234 is used to hook the tenon 46 located on the side of the test board 4, thereby fixing the test board 4 to the third supporting member 23; then the standard workpiece and its wiring are respectively placed in the second portion The card slot 121 of the substrate 12 and the line card slot 122 and the line card slot 5 of the first substrate 11; the fixing hook 234 on the first side portion 231 is separated from the tab 46 of the test board 4 to lower the test board 4 Inverting, the second groove 44 located on the lower surface of the test board 4 covers the standard workpiece; after that, the test workpiece and its wiring are placed in the first groove 43 and the line card on the upper surface of the test board 4. The slot 432 and the line card slot 5 of the first substrate 11 are arranged such that the test workpiece and its wiring are overlapped with the standard workpiece and its wiring. In this case, the wiring is fixed in the line card slot 5 so as not to fall off. At least one line buckle 111 of a substrate 11 catches the line card slot 5, and at the same time, the test workpiece is aligned upwardly at the The wireless signal module 2331 on the second side portion 232 of the three support members 23; finally, the signal test and size specification check of the test workpiece are started.

In summary, the antenna test fixture provided by the present invention includes a substrate supported by Piece, two positioning blocks, test board and line position card slot for placing standard workpiece wiring and test workpiece wiring, and the substrate and the support member respectively have card slots and grooves for overlapping standard workpieces and testing The workpiece is used to confirm the size specification of the antenna product. In addition, the signal function of the product can be tested by the wireless signal module on the support member. Through such a test fixture, the test of the product can be fast and accurate. The purpose of the project is to increase overall capacity.

The above embodiments are intended to illustrate the principles of the present invention and its effects, and are not intended to limit the present invention. Any of the above-described embodiments may be modified by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.

100‧‧‧Test fixture

1‧‧‧Substrate

11‧‧‧First substrate

111‧‧‧ line buckle

12‧‧‧second substrate

2‧‧‧Support

21‧‧‧First support

22‧‧‧second support

23‧‧‧ Third support

231‧‧‧ first side

232‧‧‧ second side

2331‧‧‧Wireless signal connector

234‧‧‧Fixed hook

3‧‧‧ Positioning block

41‧‧‧Longside

42‧‧‧ Short side

43‧‧‧First groove

431‧‧‧Tongkong

432‧‧‧Line card slot

45‧‧‧ third groove

46‧‧‧榫

5‧‧‧Line card slot

Claims (10)

A test fixture includes: a first substrate having a first line card slot; a second substrate parallel to the first substrate, having a card slot and a second line card slot communicating with the card slot; a support member is fixed to one end of the first substrate; the second support member is fixed on the other end of the first substrate opposite to the first support member, and is oppositely connected to the opposite surface of the surface of the first substrate And connecting to one end of the second substrate; two positioning blocks are fixed on opposite sides of the same surface of the second substrate; and the test board is respectively pivotally connected to the corresponding positioning a test block comprising: a first groove having a third line card slot connected thereto; a second groove having a fourth line card slot connected thereto; and a through hole extending through the first groove And the second groove, wherein the first groove and the second groove are respectively formed on the upper and lower corresponding faces of the test board, wherein the second, third and fourth line card slots respectively The first line card slots are connected. The test fixture of claim 1, wherein the position of the first groove and the second groove of the test plate and the second substrate are when the test board is in parallel with the second substrate The position of the card slot is superposed on top of each other. The test fixture of claim 2, further comprising a third support member, the third support member comprising: The first side portion is fixed to one side of the second substrate; and the second side portion is vertically fixed to one end of the first side portion and is parallel to the second substrate. The test fixture of claim 3, wherein the third support member comprises a wireless signal module with a built-in wireless signal connector, the wireless signal module being located at the second side and aligned downward The first groove. The test fixture of claim 4, wherein the test board and the two positioning blocks are coupled in a shaft connection, and the test board is inverted by the axial line formed by the two positioning blocks. The test fixture of claim 4, wherein the first substrate comprises at least one line buckle. The test fixture of claim 3, wherein the third support member comprises a fixing hook disposed on a side of the first side portion. The test fixture of claim 7, wherein the test panel comprises: a third groove disposed on one side of the test board; and a tenon disposed on the test board opposite to the second One end of the position of the support member, wherein the protrusion is used to hook with the fixed hook when the test board is turned to be close to a side of the third support member. A method for operating a test fixture according to claim 1, comprising the steps of: (a) directing the test board with the axis line formed by the two positioning blocks toward the first side of the third support member; The portion is turned upside down, and when the first side portion of the third support member is close to the first side portion, the test board is fixed by hooking the fixing hook; (b) the standard workpiece and the wiring thereof are respectively placed in the card slot of the second substrate, The second line card slot And the first line position card slot; (c) removing the fixing hook on the first side portion from the protrusion of the test board to flip the test board downward, and the second groove and the fourth line position The card slot covers the standard workpiece and its wiring respectively; (d) the test workpiece and its wiring are respectively placed in the first groove, the third line card slot and the first line card slot, so that the test workpiece And the wiring is overlapped with the standard workpiece and its wiring, and the test workpiece is aligned upwardly at the wireless signal module; and (e) the signal test and size specification of the test workpiece are started. The operation method of claim 9, wherein the step (d) causes at least one of the line buckles to be stuck to the first when the test workpiece and the wiring thereof are overlapped with the standard workpiece and the wiring thereof Line card slot.