TWI512297B - - Google Patents

Info

Publication number: TWI512297B
Authority: TW; Taiwan

Application number

TW103116505A

Other versions

TW201543039A (zh

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2014-05-09

Filing date

2014-05-09

Publication date

2015-12-11

2014-05-09 Application filed filed Critical

2014-05-09 Priority to TW103116505A priority Critical patent/TW201543039A/zh

2015-05-04 Priority to US14/702,764 priority patent/US20150323566A1/en

2015-05-07 Priority to KR2020150002909U priority patent/KR20150004160U/ko

2015-05-07 Priority to ITVI2015U000022U priority patent/ITVI20150022U1/it

2015-05-08 Priority to JP2015002253U priority patent/JP3198767U/ja

2015-11-16 Publication of TW201543039A publication Critical patent/TW201543039A/zh

2015-12-11 Application granted granted Critical

2015-12-11 Publication of TWI512297B publication Critical patent/TWI512297B/zh

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M7/00—Conversion of AC power input into DC power output; Conversion of DC power input into AC power output
- H02M7/42—Conversion of DC power input into AC power output without possibility of reversal
- H02M7/44—Conversion of DC power input into AC power output without possibility of reversal by static converters
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
General Engineering & Computer Science (AREA)
Power Engineering (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Measuring Leads Or Probes (AREA)

TW103116505A 2014-05-09 2014-05-09 用於測試探針卡之轉換卡 TW201543039A (zh)

Priority Applications (5)

Application Number	Priority Date	Filing Date	Title
TW103116505A TW201543039A (zh)	2014-05-09	2014-05-09	用於測試探針卡之轉換卡
US14/702,764 US20150323566A1 (en)	2014-05-09	2015-05-04	Conversion card for use with probe card
KR2020150002909U KR20150004160U (ko)	2014-05-09	2015-05-07	프로브 카드 시험용 전환 카드
ITVI2015U000022U ITVI20150022U1 (it)	2014-05-09	2015-05-07	Scheda di conversione da utilizzare con probe card
JP2015002253U JP3198767U (ja)	2014-05-09	2015-05-08	プローブカードテスト用の変換カード

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
TW103116505A TW201543039A (zh)	2014-05-09	2014-05-09	用於測試探針卡之轉換卡

Publications (2)

Publication Number	Publication Date
TW201543039A TW201543039A (zh)	2015-11-16
TWI512297B true TWI512297B (zh)	2015-12-11

Family

ID=53718250

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW103116505A TW201543039A (zh)	2014-05-09	2014-05-09	用於測試探針卡之轉換卡

Country Status (5)

Country	Link
US (1)	US20150323566A1 (zh)
JP (1)	JP3198767U (zh)
KR (1)	KR20150004160U (zh)
IT (1)	ITVI20150022U1 (zh)
TW (1)	TW201543039A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN106707053B (zh) *	2016-11-15	2019-04-30	中国电子科技集团公司第四十一研究所	一种提高矢量网络分析仪高速链路测试能力的系统及方法
US11226353B2 (en)	2017-03-31	2022-01-18	Intel Corporation	Integrated cable probe design for high bandwidth RF testing
CN111103565B (zh) *	2019-12-11	2022-03-01	国网天津市电力公司电力科学研究院	一种基于智能电能表计量误差分析的数据变换方法及系统
CN116298473B (zh) *	2023-05-17	2023-08-08	湖南大学	芯片引脚电压的非接触测量方法、装置、设备和介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TW201126168A (en) *	2010-01-21	2011-08-01	Mpi Corp	Probe card and printed circuit board applicable to the same
TW201209420A (en) *	2010-08-31	2012-03-01	Hermes Testing Solutions Inc	Probe card structure adaptable to different test apparatuses having different specifications

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7349223B2 (en) *	2000-05-23	2008-03-25	Nanonexus, Inc.	Enhanced compliant probe card systems having improved planarity
US7742307B2 (en) *	2008-01-17	2010-06-22	Raytheon Company	High performance power device
EP2574949A3 (en) *	2011-09-30	2013-10-30	Kabushiki Kaisha Toshiba	Photovoltaic panel diagnosis device, method and program

2014
- 2014-05-09 TW TW103116505A patent/TW201543039A/zh not_active IP Right Cessation
2015
- 2015-05-04 US US14/702,764 patent/US20150323566A1/en not_active Abandoned
- 2015-05-07 KR KR2020150002909U patent/KR20150004160U/ko not_active Ceased
- 2015-05-07 IT ITVI2015U000022U patent/ITVI20150022U1/it unknown
- 2015-05-08 JP JP2015002253U patent/JP3198767U/ja not_active Expired - Fee Related

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TW201126168A (en) *	2010-01-21	2011-08-01	Mpi Corp	Probe card and printed circuit board applicable to the same
TW201209420A (en) *	2010-08-31	2012-03-01	Hermes Testing Solutions Inc	Probe card structure adaptable to different test apparatuses having different specifications

Also Published As

Publication number	Publication date
ITVI20150022U1 (it)	2016-11-07
TW201543039A (zh)	2015-11-16
US20150323566A1 (en)	2015-11-12
KR20150004160U (ko)	2015-11-18
JP3198767U (ja)	2015-07-23

Publication	Publication Date	Title
BR112016009890A2 (zh)	2017-08-01
BR112016018088A2 (zh)	2017-08-08
BR112016018633A2 (zh)	2017-08-08
BR112016015605A2 (zh)	2017-08-08
BR112016018929A2 (zh)	2017-08-15
BR112016013151A2 (zh)	2017-08-08
BR112016017899A2 (zh)	2017-08-08
BR112016018705A2 (zh)	2017-08-08
BR112016015666A2 (zh)	2017-08-08
BR112016017413A2 (zh)	2017-08-08
BR112016015779A2 (zh)	2017-08-08
BR112016000107A2 (zh)	2017-07-25
BR112016016028A2 (zh)	2017-08-08
BR112016003522A2 (zh)	2017-08-01
BR112016017739A2 (zh)	2017-08-08
BR112016004202A2 (zh)	2017-08-01
BR112016018686A2 (zh)	2017-08-08
BR112016017378A2 (zh)	2017-08-08
BR112016010016A2 (zh)	2017-08-01
BR112016015896A2 (zh)	2017-08-08
BR112016017665A2 (zh)	2017-08-08
BR112016015154A2 (zh)	2017-08-08
TWI512297B (zh)	2015-12-11
BR112016018782A2 (zh)	2017-08-08
BR112016018822A2 (zh)	2017-08-15

Legal Events

Date	Code	Title	Description
2019-09-11	MM4A	Annulment or lapse of patent due to non-payment of fees