TWI509978B - Crystal controlled oscillator and oscillator apparatus - Google Patents
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Description
本發明是有關於一種晶體控制振盪器(crystal controlled oscillator),該晶體控制振盪器對晶體振子(crystal oscillator)所處的環境的溫度進行檢測,基於溫度的檢測結果來對加熱部進行控制,使上述環境的溫度保持固定。The present invention relates to a crystal controlled oscillator that detects a temperature of an environment in which a crystal oscillator is placed, and controls a heating portion based on a temperature detection result. The temperature of the above environment remains fixed.
當將晶體控制振盪器裝入至需要極高的頻率穩定度的應用系統(application)時,通常一般是使用恆溫槽控制晶體控制振盪器(Oven Controlled Crystal Oscillator,OCXO)。OCXO中的溫度控制是使用熱敏電阻(thermistor)作為溫度檢測器,且使用運算放大器(operational amplifier)、電阻、電容器(condenser)等分立(discrete)零件而構成,但由於類比(analog)零件各自的偏差或隨著時間的變化,例如無法進行±20m℃的溫度控制。When a crystal controlled oscillator is loaded into an application requiring extremely high frequency stability, it is common to use an Oven Controlled Crystal Oscillator (OCXO). Temperature control in OCXO uses a thermistor as a temperature detector and uses discrete components such as operational amplifiers, resistors, and condensers, but because of the analog parts. The deviation or change with time, for example, temperature control of ±20m °C is not possible.
然而,於基地台(base station)或中繼站(relay station)等中,需要廉價地使用穩定度極高的時脈信號(clock signal),因此,可預料以先前的OCXO難以應對的狀況。However, in a base station, a relay station, or the like, it is necessary to inexpensively use a clock signal having an extremely high stability. Therefore, it is expected that the previous OCXO is difficult to cope with.
於專利文獻1的圖2及圖3中,揭示了將兩對電極設置於共用的晶體片而構成2個晶體振子(晶體共振子)。又,於段落0018中揭示了與如下的方法相同的方法,即,由於根據溫度變化,2個晶體振子之間會出現頻率差,因此,藉由對該頻率差進行測量來對溫度進行測量。而且, 將上述頻率差△f與應修正的頻率的量的關係記憶於唯讀記憶體(Read Only Memory,ROM),基於△f來將頻率修正量予以讀出。In FIGS. 2 and 3 of Patent Document 1, it is disclosed that two crystal resonators (crystal resonators) are formed by providing two pairs of electrodes on a common crystal piece. Further, in paragraph 0018, the same method as the method of measuring the temperature by measuring the frequency difference due to a change in temperature due to a change in temperature occurs is disclosed. and, The relationship between the frequency difference Δf and the amount of frequency to be corrected is stored in a read only memory (ROM), and the frequency correction amount is read based on Δf.
然而,上述方法與溫度補償晶體控制振盪器(Temperature Compensated Crystal Oscillator,TCXO)相關而與OCXO無關,上述TCXO基於溫度檢測來對振盪頻率進行修正。However, the above method is independent of the OCXO in relation to the Temperature Compensated Crystal Oscillator (TCXO), which corrects the oscillation frequency based on the temperature detection.
而且,如段落0019所揭示,必須對晶體振子進行調整,以使所期望的輸出頻率f0與2個晶體振子各自的頻率f1、f2處於f0≒f1≒f2的關係,因此,存在晶體振子的製造步驟變得複雜,而且無法獲得高良率的問題。此外,以固定時間,對來自各晶體振子的頻率信號即時脈進行計數(count),求出上述時脈的差分(f1-f2),因此,檢測精度會直接對檢測時間產生影響,從而難以進行高精度的溫度補償。Further, as disclosed in paragraph 0019, the crystal oscillator must be adjusted such that the desired output frequency f0 and the respective frequencies f1 and f2 of the two crystal oscillators are in the relationship of f0 ≒ f1 ≒ f2, and therefore, the crystal oscillator is manufactured. The steps become complicated and you can't get high yield problems. Further, the frequency signals from the crystal oscillators are counted at a fixed time, and the difference (f1 - f2) of the clock is obtained. Therefore, the detection accuracy directly affects the detection time, making it difficult to perform. High precision temperature compensation.
[先前技術文獻][Previous Technical Literature]
[專利文獻][Patent Literature]
[專利文獻1]日本專利特開2001-292030號[Patent Document 1] Japanese Patent Laid-Open No. 2001-292030
本發明是鑒於如上所述的情況而成的發明,本發明的目的在於提供如下的晶體控制振盪器,該晶體控制振盪器(OCXO)對晶體振子所處的環境的溫度進行檢測,基於溫度的檢測結果來對加熱部進行控制,使上述環境的溫度保持固定,該晶體控制振盪器可獲得頻率的穩定度高的振 盪輸出。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a crystal controlled oscillator which detects the temperature of an environment in which a crystal oscillator is placed, based on temperature. The detection result is used to control the heating portion to keep the temperature of the above environment constant, and the crystal controlled oscillator can obtain a vibration with high frequency stability. Swing output.
本發明是一種晶體控制振盪器,對晶體振子所處的環境的溫度進行檢測,基於溫度的檢測結果來對加熱部進行控制,使上述環境的溫度保持固定,該晶體控制振盪器的特徵在於包括:第1晶體振子,其是將第1電極設置於晶體片而構成;第2晶體振子,其是將第2電極設置於晶體片而構成;第1振盪電路及第2振盪電路,分別連接於上述第1晶體振子及第2晶體振子;頻率差檢測部,當將第1振盪電路的振盪頻率設為f1,將基準溫度時的第1振盪電路的振盪頻率設為f1r,將第2振盪電路的振盪頻率設為f2,且將基準溫度時的第2振盪電路的振盪頻率設為f2r,則求出與如下的差分值相對應的值作為溫度檢測值,上述差分值是對應於f1與f1r的差分的值、與對應於f2與f2r的差分的值之間的差分值;加法部,將晶體振子所處的環境的溫度的溫度設定值與上述溫度檢測值的偏差分(partial difference)取出;以及電路部,基於上述加法部所取出的偏差分,對供給至上述加熱部的電力進行控制。The present invention is a crystal controlled oscillator that detects the temperature of an environment in which a crystal oscillator is placed, and controls the heating portion based on the temperature detection result to keep the temperature of the environment constant. The crystal controlled oscillator is characterized by including The first crystal oscillator is configured by providing a first electrode on a crystal piece, and the second crystal resonator is configured by providing a second electrode on the crystal piece; the first oscillation circuit and the second oscillation circuit are respectively connected to The first crystal oscillator and the second crystal oscillator; the frequency difference detecting unit sets the oscillation frequency of the first oscillation circuit to f1, sets the oscillation frequency of the first oscillation circuit at the reference temperature to f1r, and sets the second oscillation circuit. When the oscillation frequency is f2 and the oscillation frequency of the second oscillation circuit at the reference temperature is f2r, a value corresponding to the difference value is obtained as a temperature detection value, and the difference value corresponds to f1 and f1r. a difference value between the value of the difference and a value corresponding to the difference between f2 and f2r; and an addition unit that deviates the temperature setting value of the temperature of the environment in which the crystal oscillator is located from the temperature detection value (Partial difference) removed; and a circuit unit, the electric power supplied to the heating unit is controlled based on the deviation adding unit extracted points.
例如利用積分電路部來對上述加法部所取出的偏差分進行積分,接著輸出至電路部。For example, the integration circuit unit integrates the deviation score extracted by the addition unit, and then outputs it to the circuit unit.
第1振盪電路及第2振盪電路例如分別將諧波(overtone)設為振盪輸出。For example, the first oscillating circuit and the second oscillating circuit respectively set an overtone as an oscillating output.
與如下的差分值相對應的值例如為{(f2-f2r)/f2r}-{(f1-f1r)/f1r}],上述差分值是對應於f1與f1r的差分的值、與對應於f2與f2r的差分的值的差分值。再者,代替直接對該值進行檢測,亦包含如下的情形,即,對可獲得與上述值同等的結果的{(f2-f1)/f1}-{(f2r-f1r)/f1r}進行檢測。The value corresponding to the difference value is, for example, {(f2-f2r)/f2r}-{(f1-f1r)/f1r}], and the difference value is a value corresponding to the difference between f1 and f1r, and corresponds to f2 The difference value of the value of the difference from f2r. Furthermore, instead of directly detecting the value, there is also a case where {(f2-f1)/f1}-{(f2r-f1r)/f1r} which can obtain a result equivalent to the above value is detected. .
可將晶體控制振盪器的振盪輸出例如設為第1振盪電路及第2振盪電路中的一個振盪電路的振盪輸出,但亦可設置與第1晶體振子及第2晶體振子不同且處於上述環境的第3晶體振子,將來自連接於該第3晶體振子的第3振盪電路的振盪輸出設為晶體控制振盪器的振盪輸出。The oscillation output of the crystal controlled oscillator may be, for example, an oscillation output of one of the first oscillation circuit and the second oscillation circuit, but may be different from the first crystal resonator and the second crystal resonator and may be in the above environment. In the third crystal unit, the oscillation output from the third oscillation circuit connected to the third crystal unit is set as the oscillation output of the crystal controlled oscillator.
其他發明是一種振盪裝置,該振盪裝置的特徵在於包括:本發明的晶體控制振盪器、及將該晶體控制振盪器的振盪輸出設為時脈信號且包含鎖相迴路(Phase Locked Loop,PLL)的振盪裝置的本體電路部。Another invention is an oscillating device, comprising: a crystal controlled oscillator of the present invention, and an oscillation output of the crystal controlled oscillator as a clock signal and including a phase locked loop (PLL) The body circuit portion of the oscillating device.
對於本發明而言,當將第1振盪電路及第2振盪電路的振盪輸出設為f1、f2,將基準溫度時的第1振盪電路及第2振盪電路的振盪頻率分別設為f1r、f2r,則將與如下的差分值相對應的值視作此時的溫度,上述差分值是對應於f1與f1r的差分的值、與對應於f2與f2r的差分的值之間的差分值。由於上述值與溫度的關聯度極高,因此,將該值作為溫度檢測值來對加熱部的供給電力進行控制,藉此,晶體振子所處的環境的溫度極其穩定。結果,可獲得 穩定度高的振盪輸出。In the present invention, when the oscillation outputs of the first oscillation circuit and the second oscillation circuit are f1 and f2, the oscillation frequencies of the first oscillation circuit and the second oscillation circuit at the reference temperature are f1r and f2r, respectively. The value corresponding to the difference value is the temperature at this time, and the difference value is a difference value between the value corresponding to the difference between f1 and f1r and the value corresponding to the difference between f2 and f2r. Since the correlation between the above value and the temperature is extremely high, the value of the supply power of the heating unit is controlled as the temperature detection value, whereby the temperature of the environment in which the crystal resonator is placed is extremely stable. Result, available Highly stable oscillating output.
圖1是表示應用本發明的實施形態的晶體控制振盪器所構成的整個振盪裝置的方塊圖。該振盪裝置構成為將所設定的頻率的頻率信號予以輸出的頻率合成器(synthesizer),且包括:電壓控制振盪器100,使用有晶體振子;控制電路部200,構成上述電壓控制振盪器100中的PLL;晶體控制振盪器(未附上符號),產生用以使直接數位合成器(Direct Digital Synthesizer,DDS)201進行動作的時脈信號,上述DDS電路部201用以產生上述PLL的參照信號;以及加熱器(heater)5,其是用以對上述晶體控制振盪器中的晶體振子10、20所處的環境的溫度進行調整的加熱部。因此,晶體控制振盪器為OCXO。Fig. 1 is a block diagram showing an entire oscillating device including a crystal controlled oscillator according to an embodiment of the present invention. The oscillating device is configured as a frequency synthesizer that outputs a frequency signal of a set frequency, and includes a voltage controlled oscillator 100 using a crystal oscillator, and a control circuit unit 200 constituting the voltage controlled oscillator 100. PLL; crystal controlled oscillator (not shown), generates a clock signal for operating a direct digital synthesizer (DDS) 201, and the DDS circuit unit 201 generates a reference signal for the PLL. And a heater 5 for heating the temperature of the environment in which the crystal resonators 10 and 20 in the crystal controlled oscillator are located. Therefore, the crystal controlled oscillator is OCXO.
又,上述振盪裝置亦包括溫度補償部,該溫度補償部進行輸入至控制電路部200的基準時脈的溫度補償。雖未對溫度補償部附上符號,但該溫度補償部相當於圖1中的比控制電路部200更靠左側的部分,且被共用為用以對上述加熱器5進行控制的電路部分。Further, the oscillation device further includes a temperature compensation unit that performs temperature compensation of the reference clock input to the control circuit unit 200. Although the temperature compensation unit is not provided with a reference numeral, the temperature compensation unit corresponds to a portion on the left side of the control circuit unit 200 in FIG. 1 and is shared as a circuit portion for controlling the heater 5.
控制電路部200利用相位頻率比較部205,比較自DDS(Direct Digital Synthesizer)電路部201輸出的參考(reference)(參照用)時脈、與由分頻器(frequency divider)204對電壓控制振盪器100的輸出進行分頻所得的時脈的相位,接著藉由電荷泵(charge pump)202來使作為上述比較結果的相位差實現類比化。將經類比化的信 號輸入至迴路濾波器(loop filter)206,以使PLL(Phase locked loop)穩定的方式進行控制。因此,控制電路部200亦可稱為PLL部。此處,DDS電路部201是將自後述的第1振盪電路1輸出的頻率信號用作基準時脈,且輸入有如下的頻率資料(data)(數位值(digital value)),該頻率資料用以將作為目標的頻率的信號予以輸出。The control circuit unit 200 compares the reference (reference) clock output from the DDS (Direct Digital Synthesizer) circuit unit 201 with the phase frequency comparison unit 205, and the voltage controlled oscillator by the frequency divider 204. The output of 100 is divided by the phase of the obtained clock, and then the charge pump 202 is used to classify the phase difference as the result of the comparison. Analogized letter The number is input to a loop filter 206 to control the PLL (Phase locked loop) in a stable manner. Therefore, the control circuit unit 200 can also be referred to as a PLL unit. Here, the DDS circuit unit 201 uses a frequency signal output from a first oscillation circuit 1 to be described later as a reference clock, and inputs frequency data (digital value) to be used for the frequency data. The signal of the frequency to be the target is output.
然而,由於上述基準時脈的頻率具有溫度特性,因此,為了消除(cancel)該溫度特性,利用加法部60來將對應於後述的頻率修正值的信號,與輸入至DDS電路部201的上述頻率資料相加。藉由對輸入至DDS電路部201的頻率資料進行修正,基於基準時脈的溫度特性變動量的DDS電路部201的輸出頻率的溫度變動量被消除,結果,相對於溫度變動,參照用時脈的頻率穩定,因此,來自電壓控制振盪器100的輸出頻率穩定。However, since the frequency of the reference clock has a temperature characteristic, the signal corresponding to a frequency correction value to be described later is input to the frequency input to the DDS circuit unit 201 by the addition unit 60 in order to cancel the temperature characteristic. The data is added. By correcting the frequency data input to the DDS circuit unit 201, the temperature fluctuation amount of the output frequency of the DDS circuit unit 201 based on the temperature characteristic variation amount of the reference clock is eliminated, and as a result, the reference clock is used with respect to the temperature fluctuation. The frequency is stable, and therefore, the output frequency from the voltage controlled oscillator 100 is stable.
本實施形態如下所述,製作基準時脈的晶體控制振盪器構成為OCXO,因此,基準時脈的頻率穩定,故而可謂不會顯現上述基準時脈的溫度特性。然而,當加熱器發生故障等時,預先對基於基準時脈的溫度特性變動量的DDS電路部201的輸出頻率的溫度變動量進行補償,藉此,存在如下的優點,即,可構成可靠性極高的頻率合成器。According to the present embodiment, since the crystal controlled oscillator for fabricating the reference clock is configured as OCXO, the frequency of the reference clock is stabilized, so that the temperature characteristics of the reference clock are not exhibited. However, when the heater malfunctions or the like, the temperature fluctuation amount of the output frequency of the DDS circuit unit 201 based on the temperature characteristic variation amount of the reference clock is compensated in advance, thereby having the advantage that reliability can be formed. Very high frequency synthesizer.
接著,對相當於本發明的晶體控制振盪器的OCXO的部分進行說明。該晶體控制振盪器包括第1晶體振子10及第2晶體振子20,上述第1晶體振子10及第2晶體振子20是使用共用的晶體片Xb而構成。亦即,例如於長度 方向上,將帶狀的晶體片Xb的區域一分為二,於各分割區域(振動區域)的表背兩個面設置激振用的電極。因此,藉由一個分割區域與一對電極11、12來構成第1晶體振子10,藉由另一個分割區域與一對電極21、22來構成第2晶體振子20。因此,可謂第1晶體振子10及第2晶體振子20已熱耦合。Next, a portion corresponding to the OCXO of the crystal controlled oscillator of the present invention will be described. The crystal controlled oscillator includes a first crystal unit 10 and a second crystal unit 20, and the first crystal unit 10 and the second crystal unit 20 are formed using a common crystal piece Xb. That is, for example, length In the direction, the region of the strip-shaped crystal piece Xb is divided into two, and electrodes for excitation are provided on the front and back surfaces of each divided region (vibration region). Therefore, the first crystal unit 10 is constituted by one divided region and the pair of electrodes 11, 12, and the second crystal unit 20 is constituted by the other divided region and the pair of electrodes 21 and 22. Therefore, it can be said that the first crystal unit 10 and the second crystal unit 20 are thermally coupled.
第1振盪電路1及第2振盪電路2分別連接於第1晶體振子10及第2晶體振子20。上述振盪電路1、2的輸出均可為例如晶體振子10、20的諧波(overtone),亦可為基波。於獲得諧波的輸出的情形時,例如亦可於包含晶體振子與放大器的振盪迴路內設置諧波的調諧電路(tuned circuit),使振盪迴路以諧波振盪。或者亦可使振盪迴路以基波振盪,於振盪段的後段,例如於作為柯比茲柯比茲(Colpitts)電路的一部分的放大器的後段設置C級放大器,藉由該C級放大器來使基波發生變形,並且於C級放大器的後段設置調諧為諧波的調諧電路,結果,振盪電路1、2均將例如3次諧波的振盪頻率予以輸出。The first oscillation circuit 1 and the second oscillation circuit 2 are connected to the first crystal unit 10 and the second crystal unit 20, respectively. The outputs of the oscillation circuits 1 and 2 described above may be, for example, harmonics of the crystal oscillators 10 and 20, or may be fundamental waves. In the case of obtaining the output of the harmonics, for example, a tuning circuit for setting harmonics in the oscillation circuit including the crystal oscillator and the amplifier may be used to oscillate the oscillation circuit with harmonics. Alternatively, the oscillation circuit can be oscillated with a fundamental wave, and a C-stage amplifier is provided in the latter stage of the oscillation section, for example, in the latter stage of the amplifier as a part of the Colpitts circuit, by which the C-stage amplifier is used. The wave is deformed, and a tuning circuit that is tuned to harmonics is provided in the latter stage of the class C amplifier. As a result, the oscillation circuits 1, 2 output an oscillation frequency of, for example, a third harmonic.
此處,若方便起見而設為自第1振盪電路1輸出頻率f1的頻率信號,自第2振盪電路2輸出頻率f2的頻率信號,則將頻率f1的頻率信號作為基準時脈而供給至上述控制電路部200。3是頻率差檢測部,概略而言,該頻率差檢測部3是用以將f2-f1-△fr取出的電路部,其中該f2-f1-△fr是f1與f2的差分、與△fr之間的差分。△fr是基準溫度例如25℃的f1(f1r)與f2(f2r)的差分。若列舉f1與f2 的差分的一例,則例如為數MHz。本發明藉由利用頻率差檢測部3來對△F進行計算而成立,上述△F是對應於f1與f2的差分的值、與對應於基準溫度例如25℃的f1與f2的差分的值之間的差分。於本實施形態的情形時,更詳細而言,頻率差檢測部3所獲得的值為{(f2-f1)/f1}-{(f2r-f1r)/f1r}。然而,於圖式中,已將頻率差檢測部3的輸出的顯示予以省略。Here, for the sake of convenience, a frequency signal of the frequency f1 is output from the first oscillation circuit 1, and a frequency signal of the frequency f2 is output from the second oscillation circuit 2, and the frequency signal of the frequency f1 is supplied as a reference clock. The control circuit unit 200. 3 is a frequency difference detecting unit. Specifically, the frequency difference detecting unit 3 is a circuit unit for taking out f2-f1-Δfr, where f2-f1-Δfr is f1 and f2. The difference between the difference and Δfr. Δfr is the difference between f1 (f1r) and f2 (f2r) of the reference temperature, for example, 25 °C. If you list f1 and f2 An example of the difference is, for example, several MHz. The present invention is established by calculating the ΔF by the frequency difference detecting unit 3, and the ΔF is a value corresponding to a difference between f1 and f2 and a value corresponding to a difference between f1 and f2 corresponding to a reference temperature of, for example, 25°C. The difference between the two. In the case of the present embodiment, in more detail, the value obtained by the frequency difference detecting unit 3 is {(f2-f1)/f1}-{(f2r-f1r)/f1r}. However, in the drawing, the display of the output of the frequency difference detecting unit 3 has been omitted.
圖2表示頻率差檢測部3的具體例。31是正反器電路(flip-flop circuit)(F/F電路),來自第1振盪電路1的頻率f1的頻率信號輸入至該正反器電路31的一個輸入端,來自第2振盪電路2的頻率f2的頻率信號輸入至上述正反器電路31的另一個輸入端,藉由來自第1振盪電路1的頻率f1的頻率信號,對來自第2振盪電路2的頻率f2的頻率信號進行鎖存(latch)。以下,為了避免記載的冗長,視作由f1、f2來表示頻率或頻率信號本身。正反器電路31將如下的信號予以輸出,該信號具有對應於f1與f2的頻率差的值即(f2-f1)/f1的頻率。FIG. 2 shows a specific example of the frequency difference detecting unit 3. 31 is a flip-flop circuit (F/F circuit), and a frequency signal from the frequency f1 of the first oscillation circuit 1 is input to one input terminal of the flip-flop circuit 31, and from the second oscillation circuit 2 The frequency signal of the frequency f2 is input to the other input terminal of the flip-flop circuit 31, and the frequency signal of the frequency f2 from the second oscillation circuit 2 is locked by the frequency signal of the frequency f1 from the first oscillation circuit 1. Save. Hereinafter, in order to avoid redundancy in description, it is considered that the frequency or the frequency signal itself is represented by f1 and f2. The flip-flop circuit 31 outputs a signal having a frequency corresponding to the frequency difference between f1 and f2, that is, a frequency of (f2-f1)/f1.
於正反器電路31的後段設置單觸發電路(one-shot circuit)32,單觸發電路32在自正反器電路31獲得的脈衝(pulse)信號上升時,將單觸發的脈衝予以輸出。圖3是表示至此為止的一連串的信號的時序圖。A one-shot circuit 32 is provided in the rear stage of the flip-flop circuit 31, and the one-shot circuit 32 outputs a one-shot pulse when the pulse signal obtained from the flip-flop circuit 31 rises. Fig. 3 is a timing chart showing a series of signals up to this point.
於單觸發電路32的後段設置PLL(Phase Locked Loop),該PLL包括:鎖存電路33、具有積分功能的迴路濾波器34、加法部35及DDS電路部36。鎖存電路33用 以藉由自單觸發電路32輸出的脈衝,對自DDS電路部36輸出的鋸齒波進行鎖存,鎖存電路33的輸出為將上述脈衝予以輸出時的上述鋸齒波的信號位準(level)。迴路濾波器34對處於上述信號位準的直流電壓進行積分,加法部35將該直流電壓與對應於△fr(基準溫度例如25℃的f1與f2的差分)的直流電壓相加。對應於△fr的直流電壓的資料儲存於圖2所示的記憶體(memory)30。A PLL (Phase Locked Loop) is provided in the latter stage of the one-shot circuit 32. The PLL includes a latch circuit 33, a loop filter 34 having an integrating function, an adder 35, and a DDS circuit unit 36. Latch circuit 33 The sawtooth wave output from the DDS circuit unit 36 is latched by the pulse output from the one-shot circuit 32, and the output of the latch circuit 33 is the signal level of the sawtooth wave when the pulse is output. . The loop filter 34 integrates the DC voltage at the above-described signal level, and the adder 35 adds the DC voltage to a DC voltage corresponding to Δfr (the difference between the reference temperature and the f1 and f2 of 25 ° C, for example). The data corresponding to the DC voltage of Δfr is stored in the memory 30 shown in FIG. 2.
於該例子中,關於加法部35中的符號,對應於△fr的直流電壓的輸入側為「+」,迴路濾波器34的輸出電壓的輸入側為「-」。自加法部35所運算出的直流電壓,即,對應於△fr的直流電壓中減去迴路濾波器34的輸出電壓所得的電壓,輸入至DDS電路部36,將與該電壓值相對應的頻率的鋸齒波予以輸出。為了易於理解PLL的動作,圖4(a)~圖4(c)中極其模式性地表示了各部分的輸出的情況,且為了能夠直觀地掌握上述情況,預先進行了極其模式性的說明。當裝置啟動時,對應於△fr的直流電壓經由加法部35而輸入至DDS電路部36,例如若△fr為5MHz,則會自DDL36輸出與該頻率相對應的頻率的鋸齒波。In this example, with respect to the sign in the addition unit 35, the input side of the DC voltage corresponding to Δfr is “+”, and the input side of the output voltage of the loop filter 34 is “-”. The DC voltage calculated by the addition unit 35, that is, the voltage obtained by subtracting the output voltage of the loop filter 34 from the DC voltage corresponding to Δfr, is input to the DDS circuit unit 36, and the frequency corresponding to the voltage value is input. The sawtooth wave is output. In order to facilitate understanding of the operation of the PLL, the output of each part is extremely schematically shown in FIGS. 4(a) to 4(c), and in order to intuitively grasp the above, an extremely modematic description has been made in advance. When the device is activated, the DC voltage corresponding to Δfr is input to the DDS circuit unit 36 via the adder 35. For example, if Δfr is 5 MHz, a sawtooth wave of a frequency corresponding to the frequency is output from the DDL 36.
鎖存電路33利用對應於(f2-f1)的頻率的脈衝,對上述鋸齒波進行鎖存,但若(f2-f1)例如為6MHz,則由於鎖存用的脈衝的週期比鋸齒波的週期更短,因此,如圖4(a)所示,鋸齒波的鎖存點逐步降低,如圖4(b)、圖4(c)所示,鎖存電路33的輸出及迴路濾波器34的輸出朝 -側逐步降低。由於加法部35的處於迴路濾波器34的輸出側的符號為「-」,因此,自加法部35輸入至DDS電路部36的直流電壓上升。因此,當自DDS電路部36輸出的鋸齒波的頻率升高,對應於6MHz的直流電壓輸入至DDS電路部36時,鋸齒波的頻率變為6MHz,如圖5(a)~圖5(c)所示,PLL被鎖定。此時,自迴路濾波器34輸出的直流電壓達到對應於△fr-(f2-f1)=-1MHz的值。亦即,可謂迴路濾波器34的積分值相當於鋸齒波自5MHz朝6MHz變化時的1MHz的變化量的積分值。The latch circuit 33 latches the sawtooth wave by using a pulse corresponding to the frequency of (f2-f1), but if (f2-f1) is, for example, 6 MHz, the period of the pulse for latching is longer than the period of the sawtooth wave. Therefore, as shown in FIG. 4(a), the latching point of the sawtooth wave is gradually lowered, as shown in FIGS. 4(b) and 4(c), the output of the latch circuit 33 and the loop filter 34 are Output toward - The side is gradually lowered. Since the sign of the addition unit 35 on the output side of the loop filter 34 is "-", the DC voltage input from the addition unit 35 to the DDS circuit unit 36 rises. Therefore, when the frequency of the sawtooth wave outputted from the DDS circuit unit 36 rises and the DC voltage corresponding to 6 MHz is input to the DDS circuit unit 36, the frequency of the sawtooth wave becomes 6 MHz, as shown in Fig. 5(a) to Fig. 5(c). ), the PLL is locked. At this time, the DC voltage output from the loop filter 34 reaches a value corresponding to Δfr - (f2 - f1) = -1 MHz. That is, it can be said that the integrated value of the loop filter 34 corresponds to an integral value of the amount of change of 1 MHz when the sawtooth wave changes from 5 MHz to 6 MHz.
與上述例子相反地,當△fr為6MHz,(f2-f1)為5MHz時,鎖存用的脈衝的週期比鋸齒波的週期更長,因此,圖4(a)所示的鎖存點逐步升高,隨之,鎖存電路33的輸出及迴路濾波器34的輸出亦上升。因此,於加法部35中,相減所得的值變大,故而鋸齒波的頻率逐步降低,不久當該鋸齒波的頻率達到與(f2-f1)相同的5MHz時,PLL被鎖定。此時,自迴路濾波器34輸出的直流電壓達到對應於△fr-(f2-f1)=1MHz的值。再者,圖6(a)、圖6(b)為實際測試資料,於該例子中,在時刻t0處,PLL被鎖定。Contrary to the above example, when Δfr is 6 MHz and (f2-f1) is 5 MHz, the period of the latch pulse is longer than the period of the sawtooth wave, and therefore, the latch point shown in Fig. 4(a) is gradually Ascending, the output of the latch circuit 33 and the output of the loop filter 34 also rise. Therefore, in the addition unit 35, since the value obtained by subtraction becomes large, the frequency of the sawtooth wave gradually decreases, and when the frequency of the sawtooth wave reaches 5 MHz which is the same as (f2-f1), the PLL is locked. At this time, the DC voltage output from the loop filter 34 reaches a value corresponding to Δfr - (f2 - f1) = 1 MHz. Further, Fig. 6(a) and Fig. 6(b) show actual test data, and in this example, at time t0, the PLL is locked.
然而如上所述,實際上,頻率差檢測部3的輸出即圖2所示的平均化電路37的輸出,是將{(f2-f1)/f1}-{(f2r-f1r)/f1r}的值以34位元的數位值所表示的值。若將自-50℃附近至100℃附近為止的上述值的集合設為(f1-f1r)/f1=OSC1(單位為ppm或ppb)、(f2-f2r)/f2r=OSC2(單位為ppm或ppb),則相對於溫度的變化成為實質上與 OSC2-OSC1相同的曲線(curve)。因此,可將頻率差檢測部3的輸出視作OSC2-OSC1=溫度資料。However, as described above, actually, the output of the frequency difference detecting unit 3, that is, the output of the averaging circuit 37 shown in Fig. 2, is {(f2-f1)/f1}-{(f2r-f1r)/f1r} The value is a value represented by a 34-bit numeric value. The set of the above values from the vicinity of -50 ° C to around 100 ° C is set to (f1 - f1r) / f1 = OSC1 (in ppm or ppb), (f2 - f2r) / f2r = OSC2 (in ppm or Ppb), the change with respect to temperature becomes substantially OSC2-OSC1 has the same curve. Therefore, the output of the frequency difference detecting unit 3 can be regarded as OSC2-OSC1=temperature data.
又,由於在正反器電路31中,藉由f1來對f2進行鎖存的動作並不同步,因此,亦有可能會產生半穩態(metastable)(當於時脈的邊緣(edge),對輸入資料進行鎖存時,必須在鎖存的邊緣前後的固定時間內保持輸入資料,但由於時脈與輸入資料大致同時地發生變化,因此,處於輸出變得不穩定的狀態)等不定區間,於迴路濾波器34的輸出中有可能會包含瞬間誤差。因此,於迴路濾波器34的輸出側設置平均化電路37,該平均化電路37求出預先設定的時間內的輸入值的移動平均值(moving average),即便產生上述瞬間誤差,亦可消除上述瞬間誤差。藉由設置平均化電路37,最終可高精度地取得變動溫度量的頻率偏移資訊(frequency shift informaion),但亦可設為不設置平均化電路37的構成。Further, since the flipping operation of f2 by f1 is not synchronized in the flip-flop circuit 31, it is also possible to generate metastability (when the edge of the clock is formed, When the input data is latched, the input data must be held for a fixed period of time before and after the edge of the latch, but the clock and the input data change substantially at the same time, so the output becomes unstable. It is possible to include an instantaneous error in the output of the loop filter 34. Therefore, an averaging circuit 37 is provided on the output side of the loop filter 34, and the averaging circuit 37 obtains a moving average of the input value in a predetermined time period, and the above-described instantaneous error can be eliminated. Instantaneous error. By providing the averaging circuit 37, the frequency shift information (frequency shift informaion) of the variable temperature amount can be finally obtained with high accuracy. However, the averaging circuit 37 may not be provided.
此處,參照圖7至圖10,對PLL的迴路濾波器34所獲得的變動溫度量的頻率偏移資訊即OSC2-OSC1進行說明。圖7是利用基準溫度來對f1及f2進行正規化,且表示溫度與頻率的關係的特性圖。此處所謂的正規化,是指例如將25℃設為基準溫度,針對溫度與頻率的關係,將基準溫度的頻率設為零,求出自基準溫度的頻率算起的頻率的偏移量與溫度的關係。當將第1振盪電路1的25℃時的頻率設為f1r,且將第2振盪電路2的25℃時的頻率設為f2r,即,當將25℃的f1、f2的值分別設為f1r、f2r,則圖 7的縱軸的值為(f1-f1r)及(f2-f2r)。Here, the OSC2-OSC1, which is the frequency offset information of the fluctuation temperature amount obtained by the loop filter 34 of the PLL, will be described with reference to Figs. 7 to 10 . Fig. 7 is a characteristic diagram showing the relationship between temperature and frequency by normalizing f1 and f2 by the reference temperature. The term "normalization" as used herein refers to, for example, setting 25 ° C as the reference temperature, and setting the frequency of the reference temperature to zero for the relationship between temperature and frequency, and determining the offset of the frequency from the frequency of the reference temperature. The relationship between temperatures. When the frequency of the first oscillation circuit 1 at 25 ° C is f1r, and the frequency of the second oscillation circuit 2 at 25 ° C is f2r, that is, when the values of f1 and f2 of 25 ° C are respectively set to f1r , f2r, then map The values of the vertical axis of 7 are (f1 - f1r) and (f2 - f2r).
又,圖8表示圖7所示的各溫度的頻率相對於基準溫度(25℃)的頻率的變化率。因此,圖8的縱軸的值為(f1-f1r)/f1r及(f2-f2r)/f2r,即為如上所述的OSC1及OSC2。再者圖8的縱軸的值的單位為ppm。Moreover, FIG. 8 shows the rate of change of the frequency of each temperature shown in FIG. 7 with respect to the frequency of the reference temperature (25 degreeC). Therefore, the values of the vertical axis of Fig. 8 are (f1 - f1r) / f1r and (f2 - f2r) / f2r, that is, OSC1 and OSC2 as described above. Further, the unit of the value of the vertical axis of Fig. 8 is ppm.
圖9表示OSC1與溫度的關係(與圖8相同)、及(OSC2-OSC1)與溫度的關係,且已知:(OSC2-OSC1)與溫度之間為線性關係(linear relationship)。因此,已知:(OSC2-OSC1)對應於自基準溫度算起的溫度變動偏移量。Fig. 9 shows the relationship between OSC1 and temperature (same as Fig. 8), and (OSC2-OSC1) and temperature, and it is known that (OSC2-OSC1) has a linear relationship with temperature. Therefore, it is known that (OSC2-OSC1) corresponds to the temperature variation offset from the reference temperature.
若將說明返回至圖1,則頻率差檢測部3的輸出值實質上為(OSC2-OSC1),如圖9所示,可將該值稱為晶體振子10、20所處的溫度的檢測值。因此,於頻率差檢測部3的後段設置加法器(偏差分取出電路)6,將作為數位信號的溫度設定值(設定溫度的OSC2-OSC1的34位元的數位值)與頻率差檢測部3的輸出即OSC2-OSC1的差分取出。對於溫度設定值而言,較佳為選擇如下的溫度,該溫度是不易使與第1晶體振子10相對應的OSC1的值因溫度變化而發生變動的溫度,上述第1晶體振子10用以獲得晶體控制振盪器的輸出。於圖8所示的OSC1與溫度的關係曲線中,例如選擇對應於底部(bottom)部分的50℃作為上述溫度。再者,根據不易使OSC1的值因溫度變化而發生變動的溫度這一觀點,亦可將10度設為設定溫度,於該情形時,亦存在低於室溫的情形,因此,設置與加熱部及 帕耳帖元件(Peltier element)等冷卻部組合的調溫部。When the description returns to FIG. 1, the output value of the frequency difference detecting unit 3 is substantially (OSC2-OSC1). As shown in FIG. 9, this value can be referred to as the detected value of the temperature at which the crystal oscillators 10 and 20 are located. . Therefore, an adder (deviation-dividing circuit) 6 is provided in the subsequent stage of the frequency difference detecting unit 3, and a temperature setting value (a digital value of 34 bits of OSC2-OSC1 of the set temperature) and the frequency difference detecting unit 3 are set as the digital signal. The output is the differential removal of OSC2-OSC1. In the temperature setting value, it is preferable to select a temperature at which the temperature of the OSC1 corresponding to the first crystal unit 10 does not easily fluctuate due to a temperature change, and the first crystal unit 10 is used to obtain the temperature. The crystal controls the output of the oscillator. In the relationship between OSC1 and temperature shown in Fig. 8, for example, 50 °C corresponding to the bottom portion is selected as the above temperature. Further, according to the viewpoint that it is difficult to change the temperature of the OSC1 due to the temperature change, 10 degrees may be set as the set temperature. In this case, the temperature may be lower than the room temperature. Therefore, the setting and heating are performed. Department and A temperature adjustment unit in which a cooling unit such as a Peltier element is combined.
而且,於加法器6的後段,設置有相當於積分電路部的迴路濾波器61。Further, a loop filter 61 corresponding to the integrating circuit unit is provided in the subsequent stage of the adder 6.
此外,於迴路濾波器61的後段設置有脈寬調變(Pulse Width Modulation,PWM)內插部62。該PWM內插部62進行轉換,即,將14位元的數位信號(自-213 至+213 為止的2的補數(complement))以固定時間的脈衝信號來表現。例如當最小H脈衝寬度為10nsec時,將214 *10-9 =16.384msec設為固定時間,表現該期間的脈衝數數位信號。具體而言,以如下的方式表現。當14位元的數位值為零時,16.384msec期間的H脈衝數為213 個。當14位元的數位值為-213 時,16.384msec期間的H脈衝數為零個。當14位元的數位值為213 -1時,16.384msec期間的H脈衝數為214 -1個。Further, a Pulse Width Modulation (PWM) interpolation unit 62 is provided in the subsequent stage of the loop filter 61. The PWM interpolating unit 62 performs conversion so that a 14-bit digital signal (2 complements from -2 13 to +2 13 ) is expressed as a pulse signal of a fixed time. For example, when the minimum H pulse width is 10 nsec, 2 14 * 10 -9 = 16.384 msec is set to a fixed time, and the pulse number digital signal of the period is expressed. Specifically, it is expressed as follows. When the 14-bit digit value is zero, the number of H pulses during 16.384 msec is 2 13 . When the digit value of 14 bits is -2 13 , the number of H pulses during 16.384 msec is zero. When the digit value of 14 bits is 2 13 -1 , the number of H pulses during 16.384 msec is 2 14 -1 .
於PWM內插部62的後段設置有低通濾波器(Low Pass Filter,LPF)63,使來自PWM內插部62的輸出平均化,將與該輸出即脈衝數相對應的直流電壓予以輸出。亦即,於該例子中,PWM內插部62及低通濾波器63用以將數位值轉換為類比值,亦可使用數位/類比轉換器,代替使用上述PWM內插部62及低通濾波器63。A low pass filter (LPF) 63 is provided in the subsequent stage of the PWM interpolating unit 62, and the output from the PWM interpolating unit 62 is averaged, and a DC voltage corresponding to the output, that is, the number of pulses is output. That is, in this example, the PWM interpolation unit 62 and the low-pass filter 63 are used to convert the digital value into an analog value, and a digital/analog converter may be used instead of using the PWM interpolation unit 62 and low-pass filtering. 63.
於低通濾波器(LPF)63的後段,設置有相當於加熱部的加熱器電路5。如圖10所示,該加熱器電路5包括:電晶體(transistor)64,其基極(base)連接於低通濾波器63的輸出端,並且電壓自電源部Vc供給至集極 (collector);以及電阻65,連接於上述電晶體64的射極(emitter)與接地(earth)之間。供給至電晶體64的基極的電壓、與電晶體64的消耗電力及電阻65的消耗電力的合計電力的關係為線性關係,因此,相應於上述溫度資料與溫度設定值的差分,線性地對發熱溫度進行控制。於該例子中,由於電晶體64亦為發熱部的一部分,因此使用如下的表現,即,加熱器電路5兼用作加熱器與加熱器控制電路。A heater circuit 5 corresponding to the heating portion is provided in the subsequent stage of the low pass filter (LPF) 63. As shown in FIG. 10, the heater circuit 5 includes a transistor 64 whose base is connected to the output terminal of the low pass filter 63, and the voltage is supplied from the power supply portion Vc to the collector. And a resistor 65 connected between the emitter and the earth of the transistor 64. The relationship between the voltage supplied to the base of the transistor 64 and the total power of the power consumption of the transistor 64 and the power consumption of the resistor 65 is linear, and therefore, linearly corresponding to the difference between the temperature data and the temperature set value. The heating temperature is controlled. In this example, since the transistor 64 is also a part of the heat generating portion, it is used that the heater circuit 5 also serves as a heater and heater control circuit.
圖11是表示圖1所示的振盪裝置的概略構造的圖。51是容器,52是容器51內所設置的印刷(print)基板。於印刷基板52的上表面側,設置有晶體振子10、20、與使如下的電路實現單晶片化而成的積體電路部300及控制電路部200等,上述電路是包含振盪電路1、2及頻率差檢測部3等且進行數位處理的電路。又,於印刷基板52的下表面側,例如在與晶體振子10、20相對向的位置設置有加熱器5,藉由該加熱器5所發出的熱,將晶體振子10、20維持於設定溫度。Fig. 11 is a view showing a schematic structure of the oscillation device shown in Fig. 1; 51 is a container, and 52 is a print substrate provided in the container 51. On the upper surface side of the printed circuit board 52, the crystal oscillators 10 and 20 and the integrated circuit unit 300 and the control circuit unit 200 in which the following circuits are formed into a single wafer are provided, and the above circuit includes the oscillation circuits 1, 2 And a circuit that performs digital processing such as the frequency difference detecting unit 3 and the like. Further, on the lower surface side of the printed circuit board 52, for example, a heater 5 is provided at a position facing the crystal resonators 10 and 20, and the crystal oscillators 10 and 20 are maintained at a set temperature by the heat generated by the heater 5. .
又,如上所述,本實施形態的振盪裝置亦包括溫度補償部,該溫度補償部進行輸入至控制電路部200的基準時脈的溫度補償。亦即,該例子的振盪裝置是將OCXO與TCXO加以組合而成的裝置。然而,本發明亦可不組合TCXO。上述溫度補償部包括:晶體振子10、晶體振子20、振盪電路1、振盪電路2、頻率差檢測部3及修正值運算部4。亦即,頻率差檢測部3為對加熱器5的溫度進行控制的 部分的一部分,亦為上述溫度補償部的一部分。Further, as described above, the oscillation device of the present embodiment also includes a temperature compensation unit that performs temperature compensation of the reference clock input to the control circuit unit 200. That is, the oscillating device of this example is a device in which OCXO and TCXO are combined. However, the present invention may also not combine TCXO. The temperature compensation unit includes a crystal unit 10, a crystal unit 20, an oscillation circuit 1, an oscillation circuit 2, a frequency difference detection unit 3, and a correction value calculation unit 4. That is, the frequency difference detecting unit 3 controls the temperature of the heater 5. A part of the part is also part of the above temperature compensation unit.
PLL的迴路濾波器34所獲得的變動溫度量的頻率偏移資訊,輸入至圖1所示的修正值取得部即修正值運算部4,於此處,對頻率的修正值進行運算。頻率偏移資訊如上所述。The frequency offset information of the fluctuation temperature amount obtained by the loop filter 34 of the PLL is input to the correction value calculation unit 4 which is the correction value acquisition unit shown in Fig. 1, and the frequency correction value is calculated here. The frequency offset information is as described above.
圖12表示OSC1與溫度的關係(與圖8相同)、及(OSC2-OSC1)與溫度的關係,且已知:(OSC2-OSC1)與溫度之間為線性關係。因此,已知:(OSC2-OSC1)對應於自基準溫度算起的溫度變動偏移量。而且一般而言,晶體振子的頻率溫度特性由3次函數表示,因此,只要預先求出將由該3次函數引起的頻率變動量抵消的頻率修正值與(OSC2-OSC1)的關係,則可基於(OSC2-OSC1)的檢測值來求出頻率修正值。Fig. 12 shows the relationship between OSC1 and temperature (same as Fig. 8) and (OSC2-OSC1) and temperature, and it is known that (OSC2-OSC1) has a linear relationship with temperature. Therefore, it is known that (OSC2-OSC1) corresponds to the temperature variation offset from the reference temperature. In general, since the frequency-temperature characteristic of the crystal oscillator is represented by a cubic function, the relationship between the frequency correction value for canceling the frequency variation caused by the third-order function and (OSC2-OSC1) can be obtained based on The detected value of (OSC2-OSC1) is used to obtain a frequency correction value.
本實施形態的振盪裝置如上所述,將自第1振盪電路1獲得的頻率信號(f1)用作圖1所示的控制電路部200的基準時脈,由於該基準時脈存在頻率溫度特性,因此,需要針對基準時脈的頻率而進行溫度修正。因此,首先,預先求出利用基準溫度而正規化的表示溫度與f1的關係的函數,且如圖13般,預先求出用以將由上述函數引起的f1的頻率變動量抵消的函數。再者,詳細而言,上述函數的f1是基準溫度的頻率的變動率即(f1-f1r)/f1r=OSC1。因此,圖13的縱軸為-OSC1。於該例子中,為了高精度地進行溫度修正,將上述函數例如定為9次函數。As described above, the oscillation device of the present embodiment uses the frequency signal (f1) obtained from the first oscillation circuit 1 as the reference clock of the control circuit unit 200 shown in FIG. 1, and the reference clock has a frequency-temperature characteristic. Therefore, it is necessary to perform temperature correction for the frequency of the reference clock. Therefore, first, a function indicating the relationship between the temperature and f1 normalized by the reference temperature is obtained in advance, and as shown in FIG. 13, a function for canceling the frequency fluctuation amount of f1 caused by the above function is obtained in advance. In addition, in detail, f1 of the above function is a rate of change of the frequency of the reference temperature, that is, (f1 - f1r) / f1r = OSC1. Therefore, the vertical axis of Fig. 13 is -OSC1. In this example, in order to perform temperature correction with high precision, the above function is defined as, for example, a 9th-order function.
如上所述,由於溫度與(OSC2-OSC1)為線性關係, 因此,將圖13的橫軸設為(OSC2-OSC1)的值,但若直接使用(OSC2-OSC1)的值,則用以確定該值的資料量增多,因此,以如下的方式來對(OSC2-OSC1)的值進行正規化。亦即,預先決定有可能實際使用振盪裝置時的上限溫度及下限溫度,將上限溫度時的(OSC2-OSC1)的值視作+1,將下限溫度時的(OSC2-OSC1)的值視作-1。於該例子中,如圖13所示,將-30ppm設為+1,將+30ppm設為-1。As described above, since the temperature is linear with (OSC2-OSC1), Therefore, the horizontal axis of Fig. 13 is set to the value of (OSC2-OSC1). However, if the value of (OSC2-OSC1) is used as it is, the amount of data for determining the value is increased. Therefore, the following is true ( The value of OSC2-OSC1) is normalized. In other words, the upper limit temperature and the lower limit temperature when the oscillation device is actually used are determined in advance, and the value of (OSC2-OSC1) at the upper limit temperature is regarded as +1, and the value of (OSC2-OSC1) at the lower limit temperature is regarded as -1. In this example, as shown in FIG. 13, -30 ppm is set to +1, and +30 ppm is set to -1.
於該例子中,將晶體振子相對於溫度的頻率特性視作9次的多項近似式。具體而言,當生產晶體振子時,藉由實際測試來取得(OSC2-OSC1)與溫度的關係,根據該實際測試資料來導出修正頻率曲線,該修正頻率曲線是表示將相對於溫度的頻率變動量抵消的溫度與-OSC1的關係的曲線,藉由最小平方法(least square method)來導出9次的多項近似式係數。接著,將多項近似式係數預先記憶於記憶體30(參照圖1),修正值運算部4使用上述多項近似式係數來進行(1)式的運算處理。In this example, the frequency characteristic of the crystal oscillator with respect to temperature is regarded as a multiple approximation of nine times. Specifically, when a crystal oscillator is produced, the relationship between (OSC2-OSC1) and temperature is obtained by actual testing, and a corrected frequency curve is derived based on the actual test data, the corrected frequency curve indicating a frequency change with respect to temperature. The curve of the relationship between the temperature of the offset and the -OSC1 is derived by the least square method to derive the multiple approximation coefficient of 9 times. Next, the plurality of approximate expression coefficients are previously stored in the memory 30 (see FIG. 1), and the correction value calculation unit 4 performs the arithmetic processing of the equation (1) using the plurality of approximate expression coefficients.
Y=P1.X9 +P2.X8 +P3.X7 +P4.X6 +P5.X5 +P6.X4 +P7.X3 +P8.X2 +P9.X.........(1)Y=P1. X 9 +P2. X 8 +P3. X 7 +P4. X 6 +P5. X 5 +P6. X 4 +P7. X 3 +P8. X 2 +P9. X.........(1)
於(1)式中,X是頻率差檢測資訊,Y是修正資料,P1~P9是多項近似式係數。In the formula (1), X is the frequency difference detection information, Y is the correction data, and P1 to P9 are the multiple approximation coefficients.
此處,X是圖1所示的頻率差檢測部3所獲得的值, 即,圖2所示的平均化電路37所獲得的值(OSC2-OSC1)。Here, X is a value obtained by the frequency difference detecting unit 3 shown in Fig. 1, That is, the value obtained by the averaging circuit 37 shown in Fig. 2 (OSC2-OSC1).
圖14中表示用以由修正值運算部4執行運算的方塊圖的一例。圖14中,401~409是進行(1)式的各項的運算的運算部,400是加法部,410是進行捨入(rounding)處理的電路。再者,修正值運算部4例如使用了一個乘法部,當利用該乘法部來求出9次方項的值,接著利用該乘法部來求出8次方項的值時,例如亦可任意地使用該乘法部,最終將各次方項的值相加。又,修正值的運算式並不限定於使用9次的多項近似式,亦可使用次數與所要求的精度相對應的近似式。FIG. 14 shows an example of a block diagram for performing calculation by the correction value calculation unit 4. In FIG. 14, 401 to 409 are calculation units for performing calculation of each of the equations (1), 400 is an addition unit, and 410 is a circuit for performing rounding processing. Further, the correction value calculation unit 4 uses, for example, a multiplication unit, and when the multiplication unit obtains the value of the ninth power term, and then uses the multiplication unit to obtain the value of the eighth power term, for example, any The multiplication unit is used to finally add the values of the respective square terms. Further, the calculation formula of the correction value is not limited to the use of a plurality of approximation equations of nine times, and an approximate expression corresponding to the required accuracy may be used.
接著,歸納上述實施形態的整體的動作。若著眼於上述振盪裝置的晶體控制振盪器,則晶體控制振盪器的輸出相當於自第1振盪電路1輸出的頻率信號。而且,藉由加熱器5來進行加熱,以使晶體振子10、20所處的環境達到設定溫度。第1晶體振子10及第1振盪電路1產生作為晶體控制振盪器的輸出的頻率信號,且與第2晶體振子20及第2振盪電路2一併具有作為溫度檢測部的功能。如上所述,與上述振盪電路1、2各自所獲得的頻率信號的頻率差相對應的值OSC2-OSC1是對應於溫度,利用加法部來將與溫度設定值(例如50℃的OSC2-OSC1的值)之間的差分取出。Next, the overall operation of the above embodiment will be summarized. When attention is paid to the crystal controlled oscillator of the above oscillation device, the output of the crystal controlled oscillator corresponds to the frequency signal output from the first oscillation circuit 1. Further, heating is performed by the heater 5 so that the environment in which the crystal resonators 10, 20 are placed reaches a set temperature. The first crystal unit 10 and the first oscillation circuit 1 generate a frequency signal as an output of the crystal controlled oscillator, and have a function as a temperature detecting unit together with the second crystal unit 20 and the second oscillation circuit 2. As described above, the value OSC2-OSC1 corresponding to the frequency difference of the frequency signals obtained by each of the above-described oscillation circuits 1, 2 corresponds to the temperature, and the addition portion is used to set the temperature with the temperature setting value (for example, OSC2-OSC1 of 50 °C) The difference between the values is taken out.
利用迴路濾波器61來對上述差分進行積分,然後轉換為直流電壓,對加熱器5的控制電力進行調整。根據圖9所示的特性圖可知:若將50℃時的OSC1的值設為 -1.5×105 ,則加法器6的輸出在溫度低於50℃時為正值,且該輸出會隨著溫度降低而變大。因此,以如下的方式發揮作用,即,晶體振子10、20所處的環境溫度越低於50℃,則加熱器5的控制電力越大。又,當環境溫度高於50℃時,上述加法器6的輸出為負值,且該輸出的絕對值隨著溫度上升而變大。因此,以如下的方式發揮作用,即,溫度越高於50℃,則加熱器的供給電力越小。因此,晶體振子10、20所處的環境的溫度維持於設定溫度即50℃,故而作為振盪輸出的來自第1振盪器1的輸出頻率穩定。結果,於將來自第1振盪器1的輸出用作時脈信號的控制電路部200中,供給至相位比較部205的參照信號的頻率穩定,因此,作為振盪裝置(頻率合成器)的輸出的來自電壓控制振盪器100的輸出頻率亦穩定。The above difference is integrated by the loop filter 61, and then converted into a DC voltage to adjust the control power of the heater 5. According to the characteristic diagram shown in FIG. 9, when the value of OSC1 at 50 ° C is set to -1.5 × 10 5 , the output of the adder 6 is positive when the temperature is lower than 50 ° C, and the output will follow The temperature is reduced and becomes larger. Therefore, it functions in such a manner that the lower the ambient temperature at which the crystal resonators 10, 20 are lower than 50 °C, the larger the control power of the heater 5. Further, when the ambient temperature is higher than 50 ° C, the output of the adder 6 is a negative value, and the absolute value of the output becomes larger as the temperature rises. Therefore, it functions in such a manner that the higher the temperature is at 50 ° C, the smaller the supply power of the heater is. Therefore, the temperature of the environment in which the crystal resonators 10 and 20 are placed is maintained at 50 ° C which is the set temperature, so that the output frequency from the first oscillator 1 as the oscillation output is stabilized. As a result, in the control circuit unit 200 that uses the output from the first oscillator 1 as the clock signal, the frequency of the reference signal supplied to the phase comparison unit 205 is stabilized, and therefore, the output of the oscillation device (frequency synthesizer) is used. The output frequency from the voltage controlled oscillator 100 is also stable.
另一方面,來自頻率差檢測部3的輸出(OSC2-OSC1)輸入至修正值運算部4,執行上述(1)式的運算,從而獲得作為溫度修正資料的頻率修正量。(1)式的運算是求出例如圖13所示的特性圖中的修正頻率曲線的縱軸的值的處理,該修正頻率曲線的縱軸的值對應於基於頻率差檢測部3的輸出值而獲得的值。On the other hand, the output (OSC2-OSC1) from the frequency difference detecting unit 3 is input to the correction value computing unit 4, and the calculation of the above formula (1) is executed to obtain the frequency correction amount as the temperature correction data. The calculation of the equation (1) is a process of obtaining a value of the vertical axis of the corrected frequency curve in the characteristic map shown in FIG. 13, for example, the value of the vertical axis of the corrected frequency curve corresponds to the output value based on the frequency difference detecting unit 3. And the value obtained.
如圖1所示,第1晶體振子10及第2晶體振子20是使用共用的晶體片Xb而構成,且彼此已熱耦合,因此,振盪電路1、2的頻率差是極其正確地對應於環境溫度的值,故而頻率差檢測部3的輸出是環境溫度與基準溫度(於該例子中為25℃)的溫度差資訊。由於第1振盪電路1所 輸出的頻率信號f1被用作控制電路部200的主時脈,因此,修正值運算部4所獲得的修正值被用作用以對控制電路部200的動作進行補償的信號,以將對於控制電路部200的動作造成的影響抵消,該對於控制電路部200的動作造成的影響是基於因溫度偏離25℃而引起的f1的頻率偏移量。結果,無論溫度如何變動,本實施形態的振盪裝置的輸出即電壓控制振盪器100的輸出頻率均穩定。As shown in FIG. 1, the first crystal unit 10 and the second crystal unit 20 are configured by using a common crystal piece Xb, and are thermally coupled to each other. Therefore, the frequency difference between the oscillation circuits 1 and 2 is extremely accurately corresponding to the environment. The value of the temperature is such that the output of the frequency difference detecting unit 3 is the temperature difference information of the ambient temperature and the reference temperature (25 ° C in this example). Due to the first oscillating circuit 1 The output frequency signal f1 is used as the main clock of the control circuit unit 200, and therefore, the correction value obtained by the correction value computing unit 4 is used as a signal for compensating the operation of the control circuit unit 200 to be used for the control circuit. The influence of the operation of the unit 200 is canceled, and the influence on the operation of the control circuit unit 200 is based on the frequency shift amount of f1 caused by the temperature deviating from 25 °C. As a result, the output frequency of the voltage controlled oscillator 100, which is the output of the oscillation device of the present embodiment, is stable regardless of the temperature fluctuation.
如上所述,根據上述實施形態,將與晶體振子10、20各自所獲得的頻率信號的頻率差相當的值的兩者的差分用作溫度檢測值,基於上述溫度檢測值來對加熱器5進行控制,該加熱器5管理著晶體振子10、20的環境溫度。因此,可高精度地將環境溫度維持於設定溫度,晶體控制振盪器的輸出(第1振盪電路1的輸出)穩定。As described above, according to the above-described embodiment, the difference between the values corresponding to the frequency difference of the frequency signals obtained by the crystal resonators 10 and 20 is used as the temperature detection value, and the heater 5 is performed based on the temperature detection value. Controlled, the heater 5 manages the ambient temperature of the crystal resonators 10, 20. Therefore, the ambient temperature can be maintained at the set temperature with high precision, and the output of the crystal controlled oscillator (the output of the first oscillation circuit 1) is stabilized.
此外,於本實施形態中,將晶體控制振盪器的輸出作為時脈信號而供給至控制電路部200,該控制電路部200製作作為振盪裝置的頻率合成器的振盪輸出,接著,使用相當於頻率差的值來對上述時脈信號進行修正。亦即,頻率合成器將修正值運算部4所獲得的修正值與DDS電路部201的頻率設定值相加,進行輸入至DDS電路部201的主時脈(f1)的溫度補償。如此,頻率合成器包括OCXO與TCXO該兩者的功能,藉此,具有如下的優點。雖由製造者(maker)決定頻率合成器的使用溫度範圍,但即便當使用者(user)於偏離使用溫度範圍的環境中使用頻率合成器時,輸出頻率亦穩定。又,當欲使加熱器的溫度設定值 升高,使得使用溫度範圍的上限值升高時,加熱器的消耗電力會增大,加熱器電路的規模亦變大,但具有如下的優點,即,可藉由使用TCXO的功能來抑制加熱器的消耗電力。Further, in the present embodiment, the output of the crystal controlled oscillator is supplied to the control circuit unit 200 as a clock signal, and the control circuit unit 200 generates an oscillation output of the frequency synthesizer as an oscillation device, and then uses the corresponding frequency. The difference value is used to correct the above clock signal. In other words, the frequency synthesizer adds the correction value obtained by the correction value calculation unit 4 to the frequency setting value of the DDS circuit unit 201, and performs temperature compensation of the main clock (f1) input to the DDS circuit unit 201. As such, the frequency synthesizer includes both the functions of the OCXO and the TCXO, thereby having the following advantages. Although the maker uses the temperature range of the frequency synthesizer, the output frequency is stable even when the user uses the frequency synthesizer in an environment that deviates from the operating temperature range. Also, when you want to set the temperature of the heater When the upper limit value of the temperature range is increased, the power consumption of the heater is increased, and the size of the heater circuit is also increased, but the advantage is that the function of the TCXO can be suppressed. The power consumption of the heater.
然而,如圖15所示,頻率合成器亦可為不包括修正值運算部4的(不具有TCXO的功能)構成。即便於該情形時,亦將對應於如下的差分值的值視作此時的溫度,該差分值是對應於f1與f1r的差分的值、與對應於f2與f2r的差分的值之間的差分值。由於上述值與溫度的關聯度極高,因此,將該值作為溫度檢測值來對加熱部的供給電力進行控制,藉此,晶體振子所處的環境的溫度極其穩定。結果,可獲得穩定度高的振盪輸出。However, as shown in FIG. 15, the frequency synthesizer may be configured to include the function of the correction value calculation unit 4 (having no TCXO). That is, in this case, the value corresponding to the difference value is also regarded as the temperature at this time, which is a value corresponding to the difference between f1 and f1r and a value corresponding to the difference between f2 and f2r. Differential value. Since the correlation between the above value and the temperature is extremely high, the value of the supply power of the heating unit is controlled as the temperature detection value, whereby the temperature of the environment in which the crystal resonator is placed is extremely stable. As a result, an oscillation output with high stability can be obtained.
此處,迴路濾波器61是用以決定迴路增益(loop gain)及阻尼(damping)的電路,可分別根據數位值來對迴路增益及阻尼的係數進行調整。使迴路係數實現數位化,藉此,即便構造變更所引起的熱傳遞係數發生改變,亦可容易地針對每個構造而對係數進行調整。Here, the loop filter 61 is a circuit for determining loop gain and damping, and can adjust the loop gain and the coefficient of the damping according to the digital value. By making the loop coefficient digital, the coefficient can be easily adjusted for each structure even if the heat transfer coefficient caused by the structural change is changed.
於上述例子中,將晶體振子10、20各自的3次諧波取出作為輸出頻率,對於諧波的頻率溫度特性而言,由於溫度變化大,因此,可謂對應於上述3次諧波的差分的值相對於溫度的感度佳,且為較佳的形態。然而,亦可將晶體振子10、20的各基波取出作為輸出頻率,將對應於上述各基波的差分的值用作溫度值。或者,亦可自晶體振子10、20中的一個晶體振子及另一個晶體振子分別取出基波、諧 波,將對應於上述基波、諧波的差分的值視作溫度值。In the above example, the third harmonic of each of the crystal resonators 10 and 20 is taken as the output frequency, and since the temperature and temperature characteristics of the harmonics are large due to the temperature change, it is possible to correspond to the difference of the third harmonic described above. The value is better than the temperature and is a preferred form. However, each fundamental wave of the crystal resonators 10 and 20 may be taken out as an output frequency, and a value corresponding to the difference of each of the fundamental waves described above may be used as a temperature value. Alternatively, the fundamental wave and the harmonic can be respectively taken out from one of the crystal oscillators 10 and 20 and the other crystal oscillator. The wave is regarded as a temperature value as a value corresponding to the difference between the fundamental wave and the harmonic.
又,為了求出頻率差檢測資訊,製作對應於f1與f2的差分頻率的脈衝,藉由上述脈衝,利用鎖存電路來對自DDS電路部輸出的鋸齒波信號進行鎖存,對鎖存的信號值進行積分,將該積分值作為上述頻率差而予以輸出,並且將該輸出與對應於f1r與f2r的差分的值之間的差分取出,將該差分輸入至上述DDS電路部而構成PLL。如專利文獻1般,當對f1、f2進行計數(count)而取得該f1與f2的差分時,計數時間會直接對檢測精度產生影響,但於如上所述的構成中不存在此種問題,因此,檢測精度高。實際地藉由模擬(simulation)來對兩者的方式進行比較,當於對頻率進行計數的方式中,設定200ms的計數時間時,獲得了如下的結果,即,本實施形態的方式的檢測精度約高出50倍。Further, in order to obtain the frequency difference detection information, a pulse corresponding to the differential frequency of f1 and f2 is created, and the sawtooth wave signal output from the DDS circuit unit is latched by the latch circuit by the pulse, and is latched. The signal value is integrated, the integrated value is output as the frequency difference, and the difference between the output and the value corresponding to the difference between f1r and f2r is taken out, and the difference is input to the DDS circuit unit to constitute a PLL. As in Patent Document 1, when f1 and f2 are counted and the difference between f1 and f2 is obtained, the counting time directly affects the detection accuracy, but there is no such problem in the configuration described above. Therefore, the detection accuracy is high. Actually, the mode of the two is compared by simulation. When the counting time of 200 ms is set in the method of counting the frequency, the following result is obtained, that is, the detection accuracy of the mode of the present embodiment About 50 times higher.
頻率差檢測部3亦可使用(f1-f1r)與(f2-f2r)的差分值本身作為對應於如下的差分值的值,該差分值是對應於f1與f1r的差分的值、與對應於f2與f2r的差分的值之間的差分值,於該情形時,靈活運用圖7的曲線圖來求出溫度。The frequency difference detecting unit 3 may use the difference value itself of (f1 - f1r) and (f2 - f2r) as a value corresponding to a difference value which is a value corresponding to the difference between f1 and f1r and corresponds to The difference value between the values of the difference between f2 and f2r. In this case, the temperature of Fig. 7 is flexibly used to obtain the temperature.
於上述實施形態中,在圖8至圖10的說明中,利用「ppm」單位來顯示頻率的變化量,但於實際的數位電路中,全部是利用二進位數(binary number)來進行處理,因此,利用構成位元數來對DDS電路36的頻率設定精度進行計算,該頻率設定精度例如為34位元。若列舉一例, 則當將10MHz的時脈供給至圖1所示的控制電路部200中所含的DDS電路部201時,於該時脈的變動頻率為100Hz的情形In the above embodiment, in the description of FIGS. 8 to 10, the amount of change in frequency is displayed in units of "ppm". However, in the actual digital circuit, all of them are processed by binary numbers. Therefore, the frequency setting accuracy of the DDS circuit 36 is calculated by the number of constituent bits, and the frequency setting accuracy is, for example, 34 bits. If an example is given, When the 10 MHz clock is supplied to the DDS circuit unit 201 included in the control circuit unit 200 shown in FIG. 1, the frequency of the fluctuation of the clock is 100 Hz.
[變動比率計算][variation ratio calculation]
100Hz/10MHz=0.00001100Hz/10MHz=0.00001
[ppm換算][ppm conversion]
0.00001*1e6=10[ppm]0.00001*1e6=10[ppm]
[DDS設定精度換算][DDS setting accuracy conversion]
0.00001*2ˆ34≒171,799[ratio-34bit(暫定名稱)]。0.00001*2ˆ34≒171,799[ratio-34bit (tentative name)].
於上述構成的情形時,上述頻率設定精度由如下的(2)式來表示。In the case of the above configuration, the frequency setting accuracy is expressed by the following formula (2).
1×[ratio-34bit]=10M[Hz]/2ˆ34≒0.58m[Hz/bit]...(2)1×[ratio-34bit]=10M[Hz]/2ˆ34≒0.58m[Hz/bit]...(2)
因此,100[Hz]/0.58m[Hz/bit]≒171,799[bit(ratio-34bit)]。Therefore, 100 [Hz] / 0.58 m [Hz / bit] ≒ 171, 799 [bit (ratio - 34 bit)].
又,0.58mHz相對於10MHz,可以如下的(3)式的方式進行計算。Further, 0.58 mHz can be calculated in the following manner (3) with respect to 10 MHz.
0.58m[Hz]/10M[Hz]*1e9≒0.058[ppb]...(3)0.58m[Hz]/10M[Hz]*1e9≒0.058[ppb]...(3)
因此,根據(2)式、(3)式,(4)式的關係成立。Therefore, according to the formulas (2) and (3), the relationship of the formula (4) holds.
1e9/2ˆ34=0.058[ppb/ratio-34bit]...(4)1e9/2ˆ34=0.058[ppb/ratio-34bit]...(4)
亦即,DDS電路36所極理則頻率消失,僅為位元數的關係。That is, the frequency of the DDS circuit 36 is such that the frequency disappears, which is only the relationship of the number of bits.
此外,於上述例子中,第1晶體振子10及第2晶體振子20使用共用的晶體片Xb,但亦可不共用晶體片Xb。於該情形時,例如可列舉將第1晶體振子10及第2晶體振子20配置於共用的框體中的例子。根據此種構成,由於處於實質相同的溫度環境下,因此,可獲得相同的效果。Further, in the above example, the first crystal unit 10 and the second crystal unit 20 use the common crystal piece Xb, but the crystal piece Xb may not be shared. In this case, for example, the first crystal unit 10 and the second crystal unit 20 are disposed in a common housing. According to this configuration, since the temperature is substantially the same, the same effect can be obtained.
頻率差檢測部3的DDS電路部36的輸出信號不限於鋸齒波,只要為如下的頻率信號即可,該頻率信號的信號值會隨著時間而反覆地增加、減少,例如亦可為正弦波。The output signal of the DDS circuit unit 36 of the frequency difference detecting unit 3 is not limited to a sawtooth wave, and may be a frequency signal as follows. The signal value of the frequency signal may increase and decrease over time, for example, may be a sine wave. .
又,頻率差檢測部3亦可藉由計數器(counter)來對f1與f2進行計數,自該計數值的差分值中減去與△fr相當的值,將對應於所獲得的計數值的值予以輸出。Further, the frequency difference detecting unit 3 may count f1 and f2 by a counter, and subtract a value corresponding to Δfr from the difference value of the count value, and a value corresponding to the obtained count value. Output it.
於以上的實施形態中,第1晶體振子10及第1振盪電路1具有將溫度檢測值取出的功能、與製作晶體控制振盪器的輸出的功能。亦即,振盪電路1共用了用於溫度檢測的振盪電路、與晶體控制振盪器的輸出用的振盪電路。然 而,對於本發明而言,例如亦可準備3個晶體振子,並且準備3個振盪電路,例如於圖1的構成中,準備第3晶體振子與連接於該晶體振子的第3振盪電路,將第3振盪電路的輸出作為晶體控制振盪器的輸出,將剩餘的第1振盪電路及第2振盪電路的振盪輸出輸入至頻率差檢測部,獲得溫度檢測值。於該情形時,若將OCXO與TCXO加以組合,則將第3晶體振盪電路的輸出用作DDS電路部201的時脈。In the above embodiment, the first crystal unit 10 and the first oscillation circuit 1 have a function of taking out the temperature detection value and a function of producing an output of the crystal controlled oscillator. That is, the oscillation circuit 1 shares an oscillation circuit for temperature detection and an oscillation circuit for outputting the crystal controlled oscillator. Of course Further, in the present invention, for example, three crystal oscillators may be prepared, and three oscillation circuits may be prepared. For example, in the configuration of FIG. 1, a third crystal oscillator and a third oscillation circuit connected to the crystal oscillator are prepared. The output of the third oscillation circuit is used as an output of the crystal controlled oscillator, and the oscillation outputs of the remaining first oscillation circuit and second oscillation circuit are input to the frequency difference detection unit to obtain a temperature detection value. In this case, when the OCXO and the TCXO are combined, the output of the third crystal oscillation circuit is used as the clock of the DDS circuit unit 201.
圖1及圖15所示的振盪裝置即頻率合成器是利用作為本發明的實施形態的晶體控制振盪器而構成,該晶體控制振盪器包含晶體振子10、晶體振子20、振盪電路1、振盪電路2、頻率差檢測部3、以及直至加法部6~加熱器電路5的部分。然而,本發明不限於構成為頻率合成器,亦可設為如下的構成,該構成是將第1振盪電路1的振盪輸出作為本發明的晶體控制振盪器的輸出的構成,即,不使用控制電路部200的構成。The frequency synthesizer, which is an oscillating device shown in FIG. 1 and FIG. 15, is configured by using a crystal controlled oscillator including an crystal oscillator 10, a crystal unit 20, an oscillating circuit 1, and an oscillating circuit. 2. The frequency difference detecting unit 3 and the portion up to the adding unit 6 to the heater circuit 5. However, the present invention is not limited to being configured as a frequency synthesizer, and may be configured to have an oscillation output of the first oscillation circuit 1 as an output of the crystal controlled oscillator of the present invention, that is, no control is used. The configuration of the circuit unit 200.
而且,對於本發明而言,即便當以上述方式,將第1振盪電路1的振盪輸出作為晶體控制振盪器的輸出時,亦可具有TCXO的功能。具體而言,可列舉如下的例子,即,將熱敏電阻等溫度感測器(sensor)用作溫度檢測部,該溫度檢測部用以對晶體振子10、20所處的環境溫度進行檢測,基於溫度檢測部的溫度檢測值,對晶體控制振盪器的輸出進行調整。例如利用了柯比茲振盪電路的晶體控制振盪器是藉由控制電壓的設定來進行頻率的設定。於該情形 時,若晶體振子所處的環境溫度自基準溫度起發生變化,則振盪頻率會發生變化,將基於溫度檢測值而產生的控制電壓的修正值與控制電壓的設定值相加,藉此,將溫度變化所引起的振盪頻率的變化量抵消。根據此種構成,本發明的OCXO的附加價值進一步升高。Further, in the present invention, even when the oscillation output of the first oscillation circuit 1 is used as the output of the crystal controlled oscillator in the above manner, the function of the TCXO can be obtained. Specifically, an example in which a temperature sensor such as a thermistor is used as a temperature detecting unit for detecting an ambient temperature at which the crystal resonators 10 and 20 are placed is used. The output of the crystal controlled oscillator is adjusted based on the temperature detection value of the temperature detecting portion. For example, a crystal controlled oscillator using a Buchez oscillation circuit sets a frequency by setting a control voltage. In this situation When the ambient temperature at which the crystal oscillator is placed changes from the reference temperature, the oscillation frequency changes, and the correction value of the control voltage generated based on the temperature detection value is added to the set value of the control voltage, thereby The amount of change in the oscillation frequency caused by the temperature change is offset. According to such a configuration, the added value of the OCXO of the present invention is further increased.
[實例][Example]
使用上述實施形態所示的電路,對斜坡響應(ramp response)波形進行調查之後,獲得了圖16所示的結果,上述斜坡響應波形表示使晶體振子10、20所處的環境的溫度以1℃/每分鐘的斜率連續地發生變化時的2個晶體振子10、20的頻率差的變遷。f1、f2均使用3次諧波。圖16的一個刻度相當於20m℃(20℃/1000),當溫度斜率為1℃/每分鐘時,可確認相當於20m℃的偏移(offset),且可藉由將迴路濾波器61的係數予以最佳化(optimization)而使偏移量減少。Using the circuit shown in the above embodiment, the ramp response waveform was investigated, and the result shown in Fig. 16 was obtained. The ramp response waveform indicates that the temperature of the environment in which the crystal resonators 10 and 20 are placed is 1 °C. / The frequency difference of the two crystal oscillators 10, 20 when the slope of each minute changes continuously. Both f1 and f2 use the third harmonic. One scale of FIG. 16 corresponds to 20 m ° C (20 ° C / 1000), and when the temperature slope is 1 ° C / min, an offset equivalent to 20 m ° C can be confirmed, and the loop filter 61 can be used. The coefficients are optimized to reduce the offset.
又,對步級響應(step response)波形進行調查之後,獲得了圖17所示的結果,上述步級響應波形表示使上述環境溫度變化1℃時的頻率差檢測部3的輸出的變遷。根據該結果可知:頻率差檢測部3的輸出(OSC2-OSC1)追隨著溫度變化。再者,可藉由對迴路濾波器61的係數進行調整,來改善響應波形的過沖(overshoot)部分。Further, after the step response waveform was examined, the result shown in FIG. 17 was obtained, and the step response waveform indicates the transition of the output of the frequency difference detecting unit 3 when the ambient temperature was changed by 1 °C. From this result, it is understood that the output (OSC2-OSC1) of the frequency difference detecting unit 3 follows the temperature change. Furthermore, the overshoot portion of the response waveform can be improved by adjusting the coefficients of the loop filter 61.
1‧‧‧第1振盪電路/振盪電路1‧‧‧1st oscillation circuit/oscillation circuit
2‧‧‧第2振盪電路/振盪電路2‧‧‧2nd oscillation circuit/oscillation circuit
3‧‧‧頻率差檢測部3‧‧‧frequency difference detection department
4‧‧‧修正值運算部(修正值取得部)4‧‧‧ Correction value calculation unit (correction value acquisition unit)
5‧‧‧加熱器電路5‧‧‧heater circuit
6‧‧‧加法器/偏差分取出電路6‧‧‧Adder/deviation extraction circuit
10‧‧‧第1晶體振子10‧‧‧1st crystal oscillator
11、12、21、22‧‧‧電極11, 12, 21, 22 ‧ ‧ electrodes
20‧‧‧第2晶體振子20‧‧‧2nd crystal oscillator
30‧‧‧記憶體30‧‧‧ memory
31‧‧‧正反器電路31‧‧‧Factor circuit
32‧‧‧單觸發電路32‧‧‧One-shot circuit
33‧‧‧鎖存電路33‧‧‧Latch circuit
34、61‧‧‧迴路濾波器34, 61‧‧‧ loop filter
35‧‧‧加法部35‧‧‧Additional Department
36、201‧‧‧DDS電路部36, 201‧‧‧DDS Circuit Department
37‧‧‧平均化電路37‧‧‧Averaging circuit
51‧‧‧容器51‧‧‧ Container
52‧‧‧印刷基板52‧‧‧Printing substrate
60、400‧‧‧加法部60, 400‧ ‧ Addition Department
62‧‧‧PWM內插部62‧‧‧PWM Interpolation
63‧‧‧低通濾波器63‧‧‧ low pass filter
64‧‧‧電晶體64‧‧‧Optoelectronics
100‧‧‧電壓控制振盪器100‧‧‧Voltage Controlled Oscillator
200‧‧‧控制電路部200‧‧‧Control Circuit Department
202‧‧‧電荷泵202‧‧‧Charge pump
204‧‧‧分頻器204‧‧‧divider
205‧‧‧相位頻率比較部205‧‧‧ Phase Frequency Comparison Department
206‧‧‧迴路濾波器206‧‧‧ Loop Filter
300‧‧‧積體電路部300‧‧‧Integrated Circuits Department
401~409‧‧‧運算部401~409‧‧‧ Computing Department
410‧‧‧電路410‧‧‧ Circuit
f1、f2‧‧‧頻率F1, f2‧‧‧ frequency
OSC1、OSC2‧‧‧集合OSC1, OSC2‧‧‧ collection
P1~P9‧‧‧多項近似式係數P1~P9‧‧‧Multiple approximation coefficients
Vc‧‧‧電源部Vc‧‧‧Power Department
Xb‧‧‧晶體片Xb‧‧‧ crystal piece
△f‧‧‧頻率差△f‧‧‧frequency difference
圖1是表示本發明的實施形態的整體構成的方塊圖。Fig. 1 is a block diagram showing the overall configuration of an embodiment of the present invention.
圖2是表示本發明的實施形態的一部分的方塊圖。Fig. 2 is a block diagram showing a part of an embodiment of the present invention.
圖3是圖2所示的一部分的輸出的波形圖。Fig. 3 is a waveform diagram of an output of a portion shown in Fig. 2.
圖4(a)~圖4(c)是模式性地表示包含圖2所示的DDS電路部的迴路未鎖定的狀態的各部分的波形圖。4(a) to 4(c) are waveform diagrams schematically showing respective portions of a state in which the circuit including the DDS circuit portion shown in Fig. 2 is unlocked.
圖5(a)~圖5(c)是模式性地表示包含圖2所示的DDS電路部的迴路已鎖定的狀態的各部分的波形圖。5(a) to 5(c) are waveform diagrams schematically showing respective portions in a state in which the circuit including the DDS circuit portion shown in Fig. 2 is locked.
圖6(a)、圖6(b)是與對應於上述實施形態的實際裝置相關的上述迴路中的各部分的波形圖。6(a) and 6(b) are waveform diagrams of respective portions of the above-described circuit related to the actual device corresponding to the above embodiment.
圖7是表示第1振盪電路的頻率f1及第2振盪電路的頻率f2與溫度的關係的頻率溫度特性圖。FIG. 7 is a frequency-temperature characteristic diagram showing the relationship between the frequency f1 of the first oscillation circuit and the frequency f2 of the second oscillation circuit and temperature.
圖8是表示利用基準溫度的值來分別對f1的變化率及f2的變化率進行正規化所得的值與溫度的關係的頻率溫度特性圖。FIG. 8 is a frequency-temperature characteristic diagram showing the relationship between the value obtained by normalizing the rate of change of f1 and the rate of change of f2 by the value of the reference temperature, and temperature.
圖9是表示頻率差檢測部的數位輸出值與溫度的關係的特性圖。FIG. 9 is a characteristic diagram showing a relationship between a digital output value of a frequency difference detecting unit and temperature.
圖10是表示加熱部的控制電路的電路圖。Fig. 10 is a circuit diagram showing a control circuit of the heating unit.
圖11是表示上述實施形態的振盪裝置的構造的概略縱剖側面圖。Fig. 11 is a schematic longitudinal sectional side view showing the structure of the oscillating device of the embodiment.
圖12是表示利用基準溫度的值來對f1的變化率進行正規化所得的值與溫度的關係、及差分△F與溫度的關係的頻率溫度特性圖,上述差分△F是利用基準溫度的值來對f1的變化率進行正規化所得的值、與利用基準溫度的值來對f2的變化率進行正規化所得的值的差分。FIG. 12 is a frequency-temperature characteristic diagram showing the relationship between the value obtained by normalizing the rate of change of f1 and the temperature by the value of the reference temperature, and the relationship between the difference ΔF and the temperature, and the difference ΔF is the value using the reference temperature. The value obtained by normalizing the rate of change of f1 and the value obtained by normalizing the rate of change of f2 by the value of the reference temperature.
圖13是表示對圖12的縱軸進行正規化所得的值、與頻率修正值的關係的特性圖。FIG. 13 is a characteristic diagram showing a relationship between a value obtained by normalizing the vertical axis of FIG. 12 and a frequency correction value.
圖14是表示修正值運算部的方塊圖。Fig. 14 is a block diagram showing a correction value calculation unit.
圖15是表示本發明的其他實施形態的整體構成的方塊圖。Fig. 15 is a block diagram showing the overall configuration of another embodiment of the present invention.
圖16是表示使溫度連續地發生變化時的2個晶體振子的頻率差的斜坡響應圖。Fig. 16 is a view showing a slope response of a frequency difference between two crystal oscillators when the temperature is continuously changed.
圖17是表示使溫度變化1℃時的頻率差檢測部的輸出的步級響應圖。Fig. 17 is a step response diagram showing the output of the frequency difference detecting unit when the temperature is changed by 1 °C.
1‧‧‧第1振盪電路/振盪電路1‧‧‧1st oscillation circuit/oscillation circuit
2‧‧‧第2振盪電路/振盪電路2‧‧‧2nd oscillation circuit/oscillation circuit
3‧‧‧頻率差檢測部3‧‧‧frequency difference detection department
4‧‧‧修正值運算部(修正值取得部)4‧‧‧ Correction value calculation unit (correction value acquisition unit)
5‧‧‧加熱器電路5‧‧‧heater circuit
6‧‧‧加法器/偏差分取出電路6‧‧‧Adder/deviation extraction circuit
10‧‧‧第1晶體振子10‧‧‧1st crystal oscillator
11、12、21、22‧‧‧電極11, 12, 21, 22 ‧ ‧ electrodes
20‧‧‧第2晶體振子20‧‧‧2nd crystal oscillator
30‧‧‧記憶體30‧‧‧ memory
60‧‧‧加法部60‧‧ ‧Addition Department
61‧‧‧迴路濾波器61‧‧‧ Loop Filter
62‧‧‧PWM內插部62‧‧‧PWM Interpolation
63‧‧‧低通濾波器63‧‧‧ low pass filter
100‧‧‧電壓控制振盪器100‧‧‧Voltage Controlled Oscillator
200‧‧‧控制電路部200‧‧‧Control Circuit Department
201‧‧‧DDS電路部201‧‧‧DDS Circuit Department
202‧‧‧電荷泵202‧‧‧Charge pump
204‧‧‧分頻器204‧‧‧divider
205‧‧‧相位頻率比較部205‧‧‧ Phase Frequency Comparison Department
206‧‧‧迴路濾波器206‧‧‧ Loop Filter
f1、f2‧‧‧頻率F1, f2‧‧‧ frequency
Xb‧‧‧晶體片Xb‧‧‧ crystal piece
△f‧‧‧頻率差△f‧‧‧frequency difference
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| JP5872493B2 (en) * | 2012-06-13 | 2016-03-01 | 株式会社東芝 | Oscillation frequency adjustment circuit |
| JP5946737B2 (en) | 2012-09-27 | 2016-07-06 | 日本電波工業株式会社 | Oscillator |
| JP5995673B2 (en) | 2012-11-15 | 2016-09-21 | 日本電波工業株式会社 | Oscillator |
| JP6118091B2 (en) | 2012-12-10 | 2017-04-19 | 日本電波工業株式会社 | Oscillator |
| JP6045961B2 (en) | 2013-01-31 | 2016-12-14 | 日本電波工業株式会社 | Crystal oscillator and oscillation device |
| JP6033156B2 (en) | 2013-03-29 | 2016-11-30 | 日本電波工業株式会社 | Oscillator |
| JP6055708B2 (en) * | 2013-03-29 | 2016-12-27 | 日本電波工業株式会社 | Crystal oscillator and oscillation device |
| JP6177614B2 (en) * | 2013-07-29 | 2017-08-09 | 日本電波工業株式会社 | Oscillator |
| JP2015061171A (en) | 2013-09-18 | 2015-03-30 | 日本電波工業株式会社 | Oscillation device |
| JP2015119378A (en) * | 2013-12-19 | 2015-06-25 | 日本電波工業株式会社 | Highly stable oscillator |
| JP6548411B2 (en) * | 2014-03-31 | 2019-07-24 | 日本電波工業株式会社 | Oscillator |
| JP6288777B2 (en) * | 2014-06-25 | 2018-03-07 | 日本電波工業株式会社 | Oscillator |
| JP6089011B2 (en) * | 2014-08-20 | 2017-03-01 | 日本電波工業株式会社 | OSCILLATOR AND METHOD FOR MANUFACTURING OSCILLATOR |
| JP6564244B2 (en) * | 2015-05-28 | 2019-08-21 | 日本電波工業株式会社 | OSCILLATOR AND METHOD FOR MANUFACTURING OSCILLATOR |
| JP6567403B2 (en) | 2015-12-09 | 2019-08-28 | 株式会社メガチップス | Frequency calibration circuit and frequency calibration method |
| JP2020145528A (en) * | 2019-03-05 | 2020-09-10 | セイコーエプソン株式会社 | Oscillator, electronic apparatus, and movable body |
| JP7799258B2 (en) * | 2022-12-14 | 2026-01-15 | ヤマハロボティクス株式会社 | Temperature compensated oscillator manufacturing equipment |
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