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TWI505397B - Chamber and processing device - Google Patents

Chamber and processing device Download PDF

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Publication number
TWI505397B
TWI505397B TW098119214A TW98119214A TWI505397B TW I505397 B TWI505397 B TW I505397B TW 098119214 A TW098119214 A TW 098119214A TW 98119214 A TW98119214 A TW 98119214A TW I505397 B TWI505397 B TW I505397B
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Taiwan
Prior art keywords
chamber
processing chamber
chamber according
side plate
processing
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TW098119214A
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Chinese (zh)
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TW201011855A (en
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佐佐木芳彥
南雅人
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東京威力科創股份有限公司
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    • H10P72/0462

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Drying Of Semiconductors (AREA)
  • Physical Vapour Deposition (AREA)

Description

腔室及處理裝置Chamber and processing device

本發明係關於對平面顯示器用基板(以下,稱為FPD用基板)等之大型被處理體執行處理之處理腔室(處理室)等之腔室及處理裝置。The present invention relates to a chamber and a processing apparatus such as a processing chamber (processing chamber) that performs processing on a large object to be processed such as a substrate for a flat panel display (hereinafter referred to as a substrate for FPD).

就以在FPD生產工場中所使用之裝置而言,所知的有在真空或減壓環境下對FPD用基板施予各種處理之處理裝置,例如利用電漿對屬於被處理體之FPD用基板施予蝕刻等之處理的電漿處理裝置。As for the apparatus used in the FPD production plant, there is known a treatment apparatus for applying various treatments to the substrate for FPD in a vacuum or a reduced pressure environment, for example, a substrate for FPD belonging to a target to be processed by plasma. A plasma processing apparatus that performs a treatment such as etching.

電漿處理裝置係例如專利文獻1所記載般,具備有對被處理體施予電漿處理之處理腔室(處理室)、具有搬運被處理體之搬運機構的搬運腔室(搬運室),和裝載鎖定腔室(裝載鎖定室)等之各種腔室。在處理腔室內,配設有互相對向之上部電極,和兼作載置被處理體之載置台的下部電極。對上部電極和下部電極之間施加高頻,使上部電極和下部電極之間之處理空間產生電漿。The plasma processing apparatus is provided with a processing chamber (processing chamber) that applies plasma treatment to the object to be processed, and a transport chamber (transport chamber) that has a transport mechanism that transports the object to be processed, as described in Patent Document 1. And various chambers such as a load lock chamber (load lock chamber). In the processing chamber, a counter electrode facing each other and a lower electrode serving as a mounting table on which the object to be processed is placed are disposed. A high frequency is applied between the upper electrode and the lower electrode to cause plasma in the processing space between the upper electrode and the lower electrode.

然而,被處理體尤其係FPD用基板日漸朝向大型化,現在於實際之FPD製造中使用大概2000mm~2400mm方形大小之基板。FPD用基板之尺寸今後也朝向大型化,最終成為大約3000mm方形,或超過此。FPD用基板之大型化因可以增加自一片基板所取得之FPD面板數,故有謀求降低成本之優點。However, the substrate to be processed, in particular, the substrate for FPD is gradually increasing in size, and a substrate having a square shape of approximately 2000 mm to 2400 mm is currently used in actual FPD manufacturing. The size of the substrate for FPD is also increasing in size in the future, and eventually becomes approximately 3000 mm square or more. Since the size of the FPD substrate can be increased by the number of FPD panels obtained from one substrate, there is an advantage in that cost reduction can be achieved.

並且,於專利文獻2記載著即使在設置腔室之後,亦可以依據使用者之要求簡易變更腔室之形狀或大小的腔室。Further, Patent Document 2 describes a chamber in which the shape or size of the chamber can be easily changed according to the user's request even after the chamber is installed.

[專利文獻1]日本特開2007-67218號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2007-67218

[專利文獻2]日本特開2004-335743號公報[Patent Document 2] Japanese Patent Laid-Open Publication No. 2004-335743

FPD用基板之大型化導致對FPD用基板執行處理之處理腔室等之腔室本身之大型化,隨此處理裝置全體也大型化。通常FPD用基板之處理裝置係將處理裝置分成每個腔室,從處理裝置製造工場運送至FPD生產工場。但是,因當腔室本身變大時,腔室本身最終超過運送尺寸之界限,故要將處理裝置從其製造工場運送至FPD生產工場則有困難。The enlargement of the substrate for the FPD causes an increase in the size of the chamber itself such as the processing chamber in which the substrate for the FPD is processed, and the entire processing apparatus is also enlarged. In general, a processing device for a substrate for an FPD divides the processing device into each chamber and transports it from the processing device manufacturing plant to the FPD production plant. However, since the chamber itself eventually exceeds the limit of the transport size when the chamber itself becomes large, it is difficult to transport the processing device from its manufacturing plant to the FPD production plant.

本發明之目的係提供即使超過運送尺寸之界限亦可以運送之腔室,及使用該腔室之處理裝置。It is an object of the present invention to provide a chamber that can be transported even beyond the limits of the transport size, and a processing apparatus that uses the chamber.

為了解決上述課題,本發明之第1態樣所涉及之腔室,具備開放至少一個之側面的長方體狀之本體,和裝卸自如地被安裝在上述本體之被開放之側面的側板。In order to solve the above problems, the chamber according to the first aspect of the present invention includes a rectangular parallelepiped body that opens at least one side surface, and a side plate that is detachably attached to the opened side surface of the main body.

本發明之第2態樣所涉及之腔室,具備開放至少一個之側面的長方體之本體,和被安裝在上述本體之被開放之側面,持有與上述本體之開口形狀一致之開口的間隔物,和裝卸自如地被安裝在上述間隔物之側板。A chamber according to a second aspect of the present invention includes a body having a rectangular parallelepiped opening at least one side surface, and a spacer attached to an open side surface of the main body and having an opening conforming to an opening shape of the main body And detachably mounted on the side plates of the spacers.

本發明之第3態樣所涉及之處理裝置係對被處理體施予處理的處理室,使用上述第1或第2態樣所涉及之腔室。In the processing apparatus according to the third aspect of the present invention, the processing chamber to which the object to be processed is applied is the chamber according to the first or second aspect.

若藉由本發明時,則可以提供即使超過運送尺寸之界限亦可以運送之腔室,及使用該腔室之處理裝置。According to the present invention, it is possible to provide a chamber that can be transported even beyond the limit of the transport size, and a processing apparatus using the chamber.

以下參照圖面說明本發明之實施型態。在整個參照圖面全部,針對相同部份賦予相同參照符號。Embodiments of the present invention will be described below with reference to the drawings. The same reference numerals are given to the same parts throughout the drawings.

(第1實施型態)(first embodiment)

第1圖A為表示使本發明之第1實施型態所涉及之腔室適應於處理腔室之一例的斜視圖,第1圖B為第1圖A所示之處理腔室之分解斜視圖。Fig. 1A is a perspective view showing an example in which a chamber according to a first embodiment of the present invention is applied to a processing chamber, and Fig. 1B is an exploded perspective view of the processing chamber shown in Fig. 1A. .

如第1圖A及第1圖B所示般,處理腔室1a具備開放至少一個之側面的長方體狀之本體2,和裝卸自如地被安裝在該本體2之被開放之側面的側板3a、3b。As shown in FIG. 1A and FIG. 1B, the processing chamber 1a includes a rectangular parallelepiped body 2 that opens at least one side surface, and a side plate 3a that is detachably attached to the opened side surface of the main body 2, 3b.

本體2為例如鋁製。在本例中,4個側面2a至2d中,側面2a成為用於搬入搬出被處理體在本例中為FPD用基板之搬入搬出口(閘閥開口)4之第1側壁5。並且,在本例中,開放鄰接於側面2a之兩個側面2b、2c,相對於側面2a之一個側面2d成為第2側壁6。本體2之上部成為安裝有電極等之開口7的天板8,下部成為形成有將配線等插通於載置台等之開口或排氣口(在第1圖A及第1圖B中無圖式)的底板10。即是,處理腔室1a係由藉由第1側壁5、第2側壁6、天板8及底板10所構成之角筒形狀之本體2、和阻塞該角筒之被開放的兩端部的側板3a、3b而構成。The body 2 is made of, for example, aluminum. In the present embodiment, the side surface 2a is the first side wall 5 for loading and unloading the object to be processed (in this example, the loading/unloading port (gate valve opening) 4 of the FPD substrate in the fourth side surface 2a to 2d. Further, in this example, the two side faces 2b and 2c adjacent to the side surface 2a are opened, and the second side wall 6 is formed on one side surface 2d of the side surface 2a. The upper portion of the main body 2 is a ceiling 8 to which an opening 7 such as an electrode is attached, and the lower portion is formed with an opening or an exhaust port through which a wiring or the like is inserted into a mounting table or the like (there is no picture in FIG. 1A and FIG. 1B). The bottom plate 10 of the formula). That is, the processing chamber 1a is a body 2 having a rectangular tube shape formed by the first side wall 5, the second side wall 6, the sky plate 8, and the bottom plate 10, and the open end portions of the corner tube are blocked. The side plates 3a and 3b are formed.

側板3a、3b在本例中,經密封構件11例如O型環等,使用能夠裝卸之固定構件12,例如螺栓等裝卸自如地安裝在側面2b、2c。In this example, the side plates 3a and 3b are detachably attached to the side faces 2b and 2c via a sealing member 11, for example, an O-ring or the like, using a detachable fixing member 12 such as a bolt.

本體2之寬度w、高度h、深度I,在本例中,雖然各被限於運送尺寸之界限以內,但是在本體2安裝側板3之狀態下,沿著側板安裝方向之寬度w1,超過運送尺寸之界限。In the present example, the width w, the height h, and the depth I of the main body 2 are limited to the limit of the transport size. However, in the state in which the side panel 3 is attached to the main body 2, the width w1 along the mounting direction of the side panel exceeds the transport size. The limit.

如此之大小之處理腔室1a如以往般,於藉由溶接接合鋁製之板材,執行機械加工製作成箱型形狀之時,則不可以運送。As in the prior art, the processing chamber 1a of such a size is not transportable when the aluminum plate is melt-bonded and mechanically processed into a box shape.

但是,第1實施型態所涉及之處理腔室1a被分割成本體2和側板3a、3b。本體2之各邊長度限定在運送尺寸之界限以內,並將本體2及側板3a、3b運送至生產工場例如FPD生產工場,在生產工場中,將側板3a、3b安裝於本體2。依此,即使為不可能運送之大小的處理腔室1a,亦可設置在生產工場。However, the processing chamber 1a according to the first embodiment is divided into the body 2 and the side plates 3a and 3b. The length of each side of the body 2 is limited to the limit of the transport size, and the body 2 and the side plates 3a, 3b are transported to a production plant such as an FPD production plant where the side plates 3a, 3b are mounted to the body 2. Accordingly, even the processing chamber 1a of a size that is impossible to transport can be installed in a production plant.

如此一來,若藉由第一實施形態,則可以提供即使超過運送尺寸之界限亦可以運送之處理腔室。As a result, according to the first embodiment, it is possible to provide a processing chamber that can be transported even if it exceeds the limit of the transport size.

第2圖A為概略性表示第1圖A所示之處理腔室的剖面圖。並且,第2圖A所示之剖面相當於沿著第1圖A之2A-2A線的剖面。Fig. 2A is a cross-sectional view schematically showing the processing chamber shown in Fig. 1A. Further, the cross section shown in Fig. 2 corresponds to a cross section taken along line 2A-2A of Fig. 1A.

第2圖A所示之處理腔室1a係以電容耦合型平行平板電漿蝕刻處理腔室而被構成。在此,就以FPD而言例示有液晶顯示器(LCD)、電激發光(Electro Luminescence:EL)顯示器,電漿顯示面板(PDP)等。The processing chamber 1a shown in Fig. 2A is constructed by a capacitive coupling type parallel plate plasma etching processing chamber. Here, a liquid crystal display (LCD), an electroluminescence (EL) display, a plasma display panel (PDP), or the like is exemplified as the FPD.

在處理腔室1a之底板10上,設置有被處理體,例如用以載置FPD用基板G之載置台21。載置台21係經絕緣構件22被支撐在處理腔室1a之底板10。載置台21經被形成在底板10之開口9連接有用以供給高頻電力之供電線23,在該供電線23連接有整合器24及高頻電源25。自高頻電源25供給例如13.56MHz之高頻電力至載置台21。依此,載置台21係當作下部電極而發揮功能。The substrate 10 of the processing chamber 1a is provided with a target object, for example, a mounting table 21 on which the FPD substrate G is placed. The mounting table 21 is supported by the bottom plate 10 of the processing chamber 1a via the insulating member 22. The mounting table 21 is connected to a power supply line 23 for supplying high-frequency power via an opening 9 formed in the bottom plate 10, and an integrator 24 and a high-frequency power source 25 are connected to the power supply line 23. High frequency power of, for example, 13.56 MHz is supplied from the high frequency power source 25 to the mounting table 21. Accordingly, the mounting table 21 functions as a lower electrode.

在載置台21之天板8之開口7上,安裝有上部電極基座26,在該上部電極基座26支撐著當作上部電極而發揮功能之噴淋頭27。在噴淋頭27經氣體供給管28a連接有氣體供給源29。在噴淋頭27之與載置台21之對向之面形成有吐出處理氣體之無圖式的多數吐出孔。電漿處理,例如電漿蝕刻用之處理氣體係自處理氣體供給源29經無圖式之吐出孔而被供給至處理腔室1a之內部。噴淋頭27係與當作下部電極而發揮功能之載置台21一起構成一對平行平板電極。再者,開口7之尺寸也大於載置台21之尺寸。載置台21例如可以藉由開口7而被放入處理腔室1a之內部。An upper electrode base 26 is attached to the opening 7 of the top plate 8 of the mounting table 21, and the upper electrode base 26 supports a shower head 27 that functions as an upper electrode. A gas supply source 29 is connected to the shower head 27 via a gas supply pipe 28a. On the surface of the shower head 27 opposite to the mounting table 21, a plurality of discharge holes of a non-patterned discharge gas are formed. The plasma treatment, for example, the treatment gas system for plasma etching, is supplied from the processing gas supply source 29 to the inside of the processing chamber 1a via the discharge port of the drawing. The shower head 27 constitutes a pair of parallel plate electrodes together with the mounting table 21 functioning as a lower electrode. Furthermore, the size of the opening 7 is also larger than the size of the mounting table 21. The mounting table 21 can be placed inside the processing chamber 1a by, for example, the opening 7.

側板3a、3b係裝卸自如地被安裝在本體2之側面2b、2c。在本例中,側板3a、3b經鉸鏈30開關自如地被安裝在本體2。The side plates 3a and 3b are detachably attached to the side faces 2b and 2c of the main body 2. In this example, the side plates 3a, 3b are detachably mounted to the body 2 via a hinge 30.

在處理腔室1a中,例如被處理體為具有矩形之平面形狀的FPD用基板G。再者,矩形之FPD用基板G為大約3000m方形或超過此之大型基板。如此大型之FPD用基板G之最短邊之長度大約3000mm例如2800mm以上。處理如此大型之FPD用基板G之處理腔室1a之例如側板3a、3b之安裝方向之寬度w1已經超過運送尺寸之界限。In the processing chamber 1a, for example, the object to be processed is a substrate G for FPD having a rectangular planar shape. Further, the rectangular FPD substrate G is a large substrate of about 3000 m square or more. The length of the shortest side of the substrate F of such a large FPD is about 3000 mm, for example, 2800 mm or more. The width w1 of the mounting direction of the processing chambers 1a of the large-sized FPD substrate G, for example, the side plates 3a, 3b, has exceeded the limit of the transport size.

但是,在本例中,腔室1a之側板3a、3b裝卸自如地連接於被限定在運送尺寸之界限以內之本體2。因此,可以在分割本體2和側板3a、3b之狀態,從製造處理腔室1a之製造工場運送至生產FPD之生產工場。被輸送之本體2和側板3a、3b係藉由在生產工場內安裝,即使持有超過運送尺寸之界限之腔室1a的處理腔室1a,亦可以設置在生產工場。However, in this example, the side plates 3a, 3b of the chamber 1a are detachably connected to the body 2 which is limited to the limit of the transport size. Therefore, it is possible to transport from the manufacturing plant of the manufacturing process chamber 1a to the production plant where the FPD is produced in a state where the body 2 and the side plates 3a, 3b are divided. The conveyed body 2 and the side plates 3a, 3b can be installed in a production plant by being installed in a production plant, even if the processing chamber 1a of the chamber 1a exceeding the limit of the conveyance size is held.

並且,在本例中,本體2和側板3a、3b裝卸自如地連接。在本例中,尤其經鉸鏈30開關自如地被安裝。Further, in this example, the main body 2 and the side plates 3a and 3b are detachably connected. In this case, in particular, the hinge 30 is freely mounted in a switch.

若藉由如此之處理腔室1a時,例如第2圖B所示般,側板3a、3b之全體開關,可以使腔室1a之內部全體性露出於外界。若藉由側板3a、3b全體性開關之腔室1a時,例如比起原本僅經由在腔室1a部分性打開之開口7、9而執行腔室1a之內部之維修的裝置,可以取得容易執行腔室1a之內部之維修的優點。When the chamber 1a is processed as described above, for example, as shown in FIG. 2B, the entire switches of the side plates 3a and 3b can expose the entire interior of the chamber 1a to the outside. When the chamber 1a is integrally connected by the side plates 3a, 3b, for example, it is easier to perform the device for performing maintenance of the inside of the chamber 1a only via the openings 7, 9 which are partially opened in the chamber 1a. The advantage of the maintenance of the interior of the chamber 1a.

(第2實施型態)(Second embodiment)

第3圖A為表示使本發明之第2實施型態所涉及之腔室適應於處理腔室之一例的斜視圖,第3圖B為第3圖A所示之腔室之分解斜視圖。Fig. 3A is a perspective view showing an example in which a chamber according to a second embodiment of the present invention is adapted to a processing chamber, and Fig. 3B is an exploded perspective view of the chamber shown in Fig. 3A.

如第3圖A及第3圖B所示般,第2實施型態所涉及之腔室1b與第1實施型態所涉及之腔室1a不同的係在本體2之被開放的側面2b、2c,和在側板3a、3b之間,又具備間隔物31a、31b。其他與腔室1a幾乎相同。As shown in FIG. 3A and FIG. 3B, the chamber 1b according to the second embodiment is different from the chamber 1a according to the first embodiment in the open side 2b of the main body 2, 2c, and between the side plates 3a, 3b, spacers 31a, 31b are further provided. The other is almost the same as the chamber 1a.

間隔物31a、31b被安裝於本體2之被開放之側面2b、2c,在本例中,持有與本體2之側面2b、2c之開口形狀一致之開口32。The spacers 31a and 31b are attached to the opened side faces 2b and 2c of the main body 2, and in this example, have openings 32 that conform to the opening shapes of the side faces 2b and 2c of the main body 2.

第4圖A為表示使用第3圖A所示之腔室之基板處理裝置之一例。並且,第4圖A所示之剖面相當於沿著第3圖A之4A-4A線的剖面。Fig. 4A is a view showing an example of a substrate processing apparatus using the chamber shown in Fig. 3A. Further, the cross section shown in Fig. 4A corresponds to a cross section taken along line 4A-4A of Fig. 3A.

第4圖A所示之處理腔室1b係與第2圖A所示之處理腔室1a相同,以電容耦合型平行平板電漿蝕刻處理腔室而被構成。The processing chamber 1b shown in Fig. 4A is constructed in the same manner as the processing chamber 1a shown in Fig. 2A, and is etched by a capacitive coupling type parallel plate plasma etching processing chamber.

處理腔室1b與處理腔室1a不同的係在腔室1b之本體2的被開放之側面2b、2c,和側板3a、3b之間又具備間隔物31a、31b,和FPD用基板G之尺寸大於處理腔室1a。其他與腔室1a幾乎相同。The processing chamber 1b is different from the processing chamber 1a in that the open side faces 2b, 2c of the body 2 of the chamber 1b and the side plates 3a, 3b are provided with spacers 31a, 31b, and the size of the FPD substrate G. It is larger than the processing chamber 1a. The other is almost the same as the chamber 1a.

第5圖A至第5圖C為藉由本發明之實施型態所涉及之處理腔室1a及1b所產生之優點之一例的水平剖面圖。5A to 5C are horizontal cross-sectional views showing an example of advantages produced by the processing chambers 1a and 1b according to the embodiment of the present invention.

第5圖A為持有藉由溶接接合板材,且執行機械加工以一體型製作成箱型形狀之處理腔室1c的比較例。於FPD用基板G0之尺寸小時,即使處理腔室1c為一體型,處理腔室1c之大小也限定在運送尺寸之界限以內。Fig. 5A is a comparative example in which a processing chamber 1c in which a plate shape is joined by fusion bonding and mechanical processing is performed to integrally form a box shape. When the size of the FPD substrate G0 is small, even if the processing chamber 1c is of an integral type, the size of the processing chamber 1c is limited to the limit of the transport size.

第5圖B為持有第1實施型態所涉及之處理腔室1a之實施例。當FPD用基板G1之尺寸變大,以一體型製作處理腔室1a時,則在超過運送尺寸之界限之時,如第5圖B所示般,分割本體2和側板3a、3b,將本體2限定在運送尺寸之界限以內。依此,雖然如上述般,即使為超過運送尺寸之界限的處理腔室1a,亦可以運送。Fig. 5B is an embodiment in which the processing chamber 1a according to the first embodiment is held. When the size of the FPD substrate G1 is increased to form the processing chamber 1a in an integrated manner, when the boundary of the transport size is exceeded, the body 2 and the side plates 3a and 3b are divided as shown in FIG. 2 is limited to the limit of the shipping size. Accordingly, as described above, even the processing chamber 1a exceeding the limit of the transport size can be transported.

第5圖C為持有第2實施型態所涉及之處理腔室1b之實施例。FPD用基板G2之尺寸變得更大之時,使間隔物31a、31b介於側面2b、2c,和側板3a、3b之間,延伸本體2和側板3a、3b之間的距離。依此,即使尺寸大之FPD用基板G2,亦可以執行處理,並且可以取得亦能夠運送之處理腔室1b。Fig. 5C is an embodiment in which the processing chamber 1b according to the second embodiment is held. When the size of the FPD substrate G2 becomes larger, the spacers 31a and 31b are interposed between the side faces 2b and 2c and the side plates 3a and 3b, and the distance between the body 2 and the side plates 3a and 3b is extended. According to this, even if the FPD substrate G2 having a large size can be processed, the processing chamber 1b that can be transported can be obtained.

再者,FPD用基板G之大小,即使為同一規格,每FPD製造廠商也有微小的尺寸差。在如此之情形下,若藉由第2實施型態所涉及之處理腔室1b時,藉由利用間隔物31a、31b,可以微調整處理腔室1b之大小。藉由微調整處理腔室1b之大小,例如也可以取得即使尺寸差異不同之FPD基板G亦可以使自玻璃基板G之邊緣到側板3a、3b為止之距離成為一定,對於具有尺寸差異之FPD基板G亦能夠執行均勻處理之處理腔室1b的優點。Further, the size of the FPD substrate G has a small size difference per FPD manufacturer even if it is the same size. In such a case, when the processing chamber 1b according to the second embodiment is used, the size of the processing chamber 1b can be finely adjusted by using the spacers 31a and 31b. By finely adjusting the size of the processing chamber 1b, for example, even if the FPD substrate G having different dimensional differences can be obtained, the distance from the edge of the glass substrate G to the side plates 3a and 3b can be made constant, and the FPD substrate having the difference in size can be obtained. G is also capable of performing the processing chamber 1b of uniform processing.

並且,腔室1a、1b例如如第2圖B、第4圖B所示般,開關側板3a、3b之全體。Further, the chambers 1a and 1b are, as shown in FIG. 2B and FIG. 4B, for example, the entire switch side plates 3a and 3b.

若藉由如此之腔室1a、1b時,例如第6圖A及第6圖B所示般,具有側板3和底板10成為一體之本體2,比起天板8a當作上蓋開關之腔室1c,取得容易存取至下部電極21,並且容易進行維修之優點。When such a chamber 1a, 1b is used, for example, as shown in Figs. 6A and 6B, the body 2 having the side plate 3 and the bottom plate 10 integrated is used as a chamber for the upper cover switch than the top plate 8a. 1c, the advantage of easy access to the lower electrode 21 and easy maintenance is obtained.

(第3實施型態)(third embodiment)

第7圖為表示使本發明之第3實施型態所涉及之腔室適應於處理腔室之一例的分解斜視圖,第8圖為表示本發明第3實施型態所涉及之腔室之其他例的分解斜視圖。Fig. 7 is an exploded perspective view showing an example in which a chamber according to a third embodiment of the present invention is applied to a processing chamber, and Fig. 8 is a view showing another chamber according to a third embodiment of the present invention. An exploded perspective view of an example.

如第7圖及第8圖所示般,第3實施型態所涉及之處理腔室1d、1e為將天板8又設為分割型。天板8在本例中成為箱型形狀,經密封構件11,例如O型環等,裝卸自如地當作上蓋被安裝在在本體2之上面。第7圖所示之處理腔室1d係對第1實施型態所涉及之處理腔室1a,又將天板8設為分割型,第8圖所示之處理腔室1e係對第2實施型態所涉及之處理腔室1b,又將天板8設為分割型。As shown in Figs. 7 and 8, the processing chambers 1d and 1e according to the third embodiment are configured to divide the top plate 8 into a split type. In this example, the top plate 8 has a box shape, and is attached to the upper surface of the main body 2 as a top cover via a sealing member 11, for example, an O-ring or the like. The processing chamber 1d shown in Fig. 7 is a division type for the processing chamber 1a according to the first embodiment, and the processing chamber 1e shown in Fig. 8 is for the second embodiment. The processing chamber 1b involved in the type also has the top plate 8 as a split type.

如此一來,不僅將側板3a、3b設為分割型,即使又將天板8分割,作為上蓋裝卸自如地安裝在本體2亦可。In this way, not only the side plates 3a and 3b are divided into a split type, but the top plate 8 can be detachably attached to the main body 2 as an upper cover.

若藉由第3實施型態時,比起第1、第2實施型態,可以取得即使於處理腔室之高度方向之大小超過運送尺寸之界限之時亦可以對應之優點。According to the third embodiment, compared with the first and second embodiments, it is possible to obtain an advantage even when the size of the processing chamber in the height direction exceeds the limit of the transport size.

再者,藉由天板8為裝卸自如,比起僅有側板3a、3b裝卸自如之第1、第2實施型態,具有更容易執行維修之優點。Further, the roof panel 8 is detachable, and has the advantages of being easier to perform maintenance than the first and second embodiments in which the side panels 3a and 3b are detachably attached.

並且,雖無特別圖式,但是不僅天板8,即使將第1圖B或第3圖B所示之底板10又予以分割亦可,分割即使在天板8及底板10皆僅針對平板部分亦可。Further, although there is no special pattern, not only the slab 8, but also the bottom plate 10 shown in FIG. 1B or FIG. 3B may be divided, and even the slab 8 and the bottom plate 10 are only for the flat plate portion. Also.

(第4實施型態)(fourth embodiment)

第9圖A為表示使本發明之第4實施型態所涉及之腔室適應於處理腔室之一例的水平剖面圖,第9圖B為表示第9圖A所示之9B-9B線所示之剖面圖,第9圖C為第9圖A所示之9C-9C線所示之剖面圖。Fig. 9A is a horizontal cross-sectional view showing an example in which a chamber according to a fourth embodiment of the present invention is adapted to a processing chamber, and Fig. 9B is a view showing a line 9B-9B shown in Fig. 9A. The cross-sectional view shown in Fig. 9 is a cross-sectional view taken along line 9C-9C shown in Fig. 9A.

如第9圖A至第9圖C所示般,第4實施型態所涉及之處理腔室1f係將肋部33安裝在側板3a、3b,使側板3a、3b之壁厚t1比第1至第3實施型態更薄。肋部33可以當作側板3a、3b之補強材而發揮功能。因此,在本例中,例如可以使側板3a、3b之壁厚t1比本體2之側壁5、6之壁厚t2、t3薄。As shown in FIG. 9 to FIG. 9C, the processing chamber 1f according to the fourth embodiment has the ribs 33 attached to the side plates 3a and 3b, and the wall thickness t1 of the side plates 3a and 3b is made larger than that of the first embodiment. It is thinner than the third embodiment. The ribs 33 can function as reinforcing materials for the side plates 3a and 3b. Therefore, in this example, for example, the wall thickness t1 of the side plates 3a, 3b can be made thinner than the wall thicknesses t2, t3 of the side walls 5, 6 of the body 2.

若藉由第4實施型態所涉及之處理腔室1f,因可以薄化側板3a、3b之壁厚t1,故可以取得如減輕處理腔室1f所需之材料,例如鋁之使用量,並且可以下降處理腔室1f所涉及之成本之優點。According to the processing chamber 1f according to the fourth embodiment, since the thickness t1 of the side plates 3a and 3b can be thinned, it is possible to obtain a material such as aluminum used for reducing the processing chamber 1f, and The advantage of the cost involved in the processing chamber 1f can be reduced.

當然,即使壁厚t1為薄之側板3a、3b,亦可以裝卸自如,在本例中係經鉸鏈30而開關自如地安裝在本體2。因此,也可以與第1至第3實施型態一樣取得良好之維修性。Of course, even if the wall thickness t1 is the thin side plates 3a, 3b, it can be detachably attached, and in this example, the body 2 is detachably attached via the hinge 30. Therefore, it is also possible to obtain good maintainability as in the first to third embodiments.

第10圖A為表示使本發明之第4實施型態所涉及之處理腔室之其他例的水平剖面圖,第10圖B為表示第10圖A所示之10B-10B線所示之剖面圖,第10圖C為第10圖A所示之10C-10C線所示之剖面圖。Fig. 10A is a horizontal cross-sectional view showing another example of the processing chamber according to the fourth embodiment of the present invention, and Fig. 10B is a cross-sectional view taken along line 10B-10B shown in Fig. 10A. Fig. 10 is a cross-sectional view taken along line 10C-10C shown in Fig. 10A.

如第10圖A至第10圖C所示般,安裝有肋部33之側板3a、3b亦可以適用於具有間隔物31a、31b之處理腔室1g。此時,可以降低因處理腔室1g所涉及之成本。並且,具有肋部33之側板3a、3b例如因亦可以經鉸鏈30開關自如地安裝在間隔物31a、31b,故可以維持良好之維修性。As shown in Figs. 10A to 10C, the side plates 3a, 3b to which the ribs 33 are attached can also be applied to the processing chamber 1g having the spacers 31a, 31b. At this time, the cost involved in the processing chamber 1g can be reduced. Further, the side plates 3a and 3b having the ribs 33 can be attached to the spacers 31a and 31b via the hinge 30, for example, so that good maintainability can be maintained.

以上,雖然藉由幾個實施型態說明本發明,但是本發明並不限定於上述實施型態,可作各種變形。The present invention has been described above by way of several embodiments, but the present invention is not limited to the above-described embodiments, and various modifications can be made.

例如,在上述實施形態中,雖然針對FPD用基板之處理腔室表示本發明,但是即使適用於搬運腔室或裝載鎖定腔室等之各種腔室亦可,還有亦可適用於對其他各種基板執行處理之處理裝置的腔室。For example, in the above-described embodiment, the present invention is shown in the processing chamber of the FPD substrate. However, the present invention is also applicable to various other types of chambers such as a transfer chamber or a load lock chamber. The substrate performs a processing chamber of the processing device.

再者,在上述實施型態中,雖然將側板3a、3b設為一片板狀構件,但是即使例如第11圖A及第11圖B所示般,設為在側板3a、3b朝向腔室1h之內部持有凹陷34之箱形構件亦可。Further, in the above-described embodiment, the side plates 3a and 3b are formed as a single plate-shaped member. However, as shown in, for example, FIGS. 11A and 11B, the side plates 3a and 3b are oriented toward the chamber 1h. A box-shaped member having a recess 34 therein may also be used.

再者,在上述實施型態中,雖然使側板3a、3b朝向底板10側開關,但是即使如第12圖所示般,朝向天板8側開關亦可。於使側板3a、3b朝向天板8側開關之時,則有例如在維修等打開側板3a、3b之時,操作者容易接近腔室1i之優點。Further, in the above-described embodiment, the side plates 3a and 3b are opened and closed toward the bottom plate 10 side, but the switch may be turned toward the top plate 8 as shown in Fig. 12 . When the side plates 3a and 3b are opened and closed toward the top plate 8, there is an advantage that the operator can easily access the chamber 1i when the side plates 3a and 3b are opened, for example, during maintenance.

再者,在上述實施型態中,雖然經鉸鏈30開關自如地將側板3a、3b安裝在本體2之側面2b、2c,但是即使如第13圖所示般,將側板3a、3b之全體以可以自本體2之側面2b、2c拆下之狀態,安裝在側面2b、2c亦可。即使在如此之腔室1j,因拆下側板3a、3b,故有於維修之時,操作者容易接近腔室1j之優點。Further, in the above-described embodiment, although the side plates 3a and 3b are detachably attached to the side faces 2b and 2c of the main body 2 via the hinge 30, even as shown in Fig. 13, the entire side plates 3a and 3b are The side faces 2b and 2c may be attached to the side faces 2b and 2c of the main body 2, and may be attached to the side faces 2b and 2c. Even in such a chamber 1j, since the side plates 3a, 3b are removed, there is an advantage that the operator can easily access the chamber 1j at the time of maintenance.

再者,在上述實施型態中,雖然將側板3a、3b裝卸自如地分別安裝在兩個側面,但是即使側板裝卸自如地安裝在至少一個側面即可。Further, in the above-described embodiment, the side plates 3a and 3b are detachably attached to the two side faces, respectively, but the side plates may be detachably attached to at least one side surface.

再者,在上述實施型態中,雖然舉例對兩個側面設為分割構造之例,但是即使為對所有之面設為分割構造亦可。Further, in the above-described embodiment, the example in which the two side faces are divided into the divided structures is exemplified, but the dividing structure may be used for all the faces.

並且,上述實施型態,及第11圖至第13圖所示之變形例,亦可任意組合而加以實施。Further, the above-described embodiment and the modifications shown in Figs. 11 to 13 can be implemented in any combination.

1a至1g...腔室1a to 1g. . . Chamber

2...本體2. . . Ontology

2a至2d...側面2a to 2d. . . side

3a、3b...側板3a, 3b. . . Side panel

12...固定構件12. . . Fixed member

30...鉸鏈30. . . Hinge

31...間隔物31. . . Spacer

32...開口32. . . Opening

33...肋部33. . . Rib

34...凹陷34. . . Depression

G...FPD用基板(被處理體)G. . . Substrate for FPD (subject to be processed)

w...寬度w. . . width

h...高度h. . . height

I...深度I. . . depth

第1圖A為表示使該發明之第1實施型態所涉及之腔室之一例的斜視圖,第1圖B為第1圖A所示之腔室之分解斜視圖。Fig. 1A is a perspective view showing an example of a chamber according to a first embodiment of the present invention, and Fig. 1B is an exploded perspective view of the chamber shown in Fig. 1A.

第2圖A為概略性表示使用第1圖A所示之腔室的處理腔室之剖面圖,第2圖B為表示打開側板之狀態的剖面圖。Fig. 2A is a cross-sectional view schematically showing a processing chamber using the chamber shown in Fig. 1A, and Fig. 2B is a cross-sectional view showing a state in which the side plates are opened.

第3圖A為表示使該發明之第2實施型態所涉及之腔室之一例的斜視圖,第3圖B為第3圖A所示之腔室之分解斜視圖。Fig. 3 is a perspective view showing an example of a chamber according to a second embodiment of the invention, and Fig. 3B is an exploded perspective view of the chamber shown in Fig. 3A.

第4圖A為概略性表示使用第3圖A所示之腔室的處理腔室之剖面圖,第4圖B為表示打開側板之狀態的剖面圖。Fig. 4A is a cross-sectional view schematically showing a processing chamber using the chamber shown in Fig. 3, and Fig. 4B is a cross-sectional view showing a state in which the side plates are opened.

第5圖A至第5圖C為表示該發明之實施型態所涉及之腔室所產生之優點之一例的水平剖面圖。Fig. 5 to Fig. 5C are horizontal cross-sectional views showing an example of the advantages of the chamber according to the embodiment of the invention.

第6圖A為表示比較例所涉及之處理腔室之剖面圖,第6圖B為表示打開上蓋之狀態的剖面圖。Fig. 6A is a cross-sectional view showing a processing chamber according to a comparative example, and Fig. 6B is a cross-sectional view showing a state in which an upper lid is opened.

第7圖為表示該發明之第3實施型態所涉及之腔室之一例的分解斜視圖。Fig. 7 is an exploded perspective view showing an example of a chamber according to a third embodiment of the invention.

第8圖為表示該發明之第3實施型態所涉及之腔室之其他例的分解斜視圖。Fig. 8 is an exploded perspective view showing another example of the chamber according to the third embodiment of the present invention.

第9圖A為表示該發明之第4實施型態所涉及之處理腔室之一例的水平剖面圖,第9圖B為表示第9圖A所示之9B-9B線所示之剖面圖,第9圖C為第9圖A所示之9C-9C線所示之剖面圖。FIG. 9 is a horizontal cross-sectional view showing an example of a processing chamber according to a fourth embodiment of the present invention, and FIG. 9B is a cross-sectional view showing a line 9B-9B shown in FIG. Fig. 9C is a cross-sectional view taken along line 9C-9C shown in Fig. 9A.

第10圖A為表示該發明之第4實施型態所涉及之處理腔室之其他例的水平剖面圖,第10圖B為表示第10圖A所示之10B-10B線所示之剖面圖,第10圖C為第10圖A所示之10C-10C線所示之剖面圖。Fig. 10A is a horizontal cross-sectional view showing another example of the processing chamber according to the fourth embodiment of the present invention, and Fig. 10B is a cross-sectional view showing the line 10B-10B shown in Fig. 10A. Fig. 10C is a cross-sectional view taken along line 10C-10C shown in Fig. 10A.

第11圖A為概略性表示該發明之實施型態之第1變形例所涉及之處理腔室之剖面圖,第11圖B為表示打開側板之狀態的剖面圖。11 is a cross-sectional view schematically showing a processing chamber according to a first modification of the embodiment of the present invention, and FIG. 11B is a cross-sectional view showing a state in which the side plates are opened.

第12圖為概略性表示該發明之實施型態之第2變形例所涉及之處理腔室之剖面圖。Fig. 12 is a cross-sectional view schematically showing a processing chamber according to a second modification of the embodiment of the invention.

第13圖為概略性表示該發明之實施型態之第3變形例所涉及之處理腔室之剖面圖。Figure 13 is a cross-sectional view schematically showing a processing chamber according to a third modification of the embodiment of the present invention.

1a...處理腔室1a. . . Processing chamber

2...本體2. . . Ontology

2a至2d...側面2a to 2d. . . side

3a、3b...側板3a, 3b. . . Side panel

4...搬入搬出口4. . . Move in and out

5...第1側壁5. . . First side wall

6...第2側壁6. . . Second side wall

7...開口7. . . Opening

8...天板8. . . Sky

10...底板10. . . Bottom plate

11...密封構件11. . . Sealing member

12...固定構件12. . . Fixed member

w...寬度w. . . width

h...高度h. . . height

w1...寬度W1. . . width

Claims (10)

一種腔室,其特徵為:具備開放至少一個側面的長方體狀之本體;和藉由能夠裝卸之固定構件,使能夠安裝卸下並且開關自如地被安裝在上述本體之被開放之側面的側板。 A chamber characterized by having a rectangular parallelepiped body having at least one side open; and a detachable fixing member for attaching and detachably attaching to a side panel of the open side of the body. 如申請專利範圍第1項所記載之腔室,其中,上述本體具有角筒形狀,且該角筒之端部對應於上述側面。 The chamber according to claim 1, wherein the body has a corner tube shape, and an end portion of the corner tube corresponds to the side surface. 如申請專利範圍第1項所記載之腔室,其中,上述本體具有開關自如之上蓋。 The chamber of claim 1, wherein the body has a switchable upper cover. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,上述側板為朝向上述本體內部持有凹陷的箱形構件。 The chamber according to any one of claims 1 to 3, wherein the side plate is a box-shaped member that has a recess toward the inside of the body. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,上述本體之被開放的側面和上述側板之間存在持有與上述本體之開口形狀一致之開口的間隔物。 The chamber according to any one of claims 1 to 3, wherein a spacer having an opening that conforms to an opening shape of the body is present between the opened side surface of the main body and the side plate. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,上述側板經鉸鏈開關自如地被安裝在上述本體。 The chamber according to any one of claims 1 to 3, wherein the side plate is freely attached to the body via a hinge switch. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,在上述側板安裝肋部,上述側板之壁厚較上述本體之側壁的壁厚薄。 The chamber according to any one of claims 1 to 3, wherein, in the side plate mounting rib, a thickness of the side plate is thinner than a wall thickness of a side wall of the body. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,上述本體之寬度、高度、深度各被限制在運輸尺寸之界限以內,安裝有上述側板之本體之沿著側板安裝方向之寬度超過運輸尺寸之界限。 The chamber according to any one of claims 1 to 3, wherein the width, the height and the depth of the body are each limited within a limit of the transport size, and the body of the side plate is mounted along the side plate. The width of the mounting direction exceeds the limit of the transport size. 如申請專利範圍第1至3項中之任一項所記載之腔室,其中,被處理體之平面形狀為矩形,上述矩形之最短邊之長度為2800mm以上。 The chamber according to any one of claims 1 to 3, wherein the object to be processed has a rectangular shape in plan view, and the shortest side of the rectangle has a length of 2800 mm or more. 一種處理裝置,其特徵為:對被處理體執行處理之處理室,使用上述申請專利範圍第1至9項中之任一項所記載之腔室。 A processing apparatus characterized in that the processing chamber for performing processing on the object to be processed is the chamber described in any one of the above-mentioned claims.
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