TWI500929B - Voltage ion sensor read signal correction system - Google Patents
Voltage ion sensor read signal correction system Download PDFInfo
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Description
本發明係有關於一種感測器訊號校正之方法,特別係針對電壓式離子感測器量測之輸出訊號漂移校正。The invention relates to a method for sensor signal correction, in particular to output signal drift correction for voltage ion sensor measurement.
離子感測場效電晶體(Ion Sensitive Field Effect Transistor,ISFET)係於1970年首先由P.Bergveld提出,結構差異係以ISFET之感測膜取代金屬-氧化物-半導體場效電晶體(Metal-Oxide-Semiconductor Field Effect Transistor,MOSFET)之金屬閘極,此ISFET具微小化、輸入阻抗高及響應快等特性;Agner Fog於1984提出金屬氧化物電極(Metal oxide pH electrode),則取代傳統玻璃電極不便之處,其響應快、攜帶方便且保存容易。近年來,由於發展中國家之老年人口比率迅速增加,慢性疾病管理與預防觀點已浮現,使得居家檢測之生醫感測器逐漸被應用於實際臨床實驗。The Ion Sensitive Field Effect Transistor (ISFET) was first proposed by P. Bergveld in 1970. The structural difference was replaced by a metal-oxide-semiconductor field effect transistor with a sensing film of ISFET (Metal- Oxide-Semiconductor Field Effect Transistor (MOSFET) metal gate, which has miniaturization, high input impedance and fast response; Agner Fog proposed a metal oxide pH electrode in 1984 to replace the traditional glass electrode The inconvenience is fast, easy to carry and easy to store. In recent years, due to the rapid increase in the elderly population ratio in developing countries, the concept of chronic disease management and prevention has emerged, making the biosensors for home testing gradually applied to practical clinical trials.
然而,使用電路元件作為感測器時,經常會遇到時漂效應(Time-Drift Effect)之現象,所謂時漂(Time-Drift),係指於相同溫度下,長時間持續量測時,量測系統之輸出電位會隨著時間漂移(Drift),使得感測器之穩定度不佳,因而限制感測器之應用性。為解決此問題,需要一校正系統協助訊號之校正。However, when a circuit component is used as a sensor, a phenomenon of Time-Drift effect is often encountered. Time-Drift refers to a long-term continuous measurement at the same temperature. The output potential of the measurement system drifts with time (Drift), making the sensor less stable, thus limiting the applicability of the sensor. In order to solve this problem, a correction system is needed to assist the correction of the signal.
另外,溫度效應(Temperature Effect),即不同量測環境溫度,導致輸出訊號產生偏移之現象,亦為生醫感測器所需消除之非理想效應。In addition, the temperature effect (Temperature Effect), that is, the different measurement of the ambient temperature, causes the output signal to shift, which is also a non-ideal effect that the biomedical sensor needs to eliminate.
本發明提供一種感測器之非理想效應校正方法與裝置。感測器之非理想效應校正方法與裝置係用以將訊號放大、溫度效應補償以及時漂效應校正,以消除感測訊號因量測環境及時間所導致輸出訊號漂移之現象。The invention provides a method and device for correcting non-ideal effects of a sensor. The non-ideal effect correction method and device of the sensor are used to correct signal amplification, temperature effect compensation and time drift effect to eliminate the phenomenon that the output signal drifts due to the measurement environment and time.
本發明提供一種電壓式離子感測器讀出訊號校正系統,用以量測一待測溶液。電壓式離子感測器讀出訊號校正系統包括一參考電極、一感測元件、一放大器、一溫度測試棒、一讀取裝置以及一顯示裝置。參考電極用以提供一參考電位。感測元件用以偵測待測溶液,並根據待測溶液以及參考電位產生一感測訊號。放大器用以接收感測訊號,以及將感測訊號放大,以產生一讀出訊號。溫度測試棒用以量測待測溶液之溫度,並產生一溫度訊號。讀取裝置用以分別對讀出訊號以及溫度訊號進行一類比數位轉換,以產生相應之一讀出數位訊號以及一溫度數位訊號。顯示裝置用以接收讀出數位訊號以及溫度數位訊號,並根據讀出數位訊號以及溫度數位訊號顯示一結果。The invention provides a voltage ion sensor read signal correction system for measuring a solution to be tested. The voltage ion sensor read signal correction system includes a reference electrode, a sensing component, an amplifier, a temperature test bar, a reading device, and a display device. The reference electrode is used to provide a reference potential. The sensing component is configured to detect the solution to be tested, and generate a sensing signal according to the solution to be tested and the reference potential. The amplifier is configured to receive the sensing signal and amplify the sensing signal to generate a read signal. The temperature test rod is used to measure the temperature of the solution to be tested and generate a temperature signal. The reading device is configured to perform analog-to-digital conversion on the read signal and the temperature signal respectively to generate a corresponding one of the read digital signal and a temperature digital signal. The display device is configured to receive the read digital signal and the temperature digital signal, and display a result according to the read digital signal and the temperature digital signal.
10‧‧‧電壓式離子感測器讀出訊號校正系統10‧‧‧Voltage type ion sensor read signal correction system
11‧‧‧感測元件11‧‧‧Sensor components
12‧‧‧溫度測試棒12‧‧‧Temperature test stick
13‧‧‧待測溶液13‧‧‧Test solution
14‧‧‧放大器14‧‧ ‧Amplifier
15‧‧‧讀取裝置15‧‧‧Reading device
16‧‧‧顯示裝置16‧‧‧ display device
112‧‧‧參考電極112‧‧‧ reference electrode
31‧‧‧基板31‧‧‧Substrate
32‧‧‧感測電極32‧‧‧Sensing electrode
33‧‧‧開口33‧‧‧ openings
34‧‧‧導體層34‧‧‧Conductor layer
35‧‧‧絕緣層35‧‧‧Insulation
53‧‧‧時漂校正系統53‧‧‧ hour drift correction system
54‧‧‧溫度補償系統54‧‧‧Temperature compensation system
55‧‧‧計時裝置55‧‧‧Timer
56‧‧‧顯示模組56‧‧‧Display module
S1‧‧‧感測訊號S1‧‧‧Sensor signal
A1‧‧‧讀出訊號A1‧‧‧ read signal
A2‧‧‧讀出數位訊號A2‧‧‧Read digital signal
C1‧‧‧溫度訊號C1‧‧‧temperature signal
C2‧‧‧溫度數位訊號C2‧‧‧Temperature digital signal
VB‧‧‧參考電壓源VB‧‧‧reference voltage source
GND‧‧‧接地GND‧‧‧ Grounding
P1‧‧‧時漂校正後之數位訊號Digital signal after P1‧‧‧ hour drift correction
P2‧‧‧溫度補償後之量測訊號P2‧‧‧Measurement signal after temperature compensation
T1‧‧‧時間訊號T1‧‧‧ time signal
第1圖為本發明所提供之電壓式離子感測器讀出訊號校正系統之方塊圖。FIG. 1 is a block diagram of a voltage type ion sensor read signal correction system provided by the present invention.
第2圖為本發明所提供之電壓式離子感測器讀出訊號校正系統之量測訊號處理方法的流程圖。FIG. 2 is a flow chart of a method for processing a measurement signal of a voltage-type ion sensor read signal correction system provided by the present invention.
第3圖為本發明所提供之感測元件之方塊圖。Figure 3 is a block diagram of the sensing elements provided by the present invention.
第4圖為本發明所提供之顯示裝置之方塊圖。Figure 4 is a block diagram of a display device provided by the present invention.
第5圖為經由本發明所提供之裝置及方法量測後酸鹼值7之待測溶液的時漂曲線圖。Figure 5 is a time-lapse graph of the solution to be tested having a pH of 7 after being measured by the apparatus and method provided by the present invention.
第6圖為經由本發明所提供之裝置及方法校正後酸鹼值7之待測溶液的時漂曲線圖。Figure 6 is a time-lapse graph of the solution to be tested having a pH of 7 corrected by the apparatus and method provided by the present invention.
第7圖為經由本發明所提供之裝置及方法量測後待測溶液之溫度曲線圖。Figure 7 is a graph showing the temperature of the solution to be tested after being measured by the apparatus and method provided by the present invention.
第8圖為經由本發明所提供之裝置及方法補償後待測溶液之溫度曲線圖。Figure 8 is a graph showing the temperature profile of the solution to be tested after being compensated by the apparatus and method provided by the present invention.
以下將詳細討論本發明各種實施例之裝置及使用方法。然而值得注意的是,本發明所提供之許多可行的發明概念可實施在各種特定範 圍中。這些特定實施例僅用於舉例說明本發明之裝置及使用方法,但非用於限定本發明之範圍。The apparatus and method of use of various embodiments of the present invention are discussed in detail below. However, it is worth noting that many of the possible inventive concepts provided by the present invention can be implemented in various specific models. Around. These specific examples are only intended to illustrate the apparatus and methods of use of the present invention, but are not intended to limit the scope of the invention.
第1圖為本發明所提供之電壓式離子感測器讀出訊號校正系統之方塊圖。電壓式離子感測器讀出訊號校正系統10用以量測一待測溶液13。值得注意的是,待測溶液13具有一未知之酸鹼值。在本發明之一實施例中,電壓式離子感測器讀出訊號校正系統10係用以量測待測溶液13之酸鹼值。電壓式離子感測器讀出訊號校正系統10包括一參考電極112、一感測元件11、一放大器14、一溫度測試棒12、一讀取裝置15以及一顯示裝置16。FIG. 1 is a block diagram of a voltage type ion sensor read signal correction system provided by the present invention. The voltage ion sensor read signal correction system 10 is used to measure a solution 13 to be tested. It is worth noting that the solution 13 to be tested has an unknown pH value. In one embodiment of the invention, the voltage ion sensor read signal correction system 10 is configured to measure the pH value of the solution 13 to be tested. The voltage ion sensor read signal correction system 10 includes a reference electrode 112, a sensing component 11, an amplifier 14, a temperature test bar 12, a reading device 15, and a display device 16.
參考電極112耦接至一參考電壓源VB並且浸泡於待測溶液13中,用以提供一參考電位。值得注意的是,參考電極112之材料可為銀或氯化銀,本發明在此不加以限制。The reference electrode 112 is coupled to a reference voltage source VB and immersed in the solution 13 to be tested to provide a reference potential. It should be noted that the material of the reference electrode 112 may be silver or silver chloride, and the invention is not limited herein.
感測元件11浸泡於待測溶液13中,用以偵測待測溶液13,其中感測元件11更用以根據待測溶液13以及參考電極112所提供之參考電位產生一感測訊號S1,並且將感測訊號S1傳送至放大器14。值得注意的是,在本實施例中,感測訊號S1係為一類比訊號。The sensing component 11 is immersed in the solution 13 to be tested for detecting the solution 13 to be tested. The sensing component 11 is further configured to generate a sensing signal S1 according to the reference potential provided by the solution 13 to be tested and the reference electrode 112. And the sensing signal S1 is transmitted to the amplifier 14. It should be noted that in this embodiment, the sensing signal S1 is an analog signal.
放大器14用以接收感測訊號S1,以及將感測訊號S1放大,以產生一讀出訊號A1。另外,放大器14更用以將讀出訊號A1傳送至讀取裝置15。在本發明之另一實施例中,放大器14更用以將感測訊號S1放大並且濾波,以產生讀出訊號A1,本發明在此不加以限制。值得注意的是,放大器14可為一運算放大器14、一差動放大器14、一儀表放大器14及/或一電壓放大器14,本發明在此不加以限制。The amplifier 14 is configured to receive the sensing signal S1 and amplify the sensing signal S1 to generate a read signal A1. In addition, the amplifier 14 is further configured to transmit the read signal A1 to the reading device 15. In another embodiment of the present invention, the amplifier 14 is further configured to amplify and filter the sensing signal S1 to generate the read signal A1, which is not limited herein. It should be noted that the amplifier 14 can be an operational amplifier 14, a differential amplifier 14, an instrumentation amplifier 14, and/or a voltage amplifier 14, and the invention is not limited herein.
溫度測試棒12用以量測待測溶液13之溫度,並產生一溫度訊號C1。另外,溫度測試棒12更用以將溫度訊號C1傳送至讀取裝置15。值得注意的是,溫度測試棒12可為一雙載子電晶體、一熱電偶、一溫度量測晶片及/或一溫度感測電路,本發明在此不加以限制。值得注意的是,在本實施例中,溫度訊號C1係為一類比訊號。The temperature test rod 12 is used to measure the temperature of the solution 13 to be tested and generate a temperature signal C1. In addition, the temperature test rod 12 is further used to transmit the temperature signal C1 to the reading device 15. It should be noted that the temperature test bar 12 can be a dual carrier transistor, a thermocouple, a temperature measuring chip, and/or a temperature sensing circuit, and the invention is not limited herein. It should be noted that in this embodiment, the temperature signal C1 is an analog signal.
讀取裝置15用以分別對讀出訊號A1以及溫度訊號C1進行一類比數位轉換,以產生相應之一讀出數位訊號A2以及一溫度數位訊號 C2。另外,讀取裝置15更用以將讀出數位訊號A2以及溫度數位訊號C2傳送至顯示裝置16。值得注意的是,讀取裝置15可為一資料擷取裝置、一類比數位轉換晶片及/或一類比數位轉換電路,本發明在此不加以限制。The reading device 15 is configured to perform analog-to-digital conversion on the read signal A1 and the temperature signal C1, respectively, to generate a corresponding one of the read digital signal A2 and a temperature digital signal. C2. In addition, the reading device 15 is further configured to transmit the read digital signal A2 and the temperature digital signal C2 to the display device 16. It should be noted that the reading device 15 can be a data capturing device, an analog-to-digital conversion chip, and/or an analog-to-digital conversion circuit. The invention is not limited herein.
顯示裝置16用以接收讀出數位訊號A2以及溫度數位訊號C2,並根據讀出數位訊號A2以及溫度數位訊號C2顯示一結果。值得注意的是,顯示裝置16可藉由一螢幕、語音或者燈號顯示上述結果,本發明在此不加以限制。在本發明之一實施例中,顯示裝置16更用以根據溫度數位訊號C2校正讀出數位訊號A2後,產生上述結果,本發明在此不加以限制。The display device 16 is configured to receive the read digital signal A2 and the temperature digital signal C2, and display a result according to the read digital signal A2 and the temperature digital signal C2. It should be noted that the display device 16 can display the above results by a screen, a voice or a light number, and the present invention is not limited thereto. In an embodiment of the present invention, the display device 16 is further configured to correct the read digital signal A2 according to the temperature digital signal C2 to generate the above result, which is not limited herein.
第2圖為本發明所提供之電壓式離子感測器讀出訊號校正系統之量測訊號處理方法的流程圖。電壓式離子感測器讀出訊號校正系統之量測訊號處理方法適用於第1圖所示之電壓式離子感測器讀出訊號校正系統10。流程開始於步驟S200及/或步驟S204。FIG. 2 is a flow chart of a method for processing a measurement signal of a voltage-type ion sensor read signal correction system provided by the present invention. The measurement signal processing method of the voltage type ion sensor read signal correction system is applied to the voltage type ion sensor read signal correction system 10 shown in FIG. The flow begins in step S200 and/or step S204.
在步驟S200中,感測元件11中之一第一端與待測溶液13接觸,以根據待測溶液13以及參考電極112所提供之參考電位產生一感測訊號S1。In step S200, one of the first ends of the sensing element 11 is in contact with the solution 13 to be tested to generate a sensing signal S1 according to the reference potential provided by the solution 13 to be tested and the reference electrode 112.
接著,在步驟S202中,感測元件11中之一第二端與放大器14電性耦合,以將所產生之感測訊號S1傳送至放大器14。接著,放大器14將感測訊號S1放大,以產生讀出訊號A1,並將讀出訊號A1傳送至讀取裝置15。Next, in step S202, one of the second ends of the sensing element 11 is electrically coupled to the amplifier 14 to transmit the generated sensing signal S1 to the amplifier 14. Next, the amplifier 14 amplifies the sensing signal S1 to generate the read signal A1, and transmits the read signal A1 to the reading device 15.
接著,在步驟S204中,溫度測試棒12之一第一端與待測溶液13接觸,以產生溫度訊號C1。另外,溫度測試棒12之一第二端耦接至讀取裝置15,並將所產生之溫度訊號C1傳送至讀取裝置15。值得注意的是,為了清楚地說明本發明所提供之方法,因此第2圖將流程分為步驟S200-S204以分別敘述各元件之動作,但本發明不加以限制步驟S200以及S204之先後執行順序。在本發明之一實施例中,步驟S200以及步驟S204可以同時進行。在本發明之另一實施例中,步驟S204可在步驟S200之前執行,本發明在此不加以限制。Next, in step S204, the first end of one of the temperature test bars 12 is in contact with the solution 13 to be tested to generate a temperature signal C1. In addition, the second end of one of the temperature test bars 12 is coupled to the reading device 15 and transmits the generated temperature signal C1 to the reading device 15. It is to be noted that, in order to clearly explain the method provided by the present invention, the second diagram divides the flow into steps S200-S204 to describe the actions of the respective components, but the present invention does not limit the sequential execution sequence of steps S200 and S204. . In an embodiment of the present invention, step S200 and step S204 can be performed simultaneously. In another embodiment of the present invention, step S204 may be performed before step S200, and the present invention is not limited thereto.
接著,在步驟S206中,讀取裝置15分別將讀出訊號A1與溫度訊號C1進行類比數位轉換,以產生讀出數位訊號A2以及溫度數位訊 號C2。Next, in step S206, the reading device 15 performs analog-digital conversion on the read signal A1 and the temperature signal C1, respectively, to generate the read digital signal A2 and the temperature digital signal. No. C2.
接著,在步驟S208中,顯示裝置16將自讀取裝置15所擷取之讀出數位訊號A2以及溫度數位訊號C2進行校正,並將校正後之結果顯示於一螢幕(未圖示)。Next, in step S208, the display device 16 corrects the read digital signal A2 and the temperature digital signal C2 captured from the reading device 15, and displays the corrected result on a screen (not shown).
第3圖為本發明所提供之感測元件之方塊圖。在本實施例中,感測元件11包括一基板31、一感測電極32、一導體層34以及一絕緣層35,但本發明不限於此。舉例而言,基板31可為一塑膠基板31或者一矽基板31,但本發明不限於此。感測電極32形成於基板31上方。導體層34形成於基板31上方並與感測電極32電性連接,用以傳送感測訊號S1至放大器14。值得注意的是,導體層34可為銀膠或者碳膠,本發明在此不加以限制。絕緣層35形成於感測電極32以及導體層34上方,其中絕緣層35具有一開口33,使得感測電極32可與待測溶液13接觸。Figure 3 is a block diagram of the sensing elements provided by the present invention. In the present embodiment, the sensing element 11 includes a substrate 31, a sensing electrode 32, a conductor layer 34, and an insulating layer 35, but the invention is not limited thereto. For example, the substrate 31 may be a plastic substrate 31 or a germanium substrate 31, but the invention is not limited thereto. The sensing electrode 32 is formed over the substrate 31. The conductor layer 34 is formed on the substrate 31 and electrically connected to the sensing electrode 32 for transmitting the sensing signal S1 to the amplifier 14 . It should be noted that the conductor layer 34 may be silver glue or carbon glue, and the invention is not limited herein. The insulating layer 35 is formed over the sensing electrode 32 and the conductor layer 34, wherein the insulating layer 35 has an opening 33 such that the sensing electrode 32 can be in contact with the solution 13 to be tested.
在本發明之一較佳的實施例中,基板31係為可撓式塑膠基板,其中基板31中之感測電極32係以射頻濺鍍系統沉積一面積為4mm2之方形的二氧化釕(RuO2)薄膜。另外,將銀膠以網版印刷方式形成於基板31之上,並以攝氏110度至140度之溫度烘烤20至40分鐘使銀膠硬化,以形成導體層34。導體層34之第一端與感測電極32電性接觸,導體層34之第二端則耦接至放大器14之輸入端。最後,將環氧樹脂以網版印刷方式形成於感測電極32與導體層34之上,並以攝氏120度至140度進行烘烤,使環氧樹脂固定,形成絕緣層35。絕緣層35具有一直徑為2mm的圓形開口33,以將感測電極32暴露在外。In a preferred embodiment of the present invention, the substrate 31 is a flexible plastic substrate, wherein the sensing electrode 32 in the substrate 31 is deposited by a radio frequency sputtering system with a square area of 4 mm 2 of cerium oxide (RuO 2 ). )film. Further, silver paste is formed on the substrate 31 by screen printing, and baked at a temperature of 110 to 140 degrees Celsius for 20 to 40 minutes to harden the silver paste to form the conductor layer 34. The first end of the conductor layer 34 is in electrical contact with the sensing electrode 32, and the second end of the conductor layer 34 is coupled to the input end of the amplifier 14. Finally, the epoxy resin is formed on the sensing electrode 32 and the conductor layer 34 by screen printing, and baked at 120 to 140 degrees Celsius to fix the epoxy resin to form the insulating layer 35. The insulating layer 35 has a circular opening 33 having a diameter of 2 mm to expose the sensing electrode 32.
第4圖為本發明所提供之顯示裝置之方塊圖。在本實施例中,顯示裝置16包括一時漂校正系統53、一溫度補償系統54、一計時裝置55以及一顯示模組56。Figure 4 is a block diagram of a display device provided by the present invention. In the present embodiment, the display device 16 includes a time drift correction system 53, a temperature compensation system 54, a timing device 55, and a display module 56.
時漂校正系統53用以自讀取裝置15接收讀出數位訊號A2以及自計時裝置55接收一時間訊號T1,並且根據一第一函式以及時間訊號T1,對讀出數位訊號A2進行一時漂校正,以產生一時漂校正後之數位訊號P1。舉例而言,第一函式如公式(1)所示: P1=A2-(T1-18000)×W………公式(1)The time drift correction system 53 is configured to receive the read digital signal A2 from the reading device 15 and receive a time signal T1 from the timing device 55, and perform a time drift on the read digital signal A2 according to a first function and a time signal T1. Correction to generate a digital signal P1 after one-time drift correction. For example, the first function is shown in equation (1): P1=A2-(T1-18000)×W.........Formula (1)
其中,漂移量W為感測元件11在待測溶液13浸泡後之一既定時段所產生之讀出數位訊號A2的漂移量。在本發明之一實施例中,漂移量W可為感測元件11在待測溶液13浸泡後第5小時至第12小時,所產生之讀出數位訊號A2對應時間的漂移量。舉例而言,如第5圖所示,感測元件11在待測溶液13浸泡後第5小時所產生之響應電壓(即讀出數位訊號A2所代表之電壓)係為1428毫伏特,並且感測元件11在待測溶液13浸泡後第12小時所產生之響應電壓(即讀出數位訊號A2所代表之電壓)係為1444毫伏特。因此,1444毫伏特減去1428毫伏特後除以時間差(12小時-5小時=7小時)所獲得之數值,即為漂移量W。在其他實施例中,漂移量W可為感測元件11在待測溶液13浸泡後第5小時至第13小時,所產生之讀出數位訊號A2對應時間的漂移量,本發明在此不加以限制。The drift amount W is the amount of drift of the read digital signal A2 generated by the sensing element 11 during a predetermined period of time after the solution 13 is immersed. In one embodiment of the present invention, the drift amount W may be the amount of drift of the read digital signal A2 generated by the sensing element 11 from the 5th hour to the 12th hour after the solution 13 is immersed. For example, as shown in FIG. 5, the response voltage generated by the sensing element 11 at the 5th hour after the solution 13 is immersed (ie, the voltage represented by the read digital signal A2) is 1428 millivolts, and the sense is The response voltage generated by the measuring element 11 at the 12th hour after the immersion of the solution 13 to be tested (ie, the voltage represented by the read digital signal A2) is 1444 millivolts. Therefore, the value obtained by dividing 1444 millivolts by 1428 millivolts divided by the time difference (12 hours - 5 hours = 7 hours) is the drift amount W. In other embodiments, the drift amount W may be the amount of drift of the read digital signal A2 generated by the sensing element 11 from the 5th hour to the 13th hour after the solution 13 is immersed, and the present invention does not limit.
另外,漂移量W可為經由測量後,預先儲存於時漂校正系統53中之一數值。在本發明之另一實施例中,時漂校正系統53可在量測待測溶液13之酸鹼值時,根據所量測到之讀出數位訊號A2,計算漂移量W,並在計算出漂移量W後,將漂移量W代入公式(1)中,對讀出數位訊號A2進行校正。舉例而言,時漂校正系統53可在量測待測溶液13之酸鹼值時,根據第5小時以及第12小時所量測到之讀出數位訊號A2,計算漂移量W,並在計算出漂移量W後(即第12小時後),將漂移量W代入公式(1)中,對讀出數位訊號A2進行校正,但本發明不限於此。In addition, the drift amount W may be a value previously stored in the time drift correction system 53 after the measurement. In another embodiment of the present invention, the time drift correction system 53 can calculate the drift amount W according to the measured digital signal A2 when measuring the pH value of the solution 13 to be tested, and calculate After the drift amount W, the drift amount W is substituted into the formula (1), and the read digital signal A2 is corrected. For example, the time drift correction system 53 can calculate the drift amount W according to the measured digital signal A2 measured at the 5th hour and the 12th hour when measuring the pH value of the solution 13 to be tested, and calculate After the drift amount W (i.e., after the 12th hour), the drift amount W is substituted into the formula (1), and the read digital signal A2 is corrected, but the present invention is not limited thereto.
溫度補償系統54用以接收溫度數位訊號C2以及時漂校正後之數位訊號P1,並且根據一第二函式以及溫度數位訊號C2,對時漂校正後之數位訊號P1進行一溫度校正,以產生一溫度補償後之量測訊號P2。舉例而言,第二函式如公式(2)所示:
其中,離子靈敏度S係為感測元件11在不同酸鹼值之待測溶液13中所產生之響應電壓(即讀出數位訊號A2所代表之電壓)的變化量。值得注意的是,離子靈敏度S係為經由測量後,預先儲存於溫度補償系統54中之一數值。舉例而言,設備設計者可預先將感測元件11浸泡不同酸鹼值之待測溶液13中,並分別測量感測元件11所產生之響應電壓。接著,根據量測的結果描繪一響應電壓對酸鹼值之曲線圖,而曲線圖中之曲線的斜率即為離子靈敏度S。The ion sensitivity S is the amount of change in the response voltage generated by the sensing element 11 in the solution 13 of different pH values (ie, the voltage represented by the read digital signal A2). It is worth noting that the ion sensitivity S is a value previously stored in the temperature compensation system 54 after being measured. For example, the device designer can previously immerse the sensing element 11 in the solution 13 of different pH values, and measure the response voltage generated by the sensing element 11, respectively. Next, a graph of the response voltage versus the pH value is plotted based on the measured result, and the slope of the curve in the graph is the ion sensitivity S.
溫度靈敏度ST1係為感測元件11於不同溫度之待測溶液13中,所產生之響應電壓(即讀出數位訊號A2所代表之電壓)之離子靈敏度S的變化量。值得注意的是,溫度靈敏度ST1係為經由測量後,預先儲存於溫度補償系統54中之一數值。舉例而言,設備設計者可預先量測在不同溫度下之離子靈敏度S。接著,根據量測的結果描繪一離子靈敏度S對溫度之曲線圖,而曲線圖中之曲線的斜率即為溫度靈敏度ST1。The temperature sensitivity ST1 is the amount of change in the ion sensitivity S of the response voltage (ie, the voltage represented by the read digital signal A2) generated by the sensing element 11 in the solution 13 to be tested at different temperatures. It is worth noting that the temperature sensitivity ST1 is a value previously stored in the temperature compensation system 54 after being measured. For example, the device designer can pre-measure the ion sensitivity S at different temperatures. Next, a graph of the ion sensitivity S versus temperature is plotted based on the measured result, and the slope of the curve in the graph is the temperature sensitivity ST1.
計時裝置55用以計算量測待測溶液13所經過之時間,並產生時間訊號T1。The timing device 55 is configured to calculate the elapsed time of the solution 13 to be tested, and generate a time signal T1.
顯示模組56用以顯示相應於溫度補償後之量測訊號P2之結果。值得注意的是,顯示模組56可設置於顯示裝置16內或者顯示裝置16外,本發明在此不加以限制。舉例而言,顯示模組56可設置於一筆記型電腦、一掌上型電腦、一手機或者一液晶螢幕中,本發明在此不加以限制。The display module 56 is configured to display the result corresponding to the temperature-compensated measurement signal P2. It should be noted that the display module 56 can be disposed in the display device 16 or outside the display device 16. The invention is not limited herein. For example, the display module 56 can be disposed in a notebook computer, a palmtop computer, a mobile phone, or a liquid crystal screen. The invention is not limited herein.
第5圖為經由本發明所提供之裝置及方法量測後酸鹼值7之待測溶液的時漂曲線圖。第6圖為經由本發明所提供之裝置及方法校正後酸鹼值7之待測溶液的時漂曲線圖。由第5圖以及第6圖可知,校正前之時漂率為2.29毫伏/小時,校正後之時漂率為0.05毫伏/小時。因此,經由本發明所提供之裝置及方法校正後之時漂校正後之數位訊號P1的時漂率降低了2.24毫伏/小時。Figure 5 is a time-lapse graph of the solution to be tested having a pH of 7 after being measured by the apparatus and method provided by the present invention. Figure 6 is a time-lapse graph of the solution to be tested having a pH of 7 corrected by the apparatus and method provided by the present invention. As can be seen from Fig. 5 and Fig. 6, the time drift before the correction was 2.29 mV/hr, and the time-lapse after the correction was 0.05 mV/hr. Therefore, the time-lapse rate of the digital signal P1 after the time-lapse correction corrected by the apparatus and method provided by the present invention is reduced by 2.24 mV/hr.
第7圖為經由本發明所提供之裝置及方法量測後待測溶液之溫度曲線圖,其中第7圖係於不同環境溫度下量測pH值為1、3、5、7、9、11、13之待測溶液13的溫度曲線圖。第8圖為經由本發明所提供之裝置及方法補償後待測溶液之溫度曲線圖,其中第8圖係於不同環境溫度下 量測pH值為1、3、5、7、9、11、13之待測溶液13的溫度曲線圖。由第7圖以及第8圖可知,校正前之溫度係數為0.047酸鹼值/攝氏每度(pH/oC),補償後之溫度係數為0.018酸鹼值/攝氏每度(pH/oC),其中溫度係數係酸鹼值對於每攝氏溫度之變化率。換言之,溫度係數越大,量測結果因溫度所產生之誤差值越大,溫度係數越小,量測結果因溫度所產生之之誤差值越小。因此,經由本發明所提供之裝置及方法對溫度進行補償後之溫度補償後之量測訊號P2的溫度係數降低了0.029酸鹼值/攝氏每度(pH/oC)。Figure 7 is a graph showing the temperature of the solution to be tested after being measured by the apparatus and method provided by the present invention, wherein the seventh graph measures the pH values of 1, 3, 5, 7, 9, 11 at different ambient temperatures. , 13 the temperature profile of the solution 13 to be tested. Figure 8 is a temperature graph of the solution to be tested after being compensated by the apparatus and method provided by the present invention, wherein the figure 8 is at different ambient temperatures The temperature profile of the solution 13 to be tested having a pH of 1, 3, 5, 7, 9, 11, and 13 was measured. It can be seen from Fig. 7 and Fig. 8 that the temperature coefficient before calibration is 0.047 pH/Celsius per degree (pH/oC), and the temperature coefficient after compensation is 0.018 pH/Celsius per degree (pH/oC). The temperature coefficient is the rate of change of the pH value per degree Celsius. In other words, the larger the temperature coefficient, the larger the error value of the measurement result due to the temperature, and the smaller the temperature coefficient, the smaller the error value of the measurement result due to the temperature. Therefore, the temperature coefficient of the temperature-compensated measurement signal P2 after the temperature is compensated by the apparatus and method provided by the present invention is reduced by 0.029 pH/Cels per degree (pH/oC).
本發明之方法,或特定型態或其部份,可以以程式碼的型態存在。程式碼可儲存於實體媒體,如軟碟、光碟片、硬碟、或是任何其他機器可讀取(如電腦可讀取)儲存媒體,亦或不限於外在形式之電腦程式產品,其中,當程式碼被機器,如電腦載入且執行時,此機器變成用以參與本發明之裝置。程式碼也可透過一些傳送媒體,如電線、電纜、光纖及/或任何傳輸型態進行傳送,其中,當程式碼被機器,如電腦接收、載入且執行時,此機器變成用以參與本發明之裝置。當在一般用途處理單元實作時,程式碼結合處理單元提供一操作類似於應用特定邏輯電路之獨特裝置。The method of the invention, or a particular type or portion thereof, may exist in the form of a code. The code can be stored in a physical medium such as a floppy disk, a CD, a hard disk, or any other machine readable (such as computer readable) storage medium, or is not limited to an external form of computer program product, wherein When the code is loaded and executed by a machine, such as a computer, the machine becomes a device for participating in the present invention. The code can also be transmitted over a number of transmission media, such as wires, cables, fiber optics, and/or any transmission type, where the machine becomes part of the program when it is received, loaded, and executed by a machine, such as a computer. Invented device. When implemented in a general purpose processing unit, the code combination processing unit provides a unique means of operation similar to application specific logic.
惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。另外本發明的任一實施例或申請專利範圍不須達成本發明所揭露之全部目的、優點及/或特點。此外,摘要部分和標題僅是用來輔助專利文件搜尋之用,並非用來限制本發明之權利範圍。The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent. In addition, any of the objects, advantages, and/or features of the present invention are not required to be construed as the invention. In addition, the abstract sections and headings are only used to assist in the search of patent documents and are not intended to limit the scope of the invention.
10‧‧‧電壓式離子感測器讀出訊號校正系統10‧‧‧Voltage type ion sensor read signal correction system
11‧‧‧感測元件11‧‧‧Sensor components
12‧‧‧溫度測試棒12‧‧‧Temperature test stick
13‧‧‧待測溶液13‧‧‧Test solution
14‧‧‧放大器14‧‧ ‧Amplifier
15‧‧‧讀取裝置15‧‧‧Reading device
16‧‧‧顯示裝置16‧‧‧ display device
112‧‧‧參考電極112‧‧‧ reference electrode
S1‧‧‧感測訊號S1‧‧‧Sensor signal
A1‧‧‧讀出訊號A1‧‧‧ read signal
A2‧‧‧讀出數位訊號A2‧‧‧Read digital signal
C1‧‧‧溫度訊號C1‧‧‧temperature signal
C2‧‧‧溫度數位訊號C2‧‧‧Temperature digital signal
VB‧‧‧參考電壓源VB‧‧‧reference voltage source
GND‧‧‧接地GND‧‧‧ Grounding
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007108465A1 (en) * | 2006-03-20 | 2007-09-27 | National University Corporation Toyohashi University Of Technology | Accumulated type chemical/physical phenomenon detection method and device thereof |
| TW201104277A (en) * | 2009-07-22 | 2011-02-01 | Univ Nat Yunlin Sci & Tech | Drift calibration circuit and drift calibration system |
| TW201118373A (en) * | 2009-11-16 | 2011-06-01 | Univ Nat Yunlin Sci & Tech | Multi-electrode measuring system |
| WO2012093727A1 (en) * | 2011-01-07 | 2012-07-12 | 国立大学法人三重大学 | Reference electrode |
| TWM441131U (en) * | 2012-06-27 | 2012-11-11 | Univ Chung Chou Sci & Tech | Zinc oxide extended gate ion-sensitive field-effect transistor |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2007108465A1 (en) * | 2006-03-20 | 2007-09-27 | National University Corporation Toyohashi University Of Technology | Accumulated type chemical/physical phenomenon detection method and device thereof |
| TW201104277A (en) * | 2009-07-22 | 2011-02-01 | Univ Nat Yunlin Sci & Tech | Drift calibration circuit and drift calibration system |
| TW201118373A (en) * | 2009-11-16 | 2011-06-01 | Univ Nat Yunlin Sci & Tech | Multi-electrode measuring system |
| WO2012093727A1 (en) * | 2011-01-07 | 2012-07-12 | 国立大学法人三重大学 | Reference electrode |
| TWM441131U (en) * | 2012-06-27 | 2012-11-11 | Univ Chung Chou Sci & Tech | Zinc oxide extended gate ion-sensitive field-effect transistor |
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