TWI571437B - Method for growing graphene by chemical vapor deposition - Google Patents
Method for growing graphene by chemical vapor deposition Download PDFInfo
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- TWI571437B TWI571437B TW105114900A TW105114900A TWI571437B TW I571437 B TWI571437 B TW I571437B TW 105114900 A TW105114900 A TW 105114900A TW 105114900 A TW105114900 A TW 105114900A TW I571437 B TWI571437 B TW I571437B
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Description
本發明是有關於一種成長石墨烯的方法,且特別是有關於一種藉由化學氣相沉積成長石墨烯的方法。The present invention relates to a method of growing graphene, and more particularly to a method of growing graphene by chemical vapor deposition.
石墨烯包括由單層碳原子以sp 2共價鍵結合成的緊密蜂巢狀晶格的二維結構。石墨烯具有多種特別性質,尤其是高的載子遷移率、硬度、熱傳導率、電流承載能力以及極大的表面-體積比,而有許多關於石墨烯於下個世代的生醫、電子及光電元件中的應用的研究。 Graphene includes a two-dimensional structure of a tight honeycomb lattice formed by covalent bonding of a single layer of carbon atoms with sp 2 . Graphene has a variety of special properties, especially high carrier mobility, hardness, thermal conductivity, current carrying capacity and extremely large surface-to-volume ratio, while there are many biomedical, electronic and optoelectronic components for graphene in the next generation. Research in the application.
製備石墨烯的作法之一為使用化學氣相沈積(chemical vapor deposition, CVD)。石墨烯已能成功地藉由化學氣相沈積成長於各種過渡金屬的表面上。在此成長製程中,含碳氣體在高溫下藉由過渡金屬的催化而分解。取決於各種過渡金屬對於碳氫分子的催化效果與其對應的碳溶解度的不同,分解出的碳原子於過渡金屬的表面上將產生不同程度的沉積、溶解、以及析出。One of the methods of preparing graphene is to use chemical vapor deposition (CVD). Graphene has been successfully grown on the surface of various transition metals by chemical vapor deposition. In this growth process, the carbon-containing gas is decomposed by the catalysis of the transition metal at a high temperature. Depending on the catalytic effect of the various transition metals on the hydrocarbon molecules and their corresponding carbon solubility, the decomposed carbon atoms will produce varying degrees of deposition, dissolution, and precipitation on the surface of the transition metal.
對於銅箔(典型的用於成長石墨烯的金屬基板)而言,當覆蓋於金屬表面的碳原子形成連續的石墨烯膜,即會成為保護屏蔽,因此所述金屬表面失去催化分解隨後引入的碳氫分子的能力。這種自我限制的成長機制將使成長於銅表面上的石墨烯的單層覆蓋率受限,只能達到90%。For copper foil (a typical metal substrate for growing graphene), when a carbon atom covering a metal surface forms a continuous graphene film, it becomes a protective shield, so the metal surface loses catalytic decomposition and is subsequently introduced. The ability of hydrocarbon molecules. This self-limiting growth mechanism will limit the single layer coverage of graphene grown on copper surfaces to only 90%.
此外,為了電性隔離石墨烯膜,須藉由濕式(酸)蝕刻的方式移除成長石墨烯膜的金屬基板,且將所述石墨烯膜轉移至具有一層薄的高分子支架(polymer scaffold)的絕緣基板。然而,石墨烯膜除了時常在溼式蝕刻製程中受到強酸破壞結構外,殘餘的金屬粒子更無可避免地殘留在石墨烯的表面上而使電子散射,因此降低了石墨烯的電子遷移率,並且,前述薄高分子支架通常為由長鏈狀的碳氫分子組成,使得其難以藉由使用任何習知的有機溶劑以徹底地清除。In addition, in order to electrically isolate the graphene film, the metal substrate of the grown graphene film is removed by wet (acid) etching, and the graphene film is transferred to have a thin polymer scaffold (polymer scaffold) ) an insulating substrate. However, in addition to the strong acid-destroying structure in the wet etching process, the residual metal particles are inevitably left on the surface of the graphene to scatter electrons, thereby reducing the electron mobility of the graphene. Further, the aforementioned thin polymer scaffold is usually composed of long-chain hydrocarbon molecules, making it difficult to thoroughly remove by using any conventional organic solvent.
本發明提供一種新穎的藉由化學氣相沉積成長石墨烯的方法,其可將低缺陷的石墨烯膜直接成長於基板的表面(特別是絕緣的表面)。The present invention provides a novel method of growing graphene by chemical vapor deposition, which can directly grow a low-defect graphene film on a surface of a substrate (particularly an insulating surface).
本發明的藉由化學氣相沉積成長石墨烯的方法包括:裝載至少一基板至爐管中;引入含有含氧碳源(oxygen-containing carbon source)的反應氣體至爐管中;加熱反應氣體,且使用紫外光(UV)源對反應氣體照射紫外光,以分解含氧碳源;以及藉由碳源的分解釋放出的碳原子來沉積石墨烯膜於所述至少一基板的表面上。The method for growing graphene by chemical vapor deposition according to the present invention comprises: loading at least one substrate into a furnace tube; introducing a reaction gas containing an oxygen-containing carbon source into the furnace tube; heating the reaction gas, And irradiating the reaction gas with ultraviolet light using an ultraviolet (UV) source to decompose the oxygen-containing carbon source; and depositing the graphene film on the surface of the at least one substrate by carbon atoms released by decomposition of the carbon source.
所述至少一基板可包括至少一絕緣基板(特別是至少一絕緣的表面)或至少一金屬基板。The at least one substrate may include at least one insulating substrate (particularly at least one insulating surface) or at least one metal substrate.
在本發明的一實施例中,上述的藉由化學氣相沉積成長石墨烯的方法更包括使用電漿源以促進含氧碳源的分解。In an embodiment of the invention, the above method of growing graphene by chemical vapor deposition further comprises using a plasma source to promote decomposition of the oxygen-containing carbon source.
在本發明的另一實施例中,上述的藉由化學氣相沉積成長石墨烯的方法更包括提供做為觸媒的金屬蒸汽至爐管中。提供金屬蒸汽的方法例如是將固體金屬置入爐管中,或者將有機金屬化合物提供至爐管中,其中固體金屬包含銅、鎳、鋅或其組合。In another embodiment of the present invention, the above method of growing graphene by chemical vapor deposition further comprises providing metal vapor as a catalyst into the furnace tube. The method of providing metal vapor is, for example, placing a solid metal into a furnace tube or supplying an organometallic compound to a furnace tube, wherein the solid metal comprises copper, nickel, zinc or a combination thereof.
反應氣體可更包括無碳的含氧化合物(例如H 2O)。反應氣體可更包括氫氣以及作為稀釋氣體的惰性氣體。 The reaction gas may further include a carbon-free oxygen-containing compound (for example, H 2 O). The reaction gas may further include hydrogen gas and an inert gas as a diluent gas.
由於碳源藉由在高溫下照射紫外光而分解,不是藉由金屬的表面分解,因此可達到將近100%的單層覆蓋率,且可避免對金屬基底的溼式(酸)蝕刻,也不必使用高分子支架來轉移石墨烯膜,而得以預防上述因溼式(酸)蝕刻及高分子支架而導致的缺點。透過經延長控制的成長時間,多層石墨烯膜可成長於基板的表面上(特別是絕緣基板的表面上)。Since the carbon source is decomposed by irradiating ultraviolet light at a high temperature, not by surface decomposition of the metal, a single layer coverage of nearly 100% can be achieved, and wet (acid) etching of the metal substrate can be avoided, and it is not necessary The use of a polymer scaffold to transfer the graphene film prevents the above-mentioned disadvantages caused by wet (acid) etching and polymer scaffolding. The multilayer graphene film can be grown on the surface of the substrate (especially on the surface of the insulating substrate) by the extended controlled growth time.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.
以下將藉由實施方式以及附圖對本發明作進一步說明,但該等實施方式以及附圖並非意欲限制本發明之範圍。舉例來說,雖然在以下實施例中用於分解碳源的紫外光在管線中開始作用在反應氣體上,且也透過所述管線而引入至爐管,但亦可改透過形成在爐管上的窗口引入紫外光而作用在反應氣體上。更明確地說,紫外光源可位於靠近反應氣體流的上游,且紫外光可在實質上與所述至少一絕緣基板的平面方向平行的方向上,透過透明窗口照射至爐管的內部空間。The invention is further illustrated by the following examples and the accompanying drawings, which are not intended to limit the scope of the invention. For example, although the ultraviolet light for decomposing the carbon source in the following embodiments starts to act on the reaction gas in the pipeline and is also introduced into the furnace tube through the pipeline, it may be modified to be formed on the furnace tube. The window introduces ultraviolet light and acts on the reaction gas. More specifically, the ultraviolet light source may be located upstream of the reactant gas stream, and the ultraviolet light may be irradiated to the inner space of the furnace tube through the transparent window in a direction substantially parallel to the planar direction of the at least one insulating substrate.
圖1繪示根據本發明的第一實施例的用於藉由化學氣相沉積成長石墨烯的方法的裝置。1 is a diagram showing an apparatus for a method of growing graphene by chemical vapor deposition according to a first embodiment of the present invention.
請參照圖1,裝載至少一基板10至爐管100中。基板10可為晶圓,且所述晶圓可在放入晶片座的狀態下裝載於爐管100中。基板10的表面可為絕緣的表面或金屬的表面。上述絕緣的表面可包括選自由矽、鍺、氧化矽、氮化矽、碳化矽、石英、藍寶石、玻璃及其組合組成的群組的材料。上述金屬的表面可包括選自由銅(Cu)、鎳(Ni)、釕(Ru)、鈷(Co)及其組合組成的群組的材料。在裝載基板10至爐管100中之前,可使用氧氣電漿或氫氣電漿處理基板10的表面。氧氣電漿可用於自基板10的表面移除有機物質。氫氣電漿可用於減少基板10的金屬表面上的原生氧化層,或者可用於清理基板10上的含碳高分子殘留物或髒汙。在裝載基板10至爐管100中之前,可沉積圖案化的含碳晶種(carbon-containing seed)於基板10的表面。Referring to FIG. 1, at least one substrate 10 is loaded into the furnace tube 100. The substrate 10 may be a wafer, and the wafer may be loaded in the furnace tube 100 in a state of being placed in the wafer holder. The surface of the substrate 10 may be an insulating surface or a metal surface. The above-described insulating surface may include a material selected from the group consisting of ruthenium, osmium, iridium oxide, tantalum nitride, tantalum carbide, quartz, sapphire, glass, and combinations thereof. The surface of the above metal may include a material selected from the group consisting of copper (Cu), nickel (Ni), ruthenium (Ru), cobalt (Co), and combinations thereof. The surface of the substrate 10 may be treated with oxygen plasma or hydrogen plasma prior to loading the substrate 10 into the furnace tube 100. Oxygen plasma can be used to remove organic materials from the surface of the substrate 10. Hydrogen plasma can be used to reduce the native oxide layer on the metal surface of substrate 10, or can be used to clean carbonaceous polymer residues or soil on substrate 10. A patterned carbon-containing seed may be deposited on the surface of the substrate 10 prior to loading the substrate 10 into the furnace tube 100.
然後,引入含有碳及氧的氣體110至爐管100中,且通常會一起將作為觸媒氣體的氫氣112以及作為稀釋氣體的惰性氣體114引入爐管100中,而形成反應氣體。氣體110基本上含有含氧碳源(oxygen-containing carbon source)。氣體110可更包括無碳的含氧化合物(例如H 2O),以促進絕緣基板10的表面上的碳原子的石墨化。分別使用三個流量計120、122、124來測量氣體110、氫氣112以及惰性氣體114的流量。氣體110、氫氣112以及惰性氣體114在引入至爐管100之前可先於管線135中混合。在此實施例中,紫外光源130設置於管線135的末端,使得由紫外光源130放射出的紫外光可被引入至管線135中,且可透過管線135而被引入至爐管100中。 Then, a gas 110 containing carbon and oxygen is introduced into the furnace tube 100, and hydrogen gas 112 as a catalyst gas and an inert gas 114 as a diluent gas are usually introduced together into the furnace tube 100 to form a reaction gas. Gas 110 essentially contains an oxygen-containing carbon source. The gas 110 may further include a carbon-free oxygen-containing compound (for example, H 2 O) to promote graphitization of carbon atoms on the surface of the insulating substrate 10. Three flow meters 120, 122, 124 are used to measure the flow of gas 110, hydrogen 112, and inert gas 114, respectively. Gas 110, hydrogen 112, and inert gas 114 may be mixed prior to introduction to furnace tube 100 prior to line 135. In this embodiment, the ultraviolet light source 130 is disposed at the end of the line 135 such that ultraviolet light emitted by the ultraviolet light source 130 can be introduced into the line 135 and can be introduced into the furnace tube 100 through the line 135.
在引入反應氣體至爐管100中時,將爐管100中的壓力藉由真空泵140降低至預定值,加熱爐管100至預定的溫度,且藉由紫外光源130提供紫外光來照射管線135及爐管100中的反應氣體。由於紫外光及加熱的效果,反應氣體中含有的含氧碳源分解,且因上述分解而釋放出的碳原子會沉積於每一基板10的表面上而形成石墨烯膜。所沉積的石墨烯膜可包括單層石墨烯或多層石墨烯,依製程條件及反應時間而定。When the reaction gas is introduced into the furnace tube 100, the pressure in the furnace tube 100 is lowered to a predetermined value by the vacuum pump 140, the furnace tube 100 is heated to a predetermined temperature, and ultraviolet light is supplied from the ultraviolet light source 130 to illuminate the line 135. The reaction gas in the furnace tube 100. Due to the effect of ultraviolet light and heating, the oxygen-containing carbon source contained in the reaction gas is decomposed, and carbon atoms released by the above decomposition are deposited on the surface of each of the substrates 10 to form a graphene film. The deposited graphene film may comprise a single layer of graphene or a plurality of layers of graphene, depending on process conditions and reaction time.
含氧碳源可選自由一氧化碳、二氧化碳、酮、醚、酯、醇、醛、苯酚、有機酸及其組合組成的群組。含氧碳源中含有的氧具有提供具低活化能的反應路徑的功效,碳原子可藉此於絕緣基板的表面上石墨化。惰性氣體114可選自氬以及氦。取決於反應腔室的大小,含有碳及氧的氣體110的流量可在5~600 sccm的範圍內,氫氣112的流量可在5~200 sccm的範圍內,且惰性氣體114的流量可在60~800 sccm的範圍內。爐管100中的壓力藉由真空計145測量,且所述壓力可降低至數十torr。爐管100可加熱至600°C~1100°C範圍內的溫度。藉由紫外光源130提供的紫外光可具有160 nm~400 nm範圍內的波長。The oxygen-containing carbon source may be selected from the group consisting of carbon monoxide, carbon dioxide, ketones, ethers, esters, alcohols, aldehydes, phenols, organic acids, and combinations thereof. The oxygen contained in the oxygen-containing carbon source has the effect of providing a reaction path with a low activation energy, and the carbon atoms can thereby be graphitized on the surface of the insulating substrate. The inert gas 114 can be selected from the group consisting of argon and helium. Depending on the size of the reaction chamber, the flow rate of the gas 110 containing carbon and oxygen may be in the range of 5 to 600 sccm, the flow rate of the hydrogen 112 may be in the range of 5 to 200 sccm, and the flow rate of the inert gas 114 may be 60. Within the range of ~800 sccm. The pressure in the furnace tube 100 is measured by a vacuum gauge 145, and the pressure can be reduced to several tens of torr. The furnace tube 100 can be heated to a temperature in the range of 600 ° C to 1100 ° C. The ultraviolet light provided by the ultraviolet light source 130 can have a wavelength in the range of 160 nm to 400 nm.
此外,當裝載包括多個晶圓的多個基板10至爐管100中時,所述晶圓優選為彼此平行地排列,且實質上與紫外光源130的紫外光照射方向118平行。氫氣112及惰性氣體114也可提供於沉積前的溫度上升階段中,以清理所述表面,使得之後石墨烯可以均勻地沉積於其上。氫氣112的流量於溫度上升階段中可在50~600 sccm的範圍內。惰性氣體114的流量於溫度上升階段中可在60~800 sccm的範圍內。Further, when a plurality of substrates 10 including a plurality of wafers are loaded into the furnace tube 100, the wafers are preferably arranged in parallel with each other and substantially in parallel with the ultraviolet light irradiation direction 118 of the ultraviolet light source 130. Hydrogen 112 and inert gas 114 may also be provided during the temperature rise phase prior to deposition to clean the surface such that graphene may then be uniformly deposited thereon. The flow rate of the hydrogen gas 112 may be in the range of 50 to 600 sccm in the temperature rising phase. The flow rate of the inert gas 114 may be in the range of 60 to 800 sccm in the temperature rising phase.
雖然在上述實施例中,碳源僅藉紫外光及加熱來分解,但可更提供電漿源及金屬蒸汽中的至少一者以促進碳源的分解。Although in the above embodiment, the carbon source is decomposed only by ultraviolet light and heating, at least one of the plasma source and the metal vapor may be further provided to promote decomposition of the carbon source.
圖2繪示上述修改後實施例的其中一者,作為本案的第二實施例,其中有電漿源150附加至爐管100以於爐管100含有的反應氣體中誘發電漿,且有固體金屬160置於爐管100中以產生能夠催化碳源的分解的金屬蒸汽。固體金屬160可包含銅、鎳、鋅或其組合。另外,僅提供電漿源150及固體金屬160中的一者也是可行的。2 is a second embodiment of the above modified embodiment, in which a plasma source 150 is attached to the furnace tube 100 to induce plasma in the reaction gas contained in the furnace tube 100, and has a solid. Metal 160 is placed in furnace tube 100 to produce metal vapor that is capable of catalyzing the decomposition of the carbon source. Solid metal 160 can comprise copper, nickel, zinc, or a combination thereof. Additionally, it is also feasible to provide only one of the plasma source 150 and the solid metal 160.
在第二實施例中,於提供固體金屬160的情況下,可於溫度上升階段及沉積階段之間插入僅提供氫氣112及惰性氣體114的階段,以使固體金屬160表面的氧化物還原。爐管100的需求溫度可由電漿源150及/或產生自固體金屬160的催化金屬蒸汽的幫助下而降低,可能降到400°C~1100°C的範圍。In the second embodiment, in the case where the solid metal 160 is provided, a stage in which only the hydrogen gas 112 and the inert gas 114 are supplied may be inserted between the temperature rising phase and the deposition phase to reduce the oxide on the surface of the solid metal 160. The required temperature of the furnace tube 100 may be reduced by the help of the plasma source 150 and/or catalytic metal vapor generated from the solid metal 160, possibly down to the range of 400 °C to 1100 °C.
圖3繪示上述修改後實施例的另一者,作為本案的第三實施例,其中金屬蒸汽的來源為引入爐管100中的有機金屬化合物116,而不是置於爐管100中的固體金屬160。有機金屬化合物116可藉由爐管100中的高溫分解,以形成能夠催化碳源分解的金屬蒸汽。如圖3所示,可於與氣體110、氫氣112及惰性氣體114混合之狀態下引入有機金屬化合物116至爐管100中,且有機金屬化合物116的流量可由流量計126測量。有機金屬化合物116可包括選自由銅、鎳、鉑以及釕組成的群組的金屬。3 illustrates the other embodiment of the modified embodiment described above as a third embodiment of the present invention in which the source of the metal vapor is the organometallic compound 116 introduced into the furnace tube 100 instead of the solid metal placed in the furnace tube 100. 160. The organometallic compound 116 can be decomposed by pyrolysis in the furnace tube 100 to form a metal vapor capable of catalyzing the decomposition of the carbon source. As shown in FIG. 3, the organometallic compound 116 can be introduced into the furnace tube 100 in a state of being mixed with the gas 110, the hydrogen gas 112, and the inert gas 114, and the flow rate of the organometallic compound 116 can be measured by the flow meter 126. The organometallic compound 116 may include a metal selected from the group consisting of copper, nickel, platinum, and rhodium.
在上述實施例中,由於碳源藉由紫外光(及電漿及/或金屬蒸汽的催化)在高溫下分解,而不是藉由金屬的表面分解,因此可達到將近100%的單層覆蓋率,且可避免對金屬基底的溼式(酸)蝕刻,也不必使用高分子支架來轉移石墨烯膜,而得以預防上述因溼式(酸)蝕刻及高分子支架而而導致的缺點。In the above embodiment, since the carbon source is decomposed at a high temperature by ultraviolet light (and catalysis by plasma and/or metal vapor), instead of being decomposed by the surface of the metal, a single layer coverage of nearly 100% can be achieved. Moreover, the wet (acid) etching of the metal substrate can be avoided, and the polymer scaffold is not required to transfer the graphene film, thereby preventing the above-mentioned disadvantages caused by the wet (acid) etching and the polymer scaffold.
為了對本發明作進一步說明,提供以下的實例1至實例3,然而該等實例並非意欲限制本發明之範圍。In order to further illustrate the invention, the following Examples 1 to 3 are provided, however, such examples are not intended to limit the scope of the invention.
在實例1中,使用圖3繪示的裝置使單層石墨烯在1000°C下直接成長在藍寶石的表面上。沉積的設定特別包含提供160~400 nm的連續波長的紫外光源。紫外光源位於反應氣體流的上游,且紫外光在實質上與基板的平面方向平行的方向上,透過透明窗口照射至反應腔室的內部空間。含氧碳源使用乙基甲基醚(ethyl methyl ether),其在整個成長階段具有30 sccm的固定流量。還有引入氫氣作為催化氣體,其具有120 sccm的流量。作為稀釋氣體用的氬氣具有200 sccm的流量。In Example 1, a single layer of graphene was grown directly on the surface of sapphire at 1000 ° C using the apparatus illustrated in FIG. The deposition settings specifically include an ultraviolet source that provides a continuous wavelength of 160 to 400 nm. The ultraviolet light source is located upstream of the reaction gas stream, and the ultraviolet light is irradiated to the inner space of the reaction chamber through the transparent window in a direction substantially parallel to the planar direction of the substrate. The oxygen-containing carbon source uses ethyl methyl ether, which has a fixed flow rate of 30 sccm throughout the growth phase. Hydrogen was also introduced as a catalytic gas having a flow rate of 120 sccm. The argon gas used as the diluent gas has a flow rate of 200 sccm.
圖4A顯示獲得的單層石墨烯的拉曼光譜,圖4B顯示獲得的單層石墨烯的X-射線光電子分光光譜,且圖5顯示直接成長在藍寶石基板上的單層石墨烯的電子顯微剖面圖。4A shows the Raman spectrum of the obtained single-layer graphene, FIG. 4B shows the X-ray photoelectron spectroscopy spectrum of the obtained single-layer graphene, and FIG. 5 shows the electron microscopy of the single-layer graphene directly grown on the sapphire substrate. Sectional view.
可從圖4A清楚地看出G峰及2D峰的狹窄的半高寬,其顯示出所形成的石墨烯層的高結晶性。圖4B顯示出未於絕緣基板上直接成長的石墨烯膜中發現具有可追蹤量的金屬殘留物。可從圖5清楚地看出形成的石墨烯層與基板表面共形。The narrow half-height of the G peak and the 2D peak can be clearly seen from Fig. 4A, which shows high crystallinity of the formed graphene layer. Fig. 4B shows that a metal residue having a traceable amount was found in the graphene film which was not grown directly on the insulating substrate. It can be clearly seen from Figure 5 that the formed graphene layer conforms to the surface of the substrate.
在實例2及3中,使用與實例1相同的裝置使多層石墨烯分別直接成長在氮化矽基板及氧化矽基板上。沉積的設定包含提供160~400 nm的連續波長的紫外光源。紫外光源位於反應氣體流的上游,且紫外光在實質上與基板的平面方向平行的方向上,透過透明窗口照射至反應腔室的內部空間。含氧碳源使用乙基甲基醚,其在整個成長階段具有60 sccm的固定流量。還有引入氫氣作為催化氣體,其具有120 sccm的流量。作為稀釋氣體用的氬氣具有200 sccm的流量。電漿點燃在所述成長開始的一小段時間之前,並在成長期間持續點燃。In Examples 2 and 3, the multilayer graphene was directly grown on the tantalum nitride substrate and the tantalum oxide substrate, respectively, using the same apparatus as in Example 1. The deposition settings include an ultraviolet source that provides a continuous wavelength of 160 to 400 nm. The ultraviolet light source is located upstream of the reaction gas stream, and the ultraviolet light is irradiated to the inner space of the reaction chamber through the transparent window in a direction substantially parallel to the planar direction of the substrate. The oxygen-containing carbon source uses ethyl methyl ether, which has a fixed flow rate of 60 sccm throughout the growth phase. Hydrogen was also introduced as a catalytic gas having a flow rate of 120 sccm. The argon gas used as the diluent gas has a flow rate of 200 sccm. The plasma is ignited a short time before the start of the growth and continues to ignite during growth.
圖6A顯示在實例2中直接成長在氮化矽基板上的多層石墨烯的電子顯微剖面圖。圖6B顯示在實例3中直接成長在氧化矽基板上的多層石墨烯的電子顯微剖面圖。Figure 6A shows an electron micrograph of a multilayer graphene grown directly on a tantalum nitride substrate in Example 2. 6B shows an electron micrograph of a multilayer graphene grown directly on a ruthenium oxide substrate in Example 3.
可從圖6A以及圖6B清楚地看出石墨烯可在絕緣基板上成長並逐層堆疊。使用本發明揭露的技術可獲得平行於基板表面的多層石墨烯堆疊,其與花瓣狀石墨烯(graphene petal)以及記載於前案的其他非平行的石墨烯層不同。It can be clearly seen from FIGS. 6A and 6B that graphene can be grown on an insulating substrate and stacked layer by layer. A multilayer graphene stack parallel to the surface of the substrate can be obtained using the techniques disclosed herein, which differ from the graphene petal and other non-parallel graphene layers described in the previous section.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
10‧‧‧基板
100‧‧‧爐管
110‧‧‧氣體
112‧‧‧氫氣
114‧‧‧惰性氣體
116‧‧‧有機金屬化合物
118‧‧‧紫外光照射方向
120、122、124、126‧‧‧流量計
130‧‧‧紫外光源
135‧‧‧管線10‧‧‧Substrate
100‧‧‧ furnace tube
110‧‧‧ gas
112‧‧‧ Hydrogen
114‧‧‧Inert gas
116‧‧‧Organic Metal Compounds
118‧‧‧UV direction
120, 122, 124, 126‧‧ ‧ flowmeter
130‧‧‧UV light source
135‧‧‧ pipeline
140‧‧‧真空泵 140‧‧‧vacuum pump
145‧‧‧真空計 145‧‧‧ vacuum gauge
150‧‧‧電漿源 150‧‧‧ Plasma source
160‧‧‧固體金屬 160‧‧‧solid metal
圖1繪示根據本發明的第一實施例的用於藉由化學氣相沉積成長石墨烯的方法的裝置。 圖2繪示根據本發明的第二實施例的用於藉由化學氣相沉積成長石墨烯的方法的裝置。 圖3繪示根據本發明的第二實施例的用於藉由化學氣相沉積成長石墨烯的方法的裝置。 圖4A顯示在本發明的實例1中於藍寶石基板上成長的單層石墨烯的拉曼光譜(Raman spectrum)。 圖4B顯示在本發明的實例1中於藍寶石基板上成長的單層石墨烯的X-射線光電子分光光譜(X-ray photoelectron spectroscopic spectrum)。 圖5顯示在本發明的實例1中於藍寶石基板上直接成長的單層石墨烯的電子顯微剖面圖。 圖6A顯示在本發明的實例2中於氮化矽基板上直接成長的多層石墨烯的電子顯微剖面圖。 圖6B顯示在本發明的實例3中於氧化矽基板上直接成長的多層石墨烯的電子顯微剖面圖。1 is a diagram showing an apparatus for a method of growing graphene by chemical vapor deposition according to a first embodiment of the present invention. 2 illustrates an apparatus for a method of growing graphene by chemical vapor deposition in accordance with a second embodiment of the present invention. 3 illustrates an apparatus for a method of growing graphene by chemical vapor deposition in accordance with a second embodiment of the present invention. 4A shows a Raman spectrum of a single-layer graphene grown on a sapphire substrate in Example 1 of the present invention. 4B shows an X-ray photoelectron spectroscopic spectrum of a single-layer graphene grown on a sapphire substrate in Example 1 of the present invention. Fig. 5 shows an electron microscopic sectional view of a single-layer graphene directly grown on a sapphire substrate in Example 1 of the present invention. Fig. 6A shows an electron microscopic sectional view of a multilayer graphene directly grown on a tantalum nitride substrate in Example 2 of the present invention. Fig. 6B shows an electron microscopic sectional view of a multilayer graphene directly grown on a cerium oxide substrate in Example 3 of the present invention.
10‧‧‧基板 10‧‧‧Substrate
100‧‧‧爐管 100‧‧‧ furnace tube
110‧‧‧氣體 110‧‧‧ gas
112‧‧‧氫氣 112‧‧‧ Hydrogen
114‧‧‧惰性氣體 114‧‧‧Inert gas
118‧‧‧紫外光照射方向 118‧‧‧UV direction
120、122、124‧‧‧流量計 120, 122, 124‧‧‧ flowmeter
130‧‧‧紫外光源 130‧‧‧UV light source
135‧‧‧管線 135‧‧‧ pipeline
140‧‧‧真空泵 140‧‧‧vacuum pump
145‧‧‧真空計 145‧‧‧ vacuum gauge
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI457277B (en) * | 2012-08-10 | 2014-10-21 | Nat Univ Tsing Hua | A graphene manufacturing system and the method thereof |
| TW201422525A (en) * | 2012-12-13 | 2014-06-16 | Ind Tech Res Inst | Method and apparatus for manufacturing graphene sheet |
| CN104058390A (en) * | 2013-03-19 | 2014-09-24 | 海洋王照明科技股份有限公司 | Preparation method for graphene |
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