TWI564815B - Fingerprint sensing device and its fingerprint sensing method - Google Patents
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Description
本發明是有關一種指紋感測裝置及方法,特別是關於一種低寄生電容的指紋感測裝置及其指紋感測方法。 The invention relates to a fingerprint sensing device and method, in particular to a fingerprint sensing device with low parasitic capacitance and a fingerprint sensing method thereof.
圖1是習知的指紋感測裝置10,其中保護層12供手指觸碰及保護其下方的多個電極板16a、16b、16c,靜電放電(Electro-Static Discharge;ESD)層14用以提供靜電放電保護,多個偵測電路18a、18b、18c各自連接對應的電極板16a、16b、16c,用以偵測電極板16a、16b、16c與手指(圖中未示)間的電容值以得到感測電壓。由於手指的指紋是由凹凸不平的紋路構成,因此指紋會有紋峰與紋谷。又指紋的紋峰與紋谷與電極板的距離不同,所以紋峰與紋谷所產生的感測電壓也不同。指紋感測裝置10根據感測電壓的大小可以判斷對應電極板16a、16b、16c的紋路為峰值或谷值。指紋感測裝置10在取得所有電極板所對應的紋路後,即可得到手指的指紋圖像。 1 is a conventional fingerprint sensing device 10 in which a protective layer 12 is provided for a finger to touch and protect a plurality of electrode plates 16a, 16b, 16c below it, and an Electro-Static Discharge (ESD) layer 14 is provided. The ESD protection, the plurality of detecting circuits 18a, 18b, and 18c are respectively connected to the corresponding electrode plates 16a, 16b, and 16c for detecting the capacitance between the electrode plates 16a, 16b, and 16c and the fingers (not shown). The sensing voltage is obtained. Since the fingerprint of the finger is composed of uneven lines, the fingerprint has peaks and valleys. Moreover, the peak of the fingerprint is different from the distance between the valley and the electrode plate, so the sensing voltage generated by the peak and the valley is also different. The fingerprint sensing device 10 can determine that the texture of the corresponding electrode plates 16a, 16b, 16c is a peak or a valley according to the magnitude of the sensing voltage. After obtaining the texture corresponding to all the electrode plates, the fingerprint sensing device 10 can obtain the fingerprint image of the finger.
然而,如圖1所示,電極板16a、16b、16c與下方的導體之間存在寄生電容Cp1a、Cp1b、Cp1c。電極板下方的導體包括偵測電路18a、18b、18c、地端以及其他的導體。寄生電容Cp1a、Cp1b、Cp1c會影響電極板16a、16b、16c的感測,寄生電容Cp1a、Cp1b、Cp1c越高,量測電極板16a、16b、16c所獲得的感測電壓的動態範圍越小,越不易正確的辨識所偵測到的紋路是紋峰還是紋谷。此外,偵測電路18a、18b、18c的操作雜訊也會經由寄生電容Cp1a、Cp1b、Cp1c干擾電極板16a、16b、16c。 However, as shown in FIG. 1, parasitic capacitances Cp1a, Cp1b, and Cp1c exist between the electrode plates 16a, 16b, and 16c and the lower conductor. The conductor below the electrode plate includes detection circuits 18a, 18b, 18c, ground terminals, and other conductors. The parasitic capacitances Cp1a, Cp1b, Cp1c affect the sensing of the electrode plates 16a, 16b, 16c. The higher the parasitic capacitances Cp1a, Cp1b, Cp1c, the smaller the dynamic range of the sensing voltage obtained by the measuring electrode plates 16a, 16b, 16c. The more difficult it is to correctly identify whether the detected texture is a peak or a grain. Further, the operational noise of the detecting circuits 18a, 18b, and 18c also interferes with the electrode plates 16a, 16b, and 16c via the parasitic capacitances Cp1a, Cp1b, and Cp1c.
因此,一種低寄生電容的指紋感測裝置,乃為所冀。 Therefore, a fingerprint sensing device with low parasitic capacitance is what it is.
本發明的目的,在於提出一種低寄生電容的指紋感測裝置及其指紋感測方法。 The object of the present invention is to provide a fingerprint sensing device with low parasitic capacitance and a fingerprint sensing method thereof.
根據本發明,一種指紋感測裝置包括一電極板、一保護層、一回授電容、一元件層以及一阻隔板。該保護層在該電極板上方,供手指觸碰。該回授電容耦接該電極板,該回授電容與該電極板是各自獨立的元件。該元件層位於該電極板下方,該元件層包含多個電路元件連接該回授電容以形成一偵測電路供偵測該手指與該電極板之間形成的電容,以供判斷對應該電極板的指紋。該阻隔板在該電極板及該元件層之間。在激勵模式時,該電極板及該阻隔板被施加一第一電壓,在偵測模式時,該電極板及該阻隔板被施加一第二電壓。 According to the present invention, a fingerprint sensing device includes an electrode plate, a protective layer, a feedback capacitor, a component layer, and a barrier. The protective layer is above the electrode plate for finger touch. The feedback capacitor is coupled to the electrode plate, and the feedback capacitor and the electrode plate are independent components. The component layer is located under the electrode plate, and the component layer includes a plurality of circuit components connected to the feedback capacitor to form a detecting circuit for detecting a capacitance formed between the finger and the electrode plate for determining the corresponding electrode plate Fingerprint. The barrier is between the electrode plate and the component layer. In the excitation mode, the electrode plate and the baffle plate are applied with a first voltage, and in the detecting mode, the electrode plate and the baffle plate are applied with a second voltage.
根據本發明,一種指紋感測裝置包括一電極板、一保護層、一偵測電路、一第一開關以及一阻隔板。該保護層在該電極板上方,供手指觸碰。該偵測電路在偵測模式時,偵測該電極板與該手指之間形成的電容,以供判斷對應該電極板的指紋。該第一開關連接在該電極板及該偵測電路之間。該阻隔板在該電極板及該偵測電路之間。在激勵模式期間,該第一開關為開路以斷開該電極板與該偵測電路之間的連接,該電極板及該阻隔板被施加一第一電壓。在偵測模式時,該第一開關為閉路以使該偵測電路連接該電極板,該電極板及該阻隔板被施加一第二電壓。 According to the present invention, a fingerprint sensing device includes an electrode plate, a protective layer, a detecting circuit, a first switch, and a barrier. The protective layer is above the electrode plate for finger touch. In the detecting mode, the detecting circuit detects a capacitance formed between the electrode plate and the finger for determining a fingerprint corresponding to the electrode plate. The first switch is connected between the electrode plate and the detecting circuit. The blocking plate is between the electrode plate and the detecting circuit. During the excitation mode, the first switch is open to disconnect the electrode plate from the detecting circuit, and the electrode plate and the blocking plate are applied with a first voltage. In the detection mode, the first switch is closed to connect the detecting circuit to the electrode plate, and the electrode plate and the blocking plate are applied with a second voltage.
根據本發明,一種指紋感測方法包括:在激勵模式時,斷開一電極板及一偵測電路之間的連接,並施加一第一電壓至該電極板及一阻隔板;以及在偵測模式時,連接該電極板及該偵測電路並施加一第二電壓至該電極板及該阻隔板,以使該偵測電路偵測手指與該電極板之間形成的電容,以供判斷對應該電極板的指紋為紋峰或紋谷。其中該阻隔板在該電極板及該偵測電路之間,一保護層在該電極板上方供該手指觸碰。 According to the present invention, a fingerprint sensing method includes: disconnecting an electrode plate and a detecting circuit in a driving mode, and applying a first voltage to the electrode plate and a blocking plate; and detecting In the mode, the electrode plate and the detecting circuit are connected and a second voltage is applied to the electrode plate and the blocking plate, so that the detecting circuit detects the capacitance formed between the finger and the electrode plate for judging The fingerprint of the electrode plate should be a peak or a valley. The barrier plate is between the electrode plate and the detecting circuit, and a protective layer is provided above the electrode plate for the finger to touch.
本發明係利用在電極板下方設置阻隔板,來降低該電極板與下方其他導體之間的寄生電容,達到較大之訊號動態範圍,並防止偵測電路的操作雜訊干擾該電極板,而且在感測過程中,該阻隔板與該電極板具有相同電位,因而能消除該阻隔板與該電極板之間的寄生電容效應。 The invention utilizes a baffle plate under the electrode plate to reduce the parasitic capacitance between the electrode plate and other conductors below, to achieve a larger signal dynamic range, and prevent the operation noise of the detecting circuit from interfering with the electrode plate, and During the sensing process, the baffle plate has the same potential as the electrode plate, thereby eliminating the parasitic capacitance effect between the baffle plate and the electrode plate.
10‧‧‧指紋感測裝置 10‧‧‧Finger sensing device
12‧‧‧保護層 12‧‧‧Protective layer
14‧‧‧靜電放電層 14‧‧‧Electrostatic discharge layer
16a‧‧‧電極板 16a‧‧‧Electrode plate
16b‧‧‧電極板 16b‧‧‧electrode plate
16c‧‧‧電極板 16c‧‧‧electrode plate
16d‧‧‧電極板 16d‧‧‧electrode plate
18a‧‧‧偵測電路 18a‧‧‧Detection circuit
18b‧‧‧偵測電路 18b‧‧‧Detection circuit
18c‧‧‧偵測電路 18c‧‧‧Detection circuit
18d‧‧‧偵測電路 18d‧‧‧Detection circuit
20a‧‧‧運算放大器 20a‧‧‧Operational Amplifier
20b‧‧‧運算放大器 20b‧‧‧Operational Amplifier
20c‧‧‧運算放大器 20c‧‧‧Operational Amplifier
20d‧‧‧運算放大器 20d‧‧‧Operational Amplifier
22‧‧‧指紋感測裝置 22‧‧‧Finger sensing device
24a‧‧‧阻隔板 24a‧‧‧Baffle
24b‧‧‧阻隔板 24b‧‧‧Baffle
24c‧‧‧阻隔板 24c‧‧‧Baffle
24d‧‧‧阻隔板 24d‧‧‧Baffle
28‧‧‧金屬板 28‧‧‧Metal plates
30‧‧‧金屬板 30‧‧‧Metal plates
32‧‧‧元件層 32‧‧‧Component layer
34‧‧‧手指 34‧‧‧ fingers
36‧‧‧切換開關 36‧‧‧Toggle switch
圖1是習知的指紋感測裝置; 圖2是本發明的指紋感測裝置的第一實施例;圖3顯示圖2的指紋感測裝置的結構;圖4顯示圖2的指紋感測裝置在激勵模式下的等效電路;圖5顯示圖2的指紋感測裝置在偵測模式下的等效電路;圖6顯示圖4及圖5電路的時序圖;以及圖7是本發明的指紋感測裝置的第二實施例。 Figure 1 is a conventional fingerprint sensing device; 2 is a first embodiment of the fingerprint sensing device of the present invention; FIG. 3 shows the structure of the fingerprint sensing device of FIG. 2; FIG. 4 shows an equivalent circuit of the fingerprint sensing device of FIG. 2 in an excitation mode; An equivalent circuit of the fingerprint sensing device of FIG. 2 in the detection mode is shown; FIG. 6 shows a timing chart of the circuits of FIGS. 4 and 5; and FIG. 7 is a second embodiment of the fingerprint sensing device of the present invention.
圖2是本發明的指紋感測裝置22之一實施例,其與圖1的指紋感測裝置10同樣包括保護層12、靜電放電層14、電極板16a、16b、16c及偵測電路18a、18b、18c。此外,指紋感測裝置22還包括阻隔板24a、24b、24c以及開關SWse、SWsp,其中阻隔板24a在電極板16a與偵測電路18a之間,阻隔板24b在電極板16b及偵測電路18b之間,阻隔板24c在電極板16c及偵測電路18c之間,開關SWse的一端連接阻隔板24a、24b、24c,開關SWse的另一端接收電壓VR1,開關SWsp的一端連接阻隔板24a、24b、24c,開關SWsp的另一端接收電壓VR2。在指紋感測裝置22中,藉由使用阻隔板24a、24b、24c,能夠將電極板16a、16b、16c與下方其他導體(例如偵測電路18a、18b、18c以及地端)之間的寄生電容由圖1的Cp1a、Cp1b、Cp1c減少到剩下Cp1aa、Cp1ba、Cp1ca,其中寄生電容Cp1aa、Cp1ba、Cp1ca、Cp1da遠小於寄生電容Cp1a、Cp1b、Cp1c。由於對應於電極板16a、16b、16c的寄生電容大大的降低,因而可達到較大之訊號動態範圍,獲得較大的訊號量。並且,阻隔板24a、24b、24c的設置,有助於改善偵測電路18a、18b、18c的操作雜訊干擾電極板16a、16b、16c。另外,藉由控制開關SWse、SWsp的切換,可使阻隔板24a、24b、24c與電極板16a、16b、16c具有相同電位,因此在感測電極板16a、16b、16c的過程中,阻隔板24a、24b、24c與電極板16a、16b、16c之間的寄生電容Cp1ab、Cp1bb、Cp1cb的效應也可被消除。 2 is an embodiment of the fingerprint sensing device 22 of the present invention. The fingerprint sensing device 10 of FIG. 1 includes a protective layer 12, an electrostatic discharge layer 14, electrode plates 16a, 16b, and 16c, and a detecting circuit 18a. 18b, 18c. In addition, the fingerprint sensing device 22 further includes a baffle plate 24a, 24b, 24c and a switch SWse, SWsp, wherein the baffle plate 24a is between the electrode plate 16a and the detecting circuit 18a, and the baffle plate 24b is at the electrode plate 16b and the detecting circuit 18b. Between the electrode plate 16c and the detecting circuit 18c, one end of the switch SWse is connected to the blocking plate 24a, 24b, 24c, the other end of the switch SWse receives the voltage VR1, and one end of the switch SWsp is connected to the blocking plate 24a, 24b. 24c, the other end of the switch SWsp receives the voltage VR2. In the fingerprint sensing device 22, parasitic between the electrode plates 16a, 16b, 16c and other conductors below (for example, the detecting circuits 18a, 18b, 18c and the ground end) can be used by using the baffles 24a, 24b, 24c. The capacitance is reduced from Cp1a, Cp1b, and Cp1c of FIG. 1 to the remaining Cp1aa, Cp1ba, and Cp1ca, wherein the parasitic capacitances Cp1aa, Cp1ba, Cp1ca, and Cp1da are much smaller than the parasitic capacitances Cp1a, Cp1b, and Cp1c. Since the parasitic capacitance corresponding to the electrode plates 16a, 16b, and 16c is greatly reduced, a large signal dynamic range can be achieved, and a large amount of signals can be obtained. Moreover, the arrangement of the baffles 24a, 24b, 24c helps to improve the operational noise interfering electrode plates 16a, 16b, 16c of the detecting circuits 18a, 18b, 18c. In addition, by controlling the switching of the switches SWse and SWsp, the baffles 24a, 24b, and 24c can have the same potential as the electrode plates 16a, 16b, and 16c, and therefore, during the process of sensing the electrode plates 16a, 16b, and 16c, the baffle plate is blocked. The effects of the parasitic capacitances Cp1ab, Cp1bb, Cp1cb between the 24a, 24b, 24c and the electrode plates 16a, 16b, 16c can also be eliminated.
圖3顯示圖2的指紋感測裝置22的結構的一實施例,在圖3的實施例中,基於說明的方便,僅顯示一組感測單元的結構。該感測單元包括電極板16a、偵測電路18a、阻隔板24a以及連接在其間的開關SW1a、 SW2a、SWse、SWsp。如圖3所示,開關SW1a、SW2a、SW3a、SWse、SWsp及運算放大器20a等電路元件是設置在元件層32中,其中運算放大器20a及開關SW3a與回授電容Cfba組成偵測電路18a。回授電容Cfba在阻隔板24a及元件層32之間,且位於阻隔板24a的正下方,回授電容Cfba是由金屬板28及30組成,而且與電極板16a是各自獨立的元件。阻隔板24a在電極板16a及元件層32之間,且位於電極板16a的正下方以減少電極板16a與下方其他導體(例如偵測電路18a、地端)之間的寄生電容。元件層32至少包括一半導體基板(圖中未示出)用於製作偵測電路18a所需的元件。回授電容Cfba可以由其他方式來製作,例如由元件層32中的兩層多晶矽(Polysilicon)來組成。 3 shows an embodiment of the structure of the fingerprint sensing device 22 of FIG. 2. In the embodiment of FIG. 3, only the structure of a set of sensing units is shown based on the convenience of the description. The sensing unit includes an electrode plate 16a, a detecting circuit 18a, a baffle plate 24a, and a switch SW1a connected therebetween. SW2a, SWse, SWsp. As shown in FIG. 3, circuit elements such as switches SW1a, SW2a, SW3a, SWse, SWsp, and operational amplifier 20a are disposed in the element layer 32, and the operational amplifier 20a and the switch SW3a and the feedback capacitor Cfba constitute a detecting circuit 18a. The feedback capacitor Cfba is between the baffle plate 24a and the element layer 32 and directly under the baffle plate 24a. The feedback capacitor Cfba is composed of the metal plates 28 and 30, and is independent of the electrode plate 16a. The baffle plate 24a is between the electrode plate 16a and the element layer 32 and directly under the electrode plate 16a to reduce the parasitic capacitance between the electrode plate 16a and other conductors below (for example, the detecting circuit 18a, the ground end). The element layer 32 includes at least a semiconductor substrate (not shown) for fabricating the components required for the detection circuit 18a. The feedback capacitor Cfba can be fabricated in other ways, such as by two layers of polysilicon in the component layer 32.
當手指34接觸指紋感測裝置22時,手指34與電極板16a之間將形成電容Csa,藉由偵測電容Csa可以判斷對應電極板16a的指紋紋路為紋峰(peak)或紋谷(valley)。在激勵模式時,開關SW1a、SW3a及SWsp為閉路(on),開關SW2a及SWse為開路(off),此時電極板16a及阻隔板24a皆被施加電壓VR2,而回授電容Cfba處於短路狀態,故回授電容Cfba上的電壓被設定為0V。在偵測模式時,開關SW1a、SW3a及SWsp為開路,開關SW2a及SWse為閉路以分別將電極板16a及阻隔板24a分別連接至運算放大器20a的反相輸入端及電壓VR1,由於運算放大器的虛接地特性,因此電極板16a也被施加電壓VR1,此時偵測電路18a偵測電容Csa產生感測電壓Voa,以供判斷對應電極板16a的紋路為紋峰或紋谷。不論在激勵模式或偵測模式,電極板16a及阻隔板24a的電位皆相同,因此電極板16a與阻隔板24a之間的寄生電容Cp1ab的效應被消除。 When the finger 34 contacts the fingerprint sensing device 22, a capacitance Csa is formed between the finger 34 and the electrode plate 16a. By detecting the capacitance Csa, it can be determined that the fingerprint pattern of the corresponding electrode plate 16a is a peak or a valley (valley) ). In the excitation mode, the switches SW1a, SW3a, and SWsp are closed, and the switches SW2a and SWse are open. At this time, the electrode plate 16a and the baffle plate 24a are both applied with a voltage VR2, and the feedback capacitor Cfba is short-circuited. Therefore, the voltage on the feedback capacitor Cfba is set to 0V. In the detection mode, the switches SW1a, SW3a, and SWsp are open circuits, and the switches SW2a and SWse are closed to respectively connect the electrode plate 16a and the blocking plate 24a to the inverting input terminal of the operational amplifier 20a and the voltage VR1, respectively, due to the operational amplifier The virtual grounding characteristic is applied to the electrode plate 16a. The detecting circuit 18a detects the capacitance Csa to generate the sensing voltage Voa for determining that the texture of the corresponding electrode plate 16a is a peak or a valley. The electric potential of the electrode plate 16a and the baffle plate 24a are the same regardless of the excitation mode or the detection mode, and therefore the effect of the parasitic capacitance Cp1ab between the electrode plate 16a and the baffle plate 24a is eliminated.
圖4及圖5是圖2的指紋感測裝置22的等效電路,其中圖4顯示在激勵模式下的操作,圖5顯示在偵測模式下的操作。在圖4及圖5中,Csa、Csb、Csc、Csd是由手指與電極板16a、16b、16c、16d形成的電容,其中電極板16a、16b、16c、16d分別視為電容Csa、Csb、Csc、Csd右方的電極,手指則視為電容Csa、Csb、Csc、Csd左方的電極。開關SW1a的一端連接電極板16a及開關SW2a,開關SW1a的另一端接收電壓VR2。開關SW2a連接在電極板16a及偵測電路18a之間。Cp1aa為電極板16a與 其下方導體之間的寄生電容。Cp1ab為電極板16a與阻隔板24a之間的寄生電容。偵測電路18a包括一運算放大器20a、開關SW3a及回授電容Cfba,其中開關SW3a及回授電容Cfba是並聯在運算放大器20a的反相輸入端Ina及輸出端Oa之間,運算放大器20a的非反相輸入端Ipa接收電壓VR1,電容Cp2a是運算放大器20a的反相輸入端Ina上的寄生電容。開關SW1b的一端連接電極板16b及開關SW2b,開關SW1b的另一端接收電壓VR2。開關SW2b連接在電極板16b及偵測電路18b之間。Cp1ba為電極板16b與其下方導體之間的寄生電容。Cp1bb為電極板16b與阻隔板24b之間的寄生電容。偵測電路18b包括一運算放大器20b、開關SW3b及回授電容Cfbb,其中開關SW3b及回授電容Cfbb是並聯在運算放大器20b的反相輸入端Inb及輸出端Ob之間,運算放大器20b的非反相輸入端Ipb接收電壓VR1,電容Cp2b是運算放大器20b的反相輸入端Inb上的寄生電容。開關SW1c的一端連接電極板16c及開關SW2c,開關SW1c的另一端接收電壓VR2。開關SW2c連接在電極板16c及偵測電路18c之間。Cp1ca為電極板16c與其下方導體之間的寄生電容。Cp1cb為電極板16c與阻隔板24c之間的寄生電容。偵測電路18c包括一運算放大器20c、開關SW3c及回授電容Cfbc,其中開關SW3c及回授電容Cfbc是並聯在運算放大器20c的反相輸入端Inc及輸出端Oc之間,運算放大器20c的非反相輸入端Ipc接收電壓VR1,電容Cp2c是運算放大器20c的反相輸入端Inc上的寄生電容。開關SW1d的一端連接電極板16d及開關SW2d,開關SW1d的另一端接收電壓VR2。開關SW2d連接在電極板16d及偵測電路18d之間。Cp1da為電極板16d與其下方導體之間的寄生電容。Cp1db為電極板16d與阻隔板24d之間的寄生電容。偵測電路18d包括一運算放大器20d、開關SW3d及回授電容Cfbd,其中開關SW3d及回授電容Cfbd是並聯在運算放大器20d的反相輸入端Ind及輸出端Od之間,運算放大器20d的非反相輸入端Ipd接收電壓VR1,電容Cp2d是運算放大器20d的反相輸入端Ind上的寄生電容。由於在電極板16a、16b、16c、16d與偵測電路18a、18b、18c、18d之間有阻隔板24a、24b、24c、24d,因此圖4及圖5中在電極板16a、16b、16c、16d與下方其他導體之間的寄生電容由圖1的Cp1a、Cp1b、Cp1c降為Cp1aa、Cp1ba、Cp1ca、 Cp1da。寄生電容Cp1aa、Cp1ba、Cp1ca、Cp1da遠小於寄生電容Cp1a、Cp1b、Cp1c。 4 and 5 are equivalent circuits of the fingerprint sensing device 22 of FIG. 2, wherein FIG. 4 shows the operation in the excitation mode, and FIG. 5 shows the operation in the detection mode. In FIGS. 4 and 5, Csa, Csb, Csc, and Csd are capacitances formed by the fingers and the electrode plates 16a, 16b, 16c, and 16d, wherein the electrode plates 16a, 16b, 16c, and 16d are regarded as capacitances Csa and Csb, respectively. The electrodes on the right side of Csc and Csd are regarded as the electrodes on the left side of the capacitors Csa, Csb, Csc, and Csd. One end of the switch SW1a is connected to the electrode plate 16a and the switch SW2a, and the other end of the switch SW1a receives the voltage VR2. The switch SW2a is connected between the electrode plate 16a and the detecting circuit 18a. Cp1aa is the electrode plate 16a and The parasitic capacitance between the conductors below it. Cp1ab is a parasitic capacitance between the electrode plate 16a and the barrier rib 24a. The detecting circuit 18a includes an operational amplifier 20a, a switch SW3a and a feedback capacitor Cfba. The switch SW3a and the feedback capacitor Cfba are connected in parallel between the inverting input terminal Ina and the output terminal Oa of the operational amplifier 20a, and the operational amplifier 20a is non- The inverting input terminal Ipa receives the voltage VR1, and the capacitor Cp2a is a parasitic capacitance on the inverting input terminal Ina of the operational amplifier 20a. One end of the switch SW1b is connected to the electrode plate 16b and the switch SW2b, and the other end of the switch SW1b receives the voltage VR2. The switch SW2b is connected between the electrode plate 16b and the detecting circuit 18b. Cp1ba is the parasitic capacitance between the electrode plate 16b and the conductor below it. Cp1bb is a parasitic capacitance between the electrode plate 16b and the baffle plate 24b. The detecting circuit 18b includes an operational amplifier 20b, a switch SW3b, and a feedback capacitor Cfbb. The switch SW3b and the feedback capacitor Cfbb are connected in parallel between the inverting input terminal Inb and the output terminal Ob of the operational amplifier 20b, and the operational amplifier 20b is non- The inverting input terminal Ipb receives the voltage VR1, and the capacitor Cp2b is the parasitic capacitance on the inverting input terminal Inb of the operational amplifier 20b. One end of the switch SW1c is connected to the electrode plate 16c and the switch SW2c, and the other end of the switch SW1c receives the voltage VR2. The switch SW2c is connected between the electrode plate 16c and the detecting circuit 18c. Cp1ca is the parasitic capacitance between the electrode plate 16c and the conductor below it. Cp1cb is a parasitic capacitance between the electrode plate 16c and the baffle plate 24c. The detecting circuit 18c includes an operational amplifier 20c, a switch SW3c and a feedback capacitor Cfbc. The switch SW3c and the feedback capacitor Cfbc are connected in parallel between the inverting input terminal Inc and the output terminal Oc of the operational amplifier 20c. The inverting input terminal Ipc receives the voltage VR1, and the capacitor Cp2c is a parasitic capacitance on the inverting input terminal Inc of the operational amplifier 20c. One end of the switch SW1d is connected to the electrode plate 16d and the switch SW2d, and the other end of the switch SW1d receives the voltage VR2. The switch SW2d is connected between the electrode plate 16d and the detecting circuit 18d. Cp1da is the parasitic capacitance between the electrode plate 16d and the conductor below it. Cp1db is a parasitic capacitance between the electrode plate 16d and the baffle plate 24d. The detecting circuit 18d includes an operational amplifier 20d, a switch SW3d and a feedback capacitor Cfbd. The switch SW3d and the feedback capacitor Cfbd are connected in parallel between the inverting input terminal Ind and the output terminal Od of the operational amplifier 20d, and the operational amplifier 20d is non- The inverting input terminal Ipd receives the voltage VR1, and the capacitor Cp2d is the parasitic capacitance on the inverting input terminal Ind of the operational amplifier 20d. Since the barrier plates 24a, 24b, 24c, 24d are provided between the electrode plates 16a, 16b, 16c, 16d and the detecting circuits 18a, 18b, 18c, 18d, the electrode plates 16a, 16b, 16c in Figs. 4 and 5 The parasitic capacitance between 16d and the other conductors below is reduced from Cp1a, Cp1b, Cp1c in Fig. 1 to Cp1aa, Cp1ba, Cp1ca, Cp1da. The parasitic capacitances Cp1aa, Cp1ba, Cp1ca, and Cp1da are much smaller than the parasitic capacitances Cp1a, Cp1b, and Cp1c.
圖6顯示圖4及圖5的電路在偵測電極板16a時的時序圖。如圖4的電路及圖6的時間t1~t2所示,指紋感測裝置22在激勵模式時,開關SW1a、SW3a、SW1b、SW3b、SW1c、SW3c、SW1d、SW3d、SWsp為閉路(on),開關SW2a、SW2b、SW2c、SW2d、SWse為開路(off)。此時電壓VR2對電容Csa、Csb、Csc及Csd充電,並且回授電容Cfba、Cfbb、Cfbc及Cfbd的電壓為0V。由於運算放大器的虛接地特性,運算放大器20a、20b、20c、20d的反相輸入端Ina、Inb、Inc、Ind的電壓將等於VR1,又此時運算放大器20a、20b、20c、20d的輸出端Oa、Ob、Oc、Od連接至其反相輸入端Ina、Inb、Inc、Ind,故感測電壓Voa、Vob、Voc、Vod將等於VR1。在激勵模式中,寄生電容Cp1ab、Cp1bb、Cp1cb、Cp1db的兩端的電位皆為VR2,故寄生電容Cp1ab、Cp1bb、Cp1cb、Cp1db的電壓為0V。在激勵模式結束時,如圖6的時間t2所示,開關SW1a、SW3a、SW1b、SW1c、SW1d、SWsp變為開路,開關SW2a、SW2b、SW2c、SW2d、SWse保持在開路的狀態,開關SW3b、SW3c、SW3d保持在閉路狀態。 FIG. 6 is a timing chart showing the circuit of FIGS. 4 and 5 when detecting the electrode plate 16a. As shown in the circuit of FIG. 4 and the times t1 to t2 of FIG. 6, when the fingerprint sensing device 22 is in the excitation mode, the switches SW1a, SW3a, SW1b, SW3b, SW1c, SW3c, SW1d, SW3d, and SWsp are closed (on). The switches SW2a, SW2b, SW2c, SW2d, and SWse are open. At this time, the voltage VR2 charges the capacitors Csa, Csb, Csc, and Csd, and the voltages of the feedback capacitors Cfba, Cfbb, Cfbc, and Cfbd are 0V. Due to the virtual grounding characteristics of the operational amplifier, the voltages of the inverting input terminals Ina, Inb, Inc, Ind of the operational amplifiers 20a, 20b, 20c, 20d will be equal to VR1, and at this time the outputs of the operational amplifiers 20a, 20b, 20c, 20d Oa, Ob, Oc, Od are connected to their inverting input terminals Ina, Inb, Inc, Ind, so the sensing voltages Voa, Vob, Voc, Vod will be equal to VR1. In the excitation mode, the potentials at both ends of the parasitic capacitances Cp1ab, Cp1bb, Cp1cb, and Cp1db are all VR2, so the voltages of the parasitic capacitances Cp1ab, Cp1bb, Cp1cb, and Cp1db are 0V. At the end of the excitation mode, as shown at time t2 of FIG. 6, the switches SW1a, SW3a, SW1b, SW1c, SW1d, and SWsp are opened, and the switches SW2a, SW2b, SW2c, SW2d, and SWse are kept in an open state, and the switch SW3b, SW3c and SW3d remain in a closed state.
如圖5的電路及圖6的時間t3~t4所示,當指紋感測裝置22進入偵測模式且要偵測對應電極板16a的指紋時,開關SW1a、SW3a、SW1b、SW1c、SW1d、SWsp保持在開路狀態,開關SW2a、SW2b、SW2c、SW2d、SWse變為閉路,開關SW3b、SW3c、SW3d保持在閉路狀態。此時感測電壓Voa=VR1-(VR2-VR1)×[(Csa/Cfba)+(Cp1aa/Cfba)],指紋感測裝置22可以根據感測電壓Voa判斷電容Csa的大小,進而判斷對應電極板16a的紋路為紋峰或紋谷。在偵測模式結束時,如圖6的時間t4所示,開關SW1a、SW3a、SW1b、SW1c、SW1d、SWsp保持在開路狀態,開關SW2a、SW2b、SW2c、SW2d、SWse變為開路,開關SW3b、SW3c、SW3d保持在閉路狀態。在偵測模式中,由於運算放大器的虛接地特性,因此寄生電容Cp1ab、Cp1bb、Cp1cb、Cp1db的兩端的電位皆為VR1。從上述感測電壓Voa的等式可知,電極板16a與阻隔板24a之間的寄生電容Cp1ab不影響感測電壓Voa,而且電極板16a與下方其他導體只剩下極小寄生電容Cp1aa, 因此相較於習知具有較大寄生電容Cp1a的指紋感測裝置10,本發明的指紋感測裝置22具有較大之訊號動態範圍,可獲得較大的輸出訊號量。並且能改善偵測電路的操作雜訊干擾電極板。另一方面,圖式中的開關可以是設置在電極板與阻隔板的下方,本發明也可以改善這些開關的操作雜訊干擾電極板。 As shown in the circuit of FIG. 5 and the time t3~t4 of FIG. 6, when the fingerprint sensing device 22 enters the detection mode and detects the fingerprint of the corresponding electrode plate 16a, the switches SW1a, SW3a, SW1b, SW1c, SW1d, SWsp While remaining in the open state, the switches SW2a, SW2b, SW2c, SW2d, and SWse are closed, and the switches SW3b, SW3c, and SW3d are kept in a closed state. At this time, the sensing voltage Voa=VR1-(VR2-VR1)×[(Csa/Cfba)+(Cp1aa/Cfba)], the fingerprint sensing device 22 can determine the size of the capacitor Csa according to the sensing voltage Voa, and further determine the corresponding electrode. The grain of the plate 16a is a peak or a grain. At the end of the detection mode, as shown at time t4 of FIG. 6, the switches SW1a, SW3a, SW1b, SW1c, SW1d, and SWsp are kept in an open state, and the switches SW2a, SW2b, SW2c, SW2d, and SWse are opened, and the switch SW3b, SW3c and SW3d remain in a closed state. In the detection mode, due to the virtual grounding characteristics of the operational amplifier, the potentials at both ends of the parasitic capacitances Cp1ab, Cp1bb, Cp1cb, and Cp1db are all VR1. It can be seen from the above equation of the sensing voltage Voa that the parasitic capacitance Cp1ab between the electrode plate 16a and the baffle plate 24a does not affect the sensing voltage Voa, and the electrode plate 16a and the other conductors below only have a small parasitic capacitance Cp1aa. Therefore, compared with the conventional fingerprint sensing device 10 having a large parasitic capacitance Cp1a, the fingerprint sensing device 22 of the present invention has a large signal dynamic range, and a large output signal amount can be obtained. And it can improve the operation noise of the detection circuit to interfere with the electrode plate. On the other hand, the switch in the figure may be disposed under the electrode plate and the baffle plate, and the present invention can also improve the operation noise of the switches to interfere with the electrode plate.
在圖6中,從激勵模式到偵測模式的過程中,開關SW1a、SW3a、SW1b、SW1c、SW1d、SWsp先打開之後,才閉合開關SW2a、SW2b、SW2c、SW2d、SWse。 In FIG. 6, in the process from the excitation mode to the detection mode, the switches SW1a, SW3a, SW1b, SW1c, SW1d, and SWsp are turned on first, and then the switches SW2a, SW2b, SW2c, SW2d, and SWse are closed.
圖5係以量測電極板16a與手指之間電容Csa為例,熟習本項技術領域之人士當了解如何應用於量測其他電極板,在此不再贅述。 FIG. 5 is an example of measuring the capacitance Csa between the electrode plate 16a and the finger. Those skilled in the art will understand how to apply to measure other electrode plates, and details are not described herein again.
在圖2的指紋感測裝置22中,每一個電極板16a、16b、16c是對應一個偵測電路18a、18b、18c,但在其他實施例中,也可以是多個電極板16a、16b、16c共用一個偵測電路18a,如圖7所示。在圖7中,切換開關36是用以將偵測電路18a連接至要偵測的電極板18a、18b或18c。 In the fingerprint sensing device 22 of FIG. 2, each of the electrode plates 16a, 16b, and 16c corresponds to one detecting circuit 18a, 18b, and 18c, but in other embodiments, a plurality of electrode plates 16a and 16b may be used. 16c shares a detection circuit 18a as shown in FIG. In Fig. 7, the switch 36 is used to connect the detecting circuit 18a to the electrode plates 18a, 18b or 18c to be detected.
在圖2、圖4、圖5及圖7的實施例中,是多個阻隔板24a、24b、24c、24d共用開關SWse、SWsp,但在其他實施例中,也可以是一個阻隔板對應一組開關SWse、SWsp。 In the embodiment of FIG. 2, FIG. 4, FIG. 5 and FIG. 7, the plurality of blocking plates 24a, 24b, 24c, and 24d share the switches SWse and SWsp. However, in other embodiments, one of the blocking plates may be a corresponding one. Group switches SWse, SWsp.
以上對於本發明之較佳實施例所作的敘述係為闡明之目的,而無意限定本發明精確地為所揭露的形式,基於以上的教導或從本發明的實施例學習而作修改或變化是可能的,實施例係為解說本發明的原理以及讓熟習該項技術者以各種實施例利用本發明在實際應用上而選擇及敘述。 The above description of the preferred embodiments of the present invention is intended to be illustrative, and is not intended to limit the scope of the invention to the disclosed embodiments. It is possible to make modifications or variations based on the above teachings or learning from the embodiments of the present invention. The embodiments are described and described in the actual application of the present invention in various embodiments.
12‧‧‧保護層 12‧‧‧Protective layer
14‧‧‧靜電放電層 14‧‧‧Electrostatic discharge layer
16a‧‧‧電極板 16a‧‧‧Electrode plate
16b‧‧‧電極板 16b‧‧‧electrode plate
16c‧‧‧電極板 16c‧‧‧electrode plate
18a‧‧‧偵測電路 18a‧‧‧Detection circuit
18b‧‧‧偵測電路 18b‧‧‧Detection circuit
18c‧‧‧偵測電路 18c‧‧‧Detection circuit
22‧‧‧指紋感測裝置 22‧‧‧Finger sensing device
24a‧‧‧阻隔板 24a‧‧‧Baffle
24b‧‧‧阻隔板 24b‧‧‧Baffle
24c‧‧‧阻隔板 24c‧‧‧Baffle
Claims (8)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510952102.8A CN105740756A (en) | 2014-12-26 | 2015-12-17 | Fingerprint Sensing Device And Fingerprint Sensing Method Thereof |
| US14/978,599 US20160188949A1 (en) | 2014-12-26 | 2015-12-22 | Fingerprint sensing device and fingerprint sensing method thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| US201462096894P | 2014-12-26 | 2014-12-26 |
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| TW201624350A TW201624350A (en) | 2016-07-01 |
| TWI564815B true TWI564815B (en) | 2017-01-01 |
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| TW104138843A TWI569211B (en) | 2014-12-26 | 2015-11-23 | Sensing method and device of fingerprint sensor |
| TW104139496A TWI564815B (en) | 2014-12-26 | 2015-11-26 | Fingerprint sensing device and its fingerprint sensing method |
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| TW104138843A TWI569211B (en) | 2014-12-26 | 2015-11-23 | Sensing method and device of fingerprint sensor |
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| TW (2) | TWI569211B (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US10395084B2 (en) * | 2017-09-29 | 2019-08-27 | Superc-Touch Corporation | Fingerprint identification device |
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| TW424207B (en) * | 1998-03-05 | 2001-03-01 | Koninkl Philips Electronics Nv | Fingerprint sensing devices and systems incorporating such |
| TW495991B (en) * | 2000-04-25 | 2002-07-21 | Sony Corp | Active matrix circuit, method of driving the same, and surface pressure distribution detecting apparatus |
| TW200407910A (en) * | 2002-06-27 | 2004-05-16 | Seiko Epson Corp | Sensing circuit |
| TW200628786A (en) * | 2005-02-04 | 2006-08-16 | Univ Chung Yuan Christian | Multi-parameter sensor with readout circuit |
| TW201019628A (en) * | 2008-08-15 | 2010-05-16 | Ivi Smart Technologies Inc | RF power conversion circuits & methods, both for use in mobile devices |
| TW201428642A (en) * | 2013-01-04 | 2014-07-16 | Hardware & Software Technology Co Ltd | Detection module, fingerprint detection device and fingerprint image generating method |
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| US7705613B2 (en) * | 2007-01-03 | 2010-04-27 | Abhay Misra | Sensitivity capacitive sensor |
| US7683638B2 (en) * | 2008-02-20 | 2010-03-23 | Himax Technologies Limited | Capacitive fingerprint sensor and the panel thereof |
| TWI483547B (en) * | 2009-10-08 | 2015-05-01 | Sitronix Technology Corp | Capacitance sensing circuit with anti-electromagnetic capability |
| US20120092324A1 (en) * | 2010-10-18 | 2012-04-19 | Qualcomm Mems Technologies, Inc. | Touch, handwriting and fingerprint sensor with elastomeric spacer layer |
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2015
- 2015-11-23 TW TW104138843A patent/TWI569211B/en not_active IP Right Cessation
- 2015-11-26 TW TW104139496A patent/TWI564815B/en not_active IP Right Cessation
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW424207B (en) * | 1998-03-05 | 2001-03-01 | Koninkl Philips Electronics Nv | Fingerprint sensing devices and systems incorporating such |
| TW495991B (en) * | 2000-04-25 | 2002-07-21 | Sony Corp | Active matrix circuit, method of driving the same, and surface pressure distribution detecting apparatus |
| TW200407910A (en) * | 2002-06-27 | 2004-05-16 | Seiko Epson Corp | Sensing circuit |
| TW200628786A (en) * | 2005-02-04 | 2006-08-16 | Univ Chung Yuan Christian | Multi-parameter sensor with readout circuit |
| TW201019628A (en) * | 2008-08-15 | 2010-05-16 | Ivi Smart Technologies Inc | RF power conversion circuits & methods, both for use in mobile devices |
| TW201428642A (en) * | 2013-01-04 | 2014-07-16 | Hardware & Software Technology Co Ltd | Detection module, fingerprint detection device and fingerprint image generating method |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201624346A (en) | 2016-07-01 |
| TWI569211B (en) | 2017-02-01 |
| TW201624350A (en) | 2016-07-01 |
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