TWI563590B - Position apparatus of wafer fabrication and method using the same - Google Patents
Position apparatus of wafer fabrication and method using the sameInfo
- Publication number
- TWI563590B TWI563590B TW104117811A TW104117811A TWI563590B TW I563590 B TWI563590 B TW I563590B TW 104117811 A TW104117811 A TW 104117811A TW 104117811 A TW104117811 A TW 104117811A TW I563590 B TWI563590 B TW I563590B
- Authority
- TW
- Taiwan
- Prior art keywords
- same
- wafer fabrication
- position apparatus
- fabrication
- wafer
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104117811A TWI563590B (en) | 2015-06-02 | 2015-06-02 | Position apparatus of wafer fabrication and method using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104117811A TWI563590B (en) | 2015-06-02 | 2015-06-02 | Position apparatus of wafer fabrication and method using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201643987A TW201643987A (en) | 2016-12-16 |
| TWI563590B true TWI563590B (en) | 2016-12-21 |
Family
ID=58055993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104117811A TWI563590B (en) | 2015-06-02 | 2015-06-02 | Position apparatus of wafer fabrication and method using the same |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI563590B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI780424B (en) * | 2020-04-07 | 2022-10-11 | 均華精密工業股份有限公司 | Improving accuracy and speed of bonding apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050005702A1 (en) * | 2001-09-06 | 2005-01-13 | Tokyo Electron Limited | Transporting tool for object to be tested, and object-to-be-tested transporting system |
| US20060017897A1 (en) * | 2003-04-18 | 2006-01-26 | Canon Kabushiki Kaisha | Exposure apparatus |
-
2015
- 2015-06-02 TW TW104117811A patent/TWI563590B/en active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050005702A1 (en) * | 2001-09-06 | 2005-01-13 | Tokyo Electron Limited | Transporting tool for object to be tested, and object-to-be-tested transporting system |
| US20060017897A1 (en) * | 2003-04-18 | 2006-01-26 | Canon Kabushiki Kaisha | Exposure apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201643987A (en) | 2016-12-16 |
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