TWI563580B - - Google Patents
Info
- Publication number
- TWI563580B TWI563580B TW103119855A TW103119855A TWI563580B TW I563580 B TWI563580 B TW I563580B TW 103119855 A TW103119855 A TW 103119855A TW 103119855 A TW103119855 A TW 103119855A TW I563580 B TWI563580 B TW I563580B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H10W72/015—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/43—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/43—Manufacturing methods
- H01L2224/438—Post-treatment of the connector
- H01L2224/43848—Thermal treatments, e.g. annealing, controlled cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
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- H10W72/07533—
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- H10W72/50—
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- H10W72/522—
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- H10W72/534—
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- H10W74/00—
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013124903A JP5546670B1 (en) | 2013-06-13 | 2013-06-13 | Structure of coated copper wire for ultrasonic bonding |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201511150A TW201511150A (en) | 2015-03-16 |
| TWI563580B true TWI563580B (en) | 2016-12-21 |
Family
ID=51409577
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103119855A TW201511150A (en) | 2013-06-13 | 2014-06-09 | Structure of plated copper wire for ultrasonic welding |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5546670B1 (en) |
| CN (1) | CN104241237B (en) |
| SG (1) | SG10201403091UA (en) |
| TW (1) | TW201511150A (en) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SG11201608819VA (en) | 2014-04-21 | 2016-12-29 | Nippon Steel & Sumikin Mat Co | Bonding wire for semiconductor device |
| DE112015007265B4 (en) * | 2015-05-26 | 2025-06-05 | Nippon Micrometal Corporation | Bonding wire for semiconductor device |
| WO2016189752A1 (en) * | 2015-05-26 | 2016-12-01 | 日鉄住金マイクロメタル株式会社 | Bonding wire for semiconductor device |
| CN112038312B (en) * | 2015-05-26 | 2024-08-30 | 日铁新材料股份有限公司 | Bonding wire for semiconductor devices |
| CN106489199B (en) | 2015-06-15 | 2019-09-03 | 日铁新材料股份有限公司 | Bonding wire for semiconductor device |
| JP5893230B1 (en) | 2015-07-23 | 2016-03-23 | 日鉄住金マイクロメタル株式会社 | Bonding wires for semiconductor devices |
| SG10201705029XA (en) * | 2015-08-12 | 2017-07-28 | Nippon Micrometal Corp | Bonding wire for semiconductor device |
| JP6410692B2 (en) * | 2015-08-28 | 2018-10-24 | 田中電子工業株式会社 | Copper alloy bonding wire |
| WO2017221434A1 (en) * | 2016-06-20 | 2017-12-28 | 日鉄住金マイクロメタル株式会社 | Bonding wire for semiconductor device |
| CN116875840B (en) * | 2023-09-05 | 2023-11-21 | 汕头市骏码凯撒有限公司 | High-power blister copper wire resistant to high temperature, oxidation and thermal fatigue and method for manufacturing the same |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06151497A (en) * | 1992-11-10 | 1994-05-31 | Tanaka Denshi Kogyo Kk | Wire for bonding semiconductor element and its manufacture |
| JP2009088132A (en) * | 2007-09-28 | 2009-04-23 | Tanaka Electronics Ind Co Ltd | Bonding wire |
| US20120104613A1 (en) * | 2007-07-24 | 2012-05-03 | Nippon Micrometal Corporation | Bonding wire for semiconductor device |
| WO2013018238A1 (en) * | 2011-08-01 | 2013-02-07 | タツタ電線株式会社 | Ball bonding wire |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0750720B2 (en) * | 1989-11-08 | 1995-05-31 | 株式会社東芝 | Bonding wire and semiconductor device having the same |
| JPH06283565A (en) * | 1993-03-29 | 1994-10-07 | Nippon Steel Corp | High frequency bonding wire |
| JPH09246310A (en) * | 1996-03-04 | 1997-09-19 | Hitachi Ltd | Semiconductor device |
| KR100280084B1 (en) * | 1998-12-29 | 2001-03-02 | 마이클 디. 오브라이언 | Wire for semiconductor device |
| TW200414453A (en) * | 2002-03-26 | 2004-08-01 | Sumitomo Electric Wintec Inc | Bonding wire and IC device using the bonding wire |
| JP2005129603A (en) * | 2003-10-22 | 2005-05-19 | Mitsumi Electric Co Ltd | Semiconductor integrated circuit device |
| JP5381816B2 (en) * | 2010-03-03 | 2014-01-08 | 三菱電機株式会社 | Wire bonding method |
-
2013
- 2013-06-13 JP JP2013124903A patent/JP5546670B1/en not_active Expired - Fee Related
-
2014
- 2014-06-09 TW TW103119855A patent/TW201511150A/en not_active IP Right Cessation
- 2014-06-10 SG SG10201403091UA patent/SG10201403091UA/en unknown
- 2014-06-13 CN CN201410265987.XA patent/CN104241237B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06151497A (en) * | 1992-11-10 | 1994-05-31 | Tanaka Denshi Kogyo Kk | Wire for bonding semiconductor element and its manufacture |
| US20120104613A1 (en) * | 2007-07-24 | 2012-05-03 | Nippon Micrometal Corporation | Bonding wire for semiconductor device |
| JP2009088132A (en) * | 2007-09-28 | 2009-04-23 | Tanaka Electronics Ind Co Ltd | Bonding wire |
| WO2013018238A1 (en) * | 2011-08-01 | 2013-02-07 | タツタ電線株式会社 | Ball bonding wire |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5546670B1 (en) | 2014-07-09 |
| CN104241237B (en) | 2017-04-12 |
| CN104241237A (en) | 2014-12-24 |
| SG10201403091UA (en) | 2015-01-29 |
| TW201511150A (en) | 2015-03-16 |
| JP2015002213A (en) | 2015-01-05 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |