TWI562684B - - Google Patents
Info
- Publication number
- TWI562684B TWI562684B TW102121459A TW102121459A TWI562684B TW I562684 B TWI562684 B TW I562684B TW 102121459 A TW102121459 A TW 102121459A TW 102121459 A TW102121459 A TW 102121459A TW I562684 B TWI562684 B TW I562684B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H10P50/242—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H10P14/6319—
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H2242/00—Auxiliary systems
- H05H2242/20—Power circuits
- H05H2242/26—Matching networks
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012137958A JP6001932B2 (en) | 2012-06-19 | 2012-06-19 | Plasma processing apparatus and filter unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201414361A TW201414361A (en) | 2014-04-01 |
| TWI562684B true TWI562684B (en) | 2016-12-11 |
Family
ID=49768420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102121459A TW201414361A (en) | 2012-06-19 | 2013-06-18 | Plasma processing device and filter unit |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6001932B2 (en) |
| KR (1) | KR102070471B1 (en) |
| TW (1) | TW201414361A (en) |
| WO (1) | WO2013190805A1 (en) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3798044B1 (en) | 2014-01-10 | 2023-04-19 | Nissan Motor Co., Ltd. | Control device for electric motor vehicle and control method for electric motor vehicle |
| JP6218650B2 (en) * | 2014-03-11 | 2017-10-25 | 東京エレクトロン株式会社 | Plasma processing equipment |
| JP6483533B2 (en) * | 2015-06-03 | 2019-03-13 | 京セラ株式会社 | Sample holder and plasma etching apparatus using the same |
| JP6637846B2 (en) * | 2016-06-23 | 2020-01-29 | 東京エレクトロン株式会社 | How to design a filter |
| JP6698502B2 (en) | 2016-11-21 | 2020-05-27 | 東京エレクトロン株式会社 | Mounting table and plasma processing device |
| JP6832800B2 (en) * | 2017-06-21 | 2021-02-24 | 東京エレクトロン株式会社 | Plasma processing equipment |
| US10812033B2 (en) * | 2017-12-29 | 2020-10-20 | Lam Research Corporation | High-power radio-frequency spiral-coil filter |
| JP7094856B2 (en) * | 2018-10-19 | 2022-07-04 | 東京エレクトロン株式会社 | Filter unit adjustment method and plasma processing equipment |
| JP7125058B2 (en) * | 2018-12-06 | 2022-08-24 | 東京エレクトロン株式会社 | Plasma processing apparatus and plasma processing method |
| JP7184254B2 (en) | 2018-12-06 | 2022-12-06 | 東京エレクトロン株式会社 | Plasma processing apparatus and plasma processing method |
| TWI767655B (en) * | 2020-05-01 | 2022-06-11 | 日商東京威力科創股份有限公司 | Etching apparatus and etching method |
| JP7516198B2 (en) * | 2020-05-01 | 2024-07-16 | 東京エレクトロン株式会社 | Etching apparatus and method |
| KR102785926B1 (en) * | 2020-11-06 | 2025-03-26 | 세메스 주식회사 | Apparatus for treating substrate |
| JP7534235B2 (en) * | 2021-02-01 | 2024-08-14 | 東京エレクトロン株式会社 | Filter circuit and plasma processing apparatus |
| CN112992481A (en) * | 2021-02-04 | 2021-06-18 | 广州市蓝粉网络科技有限公司 | Chip type winding common-mode inductor |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI278877B (en) * | 2003-09-17 | 2007-04-11 | Pulse Eng Inc | Controlled inductance device and method |
| US20080236493A1 (en) * | 2007-03-27 | 2008-10-02 | Tokyo Electron Limited | Plasma processing apparatus |
| TW201143553A (en) * | 2009-11-24 | 2011-12-01 | Tokyo Electron Ltd | Plasma processing apparatus |
| TWI358198B (en) * | 2006-06-13 | 2012-02-11 | Applied Materials Inc | High ac current high rf power ac-rf decoupling fil |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6011418U (en) * | 1983-07-05 | 1985-01-25 | パイオニア株式会社 | variable inductance device |
| JPS62213216A (en) * | 1986-03-14 | 1987-09-19 | Matsushita Electric Ind Co Ltd | variable inductor |
| JP3843887B2 (en) * | 2002-05-24 | 2006-11-08 | 松下電器産業株式会社 | High frequency thawing device |
| JP5042661B2 (en) * | 2007-02-15 | 2012-10-03 | 東京エレクトロン株式会社 | Plasma processing apparatus and filter unit |
| JP5301812B2 (en) * | 2007-11-14 | 2013-09-25 | 東京エレクトロン株式会社 | Plasma processing equipment |
| JP2010283273A (en) * | 2009-06-08 | 2010-12-16 | Hitachi Kokusai Electric Inc | Inductance fine adjustment device |
-
2012
- 2012-06-19 JP JP2012137958A patent/JP6001932B2/en active Active
-
2013
- 2013-06-12 WO PCT/JP2013/003683 patent/WO2013190805A1/en not_active Ceased
- 2013-06-12 KR KR1020147029205A patent/KR102070471B1/en active Active
- 2013-06-18 TW TW102121459A patent/TW201414361A/en unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI278877B (en) * | 2003-09-17 | 2007-04-11 | Pulse Eng Inc | Controlled inductance device and method |
| TWI358198B (en) * | 2006-06-13 | 2012-02-11 | Applied Materials Inc | High ac current high rf power ac-rf decoupling fil |
| US20080236493A1 (en) * | 2007-03-27 | 2008-10-02 | Tokyo Electron Limited | Plasma processing apparatus |
| TW201143553A (en) * | 2009-11-24 | 2011-12-01 | Tokyo Electron Ltd | Plasma processing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201414361A (en) | 2014-04-01 |
| KR102070471B1 (en) | 2020-01-29 |
| KR20150024303A (en) | 2015-03-06 |
| JP2014003179A (en) | 2014-01-09 |
| WO2013190805A1 (en) | 2013-12-27 |
| JP6001932B2 (en) | 2016-10-05 |