TWI561835B - - Google Patents

Info

Publication number: TWI561835B
Authority: TW; Taiwan

Application number

TW104134947A

Other languages

Chinese (zh)

Other versions

TW201715241A (en

Inventor

qi-hong Chen

Original Assignee

Hon Tech Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2015-10-23

Filing date

2015-10-23

Publication date

2016-12-11

2015-10-23 Application filed by Hon Tech Inc filed Critical Hon Tech Inc

2015-10-23 Priority to TW104134947A priority Critical patent/TW201715241A/en

2016-12-11 Application granted granted Critical

2016-12-11 Publication of TWI561835B publication Critical patent/TWI561835B/zh

2017-05-01 Publication of TW201715241A publication Critical patent/TW201715241A/en

Links

TW104134947A 2015-10-23 2015-10-23 Electronic device operation apparatus and test handler using the same comprising a test mechanism, a transport mechanism, and a temperature control unit TW201715241A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
TW104134947A TW201715241A (en)	2015-10-23	2015-10-23	Electronic device operation apparatus and test handler using the same comprising a test mechanism, a transport mechanism, and a temperature control unit

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
TW104134947A TW201715241A (en)	2015-10-23	2015-10-23	Electronic device operation apparatus and test handler using the same comprising a test mechanism, a transport mechanism, and a temperature control unit

Publications (2)

Publication Number	Publication Date
TWI561835B true TWI561835B (en)	2016-12-11
TW201715241A TW201715241A (en)	2017-05-01

Family

ID=58227293

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW104134947A TW201715241A (en)	2015-10-23	2015-10-23	Electronic device operation apparatus and test handler using the same comprising a test mechanism, a transport mechanism, and a temperature control unit

Country Status (1)

Country	Link
TW (1)	TW201715241A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN113075426A (en) *	2017-08-18	2021-07-06	泰克元有限公司	Processor for testing electronic components
CN115728561A (en) *	2021-08-30	2023-03-03	鸿劲精密股份有限公司	Conveyor Mechanism, Test Device, Detection Method and Operation Machine Used therein

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
TWI854473B (en) *	2023-02-04	2024-09-01	矽品精密工業股份有限公司	Working system for semiconductor packaging process and running method thereof
TWI848544B (en) *	2023-02-04	2024-07-11	矽品精密工業股份有限公司	Working system for semiconductor packaging process and running method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2001324538A (en) *	2000-05-15	2001-11-22	Nec Eng Ltd	Semiconductor integrated circuit conveying device
WO2004051292A1 (en) *	2002-12-04	2004-06-17	Advantest Corporation	Pressing member and electronic component handling device
US20100040107A1 (en) *	2007-05-21	2010-02-18	Fujitsu Microelectronics Limited	Testing device and testing method of semiconductor devices
TW201307867A (en) *	2011-08-05	2013-02-16	Hon Tech Inc	Conveying device of electronic component tester
TWI491893B (en) *	2014-01-28	2015-07-11	Hon Tech Inc	Electronic components testing equipment

2015
- 2015-10-23 TW TW104134947A patent/TW201715241A/en unknown

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2001324538A (en) *	2000-05-15	2001-11-22	Nec Eng Ltd	Semiconductor integrated circuit conveying device
WO2004051292A1 (en) *	2002-12-04	2004-06-17	Advantest Corporation	Pressing member and electronic component handling device
US20100040107A1 (en) *	2007-05-21	2010-02-18	Fujitsu Microelectronics Limited	Testing device and testing method of semiconductor devices
TW201307867A (en) *	2011-08-05	2013-02-16	Hon Tech Inc	Conveying device of electronic component tester
TWI491893B (en) *	2014-01-28	2015-07-11	Hon Tech Inc	Electronic components testing equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN113075426A (en) *	2017-08-18	2021-07-06	泰克元有限公司	Processor for testing electronic components
CN115728561A (en) *	2021-08-30	2023-03-03	鸿劲精密股份有限公司	Conveyor Mechanism, Test Device, Detection Method and Operation Machine Used therein

Also Published As

Publication number	Publication date
TW201715241A (en)	2017-05-01

Publication	Publication Date	Title
BR112018005646A2 (en)	2018-10-02
TWI561835B (en)	2016-12-11
BR112017027358A2 (en)	2018-08-21
AU2022228198B1 (en)	2025-09-11
BE2015C047I2 (en)	2022-08-10
BE2015C044I2 (en)	2023-08-31
CN303064666S (en)	2015-01-07
BR0008604B1 (en)	2015-07-14
BR0000763F1 (en)	2015-09-15
CN303065941S (en)	2015-01-07
CN303065511S (en)	2015-01-07
BR0007672B1 (en)	2015-03-31
BR9707868B1 (en)	2015-08-25
CN303068960S (en)	2015-01-07
CN303069900S (en)	2015-01-07
BR0009994B1 (en)	2015-09-15
BR0009942B1 (en)	2015-08-25
BR0009761B1 (en)	2015-09-01
BR0009757B1 (en)	2015-06-02
BR0009717B1 (en)	2015-06-09
BR0009649B1 (en)	2015-07-21
BR0009373B1 (en)	2015-09-01
BR0009349B1 (en)	2015-08-18
BR0009182B1 (en)	2015-06-16
BR0008874B1 (en)	2015-09-15

TWI561835B - - Google Patents

Info

Links

Priority Applications (1)

Applications Claiming Priority (1)

Publications (2)

Family

ID=58227293

Family Applications (1)

Country Status (1)

Cited By (2)

Families Citing this family (2)

Citations (5)

Patent Citations (5)

Cited By (2)

Also Published As

Similar Documents