TWI559013B - Measurement fixture - Google Patents

Description

Measuring fixture

The present invention relates to a measuring jig, and more particularly to a measuring jig for an electronic component.

As a communication medium for various electronic components in an electronic product, the above-described various electronic components are mounted on the motherboard to provide users with various functions. In order to meet different needs, corresponding electronic products require different levels or different types of computing performance. Even for the same type of electronic products, manufacturers will launch different series of products depending on the customer base.

In the past, since there were not many types of electronic products, the motherboards were set to correspond to electronic components of a certain specification. For example, for a motherboard of a computer, its components may be set in a configuration to operate with a certain size of the central processing unit. Nowadays, with the evolution of technology and the needs of the market, the same motherboard can be configured with different specifications of the central processing unit according to actual needs. In other words, the configuration of the motherboard components is no longer limited to the same configuration, which makes the previous test fixtures useless, so new test fixtures must be developed to meet the design trend of the motherboard.

The invention provides a measuring jig to overcome the problem that the current motherboard has a plurality of setting configurations, so that the general test fixture is not used.

The invention provides a measuring fixture suitable for inserting into a processor socket on a motherboard. The measuring fixture comprises a substrate, at least one first voltage pin, at least one second voltage pin, at least one first signal pin and a processing unit. The substrate has a first side and a second side. At least one first voltage pin is located on the second side. At least one second voltage pin is located on the second side. At least the first signal pin is located on the second side. The processing unit is located on the first side. The processing unit is electrically connected to the at least one first voltage pin, the at least one second voltage pin, and the at least one first signal pin. When the equivalent test fixture is inserted into the processor socket, the processing unit reads at least one first voltage value from the at least one first voltage pin, and reads at least one second voltage value from the at least one second voltage pin, respectively. At least one first signal pin reads at least a third voltage value.

In summary, the present invention provides a measuring fixture. When the equivalent measuring tool is inserted into the processor slot, the processing unit of the measuring jig reads the corresponding voltage value from different pins. Thereby, the measuring jig provided by the present invention can measure the motherboard with different setting configurations. In addition, the measuring jig provided by the invention can be used to measure whether there is a short circuit or an open circuit between different pins, and provides a more diversified measuring function than the conventional measuring jig.

The above description of the disclosure and the following description of the embodiments of the present invention are intended to illustrate and explain the spirit and principles of the invention, and to provide further explanation of the scope of the invention.

The detailed features and advantages of the present invention are set forth in the Detailed Description of the Detailed Description of the <RTIgt; </ RTI> <RTIgt; </ RTI> </ RTI> </ RTI> <RTIgt; The objects and advantages associated with the present invention can be readily understood by those skilled in the art. The following examples are intended to describe the present invention in further detail, but are not intended to limit the scope of the invention.

Please refer to FIG. 1. FIG. 1 is a functional block diagram of a measuring jig according to an embodiment of the invention. As shown in FIG. 1, the measuring jig 1000 is adapted to be inserted into a processor socket 2200 on the motherboard 2000. The measuring fixture 1000 includes a substrate 1200, first voltage pins 1221, 1222, second voltage pins 1241, 1242, first signal pins 1261, 1262, and a processing unit 1280. The substrate 1200 has a first surface P1 and a second surface P2. The first voltage pins 1221, 1222 are located on the second side P2. The second voltage pins 1241, 1242 are located on the second side P2. The first signal pins 1261, 1262 are located on the second side P2. The processing unit 1280 is located on the first side P1. The processing unit 1280 is electrically connected to the first voltage pins 1221, 1222, the second voltage pins 1241, 1242 and the first signal pins 1261, 1262. The processing unit 1280 is, for example, a micro control unit (MCU), but is not limited thereto.

In one embodiment, the first voltage pins 1221, 1222, the second voltage pins 1241, 1242 and the first signal pins 1261, 1262 extend from the processing unit 1280 and pass through the substrate 1200 to be exposed on the second surface P2. In another embodiment, the processing unit 1280 has pins, and the pins of the processing unit 1280 pass through the substrate 1200 to electrically connect the first voltage pins 1221, 1222, the second voltage pins 1241, 1242 and the first signal pins 1261. 1,262. In a further embodiment, the first voltage pins 1221, 1222, the second voltage pins 1241, 1242 and the first signal pins 1261, 1262 pass through the substrate 1200 to electrically connect the processing unit 1280. The above is merely an example and is not limited to this.

The measuring fixture 1000 is inserted into the processor socket 2200 via the first voltage pins 1221, 1222, the second voltage pins 1241, 1242 and the first signal pins 1261, 1262. When the equivalent test fixture 1000 is inserted into the processor socket 2200, the processing unit 1280 reads at least one first voltage value from the first voltage pins 1221 and 1222 and at least one from the second voltage pins 1241 and 1242. The two voltage values read at least a third voltage value from the first signal pins 1261, 1262. The first voltage pins 1221, 1222 and the second voltage pins 1241, 1242 are used, for example, to transfer electrical energy supplied by the motherboard 2000. The first signal pins 1261, 1262 are used, for example, to transmit a clock signal, a status indication signal, or a control signal transmitted by the motherboard 2000.

In one embodiment, the first voltage pins 1221, 1222 and the second voltage pins 1241, 1242 are electrically connected to the plurality of power supply modules on the motherboard 2000 via the processor socket 2200, respectively, and the power supply module is, for example, a voltage pulse. Wave width modulation integrated circuit (PWM IC). The first signal pins 1261, 1262 are, for example, electrically connected to a direct media interface bus (DMI bus), a power status line, a clock signal line, or a signal line required by other processors. The above is merely an example and is not limited to this.

In practice, the processor socket 2200 is used to provide a plurality of different voltages. In other words, the measuring fixture 1000 has a type and number of pins that are not the first voltage pins 1221, 1222, and the second voltage pins. 1241, 1242 and the first signal pins 1261, 1262 are limited, and the voltage value that the processing unit 1280 can read is also not limited by the first voltage value, the second voltage value and the third voltage value. In an embodiment, the processing unit 1280 can read, for example, the supply voltage of the voltage pulse width modulation integrated circuit outputted to the processor socket 2200 on the motherboard 2000 via the processor socket 2200, the supply voltage, The first voltage value and the second voltage value are, for example, the conventional VCORE, VCCGT, VDDQ, VCCIO, or VCCSA. These voltage parameters are known to those of ordinary skill in the art and will not be described herein. The processing unit 1280 is electrically connected to the motherboard 2000 via serial voltage identification (SVID), for example, and the third voltage value is, for example, a voltage level possible for the various signal lines described above, and is not limited herein.

Referring to FIG. 2 and FIG. 3 together, FIG. 2 is a schematic top view of a motherboard according to an embodiment of the invention, and FIG. 3 is a bottom view of the measuring fixture according to an embodiment of the invention. schematic diagram. The main purpose of FIG. 2 and FIG. 3 is to disclose the relative engagement relationship between the measuring fixture 1000 and the motherboard 2000 of the present invention. Therefore, the motherboard 2000 shown in FIG. 3 is merely an example, and the number of stitches and the components of each component are adjusted. The configuration of the measuring jig 1000 provided by the present invention is more applicable to other types of the motherboard 2000, and is not limited to those depicted in the drawings.

In this embodiment, the measurement jig 1000 is inserted into the processor socket 2200 of the motherboard 2000 via a pin combination as shown in the figure. The stitch combination has first voltage pins 1221, 1222, second voltage pins 1241, 1242 and first signal pins 1261, 1262 as described above. It should be noted that in order to simplify the description, each pin is drawn in an easy-to-read manner in the drawing, and only the required stitches are indicated to avoid confusion. In other words, FIG. 2 and FIG. 3 and their corresponding related descriptions are merely illustrative examples. The measuring jig 1000 actually has the type of stitches, the stitch size, the stitch shape, the number of stitches and their relative positions are not illustrated. The limit is drawn on the formula.

As shown in FIG. 3, the first voltage pin 1221 is adjacent to the second voltage pin 1241, and the first voltage pin 1222 is adjacent to the first signal pin 1261. In an embodiment, corresponding to the voltage level of the line on the motherboard 2000, the voltage levels on the first voltage pin 1221 and the first voltage pin 1222 should be substantially the same as each other, and the second voltage pin 1241 and the second. The voltage levels on voltage pins 1242 should be substantially the same as each other. Moreover, the voltage levels on the first voltage pin 1221 and the first voltage pin 1222 and the voltage levels on the second voltage pin 1241 and the second voltage pin 1242 are different from each other.

In an embodiment, the processing unit 1280 determines whether the motherboard 2000 is normal by interpreting whether each pin has an expected voltage level. In another embodiment, the processing unit 1280 determines whether the corresponding voltage on the motherboard 2000 is short-circuited by determining whether the voltage levels on the adjacent first voltage pin 1221 and the second voltage pin 1241 are the same. . In a further embodiment, in a test procedure, the motherboard 2000 supplies power to the measurement fixture 1000 via only the first voltage pins 1221, 1222 and the second voltage pins 1241, 1242, not via the first signal pin 1261. 1262 provides a correlation signal to the measurement fixture 1000. At this time, the processing unit 1280 determines whether the relevant line of the motherboard 2000 is abnormal by determining whether the first signal pins 1261, 1262 have an unexpected voltage level. Alternatively, the processing unit 1280 determines whether the related line is short-circuited by determining whether the first signal pin 1261 of the foot has the same voltage as the adjacent first voltage pin 1222.

Corresponding to the above, in an embodiment, the processing unit 1280 further generates a set of determining parameters according to a control signal, and the determining parameter has, for example, a plurality of corresponding to the first voltage value, the second voltage value, and the third voltage value. Standard voltage value. The processing unit 1280 generates a set of determination results according to the first voltage value, the second voltage value, and the third voltage value measured by the group determination parameter and the quantity. In more detail, the processing unit 1280 determines, for example, the relative relationship between the measured first voltage value, the second voltage value, and the third voltage value and the standard voltage value in the determination parameter, such as whether it is greater than, less than, or equal. Determine if the relevant line is abnormal. How the processing unit 1280 determines based on the determination parameters and the measured voltages is designed by those skilled in the art to meet the actual needs. The content and quantity of the determination parameters are not limited herein.

Moreover, in another embodiment, the processing unit 1280 can further simulate a change in processor load to detect whether the associated line can tolerate load change of the processor. In more detail, the processing unit 1280 further extracts the first current from at least one of the first voltage pins 1221, 1222 in accordance with the control signal. At this time, the processing unit 1280 further determines whether the change in the voltage level on the relevant pin is within a tolerable range or standard to determine whether the relevant line is abnormal. For example, the processing unit 1280 can determine whether the voltage level on the relevant pin is greater than a predetermined upper limit or less than a predetermined lower limit. Alternatively, the processing unit 1280 can determine whether the voltage level on the associated pin is pulled back to the desired voltage level for a predetermined time. Alternatively, the processing unit 1280 can determine whether the average voltage on the associated pin for a predetermined time meets the requirements. The foregoing is merely exemplary, and it is not limited herein how the processing unit 1280 determines based on the voltage level on the associated pin.

Referring to FIG. 4, FIG. 4 is a functional block diagram of a measuring jig according to another embodiment of the present invention. In the embodiment corresponding to FIG. 4, the measuring jig 1000 further has a communication pin 1231, a memory unit 1250, a power connection end 1270, and a prompting module 1290. The motherboard 2000 further has an electronic component 2400. The communication pin 1231, the memory unit 1250, the power connection end 1270 and the prompt module 1290 are electrically connected to the processing unit 1280. The electronic component 2400 is electrically connected to the processor socket 2200. The communication pin 1231 is, for example, a system management bus (SM bus), and the memory unit 1250 is, for example, a volatile memory or a non-volatile memory. The prompt module 1290 is, for example, a light emitting diode. , LED) or buzzer, electronic component 2400 is, for example, a voltage pulse width modulation integrated circuit. The above is merely exemplary and does not actually limit the number and type of components.

The communication pin 1231 is located on the second surface P2, and the processing unit 1280 communicates with the electronic component 2400 through the communication pin 1231. In another embodiment, the processing unit 1280 communicates with another type of test fixture through the communication pin 1231. In this embodiment, processing unit 1280, for example, may transmit the measured results to the other type of metrology fixture for subsequent processing. The memory unit 1250 is configured to store the measured first voltage value, the second voltage value, and the third voltage value. When the memory unit 1250 is a non-volatile memory, the related measurement data can be saved in the memory unit 1250 even if the measurement unit 1000 is not powered. The user can measure the fixture 1250 after the measurement. 1000 is taken off, and relevant measurement data is read out from the memory unit 1250 by other electronic devices for analysis. The power connection end 1270 is pluggably inserted into the power supply 3000 to enable the measurement jig 1000 to obtain power from the power supply 3000. In this embodiment, when the processing unit 1280 determines that the relevant line of the motherboard 2000 is defective in the foregoing process, the processing unit 1280 further drives the prompting module 1290 to selectively emit a sound or a bright light to alert the user.

In summary, the present invention provides a measuring jig. When the equivalent test fixture is inserted into the processor socket, the processing unit of the measuring fixture reads at least one first voltage value from the at least one first voltage pin and at least one from the at least one second voltage pin. And a second voltage value and reading at least one third voltage value from the at least one first signal pin. By reading the corresponding voltage levels with different pins, the measuring jig provided by the present invention can measure the motherboard with different setting configurations. In addition, the measuring jig provided by the invention can be used to measure whether there is a short circuit or an open circuit between different pins, and provides a more diversified measuring function than the conventional measuring jig. In addition, the time for manual detection can be shortened and the loss caused by human error can be reduced. On the other hand, the detection accuracy is improved to improve the product quality, and the detection cost is prevented from increasing.

Although the present invention has been disclosed above in the foregoing embodiments, it is not intended to limit the invention. It is within the scope of the invention to be modified and modified without departing from the spirit and scope of the invention. Please refer to the attached patent application for the scope of protection defined by the present invention.

1000‧‧‧Measurement fixture
1200‧‧‧ substrate
1221, 1222, 1223, 1224‧‧‧ first voltage pins
1231‧‧‧Communication pins
1241, 1242, 1243‧‧‧ second voltage pin
1250‧‧‧ memory unit
1261, 1262, 1263‧‧‧ first signal pin
1270‧‧‧Power connection
1280‧‧‧Processing unit
1290‧‧‧Tips module
2000‧‧‧ motherboard
2200‧‧‧ processor socket
2400‧‧‧Electronic components
3000‧‧‧Power supply
P1‧‧‧ first side
P2‧‧‧ second side

FIG. 1 is a functional block diagram of a measuring jig according to an embodiment of the invention. 2 is a top plan view of a motherboard according to an embodiment of the invention. FIG. 3 is a bottom view of a measuring jig according to an embodiment of the invention. FIG. 4 is a functional block diagram of a measuring jig according to another embodiment of the present invention.

1000‧‧‧Measurement fixture

1200‧‧‧ substrate

1221, 1222‧‧‧ first voltage pin

1241, 1242‧‧‧second voltage pin

1261, 1262‧‧‧ first signal pin

1280‧‧‧Processing unit

2000‧‧‧ motherboard

2200‧‧‧ processor socket

2400‧‧‧Electronic components

Claims (10)

A measuring fixture is adapted to be inserted into a processor socket on a motherboard. The measuring fixture comprises: a substrate having a first surface and a second surface; at least one first voltage pin located at The second surface; the at least one second voltage pin is located on the second surface; the at least one first signal pin is located on the second surface; a processing unit is located on the first surface, electrically connected to the at least one first a voltage pin, the at least one second voltage pin, and the at least one first signal pin, wherein the processing unit reads at least the first voltage pin from the at least one first voltage pin when the measuring fixture is inserted into the processor socket a first voltage value, reading at least one second voltage value from the at least one second voltage pin and reading at least a third voltage value from the at least one first signal pin; and a set of communication pins located at the second And electrically connected to the processing unit, the processing unit communicates with an electronic component on the motherboard through the set of communication pins. The measuring fixture of claim 1, wherein the at least one first voltage pin is a plurality of first voltage pins, and the at least one first voltage is a plurality of first voltage values, and the processing unit respectively A voltage pin reads the first voltage values. The measuring fixture of claim 1, wherein one of the at least one first voltage pin is adjacent to one of the at least one second voltage pin. The measuring fixture of claim 1, wherein one of the at least one first voltage pin is adjacent to one of the at least one first signal pin. The measuring jig according to item 1, further comprising a power connection end, electrically connecting the processing The power connection is configured to be pluggable and inserted into a power supply. The measuring fixture of the first aspect, wherein the processing unit generates a set of determining parameters according to a control signal, and according to the set of determining parameters, the at least one first voltage value, the at least one second voltage value And the at least one third voltage value, generating a set of determination results. The measuring fixture of claim 6, wherein the processing unit further extracts a first current from the at least one first voltage pin according to the control signal. The measuring fixture of the first aspect, wherein the processing unit transmits the at least one first voltage value, the at least one second voltage value, and the at least one third voltage value to the Electronic component. The measuring fixture of the first aspect, further comprising a memory unit electrically connected to the processing unit for storing the at least one first voltage value, the at least one second voltage value and the at least one third voltage value. The measuring fixture of item 9, wherein the memory unit is a non-volatile memory or a volatile memory.