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TWI540792B - A far-field calibration system of an antenna arrary system - Google Patents

A far-field calibration system of an antenna arrary system Download PDF

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TWI540792B
TWI540792B TW103139604A TW103139604A TWI540792B TW I540792 B TWI540792 B TW I540792B TW 103139604 A TW103139604 A TW 103139604A TW 103139604 A TW103139604 A TW 103139604A TW I540792 B TWI540792 B TW I540792B
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antenna
aut
phase
far field
tested
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TW201618379A (en
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胡正南
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亞東技術學院
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Description

天線系統的遠場調校系統 Far field calibration system for antenna systems

本發明有關於一種測試方法,特別指一種關於天線系統的遠場調校系統。 The invention relates to a test method, in particular to a far field calibration system for an antenna system.

任何天線經過適當的操作,都可以在近場或遠場範圍內成功的測量。但由於成本、尺寸以及更多複雜的細節因素,導致遠近場範圍的優勢各有不同。一般來說,遠場範圍適合較低頻的天線,其需要單一場型量測;近場範圍適合較高頻天線,其需要完整場型和極化量測。 Any antenna that has been properly operated can be successfully measured in the near or far field. However, due to cost, size and more complex details, the advantages of the near and far field range are different. In general, the far field range is suitable for lower frequency antennas, which require a single field type measurement; the near field range is suitable for higher frequency antennas, which require full field and polarization measurements.

每一個量測都有附加的子類型,它們各有一定的優點和缺點,這也使得遠近場之間的量測技術難以比較。但近場量測技術有一個公認的優點,那就是它可以在室內做完整測量,排除了天氣、電磁干擾、安全等問題。然而同樣的優點也可以用在遠場量測技術,它使用了微波暗室和規範的量測空間。 Each measurement has additional subtypes, each of which has certain advantages and disadvantages, which makes the measurement techniques between the far and near fields difficult to compare. But the near-field measurement technology has a recognized advantage, that is, it can do complete measurements indoors, eliminating weather, electromagnetic interference, safety and other issues. However, the same advantages can be used in far field measurement techniques, which use a microwave darkroom and a standardized measurement space.

現已證明,相較於傳統被動天線,MIMO天線系統需要更為詳盡的測量,因此、需要一些額外量測裝備及複雜的測試方法。因此、在系統開發過程中需要發費巨資建置複雜且昂貴的測試系統及儀器,例如近場量測系統或Over-the-Air(OTA)量測系統。 It has been shown that MIMO antenna systems require more detailed measurements than traditional passive antennas, and therefore require additional measurement equipment and complex test methods. Therefore, in the system development process, it is necessary to spend a lot of money to build complex and expensive test systems and instruments, such as near-field measurement systems or Over-the-Air (OTA) measurement systems.

不過一旦在輸入多輸出(MIMO)天線陣列系統於天線基地(例如軍事用的雷達基地或無線通訊系統之Base-Station)佈置完成後,如有些傳送/接收(T/R)模組故障或是訊號相位及振幅設定不正確的話,該如何執行重新校正天線單元的振幅和相位是一個非常重要的問題,因為、吾人無法在陣地上建立複雜且昂貴的近場量 測系統或Over-the-Air(OTA)量測系統。因此、必須開發一種簡易天線自校系統。此系統可以檢測失效之天線單元,並於陣地及時抽換更新,以維護MIMO天線系統得以正常工作。 However, once the input multiple output (MIMO) antenna array system is deployed at the antenna base (such as a military radar base or a base station of a wireless communication system), if some transmission/reception (T/R) modules fail or If the signal phase and amplitude settings are incorrect, how to perform re-correction of the amplitude and phase of the antenna unit is a very important issue because we cannot build complicated and expensive near-field quantities on the ground. Measurement system or Over-the-Air (OTA) measurement system. Therefore, a simple antenna self-calibration system must be developed. This system can detect the failed antenna unit and update it in time to maintain the MIMO antenna system to work properly.

請參考圖1,圖1是線性天線陣列和參考天線的自校系統模組之示意圖。自校系統模組1是由一個多輸入多輸出(MIMO)線性天線陣列40(由等距且相同的天線單元所構成)和一個參考天線400所組成的。在每個天線單元的後面放置一個模塊,其可以影響接收訊號的振幅和相位。經過實驗,振幅和相位往往只在離散步驟中改變。此接收訊號在陣列天線上的輸出是由於從ξ方向到達平面波。公式如下所示 Please refer to FIG. 1. FIG. 1 is a schematic diagram of a self-calibration system module of a linear antenna array and a reference antenna. The self-calibration system module 1 is composed of a multiple input multiple output (MIMO) linear antenna array 40 (consisting of equidistant and identical antenna elements) and a reference antenna 400. A module is placed behind each antenna element that can affect the amplitude and phase of the received signal. Through experimentation, amplitude and phase often change only in discrete steps. The output of this received signal on the array antenna is due to the arrival of plane waves from the ξ direction. The formula is as follows

其中S e (θ)=天線單元之場型分布函數 Where S e ( θ )=the field distribution function of the antenna element

d=相鄰的天線單元之間的間距 d = spacing between adjacent antenna elements

λ=自由空間中的波長 λ = wavelength in free space

ξ=陣列到平面波的方向 ξ = array to plane wave direction

=模塊m的複數激發係數 = complex excitation coefficient of module m

為了方便計算,將陣列到平面波方向ξ=0,則(1)可簡化為 In order to facilitate the calculation, the array to plane wave direction ξ = 0, then (1) can be simplified to

請參照圖2,圖2A及圖2B是傳統Van Hezewijk的單元激發方法(Element Excitations Method,EEM)之示意圖。此設計方案(Van Hezewijk,J.G.Fast Determination of the Element Excitation of an Active Phased Array Antenna,IEEE AP-S conf.,vol.3,pp.1478-1481,24-28 Jun,(1991)),具有精準度不佳之問題。以3-bits相移器為例,S 0,…,S 7表示為在參考天線上由相位設定0,...,7所測量的複雜訊號。圖2A顯示當相互耦合忽略不計以及待測試的單元(element under test)的振幅是不受相位設定影響的情況下,測得的訊號位 於圓上。圖2B是更實際的例子,由於非理想相移器(振幅隨相位狀態而變化)所測得的訊號並不會剛好在圓上,所以使用最小均分誤差算法來計算所測得的訊號SiPlease refer to FIG. 2. FIG. 2A and FIG. 2B are schematic diagrams of a conventional Van Hezewijk Element Excitations Method (EEM). This design (Van Hezewijk, JGFast Determination of the Element Excitation of an Active Phased Array Antenna, IEEE AP-S conf., vol. 3, pp. 1478-1481, 24-28 Jun, (1991)), with accuracy Bad question. Taking a 3-bits phase shifter as an example, S 0 ,..., S 7 are represented as complex signals measured by phase settings 0,...,7 on the reference antenna. Figure 2A shows that when the mutual coupling is negligible and the amplitude of the element under test is unaffected by the phase setting, the measured signal is on the circle. Figure 2B is a more practical example. Since the signal measured by the non-ideal phase shifter (the amplitude varies with the phase state) is not exactly on the circle, the minimum mean error algorithm is used to calculate the measured signal S. i .

有鑑於此,本發明提供一種用於一多輸入多輸出(MIMO)天線陣列之遠場調校系統(phase rotation method,PRM)。此方法使用了參考天線所提供的參考訊號以做校正,並利用測試天線模組來量測近遠場範圍內的訊號。 In view of this, the present invention provides a phase rotation method (PRM) for a multiple input multiple output (MIMO) antenna array. This method uses the reference signal provided by the reference antenna for calibration and uses the test antenna module to measure the signal in the near-far range.

本發明提供一種天線系統的遠場調校系統,包括多輸入多輸出(MIMO)主動相列性天線陣列及一個(或數個)參考天線。基本上、陣列天線係由一組波束形成器、及M組天線單元模組所組成。選定M組天線單元模組其中之一天線單元,為待測天線單元(AUT),並且所述參考天線用以產生標準輻射場型。本發明之天線系統的遠場調校系統尚包括測試天線模組,與該多輸入多輸出主動相列性天線陣列設置於同一平面,用以量測所述天線單元之輻射場型;並且所述參考天線耦接於一模塊,該模塊包括放大器和相移器;天線系統的遠場調校系統更包括金屬反射面,平行設置於所述平面之法向量延伸方向上,用以反射待測天線單元(AUT)與該參考天線之電波訊號並且,除了待測天線單元(AUT)及參考天線之外的每一個天線單元分別耦接於一虛擬負載(Dummy Load);所述待測天線單元(AUT)的激發係數是依據待測天線單元(AUT)的輻射場型而被調整,以使待測天線單元(AUT)的輻射場型符合標準輻射場型;其中,所述激發係數包括一振幅係數和一相位係數,所述激發係數可藉由功率量測器量測之功率係數、參考天線振幅係數(A1)、參考天線相位係數(ψ r (j))及S參數模擬的遠場近似值而被調校。 The present invention provides a far field calibration system for an antenna system comprising a multiple input multiple output (MIMO) active phased antenna array and one (or several) reference antennas. Basically, the array antenna is composed of a group of beam formers and M groups of antenna unit modules. One of the M antenna element modules is selected as an antenna unit to be tested (AUT), and the reference antenna is used to generate a standard radiation pattern. The far field calibration system of the antenna system of the present invention further includes a test antenna module, and the multi-input multi-output active phase antenna array is disposed on the same plane for measuring a radiation field type of the antenna unit; The reference antenna is coupled to a module, the module includes an amplifier and a phase shifter; the far-field calibration system of the antenna system further includes a metal reflective surface disposed in parallel with the normal vector extending direction of the plane for reflecting The antenna signal of the antenna unit (AUT) and the reference antenna and each antenna unit except the antenna unit (AUT) and the reference antenna are respectively coupled to a dummy load; the antenna unit to be tested The excitation coefficient of the (AUT) is adjusted according to the radiation pattern of the antenna unit (AUT) to be tested, so that the radiation pattern of the antenna unit (AUT) to be tested conforms to the standard radiation pattern; wherein the excitation coefficient includes one An amplitude coefficient and a phase coefficient, the excitation coefficient can be measured by a power meter, a reference antenna amplitude coefficient (A1), a reference antenna phase coefficient ( ψ r ( j )), and an S-parameter simulated far field The approximation is adjusted.

綜上所述,本發明所提供之天線系統的遠場調校系統,可藉 由一個一個地調校天線陣列上的每一個天線單元的激發係數來優化輻射場型。多輸入多輸出(MIMO)天線陣列系統裝置於天線基地後,如果有天線單元之主動元件因老化或其他原因失效時,運回研發單位維修極為困難。因此本發明所提供之天線系統的遠場調校系統可以檢測失效之天線單元,並於天線基地及時抽換更新,同時此自校系統能於天線基地從事簡易天線系統校正,以維護多輸入多輸出(MIMO)天線陣列系統得以正常工作。 In summary, the far field calibration system of the antenna system provided by the present invention can be borrowed The radiation pattern is optimized by adjusting the excitation coefficients of each antenna element on the antenna array one by one. After the multi-input multi-output (MIMO) antenna array system is installed in the antenna base, if the active components of the antenna unit fail due to aging or other reasons, it is extremely difficult to transport it back to the R&D unit for maintenance. Therefore, the far field calibration system of the antenna system provided by the present invention can detect the failed antenna unit and timely update and update the antenna base, and the self-calibration system can perform simple antenna system correction at the antenna base to maintain multiple inputs. The output (MIMO) antenna array system is working properly.

另一方面,本發明更透過金屬反射面強化天線輻射訊號強度,使得天線測試的耦合訊號強度提升,且不須將測試模組設置於陣列天線的正前方。因此,天線系統得以實現以單一平面自校正之方式,大幅簡化系統設系困難度。 On the other hand, the present invention further enhances the intensity of the antenna radiation signal through the metal reflecting surface, so that the strength of the coupled signal of the antenna test is improved, and the test module does not need to be disposed directly in front of the array antenna. Therefore, the antenna system can achieve a single plane self-correction method, which greatly simplifies the system design difficulty.

為使能更進一步瞭解本發明之特徵及技術內容,請參閱以下有關本發明之詳細說明與附圖,但是此等說明與所附圖式僅係用來說明本發明,而非對本發明的權利範圍作任何的限制。 The detailed description of the present invention and the accompanying drawings are to be understood by the claims The scope is subject to any restrictions.

1‧‧‧自校系統模組 1‧‧‧Self-school system module

4‧‧‧天線系統的遠場調校系統 4‧‧‧ Far field calibration system for antenna systems

40‧‧‧主動相列線性天線陣列 40‧‧‧Active phased linear antenna array

41‧‧‧測試天線模組 41‧‧‧Test antenna module

400‧‧‧參考天線 400‧‧‧reference antenna

401‧‧‧待測天線單元 401‧‧‧ antenna unit to be tested

402‧‧‧天線單元 402‧‧‧Antenna unit

405‧‧‧金屬反射面 405‧‧‧Metal reflective surface

411‧‧‧功率量測器 411‧‧‧Power measuring device

4000‧‧‧放大器 4000‧‧‧Amplifier

4001‧‧‧相移器 4001‧‧‧ phase shifter

4020‧‧‧虛擬負載 4020‧‧‧Virtual load

A‧‧‧平面 A‧‧‧ plane

圖1是線性天線陣列和參考天線的自校系統模組之示意圖。 1 is a schematic diagram of a self-calibration system module of a linear antenna array and a reference antenna.

圖2A及圖2B是傳統Van Hezewijk的單元激發方法(Element Excitations Method,EEM)之示意圖。 2A and 2B are schematic diagrams of a conventional Van Hezewijk Element Excitations Method (EEM).

圖3是本發明實施例運用相位旋轉(Phase rotation method,PRM)的示意圖。 3 is a schematic diagram of the use of Phase Rotation (PRM) in an embodiment of the present invention.

圖4A是本發明實施例天線系統的遠場調校系統的示意圖。 4A is a schematic diagram of a far field calibration system of an antenna system according to an embodiment of the present invention.

圖4B是本發明實施例使用S參數方式(S-parameters method)來表示天線之間電磁場的相互作用的等效模型圖。 4B is an equivalent model diagram showing the interaction of electromagnetic fields between antennas using an S-parameters method in accordance with an embodiment of the present invention.

圖5是本發明實施例S參數(S-parameters)模擬架構示意圖。 FIG. 5 is a schematic diagram of an S-parameters simulation architecture according to an embodiment of the present invention.

圖6為本發明實施例運用GEMS EM模擬軟體的模擬結果示意圖。 FIG. 6 is a schematic diagram showing simulation results of using GEMS EM simulation software according to an embodiment of the present invention.

圖7A及圖7B是本發明實施例運用GEMS EM模擬軟體(C201) 和使用遠場近似值模擬(C202)的比較圖。 7A and 7B are diagrams showing the use of GEMS EM simulation software (C201) according to an embodiment of the present invention. A comparison chart with far field approximation simulation (C202).

圖8為本發明實施例待測天線單元和參考天線的模擬場型比較示意圖。 FIG. 8 is a schematic diagram of a comparison of analog field types of an antenna unit to be tested and a reference antenna according to an embodiment of the present invention.

圖9為本發明實施例天線系統的遠場調校系統的步驟流程圖。 9 is a flow chart showing the steps of a far field calibration system of an antenna system according to an embodiment of the present invention.

圖10A及圖10B為本發明實施例1000個樣本的測試結果示意圖。 10A and 10B are schematic diagrams showing test results of 1000 samples according to an embodiment of the present invention.

在下文將參看隨附圖式更充分地描述各種例示性實施例,在隨附圖式中展示一些例示性實施例。然而,本發明概念可能以許多不同形式來體現,且不應解釋為限於本文中所闡述之例示性實施例。確切而言,提供此等例示性實施例使得本發明將為詳盡且完整,且將向熟習此項技術者充分傳達本發明概念的範疇。在諸圖式中,可為了清楚而誇示層及區之大小及相對大小。類似數字始終指示類似元件。 Various illustrative embodiments are described more fully hereinafter with reference to the accompanying drawings. However, the inventive concept may be embodied in many different forms and should not be construed as being limited to the illustrative embodiments set forth herein. Rather, these exemplary embodiments are provided so that this invention will be in the In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Similar numbers always indicate similar components.

應理解,雖然本文中可能使用術語第一、第二、第三等來描述各種元件,但此等元件不應受此等術語限制。此等術語乃用以區分一元件與另一元件。因此,下文論述之第一元件可稱為第二元件而不偏離本發明概念之教示。如本文中所使用,術語「及/或」包括相關聯之列出項目中之任一者及一或多者之所有組合。 It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, such elements are not limited by the terms. These terms are used to distinguish one element from another. Thus, a first element discussed below could be termed a second element without departing from the teachings of the inventive concept. As used herein, the term "and/or" includes any of the associated listed items and all combinations of one or more.

〔天線系統的遠場調校系統的實施例〕 [Embodiment of Far Field Calibration System for Antenna System]

在介紹本發明之實施例以前,請參照圖3,圖3是本發明實施例運用相位旋轉(Phase rotation method,PRM)的示意圖。假設一個模塊(i)的相位設定是變化的,而其它的天線單元的振幅和相位設定是固定的話,則接收訊號將會是 Before introducing an embodiment of the present invention, please refer to FIG. 3. FIG. 3 is a schematic diagram of a phase rotation method (PRM) according to an embodiment of the present invention. Assuming that the phase setting of one module (i) is changed, and the amplitude and phase settings of other antenna elements are fixed, the received signal will be

在(3)的右式,首項對S(θ)來說是常數,而最後項則取決於變數ψ i 。所以在模塊(i)上單一天線單元激發的場型,是由最後項決定,其關係式寫為 In the right form of (3), the first term is constant for S(θ), and the last term depends on the variable ψ i . Therefore, the field type excited by a single antenna element on module (i) is determined by the last term, and the relationship is written as

如圖3所示,以3-bits相移器為例,E r (1),…,E r (8)表示為在參考天線上由相位設定1,...,8所測量的複雜訊號。如果相互耦合忽略不計以及待測單元(the element under test)(Ei)的振幅是不受相位設定影響的情況下,將有源模塊的訊號(Ei)與參考天線產生的訊號(Er)結合起來,則在遠場範圍內所測量的訊號可以表示為,Ei和以圓心C為中心旋轉的訊號(Er(j),表第j個相位狀態),此兩者的向量和。在近遠場範圍內結合Er(j)和Ei,當ψ r (j)和ψ i 同相/反相時,可以得到最大/最小測量功率。不過由於相移器之相位量化的關係,其間存在相位誤差ε。 As shown in Figure 3, taking a 3-bits phase shifter as an example, E r (1),..., E r (8) are represented as complex signals measured by phase settings 1, ..., 8 on the reference antenna. . If the mutual coupling is negligible and the amplitude of the element under test (E i ) is unaffected by the phase setting, the signal of the active module (E i ) and the signal generated by the reference antenna (E r ) When combined, the signal measured in the far field range can be expressed as E i and the signal centered on the center C (E r (j), the jth phase state of the table), the vector sum of the two . Combining E r (j) and E i in the near-far field range, when ψ r ( j ) and ψ i are in phase/inverted, the maximum/minimum measured power can be obtained. However, due to the phase quantization of the phase shifter, there is a phase error ε between them.

因此,經過適當地校正程序,有源模塊(i)的振幅和相位可以經由調校計算。再一個接一個地求得天線陣列上的每一個有源天線單元的激發係數,以獲得最佳的陣列輻射場型。為了讓校正的精準度越高,Er(圓心C對點之向量)訊號大小要能與Ei(原點座標對圓心C之向量)訊號大小比較。 Thus, with proper calibration procedures, the amplitude and phase of the active module (i) can be calculated via tuning. The excitation coefficients of each of the active antenna elements on the antenna array are determined one after another to obtain an optimum array radiation pattern. In order to make the accuracy of the correction higher, the E r (center of the center C) signal can be compared with the signal size of E i (the origin coordinate to the vector of the center C).

請參考圖4A,圖4A是本發明實施例天線系統的遠場調校系統的示意圖。本實施例之天線系統的遠場調校系包括了多輸入多輸出(MIMO)主動性天線陣列40,所述多輸入多輸出(MIMO)主動性天線陣列(40)包括M個等距(d)天線單元400、401、402,所述天線單元的其中之一為待測天線單元(AUT)401,所述天線單元的其中之一為參考天線400,參考天線用以產生一標準輻射場型以做校正之用。所述多輸入多輸出(MIMO)主動性天線陣列40還包括測試天線模組41來量測近遠場範圍內的訊號,且測試天線模組41與多輸入多輸出主動性天線陣列40設置於同一平面A。另外,天線系統的遠場調校系統4設置金屬反射面405於平面A的法向量 延伸方向上,並且平行於所述平面A。金屬反射面405用以反射待測天線單元401與參考天線400之電波訊號。其中測試天線模組41設置於多輸入多輸出主動相列性天線陣列40的邊緣,使在天線測試系統的機構設計上有較簡便之方式。然而在其他實施例中,亦可將測試天線模組41設置於主動相列性天線陣列40之中,本發明並不以此做為限制。 Please refer to FIG. 4A. FIG. 4A is a schematic diagram of a far field calibration system of an antenna system according to an embodiment of the present invention. The far field calibration system of the antenna system of the present embodiment includes a multiple input multiple output (MIMO) active antenna array 40, and the multiple input multiple output (MIMO) active antenna array (40) includes M equal distances (d Antenna unit 400, 401, 402, one of the antenna units is an antenna unit (AUT) 401 to be tested, one of the antenna units is a reference antenna 400, and the reference antenna is used to generate a standard radiation field type For correction purposes. The multiple input multiple output (MIMO) active antenna array 40 further includes a test antenna module 41 for measuring signals in a near far field range, and the test antenna module 41 and the multiple input multiple output active antenna array 40 are disposed on The same plane A. In addition, the far field calibration system 4 of the antenna system sets the normal vector of the metal reflecting surface 405 to the plane A. Extending direction and parallel to the plane A. The metal reflecting surface 405 is configured to reflect the electric wave signal of the antenna unit 401 to be tested and the reference antenna 400. The test antenna module 41 is disposed at the edge of the multi-input and multi-output active phase antenna array 40, so that the mechanism design of the antenna test system is relatively simple. However, in other embodiments, the test antenna module 41 can also be disposed in the active phase antenna array 40, and the invention is not limited thereto.

當執行量測時,所有的天線單元皆與虛擬負載4020連接,除了待測天線單元(Antenna under test,AUT)401。參考天線400耦接於一模塊,所述模塊是由一個放大器4000(將訊號放大到指定值a r )和一個相移器4001(控制參考天線訊號ψ r (j),j=1,...,8,以3-bits相移器為例)所組成。訊號源透過放大器4000和相移器4001將訊號傳送至待測天線單元401,待測天線單元401被激發之振幅/相位(a 1/ψ 1)對遠場量測而言是待調校未知數據。並且所述待測天線單元401的激發係數是依據待測天線單元401的輻射場型而被調整,以使待測天線單元401的輻射場型近似標準輻射場型。並且,所述激發係數之振幅係數和相位係數可藉由功率量測器(Power meter)411量測之功率係數、參考天線振幅係數(A2)、參考天線相位係數(ψ r (j))及S參數模擬的遠場近似值而被調校。 When performing the measurement, all the antenna elements are connected to the virtual load 4020 except for the Antenna under test (AUT) 401. The reference antenna 400 is coupled to a module which is composed of an amplifier 4000 (amplifying the signal to a specified value a r ) and a phase shifter 4001 (controlling the reference antenna signal ψ r ( j ), j=1, .. ., 8, with a 3-bits phase shifter as an example). The signal source transmits the signal to the antenna unit 401 to be tested through the amplifier 4000 and the phase shifter 4001, and the amplitude/phase ( a 1 / ψ 1 ) of the antenna unit 401 to be tested is unknown to the far field measurement. data. The excitation coefficient of the antenna unit 401 to be tested is adjusted according to the radiation pattern of the antenna unit 401 to be tested, so that the radiation field of the antenna unit 401 to be tested approximates the standard radiation pattern. And, the amplitude coefficient and the phase coefficient of the excitation coefficient can be measured by a power meter 411, a reference antenna amplitude coefficient (A 2 ), and a reference antenna phase coefficient ( ψ r ( j )). And the far field approximation of the S parameter simulation is adjusted.

圖4B是本發明實施例使用S參數方式(S-parameters method)來表示天線之間電磁場的相互耦合作用的等效模型圖。透過執行驅動的多處理模擬器(General execution-driven multiprocessor simulator,GEMS EM)所得的數值模擬驗證來介紹相位旋轉方法(Phase Rotation Method)。假設所有天線都良好的匹配(S11=S22=S33=0),且相互耦合作用影響可以忽略不計。如圖4B所示,測試天線模組41的量測場型(b3)位於(xo,yo,zo),可表示為 4B is an equivalent model diagram showing the mutual coupling action of electromagnetic fields between antennas using the S-parameters method in the embodiment of the present invention. The phase rotation method (Phase Rotation Method) is introduced by numerical simulation verification obtained by a general execution-driven multiprocessor simulator (GEMS EM). Assume that all antennas are well matched (S 11 = S 22 = S 33 =0) and the effects of mutual coupling are negligible. As shown in FIG. 4B, the measurement field type (b 3 ) of the test antenna module 41 is located at (x o , y o , z o ), which can be expressed as

以及b 3'(j)=A 1+A 2 e (j) (5.b) And b 3 '( j )= A 1 + A 2 e ( j ) (5.b)

其中,A1=a r |S 31| Wherein, A 1 = a r | S 31 |

A 2=a i |S 32| A 2 = a i | S 32 |

δ(j)=ψ i -ψ r (j)+∠S 32-∠S 31 δ ( j )= ψ i - ψ r ( j )+∠ S 32 -∠ S 31

b3=測試天線模組41上的接收訊號(或是反射電壓波) b 3 = test the received signal on the antenna module 41 (or reflected voltage wave)

S31=參考天線400/測試天線模組41上的入射/反射電壓波之散射參數 S 31 = scattering parameter of the incident/reflected voltage wave on the reference antenna 400 / test antenna module 41

S32=待測天線單元401/測試天線模組41上的入射/反射電壓波之散射參數 S 32 = scattering parameter of the incident/reflective voltage wave on the antenna unit 401/test antenna module 41 to be tested

在圖4A中,可以注意到參考天線400在每一個相位狀態(j)的振幅(A2)和相位(ψ r '(j)),可以在系統展開前預先校正和儲存可程式唯讀記憶體(PROM)修正量。在參考天線400上,3-bits相移器的相位狀態(j),可得最大值和最小值,則b3’表示為b 3' Max =A 1+A 2 ejε b 3' Min =A 1-A 2 e (6) In FIG. 4A, the amplitude (A 2 ) and phase ( ψ r '( j )) of the reference antenna 400 at each phase state (j) can be noted, and the programmable read only memory can be pre-corrected and stored before the system is deployed. Body (PROM) correction amount. On the reference antenna 400, the phase state (j) of the 3-bits phase shifter can obtain the maximum value and the minimum value, and b 3 ' is expressed as b 3 ' Max = A 1 + A 2 ejε b 3 ' Min = A 1 - A 2 e (6)

經由混合電路(hybrid circuit)可知,當系統阻抗R=1時,最大/最小功率值為 According to the hybrid circuit, when the system impedance R=1, the maximum/minimum power value is

如圖4A所示,(PMax,P Min )稱為功率係數,其中PMax為最大餘弦 功率值、PMin為最小餘弦功率值。 As shown in FIG. 4A, (P Max , P Min ) is called a power coefficient, where P Max is the maximum cosine power value and P Min is the minimum cosine power value.

由(7)可推得在待測天線單元(AUT)401上激發係數的振幅為 From (7), the amplitude of the excitation coefficient on the antenna unit (AUT) 401 to be tested can be derived as

同理,在待測天線單元(AUT)401上激發係數的相位也可推得ψ i =ε+ψ r (j)-(∠S 32-∠S 31) (9.a) Similarly, the phase of the excitation coefficient on the antenna unit (AUT) 401 to be tested can also be derived ψ i = ε + ψ r ( j ) - (∠ S 32 - ∠ S 31 ) (9.a)

在(8)和(9)式中,功率係數(PMax,P Min )、arψ r '(j)為預先儲存於修正可程式唯讀記憶體(Correction PROM)。但是因為S參數(S-parameters)量測需要同調測試(coherent test mode),所以|S32|(待測天線單元(AUT)401的振幅)和∠S 31-∠S 32(待測天線單元(AUT)401與參考天線400的量測相位差)難以得知。故在本文中,應用GO計算法與遠場近似值法(Far-field approximation)以模擬相關S參數(S-parameter)如下: In equations (8) and (9), the power coefficients (P Max , P Min ), a r , and ψ r '( j ) are stored in advance in a modified programmable read only memory (Correction PROM). However, since the S-parameters measurement requires a coherent test mode, |S 32 | (the amplitude of the antenna unit (AUT) 401 to be tested) and ∠ S 31 -∠ S 32 (the antenna unit to be tested) The measurement phase difference between the (AUT) 401 and the reference antenna 400 is difficult to know. Therefore, in this paper, the GO calculation method and the Far-field approximation method are applied to simulate the relevant S-parameters as follows:

其中, 以及 among them, as well as

其中為第i位元天線發射時測試天線之量測場型;為參考天線發射時測試天線之量測場型。 among them Measuring the field type of the antenna when transmitting the i-th antenna; The measurement field type of the test antenna for the reference antenna transmission.

將(10.b)/(10.c)和(7)式代入(8)/(9)式,可得在待測天線單元(AUT)401上激發係數的振幅係數a1和相位係數ψ1。因此,依據設計規格,在主動相列線性天線陣列40上的每一個天線單元402的激發係數,可藉由一個一個地調校來優化輻射場型。 Substituting (10.b)/(10.c) and (7) into equations (8)/(9), the amplitude coefficient a 1 and the phase coefficient of the excitation coefficient on the antenna unit (AUT) 401 to be tested are obtained. 1 . Thus, depending on the design specifications, the excitation coefficients of each of the antenna elements 402 on the active phased linear antenna array 40 can be optimized by adjusting one by one.

接著介紹運用GEMS EM模擬軟體來驗證PRM法。圖5是本發明實施例S參數(S-parameters)模擬架構示意圖。由兩個天線組成的陣列,且結合一個沿z軸方向、距離待測天線單元401有400毫米(mm)遠的金屬反射面405。本實施例中所有的天線單元皆是形成於FR4基板,且FR4基板厚度為1.6毫米(mm)。圖6為本發明實施例運用GEMS EM模擬軟體的模擬結果示意圖。在頻率2.35~2.37GHz之間,反射損耗和隔離度皆低於-10dB,其中反射損耗為20log10(|S33|),而隔離度即為20log10(|S12|)。其模擬結果良好,適合數值驗證。由於所有諧振天線在共振頻率的頻率響應都大致相同,因此天線如共振在其他頻率時,同樣地本方法運用到其他頻率一樣有效。 Next, we will use the GEMS EM simulation software to verify the PRM method. FIG. 5 is a schematic diagram of an S-parameters simulation architecture according to an embodiment of the present invention. An array of two antennas combined with a metal reflecting surface 405 having a distance of 400 millimeters (mm) from the antenna unit 401 to be tested in the z-axis direction. All of the antenna elements in this embodiment are formed on the FR4 substrate, and the FR4 substrate has a thickness of 1.6 millimeters (mm). FIG. 6 is a schematic diagram showing simulation results of using GEMS EM simulation software according to an embodiment of the present invention. At frequencies between 2.35 and 2.37 GHz, the reflection loss and isolation are below -10 dB, with a reflection loss of 20 log 10 (|S 33 |) and an isolation of 20 log 10 (|S 12 |). The simulation results are good and suitable for numerical verification. Since all resonant antennas have approximately the same frequency response at the resonant frequency, the antenna is equally effective as other frequencies when the antenna is resonant at other frequencies.

接著,利用遠場近似值來模擬|S31|(向前傳輸增益的幅度)和∠S 32-∠S 31(待測天線單元(AUT)與參考天線的相位差)。圖7A及圖7B是本發明實施例運用GEMS EM模擬軟體(C201)和使用遠場近似值模擬(C202)的比較圖。其比較結果良好,繼續作進一步分析。 Next, the far field approximation is used to simulate |S 31 | (the amplitude of the forward transmission gain) and ∠ S 32 -∠ S 31 (the phase difference between the antenna unit to be tested (AUT) and the reference antenna). 7A and 7B are comparison diagrams of the GEMS EM simulation software (C201) and the far field approximation simulation (C202) according to an embodiment of the present invention. The comparison results are good and continue to be further analyzed.

圖8為本發明實施例待測天線單元和參考天線的模擬場型比較示意圖。如圖8所示,為了補償|S31|在非遠場方向(off-boresight direction)之幅度,讓天線單元場型S e (θ)=cos(θ),且比較待測天線單元(AUT)和參考天線(reference antenna)的模擬場型,其結果在非遠 場角度從0至60度(off-boresight angle from 0 to 60 degrees)是在可接受範圍內。 FIG. 8 is a schematic diagram of a comparison of analog field types of an antenna unit to be tested and a reference antenna according to an embodiment of the present invention. As shown in FIG. 8, in order to compensate the amplitude of |S 31 | in the off-boresight direction, let the antenna unit field type S e ( θ )=cos( θ ), and compare the antenna unit to be tested (AUT) And the analog field of the reference antenna, the result is within an acceptable range from 0 to 60 degrees in the non-far field angle.

請參閱圖10,圖10為1000個樣本的測試結果示意圖。最後,將遠場近似值的結果套用到(8)、(9)式以調校在待測天線單元上的振幅(a1)和相位(ψ1)的激發係數。為了保證參考天線上有足夠的訊號強度和相角分辨率以作檢測,在此研究中給參考天線設置了一個30dBm放大器及一個5-bits相移器。然後依照校準程序,逐次地一個個地調校待測天線單元的激發係數,以驗證本發明之天線系統的遠場調校系統。圖10為本發明實施例1000個樣本的測試結果示意圖。數值呈現在本發明之遠場近似方法和精準值之間的相位/幅度誤差的平均值為1.39°/-0.44dB。 Please refer to FIG. 10, which is a schematic diagram of test results of 1000 samples. Finally, the results of the far-field approximation are applied to equations (8) and (9) to adjust the excitation coefficients of amplitude (a1) and phase (ψ 1 ) on the antenna element to be tested. In order to ensure sufficient signal strength and phase angle resolution on the reference antenna for detection, a 30 dBm amplifier and a 5-bit phase shifter were placed in the reference antenna in this study. Then, according to the calibration procedure, the excitation coefficients of the antenna unit to be tested are sequentially adjusted one by one to verify the far field calibration system of the antenna system of the present invention. FIG. 10 is a schematic diagram showing test results of 1000 samples according to an embodiment of the present invention. The numerical value shows that the average value of the phase/amplitude error between the far field approximation method and the precision value of the present invention is 1.39 ° / -0.44 dB.

請同時參閱第4圖和第9圖。圖9為本發明實施例天線系統的遠場調校系統的步驟流程圖。 Please also refer to Figures 4 and 9. 9 is a flow chart showing the steps of a far field calibration system of an antenna system according to an embodiment of the present invention.

首先,選擇該些天線單元的其中之一為待測天線單元(步驟S901);其後,計算該待測天線單元之振幅係數及該參考天線和待測天線單元之量測相位差(步驟S903);調整該待測天線單元之振幅係數及相位係數(步驟S905);經由步驟S901至步驟S905,該些天線單元中的其中一個已被調校完,此時可以重複上述步驟S901至S905,使該些天線單元中的每一個均被調校完。 First, one of the antenna units is selected as the antenna unit to be tested (step S901); thereafter, the amplitude coefficient of the antenna unit to be tested and the measured phase difference between the reference antenna and the antenna unit to be tested are calculated (step S903) Adjusting the amplitude coefficient and the phase coefficient of the antenna unit to be tested (step S905); and performing one of the antenna units has been adjusted through steps S901 to S905, and the above steps S901 to S905 may be repeated. Each of the antenna elements is tuned.

以上所述僅為本發明之實施例,其並非用以侷限本發明之專利範圍。 The above description is only an embodiment of the present invention, and is not intended to limit the scope of the invention.

4‧‧‧天線系統的遠場調校系統 4‧‧‧ Far field calibration system for antenna systems

40‧‧‧主動線性天線陣列 40‧‧‧Active Linear Antenna Array

41‧‧‧測試天線模組 41‧‧‧Test antenna module

400‧‧‧參考天線 400‧‧‧reference antenna

401‧‧‧待測天線單元(AUT) 401‧‧‧Antenna unit to be tested (AUT)

402‧‧‧天線單元 402‧‧‧Antenna unit

405‧‧‧金屬反射板 405‧‧‧Metal reflector

411‧‧‧功率量測器 411‧‧‧Power measuring device

4000‧‧‧放大器 4000‧‧‧Amplifier

4001‧‧‧相移器 4001‧‧‧ phase shifter

4020‧‧‧虛擬負載 4020‧‧‧Virtual load

A‧‧‧平面 A‧‧‧ plane

Claims (10)

一種天線系統的遠場調校系統,包括:一多輸入多輸出(MIMO)主動相列性天線陣列,包括複數個天線單元,該些天線單元的其中之一為一待測天線單元(AUT),該些天線單元的其中之一為一參考天線,該參考天線用以產生一標準輻射場型;以及一測試天線模組,與該多輸入多輸出主動相列性天線陣列設置於同一平面,用以量測該些天線單元之輻射場型;一金屬反射面,平行設置於該平面之法向量延伸方向上,用以反射該待測天線單元(AUT)與該參考天線之一電波訊號;其中,該參考天線耦接於一模塊,該模塊包括一放大器和一相移器;其中,除了該待測天線單元(AUT)及該參考天線之外的每一個該天線單元分別耦接於一虛擬負載;其中,該待測天線單元(AUT)的激發係數是依據該待測天線單元(AUT)的輻射場型而被調整,以使該待測天線單元(AUT)的輻射場型符合該標準輻射場型;其中,該激發係數包括一振幅係數和一相位係數,該激發係數可藉由一功率係數、一參考天線振幅係數(Ar)、一參考天線相位係數(ψ r (j))及一S參數模擬的遠場近似值而被調校。 A far field calibration system for an antenna system, comprising: a multiple input multiple output (MIMO) active phased antenna array, comprising a plurality of antenna elements, one of the antenna elements being an antenna unit to be tested (AUT) One of the antenna units is a reference antenna for generating a standard radiation field type, and a test antenna module is disposed on the same plane as the multiple input and multiple output active phase antenna array. The method for measuring the radiation field of the antenna elements; a metal reflecting surface disposed in parallel with the normal vector extending direction of the plane for reflecting a signal of the antenna to be tested (AUT) and the reference antenna; The reference antenna is coupled to a module, and the module includes an amplifier and a phase shifter. Each of the antenna units except the antenna unit (AUT) and the reference antenna are respectively coupled to the antenna unit. a virtual load; wherein an excitation coefficient of the antenna unit to be tested (AUT) is adjusted according to a radiation field type of the antenna unit (AUT) to be tested, so that a radiation field type of the antenna unit (AUT) to be tested conforms to the Quasi radiation pattern; wherein the excitation coefficients include a coefficient of a phase and amplitude coefficients, the coefficients may be excited by a power factor, a reference amplitude coefficient of the antenna (A r), a reference antenna phase coefficients r (j) ) and the far field approximation of an S-parameter simulation is adjusted. 如申請專利範圍第1項所述之天線系統的遠場調校系統,其中該參考天線的該振幅係數(Ar)及該相位係數(ψ r (j))在系統展開前預先校正和儲存可程式唯讀記憶體(PROM)修正量。 The far field calibration system of the antenna system according to claim 1, wherein the amplitude coefficient (A r ) of the reference antenna and the phase coefficient ( ψ r ( j )) are pre-corrected and stored before the system is deployed. Programmable read-only memory (PROM) correction. 如申請專利範圍第1項所述之天線系統的遠場調校系統,其中該功率係數,包括一最大餘弦功率值(P Max )或一最小餘弦功率值(P Min )。 The far field calibration system of the antenna system of claim 1, wherein the power coefficient comprises a maximum cosine power value (P Max ) or a minimum cosine power value (P Min ). 如申請專利範圍第3項所述之天線系統的遠場調校系統,其中該功率係數包括的該待測天線單元(AUT)之該振幅係數為(|S32|)以 及該參考天線和測試中天線單元(AUT)之一量測相位差(∠S 31-∠S 32)。 The far field calibration system of the antenna system according to claim 3, wherein the power coefficient includes the amplitude coefficient of the antenna unit (AUT) to be tested (|S 32 |) and the reference antenna and the test One of the middle antenna units (AUT) measures the phase difference (∠ S 31 -∠ S 32 ). 如申請專利範圍第4項所述之天線系統的遠場調校系統,其中該待測天線單元(AUT)之該激發係數之振幅(A1)是以下式子而得到 The far field calibration system of the antenna system according to claim 4, wherein the amplitude (A 1 ) of the excitation coefficient of the antenna unit (AUT) to be tested is obtained by the following formula 如申請專利範圍第4項所述之天線系統的遠場調校系統,其中該待測天線單元(AUT)之該激發係數之相位(ψ1)是以下式子而得到ψ i =ε+ψ r (j)-(∠S 32-∠S 31)、 其中,A 2為該測試天線接收來自該測試中天線單元發射訊號之振幅,ψ r (j)為該參考天線發射訊號在該相移器狀態為j時之相位,其中,j為整數。 The far field calibration system of the antenna system according to claim 4, wherein the phase (ψ 1 ) of the excitation coefficient of the antenna unit (AUT) to be tested is obtained by the following expression: ψ i = ε + ψ r ( j )-(∠ S 32 -∠ S 31 ), Wherein A 2 is the amplitude of the test antenna receiving the signal transmitted from the antenna unit in the test, and ψ r ( j ) is the phase of the reference antenna transmit signal when the phase shifter state is j, where j is an integer. 如申請專利範圍第4項所述之天線系統的遠場調校系統,其中該待測天線單元(AUT)之該振幅係數(|S32|)及該參考天線和測試中天線單元(AUT)之該量測相位差(∠S 31-∠S 32),可由以下式子所代表的遠場近似方法而得到, 其中,(θ 0,)為第i個該測試天線發射時測試天線之量測場型,Sr(θ 0,)為該參考天線發射時測試天線之量測場型。 The far field calibration system of the antenna system according to claim 4, wherein the amplitude coefficient (|S 32 |) of the antenna unit to be tested (AUT) and the reference antenna and the antenna unit under test (AUT) The measured phase difference (∠ S 31 -S 32 ) can be obtained by a far field approximation method represented by the following formula. among them, ( θ 0 , ) the measured field type of the test antenna when transmitting the i-th test antenna, Sr ( θ 0 , The test field type of the test antenna is transmitted for the reference antenna. 如申請專利範圍第3項所述之天線系統的遠場調校系統,其中該最大餘弦功率值(P Max )或該最小餘弦功率值(P Min )是在當系統阻抗為1時所計算而得。 The far field calibration system of the antenna system of claim 3, wherein the maximum cosine power value (P Max ) or the minimum cosine power value (P Min ) is calculated when the system impedance is 1. Got it. 如申請專利範圍第1項所述之天線系統的遠場調校系統,其中測試天線模組設置於該多輸入多輸出主動相列性天線陣列的邊緣。 The far field calibration system of the antenna system of claim 1, wherein the test antenna module is disposed at an edge of the multiple input multiple output active phase antenna array. 如申請專利範圍第1項所述之天線系統的遠場調校系統,其中該參考天線至該金屬反射面的距離為400毫米(400mm)。 The far field calibration system of the antenna system of claim 1, wherein the reference antenna has a distance of 400 mm (400 mm) from the metal reflecting surface.
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