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TWI431714B - The Center Structure and Method of Solar Silicon Chip Processing - Google Patents

The Center Structure and Method of Solar Silicon Chip Processing Download PDF

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TWI431714B
TWI431714B TW100108219A TW100108219A TWI431714B TW I431714 B TWI431714 B TW I431714B TW 100108219 A TW100108219 A TW 100108219A TW 100108219 A TW100108219 A TW 100108219A TW I431714 B TWI431714 B TW I431714B
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solar
wafer
measuring device
distance
clamping
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TW100108219A
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TW201237989A (en
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Miin Tsair Su
Jou Chin Liao
Chien Pang Ting
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Marketech Int Corp
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Description

太陽能矽晶片加工之中心定位結構及其方法Central positioning structure of solar raft wafer processing and method thereof

本發明係涉及一種太陽能矽晶片加工技術;特別是指一種太陽能矽晶片加工之中心定位結構及方法之創新設計者。The invention relates to a solar tantalum wafer processing technology; in particular to an innovative designer of a central positioning structure and method for solar tantalum wafer processing.

按,太陽能矽晶片(SOLAR CELL)本身是很容易破裂的材質,它除了本身易碎之問題外,外觀尺寸公差也比較大,以6吋大小為例,公差就可能達到1 mm(156±0.5 mm);由於太陽能矽晶片外尺寸大小不一,再加上其材料本身亦碎的特性,所以在材料的中心定位加工作業上如第1圖所示,通常必需仰賴電荷耦合元件(Charge Coupled Device;簡稱CCD)進行定位抓取,並透過抓取之邊緣值去做中心計算,如第1圖所揭加工流程;而固定夾持的力道也不可太強,否則會有破裂或片體翹曲的情形產生。According to the SOLAR CELL itself, it is a material that is easily broken. In addition to its own fragile problem, the dimensional tolerance of the product is also relatively large. For example, the size of 6吋 is 1 mm (156±0.5). Mm); Due to the different size of the solar raft wafer, and the fact that the material itself is also broken, the center positioning processing work of the material, as shown in Fig. 1, usually depends on the charge coupled device (Charge Coupled Device) (referred to as CCD) for positioning and grabbing, and through the edge value of the grab to do the center calculation, as shown in Figure 1; the fixed clamping force can not be too strong, otherwise there will be cracks or sheet warping The situation arises.

一般而言,雷射加工的時間係為固定,而各家設備廠商縮減作業時間(TACT TIME)的方法,多數是花在「CCD尋邊定位」這個加工程序上。若精確度要求較高的做法,有些國內外相關業界是採用設置多組高解析度的CCD在太陽能矽晶片個各側邊緣分佈位置上,以同步擷取太陽能矽晶片各側邊緣影像;有些則是利用單組CCD透過X-Y軸工作台的位移到各位置進行影像擷取;而就優劣點而言,前者成本頗高且相關的機構件複雜度也頗高,後者則會花費頗多時間在影像擷取上。In general, the processing time of laser processing is fixed, and the method of reducing the working time (TACT TIME) by various equipment manufacturers is mostly spent on the processing procedure of "CCD edge finding". If the accuracy is high, some domestic and foreign related industries use multiple sets of high-resolution CCDs to distribute the edges of the solar raft wafers on each side edge to simultaneously capture the image of each side of the solar 矽 wafer; The single-group CCD is used to capture the image through the displacement of the XY-axis table to each position. However, in terms of advantages and disadvantages, the cost of the former is high and the complexity of the related components is high, and the latter takes a lot of time. The image is captured.

是以,針對上述習知太陽能矽晶片加工之中心定位結構及方法所存在之問題點,如何研發出一種能夠達到高作業效率又兼具低成本、更具理想實用性之創新設計,實有待相關業界再加以思索突破者。Therefore, in view of the problems existing in the central positioning structure and method of the above-mentioned conventional solar silicon wafer processing, how to develop an innovative design that can achieve high operating efficiency and has low cost and more ideal practicability needs to be related. The industry is thinking about breakthroughs.

有鑑於此,發明人本於多年從事相關產品之製造開發與設計經驗,針對上述之目標,詳加設計與審慎評估後,終得一確具實用性之本發明。In view of this, the inventor has been engaged in the manufacturing development and design experience of related products for many years. After detailed design and careful evaluation, the inventor has finally obtained the practical invention.

本發明之主要目的,係在提供一種太陽能矽晶片加工之中心定位結構及其方法,其所欲解決之問題點,係針對如何研發出一種能夠達到高作業效率又兼具低成本之太陽能矽晶片加工之中心定位結構與方法為目標加以思索突破者;本發明解決問題之技術特點,主要在於所述太陽能矽晶片加工之中心定位結構係包含:第一承靠限位構件及第二承靠限位構件,分設於該工作台上欲供太陽能矽晶片置放位置的X、Y軸相臨二側向固定位置處,藉以當該太陽能矽晶片置放時,令太陽能矽晶片之相臨二側邊能夠抵靠於該第一、第二承靠限位構件;第一夾持機構及第二夾持機構,分設於該工作台上相對於第一、第二承靠限位構件之另側X、Y軸相臨二側向位置處,藉以位移作動抵靠夾持該太陽能矽晶片另相臨之二側邊;測距裝置,附設於該第一、第二夾持機構、工作台上任其中一處,所述測距裝置係藉以偵測第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片側邊之間的相對距離、或測距裝置與太陽能矽晶片側邊之間的相對距離任其中一種測距型態;一邏輯運算單元,與該測距裝置電性連結,藉以依據該第一、第二夾持機構與第一、第二承靠限位構件之預設已知相對距離數值以及測距裝置所測得之距離數值加以運算,進以獲得太陽能矽晶片定位狀態之中心點定位精確位置;本發明之另一主要目的,則是提供一種太陽能矽晶片加工之中心定位方法,所述中心定位方法之特徵主要包括:將太陽能矽晶片置放於該工作台上,利用該第一、第二夾持機構之位移作動抵靠推動太陽能矽晶片其中相臨二側邊,令太陽能矽晶片另其中相臨之二側邊抵靠於該第一、第二承靠限位構件,藉此令太陽能矽晶片穩固定位;於該第一、第二夾持機構位移作動過程中,藉由該測距裝置偵測該第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片之間的相對距離任其中一種測距型態;利用該邏輯運算單元之運作,以依據第一、第二夾持機構與第一、第二承靠限位構件之預設已知相對距離數值及測距裝置所測得之距離數值加以運算,進以獲得太陽能矽晶片定位狀態之中心點定位精確位置;藉此創新獨特設計,使本發明對照先前技術而言,主要是透過將測距裝置附設於該第一、第二夾持機構上之創新結構設計,使得第一、第二夾持機構於夾持位移作動過程中,同時透過測距裝置偵測該第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片之間的相對距離任其中一種測距型態,如此,當第一、第二夾持機構抵靠夾持該太陽能矽晶片另相臨之二側 邊時,俾可一併獲得太陽能矽晶片定位狀態之中心點定位精確位置,藉此,係達到高作業效率又兼具低成本之優點與實用進步性。The main object of the present invention is to provide a central positioning structure for solar wafer processing and a method thereof, and the problem to be solved is to develop a solar germanium wafer capable of achieving high operational efficiency and low cost. The central positioning structure and method of processing are considered as a breakthrough for the object; the technical feature of the problem solving of the present invention is mainly that the central positioning structure of the solar raft wafer processing system comprises: a first bearing limiting member and a second bearing limit The positional component is disposed on the workbench to be disposed at two laterally fixed positions of the X and Y axes of the solar raft wafer placement position, so that when the solar raft wafer is placed, the solar raft wafer is adjacent to the second The side edge can be abutted against the first and second bearing limiting members; the first clamping mechanism and the second clamping mechanism are respectively disposed on the working table relative to the first and second bearing limiting members The other side X and Y axes are adjacent to the two lateral positions, and the displacement is actuated against the two sides of the solar raft wafer; the distance measuring device is attached to the first and second clamping mechanisms and works. station In one of the above positions, the distance measuring device detects the displacement distance of the clamping action of the first and second clamping mechanisms or the clamping end of the first and second clamping mechanisms and the side of the solar wafer. The relative distance, or the relative distance between the distance measuring device and the side of the solar raft wafer, is one of the ranging types; a logic operation unit is electrically connected to the distance measuring device, thereby relieving the first and second clamping The mechanism is calculated by the preset known relative distance value of the first and second bearing limit members and the distance value measured by the distance measuring device, to obtain the precise position of the center point of the positioning state of the solar raft wafer; Another main purpose is to provide a central positioning method for solar raft wafer processing, the central positioning method mainly comprising: placing a solar raft wafer on the worktable, using the first and second clamping The displacement of the mechanism acts to push the adjacent sides of the solar raft wafer, so that the other two sides of the solar raft wafer abut against the first and second bearing limit members, thereby The positive energy 矽 wafer is stably fixed; during the displacement operation of the first and second clamping mechanisms, the distance measuring device detects the displacement distance of the first and second clamping mechanisms or the first and the The distance between the clamping end of the two clamping mechanism and the solar raft wafer is any one of the ranging types; the operation of the logic operation unit is used to control the first and second clamping mechanisms according to the first and second bearing Calculating the preset relative distance value of the limiting member and the distance value measured by the distance measuring device to obtain the precise position of the center point of the positioning state of the solar raft wafer; thereby, the innovative unique design makes the present invention In the prior art, the innovative structure design of attaching the distance measuring device to the first and second clamping mechanisms is adopted, so that the first and second clamping mechanisms are in the process of clamping displacement and simultaneously pass the distance measurement. The device detects the displacement distance of the clamping action of the first and second clamping mechanisms or the relative distance between the clamping end of the first and second clamping mechanisms and the solar raft wafer, and thus, First and second gripping mechanism holding the solar silicon chip against the other of the two adjacent sides At the same time, the 中心 can obtain the precise position of the center point of the solar 矽 wafer positioning state, thereby achieving the advantages of high operating efficiency and low cost and practical progress.

請參閱第1、2、3圖所示,係本發明太陽能矽晶片加工之中心定位結構及其方法之較佳實施例,惟此等實施例僅供說明之用,在專利申請上並不受此結構之限制;所述太陽能矽晶片加工之中心定位結構,係藉以取得置放夾持於一工作台05上之一太陽能矽晶片06定位狀態之中心點定位精確位置,包括:第一承靠限位構件11及第二承靠限位構件12,分設於該工作台05上欲供太陽能矽晶片06置放位置的X、Y軸相臨二側向固定位置處,藉以當該太陽能矽晶片06置放時,令太陽能矽晶片06之相臨二側邊能夠抵靠於該第一、第二承靠限位構件11、12;第一夾持機構21及第二夾持機構22,分設於該工作台05上相對於第一、第二承靠限位構件11、12之另側X、Y軸相臨二側向位置處,藉以位移作動抵靠夾持該太陽能矽晶片06另相臨之二側邊;測距裝置30,附設於該第一、第二夾持機構21、22、工作台05上任其中一處,所述測距裝置30係藉以偵測第一、第二夾持機構21、22之夾持動作位移距離或第一、第二夾持機構21、22之夾持端與太陽能矽晶片06側邊之間的相對距離、或測距裝置30與太陽能矽晶片06側邊之間的相對距離等任其中一種測距型態;一邏輯運算單元40,與該測距裝置30電性連結,藉以依據該第一、第二夾持機構21、22與第一、第二承靠限位構件11、12之預設已知相對距離數值以及測距裝置30所測得之距離數值加以運算,進以獲得太陽能矽晶片06定位狀態之中心點定位精確位置。Please refer to Figures 1, 2 and 3, which are preferred embodiments of the central positioning structure and method of the solar tantalum wafer processing of the present invention, but the embodiments are for illustrative purposes only and are not applicable to patent applications. The limitation of the structure; the central positioning structure of the solar raft wafer processing is to obtain a precise position of the center point of the positioning state of the solar raft wafer 06 placed on a worktable 05, including: the first bearing The limiting member 11 and the second bearing limiting member 12 are respectively disposed on the table 05 for the X and Y axes of the position where the solar raft wafer 06 is placed, adjacent to the two lateral fixed positions, thereby When the wafer 06 is placed, the adjacent sides of the solar raft wafer 06 can be abutted against the first and second bearing limiting members 11 and 12; the first clamping mechanism 21 and the second clamping mechanism 22, Disposed on the table 05 at two lateral positions opposite to the other side X and Y axes of the first and second bearing limiting members 11 and 12, thereby displacing against the solar raft wafer 06 by displacement actuation Two adjacent sides; a distance measuring device 30 attached to the first and second clamping machines 21, 22, one of the work stations 05, the distance measuring device 30 is used to detect the clamping action displacement distance of the first and second clamping mechanisms 21, 22 or the first and second clamping mechanisms 21, One of the ranging types of the relative distance between the clamping end of the 22 and the side of the solar raft wafer 06, or the relative distance between the distance measuring device 30 and the side of the solar raft wafer 06; a logic operation unit 40, Electrically coupled with the distance measuring device 30, according to the preset known relative distance values of the first and second clamping mechanisms 21, 22 and the first and second bearing limiting members 11, 12 and the distance measuring device The measured distance values are calculated to obtain the precise position of the center point of the positioning state of the solar raft wafer 06.

其中,該第一、第二承靠限位構件11、12係為能夠定點轉動之軸承所構成。The first and second bearing limiting members 11 and 12 are formed by bearings that can be rotated at a fixed point.

其中,所述測距裝置30能夠表現的具體型態可為多種,係為下述舉例說明所揭;下述所揭測距裝置30皆附設於第一、第二夾持機構21、22上:如第3、4圖所示,該測距裝置30分別為推力計、接觸式量測器所構成,藉以偵測該第一、第二夾持機構21、22之夾持動作位移距離,所述第一、第二夾持機構21、22未作動前與太陽能矽晶片06抵靠於該第一、第二承靠限位構件11、12之側邊距離為已知(如第3、4圖所揭X),當第一夾持機構21及第二夾持機構22向太陽能矽晶片06側邊位移並呈夾持狀態時,係可透過為推力計、接觸式量測器之測距裝置30得知位移距離(如第3、4圖所標示X1所指),接著藉由與測距裝置30電性連結之邏輯運算單元40推算出太陽能矽晶片06的外尺寸,進而能夠推算出太陽能矽晶片06側邊至中心的距離(如第3、4圖所標示X2所指),如此一來,即可獲得太陽能矽晶片06定位狀態之中心點定位精確位置。The specific types of the ranging device 30 can be represented by a plurality of types, which are disclosed in the following examples; the following distance measuring devices 30 are attached to the first and second clamping mechanisms 21 and 22; As shown in FIGS. 3 and 4, the distance measuring device 30 is composed of a thrust meter and a contact type measuring device, respectively, for detecting the displacement distance of the clamping action of the first and second clamping mechanisms 21 and 22, The distance between the first and second clamping mechanisms 21, 22 and the side of the first and second bearing limiting members 11 and 12 before the first and second clamping mechanisms 21 and 22 are not actuated is known (eg, the third, 4), when the first clamping mechanism 21 and the second clamping mechanism 22 are displaced toward the side of the solar raft wafer 06 and are in a nip state, the illuminating device can be transmitted as a thrust meter or a contact type measuring device. The device 30 knows the displacement distance (as indicated by X1 in FIGS. 3 and 4), and then calculates the outer dimension of the solar cell wafer 06 by the logic operation unit 40 electrically connected to the distance measuring device 30, thereby enabling calculation. The distance from the side of the solar cell wafer 06 to the center (as indicated by X2 in Figures 3 and 4), so that solar energy can be obtained. Locating a center point 06 of the sheet positioning accuracy state position.

再如第6圖所示測距裝置30係為對照式光電感應感知器型態,藉以偵測該第一、第二夾持機構21、22之夾持端與太陽能矽晶片06側邊之間的相對距離,當太陽能矽晶片06之相臨二側邊抵靠於該第一、第二承靠限位構件11、12時,該對照式光電感應感知器呈移動狀態,構成對照式光電感應感知器中間對位於太陽能矽晶片06,由於對照式光電感應感知器移動距離為固定狀態(如第6圖所標示X3所指),而當太陽能矽晶片06對位於對照式光電感應感知器,所述對照式光電感應感知器則會顯示出數值X5,進而能夠推算出太陽能矽晶片06側邊至中心的距離(如第6圖所標示X4所指)。As shown in FIG. 6, the distance measuring device 30 is a control type photoelectric sensing sensor type, thereby detecting the clamping end of the first and second clamping mechanisms 21, 22 and the side of the solar energy chip 06. When the adjacent sides of the solar raft wafer 06 abut against the first and second bearing limiting members 11 and 12, the contrast photoelectric sensing sensor is in a moving state, and constitutes a contrast photoelectric sensor. The middle pair of the sensor is located on the solar raft wafer 06, because the moving distance of the contrast photoelectric sensing sensor is fixed (as indicated by X3 indicated in Fig. 6), and when the solar 矽 wafer 06 is located in the comparative photoelectric sensing sensor, The comparative photoelectric sensing sensor will display the value X5, and can further calculate the distance from the side of the solar raft wafer 06 to the center (as indicated by X4 in Fig. 6).

又如第5圖所揭測距裝置30,係附設於工作台05上,該測距裝置30係為反射式光電感應感知器,為反射式光電感應感知器之測距裝置30係具有回授距離讀值功能,所述第一、第二夾持機構21、22未作動前與太陽能矽晶片06抵靠於該第一、第二承靠限位構件11、12之側邊距離為已知(如第5圖所揭X),當第一、第二夾持機構21、22位移作動對太陽能矽晶片06進行夾持,令該太陽能矽晶片06相臨二側邊抵靠於該第一、第二承靠限位構件11、12時,該光電感應感知器將發射感測光源L1投射於太陽能矽晶片06另相臨之二側邊,如此一來,光電感應感知器則顯示所測到的距離值(如第5圖所標示X1所指),進而能夠推算出太陽能矽晶片06側邊至中心的距離(如第5圖所標示X2所指)。The distance measuring device 30 as shown in FIG. 5 is attached to the worktable 05. The distance measuring device 30 is a reflective photoelectric sensing sensor, and the distance measuring device 30 for the reflective photoelectric sensing sensor has feedback. The distance reading function, the distance between the first and second clamping mechanisms 21, 22 and the side of the first and second bearing limiting members 11, 12 before the first and second clamping mechanisms 21, 22 are not actuated is known. (As disclosed in FIG. 5), when the first and second clamping mechanisms 21, 22 are displaced, the solar raft wafer 06 is clamped, and the solar raft wafer 06 is adjacent to the first side of the solar raft wafer 06. When the second member is supported by the limiting members 11, 12, the photoelectric sensing sensor projects the emission sensing light source L1 on the other two sides of the solar cell wafer 06, so that the photoelectric sensing sensor displays the measured The distance value obtained (as indicated by X1 in Fig. 5) can further calculate the distance from the side of the solar raft wafer 06 to the center (as indicated by X2 in Fig. 5).

承上述結構組成設計,本發明所揭太陽能矽晶片加工之中心定位方法係如下述:According to the above structural composition design, the central positioning method of the solar raft wafer processing disclosed in the present invention is as follows:

a、將太陽能矽晶片06置放於該工作台05上;a, the solar cell wafer 06 is placed on the workbench 05;

b、利用該第一、第二夾持機構21、22之位移作動抵靠夾持該太陽能矽晶片06其中相臨之二側邊,令該太陽能矽晶片06另相臨之二側邊能抵靠於該第一、第二承靠限位構件11、12,藉此令太陽能矽晶片06穩固定位;c、於該第一、第二夾持機構21、22位移作動過程中,藉由該測距裝置30偵測該第一、第二夾持機構21、22之夾持動作位移距離或第一、第二夾持機構21、22之夾持端與太陽能矽晶片06之間的相對距離、或測距裝置30與太陽能矽晶片06側邊之間的相對距離等任其中一種測距型態;d、利用該邏輯運算單元40之運作,以依據第一、第二夾持機構21、22與第一、第二承靠限位構件11、12之預設已知相對距離數值及測距裝置30所測得之距離數值加以運算,進以獲得太陽能矽晶片06定位狀態之中心點定位精確位置。b. Using the displacement of the first and second clamping mechanisms 21, 22 to actuate the two sides of the solar raft wafer 06, so that the two sides of the solar raft wafer 06 can be adjacent to each other. Relying on the first and second bearing limiting members 11, 12, thereby fixing the solar crucible wafer 06 to a fixed position; c, during the displacement of the first and second clamping mechanisms 21, 22, by the The distance measuring device 30 detects the clamping action displacement distance of the first and second clamping mechanisms 21, 22 or the relative distance between the clamping ends of the first and second clamping mechanisms 21, 22 and the solar raft wafer 06. Or one of the ranging types of the distance between the distance measuring device 30 and the side of the solar raft wafer 06; d, using the operation of the logic operation unit 40, according to the first and second clamping mechanisms 21, 22 and the first and second bearing limit members 11, 12 preset known relative distance values and the distance value measured by the distance measuring device 30 are calculated to obtain the center point positioning of the solar 矽 wafer 06 positioning state. Precise location.

本發明之優點:Advantages of the invention:

本發明所揭「太陽能矽晶片加工之中心定位結構」主要是透過所述測距裝置之創新結構設計,使得第一、第二夾持機構於夾持位移作動過程中,同時透過測距裝置偵測該第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片之間的相對距離、或測距裝置與太陽能矽晶片側邊之間的相對距離任其中一種測距型態,如此,當第一、第二夾持機構抵靠夾持該太陽能矽晶片另相臨之二側邊時,俾可一併獲得太陽能矽晶片定位狀態之中心點定位精確位置,藉此,係達到高作業效率又兼具低成本之優點與實用進步性。The "central positioning structure of solar raft wafer processing" disclosed in the present invention is mainly designed through the innovative structure of the distance measuring device, so that the first and second clamping mechanisms are in the process of clamping displacement actuation, and simultaneously through the distance measuring device Measuring the clamping action displacement distance of the first and second clamping mechanisms or the relative distance between the clamping ends of the first and second clamping mechanisms and the solar raft wafer, or the distance measuring device and the side of the solar raft wafer The relative distance between the two is any one of the ranging types, so that when the first and second clamping mechanisms abut against the other two sides of the solar raft wafer, the 矽 can obtain the solar 矽 wafer positioning state. The center point is positioned at a precise position, thereby achieving high operational efficiency and low cost advantages and practical advancement.

05...工作台05. . . Workbench

06...太陽能矽晶片06. . . Solar germanium wafer

11...第一承靠限位構件11. . . First bearing limit member

12...第二承靠限位構件12. . . Second bearing limit member

21...第一夾持機構twenty one. . . First clamping mechanism

22...第二夾持機構twenty two. . . Second clamping mechanism

30...測距裝置30. . . Distance measuring device

40...邏輯運算單元40. . . Logical unit

第1圖:習知加工流程之方塊示意圖。Figure 1: Schematic diagram of a conventional processing flow.

第2圖:本發明較佳實施例之結構立體示意圖。Figure 2 is a perspective view showing the structure of a preferred embodiment of the present invention.

第3圖:本發明較佳實施例之作動示意圖。Figure 3 is a schematic illustration of the actuation of a preferred embodiment of the invention.

第4圖:本發明另一測距裝置之作動示意圖。Fig. 4 is a schematic view showing the operation of another distance measuring device of the present invention.

第5圖:本發明又一測距裝置之作動示意圖。Fig. 5 is a schematic view showing the operation of another distance measuring device of the present invention.

第6圖:本發明再一測距裝置之作動示意圖。Figure 6 is a schematic view showing the operation of the further distance measuring device of the present invention.

05...工作台05. . . Workbench

06...太陽能矽晶片06. . . Solar germanium wafer

11...第一承靠限位構件11. . . First bearing limit member

12...第二承靠限位構件12. . . Second bearing limit member

21...第一夾持機構twenty one. . . First clamping mechanism

22...第二夾持機構twenty two. . . Second clamping mechanism

30...測距裝置30. . . Distance measuring device

Claims (5)

一種太陽能矽晶片加工之中心定位結構,係藉以取得置放夾持於一工作台上之一太陽能矽晶片定位狀態之中心點定位精確位置,包括:第一承靠限位構件及第二承靠限位構件,分設於該工作台上欲供太陽能矽晶片置放位置的X、Y軸相臨二側向固定位置處,藉以當該太陽能矽晶片置放時,令太陽能矽晶片之相臨二側邊能夠抵靠於該第一、第二承靠限位構件;第一夾持機構及第二夾持機構,分設於該工作台上相對於第一、第二承靠限位構件之另側X、Y軸相臨二側向位置處,藉以位移作動抵靠夾持該太陽能矽晶片另相臨之二側邊;測距裝置,附設於該第一夾持機構及第二夾持機構上、工作台上任其中一處,所述測距裝置係藉以偵測第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片側邊之間的相對距離或測距裝置與太陽能矽晶片側邊之間的相對距離任其中一種測距型態;一邏輯運算單元,與該測距裝置電性連結,藉以依據該第一、第二夾持機構與第一、第二承靠限位構件之預設已知相對距離數值以及測距裝置所測得之距離數值加以運算,進以獲得太陽能矽晶片定位狀態之中心點定位精確位置。 The central positioning structure of the solar raft wafer processing is to obtain a precise position of the center point of the positioning state of the solar raft wafer placed on a workbench, including: the first bearing limit member and the second bearing The limiting member is disposed on the working platform for the X-axis and the Y-axis of the solar raft wafer to be placed at two lateral fixed positions, so that when the solar raft wafer is placed, the solar raft wafer is adjacent to each other. The two side edges can abut against the first and second bearing limiting members; the first clamping mechanism and the second clamping mechanism are respectively disposed on the working table relative to the first and second bearing limiting members The other side X and Y axes are adjacent to the two lateral positions, and the displacement is actuated against the two sides of the solar raft wafer; the distance measuring device is attached to the first clamping mechanism and the second clamp One of the holding mechanism and the working table, the distance measuring device is configured to detect the clamping action displacement distance of the first and second clamping mechanisms or the clamping end of the first and second clamping mechanisms and the solar energy Relative distance between the sides of the wafer or the distance measuring device and the sun Any one of the distance measurement types of the relative distance between the sides of the wafer; a logic operation unit electrically connected to the distance measuring device, whereby the first and second clamping mechanisms are coupled to the first and second bearings The preset relative distance value of the limiting member and the distance value measured by the distance measuring device are calculated to obtain the precise position of the center point of the solar raft wafer positioning state. 依據申請專利範圍第1項所述之太陽能矽晶片加工之中心定位結構,其中該第一、第二承靠限位構件係為能夠定點轉動之軸承所構成。 The central positioning structure for solar raft wafer processing according to claim 1, wherein the first and second bearing limiting members are formed by bearings capable of rotating at a fixed point. 依據申請專利範圍第1項所述之太陽能矽晶片加工之中心定位結構,其中該測距裝置係為推力計、接觸式量測器任一者所構成,藉以偵測該第一、第二夾持機構之夾持動作位移距離。 The central positioning structure of the solar tantalum wafer processing according to the first aspect of the patent application, wherein the distance measuring device is formed by any one of a thrust meter and a contact type measuring device, thereby detecting the first and second clips. The clamping action displacement distance of the holding mechanism. 依據申請專利範圍第1項所述之太陽能矽晶片加工之中心定位結構,其中該測距裝置係為反射式光電感應感知器、對照式光電感應感知器任一者所構成,藉以偵測該第一、第二夾持機構之夾持端與太陽能矽晶片側邊之間的相對距離。 The central positioning structure of the solar tantalum wafer processing according to the first aspect of the patent application, wherein the distance measuring device is formed by any one of a reflective photoelectric sensing sensor and a contrast photoelectric sensing sensor, thereby detecting the first 1. The relative distance between the clamping end of the second clamping mechanism and the side of the solar wafer. 一種太陽能矽晶片加工之中心定位方法,係為採用申請專利範圍第1至4項所述結構之中心定位方法,包括:將太陽能矽晶片置放於該工作台上;利用該第一、第二夾持機構之位移作動抵靠推動該太陽能矽晶片之其中相臨二側邊,令太陽能矽晶片另其中相臨之二側邊抵靠於該第一、第二承靠限位構件,藉此令太陽能矽晶片穩固定位;於該第一、第二夾持機構位移作動過程中,藉由該測距裝置偵測該第一、第二夾持機構之夾持動作位移距離或第一、第二夾持機構之夾持端與太陽能矽晶片之間的相對距離、或測距裝置與太陽能矽晶片側邊之間的相對距離任其中一種測距型態;利用該邏輯運算單元之運作,以依據第一、第二夾持機構與第一、第二承靠限位構件之預設已知相對距離數值及測距裝置所測得之距離數值加以運算,進以獲得太陽能矽晶片定位狀態之中心點定位精確位置。 A central positioning method for solar wafer processing is to adopt a central positioning method of the structure described in claim 1 to 4, comprising: placing a solar wafer on the workbench; using the first and second The displacement of the clamping mechanism acts against the adjacent sides of the solar raft wafer, so that the other two sides of the solar raft wafer abut against the first and second bearing limiting members, thereby The solar raft wafer is stably fixed; during the displacement operation of the first and second clamping mechanisms, the distance measuring device detects the displacement distance of the first and second clamping mechanisms or the first and the second The relative distance between the clamping end of the two clamping mechanism and the solar raft wafer, or the relative distance between the distance measuring device and the side of the solar raft wafer; or the operation of the logic unit Calculating according to the preset known relative distance value of the first and second clamping mechanisms and the first and second bearing limiting members and the distance value measured by the distance measuring device, to obtain the solar raft wafer positioning state Locate the exact position of the center point.
TW100108219A 2011-03-11 2011-03-11 The Center Structure and Method of Solar Silicon Chip Processing TWI431714B (en)

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CN109590398A (en) * 2019-01-30 2019-04-09 福建渃博特自动化设备有限公司 A kind of plate leveling method and terminal

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EP2947686A1 (en) 2014-05-19 2015-11-25 Meyer Burger AG Wafer processing method
TWI616565B (en) * 2016-10-17 2018-03-01 友達晶材股份有限公司 Auto-aligning device and auto-aligning method thereof
CN108016684A (en) * 2017-12-25 2018-05-11 东莞捷荣技术股份有限公司 Labeling clamp based on labeling machine

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109590398A (en) * 2019-01-30 2019-04-09 福建渃博特自动化设备有限公司 A kind of plate leveling method and terminal
CN109590398B (en) * 2019-01-30 2020-04-28 福建渃博特自动化设备有限公司 Plate leveling method and terminal

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