TWI427831B - Led epitaxial structure and manufacturing method - Google Patents
Led epitaxial structure and manufacturing method Download PDFInfo
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本發明涉及一種LED磊晶結構及製造方法,尤其涉及一種具有較佳出光效率的LED磊晶結構及製造方法。 The invention relates to an LED epitaxial structure and a manufacturing method thereof, in particular to an LED epitaxial structure and a manufacturing method thereof with better light extraction efficiency.
LED產業係近幾年最受矚目的產業之一,發展至今,LED產品已具有節能、省電、高效率、反應時間快、壽命週期時間長、且不含汞、具有環保效益等優點。然而由於LED的結構係以磊晶方式生長在藍寶石基板上,磊晶與藍寶石基板的晶格常數以及熱膨脹係數差異極大,所以會產生高密度線差排(Thread Dislocation),此種高密度線差排會限制LED的發光效率。此外,在LED的結構中,除了發光層(Active Layer)及其它磊晶層會吸收光以外,其半導體的高折射係數也會使得LED產生的光受到侷限,且常產生全內反射使大部分從發光層發出的光線,被侷限在半導體內部,這種被侷限的光有可能被較厚的基板吸收。所以如何從半導體的發光層萃取光源,進而增加光萃取效率,係目前LED產業努力的課題。 LED industry is one of the most watched industries in recent years. Since its development, LED products have the advantages of energy saving, power saving, high efficiency, fast response time, long life cycle, mercury free, and environmental benefits. However, since the structure of the LED is epitaxially grown on the sapphire substrate, the lattice constant and the thermal expansion coefficient of the epitaxial and sapphire substrates are greatly different, so a high density Thread Dislocation is generated, and such a high density line difference is generated. The arrangement limits the luminous efficiency of the LED. In addition, in the structure of the LED, in addition to the light absorption layer (Active Layer) and other epitaxial layers will absorb light, the high refractive index of the semiconductor will also limit the light generated by the LED, and often produce total internal reflection for most of the The light emitted from the luminescent layer is confined inside the semiconductor, and this limited light may be absorbed by the thicker substrate. Therefore, how to extract the light source from the luminescent layer of the semiconductor and increase the light extraction efficiency is a problem that the LED industry is currently striving for.
有鑒於此,有必要提供一種光萃取效率良好的LED磊晶結構及製造方法。 In view of the above, it is necessary to provide an LED epitaxial structure and a manufacturing method with good light extraction efficiency.
一種LED磊晶結構及製造方法,包括一基板、一磊晶層以及一光 萃取層。該磊晶層成長在該基板的頂面,該光萃取層形成在該磊晶層的表層。該光萃取層具有一光萃取面微結構層以及一保護層。該光萃取面微結構層形成在該磊晶層具有的發光層與表層之間,該保護層形成在該光萃取面微結構層的結構體內。該磊晶層的表面則形成一透明導電層。 LED epitaxial structure and manufacturing method, comprising a substrate, an epitaxial layer and a light Extraction layer. The epitaxial layer is grown on a top surface of the substrate, and the light extraction layer is formed on a surface layer of the epitaxial layer. The light extraction layer has a light extraction surface microstructure layer and a protective layer. The light extraction surface microstructure layer is formed between the light emitting layer and the surface layer of the epitaxial layer, and the protective layer is formed in the structure of the light extraction surface microstructure layer. The surface of the epitaxial layer forms a transparent conductive layer.
一種LED磊晶製造方法,其包括以下的步驟,提供一藍寶石基板,使該藍寶石基板上生長磊晶層;形成一光萃取面微結構層,以濕式蝕刻在該磊晶層的表面與發光層之間進行;形成一保護層,在該光萃取面微結構層內,形成一光萃取層;形成一透明導電層,在該磊晶層的表面;製作電極,分別在該磊晶層上設置。 A LED epitaxial manufacturing method comprising the steps of: providing a sapphire substrate to grow an epitaxial layer on the sapphire substrate; forming a light extraction surface microstructure layer, wet etching on the surface of the epitaxial layer and illuminating Between the layers; forming a protective layer, forming a light extraction layer in the light extraction surface microstructure layer; forming a transparent conductive layer on the surface of the epitaxial layer; forming electrodes on the epitaxial layer respectively Settings.
上述的LED磊晶結構及製造方法中,由於該光萃取層形成的光萃取面微結構係由濕式蝕刻機制蝕刻缺陷造成,因此微結構密度更密,而且可隨缺陷多寡調變其微結構密度,因此可有效提高光取出效率,並且該光萃取面微結構層的成型製造方法相較於目前的成型方式其製造成本低,具有競爭上的優勢。 In the LED epitaxial structure and the manufacturing method described above, since the light extraction surface microstructure formed by the light extraction layer is caused by a wet etching mechanism etching defect, the microstructure density is denser, and the microstructure can be modulated with the defect. The density, therefore, can effectively improve the light extraction efficiency, and the molding manufacturing method of the light extraction surface microstructure layer has a lower manufacturing cost than the current molding method, and has a competitive advantage.
10、20‧‧‧LED磊晶結構 10, 20‧‧‧LED epitaxial structure
12、22‧‧‧基板 12, 22‧‧‧ substrate
14、24‧‧‧磊晶層 14, 24‧‧‧ epitaxial layer
16、26‧‧‧光萃取層 16, 26‧‧‧Light extraction layer
18‧‧‧緩衝層 18‧‧‧ Buffer layer
30‧‧‧晶格缺陷 30‧‧‧ lattice defects
122、222‧‧‧頂面 122, 222‧‧‧ top
124、224‧‧‧底面 124, 224‧‧‧ bottom
142、246‧‧‧N型磊晶層 142, 246‧‧‧N type epitaxial layer
144、244‧‧‧發光層 144, 244‧‧ ‧ luminescent layer
146、242‧‧‧P型磊晶層 146, 242‧‧‧P type epitaxial layer
148‧‧‧透明導電層 148‧‧‧Transparent conductive layer
162、262‧‧‧光萃取面微結構層 162, 262‧‧‧ light extraction surface microstructure layer
164、264‧‧‧保護層 164, 264‧‧ ‧ protective layer
1422、2462‧‧‧N型電極 1422, 2462‧‧‧N type electrode
1462‧‧‧P型電極 1462‧‧‧P type electrode
圖1係本發明LED磊晶結構第一實施例剖視圖。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a cross-sectional view showing a first embodiment of the LED epitaxial structure of the present invention.
圖2係本發明LED磊晶結構第二實施例剖視圖。 Figure 2 is a cross-sectional view showing a second embodiment of the LED epitaxial structure of the present invention.
圖3係本發明LED磊晶結構及製造方法的步驟流程圖。 3 is a flow chart showing the steps of the LED epitaxial structure and the manufacturing method of the present invention.
圖4係對應圖3基板磊晶層生長步驟的剖視圖。 4 is a cross-sectional view corresponding to the step of growing the epitaxial layer of the substrate of FIG. 3.
圖5係對應圖3形成光萃取面微結構層步驟的剖視圖。 Figure 5 is a cross-sectional view showing the steps of forming a light extraction surface microstructure layer corresponding to Figure 3.
圖6係對應圖3形成保護層步驟的剖視圖。 Figure 6 is a cross-sectional view showing the steps of forming a protective layer corresponding to Figure 3.
圖7係對應圖3形成透明導電層步驟的剖視圖。 Figure 7 is a cross-sectional view showing the step of forming a transparent conductive layer corresponding to Figure 3.
下面將結合附圖對本發明作一具體介紹。 The present invention will be specifically described below with reference to the accompanying drawings.
請參閱圖1,所示為本發明LED磊晶結構第一實施例剖視圖,該LED磊晶結構10,包括一基板12、一磊晶層14以及一光萃取層16。該基板12包含有一頂面122以及一底面124。該基板12為藍寶石基板,該頂面122上成長該磊晶層14。該磊晶層14由該頂面122上依序成長具有一N型磊晶層142、一發光層144以及一P型磊晶層146,其中該頂面122與該磊晶層14之間,進一步具有一緩衝層18。該緩衝層18可調整該磊晶層14與該基板12之間晶格匹配的差異,使該磊晶結構10因晶格差異的應力因素會造成的晶格缺陷30(如圖4所示)的密度可以被調整。該晶格缺陷30在該發光層144中會降低電子與電洞複合機率而降低其發光效率,從而磊晶結構10的晶格缺陷密度需要被調整限制,避免影響該磊晶結構10的發光效能。本實施例中,除了該緩衝層18調整該磊晶結構10的晶格缺陷30密度外,為增加發光效能在該磊晶層14的表層形成該光萃取層16。該光萃取層16具有一光萃取面微結構層162以及一保護層164。該光萃取面微結構層162形成在該磊晶層14的該發光層144與表層之間。本實施例中該磊晶層14的表層為P型磊晶層146。換句話說,該光萃取面微結構層162形成在該發光層144與該P型磊 晶層146之間。該光萃取面微結構層162的光萃取面微結構,由該磊晶層14表層(P型磊晶層146)的表面以倒錐型(圖中未示)向下深入至該發光層144,形成一凹凸狀的表層。該凹凸狀的表層可以破壞該磊晶結構10內部的全反射以萃取光線提高發光率。該光萃取面微結構層162的該凹凸狀表層體內形成該保護層164。該保護層164的材料可以係二氧化矽SiO2、氮化矽SiN或矽氧氮SiOxNy。該磊晶層14的表面上進一步形成具有一透明導電層148,用以輔助電流分散。該透明導電層148的材料可以係ITO(Indium Tin Oxide)、鎳/金Ni/Au等。該透明導電層148上具有一P型電極1462,該N型磊晶層142上具有一N型電極1422,用以導引該LED磊晶結構10發光所需的電力。 Referring to FIG. 1 , a cross-sectional view of a first embodiment of an LED epitaxial structure according to the present invention is shown. The LED epitaxial structure 10 includes a substrate 12 , an epitaxial layer 14 , and a light extraction layer 16 . The substrate 12 includes a top surface 122 and a bottom surface 124. The substrate 12 is a sapphire substrate, and the epitaxial layer 14 is grown on the top surface 122. The epitaxial layer 14 is sequentially grown from the top surface 122 to have an N-type epitaxial layer 142, a light-emitting layer 144, and a P-type epitaxial layer 146, wherein the top surface 122 and the epitaxial layer 14 are There is further a buffer layer 18. The buffer layer 18 can adjust the difference in lattice matching between the epitaxial layer 14 and the substrate 12, so that the epitaxial structure 10 causes lattice defects 30 due to stress factors of lattice difference (as shown in FIG. 4). The density can be adjusted. The lattice defect 30 reduces the electron-hole combination probability and reduces the luminous efficiency in the light-emitting layer 144, so that the lattice defect density of the epitaxial structure 10 needs to be adjusted to avoid affecting the light-emitting efficiency of the epitaxial structure 10. . In this embodiment, in addition to the buffer layer 18 adjusting the density of the lattice defects 30 of the epitaxial structure 10, the light extraction layer 16 is formed on the surface layer of the epitaxial layer 14 for increasing the luminous efficacy. The light extraction layer 16 has a light extraction surface microstructure layer 162 and a protective layer 164. The light extraction surface microstructure layer 162 is formed between the light emitting layer 144 of the epitaxial layer 14 and the surface layer. In this embodiment, the surface layer of the epitaxial layer 14 is a P-type epitaxial layer 146. In other words, the light extraction surface microstructure layer 162 is formed on the light emitting layer 144 and the P-type Lei Between the layers 146. The light extraction surface microstructure of the light extraction surface microstructure layer 162 is deep down to the light emitting layer 144 by the surface of the epitaxial layer 14 (P-type epitaxial layer 146) in an inverted cone shape (not shown). Forming a concave-convex surface layer. The uneven surface layer can destroy the total reflection inside the epitaxial structure 10 to extract light to increase the luminosity. The protective layer 164 is formed in the concave-convex surface layer of the light extraction surface microstructure layer 162. The material of the protective layer 164 may be cerium oxide SiO2, cerium nitride SiN or germanium oxynitride SiOxNy. The surface of the epitaxial layer 14 is further formed with a transparent conductive layer 148 for assisting current dispersion. The material of the transparent conductive layer 148 may be ITO (Indium Tin Oxide), nickel/gold Ni/Au or the like. The transparent conductive layer 148 has a P-type electrode 1462. The N-type epitaxial layer 142 has an N-type electrode 1422 for guiding the power required for the LED epitaxial structure 10 to emit light.
請再參閱圖2,所示為本發明LED磊晶結構第二實施例剖視圖,該LED磊晶結構20,包括一基板22、一磊晶層24以及一光萃取層26。該基板22包含有一頂面222以及一底面224。該基板22為金屬基板。該金屬基板22的頂面222上具有該磊晶層24。該磊晶層24可以單獨由雷射、化學、機械等方式進行,並經由電鍍或其他接合方式與該金屬基板22進行結合而製作垂直式發光二極體結構。該頂面222上依序成長具有一P型磊晶層242、一發光層244以及一N型磊晶層246。該磊晶層24的表層形成一光萃取層26。該光萃取層26具有一光萃取面微結構層262以及一保護層264。該光萃取面微結構層262形成在該磊晶層24的該發光層244與表層之間,與第一實施例的該光萃取層16相同。不同在於,該磊晶層24的表層為N型磊晶層246。因此,本實施例中該光萃取面微結構層262形成在該發光層244與該N型磊晶層246之間。該N型磊晶層246的電阻值較小,因此本實施例可以不需要形成一透明導電層。該N型磊 晶層246上具有一N型電極2462,與該金屬基板22構成該LED磊晶結構20的垂直結構。 Referring to FIG. 2, a cross-sectional view of a second embodiment of the LED epitaxial structure of the present invention is shown. The LED epitaxial structure 20 includes a substrate 22, an epitaxial layer 24, and a light extraction layer 26. The substrate 22 includes a top surface 222 and a bottom surface 224. The substrate 22 is a metal substrate. The epitaxial layer 24 is disposed on the top surface 222 of the metal substrate 22. The epitaxial layer 24 can be separately formed by laser, chemical, mechanical, or the like, and bonded to the metal substrate 22 via electroplating or other bonding to form a vertical light emitting diode structure. The top surface 222 is sequentially grown to have a P-type epitaxial layer 242, a light-emitting layer 244, and an N-type epitaxial layer 246. The surface layer of the epitaxial layer 24 forms a light extraction layer 26. The light extraction layer 26 has a light extraction surface microstructure layer 262 and a protective layer 264. The light extraction surface microstructure layer 262 is formed between the light emitting layer 244 of the epitaxial layer 24 and the surface layer, which is the same as the light extraction layer 16 of the first embodiment. The difference is that the surface layer of the epitaxial layer 24 is an N-type epitaxial layer 246. Therefore, in the embodiment, the light extraction surface microstructure layer 262 is formed between the light emitting layer 244 and the N type epitaxial layer 246. The N-type epitaxial layer 246 has a small resistance value, so this embodiment may not require forming a transparent conductive layer. The N-type Lei The crystal layer 246 has an N-type electrode 2462 thereon, and the metal substrate 22 constitutes a vertical structure of the LED epitaxial structure 20.
本發明LED磊晶製造方法(如圖3所示),其包括以下的步驟:S11提供一藍寶石基板,使該藍寶石基板上生長磊晶層;S12形成一光萃取面微結構層,以濕式蝕刻在該磊晶層的表面與發光層之間進行;S13形成一保護層,在該光萃取面微結構層內,形成一光萃取層;S14形成一透明導電層,在該磊晶層的表面;及S15製作電極,分別在該磊晶層上設置。 The LED epitaxial manufacturing method of the present invention (shown in FIG. 3) comprises the following steps: S11 provides a sapphire substrate to grow an epitaxial layer on the sapphire substrate; S12 forms a light extraction surface microstructure layer, in a wet manner Etching is performed between the surface of the epitaxial layer and the light-emitting layer; S13 forms a protective layer, and a light extraction layer is formed in the light extraction surface microstructure layer; S14 forms a transparent conductive layer in the epitaxial layer Surfaces; and S15 to form electrodes, which are respectively disposed on the epitaxial layer.
該步驟S11提供一藍寶石基板12(如圖4所示),該藍寶石基板12上生長磊晶層14,該磊晶層14包括該N型磊晶層142、該發光層144以及該P型磊晶層146,其中該藍寶石基板12與該磊晶層14之間形成該緩衝層18。該緩衝層18可調整該磊晶層14的缺陷30密度。該步驟S12形成一光萃取面微結構層162(如圖5所示),可使用KOH氫氧化鉀或係H3PO4磷酸等等濕式化學蝕刻進行,本實施例中使用KOH氫氧化鉀濕式化學蝕刻,利用該磊晶層14的缺陷30進行鍵結反應,不但可以用以去除該磊晶層14的缺陷30,隨著該緩衝層18可調整該缺陷30密度的增高,使形成的該光萃取面微結構層162的蝕刻密度亦增加。該光萃取面微結構層162的蝕刻密度提高可以增加光萃取效率。該光萃取面微結構層162的蝕刻深度由該磊晶層14表面到達該發光層144。接著該步驟S13形成一保護層164(如圖6所示),在該光萃取面微結構層162內,與該光萃取面微結 構層162形成該光萃取層16。緊接著該步驟S14形成一透明導電層148(如圖7所示),先利用化學機械研磨CMP或係化學蝕刻去除該磊晶層14表面的該保護層164,再形成該透明導電層148於該磊晶層14的表面,並與該P型磊晶層146接觸。最後,該步驟S15製作電極1462、1422,即以黃光微影制程分別在該P型磊晶層146的該透明導電層148上設置該P型電極1462,在該N型磊晶層142上設置該N型電極1422。該電極1462、1422材料可以係鉻/金Cr/Au等。 The step S11 provides a sapphire substrate 12 (shown in FIG. 4). The epitaxial layer 14 is grown on the sapphire substrate 12. The epitaxial layer 14 includes the N-type epitaxial layer 142, the luminescent layer 144, and the P-type Lei. The crystal layer 146, wherein the buffer layer 18 is formed between the sapphire substrate 12 and the epitaxial layer 14. The buffer layer 18 can adjust the density of the defects 30 of the epitaxial layer 14. This step S12 forms a light extraction surface microstructure layer 162 (shown in FIG. 5), which can be performed by wet chemical etching using potassium KOH hydroxide or H3PO4 phosphoric acid. In this embodiment, KOH potassium hydroxide wet chemistry is used. Etching, using the defect 30 of the epitaxial layer 14 to perform a bonding reaction, not only to remove the defect 30 of the epitaxial layer 14, but the buffer layer 18 can adjust the density of the defect 30 to form the light. The etching density of the extraction surface microstructure layer 162 also increases. The increased etching density of the light extraction surface microstructure layer 162 can increase the light extraction efficiency. The etching depth of the light extraction surface microstructure layer 162 reaches the light emitting layer 144 from the surface of the epitaxial layer 14. Then, in step S13, a protective layer 164 (shown in FIG. 6) is formed. In the light extraction surface microstructure layer 162, the light extraction surface is micro-junctioned. The layer 162 forms the light extraction layer 16. Immediately after the step S14, a transparent conductive layer 148 is formed (as shown in FIG. 7). The protective layer 164 on the surface of the epitaxial layer 14 is removed by chemical mechanical polishing or chemical etching, and the transparent conductive layer 148 is formed. The surface of the epitaxial layer 14 is in contact with the P-type epitaxial layer 146. Finally, the step S15 is performed to form the electrodes 1462 and 1422, and the P-type electrode 1462 is disposed on the transparent conductive layer 148 of the P-type epitaxial layer 146 by a yellow lithography process, and the P-type electrode 1462 is disposed on the N-type epitaxial layer 142. N-type electrode 1422. The electrode 1462, 1422 material may be chromium/gold Cr/Au or the like.
綜上,本發明LED磊晶結構及製造方法,該磊晶層14的表層形成該光萃取層16。該光萃取層16以濕式化學蝕刻進行,具有成本低、光萃取面微結構密度高的良好效能。該磊晶層14會影響發光效能的缺陷30部分,也可以因該濕式化學蝕刻製造方法及保護層填補懸鍵的機制而消失,並可增加額外的進出光面及改變出光角度,以效提升發光效率。 In summary, in the LED epitaxial structure and manufacturing method of the present invention, the surface layer of the epitaxial layer 14 forms the light extraction layer 16. The light extraction layer 16 is performed by wet chemical etching, and has good performance at a low cost and a high microstructure density on the light extraction surface. The epitaxial layer 14 may affect the defect 30 part of the luminous efficacy, and may also disappear due to the wet chemical etching manufacturing method and the mechanism for the protective layer to fill the dangling bond, and may add additional light in and out and change the light angle to effect Improve luminous efficiency.
應該指出,上述實施例僅為本發明的較佳實施方式,本領域技術人員還可在本發明精神內做其他變化。該等依據本發明精神所做的變化,都應包含在本發明所要求保護的範圍之內。 It should be noted that the above-described embodiments are merely preferred embodiments of the present invention, and those skilled in the art can make other changes within the spirit of the present invention. Such changes in accordance with the spirit of the invention are intended to be included within the scope of the invention.
10‧‧‧LED磊晶結構 10‧‧‧LED epitaxial structure
12‧‧‧基板 12‧‧‧Substrate
14‧‧‧磊晶層 14‧‧‧ epitaxial layer
16‧‧‧光萃取層 16‧‧‧Light extraction layer
18‧‧‧緩衝層 18‧‧‧ Buffer layer
122‧‧‧頂面 122‧‧‧ top surface
124‧‧‧底面 124‧‧‧ bottom
142‧‧‧N型磊晶層 142‧‧‧N type epitaxial layer
144‧‧‧發光層 144‧‧‧Lighting layer
146‧‧‧P型磊晶層 146‧‧‧P type epitaxial layer
148‧‧‧透明導電層 148‧‧‧Transparent conductive layer
162‧‧‧光萃取面微結構層 162‧‧‧Light extraction surface microstructure layer
164‧‧‧保護層 164‧‧ ‧ protective layer
1422‧‧‧N型電極 1422‧‧‧N type electrode
1462‧‧‧P型電極 1462‧‧‧P type electrode
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