TWI425214B - - Google Patents

Info

Publication number: TWI425214B
Authority: TW; Taiwan

Application number

TW100107829A

Other languages

Other versions

TW201237419A (en

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2011-03-09

Filing date

2011-03-09

Publication date

2014-02-01

2011-03-09 Application filed filed Critical

2011-03-09 Priority to TW100107829A priority Critical patent/TW201237419A/en

2012-09-16 Publication of TW201237419A publication Critical patent/TW201237419A/en

2014-02-01 Application granted granted Critical

2014-02-01 Publication of TWI425214B publication Critical patent/TWI425214B/zh

Links

TW100107829A 2011-03-09 2011-03-09 Testing board carrier TW201237419A (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
TW100107829A TW201237419A (en)	2011-03-09	2011-03-09	Testing board carrier

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
TW100107829A TW201237419A (en)	2011-03-09	2011-03-09	Testing board carrier

Publications (2)

Publication Number	Publication Date
TW201237419A TW201237419A (en)	2012-09-16
TWI425214B true TWI425214B (en)	2014-02-01

Family

ID=47223125

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW100107829A TW201237419A (en)	2011-03-09	2011-03-09	Testing board carrier

Country Status (1)

Country	Link
TW (1)	TW201237419A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN110068711B (en) *	2018-01-24	2022-04-26	台湾中华精测科技股份有限公司	Probe card device and rectangular probe

Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6060892A (en) *	1996-12-27	2000-05-09	Tokyo Electron Limited	Probe card attaching mechanism
US6107813A (en) *	1994-04-11	2000-08-22	Xandex, Inc.	Probe card changer system and method
US20030178987A1 (en) *	2001-08-07	2003-09-25	Masaru Suzuki	Probe card carrier and method of carrying probe card
CN1608336A (en) *	2001-12-28	2005-04-20	日本发条株式会社	Test socket
TW201044497A (en) *	2009-06-12	2010-12-16	Signality System Engineering Co Ltd	Test board and jig thereof

2011
- 2011-03-09 TW TW100107829A patent/TW201237419A/en not_active IP Right Cessation

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6107813A (en) *	1994-04-11	2000-08-22	Xandex, Inc.	Probe card changer system and method
US6060892A (en) *	1996-12-27	2000-05-09	Tokyo Electron Limited	Probe card attaching mechanism
US20030178987A1 (en) *	2001-08-07	2003-09-25	Masaru Suzuki	Probe card carrier and method of carrying probe card
CN1608336A (en) *	2001-12-28	2005-04-20	日本发条株式会社	Test socket
TW201044497A (en) *	2009-06-12	2010-12-16	Signality System Engineering Co Ltd	Test board and jig thereof

Also Published As

Publication number	Publication date
TW201237419A (en)	2012-09-16

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Legal Events

Date	Code	Title	Description
2017-11-01	MM4A	Annulment or lapse of patent due to non-payment of fees