TWI404164B - Tool for identifying substrate and method for identifying substrate - Google Patents
Tool for identifying substrate and method for identifying substrate Download PDFInfo
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- TWI404164B TWI404164B TW97134072A TW97134072A TWI404164B TW I404164 B TWI404164 B TW I404164B TW 97134072 A TW97134072 A TW 97134072A TW 97134072 A TW97134072 A TW 97134072A TW I404164 B TWI404164 B TW I404164B
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- 239000000758 substrate Substances 0.000 title claims abstract description 173
- 238000000034 method Methods 0.000 title claims abstract description 23
- -1 polytetrafluoroethylene Polymers 0.000 claims description 11
- 239000004743 Polypropylene Substances 0.000 claims description 5
- 239000004698 Polyethylene Substances 0.000 claims description 4
- 229920000573 polyethylene Polymers 0.000 claims description 4
- 229920001155 polypropylene Polymers 0.000 claims description 4
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 4
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 4
- 229920000915 polyvinyl chloride Polymers 0.000 claims description 2
- 150000001336 alkenes Chemical class 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 238000010410 dusting Methods 0.000 description 1
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Abstract
Description
本發明是有關於一種辨識治具與辨識方法,且特別是有關於一種基板辨識治具與基板的辨識方法。The invention relates to an identification fixture and an identification method, and in particular to a method for identifying a substrate identification fixture and a substrate.
隨著平面顯示技術的進步加上平面顯示裝置具有重量輕、體積小及省電等優點,平面顯示裝置已愈來愈普及。常見的平面顯示裝置有液晶顯示裝置、電漿顯示裝置(Plasma Display Panel,PDP)、有機發光二極體顯示裝置(Organic Light Emitting Diode Display,OLED Display)以及電泳顯示裝置(Electrophoretic Display,EPD)等,其中又以液晶顯示裝置的普及率最高。With the advancement of flat display technology and the advantages of flat display devices such as light weight, small size, and power saving, flat display devices have become more and more popular. Common flat display devices include liquid crystal display devices, plasma display panels (PDPs), organic light emitting diode displays (OLED Display), and electrophoretic display devices (EPD). Among them, the popularity of liquid crystal display devices is the highest.
一般而言,平面顯示裝置的製作方法通常是將一或多個顯示單元形成於基板上,之後再切割此基板。上述之基板可為剛性基板或軟性基板,其中常見的剛性基板為玻璃基板。隨著平面顯示裝置的不同,基板的尺寸也不同,而為了便於辨識剛性基板的尺寸與厚度,剛性基板的角落通常會有一辨識缺口,且不同尺寸或不同厚度的剛性基板其辨識缺口的形狀不同。In general, a flat display device is generally fabricated by forming one or more display units on a substrate and then cutting the substrate. The substrate described above may be a rigid substrate or a flexible substrate, wherein a common rigid substrate is a glass substrate. The size of the substrate varies according to the planar display device. In order to facilitate the identification of the size and thickness of the rigid substrate, the corners of the rigid substrate usually have an identification gap, and the shape of the identification gap of the rigid substrate of different sizes or thicknesses is different. .
圖1是習知技術中辨識剛性基板之辨識缺口的示意圖。請參照圖1,基板50上的辨識缺口52為三角形缺口,由於此辨識缺口52的邊長不長(通常小於5釐米),所以需藉由一放大鏡來量測此辨識缺口52的邊長。習知技術所使用的放大鏡之觀景窗設有刻度尺60,以便於測量辨識缺口52的邊長。FIG. 1 is a schematic diagram of identifying an identification gap of a rigid substrate in the prior art. Referring to FIG. 1, the identification notch 52 on the substrate 50 is a triangular notch. Since the side of the identification notch 52 is not long (usually less than 5 cm), the side length of the identification notch 52 needs to be measured by a magnifying glass. The viewing window of the magnifying glass used in the prior art is provided with a scale 60 for measuring the length of the side of the identification notch 52.
然而,由於辨識缺口52的邊長不長,且不同尺寸的基板50其辨識缺口52之邊長的差異不大,所以容易發生人為誤判的情形。此外,基板50具有一正面以及與此正面相對的一反 面,而顯示單元需形成於基板50的正面上。若顯示單元形成於基板50的背面,則會導致不良品的產生。但是,習知技術之辨識方法無法直接判斷基板50的正面朝向何方。However, since the side length of the identification notch 52 is not long, and the difference in the length of the side of the identification gap 52 of the substrate 50 of different sizes is not large, it is easy to cause a human error. In addition, the substrate 50 has a front side and a counter opposite to the front side The display unit needs to be formed on the front surface of the substrate 50. If the display unit is formed on the back surface of the substrate 50, the occurrence of defective products may result. However, the identification method of the prior art cannot directly judge where the front side of the substrate 50 is oriented.
本發明提供一種基板辨識治具,以提升基板辨識的準確度。The invention provides a substrate identification fixture to improve the accuracy of substrate identification.
本發明另提供一種基板的辨識方法,以提升基板辨識的準確度。The invention further provides a method for identifying a substrate to improve the accuracy of substrate identification.
為達上述優點,本發明提出一種基板辨識治具,其包括第一臂、第二臂以及辨識部。第二臂連接第一臂,第一臂與第二臂之延伸方向不同,且第一臂的長度大於第二臂的長度。辨識部是設置於第一臂與第二臂之間,其中辨識部具有接觸邊。In order to achieve the above advantages, the present invention provides a substrate identification jig including a first arm, a second arm, and an identification portion. The second arm is coupled to the first arm, the first arm and the second arm extending in different directions, and the length of the first arm is greater than the length of the second arm. The identification portion is disposed between the first arm and the second arm, wherein the identification portion has a contact edge.
在本發明之一實施例中,上述之接觸邊為斜邊。In an embodiment of the invention, the contact edge is a beveled edge.
在本發明之一實施例中,上述之第一臂垂直於第二臂。In an embodiment of the invention, the first arm is perpendicular to the second arm.
在本發明之一實施例中,上述之辨識部的形狀為直角三角形。辨識部的第一邊與第二邊是分別連接第一臂與第二臂,且辨識部的接觸邊是連接於第一邊與第二邊之間。In an embodiment of the invention, the shape of the identification portion is a right triangle. The first side and the second side of the identification portion are respectively connected to the first arm and the second arm, and the contact edge of the identification portion is connected between the first side and the second side.
在本發明之一實施例中,上述之辨識部之表面上設有辨識記號。In an embodiment of the invention, the identification portion is provided with an identification mark on the surface.
在本發明之一實施例中,上述之辨識記號包括數字、文字或圖形。In an embodiment of the invention, the identification token comprises a number, a text or a graphic.
在本發明之一實施例中,上述之第一臂、第二臂以及辨識部是一體成型。In an embodiment of the invention, the first arm, the second arm and the identification portion are integrally formed.
在本發明之一實施例中,上述之第一臂、第二臂以及辨識部的材質包括聚四氟乙烯(polytetrafluoroethylene,PTFE)、聚氯乙烯(polyvinyl chloride,PVC)、聚丙烯(polypropylene,PP) 或聚乙烯(polyethylene,PE)。In an embodiment of the invention, the material of the first arm, the second arm and the identification part comprises polytetrafluoroethylene (PTFE), polyvinyl chloride (PVC), polypropylene (polypropylene, PP). ) Or polyethylene (PE).
在本發明之一實施例中,上述之基板辨識治具更包括把手,其連接第一臂或第二臂。In an embodiment of the invention, the substrate identification fixture further includes a handle connected to the first arm or the second arm.
為達上述優點,本發明提出一種基板的辨識方法,其適於辨識基板,而此基板之角落具有辨識缺口。此基板的辨識方法包括下列步驟:首先,提供一基板辨識治具,此基板辨識治具包括一辨識部。接著,藉由辨識部來檢驗辨識缺口。當辨識部與辨識缺口吻合時,則判定基板為所需之基板。In order to achieve the above advantages, the present invention provides a method for identifying a substrate, which is suitable for identifying a substrate, and the corner of the substrate has an identification gap. The method for identifying the substrate includes the following steps: First, a substrate identification fixture is provided, and the substrate identification fixture includes an identification portion. Next, the identification gap is checked by the identification unit. When the identification portion coincides with the identification notch, it is determined that the substrate is a desired substrate.
由於本發明之基板辨識治具有辨識部,所以可藉由檢驗基板上的辨識缺口與辨識部是否吻合來判斷待辨識的基板是否為所需之基板,如此可減少發生人為誤判的機率。因此,本發明之基板辨識治具能提高辨識準確度。此外,由於本發明之基板的辨識方法是藉由基板辨識治具來檢驗基板的辨識缺口,以判斷待辨識的基板是否為所需之基板。由於本發明之基板的辨識方法較為容易,所以能減少發生人為誤判的機率,進而提高辨識準確度。Since the substrate identification method of the present invention has an identification portion, it can be determined whether the substrate to be recognized is a desired substrate by checking whether the identification gap on the substrate matches the identification portion, thereby reducing the probability of occurrence of human error. Therefore, the substrate identification jig of the present invention can improve the identification accuracy. In addition, since the identification method of the substrate of the present invention is to check the identification gap of the substrate by the substrate identification jig to determine whether the substrate to be identified is the desired substrate. Since the identification method of the substrate of the present invention is relatively easy, the probability of occurrence of human error can be reduced, and the recognition accuracy can be improved.
為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。The above and other objects, features and advantages of the present invention will become more <RTIgt;
圖2是本發明一實施例之一種基板辨識治具的示意圖。請參照圖2,本實施例之基板辨識治具100包括第一臂110、第二臂120以及辨識部130。第二臂120連接第一臂110,第一臂110的長度大於第二臂120的長度,第一臂110與第二臂120之延伸方向不同,且具有一夾角。辨識部130是設置於第一臂110與第二臂120之間的夾角中,其中辨識部130具有接觸邊132。2 is a schematic view of a substrate identification jig according to an embodiment of the present invention. Referring to FIG. 2 , the substrate identification fixture 100 of the embodiment includes a first arm 110 , a second arm 120 , and an identification unit 130 . The second arm 120 is connected to the first arm 110. The length of the first arm 110 is greater than the length of the second arm 120. The first arm 110 and the second arm 120 extend in different directions and have an included angle. The identification portion 130 is disposed in an angle between the first arm 110 and the second arm 120 , wherein the identification portion 130 has a contact edge 132 .
在本實施例中,上述之第一臂110例如是垂直於第二臂120,而辨識部130的接觸邊132例如為斜邊。更詳細地說,辨識部130的形狀例如直角三角形,辨識部130的第一邊134連接第一臂110,而辨識部130的第二邊136連接第二臂,且辨識部130的第一邊134的長度可以是大、等於或小於第二邊136的長度,可以視待辨識之不同型號的基板之辨識缺口而定。辨識部130的接觸邊132是連接於第一邊134與第二邊136之間。換言之,接觸邊132是直角三角形的斜邊。另外,辨識部130之表面138上設有辨識記號139,而設有辨識記號139的表面138可視為辨識部130的正面。此辨識記號139可為數字、文字或圖形,而在圖2中是以三角形作為辨識記號139。In the present embodiment, the first arm 110 is perpendicular to the second arm 120, for example, and the contact edge 132 of the identification portion 130 is, for example, a beveled edge. In more detail, the shape of the identification portion 130 is, for example, a right triangle, the first side 134 of the identification portion 130 is connected to the first arm 110, and the second side 136 of the identification portion 130 is connected to the second arm, and the first side of the identification portion 130 is The length of 134 may be large, equal to or less than the length of the second side 136, depending on the identification gap of the different types of substrates to be identified. The contact edge 132 of the identification portion 130 is connected between the first side 134 and the second side 136. In other words, the contact edge 132 is the hypotenuse of a right triangle. In addition, the surface 138 of the identification portion 130 is provided with an identification mark 139, and the surface 138 provided with the identification mark 139 can be regarded as the front surface of the identification portion 130. The identification mark 139 can be a number, a text or a figure, and in FIG. 2, a triangle is used as the identification mark 139.
上述之第一臂110、第二臂120以及辨識部130可以是一體成型。此外,第一臂110、第二臂120以及辨識部130的材質可為聚四氟乙烯、聚氯乙烯、聚丙烯、聚乙烯或其他不發塵的材質。The first arm 110, the second arm 120, and the identification portion 130 described above may be integrally formed. In addition, the material of the first arm 110, the second arm 120, and the identification portion 130 may be polytetrafluoroethylene, polyvinyl chloride, polypropylene, polyethylene, or other non-dusting materials.
由於基板(如玻璃基板或其他剛性基板,或是軟性基板)根據其尺寸及厚度可區分成多種型號,本實施例之基板辨識治具100可視待辨識不同型號的基板而具有不同形狀之辨識部130。具體而言,由於不同型號的基板其角落通常具有不同形狀的辨識缺口,以供基板辨識人員進行辨識,所以針對不同型號的基板可設計出不同的基板辨識治具100。換言之,每一種基板辨識治具100是對應一種型號的基板。以下將介紹本發明一實施例之基板的辨識方法。Since the substrate (such as a glass substrate or other rigid substrate or a flexible substrate) can be divided into a plurality of types according to the size and thickness thereof, the substrate identification jig 100 of the present embodiment can be identified by different types of substrates to have different shapes. 130. In particular, since the corners of different types of substrates generally have different shapes of identification gaps for the substrate identification personnel to identify, different substrate identification fixtures 100 can be designed for different types of substrates. In other words, each of the substrate identification jigs 100 is a substrate of one type. Hereinafter, a method of identifying a substrate according to an embodiment of the present invention will be described.
圖3A與圖3B是本發明一實施例之基板的辨識方法的流程圖。請參照圖3A與圖3B,本實施例之基板的辨識方法包括 下列步驟:首先,如圖3A所示,提供一基板辨識治具100,且此基板辨識治具100包括辨識部130。本實施例所使用的基板辨識治具是圖2所示之基板辨識治具100。此外,基板辨識治具100是用以辨識特定型號的基板。在本實施例中,基板辨識治具100例如是用以判斷待辨識的基板70是否為第一型號的基板。3A and 3B are flowcharts showing a method of identifying a substrate according to an embodiment of the present invention. Referring to FIG. 3A and FIG. 3B, the method for identifying the substrate of the embodiment includes The following steps are as follows: First, as shown in FIG. 3A, a substrate identification jig 100 is provided, and the substrate identification jig 100 includes an identification portion 130. The substrate identification jig used in this embodiment is the substrate identification jig 100 shown in FIG. 2. In addition, the substrate identification jig 100 is used to identify a specific type of substrate. In the embodiment, the substrate identification jig 100 is used to determine whether the substrate 70 to be identified is the first type of substrate.
接著,藉由基板辨識治具100的辨識部130來檢驗基板70的辨識缺口72。更詳細地說,基板70具有長邊74與短邊76,以及連接長邊74與短邊76之辨識缺口72,而藉由基板辨識治具100的辨識部130來檢驗基板70的辨識缺口72之步驟是先使基板辨識治具100的第一臂110位於基板70的長邊74旁,並使基板辨識治具100的第二臂120位於基板70的短邊76旁。之後,再使基板辨識治具100的辨識部130之接觸邊136接觸辨識缺口72的表面73。當基板辨識治具100的辨識部130與基板70的辨識缺口72吻合時(如圖3B所示),則判定基板70為所需之基板(即第一型號的基板)。反之,當基板辨識治具100的辨識部130與基板70的辨識缺口72不吻合時,則判定基板70不是第一型號的基板。Next, the identification gap 72 of the substrate 70 is inspected by the identification portion 130 of the substrate identification jig 100. In more detail, the substrate 70 has a long side 74 and a short side 76, and an identification notch 72 connecting the long side 74 and the short side 76, and the identification gap of the substrate 70 is checked by the identification portion 130 of the substrate identification jig 100. The first step of the substrate identification fixture 100 is located next to the long side 74 of the substrate 70, and the second arm 120 of the substrate identification fixture 100 is positioned beside the short side 76 of the substrate 70. Thereafter, the contact edge 136 of the identification portion 130 of the substrate identification jig 100 is brought into contact with the surface 73 of the identification notch 72. When the identification portion 130 of the substrate identification jig 100 coincides with the identification notch 72 of the substrate 70 (as shown in FIG. 3B), it is determined that the substrate 70 is a desired substrate (ie, a substrate of the first type). On the other hand, when the identification portion 130 of the substrate identification jig 100 does not coincide with the identification notch 72 of the substrate 70, it is determined that the substrate 70 is not the first type of substrate.
本實施例之基板的辨識方法只要藉由檢驗基板辨識治具100的辨識部130與基板70上的辨識缺口72是否吻合,即可辨識待辨識的基板70是否為所需之基板,由於辨識的方法較為容易,所以可降低發生人為誤判的機率。因此,本實施例之基板的辨識方法以及其所使用的基板辨識治具100能有效提升基板辨識的準確度。The method for identifying the substrate of the present embodiment can be used to identify whether the substrate 70 to be identified is a desired substrate by checking whether the identification portion 130 of the substrate identification jig 100 matches the identification notch 72 on the substrate 70. The method is relatively easy, so it can reduce the chance of human error. Therefore, the method for identifying the substrate of the present embodiment and the substrate identification jig 100 used therein can effectively improve the accuracy of substrate identification.
此外,為了避免基板辨識人員錯將基板辨識治具100的第一臂110與第二臂120分別置於基板70的短邊76旁與長邊 74旁而導致人為誤判,在基板辨識治具100的設計上,特別使第一臂110之長度大於第二臂120之長度。如此,基板辨識人員只要確認基板辨識治具100的長臂(即第一臂110)與短臂(即第二臂120)是分別位於基板70的長邊74旁以及短邊72旁,而由於此確認的方法容易,所以能避免發生人為誤判的情形。In addition, the first arm 110 and the second arm 120 of the substrate identification jig 100 are respectively placed next to the short side 76 of the substrate 70 and the long side in order to avoid the substrate identification person. The side of the 74 causes a human error. In the design of the substrate identification jig 100, the length of the first arm 110 is made larger than the length of the second arm 120. Thus, the substrate identifier needs to confirm that the long arm (ie, the first arm 110) and the short arm (ie, the second arm 120) of the substrate identification jig 100 are respectively located beside the long side 74 of the substrate 70 and next to the short side 72, This method of confirmation is easy, so that it is possible to avoid a situation in which human error is caused.
值得一提的是,由於基板70具有正面以及與正面相對的反面,且顯示單元需製作於基板70的正面上,所以為了辨識基板70的正面與反面,基板辨識治具100的辨識部130之表面138上設有辨識記號139。當基板辨識治具100辨識部130的接觸邊136完全承靠於基板70的辨識缺口72之表面73時,基板70之正面與設有辨識記號139的表面138是面向同一方向。換言之,在本實施例中,可藉由辨識記號139來判斷基板70的正面所面對的方向,如此可避免誤將顯示單元製作於基板70的背面上而導致不良品的產生。It is to be noted that, since the substrate 70 has a front surface and a reverse surface opposite to the front surface, and the display unit needs to be formed on the front surface of the substrate 70, in order to identify the front and back surfaces of the substrate 70, the identification portion 130 of the substrate identification jig 100 is An identification mark 139 is provided on the surface 138. When the contact edge 136 of the identification portion 130 of the substrate identification jig 100 completely bears against the surface 73 of the identification notch 72 of the substrate 70, the front surface of the substrate 70 and the surface 138 provided with the identification mark 139 face in the same direction. In other words, in the present embodiment, the direction in which the front surface of the substrate 70 faces can be determined by the identification mark 139, so that the display unit can be prevented from being mistakenly formed on the back surface of the substrate 70, resulting in defective products.
圖4是本發明另一實施例之一種基板辨識治具的示意圖。請參照圖4,本實施例之基板辨識治具100’與圖1之基板辨識治具相似,差別處在於基板辨識治具100’更包括把手140,其連接第一臂110。此把手140是供基板辨識人員握取,以方便基板辨識人員操作此基板辨識治具100’。此外,此把手140可與第一臂110一體成型。另外,在另一實施例中,此把手140可連接於第二臂120,且把手140亦可與第二臂120一體成型,同理可推,把手140亦可與板辨識治具100’一體成型。4 is a schematic diagram of a substrate identification jig according to another embodiment of the present invention. Referring to FIG. 4, the substrate identification jig 100' of the present embodiment is similar to the substrate identification jig of FIG. 1. The difference is that the substrate identification jig 100' further includes a handle 140 connected to the first arm 110. The handle 140 is held by the substrate identification person to facilitate the substrate identification person to operate the substrate identification fixture 100'. In addition, the handle 140 can be integrally formed with the first arm 110. In addition, in another embodiment, the handle 140 can be connected to the second arm 120, and the handle 140 can also be integrally formed with the second arm 120. Similarly, the handle 140 can also be integrated with the board identification fixture 100'. forming.
綜上所述,本發明至少具有下列優點:1.本發明之基板辨識治具有辨識部,而藉由檢驗基板上的辨識缺口與辨識部是否吻合即可判斷待辨識的基板是否為所 需之基板。如此,可減少發生人為誤判的機率,所以本發明之基板辨識治具能提高辨識準確度。In summary, the present invention has at least the following advantages: 1. The substrate identification process of the present invention has an identification portion, and it can be determined whether the substrate to be identified is a device by checking whether the identification gap on the substrate matches the identification portion. The substrate needed. In this way, the probability of occurrence of human error can be reduced, so the substrate identification jig of the present invention can improve the identification accuracy.
2.本發明之基板的辨識方法是藉由基板辨識治具來檢驗基板的辨識缺口,由於只需檢驗基板上的辨識缺口與辨識部是否吻合,所以能減少發生人為誤判的機率,進而提高辨識準確度。2. The method for identifying the substrate of the present invention is to verify the identification gap of the substrate by using the substrate identification jig. Since it is only necessary to check whether the identification gap on the substrate matches the identification portion, the probability of human error can be reduced, thereby improving the identification. Accuracy.
3.於基板辨識治具的辨識部之表面上設置辨識記號能幫助基板辨識人員判斷基板的正面所面對的方向,以避免誤將顯示單元製作於基板的背面上,進而導致不良品的產生。3. Providing the identification mark on the surface of the identification part of the substrate identification jig can help the substrate identification person to judge the direction facing the front side of the substrate, so as to avoid accidentally making the display unit on the back surface of the substrate, thereby causing defective products. .
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and it is intended to be a part of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.
50‧‧‧基板50‧‧‧Substrate
52、72‧‧‧辨識缺口52, 72‧‧‧ Identification gap
60‧‧‧刻度尺60‧‧‧ scale
70‧‧‧基板70‧‧‧Substrate
73、138‧‧‧表面73, 138‧‧‧ surface
74‧‧‧長邊74‧‧‧ long side
76‧‧‧短邊76‧‧‧ Short side
100‧‧‧基板辨識治具100‧‧‧Substrate identification fixture
110‧‧‧第一臂110‧‧‧First arm
120‧‧‧第二臂120‧‧‧second arm
130‧‧‧辨識部130‧‧‧ Identification Department
132‧‧‧接觸邊132‧‧‧Contact side
134‧‧‧第一邊134‧‧‧ first side
136‧‧‧第二邊136‧‧‧ second side
139‧‧‧辨識記號139‧‧‧ Identification marks
140‧‧‧把手140‧‧‧Handle
圖1是習知技術中辨識剛性基板之辨識缺口的示意圖。FIG. 1 is a schematic diagram of identifying an identification gap of a rigid substrate in the prior art.
圖2是本發明一實施例之一種基板辨識治具的示意圖。2 is a schematic view of a substrate identification jig according to an embodiment of the present invention.
圖3A與圖3B是本發明一實施例之基板的辨識方法的流程圖。3A and 3B are flowcharts showing a method of identifying a substrate according to an embodiment of the present invention.
圖4是本發明另一實施例之一種基板辨識治具的示意圖。4 is a schematic diagram of a substrate identification jig according to another embodiment of the present invention.
100‧‧‧基板辨識治具100‧‧‧Substrate identification fixture
110‧‧‧第一臂110‧‧‧First arm
120‧‧‧第二臂120‧‧‧second arm
130‧‧‧辨識部130‧‧‧ Identification Department
132‧‧‧接觸邊132‧‧‧Contact side
134‧‧‧第一邊134‧‧‧ first side
136‧‧‧第二邊136‧‧‧ second side
138‧‧‧表面138‧‧‧ surface
139‧‧‧辨識記號139‧‧‧ Identification marks
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97134072A TWI404164B (en) | 2008-09-05 | 2008-09-05 | Tool for identifying substrate and method for identifying substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97134072A TWI404164B (en) | 2008-09-05 | 2008-09-05 | Tool for identifying substrate and method for identifying substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201011852A TW201011852A (en) | 2010-03-16 |
| TWI404164B true TWI404164B (en) | 2013-08-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97134072A TWI404164B (en) | 2008-09-05 | 2008-09-05 | Tool for identifying substrate and method for identifying substrate |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI404164B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0393951A2 (en) * | 1989-04-17 | 1990-10-24 | Shin-Etsu Handotai Company Limited | Semiconductor silicon wafer and manufacturing method thereof |
| JP2004212500A (en) * | 2002-12-27 | 2004-07-29 | Optrex Corp | Liquid crystal display panel |
| TW200419660A (en) * | 2003-03-28 | 2004-10-01 | Sumitomo Electric Industries | Obverse/reverse discriminative rectangular nitride semiconductor wafer |
| JP2008041773A (en) * | 2006-08-02 | 2008-02-21 | Shin Etsu Polymer Co Ltd | Substrate storage container and identification member |
-
2008
- 2008-09-05 TW TW97134072A patent/TWI404164B/en not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0393951A2 (en) * | 1989-04-17 | 1990-10-24 | Shin-Etsu Handotai Company Limited | Semiconductor silicon wafer and manufacturing method thereof |
| JP2004212500A (en) * | 2002-12-27 | 2004-07-29 | Optrex Corp | Liquid crystal display panel |
| TW200419660A (en) * | 2003-03-28 | 2004-10-01 | Sumitomo Electric Industries | Obverse/reverse discriminative rectangular nitride semiconductor wafer |
| JP2008041773A (en) * | 2006-08-02 | 2008-02-21 | Shin Etsu Polymer Co Ltd | Substrate storage container and identification member |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201011852A (en) | 2010-03-16 |
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