TWI403738B - Test device and its glue removal module and method for manufacturing solar battery - Google Patents

Abstract

A test apparatus for a solar cell includes a test module and a trimming module. The test module is adapted to provide a test signal and the test module has a first test wire and a second test wire. The first test wire is adapted to electrically connect to at least one of a positive wire and a negative wire of the solar cell. The trimming module includes a trimming element and a test head beside the trimming element. The trimming element is adapted to trim overflowing adhesive from an edge of an adhesive layer of the solar cell. The test head is adapted to contact the adhesive layer of the solar cell and the second test wire is electrically connected to the test head. The test apparatus can improve manufacture efficiency of the solar cell. A trimming module and a manufacturing method are also provided.

Description

Test device and its glue removal module and method for manufacturing solar battery

This invention relates to a test device and, more particularly, to a test device for testing a solar cell.

Solar energy is an inexhaustible and inexhaustible source of energy. With the rising awareness of environmental protection and the energy crisis, the application of solar energy has received more and more attention. Among them, solar cells are a common type of solar energy. Application products.

1 is a schematic view of a conventional solar cell. Referring to FIG. 1 , the solar cell 100 mainly includes a first glass substrate 110 , a sealant layer 120 , and a second glass substrate 130 . A method of manufacturing the solar cell 100 is to form a photoelectric conversion unit (not shown) and a positive electrode 142 and a negative electrode 144 electrically connected to the photoelectric conversion unit before the first glass substrate 110. Next, a sealant layer 120 is formed on the photoelectric conversion unit. Then, the second glass substrate 130 is stacked on the sealant layer 120 to adhere the second glass substrate 130 to the first glass substrate 110 through the sealant layer 120, and the positive electrode lead 142 and the negative lead 144 are connected to the through hole 146. And outside the second glass substrate 130.

Then, a degumming process is performed to scrape off the edge of the sealant layer 120. Thereafter, the positive electrode lead 142 and the negative electrode lead 144 are connected through a junction box (not shown). Next, the first glass substrate 110 and the second glass substrate 130 are fixed by an aluminum frame (not shown). Then, a high voltage test is performed to test whether the solar cell 100 is leaking. After that, the amount of power generation of the solar cell 100 is tested.

The above-mentioned high-voltage test method can be divided into a dry test mode and a wet test mode, wherein the dry test method is to connect the two test probes of the test module to the junction box and the aluminum frame, respectively, and pass the high voltage power to Test the aluminum frame for current. Since bubbles may be generated at the edge of the sealant layer 120, a recess may be formed at the original bubble after the stripping process. Test accuracy is reduced because the recess cannot be in contact with the aluminum frame. In addition, the wet test method does not require an aluminum frame, but the entire solar cell 100 needs to be immersed in water for testing, so it takes time and additional equipment to dry the solar cell 100.

Based on the above, since the manufacturing method of the conventional solar cell 100 includes many steps, the production efficiency of the solar cell 100 is inferior. Therefore, how to improve the production efficiency of solar cells has become an important issue.

The invention provides a testing device which can simultaneously perform a degumming and high-voltage testing process for a solar cell, so that the production efficiency of the solar cell can be improved.

The invention further provides a degumming module, which can be electrically connected to the test module when removing the edge overflow of the solar cell, so that the test module can perform high voltage test on the solar cell, thereby improving the production efficiency of the solar cell. .

The invention further provides a method for manufacturing a solar cell, which simplifies the production steps of the solar cell, thereby improving the production efficiency of the solar cell.

To achieve the above advantages, the present invention proposes a test apparatus suitable for use in a solar cell. The test device includes a test module and a glue removal module. The test module is adapted to provide a test signal, and the test module has a first test line and a second test line. The first test circuit is adapted to be electrically connected to at least one of a positive lead and a negative lead of the solar cell. The glue removal module includes a glue removal component and a test head. The stripping member is adapted to remove the edge overflow of the sealing layer of the solar cell, and the test head is adjacent to the stripping member. The test head is adapted to contact the sealant layer of the solar cell, and the second test circuit is electrically connected to the test head.

In an embodiment of the invention, the test apparatus further includes a movable carrier. The movable carrier is adapted to carry a solar cell and to move the solar cell.

In an embodiment of the invention, the stripping module further includes a moving member, and the moving member is adapted to drive the stripping member and the test head to move around the solar cell.

In an embodiment of the invention, the stripping module further includes a connecting member for connecting the stripping member and the test head.

In an embodiment of the invention, the stripping member comprises a hot knife.

In an embodiment of the invention, the test head includes a body and a contact, wherein the contact member telescopically protrudes outside the body, and the contact member is adapted to contact the sealant layer of the solar cell.

In an embodiment of the invention, the test head further includes an elastic member between the body and the contact member.

In an embodiment of the invention, the test head further includes a joint portion at the body, and the second test circuit is adapted to be disposed in the joint portion to be electrically connected to the test head.

In an embodiment of the invention, the solar cell has a junction box electrically connected to the positive lead and the negative lead, and the first test line is adapted to be electrically connected to the positive lead of the solar cell through the junction box. At least one of the negative wires.

In order to achieve the above advantages, the present invention further provides a degumming module suitable for use in a solar cell. The glue removal module comprises a glue removal component and a test head. The stripping member is adapted to remove the edge overflow of the sealing layer of the solar cell, and the test head is adjacent to the stripping member, and the test head is adapted to contact the sealant layer of the solar cell.

In order to achieve the above advantages, the present invention further provides a method of manufacturing a solar cell comprising the steps of: first, providing a first substrate. A photoelectric conversion unit is formed on the first substrate, and a positive electrode wire and a negative electrode wire are electrically connected to the photoelectric conversion unit. Thereafter, a sealant layer is formed on the photoelectric conversion unit. Next, the second substrate is assembled on the sealing layer, wherein at least a consistent hole is formed in the second substrate and the sealing layer to expose the positive electrode and the negative wire. Then, the edge of the sealant layer is removed and the high pressure test is performed at the same time.

In an embodiment of the present invention, the step of forming the second substrate on the sealing layer is, for example, first placing the second substrate on the sealing layer, and then combining the first substrate and the sealing layer with the second substrate. The second substrate is subjected to a pressure heating process.

In an embodiment of the invention, the step of removing the edge of the sealant layer and simultaneously performing the high voltage test is, for example, first providing the above test device. Thereafter, the first test line is electrically connected to at least one of the positive lead and the negative lead, and the second test line is electrically connected to the test head, and the test head is brought into contact with the sealant layer. Then, the edge of the sealant layer is removed by the stripping member, and at the same time, the test signal is sent by the test module to perform the high voltage test.

In an embodiment of the invention, the step of electrically connecting the first test line to at least one of the positive lead and the negative lead comprises electrically connecting the first test line to the positive lead and the negative lead by a junction box At least one of them.

In an embodiment of the invention, the method for removing the edge overflow of the sealant layer comprises moving the glue removal module.

In an embodiment of the invention, the method for removing the edge overflow of the sealant layer comprises moving the assembled first substrate, the sealant layer and the second substrate.

In an embodiment of the invention, after the step of removing the edge of the sealant layer and simultaneously performing the high voltage test, the method further comprises electrically connecting the junction box to the positive lead and the negative lead.

Since the test device of the invention includes the test module and the glue removal module, the solar cell can be simultaneously subjected to the degumming and high pressure test process, thereby improving the production efficiency of the solar cell. In addition, the stripping module of the present invention includes a stripping member for removing the edge of the sealant layer and a test head for electrically connecting to the test module, so that the test can be performed during the stripping process. The module simultaneously performs high voltage testing on the solar cell. Therefore, the degumming module of the present invention can improve the production efficiency of the solar cell. In addition, since the method for manufacturing a solar cell of the present invention simultaneously performs high-pressure testing while removing the edge of the sealant layer, the production steps of the solar cell can be simplified, and the production efficiency of the solar cell can be improved.

The above and other objects, features and advantages of the present invention will become more <RTIgt;

2 is a schematic diagram of a test apparatus for testing a solar cell according to an embodiment of the present invention. Referring to FIG. 2, the testing device 200 of the present embodiment is applied to the solar cell 300. The solar cell 300 includes, for example, a first substrate 310, a sealant layer 320, and a second substrate 330, wherein the sealant layer 320 is located between the first substrate 310 and the second substrate 330. A photoelectric conversion unit (not shown) for converting light energy into electrical energy is formed on the first substrate 310, and a positive electrode lead 342 and a negative electrode lead 344 are electrically connected to the photoelectric conversion unit. At least a uniform hole 346 is formed in the second substrate 330 and the sealant layer 320. The through hole 346 penetrates the second substrate 330 and the sealant layer 320 to expose the positive electrode lead 342 and the negative electrode lead 344.

The test apparatus 200 of the present embodiment can be applied to the manufacturing process of the solar cell 300. After the combined first substrate 310, the sealing layer 320 and the second substrate 330 are subjected to a pressure heating process, the edge of the sealing layer 320 can be removed by the testing device 200 of the embodiment and the high voltage test can be simultaneously performed. . The test apparatus 200 of the present embodiment will be described in detail below.

The testing device 200 of the embodiment includes a test module 210 and a stripping module 220. The test module 210 is adapted to provide a test signal, and the test module 210 has a first test line 212 and a second test line 214. The glue removal module 220 includes a glue removal member 222 and a test head 224. The stripping member 222 is adapted to remove the edge overflow of the sealant layer 320 of the solar cell 300, and the test head 224 is adjacent to the stripping member 222. The test head 224 is adapted to contact the sealant layer 320 of the solar cell 300. In addition, the first test line 212 is adapted to be electrically connected to at least one of the positive lead 342 and the negative lead 344 of the solar cell 300, and the second test line 214 is electrically connected to the test head 224, so that the test pattern can be After the test signal is provided by the group 210, the test head 224 is used to test whether the sealant layer 320 has leakage.

The first test line 212 may include a wire electrically connected to the positive lead 342 or the negative lead 344 or electrically connected to the positive lead 342 and the negative lead 344 at the same time. The first test line 212 can also include two wires that are electrically connected to the positive lead 342 and the negative lead 344, respectively. In addition, the second test line 214 described above may include a wire electrically connected to the test head 224. However, it is not limited to this, and the required connection method can be selected according to actual needs. In addition, the test signal provided by the test module 210 is a high voltage signal, and the voltage thereof is, for example, 1000 volts plus twice the working voltage, and the common working voltage is 110 volts or 220 volts, but not limited thereto, depending on the situation. Adjust the required test voltage.

3 is a schematic view showing the detailed structure of a test head according to an embodiment of the present invention. Referring to FIG. 2 and FIG. 3, the test head 224 includes a body 224a and a contact 224b, wherein the contact 224b is telescopically protruded from the body 224a, and the contact 224b is adapted to contact the seal of the solar cell 300. Layer 320. Specifically, the test head 224 may further include an elastic member 224c between the body 224a and the contact member 224b to make the contact member 224b stretchable, so that the contact effect of the contact member 224b with the sealant layer 320 can be improved. In addition, the test head 224 may further include a joint portion 224d at the body 224a, and the second test line 214 is adapted to be disposed in the joint portion 224d to be electrically connected to the test head 224. The joint portion 224d can be a plug electrically connected to the second test line 214 and inserted into the body 224a.

In addition, the above-mentioned stripping member 222 can be a hot knife, which can heat the sealing material of the sealing layer 320 to soften it, so that it is easier to remove the edge overflow of the sealing layer 320. In addition, the glue removing module 220 may further include a connecting member 226, which is connected to the stripping member 222 and the test head 224, but is not limited thereto, and may be adjusted according to actual needs, for example, the test head directly extends from the stripping member, and may be omitted. Connector.

In view of the above, there are two ways to remove the edge of the sealant layer 320. The first way is to move the glue removal module 220. Specifically, the glue removing module 220 may further include a moving member, and the moving member is adapted to drive the stripping member 222 and the test head 224 to move around the solar cell 300. In this embodiment, the moving member is integrated into the same component as the connecting member 226, but in other embodiments, the moving member and the connecting member 226 can be separate components, but is not limited thereto, and can be adjusted according to actual needs. In addition, when moving the stripping member 222 and the test head 224, the test head 224 may be located in front of or behind the direction in which the stripping member 222 travels. When the test head 224 is located behind the stripping member 222, since the edge of the sealant layer 320 has been removed by the stripping member 222, the edge of the sealant layer 320 contacted by the test head 224 is relatively flat. In this way, the wear of the test head 224 can be reduced, thereby increasing the service life of the test head 224.

The second way to remove the edge overflow is to move the solar cell 300. Please refer to FIG. 4, which is a schematic diagram of a test device for testing a solar cell according to another embodiment of the present invention. The test device 200' of the present embodiment utilizes the method of moving the solar cell 300 to remove the edge overflow of the sealant layer 320. Compared with the testing device 200, the testing device 200' of the present embodiment further includes a movable carrier 230 adapted to carry the solar cell 300 and move the solar cell 300 so that the stripping member 222 can scrape the sealing layer 320. The edge overflows. In addition, when the solar cell 300 is moved, the edge of the sealing layer 320 can be passed through the stripping member 222 and then contacted with the test head 224, thereby reducing the wear of the test head 224 and thereby increasing the service life of the test head 224. Of course, when the solar cell 300 is moved, the edge of the sealing layer 320 may be first contacted with the test head 224, and then removed by the stripping member 222.

Based on the above, since the test device 200, 200' includes the test module 210 and the glue removal module 220, the test module 210 can be used to test whether the sealant layer 320 is leaky, and at the same time, by the glue removal module 220. To remove the edge of the sealant layer 320. Therefore, the test apparatus 200, 200' of the present embodiment can simplify the production steps of the solar cell 300, thereby improving the production efficiency of the solar cell 300.

Figure 5 is a schematic illustration of the test apparatus of Figure 2 for testing another solar cell. Referring to FIG. 5, the solar cell 300' further includes a junction box 350 as compared to the solar cell 300 of FIG. The junction box 350 is electrically connected to the positive lead (not shown) and the negative lead (not shown) of the solar cell 300 ′, and the first test line 212 is adapted to be electrically connected to the solar cell 300 through the junction box 350 . 'At least one of the positive and negative wires. In more detail, the wire 352 of the junction box 350 is electrically connected to the positive wire, for example, and the wire 354 of the junction box 350 is electrically connected to the negative wire, for example, and the first test circuit 212 is electrically connected to the wire 352. At least one of the wires 354 is electrically connected to at least one of the positive and negative wires of the solar cell 300' through the junction box 350.

6A to 6E are flowcharts showing a method of manufacturing a solar cell according to an embodiment of the present invention. The manufacturing method of the solar cell of this embodiment includes the following steps: First, as shown in FIG. 6A, a first substrate 310 is provided. The first substrate 310 is, for example, a glass substrate or a plastic substrate. The first substrate 310 is formed with a photoelectric conversion unit 312, and the positive electrode lead 342 and the negative electrode lead 344 are electrically connected to the photoelectric conversion unit 312.

Thereafter, as shown in FIG. 6B, a sealant layer 320 is formed on the photoelectric conversion unit 312 to protect the photoelectric conversion unit 312. The encapsulating layer 320 is made of a high light transmissive encapsulating material, such as EVA (Ethylene Vinyl Acetate), polyvinyl butyral (PVB), etc. It is optical and is an insulating material for protecting the photoelectric conversion unit and preventing the solar cell from leaking.

Next, as shown in FIG. 6C, the second substrate 330 is assembled on the encapsulation layer 320. The second substrate 330 is, for example, a glass substrate or a plastic substrate, and at least a uniform hole 346 is formed in the second substrate 330 and the sealing layer 320. The through hole 346 penetrates the second substrate 330 and the sealant layer 320 to expose the positive electrode lead 342 and the negative electrode lead 344. In another embodiment, the second substrate 330 and the sealant layer 320 may be formed with two through holes 346 to expose the positive lead 342 and the negative lead 344, respectively. In addition, in the embodiment, the step of stacking the second substrate 330 on the sealing layer 320 is, for example, first placing the second substrate 330 on the sealing layer 320, and then sealing the combined first substrate 310 and the sealing substrate 320. The adhesive layer 320 and the second substrate 330 are subjected to a pressure heating process to cause the adhesive layer 320 to react viscously, and in combination with vacuum evacuation, the gas remains in the sealant layer 320. In this way, the second substrate 330 can be adhered to the first substrate 310 through the sealant layer 320. However, since the sealant layer 320 is softened and extruded, the sealant layer 320 may overflow at the edge of the sealant layer 320.

Then, as shown in FIG. 6D and FIG. 2, the edge of the sealant layer 320 is removed, and a high voltage test is simultaneously performed. In more detail, the step of removing the edge of the sealant layer 320 and simultaneously performing the high voltage test is, for example, first providing the above test apparatus 200 or 200', and in Fig. 6D, the test apparatus 200 is taken as an example. Thereafter, the first test line 212 is electrically connected to at least one of the positive lead 342 and the negative lead 344, and the second test line 214 is electrically connected to the test head 224, and the test head 224 is brought into contact with the sealant layer 320. . Then, the edge of the sealant layer 320 is removed by the stripping member 222, and at the same time, the test signal is sent by the test module 210 to perform a high voltage test, so that the sealant layer 320 can be tested for leakage through the test head 224. The situation.

The manner of electrically connecting the first test line 212 to at least one of the positive lead 342 and the negative lead 344 and the manner of removing the edge overflow of the sealant layer 320 have been described above, and will not be heavy here. Said.

Since the manufacturing method of the solar cell of the present embodiment integrates the edge overflow and the high voltage test in the same step, the production steps of the solar cell can be simplified, thereby improving the production efficiency of the solar cell.

In addition, in the manufacturing method of the solar cell of the embodiment, after the step of removing the edge of the sealing layer 320 and simultaneously performing the high voltage test, the wiring box 350 may be electrically connected to the positive electrode 342 and the negative wire. Step 344 (shown in Figure 6E). Further, in the step of electrically connecting the junction box 350 to the positive electrode lead 342 and the negative electrode lead 344, the step of filling the through hole 346 by an insulating material may be included.

In another embodiment, the junction box 350 can be electrically connected to the positive lead 342 and the negative lead 344 before the steps of removing the edge overflow and performing the high voltage test. As such, in the step of electrically connecting the first test line 212 to at least one of the positive lead 342 and the negative lead 344, the first test line 212 can be electrically connected to the positive lead 342 by the junction box 350. At least one of the negative lead wires 344 (shown in FIG. 5). That is to say, the step of assembling the junction box of the present invention can be adjusted according to actual needs before or after the step of removing the edge of the sealant layer and simultaneously performing the high voltage test.

In summary, the present invention has at least the following advantages:

1. The test device of the invention can perform the de-glue and high-voltage test process for the solar cell at the same time because the test module and the glue removal module are included, so that the production efficiency of the solar cell can be improved.

2. The stripping module of the present invention includes a stripping member for removing the edge overflow of the sealing layer and a test head for electrically connecting to the test module, so that the test can be performed during the stripping process. The module simultaneously performs high voltage testing on the solar cell. Therefore, the degumming module of the present invention can improve the production efficiency of the solar cell.

3. The method for manufacturing a solar cell of the present invention integrates the steps of removing the edge overflow and performing the high voltage test in the same step, thereby simplifying the production steps of the solar cell and further improving the production efficiency of the solar cell.

Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention, and it is intended to be a part of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.

100, 300, 300’. . . Solar battery

110. . . First glass substrate

120, 320. . . Sealing layer

130. . . Second glass substrate

142, 342. . . Positive lead

144, 344. . . Negative wire

146, 346. . . Through hole

200, 200’. . . Test device

210. . . Test module

212. . . First test line

214. . . Second test line

220. . . Glue removal module

222. . . Go to the plastic parts

224. . . Test head

224a. . . Ontology

224b. . . Contact

224c. . . Elastic part

224d. . . combination

226. . . Connector

230. . . Movable carrier

310. . . First substrate

312. . . Photoelectric conversion unit

330. . . Second substrate

350. . . Junction Box

352, 354. . . wire

1 is a schematic view of a conventional solar cell.

2 is a schematic diagram of a test apparatus for testing a solar cell according to an embodiment of the present invention.

3 is a schematic view showing the detailed structure of a test head according to an embodiment of the present invention.

4 is a schematic diagram of a test apparatus for testing a solar cell according to another embodiment of the present invention.

Figure 5 is a schematic illustration of the test apparatus of Figure 2 for testing another solar cell.

6A to 6E are flowcharts showing a method of manufacturing a solar cell according to an embodiment of the present invention.

200. . . Test device

210. . . Test module

212. . . First test line

214. . . Second test line

220. . . Glue removal module

222. . . Go to the plastic parts

224. . . Test head

226. . . Connector

300. . . Solar battery

310. . . First substrate

320. . . Sealing layer

330. . . Second substrate

342. . . Positive lead

344. . . Negative wire

346. . . Through hole

Claims (23)

A test device is applicable to a solar cell, the test device includes: a test module adapted to provide a test signal, and the test module has a first test line and a second test line, the first test line is suitable Electrically connecting to at least one of a positive lead and a negative lead of the solar cell; a stripping module comprising: a stripping member adapted to remove an edge of the adhesive layer of the solar cell And a test head connected to the stripping member, the test head being adapted to contact the sealant layer of the solar cell, and the second test circuit is electrically connected to the test head. The test device of claim 1, further comprising a movable carrier, and the movable carrier is adapted to carry the solar cell and move the solar cell. The testing device of claim 1, wherein the stripping module further comprises a moving member, and the moving member is adapted to drive the stripping member and the test head to move around the solar cell. The testing device of claim 1, wherein the stripping module further comprises a connecting member connecting the stripping member and the testing head. The test device of claim 1, wherein the stripping member comprises a hot knife. The test device of claim 1, wherein the test head comprises: a body; and a contact member telescopically protruding from the body, and the contact member is adapted to contact the seal of the solar cell Adhesive layer. The test device of claim 6, wherein the test head Furthermore, an elastic member is disposed between the body and the contact member. The test device of claim 6, wherein the test head further includes a joint portion located in the body, and the second test circuit is adapted to be disposed in the joint portion to be electrically connected to the test head. The test device of claim 1, wherein the solar cell has a junction box electrically connected to the positive lead and the negative lead, and the first test line is adapted to be electrically connected through the junction box Optionally connected to at least one of the positive lead and the negative lead of the solar cell. A glue removing module is suitable for a solar battery, the glue removing module comprises: a stripping member adapted to remove an edge overflow of an adhesive layer of the solar cell; and a test head, and the stripping member Connected, the test head is adapted to contact the sealant layer of the solar cell. The stripping module of claim 10, further comprising a moving member adapted to drive the stripping member and the test head to move around the solar cell. The stripping module of claim 10, wherein the stripping module further comprises a connecting member connecting the stripping member and the test head. The stripping module of claim 10, wherein the stripping member comprises a hot knife. The stripping module of claim 10, wherein the test head comprises: a body; and a contact member telescopically protruding from the body, and the contact member is adapted to contact the solar cell The sealant layer. The stripping module of claim 14, wherein the test head further comprises an elastic member between the body and the contact member. The stripping module of claim 14, wherein the test head further comprises a joint portion located on the body. A method for manufacturing a solar cell, comprising: providing a first substrate, a photoelectric conversion unit is formed on the first substrate, and a positive electrode and a negative electrode are electrically connected to the photoelectric conversion unit; and the photoelectric conversion unit is formed on the photoelectric conversion unit. a rubber layer; a second substrate is formed on the sealing layer, wherein the second substrate and the sealing layer are formed with at least a consistent hole to expose the positive electrode and the negative wire; and the sealing is removed The edges of the glue layer overflow and the high pressure test is performed at the same time. The method for manufacturing a solar cell according to claim 17, wherein the step of forming the second substrate on the sealant layer comprises: placing the second substrate on the sealant layer; The first substrate, the sealant layer and the second substrate are subjected to a pressure heating process. The method for manufacturing a solar cell according to claim 17, wherein the step of removing the edge overflow of the sealant layer and simultaneously performing the high voltage test comprises: providing a test device, the test device comprising a test module and a a glue removal module, the test module has a first test circuit and a second test circuit, the glue removal module includes an adjacent glue removal component and a test head; the first test circuit is electrically connected to Connecting at least one of the positive lead and the negative lead, electrically connecting the second test line to the test head, and contacting the test head with the sealant layer; and removing the sealant by the stripping member The edge of the layer overflows and at the same time the test signal is sent by the test module for high voltage testing. The method for manufacturing a solar cell according to claim 19, wherein the step of electrically connecting the first test line to at least one of the positive lead and the negative lead comprises: A test line is electrically connected to at least one of the positive lead and the negative lead. The method for manufacturing a solar cell according to claim 19, wherein the method of removing the edge overflow of the sealant layer comprises moving the stripping module. The method for manufacturing a solar cell according to claim 19, wherein the method of removing the edge overflow of the sealant layer comprises moving the assembled first substrate, the sealant layer and the second substrate. The method for manufacturing a solar cell according to claim 17, wherein after the step of removing the edge of the sealant layer and simultaneously performing the high voltage test, the method further comprises electrically connecting a junction box to the positive lead and The negative lead wire.