TWI402515B - Signal testing apparatus - Google Patents

Description

Signal test device

The invention relates to a signal testing device, in particular to a signal testing device for a host interface.

The host interface generally includes a DVI (Digital Visual Interface) interface, a VGA (Video Graphics Array) interface, a USB (Universal Serial Bus) interface, and an HDMI (High Definition Multimedia Interface). Sharpness multimedia interface). In order to ensure the normal use of external devices connected to these host interfaces, signal integrity testing is required for the electrical performance of these host interfaces. In the prior art, the test of the host interface is generally to direct the signal outputted by the host interface to be tested to a dedicated test device, and the probe (such as the two probes of the oscilloscope) is used to test the host interface. The signal output from the foot is measured. Since it is necessary to change the output signal of the host interface to be tested during the test, such as changing the output signal of the host VGA interface to change the resolution of the monitor, it is necessary to repeatedly plug and unplug the test device and the connection between the monitor and the VGA interface. Repeated insertion and removal wastes time, reduces the service life of the host interface and the probe, and easily leads to poor contact between the probe and the test interface of the host interface, which affects the test accuracy.

In view of the above, it is necessary to provide a signal testing device that does not require repeated insertion and removal of external devices and test devices to exchange connections with the host interface.

A signal testing device comprising:

A plurality of switches are selected, each of the two switches includes a static contact, a first dynamic contact and a second dynamic contact, and the static contacts of the two switches are corresponding to a plurality of host interfaces The first dynamic contact of the two selected switches is connected to a plurality of pins of a peripheral interface, and the plurality of pins to be tested of the host interface are corresponding to the complex reference of the peripheral interface. foot;

a plurality of switches, including a plurality of dynamic contacts and a static contact, each of the dynamic contacts of the plurality of switches being respectively associated with a second dynamic contact of a switch; and

a test end includes a first test point and a second test point, the first test point is connected to the static contact of the multi-select switch, and the second test point is grounded;

When the static contact of each of the two switches is connected to the first dynamic contact, the pin to be tested of the host interface is connected with the pin of the peripheral interface; when each of the two switches selects a static contact When connected to the second dynamic contact, each of the pins to be tested of the host interface is respectively connected to one of the dynamic contacts of the multi-select switch, and the static contact of the multi-select switch is selectively connected thereto. Dynamic contacts are connected to test the signal output from the host interface corresponding to the pin to be tested.

The signal testing device controls the connection between the host interface and the peripheral interface through the two selection switches, and selects a signal for testing the output of one of the host interfaces through the multi-selection switch, thereby avoiding the test device and the external device. Repeated insertion and removal and repeated insertion and removal of the oscilloscope probe on the test end extend the life of the host interface and the oscilloscope probe, shorten the test time, and improve the test accuracy.

Referring to FIG. 1 , a preferred embodiment of the signal testing device of the present invention includes a host interface connector 100 , a peripheral interface connector 200 , a first switch S1 , a second switch S2 , a third switch S3 , and a first switch S1 . The fourth switch S4, the fifth switch S5, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, and a test terminal J1.

The host interface connector 100 is used to connect to a host interface 101. The peripheral interface connector 200 is used to connect an interface of an external device (referred to as a peripheral interface) 201 that is compatible with the host interface 101. In this embodiment, the host interface connector 100 has eight pins P11~P18, which are respectively connected to the eight pins P21~P28 of the host interface 101 to be tested. The peripheral interface connector 200 has eight pins T11~T18, which are respectively connected to the eight pins T21~T28 of the peripheral interface 201. In this embodiment, the pins P21~P24 of the host interface 101 are pins to be tested, that is, the signal integrity tests of the pins P21~P24 to be tested on the host interface 101 are required.

The first switch S1 to the fourth switch S4 are both a switch and a switch, such as a single pole double throw switch. The first switch S1 to the fourth switch S4 each include a static contact 1, a first dynamic contact 2, and a second dynamic contact 3. The fifth switch S5 is a multi-select switch, such as a single-pole multi-throw switch. In the embodiment, the fifth switch S5 is a four-select switch, which includes a static contact A and four dynamic contacts A1~ A4. The static contacts 1 of the first switch S1 to the fourth switch S4 are respectively connected to the pins P11 to P14 of the host interface connector 100. The first dynamic contact 2 of the first switch S1 to the fourth switch S4 are respectively connected to the pins T11~T14 of the peripheral interface connector 200, and the second dynamic contact of the first switch S1 to the fourth switch S4 3 is respectively connected to the four dynamic contacts A1~A4 of the fifth switch S5. One ends of the first resistors R1 to R4 are respectively connected to the second dynamic contacts 3 of the first switch S1 to the fourth switch S4, and the other ends of the first resistors R1 to R4 are grounded. The first resistor R1 to the fourth resistor R4 are termination resistors for preventing signal reflection of the output pins P21~P24 of the host interface 101. The static contact A of the fifth switch S5 is connected to one of the first test points P1 of the test terminal J1, and the second test point P2 of the test terminal J2 is grounded. The test end J1 is a plug with two needles. The other pins P25~P28 of the host interface 101 to be tested do not need to be tested and the corresponding pins T25~T28 of the peripheral interface 201 are normally connected through the host interface connector 100 and the peripheral interface connector 200.

When the static contacts 1 of the first switch S1 to the fourth switch S4 are connected to the second dynamic contact 3, the signals of the pins P21 to P24 of the host interface 101 are transmitted to the fifth switch S5. Four dynamic contacts A1~A4. At this time, the static contact A of the fifth switch S5 is selectively connected to the four dynamic contacts A1~A4 to select the test pin P21 of the host interface 101. The signal outputted by the P24, for example, the signal outputted by the test pin P21 of the host interface 101 is selected, and the static contact A of the fifth switch S5 is connected to the first dynamic contact A1. Then, the positive and negative probes of an oscilloscope are respectively connected to the first test point P1 and the second test point P2 of the test terminal J1 to perform signal integrity test on the signal outputted by the pin P21 of the host interface 101.

When it is necessary to change the signal outputted by the pin P21 of the host interface 101, for example, by changing the resolution of a monitor connected to the peripheral interface 201 to change the signal outputted by the pin P21 of the host interface 101. The static contact 1 of the first switch S1 to the fourth switch S4 and the first dynamic contact 2 are connected, so that the pins P21~P24 of the host interface 101 pass through the host interface connector 100 and peripherals. The interface connector 200 is connected to the corresponding pins T21~T24 of the peripheral interface 201. At this time, the host interface 101 and the peripheral interface 201 can be used normally. After that, the signal outputted by the pin P21 of the host interface 101 can be changed by changing the resolution of the monitor. After the change is completed, the static contact 1 of the first switch is connected to the second dynamic contact 3, and the signal outputted by the pin P21 of the host interface 101 can be detected.

The signal testing device controls the connection between the host interface 101 and the peripheral interface 201 through the first switch S1 to the fourth switch S4, and selects a signal for testing the output of the pin to be tested of the host interface 101 through the fifth switch S5. The repeated insertion and removal of the test device and the external device and the repeated insertion and removal of the oscilloscope probe on the test end J1 are avoided, the service life of the host interface 101 and the oscilloscope probe is prolonged, the test time is shortened, and the test accuracy is improved.

In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims.

100. . . Host interface connector

101. . . Host interface

200. . . Peripheral interface connector

201. . . Peripheral interface

S1-S4. . . Two-choice switch

S5. . . Select one switch

R1-R4. . . resistance

J1. . . Test side

P11-P18. . . Host interface connector pin

P21-P28. . . Host interface pin

T11-T18. . . Peripheral interface connector pin

T21-T28. . . Peripheral interface pin

1. . . Static contact of two switches

2, 3. . . Dynamic selection of two switches

A. . . Select one of the static contacts of a switch

A1-A4. . . Multiple selection of a dynamic contact

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a circuit diagram of a preferred embodiment of a signal testing device of the present invention.

100. . . Host interface connector

101. . . Host interface

200. . . Peripheral interface connector

201. . . Peripheral interface

S1-S4. . . Two-choice switch

S5. . . Select one switch

R1-R4. . . resistance

J1. . . Test side

P11-P18. . . Host interface connector pin

P21-P28. . . Host interface pin

T11-T18. . . Peripheral interface connector pin

T21-T28. . . Peripheral interface pin

1. . . Static contact of two switches

2, 3. . . Dynamic selection of two switches

A. . . Select one of the static contacts of a switch

A1-A4. . . Multiple selection of a dynamic contact

Claims (7)

A signal testing device includes: a plurality of selective switches, each of the two switches includes a static contact, a first dynamic contact and a second dynamic contact, and the static contact of the two selected switches Corresponding to a plurality of pins to be tested connected to a host interface, the first dynamic contact of the two switches is connected to a plurality of pins of a peripheral interface, and the plurality of pins to be tested of the host interface are correspondingly adapted to a plurality of pins of the peripheral interface; a plurality of switches, including a plurality of dynamic contacts and a static contact, each dynamic contact of the multiple-selection switch and a second dynamic contact of the switch Correspondingly connected; and a test end comprising a first test point and a second test point, the first test point being connected to the static contact of the multi-select switch, the second test point being grounded; When the static contact of a switch is connected to the first dynamic contact, the pin to be tested of the host interface is connected with the pin of the peripheral interface; when the static contact of each of the two switches is connected with the second dynamic contact When the points are connected, each of the host interfaces is to be tested. Are selected from one of a plurality of the movable contact connected to the corresponding switch via a switch selected from the plurality of stationary contact a movable contact selectively coupled therewith to test the host corresponding to the test signal output pin of the interface. The signal testing device of claim 1, wherein the second dynamic contact of each of the two switches is also grounded through a resistor. The signal testing device of claim 1, wherein the static contact of the two switches is connected to the pin to be tested of the host interface through a host interface connector. The signal testing device of claim 1, wherein the first dynamic contact of the two-select switch is connected to a pin of the peripheral interface through a peripheral interface connector. The signal testing device of claim 1, wherein the two-selection switch is a single-pole double-throw switch. The signal testing device of claim 1, wherein the multi-selection switch is a single-pole multi-throw switch. The signal testing device of claim 1, wherein the test end is an insert having two needles, and the two needles serve as the first test point and the second test point, respectively.