TWI401571B - An external power supply device and the method thereof - Google Patents

Description

External power supply device and power supply method thereof

The present invention relates to an external power supply device and a power supply method thereof, and more particularly to an external power supply device capable of providing a test voltage synchronized with a timing of an output voltage of a card reader to a device under test and a power supply method thereof.

SD (secure digital) or Expresscard is the interface product, which has the advantages of high speed, small size, low power consumption and easy development. Therefore, the products based on SD or Expresscard interface are more and more widely used, and the functions are coming. more. Thus, in the development of SD (secure digital) or Expresscard products, a number of circuits are required to be added to an SD (secure digital) or Expresscard device to be tested to assist in the experiment or test of the device under test.

However, the internal SD (secure digital) or Expresscard readers provided by the computer have limited power supply capabilities and often fail to meet the power requirements of the device under test for all experiments or tests. In this case, it is easy to cause the test environment to be unstable or the computer cannot recognize the device under test.

In addition, SD (secure digital) or Expresscard products communicate with the computer through the card reader device, and they have a certain startup program regardless of data transmission or power supply at startup, even if the voltage is directly supplied to the SD or Expresscard products from the outside. This will cause the external power supply timing to be inconsistent with the card reading device inside the computer, and the abnormal operation may occur after the normal startup or startup.

Please refer to the first figure for a block diagram of the test system of the traditional interface product. As shown in the first figure, the conventional test system is directly connected to a device under test 3 by using a computer (not labeled) or a card reader device 2 connected to the computer, and the function of the device 3 to be tested is more At the time, the circuit components of the peripheral matching experiment or test are also increased, and therefore, the power consumption of the device under test 3 as a whole is also increased. When the overall power consumption increases until the voltage V1 supplied by the card reading device 2 fails to load, the computer may cause a device identification error or the device under test 3 cannot be started normally.

Even if the voltage is directly supplied to the device under test 3 directly from the outside, the start timing of the external supply voltage is inconsistent with the voltage timing of the card reading device 2, and the device under test 3 cannot be normally started. On the other hand, if the power supply is directly applied by the card reading device 2, it takes a considerable cost and time to modify the existing circuit, and the modification is not necessarily applicable to all newly developed SD (secure digital) or Expresscard products.

In view of the above, the present invention provides an external power supply device capable of detecting an internal voltage start timing of a card reading device and providing an internal voltage start timing similar to that of the card reading device, and a power supply method thereof. The voltage is tested to enable the device under test to start normally, and to provide power for the device to be tested, thereby solving the shortcoming that the traditional test system cannot meet the power requirement of the device under test.

The external power supply device of the first embodiment of the present invention is coupled to a card reading device and a device under test. The external power supply device includes a power supply unit and a power switching unit. The power supply unit is configured to provide an external voltage. The power switching unit is coupled to the card reading device, the power supply unit, and the device to be tested. The power switching unit receives an internal voltage from the card reading device and is controlled by the timing of the internal voltage to synchronously switch the external voltage into a test. The voltage, and the output test voltage to the device under test, as the source of power required for the test or test of the device under test.

Compared with the first embodiment of the present invention, the external power supply device of the second embodiment of the present invention further includes a power supply indicating unit, wherein the power indicating unit is coupled to the power switching unit, and is configured according to the timing of the internal voltage. The synchronization generates an indication of clear/off.

In addition, the external power supply method of the preferred embodiment of the present invention has the following steps: First, an internal voltage is received from a card reading device. Then, an external voltage is switched to a test voltage output according to the timing of the internal voltage. Finally, the test voltage, which synchronizes the timing with the internal voltage, is sent to a device under test as a source of power required for the test or test of the device under test.

In summary, the external power supply device of the present invention can provide a test voltage similar to the internal voltage start timing of the card reading device to enable the device under test to start normally. Meanwhile, in the case that the original device under test or the card reading device circuit inside the computer does not need to be modified, the external power supply device of the present invention can provide the same power supply timing as the internal voltage of the card reading device, and supply sufficient operating voltage of the device under test. . Moreover, the external power supply device can directly adjust and output different test voltages to the device under test to increase the convenience and flexibility of development or experiment. A stable external power supply also allows for more accurate results of experiments or tests.

The above summary and the following detailed description are exemplary in order to further illustrate the scope of the claims. Other objects and advantages of the present invention will be described in the following description and drawings.

Please refer to the second figure, which is a circuit block diagram of an external power supply device according to a first preferred embodiment of the present invention. As shown in the second figure, the external power supply device 1 is coupled to a card reading device 2 and a device under test 3. The external power supply device 1 includes a power supply unit 10 and a power switching unit 12. The power supply unit 10 provides an external voltage V2 to the power switching unit 12. In addition, the power switching unit 12 is coupled to the card reading device 2, the power supply unit 10, and the device under test 3. At the same time, the power switching unit 12 receives an internal voltage V1 from the card reading device 2 and is controlled by the timing of the internal voltage V1. For synchronously switching the external voltage V2 to a test voltage V3, and outputting the test voltage V3 to the device under test 3 as a source of power required for the test or test device 3 to be tested or tested.

Referring to the second figure, the external power supply device 1 of the present invention supplies the test voltage V3 which is the same as the timing of the internal voltage V1 to the device under test 3 according to the timing of the internal voltage V1 sent from the card reading device 2, so as to be tested. Device 3 starts up normally. By adjustment, the power supply unit 10 in the external power supply device 1 can generate external voltages V2 of different sizes. Further, the power supply switching unit 12 switches the external voltage V2 to the test voltage V3 in accordance with the timing of the internal voltage V1. Thus, the timing of the test voltage V3 will be the same as the timing of the internal voltage V1, and the magnitude of the test voltage V3 will be proportional to the external voltage V2.

As such, the external power supply device 1 of the present invention can provide the same power supply timing as the internal voltage of the card reading device 2 to the device under test 3, and can directly adjust different test voltages V3 to the device under test 3 to increase development or experiment. Convenience and flexibility, while a stable external voltage V2 is supplied, while making the results of experiments or tests more accurate.

For the second picture, please refer to the third picture. The third figure is a schematic diagram of a first implementation circuit of the first preferred embodiment of the present invention. As shown in the third figure, the power switching unit 12 includes a resistor R1 and a P-MOS switch Q1. The gate of the P-MOS switch Q1 is coupled to the card reading device 2 through the resistor R1. Meanwhile, the P-MOS switch The drain of the Q1 is coupled to the power supply unit 10, and the source of the P-MOS switch Q1 is coupled to a ground terminal G and the device under test 3.

Refer to the second and third figures. The P-MOS switch Q1 receives the internal voltage V1 from the card reading device 2, and is controlled by the timing of the internal voltage V1, thereby switching the external voltage V2 to the test voltage V3, so the timing of the test voltage V3 will be the same as the internal voltage V1, and The test voltage V3 will be the same size as the external voltage V2, as shown in the eighth figure.

For the second picture, please refer to the fourth picture. The fourth figure is a schematic diagram of a second implementation circuit of the first preferred embodiment of the present invention. As shown in the fourth figure, the power switching unit 12 includes a switch Q2, a relay 120, a resistor R2, and a resistor R3. The control terminal of the switch Q2 is coupled to the card reading device 2 through the resistor R2, and receives the internal voltage V1. The first output terminal of the switch Q2 is coupled to the power supply unit 10 through the resistor R3, and the second switch Q2. The output end is coupled to a ground terminal G. In addition, the relay 120 has a power input terminal (+, -), a third output terminal OUT1, and a fourth output terminal OUT2, wherein the power input terminal (+, -) is coupled to the power supply unit 10 through the resistor R3. At the same time, the third output terminal OUT1 is also coupled to the power supply unit 10, and the fourth output terminal OUT2 is coupled to the device under test 3.

Refer to the second and fourth figures. The switch Q2 receives the internal voltage V1 from the card reading device 2, and is controlled to be ON or OFF by the timing of the internal voltage V1. When the switch Q2 is turned on, the power input terminal (+, -) of the relay 120 receives an excitation voltage (not labeled) from the resistor R3, and further causes a switch between the third output terminal OUT1 and the fourth output terminal OUT2 (not Indicated) is turned on, and the excitation voltage is a voltage at which the external voltage V2 output from the power supply unit 10 is established on the resistor R3. Thus, the external voltage V2 output from the power supply unit 10 will become the test voltage V3 via the changeover switch to be sent to the device under test 3. In addition, when the switch Q2 is turned off, the power input terminal (+, -) of the relay 120 cannot receive the excitation voltage, and therefore, the switch between the third output terminal OUT1 and the fourth output terminal OUT2 is turned off, and thus, The test voltage V3 to the device under test 3 will be zero voltage.

Refer to the second and fourth figures. The switch Q2 receives the internal voltage V1 from the card reading device 2, and is controlled by the timing of the internal voltage V1, thereby switching the external voltage V2 to the test voltage V3, so the timing of the test voltage V3 will be the same as the internal voltage V1, and the test voltage V3 The size will be the same as the external voltage V2, as shown in the eighth figure.

For the second picture, please refer to the fifth picture. Figure 5 is a block diagram showing the circuit of an external power supply device according to a second preferred embodiment of the present invention. The elements in the second preferred embodiment of the present invention are identical to the first preferred embodiment and are designated by the same reference numerals. The principle of operation of the second preferred embodiment is the same as that of the first preferred embodiment. The main difference is that the external power supply device 1' of the second preferred embodiment further includes a power indicating unit 14 The power indicating unit 14 is coupled to the power switching unit 12 for synchronizing the indication of the internal/lower voltage according to the timing of the internal voltage V1.

For the third and fifth figures, please refer to the sixth picture. Figure 6 is a schematic diagram of a first implementation circuit of a second preferred embodiment of the present invention. The elements in the first embodiment of the second preferred embodiment of the present invention are identical to the first embodiment of the first preferred embodiment, and are denoted by the same reference numerals. The first embodiment of the second preferred embodiment has the same circuit operation principle as the first implementation circuit of the first preferred embodiment, and the main difference is that the first implementation of the second preferred embodiment The circuit further includes a power indicating unit 14 composed of a light-emitting diode D1 and a resistor R4. The light-emitting diode D1 and the resistor R4 are connected in series between the source of the P-MOS switch Q1 and the ground terminal G. At the same time, the light-emitting diode D1 is used to synchronously generate an indication of light/off according to the timing of the internal voltage V1.

For the fourth and fifth figures, please refer to the seventh picture. Figure 7 is a schematic view showing a second embodiment of the second preferred embodiment of the present invention. The components in the second embodiment of the second preferred embodiment of the present invention are identical to the second embodiment of the first preferred embodiment, and are denoted by the same reference numerals. The second embodiment of the second preferred embodiment and the second embodiment of the first preferred embodiment have the same circuit operation principle and the same effect. The main difference lies in the second implementation of the second preferred embodiment. The circuit further includes a power indicating unit 14 composed of a light-emitting diode D1 and a resistor R4 connected in series, wherein the light-emitting diode D1 and the resistor R4 are connected in parallel to the resistor R3. At the same time, the light-emitting diode D1 is used to synchronously generate an indication of light/off according to the timing of the internal voltage V1.

With reference to the second figure, the external power supply method of the present invention will be described next. The external power supply method steps of the present invention include the following, first, receiving an internal voltage V1 from a card reading device 2. Then, according to the timing of the internal voltage V1, an external voltage V2 is switched to become a test voltage V3, wherein the magnitude of the test voltage V3 can be synchronously adjusted by adjusting the magnitude of the external voltage V2. Finally, the test voltage V3 whose timing is synchronized to the internal voltage V1 and whose magnitude is the same as the external voltage V2 is sent to a device under test 3.

In summary, the external power supply device of the present invention can provide the same power supply timing as the internal voltage of the card reading device, and supply a sufficient operating voltage of the device under test. At the same time, the external power supply device of the present invention can directly adjust and output different voltages to be tested to the device under test to increase the convenience and flexibility of development or experiment.

The above description is only the preferred embodiment of the present invention, but the features of the present invention are not limited thereto, and any one skilled in the art can easily change or modify it in the field of the present invention. Both can be covered in the following patent scope of this case.

Convention:

2. . . Card reader

3. . . Device under test

V1‧‧‧ supply voltage

this invention:

1, 1'‧‧‧ external power supply unit

2‧‧‧ card reader

3‧‧‧Device under test

10‧‧‧Power supply unit

12‧‧‧Power Switching Unit

14‧‧‧Power indicator unit

V1‧‧‧ internal voltage

V2‧‧‧ external voltage

V3‧‧‧ test voltage

R1, R2, R3, R4‧‧‧ resistance

Q1‧‧‧P-MOS switch

G‧‧‧ Grounding terminal

Q2‧‧‧ switch

120‧‧‧ relay

(+,-)‧‧‧Power input

OUT1‧‧‧ third output

OUT2‧‧‧ fourth output

D1‧‧‧Lighting diode

The first picture is a block diagram of a test system of a traditional interface product;

2 is a circuit block diagram of an external power supply device according to a first preferred embodiment of the present invention;

3 is a schematic diagram of a first implementation circuit of a first preferred embodiment of the present invention;

The fourth figure is a schematic diagram of a second implementation circuit of the first preferred embodiment of the present invention;

Figure 5 is a block diagram showing the circuit of an external power supply device according to a second preferred embodiment of the present invention;

6 is a schematic diagram of a first implementation circuit of a second preferred embodiment of the present invention;

7 is a schematic diagram of a second implementation circuit of a second preferred embodiment of the present invention; and

The eighth figure is a schematic diagram of the voltage waveform of the present invention.

1. . . External power supply unit

2. . . Card reader

3. . . Device under test

10. . . Power supply unit

12. . . Power switching unit

V1. . . Internal voltage

V2. . . External voltage

V3. . . Test voltage

Claims (10)

An external power supply device is coupled to a card reading device and a device to be tested, and includes: a power supply unit that provides an external voltage; and a power switching unit coupled to the card reading device and the power supply unit And the device under test, the power switching unit receives an internal voltage from the card reading device, and is controlled by the timing of the internal voltage, synchronously switches the external voltage into a test voltage, and outputs the test voltage to the device under test. The timing of the test voltage is the same as the internal voltage, and the voltage of the test voltage is the same as the external voltage. The external power supply device of claim 1, wherein the power switching unit is a P-MOS switch, and the gate of the P-MOS switch is coupled to the card reading device, and the P-MOS switch is The pole is coupled to the power supply unit, and the source of the P-MOS switch is coupled to a ground and the device to be tested. The external power supply device of claim 1, wherein the power switching unit comprises: a switch having a control end, a first output end and a second output end, wherein the control end is coupled to the The card reading device receives the internal voltage, the first output end is coupled to the power supply unit, the second output end is coupled to a ground end, and a relay having a power input end and a third output end And a fourth output end, wherein the power input end and the third output end are coupled to the power supply unit, and the fourth output end is coupled to the device to be tested. An external power supply device is coupled to a card reading device and a device to be tested, and includes: a power supply unit that provides an external voltage; a power switching unit coupled to the card reading device, the power supply unit, and the device to be tested, the power switching unit receiving an internal voltage from the card reading device, and controlling the timing of the internal voltage to synchronously switch the The external voltage becomes a test voltage, and the test voltage is output to the device under test, wherein the test voltage has the same timing as the internal voltage, and the test voltage has the same voltage as the external voltage; and a power indicating unit, the The power indicating unit is coupled to the power switching unit to generate a clear/off indication according to the timing of the internal voltage. The external power supply device of claim 4, wherein the power switching unit is a P-MOS switch, the gate of the P-MOS switch is coupled to the card reading device, and the P-MOS switch is The pole is coupled to the power supply unit, and the source of the P-MOS switch is coupled to the power indicating unit and the device to be tested. The external power supply device of claim 5, wherein the power indicating unit comprises a light emitting diode. The external power supply device of claim 4, wherein the power switching unit comprises: a switch having a control end, a first output end and a second output end, wherein the control end is coupled to the The card reading device receives the internal voltage, the first output end is coupled to the power supply unit, the second output end is coupled to a ground end, and a relay having a power input end and a third output end And a fourth output end, wherein the power input end and the third output end are coupled to the power supply unit, and the fourth output end is coupled to the device to be tested. The external power supply device of claim 7, wherein the power indicating unit comprises a light emitting diode. An external power supply method, the steps include: a receiving an internal voltage from a card reading device; b. switching an external voltage to a test voltage according to the timing of the internal voltage, wherein the test voltage has the same timing as the internal voltage, and the test voltage has the same voltage At the external voltage; c. outputting the test voltage to a device under test. The external power supply method of claim 9, wherein in step b, the step of adjusting the magnitude of the external voltage is further included.