TWI499685B - System architecture for combined static and pass-by processing and method for processing substrate in said system - Google Patents
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- 239000000758 substrate Substances 0.000 title claims description 323
- 238000012545 processing Methods 0.000 title claims description 238
- 238000000034 method Methods 0.000 title claims description 23
- 230000003068 static effect Effects 0.000 title 1
- 238000012546 transfer Methods 0.000 claims description 32
- 230000005540 biological transmission Effects 0.000 claims description 29
- 238000003754 machining Methods 0.000 claims description 19
- 230000007246 mechanism Effects 0.000 claims description 18
- 238000005192 partition Methods 0.000 claims description 14
- 238000007789 sealing Methods 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 230000007723 transport mechanism Effects 0.000 claims description 5
- 238000005253 cladding Methods 0.000 claims description 2
- 239000012530 fluid Substances 0.000 claims description 2
- 238000004544 sputter deposition Methods 0.000 description 26
- 230000032258 transport Effects 0.000 description 24
- 238000010438 heat treatment Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 12
- 238000013461 design Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 238000000137 annealing Methods 0.000 description 7
- 239000000969 carrier Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005086 pumping Methods 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000011247 coating layer Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000005654 stationary process Effects 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
- C23C14/566—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32889—Connection or combination with other apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32899—Multiple chambers, e.g. cluster tools
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
Description
本案主張美國臨時申請案(Provisional Application)61/580,642號,申請日2011年12月27日之優先權,該案的全部內容併入本案作為參考。This case claims the priority of the Provisional Application No. 61/580,642, filed on December 27, 2011, the entire contents of which is hereby incorporated by reference.
本發明涉及處理並加工基板的系統架構及方法,該基板可為磁碟,觸控螢幕等。更具體地說,本發明涉及一系統及方法,利用固定式及移動式加工方法之結合,以改善基板載具在基板加工系統中的加工流程。The present invention relates to a system architecture and method for processing and processing a substrate, which may be a magnetic disk, a touch screen, or the like. More particularly, the present invention relates to a system and method for utilizing a combination of fixed and mobile processing methods to improve the processing of substrate carriers in a substrate processing system.
基板加工,如磁碟,觸控螢幕等之製造,是一複雜且繁複之製程。需要體積龐大的客製化裝置,以執行繁複的特殊加工步驟,例如預加熱,塗覆多層塗覆層於基板,接著退火及/或冷卻基板。用以加工基板之機器通常有需使用一大面積,並需要一大空間來操作。此外,該機器需在高科技無塵室內操作,其建造及維護極為昂貴。因此,縮小該基板加工機器之所占空間為業界所需。Substrate processing, such as the manufacture of magnetic disks, touch screens, etc., is a complicated and complicated process. A bulky customization device is required to perform complex special processing steps, such as preheating, coating a plurality of coating layers on the substrate, followed by annealing and/or cooling the substrate. Machines used to machine substrates often require a large area and require a large amount of space to operate. In addition, the machine needs to be operated in a high-tech clean room, which is extremely expensive to construct and maintain. Therefore, it is required in the industry to reduce the space occupied by the substrate processing machine.
業界同時也需要提高每一基板單元之加工速度,以最大化 製造機具的價值,也就是最大化該機具之生產量。提高加工速度某種程度來說是個考驗,因為許多加工步驟皆有一定的所需最短時間,才能完成特定的塗覆、塗層之加熱或冷卻,以正確的製造一基板。此外,該基板表面之加工需有一致性,才能使製得的產品能夠正確的運作。因此,有些加工需要固定式加工,即在加工時該基板保持靜止不動。而其他加工則需要移動式加工,即需要該基板在加工過程中持續移動。The industry also needs to increase the processing speed of each substrate unit to maximize The value of manufacturing machines is to maximize the production of the machine. Increasing the processing speed is somewhat a test, as many processing steps have the required minimum time to complete a specific coating, coating heating or cooling to properly fabricate a substrate. In addition, the processing of the surface of the substrate requires consistency in order for the manufactured product to function properly. Therefore, some processes require fixed machining, that is, the substrate remains stationary during processing. Other processes require mobile machining, which requires the substrate to continue to move during processing.
為此,目前的技術,如加州聖塔克拉拉市的因特瓦克公司所製造的磁碟濺鍍系統200 Lean®,已提供縮小系統整體空間之解決方法。該200 Lean®於美國專利第US 6,919,001號中有進一步之解說(以下稱為專利001),該案的全部內容併入本案作為參考。如專利001內所描述,該系統可操作以提供固定式加工或移動式加工。其他系統已於現今技藝中描述,可提供固定式或移動式加工。To this end, current technologies, such as the Disk Sputtering System 200 Lean® manufactured by Intervac Corporation in Santa Clara, Calif., have provided solutions to reduce the overall space of the system. The 200 Lean® is further described in U.S. Patent No. 6,919,001 (hereinafter referred to as patent 001), the entire disclosure of which is hereby incorporated by reference. As described in Patent 001, the system is operable to provide either fixed or mobile processing. Other systems have been described in the art today, and can be provided in stationary or mobile processing.
世界專利公告號WO 2006/026886 A1(以下稱為公告號886)亦描述使用兩疊層加工腔室,以縮小整體體積之基板加工系統。與專利001描述之200 Lean®類似,該公告號886描述一提升模組,用以從一腔室疊層運送一基板至下一疊層,且利用磁性手段,即線性馬達,以傳輸該基板載具。World Patent Publication No. WO 2006/026886 A1 (hereinafter referred to as bulletin number 886) also describes a substrate processing system that uses two stacked processing chambers to reduce the overall volume. Similar to 200 Lean® described in Patent 001, the bulletin number 886 describes a lift module for transporting a substrate from a chamber stack to a next stack and using a magnetic means, a linear motor, to transport the substrate. vehicle.
然而,現今系統並無提供結合固定式及移動式加工於單一線性系統之可行的解決方法。因此,目前業界所需的是改良的基板加工系統,可以同時提供固定式及移動式加工,並能將系統體積最小化。However, today's systems do not offer a viable solution that combines fixed and mobile machining in a single linear system. Therefore, what is needed in the industry today is an improved substrate processing system that can provide both fixed and mobile processing while minimizing system volume.
以下發明簡述提供作為對本發明數種面向及技術特徵之 基本理解。發明簡述並非對本發明之廣泛介紹,也因此並非用來特別指出本發明之關鍵性或是重要元件,也非用來界定本發明之範圍。其唯一目的僅在以簡單之方式展示本發明之數種概念,並作為以下發明詳細說明之前言。The following summary of the invention is provided as a number of aspects and technical features of the invention. Basic understanding. The invention is not intended to be exhaustive or to limit the scope of the invention. The sole purpose of the invention is to be construed in a single
本發明之實施例提供一基板加工系統,其可結合固定式及移動式加工。本發明之實施例亦提供簡化的系統結構。Embodiments of the present invention provide a substrate processing system that can be combined with stationary and mobile processing. Embodiments of the present invention also provide a simplified system architecture.
根據本發明之各面向,乃是提供一種在基板加工系統內,用以傳輸基板之系統。該基板加工系統具有至少一固定式加工腔,及至少一移動式加工腔。該基板在一固定式腔室及一移動式腔室內加工時,不須離開真空環境。In accordance with various aspects of the present invention, a system for transporting substrates within a substrate processing system is provided. The substrate processing system has at least one stationary processing chamber and at least one mobile processing chamber. The substrate does not have to leave the vacuum environment when processed in a stationary chamber and a mobile chamber.
根據本發明之其他面向,本發明乃是提供一系統結構,以縮小系統所占面積。本發明將該系統建置成;使基板於其中作垂直方向加工,且每一腔室提供一加工源,設置於其一側壁上;其中另一側壁背對一互補的加工腔。根據本發明一面向,該腔室主體是由一單一金屬塊,例如鋁塊,車製而成,其中該金屬塊是從兩側加工,以保留一隔牆,而分隔兩個互補的加工腔室。In accordance with other aspects of the present invention, the present invention provides a system architecture to reduce the footprint of the system. The system is constructed such that the substrate is processed in a vertical direction therein, and each chamber provides a processing source disposed on one of the side walls; wherein the other side wall faces away from a complementary processing chamber. According to one aspect of the invention, the chamber body is made of a single metal block, such as an aluminum block, wherein the metal block is machined from both sides to retain a partition wall and separate two complementary processing chambers. room.
根據本發明所揭示之一實施例,乃是提供一種用以加工基板之系統,該系統包括:一裝載腔,用以將基板從大氣環境移送入真空環境;一裝載配置,用以裝載基板至基板載具上;滾輪,用以在該系統內傳輸該基板載具;一固定式加工腔,用以在該載具靜止不動時加工該基板;一移動式加工腔,具有一傳輸區及一加工區;及一傳輸機構,建置成在該傳輸區內用一傳輸速度傳輸該載具;且在該加工區內用一移動速度傳輸該 載具,其中該傳輸速度高於該移動速度。該傳輸機構可包括數個滾輪,設置於該固定式加工腔及該移動式加工腔之底座,並其中每組數個滾輪皆可單獨啟動。該傳輸區及該加工區可以定義在一單一未分隔之包覆內。一迴轉腔建置成可將該載具迴轉,以朝反方向移送,用以在該系統之相對側加工,以此對該基板之相同側或相反側加工。該系統可能更包括一第二固定式加工腔,具有一與該固定式加工腔共用的隔牆,及一第二移動式加工腔,具有與該移動式加工腔共用的隔牆,且其中該載具在該迴轉腔內迴轉後,以相反方向移送穿越該第二固定式加工腔及該第二移動式加工腔。一第一傳輸器建置以裝載基板至基板載具上,一第二傳輸器建置以從該基板載具卸除基板。一第一裝載裝置建置以將基板帶入至該第一傳輸器,一第二裝載裝置建置以從該第二傳輸器接收基板。可使用一第一升降機裝置,以裝載基板至該第一裝載裝置,及一第二升降機裝置,以從該第二裝載裝置卸除基板。一第一機械手臂建置以從基板匣取得基板,裝載到該第一升降機裝置上,一第二機械手臂建置以從該第二升降機裝置上卸除基板,置入基板匣內。該第一及第二機械手臂為可伸縮及可轉動。According to an embodiment of the present invention, there is provided a system for processing a substrate, the system comprising: a loading chamber for transferring a substrate from an atmospheric environment into a vacuum environment; and a loading configuration for loading the substrate to a substrate carrier; a roller for transporting the substrate carrier in the system; a fixed processing chamber for processing the substrate when the carrier is stationary; a mobile processing chamber having a transmission area and a a processing zone; and a transport mechanism configured to transmit the carrier at a transmission speed in the transmission zone; and transmit the movement at a moving speed in the processing zone A carrier, wherein the transmission speed is higher than the moving speed. The transmission mechanism may include a plurality of rollers disposed on the fixed machining chamber and the base of the movable machining chamber, and each of the plurality of rollers may be separately activated. The transfer zone and the processing zone can be defined within a single undivided cladding. A rotary chamber is configured to rotate the carrier for transport in the opposite direction for processing on the opposite side of the system for processing the same side or opposite side of the substrate. The system may further include a second fixed processing chamber having a partition wall shared with the stationary processing chamber, and a second movable processing chamber having a partition wall shared with the movable processing chamber, and wherein the partition wall After the carrier rotates in the rotary chamber, the carrier moves through the second fixed machining chamber and the second movable machining chamber in opposite directions. A first transmitter is configured to load the substrate onto the substrate carrier, and a second transmitter is configured to remove the substrate from the substrate carrier. A first loading device is built to bring the substrate into the first conveyor, and a second loading device is configured to receive the substrate from the second transmitter. A first elevator device can be used to load the substrate to the first loading device and a second elevator device to remove the substrate from the second loading device. A first robot arm is configured to take the substrate from the substrate, onto the first elevator device, and a second robot arm is configured to remove the substrate from the second elevator device and place it into the substrate. The first and second robot arms are telescopic and rotatable.
根據其他實施例,本發明所揭示之加工腔主體定義多數加工站,並包括:一單一腔體主體,由單一金屬塊車製而成,以在其內定義第一、第二、第三及第四加工站;一第一基板傳輸路徑,由該單一金屬塊車製而成,並穿越該第一及第二加工站;一第二基板傳輸路徑,由該單一金屬塊車製而成,並穿越該第三及第四加工站;及一隔牆,由該第一及第三加工站共用並分隔該第一及第三加工站,且由該第二及第四加工站共用並分隔該第二及第四加工站,用以防止流體在該第一及第三加工站之間, 及該第二及第四加工站之間的流動。一第一組傳輸輪可使基板從該第一加工站傳輸至該第二加工站,一第二組傳輸輪可使基板從該第四加工站傳輸至該第三加工站。According to other embodiments, the processing chamber body disclosed in the present invention defines a plurality of processing stations, and includes: a single cavity body, which is made of a single metal block to define first, second, and third therein. a fourth processing station; a first substrate transmission path formed by the single metal block and passing through the first and second processing stations; and a second substrate transmission path formed by the single metal block And crossing the third and fourth processing stations; and a partition wall, the first and third processing stations share and separate the first and third processing stations, and are shared and separated by the second and fourth processing stations The second and fourth processing stations are for preventing fluid between the first and third processing stations, And the flow between the second and fourth processing stations. A first set of transfer wheels can transport substrates from the first processing station to the second processing station, and a second set of transfer wheels can transport substrates from the fourth processing station to the third processing station.
根據其他實施例,本發明所揭示一升降機與裝載腔之組件,包括:一裝載腔,具有一下方密封板;一升降機組件,包括一有一上方密封板之升降機主體,該升降機主體為可延伸至使該上方密封板結合該下方密封板,而形成真空密封,該升降機主體更可縮回至使該上方密封板與該下方密封板脫離結合,以解除該真空密封;及一升降機葉片,可於該升降機主體內移動,及可結合並保持基板之機構,且該升降機葉片建置成可藉由在該升降機主體內延伸或回縮,以提升或下降該基板。According to other embodiments, an elevator and loading chamber assembly includes a loading chamber having a lower sealing plate, and an elevator assembly including an elevator body having an upper sealing plate, the elevator body being extendable to The upper sealing plate is combined with the lower sealing plate to form a vacuum seal, and the elevator body is further retracted to disengage the upper sealing plate from the lower sealing plate to release the vacuum seal; and an elevator blade is The elevator body moves and a mechanism that can engage and hold the substrate, and the elevator blade is configured to be raised or retracted within the elevator body to raise or lower the substrate.
此外,本發明也揭示用以在真空內加工基板之線性系統,包括:一第一腔室線性排列,該第一線性排列維持真空環境並具有路徑,可使基板載具從一腔室直接移動至第一移動方向之下一腔室;一第二腔室線性排列,該第二線性排列維持真空環境並具有路徑,可使基板載具從一腔室直接移動至第二移動方向之下一腔室,該第二移動方向與該第一移動方向相反;一裝載腔,位於該第一線性排列之入口側,並建置以從大氣環境引入基板至該第一腔室線性排列所維持之真空環境;一卸載腔,位於該第二線性排列之出口側,並建置以從該第二腔室線性排列所維持之真空環境卸除基板,進入大氣環境;一迴轉腔,連接至該第一線性排列之出口側及該第二線性排列之入口側,且建置以從該第一線性排列接收基板載具,並傳送該基板載具至該第二線性排列;其中該第一線性排列與該第二線性排列各自包括至少一個固定式加工腔及至少一個移動式加工腔,該移動式 加工腔內定義一加工區;及一基板載具傳輸機構,建置成:在該固定式加工腔內之加工期間,維持該基板載具靜止不動;當該基板載具在該移動式加工腔內之加工區以外區域移動時,以傳輸速度移動該基板載具;且當該基板載具在該移動式加工腔之該加工區內移動時,以移動速度移動該基板載具,其中該傳輸速度高於該移動速度。一裝載升降機建置以裝載基板至該裝載腔內;一卸載升降機建置以從該卸載腔卸除基板。一可伸縮葉片外罩具有一真空密封板,位於其上方端;一提升用葉片可在該可伸縮葉片外罩內移動;且一垂直移動機構耦接該可伸縮葉片外罩及該提升用葉片,並垂直移動該可伸縮葉片外罩及該提升用葉片。一裝載機械手臂建置以從基板匣卸除基板,並傳送基板至該裝載升降機;且一卸載機械手臂建置以從該卸載升降機卸除基板並傳送該基板至該基板匣。In addition, the present invention also discloses a linear system for processing a substrate in a vacuum, comprising: a first chamber linear arrangement that maintains a vacuum environment and has a path that allows the substrate carrier to be directly from a chamber Moving to a chamber below the first direction of movement; a second chamber linearly arranged, the second linear arrangement maintaining a vacuum environment and having a path for moving the substrate carrier directly from a chamber to a second direction of movement a chamber, the second moving direction is opposite to the first moving direction; a loading chamber is located on the inlet side of the first linear array, and is configured to introduce a substrate from the atmospheric environment to the linear alignment of the first chamber Maintaining a vacuum environment; an unloading chamber located on the exit side of the second linear array, and being configured to remove the substrate from the vacuum environment maintained by the linear arrangement of the second chamber to enter the atmospheric environment; a rotary chamber connected to An exit side of the first linear array and an entrance side of the second linear array, and configured to receive the substrate carrier from the first linear array and to transport the substrate carrier to the second linear array; A linear arrangement and the second linear array each comprising at least one stationary processing chamber and the process chamber at least one mobile, the mobile a processing area is defined in the processing chamber; and a substrate carrier transport mechanism is configured to: maintain the substrate carrier stationary during processing in the stationary processing chamber; and when the substrate carrier is in the mobile processing chamber Moving the substrate carrier at a transmission speed when the region outside the processing zone moves; and moving the substrate carrier at a moving speed when the substrate carrier moves within the processing region of the movable processing cavity, wherein the transmission The speed is higher than the moving speed. A loading elevator is built to load the substrate into the loading chamber; an unloading elevator is built to remove the substrate from the unloading chamber. A retractable blade cover has a vacuum sealing plate at an upper end thereof; a lifting blade is movable within the retractable blade cover; and a vertical moving mechanism couples the retractable blade cover and the lifting blade and is vertical The retractable blade cover and the lifting blade are moved. A loading robot is configured to remove the substrate from the substrate and transport the substrate to the loading elevator; and an unloading robot is configured to unload the substrate from the unloading elevator and transport the substrate to the substrate.
同時,本發明並提供一系統之操作方法,該系統具有一固定式加工腔及一移動式加工腔,該方法用以加工基板,並包括:將該基板移送至一真空環境內;裝載該基板至一載具上;傳輸該載具至該固定式加工腔,並在該固定式腔內加工期間,保持該載具於一定位置;一旦在該固定式加工腔內之加工完成,即在傳輸速度下傳輸該載具至該移動式加工腔,直到該載具到達位於一在該移動式加工腔內之先前載具後面之位置時為止;一旦該載具到達位於該先前載具後面之位置,降低該載具之移動速度,以在該移動式加工腔內,以一加工速度繼續傳輸該載具,其中該加工速度低於該傳輸速度。Meanwhile, the present invention also provides a system operation method, the system having a fixed processing chamber and a movable processing chamber for processing a substrate, and including: transferring the substrate into a vacuum environment; loading the substrate Transferring the carrier to the stationary processing chamber, and maintaining the carrier at a certain position during processing in the fixed cavity; once the processing in the stationary processing chamber is completed, the transmission is performed Transmitting the carrier to the mobile processing chamber at a speed until the carrier reaches a position behind a previous carrier within the mobile processing chamber; once the carrier reaches a position behind the preceding carrier And reducing the moving speed of the carrier to continue to transport the carrier at a processing speed in the mobile processing chamber, wherein the processing speed is lower than the transmission speed.
所附的圖式納入本件專利說明書中,並成為其一部份,是用來例示數種實施例,並與本案的說明內容共同用來說明及展示本發明的 原理。圖式的目的只在以圖形方式例示本發明實施例的主要特徵。圖式並不是用來顯示實際上的範例的全部特徵,也不是用來表示其中各元件之相對尺寸,或其比例。The accompanying drawings are incorporated in and constitute a part of the specification, principle. The purpose of the drawings is to exemplify the main features of the embodiments of the present invention. The drawings are not intended to illustrate all of the features of the actual examples, nor are they used to indicate the relative
本發明之數種面向提供加工基板以製造如硬碟、積體電路、觸控螢幕等物件之技術。本發明所揭示之實施例顯示數種技術特徵,如結合固定式與移動式加工、縮小系統所需空間、簡化腔體製造等。當在所示的實施例中,有些使用超過一種技術特徵,但必須說明的是,各該技術特徵可單獨實施或以不同結合方式,於不同加工系統使用。Several aspects of the present invention are directed to providing techniques for processing substrates to fabricate articles such as hard disks, integrated circuits, touch screens, and the like. Embodiments of the present invention display several technical features, such as combining fixed and mobile machining, reducing the space required for the system, simplifying cavity fabrication, and the like. While in the illustrated embodiment, some use more than one technical feature, it must be noted that each of the technical features may be implemented separately or in different combinations for use in different processing systems.
本發明之一面向提供結合基板之固定式及移動式加工之技術。如圖1之實施例所顯示,一基板加工系統100包括呈線性排列之固定式加工腔102及移動式加工腔104,用以提供數種塗覆或加工至基板103。該基板位於載具105上,詳如圖3所示。該載具105與該基板之外緣上數個接點106接觸,以保持該基板之整個表面暴露於塗覆及/或其他製程下。該載具105也具有一載具基底109,可與軌道及動力滾輪108嚙合,以移動經過該系統100之腔室102及104。請注意,如以下所將詳述,該軌道及滾輪之配置只是一種實施方式,其他實施方式,如只使用滾輪但不使用軌道,亦可使用在本發明。One aspect of the present invention is directed to a technique for providing fixed and mobile processing of bonded substrates. As shown in the embodiment of FIG. 1, a substrate processing system 100 includes a stationary processing chamber 102 and a mobile processing chamber 104 that are linearly arranged to provide several coatings or processes to the substrate 103. The substrate is placed on the carrier 105 as detailed in FIG. The carrier 105 is in contact with a plurality of contacts 106 on the outer edge of the substrate to maintain the entire surface of the substrate exposed to coating and/or other processes. The carrier 105 also has a carrier substrate 109 that is engageable with the track and power roller 108 for movement through the chambers 102 and 104 of the system 100. Please note that the configuration of the track and the roller is only one embodiment as will be described in detail below. Other embodiments, such as using only a roller but not using a track, may also be used in the present invention.
如圖1所見,該基板首先於一固定式腔102內加工,該基板於加工期間保持靜止不動,接著在一移動式腔104內加工,在此該基板在加工期間須移動,接著又在另一移動式腔104內加工,且其後又在另一固定式腔102內加工。此種設計下,對於最小化腔室閒置時間的需求,會 產生難以同步移動的問題。也就是,為達到高使用率,每一腔室必須常時處在加工基板之狀態,並在加工下一基板前,不須等待另一腔室之加工程序完成。例如,若腔室102完成其基板加工,但下一個移動式腔104尚未完成加工,則腔室102就須閒置,以等待腔室104完成加工,才能釋出其已完成加工之基板,並開始加工新的基板。然而,如以下將會說明,圖1之實施例能夠克服此問題,達成無任何腔室閒置且所有腔室常時在加工基板之目的。As seen in Figure 1, the substrate is first machined in a stationary cavity 102 that remains stationary during processing and then processed in a moving cavity 104 where the substrate has to be moved during processing, and then in another A mobile chamber 104 is machined and thereafter machined in another stationary chamber 102. Under this design, the need to minimize the idle time of the chamber will Produces problems that are difficult to move synchronously. That is, in order to achieve high usage, each chamber must be in a state of processing the substrate at all times, and it is not necessary to wait for the processing of another chamber to be completed before processing the next substrate. For example, if the chamber 102 completes its substrate processing, but the next mobile chamber 104 has not been processed, the chamber 102 must be left idle to wait for the chamber 104 to complete processing to release the finished substrate and begin Processing new substrates. However, as will be explained below, the embodiment of Fig. 1 can overcome this problem, achieving the goal of not having any chambers idle and all chambers are constantly processing substrates.
在說明圖1所示實施方式之前,首先說明實施例之系統具有之數種元件。在圖1顯示之實例中,該系統包括一裝載腔101,基板經由該裝載腔101從大氣狀態放入至系統100之真空環境。藉由真空抽氣泵107抽氣,可維持真空,真空可個別提供至每一腔室,也可由數個腔室共享,均如圖1所顯示。該基板接著移動至一固定式加工腔內,在此實例為一加熱腔102。在此實例中,一真空閥112將該裝載腔101與該大氣條件分離,另一真空閥113則將該裝載腔101與該加熱腔102分離。在此特定實例中,在該加熱腔102及加工腔104之間並無真空閥,在加工腔104(圖1顯示兩個加工腔)間也沒有真空閥。如果需要的話,固然可將閥門設置於腔室與腔室之間。例如,若固定式腔室102執行電漿加工,而不只加熱,則可使用一真空閥將該移動式加工腔室與其分離。Before explaining the embodiment shown in Fig. 1, first, several types of elements of the system of the embodiment will be described. In the example shown in FIG. 1, the system includes a loading chamber 101 through which the substrate is placed from an atmospheric state into a vacuum environment of the system 100. The vacuum can be maintained by pumping the vacuum pump 107. The vacuum can be supplied to each chamber individually or shared by several chambers, as shown in FIG. The substrate is then moved into a stationary processing chamber, in this example a heating chamber 102. In this example, a vacuum valve 112 separates the loading chamber 101 from the atmospheric conditions, and another vacuum valve 113 separates the loading chamber 101 from the heating chamber 102. In this particular example, there is no vacuum valve between the heating chamber 102 and the processing chamber 104, and there is no vacuum valve between the processing chamber 104 (shown in Figure 1 for two processing chambers). If desired, the valve can be placed between the chamber and the chamber. For example, if the stationary chamber 102 performs plasma processing, rather than heating only, a vacuum valve can be used to separate the mobile processing chamber therefrom.
加熱腔102為一固定式加工腔,意味該基板在加工期間,即在加熱期間為靜止不動。一旦該基板達到所需溫度,動力輪108即通電,以移動該載具至該第一移動式加工腔室104。根據該實例之一特色,是先啟動動力輪108,以在高速下傳送該載具,以便「追上」一已在腔室104 內完成移動式加工之基板。一旦載具離開腔室102,一新載具即可傳送至腔室102內進行加工,以使腔室102不會閒置。反之,一旦該載具追上該在腔室104內排列較先之載具,該動力輪108即減速並設定成移動式加工速度,該速度遠低於該追上速度。因此,該滾輪需要能個別驅動或整組驅動。依該動力輪位置而定,部分動力輪須個別通電,部分動力輪須配對通電,而部分動力輪則為群組通電,例如,6個或8個動力輪同時以相等速度驅動。這種設計可稱為使動力輪以個別速度驅動,代表不是通電使所有的動力輪都在相同速度下滾動。利用此種設計能使該輸送系統在不同位置以不同速度運作。因此,在該系統中不同的載具同時間可在不同速度下於該系統內移送。例如,在某些時間點時,某些滾輪是靜止不動,以便能在該固定式加工腔內加工,某些滾輪則在傳輸速度下驅動,以移動一載具進入移動式加工腔內,或載具傳輸腔內,而其他組滾輪則是在加工速度下驅動,以使在移動式加工腔之加工區內加工基板。另一種方式則是使用一線性馬達裝置。The heating chamber 102 is a stationary processing chamber, meaning that the substrate is stationary during processing, i.e., during heating. Once the substrate reaches the desired temperature, the power wheel 108 is energized to move the carrier to the first mobile processing chamber 104. According to one feature of this example, the power wheel 108 is first activated to transmit the carrier at high speed to "catch up" one of the chambers 104. The substrate for mobile processing is completed. Once the carrier exits the chamber 102, a new carrier can be transferred into the chamber 102 for processing so that the chamber 102 does not idle. Conversely, once the carrier catches up with the earlier carrier in the chamber 104, the power wheel 108 is decelerated and set to a mobile machining speed that is well below the catch-up speed. Therefore, the roller needs to be individually driven or driven in a group. Depending on the position of the power wheel, some of the power wheels must be individually energized, some of the power wheels must be paired with power, and some of the power wheels are energized for the group, for example, 6 or 8 power wheels are simultaneously driven at equal speed. This design can be said to drive the power wheels at individual speeds, meaning that instead of energizing all of the power wheels are rolling at the same speed. With this design, the conveyor system can operate at different speeds at different locations. Thus, different carriers in the system can be transferred within the system at different speeds at the same time. For example, at certain points in time, some of the rollers are stationary so that they can be machined in the stationary machining chamber, and some rollers are driven at the transmission speed to move a carrier into the mobile machining chamber, or The carrier is transported within the chamber while the other sets of rollers are driven at the processing speed to machine the substrate in the processing zone of the mobile processing chamber. Another way is to use a linear motor unit.
在此種實例中,該加工腔104為一移動式加工腔,代表該基板在加工期間持續移動。在此實例,是利用兩個移動式加工腔104,兩者皆執行物理氣相沈積法(Physical Vapor Deposition,PVD),也可稱做濺鍍腔。為改善該基板103之整體表面濺鍍材料分布不一致之問題,該基板載具在濺鍍期間須持續移動。並且,在此實例中,該PVD腔104之磁控管115須來回循環移動,以使該基板與該濺鍍源兩者於加工期間均持續移動。此種方式可以達成高度的濺鍍一致性與靶材使用率。當然,也可只使該載具保持移動式移動,但該磁控管則靜止不動。In such an example, the processing chamber 104 is a mobile processing chamber that represents the substrate being continuously moved during processing. In this example, two mobile processing chambers 104 are utilized, both of which perform Physical Vapor Deposition (PVD), which can also be referred to as a sputtering chamber. In order to improve the problem of inconsistent distribution of the sputtering material on the entire surface of the substrate 103, the substrate carrier must be continuously moved during sputtering. Also, in this example, the magnetron 115 of the PVD cavity 104 must be circulated back and forth such that both the substrate and the sputtering source continue to move during processing. This way a high degree of sputter consistency and target utilization can be achieved. Of course, it is also possible to keep the carrier moving only, but the magnetron is stationary.
如果濺鍍層需要退火,可在該加工腔104之下游提供一第二加熱腔102。該第二加熱腔102亦為固定式加工腔。因此,一旦該基板通過該濺鍍磁控管之邊緣,將適當選定的滾輪108通電,以達到一快速傳輸速度,而將該載具移送至該第二加熱腔102內。一旦進入該加熱腔102內,該滾輪即停止並該載具的退火期間保持靜止不動。在圖1之實施例中,有一出口裝載腔111位於該系統之末端。該裝載腔111將基板從真空環境傳送至大氣環境。A second heating chamber 102 can be provided downstream of the processing chamber 104 if the sputter layer requires annealing. The second heating chamber 102 is also a stationary processing chamber. Thus, once the substrate passes the edge of the sputter magnetron, the appropriately selected roller 108 is energized to achieve a fast transfer speed and the carrier is transferred into the second heating chamber 102. Once inside the heating chamber 102, the roller is stopped and remains stationary during the annealing of the carrier. In the embodiment of Figure 1, an outlet loading chamber 111 is located at the end of the system. The loading chamber 111 transfers the substrate from a vacuum environment to the atmosphere.
圖2顯示一基板加工系統,例如圖1所顯示之系統之俯視圖。如圖所示,加熱器122及濺鍍源124只位於該腔室之一側,故一次只加工該基板之一表面。圖2並顯示軌道130,由動力滾輪108嚙合,用以傳輸該載具105。在此實施例中,如圖3所顯示,該載具105之基底109包括延伸部127及滾輪129,而與該軌道130及滾輪108嚙合,以在豎直狀態傳輸該載具運行在整個系統。在此實施例,至少有一組滾輪108及129為磁化輪,以提供提高的吸引力。並且,若利用一線性馬達,則可將一系列之磁鐵101貼附於該載具之基底。2 shows a top view of a substrate processing system, such as the system shown in FIG. As shown, the heater 122 and the sputtering source 124 are located only on one side of the chamber, so that only one surface of the substrate is processed at a time. 2 and shows the track 130 engaged by the power roller 108 for transporting the carrier 105. In this embodiment, as shown in FIG. 3, the base 109 of the carrier 105 includes an extension portion 127 and a roller 129, and meshes with the rail 130 and the roller 108 to transport the carrier in a vertical state to operate throughout the system. . In this embodiment, at least one set of rollers 108 and 129 are magnetized wheels to provide increased traction. Also, if a linear motor is used, a series of magnets 101 can be attached to the base of the carrier.
圖4為一整體流程圖,顯示一加工順序在例如圖1及2所描繪之系統內執行之流程。在步驟400,該基板傳輸至該裝載腔,並裝載至該載具上。該裝載腔接著在步驟405清空,且當完成清空後,在步驟410,該載具即傳輸至該固定式加工腔內,並停留在該固定式加工腔內。在步驟415,執行固定式加工,例如,在該基板保持靜止不動下加熱該基板。一旦固定式加工完成,例如,該基板達到一所需溫度,在步驟420,將該載具快速傳輸進入移動式加工腔,並定位在一已經在該移動式加工腔完成加 工之載具後面之位置。一旦載具到達該位於前一個載具後面之位置時,即減緩其速度並使用移動式傳輸速度以在步驟425,在移動式速度下執行移動式加工。請注意,因為該載具是在一快速傳輸速度下,從該固定式腔移動至該移動式腔,以追上前一個基板,從該濺鍍腔來看,常時有一基板在加工。也就是,該濺鍍腔常時完全使用,且該腔室執行連續濺鍍,有如一系列「無端點」的基板,不斷地在移動式加工速度下,一個接一個地移動。因此,該濺鍍源並不需要重複開啟及關閉,且也不會有無基板在腔室內加工的時間。因此,該濺鍍源可完全利用。相對地,一旦該載具在傳輸速度下離開腔室102,一新的載具即接著進入腔室102以進行固定式加工。4 is an overall flow diagram showing the flow of a processing sequence performed within a system such as that depicted in FIGS. 1 and 2. At step 400, the substrate is transferred to the loading chamber and loaded onto the carrier. The loading chamber is then emptied at step 405, and when emptying is completed, at step 410, the carrier is transferred into the stationary processing chamber and remains within the stationary processing chamber. At step 415, a stationary process is performed, for example, heating the substrate while the substrate remains stationary. Once the stationary processing is completed, for example, the substrate reaches a desired temperature, in step 420, the carrier is quickly transferred into the mobile processing chamber and positioned in an already completed processing chamber. The position behind the vehicle. Once the carrier reaches the position behind the previous carrier, the speed is slowed down and the mobile transmission speed is used to perform the mobile machining at the moving speed at step 425. Please note that since the carrier is moved from the fixed cavity to the movable cavity at a rapid transfer speed to catch up with the previous substrate, from the viewpoint of the sputtering cavity, a substrate is often processed. That is, the sputtering chamber is always fully used, and the chamber performs continuous sputtering, like a series of "endless" substrates, constantly moving one by one at a moving processing speed. Therefore, the sputtering source does not need to be repeatedly turned on and off, and there is no time for the substrate to be processed in the chamber. Therefore, the sputtering source can be fully utilized. In contrast, once the carrier leaves the chamber 102 at the transfer speed, a new carrier then enters the chamber 102 for stationary processing.
以下將說明本發明另一實施例,該實施例不須大幅增加系統使用空間即可將加工腔之數量加倍。圖5及圖6皆顯示此種實例。圖5為根據一實施例之系統500之側視圖,而圖6顯示圖5之系統之俯視圖。圖5及圖6描繪之實施例,可視為將兩個圖1之系統背對背排列。除了只增加少量使用空間即可提高加工產能外,這種設計更提供使基板可從同一側進入及離開該系統之優點。這種優點對於無塵室環境特為有利,其中該基板從該無塵室隔牆的一側抵達,進入在隔牆後操作之該系統,並從該無塵室隔牆當作入口的同一側離開該系統。Another embodiment of the present invention will now be described. This embodiment doubles the number of processing chambers without significantly increasing the system usage space. Both FIG. 5 and FIG. 6 show such an example. FIG. 5 is a side view of system 500 in accordance with an embodiment, and FIG. 6 shows a top view of the system of FIG. The embodiment depicted in Figures 5 and 6 can be viewed as arranging the two systems of Figure 1 back to back. In addition to increasing processing throughput by adding only a small amount of space, this design provides the advantage of allowing the substrate to enter and exit the system from the same side. This advantage is particularly advantageous for clean room environments where the substrate arrives from one side of the clean room partition, enters the system operated after the partition, and serves as the same entrance from the clean room partition The side leaves the system.
繼續參考圖5及圖6,該基板經由入口裝載腔501進入該系統,接著移動至裝載腔503,在此將該基板裝載至載具上。該載具藉由滾輪508傳輸或由軌道530a、530b及線性馬達(未顯示)載運。該滾輪508先傳輸該載具至固定式加工腔,即加熱腔502a。在腔室502a的加工期間,該載具保持靜止不動。一旦在腔室502a之加工完成,即該基板達到 適當溫度,該載具即加速以快速傳輸速度,以追上已在加工腔504內之載具。一旦該載具到達該前一載具,即減慢速度並繼續在移動式速度下傳輸,該移動式速度低於該快速傳輸速度。如圖6所顯示,移動式加工腔504有四個濺鍍台,與濺鍍源524a、524b、524c及524d相對應,濺鍍源以成對且背對背排列。因此,在此實例,該基板首先藉由濺鍍源524a及524b加工。一旦在平台524b加工完成,該載具再次加速至一快速傳輸速度,以進入該載具傳輸腔519。在此實例中,載具傳輸腔519包括一轉盤517,用來將載具從該第一路徑,也就是從軌道530a移送到第二路徑,即軌道530b,準備朝相反方向行進。一旦載具已經位在軌道530b上,該載具即再度加速並使用一移動式加工傳輸速度移動,以藉由濺鍍源524c及524d加工。一旦在濺鍍台524d內之加工完成,該載具再度加速,行進至加熱腔502b內,以進行固定式退火。一旦退火完成,該載具即傳輸至卸載腔523內。在此,該基板從該載具卸除,並移動至裝載腔511內。該已卸載之載具接著移動至旋轉腔529,在此該載具從軌道530b移動至軌道530a,以在裝載腔503內再裝載新的基板。With continued reference to Figures 5 and 6, the substrate enters the system via the inlet loading chamber 501 and then moves to the loading chamber 503 where it is loaded onto the carrier. The carrier is transported by roller 508 or by rails 530a, 530b and a linear motor (not shown). The roller 508 first transports the carrier to a stationary processing chamber, namely a heating chamber 502a. The carrier remains stationary during processing of chamber 502a. Once the processing in chamber 502a is completed, the substrate is reached At the appropriate temperature, the carrier accelerates at a rapid transfer speed to catch up with the carrier already within the processing chamber 504. Once the vehicle reaches the previous carrier, i.e., slows down and continues to travel at the mobile speed, the mobile speed is lower than the fast transmission speed. As shown in Figure 6, the mobile processing chamber 504 has four sputtering stations corresponding to the sputtering sources 524a, 524b, 524c, and 524d, and the sputtering sources are arranged in pairs and back to back. Thus, in this example, the substrate is first processed by sputtering sources 524a and 524b. Once the processing is completed at platform 524b, the carrier is again accelerated to a fast transfer speed to enter the carrier transfer chamber 519. In this example, the carrier transfer chamber 519 includes a turntable 517 for moving the carrier from the first path, i.e., from the track 530a, to the second path, track 530b, ready to travel in the opposite direction. Once the carrier has been positioned on track 530b, the carrier is again accelerated and moved using a mobile processing transfer speed to be processed by sputtering sources 524c and 524d. Once processing in the sputtering station 524d is complete, the carrier is again accelerated and travels into the heating chamber 502b for stationary annealing. Once the annealing is complete, the carrier is transferred into the unloading chamber 523. Here, the substrate is removed from the carrier and moved into the loading chamber 511. The unloaded carrier is then moved to a rotating chamber 529 where it is moved from track 530b to track 530a to reload a new substrate within loading chamber 503.
如圖6所顯示,在該實施例中,該載具傳輸腔519包括一轉盤517,該轉盤517有兩個載具座517a及517b。若該基板只需要加工單一表面,該載具座517a及517b均為固定,如此一來當該轉盤做180°旋轉後,在載具座517a上之載具將位在載具座517b先前所在的位置,如此該之前通過軌道530a之載具可移動到軌道530b上,朝相反方向行進。如果該載具座為固定型,先前藉由濺鍍源524a及524b加工之相同表面,之後也會由濺鍍源524c及524d加工。反之,如果需要以濺鍍源524c及524d 來加工該基板之相反表面,則載具座517a及517b即設置成可在轉盤517旋轉同時,也作180°旋轉。如圖6中的彎曲箭頭所示。另一種作法則是如圖中放大圖所示,不使用轉盤,而是使一個載具座517在軌道518上作線性來回移動(如雙箭頭所示)。如果需要對該基板的相同表面加工,則使載具座517在線性移動至該第二路徑位置(如虛線所示)當中,同時旋轉180°。但應注意的是,雖然在此實例中,該載具傳輸腔內可能裝載一或兩個載具,在其他實施例中則可能提供在該載具傳輸模組內裝載超過兩個以上載具的應用。As shown in FIG. 6, in this embodiment, the carrier transfer chamber 519 includes a turntable 517 having two carrier mounts 517a and 517b. If the substrate only needs to process a single surface, the carrier seats 517a and 517b are fixed, so that when the turntable is rotated 180°, the carrier on the carrier base 517a will be located in the previous position of the carrier base 517b. The position so that the carrier previously passed through the track 530a can be moved onto the track 530b, traveling in the opposite direction. If the carrier mount is of a fixed type, the same surface previously machined by the sputter sources 524a and 524b is then processed by the sputter sources 524c and 524d. Conversely, if you need to sputter sources 524c and 524d To machine the opposite surface of the substrate, the carrier mounts 517a and 517b are arranged to rotate 180 degrees while rotating the turntable 517. This is shown by the curved arrow in Figure 6. Alternatively, instead of using a turntable, instead of using a turntable, a carrier mount 517 is moved linearly back and forth over the track 518 (as indicated by the double arrow). If it is desired to machine the same surface of the substrate, the carrier mount 517 is moved linearly to the second path position (as indicated by the dashed line) while rotating 180°. It should be noted, however, that although in this example, one or two carriers may be loaded in the carrier transport chamber, in other embodiments it may be possible to provide more than two loads in the carrier transport module. Applications.
圖7顯示一移動式加工腔室,如腔室504之腔室主體一實例,而圖8為圖7之腔室主體之截面圖。根據此實施例,該腔室主體是從單一金屬塊,如鋁塊製造而成,以提供四個加工站,成對且背對背排列。在此實例,是將單一的鋁塊車製成通透通道534a及534b,在其中放置軌道,以容載具行進通過其中。如圖所顯示,當通透通道534a及534b車製完成後,仍留有一分隔牆540,用來分隔該腔室主體成為兩部分,兩者對該分隔牆540形成對稱。同時,也在主體的各面車出成對的孔洞,用來放置濺鍍源。在此實例中,成對的孔洞544a及544b是形成在成對孔洞544c及544d的相對面。除此之外,也車出出入洞孔538,用以放置該動力滾輪508。如有必要,也可車出洞孔537,以提供對真空抽氣泵的進出,以及洞孔539,用以設置真空閥。同樣地,也可車出其他有螺紋或無螺紋的洞孔,以供元件固定之用,例如固定腔室附屬件及/或支撐件等。Figure 7 shows an example of a mobile processing chamber, such as the chamber body of chamber 504, and Figure 8 is a cross-sectional view of the chamber body of Figure 7. According to this embodiment, the chamber body is fabricated from a single piece of metal, such as an aluminum block, to provide four processing stations, arranged in pairs and back to back. In this example, a single aluminum block car is formed into through passages 534a and 534b in which the rails are placed to allow the carrier to travel therethrough. As shown in the figure, after the through passages 534a and 534b are finished, a partition wall 540 is left to separate the chamber body into two parts, and the two form a symmetry to the partition wall 540. At the same time, pairs of holes are also placed in each side of the main body to place the sputtering source. In this example, pairs of holes 544a and 544b are formed on opposite sides of the pair of holes 544c and 544d. In addition, an access hole 538 is also provided for placing the power roller 508. If necessary, a hole 537 can also be provided to provide access to the vacuum pump and a hole 539 for setting the vacuum valve. Similarly, other threaded or unthreaded holes can be driven for component mounting, such as fixed chamber attachments and/or supports.
圖9顯示另一種實例的基板載具905,該基板載具可應用於本發明所揭示之任一該系統。載具905不同於載具105的點是無配備滾 輪。反而是將所有滾輪,包括用來吸附及傳送的磁性滾輪與動力滾輪,都固定在該系統的各種裝載站與各種腔室內部。在此實施例中,該系統並無軌道,而是使各腔室的基底都配備動力化滾輪及惰輪(以下合稱「滾輪108」-請注意,圖9中只顯示少數滾輪,圖中連續3點代表其滾輪的排列在全部的路徑中繼續延伸),用來支持及移送保持在豎直狀態的載具905。基底909嚙合該滾輪並在加工及傳輸中保持豎直狀態。此種設計下可將該載具製成極薄,並使該裝載腔室可更快速淨空,且因為該閥門葉片(gate blade)移動距離極短,故該真空閥可極快速開啟及關閉。該基板藉由接點906支撐在空間903內,接點906中有兩個(或多個)為固定不動,另兩個為可以凸片927(圖9中僅顯示1支凸片)移動。如圖所示,當凸片927向弓形箭頭方向移動時,接點的銷回縮,即可更換基板。接著可將凸片釋放,接點906即回彈,頂住該基板。同時,如圖中虛線所顯示,若使用線性馬達而非動力滾輪,可將一連串永久磁鐵901置於基底909上,以提供驅動力以結合設置於該腔室基底之線性馬達線圈(未圖示)。相似之裝置可使用於本發明所揭示之其他載具。Figure 9 shows another example substrate carrier 905 that can be applied to any of the systems disclosed herein. The point at which the carrier 905 is different from the carrier 105 is unequipped. wheel. Instead, all of the rollers, including the magnetic rollers and power rollers for adsorption and transfer, are attached to various loading stations and various chambers of the system. In this embodiment, the system has no rails, but the base of each chamber is equipped with a motorized roller and an idler (hereinafter referred to as "roller 108" - please note that only a few rollers are shown in Figure 9, continuous in the figure The 3 point represents that the arrangement of its rollers continues to extend throughout the path) for supporting and transferring the carrier 905 held in the upright position. The base 909 engages the roller and remains in a vertical position during processing and transport. In this design, the carrier can be made extremely thin, and the loading chamber can be cleared more quickly, and because the gate blade moves a very short distance, the vacuum valve can be opened and closed extremely quickly. The substrate is supported in the space 903 by contacts 906. Two (or more) of the contacts 906 are fixed, and the other two are movable by the tabs 927 (only one of the tabs is shown in FIG. 9). As shown, when the tab 927 is moved in the direction of the arcuate arrow, the pin of the contact is retracted, and the substrate can be replaced. The tab can then be released and the contact 906 springs back against the substrate. Meanwhile, as shown by the broken line in the figure, if a linear motor is used instead of the power roller, a series of permanent magnets 901 can be placed on the substrate 909 to provide a driving force to couple the linear motor coils disposed on the base of the chamber (not shown). ). Similar devices can be used with other vehicles disclosed herein.
圖10A及圖10B顯示在如圖5及圖6所顯示之系統操作期間中一時間之即時快照圖。如圖所示,數個載具是在該系統內同時操作。圖中顯示載具105a位在迴轉台171上之,在此之前一基板已經從卸載腔172b(圖10B)之載具上移除,且該載具105a已經可以移動至裝載站172a。此時,載具105b位在裝載站172a內,已裝載一基板,且已經可以移動至加熱站173a內。在加熱站173a內,在載具105c上之基板已達到其所需溫度,且該載具正要離開該腔室並加速至快速傳輸速度,以追上載具105d。 加工腔174a和175a在此實例中為2個濺鍍腔,其間留有開放通道。在加工腔174a和175a內有3個載具105d-105f是在加工速度下移動,一個接著一個,當時其基板從一濺鍍源供應濺鍍材料進行沈積。如圖所顯示,此快照顯示載具105g甫於腔室175a內加工完成,且已經加速移動至迴轉腔室176內當時之狀態。由此開始,該載具將以相反方向通過該系統之另一側,如圖10B所顯示,而抵達載具105a現在所在之位置。10A and 10B show an instant snapshot of a time during operation of the system as shown in FIGS. 5 and 6. As shown, several vehicles are operating simultaneously within the system. The figure shows that the carrier 105a is positioned on the turntable 171, after which a substrate has been removed from the carrier of the unloading chamber 172b (Fig. 10B) and the carrier 105a has been moved to the loading station 172a. At this time, the carrier 105b is located in the loading station 172a, has loaded a substrate, and has been moved into the heating station 173a. Within the heating station 173a, the substrate on the carrier 105c has reached its desired temperature and the carrier is about to leave the chamber and accelerate to a fast transfer speed to track the carrier 105d. Processing chambers 174a and 175a are, in this example, two sputtering chambers with open channels therebetween. Within the processing chambers 174a and 175a, three carriers 105d-105f are moved at processing speeds, one after the other, while their substrates are deposited from a sputtering source to supply a sputtering material. As shown, this snapshot shows that the carrier 105g has been machined in chamber 175a and has accelerated to the state of rotation within chamber 176. From this point on, the carrier will pass in the opposite direction through the other side of the system, as shown in Figure 10B, to the location where the carrier 105a is now.
如圖10B所顯示,載具105h-105j在腔室174b及175b之濺鍍源前,一個接著一個以加工速度移動。載具105k於退火站173b內靜止不動,載具105l則於卸載站172b內靜止不動,在此該基板從該載具上卸載。由此該載具將行進到迴轉站171內之載具105a所顯示之位置。As shown in Fig. 10B, the carriers 105h-105j are moved one by one at a processing speed before the sputtering sources of the chambers 174b and 175b. The carrier 105k is stationary in the annealing station 173b, and the carrier 1051 is stationary in the unloading station 172b, where the substrate is unloaded from the carrier. Thereby the carrier will travel to the position displayed by the carrier 105a in the revolving station 171.
從以上說明可以理解,在該濺鍍源115a-115d前之空間常時會有基板存在,如此可使該濺鍍源115a-115d持續操作且因此達到完全利用的目的。相對於此,該加熱及退火製程可在固定模式下執行,從而簡化該等腔室之尺寸及結構。為結合固定式加工腔室及移動式加工腔室,本發明使用兩種傳輸速度,即快速傳輸速度及移動式加工速度。在此實例,是使該動力滾輪可在至少三種模式下操作,達到此目的。該三種模式為:停止、加工速度及快速傳輸速度,該快速傳輸速度高於該加工速度。又在此實例中,每一動力滾輪都可在三種模式下獨自操作;但另一種作法是,使該滾輪可根據其位置不同,以群組操作。例如,位於該濺鍍腔中心之滾輪,可能永遠不需在快速傳輸速度下操作,而只會在移動式加工速度下操作。與此相似,接近濺鍍腔入口處及出口處之滾輪可能永遠不需在移動式加工速度下操作,只會在快速傳輸速度下操作。As can be understood from the above description, a substrate is often present in the space before the sputtering sources 115a-115d, so that the sputtering sources 115a-115d can be continuously operated and thus achieve the purpose of full utilization. In contrast, the heating and annealing process can be performed in a fixed mode, thereby simplifying the size and configuration of the chambers. To combine a fixed processing chamber with a mobile processing chamber, the present invention uses two transmission speeds, namely a fast transfer speed and a mobile processing speed. In this example, the power roller can be operated in at least three modes for this purpose. The three modes are: stop, processing speed and fast transmission speed, and the fast transmission speed is higher than the processing speed. Also in this example, each power roller can operate alone in three modes; however, another method is to enable the rollers to operate in groups depending on their position. For example, a roller located at the center of the sputtering chamber may never need to operate at a fast transfer speed, but only at a mobile processing speed. Similarly, rollers near the entrance and exit of the sputter chamber may never need to be operated at mobile processing speeds and will only operate at fast transfer speeds.
並且,該移動式加工腔室之尺寸設成使其入口側有一死區(dead-space)181,使得進入的載具可以從其前緣開始進行加工,並在整個移動過程中持續加工基板的全部表面。同時,在其出口側也有一死區(dead-space)182,使得出去的載具可以完成直到其後緣的加工,之後才加速移動到該迴轉腔內。該位於入口側之死區181並可提供一空間,以使載具能在其基板之前緣進入該加工區之前加速,並追上前一個載具。如此,該死區181亦可稱為該加工腔室之傳輸區;而該腔室之其餘部分可稱為加工區。雖然並不代表其比例,但圖10所例示的死區181大小設成足以使載具105c加速,以在載具105d上之基板之後緣抵達該濺鍍源115a之前緣191以前,追上載具105d。因此,在此例中,該傳輸區製成比該基板寬度更長。在此方式下,一新載具可在前一個基板之整個表面完成濺鍍加工前,即位在該移動式加工腔室中。Moreover, the mobile processing chamber is sized such that its inlet side has a dead-space 181 so that the incoming carrier can be processed from its leading edge and the substrate is continuously processed throughout the movement. All surfaces. At the same time, there is also a dead-space 182 on its exit side so that the outgoing carrier can be completed until its trailing edge is processed before it is accelerated into the rotary chamber. The dead zone 181 on the inlet side can provide a space to enable the carrier to accelerate before the leading edge of the substrate enters the processing zone and catch up with the previous carrier. As such, the dead zone 181 can also be referred to as the transfer zone of the processing chamber; and the remainder of the chamber can be referred to as a processing zone. Although not representative of the ratio, the dead zone 181 illustrated in FIG. 10 is sized to accelerate the carrier 105c to catch the carrier before the trailing edge of the substrate on the carrier 105d reaches the leading edge 191 of the sputtering source 115a. 105d. Thus, in this example, the transfer zone is made longer than the width of the substrate. In this manner, a new carrier can be placed in the mobile processing chamber before the entire surface of the previous substrate is sputtered.
圖11顯示一裝載及卸載機構之實例,該機構可適用於任一本發明所揭示之系統中。圖11之實例顯示沿圖6中之B-B線之截面圖。圖11顯示裝載腔1101耦接至裝載腔1103,且裝載腔1111耦接至卸載腔1123。各腔室都藉由真空抽氣泵1107抽氣。另一種作法是如以下將詳細說明者,使腔室1101及1111與其相對之裝載及卸載腔1103與1123保持在相同真空環境下,故而在腔室1101及1103之間,與腔室1111及1123之間,均無須使用閘門。也就是,腔室1101與1103之間,以及腔室1111與1123之間,都有一暢行通道。此種設計將在圖12-15有關之實施例中,作更詳細的說明。Figure 11 shows an example of a loading and unloading mechanism that can be adapted for use in any of the systems disclosed herein. The example of Fig. 11 shows a cross-sectional view taken along line B-B of Fig. 6. FIG. 11 shows that the loading chamber 1101 is coupled to the loading chamber 1103 and the loading chamber 1111 is coupled to the unloading chamber 1123. Each chamber is evacuated by a vacuum pump 1107. Alternatively, as will be described in more detail below, chambers 1101 and 1111 are maintained in the same vacuum environment as their opposite loading and unloading chambers 1103 and 1123, thus between chambers 1101 and 1103, and chambers 1111 and 1123. There is no need to use a gate between them. That is, there is an unobstructed passage between the chambers 1101 and 1103 and between the chambers 1111 and 1123. Such a design will be described in more detail in the embodiment of Figures 12-15.
基板匣1120在軌道1121上移動,以將未加工的基板移送 至該加工系統,也從該系統移除已加工之基板。圖中顯示基板匣1120a位在裝載位置,其中升降機1113將未加工的基板一個一個垂直提升至裝載腔1101內。在裝載腔1101,一傳輸器1109從升降機1113上卸除該基板,並水平移動以裝載該基板至載具1105a上。在該分隔牆1140的另一側,傳輸器1108從載具1105b卸除基板,並傳輸至升降機1114。升降機1114將該基板降低至基板匣1120b上。The substrate 匣 1120 moves on the track 1121 to transfer the unprocessed substrate To the processing system, the processed substrate is also removed from the system. The substrate 匣 1120a is shown in the loading position, wherein the elevator 1113 vertically lifts the unprocessed substrates one by one into the loading chamber 1101. In the loading chamber 1101, a conveyor 1109 removes the substrate from the elevator 1113 and moves horizontally to load the substrate onto the carrier 1105a. On the other side of the dividing wall 1140, the conveyor 1108 unloads the substrate from the carrier 1105b and transports it to the elevator 1114. The elevator 1114 lowers the substrate onto the substrate 匣 1120b.
從以上說明可以理解,因為該基板的尺寸及該傳輸機構的尺寸,該裝載腔1101及1111尺寸需增大,以免每次一新基板進入時還需費時抽氣至真空。尤其是當該基板是由豎直狀態的傳輸器以水平方向移動時,更是如此。若此確實成為技術難題,可以幾種方法來克服。例如,可在開始抽真空之前,將數個基板裝載至該裝載腔,即可以傳輸器將該數個載具一個接一個裝載,之後再將下一批次進料到該傳輸腔。雖然這種作法是一種可行之解決方案,但會使該傳輸器機構之結構複雜化,且因需裝載基板至該傳輸器腔室,並抽氣至真空環境,故會產生沒有載具可以裝載的時間。圖12顯示另一個解決方式。As can be understood from the above description, because of the size of the substrate and the size of the transport mechanism, the size of the loading chambers 1101 and 1111 needs to be increased to avoid time-consuming pumping to vacuum every time a new substrate enters. This is especially true when the substrate is moved in a horizontal direction by a conveyor in a vertical state. If this does become a technical problem, there are several ways to overcome it. For example, several substrates can be loaded into the loading chamber before the vacuuming begins, i.e., the conveyor can load the plurality of carriers one after the other, and then feed the next batch to the transfer chamber. Although this method is a feasible solution, the structure of the transmitter mechanism is complicated, and since the substrate needs to be loaded into the transmitter chamber and evacuated to a vacuum environment, no carrier can be loaded. time. Figure 12 shows another solution.
圖12顯示本發明一實施例之系統架構,其中基板是在裝載至該傳輸器機構前,先裝載至真空。圖12中與圖11相同的元件,均標示相似的參考號碼。如圖12所顯示,腔室1201及1211有一無門開口,分別通至其個別裝載腔1103及卸載腔1123,並可與後者共用氣壓,且使基板在此腔室間通行順暢。因此,腔室1201及1211實質上只是裝載腔1103及卸載腔1123之個別延伸,且可稱為傳輸器腔室。Figure 12 shows a system architecture in accordance with an embodiment of the present invention in which the substrate is loaded to a vacuum prior to loading into the conveyor mechanism. Elements in Figure 12 that are identical to Figure 11 are labeled with similar reference numbers. As shown in Fig. 12, the chambers 1201 and 1211 have a doorless opening that leads to their respective loading chambers 1103 and unloading chambers 1123, and can share the air pressure with the latter, and allows the substrate to pass smoothly between the chambers. Thus, chambers 1201 and 1211 are essentially only individual extensions of loading chamber 1103 and unloading chamber 1123 and may be referred to as transmitter chambers.
傳輸器腔1201具有一裝載腔1203,固定於其底板。裝載 腔1203具有一低真空閥門1207,與大氣介接,及一高真空閥門1209,與該傳輸器腔1201介接。該裝載腔1203基本上為一方形截面之管子,且其內部容積製成極小,基本上只比該基板本身大一些,以使其可藉由抽氣泵1205輕易快速地抽真空。也就是,裝載腔1203之內部製成與該基板相同之形狀,只是略大些。傳輸器腔1201藉由抽氣泵1107經常保持真空。另一種作法是,可用適當的管道連接閥門,故可只使用一個抽氣泵,即可同時對傳輸腔1201及裝載腔1203抽真空。The transmitter cavity 1201 has a loading chamber 1203 that is secured to its bottom plate. load The cavity 1203 has a low vacuum valve 1207 that interfaces with the atmosphere and a high vacuum valve 1209 that interfaces with the transmitter cavity 1201. The loading chamber 1203 is substantially a tube having a square cross section, and its internal volume is made extremely small, substantially only larger than the substrate itself, so that it can be easily and quickly evacuated by the air pump 1205. That is, the inside of the loading chamber 1203 is formed in the same shape as the substrate, but is slightly larger. The transmitter chamber 1201 is often kept under vacuum by the air pump 1107. Alternatively, the valve can be connected by a suitable conduit so that the transfer chamber 1201 and the loading chamber 1203 can be simultaneously evacuated using only one pump.
當閥門1207開啟且閥門1209關閉時,該升降機1113裝載一基板至裝載腔1203內。閥門1207即關閉且抽氣泵1205即對該裝載腔1203抽真空。一旦達到真空,閥門1209即開啟,並將該基板裝載至該傳輸器1109上。其方式是藉由使該升降機1113上端部分在閥門1207內自由滑動,加以達成。在卸載時執行反向過程。也就是,當閥門1208及1210都關閉時,抽氣泵1206即對該卸載腔1204抽真空。隨後閥門1210即開啟,而閥門1208保持關閉,並從該傳輸器1108卸除一基板,裝載至該裝載腔1204。接著閥門1210即關閉,而閥門1208開啟,並從該裝載腔1204卸除該基板,再裝載至基板匣1120b上。When the valve 1207 is open and the valve 1209 is closed, the elevator 1113 loads a substrate into the loading chamber 1203. Valve 1207 is closed and pumping pump 1205 draws vacuum into loading chamber 1203. Once the vacuum is reached, valve 1209 is opened and the substrate is loaded onto the conveyor 1109. This is achieved by freely sliding the upper end portion of the elevator 1113 within the valve 1207. Perform the reverse process when uninstalling. That is, when the valves 1208 and 1210 are both closed, the air pump 1206 vacuums the unloading chamber 1204. Valve 1210 is then opened, and valve 1208 remains closed, and a substrate is removed from the conveyor 1108 and loaded into the loading chamber 1204. Valve 1210 is then closed and valve 1208 is opened and the substrate is removed from the loading chamber 1204 and loaded onto substrate 1120b.
圖13顯示一裝載腔真空閥門與基板升降機組合之示意圖。圖13顯示之實施例可使用於例如圖12之系統。在圖13中,主體131可作為該升降機元件134之外罩,可由馬達135驅動,作垂直移動。升降機元件134可為例如一提升葉片,在主體131內可自由移動,且可由馬達136驅動,作垂直移動。在此實施例中,該垂直移動機構包括馬達135及136,提供垂直移動的動力至該主體131及升降機元件134,使其可分別獨 立移動。該密封板132建置成可嚙合一互補密封板,例如,圖12之1207,並與之形成一真空密封。Figure 13 shows a schematic diagram of a combination of a chamber vacuum valve and a substrate lift. The embodiment shown in Figure 13 can be used in, for example, the system of Figure 12. In Fig. 13, the main body 131 can function as a cover for the elevator element 134, which can be driven by the motor 135 for vertical movement. The elevator element 134 can be, for example, a lifting blade that is free to move within the body 131 and can be driven by the motor 136 for vertical movement. In this embodiment, the vertical movement mechanism includes motors 135 and 136 that provide vertically moving power to the body 131 and the elevator member 134 so that they can be separately Move. The sealing plate 132 is configured to engage a complementary sealing plate, such as 1207 of Figure 12, and form a vacuum seal therewith.
在操作時,在初始位置時,該主體131及升降機元件134皆位在其較低位置。從該初始位置,一基板位於該升降機元件134,例如提升葉片之刀尖上。接著將主體131及升降機元件134皆上升至使該基板完全位在裝載腔(例如圖2之裝載腔1203)內,且該密封板132嚙合在該裝載腔上之附加密封板,而形成一真空密封之位置。隨即對該裝載腔抽氣,達到真空。一旦達到真空狀態,即將閥門1209開啟並使該升降機元件134在主體131內自由滑動,以更加提升,以將基板移動到該傳輸器可以達到之位置,以使該傳輸器可嚙合該基板。接著將該升降機元件134降低,以關閉該閥門1209。一旦該閥門1209關閉,即可使該裝載腔回到大氣壓,並將該主體131及升降機元件134降低至其初始之位置,以接收另一個基板。In operation, the main body 131 and the elevator element 134 are both in their lower positions in the initial position. From this initial position, a substrate is located on the elevator element 134, such as the tip of the lift blade. The main body 131 and the elevator element 134 are then raised to the full position of the substrate in the loading chamber (such as the loading chamber 1203 of FIG. 2), and the sealing plate 132 engages an additional sealing plate on the loading chamber to form a vacuum. The location of the seal. The loading chamber is then evacuated to achieve a vacuum. Once the vacuum condition is reached, the valve 1209 is opened and the elevator element 134 is free to slide within the body 131 for further lift to move the substrate to a position that the conveyor can reach so that the transmitter can engage the substrate. The elevator element 134 is then lowered to close the valve 1209. Once the valve 1209 is closed, the loading chamber can be returned to atmospheric pressure and the body 131 and elevator element 134 lowered to their original position to receive another substrate.
如圖12所顯示,該升降機裝置成可以垂直移動基板,而基板由該升降機保持在豎直狀態,而該傳輸器則建置成以水平移動基板,但基板仍由該升降機保持在豎直狀態。該載具亦建置成保持該基板在豎直狀態。因此,一旦該基板離開該基板匣,綜其在該系統內之傳輸與加工過程中,均保持在豎直狀態,直到返回該基板匣為止。在該基板匣內時,基板可以豎直或水平狀態存放,將於以下說明。As shown in FIG. 12, the elevator device is configured to vertically move the substrate while the substrate is held in a vertical state by the elevator, and the transmitter is configured to move the substrate horizontally, but the substrate is still held in the vertical state by the elevator. . The carrier is also constructed to maintain the substrate in a vertical state. Thus, once the substrate exits the substrate, it remains in a vertical state during transport and processing within the system until it returns to the substrate. When in the substrate, the substrate can be stored in a vertical or horizontal state, as will be explained below.
圖14顯示另一實施例之系統,該實施例可以提高基板裝載之使用率。圖14顯示之系統與圖12相似,且圖中與圖12相同的元件,均標示相似的參考號碼。圖14之實施例,藉由包含兩個裝載腔於該裝載 側及包含兩個裝載腔在該卸載側,而使基板裝載較圖11及12更為快速。在該裝載側,一第一裝載腔1203及一第二裝載腔1403可使用與圖12相似方式製成,並使用在圖13顯示之閥門與基板裝載機構的結合。也就是,閥門與基板裝載機構的結合1413與裝載腔1403連結操作,而閥門與基板裝載機構的結合1113與裝載腔1203連結操作。在操作期間,當一側的裝載腔,例如裝載腔1203抽氣至真空階段時,另一側的裝載腔,例如裝載機構1413可用來裝載新的基板,並提升至裝載腔1403。接著,當裝載腔1403開始操作真空抽氣時,在該裝載腔1203之該基板可提升至傳輸器1109,並接著進氣至大氣壓力,以為再裝載其他基板做準備。在該卸載側可執行類似的操作,其中之閥門與基板裝載機構的結合1114與裝載腔1204連結操作,且閥門與基板裝載機構的結合1414與裝載腔1404連結操作。Figure 14 shows a system of another embodiment which can increase the substrate loading usage. The system shown in Fig. 14 is similar to Fig. 12, and the same components as those in Fig. 12 are denoted by similar reference numerals. The embodiment of Figure 14 by including two loading chambers for the loading The side and the two loading chambers are on the unloading side, and the substrate loading is faster than Figures 11 and 12. On the loading side, a first loading chamber 1203 and a second loading chamber 1403 can be fabricated in a manner similar to that of Figure 12, using the combination of the valve and substrate loading mechanism shown in FIG. That is, the combination 1413 of the valve and substrate loading mechanism is coupled to the loading chamber 1403, and the combination 1113 of the valve and substrate loading mechanism is coupled to the loading chamber 1203. During operation, when one side of the loading chamber, such as loading chamber 1203, is pumped to the vacuum stage, the other side of the loading chamber, such as loading mechanism 1413, can be used to load a new substrate and lift to loading chamber 1403. Next, when the loading chamber 1403 begins to operate vacuum pumping, the substrate at the loading chamber 1203 can be lifted to the conveyor 1109 and then pumped to atmospheric pressure to prepare for reloading other substrates. A similar operation can be performed on the unloading side, wherein the combination of the valve and substrate loading mechanism 1114 is coupled to the loading chamber 1204, and the combination of the valve and substrate loading mechanism 1414 is coupled to the loading chamber 1404.
在圖11-14之實施例中,可看見該基板藉由提升葉片直接從該基板匣內提升。然而,此配置並非一定可行。例如,在某些製造設備中普遍都配置的基板匣,都是將基板水平置於基板匣內。在此種設備中,本發明的提升葉片就無法用來從基板匣中提升基板,因為本發明的提升葉片設計成用來提升處在豎直狀態的基板。此外,在某些系統中,用以傳輸該基板匣之軌道,並未對準該加工系統之裝載腔,而使該基板無法在在垂直提升之後,即進入該裝載腔。In the embodiment of Figures 11-14, the substrate is seen to be lifted directly from the substrate by lifting the blade. However, this configuration is not necessarily feasible. For example, substrate rafts, which are commonly deployed in some manufacturing equipment, place the substrate horizontally within the substrate stack. In such an apparatus, the lifting blade of the present invention cannot be used to lift a substrate from a substrate because the lifting blade of the present invention is designed to lift a substrate in a vertical state. Moreover, in some systems, the track used to transport the substrate is not aligned with the loading chamber of the processing system, such that the substrate cannot enter the loading chamber after vertical lifting.
圖15顯示一用以卸載及裝載基板至該基板匣之配置示意圖,其中該基板是以水平狀態停留在該基板匣內,且其中用以傳輸該基板匣之軌道並非接近,也未對準該裝載及卸載腔。對此,圖15之實例提供解決前段落所述兩種問題的方法。圖15顯示之實施例可以在圖14的系統 中實施,並顯示成如在圖14中之C-C線所見之截面圖。在圖15之元件與其他圖相同者,均標示相同參考號碼。在圖15中,該基板匣1120a及1120b等等所使用的軌道1121置於前方,而非置於該系統之裝載區下方。例如,圖中顯示軌道1121位於該迴轉腔529與傳輸器腔1201及1211前方。請注意,因迴轉腔529與傳輸器腔1201及1211位於該區C-C線上方,故用虛線顯示。15 is a schematic view showing a configuration for unloading and loading a substrate to the substrate, wherein the substrate is in a horizontal state in the substrate, and the track for transporting the substrate is not close to or aligned with the substrate. Load and unload chambers. In this regard, the example of Figure 15 provides a solution to the two problems described in the previous paragraph. Figure 15 shows an embodiment of the system of Figure 14 Implemented therein and shown as a cross-sectional view as seen on line C-C in FIG. The elements in Fig. 15 are identical to the other figures, and the same reference numerals are assigned. In Fig. 15, the tracks 1121 used for the substrate cassettes 1120a and 1120b and the like are placed in front, not under the loading area of the system. For example, the track 1121 is shown in front of the rotary chamber 529 and the transmitter chambers 1201 and 1211. Please note that since the rotary chamber 529 and the transmitter chambers 1201 and 1211 are located above the C-C line of the region, they are shown by broken lines.
機械手臂1550及1555皆可伸縮並可迴轉,其運動方向如圖中雙向箭頭及旋轉箭頭所示。要將每一基板裝載至該系統時,該機械手臂1550延伸,以從基板匣1120a卸除一基板。機械手臂接著回縮,以對準升降機1113與1413中之一,並迴轉,以使該升降機可嚙合於該基板之邊緣,並從該機械手臂卸除基板。以此方法,可使用機械手臂1550裝載基板至升降機1113及1413。同樣地,要從該系統卸載基板時,機械手臂1555達到其回縮及旋轉後位置,以使一基板可從升降機1114或1414裝載至該機械手臂上。一旦該基板已裝載至該機械手臂1555,機械手臂1555即延伸並旋轉,以將基板放置至基板匣1120b上。The robot arms 1550 and 1555 are both retractable and rotatable, and their movement directions are shown by the double-headed arrows and the rotating arrows in the figure. To load each substrate into the system, the robotic arm 1550 extends to remove a substrate from the substrate 匣 1120a. The robotic arm is then retracted to align one of the elevators 1113 and 1413 and swivel so that the elevator can engage the edge of the substrate and remove the substrate from the robotic arm. In this way, the robotic arm 1550 can be used to load the substrates to the elevators 1113 and 1413. Similarly, to unload the substrate from the system, the robotic arm 1555 reaches its retracted and rotated position so that a substrate can be loaded from the elevator 1114 or 1414 onto the robotic arm. Once the substrate has been loaded to the robotic arm 1555, the robotic arm 1555 extends and rotates to place the substrate onto the substrate cassette 1120b.
在圖15之系統中,該基板只能在一表面上加工。若在盒子1120a內之基板已有預定之背側及前側表面,能將基板放置成使正確的表面面對加工源,極為重要。例如,該基板可能需要放置成使濺鍍層能形成在每一基板之正確(正面或背面)表面。此可藉由以交替方向放置基板於該基板匣內,例如使其面朝上,朝下,朝上,朝下等排放,因而當該機械手臂一個接一個輪流放置該基板至升降機1113及1413上時,在所有基板裝載至傳輸腔1201上時,都面對同一方向。也就是說,機械手臂將基 板放置到升降機1143上時,是朝一方向迴轉,例如以順時針方向迴轉,但是在將基板放置到升降機1113上時,該機械手臂是向另一方向,例如逆時鐘方向迴轉。In the system of Figure 15, the substrate can only be processed on a surface. If the substrate in the box 1120a has a predetermined back side and front side surface, it is extremely important to place the substrate so that the correct surface faces the processing source. For example, the substrate may need to be placed such that a sputter layer can be formed on the correct (front or back) surface of each substrate. This can be achieved by placing the substrate in the substrate in alternating directions, for example, facing upwards, downwards, upwards, downwards, etc., so that the robots place the substrates one after another in turn to the elevators 1113 and 1413. In the upper case, when all the substrates are loaded onto the transfer chamber 1201, they face the same direction. In other words, the robot arm will base When the board is placed on the elevator 1143, it is rotated in one direction, for example, in a clockwise direction, but when the substrate is placed on the elevator 1113, the robot arm is rotated in the other direction, for example, in the counterclockwise direction.
相對於此,因為該基板匣也會在工廠內其他系統間傳輸,且因為多數已知機械均設置成用來處理以全部面對同一方向置放在基板匣內的基板,因此必須提供一種系統,即使基板在基板匣中全部面對同一方向,仍可正確的裝載基板。為達成此目的,在本發明一實施例中,該機械手臂設置成只朝同一方向迴轉,例如向順時鐘方向迴轉。然而,該機械手臂嚙合基板時,卻是從上方與從下方,交替執行。例如,要裝載該基板匣1120a內的第一基板時,機械手臂1550從下方嚙合該第一基板,接著回縮並順時鐘方向旋轉90°,以裝載該第一晶圓至升降機1413。接著該機械手臂1550再順時鐘旋轉90°並延伸,以從上方嚙合第二基板。機械手臂1550接著回縮,再順時鐘旋轉90°以裝載該第二晶圓至升降機1113。之後,該機械手臂1550又順時鐘旋轉90°並延伸,以從下方嚙合第三基板,餘此類推。以此方式,即使該機械手臂只向相同方向旋轉,且該基板置於盒子內時皆面對相同方向,當該基板引導進入傳輸腔1201後,也全都會面對相同的方向。In contrast, since the substrate stack is also transferred between other systems in the factory, and since most known machines are arranged to process substrates that are all placed in the same direction in the substrate, it is necessary to provide a system. Even if the substrates all face the same direction in the substrate, the substrate can be correctly loaded. To achieve this, in an embodiment of the invention, the robot arm is arranged to swivel only in the same direction, for example in a clockwise direction. However, when the mechanical arm engages the substrate, it is alternately performed from above and from below. For example, when the first substrate in the substrate cassette 1120a is to be loaded, the robot arm 1550 engages the first substrate from below, and then retracts and rotates 90° in the clockwise direction to load the first wafer to the elevator 1413. The robot arm 1550 is then rotated 90° clockwise and extended to engage the second substrate from above. The robot arm 1550 is then retracted and rotated 90° clockwise to load the second wafer to the elevator 1113. Thereafter, the robot arm 1550 is rotated 90° clockwise and extended to engage the third substrate from below, and so on. In this way, even if the robot arms are only rotated in the same direction and the substrate faces the same direction when placed in the case, all of the faces will face the same direction when the substrate is guided into the transfer chamber 1201.
圖15之放大圖提供該機械手臂1555之前視圖,以更詳細描繪該機械手臂如何旋轉,以及該升降機1114及1414如何提升該基板。機械手臂1555利用箝夾1552箝住並保持基板,並將該基板1105從基板匣取出。該機械手臂1555接著繞軸1553旋轉90°,使該基板1105對準該升降機1414,如圖中虛線所示。該基板1105被該升降機1414提升後,該機 械手臂1555即延伸並再旋轉90°,以從該基板匣取出另一片基板,但此時箝夾的方向與前一片基板方向相反。也就是,若該機械手臂箝夾第一片基板時是使其箝夾從基板上方嚙合基板,則在箝夾第二片基板時,是使其箝夾從基板下方嚙合基板。其後該機械手臂回縮,並旋轉90°以使基板與升降機1114對準。The enlarged view of Figure 15 provides a front view of the robotic arm 1555 to more detail how the robotic arm rotates and how the elevators 1114 and 1414 lift the substrate. The robot arm 1555 clamps and holds the substrate with the clamp 1552 and takes the substrate 1105 out of the substrate. The robot arm 1555 is then rotated 90° about the axis 1553 to align the substrate 1105 with the elevator 1414, as shown by the dashed lines in the figure. After the substrate 1105 is lifted by the elevator 1414, the machine The arm 1555 extends and is rotated another 90[deg.] to extract another substrate from the substrate, but at this time the direction of the jaws is opposite to the direction of the previous substrate. That is, if the mechanical arm clamps the first substrate so that the jaws engage the substrate from above the substrate, the second substrate is clamped so that the jaws engage the substrate from below the substrate. The robot arm is then retracted and rotated 90° to align the substrate with the elevator 1114.
圖16為顯示另一實施例之示意圖,用以顯示本發明系統之模組化。此實施例提供4種共用的元件,可以組合及配合,以根據需求產生不同的系統。圖16之系統所具有的共用元件有:載具傳輸模組1600,基板裝載/卸載模組1605,固定式加工模組1610,及移動式加工模組1615。這4個模組就如積木一般,不同的系統架構可以使用這些積木之一或以任何方式組合,構成其系統。每塊積木都具有自己的真空設備,並且可直接與任何其他積木連結,只要其中一模組提供一真空閥門,而可配接與之配對的模組上的一開口即可。另一種作法是將所有模組設成旋轉對稱(如圖中所示的重心標記與彎曲箭頭所示),以此使該基板裝載/卸載模組、該固定式加工模組、及該移動式加工模組個別可旋轉180°,而在原位置配接其配對的模組。該載具傳輸模組也設計成旋轉對稱,但當其旋轉180°後,會配接於該系統的相反側。此外,該基板裝載/卸載模組、該固定式加工模組、及該移動式加工模組個別具有2組相同的真空腔,背對背排列,使其一側形成由該裝載模組通來的第一加工路徑,另一側形成通往該卸載模組的第二加工路徑。Figure 16 is a schematic diagram showing another embodiment for illustrating the modularization of the system of the present invention. This embodiment provides four common components that can be combined and mated to produce different systems as needed. The common components of the system of FIG. 16 include a carrier transport module 1600, a substrate loading/unloading module 1605, a stationary processing module 1610, and a mobile processing module 1615. These four modules are like building blocks. Different system architectures can use one of these blocks or combine them in any way to form their system. Each block has its own vacuum equipment and can be directly connected to any other building block. As long as one of the modules provides a vacuum valve, it can be fitted with an opening in the paired module. Another method is to set all the modules to be rotationally symmetric (as indicated by the center of gravity mark and the curved arrow shown in the figure), so that the substrate loading/unloading module, the fixed processing module, and the mobile type The processing module can be rotated by 180° individually, and the paired modules are matched in the original position. The carrier transport module is also designed to be rotationally symmetrical, but when rotated 180°, it is mated to the opposite side of the system. In addition, the substrate loading/unloading module, the fixed processing module, and the mobile processing module individually have two sets of the same vacuum chambers, arranged side to back, so that one side thereof forms a first pass from the loading module. One processing path, the other side forms a second processing path to the unloading module.
在此實例中,該載具傳輸模組1600具有一可迴轉或一可線性移動的載具座517,如本發明對其他實施例所作之說明所示。在圖16 中顯示,該載具傳輸模組1600的朝向可用來將之設置於該系統之左側。另一載具傳輸組件1600可朝向180°旋轉後的方向,故可設置於該系統之右側。圖中顯示該傳輸組件1600具有自己的真空抽氣設備,並具有真空閥門1602,位於其一側/傳輸路徑上,且在另一側/傳輸路徑具有一開口1603。在其他模組1605、1610及1615的各側也配備有類似的真空閥門1602及開口1603的配置。由此也可知,各個閥門1602是建置成可與配對的模組上的一個開口1603配接。In this example, the carrier transport module 1600 has a rotatable or linearly moveable carrier mount 517 as illustrated by other embodiments of the present invention. In Figure 16 It is shown that the orientation of the carrier transport module 1600 can be used to set it to the left of the system. The other carrier transport assembly 1600 can be oriented in the direction of 180° rotation and can be placed on the right side of the system. The transmission assembly 1600 is shown with its own vacuum pumping device and has a vacuum valve 1602 on one side/transport path and an opening 1603 on the other side/transport path. Similar configurations of vacuum valve 1602 and opening 1603 are also provided on each side of the other modules 1605, 1610, and 1615. It will also be appreciated that each valve 1602 is configured to mate with an opening 1603 in the mating module.
如上所述,該裝載/卸載組件1605具有對稱設計,使其任一側都可作為裝載側,而另一側則可作為卸載側。基板裝載器1631可以設計成與圖12所示實例的升降機1113類似。不過,基板的裝載可以從下方為之,即如圖12所示一般(在此設計下,圖16即成為「摺圖」),但也可如圖16所示,由側面為之。在本實施例中,在裝載側與卸載側均配備2個裝載器1631。如圖12所示的實施例一般,裝載器是設置成密封開口1207與1208,並與真空閥1209與1210協同運作。在該裝載/卸載組件1605任一側的開口1603與真空閥門1602都可以與其他模組配接,故使該裝載/卸載組件1605可位於該系統的任何位置。As described above, the loading/unloading assembly 1605 has a symmetrical design such that either side can serve as the loading side and the other side can serve as the unloading side. The substrate loader 1631 can be designed similar to the elevator 1113 of the example shown in FIG. However, the substrate can be loaded from below, that is, as shown in Fig. 12 (in this design, Fig. 16 is a "folded view"), but it can also be as shown in Fig. 16, from the side. In the present embodiment, two loaders 1631 are provided on both the loading side and the unloading side. In the embodiment shown in FIG. 12, the loader is generally configured to seal the openings 1207 and 1208 and cooperate with the vacuum valves 1209 and 1210. Both the opening 1603 and the vacuum valve 1602 on either side of the loading/unloading assembly 1605 can be mated with other modules so that the loading/unloading assembly 1605 can be located anywhere in the system.
該固定式加工模組1610可用以執行例如加熱,冷卻,固定式沈積,固定式蝕刻等加工。該模組1610之兩側設計完全相同,但各側可加裝不同的固定式加工裝置。例如,固定式加工裝置1622可為一加熱器,而固定式加工裝置1624則可為一熱沈,用以冷卻該基板。重點是,該加工模組1610是建置成使任何加工裝置都可加裝到任一加工側,且亦可任意更換成其他加工裝置。The stationary processing module 1610 can be used to perform processes such as heating, cooling, stationary deposition, stationary etching, and the like. The two sides of the module 1610 are designed identically, but different fixed processing devices can be added to each side. For example, the stationary processing device 1622 can be a heater, and the stationary processing device 1624 can be a heat sink for cooling the substrate. The important point is that the processing module 1610 is constructed such that any processing device can be attached to any processing side, and can be arbitrarily replaced with other processing devices.
移動式加工模組1615與圖7顯示之移動式加工腔504具有相似的結構。每一真空腔皆具有一死區181,與圖10A與10B所示相類。如果因為加工類型及安裝於該移動式模組1615上之加工裝置數量數量不同而有必要,亦可設置死區182。每一真空腔都可安裝一個或多個加工裝置。例如,某一腔室可提供2個磁控管1615,另一腔室則可提供2個磁控管1616。所有的磁控管1616及1615可用來沉積相同的材料在該基板上,但也可使磁控管1616沉積一種材料,而磁控管1615則用來沉積另一種材料。再者,也可使磁控管1616分別用來沉積不同種類的材料,並使用磁控管1615分別用來沉積不同種類的材料,但兩組所沉積的材料形成映射關係。當然,在每一真空腔所提供之磁控管數量可根據所需之加工決定。The mobile machining module 1615 has a similar structure to the mobile machining chamber 504 shown in FIG. Each vacuum chamber has a dead zone 181, similar to that shown in Figures 10A and 10B. The dead zone 182 may also be provided if it is necessary because of the type of processing and the number of processing devices mounted on the mobile module 1615. One or more processing devices can be installed in each vacuum chamber. For example, one chamber can provide two magnetrons 1615 and the other chamber can provide two magnetrons 1616. All of the magnetrons 1616 and 1615 can be used to deposit the same material on the substrate, but the magnetron 1616 can also be used to deposit one material while the magnetron 1615 is used to deposit another material. Furthermore, the magnetron 1616 can also be used to deposit different kinds of materials, respectively, and the magnetron 1615 is used to deposit different kinds of materials, respectively, but the materials deposited by the two groups form a mapping relationship. Of course, the number of magnetrons provided in each vacuum chamber can be determined according to the processing required.
然而應注意的是,雖然在描述上述實施例時,是假設該載具在一移動式真空腔內,以同一方向持續地移動,但也可能使用其他配置。例如,當一載具在該死區內靜止不動時,在該移動式腔室之加工側內的載具,可在該加工裝置前方來回移動。使該載具在一磁控管前來回移動的設計,有助於在基板上形成均勻的沉積層。此外,在特定的加工下,該已裝載基板之載具於該移動式加工腔之加工區內也可保持靜止一段時間。It should be noted, however, that while the above embodiments are described, it is assumed that the carrier is continuously moved in the same direction in a mobile vacuum chamber, although other configurations are possible. For example, when a carrier is stationary in the dead zone, the carrier in the machined side of the mobile chamber can be moved back and forth in front of the processing device. The design of moving the carrier back and forth in front of a magnetron helps to form a uniform deposit on the substrate. In addition, under specific processing, the carrier of the loaded substrate can remain stationary for a period of time in the processing zone of the mobile processing chamber.
雖然以上所揭示的實施例,是以特定的條件敘述,但也可使用本發明的原理,達成其他的實例。再者,所敘述的操作雖然也是以特定的順序說明,但該順序只是該操作實施上的一種實例。其操作方式可以另行安排,修改,或省略其中任何特定步驟,但仍與本發明的特徵相符。Although the embodiments disclosed above are described in terms of specific conditions, other principles can be achieved by using the principles of the invention. Moreover, the operations described are also illustrated in a particular order, but the order is only one example of the implementation of the operation. The manner of operation may be arranged, modified, or omitted in any particular step, but still conforms to the features of the present invention.
所有參考方向用詞(例如上方,下方,向上,向下,左側,右側,向左,向右,頂端,底部,上面,下面等),只用於說明目的,以 幫助讀者瞭解本發明之實施例,且不得作為限定的解釋,特別是對本發明所涉位置,方向或用途的限制,除非已明確在專利申請項中明示。連接關係用詞(例如貼附,耦接,連接及類似用詞)應作廣義解釋,並包括連接元件之間,以及連接元件間相對移動時的中介元件。據此,不得由連接關係用詞推論兩個元件是直接連接,或兩者存在固定關係。All reference directions are used (for example, top, bottom, up, down, left, right, left, right, top, bottom, top, bottom, etc.), for illustrative purposes only, The reader is to be understood as being aware of the embodiments of the invention, and is not to be construed as limiting the scope of the invention, and the scope of the invention. Connection terms (e.g., attachments, couplings, connections, and the like) are to be interpreted broadly and include intervening elements between the elements and the relative movement between the elements. Accordingly, it is not permissible to use the terms of the connection relationship to infer that the two elements are directly connected, or that there is a fixed relationship between the two.
在某些情形下,元件是敘述成具有特定特性的「端」即/或連接至另一部分。但是習於斯藝之人士均可理解,本發明並不限於在連接到另一元件後,越過該點即無延伸之元件。因此,所稱之「端」應以廣義解釋,而使其包括特定構件、連結、元件、零件等之終端附近,在後方、前方或其他鄰近的部分。在以上說明或所附圖式所顯示的任何事物,都應只作為例示之用,絕非用以限制。在不脫離本發明所附申請專利範圍所規範的精神下,都可對其詳情或結構作出改變。In some cases, an element is described as having an "end" of a particular characteristic, ie,/or connected to another portion. However, it will be understood by those skilled in the art that the invention is not limited to elements that extend beyond this point, i.e., without extension, after being connected to another component. Therefore, the term "end" should be interpreted broadly to include the vicinity of the terminal of a particular component, link, component, part, etc., in the rear, in front, or in other adjacent parts. Anything shown in the above description or the drawings should be used for illustration only and is not intended to be limiting. Changes in detail or structure may be made without departing from the spirit and scope of the appended claims.
須注意的是,本專利說明書及所附申請專利範圍所使用的單數型,都包括其複數型,但已明確標示者,不在此限。It should be noted that the singular forms used in the specification and the appended claims are intended to include the plural.
對於習於斯藝之人士而言,在閱讀本案說明書之後,應可將所說明及揭示之個別實施例的個別元件及技術特徵抽離或結合任何其他多種實施的技術特徵,但並不會脫離本發明的範圍與精神。For the person skilled in the art, the individual elements and technical features of the individual embodiments illustrated and disclosed may be decoupled from or combined with any other various technical features, but not departing from the description of the present specification. The scope and spirit of the invention.
100‧‧‧加工系統100‧‧‧Processing system
101、111、503、511、1101、1103、1111、1204、1404‧‧‧裝載腔101, 111, 503, 511, 1101, 1103, 1111, 1204, 1404‧‧‧ loading chamber
102‧‧‧固定式腔102‧‧‧Fixed cavity
103、1105‧‧‧基板103, 1105‧‧‧ substrate
104‧‧‧移動式腔104‧‧‧Mobile cavity
105、105a、105b、105c、105d、105e、105f、105g、105l、105k、105j、105i、105h、905、1105a、1105b‧‧‧載具105, 105a, 105b, 105c, 105d, 105e, 105f, 105g, 105l, 105k, 105j, 105i, 105h, 905, 1105a, 1105b‧‧‧ Vehicle
106、906‧‧‧接點106, 906‧‧‧ contacts
107、1107、1205、1206‧‧‧真空抽氣泵107, 1107, 1205, 1206‧‧‧ vacuum pump
108‧‧‧動力滾輪108‧‧‧Power roller
109‧‧‧載具基底109‧‧‧Carrier base
112、113‧‧‧真空閥112, 113‧‧‧ vacuum valve
115、1615、1616‧‧‧磁控管115, 1615, 1616‧‧‧ magnetron
115a、115b、115c、115d、124、524a、524b、524c、524d‧‧‧濺鍍源115a, 115b, 115c, 115d, 124, 524a, 524b, 524c, 524d‧‧‧ sputter source
122‧‧‧加熱器122‧‧‧heater
127‧‧‧延伸部127‧‧‧Extension
129、508‧‧‧滾輪129, 508‧‧‧ Wheels
131‧‧‧主體131‧‧‧ Subject
132‧‧‧密封板132‧‧‧ Sealing plate
134‧‧‧升降機元件134‧‧‧ Lift components
135、136‧‧‧馬達135, 136‧‧ ‧ motor
171‧‧‧迴轉台171‧‧‧ turntable
172a‧‧‧裝載站172a‧‧‧ loading station
172b、523、1123‧‧‧卸載腔172b, 523, 1123‧‧‧ Unloading chamber
173a‧‧‧加熱站173a‧‧‧heating station
174a、175a、504‧‧‧加工腔174a, 175a, 504‧‧ ‧ machining chamber
174b、175b‧‧‧腔室174b, 175b‧‧‧ chamber
176‧‧‧迴轉腔室176‧‧‧Rotary chamber
181、182‧‧‧死區181, 182‧‧ dead zone
500‧‧‧系統500‧‧‧ system
501‧‧‧入口裝載腔501‧‧‧ entrance loading chamber
502a、502b‧‧‧加熱腔502a, 502b‧‧‧ heating chamber
512‧‧‧返回模組、返回通道512‧‧‧Return module, return channel
515、1114‧‧‧升降機515, 1114‧‧‧ lifts
517‧‧‧轉盤517‧‧‧ Turntable
517a、517b‧‧‧載具座517a, 517b‧‧‧ carrier
518、530a、530b、1121‧‧‧軌道518, 530a, 530b, 1121‧‧ track
519‧‧‧載具傳輸腔519‧‧‧Carriage transmission chamber
529‧‧‧旋轉腔529‧‧‧Rotating cavity
534a、534b‧‧‧通道534a, 534b‧‧‧ channels
537、538、539‧‧‧洞孔537, 538, 539 ‧ ‧ holes
540、1140‧‧‧分隔牆540, 1140‧‧ ‧ partition wall
544a、544b、544c、544d‧‧‧成對的孔洞544a, 544b, 544c, 544d‧‧‧ pairs of holes
901‧‧‧永久磁鐵901‧‧‧ permanent magnet
903‧‧‧空間903‧‧‧ Space
909‧‧‧基底909‧‧‧Base
927‧‧‧凸片927‧‧‧ 片片
1108、1109‧‧‧傳輸器1108, 1109‧‧‧ transmitter
1113、1114、1413、1414‧‧‧升降機1113, 1114, 1413, 1414‧‧‧ lifts
1120、1120a、1120b‧‧‧基板匣1120, 1120a, 1120b‧‧‧ substrate test
1201、1211‧‧‧傳輸器腔室1201, 1211‧‧‧Transport chamber
1203‧‧‧第一裝載腔1203‧‧‧First loading chamber
1207‧‧‧低真空閥門1207‧‧‧Low vacuum valve
1209‧‧‧高真空閥門1209‧‧‧High vacuum valve
1208、1210‧‧‧閥門1208, 1210‧‧‧ valves
1403‧‧‧第二裝載腔1403‧‧‧Second loading chamber
1413‧‧‧升降機、裝載機構1413‧‧‧ Lifts, loading mechanisms
1550、1555‧‧‧機械手臂1550, 1555‧‧ mechanical arm
1552‧‧‧箝夾1552‧‧‧ clamp
1553‧‧‧軸1553‧‧‧Axis
1600‧‧‧載具傳輸模組1600‧‧‧Carriage transmission module
1602‧‧‧真空閥門1602‧‧‧Vacuum valve
1603‧‧‧開口1603‧‧‧ openings
1605‧‧‧基板裝載/卸載模組1605‧‧‧Substrate loading/unloading module
1610‧‧‧固定式加工模組1610‧‧‧Fixed processing module
1615‧‧‧移動式加工模組、磁控管1615‧‧‧Mobile processing module, magnetron
1622、1624‧‧‧固定式加工裝置1622, 1624‧‧‧Fixed processing equipment
1631‧‧‧基板裝載器1631‧‧‧Substrate loader
圖1為根據本發明一實施例之基板加工系統之概要側視圖。1 is a schematic side view of a substrate processing system in accordance with an embodiment of the present invention.
圖2為根據本發明一實施例之基板加工系統之概要示意圖。2 is a schematic diagram of a substrate processing system in accordance with an embodiment of the present invention.
圖3為根據本發明一實施例之基板載具示意圖。3 is a schematic view of a substrate carrier in accordance with an embodiment of the present invention.
圖4為根據本發明之一實施例實施在例如圖1及2所顯示之系統之加工流程整體流程圖。4 is a general flow diagram of a process flow implemented in, for example, the systems shown in FIGS. 1 and 2, in accordance with an embodiment of the present invention.
圖5為根據本發明一實施例之系統500之側視圖,而圖6則顯示圖5所示系統之俯視圖。Figure 5 is a side elevational view of system 500 in accordance with an embodiment of the present invention, and Figure 6 is a plan view of the system of Figure 5.
圖7為根據本發明一實施例作為移動式加工腔使用之腔室主體示意圖,而圖8為圖7所示腔室主體之截面圖。Figure 7 is a schematic view of a chamber body used as a mobile processing chamber according to an embodiment of the present invention, and Figure 8 is a cross-sectional view of the chamber body shown in Figure 7.
圖9為另一實施例之基板載具905概要圖,該基板載具可用於本發明所揭示之任一系統。9 is a schematic diagram of a substrate carrier 905 of another embodiment that can be used in any of the systems disclosed herein.
圖10A及10B為根據本發明一實施例之一系統在操作期間之快照圖,所示系統為如圖5及6所顯示之系統。10A and 10B are snapshots of a system during operation in accordance with an embodiment of the present invention. The system shown is a system as shown in FIGS. 5 and 6.
圖11為根據本發明一實施例之裝載及卸載機構示意圖,該機構可用於本發明所揭示之任一系統。Figure 11 is a schematic illustration of a loading and unloading mechanism for use in any of the systems disclosed herein in accordance with an embodiment of the present invention.
圖12為本發明一實施例示意圖,顯示該基板裝載至傳輸器機構前,已送入真空環境之狀況。Figure 12 is a schematic view showing a state in which the substrate has been fed into a vacuum environment before being loaded into the conveyor mechanism according to an embodiment of the present invention.
圖13為根據本發明一實施例之基板升降機與裝載腔真空閥門結合狀態示意圖。FIG. 13 is a schematic view showing a state in which a substrate elevator and a loading chamber vacuum valve are combined according to an embodiment of the present invention.
圖14為本發明系統之另一實施例示意圖,該系統可提高基板裝載之使用率。Figure 14 is a schematic illustration of another embodiment of the system of the present invention which increases the utilization of substrate loading.
圖15為根據本發明一實施例,用以卸載及裝載基板至基板匣之裝置示意圖。15 is a schematic diagram of an apparatus for unloading and loading a substrate to a substrate according to an embodiment of the invention.
圖16為根據本發明一實施例之模組配置示意圖。FIG. 16 is a schematic diagram of a module configuration according to an embodiment of the invention.
100‧‧‧加工系統100‧‧‧Processing system
101、111‧‧‧裝載腔101, 111‧‧‧ loading chamber
102‧‧‧固定式腔102‧‧‧Fixed cavity
103‧‧‧基板103‧‧‧Substrate
104‧‧‧移動式腔104‧‧‧Mobile cavity
105‧‧‧載具105‧‧‧ Vehicles
106‧‧‧接點106‧‧‧Contacts
107‧‧‧真空抽氣泵107‧‧‧Vacuum pump
108‧‧‧動力滾輪108‧‧‧Power roller
109‧‧‧載具基底109‧‧‧Carrier base
112、113‧‧‧真空閥112, 113‧‧‧ vacuum valve
115‧‧‧磁控管115‧‧‧Magnetron
122‧‧‧加熱器122‧‧‧heater
124‧‧‧濺鍍源124‧‧‧Sputter source
Claims (20)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161580642P | 2011-12-27 | 2011-12-27 |
Publications (2)
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| TW201335413A TW201335413A (en) | 2013-09-01 |
| TWI499685B true TWI499685B (en) | 2015-09-11 |
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| TW101150401A TWI499685B (en) | 2011-12-27 | 2012-12-27 | System architecture for combined static and pass-by processing and method for processing substrate in said system |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US9914994B2 (en) |
| JP (1) | JP6205368B2 (en) |
| CN (1) | CN104471697B (en) |
| MY (1) | MY171044A (en) |
| SG (1) | SG11201403609QA (en) |
| TW (1) | TWI499685B (en) |
| WO (1) | WO2013101851A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9914994B2 (en) | 2011-12-27 | 2018-03-13 | Intevac, Inc. | System architecture for combined static and pass-by processing |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| JP7290509B2 (en) * | 2019-08-15 | 2023-06-13 | 株式会社アルバック | Vacuum processing equipment |
| WO2021228387A1 (en) * | 2020-05-13 | 2021-11-18 | Applied Materials, Inc. | Carrier for a roller transport system, roller transport system, and vacuum processing apparatus |
| JP7586931B2 (en) * | 2020-12-18 | 2024-11-19 | ファナック株式会社 | Data collection plan generating device and data collection plan generating method |
| US20230274920A1 (en) * | 2022-02-15 | 2023-08-31 | Intevac, Inc. | System and method for making thick-multilayer dielectric films |
| TWI885636B (en) * | 2022-12-12 | 2025-06-01 | 美商因特瓦克公司 | Thin film processing chamber having stable ground anode aperture |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4500407A (en) * | 1983-07-19 | 1985-02-19 | Varian Associates, Inc. | Disk or wafer handling and coating system |
| US5683561A (en) * | 1991-04-04 | 1997-11-04 | Conner Peripherals, Inc. | Apparatus and method for high throughput sputtering |
| US6919001B2 (en) * | 2000-05-01 | 2005-07-19 | Intevac, Inc. | Disk coating system |
| WO2006026886A1 (en) * | 2004-09-10 | 2006-03-16 | Oc Oerlikon Balzers Ag | Substrate processing system |
| US20100024731A1 (en) * | 2008-07-29 | 2010-02-04 | Eristoff D Guy | Processing tool with combined sputter and evaporation deposition sources |
| US20110104847A1 (en) * | 2009-10-30 | 2011-05-05 | Intevac, Inc. | Evaporative system for solar cell fabrication |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR970003907B1 (en) * | 1988-02-12 | 1997-03-22 | 도오교오 에레구토론 가부시끼 가이샤 | Substrate Processing Apparatus and Substrate Processing Method |
| US4981408A (en) * | 1989-12-18 | 1991-01-01 | Varian Associates, Inc. | Dual track handling and processing system |
| DE4111384C2 (en) * | 1991-04-09 | 1999-11-04 | Leybold Ag | Device for coating substrates |
| US5215420A (en) * | 1991-09-20 | 1993-06-01 | Intevac, Inc. | Substrate handling and processing system |
| JPH07166352A (en) * | 1993-12-09 | 1995-06-27 | Shincron:Kk | Dustproof carrying-in method of substrate for vacuum treatment |
| DE4428136A1 (en) * | 1994-08-09 | 1996-02-15 | Leybold Ag | In-line vacuum coating plant, |
| JP3732250B2 (en) * | 1995-03-30 | 2006-01-05 | キヤノンアネルバ株式会社 | In-line deposition system |
| JPH10140351A (en) * | 1996-11-05 | 1998-05-26 | Kobe Steel Ltd | Inline type vacuum film forming device |
| EP0995812A1 (en) * | 1998-10-13 | 2000-04-26 | Vacumetal B.V. | Apparatus for flow-line treatment of articles in an artificial medium |
| US6290821B1 (en) * | 1999-07-15 | 2001-09-18 | Seagate Technology Llc | Sputter deposition utilizing pulsed cathode and substrate bias power |
| JP3587788B2 (en) * | 2001-02-27 | 2004-11-10 | 住友精密工業株式会社 | Elevating type substrate processing apparatus and substrate processing system provided with the same |
| JP4386359B2 (en) * | 2004-09-29 | 2009-12-16 | 株式会社Sokudo | Protective film forming apparatus, substrate processing system, and removal method |
| JP4580860B2 (en) * | 2005-11-02 | 2010-11-17 | 大日本印刷株式会社 | Deposition equipment |
| DE102006056289A1 (en) * | 2006-11-29 | 2008-06-05 | Bankmann, Joachim, Dr. | Coating system with a radio device and method for controlling an actuator or a heater |
| US20090182454A1 (en) * | 2008-01-14 | 2009-07-16 | Bernardo Donoso | Method and apparatus for self-calibration of a substrate handling robot |
| JP5150387B2 (en) * | 2008-06-27 | 2013-02-20 | 昭和電工株式会社 | In-line film forming apparatus and method for manufacturing magnetic recording medium |
| US20100006420A1 (en) * | 2008-07-08 | 2010-01-14 | Seagate Technology Llc | Inline interlayer heater apparatus |
| MY171044A (en) | 2011-12-27 | 2019-09-23 | Intevac Inc | System architecture for combined static and pass-by processing |
-
2012
- 2012-12-26 MY MYPI2014001940A patent/MY171044A/en unknown
- 2012-12-26 SG SG11201403609QA patent/SG11201403609QA/en unknown
- 2012-12-26 CN CN201280070679.0A patent/CN104471697B/en not_active Expired - Fee Related
- 2012-12-26 JP JP2014550437A patent/JP6205368B2/en not_active Expired - Fee Related
- 2012-12-26 WO PCT/US2012/071684 patent/WO2013101851A1/en not_active Ceased
- 2012-12-27 TW TW101150401A patent/TWI499685B/en not_active IP Right Cessation
- 2012-12-27 US US13/728,145 patent/US9914994B2/en active Active
-
2018
- 2018-02-19 US US15/899,064 patent/US10752987B2/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4500407A (en) * | 1983-07-19 | 1985-02-19 | Varian Associates, Inc. | Disk or wafer handling and coating system |
| US5683561A (en) * | 1991-04-04 | 1997-11-04 | Conner Peripherals, Inc. | Apparatus and method for high throughput sputtering |
| US6919001B2 (en) * | 2000-05-01 | 2005-07-19 | Intevac, Inc. | Disk coating system |
| WO2006026886A1 (en) * | 2004-09-10 | 2006-03-16 | Oc Oerlikon Balzers Ag | Substrate processing system |
| US20100024731A1 (en) * | 2008-07-29 | 2010-02-04 | Eristoff D Guy | Processing tool with combined sputter and evaporation deposition sources |
| US20110104847A1 (en) * | 2009-10-30 | 2011-05-05 | Intevac, Inc. | Evaporative system for solar cell fabrication |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9914994B2 (en) | 2011-12-27 | 2018-03-13 | Intevac, Inc. | System architecture for combined static and pass-by processing |
Also Published As
| Publication number | Publication date |
|---|---|
| US20180171463A1 (en) | 2018-06-21 |
| TW201335413A (en) | 2013-09-01 |
| MY171044A (en) | 2019-09-23 |
| JP2015504248A (en) | 2015-02-05 |
| CN104471697A (en) | 2015-03-25 |
| WO2013101851A1 (en) | 2013-07-04 |
| SG11201403609QA (en) | 2014-07-30 |
| CN104471697B (en) | 2018-03-16 |
| US10752987B2 (en) | 2020-08-25 |
| US20130161183A1 (en) | 2013-06-27 |
| US9914994B2 (en) | 2018-03-13 |
| JP6205368B2 (en) | 2017-09-27 |
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