[go: up one dir, main page]

TWI498535B - An optical detection device with an on-line correction function - Google Patents

An optical detection device with an on-line correction function Download PDF

Info

Publication number
TWI498535B
TWI498535B TW102148431A TW102148431A TWI498535B TW I498535 B TWI498535 B TW I498535B TW 102148431 A TW102148431 A TW 102148431A TW 102148431 A TW102148431 A TW 102148431A TW I498535 B TWI498535 B TW I498535B
Authority
TW
Taiwan
Prior art keywords
light
module
splitting module
optical detecting
beam splitting
Prior art date
Application number
TW102148431A
Other languages
Chinese (zh)
Other versions
TW201525430A (en
Original Assignee
Chroma Ate Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma Ate Inc filed Critical Chroma Ate Inc
Priority to TW102148431A priority Critical patent/TWI498535B/en
Publication of TW201525430A publication Critical patent/TW201525430A/en
Application granted granted Critical
Publication of TWI498535B publication Critical patent/TWI498535B/en

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

具有線上校正功能之光學檢測裝置 Optical detecting device with online correction function

本發明係有關於一種光學檢測裝置,其尤指一種具有線上校正功能之光學檢測裝置。 The present invention relates to an optical detecting device, and more particularly to an optical detecting device having an on-line correction function.

習知攝影機校準系統係包括攝影機、影像顯示器、可調整多個自由度之夾持機構,以及一校正專用圖案之校正板。校正板須固定於一待測物之表面,然後由攝影機拍攝校正板而產生一校正圖像,然後依據校正圖像對攝影機進行校正,但習知校準系統之校正板不易固定於表面為曲面之待測物,導致攝影機校準之精準度降低;此外,之後攝影機對待測物進行檢測時,須將校正板移開,方能進行檢測。 The conventional camera calibration system includes a camera, an image display, a clamping mechanism that can adjust a plurality of degrees of freedom, and a correction plate for correcting a dedicated pattern. The calibration plate shall be fixed on the surface of a test object, and then the calibration plate is photographed by the camera to generate a corrected image, and then the camera is corrected according to the corrected image, but the calibration plate of the conventional calibration system is not easily fixed on the surface. The object to be tested causes the accuracy of the camera calibration to be reduced; in addition, when the camera is to be tested, the calibration plate must be removed before the detection can be performed.

有鑑於上述問題,本發明提供一種具有線上校正功能之光學檢測裝置,其不須於待測物上設置校正板,待測物之表面可為任何形態,並不影響校正之精準度,而之後進行檢測時,可直接對待測物進行檢測。 In view of the above problems, the present invention provides an optical detecting device having an on-line correction function, which does not need to provide a calibration plate on the object to be tested, and the surface of the object to be tested can be in any form without affecting the accuracy of the correction, and then When testing, the object can be directly tested.

本發明之目的,係提供一種具有線上校正功能之光學檢測裝置,其適用於表面為任何形態之待測物,於線上即時進行對位校正,有效提升校正之精確度、穩定度及一致性。 The object of the present invention is to provide an optical detecting device with an on-line correction function, which is suitable for the object to be tested on any surface, and performs on-line alignment correction on the line, thereby effectively improving the accuracy, stability and consistency of the correction.

為了達到上述所指稱之各目的與功效,本發明係揭示一種具有線 上校正功能之光學檢測裝置,其包含:一分光模組,當一光線由該分光模組之第一側進入該分光模組後,將分別由該分光模組之第三側及第四側射出,當該光線由該分光模組之第二側進入該分光模組後,將分別由該分光模組之第三面及第四側射出;一光源模組,其設置於該分光模組之該分光模組之第一側,該光源模組用以提供該光線;一光學檢測模組,其設置於該分光模組之第二側,該光學檢測模組用以檢測一待測物,該待測物係設置於該分光模組之第四側;以及一校正模組,其設置於該分光模組之第三側,該校正模組用以提供一校正圖案,以校正該光學檢測模組。 In order to achieve the above-mentioned various purposes and effects, the present invention discloses a line having The optical detection device of the upper correction function comprises: a light splitting module, when a light enters the light splitting module from the first side of the light splitting module, respectively, the third side and the fourth side of the light splitting module respectively When the light enters the light splitting module from the second side of the light splitting module, the light is emitted from the third side and the fourth side of the light splitting module respectively; a light source module is disposed in the light splitting module The light source module is configured to provide the light on the first side of the light splitting module, and the optical detecting module is disposed on the second side of the light splitting module, wherein the optical detecting module is configured to detect a sample to be tested The test object is disposed on the fourth side of the light splitting module; and a correction module is disposed on the third side of the light splitting module, the correction module is configured to provide a correction pattern to correct the optical Detection module.

1‧‧‧光學檢測裝置 1‧‧‧Optical inspection device

10‧‧‧分光模組 10‧‧‧Distribution Module

1011‧‧‧第一側 1011‧‧‧ first side

1012‧‧‧第二側 1012‧‧‧ second side

1013‧‧‧第三側 1013‧‧‧ third side

1014‧‧‧第四側 1014‧‧‧ fourth side

11‧‧‧光源模組 11‧‧‧Light source module

12‧‧‧光學檢測模組 12‧‧‧ Optical Inspection Module

13‧‧‧校正模組 13‧‧‧ Calibration Module

131‧‧‧校正區 131‧‧ ‧ calibration area

1311‧‧‧第一反射鏡片 1311‧‧‧First Reflective Lens

13111‧‧‧校正圖案 13111‧‧‧correction pattern

1312‧‧‧第二反射鏡片 1312‧‧‧second reflective lens

132‧‧‧吸光區 132‧‧‧Light absorption zone

1321‧‧‧吸光鏡片 1321‧‧‧Light-absorbing lenses

133‧‧‧切換窗 133‧‧‧Switch window

14‧‧‧遮蔽模組 14‧‧‧Shadow module

141‧‧‧吸光板 141‧‧‧Light absorbing plate

2‧‧‧待測物 2‧‧‧Test object

3‧‧‧滾輪 3‧‧‧Rollers

S‧‧‧光線 S‧‧‧Light

S1‧‧‧第一光線 S1‧‧‧first light

S2‧‧‧第二光線 S2‧‧‧second light

第一圖:其為本發明之光學檢測裝置之方塊圖;第二A圖及第二B圖:其為本發明之第一實施例之光學檢測裝置之示意圖;第三圖:其為本發明之第二實施例之光學檢測裝置之示意圖;以及第四圖:其為本發明之第三實施例之光學檢測裝置之示意圖。 1 is a block diagram of an optical detecting device of the present invention; FIG. 2A and FIG. 2B are schematic views of an optical detecting device according to a first embodiment of the present invention; A schematic view of an optical detecting device of a second embodiment; and a fourth drawing: a schematic view of an optical detecting device of a third embodiment of the present invention.

為使本發明之特徵及所達成之功效有更進一步之瞭解與認識,謹佐以實施例及配合詳細之說明,說明如後: In order to further understand and understand the features of the present invention and the effects achieved, the following examples and the detailed descriptions are provided to illustrate the following:

請參閱第一圖,其為本發明之光學檢測裝置之方塊圖;如圖所示,本實施例之光學檢測裝置1包含一分光模組10、一光源模組11、一光學檢測模組12及一校正模組13,分光模組10之光路以逆時針方向依序命名為第一側1011、第二側1012、第三側1013及第四側1014,分光模組10可以是一分光鏡傾斜45度角,或是由兩個三 角柱沿對角線黏合而成之正立方體,分光模組10通常為可讓光線一半穿透一半反射,雖然使光源的使用效率下降,但可透過光源模組11的發光效率提升作為補償。當一光線從分光模組10之第一側1011進入時,光線從分光模組10之第三側1013及第四側1014射出;當光線從分光模組10之第二側1012進入時,光線從分光模組10之第三側1013及第四側1014射出。 Please refer to the first figure, which is a block diagram of the optical detecting device of the present invention. As shown, the optical detecting device 1 of the present embodiment includes a beam splitting module 10, a light source module 11, and an optical detecting module 12. And a correction module 13, the optical path of the optical splitting module 10 is sequentially named as a first side 1011, a second side 1012, a third side 1013 and a fourth side 1014 in a counterclockwise direction, and the beam splitting module 10 can be a beam splitter Tilt at a 45 degree angle, or by two three The prism module is formed by a diagonally-bonded diagonal cube. The beam splitting module 10 generally allows half of the light to be reflected by the light. Although the use efficiency of the light source is lowered, the light-emitting efficiency of the light source module 11 is improved as compensation. When a light enters from the first side 1011 of the beam splitting module 10, the light is emitted from the third side 1013 and the fourth side 1014 of the beam splitting module 10; when the light enters from the second side 1012 of the beam splitting module 10, the light The third side 1013 and the fourth side 1014 of the beam splitting module 10 are emitted.

請一併參閱第二A圖及第二B圖,其為本發明之第一實施例之光學檢測裝置之示意圖。光源模組11、光學檢測模組12及校正模組13圍繞分光模組10設置,光源模組11設置於分光模組10之第一側1011;光學檢測模組12設置於分光模組10之第二側1012;校正模組13設置於分光模組10之第三側1013。其中校正模組13包含一校正區131、一吸光區132及一切換窗133,切換窗133對應校正區131或吸光區132,本實施例之校正區131為具有一校正圖案13111之一第一反射鏡片1311,吸光區132為表面具有一吸光材料之一吸光鏡片1321或一吸光板,第一反射鏡片1311堆疊於吸光鏡片1321上。 Please refer to FIG. 2A and FIG. 2B together, which are schematic diagrams of the optical detecting device according to the first embodiment of the present invention. The light source module 11 , the optical detection module 12 and the correction module 13 are disposed around the beam splitting module 10 , the light source module 11 is disposed on the first side 1011 of the beam splitting module 10 , and the optical detecting module 12 is disposed in the beam splitting module 10 . The second side 1012 is disposed on the third side 1013 of the beam splitting module 10 . The calibration module 13 includes a correction area 131, a light absorption area 132, and a switching window 133. The switching window 133 corresponds to the correction area 131 or the light absorption area 132. The correction area 131 of the embodiment has one of the correction patterns 13111. The reflective lens 1311 has a light absorbing lens 1321 or a light absorbing plate on the surface of the light absorbing region 132. The first reflective lens 1311 is stacked on the light absorbing lens 1321.

本實施例之光學檢測裝置1用於檢測一待測物2,本實施例之待測物2為可撓性材質,並捲繞於複數滾輪3上,而使待測物2之表面為曲面,且透過該些滾輪3之轉動捲收待測物2,當然待測物2也可為平擺於一平面上進行檢測。待測物2設置於分光模組10之第四側1014,對待測物2進行檢測之前,先校正光學檢測模組12。此時,光源模組11供應一光線S至分光模組10,光線S從分光模組10之第一側1011進入,光線S之一部分穿透,另外光線S之另一部分被反射,穿透之光線為第一光線S1,被反射之光線為第二光線 S2。 The optical detecting device 1 of the present embodiment is configured to detect a test object 2, and the object to be tested 2 of the present embodiment is a flexible material and is wound on the plurality of rollers 3, so that the surface of the object to be tested 2 is curved. And the object to be tested 2 is taken up by the rotation of the rollers 3, of course, the object to be tested 2 can also be swayed on a plane for detection. The object to be tested 2 is disposed on the fourth side 1014 of the beam splitting module 10, and the optical detecting module 12 is corrected before the object 2 is detected. At this time, the light source module 11 supplies a light S to the light splitting module 10, and the light S enters from the first side 1011 of the light splitting module 10, one of the light rays S partially penetrates, and another part of the light S is reflected, penetrates The light is the first light S1, and the reflected light is the second light S2.

第一光線S1穿透分光模組10並從分光模組10之第三側1013射出至校正模組13。如第二A圖所示,使用者讓切換窗133對應校正區131,第一光線S1射入校正區131,校正區131反射第一光線S1至分光模組10,被反射之第一光線S1從分光模組10之第三側1013進入,經分光模組10反射至光學檢測模組12。光學檢測模組12可為一維掃描探頭(linescan)或是二維取像探頭(area scan),且光學檢測模組12可由單顆探頭或是陣列探頭組成。光學檢測模組12接收被反射之第一光線S1並產生一校正圖像,然依據校正圖像內之一校正圖案與校正區131之校正圖案1311校正光學檢驗模組12之位置,以完成光學檢驗模組12之校正。此外,當光線S改由第二側1012進入,分光模組10讓光線S之一部分穿透並從第四側1014射出,並反射光線S之另一部分並從第三側1013射出。 The first light S1 penetrates the beam splitting module 10 and is emitted from the third side 1013 of the beam splitting module 10 to the correction module 13 . As shown in FIG. 2A, the user causes the switching window 133 to correspond to the correction area 131, the first light S1 is incident on the correction area 131, and the correction area 131 reflects the first light S1 to the beam splitting module 10, and the first light S1 is reflected. It enters from the third side 1013 of the beam splitting module 10 and is reflected by the beam splitting module 10 to the optical detecting module 12 . The optical detection module 12 can be a one-dimensional scanscan or a two-dimensional area scan, and the optical detection module 12 can be composed of a single probe or an array probe. The optical detecting module 12 receives the reflected first light S1 and generates a corrected image, and corrects the position of the optical inspection module 12 according to a correction pattern in the corrected image and the correction pattern 1311 of the correction area 131 to complete the optical The calibration of the inspection module 12 is performed. In addition, when the light S is changed from the second side 1012, the beam splitting module 10 allows a portion of the light S to penetrate and exit from the fourth side 1014, and reflects another portion of the light S and exits from the third side 1013.

此外,第二光線S2被分光模組10反射並從分光模組10之第四側1014射出至待測物2。本實施例係於待測物2與分光模組10之第四側1014之間更設置一遮蔽模組14,遮蔽模組14包含一吸光板141。當第二光線S2射往待測物2時,遮蔽模組14之吸光板141遮蔽待測物2,並吸收第二光線S2,避免待測物2反射第二光線S2至分光模組10及光學檢測模組12而干擾光學檢測模組12之校正。 In addition, the second light S2 is reflected by the beam splitting module 10 and is emitted from the fourth side 1014 of the beam splitting module 10 to the object to be tested 2 . In this embodiment, a shielding module 14 is further disposed between the object to be tested 2 and the fourth side 1014 of the beam splitting module 10, and the shielding module 14 includes a light absorbing plate 141. When the second light S2 is incident on the object to be tested 2, the light absorbing plate 141 of the shielding module 14 shields the object 2 and absorbs the second light S2, so as to prevent the object 2 from reflecting the second light S2 to the beam splitting module 10 and The optical detection module 12 interferes with the correction of the optical detection module 12.

待光學檢測模組12完成校正後,如第二B圖所示,僅要讓校正模組13之切換窗133對應吸光區132及移除待測物2與分光模組10間之遮蔽模組14,即可進行待測物2之檢測。當校正模組13之切換窗133對應吸光區132及移除待測物2與分光模組10間之遮蔽模組14時,穿透分光模組10之第一光線S1被吸光區132吸收,第二光 線S2被待測物2反射至分光模組10,被反射之第二光線S2從分光模組10之第四側1014進入,並穿透分光模組10而從分光模組10之第二側1012射出,然後光學檢測模組12接收被反射之第二光線S2,以對待測物2進行檢測。由上述可知,校正光學檢測模組12之光路與光學檢測模組12對待測物2進行檢測之光路不同。然,校正模組13不須設置於待測物2之表面,以避免待測物2之表面為曲面時產生不易設置及校正之問題。 After the optical detection module 12 completes the calibration, as shown in FIG. 2B, only the switching window 133 of the calibration module 13 corresponds to the light absorption area 132 and the shielding module between the object to be tested 2 and the light distribution module 10 is removed. 14, the test object 2 can be detected. When the switching window 133 of the calibration module 13 corresponds to the light absorption area 132 and the shielding module 14 between the object to be tested 2 and the light distribution module 10, the first light S1 penetrating the beam splitting module 10 is absorbed by the light absorption area 132. Second light The line S2 is reflected by the object to be tested 2 to the beam splitting module 10, and the reflected second light S2 enters from the fourth side 1014 of the beam splitting module 10 and penetrates the beam splitting module 10 from the second side of the beam splitting module 10 1012 is emitted, and then the optical detecting module 12 receives the reflected second light S2 to detect the object to be tested 2. As can be seen from the above, the optical path of the correction optical detection module 12 is different from the optical path of the optical detection module 12 for detecting the object 2 to be detected. However, the correction module 13 does not need to be disposed on the surface of the object to be tested 2, so as to avoid the problem that it is difficult to set and correct when the surface of the object to be tested 2 is curved.

請參閱第三圖,其為本發明之第二實施例之光學檢測裝置之示意圖;如圖所示,本實施例之校正模組13之校正區131更包含未具有校正圖案之一第二反射鏡片1312,第二反射鏡片1312設置於第一反射鏡片1311與吸光鏡片1321之間。當第一光線S1穿透分光模組10並從分光模組10之第三側1013射出至校正模組13。使用者讓切換窗133對應校正區131之第二反射鏡片1312,第二反射鏡片1312反射第一光線S1至分光模組10,再由分光模組10之分光模組10反射至光學檢測模組12,光學檢測模組12接收第一光線S1而產生另一校正圖像,然依據校正圖像對光學檢測模組12進行平場校正。舉例說明,當校正圖像之中心亮度較其周圍亮度高時,可利用一調整程式對光學檢測模組12進行調整,使校正圖像之周圍亮度與其中心亮度相同。 Please refer to the third figure, which is a schematic diagram of an optical detecting device according to a second embodiment of the present invention. As shown in the figure, the correction area 131 of the calibration module 13 of the present embodiment further includes a second reflection that does not have a correction pattern. The lens 1312 and the second reflective lens 1312 are disposed between the first reflective lens 1311 and the light absorbing lens 1321. When the first light S1 penetrates the beam splitting module 10 and is emitted from the third side 1013 of the beam splitting module 10 to the correction module 13 . The user allows the switching window 133 to correspond to the second reflective lens 1312 of the calibration area 131. The second reflective lens 1312 reflects the first light S1 to the beam splitting module 10, and then is reflected by the beam splitting module 10 of the beam splitting module 10 to the optical detecting module. 12, the optical detection module 12 receives the first light S1 to generate another corrected image, and then performs flat field correction on the optical detection module 12 according to the corrected image. For example, when the center brightness of the corrected image is higher than the surrounding brightness, the optical detection module 12 can be adjusted by an adjustment program so that the surrounding brightness of the corrected image is the same as the center brightness.

請參閱第四圖,其為本發明之第三實施例之光學檢測裝置之示意圖。當光源模組11提供一光線S,光線S從分光模組10之第一側1011進入,分光模組10讓部分之光線S穿透,另外部分之光線S被分光模組10反射,穿透分光模組10之部分之光線S為第一光線S1,被分光模組10反射之部分之光線S為第二光線S2。然第一光線 S1穿透分光模組10並從分光模組10之第四側1014射出至待測物2,以對待測物2進行檢測;第二光線S2被分光模組10反射並從分光模組10之第三側1013射出至校正模組13,以對光學檢測模組12進行校正。此外,當光線S改由第二側1012進入,分光模組10讓光線S之一部分穿透並從第三側1013射出,並反射光線S之另一部分並從第四側1014射出。第三實施例與第一實施例不同之處在於光線S進入分光模組10後穿透照射待測物2,其他則與第一實施例相同,於此不再贅述。 Please refer to the fourth figure, which is a schematic diagram of an optical detecting device according to a third embodiment of the present invention. When the light source module 11 provides a light S, the light S enters from the first side 1011 of the light splitting module 10, and the light splitting module 10 allows part of the light S to pass through, and the other part of the light S is reflected by the light splitting module 10, penetrating The portion S of the light splitting module 10 is the first light S1, and the portion S of the light reflected by the beam splitting module 10 is the second light S2. First light The S1 passes through the beam splitting module 10 and is emitted from the fourth side 1014 of the beam splitting module 10 to the object to be tested 2 to detect the object to be tested 2; the second light S2 is reflected by the beam splitting module 10 and is separated from the beam splitting module 10 The third side 1013 is emitted to the correction module 13 to correct the optical detection module 12. Moreover, when the light S is redirected by the second side 1012, the beam splitting module 10 allows a portion of the light S to penetrate and exit from the third side 1013 and reflect another portion of the light S and exit from the fourth side 1014. The third embodiment is different from the first embodiment in that the light S enters the beam splitting module 10 and penetrates the object to be tested 2, and the others are the same as the first embodiment, and details are not described herein again.

綜上所述,本發明提供一種具有線上校正功能之光學檢測裝置,光學檢測裝置之校正模組非設置於待測物之表面,因此不受待測物之表面形態而影響校正光學檢測模組之精度。此外校正模組與待測物為分開設置,光學檢測模組校正完成後,不須移開校正模組,可立即進行待測物之檢測,減少重新設置及移除校正模組之時間。校正模組具有不同型態的反射鏡片,以對校正光學檢測模組進行對位校正及平場校正。 In summary, the present invention provides an optical detecting device having an online correcting function. The correcting module of the optical detecting device is not disposed on the surface of the object to be tested, and thus is not affected by the surface morphology of the object to be tested. Precision. In addition, the calibration module is separately arranged from the object to be tested. After the optical detection module is corrected, the calibration module can be detected immediately, and the time for resetting and removing the calibration module can be reduced. The calibration module has different types of reflective lenses for alignment correction and flat field correction of the calibration optical detection module.

惟以上所述者,僅為本發明之實施例而已,並非用來限定本發明實施之範圍,舉凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。 The above is only the embodiment of the present invention, and is not intended to limit the scope of the present invention, and the variations, modifications, and modifications of the shapes, structures, features, and spirits described in the claims of the present invention are It should be included in the scope of the patent application of the present invention.

1‧‧‧光學檢測裝置 1‧‧‧Optical inspection device

10‧‧‧分光模組 10‧‧‧Distribution Module

1011‧‧‧第一側 1011‧‧‧ first side

1012‧‧‧第二側 1012‧‧‧ second side

1013‧‧‧第三側 1013‧‧‧ third side

1014‧‧‧第四側 1014‧‧‧ fourth side

11‧‧‧光源模組 11‧‧‧Light source module

12‧‧‧光學檢測模組 12‧‧‧ Optical Inspection Module

13‧‧‧校正模組 13‧‧‧ Calibration Module

2‧‧‧待測物 2‧‧‧Test object

Claims (9)

一種具有線上校正功能之光學檢測裝置,其包含:一分光模組,當一光線由該分光模組之第一側進入該分光模組後,將分別由該分光模組之第三側及第四側射出,當該光線由該分光模組之第二側進入該分光模組後,將分別由該分光模組之第三側及第四側射出;一光源模組,其設置於該分光模組之第一側,該光源模組用以提供該光線;一光學檢測模組,其設置於該分光模組之第二側,該光學檢測模組用以檢測一待測物,該待測物係設置於該分光模組之第四側;以及一校正模組,其設置於該分光模組之第三側,該校正模組用以提供一校正圖案,以校正該光學檢測模組;其中,該校正模組包含:一校正區,其用以提供該校正圖案;一吸光區,其用以吸收該光線;以及一切換窗,其用以選擇該校正區或該吸光區。 An optical detecting device having an on-line correction function, comprising: a light splitting module, when a light enters the light splitting module from a first side of the light splitting module, respectively, the third side and the third When the light enters the light splitting module from the second side of the light splitting module, the light is emitted from the third side and the fourth side of the light splitting module; a light source module is disposed in the light splitting On the first side of the module, the light source module is configured to provide the light; an optical detection module is disposed on the second side of the light splitting module, and the optical detecting module is configured to detect a sample to be tested. The measuring system is disposed on the fourth side of the beam splitting module; and a calibration module is disposed on the third side of the beam splitting module, the correcting module is configured to provide a correction pattern to correct the optical detecting module The calibration module includes: a correction area for providing the correction pattern; a light absorption area for absorbing the light; and a switching window for selecting the correction area or the light absorption area. 如申請專利範圍第1項所述之光學檢測裝置,其中該光學檢測模組進行校正時,該切換窗選擇該校正區。 The optical detecting device of claim 1, wherein the switching window selects the correction area when the optical detecting module performs correction. 如申請專利範圍第1項所述之光學檢測裝置,其中該光學檢測模組進行檢測時,該切換窗選擇該吸光區。 The optical detecting device of claim 1, wherein the switching window selects the light absorbing region when the optical detecting module performs the detecting. 如申請專利範圍第1項所述之光學檢測裝置,其中該校正區包含 一反射鏡片,該反射鏡片用以對該光學檢測模組進行平場校正。 The optical detecting device of claim 1, wherein the correction area comprises A reflective lens for performing flat field correction on the optical detection module. 如申請專利範圍第1項所述之光學檢測裝置,其中該光學檢測模組為一維掃描探頭(linescan)或是二維取像探頭(area scan)。 The optical detecting device of claim 1, wherein the optical detecting module is a one-dimensional scanning scan or a two-dimensional area scan. 如申請專利範圍第1項所述之光學檢測裝置,更包含:一遮蔽模組,其設置於該分光模組之第四側與該待測物之間,該遮蔽模組於該光學檢測模組進行校正時用以遮蔽該待測物。 The optical detecting device of claim 1, further comprising: a shielding module disposed between the fourth side of the beam splitting module and the object to be tested, wherein the shielding module is in the optical detecting mode The group is used to shield the object to be tested when performing calibration. 如申請專利範圍第1項所述之光學檢測裝置,其中該分光模組係為一分光鏡或一由兩個三角柱沿對角線黏合而成之正立方體。 The optical detecting device of claim 1, wherein the beam splitting module is a beam splitter or a cube formed by two triangular columns that are diagonally bonded. 如申請專利範圍第1項所述之光學檢測裝置,其中當該光線由該分光模組之第一側進入該分光模組後,該光線之一部分穿透該分光模組並由該分光模組之第三側射出,而該光線之另一部分被該分光模組反射並由該分光模組之第四側射出,當該光線由該分光模組之第二側進入該分光模組後,該光線之一部分穿透該分光模組並由該分光模組之第四側射出,而該光線之另一部分被該分光模組反射並由該分光模組之第三側射出。 The optical detecting device of claim 1, wherein when the light enters the light splitting module from the first side of the light splitting module, one of the light passes through the light splitting module and is separated by the light splitting module. The third side of the light is emitted by the light splitting module and is emitted by the fourth side of the light splitting module. When the light enters the light splitting module from the second side of the light splitting module, A portion of the light passes through the beam splitting module and is emitted by the fourth side of the beam splitting module, and another portion of the light is reflected by the beam splitting module and is emitted by the third side of the beam splitting module. 如申請專利範圍第1項所述之光學檢測裝置,其中當該光線由該分光模組之第一側進入該分光模組後,該光線之一部分穿透該分光模組並由該分光模組之第四側射出,而該光線之另一部分被該分光模組反射並由該分光模組之第三側射出,當該光線由該分光模組之第二側進入該分光模組後,該光線之一部分穿透該分光模組並由該分光模組之第三側射出,而該光線之另一部分被該分光模組反射並由該分光模組之第四側射出。 The optical detecting device of claim 1, wherein when the light enters the light splitting module from the first side of the light splitting module, one of the light passes through the light splitting module and is separated by the light splitting module. The fourth side of the light is emitted by the light splitting module and is emitted by the third side of the light splitting module. When the light enters the light splitting module from the second side of the light splitting module, A portion of the light passes through the beam splitting module and is emitted by the third side of the beam splitting module, and another portion of the light is reflected by the beam splitting module and emitted from the fourth side of the beam splitting module.
TW102148431A 2013-12-26 2013-12-26 An optical detection device with an on-line correction function TWI498535B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW102148431A TWI498535B (en) 2013-12-26 2013-12-26 An optical detection device with an on-line correction function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW102148431A TWI498535B (en) 2013-12-26 2013-12-26 An optical detection device with an on-line correction function

Publications (2)

Publication Number Publication Date
TW201525430A TW201525430A (en) 2015-07-01
TWI498535B true TWI498535B (en) 2015-09-01

Family

ID=54197553

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102148431A TWI498535B (en) 2013-12-26 2013-12-26 An optical detection device with an on-line correction function

Country Status (1)

Country Link
TW (1) TWI498535B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1471624A (en) * 2000-08-30 2004-01-28 索尼电子有限公司 Detect and correct multiple laser beam misalignment
CN101663576A (en) * 2005-04-12 2010-03-03 卡钳生命科学股份有限公司 A compact photodetection system for microfluidic devices
CN101726477A (en) * 2008-10-20 2010-06-09 三星电子株式会社 Optical dectecting apparatus for bio-chip

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1471624A (en) * 2000-08-30 2004-01-28 索尼电子有限公司 Detect and correct multiple laser beam misalignment
CN101663576A (en) * 2005-04-12 2010-03-03 卡钳生命科学股份有限公司 A compact photodetection system for microfluidic devices
CN101726477A (en) * 2008-10-20 2010-06-09 三星电子株式会社 Optical dectecting apparatus for bio-chip

Also Published As

Publication number Publication date
TW201525430A (en) 2015-07-01

Similar Documents

Publication Publication Date Title
CN102818528B (en) Apparatus and method for inspecting an object with increased depth of field
KR102011209B1 (en) Measuring apparatus and measuring method for thin film provided with a transparent substrate
CN102455511B (en) Imaging system and optical measurement device using plane mirror to combine light
CN106052596B (en) High-precision photoelectric autocollimator based on far exit pupil and small pupil diameter ratio
RU2011146074A (en) DEVICE FOR PRODUCING AN OPTICAL IMAGE, HAVING AN OPTICAL ADAPTER, AND A METHOD FOR MANAGING THEM
KR20090113895A (en) Defect measuring device of glass sheet
CN109358435B (en) Device and method for adjusting perpendicularity of double telecentric lenses
KR101446061B1 (en) Apparatus for measuring a defect of surface pattern of transparent substrate
JP7596022B2 (en) Imaging system for surface inspection
JP2014517505A5 (en)
CN105103027B (en) Measurement of focus and other features in optical systems
US10801967B2 (en) Mask inspection apparatus, switching method, and mask inspection method
JP2010271133A (en) Optical scanning type plane inspection device
JP2002034919A (en) Eye optical characteristics measuring device
JP2014240766A (en) Surface inspection method and device
US9194810B2 (en) Method and device for the detection of surface defects of a component
CN209198786U (en) A device for adjusting verticality of bi-telecentric lens
KR101447857B1 (en) Particle inspectiing apparatus for lens module
JP2015108582A (en) Three-dimensional measurement method and device
TWI661177B (en) Optical inspection apparatus
TWI498535B (en) An optical detection device with an on-line correction function
JP5019110B2 (en) Infrared thickness gauge
CN220039391U (en) Assembling parallelism detection device and its system
CN104764477B (en) Optical detection apparatus with on-line correction function
TW201623942A (en) Optical inspection device