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TWI489112B - Fool-proofing structure - Google Patents

Fool-proofing structure Download PDF

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Publication number
TWI489112B
TWI489112B TW102131638A TW102131638A TWI489112B TW I489112 B TWI489112 B TW I489112B TW 102131638 A TW102131638 A TW 102131638A TW 102131638 A TW102131638 A TW 102131638A TW I489112 B TWI489112 B TW I489112B
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TW
Taiwan
Prior art keywords
carrier
preset position
groove
base
introduction unit
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TW102131638A
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Chinese (zh)
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TW201510534A (en
Inventor
Jun Li
shu-hong Wang
Yang Yang
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Inventec Appliances Corp
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Priority to TW102131638A priority Critical patent/TWI489112B/en
Publication of TW201510534A publication Critical patent/TW201510534A/en
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Publication of TWI489112B publication Critical patent/TWI489112B/en

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Description

防呆結構Anti-dwelling structure

本發明是有關於一種防呆結構,特別是有關於一種應用於測試裝置的防呆結構,以使測試裝置得以降低電路板與零件的損壞。The present invention relates to a foolproof structure, and more particularly to a foolproof structure for use in a test apparatus to enable the test apparatus to reduce damage to the board and parts.

資訊產品於出廠前均需經過一系列的測試,以確保產品的功能運作正常,以電腦的主機板(Motherboard,MB)為例,主機板係電性連接至各種配置於其上之電子裝置,其例如硬碟、各種介面卡、記憶體及中央處理器等。換言之,主機板的效能必須能夠充分支援上述各種電子裝置,方能發揮該等電子裝置之最大效能。因此,所有主機板均需要經過相關的電性測試以確保品質的穩定性。Information products must pass a series of tests before leaving the factory to ensure that the function of the product is working properly. Take the motherboard (Motherboard, MB) of the computer as an example. The motherboard is electrically connected to various electronic devices disposed on it. For example, a hard disk, various interface cards, a memory, a central processing unit, and the like. In other words, the performance of the motherboard must be able to fully support the above various electronic devices in order to maximize the performance of the electronic devices. Therefore, all motherboards need to undergo relevant electrical testing to ensure the stability of quality.

此外,隨著電子產品的快速發展和大批量生產,對於應用於電路板之測試裝置也提出了越來越高的要求。In addition, with the rapid development of electronic products and mass production, there is an increasing demand for test devices applied to circuit boards.

而在習知的技術中,在操作者將電路板放置到測試裝置中進行測試時,由於測試裝置並未設置任何防呆結構,因此,當操作者操作測試裝置不當或未將電路板準確置入測試裝置 而進行測試時,則容易造成電路板的損壞。而且,習知的測試裝置為翻蓋設計,因此,測試裝置的射頻頭與測試探針的對位準確度容易不足,而導致零件損壞。In the prior art, when the operator places the circuit board into the test device for testing, since the test device is not provided with any foolproof structure, when the operator operates the test device improperly or does not accurately set the circuit board Into the test device When testing, it is easy to cause damage to the board. Moreover, the conventional test device is a flip cover design. Therefore, the alignment accuracy of the RF head of the test device and the test probe is easily insufficient, resulting in damage to the parts.

有鑑於上述習知技藝之問題,本發明之目的就是在 提供一種防呆結構,以解決習知技術中,測試裝置容易因操作者操作測試裝置不當或未將電路板準確置入測試裝置而導致電路板損壞的問題。In view of the above-mentioned problems of the prior art, the object of the present invention is A foolproof structure is provided to solve the problem in the prior art that the test device is liable to cause damage to the circuit board due to improper operation of the test device by the operator or accurate placement of the circuit board into the test device.

根據本發明之目的,提出一種防呆結構,應用於測 試裝置,其包含蓋體、載體及基座。蓋體設有第一凹槽及導向件,第一凹槽係設於蓋體一端,導向件一端具有缺口。載體位於蓋體一面,載體一端係樞接於蓋體另一端,載體對應第一凹槽樞設第一扣合件,且載體對應導向件樞設導入單元。基座位於載體相對於蓋體一面,基座對應導入單元另一端具有第二凹槽,當蓋體由第一預設位置位移至第二預設位置,且導入單元之一端可活動地滑入缺口時,第一扣合件則可拆卸地卡合於第一凹槽,且導入單元之另一端由第二凹槽中脫離。According to the purpose of the present invention, a foolproof structure is proposed for measurement A test device comprising a cover, a carrier and a base. The cover body is provided with a first groove and a guiding member. The first groove is disposed at one end of the cover body, and the guide member has a notch at one end. The carrier is located on one side of the cover body, and one end of the carrier is pivotally connected to the other end of the cover body. The carrier is pivoted with the first fastening component corresponding to the first groove, and the carrier corresponding to the guiding member pivots the introduction unit. The base is located on one side of the carrier relative to the cover body, and the other end of the base corresponding to the introduction unit has a second groove, when the cover body is displaced from the first preset position to the second preset position, and one end of the introduction unit is slidably movable When the gap is formed, the first fastening member is detachably engaged with the first groove, and the other end of the introduction unit is disengaged from the second groove.

其中,載體之相對之兩側分別設有第三凹槽,基座 對應該些第三凹槽樞設複數個第二扣合件,當導入單元之另一端由第二凹槽中脫離,且載體由第三預設位置位移至第四預設位置時,各第二扣合件則可拆卸地扣卡於各第三凹槽。Wherein, the opposite sides of the carrier are respectively provided with a third groove, the base Placing a plurality of second fastening members corresponding to the third recesses, when the other end of the introduction unit is disengaged from the second recess, and the carrier is displaced from the third preset position to the fourth preset position, each The two fastening components are detachably fastened to the third recesses.

其中,當導入單元之該端頂抵導向件或位於缺口外 部,且載體由第三預設位置朝第四預設位置位移時,導入單元之 另一端則頂抵第二凹槽,以使載體處於第三預設位置。Wherein, when the end of the introduction unit abuts the guide or is located outside the gap And when the carrier is displaced from the third preset position toward the fourth preset position, the introduction unit The other end is abutted against the second recess to place the carrier in a third predetermined position.

其中,載體具有複數個第一穿孔,基座具有分別對 應各第一穿孔之第二穿孔,且防呆結構更包含複數個引導單元,其分別穿設於各第一穿孔及對應各第一穿孔之第二穿孔,以使基座可活動地由第三預設位置位移至第四預設位置。Wherein the carrier has a plurality of first perforations, and the base has a pair The second perforation of each of the first perforations, and the anti-staying structure further includes a plurality of guiding units respectively disposed on the first perforations and the second perforations corresponding to the first perforations, so that the base is movable The three preset positions are displaced to the fourth preset position.

其中,當導入單元之該端頂抵導向件或位於缺口外 部,且蓋體由第一預設位置朝至第二預設位置位移時,導入單元之另一端則頂抵第二凹槽,以使蓋體處於第一預設位置。Wherein, when the end of the introduction unit abuts the guide or is located outside the gap And when the cover body is displaced from the first preset position to the second preset position, the other end of the introduction unit abuts against the second groove to position the cover body at the first preset position.

其中,載體之該面係由鄰近周緣處向內凹陷形成容 置空間,以容置基板。Wherein, the surface of the carrier is formed by the inward depression of the adjacent circumference Space is provided to accommodate the substrate.

其中,防呆結構更包含複數個探針體,其一端具有 彈性件,各探針體穿設於基座,探針體藉由彈性件調整於基座中之位置。Wherein, the foolproof structure further comprises a plurality of probe bodies, one end of which has In the elastic member, each probe body is disposed on the base, and the probe body is adjusted in the base by the elastic member.

其中,載體對應各探針體設有通孔,當基座之一面 貼合載體之另一面時,各探針體則通過所對應之通孔,進而頂觸基板上之預定測試點。Wherein, the carrier is provided with a through hole corresponding to each probe body, and one side of the base When the other side of the carrier is attached, each probe body passes through the corresponding through hole, thereby contacting the predetermined test point on the substrate.

承上所述,本發明之防呆結構,其可具有多個下述優點:As stated above, the foolproof structure of the present invention can have a number of advantages as follows:

(1)此防呆結構可藉由導向件與導入單元的設計,藉此可提高測試裝置的蓋體與載體閉合之準確性。(1) The foolproof structure can be designed by the guide member and the introduction unit, thereby improving the accuracy of closing the cover and the carrier of the test device.

(2)此防呆結構可藉由導向件與導入單元的設計,藉此可降低因操作者操作測試裝置不當或未將電路板準確置入測試裝置而導致電路板損壞的報廢率。(2) The foolproof structure can be designed by the guide member and the introduction unit, thereby reducing the scrap rate of the board damage caused by the operator operating the test device improperly or not accurately placing the circuit board into the test device.

(3)此防呆結構可藉由在探針體一端設置彈性件, 藉此可提高探針體與射頻頭對位之準確性,以及電路板的測試良率。(3) The foolproof structure can be provided with an elastic member at one end of the probe body. Thereby, the accuracy of the alignment of the probe body with the radio head and the test yield of the board can be improved.

1‧‧‧防呆結構1‧‧‧Danger prevention structure

10‧‧‧蓋體10‧‧‧ cover

100‧‧‧第一凹槽100‧‧‧first groove

101‧‧‧導向件101‧‧‧guides

102‧‧‧缺口102‧‧‧ gap

11‧‧‧載體11‧‧‧ Carrier

110‧‧‧第一扣合件110‧‧‧First fastening piece

111‧‧‧導入單元111‧‧‧Import unit

111A‧‧‧端111A‧‧‧

111B‧‧‧另一端111B‧‧‧The other end

112‧‧‧第三凹槽112‧‧‧ third groove

113‧‧‧第一穿孔113‧‧‧First perforation

114‧‧‧容置空間114‧‧‧ accommodating space

115‧‧‧通孔115‧‧‧through hole

12‧‧‧基座12‧‧‧ Pedestal

120‧‧‧第二凹槽120‧‧‧second groove

121‧‧‧第二扣合件121‧‧‧Second fasteners

122‧‧‧第二穿孔122‧‧‧Second perforation

13‧‧‧引導單元13‧‧‧Guide unit

14‧‧‧探針體14‧‧‧Probe body

140‧‧‧彈性件140‧‧‧Flexible parts

15‧‧‧基板15‧‧‧Substrate

第1圖係為本發明之防呆結構之第一實施例之第一示意圖。Figure 1 is a first schematic view of a first embodiment of the foolproof structure of the present invention.

第2圖係為本發明之防呆結構之第一實施例之第二示意圖。Figure 2 is a second schematic view of the first embodiment of the foolproof structure of the present invention.

第3圖係為本發明之防呆結構之第一實施例之第三示意圖。Figure 3 is a third schematic view of the first embodiment of the foolproof structure of the present invention.

第4圖係為本發明之防呆結構之第二實施例之第一示意圖。Figure 4 is a first schematic view of a second embodiment of the foolproof structure of the present invention.

第5圖係為本發明之防呆結構之第二實施例之第二示意圖。Figure 5 is a second schematic view of a second embodiment of the foolproof structure of the present invention.

第6圖係為本發明之防呆結構之第二實施例之第三示意圖。Figure 6 is a third schematic view of a second embodiment of the foolproof structure of the present invention.

第7圖係為本發明之防呆結構之第三實施例之第一示意圖。Figure 7 is a first schematic view of a third embodiment of the foolproof structure of the present invention.

第8圖係為本發明之防呆結構之第三實施例之第二示意圖。Figure 8 is a second schematic view of a third embodiment of the foolproof structure of the present invention.

以下將參照相關圖式,說明依本發明之防呆結構之實施例,為使便於理解,下述實施例中之相同元件係以相同之符號標示來說明。Embodiments of the foolproof structure according to the present invention will be described below with reference to the related drawings. For ease of understanding, the same components in the following embodiments are denoted by the same reference numerals.

請參閱第1圖至第3圖,其分別係為本發明之防呆結構之第一實施例之第一示意圖至第三示意圖。如圖所示,本發明之防呆結構1,其包含蓋體10、載體11及基座12。蓋體10設有第一凹槽100及導向件101,第一凹槽100係設於蓋體10一端,導向件101一端係凸出於蓋體10且具有缺口102。載體11位於蓋體10一面,載體11一端係樞接於蓋體10另一端,載體11對應第一凹槽100樞設第一扣合件110,且載體11對應導向件101樞設導入單元111。基座12位於載體11相對於蓋體10一面,基座12對應導入單元111另一端具有第二凹槽120,當蓋體10由第一預設位置位移至第二預設位置,且導入單元111之一端111A可活動地滑入缺口102時,第一扣合件110則可拆卸地卡合於第一凹槽100,且導入單元111之另一端111B由第二凹槽120中脫離。Please refer to FIG. 1 to FIG. 3 , which are first to third schematic views of the first embodiment of the foolproof structure of the present invention. As shown, the foolproof structure 1 of the present invention comprises a cover 10, a carrier 11 and a base 12. The cover 10 is provided with a first recess 100 and a guiding member 101. The first recess 100 is disposed at one end of the cover 10. The end of the guiding member 101 protrudes from the cover 10 and has a notch 102. The carrier 11 is located on one side of the cover body 10. One end of the carrier 11 is pivotally connected to the other end of the cover body 10. The carrier 11 pivots the first fastening component 110 corresponding to the first recess 100, and the carrier 11 pivots the guiding unit 111 corresponding to the guiding member 101. . The base 12 is located on one side of the carrier 11 with respect to the cover body 10. The base 12 has a second recess 120 corresponding to the other end of the introduction unit 111. When the cover 10 is displaced from the first preset position to the second preset position, and the introduction unit When one end 111A of the 111 is movably slid into the notch 102, the first fastening component 110 is detachably engaged with the first groove 100, and the other end 111B of the introduction unit 111 is disengaged from the second groove 120.

具體而言,本發明之防呆結構1係可應用於測試各種電路版的測試裝置,因此,操作者在操作具有防呆結構1的測試裝置時,係先將位於第一預設位置的蓋體10位移至第二預設位置,此第一預設位置可為蓋體10與載體11之間呈1~180度夾角,於本實施例中,係以約45度夾角作為示例,第二預設位置可為蓋體10貼合至載體11之位置。而於操作者將蓋體10由第一預設位置推壓至第二預設位置的過程中,導入單元111之一端111A會依據操作者的操作行為而滑入缺口102中,並連動另一端 111B由第二凹槽120中脫離,此導入單元111之一端111A較佳可設計為一滑輪或為任意之圓滑外型。此時,操作者即可藉由第一扣合件110卡合於第一凹槽100,以使蓋體10與載體11緊密貼合。Specifically, the foolproof structure 1 of the present invention can be applied to a test device for testing various circuit boards. Therefore, when the operator operates the test device having the foolproof structure 1, the cover is first placed at the first preset position. The body 10 is displaced to a second preset position, which may be an angle of 1 to 180 degrees between the cover 10 and the carrier 11. In this embodiment, an angle of about 45 degrees is taken as an example, and the second The preset position may be a position at which the cover 10 is attached to the carrier 11. While the operator pushes the cover 10 from the first preset position to the second preset position, one end 111A of the introduction unit 111 slides into the notch 102 according to the operator's operation behavior, and links the other end. The 111B is detached from the second recess 120, and one end 111A of the introduction unit 111 is preferably designed as a pulley or an arbitrarily shaped outer shape. At this time, the operator can engage the first recess 100 by the first fastening component 110 so that the cover 10 and the carrier 11 are in close contact with each other.

此外,當導入單元111之該端111A頂抵導向件101 或位於缺口102外部,且蓋體10由第一預設位置朝至第二預設位置位移時,導入單元111之另一端111B則頂抵第二凹槽120,以使蓋體10處於第一預設位置。In addition, when the end 111A of the introduction unit 111 abuts against the guide 101 Or when the cover body 10 is located outside the notch 102, and the cover body 10 is displaced from the first preset position to the second preset position, the other end 111B of the introduction unit 111 abuts against the second groove 120, so that the cover body 10 is at the first position. Preset location.

也就是說,操作者若因操作方式不當而導致導入單 元111之該端111A頂抵導向件101,或者造成導入單元111之該端111A位於缺口102外部時,由於導入單元111無法連動另一端111B由第二凹槽120中脫離,使得導入單元111之另一端111B頂抵於第二凹槽120中,因此,操作者係無法將蓋體10推壓至第二預設位置,而使得蓋體10處於第一預設位置,且亦會使得操作者無法將第一扣合件110卡合於第一凹槽100。In other words, if the operator causes an import order due to improper operation. When the end 111A of the element 111 abuts against the guiding member 101 or causes the end 111A of the guiding unit 111 to be located outside the notch 102, since the guiding unit 111 cannot interlock the other end 111B to be disengaged from the second groove 120, the introduction unit 111 The other end 111B abuts against the second recess 120. Therefore, the operator cannot push the cover 10 to the second preset position, so that the cover 10 is at the first preset position, and the operator is also made The first fastening component 110 cannot be engaged with the first recess 100.

由此可知,藉由本發明之防呆結構1之結構設計, 當操作者操作不當時,導入單元111之該端111A會頂抵導向件101,或者位於缺口102外部,使得另一端111B頂抵於第二凹槽120中,進而防止操作者推壓蓋體10至第二預設位置,而達到防呆功效。It can be seen from the structure design of the foolproof structure 1 of the present invention, When the operator is not operating properly, the end 111A of the introduction unit 111 will abut against the guide 101 or be located outside the notch 102, so that the other end 111B abuts against the second groove 120, thereby preventing the operator from pushing the cover 10. Go to the second preset position and achieve the foolproof effect.

請參閱第4圖至第6圖,其分別係為本發明之防呆 結構之第二實施例之第一示意圖至第三示意圖。並請一併參閱第1圖至第3圖。如圖所示,本實施例中之防呆結構之各元件作動,其與上述之第一實施例中所述的防呆結構的相同元件的作動方 式相似,故不再贅述。然,值得一提的是,於本實施例中,防呆結構1之載體11的相對之兩側較佳分別設有第三凹槽112,基座12對應該些第三凹槽112樞設複數個第二扣合件121,當導入單元111之另一端111B由第二凹槽120中脫離,且載體11由第三預設位置位移至第四預設位置時,各第二扣合件121則可拆卸地扣卡於各第三凹槽112。Please refer to Figures 4 to 6, which are respectively the foolproof of the present invention. A first to third schematic view of a second embodiment of the structure. Please also refer to Figure 1 to Figure 3. As shown in the figure, the components of the foolproof structure in the present embodiment are actuated, and the same components of the foolproof structure described in the first embodiment described above are actuated. The formula is similar, so it will not be described again. However, it is worth mentioning that, in this embodiment, the opposite sides of the carrier 11 of the foolproof structure 1 are preferably respectively provided with a third recess 112, and the base 12 is pivoted corresponding to the third recess 112. a plurality of second fastening members 121, when the other end 111B of the introduction unit 111 is disengaged from the second recess 120, and the carrier 11 is displaced from the third preset position to the fourth preset position, each of the second fastening members 121 is detachably fastened to each of the third grooves 112.

上述中,當導入單元111之該端111A頂抵導向件 101或位於缺口102外部,且載體11由第三預設位置朝第四預設位置位移時,導入單元111之另一端111B則頂抵第二凹槽120,以使載體11處於第三預設位置。In the above, when the end 111A of the introduction unit 111 abuts the guide When the 101 is located outside the notch 102, and the carrier 11 is displaced from the third preset position toward the fourth preset position, the other end 111B of the introduction unit 111 abuts against the second groove 120, so that the carrier 11 is at the third preset. position.

再者,載體11較佳具有複數個第一穿孔113,基座 12具有分別對應各第一穿孔113之第二穿孔122,且防呆結構1較佳更可包含複數個引導單元13,其分別穿設於各第一穿孔113及對應各第一穿孔113之第二穿孔122,以使基座12可活動地由第三預設位置位移至第四預設位置。Furthermore, the carrier 11 preferably has a plurality of first perforations 113, the base 12 has a second through hole 122 corresponding to each of the first through holes 113, and the anti-slipping structure 1 preferably further includes a plurality of guiding units 13 respectively penetrating the first perforations 113 and the corresponding first perforations 113 The second through hole 122 is configured to movably move the base 12 from the third preset position to the fourth preset position.

舉例而言,防呆結構1之導入單元111之一端111A 於依據操作者的操作而滑入缺口102並連動另一端111B由第二凹槽120中脫離時,操作者可推壓載體11,並使其由第三預設位置位移至第四預設位置,此第三預設位置可為載體11未貼合基座12之任意位置,而第四預設位置可為載體11貼合於基座12之位置。接著,操作者即可藉由將各第二扣合件121扣卡於各第三凹槽112,以使載體11緊密貼合於基座12。For example, one end 111A of the introduction unit 111 of the foolproof structure 1 When sliding into the notch 102 according to the operation of the operator and detaching the other end 111B from the second groove 120, the operator can push the carrier 11 and shift it from the third preset position to the fourth preset position. The third preset position may be any position where the carrier 11 is not attached to the base 12, and the fourth preset position may be the position where the carrier 11 is attached to the base 12. Then, the operator can fasten the carrier 11 to the base 12 by snapping the second fastening members 121 to the third recesses 112.

然而,當操作者操作此防呆結構1因操作方式不當 而導致導入單元111之該端111A頂抵導向件101,或者造成導入 單元111之該端111A位於缺口102外部時,操作者若欲將載體11由第三預設位置推壓至第四預設位置,則會因導入單元111之另一端111B頂抵於第二凹槽120,而使得載體11處於第三預設位置而無法朝第四預設位置位移。However, when the operator operates this foolproof structure 1 due to improper operation And causing the end 111A of the introduction unit 111 to abut against the guide 101, or causing the introduction When the end 111A of the unit 111 is located outside the notch 102, if the operator wants to push the carrier 11 from the third preset position to the fourth preset position, the other end 111B of the introduction unit 111 is abutted against the second recess. The groove 120 is such that the carrier 11 is in the third predetermined position and cannot be displaced toward the fourth predetermined position.

由此可知,本發明之防呆結構1亦可利用導入單元 111與導向件101之結構設計,防止操作者於操作方式不當之時,仍將載體11推壓至第四預設位置,進而達到另一防呆功效。It can be seen that the foolproof structure 1 of the present invention can also utilize the introduction unit. The structure of the 111 and the guiding member 101 is designed to prevent the operator from pushing the carrier 11 to the fourth preset position when the operation mode is improper, thereby achieving another foolproof effect.

此外,當防呆結構1之載體11處於第四預設位置 時,這時候操作者若推壓第一扣合件110相對於第一凹槽100的一端,欲將第一扣合件110於第一凹槽100中脫離時,會因第一扣合件110的一端頂抵基座12的一端,而無法將第一扣合件110於第一凹槽100中脫離,進而避免操作者因誤觸第一扣合件110而造成測試裝置故障或停止作動。In addition, when the carrier 11 of the foolproof structure 1 is in the fourth preset position At this time, if the operator pushes the first fastening component 110 relative to the one end of the first recess 100, and the first fastening component 110 is to be disengaged in the first recess 100, the first fastening component is One end of the 110 abuts against one end of the base 12, and the first fastening component 110 cannot be disengaged from the first recess 100, thereby preventing the operator from malfunctioning or stopping the operation due to the accidental contact with the first fastening component 110. .

請參閱第7圖及第8圖,其分別係為本發明之防呆 結構之第三實施例之第一示意圖及第二示意圖。並請一併參閱第1圖至第6圖。如圖所示,本實施例中之防呆結構之各元件作動,其與上述之第一實施例及第二實施例中所述的防呆結構的相同元件的作動方式相似,故不再贅述。然,值得一提的是,於本實施例中,防呆結構1之載體11之該面係由鄰近周緣處向內凹陷形成容置空間114,以容置基板15。此基板15較佳可為電路板。Please refer to Figure 7 and Figure 8, which are respectively the foolproof of the present invention. A first schematic diagram and a second schematic diagram of a third embodiment of the structure. Please also refer to Figure 1 to Figure 6. As shown in the figure, the components of the foolproof structure in the present embodiment are activated, which are similar to the operation of the same components of the foolproof structure described in the first embodiment and the second embodiment, and therefore will not be described again. . However, it is worth mentioning that, in this embodiment, the surface of the carrier 11 of the foolproof structure 1 is recessed inwardly from the periphery to form an accommodating space 114 for accommodating the substrate 15. The substrate 15 is preferably a circuit board.

再者,防呆結構1較佳更可包含複數個探針體14, 其一端具有彈性件140,此彈性件140較佳可為彈簧。各探針體14穿設於基座12,探針體14藉由彈性件140調整於基座12中之位置。而且,載體11對應各探針體14設有通孔115,當基座 12之一面貼合載體11之另一面時,各探針體14則通過所對應之通孔115,進而頂觸基板15上之預定測試點。Furthermore, the foolproof structure 1 preferably further comprises a plurality of probe bodies 14, One end has an elastic member 140, and the elastic member 140 is preferably a spring. Each probe body 14 is threaded through the base 12, and the probe body 14 is adjusted by the elastic member 140 at a position in the base 12. Moreover, the carrier 11 is provided with a through hole 115 corresponding to each probe body 14 as a base When one side of the carrier 11 is attached to the other side of the carrier 11, each of the probe bodies 14 passes through the corresponding through hole 115, thereby contacting the predetermined test point on the substrate 15.

簡言之,由於本發明之防呆結構1之探針體14一端 具有彈性件140,因此,當防呆結構1受到外力產生震動,或是當操作者更換完射頻頭時,探針體14皆可利用彈性件140而自由地調整於基座12中的位置,使得探針體14可準確地電性頂觸基板15上的預定測試點,進行電性測試,並取得此基板15相關數據,進而提高基板15的測試良率。In short, due to the end of the probe body 14 of the foolproof structure 1 of the present invention The elastic member 140 is provided. Therefore, when the foolproof structure 1 is vibrated by an external force, or when the operator replaces the radio frequency head, the probe body 14 can be freely adjusted to the position in the base 12 by the elastic member 140. The probe body 14 can be electrically electrically contacted with a predetermined test point on the substrate 15 to perform electrical testing, and obtain data related to the substrate 15, thereby improving the test yield of the substrate 15.

而且,藉由載體11、基座12及引導單元13的垂直位移設計,亦可使得探針體14與射頻頭能精準地進行對位,進而降低零件損壞率。Moreover, by the vertical displacement design of the carrier 11, the susceptor 12 and the guiding unit 13, the probe body 14 and the radio frequency head can be accurately aligned, thereby reducing the damage rate of the parts.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

1‧‧‧防呆結構1‧‧‧Danger prevention structure

10‧‧‧蓋體10‧‧‧ cover

100‧‧‧第一凹槽100‧‧‧first groove

101‧‧‧導向件101‧‧‧guides

102‧‧‧缺口102‧‧‧ gap

11‧‧‧載體11‧‧‧ Carrier

110‧‧‧第一扣合件110‧‧‧First fastening piece

111‧‧‧導入單元111‧‧‧Import unit

12‧‧‧基座12‧‧‧ Pedestal

120‧‧‧第二凹槽120‧‧‧second groove

Claims (8)

一種防呆結構,係應用於一測試裝置,其包含:一蓋體,係設有一第一凹槽及一導向件,該第一凹槽係設於該蓋體之一端,該導向件之一端具有一缺口;一載體,係位於該蓋體之一面,該載體之一端係樞接於該蓋體之另一端,該載體對應該第一凹槽樞設一第一扣合件,且該載體對應該導向件樞設一導入單元;以及一基座,其位於該載體相對於該蓋體之一面,該基座對應該導入單元之另一端具有一第二凹槽,當該蓋體由一第一預設位置位移至一第二預設位置,且該導入單元之一端可活動地滑入該缺口時,該第一扣合件則可拆卸地卡合於該第一凹槽,且該導入單元之另一端由該第二凹槽中脫離。A foolproof structure is applied to a test device, comprising: a cover body having a first groove and a guiding member, the first groove is disposed at one end of the cover body, and one end of the guide member Having a notch; a carrier is located on one side of the cover, one end of the carrier is pivotally connected to the other end of the cover, the carrier is pivotally disposed with a first fastening member corresponding to the first groove, and the carrier A guiding unit is pivoted to the guiding member; and a base is located on a side of the carrier opposite to the cover body, and the base has a second groove corresponding to the other end of the guiding unit, when the cover body is When the first preset position is displaced to a second preset position, and the one end of the introduction unit is movably slid into the notch, the first fastening component is detachably engaged with the first groove, and the first fastening member is detachably engaged with the first groove The other end of the introduction unit is detached from the second groove. 如申請專利範圍第1項所述之防呆結構,其中該載體之相對之兩側分別設有一第三凹槽,該基座對應該些第三凹槽樞設複數個第二扣合件,當該導入單元之另一端由該第二凹槽中脫離,且該載體由一第三預設位置位移至一第四預設位置時,各該第二扣合件則可拆卸地扣卡於各該第三凹槽。The anti-stay structure of claim 1, wherein the opposite sides of the carrier are respectively provided with a third recess, and the base pivots a plurality of second fastening members corresponding to the third recesses. When the other end of the introduction unit is disengaged from the second recess, and the carrier is displaced from a third preset position to a fourth preset position, each of the second fastening members is detachably buckled Each of the third grooves. 如申請專利範圍第2項所述之防呆結構,其中當該導入單元之該端頂抵該導向件或位於該缺口外部,且該載體由該第三預設位置朝該第四預設位置位移時,該導入單元之另一端則頂抵該第二凹槽,以使該載體處於該第三預設位置。The foolproof structure of claim 2, wherein the end of the introduction unit abuts the guide member or is located outside the gap, and the carrier is moved from the third preset position to the fourth preset position. When displaced, the other end of the introduction unit abuts against the second groove to place the carrier in the third preset position. 如申請專利範圍第2項所述之防呆結構,其中該載體具有複數個第一穿孔,該基座具有分別對應各該第一穿孔之一第二穿孔,且該防呆結構更包含複數個引導單元,其分別穿設於 各該第一穿孔及對應各該第一穿孔之該第二穿孔,以使該基座可活動地由該第三預設位置位移至該第四預設位置。The foolproof structure of claim 2, wherein the carrier has a plurality of first perforations, the base has a second perforation corresponding to each of the first perforations, and the anti-dwelling structure further comprises a plurality of Guide unit, which is respectively disposed on Each of the first through holes and the second through holes corresponding to the first through holes are configured to movably move the base from the third preset position to the fourth preset position. 如申請專利範圍第1項所述之防呆結構,其中當該導入單元之該端頂抵該導向件或位於該缺口外部,且該蓋體由該第一預設位置朝至該第二預設位置位移時,該導入單元之另一端則頂抵該第二凹槽,以使該蓋體處於該第一預設位置。The foolproof structure of claim 1, wherein the end of the introduction unit abuts the guide member or is located outside the notch, and the cover body faces the second predetermined position from the first preset position When the position is displaced, the other end of the introduction unit abuts against the second groove, so that the cover body is in the first preset position. 如申請專利範圍第1項所述之防呆結構,其中該載體之該面係由鄰近周緣處向內凹陷形成一容置空間,以容置一基板。The anti-dwelling structure of claim 1, wherein the surface of the carrier is recessed inwardly from adjacent the periphery to form an accommodating space for accommodating a substrate. 如申請專利範圍第6項所述之防呆結構,其更包含複數個探針體,其一端具有一彈性件,各該探針體穿設於該基座,該探針體藉由該彈性件調整於該基座中之位置。The anti-dwelling structure of claim 6, further comprising a plurality of probe bodies having an elastic member at one end thereof, each of the probe bodies being disposed on the base, wherein the probe body is elasticized The piece is adjusted to the position in the base. 如申請專利範圍第7項所述之防呆結構,其中該載體對應各該探針體設有一通孔,當該基座之一面貼合該載體之另一面時,各該探針體則通過所對應之該通孔,進而頂觸該基板上之預定測試點。The anti-stay structure of claim 7, wherein the carrier is provided with a through hole corresponding to each of the probe bodies, and when one of the bases is attached to the other side of the carrier, each of the probe bodies passes through Corresponding to the through hole, and then touching a predetermined test point on the substrate.
TW102131638A 2013-09-03 2013-09-03 Fool-proofing structure TWI489112B (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4278311A (en) * 1979-04-06 1981-07-14 Amp Incorporated Surface to surface connector
US4692790A (en) * 1984-09-06 1987-09-08 Nec Corporation Structure for connecting leadless chip carrier
US6354859B1 (en) * 1995-10-04 2002-03-12 Cerprobe Corporation Cover assembly for an IC socket
TWM287437U (en) * 2005-10-14 2006-02-11 Hon Hai Prec Ind Co Ltd Motherboard testing machine
US7507101B2 (en) * 2006-04-18 2009-03-24 Molex Incorporated Socket connector
CN202533707U (en) * 2012-04-13 2012-11-14 珠海市广浩捷精密机械有限公司 Multifunctional lens test clamp

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4278311A (en) * 1979-04-06 1981-07-14 Amp Incorporated Surface to surface connector
US4692790A (en) * 1984-09-06 1987-09-08 Nec Corporation Structure for connecting leadless chip carrier
US6354859B1 (en) * 1995-10-04 2002-03-12 Cerprobe Corporation Cover assembly for an IC socket
TWM287437U (en) * 2005-10-14 2006-02-11 Hon Hai Prec Ind Co Ltd Motherboard testing machine
US7507101B2 (en) * 2006-04-18 2009-03-24 Molex Incorporated Socket connector
CN202533707U (en) * 2012-04-13 2012-11-14 珠海市广浩捷精密机械有限公司 Multifunctional lens test clamp

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