TWI484283B - Image measurement method, image measurement apparatus and image inspection apparatus - Google Patents

Description

Image calculation measurement method, image calculation measurement device and image inspection device

The present invention relates to an image calculation measurement method, an image calculation measurement device, and an image inspection device for performing measurement measurement on optical characteristics of a projection image projected from a projector onto a screen.

The projector is a device that projects an optical image created by modulating a light beam emitted from a light source in accordance with image information onto a screen. If the screen is a reflective screen, the projected image can be viewed from the surface side of the screen, and if it is a transmissive screen, the projected image can be viewed from the back side of the screen.

As a characteristic for judging the quality of the projected image of the projector, there is distortion of the projected image. The distortion of the projected image is a shape of an ideal projected image 101 (a virtual image indicated by a broken line in the drawing) which is formed from image information of a projection pattern such as a grid pattern from a projector as shown in FIG. In contrast, the shape of the actual projected image 103 (shown by a solid line in the drawing) projected onto the screen 102 is different. The cause of the distortion of the projected image is related to the projection environment such as the unevenness of the surface of the screen 102, and also to the structure of the projector.

The relationship between the structure of the projector and the distortion of the projected image will be described below using the drawings. Fig. 13 is a schematic perspective view showing the configuration of a projector for calculating a measurement target. In the projector 200 shown in the figure, the light emitted from the light-shadow 201 reaches the optical image forming plate 202, and the arrived light is reflected by the panel in which the optical image forming plate 202 is arranged in units of pixels in accordance with the image information, or is transmitted. The projection light of the point image modulated into pixel units. The projection light of the point image is projected onto the screen 204 by the projection lens 203. In the projector 200 having such a structural member, the mutual setting accuracy between these structural members, the optical precision of the projection lens, the azimuth accuracy of each structural member, and the like are affected, and distortion of the projected image is generated. In particular, in a short-focus type projector that shortens the distance from the projector to the screen, the projected image projected from the projector is projected onto an aspherical mirror or the like, and the reflected light is projected onto the screen. Even if a small error of the shape accuracy and the setting accuracy of the aspherical mirror itself occurs, a large distortion of the projected image occurs.

Further, in the projector, there is an apparatus for projecting a full-color image called a liquid crystal three-panel projector, which is formed by synthesizing a projection image in which colors are decomposed into RGB. In the liquid crystal 3 panel projector 300 shown in Fig. 14, from the light source 301 The emitted light is split into three optical paths by the dichroic beamsplitters 302 and 303 and the mirrors 304 to 306. The decomposed light corresponds to the image information, and each of the RGB optical image forming plates 307 to 309 becomes point image light of each color. The three color-decomposed dot image lights are combined by the crossbar 310, and are projected onto a screen (not shown) via a projection lens unit 311 composed of a plurality of lenses. Then, in the projected image of the combined projector, a phenomenon of color deviation occurs due to the variation in the arrangement between the structural members of the optical system and the deviation of the optical systems of the respective color images. For example, the black of the character shown in Fig. 15(a) is the color of the light of all the RGB primary colors. When the characters are synthesized based on the respective color signals of RGB shown in FIG. 15(b), the color deviations as shown in FIG. 15(c) are generated due to the mutual deviation of the optical systems of the respective color images.

As a method of adjusting distortion and color deviation of a projection image in such a projector, the technique described in Patent Document 1 is known. The adjustment method of the patent document 1 projects a projection image made from the image information of the correction pattern onto the screen, and the projection image is captured by the imaging device, and the projection image is analyzed to obtain a projection image. Correction value to adjust the distortion and color deviation of the projected image. This correction amount is a correction value for correcting distortion and color deviation of the projection image due to two factors of the distortion of the optical pickup and the optical component of the imaging device. In order to accurately adjust the color deviation of the projected image, it is necessary to capture the dot image of the pixel unit to ensure the resolution. Therefore, the photographing device is placed as close as possible to the screen side to perform magnified photographing. However, it is impossible to perform measurement in the limited imaging range by amplifying a part of the screen, and the distortion of the projected image cannot be calculated based on the scale of the distortion. For example, in the case where the projection image is gently distorted over a wide range of screens, only a part of the screen is photographed, and the distortion of the projection image cannot be calculated and measured. Therefore, in order to calculate and measure the distortion of the projection image in such a wide range, there is a method of dividing the calculation measurement position of the screen into a plurality of pieces, and the list of the correction patterns at each of the calculation measurement positions. The picture is taken. In this method, there is a problem that the number of steps increases. In order to solve this problem, in the adjustment method of Patent Document 1, by mounting a high-resolution imaging element in an imaging device, a large imaging range is photographed with high resolution, whereby measurement can be performed over a wide range. Since the distortion of the projected image is performed, in the adjustment method of Patent Document 1, the color deviation of a plurality of points on the screen can be calculated and measured by a small number of imaging devices, so that image calculation can be performed at low cost and at high speed. Measure.

However, in the method of adjusting the distortion and color deviation of the projected image in the above Patent Document 1, when a large range of the screen is photographed by one photographing device, the image of the lens attached to the photographing device is used. Poor, sometimes the signal signal itself contains a signal of a distortion component of the projected image. The aberration of the lens has distortion aberration, spherical aberration, coma aberration, astigmatism, chromatic aberration, and especially due to coma aberration, the image is photographed with distortion. Further, when the projection image of the projector is subjected to calculation measurement to calculate distortion, the phenomenon that the distortion of the image light of the captured image is different due to the spectral characteristics of the image is greatly different. In addition, in the calculation measurement of the projected image of the projector, the spectral characteristics of the light irradiated by each projector are not all the same. Therefore, even if the position of the imaging device is adjusted for each projector, there is a projection for each projection. The aberration of the lens of the machine, therefore, the calculation measurement error due to the aberration of the lens cannot be improved.

Prior art document

Patent Document 1: Japanese Patent No. 3,853,674

The present invention has been made in view of the above problems, and an object thereof is to provide an image calculation measurement method, an image calculation measurement device, and an image inspection device capable of accurately measuring optical characteristics in a projection image of a projector.

In order to achieve the above object, the invention of claim 1 is an image calculation measurement method, the method having an image calculation measurement device, wherein the image calculation measurement device includes: a photographing device, by calculating a projection of the measurement object The machine will project an optical image prepared by modulating the light beam irradiated from the light source onto the screen corresponding to the image information, and capture the projected projected image; the image processing device analyzes and calculates the image signal output from the photographing device. Generating a distortion component of the optical characteristic of the projected image, the image calculation measuring device calculating the optical characteristic of the projected image based on the image signal output from the imaging device, wherein the projector has a monochromatic light pair The correction surface of the correction surface of the correction surface is illuminated, wherein the correction surface is a correction surface of a correction pattern formed of black and white and defined by a predetermined pattern, and the correction pattern of the correction surface is photographed by the photographing device According to the image processing device, the image signal output from the photographing device is The position of the correction pattern is analyzed, and a correction value of a distortion component of an optical characteristic of the imaging device is calculated based on a relationship between an actual position of the correction pattern and an ideal position of the correction pattern. Projecting an image generated by image information of a predetermined calculation measurement pattern onto the screen by the projector, and capturing the projection image by the photographing device, according to the calculated distortion of the optical characteristics of the photographing device The correction value of the component is corrected for the image signal output from the imaging device, and the optical characteristic of the projection image is calculated and measured based on the corrected image signal.

In the present invention, the projector for calculating the measurement is used as the illumination, and the correction surface member having the correction surface of the correction pattern is irradiated, and the correction pattern is imaged by the imaging device. Further, the image processing unit calculates in advance a correction value having sufficient distortion of the optical characteristics of the imaging device. By using the correction value, the image signal obtained by imaging the projection image of the projector for measuring the measurement object measured by the image calculation by the imaging device is corrected, whereby even if the imaging device has a distortion component of optical characteristics, The distortion component of the optical characteristics of the imaging device is excluded from the video signal obtained from the projected image, and the optical characteristics in the projection image of the projection projector can be accurately calculated.

Hereinafter, an embodiment of an image calculation measuring apparatus to which the present invention is applied will be described in detail with reference to the accompanying drawings.

Fig. 1 is a schematic view showing the configuration of a video calculation measuring device according to the present embodiment. The image calculation measuring device 10 shown in the figure comprises the following components: a fixing device 11 for fixedly setting a projector 20 for calculating a measurement object, a screen 12 for projecting an image by the projector 20, and a photographing device 13, The projection image projected onto the screen 12 is imaged; the image analysis unit 14 analyzes the image signal captured by the imaging device 13; and the correction surface member 15 is formed with a predetermined correction pattern of black and white that can be placed in front of the screen 12. The photographing device 13 is a general photographing device in which a solid-state image sensor such as a CCD camera is mounted. Further, the imaging element of the imaging device 13 is a monochrome monochrome, and is not limited to a color imaging element or a three-plate imaging element. In the case of a black-and-white image sensor, sensitivity is obtained for all wavelength bands of light, and even in a single-plate type, high resolution and low cost can be expected as compared with a color image sensor. It is assumed that the correction pattern formed on the correction surface member 15 is disposed on the correction surface at equal intervals, and information such as the pattern position or the like is obtained as an actually measured value accurately measured in advance. As an example of the correction pattern of the correction surface member 15 shown in Fig. 2, the color of the background is black, and the pattern portion is repeatedly formed with a white lattice pattern. Furthermore, the coordinates of each intersection are equally spaced. Another example of the correction pattern shown in Fig. 3 is a circular pattern in which the color of the background is black and the round portion of the pattern portion is white. The cycle is formed with the same circular pattern, and the centers of the circular portions are equally spaced.

Next, the distortion check processing of the projected image according to the present embodiment will be described in accordance with FIG. 4 of the processing flow.

First, a first step of performing aberration correction or the like of the imaging device will be described. If the positional relationship between the imaging device 13 and the screen 12 of Fig. 1 is not changed, and the primary color of the projected image from the projector 20 is not changed, it is not necessary to perform the first step each time (steps S101 to S104). The projector 20 that calculates the measurement object or the projector of the same model is placed on the fixture 11. Next, the correction surface member 15 is provided in front of the screen 12. Alternatively, the screen 12 may be removed and a correction surface member may be provided. The screen 12 and the correction surface member 15 are disposed such that there is no problem that the focus position is not appropriate or the like on the optical surface of the screen 12 and the correction surface of the correction surface member 15. Next, the uniform image data of the primary color is illuminated from the projector to the correction surface of the correction surface member 15 (step S101). Further, light from other light sources is not incident. The uniform image data of the primary color refers to the primary color used when forming the color of the image of the projector. For example, only the R light is irradiated by the RGB3 panel liquid crystal projector, and the other G light and B light are completely shielded. Since the correction surface of the correction surface member 15 is formed of a black and white pattern and the illumination light is the primary color of the projector, the light reflected by the screen 12 is reflected only by the white portion of the correction surface of the correction surface member 15. This reflected light directly reflects the spectroscopic characteristics of the projector. In this state, the correction surface of the correction surface member 15 is imaged using the imaging device 13 of Fig. 1 (step S102). Based on the image signal from the photographing device 13, the image analyzing unit 14 of Fig. 1 analyzes the pattern position of the correction surface of the correction surface member 15, that is, calculates the position coordinates of the measurement correction point (step S103). Then, by using the actually measured value of the correction surface of the correction surface member 15, the correction processing of the image distortion of the imaging device including the color aberration component of the lens of the imaging device 13 under the primary color of the projector 20 of the measurement target is calculated. Data (step S104).

Here, an outline of correction of the projector projection pattern calculation measurement coordinates using the correction pattern will be described using FIG. In the figure, the coordinates 33 of the detected projector pattern are corrected to the correction based on the relationship between the coordinates 31 of the detected correction pattern and the coordinates 32 of the correct correction pattern imaginarily calculated from the actually measured measurement values. After the coordinates 34. Fig. 6 shows an example of the correction calculation method. In the correction calculation, the distance from the respective detection point to the position of the lighting pattern of the projector is calculated with respect to the distance from each detection point of the correction pattern to the position of the lighting pattern of the projector. The ratio of the total sum is obtained from the positional coordinates of the projector lighting pattern after the position correction based on the increment of the coordinates of each X and Y coordinate of each detection point with respect to the ideal point. By the correction calculation, the detected projector pattern coordinates are projected onto the coordinates of the correct correction pattern that are imaginarily set, so that the distortion component caused by the imaging device can be corrected. The data of the ideal coordinates A', B', C' of the points shown in the figure are stored in advance in the storage.

Next, a second step of the image distortion check in FIG. 4 will be described. The fixture 20 for calculating the measurement object of FIG. 1 is provided by the fixing device 11, and the position pattern is projected from the projector 20 using the primary color used for the correction. The screen 12 switched from the correction surface member (step S106). The position pattern also uses correction patterns as shown in Figs. 2 and 3. Among them, the two do not have to be the same. Then, the image projected on the screen 12 is imaged by the photographing device 13 (step S107), and the image signal is analyzed by the image analyzing unit 14, thereby calculating the coordinate value of the position pattern (step S108). The coordinate value corrects an error component such as an aberration of the photographing system using the correction data obtained by the first step (step S109). Then, in the seventh diagram showing the image showing the image deformation state of the projector, the coordinates 33 of the projector pattern detected by the imaging unit of Fig. 1 and the projector pattern corrected by the correction method are shown. The coordinates of 34. The coordinate 34 of the detected projector pattern is a distortion of the image of the lens aberration component of the imaging unit, and only the calculation target is the pattern coordinate of the result of the correction. The distortion component of the projector itself. From the two pieces of data, it is calculated that the image distortion is detected by the linearity of the straight line formed by the pattern coordinates and the error of the magnification formed by the pitch between the straight lines as the feature amount of the distortion of the image (step S110). ). In this way, the aberration correction of the imaging device used in the distortion calculation measurement and the distortion calculation measurement of the image quality characteristic of the projector in the second step can be performed in the first step.

In the image calculation measuring apparatus according to a variation example of the other variation of the embodiment, each color of the color image of the projector for calculating the measurement target (or RGB for RGB) is used only for the color calculation. The operation of the primary color of the projector compares the position pattern errors of the respective formed colors, thereby obtaining the color deviation amount distribution of the entire projection pattern of the projector. Specifically, in the three-panel liquid crystal projector, three optical image forming panels of RGB are mounted, and images are formed by the respective panels. Therefore, when the present embodiment is applied, as shown in FIG. 8, for R Each of the three colors of G and B performs the first step and the second step (steps S201, S202, and S203), respectively, and performs measurement measurement of the position pattern. then, The color deviation amount is calculated from each of the pattern coordinate values of RGB (step S204), and the color deviation amount is checked (step S205).

Next, an image inspecting apparatus for inspecting the quality of the projected image of the projector to be inspected obtained by the above-described image calculation measuring device will be described. The image inspecting device is a device that actually projects a lattice pattern, and acquires coordinates of each intersection by the image calculation measuring device, and checks impedance, feature ratio, line bending, and color deviation.

First, the inspection of the impedance will be described. Here, the impedance refers to the projected image position. Check that the projector to be inspected is set to the specified position. Then, by using the zoom function of the projector to perform operations such as zooming, it becomes a specified projection size. The position of the projected image on the screen at this time is the impedance. Fig. 9 is a view showing a projected image on the screen during impedance inspection. The solid line in the figure is the inspected projected pattern 41 projected on the screen 40, and the broken line is the ideal projected pattern 42. The ideal coordinate value of the projection pattern designation position with respect to the origin of the correction surface is set in advance, and the inspection is performed based on the difference from the coordinate value of the actual projection image. Then, it is judged whether or not the difference (ΔX, ΔY) between the inspection target position 43 and the ideal projection pattern is equal to or less than a predetermined specification value, and the impedance is checked.

Next, the inspection of the feature ratio will be described. Here, the feature ratio refers to the aspect ratio of the projected image. The projector to be inspected has a design value of the feature ratio of the projected image. In the case of a feature ratio having a tolerance equal to or higher than the design value, for example, the aspect ratio of the projected character is different from the design value. For example, it becomes a squashed text. Therefore, as shown in FIG. 10, the inspection of the feature ratio is performed by calculating the vertical (= LY) and the horizontal (= LX) of the projected projection pattern projected onto the screen 40. Then, the feature ratio R = LY / LX is calculated and compared with the design value tolerance, thereby performing the inspection of the feature ratio.

Next, the inspection of the line bending will be described. In the projected image, a pattern that is originally a straight line is projected in a curved state. In particular, in a device such as a short-focus projector or the like in which an aspherical lens, a mirror, or the like is mounted, the projected image is deformed depending on the accuracy of the component and the mounting accuracy. Therefore, in the inspection of the in-line bending, as shown in Fig. 11, the inspection is performed on any or all of the lines of the respective lines formed by the lattice pattern. Then, an index indicating how much the line of the line which is originally a straight line is bent is obtained. Specifically, as shown in Fig. 11, the distance in the vertical direction is obtained for each intersection coordinate based on the coordinates of the intersection points forming the lattice pattern of one line with respect to the straight line formed by the start point and the end point thereof. Among them, the maximum values of the + side and the - side are respectively obtained, and the difference is used as an index (bending the amount). The bending of the wire is checked by comparing the amount of bending with the specification value.

Next, the inspection of the color deviation will be described. As shown in FIG. 8 above, the image calculation measurement is performed on each color of the color image forming color of the projector for which the measurement target is calculated, and the position pattern error of each of the formed colors is relatively compared. Thereby, the color deviation amount distribution of the entire region of the projection image of the projector is obtained. Specifically, in a three-panel liquid crystal projector, since three liquid crystal panels of RGB are mounted to form an image on each panel, the position pattern is calculated for each of the three colors of RGB. Further, the color deviation is checked by calculating the color deviation amount based on the respective pattern coordinate values of RGB.

What has been described above is an example, and the present invention has a unique effect in each of the following forms.

(Form A)

In the image calculation measurement method according to the present embodiment, as described in the above embodiment, when calculating the distortion of the measurement image, the projection image of the projector for measuring the measurement target is used for the aberration component of the imaging device itself. Since the correction value is calculated, the aberration component of the optical system of the imaging device can be accurately corrected regardless of the spectral characteristics of the projected image light of the projector, and can be widely applied with a small number of imaging devices, and can be highly accurate. Calculate the optical properties of the projected image.

(form B)

In (Form A), the correction pattern is the same pattern as the calculation measurement pattern. As a result, as described in the above embodiment, the correction value for the image distortion can be calculated more simply for the image distortion.

(form C)

In (Form A) or (Form B), the correction pattern is illuminated by the light of each of the primary colors forming the color image and the correction pattern of each of the primary colors is separately photographed by the photographing device, and can be separately calculated. A correction value of the distortion component of the optical characteristic of each of the primary color photographic devices. Therefore, as described in the above embodiment, when calculating the measurement color deviation, each of the projection images corresponding to the primary color of the color image of the projector for measuring the measurement target is used for the aberration component of the imaging system. Since the correction value is calculated separately from the light, the aberration component of the imaging system can be accurately corrected regardless of the spectral characteristics of the projected image light of the projector, and the optical characteristics of the projection image can be accurately calculated.

(form D)

In the image calculation measuring apparatus according to the present embodiment, as described in the above embodiment, when calculating the distortion of the measurement image, the projector for calculating the measurement target is used for the aberration component of the imaging unit itself. By projecting the image light and calculating the correction value, it is possible to accurately correct the aberration component of the optical system of the imaging unit regardless of the spectral characteristics of the projected image light of the projector, and it can be widely applied with a small number of imaging devices. The optical characteristics of the projected image are measured with high precision.

(Form E)

In (Form D), the correction pattern is illuminated by the light of each of the primary colors forming the color image, and the correction pattern of each of the primary colors is separately photographed by the photographing device to separately calculate the photograph of each of the primary colors. The correction value of the distortion component of the optical characteristics of the unit. As described above, as described in the variation example of the above-described embodiment, when calculating the measurement color deviation, the primary color of the color image of the projector for calculating the measurement target is used for the aberration component of the imaging system. Since the corrected value is calculated for each of the corresponding projected image lights, the aberration component of the imaging system can be accurately corrected regardless of the spectral characteristics of the projected image light of the projector, and the optical of the projected image can be accurately calculated. characteristic.

(form F)

Using the image calculation measuring device of (Form D) or (Form E), the quality of the projected image is checked based on the characteristic value of the projected image obtained by photographing the predetermined pattern projected by the projector that calculates the measurement object. . Therefore, as described in the variation example of the embodiment, it is possible to perform quality inspection of the image projected by the projector, for example, impedance, feature ratio, line bending, and color deviation, based on the characteristic value of the projected image. There is no deviation in the inspection results compared with the visual inspection.

10‧‧‧Image calculation measuring device

11‧‧‧Fixed devices

12‧‧‧ screen

13‧‧‧Photographing device

14‧‧‧Image Analysis Unit

15‧‧‧Correction surface components

20‧‧‧Projector

31‧‧‧ coordinates

32‧‧‧ coordinates

33‧‧‧ coordinates

34‧‧‧ coordinates

40‧‧‧ screen

41‧‧‧Checked projection pattern

42‧‧‧Ideal projection pattern

43‧‧‧Check the location of the object

Steps S101, S102, S103, S104, S105, S106, S107, S108, S109, S110‧‧

1 is a schematic view showing a configuration of a video calculation measuring device; FIG. 2 is a plan view showing an example of a correction pattern; FIG. 3 is a plan view showing another example of a correction pattern; and FIG. 4 is a plan view showing a fourth embodiment; A flowchart of the distortion check processing of the projected image of the mode; and FIG. 5 is a view showing an outline of the correction of the projection coordinate of the projector projection pattern; Fig. 6 is a view for explaining an example of a correction calculation method; Fig. 7 is a plan view showing an image showing a state of image distortion of the projector; and Fig. 8 is a view showing distortion of a projection image in another variation of the embodiment. Figure 9 is a flow chart showing the projected image on the screen during the impedance check; Figure 10 is a view showing the projected image on the screen during the feature comparison; and Figure 11 is the screen showing the line bending check. Fig. 12 is a plan view showing distortion of a projected image; Fig. 13 is a schematic perspective view showing a configuration of a projector for measuring a measurement target; and Fig. 14 is a view showing a configuration of a liquid crystal 3 panel projector Figure 15 and Figure 15 are diagrams illustrating the phenomenon of color deviation in the projected image of the projector.

Steps S101, S102, S103, S104, S105, S106, S107, S108, S109, S110‧‧

Claims (6)

An image calculation measurement method, the method having an image calculation measurement device, wherein the image calculation measurement device comprises: a photographing device, wherein the projector that calculates the measurement object performs the light beam irradiated from the light source corresponding to the image information The modulated light image is projected onto the screen to capture the projected projected image; the image processing device analyzes the image signal output from the photographing device, and calculates a distortion component of the optical characteristic of the projected image, the image calculation amount The measuring device calculates an optical characteristic of the measured projected image based on the image signal output from the photographing device, wherein the correcting surface of the correcting surface member having the correcting surface is illuminated by the projector by monochromatic light, Wherein the correction surface is a correction surface of a correction pattern formed of black and white and defined by a predetermined pattern, and the correction pattern of the correction surface is photographed by the photographing device, and the image processing device according to the image The image signal output by the photographing device analyzes the position of the correction pattern, according to the analyzed Calculating a correction value of a distortion component of an optical characteristic of the photographing device by a relative relationship between a position of the correction pattern and a position of the ideal correction pattern, by which the projector will calculate according to a prescribed The projection image generated by the image information of the measurement pattern is projected onto the screen, and the projection image is captured by the photographing device, and the corrected value of the distortion component of the optical characteristic of the photographing device is calculated. The image signal output by the imaging device is corrected, and the optical characteristics of the projected image are calculated and measured based on the corrected image signal. The image calculation measurement method according to claim 1, wherein the correction pattern and the calculation measurement pattern are the same pattern. The image calculation measurement method according to claim 1 or 2, wherein when the correction pattern is illuminated by the projector that calculates the measurement object, the color image is formed by the projector. Each of the primary colors illuminates the correction pattern, and the photographic device respectively captures a correction pattern of the correction surface of each primary color, and each of the primary colors is separately calculated by the image processing device The correction value of the distortion component of the optical characteristic of the imaging device is calculated by using the projection of each of the primary colors when the projection image of the measurement measurement pattern is projected onto the screen by the projector for calculating the measurement target Using the pattern, the correction is performed according to each correction value corresponding to each of the primary colors, and the calculation is performed according to the corresponding relationship in the projected image of each primary color. The color deviation distribution of the projector image is calculated by the relative position between the coordinate positions of the patterns. An image calculation measuring device comprising: a photographing device that projects a light image created by modulating a light beam irradiated from a light source corresponding to image information onto a screen by a projector that calculates a measurement object, and projects the projected image on the projection image Performing imaging; the image processing device analyzes the image signal output from the imaging device to calculate a distortion component of the optical characteristic of the projected image, and the image calculation measuring device calculates the measurement projection image based on the image signal output from the imaging device The optical characteristic is characterized in that: the photographing device illuminates the correction surface of the correction surface member having the correction surface by monochromatic light by the projector and photographs the correction surface, wherein the correction surface Is a correction surface of a correction pattern formed of black and white and defined by a predetermined pattern, and the image processing device analyzes the position of the correction pattern based on the image signal output from the photographing device, based on the analyzed actual The relative relationship between the position of the correction pattern and the position of the desired correction pattern a correction value of a distortion component of an optical characteristic of the imaging device, wherein the imaging device images a projection image that is replaced by the correction surface member and is generated based on image information of a predetermined calculation measurement pattern And the image processing device obtains the image signal output from the photographing device based on the correction value of the distortion component of the optical characteristic of the photographing device calculated in advance by the projector being projected onto the screen. Correction, calculating and measuring the optical characteristics of the projected image according to the corrected image signal. The image calculation measuring device according to claim 4, wherein the photographing device illuminates the correction pattern with light of each primary color formed by the projector to form a color image, and respectively for each of the primary colors The correction pattern of the correction surface is photographed, and the image processing device calculates a correction value of a distortion component of an optical characteristic of the imaging device of each of the primary colors, wherein the imaging device calculates the measurement object by When the projector projects the projection image of the calculation measurement pattern, the measurement pattern is calculated by using each of the primary color projections, and is corrected according to each correction value corresponding to each primary color, and has a projection image according to each primary color. The relative position between the coordinate positions of the calculation measurement patterns of the correspondence relationship is calculated, and the color deviation distribution of the projector image is calculated. An image inspecting apparatus, which is obtained by photographing a predetermined pattern projected by the projector that calculates a measurement object, using an image calculation measuring device according to claim 4 or 5 The characteristic value of the projected image is used to check the quality of the projected image.