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TWI474011B - - Google Patents

Info

Publication number
TWI474011B
TWI474011B TW101129003A TW101129003A TWI474011B TW I474011 B TWI474011 B TW I474011B TW 101129003 A TW101129003 A TW 101129003A TW 101129003 A TW101129003 A TW 101129003A TW I474011 B TWI474011 B TW I474011B
Authority
TW
Taiwan
Application number
TW101129003A
Other versions
TW201407171A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW101129003A priority Critical patent/TW201407171A/zh
Publication of TW201407171A publication Critical patent/TW201407171A/zh
Application granted granted Critical
Publication of TWI474011B publication Critical patent/TWI474011B/zh

Links

TW101129003A 2012-08-10 2012-08-10 電子元件測試分類設備 TW201407171A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW101129003A TW201407171A (zh) 2012-08-10 2012-08-10 電子元件測試分類設備

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101129003A TW201407171A (zh) 2012-08-10 2012-08-10 電子元件測試分類設備

Publications (2)

Publication Number Publication Date
TW201407171A TW201407171A (zh) 2014-02-16
TWI474011B true TWI474011B (zh) 2015-02-21

Family

ID=50550440

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101129003A TW201407171A (zh) 2012-08-10 2012-08-10 電子元件測試分類設備

Country Status (1)

Country Link
TW (1) TW201407171A (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI572876B (zh) * 2015-03-23 2017-03-01 Rich Flash Tech Ltd Memory card detection device
CN106707141A (zh) * 2017-03-03 2017-05-24 深圳凯智通微电子技术有限公司 一种托盘式集成电路芯片测试装置
CN109100570A (zh) * 2018-09-25 2018-12-28 昆山鑫润利自动化科技有限公司 用于电子手表内软板天线的vswr检测设备
CN114264450A (zh) * 2020-09-16 2022-04-01 山东华光光电子股份有限公司 一种半导体激光器用cos光斑扎测装置及扎测方法
CN113798214B (zh) * 2020-12-31 2024-04-30 深圳市合力泰光电有限公司 一种探针式电测机
TWI784603B (zh) * 2021-06-29 2022-11-21 牧德科技股份有限公司 物件之分類方法
CN116037496A (zh) * 2022-12-05 2023-05-02 苏州天准科技股份有限公司 一种清洗、检测及分拣下料系统及方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0232269A (ja) * 1988-07-22 1990-02-02 Mitsubishi Electric Corp 半導体装置のテスト装置
US20080143361A1 (en) * 2006-12-15 2008-06-19 Casterton Kristin N Automated loader for removing and inserting removable devices to improve load time for automated test equipment
CN100554952C (zh) * 2005-08-03 2009-10-28 鸿劲科技股份有限公司 集成电路检测机
TWI346642B (en) * 2008-03-28 2011-08-11 Hon Tech Inc Testing and classifying machine for electronic elements
TW201131170A (en) * 2010-03-05 2011-09-16 Hon Tech Inc Testing and classifying machine for electronic elements

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0232269A (ja) * 1988-07-22 1990-02-02 Mitsubishi Electric Corp 半導体装置のテスト装置
CN100554952C (zh) * 2005-08-03 2009-10-28 鸿劲科技股份有限公司 集成电路检测机
US20080143361A1 (en) * 2006-12-15 2008-06-19 Casterton Kristin N Automated loader for removing and inserting removable devices to improve load time for automated test equipment
TWI346642B (en) * 2008-03-28 2011-08-11 Hon Tech Inc Testing and classifying machine for electronic elements
TW201131170A (en) * 2010-03-05 2011-09-16 Hon Tech Inc Testing and classifying machine for electronic elements

Also Published As

Publication number Publication date
TW201407171A (zh) 2014-02-16

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