TWI470255B - Thin strip magnetic measuring device - Google Patents
Thin strip magnetic measuring device Download PDFInfo
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- TWI470255B TWI470255B TW102104115A TW102104115A TWI470255B TW I470255 B TWI470255 B TW I470255B TW 102104115 A TW102104115 A TW 102104115A TW 102104115 A TW102104115 A TW 102104115A TW I470255 B TWI470255 B TW I470255B
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- thin strip
- measuring device
- arc plate
- magnetic measuring
- winding
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- 238000004804 winding Methods 0.000 claims description 37
- 239000011810 insulating material Substances 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 7
- 239000004809 Teflon Substances 0.000 claims description 4
- 229920006362 Teflon® Polymers 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- 239000000696 magnetic material Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000007655 standard test method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
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- Measuring Magnetic Variables (AREA)
Description
本發明係關於一種磁性量測裝置，特別係關於一種薄帶磁性量測裝置。The present invention relates to a magnetic measuring device, and more particularly to a thin strip magnetic measuring device.
習知非晶質薄帶之磁性量測方法主要是依照ASTM-A912規範之「利用瓦特計-電流計-伏特計測量非晶質材料在電力頻率之交流磁特性的標準試驗方法(Standard Test Method for Alternating-Current Magnetic Properties of Amorphous Materials at Power Frequencies Using Wattmeter-Ammeter-Voltmeter Method with Toroidal Specimens)」。而上述規範之標準試驗方法是利用瓦特計、安培計及伏特計量測環狀鐵心(內徑10cm，且往外捲繞非晶質薄帶數十圈至百圈)，並於鐵心外圍繞上數百圈之一次線圈及二次線圈，而後進行量測。The magnetic measurement method of the conventional amorphous ribbon is mainly based on the standard test method for measuring the AC magnetic properties of amorphous materials at the electric frequency using the wattmeter-current meter-voltmeter according to the ASTM-A912 specification (Standard Test Method for Alternating-Current Magnetic Properties of Amorphous Materials at Power Frequencies Using Wattmeter-Ammeter-Voltmeter Method with Toroidal Specimens)". The standard test method of the above specification is to measure the annular core (having an inner diameter of 10 cm and winding an amorphous ribbon tens of turns to a hundred turns outward) by using a wattmeter, an ammeter, and a voltmeter, and surrounding the core. The primary coil and the secondary coil of a hundred turns are then measured.
參閱圖1，其係顯示習知非晶質薄帶磁性量測之流程圖。如圖1所示，習知非晶質薄帶之磁性量測步驟包括：提供一支架：將非晶質薄帶捲繞於該支架上；進行二次線圈捲繞；以絕緣紙包覆二次線圈；進行一次線圈捲繞；及以瓦特計、安培計及伏特計量測非晶質薄帶之磁性。然而，上述方法在量測完一種非晶質薄帶後，在續行量測另一種非晶質薄帶之前，必須先解繞一次線圈及二次線圈，方能更換成另一種非晶質薄帶，且在完成薄帶更換後，必須重新捲繞數百圈之一次線圈及二次線圈，方能續行磁性 量測，如此，不僅使得量測耗時且費工，其線圈銅線之外部絕緣層容易於解繞及重繞過程被割破，進而導致電路短路及量測失效。Referring to Figure 1, there is shown a flow chart of a conventional amorphous ribbon magnetic measurement. As shown in FIG. 1 , the magnetic measurement step of the conventional amorphous ribbon includes: providing a bracket: winding an amorphous ribbon on the bracket; performing secondary coil winding; coating with insulating paper Secondary coil; performs coil winding once; and measures the magnetic properties of the amorphous ribbon in watts, ammeters, and volts. However, after measuring an amorphous ribbon, the above method must first unwind the primary coil and the secondary coil before continuing to measure another amorphous ribbon, so that it can be replaced with another amorphous material. Thin strip, and after the strip replacement is completed, it is necessary to re-wrap the primary coil and the secondary coil of several hundred turns in order to continue the magnetic Measurement, in this way, not only makes the measurement time-consuming and labor-intensive, but the outer insulation layer of the coil copper wire is easy to be cut during the unwinding and rewinding process, thereby causing short circuit and measurement failure.
因此，有必要提供一創新且具進步性之薄帶磁性量測裝置，以解決上述問題。Therefore, it is necessary to provide an innovative and progressive thin strip magnetic measuring device to solve the above problems.
本發明提供一種薄帶磁性量測裝置，包括：一中空支撐架體，具有二開口及一內部空間，該等開口呈相對設置，該內部空間連通各該開口；一薄帶捲繞支架，具有一第一部份及一第二部分，該第一部份設置於該中空支撐架體之內部空間，該第二部分顯露於各該開口之間；一個二次線圈，捲繞於該中空支撐架體；一絕緣材，披覆於該二次線圈；以及一個一次線圈，捲繞於該中空支撐架體及該絕緣材。The invention provides a thin strip magnetic measuring device, comprising: a hollow supporting frame body having two openings and an inner space, the openings are oppositely arranged, the inner space is connected to each of the openings; and a thin strip winding bracket has a first portion and a second portion, the first portion is disposed in an inner space of the hollow support frame body, the second portion is exposed between the openings; a secondary coil is wound around the hollow support a frame body; an insulating material covering the secondary coil; and a primary coil wound around the hollow support frame body and the insulating material.
本發明之薄帶磁性量測裝置可無需解繞與重繞一次與二次線圈及重新披覆絕緣材，即可進行不同薄帶之磁性量測，其功效上可大幅提升薄帶磁性量測效率。The thin strip magnetic measuring device of the invention can perform magnetic measurement of different thin strips without unwinding and rewinding the primary and secondary coils and re-coating the insulating material, and the utility model can greatly improve the magnetic measurement of the thin strip. effectiveness.
為了能夠更清楚瞭解本發明的技術手段，而可依照說明書的內容予以實施，並且為了讓本發明所述目的、特徵和優點能夠更明顯易懂，以下特舉較佳實施例，並配合附圖，詳細說明如下。The embodiments of the present invention can be more clearly understood, and the objects, features, and advantages of the present invention will become more apparent. The details are as follows.
圖2顯示本發明薄帶磁性量測裝置之結構立體圖。圖3顯示本發明薄帶磁性量測裝置之薄帶捲繞示意圖。配合參閱 圖2及圖3，本發明之薄帶磁性量測裝置10包括一中空支撐架體11、一薄帶捲繞支架12、一個二次線圈13、一絕緣材14以及一個一次線圈15。Figure 2 is a perspective view showing the structure of the ribbon magnetic measuring device of the present invention. Figure 3 is a schematic view showing the ribbon winding of the ribbon magnetic measuring device of the present invention. Match 2 and 3, the thin strip magnetic measuring device 10 of the present invention comprises a hollow support frame 11, a thin strip winding support 12, a secondary coil 13, an insulating material 14, and a primary coil 15.
該中空支撐架體11包括一上弧板111、一下弧板112、一內側弧板113及一外側弧板114，且具有二開口115及一內部空間116。該內側弧板113之一側及該外側弧板114之一側分別連接於該上弧板111之兩側，而該內側弧板113之另一側及該外側弧板114之另一側分別連接於該下弧板112之兩側，藉此形成圓弧形狀之中空支撐架體11。在本實施例中，該中空支撐架體11的形狀選自如下的一種：四分之一圓弧形狀、二分之一圓弧形狀及四分之三圓弧形狀。The hollow support frame 11 includes an upper arc plate 111, a lower arc plate 112, an inner arc plate 113 and an outer arc plate 114, and has two openings 115 and an inner space 116. One side of the inner arc plate 113 and one side of the outer arc plate 114 are respectively connected to two sides of the upper arc plate 111, and the other side of the inner arc plate 113 and the other side of the outer arc plate 114 are respectively It is connected to both sides of the lower arc plate 112, thereby forming a circular support frame 11 of a circular arc shape. In this embodiment, the shape of the hollow support frame 11 is selected from the group consisting of a quarter arc shape, a half arc shape, and a three-quarter arc shape.
此外，在本實施例中，該中空支撐架體11之材質係為不導磁材料。較佳地，該中空支撐架體11之材質選自如下的一種：鐵氟龍、鋁及銅。In addition, in the embodiment, the material of the hollow support frame 11 is a non-magnetic material. Preferably, the material of the hollow support frame 11 is selected from the group consisting of Teflon, aluminum and copper.
又，在本實施例中，該等開口115呈相對設置，且該上弧板111與該下弧板112之間距係等於各該開口115之長度L，而該內側弧板113與該外側弧板114之間距係等於各該開口115之寬度W。該內部空間116係位於該內側弧板113與該外側弧板114之間，且該內部空間116連通各該開口115。Moreover, in the embodiment, the openings 115 are oppositely disposed, and the distance between the upper arc plate 111 and the lower arc plate 112 is equal to the length L of each of the openings 115, and the inner arc plate 113 and the outer arc are The distance between the plates 114 is equal to the width W of each of the openings 115. The inner space 116 is located between the inner arc plate 113 and the outer arc plate 114, and the inner space 116 communicates with each of the openings 115.
該薄帶捲繞支架12具有一第一部份121、一第二部分122、一內側壁12a及一外側壁12b，該第一部份121設置於該中空支撐架體11之內部空間116，該第二部分122顯露於各該開口115之間，該內側壁12a面向該中空支撐架體11之 內側弧板113，而該外側壁12b用以黏貼及捲繞一薄帶20。在本實施例中，該薄帶捲繞支架12的形狀係為中空圓管狀，而該薄帶捲繞支架12之材質係為不導磁材料。較佳地，該薄帶捲繞支架12之材質選自如下的一種：鐵氟龍、鋁及銅。The strip winding support 12 has a first portion 121, a second portion 122, an inner side wall 12a and an outer side wall 12b. The first portion 121 is disposed in the inner space 116 of the hollow support frame 11. The second portion 122 is exposed between the openings 115, and the inner sidewall 12a faces the hollow support frame 11 The inner arc plate 113 is used to adhere and wind a thin strip 20. In the present embodiment, the ribbon winding support 12 is in the shape of a hollow circular tube, and the material of the ribbon winding support 12 is a non-magnetic material. Preferably, the material of the ribbon winding support 12 is selected from the group consisting of Teflon, aluminum and copper.
此外，在本實施例中，該薄帶捲繞支架12之厚度t係小於各該開口115之寬度W，且較佳地，該薄帶捲繞支架12之厚度t與該薄帶20捲繞後之厚度T的和亦小於各該開口115之寬度W，以防止該薄帶捲繞支架12於旋轉解繞該薄帶20時，受到該內側弧板113及該外側弧板114之干涉。另外，在本實施例中，該薄帶捲繞支架12之一捲繞旋轉方向選自如下的一種：順時針方向及逆時針方向。In addition, in the present embodiment, the thickness t of the ribbon winding support 12 is smaller than the width W of each of the openings 115, and preferably, the thickness t of the ribbon winding support 12 and the thin strip 20 are wound. The sum of the thicknesses T is also smaller than the width W of each of the openings 115 to prevent the ribbon winding support 12 from being interfered by the inner arc plate 113 and the outer arc plate 114 when the ribbon winding 20 is unwound. Further, in the present embodiment, one of the winding directions of the ribbon winding support 12 is selected from one of the following: a clockwise direction and a counterclockwise direction.
該二次線圈13捲繞於該中空支撐架體11，在本實施例中，該二次線圈13係由一銅線捲繞數百圈所製成。The secondary coil 13 is wound around the hollow support frame 11. In the present embodiment, the secondary coil 13 is made by winding a copper wire for several hundred turns.
該絕緣材14披覆於該二次線圈13，以防止後續捲繞之該一次線圈15接觸該二次線圈13。在本實施例中，該絕緣材14係為絕緣紙。The insulating material 14 is coated on the secondary coil 13 to prevent the primary coil 15 that is subsequently wound from contacting the secondary coil 13. In the present embodiment, the insulating material 14 is an insulating paper.
該一次線圈15捲繞於該中空支撐架體11及該絕緣材14，在本實施例中，該一次線圈15係由另一銅線捲繞數百圈所製成。The primary coil 15 is wound around the hollow support frame 11 and the insulating material 14. In the present embodiment, the primary coil 15 is wound by another copper wire for several hundred turns.
本發明之薄帶磁性量測裝置10在量測完一薄帶後，僅需朝捲繞之相反方向旋轉該薄帶捲繞支架12，即可解捲該薄帶。之後，將另一薄帶捲繞於該薄帶捲繞支架12上，即可續行另一非晶質薄帶之磁性量測，其薄帶更換過程中，該 一次線圈15、該絕緣材14及該二次線圈13係完全固定不動。換言之，本發明無需解繞與重繞該一次線圈15與該二次線圈13及重新披覆該絕緣材14，即可進行不同薄帶之磁性量測，其功效上可大幅提升薄帶磁性量測效率。The thin strip magnetic measuring device 10 of the present invention can unwind the thin strip after rotating the strip winding support 12 in the opposite direction of the winding after measuring a thin strip. Then, another thin ribbon is wound on the ribbon winding support 12, and the magnetic measurement of the other amorphous ribbon can be continued, and during the strip replacement process, The primary coil 15, the insulating material 14, and the secondary coil 13 are completely fixed. In other words, the present invention can perform magnetic measurement of different thin strips without unwinding and rewinding the primary coil 15 and the secondary coil 13 and re-coating the insulating material 14, and the effect can greatly improve the magnetic properties of the thin strip. Measuring efficiency.
上述實施例僅為說明本發明之原理及其功效，並非限制本發明，因此習於此技術之人士對上述實施例進行修改及變化仍不脫本發明之精神。本發明之權利範圍應如後述之申請專利範圍所列。The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the scope of the present invention. The scope of the invention should be as set forth in the appended claims.
10‧‧‧薄帶磁性量測裝置10‧‧‧Thin ribbon magnetic measuring device
11‧‧‧中空支撐架體11‧‧‧ hollow support frame
12‧‧‧薄帶捲繞支架12‧‧‧Thin ribbon winding bracket
12a‧‧‧內側壁12a‧‧‧ inner side wall
12b‧‧‧外側壁12b‧‧‧Outer side wall
13‧‧‧二次線圈13‧‧‧second coil
14‧‧‧絕緣材14‧‧‧Insulation
15‧‧‧一次線圈15‧‧‧One coil
20‧‧‧薄帶20‧‧‧ Thin strip
111‧‧‧上弧板111‧‧‧Upper arc plate
112‧‧‧下弧板112‧‧‧ lower arc plate
113‧‧‧內側弧板113‧‧‧Inside arc plate
114‧‧‧外側弧板114‧‧‧Outer arc plate
115‧‧‧開口115‧‧‧ openings
116‧‧‧內部空間116‧‧‧Internal space
121‧‧‧第一部份121‧‧‧ first part
122‧‧‧第二部分122‧‧‧Part II
L‧‧‧開口之長度Length of L‧‧‧ opening
t‧‧‧薄帶捲繞支架之厚度t‧‧‧Thin tape winding bracket thickness
T‧‧‧薄帶捲繞後之厚度T‧‧‧Thin thickness after winding
W‧‧‧開口之寬度W‧‧‧ width of opening
圖1顯示習知非晶質薄帶磁性量測之流程圖；圖2顯示本發明薄帶磁性量測裝置之結構立體圖；及圖3顯示本發明薄帶磁性量測裝置之薄帶捲繞示意圖。1 is a flow chart showing the magnetic measurement of a conventional amorphous ribbon; FIG. 2 is a perspective view showing the structure of the thin magnetic measuring device of the present invention; and FIG. 3 is a schematic view showing the winding of the thin magnetic measuring device of the present invention. .
10‧‧‧薄帶磁性量測裝置10‧‧‧Thin ribbon magnetic measuring device
11‧‧‧中空支撐架體11‧‧‧ hollow support frame
12‧‧‧薄帶捲繞支架12‧‧‧Thin ribbon winding bracket
12a‧‧‧內側壁12a‧‧‧ inner side wall
12b‧‧‧外側壁12b‧‧‧Outer side wall
13‧‧‧二次線圈13‧‧‧second coil
14‧‧‧絕緣材14‧‧‧Insulation
15‧‧‧一次線圈15‧‧‧One coil
111‧‧‧上弧板111‧‧‧Upper arc plate
112‧‧‧下弧板112‧‧‧ lower arc plate
113‧‧‧內側弧板113‧‧‧Inside arc plate
114‧‧‧外側弧板114‧‧‧Outer arc plate
115‧‧‧開口115‧‧‧ openings
116‧‧‧內部空間116‧‧‧Internal space
121‧‧‧第一部份121‧‧‧ first part
122‧‧‧第二部分122‧‧‧Part II
L‧‧‧開口之長度Length of L‧‧‧ opening
W‧‧‧開口之寬度W‧‧‧ width of opening
Claims (15)
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| TW102104115A TWI470255B (en) | 2013-02-04 | 2013-02-04 | Thin strip magnetic measuring device |
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| TW102104115A TWI470255B (en) | 2013-02-04 | 2013-02-04 | Thin strip magnetic measuring device |
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| TWI470255B true TWI470255B (en) | 2015-01-21 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101080788A (en) * | 2004-12-17 | 2007-11-28 | 日立金属株式会社 | Magnetic cores for current transformers, current transformers and watt-hour meters |
| TWM381882U (en) * | 2010-01-27 | 2010-06-01 | Jing Shun Technology Co Ltd | Magnetic element |
| TW201033633A (en) * | 2009-03-02 | 2010-09-16 | China Steel Corp | Electromagnetic testing fixture |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101080788A (en) * | 2004-12-17 | 2007-11-28 | 日立金属株式会社 | Magnetic cores for current transformers, current transformers and watt-hour meters |
| TW201033633A (en) * | 2009-03-02 | 2010-09-16 | China Steel Corp | Electromagnetic testing fixture |
| TWM381882U (en) * | 2010-01-27 | 2010-06-01 | Jing Shun Technology Co Ltd | Magnetic element |
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