TWI464417B - Test System and Method for Frequency Range - Google Patents
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本發明係關於一種頻率範圍測試系統及方法,尤指一種對待測設備進行頻率測試以確保其正常運行的系統及方法。 The present invention relates to a frequency range test system and method, and more particularly to a system and method for performing frequency testing on a device under test to ensure its normal operation.
習知經常需要根據用戶設定的一頻率範圍對電腦各部件,例如CPU(Central Processing Unit,中央處理器)、電腦主機板等進行頻率測試,以確定電腦各部件是否能在此頻率範圍內正常運行。以電腦主機板頻率範圍測試為例,一般的測試方法通常是採用人工測試,即用戶首先根據需測試的頻率範圍調整頻率產生器產生一該頻率範圍內最小的頻率值,頻率產生器再將此頻率輸出給主機板,然後用戶給主機板上電,主機板開機後,用戶再啟動一測試軟體測試主機板能否在此頻率下正常運行,然後再逐步增加頻率值並循環執行上述測試操作,直至測試完該頻率範圍內最大的頻率值為止,從而得到測試結果。雖然這種測試方法能夠確定出電腦各部件能否在用戶設定的頻率範圍內正常運行,但用戶需人工反復進行調整頻率及主機板上電開機的繁瑣操作,使得效率極低。 It is often necessary to perform frequency tests on various computer components, such as a CPU (Central Processing Unit), a computer motherboard, etc., according to a frequency range set by the user to determine whether the computer components can operate normally within this frequency range. . Taking the computer motherboard frequency range test as an example, the general test method usually uses manual test, that is, the user first adjusts the frequency generator according to the frequency range to be tested to generate a minimum frequency value in the frequency range, and the frequency generator again The frequency is output to the motherboard, and then the user powers on the motherboard. After the motherboard is powered on, the user starts a test software to test whether the motherboard can run normally at this frequency, and then gradually increases the frequency value and cyclically performs the above test operation. The test result is obtained until the maximum frequency value in the frequency range is tested. Although this test method can determine whether the various components of the computer can operate normally within the frequency range set by the user, the user needs to manually repeat the cumbersome operation of adjusting the frequency and powering on the motherboard, so that the efficiency is extremely low.
鑒於上述內容,有必要提供一種高效率的頻率範圍測試系統及方法,可自動對待測設備進行頻率測試。 In view of the above, it is necessary to provide a high-efficiency frequency range test system and method for automatically testing the frequency of the device under test.
一種頻率範圍測試系統,用於測試一待測設備在設定的頻率範圍內能否正常工作,該頻率範圍測試系統包括一測試設備、一頻率產生器及一電源,該測試設備包括:一頻率設定模組,用於設定一頻率測試區間及一初始調整頻率值,並將該初始調整頻率值寫入該頻率產生器以使該頻率產生器產生一對應的測試頻率訊號輸出給該待測設備;一電源控制模組,用於控制該電源給該待測設備供電;一判斷模組,用於判斷在該待測設備通電開機後的一計時時間內該判斷模組能否接收到該待測設備發送的一回應訊號,以判斷該待測設備在該測試頻率下是否可以正常開機;一偵測模組,用於判斷該待測設備上的各部件是否能夠正常工作,該待測設備開機後,該偵測模組發送給該待測設備一啟動測試軟體指令以使該待測設備上存儲的一測試軟體開始測試該待測設備上的各部件是否能夠正常工作,並在該待測設備測試完後讀取各部件能否正常工作的測試結果,若該測試結果均記錄為各部件能夠正常工作,則發送一關機訊號使得該待測設備關機;及一頻率調整模組,用於判斷該測試頻率是否大於或等於該頻率測試區間的最大值來判斷測試頻率是否超出該頻率測試區間,若該測試頻率不大於或等於該頻率測試區間的最大值,則在該待測設備關機後,將該待測設備的測試頻率與一預設頻率常量相加形成另一調整頻率值傳送給該頻率產生器以進行下一次頻率的測試,另一調整頻率值傳送給該頻率產生器以使該頻率產生器產生對應的測試頻率訊號輸出給該待測設備。 A frequency range test system for testing whether a device under test can work normally within a set frequency range, the frequency range test system comprising a test device, a frequency generator and a power source, the test device comprising: a frequency setting The module is configured to set a frequency test interval and an initial adjustment frequency value, and write the initial adjustment frequency value to the frequency generator to cause the frequency generator to generate a corresponding test frequency signal to be output to the device to be tested; a power control module for controlling the power supply to the device to be tested; a determining module, configured to determine whether the determining module can receive the testable component within a time period after the device to be tested is powered on and powered on A response signal sent by the device to determine whether the device under test can be normally turned on at the test frequency; a detection module for determining whether the components on the device to be tested can work normally, and the device to be tested is powered on After the detection module sends the test software to the device under test, a test software command is started to enable the test software stored on the device to be tested to start testing the device under test. Whether the various components can work normally, and after the test device is tested, the test results of whether the components can work normally are read. If the test results are recorded as the components can work normally, a shutdown signal is sent to make the standby The measuring device is turned off; and a frequency adjusting module is configured to determine whether the test frequency is greater than or equal to a maximum value of the frequency test interval to determine whether the test frequency exceeds the frequency test interval, and if the test frequency is not greater than or equal to the frequency test The maximum value of the interval, after the device under test is turned off, the test frequency of the device under test is added to a preset frequency constant to form another adjusted frequency value, which is transmitted to the frequency generator for testing the next frequency. Another frequency adjustment value is transmitted to the frequency generator to cause the frequency generator to generate a corresponding test frequency signal to be output to the device under test.
一種頻率範圍測試方法,用於測試一待測設備在設定的頻率範圍內能否正常工作,包括以下步驟: 設定一頻率測試區間及一初始調整頻率值,並將該初始調整頻率值寫入一頻率產生器;使該頻率產生器產生一對應的測試頻率訊號輸出給該待測設備;控制一電源給該待測設備供電;判斷在一設定的計時時間內是否接收到該待測設備發送的一回應訊號,若未接收到該待測設備發送的一回應訊號,則判斷為該待測設備在測試頻率下不能開機,控制該電源停止給該待測設備供電,透過一監視器顯示測試結果;若在該計時時間內接收到該待測設備發送的一回應訊號,則判斷為該待測設備在測試頻率下能開機,發送給該待測設備一啟動測試軟體指令以使該待測設備上的一測試軟體開始測試該待測設備上的各部件是否能夠正常工作,該待測設備測試完後讀取測試結果,若該測試結果均記錄為各部件能夠正常工作,則發送一關機訊號使得該待測設備關機;及判斷測試頻率值是否大於頻率測試區間的最大值,若否,則將待測設備的測試頻率與一預設頻率常量相加形成另一調整頻率值,並將該調整頻率值寫入該頻率產生器,再返回執行使該頻率產生器產生一對應的測試頻率訊號輸出給該待測設備的步驟。 A frequency range test method for testing whether a device under test can work normally within a set frequency range includes the following steps: Setting a frequency test interval and an initial adjustment frequency value, and writing the initial adjustment frequency value to a frequency generator; causing the frequency generator to generate a corresponding test frequency signal to be output to the device under test; controlling a power supply to the The device to be tested is powered; determining whether a response signal sent by the device under test is received within a set time period, and if a response signal sent by the device under test is not received, determining that the device under test is at the test frequency The power cannot be turned on, and the power supply is stopped to supply power to the device to be tested, and the test result is displayed through a monitor; if a response signal sent by the device under test is received within the timeout period, it is determined that the device under test is in the test. The device can be powered on, and sent to the device under test to start a test software command, so that a test software on the device under test starts to test whether the components on the device under test can work normally, and the device to be tested is read after the test. Taking the test result, if the test result is recorded as each component can work normally, sending a shutdown signal causes the device to be tested to be turned off; Whether the test frequency value is greater than the maximum value of the frequency test interval, and if not, adding the test frequency of the device under test to a preset frequency constant to form another adjusted frequency value, and writing the adjusted frequency value to the frequency generator And returning to the step of executing the frequency generator to generate a corresponding test frequency signal to the device under test.
本發明頻率範圍測試系統及方法透過頻率調整模組自動產生頻率測試區間內需測試的頻率並寫入頻率產生器,並透過測試設備中的電源控制模組、判斷模組及偵測模組控制在每一測試頻率下待測設備的測試過程及分析測試結果,從而實現了頻率自動測試,無需人工手動操作,提高測試效率。 The frequency range test system and method of the present invention automatically generates the frequency to be tested in the frequency test interval through the frequency adjustment module and writes the frequency to the frequency generator, and controls the power control module, the judgment module and the detection module in the test device. The test process of the device to be tested at each test frequency and the analysis of the test results, thereby realizing the automatic frequency test, without manual manual operation, and improving the test efficiency.
8‧‧‧頻率範圍測試系統 8‧‧‧Frequency range test system
16‧‧‧監視器 16‧‧‧Monitor
30‧‧‧電源 30‧‧‧Power supply
102‧‧‧頻率設定模組 102‧‧‧frequency setting module
106‧‧‧判斷模組 106‧‧‧Judgement module
110‧‧‧頻率調整模組 110‧‧‧frequency adjustment module
10‧‧‧測試設備 10‧‧‧Test equipment
20‧‧‧頻率產生器 20‧‧‧frequency generator
40‧‧‧待測設備 40‧‧‧Device under test
104‧‧‧電源控制模組 104‧‧‧Power Control Module
108‧‧‧偵測模組 108‧‧‧Detection module
圖1係本發明頻率範圍測試系統的較佳實施方式的框圖。 1 is a block diagram of a preferred embodiment of a frequency range test system of the present invention.
圖2係本發明頻率範圍測試方法的較佳實施方式的流程圖。 2 is a flow chart of a preferred embodiment of the frequency range testing method of the present invention.
如圖1所示,本發明頻率範圍測試系統8用於測試一待測設備40在設定的頻率範圍內能否正常工作,其較佳實施方式包括一測試設備10、一監視器16、一頻率產生器20及一電源30。該測試設備10可以為電腦、伺服器等。該待測設備40可以為一電腦主機板等。 As shown in FIG. 1, the frequency range test system 8 of the present invention is used to test whether a device under test 40 can work normally within a set frequency range. A preferred embodiment includes a test device 10, a monitor 16, and a frequency. The generator 20 and a power source 30. The test device 10 can be a computer, a server, or the like. The device under test 40 can be a computer motherboard or the like.
該測試設備10透過一USB(Universal Serial Bus,通用串列匯流排)資料線與該頻率產生器20相連,透過一網路線與該待測設備40相連,還與監視器16及該電源30相連,該頻率產生器20及電源30還與待測設備40相連。在其他實施方式中,該測試設備10不限於透過USB資料線與該頻率產生器20相連,也不限於透過網路線與該待測設備40相連。 The test device 10 is connected to the frequency generator 20 through a USB (Universal Serial Bus) data line, connected to the device under test 40 via a network route, and connected to the monitor 16 and the power source 30. The frequency generator 20 and the power source 30 are also connected to the device under test 40. In other embodiments, the test device 10 is not limited to being connected to the frequency generator 20 via a USB data line, nor is it limited to being connected to the device under test 40 via a network route.
該測試設備10包括一頻率設定模組102、一電源控制模組104、一判斷模組106、一偵測模組108、一頻率調整模組110及一顯示模組112。 The test device 10 includes a frequency setting module 102, a power control module 104, a determining module 106, a detecting module 108, a frequency adjusting module 110, and a display module 112.
該頻率設定模組102用於接收由用戶設定的一頻率測試區間,如[1GHz,10GHz],並設定將頻率測試區間的最小值作為初始調整頻率值寫入該頻率產生器20。在其他實施方式中,該頻率設定模組102也可以將頻率測試區間的最大值作為初始調整頻率值寫入該頻率產生器20。 The frequency setting module 102 is configured to receive a frequency test interval set by a user, such as [1 GHz, 10 GHz], and set a minimum value of the frequency test interval as an initial adjustment frequency value to be written to the frequency generator 20. In other embodiments, the frequency setting module 102 may also write the maximum value of the frequency test interval as the initial adjustment frequency value to the frequency generator 20.
該頻率產生器20用於根據寫入的調整頻率值產生一對應的測試頻 率訊號,並將產生的測試頻率訊號輸出給該待測設備40。 The frequency generator 20 is configured to generate a corresponding test frequency according to the written adjusted frequency value. Rate the signal and output the generated test frequency signal to the device under test 40.
該電源控制模組104用於控制該電源30給該待測設備40供電。 The power control module 104 is configured to control the power source 30 to supply power to the device under test 40.
該判斷模組106用於判斷待測設備40在測試頻率訊號下是否可以正常開機。待測設備40通電開機後會發送一回應訊號給測試設備10的判斷模組106,該判斷模組106設定一段計時時間(如2秒),該計時時間從待測設備40通電開機後開始計時,若在此計時時間內判斷模組106接收到待測設備40發送的回應訊號,則判斷待測設備40在測試頻率下可以正常開機。 The determining module 106 is configured to determine whether the device under test 40 can be powered on normally under the test frequency signal. After the device 40 is powered on, a response signal is sent to the determining module 106 of the testing device 10. The determining module 106 sets a time period (for example, 2 seconds), and the time is started after the device under test 40 is powered on. If the determining module 106 receives the response signal sent by the device under test 40 during the timeout period, it is determined that the device under test 40 can be normally turned on at the test frequency.
該偵測模組108用於判斷待測設備40上的各部件例如硬碟機、記憶體、CPU等是否能夠正常工作以確定待測設備40在此測試頻率下是否工作正常。本實施方式的具體工作過程為:該偵測模組108在獲知待測設備40可以正常開機後,發送給待測設備40一啟動測試軟體指令以使待測設備40上的一測試軟體開始測試待測設備上的各部件是否能夠正常工作,待測設備40測試完後保存表示各部件能否正常工作的測試結果。該偵測模組108設定一測試時間,在該偵測模組108發送完啟動測試軟體指令後,到達該測試時間,則從待測設備40讀取該測試結果,若該測試結果均記錄為各部件能夠正常工作,則發送一關機訊號使得待測設備40關機。若該測試結果有記錄某一部件不能夠正常工作時,則透過電源控制模組104控制電源30給該待測設備40斷電。例如該待測設備40上的測試軟體測試待測設備40上的CPU是否能夠正常工作時,則可以在測試軟體中預設一演算法讓CPU去執行,若CPU執行完畢並給出正確結果,則表示CPU能夠正常工作,反之,則表示CPU不能正常工作。 The detecting module 108 is configured to determine whether components of the device under test 40, such as a hard disk drive, a memory, a CPU, etc., can work normally to determine whether the device under test 40 is working properly at the test frequency. The specific working process of the embodiment is: after the detecting module 108 knows that the device under test 40 can be normally turned on, it sends a test software command to the device under test 40 to start a test software on the device under test 40 to start testing. Whether the components on the device to be tested can work normally, and the test device 40 saves the test result indicating whether the components can work normally after the test. The detection module 108 sets a test time. After the detection module 108 sends the start test software command and reaches the test time, the test result is read from the device under test 40, and if the test result is recorded as When the components can work normally, a shutdown signal is sent to turn off the device under test 40. If the test result records that a component is not working properly, the power supply control module 104 controls the power supply 30 to power off the device under test 40. For example, when the test software on the device under test 40 tests whether the CPU on the device under test 40 can work normally, an algorithm may be preset in the test software to allow the CPU to execute. If the CPU executes and gives a correct result, It means that the CPU can work normally, otherwise it means the CPU is not working properly.
該頻率調整模組110用於判斷測試頻率是否大於或等於頻率測試區間的最大值,若測試頻率不大於或等於頻率測試區間的最大值,則在待測設備40關機後,將待測設備40的測試頻率與一預設頻率常量(如100MHz)相加形成另一調整頻率值傳送給頻率產生器20以進行下一次頻率的測試,若測試頻率大於或等於頻率測試區間的最大值,表示已測試完頻率測試區間內的所有值,則透過控制顯示模組112使得監視器16顯示相應的測試結果。在其他實施方式中,若初始調整頻率值為頻率測試區間的最大值,則該頻率調整模組110判斷測試頻率是否小於或等於頻率測試區間的最小值,若否,則在待測設備40關機後,將待測設備40的測試頻率與一預設頻率常量(如100MHz)相減形成另一調整頻率值傳送給頻率產生器20以進行下一次頻率的測試。 The frequency adjustment module 110 is configured to determine whether the test frequency is greater than or equal to the maximum value of the frequency test interval. If the test frequency is not greater than or equal to the maximum value of the frequency test interval, the device under test 40 is to be tested after the device under test 40 is powered off. The test frequency is added to a preset frequency constant (such as 100MHz) to form another adjusted frequency value and transmitted to the frequency generator 20 for the next frequency test. If the test frequency is greater than or equal to the maximum value of the frequency test interval, it indicates that After testing all the values in the frequency test interval, the monitor 16 is caused to display the corresponding test result through the control display module 112. In other embodiments, if the initial adjustment frequency value is the maximum value of the frequency test interval, the frequency adjustment module 110 determines whether the test frequency is less than or equal to the minimum value of the frequency test interval, and if not, shuts down the device under test 40. Thereafter, the test frequency of the device under test 40 is subtracted from a predetermined frequency constant (eg, 100 MHz) to form another adjusted frequency value, which is transmitted to the frequency generator 20 for testing of the next frequency.
如圖2所示,本發明頻率範圍測試方法用於測試待測設備40在設定的頻率範圍內能否正常工作,其較佳實施方式包括以下步驟:步驟S100,該頻率設定模組102接收由用戶設定的一頻率測試區間,並將頻率測試區間的最小值作為初始調整頻率值寫入該頻率產生器20。 As shown in FIG. 2, the frequency range test method of the present invention is used to test whether the device under test 40 can work normally in a set frequency range. The preferred embodiment includes the following steps: Step S100, the frequency setting module 102 receives A frequency test interval set by the user, and the minimum value of the frequency test interval is written as the initial adjustment frequency value to the frequency generator 20.
步驟S102,該頻率產生器20根據寫入的調整頻率值產生一對應的測試頻率訊號,並將產生的測試頻率訊號輸出給該待測設備40。 In step S102, the frequency generator 20 generates a corresponding test frequency signal according to the written adjusted frequency value, and outputs the generated test frequency signal to the device under test 40.
步驟S104,該電源控制模組104控制該電源30給該待測設備40供電。 In step S104, the power control module 104 controls the power supply 30 to supply power to the device under test 40.
步驟S106,該判斷模組106判斷待測設備40在測試頻率訊號下是否可以正常開機,即在計時時間內接收到待測設備40發送的回應 訊號,則判斷為待測設備40在測試頻率下可以正常開機,執行步驟S108,反之,則判斷為待測設備40在測試頻率下不能開機,執行步驟S110。 In step S106, the determining module 106 determines whether the device under test 40 can be normally turned on under the test frequency signal, that is, receives the response sent by the device under test 40 within the timeout period. If the signal is determined, the device under test 40 can be normally turned on at the test frequency, and step S108 is performed. Otherwise, it is determined that the device under test 40 cannot be turned on at the test frequency, and step S110 is performed.
步驟S108,該偵測模組108判斷待測設備40上的各部件是否能夠正常工作,即發送給待測設備40一啟動測試軟體指令以使待測設備40上的一測試軟體開始測試待測設備上的各部件是否能夠正常工作,並在到達測試時間時,從待測設備40讀取該測試結果,若該測試結果均記錄為各部件能夠正常工作,則執行步驟S112,若該測試結果有記錄某一部件不能夠正常工作時,則執行步驟S110。 In step S108, the detecting module 108 determines whether the components on the device under test 40 can work normally, that is, sends the test software to the device under test 40 to start a test software command, so that a test software on the device under test 40 starts testing. Whether the components on the device can work normally, and when the test time is reached, the test result is read from the device under test 40. If the test result is recorded as the components can work normally, step S112 is performed, if the test result is When it is recorded that a certain component cannot work normally, step S110 is performed.
步驟S110,電源控制模組104控制電源30停止給該待測設備40供電,執行步驟S118。 In step S110, the power control module 104 controls the power supply 30 to stop supplying power to the device under test 40, and step S118 is performed.
步驟S112,該偵測模組108發送一關機訊號給待測設備40使得待測設備40關機。 In step S112, the detection module 108 sends a shutdown signal to the device under test 40 to cause the device under test 40 to be powered off.
步驟S114,該頻率調整模組110判斷測試頻率是否大於或等於頻率測試區間的最大值,若測試頻率大於或等於頻率測試區間的最大值,執行步驟S118,若測試頻率不大於或等於頻率測試區間的最大值,執行步驟S116。 In step S114, the frequency adjustment module 110 determines whether the test frequency is greater than or equal to the maximum value of the frequency test interval. If the test frequency is greater than or equal to the maximum value of the frequency test interval, step S118 is performed, if the test frequency is not greater than or equal to the frequency test interval. The maximum value is executed in step S116.
步驟S116,該頻率調整模組110將待測設備40的測試頻率與一預設頻率常量相加形成另一調整頻率值,返回執行步驟S102。 In step S116, the frequency adjustment module 110 adds the test frequency of the device under test 40 to a preset frequency constant to form another adjustment frequency value, and returns to step S102.
步驟S118,該頻率調整模組110控制顯示模組112使得監視器16顯示相應的測試結果,如“在50GHz時無法開機”或“測試通過”等。 In step S118, the frequency adjustment module 110 controls the display module 112 to cause the monitor 16 to display corresponding test results, such as "cannot be turned on at 50 GHz" or "test pass".
本發明頻率範圍測試系統及方法可以對待測設備40的頻率自動進行測試以確定待測設備40在設定的頻率範圍內能否正常工作,從而提高了測試效率。 The frequency range test system and method of the present invention can automatically test the frequency of the device under test 40 to determine whether the device under test 40 can work normally within a set frequency range, thereby improving test efficiency.
綜上所述,本發明確已符合發明專利的要件,爰依法提出專利申請。惟,以上所述者僅為本發明的較佳實施方式,本發明的範圍並不以上述實施方式為限,舉凡熟悉本案技藝的人士爰依本發明的精神所作的等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in accordance with the spirit of the present invention are It should be covered by the following patent application.
8‧‧‧頻率範圍測試系統 8‧‧‧Frequency range test system
16‧‧‧監視器 16‧‧‧Monitor
30‧‧‧電源 30‧‧‧Power supply
102‧‧‧頻率設定模組 102‧‧‧frequency setting module
106‧‧‧判斷模組 106‧‧‧Judgement module
110‧‧‧頻率調整模組 110‧‧‧frequency adjustment module
10‧‧‧測試設備 10‧‧‧Test equipment
20‧‧‧頻率產生器 20‧‧‧frequency generator
40‧‧‧待測設備 40‧‧‧Device under test
104‧‧‧電源控制模組 104‧‧‧Power Control Module
108‧‧‧偵測模組 108‧‧‧Detection module
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2386447Y (en) * | 1998-07-29 | 2000-07-05 | 四川长虹电子集团公司 | Frequency tester |
| US7012418B2 (en) * | 2001-08-18 | 2006-03-14 | Robert Bosch Gmbh | Measuring system with ratiometric frequency output |
| CN1835530A (en) * | 2005-03-18 | 2006-09-20 | 阿尔卡特公司 | Communication interface and testing method therefore |
| US20080077348A1 (en) * | 2006-03-27 | 2008-03-27 | Infineon Technologies Ag | Integrated circuit and method for determining the operating range of an integrated circuit |
| TW200910926A (en) * | 2007-08-24 | 2009-03-01 | Hon Hai Prec Ind Co Ltd | System and method for testing a video signal generator |
| TW200923382A (en) * | 2007-11-30 | 2009-06-01 | Hon Hai Prec Ind Co Ltd | Testing system and method |
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2009
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2386447Y (en) * | 1998-07-29 | 2000-07-05 | 四川长虹电子集团公司 | Frequency tester |
| US7012418B2 (en) * | 2001-08-18 | 2006-03-14 | Robert Bosch Gmbh | Measuring system with ratiometric frequency output |
| CN1835530A (en) * | 2005-03-18 | 2006-09-20 | 阿尔卡特公司 | Communication interface and testing method therefore |
| US20080077348A1 (en) * | 2006-03-27 | 2008-03-27 | Infineon Technologies Ag | Integrated circuit and method for determining the operating range of an integrated circuit |
| TW200910926A (en) * | 2007-08-24 | 2009-03-01 | Hon Hai Prec Ind Co Ltd | System and method for testing a video signal generator |
| TW200923382A (en) * | 2007-11-30 | 2009-06-01 | Hon Hai Prec Ind Co Ltd | Testing system and method |
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