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TWI458183B - 連接端子 - Google Patents

連接端子 Download PDF

Info

Publication number
TWI458183B
TWI458183B TW100141571A TW100141571A TWI458183B TW I458183 B TWI458183 B TW I458183B TW 100141571 A TW100141571 A TW 100141571A TW 100141571 A TW100141571 A TW 100141571A TW I458183 B TWI458183 B TW I458183B
Authority
TW
Taiwan
Prior art keywords
end portion
diameter
contact member
base end
contact
Prior art date
Application number
TW100141571A
Other languages
English (en)
Chinese (zh)
Other versions
TW201251216A (en
Inventor
Toshio Kazama
Kazuya Souma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW201251216A publication Critical patent/TW201251216A/zh
Application granted granted Critical
Publication of TWI458183B publication Critical patent/TWI458183B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
TW100141571A 2010-11-15 2011-11-15 連接端子 TWI458183B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010254840 2010-11-15

Publications (2)

Publication Number Publication Date
TW201251216A TW201251216A (en) 2012-12-16
TWI458183B true TWI458183B (zh) 2014-10-21

Family

ID=46084004

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100141571A TWI458183B (zh) 2010-11-15 2011-11-15 連接端子

Country Status (3)

Country Link
JP (1) JP5805102B2 (ja)
TW (1) TWI458183B (ja)
WO (1) WO2012067077A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104425945A (zh) * 2013-08-30 2015-03-18 贝尔威勒电子股份有限公司 伸缩端子
TWI555987B (zh) * 2014-01-28 2016-11-01 Spring sleeve type probe and its manufacturing method
WO2016021723A1 (ja) * 2014-08-08 2016-02-11 日本発條株式会社 接続端子
KR101552553B1 (ko) * 2014-09-23 2015-10-01 리노공업주식회사 검사장치용 컨택트 프로브
CN107121570A (zh) * 2017-05-03 2017-09-01 林荣敏 高压开关柜分电接点的耐压试验装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200532207A (en) * 2004-02-04 2005-10-01 Nhk Spring Co Ltd Needle shape member, conductive conductive contactor and conductive conductor unit
TWM389955U (en) * 2010-02-08 2010-10-01 Hon Hai Prec Ind Co Ltd Electrical connector and contact thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308684A (ja) * 2004-04-26 2005-11-04 Seiko Epson Corp プローブおよび検査装置
JP4574222B2 (ja) * 2004-05-06 2010-11-04 日本電産リード株式会社 基板検査用接触子、これを用いた基板検査用治具及び基板検査装置
JP4585024B2 (ja) * 2005-06-10 2010-11-24 デラウェア キャピタル フォーメーション インコーポレイテッド 可撓性のある内部相互接続部を備えた電気コンタクトプローブ
JP5067790B2 (ja) * 2007-04-27 2012-11-07 センサータ テクノロジーズ マサチューセッツ インコーポレーテッド プローブピンおよびそれを用いたソケット
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200532207A (en) * 2004-02-04 2005-10-01 Nhk Spring Co Ltd Needle shape member, conductive conductive contactor and conductive conductor unit
TWM389955U (en) * 2010-02-08 2010-10-01 Hon Hai Prec Ind Co Ltd Electrical connector and contact thereof

Also Published As

Publication number Publication date
WO2012067077A1 (ja) 2012-05-24
TW201251216A (en) 2012-12-16
JP5805102B2 (ja) 2015-11-04
JPWO2012067077A1 (ja) 2014-05-12

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