TWI457921B - Holographic data storage system and image recognition method thereof - Google Patents
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本發明是有關於一種影像儲存系統及影像識別方法,且特別是有關於一種全像儲存系統及其影像識別方法。The present invention relates to an image storage system and an image recognition method, and more particularly to a holographic storage system and an image recognition method thereof.
目前市面上主要的光學儲存材料為光碟片,包含了CD、DVD以及BD,其資料儲存方式係藉由雷射光透過物鏡聚焦而在光碟片上單點燒錄二進制的資料,因此可儲存的容量有限。此外,光碟機大多以點對點方式讀取光碟片資料,使得資料傳輸速率受到限制。近年來,一種頁碼儲存方式的全像儲存系統被提出,使得資料儲存裝置可同時具有高儲存容量與高傳輸速率之優點。At present, the main optical storage materials on the market are optical discs, including CD, DVD and BD. The data storage method is to burn binary data on the optical disc by focusing the laser light through the objective lens, so the storage capacity is limited. . In addition, most optical disc players read optical disc data in a point-to-point manner, which limits the data transmission rate. In recent years, a holographic storage system for page number storage has been proposed, so that the data storage device can have the advantages of high storage capacity and high transmission rate at the same time.
然而,由於全像儲存系統中的光學系統存在像差與雜訊,使得投射在二維感測器上的影像產生扭曲、亮度分佈不均、光斑以及高斯雜訊,致使無法達到正確的影像辨識與影像還原。However, due to the aberrations and noise of the optical system in the holographic storage system, the image projected on the two-dimensional sensor is distorted, the brightness distribution is uneven, the spot and the Gaussian noise are not obtained, so that the correct image recognition cannot be achieved. Restore with images.
因此,迄今習知技術仍具有上述缺陷與不足之處需要解決。Therefore, the conventional techniques still have the above drawbacks and deficiencies to be solved.
本揭示內容之一態樣是在提供一種全像儲存系統,包含儲存媒體、感測器以及處理器。儲存媒體用以儲存原始影像相對應之干涉條紋。感測器配置於參考光束入射儲存媒體後所產生之繞射光束的傳遞路徑上,用以接收繞射光束投射所產生之影像圖案,並將影像圖案所對應之影像資訊轉換為影像信號。處理器電性耦接感測器,用以接收影像信號,其中處理器依據資料庫中複數個參考圖案所對應之影像畫素的數量與排列型式對影像圖案進行複數個定位點之搜尋,並依序將定位點所對應之複數個區域圖案與資料庫之參考圖案進行結構相似度之比對,以還原原始影像。One aspect of the present disclosure is to provide a holographic storage system including a storage medium, a sensor, and a processor. The storage medium is used to store the interference fringes corresponding to the original image. The sensor is disposed on the transmission path of the diffracted beam generated after the reference beam is incident on the storage medium, and is configured to receive the image pattern generated by the diffraction of the diffracted beam and convert the image information corresponding to the image pattern into the image signal. The processor is electrically coupled to the sensor for receiving the image signal, wherein the processor searches for the plurality of anchor points of the image pattern according to the number and arrangement pattern of the image pixels corresponding to the plurality of reference patterns in the database, and The plurality of regional patterns corresponding to the positioning points are sequentially compared with the reference pattern of the database to restore the original image.
依據本揭示內容之一實施例,其中干涉條紋係由物體光束經過空間調製器編碼後與參考光束之間產生干涉效應而得到。In accordance with an embodiment of the present disclosure, the interference fringes are obtained by an interference effect between the object beam and the reference beam after encoding by the spatial modulator.
依據本揭示內容之一實施例,其中物體光束與參考光束之間係為同軸或離軸。In accordance with an embodiment of the present disclosure, the object beam and the reference beam are coaxial or off-axis.
本揭示內容之另一態樣是在提供一種全像儲存系統之影像識別方法,包含下列操作步驟。首先,建立資料庫。隨後,獲取影像信號。接著,搜尋影像信號所對應之影像圖案的複數個定位點。然後,依序擷取定位點所對應之複數個區域圖案,以與資料庫中所儲存之複數個參考圖案進行結構相似度之比對。其後,選擇與區域圖案具有最高相似度之參考圖案。隨後,依據所選擇之參考圖案還原原始影像。Another aspect of the present disclosure is to provide an image recognition method for a holographic storage system, comprising the following operational steps. First, build a database. Subsequently, an image signal is acquired. Then, searching for a plurality of anchor points of the image pattern corresponding to the image signal. Then, the plurality of area patterns corresponding to the positioning points are sequentially captured to perform structural similarity comparison with the plurality of reference patterns stored in the database. Thereafter, a reference pattern having the highest similarity to the area pattern is selected. The original image is then restored in accordance with the selected reference pattern.
依據本揭示內容之一實施例,其中區域圖案與參考圖案所對應之影像畫素的數量以及排列型式係為相同。According to an embodiment of the present disclosure, the number of image pixels corresponding to the area pattern and the reference pattern and the arrangement pattern are the same.
依據本揭示內容之一實施例,其中區域圖案與參考圖案所對應之影像畫素的數量以及排列型式係為可調整。According to an embodiment of the present disclosure, the number and arrangement pattern of the image pixels corresponding to the area pattern and the reference pattern are adjustable.
依據本揭示內容之一實施例,其中參考圖案所對應之影像畫素的排列型式包含十字形、交叉形、圓形、三角形、矩形、正方形、菱形以及多邊形中之任一者。According to an embodiment of the present disclosure, the arrangement pattern of the image pixels corresponding to the reference pattern includes any one of a cross, a cross, a circle, a triangle, a rectangle, a square, a diamond, and a polygon.
依據本揭示內容之一實施例,其中參考圖案所對應之影像畫素的灰階位準係為可調整。According to an embodiment of the present disclosure, the gray level level of the image pixel corresponding to the reference pattern is adjustable.
依據本揭示內容之一實施例,其中參考圖案之間具有相異之影像編碼資訊。In accordance with an embodiment of the present disclosure, the reference patterns have different image encoding information between them.
依據本揭示內容之一實施例,其中搜尋定位點之方法包含灰階權重法、結構相似定位法以及方塊中心搜尋法中之任一者。According to an embodiment of the present disclosure, the method for searching for an anchor point includes any one of a gray scale weight method, a structural similarity positioning method, and a block center search method.
因此,應用本揭示內容可透過擷取與區域圖案具有最高相似度之參考圖案,以還原全幅原始影像,克服了感測器因影像扭曲與雜訊而無法進行影像識別的問題。Therefore, the application of the present disclosure can reduce the full-frame original image by capturing the reference pattern having the highest similarity with the area pattern, thereby overcoming the problem that the sensor cannot perform image recognition due to image distortion and noise.
以下將以圖式及詳細敘述清楚說明本揭示內容之精神,任何所屬技術領域中具有通常知識者在瞭解本揭示內容之較佳實施例後,當可由本揭示內容所教示之技術,加以改變及修飾,其並不脫離本揭示內容之精神與範圍。The spirit and scope of the present disclosure will be apparent from the following description of the preferred embodiments of the present disclosure. Modifications do not depart from the spirit and scope of the disclosure.
第1圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100之結構示意圖。全像儲存系統100可包含儲存媒體170、感測器180以及處理器190。儲存媒體170所儲存之原始影像的編碼資訊可透過參考光束30入射儲存媒體170而產生繞射效應,以投射影像圖案於感測器180上,然後藉由處理器190將感測器180所接收到之影像圖案與預先建立的參考圖案依序進行區域性的結構相似度(Structural SIMilarity,SSIM)運算與比對,以還原原始影像。在本實施例中,感測器180可為二維感測器,用以感測全幅影像資訊。1 is a block diagram showing the structure of a holographic storage system 100 in accordance with an embodiment of the present disclosure. The hologram storage system 100 can include a storage medium 170, a sensor 180, and a processor 190. The encoded information of the original image stored in the storage medium 170 can be incident on the storage medium 170 through the reference beam 30 to generate a diffraction effect to project the image pattern on the sensor 180, and then received by the sensor 180 by the processor 190. The image pattern and the pre-established reference pattern are sequentially subjected to regional structural similarity (SSIM) operations and comparisons to restore the original image. In this embodiment, the sensor 180 can be a two-dimensional sensor for sensing full-frame image information.
在本實施例中,全像儲存系統100更可包含光源110、空間濾波器120、第一透鏡131、第二透鏡132、第三透鏡133、分光鏡140、空間調製器150、第一反射鏡161、第二反射鏡162以及資料庫195。由光源110所發出之具有原始影像資訊的影像光束10依序經過空間濾波器120、第一透鏡131以及分光鏡140。分光鏡140可將影像光束10分為物體光束20以及參考光束30,其中物體光束20經過空間調製器150而傳遞給儲存媒體170,參考光束30則經由第一反射鏡161與第二反射鏡162之反射而傳遞給儲存媒體170,使得物體光束20與參考光束30可在儲存媒體170中產生干涉效應而形成干涉條紋。然後,儲存媒體170可儲存與原始影像相對應之干涉條紋於其中。In this embodiment, the holographic storage system 100 further includes a light source 110, a spatial filter 120, a first lens 131, a second lens 132, a third lens 133, a beam splitter 140, a spatial modulator 150, and a first mirror. 161, second mirror 162 and database 195. The image beam 10 having the original image information emitted by the light source 110 sequentially passes through the spatial filter 120, the first lens 131, and the beam splitter 140. The beam splitter 140 can divide the image beam 10 into an object beam 20 and a reference beam 30, wherein the object beam 20 is transmitted to the storage medium 170 via the spatial modulator 150, and the reference beam 30 is passed through the first mirror 161 and the second mirror 162. The reflection is transmitted to the storage medium 170 such that the object beam 20 and the reference beam 30 can create interference effects in the storage medium 170 to form interference fringes. The storage medium 170 can then store the interference fringes corresponding to the original image therein.
當讀取儲存媒體170之影像資訊時,可利用參考光束30入射儲存媒體170而產生繞射光束40。感測器180配置繞射光束40的傳遞路徑上,用以接收繞射光束40投射所產生之影像圖案,並可將影像圖案所對應之影像資訊轉換為影像信號。處理器190電性耦接感測器180,用以接收影像信號,其中處理器190可依據資料庫195中複數個參考圖案所對應之影像畫素的數量與排列型式對影像圖案進行複數個定位點之搜尋,並依序將定位點所對應之複數個區域圖案與資料庫195之參考圖案進行結構相似度之比對,以還原原始影像。When the image information of the storage medium 170 is read, the reference beam 30 can be incident on the storage medium 170 to generate the diffracted beam 40. The sensor 180 is disposed on the transmission path of the diffracted beam 40 for receiving the image pattern generated by the diffraction of the diffracted beam 40, and converting the image information corresponding to the image pattern into an image signal. The processor 190 is electrically coupled to the sensor 180 for receiving image signals. The processor 190 can perform multiple positioning on the image pattern according to the number and arrangement of the image pixels corresponding to the plurality of reference patterns in the database 195. Searching for points, and sequentially comparing the plurality of regional patterns corresponding to the anchor points with the reference patterns of the database 195 to restore the original images.
在本揭示內容之一實施例中,干涉條紋係由物體光束20入射空間調製器150進行編碼,經過編碼後之物體光束20可與參考光束30產生干涉效應而得到干涉條紋。因此,干涉條紋具有空間調製器150之編碼資訊以及原始影像資訊。In one embodiment of the present disclosure, the interference fringes are encoded by the object beam 20 incident spatial modulator 150, and the encoded object beam 20 can interfere with the reference beam 30 to obtain interference fringes. Therefore, the interference fringes have the encoded information of the spatial modulator 150 and the original image information.
在本揭示內容之一實施例中,物體光束20與參考光束30之間係為同軸或離軸。需說明的是,在第1圖所示之全像儲存系統100中,物體光束20與參考光束30之間係配置為離軸之傳遞方法。此外,全像儲存系統100之物體光束20與參考光束30之間更可配置為同軸之傳遞方法,而不以上述實施例為限。In one embodiment of the present disclosure, the object beam 20 and the reference beam 30 are coaxial or off-axis. It should be noted that, in the holographic storage system 100 shown in FIG. 1, the object beam 20 and the reference beam 30 are arranged to be off-axis. In addition, the object beam 20 of the holographic storage system 100 and the reference beam 30 are more configurable to be coaxially coupled, and are not limited to the above embodiments.
第2圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100中資料庫195之參考圖案設置示意圖。在本實施例中,資料庫195可包含第一參考圖案0000~第十六參考圖案1111,其中每個參考圖案均可為2x2矩陣,並具有四個影像畫素。此外,所有參考圖案均可具有相異之影像編碼資訊。亦即,所有參考圖案中之四個影像畫素可具有不同排列組合。例如,第一參考圖案0000係具有四個黑色灰階位準之影像畫素,第十六參考圖案則具有四個白色灰階位準之影像畫素。需說明的是,上述參考圖案所對應之影像畫素的灰階位準係可依據實際操作需求而調整。以8位元灰階位準為例,黑色灰階位準可調整為20或40,而白色灰階位準則可調整為220或240,以符合實際影像亮度之需求。2 is a schematic diagram showing a reference pattern setting of a database 195 in a hologram storage system 100 in accordance with an embodiment of the present disclosure. In this embodiment, the database 195 may include a first reference pattern 0000 to a sixteenth reference pattern 1111, wherein each of the reference patterns may be a 2x2 matrix and have four image pixels. In addition, all reference patterns can have different image coding information. That is, four image pixels in all reference patterns may have different permutations and combinations. For example, the first reference pattern 0000 is an image pixel having four black gray level levels, and the sixteenth reference pattern has four white gray level image pixels. It should be noted that the gray level level of the image pixel corresponding to the reference pattern can be adjusted according to actual operation requirements. Taking the 8-bit gray level as an example, the black gray level can be adjusted to 20 or 40, and the white gray level can be adjusted to 220 or 240 to meet the actual image brightness.
在本揭示內容之一實施例中,第2圖所示之第一參考圖案0000~第十六參考圖案1111所對應之影像畫素的排列型式可為2x2之矩陣形式。此外,上述參考圖案之影像畫素更可排列成十字形、交叉形、圓形、三角形、矩形、正方形、菱形以及多邊形中之任一者,而不以上述實施例為限。In an embodiment of the present disclosure, the arrangement pattern of the image pixels corresponding to the first reference pattern 0000 to the sixteenth reference pattern 1111 shown in FIG. 2 may be a matrix form of 2×2. In addition, the image pixels of the reference pattern may be arranged in any of a cross shape, a cross shape, a circle shape, a triangle shape, a rectangle shape, a square shape, a diamond shape, and a polygon shape, and are not limited to the above embodiments.
第3A圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100中感測器180上之影像圖案示意圖。上述影像圖案可為8x8矩陣,並包含第一影像畫素301~第六十四影像畫素364。處理器190可藉由灰階權重法、結構相似定位法以及方塊中心搜尋法中之任一者搜尋上述影像畫素之定位點。舉例來說,上述8x8矩陣之影像畫素可藉由灰階權重法找出第一影像畫素301的中心點作為第一定位點。接著,依據資料庫195所建立之參考圖案的大小(例如:2x2矩陣)以選取第一影像畫素301週邊相對應範圍之第一區域圖案(由第一影像畫素301、第二影像畫素302、第九影像畫素309以及第十影像畫素所構成之2x2矩陣圖案)。需說明的是,上述區域圖案所對應之影像畫素與資料庫190所建立之參考圖案所對應之影像畫素之間的數量以及排列型式係為相同,以方便進行結構比對。此外,若區域圖案之影像畫素數量大於參考圖案之影像畫素時,則可依據實際情況放大參考圖案,以方便對區域圖案與參考圖案進行結構比對。FIG. 3A is a schematic diagram showing an image pattern on the sensor 180 in the hologram storage system 100 according to an embodiment of the present disclosure. The image pattern may be an 8×8 matrix and includes first image pixels 301 to 64th image pixels 364. The processor 190 can search for the location points of the image pixels by using any one of a gray scale weighting method, a structural similarity positioning method, and a block center search method. For example, the image pixels of the above 8×8 matrix can find the center point of the first image pixel 301 as the first anchor point by the gray scale weight method. Then, according to the size of the reference pattern (for example, 2x2 matrix) established by the database 195, the first region pattern corresponding to the corresponding range of the first image pixel 301 is selected (by the first image pixel 301, the second image pixel 302, a ninth image pixel 309 and a 2x2 matrix pattern formed by the tenth image pixel). It should be noted that the number of image pixels corresponding to the image pixels corresponding to the area pattern and the reference pixels created by the database 190 are the same as the arrangement pattern, so as to facilitate structural comparison. In addition, if the number of image pixels of the area pattern is larger than the image pixel of the reference pattern, the reference pattern may be enlarged according to actual conditions to facilitate structural comparison between the area pattern and the reference pattern.
隨後,可將第一區域圖案與資料庫195中所建立之第一參考圖案0000~第十六參考圖案1111依序進行結構相似度比對,上述區域圖案之區分方式可參照第3B圖所示。第3B圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100中感測器190上之區域圖案示意圖。由上述圖示可知,第一區域圖案係與第2圖之第九參考圖案1000具有最高相似度。然後,依序選取其他區域圖案與資料庫195中所建立之第一參考圖案0000~第十六參考圖案1111依序進行結構相似度比對。經由上述比對程序之後可將與上述區域圖案具有最高相似性之參考圖案作為基底,以取代原來的區域圖案,如第3C圖所示。第3C圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100中以具有最大相似度之參考圖案作為還原基底之示意圖。然後,對取代後的區域圖案及其構成之全幅影像圖案進行解碼,以還原原始影像。需說明的是,上述區域圖案與參考圖案所對應之影像畫素的數量以及排列型式係為可調整。例如,可將第3A圖中的第一影像畫素301~第八影像畫素308所構成之8x1長方形矩陣劃分為第一區域圖案,並依此類推將影像圖案由上而下劃分為8個長方形矩陣之區域圖案,且資料庫195中的參考圖案亦可調整成8x1長方形矩陣,以方便進行結構比對,而不以上述實施例為限。Then, the first region pattern and the first reference pattern 0000 to the sixteenth reference pattern 1111 established in the database 195 can be sequentially compared with the structural similarity. The manner of distinguishing the regional patterns can be referred to the third FIG. . FIG. 3B is a schematic diagram showing a region pattern on the sensor 190 in the hologram storage system 100 in accordance with an embodiment of the present disclosure. As can be seen from the above illustration, the first area pattern has the highest similarity to the ninth reference pattern 1000 of FIG. Then, the other region patterns are sequentially selected and the first reference pattern 0000 to the sixteenth reference pattern 1111 established in the database 195 are sequentially subjected to structural similarity comparison. The reference pattern having the highest similarity to the above-described area pattern may be used as a substrate after the above alignment process to replace the original area pattern, as shown in FIG. 3C. FIG. 3C is a schematic diagram showing a reference pattern having maximum similarity as a reduction substrate in a hologram storage system 100 according to an embodiment of the present disclosure. Then, the replaced area pattern and its constituent full-image image are decoded to restore the original image. It should be noted that the number and arrangement pattern of the image pixels corresponding to the area pattern and the reference pattern are adjustable. For example, the 8x1 rectangular matrix formed by the first image pixel 301 to the eighth image pixel 308 in FIG. 3A can be divided into the first region pattern, and the image pattern can be divided into eight by the top and bottom. The area pattern of the rectangular matrix, and the reference pattern in the database 195 can also be adjusted to an 8x1 rectangular matrix to facilitate structural comparison, and is not limited to the above embodiment.
第4圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統100之影像識別方法的流程圖,其操作步驟以一實施例並搭配參照第1圖~第3C圖進行說明。4 is a flow chart showing an image recognition method of a holistic storage system 100 according to an embodiment of the present disclosure. The operation steps are described in an embodiment with reference to FIGS. 1 to 3C.
首先,在操作步驟410中可預先設置多個參考圖案,如第2圖所示之具有2x2矩陣大小之第一參考圖案0000~第十六參考圖案1111,以建立資料庫195。接著,當對儲存媒體170進行影像資料讀取時,可藉由參考光束30入射儲存媒體170以產生繞射光束,再將繞射光束投射於感測器180上並進行轉換,以獲取相對應之影像信號,如操作步驟420所示。First, in operation step 410, a plurality of reference patterns, such as a first reference pattern 0000 to a sixteenth reference pattern 1111 having a matrix size of 2x2 as shown in FIG. 2, may be set in advance to create a database 195. Then, when the image data is read by the storage medium 170, the reference light beam 30 is incident on the storage medium 170 to generate a diffracted beam, and the diffracted beam is projected onto the sensor 180 and converted to obtain a corresponding image. The image signal is as shown in operation 420.
隨後,在操作步驟430中,可利用灰階權重法、結構相似定位法以及方塊中心搜尋法中之任一者搜尋影像信號所對應之影像圖案中的複數個定位點。例如,可藉由上述搜尋方法找到第一影像畫素310之中心作為第一定位點。Then, in operation step 430, any one of the grayscale weighting method, the structural similarity positioning method, and the block center search method may be used to search for a plurality of positioning points in the image pattern corresponding to the image signal. For example, the center of the first image pixel 310 can be found as the first anchor point by the above search method.
在操作步驟440中,可依序擷取定位點所對應之複數個區域圖案,以與資料庫中所儲存之複數個參考圖案進行結構相似度之比對。例如,可將第一影像畫素301周圍之2x2矩陣劃分為第一區域圖案(由第一影像畫素301、第二影像畫素302、第九影像畫素309以及第十影像畫素310所組成之圖案),然後,依此類推將8x8之影像圖案劃分為16個區域圖案。In operation 440, the plurality of area patterns corresponding to the positioning points may be sequentially captured to perform structural similarity comparison with the plurality of reference patterns stored in the database. For example, the 2x2 matrix around the first image pixel 301 can be divided into the first region pattern (by the first image pixel 301, the second image pixel 302, the ninth image pixel 309, and the tenth image pixel 310). The pattern is composed), and then, the 8x8 image pattern is divided into 16 area patterns.
接著,依序將上述區域圖案與資料庫195之第一參考圖案0000~第十六參考圖案1111進行結構相似度比對。上述結構相似度比對係利用下列運算方式:Next, the regional pattern is sequentially compared with the first reference pattern 0000 to the sixteenth reference pattern 1111 of the database 195 for structural similarity. The above structural similarity comparison uses the following operations:
其中x,y分別為所擷取之區域圖案以及資料庫的參考圖案,C1與C2為調整參數。Where x, y are the extracted area pattern and the reference pattern of the database, and C1 and C2 are adjustment parameters.
μx ,μy 分別為區域圖案與參考圖案之影像的平均強度(mean intensity),其公式如下:μ x , μ y are the mean intensity of the image of the area pattern and the reference pattern, respectively, and the formula is as follows:
σx ,σy 分別為區域圖案與參考圖案之影像的標準差(standard deviation),其公式如下:σ x , σ y are the standard deviations of the image of the area pattern and the reference pattern, respectively, and the formula is as follows:
σxy 則為區域圖案與參考圖案之影像的共變異數(correlation coefficient),其公式如下:σ xy is the correlation coefficient of the image of the area pattern and the reference pattern, and the formula is as follows:
由此可知,將每個區域圖案與資料庫195中的參考圖案進行上述SSIM運算之後可得到相對應之SSIM數值,此SSIM數值係與影像之亮度比對(luminance comparison)、對比比對(contrast comparison)以及結構比對(structure comparison)相關聯。當區域圖案與參考圖案具有高相似度時,SSIM數值則相對較高,以提供影像比對之依據。It can be seen that after performing the above SSIM operation on each of the area patterns and the reference pattern in the database 195, a corresponding SSIM value can be obtained, and the SSIM value is compared with the brightness comparison of the images (contrast comparison, contrast ratio (contrast) Comparison) and structure comparison are associated. When the area pattern has a high similarity to the reference pattern, the SSIM value is relatively high to provide a basis for image comparison.
其後,在操作步驟450中,選擇與區域圖案具有最高相似度之參考圖案,如第3C圖所示,以作為還原影像時的基底。Thereafter, in operation 450, a reference pattern having the highest similarity to the area pattern is selected, as shown in FIG. 3C, as a base when the image is restored.
然後,在操作步驟460中,可對第3C圖中所選擇之參考圖案1000、1011、1010、1001、...、1001進行解碼,以還原原始影像。Then, in operation 460, the reference patterns 1000, 1011, 1010, 1001, ..., 1001 selected in FIG. 3C may be decoded to restore the original image.
相較於習知作法,在本揭示內容上述實施例中,可透過與人眼識別較為接近的結構相似度比對方法,並配合區域影像的最高相似度比對而將相對應之資料庫的參考影像作為影像還原之基底,以克服影像扭曲、亮度分佈不均、光斑以及高斯雜訊,達到正確的全幅影像還原。Compared with the conventional method, in the above embodiments of the present disclosure, the structural similarity comparison method which is closer to the human eye recognition can be used, and the corresponding similarity of the regional images can be matched with the highest similarity comparison of the regional images. The reference image is used as the base of image restoration to overcome image distortion, uneven brightness distribution, spot and Gaussian noise, and achieve correct full-frame image restoration.
在本揭示內容中所提及的步驟,除特別敘明其順序者外,均可依實際需要調整其前後順序,甚至可同時或部分同時執行,而不以上述為限。The steps mentioned in the present disclosure may be adjusted according to actual needs, except for the order in which they are specifically described, and may be performed simultaneously or partially simultaneously, without being limited to the above.
雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and the present invention can be modified and modified without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the patent application attached.
100...全像儲存系統100. . . Holographic storage system
110...光源110. . . light source
120...空間濾波器120. . . Spatial filter
131~133...第一透鏡~第三透鏡131~133. . . First to third lenses
140...分光鏡140. . . Beam splitter
150...空間調製器150. . . Spatial modulator
161、162...第一反射鏡、第二反射鏡161, 162. . . First mirror, second mirror
170...儲存媒體170. . . Storage medium
180...感測器180. . . Sensor
190...處理器190. . . processor
195...資料庫195. . . database
301~364...第一影像畫素~第六十四影像畫素301~364. . . First image pixel - 64th image pixel
410~460...操作步驟410~460. . . Steps
0000~1111...第一參考圖案~第十六參考圖案0000~1111. . . First reference pattern to sixteenth reference pattern
為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下:The above and other objects, features, advantages and embodiments of the present invention will become more apparent and understood.
第1圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統之結構示意圖。1 is a schematic structural diagram of a holographic storage system in accordance with an embodiment of the present disclosure.
第2圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統中資料庫之參考圖案設置示意圖。2 is a schematic diagram showing a reference pattern setting of a database in a holographic storage system according to an embodiment of the present disclosure.
第3A圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統中感測器上之影像圖案示意圖。FIG. 3A is a schematic diagram showing an image pattern on a sensor in a holographic storage system according to an embodiment of the present disclosure.
第3B圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統中感測器上之區域圖案示意圖。FIG. 3B is a schematic diagram showing a region pattern on a sensor in a holographic storage system according to an embodiment of the present disclosure.
第3C圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統中以具有最大相似度之參考圖案作為還原基底之示意圖。FIG. 3C is a schematic diagram showing a reference pattern having the greatest similarity as a reduction substrate in a holographic storage system according to an embodiment of the present disclosure.
第4圖係繪示依照本揭示內容之一實施方式的一種全像儲存系統之影像識別方法的流程圖。4 is a flow chart showing an image recognition method of a holographic storage system in accordance with an embodiment of the present disclosure.
410~460...操作步驟410~460. . . Steps
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