TWI451560B - Electrostatic discharge protection device - Google Patents
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- 238000002955 isolation Methods 0.000 claims description 26
- 102100036285 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Human genes 0.000 description 25
- 101000875403 Homo sapiens 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Proteins 0.000 description 25
- 101100489713 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND1 gene Proteins 0.000 description 14
- 238000010586 diagram Methods 0.000 description 13
- 230000004044 response Effects 0.000 description 4
- 101100489717 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND2 gene Proteins 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910021332 silicide Inorganic materials 0.000 description 2
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
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Description
本發明是有關於一種保護裝置,且特別是有關於一種靜電放電保護裝置。 This invention relates to a protective device and, more particularly, to an electrostatic discharge protection device.
靜電放電(electrostatic discharge,ESD)為自非導電表面之靜電移動的現象,其會造成積體電路中之半導體損害。例如,在封裝積體電路的機器或測試積體電路的儀器等常見的帶電體,接觸到晶片時,將會向晶片放電,此靜電放電之瞬間功率有可能造成晶片中的積體電路損壞。 Electrostatic discharge (ESD) is a phenomenon of electrostatic movement from a non-conductive surface, which causes damage to the semiconductor in the integrated circuit. For example, a conventional charged body such as a machine that houses an integrated circuit or an instrument that tests an integrated circuit will discharge to the wafer when it contacts the wafer, and the instantaneous power of the electrostatic discharge may cause damage to the integrated circuit in the wafer.
為了防止積體電路受到外部靜電效應的影響而損壞,在積體電路中都會加入靜電放電保護裝置的設計。於矽化製程(silicide process)中,常見的靜電放電保護裝置是於N型電晶體的汲極上配置矽化物阻擋層(silicide block),以致使N型電晶體在靜電放電事件發生時具有均勻開啟的特性(uniform turn-on),進而提供較完整的放電路徑。然而,額外所設置矽化物阻擋層則會增加製程複雜度以及生產成本。 In order to prevent the integrated circuit from being damaged by the external electrostatic effect, the design of the electrostatic discharge protection device is added to the integrated circuit. In the silicide process, a common electrostatic discharge protection device is provided with a silicide block on the drain of the N-type transistor, so that the N-type transistor has a uniform opening when an electrostatic discharge event occurs. Uniform turn-on, which provides a more complete discharge path. However, the additional placement of the telluride barrier increases process complexity and production costs.
為了改善上述缺點,現有的靜電放電保護裝置大多已移除矽化物阻擋層的設置,並改用一控制電路來控制N型電晶體。然而,此種架構的靜電放電保護裝置則必須具有良好的控制電路,以適時地導通N型電晶體。此外,現有的控制電路往往容易受到雜訊的影響,進而造成靜電放電 保護裝置的誤動作。 In order to improve the above disadvantages, most of the existing electrostatic discharge protection devices have removed the arrangement of the telluride blocking layer and used a control circuit to control the N-type transistor. However, the electrostatic discharge protection device of this architecture must have a good control circuit to turn on the N-type transistor in a timely manner. In addition, existing control circuits are often susceptible to noise, which in turn causes electrostatic discharge Malfunction of the protection device.
本發明提供一種靜電放電保護裝置,其控制電路利用來自不同電源配線的兩電源電壓來控制箝制單元,進而增加靜電放電保護裝置的抗雜訊能力。 The invention provides an electrostatic discharge protection device, wherein a control circuit uses two power supply voltages from different power supply lines to control the clamping unit, thereby increasing the anti-noise capability of the electrostatic discharge protection device.
本發明提供一種靜電放電保護裝置,接收來自不同電源配線的兩電源電壓,並利用兩電源電壓操作控制電路。藉此,將可提升靜電放電保護裝置的抗雜訊能力。 The present invention provides an electrostatic discharge protection device that receives two supply voltages from different power supply wirings and operates the control circuit using two supply voltages. Thereby, the anti-noise capability of the ESD protection device can be improved.
本發明提出一種靜電放電保護裝置,包括箝制單元及控制電路。箝制單元提供由第一電源配線至第一接地配線的放電路徑。控制電路接收來自第一電源配線的第一電源電壓以及來自第二電源配線的第二電源電壓。其中,當第一電源電壓與第二電源電壓被供應時,控制電路產生隔離訊號,以切斷放電路徑。此外,當第一電源電壓與第二電源電壓不被供應時,控制電路利用來自第一電源配線的靜電訊號產生觸發訊號,以導通放電路徑。 The invention provides an electrostatic discharge protection device comprising a clamping unit and a control circuit. The clamping unit provides a discharge path from the first power wiring to the first ground wiring. The control circuit receives the first power supply voltage from the first power supply wiring and the second power supply voltage from the second power supply wiring. Wherein, when the first power voltage and the second power voltage are supplied, the control circuit generates an isolation signal to cut off the discharge path. In addition, when the first power voltage and the second power voltage are not supplied, the control circuit generates a trigger signal by using an electrostatic signal from the first power wiring to turn on the discharge path.
在本發明之一實施例中,上述之控制電路包括觸發單元及閂鎖單元。觸發單元電性連接第一電源配線、第二電源電壓與第一接地配線。此外,觸發單元依據第一電源電壓與第二電源電壓產生第一控制訊號,並依據靜電訊號產生一第二控制訊號。閂鎖單元電性連接第一電源配線與第一接地配線。此外,閂鎖單元依據第一控制訊號產生隔離訊號,且閂鎖單元依據第二控制訊號產生觸發訊號。 In an embodiment of the invention, the control circuit includes a trigger unit and a latch unit. The trigger unit is electrically connected to the first power wiring, the second power voltage, and the first ground wiring. In addition, the trigger unit generates a first control signal according to the first power voltage and the second power voltage, and generates a second control signal according to the static signal. The latch unit is electrically connected to the first power wiring and the first ground wiring. In addition, the latch unit generates the isolation signal according to the first control signal, and the latch unit generates the trigger signal according to the second control signal.
在本發明之一實施例中,上述之觸發單元包括第一P型電晶體、電阻及第一反相器。第一P型電晶體之源極電性連接第一電源配線,第一P型電晶體的閘極電性連接第二電源配線。電阻之第一端電性連接第一P型電晶體之汲極,電阻之第二端電性連接第一接地配線。第一反相器之輸入端電性連接電阻之第一端,第一反相器之輸出端輸出第一控制訊號或第二控制訊號。 In an embodiment of the invention, the trigger unit includes a first P-type transistor, a resistor, and a first inverter. The source of the first P-type transistor is electrically connected to the first power supply wiring, and the gate of the first P-type transistor is electrically connected to the second power supply wiring. The first end of the resistor is electrically connected to the drain of the first P-type transistor, and the second end of the resistor is electrically connected to the first ground wiring. The input end of the first inverter is electrically connected to the first end of the resistor, and the output end of the first inverter outputs the first control signal or the second control signal.
在本發明之一實施例中,上述之閂鎖單元包括第二P型電晶體、第二反相器以及第一N型電晶體。第二P型電晶體之源極電性連接第二電源配線,第二P型電晶體之汲極產生隔離訊號或觸發訊號。第二反相器之輸入端電性連接第二P型電晶體之汲極,第二反相器之輸出端電性連接第二P型電晶體之閘極。第一N型電晶體之源極電性連接第一接地配線,第一N型電晶體之汲極電性連接第二P型電晶體之汲極,第一N型電晶體之閘極接收第一控制訊號或第二控制訊號。 In an embodiment of the invention, the latch unit includes a second P-type transistor, a second inverter, and a first N-type transistor. The source of the second P-type transistor is electrically connected to the second power supply wiring, and the drain of the second P-type transistor generates an isolation signal or a trigger signal. The input end of the second inverter is electrically connected to the drain of the second P-type transistor, and the output end of the second inverter is electrically connected to the gate of the second P-type transistor. The source of the first N-type transistor is electrically connected to the first ground wiring, the drain of the first N-type transistor is electrically connected to the drain of the second P-type transistor, and the gate of the first N-type transistor is received. A control signal or a second control signal.
本發明提出一種靜電放電保護裝置,包括控制電路及箝制單元。控制電路電性連接第一電源配線、第二電源配線與第一接地配線。箝制單元提供由第一電源配線至第一接地配線的放電路徑。其中,當第一電源電壓與第二電源電壓分別被供應至第一電源配線與第二電源配線時,控制電路產生隔離訊號,以切斷放電路徑。此外,當第一電源電壓與第二電源電壓不被供應時,控制電路利用來自第一電源配線的靜電訊號產生觸發訊號,以導通放電路徑。 The invention provides an electrostatic discharge protection device comprising a control circuit and a clamping unit. The control circuit electrically connects the first power wiring, the second power wiring, and the first ground wiring. The clamping unit provides a discharge path from the first power wiring to the first ground wiring. Wherein, when the first power voltage and the second power voltage are respectively supplied to the first power wiring and the second power wiring, the control circuit generates an isolation signal to cut off the discharge path. In addition, when the first power voltage and the second power voltage are not supplied, the control circuit generates a trigger signal by using an electrostatic signal from the first power wiring to turn on the discharge path.
基於上述,本發明提出一種靜電放電保護裝置,其控制電路利用來自不同電源配線的兩電源電壓來控制箝制單元。藉此,當第一電源電壓與第二電源電壓被供應時,受控於兩電源電壓的控制電路將不會輕易地受到雜訊的影響,進而增加靜電放電保護裝置的抗雜訊能力。 Based on the above, the present invention proposes an electrostatic discharge protection device whose control circuit controls the clamping unit using two power supply voltages from different power supply wirings. Thereby, when the first power voltage and the second power voltage are supplied, the control circuit controlled by the two power voltages will not be easily affected by the noise, thereby increasing the anti-noise capability of the electrostatic discharge protection device.
為讓本發明之上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 The above described features and advantages of the present invention will be more apparent from the following description.
在以下說明中,為呈現對本發明之說明的一貫性,故在不同的實施例中,若有功能與結構相同或相似的元件會用相同的元件符號與名稱。 In the following description, in order to present the consistency of the description of the present invention, in the different embodiments, the same element symbols and names are used for the same or similar elements.
圖1為依據本發明之第一實施例之靜電放電保護裝置的方塊示意圖。請參照圖1,靜電放電保護裝置100包括控制電路110以及箝制單元120。控制電路110電性連接電源配線131、電源配線133與接地配線135。此外,控制電路110用以接收來自電源配線131的電源電壓VDD1、來自電源配線133的電源電壓VDD2以及來自接地配線135的接地電壓GND1。箝制單元120電性連接在電源配線131與接地配線135之間,並用以提供由電源配線131至接地配線135的放電路徑。 1 is a block diagram showing an electrostatic discharge protection device according to a first embodiment of the present invention. Referring to FIG. 1 , the electrostatic discharge protection device 100 includes a control circuit 110 and a clamping unit 120 . The control circuit 110 is electrically connected to the power supply wiring 131, the power supply wiring 133, and the ground wiring 135. Further, the control circuit 110 is for receiving the power supply voltage VDD1 from the power supply line 131, the power supply voltage VDD2 from the power supply line 133, and the ground voltage GND1 from the ground line 135. The clamping unit 120 is electrically connected between the power supply wiring 131 and the ground wiring 135 and is used to provide a discharge path from the power supply wiring 131 to the ground wiring 135.
在實際應用方面,當電源電壓VDD1及電源電壓VDD2被供應時,控制單元110會產生隔離訊號IS至箝制 單元120的控制端,以使得箝制單元120切斷放電路徑。相對地,當電源電壓VDD1及電源電壓VDD2不被供應時,靜電放電事件可能會發生於電源配線131。為了因應此情況,當靜電放電事件發生時,靜電訊號將從電源配線131耦合至控制單元110,且控制單元110將利用靜電訊號產生觸發訊號TS,並傳送靜電訊號至箝制單元120的控制端,以使得箝制單元120導通放電路徑。 In practical applications, when the power supply voltage VDD1 and the power supply voltage VDD2 are supplied, the control unit 110 generates an isolation signal IS to clamp The control end of unit 120 is such that clamp unit 120 cuts off the discharge path. In contrast, when the power supply voltage VDD1 and the power supply voltage VDD2 are not supplied, an electrostatic discharge event may occur in the power supply wiring 131. In response to this situation, when an electrostatic discharge event occurs, the electrostatic signal will be coupled from the power supply wiring 131 to the control unit 110, and the control unit 110 will generate the trigger signal TS by using the electrostatic signal, and transmit the electrostatic signal to the control end of the clamping unit 120. So that the clamping unit 120 turns on the discharge path.
為了致使本領域具有通常知識者能更加了解本發明的第一實施例,圖2為依據本發明之第一實施例之靜電放電保護裝置的電路示意圖,以下請參照圖2來看控制電路110以及箝制單元120的細部電路與運作。 FIG. 2 is a schematic circuit diagram of an electrostatic discharge protection device according to a first embodiment of the present invention. FIG. 2 is a schematic diagram of a circuit of the electrostatic discharge protection device according to the first embodiment of the present invention. The detailed circuit and operation of the clamping unit 120.
控制單元110包括觸發單元210與閂鎖單元240。其中,觸發單元210電性連接電源配線131、電源配線133以及接地配線135,並且觸發單元210包括P型電晶體MP1、電阻R1以及反相器211。在電性連接上,P型電晶體MP1之源極電性連接電源配線131,並且P型電晶體MP1之閘極電性連接電源配線133。電阻R1的第一端電性連接P型電晶體MP1之汲極,電阻R1的第二端電性連接接地配線135。反相器211具有輸入端、輸出端、電源端及接地端。反相器211的輸入端電性連接電阻R1的第一端,反相器211的電源端電性連接電源配線131以接收電源電壓VDD1,反相器211的接地端電性連接至接地配線135以接收接地電壓GND1,並且反相器211的輸出端用以輸出控制訊號CS1或是控制訊號CS2。 The control unit 110 includes a trigger unit 210 and a latch unit 240. The trigger unit 210 is electrically connected to the power supply wiring 131, the power supply wiring 133, and the ground wiring 135, and the trigger unit 210 includes a P-type transistor MP1, a resistor R1, and an inverter 211. In the electrical connection, the source of the P-type transistor MP1 is electrically connected to the power supply wiring 131, and the gate of the P-type transistor MP1 is electrically connected to the power supply wiring 133. The first end of the resistor R1 is electrically connected to the drain of the P-type transistor MP1, and the second end of the resistor R1 is electrically connected to the ground wiring 135. The inverter 211 has an input terminal, an output terminal, a power supply terminal, and a ground terminal. The input end of the inverter 211 is electrically connected to the first end of the resistor R1, the power end of the inverter 211 is electrically connected to the power supply line 131 to receive the power supply voltage VDD1, and the ground end of the inverter 211 is electrically connected to the ground line 135. The ground voltage GND1 is received, and the output of the inverter 211 is used to output the control signal CS1 or the control signal CS2.
在整體操作上,當電源電壓VDD1與VDD2分別被提供至電源配線131與133時,P型電晶體MP1之閘極將接收到電源電壓VDD2,進而致使P型電晶體MP1截止。並且,由於電阻R1之第二端電性連接至接地配線135,因此接地電壓GND1將透過電阻R1傳遞至反相器211之輸入端。藉此,操作在電源電壓VDD1與接地電壓GND1之間的反相器211,將響應於所接收的接地電壓GND1,而據以產生具有高電壓準位的控制訊號CS1,例如:電源電壓VDD1。 In the overall operation, when the power supply voltages VDD1 and VDD2 are supplied to the power supply wirings 131 and 133, respectively, the gate of the P-type transistor MP1 will receive the power supply voltage VDD2, thereby causing the P-type transistor MP1 to be turned off. Moreover, since the second end of the resistor R1 is electrically connected to the ground wiring 135, the ground voltage GND1 is transmitted to the input terminal of the inverter 211 through the resistor R1. Thereby, the inverter 211 operating between the power supply voltage VDD1 and the ground voltage GND1 will generate a control signal CS1 having a high voltage level, for example, the power supply voltage VDD1 in response to the received ground voltage GND1.
附帶一提,為了確保P型電晶體MP1偏壓在電源電壓VDD1與VDD2時能維持在截止的狀態,因此電源電壓VDD1必須小於或是等於電源電壓VDD2。在實際應用上,靜電放電保護裝置100可例如是應用在快閃記憶體(flash memory)裝置中。此時,快閃記憶體裝置所需的兩電源電壓VDD1與VDD2為電壓值相等的兩電壓,因此可致使控制單元110維持正常的運作。換言之,只要電源電壓符合上述條件的電子電路皆是靜電放電保護裝置100可應用的範圍。 Incidentally, in order to ensure that the P-type transistor MP1 bias is maintained in the off state at the power supply voltages VDD1 and VDD2, the power supply voltage VDD1 must be less than or equal to the power supply voltage VDD2. In practical applications, the electrostatic discharge protection device 100 can be applied, for example, to a flash memory device. At this time, the two power supply voltages VDD1 and VDD2 required by the flash memory device are two voltages having the same voltage value, and thus the control unit 110 can be maintained in normal operation. In other words, the electronic circuit as long as the power supply voltage meets the above conditions is a range in which the electrostatic discharge protection device 100 can be applied.
當電源電壓VDD1與VDD2不被供應時,電源配線133為浮接(floating)狀態,故此時P型電晶體MP1之閘極的電壓將趨近於接地電壓。此時,倘若靜電放電事件發生於電源配線131時,來自電源配線131的靜電訊號(例如:正脈衝訊號)將導致P型電晶體MP1導通。藉此,靜電訊號將透過P型電晶體MP1傳遞至反相器211的輸入端,進 而致使反相器211產生具有低電壓準位的控制訊號CS2,例如:接地電壓GND1。 When the power supply voltages VDD1 and VDD2 are not supplied, the power supply wiring 133 is in a floating state, so that the voltage of the gate of the P-type transistor MP1 will approach the ground voltage. At this time, if an electrostatic discharge event occurs in the power supply wiring 131, an electrostatic signal (for example, a positive pulse signal) from the power supply wiring 131 causes the P-type transistor MP1 to be turned on. Thereby, the electrostatic signal will be transmitted to the input end of the inverter 211 through the P-type transistor MP1. The inverter 211 is caused to generate a control signal CS2 having a low voltage level, for example, a ground voltage GND1.
閂鎖單元240包括P型電晶體MP2、反相器213以及N型電晶體MN1。其中,N型電晶體MN1之源極電性連接至接地配線135,N型電晶體MN1之汲極電性連接P型電晶體MP2之汲極,並且N型電晶體MN1之閘極用以接收控制訊號CS1或是控制訊號CS2。反相器213具有輸入端、輸出端、電源端及接地端。反相器213之輸入端電性連接P型電晶體MP2之汲極,反相器213的電源端電性連接電源配線131以接收電源電壓VDD1,反相器213的接地端電性連接至接地配線135以接收接地電壓GND1,並且反相器213之輸出端電性連接P型電晶體MP2之閘極。P型電晶體MP2之源極電性連接電源配線131,並且P型電晶體MP2之汲極用以產生隔離訊號IS或觸發訊號TS。 The latch unit 240 includes a P-type transistor MP2, an inverter 213, and an N-type transistor MN1. Wherein, the source of the N-type transistor MN1 is electrically connected to the ground wiring 135, the drain of the N-type transistor MN1 is electrically connected to the drain of the P-type transistor MP2, and the gate of the N-type transistor MN1 is used for receiving Control signal CS1 or control signal CS2. The inverter 213 has an input terminal, an output terminal, a power supply terminal, and a ground terminal. The input end of the inverter 213 is electrically connected to the drain of the P-type transistor MP2, the power terminal of the inverter 213 is electrically connected to the power supply line 131 to receive the power supply voltage VDD1, and the ground end of the inverter 213 is electrically connected to the ground. The wiring 135 receives the ground voltage GND1, and the output end of the inverter 213 is electrically connected to the gate of the P-type transistor MP2. The source of the P-type transistor MP2 is electrically connected to the power supply wiring 131, and the drain of the P-type transistor MP2 is used to generate the isolation signal IS or the trigger signal TS.
當電源電壓VDD1與VDD2分別供應至電源配線131以及電源配線133時,N型電晶體MN1將接收到具有高電壓準位的控制訊號CS1,進而使得N型電晶體MN1導通。藉此,N型電晶體MN1的汲極將產生具有低電壓準位的隔離訊號IS,例如:接地電壓GND1。另一方面,接地電壓GND1將從接地配線135傳遞至反相器213之輸入端。藉此,操作在電源電壓VDD1與接地電壓GND1之間的反相器213,將響應於所接收的接地電壓GND1,而據以產生具有高電壓準位的訊號(例如:電源電壓VDD1)至P型電晶體MP2之閘極,進而致使P型電晶體MP2進入不 導通的狀態。 When the power supply voltages VDD1 and VDD2 are respectively supplied to the power supply wiring 131 and the power supply wiring 133, the N-type transistor MN1 receives the control signal CS1 having a high voltage level, thereby turning on the N-type transistor MN1. Thereby, the drain of the N-type transistor MN1 will generate an isolation signal IS having a low voltage level, for example, the ground voltage GND1. On the other hand, the ground voltage GND1 is transmitted from the ground wiring 135 to the input terminal of the inverter 213. Thereby, the inverter 213 operating between the power supply voltage VDD1 and the ground voltage GND1 will generate a signal having a high voltage level (for example, the power supply voltage VDD1) to the P in response to the received ground voltage GND1. The gate of the transistor MP2, which in turn causes the P-type transistor MP2 to enter The state of conduction.
當電源電壓VDD1與VDD2不被供應,且靜電放電事件發生於電源配線131時,觸發單元210將產生具有低電壓準位的控制訊號CS2。此時,N型電晶體MN1之閘極將接收到具有低電壓準位的控制訊號CS2,而致使N型電晶體MN1截止。此外,來自電源配線131的靜電訊號(例如正脈衝訊號)將耦合至N型電晶體MN1的汲極。藉此,N型電晶體MN1的汲極將產生具有高電壓準位的觸發訊號TS。另一方面,反相器213的輸入端電性連接N型電晶體MN1的汲極,因此來自電源配線131的靜電訊號(例如正脈衝訊號)也將耦合至反相器213之輸入端。藉此,反相器213將可透過P型電晶體MP2自動閂鎖住位在N型電晶體MN1之汲極的準位。亦即,反相器213將產生具有低電壓準位的訊號至P型電晶體MP2之閘極,進而致使P型電晶體MP2閂鎖在導通的狀態。 When the power supply voltages VDD1 and VDD2 are not supplied, and an electrostatic discharge event occurs in the power supply wiring 131, the trigger unit 210 will generate a control signal CS2 having a low voltage level. At this time, the gate of the N-type transistor MN1 will receive the control signal CS2 having a low voltage level, causing the N-type transistor MN1 to be turned off. In addition, an electrostatic signal (eg, a positive pulse signal) from the power supply line 131 will be coupled to the drain of the N-type transistor MN1. Thereby, the drain of the N-type transistor MN1 will generate a trigger signal TS having a high voltage level. On the other hand, the input terminal of the inverter 213 is electrically connected to the drain of the N-type transistor MN1, so an electrostatic signal (for example, a positive pulse signal) from the power supply line 131 is also coupled to the input terminal of the inverter 213. Thereby, the inverter 213 automatically latches the position of the drain of the N-type transistor MN1 through the P-type transistor MP2. That is, the inverter 213 will generate a signal having a low voltage level to the gate of the P-type transistor MP2, thereby causing the P-type transistor MP2 to be latched in an on state.
箝制單元120包括N型電晶體MN2。其中N型電晶體MN2的源極電性連接接地配線135,N型電晶體MN2的汲極電性連接電源配線131,並且N型電晶體MN2的閘極接收隔離訊號IS或觸發訊號TS。在操作上,當電源電壓VDD1與VDD2被供應時,N型電晶體MN2將接收隔離訊號IS。由於隔離訊號IS的電壓準位為接地電壓GND1,故使得N型電晶體MN2截止。此時,電源配線131至接地配線135的放電路徑將被切斷,進而防止電源電壓VDD1漏電至接地配線135。 The clamping unit 120 includes an N-type transistor MN2. The source of the N-type transistor MN2 is electrically connected to the ground wiring 135, the drain of the N-type transistor MN2 is electrically connected to the power supply wiring 131, and the gate of the N-type transistor MN2 receives the isolation signal IS or the trigger signal TS. In operation, when the supply voltages VDD1 and VDD2 are supplied, the N-type transistor MN2 will receive the isolation signal IS. Since the voltage level of the isolation signal IS is the ground voltage GND1, the N-type transistor MN2 is turned off. At this time, the discharge path of the power supply wiring 131 to the ground wiring 135 is cut off, thereby preventing the power supply voltage VDD1 from leaking to the ground wiring 135.
當電源電壓VDD1與VDD2不被供應,且靜電放電事件發生於電源配線131時,N型電晶體MN2將對應地接收觸發訊號TS。由於觸發訊號TS之電壓準位為高電壓準位,故使得N型電晶體MN2導通。藉此,靜電訊號將經由N型電晶體MN2導引至接地配線135,進而使得被保護的電路不受到靜電訊號之影響。 When the power supply voltages VDD1 and VDD2 are not supplied, and an electrostatic discharge event occurs in the power supply wiring 131, the N-type transistor MN2 will correspondingly receive the trigger signal TS. Since the voltage level of the trigger signal TS is at a high voltage level, the N-type transistor MN2 is turned on. Thereby, the electrostatic signal will be guided to the ground wiring 135 via the N-type transistor MN2, so that the protected circuit is not affected by the electrostatic signal.
如上所述,當電源配線131上發生靜電放電事件時,箝制單元120將導通放電路徑,進而致使被保護之電路不受到靜電訊號的影響。另一方面,在一般操作下,由於P型電晶體MP1是在兩電源電壓VDD1與VDD2的控制下而被切換至不導通的狀態,因此控制電路110將不容易受到電源配線131與133上之雜訊的影響。 As described above, when an electrostatic discharge event occurs on the power supply wiring 131, the clamping unit 120 turns on the discharge path, thereby causing the protected circuit to be unaffected by the electrostatic signal. On the other hand, under normal operation, since the P-type transistor MP1 is switched to a non-conducting state under the control of the two power supply voltages VDD1 and VDD2, the control circuit 110 will not be easily received by the power supply wirings 131 and 133. The impact of noise.
舉例來說,圖3A至圖3E分別為依據本發明之第一實施例之模擬波形圖,其中圖式中的橫軸代表時間(單位為奈米秒,ns),並且其縱軸代表電壓(單位為伏特,V)。如圖3A之左半邊的波形圖所示,當靜電放電事件發生於電源配線131時,電源配線131上將出現正脈衝訊號PS,且控制電路110將產生電壓位準如同正脈衝訊號PS的觸發訊號TS,進而致使箝制單元120導通放電路徑。再者,如圖3A之右半邊的波形圖所示,而在一般操作下,電源電壓VDD1及電源電壓VDD2皆為約3.6V,且控制電路110將產生具有低電壓準位的隔離訊號IS,例如0V,以致使箝制單元120切斷放電路徑。 For example, FIGS. 3A to 3E are respectively analog waveform diagrams according to the first embodiment of the present invention, wherein the horizontal axis in the graph represents time (in nanoseconds, ns), and the vertical axis represents voltage ( The unit is volt, V). As shown in the waveform diagram of the left half of FIG. 3A, when an electrostatic discharge event occurs on the power supply wiring 131, a positive pulse signal PS will appear on the power supply wiring 131, and the control circuit 110 will generate a voltage level as a trigger of the positive pulse signal PS. The signal TS, in turn, causes the clamping unit 120 to conduct a discharge path. Moreover, as shown in the waveform diagram of the right half of FIG. 3A, under normal operation, the power supply voltage VDD1 and the power supply voltage VDD2 are both about 3.6V, and the control circuit 110 will generate the isolation signal IS having a low voltage level. For example, 0 V, so that the clamping unit 120 cuts off the discharge path.
如圖3B所示,在一般操作下,當電源配線133上出 現雜訊時,亦即當電源電壓VDD2從3.6V短暫地下拉至0V時,隔離訊號IS只會短暫地從0V下拉至-0.5V。如此一來,此時的箝制單元120仍然是維持在截止的狀態。另一方面,如圖3C所示,當電源配線133上所出現的雜訊為正突波時,亦即當電源電壓VDD2短暫地上拉至10V時,隔離訊號IS的準位幾乎是沒有變動。也就是說,此時的箝制單元120仍然也是維持在截止的狀態。 As shown in FIG. 3B, under normal operation, when the power supply wiring 133 is turned on In the current noise, when the power supply voltage VDD2 is briefly pulled down from 3.6V to 0V, the isolation signal IS will only briefly pull down from 0V to -0.5V. As a result, the clamping unit 120 at this time is still maintained in the cut-off state. On the other hand, as shown in FIG. 3C, when the noise appearing on the power supply wiring 133 is a positive glitch, that is, when the power supply voltage VDD2 is briefly pulled up to 10 V, the level of the isolation signal IS is almost unchanged. That is to say, the clamping unit 120 at this time is still maintained in the cut-off state.
如圖3D所示,在如上所述的操作下,若於電源配線131上模擬發生雜訊,使得電源電壓VDD1由3.6V短暫地下拉至0V,則隔離訊號IS也只會從0V短暫地下拉至-0.25V。如此一來,此時的箝制單元120仍然是維持在截止的狀態。再者,如圖3E所示,若於電源配線131上模擬發生雜訊,使得電源電壓VDD1從3.6V短暫地上拉至10V時,則箝制單元120所接收之隔離訊號IS只會從0V短暫地上拉至1.5V,且箝制單元120依舊是維持在截止的狀態。 As shown in FIG. 3D, under the above operation, if noise is simulated on the power supply wiring 131, so that the power supply voltage VDD1 is briefly pulled down from 3.6V to 0V, the isolation signal IS will only briefly pull down from 0V. To -0.25V. As a result, the clamping unit 120 at this time is still maintained in the cut-off state. Furthermore, as shown in FIG. 3E, if noise is simulated on the power supply wiring 131, so that the power supply voltage VDD1 is briefly pulled up from 3.6V to 10V, the isolation signal IS received by the clamping unit 120 will only briefly elapse from 0V. Pulled to 1.5V, and the clamping unit 120 is still maintained in the off state.
圖4為本發明之第二實施例之靜電放電保護裝置的電路示意圖。請參照圖4,本實施例與第一實施例大致相同,且圖4中相同或相似的元件標號代表相同或相似的元件,本實施例中便不再贅述。 4 is a circuit diagram of an electrostatic discharge protection device according to a second embodiment of the present invention. Referring to FIG. 4, the present embodiment is substantially the same as the first embodiment, and the same or similar component numbers in FIG. 4 denote the same or similar components, and will not be described again in this embodiment.
本實施例與第一實施例主要的不同之處在於:本實施例更包括N型電晶體MN3、二極體D1及二極體D2。其中,N型電晶體MN3之源極電性連接至接地配線135,N 型電晶體MN3之汲極電性連接電源配線133,並且N型電晶體之閘極接收隔離訊號IS或觸發訊號TS。二極體D1之陽極電性連接電源配線131,並且二極體D1的陰極電性連接電源配線133。二極體D2之陽極電性連接電源配線133,並且二極體D2之陰體電性連接電源配線131。 The main difference between this embodiment and the first embodiment is that the embodiment further includes an N-type transistor MN3, a diode D1, and a diode D2. Wherein, the source of the N-type transistor MN3 is electrically connected to the ground wiring 135, N The drain of the type transistor MN3 is electrically connected to the power supply wiring 133, and the gate of the N-type transistor receives the isolation signal IS or the trigger signal TS. The anode of the diode D1 is electrically connected to the power supply wiring 131, and the cathode of the diode D1 is electrically connected to the power supply wiring 133. The anode of the diode D2 is electrically connected to the power supply wiring 133, and the female body of the diode D2 is electrically connected to the power supply wiring 131.
為了致使靜電訊號可以在電源配線131、電源配線133以及接地配線135之間相互流通,因此本實施例在兩電源配線131與133之間串接二極體D1與二極體D2。此外,當電源配線131上發生靜電放電事件時,具有高電壓準位的觸發訊號TS將傳送至N型電晶體MN3的閘極,進而導通N型電晶體MN3。再者,隨著N型電晶體MN3的導通,電源配線133與接地配線135之間將可形成一電流迴路,進而致使二極體D1可以因應來自電源配線131的靜電訊號而導通。如此一來,二極體D1所形成的電壓差將可確保P型電晶體MP1維持在導通的狀態,進而致使觸發單元210可以正常地產生具有低電壓準位的控制訊號CS2。 In order to cause the electrostatic signals to flow between the power supply wiring 131, the power supply wiring 133, and the ground wiring 135, the diode D1 and the diode D2 are connected in series between the two power supply wirings 131 and 133. In addition, when an electrostatic discharge event occurs on the power supply wiring 131, the trigger signal TS having a high voltage level is transmitted to the gate of the N-type transistor MN3, thereby turning on the N-type transistor MN3. Furthermore, as the N-type transistor MN3 is turned on, a current loop can be formed between the power supply wiring 133 and the ground wiring 135, thereby causing the diode D1 to be turned on in response to the electrostatic signal from the power supply wiring 131. As a result, the voltage difference formed by the diode D1 can ensure that the P-type transistor MP1 is maintained in an on state, thereby causing the trigger unit 210 to normally generate the control signal CS2 having a low voltage level.
圖5為本發明之第三實施例之靜電放電保護裝置的電路示意圖。請參照圖5,本實施例與第二實施例大致相同,且圖5中相同或相似的元件標號代表相同或相似的元件,本實施例中便不再贅述。 Fig. 5 is a circuit diagram showing an electrostatic discharge protection device according to a third embodiment of the present invention. Referring to FIG. 5, the present embodiment is substantially the same as the second embodiment, and the same or similar components in FIG. 5 denote the same or similar components, and will not be described again in this embodiment.
本實施例與第二實施例主要的不同之處在於:本實施例更包括接地配線137、二極體D3及二極體D4。其中,接地配線137用以接收接地電壓GND2。二極體D3之陽 極電性連接至接地配線135,並且二極體D3之陰極電性連接至接地配線137。此外,二極體D4之陽極電性連接至接地配線137,並且二極體D4之陰極電性連接至接地配線135。靜電放電保護裝置500具有接地配線135及137,並將二極體D3及D4串接於接地配線135及137之間,以致使靜電電流的流動路徑更加完整。 The main difference between this embodiment and the second embodiment is that the embodiment further includes a grounding wire 137, a diode D3, and a diode D4. The grounding wire 137 is configured to receive the ground voltage GND2. The anode of the diode D3 The pole is electrically connected to the ground wiring 135, and the cathode of the diode D3 is electrically connected to the ground wiring 137. In addition, the anode of the diode D4 is electrically connected to the ground wiring 137, and the cathode of the diode D4 is electrically connected to the ground wiring 135. The ESD protection device 500 has ground wirings 135 and 137, and the diodes D3 and D4 are connected in series between the ground wirings 135 and 137 to make the flow path of the electrostatic current more complete.
綜上所述,本發明提出一種靜電放電保護裝置,其控制電路利用來自不同電源配線的兩電源電壓來控制箝制單元。其中,在靜電發生時,控制電路導通箝制單元中的放電路徑。此外,在一般操作下,控制電路切斷箝制單元中的放電路徑,且由於此時的控制電路受控於兩電源電壓,故不會輕易受到雜訊的影響。此外,本發明更在不同的電源配線以及不同的接地配線之間配置二極體,以致使靜電電流的流動路徑更加完整。 In summary, the present invention provides an electrostatic discharge protection device whose control circuit utilizes two supply voltages from different power supply wirings to control the clamping unit. Wherein, when static electricity occurs, the control circuit turns on the discharge path in the clamping unit. In addition, under normal operation, the control circuit cuts off the discharge path in the clamp unit, and since the control circuit at this time is controlled by the two power supply voltages, it is not easily affected by noise. In addition, the present invention further configures the diode between different power supply wirings and different ground wirings to make the flow path of the electrostatic current more complete.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.
100、400、500‧‧‧靜電放電保護裝置 100, 400, 500‧‧‧ Electrostatic discharge protection device
110‧‧‧控制電路 110‧‧‧Control circuit
120‧‧‧箝制單元 120‧‧‧Clamping unit
131、133‧‧‧電源配線 131, 133‧‧‧Power wiring
135、137‧‧‧接地配線 135, 137‧‧‧ Grounding Wiring
VDD1、VDD2‧‧‧電源電壓 VDD1, VDD2‧‧‧ power supply voltage
GND1、GND2‧‧‧接地電壓 GND1, GND2‧‧‧ Grounding voltage
210‧‧‧觸發單元 210‧‧‧Trigger unit
240‧‧‧閂鎖單元 240‧‧‧Latch unit
211、213‧‧‧反相器 211, 213‧‧ ‧ inverter
MP1、MP2‧‧‧P型電晶體 MP1, MP2‧‧‧P type transistor
MN1、MN2、MN3‧‧‧N型電晶體 MN1, MN2, MN3‧‧‧N type transistor
R1‧‧‧電阻 R1‧‧‧ resistance
CS1、CS2‧‧‧控制訊號 CS1, CS2‧‧‧ control signals
IS‧‧‧隔離訊號 IS‧‧‧Isolation signal
TS‧‧‧觸發訊號 TS‧‧‧ trigger signal
PS‧‧‧正脈衝訊號 PS‧‧‧ Positive Pulse Signal
D1、D2、D3、D4‧‧‧二極體 D1, D2, D3, D4‧‧‧ diodes
圖1為依據本發明之第一實施例之靜電放電保護裝置的方塊示意圖。 1 is a block diagram showing an electrostatic discharge protection device according to a first embodiment of the present invention.
圖2為依據本發明之第一實施例之靜電放電保護裝置的電路示意圖。 2 is a circuit diagram of an electrostatic discharge protection device according to a first embodiment of the present invention.
圖3A至圖3E分別為依據本發明之第一實施利之模擬波形圖。 3A to 3E are respectively analog waveform diagrams according to a first embodiment of the present invention.
圖4為本發明之第二實施例之靜電放電保護裝置的電路示意圖。 4 is a circuit diagram of an electrostatic discharge protection device according to a second embodiment of the present invention.
圖5為本發明之第三實施例之靜電放電保護裝置的電路示意圖。 Fig. 5 is a circuit diagram showing an electrostatic discharge protection device according to a third embodiment of the present invention.
100‧‧‧靜電放電保護裝置 100‧‧‧Electrostatic discharge protection device
110‧‧‧控制電路 110‧‧‧Control circuit
120‧‧‧箝制單元 120‧‧‧Clamping unit
131、133‧‧‧電源配線 131, 133‧‧‧Power wiring
135‧‧‧接地配線 135‧‧‧ Grounding Wiring
VDD1、VDD2‧‧‧電源電壓 VDD1, VDD2‧‧‧ power supply voltage
GND1‧‧‧接地電壓 GND1‧‧‧ Grounding voltage
IS‧‧‧隔離訊號 IS‧‧‧Isolation signal
TS‧‧‧觸發訊號 TS‧‧‧ trigger signal
Claims (12)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100146145A TWI451560B (en) | 2011-12-14 | 2011-12-14 | Electrostatic discharge protection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100146145A TWI451560B (en) | 2011-12-14 | 2011-12-14 | Electrostatic discharge protection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201324741A TW201324741A (en) | 2013-06-16 |
| TWI451560B true TWI451560B (en) | 2014-09-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100146145A TWI451560B (en) | 2011-12-14 | 2011-12-14 | Electrostatic discharge protection device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI451560B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI710193B (en) * | 2019-05-07 | 2020-11-11 | 旺宏電子股份有限公司 | Control circuit for esd circuit |
| CN112764448B (en) * | 2019-11-05 | 2022-05-24 | 台达电子工业股份有限公司 | Over-temperature compensation control circuit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7027275B2 (en) * | 2003-01-10 | 2006-04-11 | Texas Instruments Incorporated | Electrostatic discharge protection circuit with feedback enhanced triggering |
| US20070247772A1 (en) * | 2006-04-21 | 2007-10-25 | Sarnoff Corporation | Esd clamp control by detection of power state |
-
2011
- 2011-12-14 TW TW100146145A patent/TWI451560B/en active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7027275B2 (en) * | 2003-01-10 | 2006-04-11 | Texas Instruments Incorporated | Electrostatic discharge protection circuit with feedback enhanced triggering |
| US20070247772A1 (en) * | 2006-04-21 | 2007-10-25 | Sarnoff Corporation | Esd clamp control by detection of power state |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201324741A (en) | 2013-06-16 |
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