TWI309779B - Testing system and testing method for link control card - Google Patents

Description

1309779 IX. Description of the Invention: [Technical Field] The present invention relates to a link control card test system and method. [Prior Art] With the development of information technology, disk arrays are increasingly used in enterprise systems. It started as a simple external storage device for a host or server. It is mainly used to extend the permanent SCSI (Small Computer System Interface) or other interface directly to the host. Phase s; later with the development of fiber-optic technology, the disk array is connected to the (sa annel) through the fiber channel interface. - The top-of-rack Fibre Channel storage device usually consists of two link control cards and an intermediate disk array. And electricity, in the light_channel storage device 7, = into the disk array read and write test, record • test • gentry, two L through the way to complete the performance, the test wire requires a large number of fiber long-term and disk It is also easy to be subjected to vibration d / 2; early - "It is impossible to test the other control of the Lin control card. It is possible to freeze the control card. J = ^ _ _ pressure deviation from the standard 2 transmission of the Fibre Channel 峨Will be distorted, can not be confirmed ^ transmission, then the product can not meet the customer's test / annihilation channel - Tiger can be secret 7 1309779 in the measurement of the Lin (four) phased thief method, with -, link control card test system, which includes: - With host bus The host of the adapter; the junction control card 'the first end is connected to the host, the bus bar adapter sends the fiber communication number ^, the 中间-intermediate board, the first end and the link control card are a test device array, the front shot (four) Xi-Di-& is connected, and: the Hai 4 device array is connected to send the test. The test device array is composed of a plurality of measurement and control devices, such as the '° fruit'-micro control device, and each of the devices includes: · fiber channel communication 1 the micro-control device is connected to the interface, the secret receiving light - The light source _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ . An address setting unit connected to the microcontroller, and each test device passes the first-series paste chain control card test method, which is used for testing-linking crime, the link control card The test method comprises the following steps:, wei, and the respective addresses of each test device in the test device array; detecting the address set by each test device, 1 - each per-test device in the microcontroller The worker saves the material address in the corresponding--the host sends the 1_Tao_link (four) card to the Fibre Channel signal to each-test device; the intermediate board sends the remote command to the host to send one test command to one of the test device arrays. 8 1309779; 'The test device detects whether the address included in the test command is consistent with the address of the test command; if it is consistent', the test device sets the link control card working voltage mode; The test device performs a complete signal test on the received Fibre Channel signal and transmits the test result to the host. Compared with the conventional test device, since the present invention replaces the disk array in the chain array array, through the integrity test of the channel signal, the indirect test chain = the fiber channel signal reliability transmission, using the present invention = test == Method ^ The test process is fast and effective, meeting the customer's testing requirements. ... [Embodiment]

Bus Adaptor) host 100, one by -°. A (Host, - intermediate plate 3., first: 50, a first power supply 6〇 and a second brother, a chain, .. control card, the test device (four) rib G is connected for transmission - serial 埠The first end of the two-link control card 50 is used to contact the host, and the first end of the two-link control card 50 is used to make a key, the card 40, the first end, and the first link control card 4中间x ^ fiber channel signal, the intermediate board 30 is connected, the second end of the intermediate board 30 is controlled by the second end HBA of the control card 5 输出 output two standard optical fibers = serially connected. The side host 100 passes 40, the After the second link control card 50, the first link control card is assigned to each of the pick-up boards 3G in the test device array to separate the fiber channel signals - and refer to the second figure of the figure, which is the invention ^ A control block diagram of every test set in the control card test system, each test device includes: a microcontroller 10, which uses a PIC18F6520 chip, which internally stores a firmware (Firmware) There are registers inside the chip, the chip supports two RS232 serial ports, one HC bus bar; one interface connector SCA2 ( Single Co Nnector Attach 2 ) 11, which is connected with the micro control = ίο 'the interface connector u meets the Fibre Channel hard disk interface sff_8 〇 45, and has a hot plug function. In the first figure, the test device array 2 Each test device 1 is connected to the second end of the intermediate board 3 through the interface connector n to receive the fiber channel signal allocated by the intermediate board 30; a fiber channel hub 12, which is connected to the interface connector u Connection, used to test the received Fibre Channel signal, the Fibre Channel hub uses BCM8422; 'The internal memory of the chip ^, the same light w has a detection signal

Integrity SI (SignalIntegrity), frame start s〇F (Start OfFrame), 轳 LS (Loss Of Signal) and other functions; 0 儿贝: I2C level conversion unit 13 ' is connected to the microcontroller 1 Between the 光 and the optical line controller 12, the microcontroller 1G and the Fibre Channel hub 12 transmit data through 1 排, and the I2C level converting unit 13 is configured to perform level conversion for the transmitted signal; The second pole if the material shape ^ (kiss like ", the light 兮 LE ^ single early W f in the test state of each test device 1 is displayed, Λ light, the each - (4) 1 in the fiber channel can be bundled 'If there is an error in the side of each test device, the voltage limit control unit 15 connected to the red controller 2G is used to control the second junction control card 4G or the second link control card 5G. The operation of the 苐-link control card 40 or the second link control card 50 can be = the last pass, the address 10 of the microcontroller 10 is connected; the outgoing; the first - the serial 璋 7 ' For the 2 series, it is used to test the result 10 1309779 a second string 埠18, which is also RS232 serial 埠. Si Si diagram = over series 埠 测The connection mode of the test device array is as follows. The host 1 is connected to the third node through the serial 4, and the first test device i is the second = set/one of the first series. In the array of the mouth and month and refer to the second figure 'which is the link of the invention, ^ ^ - test device 设定 address setting material circuit diagram, each - 糸 = = unit 16 is connected with the microcontroller 10, the : When the address is connected, 'A0 is set to 1'; when j〇2's feet 1 and 2 'oour, '〇011,', '1000', '1001', '1Η〇', ie each Measure "0", the j W2, J3 setting method and J 〇 phase = 0 = set as the input value, then select "0000", "〇〇〇1" and then repeat, then the address "0100" “0101”, “0110”, “〇111” “1010”, “1011”, “1100”, “11〇1 test device 1 can be set to address from 0 to 14. Measure j = reference fine picture, For the link control card test secret of the present invention, the voltage limit control unit 15 of the V and (4) plants in the test system of the present invention has a dry sound control card, and the work is fresh in the first mode. Degrees, 5% vinylidene standards, as shown in the lower core sheet formula tadpole operating voltage departing Shu -. ~ Mine working voltage mode of Yan

2.5V ~ mode

5* (1+5%) = 5.25V

2-5* ( 1+5%) = 2.625V 5* ( 1-5%) =4.75v

^ Yangshuo----^... 2·5* (1-5%) =2_37W Four θ per -1309779 New control fresh element 15 is negotiable 1G issued by i ^ relay signal respectively margin m NB ' margin -^〇-N_b ^ The voltage limit of the card 4〇, MARGIN L0 NB, Γ can control the voltage limit of the second bond control card 50: the fourth figure ΐ [link control card 4 〇 card 40 or the second Chain control: the current control _-key control chart, which is the flow of the test method of the link control card of the invention S" ======? The address set by the test set i is "_ ", each number 1113⁄43⁄4 set 0110 1001 brother eleven test purple 罡T~77^r~t~-~Α~~μ Shangzhou crying corresponding to each test device 1 of the microcontroller 10 register 2 10 register In the 'second test device=in: the register of the controller 10, the third test object holds the street of the microcontroller 10, and the other test device W will correspond to the register of 12 1309779 in its microcontroller 10; 100 sends a standard Fibre Channel signal to the first link control card or the second bond control card 5 through the HBA, and the standard Fibre Channel signal is distributed by the intermediate board 3 to the parent test device 1 (step S3); Bean φ 机 2 〇〇 through its serial 埠 send a test command to the test array 20 i i i device Κ step 弘) 'The test command contains a set first link control: human into or second The link control card 5 〇 working voltage mode command, a test signal complete 卩々, a preset phase channel data of a preset Fibre Channel signal, and a preset address, the preset ^ address is “〇_,, to “111任何 任何 任何 任何 任何 ; ; ; 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 第一 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收 接收The other 3 == the test device 1 transmits the test command to the 5 connected thereto, and the address of the battery 3 matches the address it holds (step S5), if a device = not - To the 'room continues to tilt S6, according to which the other test devices 1 in the test spear array 200 are detected one by one; when consistent, the # test device i directly proceeds to step S7. Order, field, the test ί : the address of the save and the address contained in the test command - the exact number of the link control card 40 or Two-link control card 50 Guardian electric power device No. 'Just control card 4G or second link control card 50 Industrial test device 1 Fibre Channel hub 12 to the received light S3 number shouted complete _ test The specifics are as follows: _ Recording 1 of the micro 2 2 for the standard phase data contained in the command towel written by the Fibre Channel set ii received, Zeng 1 = wearing a channel hub 12 to set a frame format, and then the data to do than # , / ~ 进仃_ '将杂# The data and the standard phase he recognizes the right two are not _, job error, if both _, off correctly, 13 1309779. When 'measure the wealth set 1 to pass the test results to the host, If the test device 1 is erroneous, the red light is on (step S8). In step S4, the test device i or the 工作 word work mode command can be transmitted to the working voltage of the first link control card milk card 5G through a line. The invention complements the first test sound

The St intermediate plate 3G is connected (not shown). Step (4) in ί 一式或弟: The link control card 50 is in the standard, high and low three working voltage modes > i hit = then the first test split 1 voltage limit control unit 15 in the standard · gas % test 5 That is, set the voltage of 5ν, 2·5ν to test; in the high voltage mode, tl = 5.25V, 2.625ν voltage is tested; _ in the low voltage mode, the port is set to 4.75 V, 2.375 V To test. Step S8, the test wire is transmitted to the host 1 via the test j of the first (four) test command. #Fiber channel job integrity test · When the first test test device is completed, the test wire system is directly _ the first to receive the test life second "test, the device is transmitted to the host Ou Ruo job results are not _ the first to receive the test When the test is completed, the test device that completes the test result transports the test result to the test device that first receives the test command, and then passes the test device that first receives the test command 7 to the host device 100. In the above embodiment of the present invention, the host 100 transmits two standard optical 40-channel and 3^ signals via the HBA, and the two standard Fibre Channel signals are respectively transmitted through the first link control card, or the ί-key control card 50. 'Assigned to the 5 test devices 1 by the intermediate board 30', the first fiber channel signal through one of the link control cards is measured, and the other fiber channel signal of the other link control card is measured. In the first measurement, when the one-way Fibre Channel signal of the control card 40 is used, the test result of the Fibre Channel signal received by the interface connector 11 of the host 1 〇 0 read to 15 °-wave type 1 is a harm. Xuan host 1 〇〇 shows that the test is successful, indicating that the first link control card 40 is working properly. If any of the test devices 1 have incorrect test results, the host 〇〇 14 14 1309779 3 test 2 ' indicates the first chain When the control card 4 is not working properly, the other link of the first link control card 5Q is the same as the Fibre Channel signal. The test result is correct. The host 1GG shows that the test is successful, indicating that the card is working properly. If there is any test in it: the force control does not indicate that the test fails, indicating that the second link control card 5q = positive, as described on the ice, the invention has indeed met the requirements of the invention patent.

The present invention is only a preferred embodiment of the present invention, and equivalent modifications or changes made by the spirit of the present invention should be [simplified description of the drawing] Ϊ a picture of the link control card test of the present invention (4) Block diagram. Brother Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Schematic diagram. , set the voltage [main flow chart. Host Test Device First Link Control Card First Power Microcontroller Fibre Channel Hub LED Unit Address Setting Unit Second Serial 埠100 1 40 60 10 12 14 16 18 Array 2 〇〇 Intermediate Board 30 Second Link Control card; two power supply 7; " surface connector u I2C level conversion unit voltage limit control unit 15 first - tandem trick 15

Claims (1)

1309779, the scope of application for patents: • If the chain control card test system, including: the host with the host bus adapter; the appropriate flow of the two ends connected; and send test ^ 5 = 4 = _ device composition 'every - The testing device comprises: a micro-control material interface connected to the stomach, a secret receiving channel, a fiber channel scale connected for signal integrity testing of the received Fibre Channel channel; The micro-control succeeds in connecting the f-electrode with the fresh element, and is used for controlling the working voltage limit of the link control card; an address setting unit connected to the microcontroller; and a serial string 埠' each test device The test result is transmitted through the first serial port. 2. The link control card test system described in Item 1 and Item 1, wherein each::: also includes - I2C level shifting a unit connected between the microcontroller and the Fibre Channel hub, the microcontroller and the Fibre Channel hub transmitting data in an I2C 11 stream, and the I2C level converting unit is used for transmitting on the I2C bus The signal is level-shifted. 3. For example, the application of the patent 丨 丨 之 之 之 之 之 之 , , , , , , , , , , , , , , , , , , , , , , , , 述 述 述 述 述 述 述 述 述 述The second serial port of the first test device is connected to the second test device H, and the second serial device 16 1309779 of the second test device is connected to the first line of the test device, according to which other The test devices are sequentially connected in series. The device is connected to the first node (four) card; _, system, where the „ another link control card, the host through the host bus adapter adapter:; = fiber, the signal is adapted through the row. . Two standard Fibre Channel signals output. ❿ 5 kinds of test devices, which are the reliability of the ship-control system, including: Bayi microcontroller; Fibre Channel signal; fiber channel signal ^^^ line device for receiving the light unit For controlling the key connection control, an address setting unit connected to the microcontroller and the test device will pass the serial port 埠 测 如 如 如 概 概 概 ! ! ! ! ! ! ! ! ! ! ! 2C level conversion unit (4) Device transport package Between hubs, (4) ^ Touch Fibre Channel = line = ‘=== Set the test status to display. For the test of the opposite side test device. 8. As described in the patent application 帛7, the test device has a red light in the basin. The test device has an error in the fiber channel signal test junction 17 1309779, the red light is on. . 9. The test device of claim 8 of the patent application, η. The address range that can be set by four jumpers is 〇 to 14. In addition, the early yuan chain system is a sin of the work of the 元 赖 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 Address; the same as the presence of the corresponding Fibre Channel signal to the link control card, by - (4) • fiber channel signal to each test device; with the main: ΐ - test command to the test device array - The test is placed. The address contained in the test command is the same as the time when the test device is set up. The test device sets the link control card, and the domain access signal is sent to the domain. Host. The method of testing a link control card according to the above item, wherein the array of apparatus comprises a plurality of serially connected test devices. / • 12, ttl patent turns the 1G reward link control card test method, where the two np 7 contains - pre-set address, - set the link control card work electric mode two general search command and - pre Set the standard phase of the Fibre Channel. If the application method of the link control card is applied, the address included in the test command is also the same as the address of the guaranteed address. The method includes: when::, the test device transmits the test command to the test device array, and another test device connected in series with the test device, the other test device, ',, ' only It is judged that the address included in the test command is the same as the 18 '1309779 stored in the test command; if it is inconsistent, the foregoing steps are repeated, if the operation is performed by the push-to-control control card. - ° Measure 33 ^ 2 item of the numb control cut m method, wherein the step of setting the ̄ ̄ ̄ ̄ ̄ ̄ chain control card operating voltage mode further comprises: connecting the test device to the intermediate plate; The board will transfer the working electric pull command to the key control card. The control is 15·ΐ3ίΓ Fan difficult 14 Gu Shuzhi chain (four) card method, which sets f5 Haixing, 纟. The control card voltage mode also includes: , set the operating voltage of 5V, 2.5V standard voltage mode; set the operating voltage of 5.25V, 2.625V high voltage mode; set ΐ 4·75 V ' 2·375 V voltage bias The low mode is used as the voltage. 16U=The test method of the bond control card described in the item 12 of the range, wherein the light received by the step is performed by the intimate call integrity test, and the test phase cap includes the standard phase data written by the fiber channel hub fiber channel. The hub sets a frame format; samples the received Fibre Channel signal; f compares the sampled data with the standard phase data; if the two are not the same, it is an error; if the two are the same, it is correct. 17. The method of testing a link control card according to Item 13, wherein the address of the ride and the test device included in the test command towel are transmitted to the test device and then transmitted to the host . 19