TWI306619B - Semiconductor workpiece processing apparatus - Google Patents
Semiconductor workpiece processing apparatus Download PDFInfo
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- TWI306619B TWI306619B TW95103572A TW95103572A TWI306619B TW I306619 B TWI306619 B TW I306619B TW 95103572 A TW95103572 A TW 95103572A TW 95103572 A TW95103572 A TW 95103572A TW I306619 B TWI306619 B TW I306619B
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- 238000012545 processing Methods 0.000 title claims description 267
- 239000004065 semiconductor Substances 0.000 title claims description 237
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 15
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
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Description
1306619 九、發明說明: 【發明所屬之技術領域】 本發明係關於半導體製造設備技術領域,尤其係關於— 種具有多個半導體製程物件處理腔室且在每一半導體製程 物件處理腔室内設置有多個半導體製程物件處理平臺:: 導體製程物件處理裝置。 【先前技術】 目前有兩種常用的半導體製程物件處理系統,一種係對 半導體製程物件進行批量處理之系統,而另一種則對半導 體製程物件進行單片處理。在批量處理系統中,多片半導 體製程物件被同時水平地或垂直地置放並進行處理。 雖然早片處理系統在產品處理均_性、熱效應以及軍批 加工速度方面具有優勢,但其低產能以及昂責之生產成本 顯然係難以克服之致命缺陷。 為解決以上問題美國專利第58551641號之背景部分提供 了幾種批量處理之系統。此等批量處理系統具有多個處理 腔室,每一處理腔室中具有多個處理平臺,如此處理腔室 就可同時—次處理多片半導體製程物件。 但’對半導體製程物件進行批量處理之系統存在的最大 問題在於各片半導體製程物件之處理均一性難以保證。批 量處理半導體製程物件時,多片半導體製程物件置放在同 一腔室内’由於系統内之熱及氣流的差異導致半導體製程 物件處理之不均-性。為克服這種不足,業内提出了各種 解決方案。 108183.doc 1306619 …請參看圖卜美國專利第嶋175號在其背景技術 部分内揭示了-種半導體製程物件處理裝置,其中,被加 工之梦基m放在—碳基座9,上,碳基座9,下方設置一加 熱基座35,,加熱基座35.内部設置有高頻加熱線圈】,來對石夕 基W加熱,在處理過程中,碳基座9,可隨碳基座支持部 Η 一起繞軸旋轉,以保證溫度分佈均勻。 另外,圖2,美國專利申請第2〇〇5〇〇11459號揭示了另一 種半導體製程物件處理方案,其在反應腔内設置一可旋轉 之+導體製程物件載體116,,半導體製程物件⑽置放在 =導體製程物件載體116,内,半導體製程物件載體Μ ,·軸121’旋轉,而加熱基座m,靜止不動,其半導體譽1306619 IX. Description of the Invention: [Technical Field] The present invention relates to the field of semiconductor manufacturing equipment, and more particularly to a processing chamber having a plurality of semiconductor processing articles and having a plurality of processing chambers in each semiconductor processing article Semiconductor process object processing platform:: Guide system object processing device. [Prior Art] There are currently two commonly used semiconductor process object processing systems, one is a system for batch processing semiconductor process articles, and the other is for single-chip processing of semi-conductive process articles. In a batch processing system, multiple semiconductor programs are placed and processed horizontally or vertically simultaneously. Although early film processing systems have advantages in terms of product handling, thermal effects, and military batch processing speed, their low production capacity and high production costs are clearly fatal defects that are difficult to overcome. In order to solve the above problems, the background portion of U.S. Patent No. 5,851,161 provides several batch processing systems. These batch processing systems have a plurality of processing chambers, each having a plurality of processing platforms, such that the processing chamber can simultaneously process a plurality of semiconductor process articles. However, the biggest problem with systems that process batches of semiconductor process articles is that the uniformity of processing of individual semiconductor process articles is difficult to guarantee. When batch processing semiconductor process articles, multiple semiconductor process objects are placed in the same chamber. The unevenness of semiconductor process object processing due to the difference in heat and airflow in the system. To overcome this deficiency, various solutions have been proposed in the industry. 108183.doc 1306619 ... see U.S. Patent No. 175, U.S. Patent No. 175, the entire disclosure of which is incorporated herein by reference in its entire entire entire entire entire entire entire entire entire disclosure The base 9 is provided with a heating base 35 below, and the heating base 35 is internally provided with a high-frequency heating coil to heat the Shi Xiji W. During the process, the carbon base 9 can be used with the carbon base. The support unit 旋转 rotates around the axis to ensure uniform temperature distribution. In addition, FIG. 2, U.S. Patent Application Serial No. 2,145,459, discloses another semiconductor process article processing scheme in which a rotatable +conductor process article carrier 116 is disposed in a reaction chamber, and a semiconductor process article (10) is disposed. Placed in the = conductor process article carrier 116, the semiconductor process article carrier Μ, the shaft 121' rotates, and the heating base m, stationary, its semiconductor reputation
,物件載體m,與反應腔留有一足夠小距離之通H 錯由半導體製程物件載體116,旋轉來迫使氣體沿通道⑽ 向外水平流動,以實現半導體製程物件處理時之薄膜均勻 生長。 上述兩種方案雖然可部分地解決半導體製 不均一性問題,但,1介古丈β $ 卞知理之 半導體製程物件承載;:襄有此兩種方案均在-程物件,"止==被加工之半導體製 置及裏面之半導體座加熱半導體製程物件承载裝 置的旋轉來達至半物=半導體製程物件承載裝 千導體製私物件處理均一性之目的丘 =係:加熱裝置及半導體製程物件承载 二 置::加了系統之複雜性,而且半導體製程物件承載,置 之设置使得半導體製程物件距離加熱裝置有-段間Π I08I83.doc 1306619 得半導體製程物件之處理溫度更加難以控制。再者,上、 兩種方案在半導體製程物件處理過程中, 上述 1句,、糟由一旋 ==帶動所有的半導體製程物件—起旋轉,此種“ 方式運用於在-半導體製程物件處理腔室㈣置有多 導體製程物件處理平臺之半導體製程物件處理 導體製程物件均一性效果並不理想。 、 >The object carrier m, which has a sufficiently small distance from the reaction chamber, is rotated by the semiconductor process article carrier 116 to force the gas to flow horizontally outward along the channel (10) to achieve uniform film growth during processing of the semiconductor process article. Although the above two schemes can partially solve the heterogeneity problem of the semiconductor system, the semiconductor processing object of the 1st Guzhang β $ 卞 理 ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体The processing of the semiconductor device and the semiconductor semiconductor heating semiconductor process object carrying device rotation to reach half of the material = semiconductor process object carrying a thousand conductors of the private object processing uniformity of the purpose of the hill = system: heating device and semiconductor process object bearing Two-position:: Adding the complexity of the system, and the semiconductor process object is carried, and the setting is such that the semiconductor process object is separated from the heating device. I08I83.doc 1306619 The processing temperature of the semiconductor process object is more difficult to control. Furthermore, in the process of semiconductor process object processing, the above two methods, the rotation of all the semiconductor process objects - rotates, the "mode is applied to the - semiconductor process object processing chamber Room (4) The semiconductor process object with a multi-conductor process object processing platform is not ideal for the uniformity of the processing of the conductor process article, >
而受一種半導體製程物件處理裝置,其在對多個 :體製程物件處理時,能具有隔離之半導體製程 裱境’以保證每半導體製程物件處理之均一性,並 靈活地對半導體製程物件進行處理,尤其係調整= ',>、H +導體製程物件批量處理系統中. 導體製程物件處理之均一性。 【發明内容】 不努明之目的在於提供 ,y灿·取你切爽理裝署 以決目前半導體製程物件量產裝置均一性不高,不处 批量同時處理半導體製程物件之問題。 此 本:明之又一目的在於提供一種半導體製程物件處理 其可同時對多片半導體製程物件處理,且每半導體: 程物件具有相對隔離之半導體製π物# 每半導體製程物件處理之Γ Γ物件處料境,以心And a semiconductor process object processing device, which can have an isolated semiconductor process environment when processing a plurality of process items, to ensure the uniformity of processing of each semiconductor process object, and to flexibly process the semiconductor process object. In particular, the adjustment = ', >, H + conductor process article batch processing system. The uniformity of the processing process object processing. [Summary of the Invention] The purpose of the invention is to provide, ycan, take care of you, and to solve the problem that the current semiconductor device mass production device is not uniform, and the semiconductor process object is not processed at the same time. Another object of the present invention is to provide a semiconductor process object processing which can simultaneously process a plurality of semiconductor process articles, and each semiconductor: the workpiece has a relatively isolated semiconductor π material # per semiconductor process object processing Γ Γ object Environment, heart
置本:明之再—目的在於提供-種半導體製程物件處理J -可同時對多片半導體製程物件 物件處理I署介< 士〜 且千導體激毛 裝置亦料密封構件以在半導體製程物件處理斗 至日·保持半導體製程物件處理腔室内部密封,並具有 108183.doc 1306619 、部裝置保證密封元件正常工作。 本發明藉由以下技術方法音 理梦署^ 請方法實現.一種半導體製程物件處 匕括至少—半導體製程物件處理腔 程物件處理腔室内嘹w古夕 導體襄 每-半導/ 體製程物件處理平臺, 丰導體1程物件處理平臺處 並胜料+从.上 片丰導體製程物件, … 半導體製程物件處理過程中,半導體萝 物件處理平臺可旋轉。 τ +導體製程 半導體製程物件處理裝詈介< 褒置亦⑦置有與半導體製程物件處 數目對應之多個平臺旋轉構件,且每 物件處理平臺各盥一平喜 導體裏程 .. 八+臺旋轉構件相連。至少兩個平喜絲 轉構件藉由同一馬達驅動_ 疋 ’違驅動裝置帶動一起同步旋 =置係藉由皮帶來帶動多個半導體製程物件處理;臺旋 :二臺:::件設有皮帶輥轴來受皮帶帶動旋轉。皮 =軸:有與皮帶上之條紋相吻合的卡口,以利於皮帶及 皮帶輥軸之緊密結合。 贳汉 半導體製程物件處理平臺共有四個,其中相鄰之兩個丘 用同一馬達驅動裝置帶動 物件處理平臺藉由第轉 個半導體製程 支撐板裝配在一起,並受一第一 達驅動共同升降移動。 第-支撐板上設置_第一定位感測器,以定位第一支撐 板之升降移動位置。笫—民 牙 ^ 第馬達籍由一蜗輪蝎桿裝置驅動第 撐板升降移動。每—半導體製程物件處理平臺配備多 個頂針導引槽,每_頂針導引槽内設置有可升降之 該等多個半導體製程物件處理平臺上之頂針藉由第二支 108183.doc 1306619 樓板裝配在一起’並受—第二馬達驅動共同升降移動。第 二支撑板上設有一第二定位感測器,以禮保頂針在一定範 圍内升降。 該半導體製程物件處理裝置亦設有一具有登直執槽之滑 兩個可上下滑動之滑塊,該等兩個滑塊分 /第支撑板及第二支禮板固定連接,以引導第一支撑 板及第二支撐板升降移動。 每一半導體製程物件處理平臺内部設置有Μ分佈之加 熱:件。平臺旋轉構件包括依次連接之轉轴及皮帶輥軸。 本發明亦提供另一種解決目前半導體製程物件量產裝置 均-性不⑧之技術方案。—種半導體製程物件處理裝置, 包括至少一半導體製程物件處理腔室,半導體製程物 理腔室内設置有多個半導體製程物件處理平臺,每一半: 體製程物件處理平臺處理—片半導體製程物件,1 於:每一半導體製程物件處理平臺下面設有相應之平臺f 轉構件帶動半導體製程物件處理平臺旋轉並加孰 2This book: the purpose of the re--the purpose is to provide a kind of semiconductor process object processing J - can simultaneously process multiple pieces of semiconductor process object object I < 士 ~ and thousand conductor stimulator device also seals the component to process in the semiconductor process object Bucket to the day · Keep the inside of the semiconductor process object processing chamber sealed, and has 108183.doc 1306619, the device to ensure the normal operation of the sealing element. The present invention is implemented by the following technical method: a semiconductor process article, at least, a semiconductor process object processing chamber, an object processing chamber, a 夕w ancient 襄 conductor, a semi-conductor, and an institutional process object processing. Platform, Feng conductor 1 process object processing platform and wins material + from. On the film conductor process items, ... semiconductor process object processing, the semiconductor lens processing platform can be rotated. The τ + conductor process semiconductor process object processing device is also provided with a plurality of platform rotating members corresponding to the number of semiconductor process articles, and each device processing platform has a flat conductor length. The rotating members are connected. At least two Pingxing wire rotating members are driven by the same motor _ 疋 违 驱动 违 违 = = = = = = = = = = = = = = = = = = = = 藉 ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; The roller shaft is rotated by the belt. Leather = Shaft: There is a bayonet that matches the stripe on the belt to facilitate the tight coupling of the belt and the belt roller. There are four Shuhan semiconductor process object processing platforms, in which two adjacent hills are assembled with the same motor drive unit with animal processing platform by the first semiconductor process support board, and are driven by a first drive to move up and down. . A first positioning sensor is disposed on the first support plate to position the lifting and lowering position of the first support plate.笫—民牙 ^ The first motor is driven by a worm gear mast device to move the slab. Each of the semiconductor process object processing platforms is provided with a plurality of thimble guiding grooves, and each _ thimble guiding groove is provided with a thimble on the plurality of semiconductor process object processing platforms that can be lifted and lowered by the second branch 108183.doc 1306619 floor assembly Together 'and subject to the second motor drive to move up and down together. The second support plate is provided with a second positioning sensor for lifting and lowering the thimble within a certain range. The semiconductor process object processing device is also provided with a slider having a straightening and sliding slot for sliding up and down, and the two sliders/the first support plate and the second support plate are fixedly connected to guide the first support. The plate and the second support plate move up and down. Each semiconductor processing object processing platform is internally provided with a heating of the Μ distribution: a piece. The platform rotating member includes a rotating shaft and a belt roller shaft which are sequentially connected. The present invention also provides another technical solution for solving the current uniformity of the mass production device of the semiconductor process article. A semiconductor process object processing device includes at least one semiconductor process object processing chamber, and a semiconductor process physical chamber is provided with a plurality of semiconductor process object processing platforms, each half: a process object processing platform processing - a semiconductor process article, 1 : Each semiconductor processing object processing platform is provided with a corresponding platform f rotating member to drive the semiconductor process object processing platform to rotate and twist 2
旋轉構件設有通道供電訊號輸人,在該半導財L 理裝置上亦具有密封構件以形成半導體製程 内之密閉環境。 腔至 平臺旋轉構件包括依切接之轉軸及皮帶_ 帶誕軸之旋轉帶動轉軸旋轉。皮帶輥軸藉由; 線器連接’集線器一端與—訊號放大器相連。半 物件處理平臺下方設有_支持桿與處理平臺相連接,—王 桿與轉軸相連接’支持桿内部設有電源線以連接半導體2 108183.doc ^06619 程物件處理平臺内 行加熱。支奸内邱,、、糸對半導體製程物件處理平臺進 物件處理平臺二:::測裝置以量測半導體製程 圈及波紋管密封件組成之密封2外部設有一由彈性密封 件與半導體製程物件處. 肖於㈣波紋管密封 波㈣〜 知理腔至底部之接觸間隙。 波紋管役封件下方連接有—轉轴及 罩設於轉軸外部,第一外 卜罩,第一外 自卜罩與轉軸之間設有軸承,使轉軸 件之外罩不隨之轉動。第-外罩及波紋管密封 件之間亦材密封元件來密 間的接罩及波紋管後封件之 术卜卓與轉軸之間設置—磁密封元件, :轉抽轉動時可保證第一外罩與轉轴之間的接觸間隙被密 支持桿及㈣直接藉由銷或螺釘螺㈣定連接在一起, 並且支持桿及轉軸相連接之地方設有密封元件。或者,支 1桿與轉轴之間藉由—連接塊使二者連接在—起,在支持 桿及連接塊相接觸之地方以及在轉軸與連接塊相連接之地 方分別設有密封元件。 第循環通道設置在轉軸上,用於冷卻設置在轉軸附 近之捃封元件。一第二循環通道設置在第一外罩上,用於 冷部設置在第一外罩附近之密封元件。第一循環通道及第 一循Ϊ哀通道藉由一外接管道相連通。第一循環通道上設有 冷卻液入口’藉由該冷卻液入口使冷卻液進入第一循環 通道。第一循環通道包括設置於轉軸上且相互連通之第一 冷卻槽、第一通道及第二通道,其中,第一冷卻槽圍繞靠 108183.doc -11 - 1306619 近轉軸附近之密封元件設置,篦一 弟通道及第二通道設置於 轉軸内壁上,並且在轉軸上亦畤¥ —健 π °又置弟-軸孔與第一通道 連通及一第二軸孔與第二通道連通。 轉軸之周邊亦設有一第二外里,锭_ 卜罩第一外罩與轉轴之間設 有多個相互間隔之密封元件,苴中 兵τ相鄰的密封元件之間分 別形成一第一環間隙及一第二環間降。 第一軸孔位於第一環間隙内计 宁、内並且有—冷卻液接入管之 入口亦位於此第一環間隙内,、人%、六> 皁内冷卻液接入管提供冷卻液進 入第一環間隙内’並自第—私丨 弟軸孔内進入轉軸。第二軸孔位 於第二環間隙内,外接管道之篦一 <笫螭亦位於此第二環間隙 内,第一循環通道内之冷卻液矸拉 ’、 履了藉由此第二軸孔流出至第 二環間隙内,並經過外接營措 ,伐g道之第—端進入外接管道, 流入第二循環通道。 第二循環通道包括設置於第—外罩上之第二冷卻槽,今 第二冷卻槽圍繞靠近第一外罩附近之密封元件設置,第: 冷卻槽在不同位置設置_第_ 第一冷部槽入水孔及一第二冷卻 槽出水孔,其中,第-火知战 , 1 7卩槽入水孔與外接管道之第二端 目連接’第二冷卻槽出水孔與 出冷卻液。 彳接輸W連接,用於排 本發明之另一技術方案為: 理裝置,包括至少一半導㈣料導體製程物件處 内#蓄古# 導體I程物件處理腔室,處理 内权置有多個半導體製程物件處理平臺,每 物件處理平臺處理一 體製釭 一 丰¥體1程物件,其特徵在於:每 半導體製程物件處理平喜i八a 室了刀別升降並旋轉,半導體製 108183.doc J2- 1306619 =:τ設有密封搆件以在半導趙*巷物件處理 保持半導雜製程物件處理腔室内部密封,並具 有冷部裝置保證密封元件正常工作。 其中,該何««件處理平臺7料有 封圈及波紋管密封件組成之密封裝置,用來密封波 Γ牛與半導體製程物件處理腔室底部之接觸㈣。波= ::件下部設有第一外罩及轉轴,在第一外罩與轉轴之: ^-磁密封元件’當轉軸轉動時可保證第—外罩與轉^ 之:的接觸間隙被密封。第一外罩與波 設有密封元件來密封第-外罩與波紋管密封件之=; 間隙。 s在法了仟之間之接觸 冷卻裝置係水冷管道。冷卻震置為 通道包括第-猶環通道及第二循環通道,”;:二部 道設置在轉軸與密封構 八中第—循%通 循環通道設置在第一外罩::㈣轉軸侧壁上;第二 循環通道及第二循環通、封構件#近之部位,且第- 周邊亦設有-第二C外接管道相連通。轉轴之 互間隔之密封元件,”轉轴之間設有多個相 第-環間隙及-第-=的密封元件之間分別形成- 道及一外接冷卻源相連通,、夕=^間隙與該第—循環通 一環間隙進入該第—循環、^接冷卻源t冷卻液藉由此第 隙連通,且外接管道=第—心通道與第二環間 該第二環間隙可將第―循:亦第二環間隙内,藉由 道,再流入第二循環通道道内之冷卻液傳遞至外接管 108183.doc -13- 1306619 本發明亦提供了一種半導體製程物件處理方 導體製程物件分別置放在多 多片+ 仃處理’在處理過程中,該等多個半導進 旋轉並加熱,以便對半導體製程物件進行均勾處理 其中該等多個半導體製程物件處理平臺係同步旋轉的 本發明抑㈣之半導”㈣ ° 動夕钍德丁 ^夕自由度運 籌…以對同一片半導體製程物件 均句加熱。可更加靈活地進行複雜之半導體 = 件。太^ 率大批量處理半導體製程物 件 本發明亦設計了 一套ffi氐、去么^ 牛藉一 w 套八用馬達系統’在保證了系統同 步穩疋性之同時簡化了機械結構,降低了製造成本。 【實施方式】 本發明之半導體製程物件處㈣置,包括至少— 襄程物件處理腔室,處理 " 此一 腔至内可設置有多個半導體製程 件,各#處理千臺上處理—片半導體製程物 牛母一處理平臺在半導體製程物件處理 Μ # . y 衣狂初仟屣理過程中可分別旋 轉並加熱,保證半導體製程物件處理之均一性。 立=本發明之半導體製程物件處理裝置的-實施例之 *㈤圖3中之半導體製程物件處理裝置包括4個處理平 但為簡潔起見,只顯示處理腔室内之2個處理平臺。 應里解,本發明之半導體製程物件處理襄置内不限於只 括4個處理平臺,亦可包括其他數量之處理平臺。… 請同時參看目3,圖4及圖5。圖4及圖5為圖3所示之本發 明的半導體製程物件處理裝置自 衣置目不冋視角觀察之示意圖。 108183.doc 1306619 多個處理平臺〗μ 口又置於一處理腔室内(未圖示), =-文持捍4與其相連接,並且每—處;臺〗 = ):=旋轉構件(亦即,轉轴26及皮帶輥㈣,容: 理平臺m轉^相連接,平臺旋轉構件帶動支持桿4及處 支^干4自處理腔室内延伸而出’並設置於處理平臺1下 方之波紋切封件如。處料臺1±亦 取放半導體製程物件之頂針期4),每—頂針2用於 相應之頂桿3 ’以控制頂針 頂&置有 方設置有密封裝置5,密升降。頂桿3下 戽密封# ' 、腔至底部相連接。波紋 吕密封件52亦與腔室底部相連接,密封裝置 封件52可㈣地㈣其與處理腔室底部之接觸面, 氣體及熱量之_。波紋管密封件52下方分別設置 =:第二外罩I第二外罩28下方設置-皮_ ㈣於帶動設置於第-外罩16及—第二外罩28内部之轉轴 26(睛參看圖7)旋轉。皮帶報軸17下面係—集線㈣可 在處理平臺i轉動時,設置於支持桿4及轉軸%内部之電後 不至於纏繞。集線器19的下方係—訊號放大器Μ 大輸入電壓。 於放 在處理過程中,本發明中之每-處理平臺】的頂針2均可 單獨升降,當[亦可藉由-定的裝置組合使多個頂針2 一起升降。在圖4之實施例中’每—半導體製程物件處理 平臺1具有三個頂針2,則在圖示之兩個處理平臺丨内妓且 有六個頂針2及其相應之頂桿3及密封裝置5。此等頂針 108183.doc 】5· 1306619 頂桿3及密封裝一一^ ^ ^ , &女哀*上支撐板6上。該上支撐 . “―馬達8控制可沿滑軌7上下移動,而帶動所有頂針2 ,—起上下升降。為確保頂針2上下移動之位置在—定範圍 在π軌7之對應位置設置了 一位置感測器9,以在上支 • 樓板6經過感測器9所在位置時使馬達8停止運動,從而確 保頂針2及其附屬裝置只能在—定範圍内上下升降移動。 。類似地,在處理過程中,本發明中之每一處理平臺1可 • $獨旋轉或升降,當然,亦可藉由-定的裝置組合使多個 處理平臺1-起旋轉或升降。如圖所示,每__處理平臺1下 方各設有一皮帶輥軸17轉軸26連接,皮帶輥軸”來受皮帶 (未圖示)帶動旋轉,並帶動轉軸26旋轉,進而帶動處理平 臺1旋轉。皮帶輥軸17上設有與皮帶上之條紋相吻合的卡 口 U,以利於皮帶及皮帶輥軸17之緊密結合。每一處理平 臺1對應之皮帶輥軸17可由一各自的皮帶帶動旋轉,亦可 多個處理平臺1對應之皮帶輥轴17一起由同一皮帶帶動旋 § 轉,使得多個處理平臺丨同步旋轉,保持處理之均一性。 比如,一貫施例係,半導體製程物件處理平臺1共有四 個,其中相鄰的兩個處理平臺!共用同一馬達驅動裝置帶 動同一皮帶同步旋轉。 下支撐板10將兩個半導體製程物件處理平臺丨之第一外 罩16裝配在一起。第一外罩16可被下支撐板1〇卡住並隨之 上下移動。下支撐板10上下移動可帶動這兩個半導體製程 物件處理平臺1一起上下升降移動。該下支撐板1〇由一馬 達11藉由蝸輪蜗桿裝置12驅動沿滑軌7上下移動。同樣 108183.doc -16 - 1306619 地,在滑軌7之相 ..... %「又辑板 10經過感測器13所在之位置時使馬達丨丨停止工作,以確保 半導體製程物件處理平臺丄只能在一定範圍内上下升降移 動。 在如圖3之實施例中,下支擇板1G將兩個半導體製程物 件處理平臺i裝配在-起共用一套馬達驅動裝置。在此實 施例中’半導體製程物件處理腔室中可有兩組如此之组 合,即四個半導體製程物件處理平臺】中之每兩個處理平 臺1共用-套馬達驅動裝置。此等兩個組合對稱設置確保 了半導體製程物件處理腔室之穩定性。 藉由上支撐板6及下支樓板1〇之設置,本發明可實現多 個+導體製程物件處理平臺工上之頂針同步上下升降運 動、,並可實現多個半導體製程物件處理平豹同步上下升 降運動。如此設置,一方面多套半導體製程物件處理平臺 1共用一馬達驅動裝置’簡化了設備,降低了成本,·另一 :面多套半導體製程物件處理平臺ι共用一馬達驅動裝置 亦可確保各處理平臺1 從而亦保證了各半 導體製程物件處理平臺1處理之均一性。 :參看圖5’可看到滑軌7上留有很多垂直排列的孔14, 之下支撐板10可依託此等孔14上下移動,滑軌7 ’ Μ 了整個組合系統對蝸輪蝸捍12之壓力,降低了 對蜗輪蜗桿12之結構 降低了 性。s & ㈣度H麵了組合系統之穩定 撐板,由於下支撐板10帶動整個系統,因此驅動下支 之馬達11傳動的蜗輪蜗扣要承受較大之壓力,故 108183.doc 1306619 在下支撐板10與蝸輪蝸桿12 撐板10均勻受力。 間故置有一腔體22以使下支 請參看圖6、圖7及圖8,圖7达丄 件處理平臺及1平本發明之—半導體製程物 本發轉構件的剖面圓,圖8為圖7所示之 本發明的何體製程物件處 面圖的局部放大圖。每一平喜 其平臺旋轉構件之剖 m , 7 臺紋轉構件包括一轉軸26及皮 = ’轉轴%之一端與支持桿4相連接,轉轴The rotating member is provided with a channel power supply signal, and the sealing member is also provided on the semiconductor device to form a sealed environment in the semiconductor process. The cavity-to-platform rotating member includes a rotating shaft that rotates according to the rotation of the shaft and the belt. The belt roller shaft is connected to the signal amplifier by a wire connector. Below the semi-object handling platform, there is a support bar connected to the processing platform, and the king bar is connected to the rotating shaft. A power cord is provided inside the support bar to connect the semiconductor 2 108183.doc ^06619 The workpiece processing platform is heated. In the case of the semiconductor process object processing platform, the object processing platform 2::: The measuring device is used to measure the semiconductor process ring and the bellows seal. The seal 2 consists of an elastic seal and a semiconductor process object. Where. Xiao Yu (four) bellows seal wave (four) ~ contact cavity to the bottom contact gap. The bellows seal is connected with a rotating shaft and a cover disposed outside the rotating shaft. The first outer cover is provided with a bearing between the first outer cover and the rotating shaft, so that the outer cover of the rotating shaft does not rotate. Between the first cover and the bellows seal, the sealing member is also connected between the sealing member and the bellows rear seal. The magnetic sealing member is disposed between the screw and the rotating shaft, and the first outer cover is ensured when the rotary is rotated. The contact gap with the rotating shaft is connected by the dense support rod and (4) directly by the pin or the screw screw (4), and the sealing rod is provided at the place where the support rod and the rotating shaft are connected. Alternatively, the connecting rod and the rotating shaft are connected by the connecting block, and the sealing member is respectively disposed at a position where the supporting rod and the connecting block are in contact with each other and where the rotating shaft is connected to the connecting block. The first circulation passage is disposed on the rotating shaft for cooling the sealing member disposed near the rotating shaft. A second circulation passage is provided on the first outer casing for the sealing member disposed in the vicinity of the first outer casing. The first circulation channel and the first circulation channel are connected by an external pipe. The first circulation passage is provided with a coolant inlet' through which the coolant enters the first circulation passage. The first circulation passage includes a first cooling groove, a first passage and a second passage which are disposed on the rotating shaft and communicate with each other, wherein the first cooling groove is disposed around the sealing member near the rotating shaft of 108183.doc -11 - 1306619, The first channel and the second channel are disposed on the inner wall of the rotating shaft, and the shaft is also connected to the first passage and the second shaft is connected to the second passage. A second outer lining is further disposed around the rotating shaft, and a plurality of mutually spaced sealing members are disposed between the first outer cover and the rotating shaft, and a first ring is formed between the sealing members adjacent to the squatting τ The gap and a second loop drop. The first shaft hole is located in the first ring gap, and the inlet of the coolant inlet pipe is also located in the first ring gap, and the human%, six> soap coolant inlet pipe provides the coolant Enter the first ring gap and enter the shaft from the first-private shaft hole. The second shaft hole is located in the second ring gap, and the first pipe of the external pipe is also located in the second ring gap, and the coolant in the first circulation channel is pulled, and the second shaft hole is It flows out into the gap of the second ring and passes through the external battalion. The first end of the cutting path enters the external pipe and flows into the second circulation channel. The second circulation passage includes a second cooling groove disposed on the first outer cover. The second cooling groove is disposed around the sealing member near the first outer cover. The: cooling groove is disposed at different positions. The hole and a second cooling trough water outlet hole, wherein, the first fire, the 1 7 gutter inlet hole and the second end of the external pipe are connected to the second cooling trough water outlet and the coolant.彳Connecting W connection, another technical solution for arranging the invention is: the device, including at least half of the (four) material conductor process object at the end of the #古古# conductor I process object processing chamber, the processing of the internal authority is more A semiconductor process object processing platform, each object processing platform processes a system, a body, a body, a body, and an object, which is characterized in that each semiconductor process object is processed, and the tool is lifted and rotated, and the semiconductor system is 108183.doc J2- 1306619 =: τ is provided with a sealing member to keep the inside of the semi-conducting process object processing chamber in the semi-conducting object processing, and has a cold portion device to ensure the normal operation of the sealing member. Among them, the «« processing platform 7 material has a sealing device composed of a sealing ring and a bellows sealing member for sealing the contact between the wave yak and the bottom of the semiconductor processing object processing chamber (4). Wave =: The lower part of the part is provided with a first outer cover and a rotating shaft. In the first outer cover and the rotating shaft: ^-magnetic sealing element 'When the rotating shaft rotates, the contact gap between the first cover and the rotating cover is sealed. The first outer cover and the wave are provided with sealing elements to seal the gap between the first outer cover and the bellows seal; s contact between the law and the chiller is a water-cooled pipeline. The cooling is set to the channel including the first-semi-ring channel and the second circulation channel,";: the two-way channel is disposed in the rotating shaft and the sealing structure. The first-pass circulation channel is disposed on the first outer cover: (4) on the side wall of the rotating shaft The second circulation passage and the second circulation passage and the sealing member # are in close proximity, and the first periphery is also provided with a second C external pipe connected to each other. The mutually spaced sealing elements of the rotating shaft are provided between the rotating shafts. A plurality of phase first-ring gaps and -th-= sealing elements are respectively formed between the - channel and an external cooling source, and the first and second gaps and the first-cycle through-loop gap enter the first-cycle, The cooling source t coolant is connected by the first gap, and the external pipe=the second ring gap between the first-heart channel and the second ring can be in the first ring: also in the second ring gap, by the channel, and then into the first The coolant in the second circulation channel is transferred to the external pipe 108183.doc -13 - 1306619 The present invention also provides a semiconductor process article processing square conductor process object placed in a plurality of pieces + 仃 process 'in the process, the Semi-conducting rotation and heating to contact the semiconductor The process object is uniformly processed, wherein the plurality of semiconductor process object processing platforms are synchronously rotated, and the semi-conductor of the invention (4) is used for the fourth semiconductor process object. Heating. It is more flexible to carry out complex semiconductors. It is also a high-volume processing of semiconductor process objects. The present invention also designs a set of ffi氐, go to ^ 牛 borrow a w-set eight-purpose motor system' to ensure system synchronization The simplification of the mechanical structure simplifies the manufacturing structure and reduces the manufacturing cost. [Embodiment] The semiconductor process article of the present invention is disposed at (four), including at least - a process object processing chamber, processing " Multiple semiconductor process parts, each processing thousands of units on the processing - the semiconductor processing process of the mother-in-a-processing platform in the semiconductor process object processing Μ # . y clothing mad priming process can be rotated and heated separately to ensure semiconductor process objects Uniformity of processing. 立 = semiconductor process article processing apparatus of the present invention - embodiment * (5) semiconductor process article processing equipment in FIG. Including four processes, but for the sake of brevity, only two processing platforms in the processing chamber are displayed. It should be noted that the semiconductor process object processing device of the present invention is not limited to only four processing platforms, and may also include other quantities. Processing platform.... Please also refer to item 3, Fig. 4 and Fig. 5. Fig. 4 and Fig. 5 are schematic diagrams of the semiconductor process object processing device of the present invention shown in Fig. 3, which are viewed from the perspective of the clothes. 1306619 Multiple processing platforms 〖μ port is placed in a processing chamber (not shown), = - 捍 捍 4 connected to it, and each - at the table = = =: = rotating member (ie, the shaft 26 and the belt roller (4), the capacity: the platform is connected by the m-turn, the platform rotating member drives the support rod 4 and the branch support 4 to extend from the processing chamber and the corrugated sealing member disposed under the processing platform 1 . The table 1± also picks up the thimble period 4) of the semiconductor process article, and each thimble 2 is used for the corresponding ejector 3' to control the ejector pin & The ejector pin 3 is 戽 sealed # ', and the cavity is connected to the bottom. The corrugated seal member 52 is also coupled to the bottom of the chamber, and the seal member 52 can (4) ground (4) its contact surface with the bottom of the processing chamber, gas and heat. The bellows seals 52 are respectively disposed under the lower portion of the bellows seal member 52. The second outer cover is disposed under the second outer cover 28. The fourth outer cover 28 is disposed under the second outer cover 28 to rotate the rotating shaft 26 disposed inside the first outer cover 16 and the second outer cover 28 (see FIG. 7). . The belt-reporting shaft 17 is below the line-collecting line (4). When the processing platform i rotates, it is disposed on the support rod 4 and the shaft inside the shaft, and is not wound. Below the hub 19 is a signal amplifier Μ large input voltage. In the process of being placed, the thimble 2 of each of the processing platforms of the present invention can be lifted and lowered individually, and [the plurality of thimbles 2 can also be raised and lowered together by a combination of devices. In the embodiment of FIG. 4, the 'per-semiconductor process article processing platform 1 has three thimbles 2, and then two thimbles 2 and their corresponding ejector pins 3 and sealing devices are illustrated in the two processing platforms shown in the figure. 5. These thimbles 108183.doc 】5· 1306619 ejector 3 and sealed one by one ^ ^ ^, & 女 哀 上 上 上 upper support plate 6. The upper support. "The motor 8 control can move up and down along the slide rail 7, and drive all the thimbles 2, up and down. To ensure that the position of the ejector pin 2 moves up and down, the corresponding range is set at the corresponding position of the π rail 7 The position sensor 9 stops the movement of the motor 8 when the upper slab 6 passes the position of the sensor 9, thereby ensuring that the thimble 2 and its attachments can only move up and down within a predetermined range. Similarly, During the processing, each processing platform 1 in the present invention can be rotated or raised independently. Of course, a plurality of processing platforms can be rotated or raised by a combination of devices. Each of the __ processing platforms 1 is provided with a belt roller shaft 17 and a shaft 26 connected thereto. The belt roller shaft is driven by a belt (not shown) to rotate, and the rotating shaft 26 is rotated to drive the processing platform 1 to rotate. The belt roller shaft 17 is provided with a bayonet U which coincides with the stripe on the belt to facilitate the tight coupling of the belt and the belt roller shaft 17. The belt roller shafts 17 corresponding to each processing platform 1 can be rotated by a respective belt, or the belt rollers 17 corresponding to the plurality of processing platforms 1 can be rotated by the same belt, so that the plurality of processing platforms are synchronously rotated. Maintain uniformity of processing. For example, consistently, there are four semiconductor process object processing platforms 1, two of which are adjacent to each other! Sharing the same motor drive drives the same belt to rotate synchronously. The lower support plate 10 assembles the first outer cover 16 of the two semiconductor process article processing platforms. The first outer cover 16 can be caught by the lower support plate 1 and then moved up and down. The downward movement of the lower support plate 10 can drive the two semiconductor process object processing platforms 1 to move up and down together. The lower support plate 1 is driven up and down along the slide rail 7 by a motor 11 driven by the worm gear unit 12. Similarly, 108183.doc -16 - 1306619, in the phase of the slide rails ..... % "The board 10 is placed in the position of the sensor 13 to stop the motor , to ensure the semiconductor process object processing platform丄 can only move up and down within a certain range. In the embodiment of Fig. 3, the lower support plate 1G assembles two semiconductor process object processing platforms i to share a set of motor drive devices. In this embodiment 'The semiconductor process object processing chamber can have two sets of such combinations, that is, four semiconductor process object processing platforms. Each of the two processing platforms 1 shares a set of motor drive devices. These two combinations of symmetric settings ensure the semiconductor The stability of the process object processing chamber. By the arrangement of the upper support plate 6 and the lower support floor plate, the invention can realize the simultaneous lifting movement of the ejector pins of the plurality of +conductor process object processing platforms, and can realize more The semiconductor process object handles the flat leopard synchronous up and down movement. This arrangement, on the one hand, multiple sets of semiconductor process object processing platform 1 share a motor drive device' simplifies the device and reduces The cost, another: a plurality of sets of semiconductor process object processing platform ι share a motor drive device can also ensure that each processing platform 1 thus also ensures the uniformity of processing of each semiconductor process object processing platform 1. See Figure 5' It is seen that there are many vertically arranged holes 14 on the slide rail 7, and the lower support plate 10 can be moved up and down by the holes 14, and the slide rails 7' smash the pressure of the entire combination system against the worm gears 12, reducing the worm gears. The structure of the worm 12 is reduced. s & (4) degree H surface of the stable struts of the combined system, since the lower support plate 10 drives the entire system, the worm gear that drives the lower motor 11 is subjected to a larger one. Pressure, so 108183.doc 1306619 The lower support plate 10 and the worm gear 12 struts 10 are evenly stressed. A cavity 22 is placed so that the lower support can be seen in Figures 6, 7 and 8, and Figure 7 is processed. The platform and the flat surface of the present invention are the cross-sectional circles of the present invention, and FIG. 8 is a partial enlarged view of the surface of the apparatus of the present invention shown in FIG. 7. Each of the flat rotating members of the platform Section m, 7 sets of grain transfer members One end including a shaft 26 and a skin = 'shaft % is connected to the support rod 4, the shaft
7與皮帶輕轴17相連接,皮帶觀㈣上留有與皮 帶上之條紋相吻合的4 Γ7 1 C 發六 ’以利於皮帶及皮帶輥軸1 7之 册 較大的力。馬達驅動裝置(未圖示)與一皮 -(未圖示)相連’皮帶輥轴17受該皮帶帶動旋轉,並帶動 ^26旋轉,㈣帶動與支持桿4相連接之半導體製程物 件處理平臺1旋轉。 轉軸26與第一外罩16之間藉由滚珠轴承⑹連接在一 起滾珠軸承163之數量可為—個或多個。在如圖所示之 實鉍例中’滾珠軸承163之數量為兩個,上下各設置一 個圖不中之滾珠軸承163僅為示意性的,並未顯示其真 正結構’其可是先前技射之任何—種常料滾珠轴承。 通吊’滾珠軸承包括一外連接件、内連接件及設於二者之 間之轴承’其中’内連接件與轉軸26相連接,外連接件與 第一外罩16相連接。當轉軸26轉動時,内連接件受轉軸% $動起方疋轉’而軸承亦一起旋轉,從而可、維持第一外罩 16固定不動。該第一外罩16上亦設有冷卻液管道(容後詳 述)以及冷卻液出口 15b。在第一外罩16的下方有一供冷卻 108183.doc •18· Ϊ306619 液進行密封之冷卻液輸入裝置(容後詳述)。 方式。二之=旋刪的旋轉驅動方式可有多種實施 母平室杈轉構件之皮帶輥軸17可分別由各 自的馬達驅動裴置來 各 鹛翻&士 t 力J 由馬達驅動裝置共同 擇其:平臺旋轉構件之皮帶輥軸17-起旋轉,亦可選 、部分平臺旋轉構件之皮帶輥軸17組合在—起,由一 二=!置帶動旋轉’剩下的平臺旋轉構件之皮帶觀轴 由各自的馬達驅動裝置來帶動旋轉或部分組合在—起 由一馬達驅動裝置帶動旋轉。 ::明之一較佳實施方式係’半導體製程物件處理腔室 置有四料導體製程物件處理平臺!,每一半導體製 程物件處理平臺1對應設置-平臺旋轉構件。|中,相鄰 :兩個平臺旋轉構件之皮帶輥軸17兩兩組合,每一組合由 -馬達驅動裝置用皮帶帶動旋轉’如此,整個半導體二程 物件處理腔室内之四個處理平臺需要兩個馬達驅動裝 置帶動即可旋轉。 為實現半導體製程物件處理之目的,本發明之半導體製 程物件處理裝置應能夠加熱置放於其處理平臺上之被加工 的半導體製程物件,且半導體製程物件處理腔室應為一相 對真空之處理環境。SUb ’與處理腔室相連接之部分應設 置某些密封裝置,以使處理腔室與大氣相隔離,形成真空 環境。以下將詳述。 凊參看圖7,處理平臺1之支持桿4内部設置成空心的, 轉軸26内部亦設置成空心的’在空心的支持桿4及轉軸% 108183.doc •19· 1306619 配備兩條線纜管23及24,1中—值括脱 迴路,其連接至半導體製程:件:::=電源輸入 示)上以對半導體製程物件處理平臺:I!電Π: 設有溫度偵測裝置23,連接、 條中 本;曰 主牛導體製程物件處理平臺i 表面以置測半導體製程物件處理 $ 導體製程物件之處理過程中 :::在半 加熱其上的半導體製程物件,並且=可臺 =從而 耘中疑轉,以保證半導體製程物件處理之均一性。 請結合參看圖7及圖8,由於半導體製程物件處 下:設置之支持桿4自半導體製程物件處理腔室下面延伸 而出,因此,必須保證支持桿4與半導體製程物件處理腔 =::Γ接為密封的。根據此要求,本發明在半導體 物件處理腔室下方設置-波紋管密封件52來密封。請 參看圖13,圖13為用於本發明中之波紋管密封件的剖面示 =圖。波紋管密封件52為一軸向對稱之薄壁圓管組件,圓 管上有密集之環狀波形突出,由於每一環形波形突出皆可 承受外力施加而變形,並在外力除去後彈性回復,使得波 =密封件52具備彈性回復、可轴向伸縮。本發明之波紋 官畨封件52為金屬材料,如不銹鋼,並且具有上法蘭… 及下法蘭5lb,其中上法蘭51a及半導體製程物件處理腔室 (未圖示)焊接在一起,在上法蘭5U及半導體製程物件處理 腔室之接觸面處設有彈性密封圈5〇,用於密封波紋管密封 件與半導體製程物件處理腔室底部之接觸間隙。下法蘭 5 1 b與第一外罩1 6焊接在一起後。焊接後之波紋管密封件 308l83.doc -20- 1306619 5 2内部形成一密封環境。 由於波紋管密封件52内部容納有支持桿4,並且為提供 電訊號給丰導體製程物件處理平臺i,本發明之支持桿*為 空心的,其内有電線與半導體製程物件處理平臺i上之電 阻絲(未圖示)連接,提供電能。因此,支持桿4之空心部分 内為大氣環境,只能使波紋管密封件52内部與支持桿⑽ 邊形成之空間為真空環境’以下稱為波紋管密封空間。7 is connected to the belt light shaft 17, and the belt view (4) has a 4 Γ 7 1 C hair six ′ which coincides with the stripe on the belt to facilitate the large force of the belt and the belt roller shaft. A motor driving device (not shown) is connected to a skin- (not shown). The belt roller shaft 17 is rotated by the belt and drives the motor 26 to rotate. (4) The semiconductor process object processing platform 1 connected to the support rod 4 is driven. Rotate. The number of the ball bearings 163 connected between the rotating shaft 26 and the first outer casing 16 by the ball bearings (6) may be one or more. In the actual example shown in the figure, the number of the ball bearings 163 is two, and the ball bearings 163 which are arranged one above the other are only schematic and do not show their true structure. Any kind of ball bearing. The hoisting ball bearing includes an outer connecting member, an inner connecting member and a bearing disposed therebetween. The inner connecting member is coupled to the rotating shaft 26, and the outer connecting member is coupled to the first outer cover 16. When the rotating shaft 26 rotates, the inner connecting member is rotated by the rotating shaft %$ and the bearings are also rotated together, so that the first outer cover 16 can be kept stationary. The first outer casing 16 is also provided with a coolant pipe (described later in detail) and a coolant outlet 15b. Below the first outer cover 16, there is a coolant input device for cooling (the details are described later) for cooling 108183.doc • 18· Ϊ 306619 liquid. the way. The rotary drive mode of the rotary switch can be implemented by a plurality of belt roller shafts 17 that are configured to be driven by respective motors, and each of them is driven by a motor drive device. : The belt roller shaft of the platform rotating member 17-rotates, and the belt roller shaft 17 of some platform rotating members is also combined, and the belt roller shaft of the remaining platform rotating member is rotated by one or two. The rotation or partial combination is driven by the respective motor driving device to be rotated by a motor driving device. A preferred embodiment of the invention is a 'semiconductor process object processing chamber. There is a four-conductor process object processing platform! Each semiconductor process article processing platform 1 corresponds to a set-platform rotating member. |Medium, adjacent: the belt roller shafts 17 of the two platform rotating members are combined in two, each combination is driven by a belt driven by a motor drive device. Thus, the four processing platforms in the entire semiconductor two-pass object processing chamber require two The motor drive unit can be rotated. For the purpose of processing semiconductor process articles, the semiconductor process article processing apparatus of the present invention should be capable of heating processed semiconductor process articles placed on its processing platform, and the semiconductor process object processing chamber should be a relatively vacuum processing environment. . Some of the sealing means should be provided in the portion of the SUb's connected to the processing chamber to isolate the processing chamber from the atmosphere to create a vacuum environment. It will be detailed below. Referring to Figure 7, the support rod 4 of the treatment platform 1 is internally hollow, and the inside of the shaft 26 is also hollow. The hollow support rod 4 and the shaft % 108183.doc • 19·1306619 are equipped with two cable tubes 23 And 24,1 medium-valued circuit, connected to the semiconductor process: piece:::= power input indication) on the semiconductor processing object processing platform: I! Power: with temperature detection device 23, connection, In the process of processing the semiconductor process object, the surface of the process is processed by the semiconductor process object: the semiconductor process object on the semi-heated surface, and = can be set = thus Suspected to ensure the uniformity of semiconductor process object processing. Referring to FIG. 7 and FIG. 8 together, since the semiconductor process article is disposed: the support rod 4 is extended from the underside of the semiconductor process object processing chamber, the support rod 4 and the semiconductor process object processing chamber must be ensured =::Γ Connected to seal. In accordance with this requirement, the present invention provides a bellows seal 52 under the semiconductor article processing chamber for sealing. Referring to Figure 13, there is shown a cross-sectional view of a bellows seal for use in the present invention. The bellows seal 52 is an axially symmetrical thin-walled round tube assembly. The round tube has a dense annular waveform protruding. Since each annular waveform protrudes, it can be deformed by external force application, and elastically recovers after the external force is removed, so that the wave The seal 52 has elastic recovery and is axially expandable and contractible. The corrugated mantle seal 52 of the present invention is a metal material, such as stainless steel, and has an upper flange ... and a lower flange 51b, wherein the upper flange 51a and the semiconductor process article processing chamber (not shown) are welded together. An elastic sealing ring 5〇 is disposed at the contact surface of the upper flange 5U and the semiconductor process object processing chamber for sealing the contact gap between the bellows seal and the bottom of the semiconductor process object processing chamber. The lower flange 5 1 b is welded to the first outer cover 16 . The bellows seal after welding 308l83.doc -20- 1306619 5 2 forms a sealed environment inside. Since the bellows seal 52 internally houses the support rod 4 and provides electrical signals to the conductor-conducting workpiece processing platform i, the support rod* of the present invention is hollow with wires and semiconductor process object processing platform i Electrical resistance wires (not shown) are connected to provide electrical energy. Therefore, the hollow portion of the support rod 4 has an atmospheric environment, and only the space formed inside the bellows seal 52 and the side of the support rod (10) is a vacuum environment 'hereinafter referred to as a bellows seal space.
處理平臺1下面之支持桿4自波紋管密封件52中心向外延 伸並與轉㈣連接。為連接支持桿4與轉軸%,在支持桿4 與轉軸26之間設置—連接塊41,藉由銷連接或螺栓螺母連 接之方式使支持桿4與轉軸26固定連接。需要說明,在圖8 所示之實施例中’轉軸26與支持桿4亦可有其他之連接方 式比如,轉轴26與支持桿4直接藉由銷連接或螺检螺母 連接’不需要在其間設置連接塊4 i。 請參看圖8’為使得波紋管密封件52内部與支持桿4周邊 形成之波紋管密封空間為真空環境,必須堵住通往此空間 之任何縫隙’使此空間形成為密閉空間。首先,波纹管密 封件52藉由其下法蘭51b與第一外罩16嬋接在—起,二者 之間的接觸面藉由一密封元件16乜來密封,該 164a可設置在轉軸26上開設之 n 通吊,密封元件 仙可為。形環’當然亦可為其他形式之密封材料;接 著,在第-外罩16與轉軸26之間設置一磁密封元件16〇, 來堵住第-外罩16與轉軸26之間通往前述波紋管密封空間 的縫隙’通常’該磁密封元件160為一磁流體密封元^ 108I83.doc •21 - 1306619The support rod 4 below the treatment platform 1 extends from the center of the bellows seal 52 and is connected to the turn (4). In order to connect the support rod 4 and the shaft %, a connecting block 41 is provided between the support rod 4 and the rotating shaft 26, and the support rod 4 is fixedly coupled to the rotating shaft 26 by means of a pin connection or a bolt-and-nut connection. It should be noted that in the embodiment shown in FIG. 8 , the shaft 26 and the support rod 4 may have other connection manners, for example, the shaft 26 and the support rod 4 are directly connected by a pin connection or a screw nut. Set the connection block 4 i. Referring to Fig. 8', in order to make the bellows sealing space formed inside the bellows seal 52 and the periphery of the support rod 4 a vacuum environment, any gap leading to this space must be blocked to make the space a closed space. First, the bellows seal 52 is connected to the first outer cover 16 by its lower flange 51b, and the contact surface between the two is sealed by a sealing member 16乜, which can be disposed on the rotating shaft 26. Open the n-way, the sealing element can be. The ring ' can of course be other forms of sealing material; then, a magnetic sealing element 16 设置 is disposed between the first outer cover 16 and the rotating shaft 26 to block between the first outer cover 16 and the rotating shaft 26 to the bellows. The gap of the sealed space 'usually' the magnetic sealing element 160 is a magnetic fluid seal element ^ 108I83.doc • 21 - 1306619
其具有相當高的密封性能,且當轉軸26轉動時亦可保證第 —外罩〗6與轉軸26之間的接觸間隙被有效地密封;另外, 在連接塊4 1與支持桿4、轉軸26接觸之地方分別設置一密 封元件41a、41b來密封,此等兩個密封元件41a、41b可保 證在轉軸26及支持桿4内流動之大氣不會經過連接塊“與 支持桿4及轉軸26接觸之縫隙進入前述波紋管密封空間, 密封元件41a、41b可採用〇形環或其他形式之密封材料。 藉由以上密封結構可實現完全密閉前述波紋管密封空間, 從而,可保證與之相連通的處理腔室内部有一密封的真空 環境。 工 在半導體製程物件之處理過程中,4理平臺之溫度通常 很高,約為600至900攝氏度左右。因此,在處理過程中, 高溫熱量會沿著陶竟材料之支持桿4向轉軸%及第一外罩 16來傳導,並且熱量亦會向前述之各種密封元件(密封元 = 164a、磁密封元件16〇、密封元件4U、叫傳導由於 密封元件之材料及磁密封元件不能耐高溫,在高溫下會逐 斬發生老化失效’失效後就不再起有效之密封作用。因 此,必須對此等密封元件周圍設置特定之冷卻㈣ 们專導以’降低密封元件周圍之溫度。因此,本發明: 提供了一種獨特的冷卻系統來保證密封元件正 下將詳述。 乍。以 請參看圖12,首先,為冷卻連接塊“與支 26接觸之地方設置的兩個密封元 、 軸 -^ ., ., ^ 4 1 b ’本發明在盥 連接塊…近之轉㈣上端開設了 一第一冷卻槽162。:: 108183.doc -22- 1306619 第一冷卻槽162圍繞連接塊41之周邊設置,並且在圓周上 係不連通的。請再參看圖10及圖9,為向第一冷卻槽162提 供源源不斷的冷卻液’本發明在轉韩2 6之内壁上沿縱轴方 向分別設有一通道(第一通道61及第‘二通道62),第一通道 61及第二通道62分別與轉軸26之第一冷卻槽162相連通, 並且在轉轴26之下端在兩個通道61及62上分別亦設置一第 一轴孔71及第二軸孔72。請再參看圖11之虛線部分,可清 楚地看到轉軸26上設置之第一軸孔71、第二軸孔72、第— 通道61、第二通道62及第一冷卻槽162係相互連通的。 請結合參看圖11及圖12,在轉轴2 6之下端的外面亦設有 一第二外罩28,第二外罩28與第一外罩16上下連接在一 起。第一外罩2 8與轉軸2 6之間有一定的空間,在此空間内 設置有幾個相互隔開之密封元件166,其中每兩個密封元 件166之間分別形成一第一環間隙81及一第二環間隙82。 該雄、封元件166可為〇形環或其他形式之密封材料。如圖” 所示’有一冷卻液接入管15 a自第二外罩2 8上開設之一孔 (未圖示)内接入’並正好及轉軸26之第一軸孔71 —起位於 第一環間隙81内。如此’冷卻液自冷卻液接入管i5a流入 第一環間隙8 1内,再流入轉軸26上之第一軸孔71内,藉由 第一軸孔71使冷卻液注入轉軸26内,並沿著轉軸26上之第 一通道61上行,流入第一冷卻槽162,再下行流入第二通 道62 ’最後藉由轉軸26上之第二轴孔72流出轉軸26,進入 第二環間隙82内,並在第二環間隙82内流動。以上構成第 一循環通道,該第一循環通道用於冷卻密封元件41 a、 108183.doc •23- 1306619 41b ° 接著,為冷卻波紋管密封件52之下法蘭51b與第一外罩 16之間的密封元件1643以及冷卻磁密封元件16〇,本發明 在第一外罩16上靠近該密封元件164a之位置上開設了一第 二冷卻槽167,該第二冷卻槽167構成第二循環通道,該第 二冷卻槽1 67可設在密封元件164a之内側或外側。如圖所 示為本發明之一較佳之實施例,第二冷卻槽167設在密封 元件164a外側,並沿捃封元件164&外側分佈。類似地,第 二冷卻槽167在圓周上係不連通的,並且在第二冷卻槽a? 之某兩個位置處分別設置一孔,一孔為第二冷卻槽入水孔 167&,一為第二冷卻槽出水孔167b,其中,第二冷卻槽入 X孔167a與外接管道84相連接,第二冷卻槽出水孔“π與 一冷卻液輸出管15b連接,用於排冷卻液。 為給第二冷卻槽167提供源源不斷之冷卻液,本發明巧 如地運用外接f道84將第三循環通道與第__循環通道相 互連通。如此,可僅藉由第一循環通道之入水口提供冷卻 液輸入並且充分利用第一循環通道的冷卻液使之再藉由 第二循環通道,進—步冷卻密封元件164a以及冷卻磁密封 兀件160 ’最後再藉由冷卻液輸出管15b將冷卻液排出。以 下將。羊述冷部液在第二循環通道及外接管道^ 況。 請再參看圖11,外接管道84的下端透過第二外罩28上設 置之孔(未圖示)與轉軸26上之第二軸孔72一起位二俨 間隙㈣’外接管道84之上端與第—外罩16上之第二冷= 108183.doc -24 - 1306619 槽167的入水孔167a(圖12)相連接。如此,當冷卻液自第一 循環通道之第二軸孔72流出轉軸26後,冷卻液進入第二環 間隙82内並在其内流動’在第二環間隙咖流動的水會再 流入與第二環間隙82相連之外接管道以’再沿著外接管道 84向上流動,再藉由第-外罩16上之第二冷卻槽167上之 入水孔167a進人第二循環通道内(即,第二冷卻槽^7内), 在第二冷卻槽167内循環-周後,帶走第二冷卻槽167附近 之熱量’最後藉由第二冷卻槽出水孔祕自冷卻液輸出管 15b流出’將熱水排出整個平臺旋轉組合裝置。該第二循 環通道藉由第二冷卻槽167内流動之冷卻液將密封元件 164a以及冷卻磁密封元件16〇附近的熱量帶走。 請再參看圖8,第-冷卻槽162上方恰好係前述之波紋管 密封空間’而第一冷卻槽162與外界大氣環境之冷卻液相 通’在第一冷卻槽162内是大氣環境,因此亦必須將第一 冷卻槽162與波紋管密封空間隔離。為此,在第 ⑹上方固定連接-第-密封件咖,該第_密封㈣二 不僅可起到密封作用,將前述之波紋管密封空間與第_A 部槽162相隔絕,使第一冷卻槽162的大氣不會進入波紋: 2空間’而且可阻擋冷卻液之蒸汽因受高溫向外溢出: 賤出1第-密封件心可為各種密封材料,較佳的實施 方式係不錢鋼材料,並且, 且該不銹鋼材料可緊密地焊接在韓 軸26上。類似地,在第二冷卻槽167上方亦固定連接—第 二密封祕,用以阻擒冷卻液向外溢出或賤出 二 密封件可為各種密封材料,較佳的實施方式係:: 108183.doc -25- 1306619 材料,並且該不銹鋼材料 竹竹了緊#地焊接在第一外罩16上。 應注意,本發明之苐_冰 外罩16與苐二外罩28可如上面所 述係分開成兩個外罩,亦可合成一外罩。 本發明巧妙地藉由外接这、*。Λ 卜接g道84將第一循環通道與第二循 環通道連通在一起,使洽饰 P液在整個冷卻系統内循環之路 徑加長、停留之時間加大 從而充分利用冷卻液的冷卻功 能’並且整個冷卻系統僅需要提供一冷卻液輸入口及排出 、:充刀地用了第—外罩28與轉軸%之間的第一環間 隙81及-第二環間隙82來實現冷卻液在第—循環通道與第 二循環通道之間的交換流通。不僅冷卻效果好,而且成本 低0 以上介紹的僅為基於本發 以此來限定本發明之範圍。 領域内熟知的部件之替換、 施步驟作本技術領域内熟知 發明之揭示以及保護範圍。 明之幾個較佳實施例,並不能 任何對本發明之裝置作本技術 組合、分立,以及對本發明實 的等同改變或替換均不超出本 【圖式簡單說明】 圊!為現有的一半導體製程物件處理裝置之結構圖。 圖2為現有的另一半導體製程物件處理裝置之結構圖。 圖3為本發明之半導體製程物件處理裝置的立體圖。 圖4為本發明之半導體製程物件處理裝置自一視角觀察 的示意圖。 圖5為本發明之半導體製程物件處理農£自另一視角觀 察的不意圖。 108183.doc •26- 1306619 圖6為本發明之一半導體製程物 轉構件的示意圖。 炎里千臺及其平臺旋 圖7為本發明之—半導體製程 轉構件的剖面圖。 +室及其平臺旋 圖8為圖7所示之本發明的半導體製 平喜β^ 切什處理平臺及其 臺疋轉構件之剖面圖的局部放大圖。 圖9為本發明之轉軸内壁冷卻通道的剖面圖。It has a relatively high sealing performance, and also ensures that the contact gap between the first cover 6 and the rotating shaft 26 is effectively sealed when the rotating shaft 26 rotates; in addition, the connecting block 41 is in contact with the support rod 4 and the rotating shaft 26. The sealing elements 41a, 41b are respectively provided for sealing, and the two sealing elements 41a, 41b ensure that the atmosphere flowing in the rotating shaft 26 and the supporting rod 4 does not pass through the connecting block "contact with the support rod 4 and the rotating shaft 26". The slit enters the bellows sealing space, and the sealing member 41a, 41b can adopt a ring-shaped ring or other sealing material. The sealing structure can completely seal the bellows sealing space, thereby ensuring the communication with the sealing device. There is a sealed vacuum environment inside the chamber. During the processing of semiconductor process articles, the temperature of the four platforms is usually very high, about 600 to 900 degrees Celsius. Therefore, during the process, the high temperature heat will follow the ceramics. The support rod 4 of the material is conducted to the shaft % and the first outer cover 16, and the heat is also applied to the various sealing elements described above (sealing element = 164a, magnetic sealing element 16). The sealing element 4U, called conduction, because the material of the sealing element and the magnetic sealing element cannot withstand high temperature, the aging failure will occur gradually at high temperature. After the failure, the effective sealing effect is no longer effective. Therefore, it is necessary to set around the sealing element. Specific Cooling (4) Specialized to 'reduce the temperature around the sealing element. Therefore, the present invention: provides a unique cooling system to ensure that the sealing element will be detailed below. 以. See Figure 12, first, for cooling The connecting block "two sealing elements disposed at the place where the branch 26 is in contact, the shaft -^., ., ^ 4 1 b '. The present invention opens a first cooling groove 162 at the upper end of the 盥 connecting block. 108183.doc -22- 1306619 The first cooling slot 162 is disposed around the periphery of the connecting block 41 and is not circumferentially connected. Referring again to Figures 10 and 9, the first cooling slot 162 is provided continuously. Cooling liquid 'The present invention is provided with a passage (first passage 61 and second 'second passage 62) along the longitudinal axis of the inner wall of the rotor 2, respectively, and the first passage 61 and the second passage 62 are respectively the first of the rotary shaft 26 Cooling tank 162 is connected And a first shaft hole 71 and a second shaft hole 72 are respectively disposed on the two passages 61 and 62 at the lower end of the rotating shaft 26. Referring to the broken line portion of Fig. 11, the setting of the rotating shaft 26 can be clearly seen. The first shaft hole 71, the second shaft hole 72, the first passage 61, the second passage 62 and the first cooling groove 162 are in communication with each other. Referring to FIG. 11 and FIG. 12, at the lower end of the rotating shaft 26 There is also a second outer cover 28 on the outside, and the second outer cover 28 is connected to the first outer cover 16. The first outer cover 28 and the rotating shaft 26 have a certain space, and several spaces are arranged in the space. The sealing element 166 has a first ring gap 81 and a second ring gap 82 formed between each of the two sealing elements 166. The male, sealing element 166 can be a braided ring or other form of sealing material. As shown in the figure, a coolant inlet pipe 15a is inserted into a hole (not shown) formed in the second casing 28, and the first shaft hole 71 of the shaft 26 is located first. In the ring gap 81, the coolant flows into the first ring gap 81 from the coolant inlet pipe i5a, and then flows into the first shaft hole 71 on the rotating shaft 26, and the coolant is injected into the rotating shaft through the first shaft hole 71. 26, and along the first passage 61 on the rotating shaft 26, flowing into the first cooling groove 162, and then flowing down into the second passage 62' and finally flowing out of the rotating shaft 26 through the second shaft hole 72 on the rotating shaft 26, entering the second The ring gap 82 flows within the second ring gap 82. The above constitutes a first circulation passage for cooling the sealing member 41 a, 108183.doc • 23-1306619 41b ° Next, for cooling the bellows a sealing member 1643 between the flange 51b of the sealing member 52 and the first housing 16 and a cooling magnetic sealing member 16A. The present invention opens a second cooling slot on the first housing 16 adjacent to the sealing member 164a. 167, the second cooling channel 167 constitutes a second circulation channel, the second cooling 1 67 may be disposed on the inner side or the outer side of the sealing member 164a. As shown in the drawings, a preferred embodiment of the present invention, the second cooling groove 167 is disposed outside the sealing member 164a and distributed along the outer side of the sealing member 164 & The second cooling groove 167 is not connected on the circumference, and a hole is respectively disposed at two positions of the second cooling groove a?, one hole is the second cooling groove water inlet hole 167&; one is the second The cooling tank outlet hole 167b, wherein the second cooling tank inlet X hole 167a is connected to the external pipe 84, and the second cooling tank water outlet hole "π is connected to a coolant discharge pipe 15b for discharging the coolant. To provide a continuous flow of coolant to the second cooling tank 167, the present invention utilizes an external f-channel 84 to interconnect the third circulating passage with the first _ circulating passage. In this way, the coolant input can be provided only by the water inlet of the first circulation passage and the coolant of the first circulation passage can be fully utilized to further cool the sealing member 164a and the cooling magnetic sealing element by the second circulation passage. 160' Finally, the coolant is discharged by the coolant outlet pipe 15b. Below. The sheep said that the cold liquid is in the second circulation channel and the external pipe. Referring to FIG. 11 again, the lower end of the external pipe 84 passes through a hole (not shown) provided in the second outer cover 28 and a second shaft hole 72 on the rotating shaft 26 together with a gap (4) 'the upper end of the external pipe 84 and the first portion- The second cold on the outer cover 16 = 108183.doc -24 - 1306619 The water inlet holes 167a (Fig. 12) of the slots 167 are connected. Thus, when the coolant flows out of the rotating shaft 26 from the second shaft hole 72 of the first circulation passage, the coolant enters the second ring gap 82 and flows therein. The water flowing in the second ring gap will flow in again. The second ring gap 82 is connected to the external pipe to flow upward along the external pipe 84, and then enters the second circulation channel through the water inlet hole 167a of the second cooling groove 167 on the first outer cover 16 (ie, the second In the cooling tank ^7), after circulating in the second cooling tank 167, the heat in the vicinity of the second cooling tank 167 is taken away. Finally, the water outlet hole of the second cooling tank flows out from the cooling liquid output pipe 15b. The water drains the entire platform rotation assembly. The second circulation passage carries the heat in the vicinity of the sealing member 164a and the cooling magnetic sealing member 16A by the coolant flowing in the second cooling groove 167. Referring to FIG. 8 again, the first cooling channel 162 is just above the bellows sealing space 'and the first cooling channel 162 is connected to the cooling liquid phase of the external atmosphere. The first cooling channel 162 is an atmospheric environment, and therefore The first cooling slot 162 must be isolated from the bellows seal space. To this end, in the (6) above the fixed connection - the first seal member, the first seal (four) two not only can play a sealing role, the aforementioned bellows seal space and the _A portion of the groove 162 is isolated, so that the first cooling The atmosphere of the groove 162 does not enter the corrugation: 2 space 'and can block the vapor of the coolant from overflowing due to high temperature: the first sealing member can be a variety of sealing materials, and the preferred embodiment is a steel material. And, the stainless steel material can be tightly welded to the Korean shaft 26. Similarly, the second cooling channel 167 is also fixedly connected to the second sealing member for blocking the coolant to overflow or the two sealing members can be various sealing materials. The preferred embodiment is: 108183. Doc -25- 1306619 material, and the stainless steel material is tightly welded to the first outer cover 16. It should be noted that the 冰-ice cover 16 and the second cover 28 of the present invention may be divided into two outer covers as described above, or a cover may be combined. The invention is ingeniously by externally connecting this to *. Λ 接 接 g channel 84 connects the first circulation channel and the second circulation channel together, so that the path of the circulation of the liquid P in the entire cooling system is lengthened and the time of staying is increased to fully utilize the cooling function of the coolant' The entire cooling system only needs to provide a coolant inlet and discharge, and the first ring gap 81 and the second ring gap 82 between the first cover 28 and the shaft % are used to achieve the coolant in the first cycle. The exchange between the channel and the second circulation channel. Not only is the cooling effect good, but the cost is low. The above description is only based on the present invention to limit the scope of the present invention. The replacement of components well known in the art, the steps of the invention are well known in the art and the scope of protection. The preferred embodiments of the present invention are not intended to be a combination, a separate embodiment of the present invention, and equivalent changes or substitutions to the present invention are not beyond the scope of the drawings. It is a structural diagram of an existing semiconductor processing object processing device. 2 is a structural view of another conventional semiconductor process article processing apparatus. 3 is a perspective view of a semiconductor process article processing apparatus of the present invention. Figure 4 is a schematic view of the semiconductor process article processing apparatus of the present invention as viewed from a viewing angle. Figure 5 is a schematic view of the semiconductor process article of the present invention being processed from another perspective. 108183.doc • 26-1306619 FIG. 6 is a schematic view of a semiconductor process transfer member of the present invention. Fig. 7 is a cross-sectional view of a semiconductor process rotating member of the present invention. + chamber and its platform rotation Fig. 8 is a partially enlarged view showing a cross-sectional view of the semiconductor flat-panel β^Cash processing platform of the present invention shown in Fig. 7 and its turn-to-turn member. Figure 9 is a cross-sectional view showing the cooling passage of the inner wall of the rotating shaft of the present invention.
圖1〇為本發明之轉軸内壁冷卻通道的另一剖面圖。 圖11為本發明冷卻通道的整體示意圖。 圖12為本發明之轉軸、第一外罩及第二外罩組裝在一起 的剖面圖。 圖13為用於本發明中之波紋管密封件的剖面示意圖 【主要元件符號說明】 1 處理平臺 1' 高頻加熱線圈 2 頂針 3 頂桿 4 支持桿 5 密封裝置 6 上支撐板 7 滑執 8 馬達 8' 矽基片 9 感測器 108183.doc 1306619 9' 碳基座 - 10 下支撐板 * 11 馬達 «» 1Γ 碳基座支持部 • 12 蜗輪蜗桿 13 感測器 14 • 15a 冷卻液接入管 15b 冷卻液輸出管 16 第一外罩 17 皮帶1昆轴 18 卡口 19 集線器 20 訊號放大器 22 腔體 • 23 線纜管/溫度偵測裝置 24 線纜管 26 轉軸 28 第二外罩/處理腔室 - 35' 加熱基座 41 連接塊 41a 密封元件 41b 密封元件 50 密封圈 108183.doc -28- 1306619 51a 上法蘭 51b 下法蘭 52 波紋管密封件 61 第一通道 62 第二通道 71 第一軸孔 72 第二軸孔 81 第一環間隙 82 第二環間隙 84 外接管道 110' 半導體製程物件 116' 載體 117' 加熱基座 121' 轴 130' 通道 160 磁密封元件 162 第一冷卻槽 162a 第一密封件 163 滚珠轴承 164 槽 164a 密封元件 166 密封元件 167 第二冷卻槽 167a 第二冷卻槽入水 167b 第二冷卻槽出水 108183.doc -29-Figure 1 is another cross-sectional view of the cooling passage of the inner wall of the rotating shaft of the present invention. Figure 11 is a schematic overall view of a cooling passage of the present invention. Figure 12 is a cross-sectional view showing the assembly of the rotating shaft, the first outer cover and the second outer cover of the present invention. Figure 13 is a schematic cross-sectional view of a bellows seal used in the present invention. [Main component symbol description] 1 Processing platform 1' High frequency heating coil 2 Thimble 3 Plunger 4 Support rod 5 Sealing device 6 Upper support plate 7 Slipper 8 Motor 8' 矽 Substrate 9 Sensor 108183.doc 1306619 9' Carbon base - 10 Lower support plate * 11 Motor «» 1Γ Carbon base support • 12 Worm gear 13 Sensor 14 • 15a Coolant connection Inlet pipe 15b Coolant outlet pipe 16 First casing 17 Belt 1 Kunming shaft 18 Bayonet 19 Hub 20 Signal amplifier 22 Cavity • 23 Cable pipe / temperature detecting device 24 Cable pipe 26 Rotary shaft 28 Second casing / processing chamber Chamber - 35' Heating base 41 Connection block 41a Sealing element 41b Sealing element 50 Sealing ring 108183.doc -28- 1306619 51a Upper flange 51b Lower flange 52 Bellows seal 61 First passage 62 Second passage 71 First Shaft hole 72 second shaft hole 81 first ring gap 82 second ring gap 84 external pipe 110' semiconductor process article 116' carrier 117' heating base 121' shaft 130' channel 160 Magnetic sealing element 162 First cooling groove 162a First seal 163 Ball bearing 164 Slot 164a Sealing element 166 Sealing element 167 Second cooling tank 167a Second cooling tank water 167b Second cooling tank water 108183.doc -29-
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95103572A TWI306619B (en) | 2006-01-27 | 2006-01-27 | Semiconductor workpiece processing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95103572A TWI306619B (en) | 2006-01-27 | 2006-01-27 | Semiconductor workpiece processing apparatus |
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| Publication Number | Publication Date |
|---|---|
| TWI306619B true TWI306619B (en) | 2009-02-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95103572A TWI306619B (en) | 2006-01-27 | 2006-01-27 | Semiconductor workpiece processing apparatus |
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|---|---|
| TW (1) | TWI306619B (en) |
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2006
- 2006-01-27 TW TW95103572A patent/TWI306619B/en active
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