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TWI305373B - Circuit board and method for fabricating the same - Google Patents

Circuit board and method for fabricating the same Download PDF

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Publication number
TWI305373B
TWI305373B TW94122282A TW94122282A TWI305373B TW I305373 B TWI305373 B TW I305373B TW 94122282 A TW94122282 A TW 94122282A TW 94122282 A TW94122282 A TW 94122282A TW I305373 B TWI305373 B TW I305373B
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Taiwan
Prior art keywords
layer
circuit
metal
circuit layer
dielectric
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TW94122282A
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Chinese (zh)
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TW200703425A (en
Inventor
Ching Fu Horng
Wu Chou Hsu
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Advanced Semiconductor Eng
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Priority to TW94122282A priority Critical patent/TWI305373B/en
Publication of TW200703425A publication Critical patent/TW200703425A/en
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Publication of TWI305373B publication Critical patent/TWI305373B/en

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Description

1305373 16270twf.doc/g 九、發明說明: 【發明所屬之技術領域】 本發明是有關於-種線路基板及其製造方法,且特別 是有關於-種具有多層線路層之線路基板及其製造方法。 【先前技術】 —目前在半導體封裝製財,由於線路基板具有佈線細 密、,組裝緊湊及性能良好等優點,使得線路基板已經成為 # 財使用的構裝元件之-。—般而言,線路基板主要由多 層線路層(patterned dreuitlaye〇及多層介電層(硫耐 layer)父替豐合而成’其中線路層間主要是藉由導電孔 (conductive via)來達成彼此之間的電性連接。 - 圖1A〜1C %示為習知線路基板之製作方法的流程示 •意圖。請參照圖1A,首先提供一基板11〇,其中基板11〇 的=為環氧樹脂(epoxyresin)或含玻璃纖維(giassfiber) 氧樹脂。之後,利用電鍍的方式,於基板UQ上形成 ’、f㉟’接著利用微影與钱刻的方式,將此導電層圖案化 以形成一圖案化導電層12〇。 ^明參照圖1B,接著於圖案化導電層12〇上形成一介 電層m。然後在介電層1;3〇上形成多個盲孔(匕脇 via)。 月多…、圖1C ’之後利用電鑛(eiectr〇piating)的方式, 形導電層於介電層13〇與盲孔135之孔壁上,並且利 用Μ影與餘刻的方式將此導電層圖案化,以分別形成圖案 導電層與電錢盲孔(plated blind via) 145。然後再 1305373 16270twf.doc/g 於圖案化導電層140與電鍍盲孔上145形成一介電層 150。接著’在介電層150上形成多個盲孔155。 請參照圖1D,形成一導電層於介電層15〇與盲孔155 之孔壁上,並且利用微影與|虫刻的方式將此導電層圖案 化,以分別形成圖案化導電層160與電鑛盲孔165。接著, 將銲罩層(solder mask) 170形成於圖案化導電層16〇與 電鍍盲孔165上,並且在銲罩層17〇上形成多個開口 175, 以曝露出線路層16G之多個接點區167,而完成路義 板 1〇〇 。 土 在線路基板100中,為了使圖案化導電層14〇能確實 地電性連接於®案化導線層16G,習知技 盲孔则離導電盲孔145—適當的距離。然 造成線路基板_具有較大_如及較低的佈 不導電盲孔145與165製作不易且品質 不穩疋’因此導電盲孔145與165不 的佈種線路基板’其具有較高 本發明的另—目的就是在提供 方法,以提高線路基板H以 ' 路基板的製造 積。 W 4度以及^小線路基板之體 基於上述目的及发仙 的及其他目的’本發明提出一種線路基板 1305373 I6270twf.doc/g 的製造方法,其包括先提供一核心板、一第一金屬複合層、 一第二金屬複合層、一第一介電層與一第二介電層,其中 核心板之上、下表面分別具有互相電性連接的一第一線路 層與一第二線路層,第一金屬複合層包括一第一金屬層、 一第二金屬層與一第一餘刻阻障層,第一 ♦虫刻阻障層具有 導電性且配置於第一金屬層與第二金屬層之間,第二金屬 複合層包括一第三金屬層、一第四金屬層與一第二钱刻阻 障層,第二蝕刻阻障層具有導電性且配置於第三金屬層與 第四金屬層之間,而第一介電層與第二介電層分別具有多 個第一貫孔與多個第二貫孔。之後,將第二金屬層圖案化, 以形成多個第一凸塊,其中這些第一凸塊之位置是對應第 一貫孔之位置。接著,將第四金屬層圖案化,以形成多個 第二凸塊,其中這些第二凸塊之位置是對應第二貫孔之位 置。其後,將圖案化後之第一金屬複合層與第一介電層壓 合至第一線路層上,以使第一金屬層經由插入這些第一貫 孔之第一凸塊而電性連接第一線路層。並且,將圖案化後 之第二金屬複合層與第二介電層壓合至第二線路層上,以 使第三金屬層經由插入這些第二貫孔之第二凸塊而電性連 接第二線路層。接著,將第一金屬層與第三金屬層圖案化, 以分別形成一第三線路層與一第四線路層。 依照本發明的較佳實施例所述之線路基板的製造方 法,其中在壓合圖案化後之第一金屬複合層、第一介電層 與第一線路層之前,例如更包括對第一線路層及圖案化後 之第一金屬複合層將接觸第一介電層之表面進行一粗化處 1305373 16270twf.doc/g 埋 與第二線路層屬複:層、第二介電層 之第二金屬複合層將接觸 理。 电層之表面進仃—粗化處 法,其+形成^些t路基㈣製造方 障層做為_阻障,第二刻阻 依照本發明的較佳每㈣:、f订心餘刻製程。 法’其中形成這些第二凸方述之線路基板的製造方 障層做為餘刻阻障,對第四金屬====餘刻阻 法,:rrr實施例所述造方 而在形成第:=四=層分別具有多個接點區, -銲罩層於第三後,例如购^ =個開口,這些開口暴露接點區。:外:=陶具有 後’例如更包括在這些接點區上形成銲罩層之 依照本發層。 法,其中第三線路層盥楚阳姑aβ之線路基板的製造方 而在形成第三線路層與第四祕;2財多個接點區’ —金屬層與第三金屬層之表面上“ '例如更包括在第 :是位於後續形成之第三線層’抗氧化 此外’在形成第三線路層與第四線路二= 1305373 16270twf.doc/g 包括覆蓋一 奸早增於弟三線路層與第四線路層上,i 罩層具有多個開口,這4b開口 |露接@ 八’干 "電層 第一介電層、一第三線路屏、隻 多個第-凸塊、多個第二凸塊二 二:Γϊ別;有互相電性連接的-第-線路層盘- 多個第-貫孔。第二介電層配置於核面且2 :多:第二貫孔。第三線路層配 上且: 層:T第二介電層上。第-凸塊二第 塊配晋於/電性連接第一線路層與第三線路層。第一凸 塊配置於這些第二貫孔 弟一凸 線路層。餘刻阻障層配置於路層與第四 間以及這些第一凸塊與第跋t凸塊與弟四線路層之 具有導電性。 9之間’而且蝕刻阻障層 依照本發明的較佳實 括:銲罩層,至少覆蓋第三線路反’例如更包 二線路層與第四線路層分别與苐四線路層,其中第 有多烟開口,這些開口暴露出、:二固接點區’而銲罩層具 括—明=圭^例所述之線路基板,例如更包 個接=,而抗氧化層:置層分別具有多 依照本發明的較佳實 二接點&上。 11 且障層之材質例如包括例所述之線路基板,其令钱刻 10 1305373 16270twf.doc/g 質 例如包括銅1305373 16270twf.doc/g IX. Description of the Invention: [Technical Field] The present invention relates to a circuit board and a method of manufacturing the same, and more particularly to a circuit board having a multilayer wiring layer and a method of manufacturing the same . [Prior Art] - At present, in the semiconductor package manufacturing, the circuit board has the advantages of fine wiring, compact assembly, and good performance, so that the circuit substrate has become a component for use in the financial system. In general, the circuit substrate is mainly composed of a plurality of circuit layers (patterned dreuitlaye and multi-layer dielectric layer (sulfur-resistant layer) fathers for the combination of 'the middle of the circuit layers through the conductive vias to achieve each other 1A to 1C are shown as flow diagrams of a conventional method for fabricating a circuit board. Referring to FIG. 1A, a substrate 11 is first provided, wherein the substrate 11 is = epoxy resin ( Epoxyresin) or gyssfiber oxyresin. Then, by electroplating, ', f35' is formed on the substrate UQ, and then the conductive layer is patterned by lithography and engraving to form a patterned conductive Layer 12〇. Referring to FIG. 1B, a dielectric layer m is formed on the patterned conductive layer 12A. Then, a plurality of blind vias are formed on the dielectric layer 1; 3〇. After FIG. 1C', an electroconductive layer is used to form a conductive layer on the wall of the dielectric layer 13 and the blind hole 135, and the conductive layer is patterned by using a shadow and a residual pattern. To form a patterned conductive layer and a blind hole for the money separately Plated blind via) 145. Then, 1305373 16270twf.doc/g forms a dielectric layer 150 on the patterned conductive layer 140 and the plating via 145. Then, a plurality of blind vias 155 are formed on the dielectric layer 150. 1D, a conductive layer is formed on the walls of the dielectric layer 15 and the via hole 155, and the conductive layer is patterned by lithography and lithography to form the patterned conductive layer 160 and the electric ore, respectively. Blind hole 165. Next, a solder mask 170 is formed on the patterned conductive layer 16 and the plating via 165, and a plurality of openings 175 are formed on the solder mask layer 17 to expose the wiring layer 16G. The plurality of contact regions 167 are completed, and the lands are completed. In the circuit substrate 100, in order to enable the patterned conductive layer 14 to be electrically connected to the scribe wire layer 16G, the conventional technology is blind. The holes are separated from the conductive blind holes 145 by an appropriate distance. However, the circuit substrate _ has a larger _ and lower cloth non-conductive blind holes 145 and 165 are not easy to manufacture and the quality is unstable 因此 so the conductive blind holes 145 and 165 are not Fabric substrate "which has a higher aspect of the invention" is intended to The method is to improve the manufacturing of the circuit substrate H by the 'circuit substrate. The body of the W 4 degree and the small circuit substrate is based on the above object and the other purpose. The present invention proposes the manufacture of the circuit substrate 1305373 I6270twf.doc/g. The method includes first providing a core board, a first metal composite layer, a second metal composite layer, a first dielectric layer and a second dielectric layer, wherein the upper and lower surfaces of the core board are electrically connected to each other a first circuit layer and a second circuit layer, the first metal composite layer comprises a first metal layer, a second metal layer and a first residual barrier layer, and the first etch barrier layer Conductively disposed between the first metal layer and the second metal layer, the second metal composite layer includes a third metal layer, a fourth metal layer and a second etching barrier layer, and the second etching barrier The layer is electrically conductive and disposed between the third metal layer and the fourth metal layer, and the first dielectric layer and the second dielectric layer respectively have a plurality of first through holes and a plurality of second through holes. Thereafter, the second metal layer is patterned to form a plurality of first bumps, wherein the positions of the first bumps are corresponding to the positions of the first uniform holes. Next, the fourth metal layer is patterned to form a plurality of second bumps, wherein the positions of the second bumps are corresponding to the positions of the second through holes. Thereafter, the patterned first metal composite layer is laminated to the first circuit layer with the first dielectric layer, so that the first metal layer is electrically connected via the first bumps inserted into the first through holes. The first circuit layer. And bonding the patterned second metal composite layer and the second dielectric layer to the second circuit layer, so that the third metal layer is electrically connected via the second bumps inserted into the second through holes. Two circuit layers. Next, the first metal layer and the third metal layer are patterned to form a third circuit layer and a fourth circuit layer, respectively. A method of manufacturing a circuit substrate according to a preferred embodiment of the present invention, wherein before the patterning of the first metal composite layer, the first dielectric layer and the first circuit layer, for example, the first circuit is further included The layer and the patterned first metal composite layer will contact the surface of the first dielectric layer to perform a roughening. 1305373 16270twf.doc/g buried and the second circuit layer is a layer: the second layer of the second dielectric layer The metal composite layer will be in contact with the material. The surface of the electric layer enters the 仃-roughening method, and the + forms some t-bases (4) to form the barrier layer as a barrier, and the second obstruction is preferably in accordance with the present invention. . a method in which the manufacturing barrier layer of the circuit substrate in which the second convex surface is formed is used as a residual barrier, and the fourth metal ==== residual etching method, the rrr embodiment is formed in the first embodiment. :=4=Layer has a plurality of contact regions respectively, - after the third layer of the solder mask layer, for example, an opening, these openings expose the contact region. : Exterior: = 陶有后后', for example, including the formation of a solder mask layer on these contact regions. The method, wherein the third circuit layer is formed by the circuit substrate of the Chu Yanggu aβ, and forms the third circuit layer and the fourth secret; the second plurality of contact regions 'on the surface of the metal layer and the third metal layer' 'For example, it is included in the first: is located in the subsequent formation of the third line layer 'anti-oxidation addition' in the formation of the third line layer and the fourth line two = 1305373 16270twf.doc / g including covering a rape early increase in the third line layer with On the fourth circuit layer, the i cover layer has a plurality of openings, and the 4b opening|exposed @八'dry" the first dielectric layer of the electric layer, the third circuit screen, only the plurality of first bumps, and a plurality of The second bumps are two: two; there are electrically connected - the first circuit layer disk - a plurality of first through holes. The second dielectric layer is disposed on the nuclear surface and 2: more: the second through hole. The three-layer layer is matched with: a layer: a second dielectric layer on the T. The first bump-first block is bonded to/electrically connected to the first circuit layer and the third circuit layer. The first bump is disposed in the second layer a through-hole layer of a convex line. The residual barrier layer is disposed on the road layer and the fourth portion, and the first bumps and the second and second layers of the second and fourth layers are electrically conductive. Between 9 and etch barrier layer according to a preferred embodiment of the present invention: a solder mask layer covering at least the third line reverse', for example, a second circuit layer and a fourth circuit layer respectively and a fourth circuit layer, wherein the first Multi-smoke openings, these openings are exposed: the two-bonded contact area' and the solder mask layer includes the circuit substrate described in the example, for example, more than one connection, and the anti-oxidation layer: the layers have respectively According to the preferred embodiment of the present invention, the material of the barrier layer includes, for example, the circuit substrate as described in the example, and the material of the material is 10 1305373 16270 twf.doc/g, for example, including copper.

由於本發明所採用凸塊是實心結構,因 點電技術而言’本發明具有降低聰:訊的優 :點^=1 成線路層的過程中’本發明更可以直接將 曰二/ ;塊上,以縮短接點區之間的跨距(pitch), 中:::接‘:區所佔據的面積。因此’本發明更能夠製造 出咼岔度内連線化以及微小化線路基板。 為讓本IΘ之上述和其他目的、特徵和優點能更明顯 易懂,下域舉較佳實施例,並配合所關式,作詳細說 明如下。 【實施方式】 圖2A〜2G繪示為本發明一實施例之線路基板的製作 方,的流辟意®。請參照圖2A,本實施例包括先提供金 屬複合層210。金屬複合層21〇包括金屬層212、214以及 蝕刻阻障層216,其中蝕刻阻障層216具有導電性,而且 蝕刻阻障層216係配置於金屬層212與214之間。在—較 佳的實施方式中,金屬層212、214之材質例如為銅,蝕刻 阻障層216的例如為鎳。 請參照圖2B ’例如利用貼附乾膜光阻(dry film photoresist)、利用旋轉塗佈(spinc〇ating)液態光阻或 是其它的方式,分別將光阻層310a與31〇b形成於金屬層 212與214的表面上。之後,例如利用微影與蝕刻的方式, 1305373 16270twf.doc/g :=:層216為_阻障,將金屬層则案化, :ΐ: '然後,移除殘留的光阻層廳與 ,ΐ可ίί時移除未被凸塊23。覆蓋之1 虫刻阻 1 2曰30作αΪ得注意是’雖然本實施例以截面為梯形之凸 2狀。作絲舰明,但本翻財限定凸塊23G之截面 220勺清ifyf圖兀’提供一金屬複合層220。金屬複合層 已括1屬層222、224以及钱刿p且陸厗? 阻障層226具有導電性,而日―早層6,其中則 屬厗而且蝕刻阻障層226係配置於金 盥^24之㈣24之間。在—較佳的實施方式中,金屬層222 ”=材質例如為銅,餘刻阻障層]的例如為錄。 2D ’例如利用貼附乾膜光阻、利用旋轉塗 或是其它的方式,分別將光阻層315&與315b 輪;的:Γ2ίΐ22:的表面上。之後,例如利用微影 麗H的方式’並且⑽刻轉層226為㈣阻障,將金 2 224圖案化,以形成多個凸塊· 的先阻層315a與皿。另外,也可 24〇覆蓋之蝕刻阻障層226。值得.、主咅是,破凸塊 =為梯形之凸塊作為舉例“ 凸塊240之截面形狀。 月I不限疋 層的:f:提供Γ心板250 ’其中核心板250之内 ^? σ為局分子聚合物、含有玻璃纖維之高分子聚 5物、環氧樹脂或其他材質。核心板25〇 人 1305373 16270twf.doc/g 間係彼此電性連接。在本實施例中,線路層252係經由電 鍍通孔256而與線路層252電性連接。 凊繼續參照圖2E’提供介電層260與265。介電層260 與265分別具有多個貫孔262與267,其中形成貫孔262 與267的方式例如為機械鑽孔、雷射鑽孔或是其它的鑽孔 方式。值得注意的是,貫孔262、267的位置係分別對應於 金屬層212、222上之凸塊23〇、24〇的位置,以使得金屬 • 層212、222分別沿方向314、316而與介電層26〇、2幻 壓合時,每一個凸塊230、240均能夠插入相對應之貫孔 262 或 267 中。 ' 請共同參照2E與2F,將圖案化後的金屬複合層22〇 . 與介電層260沿方向314與核心板250壓合,並且將圖案 化後的金屬複合層210與介電層265沿方向316盘坊心拓 * 250壓合,以使每一個凸塊230崎入相對應= 262或267中,其中壓合的方式例如是採用加熱壓合。如 此一來,金屬層212、222以及線路層252、254便可以藉 _ 由凸塊230、240與電鍍通孔256而彼此電性連接(如^ 2F所示)。 在一較佳的實施方式中,於進行壓合之前,還更可以 先對面向介電層265之圖案化後金屬複合層21〇的表面進 行粗化處理,以使圖案化後金屬複合層21〇與介電層265 之間具有良好的結合,其中粗化處理例如為棕氧化^ =〇wn oxidation)或是黑氧化(black oxidation)。 或者,在進行壓合之前’也可對面向介電層26〇之圖 1305373 I6270twf.doc/g 案化後金屬複合層220的表面進行粗化處理,以使圖案化 後金屬複合層220與介電層260之間具有良好的結合,其 中粗化處理例如是棕氧化或是黑氧化。當然,本實施例在 進行壓合之前,更可以同時對圖案化後金屬複合層21〇與 220的表面進行粗化處理。 '、 請參照® 2G,例如以微影與钱刻的方式,將金屬層 212與222 _案化而形成線路層仙與222&,以完成一 ^Since the bump used in the present invention is a solid structure, the present invention has the advantage of reducing the power: the advantage of the point: ^^ into the circuit layer due to the point-and-point technology. The present invention can directly directly implement the second layer; To shorten the pitch between the contact areas, the middle::: is connected to the area occupied by the area. Therefore, the present invention is more capable of manufacturing a wiring within a twist and miniaturizing a circuit board. The above and other objects, features and advantages of the present invention will become more apparent and understood. [Embodiment] Figs. 2A to 2G are diagrams showing the manufacture of a circuit board according to an embodiment of the present invention. Referring to Figure 2A, this embodiment includes providing a metal composite layer 210 first. The metal composite layer 21A includes metal layers 212, 214 and an etch barrier layer 216, wherein the etch barrier layer 216 is electrically conductive, and the etch barrier layer 216 is disposed between the metal layers 212 and 214. In a preferred embodiment, the material of the metal layers 212, 214 is, for example, copper, and the etch barrier layer 216 is, for example, nickel. Referring to FIG. 2B, the photoresist layers 310a and 31b are respectively formed on the metal by, for example, applying a dry film photoresist, using a spin coating liquid crystal or other means. On the surface of layers 212 and 214. Thereafter, for example, by means of lithography and etching, 1305373 16270twf.doc/g:=: layer 216 is a barrier, and the metal layer is formed, ΐ: 'then, remove the residual photoresist layer hall,未被 ί ί ί ί ί ί ί ί ί ί ί Covering 1 Insect resistance 1 2曰30 as αΪ Note that although this embodiment has a convex shape with a trapezoidal cross section. As a silk ship, but the section of the fortune-defining bump 23G 220 spoon clear ingf 兀 ' provides a metal composite layer 220. The metal composite layer has included the 1 genus layer 222, 224 and the money 刿p and the land 厗? The barrier layer 226 is electrically conductive, while the day-to-earth layer 6, which is 厗 and the etch barrier layer 226, is disposed between the (four) 24 of the metal. In a preferred embodiment, the metal layer 222 ′ = material is, for example, copper, and the remaining barrier layer is, for example, recorded. 2D 'for example, by attaching a dry film photoresist, using spin coating or the like, The photoresist layer 315 & and the 315b wheel are respectively on the surface of: Γ2ίΐ22: after that, for example, by using the method of lithography H and (10) the layer 226 is a (four) barrier, the gold 2 224 is patterned to form a plurality of bumps of the first resist layer 315a and the dish. Alternatively, the etch barrier layer 226 may be covered by 24 Å. It is worthwhile. The main 咅 is that the bump = the trapezoidal bump is exemplified as "the bump 240" Section shape. The month I is not limited to the layer: f: provides the core board 250 ’ of which the core board 250 is inside? σ is a molecular polymer, a polymer containing glass fiber, an epoxy resin or other materials. The core board 25〇人 1305373 16270twf.doc/g is electrically connected to each other. In the present embodiment, the wiring layer 252 is electrically connected to the wiring layer 252 via the via hole 256.介 Continue to provide dielectric layers 260 and 265 with reference to Figure 2E'. The dielectric layers 260 and 265 have a plurality of through holes 262 and 267, respectively, wherein the through holes 262 and 267 are formed by mechanical drilling, laser drilling or other drilling methods, for example. It should be noted that the positions of the through holes 262, 267 correspond to the positions of the bumps 23 〇, 24 上 on the metal layers 212, 222, respectively, so that the metal layers 212, 222 are respectively oriented in the directions 314, 316. When the electrical layers 26, 2 are slid, each of the bumps 230, 240 can be inserted into the corresponding through hole 262 or 267. 'Please refer to 2E and 2F together, and the patterned metal composite layer 22〇 and the dielectric layer 260 are pressed in the direction 314 with the core plate 250, and the patterned metal composite layer 210 and the dielectric layer 265 are along Direction 316 Pantoxin* 250 is pressed so that each of the bumps 230 is in the corresponding = 262 or 267, wherein the pressing is performed by, for example, heating and pressing. As such, the metal layers 212, 222 and the circuit layers 252, 254 can be electrically connected to each other (as shown by ^2F) by the bumps 230, 240 and the plated through holes 256. In a preferred embodiment, the surface of the patterned metal composite layer 21 facing the dielectric layer 265 may be roughened before the pressing, so that the patterned metal composite layer 21 is patterned. There is a good bond between the germanium and the dielectric layer 265, wherein the roughening treatment is, for example, brown oxidation or black oxidation. Alternatively, the surface of the metal composite layer 220 after the dielectric layer 26 can be roughened before the press-bonding is performed to make the patterned metal composite layer 220 and the patterned metal composite layer 220 There is a good bond between the electrical layers 260, wherein the roughening treatment is, for example, brown oxidation or black oxidation. Of course, in this embodiment, the surface of the patterned metal composite layers 21 and 220 may be roughened at the same time before the pressing. ', please refer to ® 2G, for example, in the form of lithography and money engraving, the metal layers 212 and 222 are formed to form the circuit layer fairy and 222 & to complete a ^

路基板200。另外’由於金屬層214與224是分別用來形 成貫穿介電層260與265的凸境24〇與23(),而金屬層212 與222則分別是用來形成線路層212a與222a,故金屬層 214與224品要較大的厚度,而金屬層2與從之厚度 ^:太大。值得注意的是,若本實補沒有在凸塊230 喊後,將未被凸塊230與24〇所覆蓋的姓刻阻障層216 除時’本實施例還可以在形成線路層212a與220a 的乂知中,將不需要的㈣阻障層216與226移除。 ,在較佳的實施方式中,形成線路層 212a 與 222a $ ; 了選擇性地在線路層212a與2瓜上形成銲罩層Μ 7。|干罩層挪與奶具有多個開口⑷會示),豆 :曝露出線路層212a與心之接點區。接 ,成抗氧化層29〇a與麟於線 2a 接點區280上。苴中,於与& β /、zzza 4 例如為電鑛。糾,r ^思層29Ga與29%的形成方式 盘一八思m 几孔化層290a例如包括一鎳層292a 二;;:’抗氧化層29%例如包括-鎳層_與-至層b。右採用電鍍方式形成抗氧化層290a與290b, 1305373 16270twf.doc/g 貝=路層j 12a與222a上可能f設計有電鍵短線段( stub)(未繪示),或採用其 成整個抗氧化層27〇。Road substrate 200. In addition, since the metal layers 214 and 224 are respectively used to form the protrusions 24〇 and 23() through the dielectric layers 260 and 265, and the metal layers 212 and 222 are used to form the wiring layers 212a and 222a, respectively, the metal Layers 214 and 224 have a greater thickness, while metal layer 2 and thickness from it are too large. It should be noted that if the real complement is not shouted by the bump 230, the surname barrier layer 216 not covered by the bumps 230 and 24〇 is removed. This embodiment can also form the circuit layers 212a and 220a. In the knowledge, the (four) barrier layers 216 and 226 are removed. In a preferred embodiment, the wiring layers 212a and 222a are formed to selectively form a solder mask layer 7 on the wiring layers 212a and 2. The dry cover layer and the milk have a plurality of openings (4), and the beans: expose the contact layer of the circuit layer 212a and the heart. The anti-oxidation layer 29〇a and the lining line 2a are connected to the contact area 280. In the middle, the & β /, zzza 4 is for example an electric mine. Correction, r ^ layer 29Ga and 29% formation mode disk 八 思 m several holes 290a, for example, including a nickel layer 292a 2;;: 'antioxidant layer 29%, for example, including - nickel layer _ and - to layer b . The right side is formed by electroplating to form anti-oxidation layers 290a and 290b, 1305373 16270twf.doc/g, and the surface layer j 12a and 222a may be designed with a short stub (not shown) or used to form an entire antioxidant. Layer 27〇.

,圖2H〜21!會示為完成如圖2F所示之步驟後,另一種 =線路層與抗氧化層的方法。請參照圖2H,在此實施方 =,於形成線路層2仏與2咖之前,可先在金屬層212 。222之表面形成一層抗氧化層29〇a與29〇b,盆中形成 f氧化層鳥與2遍的方法例如為電鑛,並且抗氧化層 =列如包括-鎳層292續—金層⑽,抗氧化層鳩 例如包括一鎳層292b與一金層294b。 請參照圖21,例如利用微影與則製程,將抗氧化層 a ” 290b圖案化,其中圖案化後的抗氧化層2術斑 HI置於金屬層212與222的位置係位在將要形成的線 路層212a與222a的接點區280上。值得一提的是,若採 用圖2H〜2J的方法形成圖案化之抗氧化層270與275時, 在後續製程中就可以不需要電鍍短線段的輔助。 由圖2G可知,本實施例之線路基板2〇〇,豆包括核 心板250、介電層26〇與265、線路層212a、222a、252 與254、多個230與240以及蝕刻阻障層216與 板㈣之上、下表面分別具有互相電性連接的線路層252 與254。介電層260配置於核心板25〇之上表面,且呈有 多個262貫孔。介電層265配置於核心板25〇之下表面, 且具有多個貫孔267。線路層222a配置於介電層26〇上, 而線路層212a配置於介電層265上。凸塊24〇配置於貫孔Fig. 2H~21! will be shown as another method of completing the circuit layer and the oxidation resistant layer after the step shown in Fig. 2F. Referring to FIG. 2H, in this embodiment, before the formation of the circuit layers 2 and 2, the metal layer 212 may be used first. The surface of 222 forms an anti-oxidation layer 29〇a and 29〇b, and the method of forming f oxide layer bird and 2 times in the basin is, for example, an electric ore, and the anti-oxidation layer=column includes a nickel layer 292 continuous-gold layer (10) The anti-oxidation layer 鸠 includes, for example, a nickel layer 292b and a gold layer 294b. Referring to FIG. 21, the oxidation resistant layer a" 290b is patterned, for example, by using a lithography process, wherein the patterned anti-oxidation layer 2 is placed at the position of the metal layers 212 and 222 to be formed. On the contact region 280 of the circuit layers 212a and 222a, it is worth mentioning that if the patterned anti-oxidation layers 270 and 275 are formed by the method of FIGS. 2H to 2J, the electroplated short segments may not be needed in the subsequent process. As can be seen from FIG. 2G, the circuit substrate 2 of the present embodiment includes a core board 250, dielectric layers 26 and 265, circuit layers 212a, 222a, 252 and 254, a plurality of 230 and 240, and an etch barrier. The upper and lower surfaces of the layer 216 and the board (4) respectively have circuit layers 252 and 254 electrically connected to each other. The dielectric layer 260 is disposed on the upper surface of the core board 25 and has a plurality of 262 through holes. The dielectric layer 265 It is disposed on the lower surface of the core plate 25B and has a plurality of through holes 267. The circuit layer 222a is disposed on the dielectric layer 26, and the circuit layer 212a is disposed on the dielectric layer 265. The bumps 24 are disposed in the through holes

15 1305373 16270twf.doc/g 2 並電性連接線路層222a與252。凸塊23Θ配置於 =二貝孔267内,並電性連接線路層212a與254。蝕刻阻 P早f 216與226分別配置於凸塊23〇與線路層2Ha之間以 及這些凸塊24〇與線路層2咖之間,而且侧阻障層 與226具有導電性。 立圖2J繪示為本發明另一實施例之線路基板的剖面示 w圖明參照圖2J,由於本實施例之線路基板2〇〇,相似於 上述之線路基板扇,因此相同之標號係表示相同之元 件於此不再多作贅述。本實施例之線路基板2〇〇,與上述 之線路基板2GG之不同處主要在於線路層252與25 的電!·生連接除了可以為圖2G所示之電鑛通孔256,更可以 利用先前所揭露之製造凸塊230與240的方法,來f作中 ^塊258簡線路層252與254電性連接。換句話說,雖 ;、、、、上述之實施例係藉由電鑛通孔256或凸塊258而將 層252電性連接於線路層254,本實施例更可以利用導 c〇iumn)或其他的導電媒介來完成_ 層252與254之間的電性連接。 綜上所述,由於本發明係利用半導體製程,直 ,製作於線路層上’因此相較於f知技術中電錢通孔的 作’本發明具有製程上相對地簡單的優點。 、、 铲、甬明之凸塊為實心的結構’因此相較於採用電 又、孔的白知技術而言,本發明具有降低訊號雜訊的 接二義2成線路層的過程中’本發明更可以直接將 ;凸塊上。如此一來,本發明可以縮短接點區 16 1305373 16270twf.doc/g 之間的&距並且縮小接點區所伯 =:線路基板具有高密度内連線化以:二 ㈣已以較佳實施例揭露如上,料並非用以 習此技藝者’在不脫離本發明之精神 車巳圍 田可作些許之更動與潤飾,因此本發明之保含蒦15 1305373 16270twf.doc/g 2 and electrically connect the circuit layers 222a and 252. The bumps 23 are disposed in the = two via holes 267 and electrically connected to the circuit layers 212a and 254. The etch resistance P is pre-disposed between the bump 23 and the wiring layer 2Ha, and between the bumps 24 and the wiring layer 2, and the side barrier layers 226 are electrically conductive. Figure 2J is a cross-sectional view of a circuit substrate according to another embodiment of the present invention. Referring to Figure 2J, since the circuit substrate 2 of the present embodiment is similar to the above-mentioned circuit substrate fan, the same reference numerals are used. The same elements will not be described again here. The circuit substrate 2A of the present embodiment differs from the above-mentioned circuit substrate 2GG mainly in the electrical connection of the circuit layers 252 and 25. In addition to the electric mine through hole 256 shown in FIG. 2G, the prior art can utilize the previous The disclosed method of fabricating the bumps 230 and 240 is electrically connected to the 252 circuit layers 252 and 254. In other words, although the embodiment of the present invention electrically connects the layer 252 to the circuit layer 254 by the electric ore via 256 or the bump 258, the embodiment may further utilize a conductive layer or Other conductive media are used to complete the electrical connection between layers 252 and 254. In summary, since the present invention utilizes a semiconductor process, it is fabricated directly on the wiring layer. Therefore, the present invention has a relatively simple advantage in the process of the present invention. The shovel and the shovel of the shovel are solid structures. Therefore, the present invention has the principle of reducing the signal noise by connecting the second layer of the circuit layer. More can be directly; on the bump. In this way, the present invention can shorten the & distance between the contact area 16 1305373 16270twf.doc/g and reduce the contact area. =: The circuit substrate has a high density of interconnecting: 2 (4) has been better The embodiment disclosed above is not intended to be used by those skilled in the art to make some modifications and retouchings without departing from the spirit of the present invention.

範圍當視後附之申請專利範圍所界定者為準。 DThe scope is subject to the definition of the scope of the patent application attached. D

【圖式簡單說明】 圖1A〜m!會示為習知線路基板之製作方法的流程示 意圖。 圖2A〜2G 方法的流程示意 繪示為本發明一實施例之線路基板的製作 圖。 圖2H〜21繪示為完成如圖2F所示之步驟後,另一 形成線路層與抗氧化層的方法。 圖2J繪示為本發明另—實施例之線路基板的剖面八 意圖。 Π不 【主要元件符號說明】 100、200 :線路基板 110 :基板 112、262、267 :貫孔 114 :開口 120a、120b :導電金屬層 130、256 :電鍍通孔 140a、140b、252、254、212a、222a :線路層 1305373 16270twf.doc/g 150a、150b、270、275 :銲罩層 210、220 :金屬複合層 212、214、222、224 :金屬層 216、226 :蝕刻阻障層 310a、310b、315a、315b :光阻層 230、240 :凸塊 2 5 0 .核心板 260、265 :介電層 290a、290b :抗氧化層 292a、292b :鎳層 294a、294b :金層 160、280 :接點區 310、312、314、316 :方向BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1A to m! show the flow of a conventional method of manufacturing a circuit board. 2A to 2G are schematic diagrams showing the fabrication of a circuit substrate according to an embodiment of the present invention. 2H to 21 illustrate another method of forming a wiring layer and an oxidation resistant layer after the step shown in Fig. 2F is completed. 2J is a cross-sectional view of a circuit substrate according to another embodiment of the present invention. ΠNot [Main component symbol description] 100, 200: circuit substrate 110: substrate 112, 262, 267: through hole 114: opening 120a, 120b: conductive metal layer 130, 256: plated through holes 140a, 140b, 252, 254, 212a, 222a: circuit layer 1305373 16270twf.doc / g 150a, 150b, 270, 275: solder mask layer 210, 220: metal composite layer 212, 214, 222, 224: metal layer 216, 226: etch barrier layer 310a, 310b, 315a, 315b: photoresist layer 230, 240: bump 2 50. core board 260, 265: dielectric layer 290a, 290b: oxidation resistant layer 292a, 292b: nickel layer 294a, 294b: gold layer 160, 280 : Contact area 310, 312, 314, 316: direction

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Claims (1)

1305373 16270twf.doc/g 十、申請專利範圍: 1.一種線路基板的製造方法,包括: 提供一核心板、一第一金屬複合層、一第二金屬複合 層、一第一介電層與一第二介電層,其中該核心板之上、 下表面分別具有互相電性連接的一第一線路層與一第二線 路層,該第一金屬複合層包括一第一金屬層、一第二金屬 層與一第一蝕刻阻障層,該第一蝕刻阻障層具有導電性且 $ 配置於該第一金屬層與該第二金屬層之間,該第二金屬複 合層包括一第三金屬層、一第四金屬層與一第二姓刻阻障 層,該第二蝕刻阻障層具有導電性且配置於該第三金屬層 與該第四金屬層之間,而該第一介電層與該第二介電層分 別具有多個第一貫孔與多個第二貫孔; 將該第二金屬層圖案化,以形成多個第一凸塊,其中 * 該些第一凸塊之位置是對應該些第一貫孔之位置; 將該第四金屬層圖案化,以形成多個第二凸塊,其中 該些第二凸塊之位置是對應該些第二貫孔之位置; • 將圖案化後之該第一金屬複合層與該第一介電層壓合 至該第一線路層上,以使該第一金屬層經由插入該些第一 貫孔之該些第一凸塊而電性連接該第一線路層,並且 將圖案化後之該第二金屬複合層與該第二介電層壓合至該 第二線路層上,以使該第三金屬層經由插入該些第二貫孔 之該些第二凸塊而電性連接該第二線路層;以及 將該第一金屬層與該第三金屬層圖案化,以分別形成 一第三線路層與一第四線路層。 19 1305373 16270twf.doc/g 法,4 圍第1項所述之線路基板的製造方 電層盘該第料―金屬複合層、該第一介 -=2。屬複合層將接觸該第-介電層之表面進行1305373 16270twf.doc/g X. Patent Application Range: 1. A method for manufacturing a circuit substrate, comprising: providing a core board, a first metal composite layer, a second metal composite layer, a first dielectric layer and a a second dielectric layer, wherein the upper and lower surfaces of the core board respectively have a first circuit layer and a second circuit layer electrically connected to each other, the first metal composite layer comprising a first metal layer and a second a metal layer and a first etch barrier layer, the first etch barrier layer being electrically conductive and disposed between the first metal layer and the second metal layer, the second metal composite layer comprising a third metal a layer, a fourth metal layer and a second photoresist layer, the second etch barrier layer is electrically conductive and disposed between the third metal layer and the fourth metal layer, and the first dielectric The layer and the second dielectric layer respectively have a plurality of first through holes and a plurality of second through holes; patterning the second metal layer to form a plurality of first bumps, wherein the first bumps The position is corresponding to the position of the first through hole; the fourth metal layer map Forming a plurality of second bumps, wherein the positions of the second bumps are corresponding to positions of the second through holes; • patterning the first metal composite layer and the first dielectric Laminated to the first circuit layer, such that the first metal layer is electrically connected to the first circuit layer via the first bumps inserted into the first through holes, and the patterned first layer The second metal composite layer and the second dielectric layer are laminated on the second circuit layer, so that the third metal layer is electrically connected to the second metal via the second bumps inserted into the second through holes. a second circuit layer; and the first metal layer and the third metal layer are patterned to form a third circuit layer and a fourth circuit layer, respectively. 19 1305373 16270twf.doc / g method, 4 manufacturing circuit board according to the first item, the first layer - metal composite layer, the first dielectric -= 2. a composite layer that will contact the surface of the first dielectric layer 法,利範圍第1項所述之線路基板的製造方 電層與81案化後之該第二金屬複合層、該第二介 化後層之前,更包括對該第二線路層及圖案 -粗化^理Γ、屬複合層將接觸該第二介電層之表面進行 法,專利範圍第1項所述之線路基板的製造方 成该些第一凸塊之方法包括: 進行1㈣阻障層做為細阻障,對該第二金層廣 疋订μ影蝕刻製裎。 不 法,龙專利1項所述之線路基板的製造方 二τ成該些第二凸塊之方法包括: 進行二細m障層做為似,]轉,對該第四金肩廣 μ衫银刻製程。 法,其t?請專利範圍第1項所述之線路基板的製造方 區,而在5亥第三線路層與該第四線路層分別具有多個换1占 形成該第三線路層與該第四線路層之後,更包#: 中讀—銲罩層於該第三線路層與該第四線路層上,其 心7于罩層具有多個開口,該些開口暴露該些接點區。 .如申請專利範圍第6項所述之線路基板的製造方 20 1305373 16270twf.doc/g 法,其中在形成該銲罩層之後,更包括: 在該些接點區上形成一抗氧化層。 8. 如申請專利範圍第1項所述之線路基板的製造方 法,其中該第三線路層與該第四線路層分別具有多個接點 區,而在形成該第三線路層與該第四線路層之前,更包括: 在該第一金屬層與該第三金屬層之表面上形成一抗 氧化層,該抗氧化層是位於後續形成之該第三線路層與該 第四線路層的該些接點區。 9. 如申請專利範圍第8項所述之線路基板的製造方 法,其中在形成該第三線路層與該第四線路層之後,更包 括: 覆蓋一銲罩層於該第三線路層與該第四線路層上,其 中該銲罩層具有多個開口,該些開口暴露該些接點區上的 該抗氧化層。 10. —種線路基板,包括: 一核心板,該核心板之上、下表面分別具有互相電性 連接的一第一線路層與一第二線路層; 一第一介電層,配置於該核心板之上表面,該第一介 電層具有多個第一貫孔; 一第二介電層,配置於該核心板之下表面,該第二介 電層具有多個第二貫孔; 一第三線路層,配置於該第一介電層上; 一第四線路層,配置於該第二介電層上; 多個第一凸塊,配置於該些第一貫孔内,並電性連接 21 1305373 16270twf.doc/g 該第一線路層與該第三線路層; 多個第二凸塊,配置於該些第二貫孔内,並電性連接 該第二線路層與該第四線路層;以及 一蝕刻阻障層,配置於該些第二凸塊與該第四線路層 之間以及該些第一凸塊與該第三線路層之間,該蝕刻阻障 層具有導電性。 11. 如申請專利範圍第10項所述之線路基板,更包括 一銲罩層,至少覆蓋該第三線路層與該第四線路層,其中 該第三線路層與該第四線路層分別具有多個接點區,而該 銲罩層具有多個開口,該些開口暴露該些接點區。 12. 如申請專利範圍第10項所述之線路基板,更包括 一抗氧化層,其中該第三線路層與該第四線路層分別具有 多個接點區,而該抗氧化層配置於該些接點區上。 13. 如申請專利範圍第10項所述之線路基板,其中該 蝕刻阻障層之材質包括鎳。 14. 如申請專利範圍第10項所述之線路基板,其中該 第一線路層、該第二線路層、該第三線路層以及該第四線 路層之材質包括銅。 22The method, the manufacturing circuit layer of the circuit substrate according to item 1 of the first aspect, and the second metal composite layer and the second dielectric layer after the invention, further comprising the second circuit layer and the pattern- The roughening method and the plexus layer contacting the surface of the second dielectric layer, and the method for manufacturing the circuit substrate according to the first aspect of the patent to form the first bumps includes: performing a 1 (four) barrier The layer is used as a thin barrier, and the second gold layer is widely etched. Unlawful, the method for manufacturing the second substrate of the circuit substrate described in the Dragon Patent 1 includes: performing a two-dimensional m barrier as a similar, turning, the fourth gold shoulder Engraving process. The method of manufacturing a circuit board of the circuit board according to the first aspect of the patent, and having a plurality of replacements in the fifth circuit layer and the fourth circuit layer respectively forming the third circuit layer and After the fourth circuit layer, the package #: medium read-welding layer is on the third circuit layer and the fourth circuit layer, and the core 7 has a plurality of openings in the cover layer, and the openings expose the contact regions . The method of manufacturing a circuit board according to claim 6, wherein the forming of the solder mask layer further comprises: forming an anti-oxidation layer on the contact regions. 8. The method of manufacturing a circuit substrate according to claim 1, wherein the third circuit layer and the fourth circuit layer respectively have a plurality of contact regions, and the third circuit layer and the fourth are formed. Before the circuit layer, the method further includes: forming an anti-oxidation layer on the surface of the first metal layer and the third metal layer, the anti-oxidation layer being located in the subsequently formed third circuit layer and the fourth circuit layer Some contact areas. 9. The method of manufacturing the circuit substrate of claim 8, wherein after forming the third circuit layer and the fourth circuit layer, the method further comprises: covering a third wiring layer with the solder mask layer The fourth circuit layer, wherein the solder mask layer has a plurality of openings, the openings exposing the anti-oxidation layer on the contact regions. 10. A circuit board, comprising: a core board having a first circuit layer and a second circuit layer electrically connected to each other; and a first dielectric layer disposed on the core board a first dielectric layer having a plurality of first through holes; a second dielectric layer disposed on a lower surface of the core plate, the second dielectric layer having a plurality of second through holes; a third circuit layer disposed on the first dielectric layer; a fourth circuit layer disposed on the second dielectric layer; a plurality of first bumps disposed in the first through holes, and Electrical connection 21 1305373 16270twf.doc / g the first circuit layer and the third circuit layer; a plurality of second bumps disposed in the second through holes, and electrically connected to the second circuit layer and the a fourth circuit layer; and an etch barrier layer disposed between the second bumps and the fourth circuit layer and between the first bumps and the third circuit layer, the etch barrier layer has Electrical conductivity. 11. The circuit substrate of claim 10, further comprising a solder mask layer covering at least the third circuit layer and the fourth circuit layer, wherein the third circuit layer and the fourth circuit layer respectively have A plurality of contact regions, and the solder mask layer has a plurality of openings that expose the contact regions. 12. The circuit substrate of claim 10, further comprising an oxidation resistant layer, wherein the third circuit layer and the fourth circuit layer respectively have a plurality of contact regions, and the oxidation resistant layer is disposed on the These are on the contact area. 13. The circuit substrate of claim 10, wherein the material of the etch barrier layer comprises nickel. 14. The circuit substrate of claim 10, wherein the material of the first circuit layer, the second circuit layer, the third circuit layer, and the fourth circuit layer comprises copper. twenty two
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