[go: up one dir, main page]

TWI384542B - Processing device and surface treatment fixture - Google Patents

Processing device and surface treatment fixture Download PDF

Info

Publication number
TWI384542B
TWI384542B TW096142480A TW96142480A TWI384542B TW I384542 B TWI384542 B TW I384542B TW 096142480 A TW096142480 A TW 096142480A TW 96142480 A TW96142480 A TW 96142480A TW I384542 B TWI384542 B TW I384542B
Authority
TW
Taiwan
Prior art keywords
processed
treatment
treated
liquid
processing
Prior art date
Application number
TW096142480A
Other languages
Chinese (zh)
Other versions
TW200830398A (en
Inventor
宮成淳
Original Assignee
東京應化工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東京應化工業股份有限公司 filed Critical 東京應化工業股份有限公司
Publication of TW200830398A publication Critical patent/TW200830398A/en
Application granted granted Critical
Publication of TWI384542B publication Critical patent/TWI384542B/en

Links

Classifications

    • H10P72/0414

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Description

處理裝置及表面處理治具Processing device and surface treatment fixture

本發明是有關對被處理體的表面進行使用處理液的處理之處理裝置及適用於該處理的表面處理治具。The present invention relates to a processing apparatus for treating a surface of a workpiece with a treatment liquid, and a surface treatment fixture suitable for the treatment.

近年來被要求IC卡或行動電話的薄型化、小型化、輕量化,為了滿足此要求,有關所被裝入的半導體晶片亦必須為薄型的半導體晶片。因此,成為半導體晶片的基礎之半導體晶圓的厚度(膜厚)現狀為125μm~150μm,但宣稱次世代的晶片用必須為25μm~50μm。In recent years, IC cards or mobile phones have been required to be thinner, smaller, and lighter. To meet this requirement, the semiconductor wafer to be mounted must also be a thin semiconductor wafer. Therefore, the thickness (film thickness) of the semiconductor wafer which is the basis of the semiconductor wafer is currently 125 μm to 150 μm, but it is required to be 25 μm to 50 μm for the next generation wafer.

就取得上述膜厚的半導體晶圓的方法之一而言,可舉以下的薄化方法。此方法,首先是經由在兩面具有黏著層的膠帶或接著劑來貼附半導體晶圓及支承板(support plate)等的板材。此支承板是在於發揮保護被薄化的半導體晶圓之任務。進而,在藉由支承板來保護的狀態下,利用研磨器(grinder)等來進行半導體晶圓的研磨,藉此形成被薄化的半導體晶圓。最後,從該被薄化的半導體晶圓來剝離支承板。One of the methods for obtaining the semiconductor wafer having the above film thickness is the following thinning method. In this method, first, a sheet of a semiconductor wafer, a support plate, or the like is attached via an adhesive tape or an adhesive having an adhesive layer on both sides. This support plate serves to protect the thinned semiconductor wafer. Further, in a state of being protected by a support plate, the semiconductor wafer is polished by a grinder or the like to form a thinned semiconductor wafer. Finally, the support plate is peeled off from the thinned semiconductor wafer.

然而,在上述薄化方法中,採用經由接著劑來貼附支承板與半導體晶圓的方法時,從半導體晶圓分離支承板後會有接著劑殘留於半導體晶圓的情況。因此,必須除去接著劑來使半導體晶圓的上面形成清淨的面。在此,上述被薄化的半導體晶圓,一般是貼附在固定於切割框的切割膠帶之狀態下被切割,分割成各個的晶片。上述被薄化的半導體晶圓是在與支承板貼合的狀態下貼附於切割膠帶之後,進行支承板的剝離,然後除去半導體晶圓上的接著劑。在使用該切割膠帶時,通常其表面積是比半導體晶圓大,因此在半導體晶圓的外周有切割膠帶的露出面。若針對如此的被處理體實施一面使被處理體旋轉一面滴下處理液(溶劑)的方法、或使半導體晶圓浸漬之通常的洗淨處理,則切割膠帶的露出面也會以該處理液來處理。亦即,想要處理的面不僅是半導體晶圓的表面,甚至設置於半導體晶圓的外周之切割膠帶的露出面也被進行處理。依照此時的處理液種類,切割膠帶會有劣化的疑慮,因此期望開發一種可一面保護切割膠帶,一面除去半導體晶圓上的接著劑之處理方法。However, in the above thinning method, when a method of attaching a support plate and a semiconductor wafer via an adhesive is used, when the support plate is separated from the semiconductor wafer, an adhesive remains on the semiconductor wafer. Therefore, it is necessary to remove the adhesive to form a clean surface on the upper surface of the semiconductor wafer. Here, the thinned semiconductor wafer is generally cut in a state of being attached to a dicing tape fixed to a dicing frame, and is divided into individual wafers. The thinned semiconductor wafer is attached to the dicing tape in a state of being bonded to the support plate, and then the support plate is peeled off, and then the adhesive on the semiconductor wafer is removed. When the dicing tape is used, since the surface area is generally larger than that of the semiconductor wafer, the exposed surface of the dicing tape is provided on the outer periphery of the semiconductor wafer. When such a target object is subjected to a method of dropping a treatment liquid (solvent) while rotating the object to be processed, or a normal cleaning process of immersing the semiconductor wafer, the exposed surface of the dicing tape is also treated with the treatment liquid. deal with. That is, the surface to be processed is not only the surface of the semiconductor wafer, but also the exposed surface of the dicing tape provided on the outer periphery of the semiconductor wafer is processed. According to the type of the treatment liquid at this time, the dicing tape may be deteriorated. Therefore, it is desired to develop a treatment method for removing the adhesive on the semiconductor wafer while protecting the dicing tape.

本發明是有鑑於上述問題點而研發者,其目的是在於提供一種只對被處理面實施利用處理液的處理之處理裝置及表面處理治具。The present invention has been made in view of the above problems, and an object of the invention is to provide a treatment apparatus and a surface treatment fixture which perform treatment using a treatment liquid only on a surface to be treated.

(1)本發明之處理裝置的特徵係包含:載置台,其係載置被處理體;表面處理治具,其係以處理液來處理上述被處理體的被處理面;供給手段,其係對上述表面處理治具供給處理液;回收手段,其係回收供給至上述表面處理治具的處理液;及離間維持手段,其係將上述表面處理治具維持成與上述被處理面離間的狀態,又,上述表面處理治具,係具備:具有對向於上述被處理面的對向面,在該對向面與該被處理面之間保持從上述供給手段所供給的處理液,而來處理被處理面之處理部。(1) The processing apparatus according to the present invention includes: a mounting table on which a target object is placed; a surface treatment jig that processes the processed surface of the object to be processed by a treatment liquid; and a supply means Providing a treatment liquid to the surface treatment jig; a recovery means for recovering a treatment liquid supplied to the surface treatment fixture; and a separation maintaining means for maintaining the surface treatment fixture in a state of being separated from the surface to be treated Further, the surface treatment jig includes: a facing surface facing the surface to be processed; and the processing liquid supplied from the supply means is held between the facing surface and the surface to be processed, and Processing the processing unit of the processed surface.

本發明的處理裝置是包含:可一面維持與被處理面離間的狀態,一面對表面處理治具進行處理液的供給及回收之表面處理治具。因此,可只在被處理面與對向面(和被處理面對向)之間保持處理液,不會有處理液飛散至被處理面以外的情況。其結果,若根據本發明的處理裝置,則可只對被處理面中想要實施處理的領域實施處理。又,由於表面處理治具不會接觸於被處理體,因此可降低對被處理體造成損傷的可能性。The processing apparatus of the present invention includes a surface treatment jig that can supply and recover the treatment liquid to the surface treatment jig while maintaining the state of being separated from the surface to be treated. Therefore, the treatment liquid can be held only between the surface to be treated and the opposite surface (and the surface to be treated), and the treatment liquid is not scattered to the surface to be treated. As a result, according to the processing apparatus of the present invention, it is possible to perform processing only on the field in which the processing is to be performed among the processed surfaces. Further, since the surface treatment jig does not come into contact with the object to be treated, the possibility of damage to the object to be processed can be reduced.

(2)在本發明的處理裝置中,最好上述處理部,係具備:從上述對向面往上述被處理體突出的突出部,藉由該突出部與上述被處理面之間的處理液的表面張力來將所被供給的處理液保持於上述對向面與上述被處理面之間。(2) In the processing apparatus of the present invention, preferably, the processing unit includes: a protruding portion that protrudes from the opposite surface toward the object to be processed, and a processing liquid between the protruding portion and the processed surface The surface tension is to maintain the supplied processing liquid between the opposing surface and the surface to be processed.

若根據此形態,則可藉由突出部的設置,在被處理面與對向面之間確實地進行處理液的保持。According to this aspect, the processing liquid can be surely held between the surface to be processed and the opposing surface by the provision of the protruding portion.

(3)在本發明的處理裝置中,最好上述突出部之與上述被處理面對向的面為平面,藉由上述離間維持手段來使該突出部與該被處理面的距離維持於3mm以下。(3) In the processing apparatus of the present invention, preferably, the surface of the protruding portion facing the processed surface is a flat surface, and the distance between the protruding portion and the processed surface is maintained at 3 mm by the separation maintaining means. the following.

若根據此形態,則可利用處理液的表面張力,在被處理面與表面處理治具的對向面之間,更確實地保持處理液。因此,可抑止處理液飛散至被處理面以外。According to this aspect, the surface tension of the treatment liquid can be used to more reliably hold the treatment liquid between the surface to be treated and the opposing surface of the surface treatment fixture. Therefore, it is possible to suppress the treatment liquid from scattering to the outside of the treated surface.

(4)在本發明的處理裝置中,最好具備:使處理後的被處理面乾燥之乾燥手段。(4) In the treatment apparatus of the present invention, it is preferable to provide a drying means for drying the treated surface after the treatment.

若根據此形態,則即使是無法完全進行處理液的回收,還是可進行被處理面的乾燥。According to this aspect, even if the processing liquid cannot be completely recovered, the surface to be treated can be dried.

(5)在本發明的處理裝置中,最好上述乾燥手段,為往上述被處理面供給惰性氣體的惰性氣體供給手段。(5) In the processing apparatus of the present invention, it is preferable that the drying means is an inert gas supply means for supplying an inert gas to the surface to be treated.

若根據此形態,則可藉由吹附惰性氣體,來使處理液飛散、乾燥。According to this aspect, the treatment liquid can be scattered and dried by blowing an inert gas.

(6)在本發明的處理裝置中,最好上述乾燥手段,為吸引殘留於上述被處理面的處理液之吸引手段。(6) In the processing apparatus of the present invention, it is preferable that the drying means is a suction means for sucking the treatment liquid remaining on the surface to be treated.

(7)在本發明的處理裝置中,最好上述吸引手段,係利用上述表面處理治具來進行,在停止來自上述供給手段之處理液的供給的狀態下,藉由上述回收手段來吸引殘留於上述被處理面的處理液。(7) In the processing apparatus of the present invention, it is preferable that the suction means is performed by the surface treatment jig, and the remaining means is used to attract the residue by stopping the supply of the treatment liquid from the supply means. The treatment liquid on the surface to be treated.

若根據此形態,則可對處理及乾燥的雙方使用表面處理治具。According to this aspect, the surface treatment jig can be used for both the treatment and the drying.

(8)在本發明的處理裝置中,最好上述對向面的面積,係比上述被處理面的面積小。(8) In the processing apparatus of the present invention, it is preferable that the area of the opposing surface is smaller than the area of the surface to be processed.

(9)在本發明的處理裝置中,上述離間維持手段可使表面處理治具對被處理體移動。(9) In the processing apparatus of the present invention, the separation preventing means can move the surface treatment fixture to the object to be processed.

若根據此形態,則即使對向面的面積比被處理面的面積小,還是可對被處理面的全域進行處理。According to this aspect, even if the area of the opposing surface is smaller than the area of the processed surface, the entire area of the processed surface can be processed.

(10)在本發明的處理裝置中,上述離間維持手段可使表面處理治具從被處理體的大略中心往外緣移動。(10) In the processing apparatus of the present invention, the separation preventing means can move the surface treatment fixture from the approximate center of the object to the outer edge.

另外,在本形態中,所謂的「大略中心」是意指包含中心及中心的周圍。若根據此形態,則特別是可一邊使被處理體旋轉,一邊使表面處理治具從中心往外周移動,藉此得以處理被處理體全體。In addition, in this form, the "general center" means the periphery including a center and a center. According to this aspect, in particular, the entire surface of the object to be processed can be processed by moving the surface treatment jig from the center to the outer periphery while rotating the object to be processed.

(11)在本發明的處理裝置中,上述載置台可使所被載置的被處理體旋轉。(11) In the processing apparatus of the present invention, the mounting table can rotate the object to be processed placed thereon.

若根據此形態,則在被處理面的面積比對向面大時,可謀求處理的效率化。According to this aspect, when the area of the surface to be processed is larger than the opposing surface, the efficiency of the processing can be improved.

(12)本發明的表面處理治具,係使用於以處理液來處理被處理體的被處理面之表面處理治具,其特徵為:具備處理部,其係具有在維持對被處理面離間時對向於上述被處理面的對向面,保持在該對向面與上述被處理面之間所被供給的處理液,而來處理被處理面。(12) The surface treatment jig of the present invention is a surface treatment jig for treating a surface to be treated of a target object with a treatment liquid, characterized in that it has a treatment portion which is provided to maintain a separation from the treated surface At the time of facing the opposite surface of the surface to be processed, the processing liquid supplied between the opposing surface and the surface to be processed is held to process the surface to be processed.

本發明的表面處理治具可在被處理面與對向面之間保持處理液。因此,在利用本發明的表面處理治具來進行處理之下,可只在所望的領域實施利用處理液的處理。其結果,即使在與被處理面同一位準設有不想要實施處理的面,照樣可實現處理液飛散於該面的情況會被抑止的處理。The surface treatment jig of the present invention can hold the treatment liquid between the treated surface and the opposite surface. Therefore, under the treatment using the surface treatment jig of the present invention, the treatment using the treatment liquid can be carried out only in the desired field. As a result, even if the surface on which the treatment is not desired is provided at the same level as the surface to be processed, the treatment in which the treatment liquid is scattered on the surface can be suppressed.

本發明的其他目的、特徵、及優點,根據以下記載可充分了解。並且,本發明的利點可由參照圖面的以下說明明白得知。Other objects, features, and advantages of the present invention will be apparent from the description. Further, the advantages of the present invention can be understood from the following description of the drawings.

以下,一邊參照圖面一邊說明有關本發明的實施形態。Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(處理裝置)(processing device)

有關本實施形態的處理裝置100是一邊參照圖1~圖3一邊進行說明。圖1是表示本實施形態的處理裝置100的要部剖面圖。圖2是更詳細顯示圖1的A部之剖面圖。圖3是表示本實施形態的處理裝置所具備的表面處理治具的一部份平面圖。另外,圖3是表示表面處理治具的對向面(與被處理面對向的面)的平面圖。The processing apparatus 100 according to the present embodiment will be described with reference to Figs. 1 to 3 . Fig. 1 is a cross-sectional view showing the main part of a processing apparatus 100 according to the present embodiment. Fig. 2 is a cross-sectional view showing a portion A of Fig. 1 in more detail. Fig. 3 is a plan view showing a part of a surface treatment jig provided in the processing apparatus of the embodiment. In addition, FIG. 3 is a plan view showing the opposing surface (surface facing the surface to be processed) of the surface treatment jig.

如圖1所示,處理裝置100是包含:載置被處理體18的載置台10、及以處理液來處理被處理體18的被處理面18a之表面處理治具20、及對表面處理治具20供給處理液的供給手段30、回收供給至表面處理治具20的處理液之回收手段40、及使表面處理治具20維持與被處理面18a離間的狀態之離間維持手段50。更在處理裝置100設有洗淨杯16,其係設置成圍繞被處理體18。As shown in Fig. 1, the processing apparatus 100 includes a mounting table 10 on which the object 18 to be processed is placed, and a surface treatment jig 20 for treating the processed surface 18a of the object 18 to be treated with a treatment liquid, and a surface treatment treatment The supply means 30 for supplying the treatment liquid 20, the recovery means 40 for recovering the treatment liquid supplied to the surface treatment fixture 20, and the separation maintaining means 50 for maintaining the surface treatment fixture 20 in a state of being separated from the surface to be treated 18a. Further, the processing apparatus 100 is provided with a washing cup 16 which is disposed to surround the object 18 to be processed.

載置台10是例如可吸引保持被處理體18。並且,載置台10是大略以中心為軸來設於可旋轉的旋轉軸12上,在旋轉軸12安裝有使旋轉的馬達14。藉由此構成,可使被處理體18以通過被處理面18a的大略中心的垂線作為軸來旋轉。The mounting table 10 is, for example, capable of attracting and holding the object 18 to be processed. Further, the mounting table 10 is provided on the rotatable rotating shaft 12 with the center as the axis, and the rotating motor 14 is attached to the rotating shaft 12. With this configuration, the object 18 can be rotated with the perpendicular line passing through the approximate center of the processed surface 18a as an axis.

表面處理治具20具有對向於被處理面18a的對向面22a,在對向面22a與被處理面18a之間,發揮用以保持從供給手段30所供給的處理液之任務。在本實施形態的處理裝置,表面處理治具20是只要能夠揮發上述任務即可,其構造並無特別加以限制。The surface treatment jig 20 has a facing surface 22a facing the surface to be processed 18a, and a task for holding the processing liquid supplied from the supply means 30 between the opposing surface 22a and the surface to be processed 18a. In the processing apparatus of the present embodiment, the surface treatment jig 20 is not particularly limited as long as it can volatilize the above task.

以下,一邊參照圖2及圖3一邊說明有關表面處理治具20的構造之一例。如圖2所示,表面處理治具20是具有保持所供給的處理液來處理被處理面18a的處理部22。此處理部22是具有表面處理治具20對被處理面18a維持離間時對向於被處理面18a的對向面22a。亦即,若根據本實施形態的表面處理治具20,則可在處理部22與對向面22a之間保持處理液。Hereinafter, an example of the structure of the surface treatment jig 20 will be described with reference to FIGS. 2 and 3. As shown in FIG. 2, the surface treatment jig 20 is a processing unit 22 that holds the supplied processing liquid to process the to-be-processed surface 18a. The processing unit 22 has a facing surface 22a that faces the processed surface 18a when the surface treatment jig 20 is kept away from the surface to be processed 18a. In other words, according to the surface treatment jig 20 of the present embodiment, the treatment liquid can be held between the treatment portion 22 and the opposing surface 22a.

在處理部22設有第1貫通孔26及第2貫通孔28。第1貫通孔26是用以將處理液供給至處理部22的孔,第2貫通孔28是用以回收處理部22的處理液之孔。在圖2中,各虛線的箭號是表示處理液的流向。另外,在圖2及圖3是顯示第1貫通孔26為設置一個,第2貫通孔28為設置4個的情況,但並非限於此,例如亦可設置6個或8個的第2貫通孔。又,有關第1貫通孔26及第2貫通孔28的配置,亦非限於圖示的配置。第1貫通孔26及第2貫通孔28的平面形狀可為圓形、橢圓形或矩形,只要不妨礙處理液的流動,並無特別加以限制。這有關第1貫通孔26及第2貫通孔28的開口徑也是同様的。The processing unit 22 is provided with a first through hole 26 and a second through hole 28 . The first through hole 26 is a hole for supplying the processing liquid to the processing unit 22, and the second through hole 28 is a hole for collecting the processing liquid of the processing unit 22. In Fig. 2, the arrows of the respective broken lines indicate the flow direction of the treatment liquid. In addition, in FIG. 2 and FIG. 3, it is shown that the first through-holes 26 are provided, and the number of the second through-holes 28 is four. However, the present invention is not limited thereto. For example, six or eight second through holes may be provided. . Further, the arrangement of the first through holes 26 and the second through holes 28 is not limited to the arrangement shown in the drawings. The planar shape of the first through hole 26 and the second through hole 28 may be circular, elliptical or rectangular, and is not particularly limited as long as it does not interfere with the flow of the treatment liquid. The opening diameters of the first through hole 26 and the second through hole 28 are also the same.

又,上述處理部22最好是具備從對向面22a往被處理體18突出的突出部24。突出部24,如圖2及圖3所示,最好是設置於對向面22a的周緣。如此,處理部22可藉由具備突出部24來將所供給的處理液予以更確實地保持於與被處理面18a之間。處理液的保持是利用處理液的表面張力來進行。Moreover, it is preferable that the processing unit 22 includes a protruding portion 24 that protrudes from the opposing surface 22a toward the object 18 to be processed. As shown in FIGS. 2 and 3, the protruding portion 24 is preferably provided on the peripheral edge of the opposing surface 22a. In this way, the processing unit 22 can hold the supplied processing liquid more reliably between the processed surface 18a by providing the protruding portion 24. The maintenance of the treatment liquid is carried out by using the surface tension of the treatment liquid.

又,當突出部24的底面(與被處理面18a對向的面)為平面時,最好是藉由後述的離間維持手段50來將突出部24與被處理面18a的距離維持於0.5mm以上、3mm以下,更理想是0.5~1.5mm的範圍。另外,突出部24與被處理面18a的距離並非限於不接觸的範圍,亦可趨近於0mm。藉此,更可確實地保持處理液。Further, when the bottom surface of the protruding portion 24 (the surface facing the surface to be processed 18a) is a flat surface, it is preferable that the distance between the protruding portion 24 and the surface to be processed 18a is maintained at 0.5 mm by the separation maintaining means 50 to be described later. Above, 3 mm or less, more preferably in the range of 0.5 to 1.5 mm. Further, the distance between the protruding portion 24 and the surface to be processed 18a is not limited to the range in which it is not in contact, and may be closer to 0 mm. Thereby, the treatment liquid can be more reliably maintained.

本實施形態的表面處理治具20最好是使用於被處理面18a的面積比其對向面22a的面積(處理部22的處理面積)大的被處理體18之處理。當被處理面18a的面積比對向面22a的面積大時,可藉由離間維持手段50來調整被處理面18a與處理部22的距離,而利用其表面張力來保持處理液。具體而言,當對向面22a及被處理面18a(處理部22的處理面積)為圓形狀時,對向面22a的直徑最好是比被處理面18a的半徑小。The surface treatment jig 20 of the present embodiment is preferably a treatment of the object 18 to be processed having a larger area than the area of the facing surface 22a (processing area of the processing unit 22). When the area of the processed surface 18a is larger than the area of the opposing surface 22a, the distance between the processed surface 18a and the processing portion 22 can be adjusted by the separation maintaining means 50, and the processing liquid can be held by the surface tension. Specifically, when the opposing surface 22a and the processed surface 18a (processing area of the processing unit 22) have a circular shape, the diameter of the opposing surface 22a is preferably smaller than the radius of the processed surface 18a.

供給手段30是在於達成對表面處理治具20的處理部22供給處理液的任務。此供給手段30是例如包含:儲存處理液的處理液槽34、連接至處理液槽34的供給配管32、及用以對表面處理治具22供給處理液的泵(未圖示)等。並且,上述供給配管32是被連接至第1貫通孔26。然後,經由處理液槽34、供給配管32及第1貫通孔26來對上述處理部22供給處理液。The supply means 30 is a task of supplying the treatment liquid to the treatment portion 22 of the surface treatment fixture 20. The supply means 30 includes, for example, a processing liquid tank 34 for storing the processing liquid, a supply pipe 32 connected to the processing liquid tank 34, and a pump (not shown) for supplying the processing liquid to the surface treatment fixture 22. Further, the supply pipe 32 is connected to the first through hole 26. Then, the treatment liquid is supplied to the treatment unit 22 via the treatment liquid tank 34, the supply pipe 32, and the first through hole 26.

吸引手段40是在於達成從表面處理治具20的處理部22來回收處理液的任務。此吸引手段40是例如包含:處理液的回收配管42、及用以回收處理完成的處理液的回收槽44、用以吸引處理液的泵或排出器等。另外,上述泵或排出器(ejector)只要設置於回收槽的後方即可。並且,上述回收配管42是被連接至第2貫通孔28。然後,被供給至處理部22的處理液可經由第2貫通孔28、回收配管42來回收於回收槽44。在上述雖是記載將處理液回收於回收槽的構成,但亦可為只是藉由泵、排出器等來從表面處理治具20排出處理液的構成。The suction means 40 is a task of recovering the treatment liquid from the treatment portion 22 of the surface treatment jig 20. The suction means 40 is, for example, a recovery pipe 42 including a treatment liquid, a recovery tank 44 for recovering the treated liquid, a pump or an ejector for sucking the treatment liquid, and the like. Further, the pump or the ejector may be disposed at the rear of the recovery tank. Further, the recovery pipe 42 is connected to the second through hole 28. Then, the processing liquid supplied to the processing unit 22 can be recovered in the recovery tank 44 through the second through hole 28 and the recovery pipe 42. Although the configuration in which the treatment liquid is collected in the recovery tank is described above, the treatment liquid may be discharged from the surface treatment fixture 20 by a pump or an ejector.

離間維持手段50是使表面處理治具20對被處理面18a維持離間者。將表面處理治具20與被處理面18a的距離維持於所定的距離,藉此可在上述處理部22保持處理液。並且,離間維持手段50亦可具備:使表面處理治具20可移動於和被處理面18a平行的方向及對被處理面18a上下的方向之機構。離間維持手段50具體而言是例如可藉由保持表面處理治具20的臂52等來實現。The detachment maintaining means 50 is such that the surface treatment jig 20 is kept separated from the treated surface 18a. The distance between the surface treatment jig 20 and the surface to be treated 18a is maintained at a predetermined distance, whereby the treatment liquid can be held in the treatment portion 22. Further, the detachment maintaining means 50 may include means for moving the surface treatment jig 20 in a direction parallel to the surface to be processed 18a and a direction upward and downward of the surface 18a to be processed. Specifically, the intervening maintenance means 50 can be realized by, for example, holding the arm 52 of the surface treatment jig 20 or the like.

又,本實施形態的處理裝置100是具備使處理後的被處理面18a乾燥的乾燥手段。乾燥手段,例如可為往被處理面18a供給惰性氣體的惰性氣體供給手段60、及吸引殘留於被處理面18a的處理液之吸引手段(未圖示)。惰性氣體供給手段60例如可由:惰性氣體槽62、惰性氣體供給配管64、及設於惰性氣體供給配管64的前端之噴嘴66所構成。惰性氣體,可使用公知的惰性氣體、例如氬、氮等。並且,在惰性氣體的供給時,最好是以能夠吹附於被處理面18a的方式來供給。又,吸引手段例如可由:吸引用的泵、及用以回收處理液的回收槽及處理液的回收配管所構成。惰性氣體供給手段60及吸引手段,可與後述的表面處理治具20一體構成,或各別構成。而且,該被處理體18的乾燥亦可利用表面處理治具20來進行。有關利用表面處理治具20來進行被處理面18a的乾燥時的處理方法會在往後敘述。Further, the processing apparatus 100 of the present embodiment is provided with a drying means for drying the processed surface 18a after the treatment. The drying means may be, for example, an inert gas supply means 60 for supplying an inert gas to the surface to be treated 18a, and a suction means (not shown) for sucking the treatment liquid remaining on the surface to be processed 18a. The inert gas supply means 60 can be constituted, for example, by an inert gas tank 62, an inert gas supply pipe 64, and a nozzle 66 provided at the tip end of the inert gas supply pipe 64. As the inert gas, a known inert gas such as argon, nitrogen or the like can be used. Further, when the inert gas is supplied, it is preferably supplied so as to be able to be blown to the surface 18a to be processed. Further, the suction means may be constituted by, for example, a pump for suction, a recovery tank for recovering the treatment liquid, and a recovery pipe for the treatment liquid. The inert gas supply means 60 and the suction means may be integrally formed with a surface treatment jig 20 to be described later, or may be configured separately. Further, the drying of the object 18 can be carried out by using the surface treatment fixture 20. The processing method when the surface to be treated 18a is dried by the surface treatment jig 20 will be described later.

(處理方法)(Approach)

其次,說明有關利用上述處理裝置之被處理體的處理方法。就本處理方法而言,首先是將被處理體18保持於載置台10。在載置台10中設有吸引機構,可保持被處理體18。進而藉由離間維持手段50來將表面處理治具20配置於被處理體18的上方。此時,被處理體18的被處理面18a與表面處理治具20(特別是突出部24)的距離,最好是例如維持於3mm以下。藉此,容易將處理液保持於被處理面18a與表面處理治具20的對向面22a之間。Next, a processing method of the object to be processed using the above processing apparatus will be described. In the present processing method, first, the object to be processed 18 is held on the mounting table 10. An attraction mechanism is provided in the mounting table 10 to hold the object 18 to be processed. Further, the surface treatment jig 20 is placed above the object 18 by the separation maintaining means 50. At this time, the distance between the surface 18a to be processed of the object 18 to be treated and the surface treatment jig 20 (particularly, the protruding portion 24) is preferably maintained at, for example, 3 mm or less. Thereby, it is easy to hold the processing liquid between the to-be-processed surface 18a and the opposing surface 22a of the surface-processing jig 20.

其次,由處理液的供給手段30來對表面處理治具20(處理部22)供給處理液。此處理液的供給是經由表面處理治具20的第1貫通孔26來進行。與處理液的供給同時,所被供給之處理液的回收會藉由回收手段40來進行(以下稱為「供給.回收處理」)。此處理液的回收是經由表面處理治具20的第2貫通孔28來吸引處理液至回收配管44側。Next, the treatment liquid supply device 30 supplies the treatment liquid to the surface treatment fixture 20 (the treatment unit 22). The supply of the treatment liquid is performed through the first through hole 26 of the surface treatment fixture 20. At the same time as the supply of the treatment liquid, the recovery of the supplied treatment liquid is performed by the recovery means 40 (hereinafter referred to as "supply and recovery treatment"). The recovery of the treatment liquid is performed by suctioning the treatment liquid to the recovery pipe 44 side through the second through hole 28 of the surface treatment fixture 20.

然後,可利用在被處理面18a與表面處理治具20之間產生的處理液的表面張力來保持處理液。另外,上述供給.回收處理之處理液的供給量及回收量是只要保持上述表面張力,處理液不會從表面處理治具20擴散即可,例如只要調整成大致相同的量等即可。Then, the treatment liquid can be held by the surface tension of the treatment liquid generated between the treated surface 18a and the surface treatment fixture 20. In addition, the above supply. The supply amount and the recovery amount of the treatment liquid to be recovered may be such that the treatment liquid does not diffuse from the surface treatment fixture 20 as long as the surface tension is maintained. For example, the treatment liquid may be adjusted to have substantially the same amount or the like.

此處理液的供給.回收處理,可一邊使表面處理治具20對被處理體18移動一邊進行。此刻,最好是使表面處理治具20從被處理體18的大略中往外緣移動。如此,在使表面處理治具20移動之下,即使表面處理治具20的處理部22的處理面比被處理面18a小,還是可以對被處理面18a的全域實施處理。另外,在本形態中,所謂的「大略中心」是意指包含中心及中心的周圍。The supply of this treatment liquid. The collection process can be performed while moving the surface treatment jig 20 to the object 18 to be processed. At this point, it is preferable to move the surface treatment jig 20 from the middle to the outer edge of the object 18 to be processed. As described above, even when the surface treatment jig 20 is moved, even if the treatment surface of the treatment portion 22 of the surface treatment jig 20 is smaller than the surface to be treated 18a, the entire surface of the surface 18a to be processed can be subjected to processing. In addition, in this form, the "general center" means the periphery including a center and a center.

又,亦可一面使被處理體18以通過其表面的大略中心的垂線為軸來旋轉,一面進行供給.回收處理。此情況,最好旋轉速度是10rpm以上,100rpm以下。若為上述範圍內,則可將處理液保持於處理部22與被處理面18a之間,抑止處理液飛散至其他的領域。並且,在如此使被處理體18旋轉下謀求處理的效率化。Further, the object to be processed 18 may be supplied while being rotated about a vertical line passing through the center of the surface thereof. Recycling treatment. In this case, the rotation speed is preferably 10 rpm or more and 100 rpm or less. When it is in the above range, the treatment liquid can be held between the treatment portion 22 and the surface to be treated 18a, and the treatment liquid can be prevented from scattering to other fields. Further, the processing body 18 is rotated as described above to improve the efficiency of the processing.

其次,在終了供給.回收處理後,使被處理面18a乾燥(以下稱為「乾燥處理」)。乾燥處理可利用上述惰性氣體供給手段60或吸引手段來進行。並且,可利用表面處理治具20來進行該乾燥工程。在利用表面處理治具20時,是在來自供給手段30之處理液的供給停止的狀態下,利用回收手段40來吸引殘留於被處理面18a的處理液。此情況,表面處理治具20可實現處理液的處理及乾燥,可有效活用處理裝置。Second, at the end of the supply. After the recovery treatment, the treated surface 18a is dried (hereinafter referred to as "drying treatment"). The drying treatment can be carried out by the inert gas supply means 60 or the suction means. Also, the drying process can be performed using the surface treatment fixture 20. When the surface treatment tool 20 is used, the processing liquid remaining on the surface to be processed 18a is sucked by the recovery means 40 in a state where the supply of the processing liquid from the supply means 30 is stopped. In this case, the surface treatment jig 20 can realize the treatment and drying of the treatment liquid, and can effectively utilize the treatment device.

以上,可利用本實施形態的處理裝置來對被處理面18a進行處理液的處理。As described above, the processing liquid of the surface to be processed 18a can be processed by the processing apparatus of the present embodiment.

若根據本實施形態的處理裝置100,則可藉由離間維持手段50來一面維持被處理面18a與表面處理治具20的離間狀態,一面進行對表面處理治具20之處理液的供給、及所被供給之處理液的回收。如此在同時進行處理液的供給及所被供給的處理液的回收之下,可在表面處理治具20與被處理面18a之間保持處理液。因此,可抑止對不希望處理液飛散的領域之處理液的飛散。其結果,可提供一種只對想要實施處理的面(被處理面)實施處理的處理裝置。According to the processing apparatus 100 of the present embodiment, the treatment of the surface treatment jig 20 can be performed while maintaining the disengaged state of the surface to be treated 18a and the surface treatment jig 20 by the separation maintaining means 50. Recovery of the treated liquid to be supplied. By simultaneously supplying the processing liquid and recovering the supplied processing liquid, the processing liquid can be held between the surface treatment jig 20 and the surface to be treated 18a. Therefore, the scattering of the treatment liquid in the field where the treatment liquid is not desired to be scattered can be suppressed. As a result, it is possible to provide a processing apparatus that performs processing only on the surface (processed surface) on which the treatment is to be performed.

又,本實施形態的處理裝置100可藉由離間維持手段50來調整表面處理治具20與被處理面18a之間的距離,利用處理液的表面張力來更確實地保持處理液。因此,可防止處理液的飛散的同時,在被施以處理的領域中保持所定量的處理液。並且,在設置突出部24時,按照突出部24的長度在處理部22中產生凹陷。其結果,可使該凹陷具有作為處理液的保持領域之機能。在如此利用表面處理治具20之下,可保持所望量的處理液,良好地進行處理。Further, in the processing apparatus 100 of the present embodiment, the distance between the surface treatment fixture 20 and the surface to be processed 18a can be adjusted by the separation maintaining means 50, and the processing liquid can be more reliably held by the surface tension of the processing liquid. Therefore, it is possible to prevent the scattering of the treatment liquid while maintaining the amount of the treatment liquid in the field to be treated. Further, when the protruding portion 24 is provided, a depression is formed in the treatment portion 22 in accordance with the length of the protruding portion 24. As a result, the depression can be made to function as a holding area of the treatment liquid. Under the surface treatment jig 20 as described above, the desired amount of the treatment liquid can be maintained and the treatment can be performed satisfactorily.

又,若利用本實施形態的處理裝置,則可不使處理液飛散,因此可提高處理液的利用效率。Further, according to the processing apparatus of the present embodiment, the treatment liquid can be prevented from scattering, so that the utilization efficiency of the treatment liquid can be improved.

其次,說明有關藉由本實施形態的處理裝置來特別良好地進行處理之被處理體的例子。另外,當然被處理體18並非是限於以下例示的被處理體。Next, an example of the object to be processed which is particularly well processed by the processing apparatus of the present embodiment will be described. Further, of course, the object to be processed 18 is not limited to the object to be processed exemplified below.

藉由本實施形態的處理裝置來良好地進行處理的被處理體18是設置於支持體的切割膠帶上,被薄化的半導體晶圓。如此薄化的半導體晶圓有時在其薄化製程中,於半導體晶圓的表面殘留有接著劑。在如此之半導體晶圓的接著劑的除去處理中,可利用本實施形態的處理裝置。The object 18 to be processed which is satisfactorily processed by the processing apparatus of the present embodiment is a thinned semiconductor wafer provided on a dicing tape of a support. Such a thinned semiconductor wafer sometimes has an adhesive remaining on the surface of the semiconductor wafer in its thinning process. In the removal process of the adhesive of such a semiconductor wafer, the processing apparatus of this embodiment can be utilized.

在以下的說明,首先一面參照圖面一面說明有關半導體晶圓的薄化製程之後,說明有關利用本實施形態的處理裝置之優點。圖4(a)~圖4(d)是說明半導體晶圓的薄化製程的剖面圖。在此,說明有關使用有孔支承板70的例子。In the following description, first, the advantages of the processing apparatus using the present embodiment will be described after explaining the thinning process of the semiconductor wafer with reference to the drawings. 4(a) to 4(d) are cross-sectional views illustrating a thinning process of a semiconductor wafer. Here, an example of using the perforated support plate 70 will be described.

首先,如圖4(a)所示,經由接著劑72來貼附支承板70及半導體晶圓74a。此半導體晶圓74a是薄化之前者。進而,如圖4(b)所示,研磨半導體晶圓74a,形成被薄化的半導體晶圓74。半導體晶圓74a的研磨可藉由各種公知的技術來進行。進而,如圖4(c)所示,使未與半導體晶圓74的接著劑72接觸的面和切割膠帶(支持體)76貼合。此時,切割膠帶76是在於填補剝離後之半導體晶圓74的強度,發揮容易處理的任務。另外,在切割膠帶76的周圍設有切割框架(固定具)78。此切割框架78是在於防止切割膠帶76的鬆弛。然後,從支承板70的孔來供給溶解接著劑72的溶劑,在溶解接著劑72之後,除去支承板70。此刻,接著劑72未完全被除去殘留於半導體晶圓74上。以殘留後的接著劑72作為殘留接著劑73表示。如此,具有殘留接著劑73的半導體晶圓74是相當於被處理體18。First, as shown in FIG. 4(a), the support plate 70 and the semiconductor wafer 74a are attached via the adhesive 72. This semiconductor wafer 74a is thinned before. Further, as shown in FIG. 4(b), the semiconductor wafer 74a is polished to form a thinned semiconductor wafer 74. The polishing of the semiconductor wafer 74a can be performed by various well-known techniques. Further, as shown in FIG. 4(c), a surface that is not in contact with the adhesive 72 of the semiconductor wafer 74 is bonded to a dicing tape (support) 76. At this time, the dicing tape 76 is intended to fill the strength of the semiconductor wafer 74 after peeling, and it is easy to handle. Further, a cutting frame (fixing tool) 78 is provided around the dicing tape 76. This cutting frame 78 is intended to prevent slack in the dicing tape 76. Then, the solvent for dissolving the adhesive 72 is supplied from the hole of the support plate 70, and after the adhesive 72 is dissolved, the support plate 70 is removed. At this point, the adhesive 72 is not completely removed and remains on the semiconductor wafer 74. The remaining adhesive 72 is shown as a residual adhesive 73. As described above, the semiconductor wafer 74 having the residual adhesive 73 corresponds to the object 18 to be processed.

此被處理體18是經由上述工程在其外周配置切割膠帶76。切割膠帶76有時會因為附著有使用於殘留接著劑73的除去之溶劑(處理液)而劣化。切割膠帶76的劣化會引起鬆弛,此鬆弛有時會引起被薄化強度降低之半導體晶圓74的破裂。因此,必須使切割膠帶76不劣化,除去半導體晶圓74上的殘留接著劑73。亦即,會被要求只在半導體晶圓74的表面實施溶劑的除去。This object to be processed 18 is provided with a dicing tape 76 on its outer circumference via the above-described work. The dicing tape 76 may be deteriorated by adhering a solvent (treatment liquid) used for removal of the residual adhesive 73. Deterioration of the dicing tape 76 causes slack, which sometimes causes cracking of the semiconductor wafer 74 which is reduced in thinning strength. Therefore, it is necessary to remove the residual adhesive 73 on the semiconductor wafer 74 without deteriorating the dicing tape 76. That is, it is required to perform removal of the solvent only on the surface of the semiconductor wafer 74.

將本實施形態的處理裝置100使用於半導體晶圓74上的殘留接著劑73的除去時,如上述,可進行抑止在半導體晶圓74(被處理體18)以外溶劑飛散的處理。因此,可不使切割膠帶76劣化,良好地進行殘留接著劑73的除去。若利用本實施形態的處理裝置,則提供一種一面對不想要實施處理的面抑止處理液的飛散,一面對想要處理的面進行良好的處理之處理裝置。When the processing apparatus 100 of the present embodiment is used for removing the residual adhesive 73 on the semiconductor wafer 74, as described above, it is possible to suppress the scattering of the solvent other than the semiconductor wafer 74 (the object 18 to be processed). Therefore, the removal of the residual adhesive 73 can be favorably performed without deteriorating the dicing tape 76. According to the processing apparatus of the present embodiment, it is possible to provide a processing apparatus that performs a good treatment on the surface to be processed, in response to the scattering of the surface treatment liquid which is not intended to be processed.

另外,本實施形態是針對被處理體18設於切割膠帶76上的半導體晶圓74時,但並非限於此。只要是希望實施處理液的處理之被處理體,任何的被處理體皆可使用本實施形態的處理裝置。Further, the present embodiment is directed to the semiconductor wafer 74 on which the object 18 to be processed is provided on the dicing tape 76, but is not limited thereto. The processing apparatus of this embodiment can be used for any object to be processed as long as it is a subject to be subjected to the treatment of the treatment liquid.

另外,上述處理裝置100是顯示表面處理治具20的平面形狀為圓形時,但表面處理治具20的形狀並非限於此。以下一面參照圖5一面說明有關上述表面處理治具20的變形例之表面處理治具70。圖5是表面處理治具70位於被處理面18a上方時的平面圖。其他的構成則是與表面處理治具20同様。Further, in the above-described processing apparatus 100, when the planar shape of the surface treatment jig 20 is circular, the shape of the surface treatment jig 20 is not limited thereto. A surface treatment jig 70 according to a modification of the surface treatment jig 20 will be described below with reference to Fig. 5 . Fig. 5 is a plan view showing the surface treatment jig 70 positioned above the surface to be treated 18a. The other constitution is the same as the surface treatment fixture 20.

如圖5所示,表面處理治具70為長方形狀,具有其角為圓弧的平面形狀。在表面處理治具70設有:將處理液供給至被處理面18a的第1貫通孔76、及第2貫通孔78。經由第1貫通孔76來進行往處理部之處理液的供給,經由第2貫通孔78來進行所被供給之處理液的回收。第1貫通孔76及第2貫通孔78的開口形狀、個數、配置皆不是限於圖5所示者。當被處理面18a為圓形時,最好表面處理治具70的長邊方向的長度是與被處理面18a的半徑大略相同。此情況,例如可在一邊使被處理體旋轉於箭號所示的方向一邊進行處理之下,對被處理面的全域實施處理。並且,在表面處理治具70也是與表面處理治具20同様,當然亦可在與被處理面18a的對向面設置突出部。另外,在表面處理治具70雖顯示其平面形狀為長方形狀,但並非限於此形狀,只要可進行對被處理面18a之處理液的供給及所被供給之處理液的回收,在表面處理治具70與被處理面18a之間保持處理液即可。As shown in FIG. 5, the surface treatment jig 70 has a rectangular shape and has a planar shape in which the corner is an arc. The surface treatment jig 70 is provided with a first through hole 76 that supplies the treatment liquid to the surface 18a to be processed, and a second through hole 78. The supply of the treatment liquid to the treatment unit is performed through the first through hole 76, and the supply of the treatment liquid to be supplied is performed through the second through hole 78. The shape, number, and arrangement of the openings of the first through holes 76 and the second through holes 78 are not limited to those shown in FIG. 5. When the surface to be processed 18a is circular, it is preferable that the length of the surface treatment jig 70 in the longitudinal direction is substantially the same as the radius of the surface to be processed 18a. In this case, for example, it is possible to perform processing on the entire surface of the processed surface while performing the processing while rotating the object to be processed in the direction indicated by the arrow. Further, the surface treatment jig 70 is also the same as the surface treatment jig 20, and of course, a protruding portion may be provided on the opposing surface of the surface to be processed 18a. Further, although the surface treatment jig 70 has a rectangular shape in plan view, the shape is not limited thereto, and the surface treatment may be performed by supplying the treatment liquid to the surface to be treated 18a and recovering the supplied treatment liquid. The treatment liquid may be held between the device 70 and the surface to be treated 18a.

本發明並非限於上述各實施形態,可在請求項所示的範圍內進行各種的變更,有關適當組合不同實施形態所分別揭示的技術手段取得的實施形態亦為本發明的技術範圍所包含。The present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the claims. The embodiments obtained by appropriately combining the technical means disclosed in the respective embodiments are also included in the technical scope of the present invention.

本發明的處理裝置是具備:與被處理體維持離間的表面處理治具、及處理液的供給手段與回收手段,藉此可在被處理面與對向面之間保持處理液,可實現抑止對被處理面以外的處理液的飛散之處理。The processing apparatus of the present invention includes a surface treatment jig that maintains a separation from the object to be processed, and a supply means and a recovery means for the treatment liquid, whereby the treatment liquid can be held between the surface to be treated and the opposite surface, thereby suppressing The treatment of scattering of the treatment liquid other than the surface to be treated.

本發明的處理裝置可實現處理液的洗淨或塗佈等各種處理。The treatment apparatus of the present invention can realize various treatments such as washing or coating of the treatment liquid.

在發明的詳細說明中之具體的實施形態或實施例,終歸是為了明確本發明的技術內容者,並非狹隘地只限於如此的具體例,只要是在本發明的技術思想及其次記載的申請專利範圍內,亦可實施各種的變更。The specific embodiments or examples in the detailed description of the invention are intended to clarify the technical contents of the present invention, and are not limited to such specific examples, as long as they are in the technical idea of the present invention and the patent application described in the second embodiment. Various changes can be implemented within the scope.

10...載置台10. . . Mounting table

12...旋轉軸12. . . Rotary axis

14...馬達14. . . motor

16...洗淨槽16. . . Washing tank

18...被處理體18. . . Object to be processed

18a...被處理面18a. . . Processed surface

20...表面處理治具20. . . Surface treatment fixture

22...處理部twenty two. . . Processing department

22a...對向面22a. . . Opposite face

24...突出部twenty four. . . Protruding

26...第1貫通孔26. . . First through hole

28...第2貫通孔28. . . Second through hole

30...供給手段30. . . Supply means

32...供給配管32. . . Supply piping

34...處理液槽34. . . Treatment tank

40...回收手段40. . . Recycling method

42...回收配管42. . . Recycling piping

44...吸引泵44. . . Suction pump

50...離間維持手段50. . . Separation maintenance

52...臂52. . . arm

60...惰性氣體供給手段60. . . Inert gas supply means

62...惰性氣體槽62. . . Inert gas tank

64...惰性氣體供給配管64. . . Inert gas supply piping

66...噴嘴66. . . nozzle

100...處理裝置100. . . Processing device

圖1是表示本發明的實施形態之處理裝置的構成要部的剖面圖。Fig. 1 is a cross-sectional view showing a main part of a configuration of a processing apparatus according to an embodiment of the present invention.

圖2是更詳細顯示圖1的A部之剖面圖。Fig. 2 is a cross-sectional view showing a portion A of Fig. 1 in more detail.

圖3是表示本實施形態的處理裝置所具有的表面處理治具的平面圖。Fig. 3 is a plan view showing a surface treatment jig included in the processing apparatus of the embodiment.

圖4(a)是表示在本實施形態的處理裝置所處理的被處理體之一例的剖面圖。Fig. 4 (a) is a cross-sectional view showing an example of a target object processed by the processing apparatus of the embodiment.

圖4(b)是表示在本實施形態的處理裝置所處理的被處理體之一例的剖面圖。Fig. 4 (b) is a cross-sectional view showing an example of the object to be processed which is processed by the processing apparatus of the embodiment.

圖4(c)是表示在本實施形態的處理裝置所處理的被處理體之一例的剖面圖。Fig. 4 (c) is a cross-sectional view showing an example of the object to be processed which is processed by the processing apparatus of the embodiment.

圖4(d)是表示在本實施形態的處理裝置所處理的被處理體之一例的剖面圖。Fig. 4 (d) is a cross-sectional view showing an example of the object to be processed which is processed by the processing apparatus of the embodiment.

圖5是表示其他形態的表面處理治具的平面圖。Fig. 5 is a plan view showing a surface treatment jig of another embodiment.

10...載置台10. . . Mounting table

12...旋轉軸12. . . Rotary axis

14...馬達14. . . motor

16...洗淨槽16. . . Washing tank

18...被處理體18. . . Object to be processed

18a...被處理面18a. . . Processed surface

20...表面處理治具20. . . Surface treatment fixture

22a...對向面22a. . . Opposite face

30...供給手段30. . . Supply means

32...供給配管32. . . Supply piping

34...處理液槽34. . . Treatment tank

40...回收手段40. . . Recycling method

42...回收配管42. . . Recycling piping

44...吸引泵44. . . Suction pump

50...離間維持手段50. . . Separation maintenance

60...惰性氣體供給手段60. . . Inert gas supply means

62...惰性氣體槽62. . . Inert gas tank

64...惰性氣體供給配管64. . . Inert gas supply piping

66...噴嘴66. . . nozzle

100...處理裝置100. . . Processing device

A...剖面圖A. . . Sectional view

Claims (15)

一種處理裝置,其特徵係包含:載置台,其係載置被處理體;表面處理治具,其係以處理液來處理上述被處理體的被處理面;供給手段,其係對上述表面處理治具供給處理液;回收手段,其係回收供給至上述表面處理治具的處理液;及離間維持手段,其係將上述表面處理治具維持成與上述被處理面離間的狀態,又,上述表面處理治具,係具備:具有對向於上述被處理面的對向面,在該對向面與該被處理面之間保持從上述供給手段所供給的處理液,而來處理被處理面之處理部,上述處理部,係具備:從上述對向面往上述被處理體突出的突出部,藉由該突出部與上述被處理面之間的處理液的表面張力來將所被供給的處理液保持於上述對向面與上述被處理面之間。 A processing apparatus, comprising: a mounting table on which a target object is placed; a surface treatment fixture that treats a processed surface of the object to be processed by a treatment liquid; and a supply means for the surface treatment The jig is supplied with a treatment liquid; the recovery means is for recovering the treatment liquid supplied to the surface treatment fixture; and the separation maintenance means is for maintaining the surface treatment fixture in a state of being separated from the surface to be treated, and The surface treatment jig includes: a facing surface facing the surface to be processed; and the processing liquid supplied from the supply means is held between the facing surface and the surface to be processed to process the surface to be processed In the processing unit, the processing unit includes a protruding portion that protrudes from the opposite surface toward the object to be processed, and is supplied by a surface tension of the processing liquid between the protruding portion and the processed surface. The treatment liquid is held between the opposite surface and the surface to be treated. 如申請專利範圍第1項之處理裝置,其中,上述突出部之與上述被處理面對向的面為平面,藉由上述離間維持手段來使該突出部與該被處理面的 距離維持於3mm以下。 The processing device according to claim 1, wherein the surface of the protruding portion facing the surface to be processed is a flat surface, and the protruding portion and the processed surface are used by the separation maintaining means The distance is maintained below 3mm. 如申請專利範圍第1項之處理裝置,其中,具備:使處理後的被處理面乾燥之乾燥手段。 The processing apparatus according to the first aspect of the invention, further comprising: a drying means for drying the treated surface after the treatment. 如申請專利範圍第3項之處理裝置,其中,上述乾燥手段,為往上述被處理面供給惰性氣體的惰性氣體供給手段。 The processing apparatus according to claim 3, wherein the drying means is an inert gas supply means for supplying an inert gas to the surface to be treated. 如申請專利範圍第3項之處理裝置,其中,上述乾燥手段,為吸引殘留於上述被處理面的處理液之吸引手段。 The processing apparatus according to claim 3, wherein the drying means is a suction means for sucking the treatment liquid remaining on the surface to be treated. 如申請專利範圍第5項之處理裝置,其中,上述吸引手段,係利用上述表面處理治具來進行,在停止來自上述供給手段之處理液的供給的狀態下,藉由上述回收手段來吸引殘留於上述被處理面的處理液。 The processing apparatus according to claim 5, wherein the suction means is performed by the surface treatment tool, and the remaining means is used to attract the residue by stopping the supply of the treatment liquid from the supply means. The treatment liquid on the surface to be treated. 如申請專利範圍第1項之處理裝置,其中,上述對向面的面積,係比上述被處理面的面積小。 The processing apparatus according to claim 1, wherein the area of the opposing surface is smaller than the area of the surface to be processed. 如申請專利範圍第1項之處理裝置,其中,上述離間維持手段,係使表面處理治具對被處理體移動。 The processing apparatus according to claim 1, wherein the separation preventing means moves the surface treatment fixture to the object to be processed. 如申請專利範圍第8項之處理裝置,其中,上述離間維持手段,係使表面處理治具從被處理體的大略中心往外緣移動。 The processing apparatus of claim 8, wherein the separation preventing means moves the surface treatment fixture from a center of the object to the outer edge. 如申請專利範圍第1項之處理裝置,其中,上述載置台,係使所被載置的被處理體旋轉。 The processing apparatus according to claim 1, wherein the mounting table rotates the object to be processed. 一種表面處理治具,係使用於以處理液來處理被處理體的被處理面之表面處理治具,其特徵為: 具備處理部,其係具有在維持對被處理面離間時對向於上述被處理面的對向面,保持在該對向面與上述被處理面之間所被供給的處理液,而來處理被處理面,上述處理部,係具備:從上述對向面往上述被處理體突出的突出部,藉由該突出部與上述被處理面之間的處理液的表面張力來將所被供給的處理液保持於上述對向面與上述被處理面之間。 A surface treatment jig for use in a surface treatment tool for treating a treated surface of a treated object with a treatment liquid, characterized in that: The processing unit includes a processing liquid that is opposed to the processed surface when the surface to be processed is kept away, and is supplied with a processing liquid that is supplied between the opposing surface and the processed surface, and is processed In the processed surface, the processing unit includes a protruding portion that protrudes from the opposing surface toward the object to be processed, and is supplied by a surface tension of the processing liquid between the protruding portion and the processed surface. The treatment liquid is held between the opposite surface and the surface to be treated. 一種處理裝置,其特徵係包含:載置台,其係載置被處理體;表面處理治具,其係以處理液來處理上述被處理體的被處理面;供給手段,其係對上述表面處理治具供給處理液;回收手段,其係回收供給至上述表面處理治具的處理液;及離間維持手段,其係將上述表面處理治具維持成與上述被處理面離間的狀態,又,上述表面處理治具,係具備:具有對向於上述被處理面的對向面,在該對向面與該被處理面之間保持從上述供給手段所供給的處理液,而來處理被處理面之處理部,上述對向面的面積,係比上述被處理面的面積小。 A processing apparatus, comprising: a mounting table on which a target object is placed; a surface treatment fixture that treats a processed surface of the object to be processed by a treatment liquid; and a supply means for the surface treatment The jig is supplied with a treatment liquid; the recovery means is for recovering the treatment liquid supplied to the surface treatment fixture; and the separation maintenance means is for maintaining the surface treatment fixture in a state of being separated from the surface to be treated, and The surface treatment jig includes: a facing surface facing the surface to be processed; and the processing liquid supplied from the supply means is held between the facing surface and the surface to be processed to process the surface to be processed In the processing unit, the area of the opposing surface is smaller than the area of the surface to be processed. 一種表面處理治具,係使用於以處理液來處理被處理體的被處理面之表面處理治具,其特徵為: 具備處理部,其係具有在維持對被處理面離間時對向於上述被處理面的對向面,保持在該對向面與上述被處理面之間所被供給的處理液,而來處理被處理面,上述對向面的面積,係比上述被處理面的面積小。 A surface treatment jig for use in a surface treatment tool for treating a treated surface of a treated object with a treatment liquid, characterized in that: The processing unit includes a processing liquid that is opposed to the processed surface when the surface to be processed is kept away, and is supplied with a processing liquid that is supplied between the opposing surface and the processed surface, and is processed The surface to be processed has an area smaller than the area of the surface to be processed. 一種處理裝置,其特徵係包含:載置台,其係載置被處理體;表面處理治具,其係以處理液來處理上述被處理體的被處理面;供給手段,其係對上述表面處理治具供給處理液;回收手段,其係回收供給至上述表面處理治具的處理液;及離間維持手段,其係將上述表面處理治具維持成與上述被處理面離間的狀態,又,上述表面處理治具,係具備:具有對向於上述被處理面的對向面,在該對向面與該被處理面之間保持從上述供給手段所供給的處理液,而來處理被處理面之處理部,上述離間維持手段,係使表面處理治具對被處理體移動,上述離間維持手段,係使表面處理治具從被處理體的大略中心往外緣移動。 A processing apparatus, comprising: a mounting table on which a target object is placed; a surface treatment fixture that treats a processed surface of the object to be processed by a treatment liquid; and a supply means for the surface treatment The jig is supplied with a treatment liquid; the recovery means is for recovering the treatment liquid supplied to the surface treatment fixture; and the separation maintenance means is for maintaining the surface treatment fixture in a state of being separated from the surface to be treated, and The surface treatment jig includes: a facing surface facing the surface to be processed; and the processing liquid supplied from the supply means is held between the facing surface and the surface to be processed to process the surface to be processed In the processing unit, the detachment maintaining means moves the surface treatment jig to the object to be processed, and the detachment maintaining means moves the surface treatment jig from the approximate center of the object to the outer edge. 一種表面處理治具,係使用於以處理液來處理被處理體的被處理面之表面處理治具,其特徵為包含:處理部,其係具有在維持對被處理面離間時對向於上 述被處理面的對向面,保持在該對向面與上述被處理面之間所被供給的處理液,而來處理被處理面,離間維持手段,其係將上述表面處理治具維持成與上述被處理面離間的狀態,上述離間維持手段,係使表面處理治具對被處理體移動,上述離間維持手段,係使表面處理治具從被處理體的大略中心往外緣移動。 A surface treatment jig for use in a surface treatment jig for treating a treated surface of a target object with a treatment liquid, comprising: a treatment portion having a treatment portion that is opposed to while maintaining a separation from the surface to be treated The processing surface supplied between the opposing surface and the surface to be processed is held by the opposing surface of the surface to be processed, and the surface to be treated is treated, and the surface treatment means is maintained. In the state of being separated from the surface to be treated, the separation preventing means moves the surface treatment jig to the object to be processed, and the separation means moves the surface treatment jig from the center of the object to the outer edge.
TW096142480A 2006-11-30 2007-11-09 Processing device and surface treatment fixture TWI384542B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006324438A JP5038695B2 (en) 2006-11-30 2006-11-30 Processing apparatus and surface treatment jig

Publications (2)

Publication Number Publication Date
TW200830398A TW200830398A (en) 2008-07-16
TWI384542B true TWI384542B (en) 2013-02-01

Family

ID=39467606

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096142480A TWI384542B (en) 2006-11-30 2007-11-09 Processing device and surface treatment fixture

Country Status (3)

Country Link
JP (1) JP5038695B2 (en)
TW (1) TWI384542B (en)
WO (1) WO2008065809A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8141566B2 (en) * 2007-06-19 2012-03-27 Lam Research Corporation System, method and apparatus for maintaining separation of liquids in a controlled meniscus
US7849554B2 (en) 2009-04-28 2010-12-14 Lam Research Corporation Apparatus and system for cleaning substrate
JP5687862B2 (en) * 2010-08-06 2015-03-25 東京応化工業株式会社 Cleaning device, cleaning method and composition
JP5945094B2 (en) * 2010-12-03 2016-07-05 東京応化工業株式会社 Substrate cleaning method
US11705351B2 (en) 2017-12-01 2023-07-18 Elemental Scientific, Inc. Systems for integrated decomposition and scanning of a semiconducting wafer
US12152966B2 (en) 2020-04-16 2024-11-26 Elemental Scientific, Inc. Systems for integrated decomposition and scanning of a semiconducting wafer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI254968B (en) * 2003-12-02 2006-05-11 Dainippon Screen Mfg Substrate treating apparatus and substrate treating method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH047831A (en) * 1990-04-25 1992-01-13 Seiko Epson Corp Substrate drying method and substrate drying device
JPH1092784A (en) * 1996-09-10 1998-04-10 Toshiba Microelectron Corp Wafer processing apparatus and wafer processing method
JP3511441B2 (en) * 1996-11-29 2004-03-29 忠弘 大見 Liquid-saving liquid supply nozzle, wet processing apparatus, and wet processing method used for wet processing including cleaning, etching, development, and peeling
JP3338380B2 (en) * 1998-07-27 2002-10-28 東邦化成株式会社 Wafer processing apparatus and wafer processing method
JP3772056B2 (en) * 1998-10-12 2006-05-10 株式会社東芝 Semiconductor substrate cleaning method
JP4215900B2 (en) * 1999-08-13 2009-01-28 アルプス電気株式会社 Wet processing nozzle device and wet processing device
JP3958539B2 (en) * 2001-08-02 2007-08-15 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI254968B (en) * 2003-12-02 2006-05-11 Dainippon Screen Mfg Substrate treating apparatus and substrate treating method

Also Published As

Publication number Publication date
JP2008140909A (en) 2008-06-19
JP5038695B2 (en) 2012-10-03
TW200830398A (en) 2008-07-16
WO2008065809A1 (en) 2008-06-05

Similar Documents

Publication Publication Date Title
CN107026109B (en) Substrate cleaning apparatus and method, substrate processing apparatus and method
TWI384542B (en) Processing device and surface treatment fixture
KR20150130228A (en) Wafer processing method
JP4806282B2 (en) Wafer processing equipment
JP2017092379A (en) Protective film coating method
JP5713749B2 (en) Protective film coating device
JP4971078B2 (en) Surface treatment equipment
TWI357103B (en) Treatment device, treatment method, and surface tr
JP6228508B2 (en) Cleaning device, peeling system, cleaning method, program, and computer storage medium
US11090691B2 (en) Cleaning method for cleaning frame unit
KR101536379B1 (en) Method for processing process-target object
CN111341694A (en) Wafer manufacturing equipment
TW201932209A (en) Substrate treatment method including a substrate liquid processing step and an opposing portion cleaning step
JP4908085B2 (en) Wafer processing equipment
JP5471777B2 (en) Wafer processing method and wafer processing apparatus
JP6122790B2 (en) Peeling device and peeling system
JP6173036B2 (en) Processing equipment
JP5227441B2 (en) Processing equipment
JP6153886B2 (en) Cleaning device, peeling system, cleaning method, program, and computer storage medium
JP2015138819A (en) Spinner device
JP2007250738A (en) Holding fixture and method of grinding semiconductor wafer
JP7118536B2 (en) Workpiece cutting method
JP2018006395A (en) Transport method
JP2021125518A (en) Wafer processing method
JP2007180185A (en) Cleaning device