TWI380034B - Capacitive touch panel and inspection method thereof - Google Patents
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- 238000000034 method Methods 0.000 title claims description 28
- 238000007689 inspection Methods 0.000 title description 2
- 238000004804 winding Methods 0.000 claims description 76
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- 238000001514 detection method Methods 0.000 claims description 13
- 239000011265 semifinished product Substances 0.000 claims description 12
- 230000007547 defect Effects 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 7
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- 238000005259 measurement Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 12
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- 239000003990 capacitor Substances 0.000 description 4
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九、發明說明: 【發明所屬之技術領域】 曰本發明有關於一種電容觸控面板及其檢測方法,並且 別是有關於一種於製程中即可檢測之電容觸控面板及其測 【先前技術】 於習知祕式電容觸控面板之餘巾,彩色渡光片與觸 之感測結構多設置於同一基材上,並且因為彩色濾&片 多需採用雙面製程,因此感測結構可能於濾光片製程f發生 斷路或短路的問題。雖然有瑕疵的觸控面板終可於產品^廠 檢驗時檢測出來,但是卻已浪費了從瑕疵的觸控面板^生之 後的製造成本,並佔用了原可供其他合格的觸控面板使用的 生產線,進而降低了生產線的利用率。 因此有需要提出一種方法可於製程中找出缺陷的觸控面 板,以避免流入後續製程徒增製造成本及減少產能利用率。 【發明内容】 本發明之一目的在於提供一種電容觸控面板。 本發明之另一目的在於提供一種電容觸控面板之檢測方 法。 根據一具體實施例,本發明之電容觸控面板之檢測方法 包含:首先,準備一電容觸控面板半成品,其包含一層狀基 材、多排第-感測墊、多排第二感測墊、—介面連接墊以及 一基準電壓繞線。其中,每一排第一感測墊沿一第一方向平 行排列設置於該層狀基材上,每一排第一感測墊包含多個電 1380034Nine, the invention description: [Technical field of the invention] The present invention relates to a capacitive touch panel and a detection method thereof, and is not related to a capacitive touch panel which can be detected in a process and its measurement [Prior Art] 】 In the lingering capacitive touch panel, the color illuminator and the sensing structure are set on the same substrate, and because the color filter & film needs to use a two-sided process, the sensing structure There may be a problem that the filter process f is broken or shorted. Although the flawy touch panel can be detected at the time of product inspection, it has already wasted the manufacturing cost of the touch panel and occupies the original use of other qualified touch panels. The production line, which in turn reduces the utilization rate of the production line. Therefore, there is a need to propose a method for finding defective touch panels in the process to avoid influencing subsequent processes to increase manufacturing costs and reduce capacity utilization. SUMMARY OF THE INVENTION One object of the present invention is to provide a capacitive touch panel. Another object of the present invention is to provide a method of detecting a capacitive touch panel. According to a specific embodiment, the method for detecting a capacitive touch panel of the present invention comprises: first, preparing a capacitive touch panel semi-finished product, comprising a layered substrate, a plurality of rows of first-sensing pads, and a plurality of rows of second sensing Pad, interface pad and a reference voltage winding. Wherein, each row of the first sensing pads is arranged in parallel on a layered substrate along a first direction, and each row of the first sensing pads comprises a plurality of electrodes 1380034
性串聯的感測墊、一第一端連接部以及一第二端連接部。每 一排第二感測墊沿一第二方向平行排列設置於該層狀基材 上,該第一方向異於該第一方向,每一排第二感測墊包含多 個電性串聯的感測墊以及二個端連接部。該多排第二感測墊 與該多排第一感測墊交錯絕緣設置。該介面連接墊形成於該 f狀基材上,該介面連接墊包含多個第一連接墊以及多個第 二,接塾’該等第-連接墊電性連接該多排第—感測塾之該 等第-端連接部,該等第二連接墊電性連接該多排第二感測 塾。該基準電壓繞線形成於該層狀紐上,絲準電壓繞線 環繞該多排以及該多排第二❹播,該基準電壓 繞線並包好個橋接部以繞過該多排L雜之該等第二 端連接部及該籍第二感難之料猶接部。$外,定義 -切斷線麟雜基材上用於檢測後靖 斷線包圍該多排第一感測塾、該多排 塾該Μ面連接塾以及該基準電壓繞線。 、接著’將該多排第—感測塾經由相鄰的該等第二端連接 nf電性’ _線跨__線形成於該層狀基The sensing mat is connected in series, a first end connecting portion and a second end connecting portion. Each row of second sensing pads is arranged in parallel along a second direction on the layered substrate, the first direction is different from the first direction, and each row of second sensing pads comprises a plurality of electrically connected series The sensing pad and the two end connections. The plurality of rows of second sensing pads are interleaved with the plurality of rows of first sensing pads. The interface connection pad is formed on the f-shaped substrate, the interface connection pad includes a plurality of first connection pads and a plurality of second terminals, and the first connection pads electrically connect the plurality of rows of first sense pads The second connection pads are electrically connected to the plurality of rows of second sensing electrodes. The reference voltage winding is formed on the layered button, the wire quasi-voltage winding surrounds the plurality of rows and the plurality of rows of the second bust, the reference voltage is wound and a bridge is wrapped to bypass the plurality of rows of L The second end connecting portion and the second inferior material are still connected. $External, Definition - The cut-off line is used on the substrate for detecting the break line to surround the plurality of rows of first sense electrodes, the plurality of rows of the facets, and the reference voltage winding. And then, the plurality of rows of first sensing electrodes are connected to the layered base via the adjacent second ends of the nf electrical'_line __ lines
然’排除具有缺陷區域之電容觸控面板不以 亦可據别,斷絲排_其他餘實施於具有缺陷區域者 該多排第:❹触第—感測墊或 根;===== 因其 裁切出之電容觸控面板即本發明之電容觸控面板。 ί S1 7 Ϊ380034 =胃,第二端連接部藉由該繞線延伸至該邊緣;並且該 電H線S此以橋接的方式繞過該等第二端連接部。g 同,本發明之電容觸控面板並不以具有該基 關於本發明之優點與精 附圖式得到進一步的瞭解。However, 'excluding the capacitive touch panel with the defective area is not allowed to be distinguished, the broken wire row _ other implementations in the defective area of the multi-row: the first touch-sensing pad or root; ===== The capacitive touch panel of the present invention is the capacitive touch panel of the present invention. S S1 7 Ϊ 380034 = stomach, the second end connecting portion extends to the edge by the winding; and the electric H line S bypasses the second end connecting portions in a bridging manner. g. The capacitive touch panel of the present invention is not further understood by having the advantages and the drawings of the present invention.
【實施方式】[Embodiment]
準電壓繞線為限 神可以藉由以下的發明詳述及所 請參閱圖-及圖二。圖一係緣示根據本發明之第一具體 實施例之電容觸控面板之檢測方法之流程圖。圖二係繪示根 據第一具體實施例之電容觸控面板半成品之部分示意圖 即该,容觸控面板半成品可包含多個電容觸控面板,而圖二 僅顯示包含一個電容觸控面板之區域,其邊界以鏈線表示。 根據第一具體實施例,如步驟S100所示,本發明之電容觸控 面板之檢測方法包含首先準備一電容觸控面板半成品,如圖 二所示。該電容觸控面板半成品包含層狀基材12、多排第一 感測墊14(僅標示其一)、多排第二感測塾16(僅標示其一)、 介面連接墊18以及基準電壓繞線20。 ^ 母一排第一感測塾14沿第一方向D1平行排列設置於層 狀基材12上,每一排第一感測墊μ包含多個電性串聯的感 測墊14a(僅標示其一)、第一端連接部14b以及第二端連接部 14c。母一排弟一感測塾16沿第二方向D2平行排列設置於 層狀基材12上’每一排第二感測墊16包含多個電性串聯的 感測墊16a(僅標示其一)以及二個端連接部於第一具體 實施例中,第二方向D2垂直於第一方向D1,多排第二感測 墊14與多排第一感測墊16交錯絕緣設置。利用交錯排^的 I S] 8 感測墊14a、16a即可對觸控位置進行定位處理,因此於實際 產品設計中’第一方向D1不以與第二方向D2垂直為必要, 僅需彼此間形成失角即可(例如成菱形交錯設置)。 介面連接墊18形成於層狀基材12上,介面連接墊18包 含四個第一連接墊18a(僅標示其一)以及位於第一連接墊18a 兩側共八個之第一連接墊18b(兩側各標示其一該等第一連 接墊18a電性連接該多排第一感測墊14之第一端連接部 1扑’該等第二連接塾18b則經由該多排第二感測塾16之端 連接部16b電性連接該多排第二感測墊16。基準電壓繞線2〇 形成於層狀紐I2上,鱗賴祕Μ環_乡排第一感 /則墊14以及該多排第二感測墊16,基準電壓繞線2〇並包含 多個橋接部2Ga(僅標.示其二)以繞過該多排第—制塾14之 第二端連接部14e及該多排第二制墊16之端連接部脱。 ^於層狀紐I2上定義―切斷線CL(以虛絲_以於該 檢測方法實施後’切斷以形成一電容觸控面板(如圖八所示之 ,j控面板1)。切斷線CL包圍該多排第—感測塾14、該 夕排第二感麟16、介面連接塾18以及鱗賴繞線2〇。 如步騾S102所示,本發明之電容觸控 且包含將够排第-感· 14經由相_ 以第-繞線W1電性串聯,第一繞線W1 =Quasi-voltage winding is limited to God's detailed description of the invention and please refer to Figure- and Figure 2. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a flow chart showing a method of detecting a capacitive touch panel according to a first embodiment of the present invention. 2 is a partial schematic view of a semi-finished capacitive touch panel according to the first embodiment, that is, the capacitive touch panel semi-finished product may include a plurality of capacitive touch panels, and FIG. 2 only shows an area including a capacitive touch panel. Its boundaries are represented by chain lines. According to the first embodiment, as shown in step S100, the method for detecting a capacitive touch panel of the present invention comprises first preparing a capacitive touch panel semi-finished product, as shown in FIG. The capacitive touch panel semi-finished product comprises a layered substrate 12, a plurality of rows of first sensing pads 14 (only one of which is indicated), a plurality of rows of second sensing electrodes 16 (only one of which is indicated), an interface connecting pad 18 and a reference voltage Winding 20. ^ The first sensing 塾 14 of the mother row is arranged in parallel along the first direction D1 on the layered substrate 12, and each row of the first sensing pads μ comprises a plurality of electrically connected sensing pads 14a (only labeled a) a first end connecting portion 14b and a second end connecting portion 14c. The first row of sensing electrodes 16 are arranged in parallel along the second direction D2 on the layered substrate 12. Each row of second sensing pads 16 includes a plurality of electrically connected sensing pads 16a (only one of which is labeled And the two end connections are in the first embodiment, the second direction D2 is perpendicular to the first direction D1, and the plurality of rows of second sensing pads 14 are staggered and insulated from the plurality of rows of first sensing pads 16. The touch position can be positioned by using the staggered IS] 8 sensing pads 14a, 16a. Therefore, in the actual product design, the first direction D1 is not perpendicular to the second direction D2, and only needs to be between each other. It is sufficient to form a lost angle (for example, a diamond-shaped staggered arrangement). The interface connection pad 18 is formed on the layered substrate 12, and the interface connection pad 18 includes four first connection pads 18a (only one of which is labeled) and a total of eight first connection pads 18b on both sides of the first connection pad 18a ( The first connecting portion 1 of the plurality of rows of the first sensing pads 14 electrically connected to the first connecting pads 18a is electrically connected to the second connecting port 18b via the plurality of rows of second sensing The end connection portion 16b of the crucible 16 is electrically connected to the plurality of rows of second sensing pads 16. The reference voltage winding 2〇 is formed on the layered button I2, and the first ring/seat pad 14 The plurality of rows of second sensing pads 16 have a reference voltage winding 2〇 and include a plurality of bridge portions 2Ga (only two of which are shown) to bypass the second end connection portion 14e of the plurality of rows of first turns 14 and The end connection portion of the plurality of rows of second pads 16 is removed. ^ The cutting line CL is defined on the layered button I2 (after the dummy wire is used to cut off to form a capacitive touch panel) As shown in Fig. 8, the j control panel 1). The cutting line CL surrounds the plurality of rows of the first sensing 塾 14, the second row of the sensation lining 16, the interface connecting 塾 18, and the scale winding 2 如. Step S102 is shown The capacitive touch of the present invention includes and includes a first-in-one 14-phase via the phase-to-wire W1, the first winding W1 =
成於層狀基材上,如圖二所示。接著U ίί㈡5二6同時ί分別量測該多排第-感測墊14二 夕排第一感測墊16之電性連接狀態,如步驟& 檢測方法包含當該電性連接㈣被量測超出—二了 判斷該多排第—感測塾14或該多排第 1 缺陷或斷路缺陷,如步驟藝所示。有短, 不限於以錄量财電-鋪,亦彳===== 電容為依擄。 里判具電谷或寄生 於第一具體實施例中,在量測之前(亦即於步驟Si〇4之 前)’該檢測方法進一步包含以多個第二繞線W2(僅標示其一) 經由第一連接墊18a及第二連接墊18b將該多排第二感&墊 14與該多排第二感測墊16串聯,其中第二繞線W2跨越切 斷線CL形成於層狀基材12上,並自介面連接塾中引出 量測接點n、T2。由此量測接點Τ卜X2可量測出該多排第 一感測墊14與該多排第二感測墊16之串聯電阻值。當量測 的電阻值過大時,原則上可判斷有斷路缺陷;而當量測的電 阻值過小^,原則上可判斷有短路缺陷。另外,基於製造變 異上的考量’該多排第-感測墊M及該多排第二感測塾16 之串聯電阻值並非定值,而係一範圍,即前述標準範圍。 轨亦得直接以一量測接頭之探針直接接觸第一連接 接塾18b以實施前述量測’前述第二繞線W2 貝!可,應f域於該制接_而無f形成於層狀基材η 百'^述^二繞線W2所欲達成之連接關係可於與該量 =接頭連接之量測裝置内處理、決定,可進一步增加量測彈 八別:S Τί多排第1測墊14與該多排第二感測墊κ S 量^出^電Γ以分別判斷該多排第一感 於m括旦f第一感塾之電性連接狀態。又或,基 果^ f里測方式(一併量測及分別量測),將兩種量測处 ϊΐ=孰則_地判斷該多排第-感測塾心; 排苐一感測墊16之電性連接狀態。 ^ /、忑夕 «月併參閱圖二及圖三。圖三係、洽 ― 之電容觸控面板半成品之部分;If:、體實施例 再繪示出雜絲17 ΛΪ ® ’其巾為顧方便,不 例不同之處主土要在於n域並τ之。與第一具體實施 線,亦即每一排第1 所不之電容觸控面板為雙繞拉 連接㈣電性H塾1 戶 連接部i6b均與介面 而圖二所不之電容觸控面板則為單繞拉 Γ380034 ί H 導16僅—個猶接部齡面連接墊 18=性連接。於圖三中’將每一排第二感測墊16之二個 ,參閱圖二)分別定義為一第三端連接部16c(即圖二 中左側之端連接部16b)及一細端連接部16d(即圖二中右 =端=部16b),因此每—排第二感測墊16之第三端連接部 ^ 接塾18之第二連接塾i8b電性連接。此外,因 為苐-具體實關拥單繞拉線,目齡面連接118 二 ,接墊m之數量亦可對應地減少’所需第 [ 量亦隨之減少。 欲Formed on a layered substrate, as shown in Figure 2. Next, U ίί (2) 5 2 6 simultaneously measures the electrical connection state of the first row of the first sensing pads 16 of the plurality of rows of the first sensing pads, such as the step & detecting method, when the electrical connection (four) is measured Exceeding - two determines the plurality of rows of first sensing 塾 14 or the plurality of rows of first defects or open circuit defects, as shown in the step art. There is a short, not limited to the recording of electricity - shop, also 彳 ===== capacitors. In the first embodiment, before the measurement (that is, before step Si〇4), the detection method further includes a plurality of second windings W2 (only one of which is indicated) via The first connection pad 18a and the second connection pad 18b connect the plurality of rows of second sensing & pads 14 in series with the plurality of rows of second sensing pads 16, wherein the second winding W2 is formed on the layered base across the cutting line CL. On the material 12, the measurement contacts n and T2 are taken out from the interface connection. The measured contact point X2 can measure the series resistance of the plurality of rows of the first sensing pads 14 and the plurality of rows of second sensing pads 16. When the resistance value of the equivalent measurement is too large, it is judged that there is a disconnection defect in principle; and the resistance value of the equivalent measurement is too small, and in principle, a short-circuit defect can be judged. Further, the series resistance value of the plurality of rows of the first sensing pads M and the plurality of rows of the second sensing electrodes 16 is not a fixed value based on the consideration of manufacturing variations, but is a range, that is, the aforementioned standard range. The rail also has to directly contact the first connecting port 18b with a probe of a measuring connector to perform the aforementioned measurement 'the aforementioned second winding W2! Yes, the f field is formed in the connection _ without f forming on the layer The connection relationship between the substrate η and the two windings W2 can be processed and determined in the measuring device connected to the quantity=connector, and the measuring elastic can be further increased: S Τί multi-row The measuring pad 14 and the plurality of rows of second sensing pads κ S are electrically connected to determine the electrical connection state of the plurality of rows of first senses in the first sense. Or, the method of measuring the roots (following and measuring separately), and determining the multi-row first-sensing center of the two measurements; 16 electrical connection status. ^ /, 忑 « «月 and see Figure 2 and Figure 3. Figure 3 is the part of the semi-finished capacitive touch panel of the system; If:, the body embodiment then shows the shredded 17 ΛΪ ® 'the towel is convenient, except for the difference, the main land is in the n-domain and τ It. And the first specific implementation line, that is, each row of the first capacitive touch panel is a double-wound pull connection. (4) The electrical H塾1 connection portion i6b is connected to the interface and the capacitive touch panel of FIG. For a single winding pull 380034 ί H guide 16 only - a joint of the age of the face connection pad 18 = sexual connection. In FIG. 3, 'two of the second sensing pads 16 of each row, see FIG. 2' are respectively defined as a third end connecting portion 16c (ie, the left end connecting portion 16b in FIG. 2) and a thin end connection. The portion 16d (i.e., right = end = portion 16b in Fig. 2) is electrically connected to the second port 塾i8b of the third end connecting portion 18 of the second sensing pad 16. In addition, because the 苐- specific implementation of the single winding wire, the age of the surface connection 118 2, the number of pads m can also be correspondingly reduced 'required' [the amount is also reduced. want
基於與第—具體實施例相同之量測機制,於量測之前, 該檢測方法進-步包含將料排第二感測墊16經由相鄰的第 四端連接部16d以第三繞線W3電性串聯,第三繞線犯跨 越切斷線CL形成於層狀基材12(未標示於圖三中)上。夢 此,該多排第一感測墊14與該多排第二感測墊16亦同樣^ ,串聯二並可經由量測接點Τ卜Τ2進行量測。補充說明的 疋’於第-具體實施财,有關以制接頭接觸介面連接塾 18以實現量測之相關說明,於此亦有適用,不再贅述。Based on the same measurement mechanism as the first embodiment, prior to the measurement, the detection method further includes routing the second sensing pad 16 through the adjacent fourth end connection portion 16d to the third winding W3. Electrically connected in series, the third winding is formed on the layered substrate 12 (not shown in FIG. 3) across the cutting line CL. It is a dream that the plurality of rows of first sensing pads 14 and the plurality of rows of second sensing pads 16 are also the same, connected in series and can be measured via the measuring contacts. The supplementary description of 疋' in the first-specific implementation of the relevant instructions for the connection of the connector interface to achieve measurement, is also applicable here, and will not be described again.
明併參閱圖二及圖四。圖四係繪示根據第三具體實施例 之電容巧控面板半成品之部分示意圖,其中層狀基材U未緣 示及標示。與第一具體實施例不同之處在於,該多排第一感 測塾14與該夕排第一感測塾16分別量測,因此於介面連接 墊18之繞線將不同於第二繞線W2。於第三具體實施例中, 該檢測方法包含以至少一第四繞線W4經由第一連接墊18已 將該多排第一感測墊14串聯,並拉線出量測接點Τχ卜 TX2,並以多個第五繞線W5經由第二連接塾撕將該多排 第一感測墊16串聯,並拉線出量測接點τγι、τγ2。其中第 四繞線W4 ^第五繞線W5均跨越切斷線CL形成於層狀基 材Π上。藉此,於步驟sl〇4中,可經由量測接點τχι、 11 1380034 TX2量測該多排第一感測墊14之電阻,另經由量測接點 ΊΎ1、ΊΎ2量測該多排第二感測墊16之電阻。補充說明的 是,於第一具體實施例中有關以量測接頭接觸介面連接墊18 以實現量測之相關說明’於此亦有適用,不再贅述。 請併參閱圖三、圖四及圖五。圖五係繪示根據第四具體 實施例之電容觸控面板半成品之部分示意圖,其中層狀基材 12未繪示及標示。與第二具體實施例不同之處在於,該多排 第一感測墊14與該多排第二感測塾16分別量測,因此於介 面連接墊18之繞線將不同於第二繞線W2,此情形相當於第 二具體實施例與第一具體實施例之不同。與第三具體實施例 不同之處則在於,圖四所示之電容觸控面板為雙繞拉線,而 圖五所示之電容觸控面板則為單繞拉線,此情形相當於第二 具體實施例與第一具體實施例之不同。因此,於第三具體杂 施例中’ ϋ檢測方法進-步包含以至少一第六繞線W6經: 第-連接墊18a將該多排第-感測墊M串聯,並拉線出 接點TX1、TX2 ;並將該多排第二感測塾10、經由相鄰的 端連接部16d以第七繞線W7(相當於圖三中第三繞線从,3、带 性串聯;以及以至少一第八繞、線W8經由第二連接塾l8b^ 該多排第二制塾16串聯’並拉線出量測接點顶、τγ2。 其中第六繞線W6、第七緩線W7及第人繞線均跨越 CL形成於層狀基材12上。藉此,於步驟sl〇4中,可經 測接點TX卜TX2量測該多排第—感測塾14之電阻= ^量測接點TYi、TY2量測該多排第二感測塾16之電阻, 二H第"1具體實施例中’有關以量測接頭接觸介面連接 塾8以實現量測之相關說明,於此亦有適用,不再資述。 請參閱圖六。圖六係繪示根據第五具體實施例 控面板半成品之部分示意圖’其中層狀基材12未繪示 不。與第-具體實施例不同之處在於,該多排第二感測墊& 12 Ϊ380034 被量測者為其電容,而非其電阻,因此於介面連接墊18之繞 線亦有所不同。於該第五具體實施例中,該檢測方法進一J; 包含至少一第九繞線W9經由第一連接墊18a將該多排第二 感測塾14串聯’並拉線出量測接點丁乂卜τχ2 ;以第十繞 • W10經由第二連接墊18b分別將奇數排(由上而下之順序)之 第二感測墊16並聯,並自第十繞線W10拉線出量測接點 TY3 ;以第十一繞線W11經由第二連接墊18b分別將偶數排 之第二感測墊16並聯,並自第十一繞線W11拉線出量測接 點TY4。其中第九繞線W9、第十繞線wl〇及第十一^線 φ WU均跨越切斷線CL形成於層狀基材12上。 ' 藉此,於步驟S104中,該檢測方法仍經由量測接點 TX1、TX2量測該多排第一感測墊μ之電阻,但對該多排第 一感測塾16之電性連接狀態之量測則經由量測接點τγ3、 TY4以量測其與該多排第一感測墊μ之寄生電容來實現。當 量測的寄生電容值超出標準範圍時(例如與一標準值差距二 大)’表示該多排第二感測墊16有斷路缺陷或短路缺陷。補 充說明的是,第五具體實施例中之量測架構亦可適用於單繞 拉線之電容觸控面板中,如圖七所示。圖七顯示每一排第二 Φ 感測塾16僅一端連接部16b與第二連接塾i8b電性連接,而 呈單繞拉線形式。g然,於第一具體實施例中有關以量測接 頭接觸介面連接墊18以實現量測之相關說明,於此亦有適 用,不再贅述。 於該電容觸控面板檢測完畢後’其自該電容觸控面板半 成品上(或謂自層狀基材12上)’沿切斷線CL裁切出來。以 第一具體實施例為例,裁切出來的電容觸控面板1如圖八所 示。電容觸控面板1之邊緣22即對應層狀基材12上之切斷 線CL ’因此*第一繞線W1及第一繞線W2均被裁切,使得繞 線連接的功能消失。從外觀來看,每一排第一感測塾14之第 ts] 13 1380034 j連,14C均延伸至邊緣22,或謂第 由第一、、>〇線W1延伸至邊緣22 ;同樣地,M 二 曰 第二遠接執r t 6 天把1第一連接墊18a及 殘留的部分第」繞、ί w、ri Γ-ϊ: w,緣22。換句話說, 有效心測該 不,,外= 低製造成本、增加產能利用率並提高生產良率。 , 同樣地,於其他前述各具體實施例中,於 即可沿切斷線CL動础所需的電容_板1 = 圍繞出之區域=示== 二ίί ΐ 特別說明的是,請併參_七及圖九。 之電容觸控面板之示意圖。將每一排第 忒=6 =連接部16b(如圖七所示)分別定義為第三端 9端連接部16d,此相似於第二具體實施 i接ϊιλι’於圖九十,第三端連接部i6e係指與第二 電性連接之端連接部16b。因此,於此架構中, f 2連16C與第四端連接部16d係以端連接部16b交 1=·&哲二ί貝仍為每一排第二感測塾16經由其一端連接部 16b與第二連接塾18b電性連接。 補充說明的是’依各產品設計的不同,本發明之電容觸 二面^不$具有基準電壓繞線為限。請併參閱圖八及圖十。 係繪示根據—具體實施例之未具有基準賴繞線之電容 觸控面板Γ之示意圖。此電容觸控面板Γ係基於第一具體實 施例之電容觸控面板1變化而成。不同之處,僅在於電容觸 iS] 14 1380034 f面板1’未具有基準電屋繞線 未具有基準電顯線2G之電 "^圖^)。換句話說, 明之檢測方法檢測之。因此,運用本發 ^詳細佈局可參閱前述各具體 併形成,使得製程中檢測得以實現:製程-,麦續製程之外’避免無效的製程實:=:以 於製程中’大幅減少檢測時間及二η方j可實施 換時間’使得製程中檢測之可行間之轉 以對❹ΐ二^排π 針imi6—分別戒同時進行電阻或電容之檢* ί二 對早一的電谷觸控面板(如圖九所示 查 =18單獨對該多排第一感啦14進行^阻^^面連 土發:月之,法遠較傳統檢測方法具 二 擇,且可触紐叙檢麻果。 w檢利^ 藉由以上較佳具體實施例之詳述,希望能更加 3明之特徵,神,而並非以上述所揭露触佳』= ::對本發明之㈣加以限制。相反地,其目的^望能涵 改變及具鱗性的鶴於本發_对請之專利範圍 内。因此’本發明所中請之專利範圍 賴,㈣使純物能的= 1380034 【圖式簡單說明】 圖一係繪示根據本發明 板之檢測方法之流程圖。 —具體實施例之電容觸控面 圖 之部分示意圖 .據第一 具體實施例之電容觸控 面板半成品 圖二係繪示根據第二且See Figure 2 and Figure 4 for details. Figure 4 is a partial schematic view showing a semi-finished product of a capacitive control panel according to a third embodiment, wherein the layered substrate U is not shown and labeled. The difference from the first embodiment is that the plurality of rows of first sensing electrodes 14 and the first row of first sensing electrodes 16 are respectively measured, so that the windings of the interface connecting pads 18 will be different from the second windings. W2. In a third embodiment, the detecting method includes connecting the plurality of rows of first sensing pads 14 in series via the first connection pad 18 with at least one fourth winding W4, and pulling out the measurement contacts. And connecting the plurality of rows of first sensing pads 16 in series via a plurality of fifth windings W5 via the second connection, and pulling out the measurement contacts τγι, τγ2. The fourth winding W4 ^ fifth winding W5 is formed on the layered substrate 跨越 across the cutting line CL. Therefore, in step s1〇4, the resistance of the plurality of rows of first sensing pads 14 can be measured via the measuring contacts τχι, 11 1380034 TX2, and the plurality of rows of the first sensing pads 14 are measured via the measuring contacts ΊΎ1 and ΊΎ2. The resistance of the second sensing pad 16 is. It is to be noted that, in the first embodiment, the relevant description for measuring the joint contact interface connecting pad 18 for measuring is also applicable here and will not be described again. Please also refer to Figure 3, Figure 4 and Figure 5. FIG. 5 is a partial schematic view showing a semi-finished product of a capacitive touch panel according to a fourth embodiment, wherein the layered substrate 12 is not shown and labeled. The difference from the second embodiment is that the plurality of rows of first sensing pads 14 and the plurality of rows of second sensing electrodes 16 are respectively measured, so that the windings of the interface connecting pads 18 will be different from the second windings. W2, this case is equivalent to the difference between the second embodiment and the first embodiment. The difference from the third embodiment is that the capacitive touch panel shown in FIG. 4 is a double-wound pull cable, and the capacitive touch panel shown in FIG. 5 is a single-wound pull cable, which is equivalent to the second The specific embodiment is different from the first embodiment. Therefore, in the third specific embodiment, the ϋ detection method further includes connecting the plurality of rows of the first-sensing pads M in series with at least one sixth winding W6 via the first connection pad 18a, and pulling out the wires. Points TX1, TX2; and the plurality of rows of second sensing turns 10, via the adjacent end connecting portion 16d to the seventh winding W7 (corresponding to the third winding in Figure 3, 3, banded in series; The at least one eighth winding, the line W8 is connected in series by the second connection 塾l8b^ the plurality of rows of the second cymbal 16 and pulls the measurement of the contact top, τ γ2. The sixth winding W6 and the seventh slow line W7 And the first person winding is formed on the layered substrate 12 across the CL. Thereby, in step s1〇4, the resistance of the plurality of rows of the first sensing 塾14 can be measured by the measuring point TXb TX2. The measuring contacts TYi and TY2 measure the resistance of the plurality of rows of second sensing electrodes 16 , and the second embodiment of the second embodiment is related to measuring the connector contact interface port 8 to achieve measurement. Please refer to FIG. 6. Figure 6 is a partial schematic view of a control panel semi-finished product according to a fifth embodiment, wherein the layered substrate 12 is not shown. The difference in the body embodiment is that the plurality of rows of second sensing pads & 12 Ϊ 380034 are measured by their capacitance, not their resistance, so the winding of the interface connection pad 18 is also different. In a specific embodiment, the detecting method further comprises: comprising at least one ninth winding W9 connecting the plurality of rows of second sensing electrodes 14 in series via the first connecting pad 18a and pulling out the measuring contact point Ding Bu τ χ 2 The tenth windings • W10 respectively connect the odd rows (the top-down order) of the second sensing pads 16 in parallel via the second connection pads 18b, and pull the measurement contacts TY3 from the tenth windings W10; The even rows of the second sensing pads 16 are respectively connected in parallel by the eleventh winding W11 via the second connection pads 18b, and the measuring contacts TY4 are pulled out from the eleventh winding W11. The ninth winding W9, The tenth winding w1〇 and the eleventh line φ WU are both formed on the layered substrate 12 across the cutting line CL. By this, in step S104, the detecting method still passes the measurement contacts TX1, TX2. Measure the resistance of the plurality of rows of first sensing pads μ, but the measurement of the electrical connection state of the plurality of rows of first sensing electrodes 16 is via the measurement contact point τγ3, TY4 is measured by measuring the parasitic capacitance of the plurality of rows of first sensing pads μ. When the measured parasitic capacitance value exceeds the standard range (for example, the difference from a standard value is two), the multi-row second sense is expressed. The test pad 16 has a circuit breaker defect or a short circuit defect. It is to be noted that the measurement architecture in the fifth embodiment can also be applied to a capacitive touch panel of a single-wound cable, as shown in Figure 7. Figure 7 shows each A row of second Φ sensing turns 16 is only electrically connected to the second connection 塾i8b by the one end connecting portion 16b, and is in the form of a single winding wire. In the first embodiment, the measuring contact interface is connected. The pad 18 is related to the measurement, and is also applicable here and will not be described again. After the capacitive touch panel is detected, it is cut from the capacitive touch panel blank (or from the layered substrate 12) along the cutting line CL. Taking the first specific embodiment as an example, the cut capacitive touch panel 1 is shown in FIG. The edge 22 of the capacitive touch panel 1 corresponds to the cutting line CL' on the layered substrate 12. Therefore, both the first winding W1 and the first winding W2 are cut, so that the function of the winding connection disappears. From the appearance, each row of the first sensing 塾 14 ts] 13 1380034 j, 14C extends to the edge 22, or the first, > 〇 line W1 extends to the edge 22; , M 曰 second remote rt 6 days to 1 1 first connection pad 18a and the remaining part of the winding, ί w, ri Γ-ϊ: w, edge 22. In other words, effective heart testing should not, outside = low manufacturing costs, increased capacity utilization and increased production yield. Similarly, in the other foregoing specific embodiments, the capacitance required to move along the cutting line CL_board 1 = surrounding area = indication == two ίί ΐ In particular, please refer to _7 and Figure 9. A schematic diagram of a capacitive touch panel. Each row of the second 忒=6=connecting portion 16b (shown in FIG. 7) is defined as the third end 9 end connecting portion 16d, which is similar to the second embodiment i ϊ ιλι' in the figure ninety, the third end The connection portion i6e refers to the end connection portion 16b that is electrically connected to the second. Therefore, in this architecture, the f 2 connection 16C and the fourth end connection portion 16d are intersected by the end connection portion 16b 1=·& 哲二ί is still the second sense 每一16 of each row via its one end connection portion 16b It is electrically connected to the second port 18b. It is added that the capacitance of the present invention is not limited to the reference voltage winding, depending on the design of each product. Please also refer to Figure 8 and Figure 10. A schematic diagram of a capacitive touch panel that does not have a reference winding according to a specific embodiment is shown. The capacitive touch panel is modified based on the capacitive touch panel 1 of the first embodiment. The only difference is that the capacitive touch iS] 14 1380034 f panel 1' does not have the reference electric house winding. The electric power of the reference electric display line 2G is not <^^^. In other words, the detection method of the detection is detected. Therefore, using the detailed layout of the present invention can be referred to the above specific details and formed, so that the detection in the process can be realized: the process - the process of avoiding the invalid process outside the process: =: in the process, the detection time is greatly reduced The second η square j can be implemented with the change of time 'so that the feasible detection of the process is changed to the ❹ΐ ^ π pin imi6 — respectively, or the resistance or capacitance check is performed at the same time. As shown in Figure IX, check = 18 alone for the first row of the first sense of 14 ^ ^ ^ ^ face with the soil: the moon, the law far more than the traditional detection method has two choices, and can touch the new check the results. </ RTI> </ RTI> </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; It is within the scope of the patents of the present invention. Therefore, the patent scope of the invention is based on (4) the pure material energy = 1380034 [Simplified illustration] A flow chart showing a method for detecting a panel according to the present invention. Receiving partial schematic view of the touch. Semifinished FIG capacitive touch panel according to a first embodiment of the system shown in accordance with a second two and
之部分示意圖。 仏例之電容觸控面板半成品 圖四係繪示根據第三罝 之部分示意圖。 一實施例之電容觸控面板半成品 圖五係繪示根據第四夏 之部分示意圖。 “實施例之電容觸控面板半成品 圖六係繪示根據第五具 之部分示意圖。 、貫施例之電容觸控面板半成品Part of the schematic. The semi-finished product of the capacitive touch panel of the example is shown in the figure of the third part. A capacitive touch panel semi-finished product according to an embodiment is shown in the figure of the fourth summer. "Capacitor Touch Panel Semi-finished Product of the Embodiment Figure 6 is a schematic diagram showing part of the fifth part.
圖七係繪示根據另一具 之部分示意圖。 一貫施例之電容觸控面板半成品 意 圖。圖八鱗祿據第—相實施例之電容面板之示 圖罐示基㈣板之示意圖。 電容具财匈之未科鮮繞線之 【主要元件符號說明】 16 Ϊ380034Figure 7 is a partial schematic view showing another part. A semi-finished product of a capacitive touch panel that has been consistently applied. Figure 8 is a schematic view of the capacitor panel of the first embodiment. Capacitor has a fresh winding of the economy of Hungary. [Main component symbol description] 16 Ϊ380034
l、r:電容觸控面板 12 :層狀基材 16 :第二感測墊 20 :基準電壓繞線 14a、16a :感測墊 14c :第二端連接部 16c :第三端連接部 18a :第一連接墊 20a .橋接部 D1 :第一方向 Ή、T2、TX 卜 TX2、TY1 W1 :第一繞線 W3 :第三繞線 W5 :第五繞線 W7 :第七繞線 W9 :第九繞線 W11 :第Η —繞線 14 :第一感測墊 18 :介面連接墊 22 :邊緣 14b :第一端連接部 16b :端連接部 16d :第四端連接部 18b:第二連接墊 CL :切斷線 D2 :第二方向 、TY2、TY3、TY4 :量測接點 W2 :第二繞線 W4 :第四繞線 W6 :第六繞線 W8 :第八繞線 W10 :第十繞線 S100〜S106 :實施步驟 IS] 17l, r: capacitive touch panel 12: layered substrate 16: second sensing pad 20: reference voltage winding 14a, 16a: sensing pad 14c: second end connecting portion 16c: third end connecting portion 18a: First connection pad 20a. Bridge portion D1: first direction Ή, T2, TX Bu TX2, TY1 W1: first winding W3: third winding W5: fifth winding W7: seventh winding W9: ninth Winding W11: Η-winding 14: first sensing pad 18: interface connecting pad 22: edge 14b: first end connecting portion 16b: end connecting portion 16d: fourth end connecting portion 18b: second connecting pad CL : cutting line D2 : second direction, TY2, TY3, TY4 : measuring contact W2 : second winding W4 : fourth winding W6 : sixth winding W8 : eighth winding W10 : tenth winding S100~S106: Implementation steps IS] 17
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| TW97139407A TWI380034B (en) | 2008-10-14 | 2008-10-14 | Capacitive touch panel and inspection method thereof |
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| TW97139407A TWI380034B (en) | 2008-10-14 | 2008-10-14 | Capacitive touch panel and inspection method thereof |
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|---|---|
| TW201015081A TW201015081A (en) | 2010-04-16 |
| TWI380034B true TWI380034B (en) | 2012-12-21 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97139407A TWI380034B (en) | 2008-10-14 | 2008-10-14 | Capacitive touch panel and inspection method thereof |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI380034B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI662459B (en) * | 2018-07-05 | 2019-06-11 | 友達光電股份有限公司 | Touch panel |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI410636B (en) * | 2010-10-13 | 2013-10-01 | Adl Engineering Inc | Probe card |
| CN110082631B (en) * | 2019-04-29 | 2021-08-17 | 昆山龙腾光电股份有限公司 | Test method and test device for touch panel |
-
2008
- 2008-10-14 TW TW97139407A patent/TWI380034B/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI662459B (en) * | 2018-07-05 | 2019-06-11 | 友達光電股份有限公司 | Touch panel |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201015081A (en) | 2010-04-16 |
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| MM4A | Annulment or lapse of patent due to non-payment of fees |