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TWI376819B - Photo diode package base structure and manufacturing method of the same - Google Patents

Photo diode package base structure and manufacturing method of the same Download PDF

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Publication number
TWI376819B
TWI376819B TW97129441A TW97129441A TWI376819B TW I376819 B TWI376819 B TW I376819B TW 97129441 A TW97129441 A TW 97129441A TW 97129441 A TW97129441 A TW 97129441A TW I376819 B TWI376819 B TW I376819B
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Taiwan
Prior art keywords
layer
substrate
base structure
conductive
package base
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TW97129441A
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Chinese (zh)
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TW201007971A (en
Inventor
Chih Ming Chen
Ching Chi Cheng
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Silicon Base Dev Inc
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Priority to TW97129441A priority Critical patent/TWI376819B/en
Publication of TW201007971A publication Critical patent/TW201007971A/en
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Publication of TWI376819B publication Critical patent/TWI376819B/en

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Description

1376819 九、發明說明: 【發明所屬之技術領域】 本案係為一種光二極體封裝基座結構及其製作方 法’尤指一種應用於一光二極體晶粒上的_種封裝基座結 構及製作方法。 L无刖技術】1376819 IX. Description of the invention: [Technical field of invention] The present invention relates to a photodiode package pedestal structure and a manufacturing method thereof, particularly a capsular pedestal structure and fabrication for use on a photodiode die method. L flawless technology]

請參見第-圖,其係為習用光二極體封裝基座構造截 面不意圖。從圖中我們可以清楚的看出此習用光二極體封 裝基座構造1主要是树基板1G上形成有承载空間^ 以及導通孔12、13,其中矽基板10具有表面1〇1、1〇2 , 承载空間11的頂部開口位於石夕基板1〇之表面101之侧, 而承載空間11底部係用以承載如發光二極體(led =二極體Dic)de)等的光二極體晶粒職,而 j 12、13的頂部連通於承載空間㈣底部。此外,Please refer to the figure, which is a schematic view of the conventional light-diode package base construction. It can be clearly seen from the figure that the conventional photodiode package base structure 1 is mainly formed with a bearing space ^ and via holes 12, 13 on the tree substrate 1G, wherein the crucible substrate 10 has surfaces 1〇1, 1〇2 The top opening of the load-bearing space 11 is located on the side of the surface 101 of the stone substrate, and the bottom of the load-bearing space 11 is used to carry the photodiode grains such as a light-emitting diode (led = diode Dic). Job, while the top of j 12, 13 is connected to the bottom of the carrying space (four). In addition,

:土板10的表面ΗΠ、1〇2與環繞於承载空間n四周 ,面以及導通孔12、13的側壁表面上形成有第一層 乳化矽絕緣層Η,域絲切 = ;==率_所完成的反射層15=: 絕緣層“上f 16,最後在氧切 之光二極體封裝基= 層17後’便完成如第, 上二雜封裝基座結構1的設計 刀的㈣。例如··上述習用封裝基座結構 6 1中所包含的反射層15主要是用來提供高的光反射率來 反射由置於封裝基座結構i内部的光二極體晶粒1麵發 出的光。但是在習用封裝基座結構1中,其反射層15上 形成有氧化⑦絕緣層16,而通常此氧化概緣層16會有 光部分吸收㈣題,因此便會造成反射層15對光線反射 率下降的情況;糾,在反射層15上形成氧化石夕絕緣層 16的這個製作過財會有大約攝氏3GG度以上的溫度產 生而這個度也會造成原本光亮的反射層15表面變得 較為粗糙岐其反料大為下降;再者,-般的氧化石夕絕 緣層14、16的導熱效果不良,當導電層17進行導電所產 生的熱旎,氧化矽絕緣層14、16也較不利於熱能的傳導, 對於整體封裝基座結構〗的散熱效率也造成了極大的影 響。因此,如何針對習用光二極體封裝基座結構1在設計 上所產生的問題,係為發展本案之最主要的目的。 【發明内容】 本案係為一種封裝基座結構,用於承載一光二極體晶 粒,該封裝基座結構包含:一基板,其係具有一第一表面 與一第二表面;一導通孔,其係貫穿於該基板,且該導通 孔之頂部開口位於該基板之該第一表面,該導通孔之底部 開口位於該基板之該第二表面;以及一導電反射層,其係 形成於該基板之該第一表面上,並具有一導電部與一反射 邛’其中該導電部係通過該導通孔之側壁並延伸形成至該 基板之該第二表面上並可與該光二極體晶粒完成電性連 接’而該反射部係位於該米二極體晶粒與該基板之第一表 面之間》 根據上述構想,本案所述之封裝基座結構,其中該基 板係可為晶格方向(100)、晶格方向⑴〇)、或晶格方向(111) 之碎晶圓基板。 根據上述構想,本案所述之封裝基座結構,其中該導 電反射層係以一 Tiw/Cu/Ni/Au合金、一 Ti/Cu/Ni/Au合 金、一 Ti/Au/Ni/Au合金或一 A1Cu/Ni/Au合金所完成。 根擄上述構想,本案所述之封裝基座結構,其中該導 電反射層所具有之該導電部與該反射部係間隔有大於2〇 微米(um)之間距。 根擄上述構想,本案所述之封裝基座結構,更包含 有··一氧化矽絕緣層,其係形成於該基板所具有之該第一 表面、該第二表面以及該導通孔之侧壁上;一反射層,其 係形成於該導電反射層所具有之該反射部上;以及一透明 保護層’其係形成於該反射層上。 根擄上述構想,本案所述之封裝基座結構,其中該反 射層係由對光反射率很高之銘或銀材質所完成。 根擄上述構想,本案所述之封裝基座結構,其中該透 明保護層係以-二氧化賴緣層_2)、—氮切絕緣層 (SixNy)、一聚亞醯胺絕緣層(p〇lyimide)、一聚甲基丙烯酸 甲酯絕緣層(Polymethyl Methacrylate: PMMA)或一光阻層 SU8等材質所完成之該透明保護層。 根據上述構想,本案所述之封裝基座結構,更包含一 承載空間,其頂部開口位於該基板所具有之該第一表面, 1376819 其底部用以承載該光二極體晶命 通於該承載空間之底部。而該導通孔之頂部係連 =據上述構想,本案所述之魄基座結構,其中該承 载工間之頂部開口係可位於該基板所具有之該第二表面。 根據上述構想,本案所述之封裝基座結構,1中該導 通孔之頂部開口係大於、等於或小於該底部開口、。 =上賴想’本案所述之縣基座結構,其中該光 粒係以一打線之方式或—覆晶之方式與該反射 導电層所具有之該導電部完成電性連接。 根據上述構想’本案所述之封裝基座結構,其所承載 之該光二極體晶粒係可為—發光二極體晶粒或一雷射二 體晶粒。 本案另-方面係為—種光二極體封裝基座結構之製 作方法,該方法包含下列步驟:提供一基板,其係具有一 第-表面與-第二表面;於職板之該第—表面上形成一 罩幕層’·於該罩幕層上定義出一開口;對該基板進行蝕 刻’進而於該開口處形成至少兩個導通孔,該等導通孔係 連通於該基板之該第_表面與該第二表面;以及去除該 幕層並於該練之料—表面上謂成—導狀射層1 導電反射層係具有-導電部與—反射部,其中該導電部係 通過該轉通孔之側壁並㈣形絲該基板之該第二表 面上方並與-光二極體晶粒完成€性連接,而該反射部係 位於該光二極體晶粒與該基板之第一表面之間。 根擄上述構想,本案另一方面所述之光二極體封裝基 9 f結構f作方法,其巾該基板係可為晶格方向(100)、晶 。方向(11G)、或晶格方向⑴丨)之發晶圓基板。 根據上述構想,本案另—方.面所述之光二極體封裝基 座結婦作方法,其巾關口之職方法包含下列步驟: ^該基板之該第H形成錢切、氧切或金屬完 成之該罩幕層;_罩幕層上形成-光阻層;利用一光 罩在該光阻層上出—光阻圖形;以及根據該光阻圖形 光對該罩幕層進行烟而形成該開口。 根據上述構想,本案另—方面所述之光二極體封裝基 座、”。構製作方法’其申該基板係可利用一渔式飯刻或一乾 式蝕刻對該開口進行蝕刻。 根據上述構想,本案另—方面所述之光二極體封裝基 座結構製作方法,更包含下辭驟:純行_後之該基 ,之該第一表面、該第二表面與該等導通孔側壁上形成一 氧化H缘層;於該第-表面、該第二表面、該等導通孔 側壁之該氧化♦絕緣層上形成該導電反射層;於該導電 反射層所具有之該反射部上形成—反射層;以及於該反射 層上形成一透明保護層。 根據上述構想’本案另一方面所述之光二極體封裝基 座結構製作方法’其中該氧切絕緣層係以—高溫氧化之 方式所形成。 根據上述構想,本案另一方面所述之光二極體封裝基 座結構製作方法,其中該反射層係由對総射率报高之紹 或銀材質所完成並以-蒸鍍或魏之方式形成於該反射 1376819 部上。 根據上述構想’本案另一方面所述之光二極體封裝基 座結構製作方法,其巾料明倾層仙-二A化石夕絕緣 層(Sl02)、一氮化矽絕緣層(SixNy)、一聚亞醯胺絕緣層 (Polyimide)、一聚曱基丙烯酸曱酯絕緣層(p〇lymethylThe first layer of emulsified insulating layer Η is formed on the surface of the soil plate 10, 1〇2 and the periphery of the bearing space n, and the surface of the side wall and the through holes 12 and 13 are formed, and the area is cut ==== rate_ The completed reflective layer 15 =: the insulating layer "on f 16, finally after the oxygen-cut light diode package base = layer 17" completes the design of the upper two-package base structure 1 (four). For example The reflective layer 15 included in the conventional package base structure 61 is mainly used to provide high light reflectance to reflect light emitted from the surface of the photodiode die 1 placed inside the package base structure i. However, in the conventional package base structure 1, an oxide 7 insulating layer 16 is formed on the reflective layer 15, and generally the oxidized front edge layer 16 has a light partial absorption (four) problem, thereby causing the reflective layer 15 to reflect light. The case of the lowering; correction, the formation of the oxidized oxide layer 16 on the reflective layer 15 has a temperature of about 3 GG or more, and this degree also causes the surface of the originally bright reflective layer 15 to become rough. The opposite is expected to fall; in addition, the general oxidized stone eve The heat conduction effect of the edge layers 14 and 16 is poor. When the conductive layer 17 conducts heat, the yttrium oxide insulating layers 14 and 16 are also unfavorable for the conduction of heat energy, and the heat dissipation efficiency of the entire package base structure is also caused. Great impact. Therefore, how to solve the problem caused by the design of the conventional photodiode package base structure 1 is the most important purpose of the development of the present invention. [Invention] This case is a package base structure for Carrying a photodiode die, the package base structure comprises: a substrate having a first surface and a second surface; a via hole extending through the substrate, and the top opening of the via hole is located a first surface of the substrate, a bottom opening of the via hole is located on the second surface of the substrate; and a conductive reflective layer formed on the first surface of the substrate and having a conductive portion and a reflection The conductive portion passes through the sidewall of the via hole and extends to form on the second surface of the substrate and can be electrically connected to the photodiode die. Between the rice diode dies and the first surface of the substrate. According to the above concept, the package pedestal structure of the present invention, wherein the substrate can be in a lattice direction (100), a lattice direction (1) 〇) Or a wafer substrate of the lattice direction (111). According to the above concept, the package base structure of the present invention, wherein the conductive reflective layer is a Tiw/Cu/Ni/Au alloy, a Ti/Cu/Ni The Au-alloy, a Ti/Au/Ni/Au alloy, or an A1Cu/Ni/Au alloy. According to the above concept, the package base structure of the present invention, wherein the conductive reflective layer has the conductive portion and The reflective portion is spaced apart by more than 2 〇 micrometers (um). According to the above concept, the package base structure described in the present invention further includes a ruthenium oxide insulating layer formed on the substrate. a first surface, the second surface, and a sidewall of the via hole; a reflective layer formed on the reflective portion of the conductive reflective layer; and a transparent protective layer formed on the reflective portion On the floor. According to the above concept, the package base structure described in the present invention, wherein the reflective layer is made of a material or a silver material having a high light reflectance. According to the above concept, the packaged base structure described in the present invention, wherein the transparent protective layer is a layer of a double-oxide layer 2), a nitrogen-cut insulating layer (SixNy), and a polyimide-based insulating layer (p〇) The transparent protective layer is made of a material such as lyimide, polymethyl Methacrylate (PMMA) or a photoresist layer SU8. According to the above concept, the package base structure of the present invention further includes a bearing space, the top opening is located on the first surface of the substrate, and the bottom portion of the 1376819 is used to carry the photodiode crystal to the bearing space. The bottom. And the top connection of the via hole. According to the above concept, the crucible base structure described in the present invention, wherein the top opening of the loading station can be located on the second surface of the substrate. According to the above concept, in the package base structure of the present invention, the top opening of the via hole is larger than, equal to or smaller than the bottom opening. The pedestal structure of the county described in the present invention, wherein the phosgene is electrically connected to the conductive portion of the reflective conductive layer in a one-line manner or in a flip chip manner. According to the above concept, the packaged pedestal structure described in the present invention may be a light-emitting diode die or a laser diode die. Another aspect of the present invention is a method for fabricating a photodiode package base structure, the method comprising the steps of: providing a substrate having a first surface and a second surface; the first surface of the service plate Forming a mask layer on the upper surface of the mask layer, forming an opening on the mask layer, etching the substrate, and forming at least two via holes in the opening, the conductive vias being connected to the substrate a surface and the second surface; and removing the curtain layer and forming on the surface of the material - the conductive layer 1 has a conductive portion and a reflecting portion, wherein the conductive portion passes through the rotating portion a sidewall of the through hole and (4) a wire above the second surface of the substrate and connected to the photodiode die, and the reflective portion is located between the photodiode die and the first surface of the substrate . According to the above concept, the photodiode encapsulation substrate 9 f structure according to another aspect of the present invention is a method in which the substrate is in a lattice direction (100) and crystal. The wafer substrate in the direction (11G) or the lattice direction (1) 丨). According to the above concept, in the case of the photodiode package pedestal method described in the above, the method of the towel gateway includes the following steps: ^ The H of the substrate forms a cash cut, an oxygen cut or a metal finish a mask layer; a photoresist layer formed on the mask layer; a photoresist pattern on the photoresist layer by using a mask; and the mask layer is smoked according to the photoresist pattern Opening. According to the above concept, the photodiode package pedestal of the present invention, the method of fabricating the substrate, can etch the opening by a fish-style rice or a dry etching. The method for fabricating the photodiode package base structure according to the other aspect of the present invention further includes the following: the base of the pure row _, the first surface, the second surface and the sidewalls of the via holes are formed Oxidizing the H-edge layer; forming the conductive reflective layer on the oxidized insulating layer of the first surface, the second surface, and the sidewalls of the via holes; forming a reflective layer on the reflective portion of the conductive reflective layer And forming a transparent protective layer on the reflective layer. According to the above concept, a method for fabricating a photodiode package base structure according to another aspect of the present invention, wherein the oxygen-cut insulating layer is formed by high temperature oxidation. According to the above concept, a method for fabricating a photodiode package base structure according to another aspect of the present invention, wherein the reflective layer is completed by a high-yield or silver material and is vapor-deposited or Weizhi The method is formed on the portion of the reflection 1376819. According to the above concept, the method for fabricating the photodiode package base structure according to another aspect of the present invention, the towel material is smear-small-small A-fossil insulation layer (S102), a nitrogen Silicone insulating layer (SixNy), a polyimide insulating layer (Polyimide), a poly(decyl methacrylate) insulating layer (p〇lymethyl)

Methacrylate: PMMA)或一光阻層sus等材質所完成之該 透明保護層。 根據上述構想’本案另—方面所述之光二極體封裝基 座結構製作方法,其中該導電反射層係一 Tiw/Cu/Ni/Au 合金、一 Ti/Cu/Ni/Au 合金、一 Ti/Au/Ni/Au 合金或一 A1Cu/Ni/Au合金所完成,其形成方法包含下列步驟:以 一光罩於該第一表面之該氧化矽絕緣層上定義出一電鍍 區域;以及以一濺鍍加電鍍或一濺鍍加化鍍之方式於該電 鍵區域形成該導電反射層。 根據上述構想’本案另一方面所述之光二極體封裝基 座結構製作方法,其中該光二極體晶粒係可為一發光二極 體晶粒或一雷射二極體晶粒。 本案另一方面係為一種光二極體封裝基座結構之製 作方法,該方法包含下列步驟:提供一基板,其係具有一 第一表面與一第二表面;分別於該基板之該第一表面與該 第二表面上形成一第一罩幕層與一第二罩幕層;分別於該 第罩幕層與該第二罩幕層上定義出一第一開口與一第 二開口;對該基板進行蝕刻,進而分別於該第一開口處與 該第二開口處形成可供一光二極體晶粒置放之一承載空 11 1376819 間與至少兩個導通孔’該等導通孔係連通於該承載空間之 底部與該基板之該第二表面;以及去除該罩幕層並於該基 板之該第一表面與該承载空間之底部上方形成一導電反 射層,該導電反射層係具有一導電部與一反射部,其中該 導,部係通過該等導通孔之儀並延伸形成至該基板之 該第二表面上方並與一光二極體晶粒完成電性連接,而該 反射部係位於該光二極體晶粒與該承載$間之底部之間。 根據上述構想’本案另一方面所述之光二極體封裝基 座結構製作方法,其巾該基板係可為晶格方向(卿、晶 格方向(110)、或晶格方向⑴U之石夕晶圓基板。 根擄上述構想’本案另—方面所述之光二極體封裝基 座結構製作方法’其巾該第―開口與該第二開口之形成方 法包含下列步驟:於該基板之該第—表面與該第二表面分 ,形成以氮切、氧切或金屬完狀該第—罩幕層與該 第二罩幕層;於該第-罩幕層與該f二罩幕層上分別形 成一第-姐層與-第二光阻層;利用—第—光罩與一第 二光罩在該等光阻層上定義出—第—光聞形與一第二 光,圖形;以及根據該第—光阻圖形與該第二光阻圖形對 該第罩幕層與該第二罩幕廣進行鞋刻而形成該第 口與該第二開口。 根據上述構想,本案另―方面所述之光二極體封裝基 座結構製作方法’其巾該基板係可利m㈣或一乾 式姓刻對該開口進行蝕刻。 根據上述構想,本案另—方續述之光二極體封裝基 12 1376819 座結構製作方法,更包含下列步驟:於進行蝕刻後之該基 板之該第一表面、該第二表面、該承載空間之底部與該等 導通孔侧壁上形成一氧化矽絕緣層;於該第一表面、該第 一表面、該承載空間底部、該等導通孔側壁之該氧化石夕絕 緣層上形成該導電反射層;於該導電反射層所具有之該反 射部上形成—反射層;以及於該反射層上形成一透明 根據上述構想,本案另一方面所述之光二極體封裝基 座結構製作方法’其中該氧化矽絕緣層係以一高溫氧化之 方式所形成。 根據上述構想’未案另一方面所述之光二極體封裝基 座結構製作方法,其中該反射層係由對光反射率很高之結 或銀材質所完成並以一蒸錢或濺鐘之方式形成於該反射 部上。 根據上述構想’本案另一方面所述之光二極體封裝基 座結構製作方法’其中該透明保護層係以一二氧化矽絕緣 層(Si02)、一氮化矽絕緣層(SixNy)、一聚亞醯胺絕緣層 (Polyimide)、一聚甲基丙烯酸曱酯絕緣層Methacrylate: PMMA) or a photoresist layer sus and other materials to complete the transparent protective layer. The method for fabricating a photodiode package base structure according to the above aspect, wherein the conductive reflective layer is a Tiw/Cu/Ni/Au alloy, a Ti/Cu/Ni/Au alloy, and a Ti/ The Au/Ni/Au alloy or an A1Cu/Ni/Au alloy is formed by the following steps: defining a plating region on the yttria insulating layer of the first surface with a mask; and sputtering The conductive reflective layer is formed in the area of the key by plating or plating. According to the above concept, the photodiode package base structure according to another aspect of the present invention, wherein the photodiode die can be a light emitting diode die or a laser diode die. Another aspect of the present invention is a method for fabricating a photodiode package base structure, the method comprising the steps of: providing a substrate having a first surface and a second surface; respectively on the first surface of the substrate Forming a first mask layer and a second mask layer on the second surface; defining a first opening and a second opening on the second mask layer and the second mask layer respectively; The substrate is etched to form a conductive space between the first opening and the second opening, wherein one of the light-emitting diodes is placed between the first and second openings, and the at least two via holes are connected to the conductive vias. a bottom of the carrying space and the second surface of the substrate; and removing the mask layer and forming a conductive reflective layer on the first surface of the substrate and the bottom of the carrying space, the conductive reflective layer having a conductive And a reflecting portion, wherein the guiding portion passes through the guiding holes and extends to form the second surface of the substrate and is electrically connected to a photodiode die, and the reflecting portion is located The light two Between the grains and the carrier between the bottom $. According to the above concept, a method for fabricating a photodiode package base structure according to another aspect of the present invention, the substrate of the substrate may be in the lattice direction (clear, lattice direction (110), or lattice direction (1) U. The method of forming the photodiode package base structure described in the above aspect of the present invention, the method for forming the first opening and the second opening includes the following steps: the first step of the substrate Forming the surface with the second surface to form the first mask layer and the second mask layer by nitrogen cutting, oxygen cutting or metal forming; forming on the first mask layer and the f second mask layer respectively a first-sister layer and a second photoresist layer; a first photomask and a second photomask are used on the photoresist layers to define a first-light image and a second light pattern; The first photoresist pattern and the second photoresist pattern are engraved on the first mask layer and the second mask to form the first opening and the second opening. According to the above concept, the other aspect of the present invention Light-emitting diode package base structure manufacturing method 'the towel is the substrate system can be m (four) or a dry According to the above concept, the method for fabricating the photodiode package base 12 1376819 is further included in the following steps: the first surface of the substrate after the etching, the second a surface of the bearing space and a sidewall of the via holes are formed with a yttria insulating layer; the oxidized oxide layer on the first surface, the first surface, the bottom of the bearing space, and the sidewalls of the via holes Forming the conductive reflective layer thereon; forming a reflective layer on the reflective portion of the conductive reflective layer; and forming a transparent layer on the reflective layer. According to the above concept, the photodiode package base according to another aspect of the present disclosure The method for fabricating a structure in which the yttrium oxide insulating layer is formed by a high-temperature oxidation. According to the above concept, the method for fabricating a photodiode package pedestal structure according to the above aspect, wherein the reflective layer is made of light The knot with high reflectivity or silver material is completed and formed on the reflecting portion by a steaming or splashing clock. According to the above concept, the other side of the case The method for fabricating a photodiode package base structure is described in which the transparent protective layer is a cerium oxide insulating layer (SiO 2 ), a tantalum nitride insulating layer (SixNy), a polyimide insulating layer (Polyimide), Monopolymethacrylate insulating layer

Methacrylate: PMMA)或一光阻層SU8等材質所完成之該 透明保護層。 根據上述構想,本案另一方面所述之光二極體封裝基 座結構製作方法,其中該導電反射層係一 TiW/Cu/Ni/Au 合金、一 Ti/Cu/Ni/Au 合金、一 Ti/Au/Ni/Au 合金或一 AlCu/Ni/Au合金所完成,其形成方法包含下列步驟··以 13 第一光罩於該氧化矽絕緣層上定義出一電鍍區域;以及 乂濺鍍加電鍍或一濺鍍加化鍍之方式於該電鍍區域形 成該導電反射層。 根據上述構想,本案另一方面所述之光二極體封裝基 座結構製作綠’其巾該光二極體晶粒係可為—發光二極 體晶粒或一雷射二極體晶粒。 【實施方式】 請參見第二圖’其係為改善習用封裝基座結構所產生 之缺失而發展出-縣基座結構之第—難實施例截面 示意圖,而本案所述之封裝基座結構2主要係用於如發光 二極體晶粒或雷射二極體晶粒之一光二極體晶粒2〇〇的 封裝過程中。從圖中我們可以清楚的看出,該封裝基座結 構2主要包含有一基板2〇、一導通孔21、22、一氧化石夕 絕緣層23以及一導電反射層24,其中該基板20係為一 矽晶圓基板並具有一第一表面201與一第二表面202,該 導通孔21、22係貫穿於該基板20,且該導通孔21、22 之頂部開口位於該基板20之該第一表面2〇1,該導通孔 21、22之底部開口位於該基板20之該第二表面202,該 氧化矽絕緣層23係形成於該基板2〇所具有之該第一表面 20卜該第二表面202與該導通孔21、22之侧壁上,而該 導電反射層24係形成於該基板20所具有之該第一表面 201之該氧化矽絕緣層23上,該導電反射層24具有—導 電部241與一反射部242,其中該導電部241係通過該導 通孔2卜22之側壁並延伸形成至該基板2〇之該第二表面 1376819 202之該氧化石夕絕緣層23上,該反射部242上係承載該 光二極體晶粒200。以下再就本案所述之封裝基座結構做 進一步的描述。 承上述說明,該封裝基座結構2所包含之該導電反 射層24係以一 TiW/Cu/Ni/Au合金、一⑽湖/如合金、 一 Ti/Au/Ni/Au合金或一 A1Cu/Ni/Au合金所完成,而該 光二極體晶粒2〇〇通常是以打線(如圖卡所示之電導線2乃 或覆晶的方式來與該導電反射層24所包含之該導電部 241完成電性連接,該導電反射層24所具有之該導電部 241與該反射部242係間隔有大於2〇微米㈣的間距&。 此外,由於以雜質所完成的基板2G與以金屬所完成的 該導電反射層24對某錄長的光會有穿透或吸收的問 題,因此可以在承载該光二極體晶粒2〇〇的該反射部242 上幵y成層對光反射率很高之銘或銀材質所完成之一反 射層25,以增加所完成之光二極體封裝結構2之整體出 光效率,倘若顧慮到在後續製程該反射層25會遭受到破 壞’我們也可以在該反射層25上形成一層非常薄的一透 明保濩層26(厚度小於1〇〇nm),而此透明保護層%可以 是二氧化矽絕緣層(Si02)、氮化矽絕緣層(SixNy)、一聚亞 驢胺絕緣層(P〇lyimide)、一聚曱基丙歸酸?醋絕緣層 (Polymethyl Methacrylate: PMMA)或一光阻層 SU8 等材質來 完成,以此來達到保護該反射層25的目的。上述在該反 射°卩242上並非—定要形成該反射層25以及該透明保護 層26,在本案所述之封裝基座結構2中,該反射部242 15 1376819 已經具備將光線反射的功能,而於其上形成該反射層25 只是要增強其發光的效率’但並非必要手段,特此說明。 請參見第三圖(a)〜(i),其係為本案在第一較佳 實施例中所狀封裝基座結·作方法流程示意圖。從圖 中我可以清楚的看出,首先,如第三圖(a)所示,在該基 板20之該第一表面201形成以氮化矽、氧化矽或金屬等 材質所完成的罩幕層2010 ;如第三圖(的所示,在該罩幕 層2010上形成一光阻層2011 ;如第三圖(c)所示,利 用一光罩(在本圖中未示出)在該光阻層2〇11上定義出 一光阻圖形2012、2013;如第三圖(d)所示,根據該光 阻圖形2012、2013對該罩幕層2010進行蝕刻而形成開口 2014、2015;如第三圖(e)所示,對該基板2〇進行蝕刻, 進而在該開口 2014、2015處形成導通孔21、22,並且將 該罩幕層2010與該光阻層2011去除;如第三圖(f)所 示,於該基板20之該第一表面2〇1、該第二表面2〇2與 導通孔21、22側壁上形成該氧化矽絕緣層23 ;如第三圖 (g)所示,於該第一表面201、該第二表面202、該導通 孔21、22側壁之該氧化矽絕緣層23上形成以The transparent protective layer is made of a material such as Methacrylate: PMMA or a photoresist layer SU8. According to the above concept, a photodiode package base structure manufacturing method according to another aspect of the present invention, wherein the conductive reflective layer is a TiW/Cu/Ni/Au alloy, a Ti/Cu/Ni/Au alloy, and a Ti/ The Au/Ni/Au alloy or an AlCu/Ni/Au alloy is formed by the following steps: • defining a plating region on the yttria insulating layer by the first photomask; and sputtering and plating Or a sputtering and plating method forms the conductive reflective layer in the plating region. According to the above concept, the photodiode package base structure described in another aspect of the present invention can be made of a light-emitting diode die or a laser diode die. [Embodiment] Please refer to the second figure, which is a cross-sectional view of the difficult-to-implement example of the pedestal structure for improving the missing structure of the conventional package base structure, and the package base structure 2 described in the present application It is mainly used in the encapsulation process of light-emitting diode grains or photodiode grains 2〇〇 of one of the laser diode grains. As can be clearly seen from the figure, the package base structure 2 mainly comprises a substrate 2 〇, a via hole 21, 22, a oxidized oxide layer 23 and a conductive reflective layer 24, wherein the substrate 20 is a first substrate surface 201 and a second surface 202, the via holes 21, 22 are through the substrate 20, and the top opening of the via holes 21, 22 is located at the first of the substrate 20 The bottom surface of the via hole 21, 22 is located on the second surface 202 of the substrate 20. The yttria insulating layer 23 is formed on the first surface 20 of the substrate 2 The conductive layer 24 is formed on the sidewall of the via hole 21, 22, and the conductive reflective layer 24 is formed on the yttrium oxide insulating layer 23 of the first surface 201 of the substrate 20. The conductive reflective layer 24 has a conductive portion 241 and a reflective portion 242, wherein the conductive portion 241 extends through the sidewall of the via hole 22 and extends to the oxidized oxide layer 23 of the second surface 1376819 202 of the substrate 2? The photodiode die 200 is carried on the reflecting portion 242. The package base structure described in this case will be further described below. According to the above description, the conductive reflective layer 24 included in the package base structure 2 is a TiW/Cu/Ni/Au alloy, a (10) lake/such as an alloy, a Ti/Au/Ni/Au alloy or an A1Cu/ The Ni/Au alloy is completed, and the photodiode die 2 is usually wire-bonded (the conductive wire included in the conductive reflective layer 24 is included in the wire 2 or the flip chip shown in FIG. 241 is electrically connected, and the conductive portion 241 of the conductive reflective layer 24 is spaced apart from the reflective portion 242 by a pitch of more than 2 〇 micrometers (4). Further, since the substrate 2G and the metal are completed by impurities The completed conductive reflective layer 24 has a problem of penetrating or absorbing a certain length of light, so that the reflection portion 242 carrying the photodiode die 2 成 can be layered with a high reflectivity of light. Or a silver material completes one of the reflective layers 25 to increase the overall light extraction efficiency of the completed photodiode package structure 2, if the reflection layer 25 is damaged in the subsequent process, we can also be in the reflective layer 25 Forming a very thin transparent protective layer 26 (thickness less than 1〇) Nm), and the transparent protective layer % may be a cerium oxide insulating layer (SiO 2 ), a tantalum nitride insulating layer (SixNy), a polyamidene insulating layer (P〇lyimide), a polyfluorenyl acryl acid? A material such as Polymethyl Methacrylate (PMMA) or a photoresist layer SU8 is used to protect the reflective layer 25. The above reflection layer 242 does not necessarily form the reflective layer 25 and The transparent protective layer 26, in the package base structure 2 described in the present invention, the reflecting portion 242 15 1376819 has a function of reflecting light, and the reflective layer 25 is formed thereon only to enhance the efficiency of light emission. This is not a necessary means, so please refer to the third figure (a) ~ (i), which is a schematic flow chart of the method of the packaged pedestal in the first preferred embodiment of the present invention. I can clearly see from the figure It can be seen that, as shown in the third figure (a), the mask layer 2010 is formed on the first surface 201 of the substrate 20 by using materials such as tantalum nitride, yttria or metal; (shown, a photoresist layer 2011 is formed on the mask layer 2010; As shown in FIG. (c), a photoresist pattern 2012, 2013 is defined on the photoresist layer 2〇11 by using a photomask (not shown in the figure); as shown in the third diagram (d), The mask patterns 2012 and 2013 etch the mask layer 2010 to form openings 2014 and 2015. As shown in FIG. 3(e), the substrate 2 is etched to form a turn-on at the openings 2014 and 2015. Holes 21, 22, and removing the mask layer 2010 and the photoresist layer 2011; as shown in the third figure (f), the first surface 2 〇1, the second surface 2 〇 2 of the substrate 20 The yttria insulating layer 23 is formed on the sidewalls of the via holes 21, 22; as shown in the third figure (g), the yttrium oxide on the sidewalls of the first surface 201, the second surface 202, and the via holes 21, 22 Formed on the insulating layer 23

TiW/Cu/Ni/Au 或 Ti/Cu/Ni/Au 或 Ti/Au/Ni/Au 或TiW/Cu/Ni/Au or Ti/Cu/Ni/Au or Ti/Au/Ni/Au or

AlCu/Ni/Au合金所完成之該導電反射層24;如第三圖(h) 所示,於該導電反射層24所具有之該反射部242上形成 該反射層25 ;如第三圖(i)如示,於該反射層25上形成 以二氧化矽絕緣層(Si02)、氮化矽絕緣層(sixNy)、一聚亞 醯胺絕緣層(Polyimide)、聚甲基丙烯酸曱酯絕緣層 16 1376819 (Polymethyl Methacrylate: PMMA)或光阻層觀等材— 成之該透縣護層26。以下再就上述之流程步驟做詳= 的描述。 ”關於上騎裝基座結構2之製作步驟’其巾該氧化石夕 絕緣層23細-高溫氧化之方式所形成。該導電反射居 24係以-光罩(在本圖中未示出)於該第—表面加丄 ,氧化石夕絕緣層23上定義出一電鍍區域(該電鑛區域涵 蓋導通孔表面)’並以一濺鑛(§帅订心)加電鑛 (Electroplating)或-濺鍍(Sputtering)加化鍍(Ε1_〇ι咖The conductive reflective layer 24 is completed by the AlCu/Ni/Au alloy; as shown in FIG. 3(h), the reflective layer 25 is formed on the reflective portion 242 of the conductive reflective layer 24; i) as shown, a ruthenium dioxide insulating layer (SiO 2 ), a tantalum nitride insulating layer (sixNy), a polyimide insulating layer (Polyimide), a polymethyl methacrylate insulating layer are formed on the reflective layer 25 . 16 1376819 (Polymethyl Methacrylate: PMMA) or photoresist layer material - into the county shield 26. The following is a description of the process steps described above. The manufacturing step of the upper riding base structure 2 is formed by the method of fine-high temperature oxidation of the oxidized oxide layer 23. The conductive reflection is in the form of a reticle (not shown in the figure). The first surface is twisted, and a galvanic oxide layer 23 defines a plated region (the electrode region covers the surface of the via hole) and is electroplated with a splash (or stipple) or Sputtering plus plating (Ε1_〇ι咖

Platmg)之方式_電鍍區_成該導電反射層24。而該 反射層25係以—蒸鍍或減鑛(Sputtering)之方式形成於該 導電反射層24所具有之該反射部242上。 經由上述說明,我們可以清楚的瞭解本案所述之封 裝基座結構2主要是在具有導通孔21、22的基板2〇上形 成具有該導電部241與該反射部242之該導電反射層 24,其中該導電部241係通過該導通孔、22之側壁, ^匕導電部241可做為接合、導電以及導熱之用,而該反射 部242則增加該光二極體晶粒2〇〇的出光效率。由於該導 電反射層24同時完成了可增加出光效率的反射構造(如 該反射部242)以及導電構造(如該導電部241),所以本 案所述之封裝基座結構2可以避免和降低在先前技術中 所提到習用封裝基座結構的反射層在製作過程中遭受到 破壞的可能性’且由於本案所述之封裝基座結構2製作步 驟較為簡單,也因此有效的降低了製作成本。此外,在第 17 丄376819 一較佳實施例中所述之封裝基座結構2依照所選用基板 晶格方向的不同,如(100)、(110)或(111)等不同晶格方向 的石夕基板、姓刻方式(如使用濕式姓刻或乾式钱列)或制 作方法的不同,也可以如第四圖(a) (b) 所示之 封裝基座結構2a、2b、2c之不同的變形。 3卜 氧化矽絕 請參見第五圖’其係為改善習用封裝基座結構所產 生之缺失而發展出一封裝基座結構之第二較佳實施例截 面示意圖。從圖中我們可以清楚的看出,該封裝基座結構 3主要包含有一基板30、一導通孔31、32、一承載空間 33、一氧化矽絕緣層34以及一導電反射層35,其中該基 板3〇具有一第表面301與一第二表面3〇2,該導通孔= 32之頂部開口係位於該承載空間33之底部,該導通孔The manner of Platmg)_plating zone_ becomes the conductive reflective layer 24. The reflective layer 25 is formed on the reflective portion 242 of the conductive reflective layer 24 by vapor deposition or sputtering. Through the above description, we can clearly understand that the package base structure 2 described in the present invention mainly forms the conductive reflective layer 24 having the conductive portion 241 and the reflective portion 242 on the substrate 2 having the via holes 21, 22, The conductive portion 241 passes through the sidewalls of the via hole 22, and the conductive portion 241 can be used for bonding, conducting, and conducting heat, and the reflecting portion 242 increases the light-emitting efficiency of the photodiode die 2 . Since the conductive reflective layer 24 simultaneously completes a reflective structure (such as the reflective portion 242) that can increase light extraction efficiency and a conductive structure (such as the conductive portion 241), the package base structure 2 described in the present invention can be avoided and lowered in the previous The reflective layer of the conventional packaged pedestal structure mentioned in the technology suffers from the possibility of damage during the manufacturing process, and since the manufacturing process of the packaged pedestal structure 2 described in the present invention is relatively simple, the manufacturing cost is effectively reduced. In addition, the package base structure 2 described in a preferred embodiment of the present invention has different lattice directions of stones such as (100), (110) or (111) depending on the orientation of the selected substrate. Depending on the base substrate, the surname pattern (such as using a wet surrogate or dry money column) or the manufacturing method, the package base structure 2a, 2b, 2c may be different as shown in the fourth figure (a) (b). The deformation. 3 矽 矽 请 请 请 请 请 请 请 请 请 请 请 请 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 As can be clearly seen from the figure, the package base structure 3 mainly comprises a substrate 30, a via hole 31, 32, a bearing space 33, a tantalum oxide insulating layer 34 and a conductive reflective layer 35, wherein the substrate 3〇 has a first surface 301 and a second surface 3〇2, and the top opening of the via hole=32 is located at the bottom of the bearing space 33, and the through hole

氧化石夕絕緣層34係形成於該基板3〇所具有之該第一表面 30卜該第二表面302、構成該承載空間%之斜面现、 ’而該導電反射層35 表面301與構成該承 332以及該導通孔31、32之側壁上, 係形成於該基板30所具有之該第一4 載空間33之斜面33卜332之該氧化矽絕緣層%上咳 導電反射層35具有-導電部351與一反射部352,其^ 該導電部351係通過該導通孔31、32之側壁並延伸形成 至該基板30之該第二表面3〇2之該氧化梦絕緣層上, 該反射部352上係承載光二極體晶粒3〇〇。而與第二圖所 示之封裝基膀構2抑處在於本錄實補所述之封 裝基座結構3在該絲30上形成有該承載空間%,其頂 18 1376819 部開口位於該基板30之該第—表面3〇1,該承載空間幻 主要是將光二極體晶粒3GG置於其巾,藉由構顏承載空 間33之斜面331、332來增進所完成之光二極體封裝結構 3之整體出光效率。 請參見第六圖(a)〜⑴,其係為本案在第二較佳 實施例中所述之封裝基座結構製作方法流程示意圖。從圖 中我們可以清楚的看出,首先,如第六圖(a)所示,在該 基板30之該第一表面301與該第二表面3〇2分別形成以 氮化矽、氧化矽或金屬等材質所完成的罩幕層3〇1〇、 3011 ;如第六圖(b)所示,在該罩幕層3〇1〇、3〇11上形成 一光阻層3012、3013 ;如第六圖(c)所示,利用一第— 光罩與一弟一光罩(在本圖中未示出)在該光阻層3012、 3013上定義出一光阻圖形3〇14、3〇15、3016 ;如第六圖 (d)所示’根據該光阻圖形3〇14、3〇15、3〇16對該罩幕 層3010、3011進行蝕刻而形成開口 3017、3〇18、3〇19 ; 如第六圖(e)所示,對該基板30進行蝕刻,進而在該開 口 3017、3018、3019處形成該承載空間33導通孔31、 32,並且將該罩幕層3010、3011與該光阻層3〇12、3〇13 去除,如第六圖(f)所示,於該基板3〇之該第—表面 301、該第二表面3〇2、該等導通孔31、32側壁以及構成 該承載空間33之斜面331、332、該承载空間33底部上 形成該氧化矽絕緣層34 ;如第六圖(g)所示,於該第一 表面30卜該第二表面302、該承載空間33之底面以及斜 面331、332上之該氧化矽絕緣層34上形成以 19 1376819The oxidized oxide layer 34 is formed on the first surface 30 of the substrate 3, the second surface 302, and the slope of the bearing space %, and the surface 301 of the conductive reflective layer 35 constitutes the bearing The 332 and the sidewalls of the via holes 31 and 32 are formed on the beveled surface 33 of the first four-capacity space 33 of the substrate 30, and the conductive reflective layer 35 has a conductive portion. 351 and a reflecting portion 352, the conductive portion 351 is formed on the oxidized dream insulating layer of the second surface 3?2 of the substrate 30 through the sidewalls of the via holes 31, 32. The upper layer carries the photodiode grains 3〇〇. The package base structure shown in FIG. 2 is that the package base structure 3 described in the present specification has the bearing space % formed on the wire 30, and the top 18 1376819 opening is located on the substrate 30. The first surface 3〇1, the bearing space is mainly caused by the photodiode die 3GG being placed on the towel, and the completed photodiode package structure is enhanced by the inclined faces 331, 332 of the frame carrying space 33. The overall light output efficiency. Referring to the sixth embodiment (a) to (1), which is a flow chart of the method for fabricating the package base structure described in the second preferred embodiment of the present invention. As can be clearly seen from the figure, first, as shown in FIG. 6(a), the first surface 301 and the second surface 3〇2 of the substrate 30 are respectively formed of tantalum nitride, hafnium oxide or a mask layer 3〇1〇, 3011 made of a material such as metal; as shown in FIG. 6(b), a photoresist layer 3012, 3013 is formed on the mask layer 3〇1〇, 3〇11; As shown in FIG. 6(c), a photoresist pattern 3〇14, 3 is defined on the photoresist layers 3012 and 3013 by using a first photomask and a photomask (not shown in the figure). 〇15, 3016; as shown in the sixth figure (d), the mask layers 3010, 3011 are etched according to the photoresist patterns 3〇14, 3〇15, 3〇16 to form openings 3017, 3〇18, 3〇19; as shown in FIG. 6(e), the substrate 30 is etched, and the via holes 31, 32 of the bearing space 33 are formed at the openings 3017, 3018, and 3019, and the mask layer 3010, 3011 and the photoresist layers 3〇12, 3〇13 are removed, as shown in FIG. 6(f), the first surface 301, the second surface 3〇2, and the via holes 31 of the substrate 3〇 , 32 side walls and constituting the bearing space 33 The beveled surfaces 331, 332 and the bottom of the bearing space 33 are formed on the bottom of the bearing space 33; as shown in the sixth figure (g), the second surface 302, the bottom surface of the carrying space 33, and the inclined surface are formed on the first surface 30. 331, 332 on the yttria insulating layer 34 is formed with 19 1376819

TiW/Cu/Ni/Au 或 Ti/Cu/Ni/Au 或 Ti/Au/Ni/Au 或TiW/Cu/Ni/Au or Ti/Cu/Ni/Au or Ti/Au/Ni/Au or

AlCu/Ni/Au合金所完成之該導電反射層35;如第六圖(h) 所示,於該導電反射層35所具有之該反射部352上形成 該反射層36 ;如第六圖(i)如示,於該反射層36上形成 以二氧化矽絕緣層(Si02)、氮化矽絕緣層(sixNy)、聚亞醯 胺絕緣層(Polyimide)、聚曱基丙烯酸甲酯絕緣層(p〇lymethylThe conductive reflective layer 35 is completed by an AlCu/Ni/Au alloy; as shown in FIG. 6(h), the reflective layer 36 is formed on the reflective portion 352 of the conductive reflective layer 35; as shown in the sixth figure ( i) as shown, a ruthenium dioxide insulating layer (SiO 2 ), a tantalum nitride insulating layer (sixNy), a polyamidide insulating layer (Polyimide), a polymethyl methacrylate insulating layer are formed on the reflective layer 36 ( P〇lymethyl

Methacrylate: PMMA)或光阻層SU8等材質所完成之該透 明保護層37。 承上述說明,根據第二較佳實施例中所述之封裝基 座結構3的概念,我們也製作出如第七圖所示之封裝基座 結構3a,也就是在基座3〇a的第一表面3〇la與第二表面 302a皆形成有承載空間33a,進而完成一種雙面皆有承載 空間的封裝基座結構。 多示合以上不同的實施例說明,我們可以清楚的瞭解 到’透過本案所述之技術手段所完成之光二極體封裝結構 確實解決了習用封裝結構上所產生的缺失,進而完成發展 本案之最主要的目的。而本發明得由熟習此技藝之人士任 施匠思而為諸般修飾’然皆不脫如附申請專利範圍所欲保 護者。 【圖式簡單說明】 本案得藉由下列圖式及說明,俾得—更深入之了解: 第圖,其係為習用光二極體封裝基座辑造截面示意圖。 20 1376819The transparent protective layer 37 is made of a material such as Methacrylate: PMMA or a photoresist layer SU8. In view of the above, according to the concept of the package base structure 3 described in the second preferred embodiment, we also fabricate the package base structure 3a as shown in the seventh figure, that is, at the base 3〇a A surface 3〇1a and a second surface 302a are formed with a bearing space 33a, thereby completing a package base structure having a bearing space on both sides. In the different embodiments, we can clearly understand that the optical diode package structure completed by the technical means described in this case has indeed solved the defects in the conventional package structure, and thus completed the development of the case. main purpose. However, the invention may be modified by those skilled in the art and may be modified as described in the appended claims. [Simple description of the diagram] This case can be obtained through the following drawings and descriptions - a deeper understanding: The figure is a schematic cross-section of a conventional light-diode package base. 20 1376819

反射層25 電導線27 第二表面202 反射部242 光阻層2011 開口 2014、2015 封裝基座結構3、3a 基板30、30a 承載空間33 導電反射層35 透明保護層37 斜面 331、332 反射部352 第二表面302、302a 光阻層3012、3013 光阻圖形 3014、3015、3016 開口 3017、3018、3019 導電部與反射部之間距a、b 透明保護層26 第一表面201 導電部241 罩幕層2010 光阻圖形2012、2013 光二極體晶粒300 導通孔31、32 氧化矽絕緣層34 反射層36 電導線38 導電部351 第一表面301、301a 罩幕層3010、3011 22Reflective layer 25 Electrical wire 27 Second surface 202 Reflecting portion 242 Photoresist layer 2011 Opening 2014, 2015 Package base structure 3, 3a Substrate 30, 30a Bearing space 33 Conductive reflective layer 35 Transparent protective layer 37 Bevel 331, 332 Reflecting portion 352 Second surface 302, 302a photoresist layer 3012, 3013 photoresist pattern 3014, 3015, 3016 opening 3017, 3018, 3019 distance between conductive portion and reflective portion a, b transparent protective layer 26 first surface 201 conductive portion 241 mask layer 2010 photoresist pattern 2012, 2013 photodiode die 300 vias 31, 32 yttrium oxide insulating layer 34 reflective layer 36 electrical wires 38 conductive portion 351 first surface 301, 301a mask layer 3010, 3011 22

Claims (1)

1376819 十、申請專利範園: 1· -種縣基座結構’用於承載—光二極體晶粒,該封裝基 座結構包含: 基板,其係具有一第一表面與一第二表面; -導通礼,其係貫穿於絲板,^該導通孔之頂部開口 位於該基板之該第-表面,該導通狀底糊σ位於該基板 之該第二表面;以及 Α 土 一導電反射層,其係形成於該基板之該第一表面上並 具有一導電部與一反射部,其中該導電部係通過該導通孔之 側壁並延伸形成至該基板之該第二表面上並可與該光二極體 晶粒完成電性連接,而該反射部係位於該光二極體晶粒與該 基板之第一表面之間。 2. 如申請專利範圍第1項所述之封裝基座結構,其中該基板 係可為晶格方向(100)、晶格方向(110)、或晶格方向(U1)之石夕 晶圓基板。 3. 如申請專利範圍第1項所述之封裝基座結構,其中該導電 反射層係以一 TiW/Cu/Ni/Au 合金、一 Ti/Cu/Ni/Au 合金、一 Ti/Au/Ni/Au合金或一 AlCu/Ni/Au合金所完成。 4. 如申請專利範圍第i項所述之封裝基座結構,其中該導電 反射層所具有之該導電部與該反射部係間隔有大於20微米 (um)之間距。 5. 如申請專利範圍第1項所述之封裝基座結構,更包含有: ——氧化矽絕緣層,其係形成於該基板所具有之該第一表 面、該第二表面以及該導通孔之側壁上; 23 1376819 一反射層’其係形成於該導電反射層所具有之該反射部 上;以及 一透明保s蔓層’其係形成於該反射層上。 6. 如申請專利範圍第5項所述之封裝基座結構,其中該反射 層係由對光反射率很高之鋁或銀材質所完成。1376819 X. Patent application garden: 1·- County pedestal structure 'for carrying-photodiode dies, the package pedestal structure comprises: a substrate having a first surface and a second surface; a pass-through manner, wherein the top opening of the via hole is located at the first surface of the substrate, the conductive paste σ is located at the second surface of the substrate; and the conductive-reflective layer of the earth is Forming on the first surface of the substrate and having a conductive portion and a reflective portion, wherein the conductive portion passes through the sidewall of the via hole and extends to form the second surface of the substrate and can be coupled to the photodiode The body grains are electrically connected, and the reflection portion is located between the photodiode grains and the first surface of the substrate. 2. The package base structure according to claim 1, wherein the substrate is a crystal lattice direction (100), a lattice direction (110), or a lattice direction (U1) . 3. The package base structure according to claim 1, wherein the conductive reflective layer is a TiW/Cu/Ni/Au alloy, a Ti/Cu/Ni/Au alloy, and a Ti/Au/Ni. /Au alloy or an AlCu/Ni/Au alloy. 4. The package base structure of claim i, wherein the conductive reflective layer has the conductive portion spaced from the reflective portion by more than 20 micrometers (um). 5. The package base structure of claim 1, further comprising: a yttria insulating layer formed on the first surface, the second surface, and the via hole of the substrate On the side wall; 23 1376819 a reflective layer 'is formed on the reflective portion of the conductive reflective layer; and a transparent protective layer' is formed on the reflective layer. 6. The package base structure of claim 5, wherein the reflective layer is made of an aluminum or silver material having a high light reflectance. 7. 如申請專利範圍第5項所述之封裝基座結構,其中該透明 保護層係以一二氧化矽絕緣層(Si〇2)、一氮化矽絕緣層 (SixNy)、一蚁亞酿胺絕緣層(p〇iy丨瓜丨加)、一聚甲基丙稀酸甲酯 絕緣層(Polymethyl Methacrylate: PMMA)或一光阻層 SU8 等材 質所完成之該透明保護層。. 8·如申請專·㈣i項所述之封裝基座結構,更包含一承 載空間’其頂部開口位於該基板所具有之該第—表面,其底 部用以承载m極體晶粒,而該導通孔之頂部係連通於該 承載空間之底部。 、°Λ 9.如申請專㈣圍第8項所述之封裝基座結構,其中7. The package base structure according to claim 5, wherein the transparent protective layer is a cerium oxide insulating layer (Si〇2), a tantalum nitride insulating layer (SixNy), and an arion. The transparent protective layer is made of a material such as an amine insulating layer, a polymethyl methacrylate (PMMA) or a photoresist layer SU8. 8. The package base structure according to the application of (4) item i further includes a bearing space whose top opening is located on the first surface of the substrate, and the bottom portion thereof is used to carry the m pole body grain, and the bottom portion The top of the via is connected to the bottom of the carrying space. , ° Λ 9. If you apply for the special (4) package 8 as described in the package base structure, 兵中該承載 空間之頂部開D係可位於該基板所具有之該第二表面。 说如申請專利範圍第!項所述之封裳基座結構, 通孔之頂部f扣係大於、等於或小於該底部開口。- ^如中料利簡第1顧述之封祕座結構, :極體晶粒係以_打線之方式或―覆晶之方式與該反射 層所具有之該導電部完成電性連接。 μ ===專觀項所述之封裝基座結構,1 之該光一極體晶粒係可為一發光二 、 粒。 瑕日日拉或一雷射二體晶 24 1376819 13. —種光二極體封裝基座結構之製作方法,該方 列步驟: 3卜 提供一基板,其係具有一第—表面與一第二表面; 於該基板之該第一表面上形成一罩幕層; 於該罩幕層上定義出一開口; 對該基板進行#刻,進而於該開σ處形成至少兩個導通 孔,該等導通孔係連通於該基板之該第一表面盥該 面;以及 ^ 一The top D of the load space in the soldier may be located on the second surface of the substrate. Say as the scope of patent application! In the shackle base structure, the top f-foil of the through hole is greater than, equal to, or smaller than the bottom opening. - ^ For example, in the middle of the material, the first part of the structure of the sealing block is: the polar body is electrically connected to the conductive portion of the reflective layer by means of _ wire bonding or "cladding". μ == = the package base structure described in the special item, wherein the light-pole body grain system can be a light-emitting diode or a grain.瑕日日 or a laser two-body crystal 24 1376819 13. A method for fabricating a photodiode package base structure, the method of the steps: 3 provides a substrate having a first surface and a second Forming a mask layer on the first surface of the substrate; defining an opening on the mask layer; engraving the substrate, and forming at least two via holes at the opening σ, a via hole is connected to the first surface of the substrate, the surface; and 去除該罩幕層並於該基板之該第—表面上方形成一導電 反射層,該導電反射層係具有—導電部與_反射部,其中^ 導電部係通過該科通孔之㈣並延伸形成至該基板找第ζ ,表面上方並與-光二極體晶粒完成電性連接,而該反射部 係位於泫光二極體晶粒與該基板之第一表面之間。 14. 如申請專利範圍第13項所述之光二極體封装基座結構製 作方法〃中„亥基板係可為晶格方向(刚)、晶格方向⑴〇)、 或晶格方向(111)之矽晶圓基板。 15. 如申請專·㈣13項職之光二極醜裝基座結構製 作方法’其t該開σ之形成方法包含下列步驟: 於該基板之該第-表面上職讀切、氧切或金屬 完成之該罩幕層; 於该罩幕層上形成一光阻層; 利用-光罩在該轨層上定義出—光阻圖形;以及 根據該光阻圖形光對該罩幕層進行姓刻而形成該開口。 16.如申凊專利範圍第13項所述之光二極體封袭基座結構製 25 1376819 作方法,其t該基板係刊n该刻或_乾式钱刻對該 開口進行蝕刻。 17. 如申請專利範圍第13項所述之光二極體封裝基座結構製 作方法,更包含下列步驟: 、 …於進行_後之該基板之該第H該第二表面與該 等導通孔側壁上形成一氧化矽絕緣層; 於該第一表面、該第二表面、該等導通孔側壁之該氧化 矽絕緣層上形成該導電反射層; 於該導電反射層所具有之該反射部上形成一反射層;以 及 曰’ 於該反射層上形成一透明保護層。 18. 如申請專利範圍第17項所述之光二極體封裝基座結構製 作方法’其中該氧化矽絕緣層係以一高溫氧化之方式所形成。 19. 如申請專利範圍第17項所述之光二極體封裝基座結構製 作方法,其命該反射層係由對光反射率很高之鋁或銀材質所 完成並以一蒸鍍或濺鍍之方式形成於該反射部上。 20. 如申請專利範圍第17項所述之光二極體封裝基座結構製 作方法,其令該透明保護層係以一二氧化矽絕緣層(Si〇2)、 一氮化矽絕緣層(SixNy)、一聚亞醯胺絕緣層(p〇lyimide)、—聚 甲基丙烯酸甲酉旨絕緣層(p〇丨Methacrylate: PMMA)或一光 阻層SU8等材質所完成之該透明保護層。 21. 如申請專利範圍第17項所述之光二極體封裝基座結構製 作方法’其_該導電反射層係一 TiW/Cu/Ni/Au合金、一 Ti/Cu/Ni/Au 合金、一 Ti/Au/Ni/Au 合金或一 A1Cu/Ni/Au 合金 26 1376819Removing the mask layer and forming a conductive reflective layer over the first surface of the substrate, the conductive reflective layer having a conductive portion and a reflective portion, wherein the conductive portion passes through the (four) and extends the through hole A second surface is formed on the substrate, and the surface is electrically connected to the photodiode die, and the reflective portion is located between the dimming diode die and the first surface of the substrate. 14. The method for fabricating a photodiode package pedestal structure according to claim 13, wherein the diametric substrate may be in a lattice direction (rigid), a lattice direction (1) 〇, or a lattice direction (111) Then, the wafer substrate. 15. If the application method (4) 13-position light dipole ugly pedestal structure manufacturing method 'the method of forming the σ s σ includes the following steps: on the first surface of the substrate a mask layer formed by oxygen cutting or metal; forming a photoresist layer on the mask layer; defining a photoresist pattern on the rail layer by using a mask; and illuminating the mask according to the photoresist pattern The curtain layer is engraved to form the opening. 16. The photodiode encapsulation base structure according to claim 13 of the patent application is stipulated in the method of 25 1376819, the t-substrate is the engraving or the _ dry money The method for fabricating the photodiode package base structure according to claim 13 further includes the following steps: ... the second and second of the substrate after the _ Forming a tantalum oxide insulating layer on the surface and sidewalls of the via holes; Forming the conductive reflective layer on the yttria insulating layer on a surface, the second surface, and the sidewalls of the via holes; forming a reflective layer on the reflective portion of the conductive reflective layer; and ??? 18. A method of fabricating a photodiode package base structure as described in claim 17 wherein the yttria insulating layer is formed by a high temperature oxidation. The method for fabricating a photodiode package base structure according to Item 17, wherein the reflective layer is formed by an aluminum or silver material having a high light reflectivity and formed by evaporation or sputtering. The method for fabricating a photodiode package base structure according to claim 17, wherein the transparent protective layer is made of a germanium dioxide insulating layer (Si〇2) and a tantalum nitride layer. The transparent layer (SixNy), a polyiguanide insulating layer (p〇lyimide), a polymethyl methacrylate-based insulating layer (p〇丨Methacrylate: PMMA) or a photoresist layer SU8 and the like Protective layer. 21. If applying for a patent The method for fabricating a photodiode package base structure according to item 17 is characterized in that the conductive reflective layer is a TiW/Cu/Ni/Au alloy, a Ti/Cu/Ni/Au alloy, and a Ti/Au/Ni alloy. /Au alloy or an A1Cu/Ni/Au alloy 26 1376819 所凡成,其形成方法包含下列步驟: 以The method of forming the method includes the following steps: 鏟區域;2於料—表面之魏切絕緣層 成該鍍或—贿加傾之方式_紐區域形 ==圍==述之光二極體封裝基座結構製 雷射二極體晶粒的粒係可為-發光二極體晶粒或- 23· -種光二極體封裝基座結構之製作方法 上定義出一電 列步驟 該方法包含下 提供-基板,其係具有—第—表面與—第 分別於該基板之該第一表面與該 罩幕層與H幕層; 面场成-第- 口與罩幕層與該第二罩幕層上定義出―第一開Shovel area; 2 material-surface Wei-cut insulation layer into the plating or bribe plus the way of _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The granules may be-light-emitting diode dies or a photodiode package pedestal structure is defined by an electro-column step. The method comprises the following-substrate, which has a -surface-to-surface - respectively on the first surface of the substrate and the mask layer and the H curtain layer; the field field-the first port and the mask layer and the second mask layer define a "first opening" 對該基板進行钱刻’進而分別於該第—開σ處與該第二 開口處I成可供-^二極體晶粒置放之一承載空間與至少兩 個導通孔,該料通孔錢通於該承載㈣之底部與該基板 之該第二表面;以及 去除該罩幕層並於該基板之該第—表面與該承載空間之 底部上方形咸-導電反射層,該導電反射層係具有一導電部 ^反射部,其中該導電部係通過該等導通孔之侧壁並延伸 形成至該練之該第二表面上方並與—光二鋪晶粒完成電 性連接,而飯射部係位於該光二極體晶粒與該承載空間之 27 1376819 底部之間。 24‘ ^請㈣範圍第U項所狀光二簡龍基座結構製 、'’,其中該基板係可為晶格方向(100)、晶格方向 或晶格方向(111)之石夕晶圓基板。 I5·方m聰圍第23項所述之光二極體封裝基座結構製 步驟:該弟一開口與該第二開口之形成方法包含下列 、::第一表面與該第二表面分別形成以氮化石夕 乳夕或金屬完成之該第一罩幕層與該第二翠幕層; 於該第-罩幕層與該第二罩幕層上分i 層與-第二級層; 取#先阻 利用-第-光罩與—第二光罩在該等光阻層上 第一光阻圖形與一第二光阻圖形;以及 根據该第-光阻圖形與該第二光阻圖形對該 與該第二罩幕層進行钱刻而形成該第一開口盘該第層 26. 如申請專利範圍第23項所述之光二極體封襄基 作方法,其中該基板係可利用—料_或_ 開口進行蝕刻。 d對該 27. 如中物細第23項所述之光二極體封裝基座 作方法,更包含下列步驟: 、D構製 於進行银刻後之該基板之該第一表面、該第二 承载空間之底部與該等導通孔側壁上形成一 一面、該 於該第:表面、該第二表面、該承载空=絕= 通孔側壁之该氧化梦絕緣層上形成該導電反射^, 導 28 1376819 於該導電反射層所具有之該反射部上形成一反射層;以 及 3 * 於該反射層上形成一透明保護層。 28. 如申請專利範圍第27項所述之光二極體封裝基座結構製 作方法’其中該氧化矽絕緣層係以一高溫氧化之方式所形成。 29. 如申請專利範圍第27項所述之光二極體封裝基座結構製 作方法,其_該反射層係由對光反射率很高之鋁或銀材質所 完成並以一蒸鍍或濺鍍之方式形成於該反射部上。 30. 如申請專利範圍第27項所述之光二極體封裝基座結構製 作方法其中該透明保護層係以一二氧化砍絕緣層(§丨〇2)、 一氮化矽絕緣層(SixNy)、一聚亞醯胺絕緣層(p〇lyimide)、—聚 曱基丙細酉文曱@旨絕緣層丨MethaCrylate· 或一光 阻層SU8等材質所完成之該透明保護層。 31·如申請專利範圍第27項所述之光二極體封裝基座結構製 作方法,其十該導電反射層係一 TiW/Cu/Ni/Au合金、— Ti/fu/Ni/Au合金、_ Ti/Au/Ni/Au合金或一⑽禮跑合金 所元成,其形成方法包含下列步驟: 以第一光罩於該氧化矽絕緣層上定義出一電鍍區域; 以及 * 以濺鍍加電鍍或一濺鍍加化鍍之方式於該電鍍區域形 成該導電反射層。 32,如申請專利範圍第23項所述之光二極體封裝基座結構製 作方法其中該光二極體晶粒係可為一發光二極體晶粒或— 雷射二極體晶粒。 29The substrate is engraved and further formed at the first opening σ and the second opening, respectively, and the second diode is placed in a bearing space and at least two via holes, and the material through hole The money passes through the bottom of the carrier (4) and the second surface of the substrate; and the mask layer is removed and a square salt-conductive reflective layer is formed on the first surface of the substrate and the bottom of the bearing space, the conductive reflective layer The utility model has a conductive portion and a reflecting portion, wherein the conductive portion passes through the sidewall of the conductive via and extends to form the second surface of the practice and is electrically connected with the light-distributing die, and the meal portion It is located between the photodiode die and the bottom of the 27 1376819 of the carrying space. 24' ^ (4) The U-shaped short base structure of the U-shaped range, '', wherein the substrate can be a crystal lattice direction (100), a lattice direction or a lattice direction (111). The step of forming the photodiode package base structure according to Item 23 of the present invention: the method for forming the opening and the second opening comprises the following: the first surface and the second surface are respectively formed The first mask layer and the second crest layer are formed by the nitrite or the metal; the i-layer and the second layer are separated on the first-mask layer and the second mask layer; First resisting - the first photomask and the second photomask on the photoresist layer, the first photoresist pattern and the second photoresist pattern; and the first photoresist pattern and the second photoresist pattern pair The second layer of the mask layer is formed by the second mask layer to form the first open-disc layer. The photodiode sealing method according to claim 23, wherein the substrate is available for use. _ or _ opening for etching. The method of the photodiode package base according to Item 23, further comprising the steps of: d, constructing the first surface of the substrate after silver etching, and the second Forming the conductive reflection on the bottom of the bearing space and the side wall of the via holes, and forming the conductive surface on the oxidized dream insulating layer of the first surface, the second surface, the carrying surface, the sidewall of the via hole, Guide 28 1376819 forms a reflective layer on the reflective portion of the conductive reflective layer; and 3* forms a transparent protective layer on the reflective layer. 28. The method of fabricating an optical diode package base structure according to claim 27, wherein the yttria insulating layer is formed by a high temperature oxidation. 29. The method for fabricating a photodiode package base structure according to claim 27, wherein the reflective layer is formed by aluminum or silver having a high light reflectivity and is vapor-deposited or sputtered. The method is formed on the reflecting portion. 30. The method for fabricating a photodiode package base structure according to claim 27, wherein the transparent protective layer is a oxidized chopped insulating layer (§2) and a tantalum nitride insulating layer (SixNy) The transparent protective layer is made of a material such as a polymethylene chloride insulating layer, a polyfluorene-based fine layer, an insulating layer, a MethaCrylate, or a photoresist layer SU8. 31. The method for fabricating a photodiode package base structure according to claim 27, wherein the conductive reflective layer is a TiW/Cu/Ni/Au alloy, Ti/fu/Ni/Au alloy, _ a Ti/Au/Ni/Au alloy or a (10) ritual alloy, the method of forming comprising the steps of: defining a plating region on the yttria insulating layer by using a first mask; and * sputtering and plating Or a sputtering and plating method forms the conductive reflective layer in the plating region. 32. The method of fabricating a photodiode package base structure according to claim 23, wherein the photodiode die is a light emitting diode die or a laser diode die. 29
TW97129441A 2008-08-01 2008-08-01 Photo diode package base structure and manufacturing method of the same TWI376819B (en)

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