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TWI370535B - Device for protecting semiconductor ic - Google Patents

Device for protecting semiconductor ic

Info

Publication number
TWI370535B
TWI370535B TW096138908A TW96138908A TWI370535B TW I370535 B TWI370535 B TW I370535B TW 096138908 A TW096138908 A TW 096138908A TW 96138908 A TW96138908 A TW 96138908A TW I370535 B TWI370535 B TW I370535B
Authority
TW
Taiwan
Prior art keywords
protecting semiconductor
protecting
semiconductor
Prior art date
Application number
TW096138908A
Other languages
English (en)
Other versions
TW200828557A (en
Inventor
Sang Soo Song
Original Assignee
Dongbu Hitek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongbu Hitek Co Ltd filed Critical Dongbu Hitek Co Ltd
Publication of TW200828557A publication Critical patent/TW200828557A/zh
Application granted granted Critical
Publication of TWI370535B publication Critical patent/TWI370535B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10W42/80
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/811Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
TW096138908A 2006-12-29 2007-10-17 Device for protecting semiconductor ic TWI370535B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060137353A KR100831269B1 (ko) 2006-12-29 2006-12-29 반도체 집적회로 소자를 정전기 방전으로부터 보호하는장치

Publications (2)

Publication Number Publication Date
TW200828557A TW200828557A (en) 2008-07-01
TWI370535B true TWI370535B (en) 2012-08-11

Family

ID=39582621

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096138908A TWI370535B (en) 2006-12-29 2007-10-17 Device for protecting semiconductor ic

Country Status (4)

Country Link
US (1) US7869175B2 (zh)
KR (1) KR100831269B1 (zh)
CN (1) CN101211910A (zh)
TW (1) TWI370535B (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8693148B2 (en) 2009-01-08 2014-04-08 Micron Technology, Inc. Over-limit electrical condition protection circuits for integrated circuits
CN102148246B (zh) * 2010-02-10 2015-07-22 上海华虹宏力半导体制造有限公司 静电放电保护电路
US8611058B2 (en) 2011-08-23 2013-12-17 Micron Technology, Inc. Combination ESD protection circuits and methods
US8724268B2 (en) 2011-08-30 2014-05-13 Micron Technology, Inc. Over-limit electrical condition protection circuits and methods
US8848326B2 (en) * 2012-03-09 2014-09-30 Globalfoundries Singapore Pte. Ltd. Cross-domain ESD protection scheme
CN104578036B (zh) * 2015-01-27 2018-05-01 京东方科技集团股份有限公司 一种静电保护电路、静电保护系统及显示器件
US9583406B2 (en) * 2015-03-17 2017-02-28 Infineon Technologies Austria Ag System and method for dual-region singulation
FR3044166B1 (fr) * 2015-11-19 2018-03-23 Stmicroelectronics Sa Dispositif electronique, en particulier pour la protection contre des surtensions
JP2017212295A (ja) 2016-05-24 2017-11-30 東芝メモリ株式会社 半導体装置
US9882003B1 (en) 2016-07-11 2018-01-30 Tower Semiconductor Ltd. Device and system of a silicon controlled rectifier (SCR)
CN110416209B (zh) * 2019-07-29 2021-09-28 成都芯图科技有限责任公司 一种具有反馈结构的半导体功率晶体管及集成电路与封装结构
TWI799312B (zh) * 2022-07-05 2023-04-11 瑞昱半導體股份有限公司 輸出入埠電路及其晶片

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW247368B (en) * 1993-09-29 1995-05-11 Seiko Epuson Co Current regulating semiconductor integrate circuit device and fabrication method of the same
US6016002A (en) 1996-12-20 2000-01-18 Texas Instruments Incorporated Stacked silicon-controlled rectifier having a low voltage trigger and adjustable holding voltage for ESD protection
TW454328B (en) * 1998-10-22 2001-09-11 Winbond Electronics Corp ESD protection circuit triggered by diodes
KR20020055936A (ko) * 2000-12-29 2002-07-10 박종섭 정전기 방전 보호 회로
US7170726B2 (en) * 2003-01-16 2007-01-30 Silicon Integrated Systems Corp. Uniform turn-on design on multiple-finger MOSFET for ESD protection application
US7224560B2 (en) * 2003-02-13 2007-05-29 Medtronic, Inc. Destructive electrical transient protection
US7342281B2 (en) 2004-12-14 2008-03-11 Electronics And Telecommunications Research Institute Electrostatic discharge protection circuit using triple welled silicon controlled rectifier
KR100664377B1 (ko) * 2004-12-30 2007-01-02 동부일렉트로닉스 주식회사 반도체-제어 정류기 정전 방전 보호회로

Also Published As

Publication number Publication date
US7869175B2 (en) 2011-01-11
CN101211910A (zh) 2008-07-02
KR100831269B1 (ko) 2008-05-22
US20080157204A1 (en) 2008-07-03
TW200828557A (en) 2008-07-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees