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TWI369501B - Transient detection circuit and integrated circuit - Google Patents

Transient detection circuit and integrated circuit

Info

Publication number
TWI369501B
TWI369501B TW097113923A TW97113923A TWI369501B TW I369501 B TWI369501 B TW I369501B TW 097113923 A TW097113923 A TW 097113923A TW 97113923 A TW97113923 A TW 97113923A TW I369501 B TWI369501 B TW I369501B
Authority
TW
Taiwan
Prior art keywords
circuit
transient detection
integrated circuit
detection circuit
integrated
Prior art date
Application number
TW097113923A
Other languages
English (en)
Other versions
TW200933164A (en
Inventor
Ming Dou Ker
Cheng Chegn Yen
Chi Sheng Liao
Tung Yang Chen
Original Assignee
Univ Nat Chiao Tung
Himax Tech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nat Chiao Tung, Himax Tech Ltd filed Critical Univ Nat Chiao Tung
Publication of TW200933164A publication Critical patent/TW200933164A/zh
Application granted granted Critical
Publication of TWI369501B publication Critical patent/TWI369501B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW097113923A 2008-01-23 2008-04-17 Transient detection circuit and integrated circuit TWI369501B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/018,229 US7710696B2 (en) 2008-01-23 2008-01-23 Transient detection circuit for ESD protection

Publications (2)

Publication Number Publication Date
TW200933164A TW200933164A (en) 2009-08-01
TWI369501B true TWI369501B (en) 2012-08-01

Family

ID=40877120

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097113923A TWI369501B (en) 2008-01-23 2008-04-17 Transient detection circuit and integrated circuit

Country Status (3)

Country Link
US (1) US7710696B2 (zh)
CN (1) CN101493489B (zh)
TW (1) TWI369501B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103412216B (zh) * 2013-07-31 2016-03-16 格科微电子（上海）有限公司 静电放电检测电路及处理系统
US10523002B2 (en) 2016-12-05 2019-12-31 Vanguard International Semiconductor Corporation Electrostatic discharge protection circuit
CN110967568B (zh) * 2018-09-30 2022-07-26 奇景光电股份有限公司 静电放电检测装置
US11424615B2 (en) 2020-05-29 2022-08-23 Nxp Usa, Inc. Integrity monitoring for input/output (IO) circuits of a system on a chip (SOC)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6233130B1 (en) * 1998-07-30 2001-05-15 Winbond Electronics Corp. ESD Protection device integrated with SCR
US6369994B1 (en) * 1998-07-31 2002-04-09 International Business Machines Corporation Method and apparatus for handling an ESD event on an SOI integrated circuit
US6385021B1 (en) * 2000-04-10 2002-05-07 Motorola, Inc. Electrostatic discharge (ESD) protection circuit
JP3773506B2 (ja) * 2003-07-24 2006-05-10 松下電器産業株式会社 半導体集積回路装置
US8254069B2 (en) * 2005-10-28 2012-08-28 Fairchild Semiconductor Corporation ESD protection for outputs
DE102006029142B4 (de) * 2006-06-24 2008-04-03 Infineon Technologies Ag Verfahren und Schutzschaltung gegen Überspannung

Also Published As

Publication number Publication date
CN101493489B (zh) 2011-08-31
TW200933164A (en) 2009-08-01
US20090187361A1 (en) 2009-07-23
CN101493489A (zh) 2009-07-29
US7710696B2 (en) 2010-05-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees